﻿FN Thomson Reuters Web of Science™
VR 1.0
PT J
AU Sun, ZW
   Russell, TP
AF Sun, Zhiwei
   Russell, Thomas P.
TI In situ grazing incidence small-angle X-ray scattering study of solvent
   vapor annealing in lamellae-forming block copolymer thin films:
   Trade-off of defects in deswelling
SO JOURNAL OF POLYMER SCIENCE PART B-POLYMER PHYSICS
LA English
DT Article
DE annealing; block copolymers; self-assembly; thin films; X-ray
ID BIT-PATTERNED MEDIA; LITHOGRAPHY; GRAPHENE; ARRAYS; ORIENTATION;
   NANOWIRES; PARALLEL; BEHAVIOR; INPLANE; DENSITY
AB Solvent vapor annealing (SVA) is one route to prepare block copolymer (BCP) thin films with long-range lateral ordering. The lattice defects in the spin-coated BCP thin film can be effectively and rapidly reduced using SVA. The solvent evaporation after annealing was shown to have a significant impact on the in-plane ordering of BCP microdomains. However, the effect of solvent evaporation on the out-of-plane defects in BCPs has not been considered. Using grazing-incidence x-ray scattering, the morphology evolution of lamellae-forming poly(2-vinlypyridine)-b-polystyrene-b-poly(2vinylpyridine) triblock copolymers, having lamellar microdomains oriented normal to substrate surface during SVA, was studied in this work. A micelle to lamellae transformation was observed during solvent uptake. The influence of solvent swelling ratio and solvent removal rate on both the in-plane and out-of-plane defect density was studied. It shows that there is a trade-off between the in-plane and out-of-plane defect densities during solvent evaporation. (c) 2017 Wiley Periodicals, Inc. J. Polym. Sci., Part B: Polym. Phys. 2017, 55, 980-989
C1 [Sun, Zhiwei; Russell, Thomas P.] Univ Massachusetts Amherst, Dept Polymer Sci & Engn, Amherst, MA 01003 USA.
   [Russell, Thomas P.] Lawrence Berkeley Natl Lab, Div Mat Sci, Berkeley, CA 94720 USA.
   [Russell, Thomas P.] Beijing Univ Chem Technol, Beijing Adv Innovat Ctr Soft Matter Sci & Engn, Beijing, Peoples R China.
RP Russell, TP (reprint author), Univ Massachusetts Amherst, Dept Polymer Sci & Engn, Amherst, MA 01003 USA.; Russell, TP (reprint author), Lawrence Berkeley Natl Lab, Div Mat Sci, Berkeley, CA 94720 USA.; Russell, TP (reprint author), Beijing Univ Chem Technol, Beijing Adv Innovat Ctr Soft Matter Sci & Engn, Beijing, Peoples R China.
EM russell@mail.pse.umass.edu
FU U.S. Department of Energy BES [BES-DE-FG02-96ER45612]; Director of the
   Office of Science, Office of Basic Energy Sciences, of the U.S.
   Department of Energy [DE-AC02-05CH11231]; Office of Science, Office of
   Basic Energy Sciences, of the U.S. Department of Energy
   [DE-AC02-05CH11231]
FX The authors acknowledge the facility support in Advanced Light Source
   and Molecular Foundry in Lawrence Berkeley National Laboratory. This
   work was supported by the U.S. Department of Energy BES under contract
   BES-DE-FG02-96ER45612. The GISAXS characterization in beamline 7.3.3 of
   the Advanced Light Source is supported by the Director of the Office of
   Science, Office of Basic Energy Sciences, of the U.S. Department of
   Energy under contract no. DE-AC02-05CH11231. The SEM and AFM
   characterization in the Molecular Foundry was supported by the Office of
   Science, Office of Basic Energy Sciences, of the U.S. Department of
   Energy under contract no. DE-AC02-05CH11231.
CR Bai W, 2015, MACROMOLECULES, V48, P8574, DOI 10.1021/acs.macromol.5b02174
   Bosworth JK, 2011, MACROMOLECULES, V44, P9196, DOI 10.1021/ma201967a
   Bosworth JK, 2010, J PHOTOPOLYM SCI TEC, V23, P145, DOI 10.2494/photopolymer.23.145
   Chai J, 2008, ACS NANO, V2, P489, DOI 10.1021/nn700341s
   Chai J, 2007, NAT NANOTECHNOL, V2, P500, DOI 10.1038/nnano.2007.227
   Choi S, 2012, SOFT MATTER, V8, P3463, DOI 10.1039/c2sm07297a
   Di ZY, 2012, MACROMOLECULES, V45, P5185, DOI 10.1021/ma3004136
   Farrell RA, 2012, NANOSCALE, V4, P3228, DOI 10.1039/c2nr00018k
   Gowd E. B., 2010, IOP C SER MAT SCI EN, V14
   Gu XD, 2014, ADV MATER, V26, P273, DOI 10.1002/adma.201302562
   Gunkel I, 2016, J POLYM SCI POL PHYS, V54, P331, DOI 10.1002/polb.23933
   Ilavsky J, 2012, J APPL CRYSTALLOGR, V45, P324, DOI 10.1107/S0021889812004037
   Jeong SJ, 2010, NANO LETT, V10, P3500, DOI 10.1021/nl101637f
   Ji S, 2008, MACROMOLECULES, V41, P9098, DOI 10.1021/ma801861h
   Khaira GS, 2014, ACS MACRO LETT, V3, P747, DOI 10.1021/mz5002349
   Kikitsu A, 2013, IEEE T MAGN, V49, P693, DOI 10.1109/TMAG.2012.2226566
   Kim BH, 2011, ADV MATER, V23, P5618, DOI 10.1002/adma.201103650
   Kim BH, 2010, ACS NANO, V4, P5464, DOI 10.1021/nn101491g
   Kurihara M, 2013, JPN J APPL PHYS, V52, DOI 10.7567/JJAP.52.086201
   Liu GX, 2012, ACS NANO, V6, P6786, DOI 10.1021/nn301515a
   Mahadevapuram N, 2016, J POLYM SCI POL PHYS, V54, P339, DOI 10.1002/polb.23937
   Paik MY, 2010, MACROMOLECULES, V43, P4253, DOI 10.1021/ma902646t
   Sinturel C, 2014, ACS APPL MATER INTER, V6, P12146, DOI 10.1021/am504086x
   Sun ZW, 2015, ADV MATER, V27, P4364, DOI 10.1002/adma.201501585
   Vu T, 2011, MACROMOLECULES, V44, P6121, DOI 10.1021/ma2009222
   Thurn-Albrecht T, 2000, SCIENCE, V290, P2126, DOI 10.1126/science.290.5499.2126
   Wan L., 2012, MOEMS, V11, P31405
   Wang JY, 2008, LANGMUIR, V24, P3545, DOI 10.1021/la703559q
   Xiao S., 2013, MOEMS, V12
   Xiao SG, 2014, ACS NANO, V8, P11854, DOI 10.1021/nn505630t
   Xiao SG, 2014, J POLYM SCI POL PHYS, V52, P361, DOI 10.1002/polb.23433
   Yamamoto R, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2013.2284474
   Yang X., 2014, MOEMS, V13
   Yang X., 2013, J MATER RES, V2013, P1
   Yang XM, 2014, NANOTECHNOLOGY, V25, DOI 10.1088/0957-4484/25/39/395301
   Yang XM, 2009, ACS NANO, V3, P1844, DOI 10.1021/nn900073r
   Zhang JQ, 2014, MACROMOLECULES, V47, P5711, DOI 10.1021/ma500633b
NR 37
TC 0
Z9 0
U1 1
U2 1
PU WILEY
PI HOBOKEN
PA 111 RIVER ST, HOBOKEN 07030-5774, NJ USA
SN 0887-6266
EI 1099-0488
J9 J POLYM SCI POL PHYS
JI J. Polym. Sci. Pt. B-Polym. Phys.
PD JUL 1
PY 2017
VL 55
IS 13
BP 980
EP 989
DI 10.1002/polb.24346
PG 10
WC Polymer Science
SC Polymer Science
GA EU7BQ
UT WOS:000401190100002
ER

PT J
AU Wodarz, S
   Hasegawa, T
   Ishio, S
   Homma, T
AF Wodarz, Siggi
   Hasegawa, Takashi
   Ishio, Shunji
   Homma, Takayuki
TI Structural control of ultra-fine CoPt nanodot arrays via
   electrodeposition process
SO JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
LA English
DT Article
DE Electrodeposition; Structural control; Nanodot array; Bit-patterned
   media; CoPt alloy
ID BIT-PATTERNED MEDIA; ELECTRON-BEAM LITHOGRAPHY; RECORDING MEDIA;
   MAGNETIC MEDIA; DENSITY; FILMS; ANISOTROPY; STORAGE
AB CoPt nanodot arrays were fabricated by combining electrodeposition and electron beam lithography (EBL) for the use of bit-patterned media (BPM). To achieve precise control of deposition uniformity and coercivity of the CoPt nanodot arrays, their crystal structure and magnetic properties were controlled by controlling the diffusion state of metal ions from the initial deposition stage with the application of bath agitation. Following bath agitation, the composition gradient of the CoPt alloy with thickness was mitigated to have a near-ideal alloy composition of Co:Pt =80:20, which induces epitaxial-like growth from Ru substrate, thus resulting in the improvement of the crystal orientation of the hcp (002) structure from its initial deposition stages. Furthermore, the cross-sectional transmission electron microscope (TEM) analysis of the nanodots deposited with bath agitation showed CoPt growth along its c-axis oriented in the perpendicular direction, having uniform lattice fringes on the hcp (002) plane from the Ru underlayer interface, which is a significant factor to induce perpendicular magnetic anisotropy. Magnetic characterization of the CoPt nanodot arrays showed increase in the perpendicular coercivity and squareness of the hysteresis loops from 2.0 kOe and 0.64 (without agitation) to 4.0 kOe and 0.87 with bath agitation. Based on the detailed characterization of nanodot arrays, the precise crystal structure control of the nanodot arrays with ultra-high recording density by electrochemical process was successfully demonstrated.
C1 [Wodarz, Siggi; Homma, Takayuki] Waseda Univ, Dept Appl Chem, Shinjuku Ku, Tokyo 1698555, Japan.
   [Hasegawa, Takashi; Ishio, Shunji] Akita Univ, Dept Mat Sci, Akita 0108502, Japan.
RP Homma, T (reprint author), Waseda Univ, Dept Appl Chem, Shinjuku Ku, Tokyo 1698555, Japan.
EM t.homma@waseda.jp
OI Hasegawa, Takashi/0000-0002-8178-4980
FU JSPS KAKENHI Grant [25249104]
FX This work was supported in part by JSPS KAKENHI Grant Number 25249104.
CR Albrecht TR, 2013, IEEE T MAGN, V49, P773, DOI 10.1109/TMAG.2012.2227303
   BUSCHOW KHJ, 1983, J MAGN MAGN MATER, V38, P1, DOI 10.1016/0304-8853(83)90097-5
   Gapin AI, 2006, J APPL PHYS, V99, DOI 10.1063/1.2163289
   Homma Takayuki, 2015, ECS Transactions, V64, P1, DOI 10.1149/06431.0001ecst
   Kryder MH, 2008, P IEEE, V96, P1810, DOI 10.1109/JPROC.2008.2004315
   Kubo T, 2005, J APPL PHYS, V97, DOI 10.1063/1.1855572
   Lodder JC, 2004, J MAGN MAGN MATER, V272, P1692, DOI 10.1016/j.jmmm.2003.12.259
   Mitsuzuka K, 2007, IEEE T MAGN, V43, P2160, DOI 10.1109/TMAG.2007.893129
   Ouchi T, 2010, ELECTROCHIM ACTA, V55, P8081, DOI 10.1016/j.electacta.2010.02.073
   Pattanaik G, 2006, J APPL PHYS, V99, DOI 10.1063/1.2150805
   Pattanaik G, 2007, ELECTROCHIM ACTA, V52, P2755, DOI 10.1016/j.electacta.2006.07.062
   Piramanayagam SN, 2009, J MAGN MAGN MATER, V321, P485, DOI 10.1016/j.jmmm.2008.05.007
   Ross CA, 2008, MRS BULL, V33, P838, DOI 10.1557/mrs2008.179
   Shiroishi Y, 2009, IEEE T MAGN, V45, P3816, DOI 10.1109/TMAG.2009.2024879
   Sirtori V, 2011, ACS APPL MATER INTER, V3, P1800, DOI 10.1021/am200267u
   Sohn JS, 2009, NANOTECHNOLOGY, V20, DOI 10.1088/0957-4484/20/2/025302
   Sun SH, 2000, SCIENCE, V287, P1989, DOI 10.1126/science.287.5460.1989
   Terris BD, 2007, MICROSYST TECHNOL, V13, P189, DOI 10.1007/s00542-006-0144-9
   Wang JP, 2008, P IEEE, V96, P1847, DOI 10.1109/JPROC.2008.2004318
   Weller D, 1999, IEEE T MAGN, V35, P4423, DOI 10.1109/20.809134
   Weller D, 2000, IEEE T MAGN, V36, P10, DOI 10.1109/20.824418
   Wodarz S, 2016, ELECTROCHIM ACTA, V197, P330, DOI 10.1016/j.electacta.2015.11.136
   Xu X, 2012, J ELECTROCHEM SOC, V159, pD240, DOI 10.1149/2.090204jes
   Yang X, 2007, J VAC SCI TECHNOL B, V25, P2202, DOI 10.1116/1.2798711
   Yang XM, 2009, ACS NANO, V3, P1844, DOI 10.1021/nn900073r
   Yasui N, 2003, APPL PHYS LETT, V83, P3347, DOI 10.1063/1.1622787
   Yua H., 2009, J APPL PHYS, V105
   Zhu JG, 2008, IEEE T MAGN, V44, P125, DOI 10.1109/TMAG.2007.911031
NR 28
TC 0
Z9 0
U1 21
U2 21
PU ELSEVIER SCIENCE BV
PI AMSTERDAM
PA PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
SN 0304-8853
EI 1873-4766
J9 J MAGN MAGN MATER
JI J. Magn. Magn. Mater.
PD MAY 15
PY 2017
VL 430
BP 52
EP 58
DI 10.1016/j.jmmm.2017.01.061
PG 7
WC Materials Science, Multidisciplinary; Physics, Condensed Matter
SC Materials Science; Physics
GA EP2GP
UT WOS:000397201600008
ER

PT J
AU Bian, WL
   Lian, H
   Zhang, YX
   Tai, FF
   Wang, H
   Dong, QC
   Yu, BF
   Wei, XH
   Zhao, Q
AF Bian, Wanli
   Lian, Hong
   Zhang, Yixia
   Tai, Feifei
   Wang, Hua
   Dong, Qingchen
   Yu, Baofeng
   Wei, Xuehong
   Zhao, Qiang
TI Porphyrin-based Pt/Pd-containing metallopolymers: Synthesis,
   characterization, optical property and potential application in
   bioimaging
SO JOURNAL OF ORGANOMETALLIC CHEMISTRY
LA English
DT Article
DE Porphyrin; Metallopolymer; Phosphorescent probe; Bioimaging
ID BIT-PATTERNED MEDIA; METAL-ORGANIC FRAMEWORK; FEPT NANOPARTICLES;
   CONJUGATED POLYMER; EXCIMER EMISSION; PRECURSORS; COMPLEXES; THERAPY;
   POLYMETALLAYNES; CATALYSIS
AB In this work, we report two metallopolymers (Pt-P and Pd-P) through coupling of Pt-II or Pd-II porphyrin with fluorene derivatives. The structure and photophysical properties of these two metallpolymers were fully characterized, which indicate that these two metallopolymers are of good capability for bioimaging of cancer cells. Hence, nanoprobes based on Pt-P and Pd-P for bioimaging of HeLa cancer cells were explored. The biological experimental results show that Pt-P NPs exhibit good biocompatibility and specificity to HeLa cancer cells due to its favorable NP size. (C) 2017 Elsevier B.V. All rights reserved.
C1 [Bian, Wanli; Lian, Hong; Tai, Feifei; Wang, Hua; Dong, Qingchen] Taiyuan Univ Technol, Res Ctr Adv Mat Sci & Technol, Key Lab Interface Sci & Engn Adv Mat, Minist Educ, Taiyuan 030024, Peoples R China.
   [Zhang, Yixia] Taiyuan Univ Technol, Coll Mech, Shanxi Key Lab Mat Strength & Struct Impact, Dept Biomed Engn, Taiyuan 030024, Peoples R China.
   [Yu, Baofeng] Shanxi Med Univ, Dept Biochem & Mol Biol, Taiyuan 030001, Peoples R China.
   [Wei, Xuehong] Shanxi Univ, Dept Chem, Inst Appl Chem, Taiyuan 030006, Peoples R China.
   [Zhao, Qiang] Nanjing Univ Posts & Telecommun, Jiangsu Natl Synergist Innovat Ctr Adv Mat SICAM, IAM, Key Lab Organ Elect & Informat Displays, 9 Wenyuan Rd, Nanjing 210023, Jiangsu, Peoples R China.
RP Dong, QC (reprint author), Taiyuan Univ Technol, Res Ctr Adv Mat Sci & Technol, Key Lab Interface Sci & Engn Adv Mat, Minist Educ, Taiyuan 030024, Peoples R China.; Yu, BF (reprint author), Shanxi Med Univ, Dept Biochem & Mol Biol, Taiyuan 030001, Peoples R China.; Wei, XH (reprint author), Shanxi Univ, Dept Chem, Inst Appl Chem, Taiyuan 030006, Peoples R China.; Zhao, Q (reprint author), Nanjing Univ Posts & Telecommun, Jiangsu Natl Synergist Innovat Ctr Adv Mat SICAM, IAM, Key Lab Organ Elect & Informat Displays, 9 Wenyuan Rd, Nanjing 210023, Jiangsu, Peoples R China.
EM dongqingchen@tyut.edu.cn; shanxiyangcheng@126.com; xhwei@sxu.edu.cn;
   iamqzhao@njupt.edu.cn
FU Natural Science Foundation for Young Scientists of Shanxi Province,
   China [2014021019-2]; Natural Science Foundation of Shnaxi Province
   [2015011113]; Key R&D Project of Shanxi Province [201603D421032]; Fund
   Program for the Scientific Activities of Selected Returned Overseas
   Professionals in Shanxi Province; Outstanding Young Scholars Cultivating
   Program; Shanxi Scholarship Council of China [2014-02]
FX We acknowledge the financial support from the National Natural Science
   Foundation of China (Grant No.: 61307030, 81602506, 30901821, 81172136).
   This work was also supported by the Program for the Outstanding
   Innovative Teams of Higher Learning Institutions of Shanxi (OIT), the
   Youth "Sanjin" Scholar Program, the Natural Science Foundation for Young
   Scientists of Shanxi Province, China (Grant No.: 2014021019-2), the
   Natural Science Foundation of Shnaxi Province (Grant No.: 2015011113),
   the Key R&D Project of Shanxi Province (International cooperation
   program, No. 201603D421032), Fund Program for the Scientific Activities
   of Selected Returned Overseas Professionals in Shanxi Province and the
   Outstanding Young Scholars Cultivating Program, Research Project
   Supported by Shanxi Scholarship Council of China (Grant No.: 2014-02).
CR Dondi R, 2016, ORG BIOMOL CHEM, V14, P11488, DOI 10.1039/c6ob02135b
   Dong QC, 2016, NANOSCALE, V8, P7068, DOI 10.1039/c6nr00034g
   Dong QC, 2015, J MATER CHEM C, V3, P734, DOI 10.1039/c4tc02058h
   Dong QC, 2014, ADV FUNCT MATER, V24, P857, DOI 10.1002/adfm.201301143
   Dong Q, 2012, ADV MATER, V24, P1034, DOI 10.1002/adma.201104171
   Gallagher AT, 2016, INORG CHEM FRONT, V3, P536, DOI 10.1039/c5qi00275c
   Gilroy JB, 2011, ANGEW CHEM INT EDIT, V50, P5851, DOI 10.1002/anie.201008184
   Giuntini F, 2014, PHOTOCH PHOTOBIO SCI, V13, P1039, DOI 10.1039/c4pp00026a
   Guo B, 2016, SMALL, V12, P6243, DOI 10.1002/smll.201602293
   Ho CL, 2016, CHEM SOC REV, V45, P5264, DOI 10.1039/c6cs00226a
   Ishihara S, 2014, PHYS CHEM CHEM PHYS, V16, P9713, DOI 10.1039/c3cp55431g
   Kumar R, 2009, ACS APPL MATER INTER, V1, P1474, DOI 10.1021/am9001293
   Lee J, 2016, J MATER CHEM C, V4, P2784, DOI 10.1039/c5tc03289j
   Liu K, 2008, ANGEW CHEM INT EDIT, V47, P1255, DOI 10.1002/anie.200703199
   Liu Y, 2016, TETRAHEDRON, V72, P2287, DOI 10.1016/j.tet.2016.03.034
   Lu Y, 2009, NATURE, V460, P855, DOI 10.1038/nature08304
   Meng ZG, 2017, NANOSCALE, V9, P731, DOI 10.1039/c6nr07863j
   Meng ZG, 2016, POLYM CHEM-UK, V7, P4467, DOI 10.1039/c6py00714g
   Moiseev AG, 2014, DALTON T, V43, P2676, DOI 10.1039/c3dt52926f
   Nanjo M, 2008, ADV FUNCT MATER, V18, P470, DOI 10.1002/adfm.200700315
   Niu ZQ, 2016, NAT MATER, V15, P1188, DOI [10.1038/nmat4724, 10.1038/NMAT4724]
   Palner M, 2015, ANGEW CHEM INT EDIT, V54, P11477, DOI 10.1002/anie.201502736
   Pordea A, 2009, SYNLETT, P3225, DOI 10.1055/s-0029-1218305
   Prasad K, 2015, RSC ADV, V5, P74986, DOI 10.1039/c5ra14267a
   Qiao BT, 2011, NAT CHEM, V3, P634, DOI [10.1038/nchem.1095, 10.1038/NCHEM.1095]
   Shi HF, 2014, ADV FUNCT MATER, V24, P4823, DOI 10.1002/adfm.201400647
   Shi HF, 2013, ADV FUNCT MATER, V23, P3268, DOI 10.1002/adfm.201202385
   Shi JB, 2010, MACROMOLECULES, V43, P680, DOI 10.1021/ma9012658
   Shinohara S, 2008, ANGEW CHEM INT EDIT, V47, P9039, DOI 10.1002/anie.200803046
   Simoes AVC, 2015, RSC ADV, V5, P99540, DOI 10.1039/c5ra16103g
   Whittell GR, 2011, NAT MATER, V10, P176, DOI 10.1038/nmat2966
   Wong WY, 2010, ACCOUNTS CHEM RES, V43, P1246, DOI 10.1021/ar1000378
   Wu CF, 2009, ANGEW CHEM INT EDIT, V48, P2741, DOI 10.1002/anie.200805894
   Wu FI, 2007, ADV FUNCT MATER, V17, P1085, DOI 10.1002/adfm.200600697
   Wu WT, 2011, DYES PIGMENTS, V89, P199, DOI 10.1016/j.dyepig.2010.01.020
   Yamamoto T, 2000, MACROMOLECULES, V33, P5988, DOI 10.1021/ma000141l
   Yang S, 2016, ANGEW CHEM INT EDIT, V55, P2058, DOI 10.1002/anie.201509241
   Zhang L, 2015, CHEM COMMUN, V51, P10831, DOI 10.1039/c5cc03028e
   Zhang LY, 2015, DALTON T, V44, P15212, DOI 10.1039/c5dt00545k
   Zhao Q, 2015, CHEM SCI, V6, P1825, DOI 10.1039/c4sc03062a
   Zhou GJ, 2011, CHEM SOC REV, V40, P2541, DOI 10.1039/c0cs00094a
NR 41
TC 1
Z9 1
U1 42
U2 42
PU ELSEVIER SCIENCE SA
PI LAUSANNE
PA PO BOX 564, 1001 LAUSANNE, SWITZERLAND
SN 0022-328X
EI 1872-8561
J9 J ORGANOMET CHEM
JI J. Organomet. Chem.
PD MAY 1
PY 2017
VL 835
BP 25
EP 30
DI 10.1016/j.jorganchem.2017.02.038
PG 6
WC Chemistry, Inorganic & Nuclear; Chemistry, Organic
SC Chemistry
GA EP9HP
UT WOS:000397685000005
ER

PT J
AU Liu, NJ
   Wang, YY
   Wang, C
   He, Q
   Bu, WF
AF Liu, Nijuan
   Wang, Yongyue
   Wang, Chen
   He, Qun
   Bu, Weifeng
TI Syntheses and Controllable Self-Assembly of Luminescence Platinum(II)
   Plane-Coil Diblock Copolymers
SO MACROMOLECULES
LA English
DT Article
ID BIT-PATTERNED MEDIA; TRANSFER RADICAL POLYMERIZATION; STAR
   BLOCK-COPOLYMERS; ROD-COIL; AGGREGATION BEHAVIOR; FEPT NANOPARTICLES;
   AQUEOUS-SOLUTION; COMPLEXES; EMISSION; FILMS
AB Polystyrenes have been synthesized with terminal groups of luminescence square-planar platinum(II) complexes, which can be conceptually regarded as plane-coil diblock copolymers. They can self-assemble into spherical micelles with a core of polystyrenes and a corona of planar platinum(II) complexes in the chloroform/ methanol mixture solvents, while free-standing bilayered sheets form in the toluene/methanol mixture solvents. With increasing methanol content in the latter case, where the solvent quality was highly deteriorated for polystyrene blocks, the sheetlike nanostructures are readily transformed into spherical micelles. Pt center dot center dot center dot Pt and/or pi-pi stacking interactions between the planar platinum(Il) blocks contributed significantly to these aggregate morphologies and their evolutions, leading to remarkable luminescence enhancements. This work represents a novel approach to design and synthesize luminescence platinum(II) plane-coil diblock copolymers, in which the planar platinum(II) complexes individual block for the creation of block copolymers and micellelike aggregates in solution.
C1 [Bu, Weifeng] Lanzhou Univ, Key Lab Nonferrous Met Chem & Resources Utilizat, State Key Lab Appl Organ Chem, Lanzhou, Gansu, Peoples R China.
   [Bu, Weifeng] Lanzhou Univ, Coll Chem & Chem Engn, Lanzhou, Gansu, Peoples R China.
RP Bu, WF (reprint author), Lanzhou Univ, Key Lab Nonferrous Met Chem & Resources Utilizat, State Key Lab Appl Organ Chem, Lanzhou, Gansu, Peoples R China.
EM buwf@lzu.edu.cn
FU NSFC [21474044, 21674044]; Fundamental Research Funds for the Central
   Universities [lzujbky-2015-k04, lzujbky-2016-42]; Open Project of State
   Key Laboratory of Supramolecular Structure and Materials of Jilin
   University [sklssm201601]; Open Research Fund of State Key Laboratory of
   Polymer Physics and Chemistry, Changchun Institute of Applied Chemistry,
   Chinese Academy of Sciences [201626]
FX This work is supported by the NSFC (21474044 and 21674044), the
   Fundamental Research Funds for the Central Universities
   (lzujbky-2015-k04 and lzujbky-2016-42), and the Open Project of State
   Key Laboratory of Supramolecular Structure and Materials of Jilin
   University (sklssm201601). The project was supported by Open Research
   Fund of State Key Laboratory of Polymer Physics and Chemistry, Changchun
   Institute of Applied Chemistry, Chinese Academy of Sciences (201626).
CR ADDISON AW, 1981, J HETEROCYCLIC CHEM, V18, P803
   BAILEY JA, 1995, INORG CHEM, V34, P4591, DOI 10.1021/ic00122a015
   Bender JL, 2002, J AM CHEM SOC, V124, P8526, DOI 10.1021/ja0261269
   Chen YM, 2012, MACROMOLECULES, V45, P2619, DOI 10.1021/ma201495m
   Chiper M, 2008, MACROMOLECULES, V41, P8823, DOI 10.1021/ma801217v
   Discher DE, 2002, SCIENCE, V297, P967, DOI 10.1126/science.1074972
   Dong QC, 2014, ADV FUNCT MATER, V24, P857, DOI 10.1002/adfm.201301143
   Dong Q, 2012, ADV MATER, V24, P1034, DOI 10.1002/adma.201104171
   Eryazici I, 2008, CHEM REV, V108, P1834, DOI 10.1021/cr0781059
   Forster S, 1998, ADV MATER, V10, P195, DOI 10.1002/(SICI)1521-4095(199802)10:3<195::AID-ADMA195>3.0.CO;2-V
   Fraser CL, 2000, J AM CHEM SOC, V122, P9026, DOI 10.1021/ja001360p
   Gohy JF, 2003, CHEM-EUR J, V9, P3472, DOI 10.1002/chem.200214640
   Gohy JF, 2002, MACROMOLECULES, V35, P7427, DOI 10.1021/ma0204812
   Grove LJ, 2008, INORG CHEM, V47, P1408, DOI 10.1021/ic701523e
   Grove LJ, 2004, J AM CHEM SOC, V126, P1594, DOI 10.1021/ja037783j
   Gutacker A, 2012, MACROMOLECULES, V45, P4441, DOI 10.1021/ma202738t
   Hayward RC, 2010, MACROMOLECULES, V43, P3577, DOI 10.1021/ma9026806
   He M, 2011, J MATER CHEM, V21, P17039, DOI 10.1039/c1jm11518a
   Ho CL, 2016, CHEM SOC REV, V45, P5264, DOI 10.1039/c6cs00226a
   Ho CL, 2013, COORDIN CHEM REV, V257, P1614, DOI 10.1016/j.ccr.2012.08.023
   Ho CL, 2011, COORDIN CHEM REV, V255, P2469, DOI 10.1016/j.ccr.2011.01.052
   Hu R, 2014, CHEM SOC REV, V43, P4494, DOI 10.1039/c4cs00044g
   Hu YC, 2011, DALTON T, V40, P12228, DOI 10.1039/c1dt10741k
   Ievins AD, 2008, MACROMOLECULES, V41, P3571, DOI 10.1021/ma800047r
   JENNETTE KW, 1976, J AM CHEM SOC, V98, P6159, DOI 10.1021/ja00436a016
   Johnson RM, 2004, MACROMOLECULES, V37, P2718, DOI 10.1021/ma035494+
   Kim JK, 2009, J AM CHEM SOC, V131, P17768, DOI 10.1021/ja907462h
   Knaapila M, 2010, LANGMUIR, V26, P5056, DOI 10.1021/la903520w
   Kumpfer JR, 2012, J MATER CHEM, V22, P14196, DOI 10.1039/c2jm32160b
   Lee M, 2001, CHEM REV, V101, P3869, DOI 10.1021/cr0001131
   Lee SW, 2012, MACROMOLECULES, V45, P8201, DOI 10.1021/ma301640d
   Li HX, 2016, SOFT MATTER, V12, P1411, DOI 10.1039/c5sm02639c
   Liang JJ, 2015, DALTON T, V44, P66, DOI 10.1039/c4dt02912g
   Liang JJ, 2014, DALTON T, V43, P13174, DOI 10.1039/c4dt01243g
   Lim YB, 2008, J MATER CHEM, V18, P2909, DOI 10.1039/b802639d
   Liu CL, 2011, PROG POLYM SCI, V36, P603, DOI 10.1016/j.progpolymsci.2010.07.008
   Liu G, 2006, J AM CHEM SOC, V128, P10103, DOI 10.1021/ja0610840
   Liu K, 2008, ANGEW CHEM INT EDIT, V47, P1255, DOI 10.1002/anie.200703199
   Liu N, 2013, MACROMOLECULES, V46, P7753, DOI 10.1021/ma4016664
   Liu NJ, 2015, LANGMUIR, V31, P2262, DOI 10.1021/la504817q
   Liu NJ, 2013, J MATER CHEM C, V1, P1130, DOI 10.1039/c2tc00318j
   Liu NJ, 2011, CHEM COMMUN, V47, P9336, DOI 10.1039/c1cc12192h
   Lohmeijer BGG, 2004, CHEM COMMUN, P2886, DOI 10.1039/b411777h
   Lohmeijer BGG, 2002, ANGEW CHEM INT EDIT, V41, P3825, DOI 10.1002/1521-3773(20021018)41:20<3825::AID-ANIE3825>3.0.CO;2-6
   Mathew I, 2010, DALTON T, V39, P5885, DOI 10.1039/b923203f
   Matyjaszewski K, 2001, CHEM REV, V101, P2921, DOI 10.1021/cr940534g
   Matyjaszewski K, 2009, NAT CHEM, V1, P276, DOI [10.1038/nchem.257, 10.1038/NCHEM.257]
   Mei J, 2015, CHEM REV, V115, P11718, DOI 10.1021/acs.chemrev.5b00263
   Meng ZG, 2017, NANOSCALE, V9, P731, DOI 10.1039/c6nr07863j
   Meng ZG, 2016, POLYM CHEM-UK, V7, P4467, DOI 10.1039/c6py00714g
   Moughton AO, 2008, J AM CHEM SOC, V130, P8714, DOI 10.1021/ja800230k
   Moughton AO, 2009, SOFT MATTER, V5, P2361, DOI 10.1039/b818955b
   Mugemana C, 2010, CHEM COMMUN, V46, P1296, DOI 10.1039/b923270b
   Park CM, 2002, CHEM MATER, V14, P1225, DOI 10.1021/cm010731d
   Po C, 2011, J AM CHEM SOC, V133, P12136, DOI 10.1021/ja203920w
   Qu F, 2014, RSC ADV, V4, P9750, DOI 10.1039/c3ra45574b
   Ramanathan M, 2013, J MATER CHEM C, V1, P2080, DOI 10.1039/c3tc00930k
   Rosselli S, 2003, CHEM-EUR J, V9, P3481, DOI 10.1002/chem.200304796
   Rosselli S, 2001, ANGEW CHEM INT EDIT, V40, P3138
   Rowan SJ, 2005, FARADAY DISCUSS, V128, P43, DOI 10.1039/b403135k
   Schacher FH, 2012, ANGEW CHEM INT EDIT, V51, P7898, DOI 10.1002/anie.201200310
   Shen BW, 2016, ANGEW CHEM INT EDIT, V55, P2382, DOI 10.1002/anie.201509190
   Tam AYY, 2009, J AM CHEM SOC, V131, P6253, DOI 10.1021/ja900895x
   Tu GL, 2007, SMALL, V3, P1001, DOI 10.1002/smll.200600351
   Vaidyanathan VG, 2005, EUR J INORG CHEM, P3756, DOI 10.1002/ejic.200500335
   Wang KH, 2000, INORG CHEM, V39, P4022, DOI 10.1021/ic990880m
   Wong KMC, 2011, ACCOUNTS CHEM RES, V44, P424, DOI 10.1021/ar100130j
   Wong WY, 2007, DALTON T, P4495, DOI 10.1039/b711478h
   Wong WY, 2006, COORDIN CHEM REV, V250, P2627, DOI 10.1016/j.ccr.2006.04.014
   Wong WY, 2010, MACROMOL RAPID COMM, V31, P671, DOI 10.1002/marc.200900690
   XU RL, 1991, MACROMOLECULES, V24, P87, DOI 10.1021/ma00001a014
   Yam VWW, 2015, CHEM REV, V115, P7589, DOI 10.1021/acs.chemrev.5b00074
   Yam VWW, 2009, CHEM COMMUN, P6216, DOI 10.1039/b911657e
   Zhang GX, 2015, LANGMUIR, V31, P4593, DOI 10.1021/la5029367
   Zhang J, 2013, CHEM SOC REV, V42, P9127, DOI 10.1039/c3cs60192g
NR 75
TC 0
Z9 0
U1 1
U2 1
PU AMER CHEMICAL SOC
PI WASHINGTON
PA 1155 16TH ST, NW, WASHINGTON, DC 20036 USA
SN 0024-9297
EI 1520-5835
J9 MACROMOLECULES
JI Macromolecules
PD APR 11
PY 2017
VL 50
IS 7
BP 2825
EP 2837
DI 10.1021/acs.macromol.7b00171
PG 13
WC Polymer Science
SC Polymer Science
GA ES1BW
UT WOS:000399263900023
ER

PT J
AU Sharov, A
   Roth, RM
AF Sharov, Artyom
   Roth, Ron M.
TI On the Capacity of Generalized Ising Channels
SO IEEE TRANSACTIONS ON INFORMATION THEORY
LA English
DT Article; Proceedings Paper
CT IEEE International Symposium on Information Theory (ISIT)
CY JUN 14-19, 2015
CL Hong Kong, PEOPLES R CHINA
SP IEEE, IEEE Informat Theory Soc, HUAWEI, VTECH, Qualcomm, Google, Croucher Fdn, IBM, BROADCOM, Mediatek, iSN State Key Lab, INC, ITS, SENG, Hong Kong Polytechn Univ, K C Wong Educ Fdn, NSF, Hong Kong Univ Sci & Technol, Sch Engn
DE Granular media; dynamic programming; channel capacity; magnetic
   recording; feedback
ID BIT-PATTERNED MEDIA; FEEDBACK CAPACITY
AB Nearly tight lower and upper bounds on the capacity of generalized Ising channels are presented. For the case where feedback is allowed, a closed-form expression for the capacity is found for channel error probability p is an element of[0, p(0)], where p(0) approximate to 0.398324. A near-capacity-achieving family of encoders is presented for the values p is an element of[0, p(0)]. Two lower bounds on that capacity for larger values of p are presented, one of which is tight on the interval [p(0), 0.5].
C1 [Sharov, Artyom; Roth, Ron M.] Technion Israel Inst Technol, Comp Sci Dept, IL-3200003 Haifa, Israel.
RP Sharov, A (reprint author), Technion Israel Inst Technol, Comp Sci Dept, IL-3200003 Haifa, Israel.
EM sharov@cs.technion.ac.il; ronny@cs.technion.ac.il
FU Israel Science Foundation [1092/12, 1396/16]
FX This work was supported by the Israel Science Foundation under Grant
   1092/12 and Grant 1396/16.
CR ARAPOSTATHIS A, 1993, SIAM J CONTROL OPTIM, V31, P282, DOI 10.1137/0331018
   Asnani H, 2013, IEEE INT SYMP INFO, P2538, DOI 10.1109/ISIT.2013.6620684
   BELLMAN R, 1957, J MATH MECH, V6, P679
   BERGER T, 1990, IEEE T INFORM THEORY, V36, P173, DOI 10.1109/18.50386
   Bertsekas D., 1976, DYNAMIC PROGRAMMING
   BLACKWELL D, 1958, ANN MATH STAT, V29, P1209, DOI 10.1214/aoms/1177706452
   Boyd S, 2004, CONVEX OPTIMIZATION
   COVER TM, 1973, IEEE T INFORM THEORY, V19, P73, DOI 10.1109/TIT.1973.1054929
   Cover T. M., 1991, ELEMENTS INFORM THEO
   Elishco O, 2014, IEEE T INFORM THEORY, V60, P5138, DOI 10.1109/TIT.2014.2331951
   Gallager R., 1968, INFORM THEORY RELIAB
   Greaves S, 2010, IEEE T MAGN, V46, P1460, DOI 10.1109/TMAG.2010.2043221
   Immink K. A. S., 2004, CODES MASS DATA STOR
   Ising E, 1925, Z PHYS, V31, P253, DOI 10.1007/BF02980577
   Iyengar AR, 2011, IEEE T MAGN, V47, P35, DOI 10.1109/TMAG.2010.2080667
   Kim YH, 2008, IEEE T INFORM THEORY, V54, P1488, DOI 10.1109/TIT.2008.917685
   Kramer G, 2003, IEEE T INFORM THEORY, V49, P4, DOI 10.1109/TIT.2002.806135
   Lenz W., 1920, Physikalische Zeitschrift, V21, P613
   MARKO H, 1973, IEEE T COMMUN, VCO21, P1345, DOI 10.1109/TCOM.1973.1091610
   Massey J. L., 1990, P INT S INF THEOR AP, P303
   Mazumdar A, 2011, IEEE T INFORM THEORY, V57, P7403, DOI 10.1109/TIT.2011.2158514
   Permuter H, 2008, IEEE T INFORM THEORY, V54, P3150, DOI 10.1109/TIT.2008.924681
   Sabag O, 2016, IEEE INT SYMP INFO, P310, DOI 10.1109/ISIT.2016.7541311
   Sharov A, 2014, IEEE T INFORM THEORY, V60, P2010, DOI 10.1109/TIT.2014.2301811
   Sharov A, 2010, IEEE INT SYMP INFO, P1208, DOI 10.1109/ISIT.2010.5513233
   Tallini LG, 2008, IEEE T INFORM THEORY, V54, P1357, DOI 10.1109/TIT.2007.915919
   Tatikonda S., 2000, THESIS
   Tatikonda S, 2009, IEEE T INFORM THEORY, V55, P323, DOI 10.1109/TIT.2008.2008147
   Vontobel PO, 2008, IEEE T INFORM THEORY, V54, P1887, DOI [10.1109/TIT.2008.920243, 10.1109/TIT.2008.926243]
   Yang SH, 2005, IEEE T INFORM THEORY, V51, P799, DOI 10.1109/TIT.2004.842626
   Yang SH, 2007, IEEE T INFORM THEORY, V53, P929, DOI 10.1109/TIT.2006.890728
NR 31
TC 0
Z9 0
U1 0
U2 0
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9448
EI 1557-9654
J9 IEEE T INFORM THEORY
JI IEEE Trans. Inf. Theory
PD APR
PY 2017
VL 63
IS 4
BP 2338
EP 2356
DI 10.1109/TIT.2016.2645560
PG 19
WC Computer Science, Information Systems; Engineering, Electrical &
   Electronic
SC Computer Science; Engineering
GA ER2AE
UT WOS:000398595500026
ER

PT J
AU Ball, DK
   Gunther, S
   Fritzsche, M
   Lenz, K
   Varvaro, G
   Laureti, S
   Makarov, D
   Mucklich, A
   Facsko, S
   Albrecht, M
   Fassbender, J
AF Ball, D. K.
   Guenther, S.
   Fritzsche, M.
   Lenz, K.
   Varvaro, G.
   Laureti, S.
   Makarov, D.
   Muecklich, A.
   Facsko, S.
   Albrecht, M.
   Fassbender, J.
TI Out-of-plane magnetized cone-shaped magnetic nanoshells
SO JOURNAL OF PHYSICS D-APPLIED PHYSICS
LA English
DT Article
DE 2D magnetic shells; self-assembled nanostructures; Co/Pd multilayers;
   magnetic properties; exchange coupling
ID BLOCK-COPOLYMER LITHOGRAPHY; BIT-PATTERNED MEDIA; THIN-FILMS; INCLINED
   ANISOTROPY; SPIN TEXTURES; MULTILAYERS; ARRAYS; FIELD; DOTS
AB The geometry of a magnetic nano-object, namely its shape and dimensions determines the complex electromagnetic responses. Here, we address the geometry-induced changes of the magnetic properties of thin ferromagnetic Co/Pd multilayers with out-of-plane magnetic anisotropy deposited on three-dimensionally curved templates. For this purpose, arrays of self-assembled cone-shaped nano-objects with a chracteristic size of either 30 or 70 nm were created in GaSb(001) by the ion erosion technique. The templates are designed in the way that the shape of the cone remains the same for all the samples; namely, we keep the opening angle at about 55 degrees by adjusting the ratio between the cone height and its base diameter to be about 1. In this case, we are able to address the impact of the linear dimensions of the object on the magnetic properties and exclude the impact of the shape from the consideration. The deposition of 15 nm thick Co/Pd multilayers on top of the cone templates results in the formation of a close-packed array of 2D magnetic cone-shaped shells. Integral angledependent magnetometry measurements demonstrate that the local curvature results in the spread of the easy axes of magnetization following the shape of the nanocones independent of the linear dimensions of the cones. At the same time different local magnetic domain patterns are observed for samples prepared on 30 and 70 nm large cones. When the thickness of the magnetic shell is only half of the linear dimension of a cone, a clear multidomain state is observed. Remarkably, we find that the neighboring magnetic cone-shaped shells are exchange decoupled when the linear dimension of a cone is four times larger compared to the thickness of the magnetic shell. These findings are relevant for the further development of tilted bit patterned magnetic recording media as well as for the emergent field of magnetism in curved geometries.
C1 [Ball, D. K.; Fritzsche, M.; Lenz, K.; Makarov, D.; Muecklich, A.; Facsko, S.; Fassbender, J.] Helmholtz Zentrum Dresden Rossendorf, Inst Ion Beam Phys & Mat Res, Bautzner Landstr 400, D-01328 Dresden, Germany.
   [Guenther, S.; Makarov, D.; Albrecht, M.] Tech Univ Chemnitz, Inst Phys, D-09107 Chemnitz, Germany.
   [Varvaro, G.; Laureti, S.] CNR, Ist Struttura Mat, nM2 Lab, I-00015 Rome, Italy.
   [Albrecht, M.] Univ Augsburg, Inst Phys, Univ Str 1 Nord, D-86159 Augsburg, Germany.
   [Fassbender, J.] Tech Univ Dresden, Inst Phys Solids, Zellescher Weg 16, D-01069 Dresden, Germany.
RP Lenz, K (reprint author), Helmholtz Zentrum Dresden Rossendorf, Inst Ion Beam Phys & Mat Res, Bautzner Landstr 400, D-01328 Dresden, Germany.
EM k.lenz@hzdr.de
FU Deutsche Forschungsgemeinschaft DFG [FA 314/7-1, AL 618/6]; Ministero
   dell'Istruzione, dell'Universita e della Ricerca [FIRB2010 NANOREST];
   ERC within the EU Seventh Framework Programme (ERC) [306277]; EU FET
   Programme [618083]; Ion Beam Center (IBC) at HZDR
FX This work was supported in part by the Deutsche Forschungsgemeinschaft
   DFG (Grants no. FA 314/7-1 and AL 618/6), Ministero dell'Istruzione,
   dell'Universita e della Ricerca: FIRB2010 NANOREST, ERC within the EU
   Seventh Framework Programme (ERC Grant No. 306277) and the EU FET
   Programme (FET- Open Grant No. 618083). Support by the Ion Beam Center
   (IBC) at HZDR is greatfully acknowledged. Furthermore we would like to
   acknowledge E Patrizi for technical assistance in magnetic measurements.
CR Adeyeye AO, 2008, J PHYS D APPL PHYS, V41, DOI 10.1088/0022-3727/41/15/153001
   Albrecht M, 2005, NAT MATER, V4, P203, DOI 10.1038/nmat1324
   Albrecht M, 2012, SURF SCI, V4, P42
   Ball DK, 2014, NANOTECHNOLOGY, V25, DOI 10.1088/0957-4484/25/8/085703
   Baraban L, 2013, NANOSCALE, V5, P1332, DOI 10.1039/c2nr32662k
   Bates CM, 2014, MACROMOLECULES, V47, P2, DOI 10.1021/ma401762n
   Bobek T, 2003, PHYS REV B, V68, DOI 10.1103/PhysRevB.68.085324
   Facsko S, 2001, PHYS REV B, V63, DOI 10.1103/PhysRevB.63.165329
   Facsko S, 1999, SCIENCE, V285, P1551, DOI 10.1126/science.285.5433.1551
   Faustini M, 2012, CHEM MATER, V24, P1072, DOI 10.1021/cm2033492
   Gaididei Y, 2014, PHYS REV LETT, V112, DOI 10.1103/PhysRevLett.112.257203
   Gibbs JG, 2014, NANOSCALE, V6, P9457, DOI 10.1039/c4nr00403e
   Griffiths RA, 2013, J PHYS D APPL PHYS, V46, DOI 10.1088/0022-3727/46/50/503001
   Hertel R, 2013, SPIN-SINGAPORE, V3, DOI 10.1142/S2010324713400092
   Honda N, 2011, PHYSCS PROC, V16, DOI 10.1016/j.phpro.2011.06.099
   Honda N, 2011, IEEE T MAGN, V47, P11, DOI 10.1109/TMAG.2010.2078802
   Honda N, 2008, IEEE T MAGN, V44, P3438, DOI 10.1109/TMAG.2008.2002528
   Hu G, 2005, J APPL PHYS, V97, DOI 10.1063/1.1849572
   Karnaushenko D, 2015, ADV MATER, V27, P6582, DOI 10.1002/adma.201503127
   Kondratyev VN, 1998, PHYS REV LETT, V81, P4508, DOI 10.1103/PhysRevLett.81.4508
   Liedke MO, 2013, PHYS REV B, V87, DOI 10.1103/PhysRevB.87.024424
   Liedke MO, 2012, APPL PHYS LETT, V100, DOI 10.1063/1.4729151
   Makarov D, 2016, BIT PATTERNED MAGNET, P327
   Makarov D, 2016, APPL PHYS REV, V3, DOI 10.1063/1.4938497
   Mari A, 2009, SUPERLATTICE MICROST, V46, P95, DOI 10.1016/j.spmi.2009.02.001
   Meyerheim HL, 2005, PHYS REV B, V72, DOI 10.1103/PhysRevB.72.113403
   Otalora JA, 2012, APPL PHYS LETT, V100, DOI 10.1063/1.3687154
   Phatak C, 2014, NANO LETT, V14, P759, DOI 10.1021/nl404071u
   Pylypovskyi OV, 2016, SCI REP-UK, V6, DOI 10.1038/srep23316
   Pylypovskyi OV, 2015, PHYS REV LETT, V114, DOI 10.1103/PhysRevLett.114.197204
   Rasappa S, 2012, THIN SOLID FILMS, V522, P318, DOI 10.1016/j.tsf.2012.09.017
   Sapozhnikov MV, 2012, PHYS REV B, V85, DOI 10.1103/PhysRevB.85.054402
   Sheka DD, 2015, J PHYS A-MATH THEOR, V48, DOI 10.1088/1751-8113/48/12/125202
   SIMSOVA J, 1994, IEEE T MAGN, V30, P784, DOI 10.1109/20.312408
   Smith EJ, 2011, PHYS REV LETT, V107, DOI 10.1103/PhysRevLett.107.097204
   Soares MM, 2008, PHYS REV B, V77, DOI 10.1103/PhysRevB.77.224405
   Streubel R, 2016, J PHYS D APPL PHYS, V49, DOI 10.1088/0022-3727/49/36/363001
   Streubel R, 2015, PHYS REV B, V92, DOI 10.1103/PhysRevB.92.104431
   Streubel R, 2015, APPL PHYS LETT, V107, DOI 10.1063/1.4931101
   Streubel R, 2015, NAT COMMUN, V6, DOI 10.1038/ncomms8612
   Streubel R, 2015, SCI REP-UK, V5, DOI 10.1038/srep08787
   Streubel R, 2012, APPL PHYS LETT, V101, DOI 10.1063/1.4756708
   Streubel R, 2012, NANO LETT, V12, P3961, DOI 10.1021/nl301147h
   Teichert C, 2003, APPL PHYS A-MATER, V76, P653, DOI 10.1007/s00339-002-2010-7
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Ulbrich TC, 2010, PHYS REV B, V81, DOI 10.1103/PhysRevB.81.054421
   Ulbrich TC, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.077202
   Varvaro G, 2008, J PHYS D APPL PHYS, V41, DOI 10.1088/0022-3727/41/13/134017
   Varvaro G, 2008, IEEE T MAGN, V44, P643, DOI 10.1109/TMAG.2008.918205
   Wen TL, 2015, NANOSCALE, V7, P4906, DOI 10.1039/c4nr07489k
   Yan M, 2012, APPL PHYS LETT, V100, DOI 10.1063/1.4727909
   Yan M, 2011, APPL PHYS LETT, V99, DOI 10.1063/1.3643037
   Yan M, 2010, PHYS REV LETT, V104, DOI 10.1103/PhysRevLett.104.057201
   JOHNSON MT, 1996, Patent No. 591409
NR 54
TC 0
Z9 0
U1 5
U2 5
PU IOP PUBLISHING LTD
PI BRISTOL
PA TEMPLE CIRCUS, TEMPLE WAY, BRISTOL BS1 6BE, ENGLAND
SN 0022-3727
EI 1361-6463
J9 J PHYS D APPL PHYS
JI J. Phys. D-Appl. Phys.
PD MAR 22
PY 2017
VL 50
IS 11
AR 115004
DI 10.1088/1361-6463/aa5c26
PG 7
WC Physics, Applied
SC Physics
GA EN3RV
UT WOS:000395926500001
ER

PT J
AU Leydesdorff, L
   Petersen, AM
   Ivanova, I
AF Leydesdorff, Loet
   Petersen, Alexander M.
   Ivanova, Inga
TI Self-organization of meaning and the reflexive communication of
   information
SO SOCIAL SCIENCE INFORMATION SUR LES SCIENCES SOCIALES
LA English
DT Article
DE codification; horizontal and vertical differentiation; redundancy;
   reflection; triple helix
ID UNIVERSITY-INDUSTRY-GOVERNMENT; TRIPLE-HELIX; GENERALIZED MEDIA;
   SYSTEMS; MODEL; REDUNDANCY; FUTURE
AB Following a suggestion from Warren Weaver, we extend the Shannon model of communication piecemeal into a complex systems model in which communication is differentiated both vertically and horizontally. This model enables us to bridge the divide between Niklas Luhmann's theory of the self-organization of meaning in communications and empirical research using information theory. First, we distinguish between communication relations and correlations among patterns of relations. The correlations span a vector space in which relations are positioned and can be provided with meaning. Second, positions provide reflexive perspectives. Whereas the different meanings are integrated locally, each instantiation opens global perspectives - 'horizons of meaning' - along eigenvectors of the communication matrix. These next-order codifications of meaning can be expected to generate redundancies when interacting in instantiations. Increases in redundancy indicate new options and can be measured as local reduction of prevailing uncertainty (in bits). The systemic generation of new options can be considered as a hallmark of the knowledge-based economy.
C1 [Leydesdorff, Loet] Univ Amsterdam, Amsterdam Sch Commun Res ASCoR, POB 15793, NL-1001 NG Amsterdam, Netherlands.
   [Petersen, Alexander M.] Univ Calif, Sch Engn, Management Program, Merced, CA USA.
   [Ivanova, Inga] NRU HSE, Inst Stat Studies & Econ Knowledge, Moscow, Russia.
RP Leydesdorff, L (reprint author), Univ Amsterdam, Amsterdam Sch Commun Res ASCoR, POB 15793, NL-1001 NG Amsterdam, Netherlands.
EM l.a.leydesdorff@uva.nl
RI Ivanova, Inga/D-3130-2014
OI Ivanova, Inga/0000-0002-5441-5231
FU EU COST Action TD1210 'KnowEscape'; Basic Research Program at the
   National Research University Higher School of Economics (HSE); Russian
   Academic Excellence Project '5-100'
FX The authors would like to thank the EU COST Action TD1210 'KnowEscape'
   for its support. Inga Ivanova also thanks the Basic Research Program at
   the National Research University Higher School of Economics (HSE) and
   the Russian Academic Excellence Project '5-100' for their support.
CR Abramson N, 1963, INFORM THEORY CODING
   Achterbergh J., 2009, ORG SOCIAL SYSTEMS C
   Andersen ES, 1992, ARTIFICIAL EC EVOLUT
   Arthur WB, 2009, NATURE TECHNOLOGY
   Bar-Hillel Y., 1953, BRIT J PHILOS SCI, V4, P147, DOI [DOI 10.1093/BJPS/IV.14.147, 10.2307/685989]
   Bateson G., 1972, STEPS ECOLOGY MIND
   Bianconi G, 2014, PHYS REV E, V90, DOI 10.1103/PhysRevE.90.042806
   Boudon R, 1979, LA LOGIQUE DU SOCIAL
   Boulding K., 1978, ECODYNAMICS NEW THEO
   Bourdieu P, 2004, SCI SCI REFLEXIVITY
   BOURDIEU P., 1976, ACTES RECHERCHE SCI, V2, P88, DOI DOI 10.3406/ARSS.1976.3454
   Brillouin L., 1962, SCI INFORM THEORY
   Brooks DR, 1986, EVOLUTION AS ENTROPY
   Burt RS, 1982, STRUCTURAL THEORY AC
   Cowan R., 1997, IND CORP CHANGE, V6, P595, DOI DOI 10.1093/ICC/6.3.595
   de Nooy W, 2015, J INFORMETR, V9, P542, DOI 10.1016/j.joi.2015.04.005
   DOSI G, 1982, RES POLICY, V11, P147, DOI 10.1016/0048-7333(82)90016-6
   Dubois DM, 2003, LECT NOTES ARTIF INT, V2684, P110
   Dubois DM, 1998, AIP CONF PROC, V437, P3
   Fujigaki Y, 1998, SOC SCI INFORM, V37, P5, DOI 10.1177/053901898037001001
   Fujigaki Y, 2000, SOC SCI INFORM, V39, P635, DOI 10.1177/053901800039004004
   Giddens Anthony, 1984, CONSTITUTION SOC
   Giddens A., 1979, CENTRAL PROBLEMS SOC
   Gilbert G., 1984, OPENING PANDORAS BOX
   Haken H, 2014, INFORMATION ADAPTATI
   Hayles NK, 1990, CHAOS BOUND ORDERLY
   Hoffmeyer J, 1991, SEMIOTIC MODELING, P117
   Husserl E, 1960, CARTESIANISCHE MEDIT
   HUSSERL Edmund, 1962, KRISIS EUROPAISCHEN
   Ivanova IA, 2014, TECHNOL FORECAST SOC, V86, P143, DOI 10.1016/j.techfore.2013.08.022
   Ivanova IA, 2014, SCIENTOMETRICS, V99, P927, DOI 10.1007/s11192-014-1241-7
   Kauffman S. A., 2000, INVESTIGATIONS
   Kauffman S, 2008, BIOL PHILOS, V23, P27, DOI 10.1007/s10539-007-9066-x
   Krippendorff K, 2009, INT J GEN SYST, V38, P669, DOI 10.1080/03081070902993160
   Krippendorff K, 2009, INT J GEN SYST, V38, P189, DOI 10.1080/03081070802621846
   Kuhn T, 1962, STRUCTURE SCI REVOLU
   KUNZLER J, 1987, Z SOZIOL, V16, P317
   Latour B, 1988, KNOWLEDGE REFLEXIVIT, P155
   Leydesdorff L, 1996, SOC SCI INFORM, V35, P283, DOI 10.1177/053901896035002007
   Leydesdorff L, 2014, J ASSOC INF SCI TECH, V65, P386, DOI 10.1002/asi.22973
   Leydesdorff L, 2010, ENTROPY-SWITZ, V12, P63, DOI 10.3390/e12010063
   LUHMANN N, 1974, Z SOZIOL, V3, P236
   Luhmann N, 1996, SOC SCI INFORM, V35, P257, DOI 10.1177/053901896035002005
   Luhmann N, 2000, ORG ENTSCHEIDUNG
   Luhmann N., 1997, GESELLSCHAFT GESELLS
   Luhmann N., 1995, SOZIOLOGISCHE AUFKLA, V6, P169
   Luhmann N., 1995, SOCIAL SYSTEMS
   Luhmann N, 1986, ARCH FILOSOFIA, V54, P41
   Luhmann N., 1984, SOZIALE SYSTEME GRUN
   Luhmann N, 1995, NEUZEITLICHEN WISSEN
   Luhmann N., 2013, THEORY OF SOC, V2
   Luhmann Niklas, 1990, WISSENSCHAFT GESELLS
   Luhmann N, 1975, ZUKUNFT PHILOS, P85
   Luhmann N., 1986, SOCIOCYBERNETIC PARA, P172
   MacKay D.M., 1969, INFORM MECH MEANING
   Maturana HR, 1978, PSYCHOL BIOL LANGUAG, P27
   MCGILL WJ, 1954, PSYCHOMETRIKA, V19, P97
   Mead GH, 1934, MIND SELF SOC STAND
   Nelson R., 1982, EVOLUTIONARY THEORY
   Newell A., 1972, HUMAN PROBLEM SOLVIN
   Nietzsche F, 1967, MENSCHLICHES ALIZUME
   PARSONS T, 1963, PUBLIC OPIN QUART, V27, P37, DOI 10.1086/267148
   Parsons T, 1968, INT ENCYCL SOC SCI, V7, P429
   Parsons T., 1963, P AM PHILOS SOC, V107, P232
   Petersen AM, 2016, RES POLICY, V45, P666, DOI 10.1016/j.respol.2015.12.004
   Pickering A., 1995, MANGLE PRACTICE TIME
   Popper Karl R., 1959, LOGIC SCI DISCOVERY
   Popper K. R., 1972, OBJECTIVE KNOWLEDGE
   Salton G, 1983, INTRO MODERN INFORM
   Schiffman S. F., 1981, INTRO MULTIDIMENSION
   SHANNON CE, 1948, AT&T TECH J, V27, P623
   Simmel G, 1902, AM J SOCIOL, V8, P1, DOI 10.1086/211115
   SIMON HA, 1973, PHILOS SCI, V40, P471, DOI 10.1086/288559
   Simon H. A., 1973, HIERARCHY THEORY CHA, P1
   Sun Y, 2010, SCIENTOMETRICS, V82, P677, DOI 10.1007/s11192-010-0179-7
   Theil H., 1972, STAT DECOMPOSITION A
   Ulanowicz RE, 2009, ECOL MODEL, V220, P1886, DOI 10.1016/j.ecolmodel.2009.04.015
   Varela Fransisco J., 1979, PRINCIPLES BIOL AUTO
   von Glasersfeld E, 2008, CONSTR FOUND, V3, P59
   Von Foerster H, 1960, SELF ORG SYSTEMS, P31
   Von Foerster H, 1982, OBSERVING SYSTEMS IN
   Weaver W, 1949, MATH THEORY COMMUNIC, P93
   Yeung R. W., 2008, INFORM THEORY NETWOR
NR 83
TC 0
Z9 0
U1 6
U2 6
PU SAGE PUBLICATIONS LTD
PI LONDON
PA 1 OLIVERS YARD, 55 CITY ROAD, LONDON EC1Y 1SP, ENGLAND
SN 0539-0184
EI 1461-7412
J9 SOC SCI INFORM
JI Soc. Sci. Inf. Sci. Soc.
PD MAR
PY 2017
VL 56
IS 1
BP 4
EP 27
DI 10.1177/0539018416675074
PG 24
WC Information Science & Library Science; Social Sciences,
   Interdisciplinary
SC Information Science & Library Science; Social Sciences - Other Topics
GA EL5NU
UT WOS:000394668600002
PM 28232771
ER

PT J
AU Vazza, F
AF Vazza, F.
TI On the complexity and the information content of cosmic structures
SO MONTHLY NOTICES OF THE ROYAL ASTRONOMICAL SOCIETY
LA English
DT Article
DE chaos; MHD; plasmas; turbulence; methods: numerical; intergalactic
   medium
ID ADAPTIVE MESH REFINEMENT; GALAXY CLUSTERS; MAGNETIC-FIELDS; PLASMA
   INSTABILITIES; COMPARISON PROJECT; SHANNON ENTROPY; SHOCK-WAVES;
   SIMULATIONS; TURBULENCE; GAS
AB The emergence of cosmic structure is commonly considered one of the most complex phenomena in nature. However, this complexity has never been defined nor measured in a quantitative and objective way. In this work, we propose a method to measure the information content of cosmic structure and to quantify the complexity that emerges from it, based on Information Theory. The emergence of complex evolutionary patterns is studied with a statistical symbolic analysis of the datastream produced by state-of-the-art cosmological simulations of forming galaxy clusters. This powerful approach allows us to measure how many bits of information is necessary to predict the evolution of energy fields in a statistical way, and it offers a simple way to quantify when, where and how the cosmic gas behaves in complex ways. The most complex behaviours are found in the peripheral regions of galaxy clusters, where supersonic flows drive shocks and large energy fluctuations over a few tens of million years. Describing the evolution of magnetic energy requires at least twice as large amount of bits as required for the other energy fields. When radiative cooling and feedback from galaxy formation are considered, the cosmic gas is overall found to double its degree of complexity. In the future, Cosmic Information Theory can significantly increase our understanding of the emergence of cosmic structure as it represents an innovative framework to design and analyse complex simulations of the Universe in a simple, yet powerful way.
C1 [Vazza, F.] Hamburger Sternwarte, Gojenbergsweg 112, D-20535 Hamburg, Germany.
   [Vazza, F.] INAF, Ist Radioastron Bologna, Via Gobetti 101, I-41029 Bologna, Italy.
RP Vazza, F (reprint author), Hamburger Sternwarte, Gojenbergsweg 112, D-20535 Hamburg, Germany.; Vazza, F (reprint author), INAF, Ist Radioastron Bologna, Via Gobetti 101, I-41029 Bologna, Italy.
EM franco.vazza@hs.uni-hamburg.de
FU JURECA cluster at the Juelich Supercomputing Centre (JSC) [7006, 9016];
   Deutsche Forschungsgemeinschaft (DFG) [VA 876/3-1, FOR1254]; European
   Union's Horizon research and innovation programme under the
   Marie-Sklodowska-Curie grant [664931]
FX Computations described in this work were performed using the ENZO code
   (http://enzo-project.org), which is the product of a collaborative
   effort of scientists at many universities and national laboratories. I
   acknowledge the usage of computational resources on the JURECA cluster
   at the Juelich Supercomputing Centre (JSC), under projects no. 7006 and
   9016. I acknowledge personal support from the grants VA 876/3-1 and
   FOR1254 from the Deutsche Forschungsgemeinschaft (DFG). I acknowledge
   funding from the European Union's Horizon 2020 research and innovation
   programme under the Marie-Sklodowska-Curie grant agreement no. 664931. I
   gratefully acknowledge useful feedback from the anonymous referee of
   this paper, which resulted into a better presentation of these results.
   I thank Annalisa and Leonardo for giving me the necessary 'free' time
   that gave me the inspiration for this work.
CR Adami C, 2002, BIOESSAYS, V24, P1085, DOI 10.1002/bies.10192
   Beresnyak A, 2016, ASTROPHYS J, V817, DOI 10.3847/0004-637X/817/2/127
   Bonafede A, 2013, MON NOT R ASTRON SOC, V433, P3208, DOI 10.1093/mnras/stt960
   Brunetti G, 2011, MON NOT R ASTRON SOC, V412, P817, DOI 10.1111/j.1365-2966.2010.17937.x
   Bryan GL, 2014, ASTROPHYS J SUPPL S, V211, DOI 10.1088/0067-0049/211/2/19
   Chaitin G. J., 1995, ARXIVCHAODYN9509014
   Crutchfield JP, 2003, CHAOS, V13, P25, DOI 10.1063/1.1530990
   Crutchfield JP, 1997, PHYS REV E, V55, pR1239
   de Avellar MGB, 2012, PHYS LETT A, V376, P1085, DOI [10.1016/j.physleta.2012.02.012, 10.1016/j.physleta.2012.C2.012]
   Dolag K, 2009, MON NOT R ASTRON SOC, V399, P497, DOI 10.1111/j.1365-2966.2009.15034.x
   EFSTATHIOU G, 1985, ASTROPHYS J SUPPL S, V57, P241, DOI 10.1086/191003
   Ensslin TA, 2013, PHYS REV E, V87, DOI 10.1103/PhysRevE.87.013308
   Ensslin TA, 2011, PHYS REV D, V83, DOI 10.1103/PhysRevD.83.105014
   Ensslin TA, 2009, PHYS REV D, V80, DOI 10.1103/PhysRevD.80.105005
   Fernandez N, 2014, EMERGENCE COMPLEX CO, V9, P19, DOI 10.1007/978-3-642-53734-9_2
   Frenk CS, 1999, ASTROPHYS J, V525, P554, DOI 10.1086/307908
   Grassberger P, 2013, J STAT PHYS, V153, P289, DOI 10.1007/s10955-013-0824-7
   Heitmann Katrin, 2008, Computational Science and Discovery, V1, DOI 10.1088/1749-4699/1/1/015003
   Hoffman FM, 2011, PROCEDIA COMPUT SCI, V4, P1450, DOI 10.1016/j.procs.2011.04.157
   Hosoya A, 2004, PHYS REV LETT, V92, DOI 10.1103/PhysRevLett.92.141302
   Kauffmann G, 1999, MON NOT R ASTRON SOC, V303, P188, DOI 10.1046/j.1365-8711.1999.02202.x
   KOLMOGOROV AN, 1968, INT J COMPUT MATH, V2, P157, DOI 10.1080/00207166808803030
   Kravtsov AV, 2012, ANNU REV ASTRON ASTR, V50, P353, DOI 10.1146/annurev-astro-081811-125502
   Kunz MW, 2011, MON NOT R ASTRON SOC, V410, P2446, DOI 10.1111/j.1365-2966.2010.17621.x
   Larson JW, 2011, PROCEDIA COMPUT SCI, V4, P1592, DOI 10.1016/j.procs.2011.04.172
   Li N, 2012, PHYS REV D, V86, DOI 10.1103/PhysRevD.86.083539
   Miniati F, 2015, NATURE, V523, P59, DOI 10.1038/nature14552
   Pandey B, 2015, MON NOT R ASTRON SOC, V454, P2647, DOI 10.1093/mnras/stv2166
   Pandey B, 2013, MON NOT R ASTRON SOC, V430, P3376, DOI 10.1093/mnras/stt134
   Peebles Phillip J., 1993, PRINCIPLES PHYS COSM
   Prokopenko M, 2009, COMPLEXITY, V15, P11, DOI 10.1002/cplx.20249
   Ryu D, 2003, ASTROPHYS J, V593, P599, DOI 10.1086/376723
   Sarazin C. L., 1988, XRAY EMISSION CLUSTE
   Scannapieco C, 2012, MON NOT R ASTRON SOC, V423, P1726, DOI 10.1111/j.1365-2966.2012.20993.x
   Schekochihin AA, 2005, ASTROPHYS J, V629, P139, DOI 10.1086/431202
   Schmidt W, 2015, ASTRON COMPUT, V9, P49, DOI 10.1016/j.ascom.2014.11.003
   SHALIZI CR, 2004, PHYS REV LETT, V93, DOI 10.1103/PhysRevLett.93.149902
   SHANNON CE, 1949, P IRE, V37, P10, DOI 10.1109/JRPROC.1949.232969
   Shannon CE, 1949, MATH THEORY COMMUNIC
   Springel V, 2005, NATURE, V435, P629, DOI 10.1038/nature03597
   SUNYAEV RA, 1972, ASTRON ASTROPHYS, V20, P189
   Vazza F, 2017, MON NOT R ASTRON SOC, V464, P210, DOI 10.1093/mnras/stw2351
   Vazza F, 2016, MON NOT R ASTRON SOC, V459, P70, DOI 10.1093/mnras/stw584
   Vazza F, 2014, MON NOT R ASTRON SOC, V445, P3706, DOI 10.1093/mnras/stu1896
   Vazza F, 2013, MON NOT R ASTRON SOC, V428, P2366, DOI 10.1093/mnras/sts213
   Vazza F, 2012, ASTRON ASTROPHYS, V544, DOI 10.1051/0004-6361/201118688
   Vazza F, 2011, MON NOT R ASTRON SOC, V418, P960, DOI 10.1111/j.1365-2966.2011.19546.x
   Vazza F, 2011, ASTRON ASTROPHYS, V529, DOI 10.1051/0004-6361/201016015
   Vazza F, 2011, MON NOT R ASTRON SOC, V410, P461, DOI 10.1111/j.1365-2966.2010.17455.x
   Vogelsberger M, 2014, NATURE, V509, P177, DOI 10.1038/nature13316
   Wittor D, 2017, MON NOT R ASTRON SOC, V464, P4448, DOI 10.1093/mnras/stw2631
   WOLFRAM S, 1984, PHYSICA D, V10, P1, DOI 10.1016/0167-2789(84)90245-8
   Xu H, 2009, ASTROPHYS J LETT, V698, pL14, DOI 10.1088/0004-637X/698/1/L14
   Zhuravleva I, 2015, MON NOT R ASTRON SOC, V450, P4184, DOI 10.1093/mnras/stv900
NR 54
TC 0
Z9 0
U1 1
U2 1
PU OXFORD UNIV PRESS
PI OXFORD
PA GREAT CLARENDON ST, OXFORD OX2 6DP, ENGLAND
SN 0035-8711
EI 1365-2966
J9 MON NOT R ASTRON SOC
JI Mon. Not. Roy. Astron. Soc.
PD MAR
PY 2017
VL 465
IS 4
BP 4942
EP 4955
DI 10.1093/mnras/stw3089
PG 14
WC Astronomy & Astrophysics
SC Astronomy & Astrophysics
GA EM2UC
UT WOS:000395170200085
ER

PT J
AU Nguyen, CD
   Lee, J
AF Chi Dinh Nguyen
   Lee, Jaejin
TI 9/12 2-D Modulation Code for Bit-Patterned Media Recording
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT Asia-Pacific Magnetic Recording Conference (APMRC)
CY JUL 13-15, 2016
CL Yonsei Univ, Seoul, SOUTH KOREA
HO Yonsei Univ
DE Bit-patterned media recording (BPMR); intersymbol interference (ISI);
   intertrack interference (ITI); modulation coding
ID LITHOGRAPHY; FABRICATION; STORAGE; ERROR; NOISE
AB This paper presents a 9/12 2-D modulation code to overcome 2-D interference effects in bit-patterned media recording (BPMR) systems. Next-generation storage systems that are challenged by the superparamagnetic effect require new technologies to be developed, and for magnetic recording, BPMR technology is regarded to be one of the most promising candidates to extend area density beyond 1 Tb/in(2). BPMR systems not only help to reduce transition noise and non-linear bit shift, but they also simplify the tracking operation. Nevertheless, some challenges arise for BPMR systems from a signal processing point of view. One of the primary challenges in the systems is the 2-D interference due to the effects of both the along- and across-track intersymbol interference. Moreover, the effect of media noise and the physical limits of the electromechanical components also negatively impact the system performance. The proposed modulation code converts 9 b sequences of user data into 2-D output codewords in 6-by-2 arrays to avoid fatal interference as much as possible, and a reasonable Hamming distance is also ensured for the codeword set. The proposed code achieves gains of about 2 and 1 dB over a system without encoding and a system with 6/8 modulation coding at the same code rate, respectively. Moreover, the performance of the 9/12 2-D modulation codes according to the different array sizes is also investigated.
C1 [Chi Dinh Nguyen; Lee, Jaejin] Soongsil Univ, Sch Elect Engn, Seoul 06987, South Korea.
RP Lee, J (reprint author), Soongsil Univ, Sch Elect Engn, Seoul 06987, South Korea.
EM zlee@ssu.ac.kr
FU National Research Foundation of Korea - Korean Government
   [NRF-2016R1A2B4011270]
FX This work was supported by the National Research Foundation of Korea
   funded by the Korean Government under Grant NRF-2016R1A2B4011270.
CR Albrecht TR, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2015.2397880
   Nguyen CD, 2016, IET COMMUN, V10, P1730, DOI 10.1049/iet-com.2016.0200
   Nguyen CD, 2016, IEEE T MAGN, V52, DOI 10.1109/TMAG.2016.2573769
   Costner EA, 2009, ANNU REV MATER RES, V39, P155, DOI 10.1146/annurev-matsci-082908-145336
   Groenland JPJ, 2007, IEEE T MAGN, V43, P2307, DOI 10.1109/TMAG.2007.893137
   Hellwig O., 2010, APPL PHYS LETT, V96
   Karakulak S, 2010, IEEE T MAGN, V46, P3639, DOI 10.1109/TMAG.2010.2049116
   Kaynak MN, 2004, IEEE T MAGN, V40, P3087, DOI 10.1109/TMAG.2004.828996
   Kim B, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2014.2304556
   Kovintavewat P, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2014.2316203
   Litvinov D, 2008, IEEE T NANOTECHNOL, V7, P463, DOI 10.1109/TNANO.2008.920183
   Nabavi S, 2007, IEEE T MAGN, V43, P2274, DOI 10.1109/TMAG.2007.893479
   Nabavi S, 2009, IEEE T MAGN, V45, P3523, DOI 10.1109/TMAG.2009.2022493
   Nakamura Y, 2009, IEEE T MAGN, V45, P3753, DOI 10.1109/TMAG.2009.2022331
   Ng Y, 2009, IEEE T MAGN, V45, P3535, DOI 10.1109/TMAG.2009.2024427
   Park KS, 2011, IEEE T MAGN, V47, P539, DOI 10.1109/TMAG.2010.2102343
   Shiroishi Y, 2009, IEEE T MAGN, V45, P3816, DOI 10.1109/TMAG.2009.2024879
   Wang Y, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2015.2464786
   Wood R, 2000, IEEE T MAGN, V36, P36, DOI 10.1109/20.824422
   Yang X, 2007, J VAC SCI TECHNOL B, V25, P2202, DOI 10.1116/1.2798711
NR 20
TC 0
Z9 0
U1 1
U2 1
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD MAR
PY 2017
VL 53
IS 3
AR 3101207
DI 10.1109/TMAG.2016.2626381
PN 1
PG 7
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA EN2XA
UT WOS:000395872400008
ER

PT J
AU Nguyen, CD
   Lee, J
AF Chi Dinh Nguyen
   Lee, Jaejin
TI Scheme for Utilizing the Soft Feedback Information in Bit-Patterned
   Media Recording Systems
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT Asia-Pacific Magnetic Recording Conference (APMRC)
CY JUL 13-15, 2016
CL Yonsei Univ, Seoul, SOUTH KOREA
HO Yonsei Univ
DE Bit-patterned media recording (BPMR); extrinsic information; intertrack
   interference (ITI); soft output Viterbi algorithm
ID RESPONSE MAXIMUM-LIKELIHOOD; HOLOGRAPHIC DATA-STORAGE; VITERBI ALGORITHM
AB This paper presents a scheme that utilizes soft feedback information obtained from a decoder to eliminate detrimental interference in bit-patterned media recording (BPMR) systems. BPMR is a promising technology that can increase the storage area density of magnetic storage systems, but one of the main challenges is to overcome 2-D spatial interference. The performance of the proposed scheme is compared with that of a conventional iterative detection scheme, and the results indicate that the proposed model is better by approximately 1 dB at 20% track misregistration. In particular, the performance of the system is quite superior, allowing the design of systems with higher area densities.
C1 [Chi Dinh Nguyen; Lee, Jaejin] Soongsil Univ, Sch Elect Engn, Seoul 06978, South Korea.
RP Lee, J (reprint author), Soongsil Univ, Sch Elect Engn, Seoul 06978, South Korea.
EM zlee@ssu.ac.kr
FU National Research Foundation of Korea - Korean Government Ministry of
   Science, ICT and Future Planning (MSIP) [NRF-2016R1A2B4011270]
FX This work was supported by the National Research Foundation of Korea
   funded by the Korean Government Ministry of Science, ICT and Future
   Planning (MSIP) under Grant NRF-2016R1A2B4011270.
CR Albrecht TR, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2015.2397880
   Keskinoz M, 2008, IEEE T MAGN, V44, P533, DOI 10.1109/TMAG.2007.914966
   Kim J., 2010, JPN J APPL PHYS, V49
   Kim J, 2011, JPN J APPL PHYS, V50, DOI 10.1143/JJAP.50.09MB02
   Kim J, 2011, IEEE T MAGN, V47, P594, DOI 10.1109/TMAG.2010.2100371
   Kim J, 2009, IEEE T MAGN, V45, P2260, DOI 10.1109/TMAG.2009.2016260
   Koo K, 2013, IEEE T MAGN, V49, P2744, DOI 10.1109/TMAG.2013.2251615
   NABAVI S, 2007, P IEEE INT C COMM IC, P6249
   Nabavi S, 2007, IEEE T MAGN, V43, P2274, DOI 10.1109/TMAG.2007.893479
   Nabavi S, 2009, IEEE T MAGN, V45, P3523, DOI 10.1109/TMAG.2009.2022493
   Okumura T, 2008, JPN J APPL PHYS, V47, P5971, DOI 10.1143/JJAP.47.5971
   Shiroishi Y, 2009, IEEE T MAGN, V45, P3816, DOI 10.1109/TMAG.2009.2024879
NR 12
TC 0
Z9 0
U1 2
U2 2
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD MAR
PY 2017
VL 53
IS 3
AR 3101304
DI 10.1109/TMAG.2016.2626386
PN 1
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA EN2XA
UT WOS:000395872400009
ER

PT J
AU Jeong, S
   Lee, J
AF Jeong, Seongkwon
   Lee, Jaejin
TI Iterative LDPC-LDPC Product Code for Bit Patterned Media
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT Asia-Pacific Magnetic Recording Conference (APMRC)
CY JUL 13-15, 2016
CL Yonsei Univ, Seoul, SOUTH KOREA
HO Yonsei Univ
DE Bit patterned media (BPM); burst error; low-density parity check (LDPC)
   code; product code
ID PARITY-CHECK CODES; READ CHANNEL; PERFORMANCE; SYSTEMS; STORAGE; NOISE
AB Bit patterned media aims at high density recording of more than 10 Tb per square inch, but a burst error mostly occurred by media defects, and data write failure can be a serious problem. However, if the burst errors are compensated by erasure decoding, the performance of low-density parity check (LDPC) code, which is a strong candidate for the error correcting code for storage systems, can be improved. In this paper, we propose an iterative LDPC-LDPC product code and show that it performs better than a simple LDPC-LDPC product code when there are only random errors and both random and burst errors.
C1 [Jeong, Seongkwon; Lee, Jaejin] Soongsil Univ, Sch Elect Engn, Seoul 06978, South Korea.
RP Lee, J (reprint author), Soongsil Univ, Sch Elect Engn, Seoul 06978, South Korea.
EM zlee@ssu.ac.kr
FU National Research Foundation of Korea (NRF) grant - Korean Government
   (MSIP) [NRF-2016R1A2B4011270]
FX This work was supported by the National Research Foundation of Korea
   (NRF) grant funded by the Korean Government (MSIP) under Grant
   NRF-2016R1A2B4011270.
CR ELIAS P, 1954, IRE T INFORM THEOR, P29
   GALLAGER RG, 1962, IRE T INFORM THEOR, V8, P21, DOI 10.1109/TIT.1962.1057683
   Han Y., 2005, P IEEE GLOB COMM C S, P6
   Kim J, 2011, J APPL PHYS, V109, DOI 10.1063/1.3559540
   Kim J, 2011, IEEE T MAGN, V47, P594, DOI 10.1109/TMAG.2010.2100371
   Lee J, 2005, IEEE T CONSUM ELECTR, V51, P1197, DOI 10.1109/TCE.2005.1561844
   LU PL, 1994, IEEE T MAGN, V30, P4230, DOI 10.1109/20.334044
   MacKay DJC, 1996, ELECTRON LETT, V32, P1645, DOI 10.1049/el:19961141
   Nabavi S, 2008, IEEE T MAGN, V44, P3789, DOI 10.1109/TMAG.2008.2002387
   Nakamura Y., 2008, P 68 IEEE SEM VEH TE, P1
   Nutter PW, 2005, IEEE T MAGN, V41, P3214, DOI 10.1109/TMAG.2005.854780
   Nutter PW, 2005, IEEE T MAGN, V41, P4327, DOI 10.1109/TMAG.2005.856586
   Nutter PW, 2004, IEEE T MAGN, V40, P3551, DOI 10.1109/TMAG.2004.835697
   Park D., 2012, J IEIE, V49, P3
   Vo TV, 2011, IEEE T MAGN, V47, P3320, DOI 10.1109/TMAG.2011.2157091
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
   Xie ND, 2010, IEEE T MAGN, V46, P933, DOI 10.1109/TMAG.2009.2034012
   Zhu JG, 2000, IEEE T MAGN, V36, P23, DOI 10.1109/20.824420
NR 18
TC 0
Z9 0
U1 2
U2 2
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD MAR
PY 2017
VL 53
IS 3
AR 3100704
DI 10.1109/TMAG.2016.2618008
PN 1
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA EN2XA
UT WOS:000395872400003
ER

PT J
AU Yuan, ZM
   Ong, CL
   Liu, ZJ
   Ang, SM
   Santoso, B
AF Yuan, Zhi-Min
   Ong, Chun Lian
   Liu, Zhejie
   Ang, Shiming
   Santoso, Budi
TI Noise Mechanism of TDMR Readers at System Level
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT Asia-Pacific Magnetic Recording Conference (APMRC)
CY JUL 13-15, 2016
CL Yonsei Univ, Seoul, SOUTH KOREA
HO Yonsei Univ
DE Two-dimensional magnetic recording (TDMR); Inter-track interference
   (ITI) cancellation; off-track reading; perpendicular magnetic recording
   (PMR) extension; reader noise
ID HEADS
AB In perpendicular magnetic recording system, the jitter noise is the dominant noise from the medium. The jitter noise is proportional to the cross-track correlation and the square of transition parameter [1]. For a given head and medium, pushing linear density has more SNR penalty than increasing track density. That is why all the emerging technologies, such as shingled magnetic recording, microwave assisted magnetic recording, heat assisted magnetic recording, and bit pattern media, emphasize more on the track density increment for the growth of areal density. One challenge from narrower track width is the inter-track interference (ITI). In the two-dimensional magnetic recording (TDMR), multiple readers were proposed to reproduce the signals from multiple tracks [2]. The recent study shows that TDMR readers are effective to cancel the ITI from the adjacent tracks and are able to achieve higher track density [3]. The pitch between the readers along cross-track direction needs to be set properly for the optimal ITI cancellation. But due to the skew angle, one of TDMR readers may have to read near the middle of two tracks. When the recording bits on two adjacent tracks are in the opposite polarity, it may create local flux paths between reader hard bias and medium bits. This could generate multi-domains in the read sensor and produces additional reader noises. This paper studies this noise dependence on both the off-track position and the bit length.
C1 [Yuan, Zhi-Min; Ong, Chun Lian; Liu, Zhejie; Ang, Shiming; Santoso, Budi] ASTAR, Data Storage Inst, Singapore 138634, Singapore.
RP Yuan, ZM (reprint author), ASTAR, Data Storage Inst, Singapore 138634, Singapore.
EM yuan_zhimin@dsi.a-star.edu.sg
CR Bertram HN, 2000, IEEE T MAGN, V36, P4, DOI 10.1109/20.824417
   Elidrissi MR, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2013.2283884
   Kryder MH, 2008, P IEEE, V96, P1810, DOI 10.1109/JPROC.2008.2004315
   Liu ZJ, 2015, J APPL PHYS, V117, DOI 10.1063/1.4916298
   Liu ZJ, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2014.2329813
   Mao SN, 2006, IEEE T MAGN, V42, P97, DOI 10.1109/TMAG.2005.861788
   Ng YB, 2015, J APPL PHYS, V117, DOI 10.1063/1.4913899
   Ong CL, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2014.2317782
   Venugopal V, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2015.2444277
   Wood R, 2009, IEEE T MAGN, V45, P917, DOI 10.1109/TMAG.2008.2010676
   Yuan ZM, 2009, IEEE T MAGN, V45, P5038, DOI 10.1109/TMAG.2009.2029599
   Zhou TJ, 2010, IEEE T MAGN, V46, P738, DOI 10.1109/TMAG.2009.2037331
   Zhu JG, 1999, IEEE T MAGN, V35, P655, DOI 10.1109/20.750623
   Zhu JG, 2008, IEEE T MAGN, V44, P125, DOI 10.1109/TMAG.2007.911031
NR 14
TC 0
Z9 0
U1 3
U2 3
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD MAR
PY 2017
VL 53
IS 3
AR 3100804
DI 10.1109/TMAG.2016.2623816
PN 1
PG 6
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA EN2XA
UT WOS:000395872400004
ER

PT J
AU Sundar, V
   Yang, XM
   Liu, Y
   Dai, ZK
   Zhou, B
   Zhu, JX
   Lee, K
   Chang, T
   Laughlin, D
   Zhu, JG
AF Sundar, Vignesh
   Yang, XiaoMin
   Liu, Yang
   Dai, Zhengkun
   Zhou, Bing
   Zhu, Jingxi
   Lee, Kim
   Chang, Thomas
   Laughlin, David
   Zhu, Jian-Gang (Jimmy)
TI Fabrication of bit patterned media using templated two-phase growth
SO APL MATERIALS
LA English
DT Article
ID PERPENDICULAR RECORDING MEDIA; MAGNETIC-PROPERTIES; BLOCK-COPOLYMERS;
   LITHOGRAPHY; CHALLENGES; ARRAYS
AB In fabricating high areal density magnetic nanostructures for bit patterned magnetic recording media, conventional lithography methods are limited in scaling and often present other challenges, for instance, as etch-damage in case of subtractive schemes. In this paper, we present a novel two-phase growth scheme that enables the fabrication of nanostructures of one material embedded in a matrix of a different material by choosing a separation material that is immiscible with the material of the nanostructure and by designing a template whose material and morphology guides the separation of the two phases and their subsequent growth. (C) 2017 Author(s).
C1 [Sundar, Vignesh; Dai, Zhengkun; Zhu, Jian-Gang (Jimmy)] Carnegie Mellon Univ, Dept Elect & Comp Engn, Pittsburgh, PA 15213 USA.
   [Yang, XiaoMin; Lee, Kim; Chang, Thomas] Seagate Technol, Fremont, CA 94538 USA.
   [Liu, Yang; Zhou, Bing; Laughlin, David] Carnegie Mellon Univ, Dept Mat Sci & Engn, Pittsburgh, PA 15213 USA.
   [Zhu, Jingxi] Sun Yat Sen Univ Carnegie Mellon Univ Joint Inst, Guangzhou, Guangdong, Peoples R China.
   [Zhu, Jingxi] Sun Yat Sen Univ Carnegie Mellon Univ Shunde Int, Guangzhou, Guangdong, Peoples R China.
RP Sundar, V (reprint author), Carnegie Mellon Univ, Dept Elect & Comp Engn, Pittsburgh, PA 15213 USA.
EM vigneshs@andrew.cmu.edu
FU Seagate through the Data Storage Systems Center at Carnegie Mellon
   University
FX The authors would also like to thank Dr. Matthew Moneck and Dr. Vincent
   Sokalski for fruitful discussions. This work was funded by Seagate
   through the Data Storage Systems Center at Carnegie Mellon University.
CR Albrecht TR, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2015.2397880
   Albrecht TR, 2013, IEEE T MAGN, V49, P773, DOI 10.1109/TMAG.2012.2227303
   Bita I, 2008, SCIENCE, V321, P939, DOI 10.1126/science.1159352
   Chen JS, 2009, IEEE T MAGN, V45, P839, DOI 10.1109/TMAG.2008.2010648
   Drevet B., 1994, METALL MATER TRANS A, V25, P599
   Giermann A. L., 2016, J APPL PHYS, V109
   Hellwig O, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3293301
   Hellwig O, 2008, APPL PHYS LETT, V93, DOI 10.1063/1.3013857
   Moneck M. T., 2013, DEKKER ENCY NANOSCIE, P1
   Movchan B. A., 1969, Fizika Metallov i Metallovedenie, V28, P653
   MULLINS WW, 1959, J APPL PHYS, V30, P77, DOI 10.1063/1.1734979
   Naito K, 2002, IEEE T MAGN, V38, P1949, DOI 10.1109/TMAG.2002.802847
   Oikawa T, 2002, IEEE T MAGN, V38, P1976, DOI 10.1109/TMAG.2002.801791
   Park SH, 2006, J APPL PHYS, V99, DOI 10.1063/1.2162815
   Park S, 2009, SCIENCE, V323, P1030, DOI 10.1126/science.1168108
   Piramanayagam SN, 2009, J MAGN MAGN MATER, V321, P485, DOI 10.1016/j.jmmm.2008.05.007
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Shi JZ, 2005, APPL PHYS LETT, V87, DOI 10.1063/1.2137447
   Sundar V, 2014, NANO LETT, V14, P1609, DOI 10.1021/nl500061t
   Terris BD, 2009, J MAGN MAGN MATER, V321, P512, DOI 10.1016/j.jmmm.2008.05.046
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   THORNTON JA, 1977, ANNU REV MATER SCI, V7, P239, DOI 10.1146/annurev.ms.07.080177.001323
   Wang H, 2011, J APPL PHYS, V109, DOI 10.1063/1.3562453
   Wen TL, 2012, NANO LETT, V12, P5873, DOI 10.1021/nl3032372
   Yang G., 2016, J APPL PHYS, V117
   Yang X, 2007, J VAC SCI TECHNOL B, V25, P2202, DOI 10.1116/1.2798711
   Yang XM, 2008, J VAC SCI TECHNOL B, V26, P2604, DOI 10.1116/1.2978487
NR 27
TC 0
Z9 0
U1 0
U2 0
PU AMER INST PHYSICS
PI MELVILLE
PA 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
SN 2166-532X
J9 APL MATER
JI APL Mater.
PD FEB
PY 2017
VL 5
IS 2
AR 026106
DI 10.1063/1.4974866
PG 6
WC Nanoscience & Nanotechnology; Materials Science, Multidisciplinary;
   Physics, Applied
SC Science & Technology - Other Topics; Materials Science; Physics
GA EM0TU
UT WOS:000395031400006
ER

PT J
AU Alexander, J
   Ngo, T
   Dahandeh, S
AF Alexander, James
   Ngo, Tue
   Dahandeh, Shafa
TI Exploring Two-Dimensional Magnetic Recording Gain Constraints
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Bit-patterned media recording; conventional magnetic recording (CMR);
   field programmable gate array; heat-assisted magnetic recording;
   shingled magnetic recording; TDMR
ID MEDIA
AB Two-dimensional magnetic recording (TDMR) offers the opportunity to provide areal density (AD) gain, but questions were unanswered as to how the gain is achieved and what can be done to maximize the gain from this new technology. In this paper, we offer some reasons why different investigators might report different AD gain opportunities. We present data collected on a spin stand with two reader heads and processed with a commercially available field programmable gate array TDMR channel. The implications of this paper should provide guidelines on reader geometries, placement, and performance.
C1 [Alexander, James; Dahandeh, Shafa] Western Digital, Irvine, CA 92612 USA.
   [Ngo, Tue] Western Digital, San Jose, CA 95138 USA.
RP Dahandeh, S (reprint author), Western Digital, Irvine, CA 92612 USA.
EM shafa.dahandeh@wdc.com
OI Dahandeh, Shafa/0000-0001-9413-8366
CR Chan KS, 2009, IEEE T MAGN, V45, P3837, DOI 10.1109/TMAG.2009.2024001
   Dahandeh S., 2015, MAGN REC C TMRC
   Piramanayagam SN, 2009, J MAGN MAGN MATER, V321, P485, DOI 10.1016/j.jmmm.2008.05.007
   Rea C, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2013.2287886
   Richter HJ, 2007, J PHYS D APPL PHYS, V40, pR149, DOI 10.1088/0022-3727/40/9/R01
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Wood R., 2009, T MAGN, V45, P917
   Zhu JG, 2008, IEEE T MAGN, V44, P125, DOI 10.1109/TMAG.2007.911031
NR 8
TC 0
Z9 0
U1 1
U2 1
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD FEB
PY 2017
VL 53
IS 2
AR 3000304
DI 10.1109/TMAG.2016.2609858
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA EM6VR
UT WOS:000395451100009
ER

PT J
AU Honda, N
   Yamakawa, K
AF Honda, N.
   Yamakawa, K.
TI High Recording Performance of Bit-Patterned Media With Two-Layer
   Inclined Anisotropy ECC Dots
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Applied field angle dependence; bit-patterned media; granular media;
   inclined anisotropy; recording simulation; switching field; two-layer
   exchange coupled composite
AB A simplified exchange coupled composite (ECC) dot structure with a reduced switching field and small applied field angle dependence in the switching field is proposed. It was found from a spin model analysis that a reduced switching field as well as a small applied field angle dependence of the field is obtainable even for two-layer ECC dot when the anisotropy axis is weakly inclined with an increased anisotropy for the soft layer. The switching properties of the two-layer ECC dots were confirmed using a micromagnetic simulation. A minimum normalized switching field of 0.51 was obtained for a two-layer ECC dot model of stacked cubes with a size of 5 nm and an anisotropy inclination angle of 10 degrees. Recording simulation on a bit-pattered medium of the two-layer ECC dot array suggested the possibility of a high areal density recording beyond 4 Tdot/in(2) by shingled recording. It was also confirmed by simulation that the proposed inclined anisotropy ECC dot could be applicable to granular media for narrow track recoding.
C1 [Honda, N.] Tohoku Inst Technol, Sendai, Miyagi 9828577, Japan.
   [Yamakawa, K.] Akita Ind Technol Ctr, Akita 0101623, Japan.
RP Honda, N (reprint author), Tohoku Inst Technol, Sendai, Miyagi 9828577, Japan.
EM n_honda@tohtech.ac.jp
CR Honda A, 2013, IEEE T MAGN, V49, P3600, DOI 10.1109/TMAG.2013.2239964
   Honda N., 2013, J MAGN SOC JPN, V37, P126
   Honda N, 2007, IEEE T MAGN, V43, P2142, DOI 10.1109/TMAG.2007.893139
   Honda N, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2014.2326924
   Honda N, 2011, PHYSCS PROC, V16, DOI 10.1016/j.phpro.2011.06.099
   Saito S, 2011, J APPL PHYS, V109, DOI 10.1063/1.3562262
   Victora RH, 2005, IEEE T MAGN, V41, P2828, DOI 10.1109/TMAG.2005.855263
   Yamakawa K., 2009, J APPL PHYS, V105
NR 8
TC 0
Z9 0
U1 2
U2 2
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD FEB
PY 2017
VL 53
IS 2
AR 3200207
DI 10.1109/TMAG.2016.2616415
PG 7
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA EM6VR
UT WOS:000395451100020
ER

PT J
AU Meyer, A
   Franz, N
   Oepen, HP
   Perlich, J
   Carbone, G
   Metzger, TH
AF Meyer, Andreas
   Franz, Norbert
   Oepen, Hans Peter
   Perlich, Jan
   Carbone, Gerardina
   Metzger, Till Hartmut
TI In situ grazing-incidence small-angle X-ray scattering observation of
   block-copolymer templated formation of magnetic nanodot arrays and their
   magnetic properties
SO NANO RESEARCH
LA English
DT Article
DE poly(styrene)-b-poly(vinyl pyridine); argon ion etching; self-assembly;
   grazing-incidence small-angle X-ray scattering (GISAXS) simulation;
   magnetic nanodot coercivity
ID THIN-FILMS; DIBLOCK-COPOLYMER; NANOPARTICLE ARRAYS; METAL NANOPARTICLES;
   SPUTTER-DEPOSITION; PHASE-BEHAVIOR; MICELLES; GROWTH; LITHOGRAPHY;
   ANISOTROPY
AB The fabrication of bit-patterned media (BPM) is crucial for new types of hard disk drives. The development of methods for the production of BPM is progressing rapidly. Conventional lithography reaches the limit regarding lateral resolution, and new routes are needed. In this study, we mainly focus on the dependence of the size and shape of magnetic nanodots on the Ar+-ion etching duration, using silica dots as masks. Two-dimensional (2D) arrays of magnetic nanostructures are created using silica-filled diblock-copolymer micelles as templates. After the self-assembly of the micelles into 2D hexagonal arrays, the polymer shell is removed, and the SiO2 cores are utilized to transform the morphology into a (Co/Pt)2-multilayer via ion etching under normal incidence. The number of preparation steps is kept as low as possible to simplify the formation of the nanostructure arrays. High-resolution in situ grazing-incidence small-angle X-ray scattering (GISAXS) investigations are performed during the Ar+-ion etching to monitor and control the fabrication process. The in situ investigation provides information on how the etching conditions can be improved for further ex situ experiments. The GISAXS patterns are compared with simulations. We observe that the dots change in shape from cylindrical to conical during the etching process. The magnetic behavior is studied by utilizing the magneto-optic Kerr effect. The Co/Pt dots exhibit different magnetic behaviors depending on their size, interparticle distance, and etching time. They show ferromagnetism with an easy axis of magnetization perpendicular to the film. A systematic dependence of the coercivity on the dot size is observed.
C1 [Meyer, Andreas] Univ Hamburg, Inst Phys Chem, Grindelallee 117, D-20146 Hamburg, Germany.
   [Franz, Norbert; Oepen, Hans Peter] Univ Hamburg, Inst Nanostruktur & Festkorperphys, Jungiusstr 11a, D-20355 Hamburg, Germany.
   [Perlich, Jan] HASYLAB Deutsch Elektronen Synchrotron, Notkestr 85, D-22603 Hamburg, Germany.
   [Carbone, Gerardina; Metzger, Till Hartmut] European Synchrotron Radiat Facil, 6 Rue Jules Horowitz, F-38043 Grenoble, France.
RP Meyer, A (reprint author), Univ Hamburg, Inst Phys Chem, Grindelallee 117, D-20146 Hamburg, Germany.
EM andreas.meyer@chemie.uni-hamburg.de
FU Deutsche Forschungsgemeinschaft [SFB 668]; University of Hamburg
FX This research was supported by the SFB 668 of the Deutsche
   Forschungsgemeinschaft and by the University of Hamburg. The authors
   thank S.V. Roth and the HASYLAB staff for the support at the beamline
   BW4 and the ESRF staff for their support during beamtime at ID01. We
   thank A. Kornowski for the helpful advices about the SEM analysis.
CR Aizawa M, 2005, J AM CHEM SOC, V127, P8932, DOI 10.1021/ja052281m
   Aizawa M, 2007, CHEM MATER, V19, P5090, DOI 10.1021/cm071382b
   Beleggia M, 2006, J PHYS D APPL PHYS, V39, P891, DOI 10.1088/0022-3727/39/5/001
   Bennett RD, 2004, CHEM MATER, V16, P5589, DOI 10.1021/cm0489921
   Bennett TM, 2016, MACROMOLECULES, V49, P205, DOI 10.1021/acs.macromol.5b02041
   Bhaviripudi S, 2006, NANOTECHNOLOGY, V17, P5080, DOI 10.1088/0957-4484/17/20/007
   Boker A, 2001, MACROMOLECULES, V34, P7477, DOI 10.1021/ma002198d
   Cheng JY, 2001, ADV MATER, V13, P1174, DOI 10.1002/1521-4095(200108)13:15<1174::AID-ADMA1174>3.0.CO;2-Q
   Dong QC, 2016, NANOSCALE, V8, P7068, DOI 10.1039/c6nr00034g
   Dong QC, 2015, J MATER CHEM C, V3, P734, DOI 10.1039/c4tc02058h
   Dong QC, 2014, ADV FUNCT MATER, V24, P857, DOI 10.1002/adfm.201301143
   Dong Q, 2012, ADV MATER, V24, P1034, DOI 10.1002/adma.201104171
   Fasolka MJ, 2001, ANN REV MATER RES, V31, P323, DOI 10.1146/annurev.matsci.31.1.323
   Forster S, 1998, ADV MATER, V10, P195, DOI 10.1002/(SICI)1521-4095(199802)10:3<195::AID-ADMA195>3.0.CO;2-V
   Fromsdorf A, 2007, SMALL, V3, P880, DOI 10.1002/smll.200600706
   Fromsdorf A, 2006, J PHYS CHEM B, V110, P15166, DOI 10.1021/jp0621880
   Hamley I. W., 1998, PHYS BLOCK COPOLYMER
   Haupt M, 2003, ADV MATER, V15, P829, DOI 10.1002/adma.200304688
   Hexemer A., ADV GRAZING INCIDENC
   Jung J.-M., GOLD CONJUGATED PROT
   Kim DH, 2005, ADV FUNCT MATER, V15, P1160, DOI 10.1002/adfm.200400462
   Kim HC, 2001, ADV MATER, V13, P795, DOI 10.1002/1521-4095(200106)13:11<795::AID-ADMA795>3.0.CO;2-1
   KNELLER E, 1966, J APPL PHYS, V37, P1350, DOI 10.1063/1.1708467
   Knoll A, 2007, NANO LETT, V7, P843, DOI 10.1021/nl070006n
   Krausch G, 2002, ADV MATER, V14, P1579, DOI 10.1002/1521-4095(20021104)14:21<1579::AID-ADMA1579>3.0.CO;2-6
   Lai CJ, 2002, MACROMOLECULES, V35, P841, DOI 10.1021/ma011696z
   Lazzari R, 2002, J APPL CRYSTALLOGR, V35, P406, DOI 10.1107/S0021889802006088
   Lee DH, 2008, ADV MATER, V20, P2480, DOI 10.1002/adma.200702712
   Lee S, 2010, SCIENCE, V330, P349, DOI 10.1126/science.1195552
   LEIBLER L, 1980, MACROMOLECULES, V13, P1602, DOI 10.1021/ma60078a047
   Li RR, 2000, APPL PHYS LETT, V76, P1689, DOI 10.1063/1.126137
   Li X, 2005, LANGMUIR, V21, P5212, DOI 10.1021/la046812g
   Li Z, 1996, J AM CHEM SOC, V118, P10892, DOI 10.1021/ja961713d
   Lille J., 2011, P SPIE, V8166
   Lodge TP, 2002, MACROMOLECULES, V35, P4707, DOI 10.1021/ma0200975
   Loginova TP, 2004, CHEM MATER, V16, P2369, DOI 10.1021/cm040147f
   Meiners JC, 1997, MACROMOLECULES, V30, P4945, DOI 10.1021/ma970327t
   Melde BJ, 2005, CHEM MATER, V17, P4743, DOI 10.1021/cm051407b
   Millev YT, 2003, J PHYS D APPL PHYS, V36, P2945, DOI 10.1088/0022-3727/36/23/012
   Neumann A., 2012, OPEN SURF SCI J, V4, P55
   Neumann A, 2014, NEW J PHYS, V16, DOI 10.1088/1367-2630/16/8/083012
   Neumann A, 2013, NANO LETT, V13, P2199, DOI 10.1021/nl400728r
   Park M, 1997, SCIENCE, V276, P1401, DOI 10.1126/science.276.5317.1401
   Putter S, 2007, J MAGN MAGN MATER, V316, pE40, DOI 10.1016/j.jmmm.2007.02.054
   Renaud G, 2009, SURF SCI REP, V64, P255, DOI 10.1016/j.surfrep.2009.07.002
   Ross CA, 2008, J VAC SCI TECHNOL B, V26, P2489, DOI 10.1116/1.2981079
   Sakar K., 2014, J MATER CHEM A, V2, P6945
   Schwartzkopf M, 2015, ACS APPL MATER INTER, V7, P13547, DOI 10.1021/acsami.5b02901
   Schwartzkopf M, 2013, NANOSCALE, V5, P5053, DOI 10.1039/c3nr34216f
   Shan LC, 2014, J MATER CHEM C, V2, P701, DOI 10.1039/c3tc31333f
   SHARROCK MP, 1990, IEEE T MAGN, V26, P193, DOI 10.1109/20.50532
   SHARROCK MP, 1981, IEEE T MAGN, V17, P3020, DOI 10.1109/TMAG.1981.1061755
   Shaw JM, 2007, J APPL PHYS, V101, DOI 10.1063/1.2431399
   Skomski R, 2003, J PHYS-CONDENS MAT, V15, pR841, DOI 10.1088/0953-8984/15/20/202
   Spatz JP, 2000, LANGMUIR, V16, P407, DOI 10.1021/1a990070n
   Spatz JP, 1999, ADV MATER, V11, P149, DOI 10.1002/(SICI)1521-4095(199902)11:2<149::AID-ADMA149>3.0.CO;2-W
   Spatz JP, 1996, MACROMOLECULES, V29, P3220, DOI 10.1021/ma951712q
   Stillrich H, 2008, ADV FUNCT MATER, V18, P76, DOI 10.1002/adfm.200700444
   Stillrich H, 2010, J MAGN MAGN MATER, V322, P1353, DOI 10.1016/j.jmmm.2009.09.039
   Sun Z, 2005, PHYSICA B, V357, P141, DOI 10.1016/j.physb.2004.11.043
   Sun ZC, 2006, CHEMPHYSCHEM, V7, P370, DOI 10.1002/cphc.200500340
   Thurn-Albrecht T, 2000, SCIENCE, V290, P2126, DOI 10.1126/science.290.5499.2126
   Tsarkova L, 2006, MACROMOLECULES, V39, P3608, DOI 10.1021/ma060224n
   Wellhofer M, 2005, J MAGN MAGN MATER, V292, P345, DOI 10.1016/j.jmmm.2004.11.150
   Wiedwald U, 2010, BEILSTEIN J NANOTECH, V1, P24, DOI 10.3762/bjnano.1.5
NR 65
TC 0
Z9 0
U1 5
U2 5
PU TSINGHUA UNIV PRESS
PI BEIJING
PA TSINGHUA UNIV, RM A703, XUEYAN BLDG, BEIJING, 100084, PEOPLES R CHINA
SN 1998-0124
EI 1998-0000
J9 NANO RES
JI Nano Res.
PD FEB
PY 2017
VL 10
IS 2
BP 456
EP 471
DI 10.1007/s12274-016-1305-5
PG 16
WC Chemistry, Physical; Nanoscience & Nanotechnology; Materials Science,
   Multidisciplinary; Physics, Applied
SC Chemistry; Science & Technology - Other Topics; Materials Science;
   Physics
GA EL0OS
UT WOS:000394322300009
ER

PT J
AU Ehrmann, A
   Blachowicz, T
AF Ehrmann, Andrea
   Blachowicz, Tomasz
TI Interaction between magnetic nanoparticles in clusters
SO AIMS MATERIALS SCIENCE
LA English
DT Article
DE micromagnetic simulation; magnetic nanoparticles; nanoparticle cluster;
   OOMMF; stable intermediate state; lithography
ID SYSTEM; MEDIA
AB Micromagnetic simulations are often used to model the magnetic properties of nanoparticles, depending on their shape and dimension as well as other parameters. Due to the significant increase in computing time for large-scale models, simulations are regularly restricted to a single magnetic nanoparticle. Applications in bit-patterned media etc., however, necessitate large clusters of nanostructures. In our recent works, the deviations of magnetic properties and magnetization reversal processes, comparing single nanoparticles and small clusters, were investigated using the micromagnetic simulation OOMMF. The studies concentrated on a special fourfold shape which has been shown before to offer four stable states at remanence, allowing for creating quaternary bit-patterned media with two bits storable in one position. The influence of downscaling was examined by varying the sample dimensions without changing the particle shape. The results show that in case of the special square nanostructures under investigation, the largest nanoparticles experience the strongest effect by being included in a cluster, while the technologically more relevant smaller nanoparticles have similar magnetic properties and identical magnetization reversal processes for single and clustered particles.
C1 [Ehrmann, Andrea] Bielefeld Univ Appl Sci, Fac Engn & Math, D-33619 Bielefeld, Germany.
   [Blachowicz, Tomasz] Silesian Tech Univ, Inst Phys, Ctr Sci & Educ, PL-44100 Gliwice, Poland.
RP Ehrmann, A (reprint author), Bielefeld Univ Appl Sci, Fac Engn & Math, D-33619 Bielefeld, Germany.
EM andrea.ehrmann@fh-bielefeld.de
CR Akerman J, 2005, SCIENCE, V308, P508, DOI 10.1126/science.1110549
   Bader SD, 2006, REV MOD PHYS, V78, P1, DOI 10.1103/RevModPhys.78.1
   Blachowicz T., 2016, Journal of Physics: Conference Series, V738, DOI 10.1088/1742-6596/738/1/012058
   Blachowicz T, 2015, J PHYS CONF SER, V633, DOI 10.1088/1742-6596/633/1/012100
   Blachowicz T, 2013, SCI WORLD J, DOI 10.1155/2013/472597
   Blachowicz T, 2013, J MAGN MAGN MATER, V331, P21, DOI 10.1016/j.jmmm.2012.11.014
   Blachowicz T, 2013, J APPL PHYS, V113, DOI 10.1063/1.4772459
   Blachowicz T, 2011, J APPL PHYS, V110, DOI 10.1063/1.3646490
   Blachowicz T, 2016, MAT TODAY P UNPUB
   Bowden SR, 2009, IEEE T MAGN, V45, P5326, DOI 10.1109/TMAG.2009.2026573
   Cowburn RP, 2000, SCIENCE, V287, P1466, DOI 10.1126/science.287.5457.1466
   Cowburn RP, 1999, PHYS REV LETT, V83, P1042, DOI 10.1103/PhysRevLett.83.1042
   Donahue M, 1999, 6376 NISTIR
   Ehrmann A, 2016, J MAGN MAGN MATER, V412, P7, DOI 10.1016/j.jmmm.2016.03.071
   Ehrmann A, 2015, J APPL PHYS, V117, DOI 10.1063/1.4919839
   Gilbert TL, 2004, IEEE T MAGN, V40, P3443, DOI 10.1109/TMAG.2004.836740
   He K, 2010, J APPL PHYS, V107, DOI 10.1063/1.3358233
   Huang L, 2010, ADV MATER, V22, P492, DOI 10.1002/adma.200902488
   KNELLER EF, 1991, IEEE T MAGN, V27, P3588, DOI 10.1109/20.102931
   Ma CT, 2016, J MAGN MAGN MATER, V417, P197
   Michea S, 2014, J PHYS D APPL PHYS, V47, DOI 10.1088/0022-3727/47/33/335001
   Moritz J, 2011, J APPL PHYS, V109, DOI 10.1063/1.3572259
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   SMITH N, 1989, J APPL PHYS, V65, P4362, DOI 10.1063/1.343273
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Thevenard L, 2010, J MAGN MAGN MATER, V322, P2152, DOI 10.1016/j.jmmm.2010.01.048
   Tillmanns A, 2006, APPL PHYS LETT, V89, DOI 10.1063/1.2392283
   Wang RH, 2009, MATER RES BULL, V44, P1468, DOI 10.1016/j.materresbull.2009.02.016
   Zhang W, 2010, PHYS REV B, V81, DOI 10.1103/PhysRevB.81.064433
NR 29
TC 0
Z9 0
U1 1
U2 1
PU AMER INST MATHEMATICAL SCIENCES-AIMS
PI SPRINGFIELD
PA PO BOX 2604, SPRINGFIELD, MO 65801-2604 USA
SN 2372-0468
EI 2372-0484
J9 AIMS MATER SCI
JI AIMS Mater. Sci.
PY 2017
VL 4
IS 2
BP 383
EP 390
DI 10.3934/matersci.2017.2.383
PG 8
WC Materials Science, Multidisciplinary
SC Materials Science
GA EO3WD
UT WOS:000396624300009
ER

PT J
AU Meng, ZG
   Li, GJ
   Wong, HF
   Ng, SM
   Yiu, SC
   Ho, CL
   Leung, CW
   Manners, I
   Wong, WY
AF Meng, Zhengong
   Li, Guijun
   Wong, Hon-Fai
   Ng, Sheung-Mei
   Yiu, Sze-Chun
   Ho, Cheuk-Lam
   Leung, Chi-Wah
   Manners, Ian
   Wong, Wai-Yeung
TI Patterning of L1(0) FePt nanoparticles with ultra-high coercivity for
   bit-patterned media
SO NANOSCALE
LA English
DT Article
ID ELECTRON-BEAM LITHOGRAPHY; NANOIMPRINT LITHOGRAPHY; IMPRINT LITHOGRAPHY;
   PRECURSOR; FABRICATION; POLYMERS; METALLOPOLYMERS; NANOCRYSTALS; SIZE
AB L1(0)-ordered FePt nanoparticles (NPs) with ultra-high coercivity were directly prepared from a new metallopolyyne using a one-step pyrolysis method. The chemical ordering, morphology and magnetic properties of the as-synthesized FePt NPs have been studied. Magnetic measurements show the coercivity of these FePt NPs is as high as 3.6 T. Comparison of NPs synthesized under the Ar and Ar/H-2 atmospheres shows that the presence of H-2 in the annealing environment influences the nucleation and promotes the growth of L1(0)-FePt NPs. Application of this metallopolymer for bit-patterned media was also demonstrated using nanoimprint lithography.
C1 [Meng, Zhengong; Yiu, Sze-Chun; Ho, Cheuk-Lam; Wong, Wai-Yeung] Hong Kong Baptist Univ, Dept Chem, Inst Mol Funct Mat, Waterloo Rd, Kowloon Tong, Hong Kong, Peoples R China.
   [Meng, Zhengong; Yiu, Sze-Chun; Ho, Cheuk-Lam; Wong, Wai-Yeung] Hong Kong Baptist Univ, Inst Adv Mat, Waterloo Rd, Kowloon Tong, Hong Kong, Peoples R China.
   [Li, Guijun; Wong, Hon-Fai; Ng, Sheung-Mei; Leung, Chi-Wah] Hong Kong Polytech Univ, Dept Appl Phys, Hong Kong, Hong Kong, Peoples R China.
   [Manners, Ian] Univ Bristol, Sch Chem, Bristol BS8 1TS, Avon, England.
   [Wong, Wai-Yeung] Hong Kong Polytech Univ, Dept Appl Biol & Chem Technol, Hong Kong, Hong Kong, Peoples R China.
RP Ho, CL; Wong, WY (reprint author), Hong Kong Baptist Univ, Dept Chem, Inst Mol Funct Mat, Waterloo Rd, Kowloon Tong, Hong Kong, Peoples R China.; Ho, CL; Wong, WY (reprint author), Hong Kong Baptist Univ, Inst Adv Mat, Waterloo Rd, Kowloon Tong, Hong Kong, Peoples R China.; Leung, CW (reprint author), Hong Kong Polytech Univ, Dept Appl Phys, Hong Kong, Hong Kong, Peoples R China.; Manners, I (reprint author), Univ Bristol, Sch Chem, Bristol BS8 1TS, Avon, England.; Wong, WY (reprint author), Hong Kong Polytech Univ, Dept Appl Biol & Chem Technol, Hong Kong, Hong Kong, Peoples R China.
EM clamho@hkbu.edu.hk; dennis.leung@polyu.edu.hk;
   Ian.Manners@bristol.ac.uk; rwywong@hkbu.edu.hk
FU Hong Kong Research Grants Council [HKBU 12302114, PolyU 153015/ 14P];
   Areas of Excellence Scheme of HKSAR [AoE/ P-03/08]; National Natural
   Science Foundation of China [51373145, 21504074]; Science, Technology,
   and Innovation Committee of Shenzhen Municipality
   [JCYJ20140419130507116]; Hong Kong Baptist University [FRG2/13-14/083];
   Hong Kong Polytechnic University [FRG2/13-14/078]; Science, Technology
   and Innovation Committee of Shenzhen Municipality
   [JCYJ20140818163041143]; PolyU [1-ZE14/1-ZE25]
FX W.-Y. Wong thanks the Hong Kong Research Grants Council (HKBU 12302114),
   Areas of Excellence Scheme of HKSAR (AoE/ P-03/08), National Natural
   Science Foundation of China (Project No. 51373145), Science, Technology,
   and Innovation Committee of Shenzhen Municipality
   (JCYJ20140419130507116), Hong Kong Baptist University (FRG2/13-14/083)
   and the Hong Kong Polytechnic University for financial support. C.-L. Ho
   thanks Hong Kong Baptist University (FRG2/13-14/078), and the Science,
   Technology and Innovation Committee of Shenzhen Municipality
   (JCYJ20140818163041143) for their financial support. We also thank the
   National Natural Science Foundation of China (project number: 21504074).
   The work in PolyU was supported by the Hong Kong Research Grants Council
   (PolyU 153015/ 14P) and PolyU (1-ZE14/1-ZE25).
CR Albrecht TR, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2015.2397880
   Austin MD, 2003, NANO LETT, V3, P1687, DOI 10.1021/nl034831p
   Bencher C, 2008, P SOC PHOTO-OPT INS, V6924, pE9244, DOI 10.1117/12.772953
   Bian BR, 2013, IEEE T MAGN, V49, P3307, DOI 10.1109/TMAG.2013.2243124
   Bosworth JK, 2010, J PHOTOPOLYM SCI TEC, V23, P145, DOI 10.2494/photopolymer.23.145
   Capobianchi A, 2009, CHEM MATER, V21, P2007, DOI 10.1021/cm9003992
   Chen M, 2004, J AM CHEM SOC, V126, P8394, DOI 10.1021/ja047648m
   Chou SY, 1996, SCIENCE, V272, P85, DOI 10.1126/science.272.5258.85
   Chou SY, 1997, J VAC SCI TECHNOL B, V15, P2897, DOI 10.1116/1.589752
   CHOU SY, 1995, APPL PHYS LETT, V67, P3114, DOI 10.1063/1.114851
   Dobisz EA, 2012, J VAC SCI TECHNOL B, V30, DOI 10.1116/1.4757955
   Dong QC, 2015, J MATER CHEM C, V3, P734, DOI 10.1039/c4tc02058h
   Dong Q, 2012, ADV MATER, V24, P1034, DOI 10.1002/adma.201104171
   Elkins KE, 2003, NANO LETT, V3, P1647, DOI 10.1021/nl034743w
   Eloi JC, 2008, MATER TODAY, V11, P28, DOI 10.1016/S1369-7021(08)70054-3
   Frey NA, 2009, CHEM SOC REV, V38, P2532, DOI 10.1039/b815548h
   Gates BD, 2005, CHEM REV, V105, P1171, DOI 10.1021/cr030076o
   Guo VW, 2011, J APPL PHYS, V109, DOI 10.1063/1.3558986
   Hauet T, 2011, APPL PHYS LETT, V98, DOI 10.1063/1.3581896
   Li GJ, 2011, THIN SOLID FILMS, V519, P8307, DOI 10.1016/j.tsf.2011.03.088
   Li GJ, 2013, MICROELECTRON ENG, V110, P192, DOI 10.1016/j.mee.2013.03.135
   Li Q, 2015, NANO LETT, V15, P2468, DOI 10.1021/acs.nanolett.5b00320
   Li Z, 2015, AIP ADV, V5, DOI 10.1063/1.4929578
   Liu K, 2008, ANGEW CHEM INT EDIT, V47, P1255, DOI 10.1002/anie.200703199
   McCallum AT, 2011, APPL PHYS LETT, V98, DOI 10.1063/1.3599573
   Meng ZG, 2016, POLYM CHEM-UK, V7, P4467, DOI 10.1039/c6py00714g
   Moneck MT, 2011, IEEE T MAGN, V47, P2656, DOI 10.1109/TMAG.2011.2157671
   Nguyen P, 1999, CHEM REV, V99, P1515, DOI 10.1021/cr960113u
   Ruiz R, 2011, ACS NANO, V5, P79, DOI 10.1021/nn101561p
   Rutledge RD, 2006, J AM CHEM SOC, V128, P14210, DOI 10.1021/ja0633868
   Shields PA, 2011, MICROELECTRON ENG, V88, P3011, DOI 10.1016/j.mee.2011.04.063
   Siani A, 2006, LANGMUIR, V22, P5160, DOI 10.1021/la053476a
   Sohn JS, 2009, NANOTECHNOLOGY, V20, DOI 10.1088/0957-4484/20/2/025302
   Song HM, 2006, CHEM COMMUN, P1292, DOI 10.1039/b516831g
   Stappert S, 2003, J CRYST GROWTH, V252, P440, DOI 10.1016/S0022-0248(03)00935-7
   Sun SH, 2006, ADV MATER, V18, P393, DOI 10.1002/adma.200501464
   Sun SH, 2000, SCIENCE, V287, P1989, DOI 10.1126/science.287.5460.1989
   Szunyogh L, 2001, PHYS REV B, V63, DOI 10.1103/PhysRevB.63.184408
   Thompson DA, 2000, IBM J RES DEV, V44, P311
   Weller D, 2000, IEEE T MAGN, V36, P10, DOI 10.1109/20.824418
   Wellons MS, 2007, CHEM MATER, V19, P2483, DOI 10.1021/cm062455e
   Whittell GR, 2011, NAT MATER, V10, P176, DOI 10.1038/nmat2966
   Yang XM, 2013, J NANOMATER, DOI 10.1155/2013/615896
   Yang XM, 2009, ACS NANO, V3, P1844, DOI 10.1021/nn900073r
   Yang XM, 2009, IEEE T MAGN, V45, P833, DOI 10.1109/TMAG.2008.2010647
NR 45
TC 2
Z9 2
U1 8
U2 8
PU ROYAL SOC CHEMISTRY
PI CAMBRIDGE
PA THOMAS GRAHAM HOUSE, SCIENCE PARK, MILTON RD, CAMBRIDGE CB4 0WF, CAMBS,
   ENGLAND
SN 2040-3364
EI 2040-3372
J9 NANOSCALE
JI Nanoscale
PY 2017
VL 9
IS 2
BP 731
EP 738
DI 10.1039/c6nr07863j
PG 8
WC Chemistry, Multidisciplinary; Nanoscience & Nanotechnology; Materials
   Science, Multidisciplinary; Physics, Applied
SC Chemistry; Science & Technology - Other Topics; Materials Science;
   Physics
GA EL7DB
UT WOS:000394780200031
PM 27959375
ER

PT J
AU Wang, XY
   Guo, ZL
   Tong, HB
   Zhou, MS
AF Wang, Xiaoyang
   Guo, Zeling
   Tong, Hongbo
   Zhou, Meisu
TI Synthesis and structures of titanium(IV) imido complexes with dianionic
   ligands of triazapentadienyl derivatives
SO JOURNAL OF ORGANOMETALLIC CHEMISTRY
LA English
DT Article
DE Titanium; Triazapentadienyl; Structure; Polymerization of ethylene
ID OLEFIN POLYMERIZATION CATALYSTS; BIT-PATTERNED MEDIA; ETHYLENE
   POLYMERIZATION; METALLOPOLYMER PRECURSORS; POTENTIAL APPLICATION;
   ZIRCONIUM COMPLEXES; CRYSTAL-STRUCTURES; ANCILLARY LIGANDS; X-RAY;
   CHEMISTRY
AB The reaction of PhN(Li)SiMe3 with dimethylcyanamide or 1-piperidinecarbonitrile and further with one third equiv of TiCl4(THF)(2) led via Me3SiCl elimination to novel five-coordinate titanium(IV) triazapentadienates L1L2TiCl (L-1 = [N(Ph)C(R)NC(R)N(R')](-), L-2 = [N(Ph)C(R)NC(R)M2-; 1, R = dimethylamino, R' = H; 2, R' = 1-piperidino, R' = SiMe3; 3, R = dimethylamino, R' = SiMe3). The crystal structure studies of 1-3 revealed dianionic triazapentadienate binding of the metal center. The very short bond length of Ti N implies the multiple bond character and imido feature of the ligand. The catalytic activity of selected complexes 1 and 2 in the polymerization of ethylene is reported. (C) 2016 Elsevier B.V. All rights reserved.
C1 [Wang, Xiaoyang; Tong, Hongbo; Zhou, Meisu] Shanxi Univ, Inst Appl Chem, Taiyuan 030006, Peoples R China.
   [Guo, Zeling] Zhejiang Univ, Dept Chem, Hangzhou, Zhejiang, Peoples R China.
RP Zhou, MS (reprint author), Shanxi Univ, Inst Appl Chem, Taiyuan 030006, Peoples R China.
EM mszhou@sxu.edu.cn
FU Shanxi Functional Organometallic Compound Information Net Project
   [2013091022]; Shanxi Scholarship Council of China [2013-025]
FX We thank the Natural Science Foundation of China (No. 21371111), Shanxi
   Scholarship Council of China (No. 2013-025) and Shanxi Functional
   Organometallic Compound Information Net Project (No. 2013091022).
CR Bai SD, 2006, EUR J INORG CHEM, P4903, DOI 10.1002/ejic.200600658
   Bezombes JP, 2001, J CHEM SOC DALTON, P816, DOI 10.1039/b0097241
   Britovsek GJP, 1999, ANGEW CHEM INT EDIT, V38, P428, DOI 10.1002/(SICI)1521-3773(19990215)38:4<428::AID-ANIE428>3.0.CO;2-3
   Coles MP, 2003, ORGANOMETALLICS, V22, P5201, DOI 10.1021/om0341092
   Deelman BJ, 1996, J ORGANOMET CHEM, V513, P281, DOI 10.1016/0022-328X(95)06108-9
   Dong QC, 2016, J MATER CHEM C, V4, P5010, DOI 10.1039/c6tc00145a
   Dong QC, 2016, NANOSCALE, V8, P7068, DOI 10.1039/c6nr00034g
   Dong QC, 2015, J MATER CHEM C, V3, P734, DOI 10.1039/c4tc02058h
   Dong QC, 2014, ADV FUNCT MATER, V24, P857, DOI 10.1002/adfm.201301143
   Dong Q, 2012, ADV MATER, V24, P1034, DOI 10.1002/adma.201104171
   Duan XE, 2016, CHINESE J POLYM SCI, V34, P390, DOI 10.1007/s10118-016-1768-6
   DUCHATEAU R, 1991, INORG CHEM, V30, P4863, DOI 10.1021/ic00025a036
   EDELMANN FT, 1995, ANGEW CHEM INT EDIT, V34, P2466, DOI 10.1002/anie.199524661
   Evans LTJ, 2007, DALTON T, P2707, DOI 10.1039/b704625a
   Gibson VC, 2003, CHEM REV, V103, P283, DOI 10.1021/cr980461r
   Guiducci AE, 2009, DALTON T, P5960, DOI 10.1039/b901774g
   Hagadorn JR, 1996, J AM CHEM SOC, V118, P893, DOI 10.1021/ja953449e
   Hagadorn JR, 1998, ORGANOMETALLICS, V17, P1355, DOI 10.1021/om970933c
   Ho CL, 2013, J ORGANOMET CHEM, V744, P165, DOI 10.1016/j.jorganchem.2013.06.027
   Jones C, 2003, INORG CHEM COMMUN, V6, P1126, DOI 10.1016/S1387-7003(03)00208-9
   Kretschmer WP, 2002, CHEM COMMUN, P608, DOI 10.1039/b111343g
   LATHAM IA, 1986, J CHEM SOC DALTON, P377, DOI 10.1039/dt9860000377
   Li W, 2016, RSC ADV, V6, P40741, DOI 10.1039/c6ra01365a
   Liu K, 2008, ANGEW CHEM INT EDIT, V47, P1255, DOI 10.1002/anie.200703199
   Meerendonk W.J., 2003, EUR J INORG CHEM, P427
   Meng ZG, 2016, POLYM CHEM-UK, V7, P4467, DOI 10.1039/c6py00714g
   ORPEN AG, 1989, J CHEM SOC DALTON, pS1, DOI 10.1039/dt98900000s1
   Pang XA, 2005, CHINESE J CHEM, V23, P1193, DOI 10.1002/cjoc.200591193
   Sheldrick G., 2003, SHELXTL VERSION 6 14
   Sheldrick G. M., 1997, PROGRAM SOLUTION CRY
   Sheldrick G.M., 1996, CORRECTION SOFTWARE
   Tang LM, 2006, J ORGANOMET CHEM, V691, P2023, DOI 10.1016/j.jorganchem.2005.12.053
   Wang P, 2015, DALTON T, V44, P4718, DOI 10.1039/c4dt03599b
   Wong WY, 2010, ACCOUNTS CHEM RES, V43, P1246, DOI 10.1021/ar1000378
   Wood D, 1999, INORG CHEM, V38, P5788
   YANG XM, 1994, J AM CHEM SOC, V116, P10015, DOI 10.1021/ja00101a022
   Zhang J, 2009, DALTON T, P1806, DOI 10.1039/b817776g
   Zhou MS, 2008, INORG CHEM, V47, P6692, DOI 10.1021/ic800320e
   Zhou MS, 2008, INORG CHEM, V47, P1886, DOI 10.1021/ic702322n
   Zhou M, 2007, INORG CHEM COMMUN, V10, P1262, DOI 10.1016/j.inoche.2007.08.001
   Zhou MS, 2007, J ORGANOMET CHEM, V692, P5195, DOI 10.1016/j.jorganchem.2007.07.051
   Zhou MS, 2011, INORG CHEM, V50, P1926, DOI 10.1021/ic102401w
   Zhou M.-S., 2015, RSC ADV, V5
NR 43
TC 0
Z9 0
U1 8
U2 8
PU ELSEVIER SCIENCE SA
PI LAUSANNE
PA PO BOX 564, 1001 LAUSANNE, SWITZERLAND
SN 0022-328X
EI 1872-8561
J9 J ORGANOMET CHEM
JI J. Organomet. Chem.
PD JAN 1
PY 2017
VL 828
BP 10
EP 15
DI 10.1016/j.jorganchem.2016.11.017
PG 6
WC Chemistry, Inorganic & Nuclear; Chemistry, Organic
SC Chemistry
GA EI5TJ
UT WOS:000392557400002
ER

PT J
AU Camelin, P
   Javaloyes, J
   Marconi, M
   Giudici, M
AF Camelin, P.
   Javaloyes, J.
   Marconi, M.
   Giudici, M.
TI Electrical addressing and temporal tweezing of localized pulses in
   passively-mode-locked semiconductor lasers
SO PHYSICAL REVIEW A
LA English
DT Article
ID CAVITY SOLITONS; SUBCRITICAL INSTABILITIES; PATTERNS; SYSTEMS; BITS
AB We show that the pumping current is a convenient parameter for manipulating the temporal localized structures (LSs), also called localized pulses, found in passively-mode-locked vertical-cavity surface-emitting lasers. While short electrical pulses can be used for writing and erasing individual LSs, we demonstrate that a current modulation introduces a temporally evolving parameter landscape allowing one to control the position and the dynamics of LSs. We show that the localized pulse drifting speed in this landscape depends almost exclusively on the local parameter value instead of depending on the landscape gradient, as shown in quasi-instantaneous media. This experimental observation is theoretically explained by the causal response time of the semiconductor carriers that occurs on a finite time scale and breaks the parity invariance along the cavity, thus leading to a different paradigm for temporal tweezing of localized pulses. Different modulation waveforms are applied for describing exhaustively this paradigm. Starting from a generic model of passive mode locking based upon delay differential equations, we deduce the effective equations of motion for these LSs in a time-dependent current landscape.
C1 [Camelin, P.; Marconi, M.; Giudici, M.] Univ Cote DAzur, CNRS, Inst Nonlineaire Nice, F-06560 Valbonne, France.
   [Javaloyes, J.] Univ Illes Balears, Dept Fis, C Valldemossa Km 7-5, E-07122 Mallorca, Spain.
RP Marconi, M (reprint author), Univ Cote DAzur, CNRS, Inst Nonlineaire Nice, F-06560 Valbonne, France.
FU Ramon y Cajal fellowship; project COMBINA [TEC2015-65212-C3-3-P]; Region
   PACA; Projet Volet General GEDEPULSE ANR project OPTIROC; CNRS; Region
   PACA (Emplois Jeunes Doctorants)
FX J.J. acknowledges financial support from the Ramon y Cajal fellowship
   and project COMBINA (TEC2015-65212-C3-3-P). The INLN Group acknowledges
   funding of Region PACA with the Projet Volet General 2011 GEDEPULSE ANR
   project OPTIROC. M.G. thanks the University of Balearic Islands for a
   one-month visiting position. P.C.'s PhD grant is cofunded by CNRS and
   Region PACA (Emplois Jeunes Doctorants).
CR ARECCHI FT, 1992, PHYS REV A, V45, pR4225
   Astrov YA, 2001, PHYS LETT A, V283, P349, DOI 10.1016/S0375-9601(01)00257-2
   Barland S, 2002, NATURE, V419, P699, DOI 10.1038/nature01049
   Coullet P, 2004, CHAOS, V14, P193, DOI 10.1063/1.1642311
   Coullet P, 2000, PHYS REV LETT, V84, P3069, DOI 10.1103/PhysRevLett.84.3069
   Elsass T, 2010, APPL PHYS B-LASERS O, V98, P327, DOI 10.1007/s00340-009-3748-9
   Engelborghs K., 2001, TECHNICAL REPORT
   FAUVE S, 1990, PHYS REV LETT, V64, P282, DOI 10.1103/PhysRevLett.64.282
   Firth WJ, 2007, PHYS REV LETT, V99, DOI 10.1103/PhysRevLett.99.104503
   Firth WJ, 1996, PHYS REV LETT, V76, P1623, DOI 10.1103/PhysRevLett.76.1623
   Freeman R. L.., 2015, TELECOMMUNICATION SY
   Garbin B, 2015, NAT COMMUN, V6, DOI 10.1038/ncomms6915
   Genevet P, 2008, PHYS REV LETT, V101, DOI 10.1103/PhysRevLett.101.123905
   Giacomelli G, 1996, PHYS REV LETT, V76, P2686, DOI 10.1103/PhysRevLett.76.2686
   Herr T, 2014, NAT PHOTONICS, V8, P145, DOI [10.1038/nphoton.2013.343, 10.1038/NPHOTON.2013.343]
   Hurtado T., 2015, PHYS REV LETT, V115
   Jang JK, 2015, NAT COMMUN, V6, DOI 10.1038/ncomms8370
   Javaloyes J, 2016, PHYS REV LETT, V116, DOI 10.1103/PhysRevLett.116.133901
   Javaloyes J, 2016, PHYS REV LETT, V116, DOI 10.1103/PhysRevLett.116.043901
   Leo F, 2010, NAT PHOTONICS, V4, P471, DOI [10.1038/NPHOTON.2010.120, 10.1038/nphoton.2010.120]
   Lugiato L. A., 2003, QUANTUM ELECT IEEE J, V39, P193
   Maggipinto T, 2000, PHYS REV E, V62, P8726, DOI 10.1103/PhysRevE.62.8726
   Marconi M, 2015, NAT PHOTONICS, V9, P450, DOI [10.1038/nphoton.2015.92, 10.1038/NPHOTON.2015.92]
   Marconi M, 2014, PHYS REV LETT, V112, DOI 10.1103/PhysRevLett.112.223901
   Marconi M., 2016, SELECTED TOPICS QUAN, V21, P85
   Marconi M, 2015, IEEE J SEL TOP QUANT, V21, DOI 10.1109/JSTQE.2015.2435895
   Marino F, 2014, PHYS REV LETT, V112, DOI 10.1103/PhysRevLett.112.103901
   McSloy JM, 2002, PHYS REV E, V66, DOI 10.1103/PhysRevE.66.046606
   MOSES E, 1987, PHYS REV A, V35, P2757, DOI 10.1103/PhysRevA.35.2757
   NIEDERNOSTHEIDE FJ, 1992, PHYS STATUS SOLIDI B, V172, P249, DOI 10.1002/pssb.2221720123
   Nizette M, 2006, PHYSICA D, V218, P95, DOI 10.1016/j.physd.2006.04.013
   Pedaci F, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2828458
   Pedaci F, 2006, APPL PHYS LETT, V89, DOI 10.1063/1.2388867
   Romeira B, 2016, SCI REP-UK, V6, DOI 10.1038/srep19510
   Rosanov NN, 1988, OPT SPECTROSC, V65, P449
   Tanguy Y, 2008, PHYS REV LETT, V100, DOI 10.1103/PhysRevLett.100.013907
   THUAL O, 1988, J PHYS-PARIS, V49, P1829, DOI 10.1051/jphys:0198800490110182900
   TLIDI M, 1994, PHYS REV LETT, V73, P640, DOI 10.1103/PhysRevLett.73.640
   Uecker H, 2014, NUMER MATH-THEORY ME, V7, P58, DOI 10.4208/nmtma.2014.1231nm
   Umbanhowar PB, 1996, NATURE, V382, P793, DOI 10.1038/382793a0
   Vladimirov AG, 2005, PHYS REV A, V72, DOI 10.1103/PhysRevA.72.033808
   Vladimirov AG, 1999, J OPT B-QUANTUM S O, V1, P101, DOI 10.1088/1464-4266/1/1/019
   Vladimirov AG, 2010, J OPT SOC AM B, V27, P2102, DOI 10.1364/JOSAB.27.002102
   WU J, 1984, PHYS REV LETT, V52, P1421, DOI 10.1103/PhysRevLett.52.1421
NR 44
TC 0
Z9 0
U1 6
U2 6
PU AMER PHYSICAL SOC
PI COLLEGE PK
PA ONE PHYSICS ELLIPSE, COLLEGE PK, MD 20740-3844 USA
SN 2469-9926
EI 2469-9934
J9 PHYS REV A
JI Phys. Rev. A
PD DEC 27
PY 2016
VL 94
IS 6
AR 063854
DI 10.1103/PhysRevA.94.063854
PG 12
WC Optics; Physics, Atomic, Molecular & Chemical
SC Optics; Physics
GA EG3QT
UT WOS:000390960500024
ER

PT J
AU Saito, H
AF Saito, Hidetoshi
TI Multi-Track Joint Decoding Schemes Using Two-Dimensional Run-Length
   Limited Codes for Bit-Patterned Media Magnetic Recording
SO IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND
   COMPUTER SCIENCES
LA English
DT Article; Proceedings Paper
CT 38th Symposium on Information Theory and its Applications (SITA)
CY NOV, 2015
CL Kojima, JAPAN
DE two-dimensional magnetic recording; multi-track recording; run-length
   limited codes; bit-patterned media; generalized partial response;
   pattern-dependent noise-predictive sequence detection
ID EQUALIZATION; NOISE
AB This paper proposes an effective signal processing scheme using a modulation code with two-dimensional (2D) run-length limited (RLL) constraints for bit-patterned media magnetic recording (BPMR). This 2D signal processing scheme is applied to be one of two-dimensional magnetic recording (TDMR) schemes for shingled magnetic recording on bit patterned media (BPM). A TDMR scheme has been pointed out an important key technology for increasing areal density toward 10 TDMR. From the viewpoint of 2D signal processing for TDMR, multi-track joint decoding scheme is desirable to increase an effective transfer rate because this scheme gets readback signals from several adjacent parallel tracks and detect recorded data written in these tracks simultaneously. Actually, the proposed signal processing scheme for BPMR gets mixed readback signal sequences from the parallel tracks using a single reading head and these readback signal sequences are equalized to a frequency response given by a desired 2D generalized partial response system. In the decoding process, it leads to an increase in the effective transfer rate by using a single maximum likelihood (ML) sequence detector because the recorded data on the parallel tracks are decoded for each time slot. Furthermore, a new joint pattern-dependent noise-predictive (PDNP) sequence detection scheme is investigated for multi-track recording with media noise. This joint PDNP detection is embed in a ML detector and can be useful to eliminate media noise. Using computer simulation, it is shown that the joint PDNP detection scheme is able to compensate media noise in the equalizer output which is correlated and data-dependent.
C1 [Saito, Hidetoshi] Kogakuin Univ, Sch Adv Engn, Dept Appl Phys, Tokyo 1638677, Japan.
RP Saito, H (reprint author), Kogakuin Univ, Sch Adv Engn, Dept Appl Phys, Tokyo 1638677, Japan.
EM h-saito@cc.kokugakuin.ac.jp
FU JSPS KAKENHI [16K06313]
FX The author would like to thank the anonymous referees for their
   constructive comments and suggestions which helped improve this paper.
   This work was supported in part by a grant of JSPS KAKENHI (Grant-in-Aid
   for Scientific Research) Grant Number 16K06313.
CR Albrecht TR, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2015.2397880
   Chang W, 2011, IEEE T MAGN, V47, P2551, DOI 10.1109/TMAG.2011.2151839
   Karakulak S, 2010, IEEE T MAGN, V46, P3639, DOI 10.1109/TMAG.2010.2049116
   Moon J, 2001, IEEE J SEL AREA COMM, V19, P730, DOI 10.1109/49.920181
   Nabavi S., 2008, THESIS
   Nabavi S, 2007, IEEE ICC, P6249, DOI 10.1109/ICC.2007.1035
   Ng Y, 2009, IEEE T MAGN, V45, P3535, DOI 10.1109/TMAG.2009.2024427
   Ordentlich E, 2011, IEEE T INFORM THEORY, V57, P7661, DOI 10.1109/TIT.2011.2170108
   Sabato G, 2012, IEEE T COMMUN, V60, P669, DOI 10.1109/TCOMM.2012.122211.110026
   Saito H., 2015, IEEE T MAGN, V51, P1
   Wang Y., 2015, 26 MAGN REC C TMRC F, VF7, P97
   Wang Y., 2016, 2016 JOINT MMM INT C
   Wang Y, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2015.2464786
   Wood R, 2009, IEEE T MAGN, V45, P917, DOI 10.1109/TMAG.2008.2010676
   Wu T, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2013.2281779
   Zhang Y, 2011, MATH COMPUT MODEL, V53, P1810, DOI 10.1016/j.mcm.2010.12.059
   Zheng WX, 1999, J FRANKLIN I, V336, P1309, DOI 10.1016/S0016-0032(99)00038-1
NR 17
TC 0
Z9 0
U1 1
U2 1
PU IEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG
PI TOKYO
PA KIKAI-SHINKO-KAIKAN BLDG, 3-5-8, SHIBA-KOEN, MINATO-KU, TOKYO, 105-0011,
   JAPAN
SN 1745-1337
J9 IEICE T FUND ELECTR
JI IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
PD DEC
PY 2016
VL E99A
IS 12
BP 2248
EP 2255
DI 10.1587/transfun.E99.A.2248
PG 8
WC Computer Science, Hardware & Architecture; Computer Science, Information
   Systems; Engineering, Electrical & Electronic
SC Computer Science; Engineering
GA EJ2RU
UT WOS:000393059600017
ER

PT J
AU Tarr, BA
   Ladendorf, DW
   Sanchez, D
   Milner, GM
AF Tarr, B. A.
   Ladendorf, D. W.
   Sanchez, D.
   Milner, G. M.
TI Next-Generation Kick Detection During Connections: Influx Detection at
   Pumps Stop (IDAPS) Software
SO SPE DRILLING & COMPLETION
LA English
DT Article
AB At least 25% of all influx events on deepwater wells occur while making connections, but few deepwater rig contractors use kick-detection alarms to alert the driller during a connection (Fraser et al. 2014; Brakel et al. 2015). Because of the transient-flow characteristics associated with connections, kick detection during connections is the most challenging to automate effectively. The Influx Detection at Pumps Stop (IDAPS) software was developed to provide early warning of abnormal flowback conditions during connections. Available flow-in, flow-out, pit volume, bit depth, and hole-depth real-time data are used as input data. Particular attention was paid to achieving high probability of detection (PD) at low false-alarm rates (FARs) to minimize nuisance alarms, and fast influx-detection times to reduce kick volumes. The use of IDAPS to reliably detect a formation-fluid influx has improved safety, operational efficiency, and driller situational awareness. IDAPS has been deployed in an operator's real-time operations center for monitoring critical offshore wells since 2014.
   During IDAPS operation, pumps-off occurrences are automatically detected from the ramp-down of pump strokes, and saved as unique events. Machine-learning algorithms are applied to recent pumps-off event flow-out and pit-volume data patterns to adaptively calculate limits for "normal" events. The adaptive nature of these limits allows IDAPS processing to adjust to changes such as increasing hole depth. Each new pumps-off event is evaluated in real-time, and statistically meaningful deviations from the recent "normal" limits generate corresponding possible influx notifications at one of four confidence levels (low, medium, high, and confirmed). In addition, on the basis of data-pattern-recognition algorithms, the software detects and notifies the user of circulation- system data-validity issues that could otherwise impair influx-detection performance [e.g., a malfunctioning flow sensor (including sticking of the commonly used flow-out paddle-style flow sensor)], inconsistent pit volume gains, and others. Overlay plots of current and historical flow and pit-volume data have been shown to be valuable in significantly reducing the time required by the user to validate anomalous pumps-off event data automatically identified by IDAPS.
   On the basis of an extensive validation process, that included more than 1,300 historical pumps-off events, the demonstrated FAR for IDAPS was 1 per 195 connections with a 100% influx-detection rate, with an associated confirmed influx-detection time as fast as 84 seconds after pumps stopped.
C1 [Tarr, B. A.; Ladendorf, D. W.] Shell Int Explorat & Prod, Houston, TX 77079 USA.
   [Sanchez, D.] Shell Int Explorat & Prod, Deepwater WellVantage Remote Operat Ctr, Houston, TX USA.
   [Milner, G. M.] CoVar Appl Technol, Energy, Mclean, VA USA.
RP Tarr, BA (reprint author), Shell Int Explorat & Prod, Houston, TX 77079 USA.
CR Aldred W. D., 2008, SPE IADC DRILL C EXH
   Ali T. H., 2013, SPE IADC DRILL C EXH
   Ashley P. R., 2000, IADC SPE AS PAC DRIL
   Brakel J. D., 2015, SPE IADC DRILL C EXH
   BSEE (Bureau of Safety and Environmental Enforcement), 2013, 3 BSEE
   Cayeux E., 2013, SPE IADC MIDDL E DRI
   Fraser D., 2014, SPE ANN TECHN C EXH
   Jardine S. I., 1991, SPE OFFSH EUR C AB 3
   Nybo R., 2008, SPE INT EN C EXH AMS
NR 9
TC 0
Z9 0
U1 8
U2 8
PU SOC PETROLEUM ENG
PI RICHARDSON
PA 222 PALISADES CREEK DR,, RICHARDSON, TX 75080 USA
SN 1064-6671
EI 1930-0204
J9 SPE DRILL COMPLETION
JI SPE Drill. Complet.
PD DEC
PY 2016
VL 31
IS 4
BP 250
EP 260
PG 11
WC Engineering, Petroleum
SC Engineering
GA EJ6JO
UT WOS:000393325500001
ER

PT J
AU Chapman, BK
   McPhee, D
AF Chapman, Blake K.
   McPhee, Daryl
TI Global shark attack hotspots: Identifying underlying factors behind
   increased unprovoked shark bite incidence
SO OCEAN & COASTAL MANAGEMENT
LA English
DT Article
DE Unprovoked shark bite; Tiger shark (Galeocerdo cuvier); White shark
   (Carcharodon carcharias); Bull shark (Carcharhinus leucas);
   Human-wildlife interaction
ID NEW-SOUTH-WALES; WHALES MEGAPTERA-NOVAEANGLIAE; GREAT-BARRIER-REEF;
   WHITE SHARKS; CARCHARODON-CARCHARIAS; GALEOCERDO-CUVIER; AUSTRALIAN
   WATERS; CLIMATE-CHANGE; TIGER SHARK; CARCHARHINUS-LEUCAS
AB Unprovoked shark bite remains a rare, unlikely occurrence; however, shark bite incidence is increasing world-wide. In an effort to understand why shark bite incidence is increasing, we examine recent trends in unprovoked shark bite statistics and other media from the six global shark bite "hotspots", the United States, South Africa, Australia, Brazil, Reunion Island and the Bahamas, and review recent literature that identifies potential causative factors that may contribute to rising shark bite incidence. Increases in shark bite incidence are likely attributable to rises in human population, as well as other causative factors, including habitat destruction/modification, water quality, climate change and anomalous weather patterns and the distribution/abundance of prey. Our analysis shows that increases are likely the result of a set of conditions that disrupts the natural balance of an area at a local or regional level and increases the probability of shark-human interaction. We also present recommendations for future management of shark-human interaction. (C) 2016 Elsevier Ltd. All rights reserved.
C1 [Chapman, Blake K.; McPhee, Daryl] Bond Univ, Fac Soc & Design, Robina, Qld, Australia.
RP Chapman, BK (reprint author), Bond Univ, Fac Soc & Design, Robina, Qld, Australia.
EM blakechapmancomms@gmail.com
CR Adigun B., 2015, EXPRESS
   Afonso AS, 2014, PLOS ONE, V9, DOI 10.1371/journal.pone.0102369
   Afonso A.S, 2013, BIOECOLOGY MOVEMENT, P295
   Amin R, 2012, MAR FRESHW BEHAV PHY, V45, P185, DOI 10.1080/10236244.2012.715742
   Aubrey C., 2007, SHARK NURSERY GROUND, P175
   Austin B, 1999, J APPL MICROBIOL, V85, p234S
   Australian Bureau of Statistics, 2010, COAST DEV MEAS AUSTR
   Australian Bureau of Statistics, 2014, INT MOV 2013 14
   Bellwood DR, 2006, GLOBAL CHANGE BIOL, V12, P1587, DOI 10.1111/j.1365-2486.2006.01204.x
   Bigot L, 2006, MAR POLLUT BULL, V52, P865, DOI 10.1016/j.marpolbul.2005.11.021
   Blaison A., 2014, NEW INSIGHT SEASONAL, P22
   Bonfil R, 2005, SCIENCE, V310, P100, DOI 10.1126/science.1114898
   Brazier W, 2012, AFR J MAR SCI, V34, P249, DOI 10.2989/1814232X.2012.709967
   Breitburg DL, 2009, ANNU REV MAR SCI, V1, P329, DOI 10.1146/annurev.marine.010908.163754
   Brown AC, 2010, COPEIA, P232, DOI 10.1643/CE-08-012
   Bruce BD, 2006, MAR BIOL, V150, P161, DOI 10.1007/s00227-006-0325-1
   Bruce E, 2014, APPL GEOGR, V54, P83, DOI 10.1016/j.apgeog.2014.06.014
   Bureau of Meteorology, 2015, W AUSTR TROP CYCL SE
   Burgess GH, 2014, PLOS ONE, V9, DOI 10.1371/journal.pone.0098078
   Burgess GH, 2010, CRC MAR BIOL SER, P541
   Burgess G.H., 2014, ISAF 2013 WORLDWIDE
   Caldicott DGE, 2001, INJURY, V32, P445, DOI 10.1016/S0020-1383(01)00041-9
   Campbell R, 2014, AUST J ZOOL, V62, P261, DOI 10.1071/ZO14016
   Carlson JK, 2012, J FISH BIOL, V80, P1749, DOI 10.1111/j.1095-8649.2011.03193.x
   Chapple TK, 2011, BIOL LETTERS, V7, P581, DOI 10.1098/rsbl.2011.0124
   Chin A, 2010, GLOBAL CHANGE BIOL, V16, P1936, DOI 10.1111/j.1365-2486.2009.02128.x
   Chollett I, 2012, MAR POLLUT BULL, V64, P956, DOI 10.1016/j.marpolbul.2012.02.016
   Christiansen HM, 2014, PLOS ONE, V9, DOI 10.1371/journal.pone.0094407
   Clua E, 2014, J FORENSIC LEG MED, V25, P68, DOI 10.1016/j.jflm.2014.04.005
   Comas M.E., 2012, VOLUSIA BEACH WATER
   Crossley Roxanne, 2014, Human Dimensions of Wildlife, V19, P154
   Daly R, 2014, PLOS ONE, V9, DOI 10.1371/journal.pone.0109357
   Dennis G.D., 1993, P C GLOB ASP COR REE, P167
   Dias D., 2011, ECOCITY WORLD SUMMIT, V21
   Dudley SFJ, 2006, MAR FRESHWATER RES, V57, P225, DOI 10.1071/MF05156
   Dudley SFJ, 1997, OCEAN COAST MANAGE, V34, P1, DOI 10.1016/S0964-5691(96)00061-0
   Dudley SFJ, 2010, CRC MAR BIOL SER, P567
   Eilperin J., 2011, WAHINGTON POST
   Fallows C, 2013, PLOS ONE, V8, DOI 10.1371/journal.pone.0060797
   FAOSTAT, 2014, POPULATION
   Gibbs L., 2014, CONVERSATION, P1
   Gibbs L, 2015, MAR POLICY, V58, P116, DOI 10.1016/j.marpol.2015.04.014
   Gribble NA, 1998, MAR FRESHWATER RES, V49, P645, DOI 10.1071/MF97053
   Hall CM, 2001, OCEAN COAST MANAGE, V44, P601, DOI 10.1016/S0964-5691(01)00071-0
   Hazin FHV, 2014, ANIM CONSERV, V17, P287, DOI 10.1111/acv.12096
   Hazin FHV, 2008, B MAR SCI, V82, P199
   Hazin FHV, 2013, AN ACAD BRAS CIENC, V85, P1053, DOI 10.1590/S0001-37652013005000055
   Hitting A.K., 2013, MAR BIOL, V160, P1681
   Holmes B.J., 2012, FISH RES, p[38, 129]
   Holmes BJ, 2014, MAR BIOL, V161, P2645, DOI 10.1007/s00227-014-2536-1
   Honey M., 2007, CENT ECOTOURISM SUST, V140
   Hussey Nigel E., 2012, P27
   [Anonymous], 2015, FLOR MUS NAT HIST
   Islam MS, 2004, MAR POLLUT BULL, V48, P624, DOI 10.1016/j.marpolbul.2003.12.004
   Jewell OJD, 2013, ENVIRON BIOL FISH, V96, P881, DOI 10.1007/s10641-012-0084-4
   Kim SS, 2012, PLOS ONE, V7, DOI 10.1371/journal.pone.0030501
   Kingsford M.J., 2007, CLIMATE CHANGE GREAT, P555
   Klimley AP, 2001, MAR BIOL, V138, P617, DOI 10.1007/s002270000489
   Kock A., 2012, GLOBAL PERSPECTIVES, P447
   Kock A., 2006, WWF S AFRICA REPORT, P1
   Koening ML, 2003, BRAZ ARCH BIOL TECHN, V46, P73, DOI 10.1590/S1516-89132003000100012
   Krogh M, 1996, BIOL CONSERV, V77, P219, DOI 10.1016/0006-3207(95)00141-7
   Lisney T., 2004, NEUROETHOLOGY VISION
   LiveScience, 2013, STORM COV
   Long DJ, 1996, GREAT WHITE SHARKS, P293, DOI 10.1016/B978-012415031-7/50028-8
   Lotze HK, 2006, SCIENCE, V312, P1806, DOI 10.1126/science.1128035
   Lowe Christopher G., 2012, P169
   Lynch AMJ, 2010, AQUAT CONSERV, V20, P312, DOI 10.1002/aqc.1056
   Maguire GS, 2011, OCEAN COAST MANAGE, V54, P781, DOI 10.1016/j.ocecoaman.2011.07.012
   Maljkovic A, 2011, BIOL CONSERV, V144, P859, DOI 10.1016/j.biocon.2010.11.019
   Marie C., 2012, DEMOGRAPHIC MIGRATIO, P1
   Matich P, 2012, MAR ECOL PROG SER, V447, P165, DOI 10.3354/meps09497
   McPhee D, 2014, COAST MANAGE, V42, P478, DOI 10.1080/08920753.2014.942046
   Meeuwig JJ, 2014, ANIM CONSERV, V17, P297, DOI 10.1111/acv.12154
   Meeuwig J.J., 2014, CONVERSATION
   Morgan D, 2013, OCEAN COAST MANAGE, V84, P180, DOI 10.1016/j.ocecoaman.2013.08.006
   Mull J., 2015, SURFER MAGAZINE
   Mull J., 2013, REUNION ISLAND BANS
   Munday PL, 2008, FISH FISH, V9, P261, DOI 10.1111/j.1467-2979.2008.00281.x
   Murtugudde R, 2000, J GEOPHYS RES-OCEANS, V105, P3295, DOI 10.1029/1999JC900294
   Myrick JG, 2014, SCI COMMUN, V36, P544, DOI 10.1177/1075547014547159
   National Climate Centre, 2009, EV COR REEF MAPP MET, P1
   Neff C., 2014, HUMAN PERCEPTIONS AT
   Neff C, 2012, COAST MANAGE, V40, P88, DOI 10.1080/08920753.2011.639867
   Neumann B, 2015, PLOS ONE, V10, DOI 10.1371/journal.pone.0118571
   Noad Michael J., 2011, Journal of Cetacean Research and Management, P243
   Ortega LA, 2009, ENVIRON BIOL FISH, V84, P361, DOI 10.1007/s10641-009-9442-2
   Paschoa C., 2013, MARINE TECHNOLOGY NE
   PATERSON RA, 1990, BIOL CONSERV, V52, P147, DOI 10.1016/0006-3207(90)90123-7
   Perry AL, 2005, SCIENCE, V308, P1912, DOI 10.1126/science.1111322
   Powers SP, 2013, MAR COAST FISH, V5, P93, DOI 10.1080/19425120.2013.786001
   Rabalais NN, 2009, ICES J MAR SCI, V66, P1528, DOI 10.1093/icesjms/fsp047
   Reid DD, 2011, MAR FRESHWATER RES, V62, P676, DOI 10.1071/MF10162
   Rolland M, 2012, AM J FOREN MED PATH, V33, P265, DOI 10.1097/PAF.0b013e3182186f85
   Ropelewski C., 1999, CONSEQUENCES, V5, P17
   Sawers R., 2012, WORLD NEWS TV
   SBS, 2014, INS REUN SHARK CULL
   Simpfendorfer CA, 2011, MAR FRESHWATER RES, V62, P518, DOI 10.1071/MF11086
   Skomal Gregory B., 2012, P405
   Smith S.K., 2015, TRENDS FLORIDAS POPU
   Sprivulis P., 2014, AUST MED J, V7, P137
   Stewart R., 2015, REUNION SHARK ATTACK
   Sunstein CR, 2011, ENVIRON RESOUR ECON, V48, P435, DOI 10.1007/s10640-010-9449-3
   Towner AV, 2013, PLOS ONE, V8, DOI 10.1371/journal.pone.0066035
   United States Census Bureau, 2015, STAT COUNT QUICKF
   Van Grevelynghe G, 2000, 3RD MEETING OF THE EUROPEAN ELASMOBRANCH ASSOCIATION, PROCEEDINGS, P73
   Waycott M, 2007, CLIMATE CHANGE GREAT, P193
   Wcisel M, 2015, BEHAV ECOL SOCIOBIOL, V69, P127, DOI 10.1007/s00265-014-1825-5
   Weltz K., 2013, PLOS ONE, V8
   Werry J.M., 2010, HABITAT ECOLOGY BULL
   Werry JM, 2012, PLOS ONE, V7, DOI 10.1371/journal.pone.0049796
   West JG, 2011, MAR FRESHWATER RES, V62, P744, DOI 10.1071/MF10181
   Wetherbee Bradley M., 1994, Pacific Science, V48, P95
   Woolgar JD, 2001, J TRAUMA, V50, P887, DOI 10.1097/00005373-200105000-00019
NR 114
TC 1
Z9 1
U1 93
U2 94
PU ELSEVIER SCI LTD
PI OXFORD
PA THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD OX5 1GB, OXON, ENGLAND
SN 0964-5691
EI 1873-524X
J9 OCEAN COAST MANAGE
JI Ocean Coastal Manage.
PD DEC
PY 2016
VL 133
BP 72
EP 84
DI 10.1016/j.ocecoaman.2016.09.010
PG 13
WC Oceanography; Water Resources
SC Oceanography; Water Resources
GA EA9UJ
UT WOS:000386989900009
ER

PT J
AU Zhao, XT
   Liu, W
   Dai, ZM
   Li, D
   Zhao, XG
   Wang, ZH
   Kim, D
   Choi, CJ
   Zhang, ZD
AF Zhao, X. T.
   Liu, W.
   Dai, Z. M.
   Li, D.
   Zhao, X. G.
   Wang, Z. H.
   Kim, D.
   Choi, C. J.
   Zhang, Z. D.
TI Weak dipolar interaction between CoPd multilayer nanodots for
   bit-patterned media application
SO MATERIALS LETTERS
LA English
DT Article
DE Magnetic materials; Multilayer structure; Nanodot; Anodic aluminum
   oxide(AAO); Magnetic force microscopy (MFM); First order reverse
   curves(FORC)
ID 1ST-ORDER REVERSAL CURVES; ARRAYS; FABRICATION; ALUMINA
AB The morphology and magnetic performance of CoPd multilayer nanodots have been investigated by a combination of DC sputtering, anodic aluminum oxide(AAO) template method and Ar ion etching. The nanodots exhibit a normal switching field distribution(SFD) of 17%, which is comparative to Bit-patterned media (BPM) made by e-Beam. It is found that the first-order reverse curve (FORC) data of CoPd nanodots have a good match with the mean-field model, which shows dipolar interaction contributes as small as 8.4% to the total SFD. Magnetic force microscope(MFM) imaging at a certain location confirms the FORC results by observing the effect of dipolar interaction directly. Our CoPd multilayer nanodots can be a good candidate for BPM application. (C) 2016 Elsevier B.V. All rights reserved.
C1 [Zhao, X. T.; Liu, W.; Dai, Z. M.; Li, D.; Zhao, X. G.; Wang, Z. H.; Zhang, Z. D.] Chinese Acad Sci, Shenyang Natl Lab Mat Sci, Inst Met Res, Shenyang 110016, Peoples R China.
   [Kim, D.; Choi, C. J.] Korea Inst Mat Sci, Powder & Ceram Div, 797 Changwon Daero, Chang Won 642831, South Korea.
RP Liu, W (reprint author), Chinese Acad Sci, Shenyang Natl Lab Mat Sci, Inst Met Res, Shenyang 110016, Peoples R China.
EM wliu@imr.ac.cn
FU National Natural Science Foundation of China [51590883, 51471167];
   Chinese Academy of Sciences [KJZD-EW-M05-3]; Ministry of Science, ICT
   and Future Planning/Korea Research Council for Industrial Science and
   Technology
FX This work was supported by the National Natural Science Foundation of
   China under projects 51590883, 51471167 and the project of Chinese
   Academy of Sciences with Grant number KJZD-EW-M05-3. This work was also
   supported by a Joint Research Project from Ministry of Science, ICT and
   Future Planning/Korea Research Council for Industrial Science and
   Technology.
CR Chu SZ, 2006, J ELECTROCHEM SOC, V153, pB384, DOI 10.1149/1.2218822
   Dumas RK, 2007, PHYS REV B, V75, DOI 10.1103/PhysRevB.75.134405
   Dumas RK, 2012, PHYS REV B, V86, DOI 10.1103/PhysRevB.86.144410
   Gilbert DA, 2014, SCI REP-UK, V4, DOI 10.1038/srep04204
   Gong WJ, 2012, APPL PHYS LETT, V101, DOI 10.1063/1.4733341
   Hauet T, 2014, PHYS REV B, V89, DOI 10.1103/PhysRevB.89.174421
   Hellwig O, 2007, APPL PHYS LETT, V90, DOI 10.1063/1.2730744
   Kim C., 2007, APPL PHYS LETT, V91
   Lee W, 2008, NAT NANOTECHNOL, V3, P402, DOI 10.1038/nnano.2008.161
   Li AP, 1998, J APPL PHYS, V84, P6023, DOI 10.1063/1.368911
   Li WJ, 2015, APPL PHYS LETT, V106, DOI 10.1063/1.4913422
   Liu K, 2002, APPL PHYS LETT, V81, P4434, DOI 10.1063/1.1526458
   Pei WL, 2011, ACTA MATER, V59, P4818, DOI 10.1016/j.actamat.2011.04.024
   Pike CR, 1999, J APPL PHYS, V85, P6660, DOI 10.1063/1.370176
   Piraux L, 2012, APPL PHYS LETT, V101, DOI 10.1063/1.4731640
   Stancu A, 2003, J APPL PHYS, V93, P6620, DOI 10.1063/1.1557656
   Thomson T, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.257204
   Yang YM, 2014, NANOTECHNOLOGY, V25, DOI 10.1088/0957-4484/25/19/195202
NR 18
TC 0
Z9 0
U1 20
U2 38
PU ELSEVIER SCIENCE BV
PI AMSTERDAM
PA PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
SN 0167-577X
EI 1873-4979
J9 MATER LETT
JI Mater. Lett.
PD NOV 1
PY 2016
VL 182
BP 185
EP 189
DI 10.1016/j.matlet.2016.06.121
PG 5
WC Materials Science, Multidisciplinary; Physics, Applied
SC Materials Science; Physics
GA DU6PZ
UT WOS:000382338400046
ER

PT J
AU Vogler, C
   Abert, C
   Bruckner, F
   Suess, D
   Praetorius, D
AF Vogler, Christoph
   Abert, Claas
   Bruckner, Florian
   Suess, Dieter
   Praetorius, Dirk
TI Basic noise mechanisms of heat-assisted-magnetic recording
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article
AB Heat-assisted magnetic recording (HAMR) is expected to be a key technology to significantly increase the areal storage density of magnetic recording devices. At high temperatures, thermally induced noise becomes a major problem, which must be overcome in order to reliably write magnetic bits with narrow transitions. We propose an elementary model based on the effective recording time window (ERTW) to compute the switching probability of bits during HAMR. With few assumptions, this analytical model allows to gain deeper insights into basic noise mechanisms, like AC and DC noise. Finally, we discuss strategies to reduce noise and to increase the areal storage density of both bit-patterned and granular media. Published by AIP Publishing.
C1 [Vogler, Christoph] TU Wien, Inst Solid State Phys, Wiedner Hauptstr 8-10, A-1040 Vienna, Austria.
   [Vogler, Christoph; Praetorius, Dirk] TU Wien, Inst Anal & Sci Comp, Wiedner Hauptstr 8-10, A-1040 Vienna, Austria.
   [Abert, Claas; Bruckner, Florian; Suess, Dieter] TU Wien, Inst Solid State Phys, Christian Doppler Lab Adv Magnet Sensing & Mat, Wiedner Hauptstr 8-10, A-1040 Vienna, Austria.
RP Vogler, C (reprint author), TU Wien, Inst Solid State Phys, Wiedner Hauptstr 8-10, A-1040 Vienna, Austria.; Vogler, C (reprint author), TU Wien, Inst Anal & Sci Comp, Wiedner Hauptstr 8-10, A-1040 Vienna, Austria.
EM christoph.vogler@tuwien.ac.at
FU Vienna Science and Technology Fund (WWTF) [MA14-044]; Advanced Storage
   Technology Consortium (ASTC); Austrian Science Fund (FWF) [F4112 SFB
   ViCoM, I2214-N20]
FX The authors would like to thank the Vienna Science and Technology Fund
   (WWTF) under Grant No. MA14-044, the Advanced Storage Technology
   Consortium (ASTC), and the Austrian Science Fund (FWF) under Grant Nos.
   F4112 SFB ViCoM and I2214-N20 for the financial support.
CR Atxitia U, 2007, APPL PHYS LETT, V91, DOI 10.1063/1.2822807
   Bunce C, 2010, PHYS REV B, V81, DOI 10.1103/PhysRevB.81.174428
   Chubykalo-Fesenko O, 2006, PHYS REV B, V74, DOI 10.1103/PhysRevB.74.094436
   Evans RFL, 2012, PHYS REV B, V85, DOI 10.1103/PhysRevB.85.014433
   Garanin DA, 2004, PHYS REV B, V70, DOI 10.1103/PhysRevB.70.212409
   Greaves S, 2012, IEEE T MAGN, V48, P1794, DOI 10.1109/TMAG.2012.2187776
   Ju GP, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2015.2439690
   Kazantseva N, 2008, PHYS REV B, V77, DOI 10.1103/PhysRevB.77.184428
   McDaniel TW, 2012, J APPL PHYS, V112, DOI 10.1063/1.4733311
   MEE CD, 1967, IEEE T MAGN, VMAG3, P72, DOI 10.1109/TMAG.1967.1066003
   Mendil J, 2014, SCI REP-UK, V4, DOI 10.1038/srep03980
   Rottmayer RE, 2006, IEEE T MAGN, V42, P2417, DOI 10.1109/TMAG.2006.879572
   Schieback C, 2009, PHYS REV B, V80, DOI 10.1103/PhysRevB.80.214403
   Suess D, 2015, J APPL PHYS, V117, DOI 10.1063/1.4918609
   Vogler C, 2016, J APPL PHYS, V119, DOI 10.1063/1.4953390
   Vogler C, 2014, PHYS REV B, V90, DOI 10.1103/PhysRevB.90.214431
   Zhu JG, 2013, IEEE T MAGN, V49, P765, DOI 10.1109/TMAG.2012.2231855
   Zhu JG, 2015, IEEE MAGN LETT, V6, DOI 10.1109/LMAG.2015.2427117
   Lewicki G. W., U.S. patent, Patent No. [US3626114, 3626114]
   Kobayashi H., 1984, Japan patent application, Patent No. [JPS57113402, 57113402]
NR 20
TC 2
Z9 2
U1 5
U2 6
PU AMER INST PHYSICS
PI MELVILLE
PA 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
SN 0021-8979
EI 1089-7550
J9 J APPL PHYS
JI J. Appl. Phys.
PD OCT 21
PY 2016
VL 120
IS 15
AR 153901
DI 10.1063/1.4964949
PG 7
WC Physics, Applied
SC Physics
GA EA9BA
UT WOS:000386934000005
ER

PT J
AU Xiong, SS
   Chapuis, YA
   Wan, L
   Gao, H
   Li, X
   Ruiz, R
   Nealey, PF
AF Xiong, Shisheng
   Chapuis, Yves-Andre
   Wan, Lei
   Gao, He
   Li, Xiao
   Ruiz, Ricardo
   Nealey, Paul F.
TI Directed self-assembly of high-chi block copolymer for nano fabrication
   of bit patterned media via solvent annealing
SO NANOTECHNOLOGY
LA English
DT Article
DE directed self-assembly; bit patterned media; solvent annealing;
   nanoimprint
ID SEQUENTIAL INFILTRATION SYNTHESIS; TRIBLOCK COPOLYMER; THIN-FILMS;
   PHASE; LITHOGRAPHY
AB We report the formation of nanoimprint master templates that can be used for the fabrication of bit patterned media (BPM). The template was formed by directed self-assembly, with solvent annealing, of a symmetric ABA triblock copolymer to form perpendicularly oriented lamellae on chemical patterns. We used a high-chi block copolymer, poly(2-vinyl pyridine)-block-polystyrene- block-poly(2-vinyl pyridine) to achieve smaller feature sizes than are possible with polystyrene-block-poly(methyl methacrylate). The work shows that triblock copolymers can provide a large processing window in terms of pitch commensurability. Using block-selective infiltration (atomic layer deposition with sequential long soaking/purge cycles), an alumina composite with high etch resistance was specifically incorporated into the polar and hydrophilic P2VP domains. Subsequently, the surface pattern was successfully transferred into underlying Si substrates by etching with a fluorine-containing plasma to create a nanoimprint master. The line/space pattern of the nanoimprint master met the BPM fabrication requirement of defectivity < 10(-3). For demonstration purposes, the nanoimprint master was used to imprint a replica pattern of photoresist on a quartz wafer.
C1 [Xiong, Shisheng; Li, Xiao; Nealey, Paul F.] Univ Chicago, Inst Mol Engn, Chicago, IL 60637 USA.
   [Chapuis, Yves-Andre; Wan, Lei; Gao, He; Ruiz, Ricardo] HGST, San Jose, CA 95135 USA.
RP Nealey, PF (reprint author), Univ Chicago, Inst Mol Engn, Chicago, IL 60637 USA.
EM nealey@uchicago.edu
OI Ruiz, Ricardo/0000-0002-1698-4281
FU US Department of Energy, Office of Science, and Office of Basic Energy
   Sciences-Materials Science; Advanced Storage Technology Corporation
FX This work is supported by the US Department of Energy, Office of
   Science, and Office of Basic Energy Sciences-Materials Science. SX
   received support from the Advanced Storage Technology Corporation. SX
   would like to acknowledge HGST, a Western Digital Company for offering
   opportunities to use the facilities to conduct research at the San Jose
   research center. The authors also thank KC Patel for technical
   assistance.
CR Albrecht TR, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2015.2397880
   Bates CM, 2012, SCIENCE, V338, P775, DOI 10.1126/science.1226046
   Cushen J, 2015, ACS APPL MATER INTER, V7, P13476, DOI 10.1021/acsami.5b02481
   Doerk GS, 2015, NANOTECHNOLOGY, V26, DOI 10.1088/0957-4484/26/8/085304
   EASTMAN CE, 1994, MACROMOLECULES, V27, P5591, DOI 10.1021/ma00098a012
   Grobis MK, 2011, IEEE T MAGN, V47, P6, DOI 10.1109/TMAG.2010.2076798
   Hanley KJ, 1998, J POLYM SCI POL PHYS, V36, P3101, DOI 10.1002/(SICI)1099-0488(199812)36:17<3101::AID-POLB10>3.0.CO;2-X
   Hur SM, 2015, ACS MACRO LETT, V4, P11, DOI 10.1021/mz500705q
   Jeong JW, 2011, NANO LETT, V11, P4095, DOI 10.1021/nl2016224
   Khaira GS, 2014, ACS MACRO LETT, V3, P747, DOI 10.1021/mz5002349
   Lodge TP, 2003, MACROMOLECULES, V36, P816, DOI 10.1021/ma0209601
   MATSEN MW, 1994, MACROMOLECULES, V27, P187, DOI 10.1021/ma00079a027
   Peng Q, 2011, ACS NANO, V5, P4600, DOI 10.1021/nn2003234
   Ruiz R, 2012, J VAC SCI TECHNOL B, V30, DOI 10.1116/1.4758773
   Ruiz R, 2011, ACS NANO, V5, P79, DOI 10.1021/nn101561p
   Stoykovich MP, 2005, SCIENCE, V308, P1442, DOI 10.1126/science.1111041
   Sun ZW, 2015, ADV MATER, V27, P4364, DOI 10.1002/adma.201501585
   Tseng YC, 2011, J PHYS CHEM C, V115, P17725, DOI 10.1021/jp205532e
   Wan L, 2015, ACS NANO, V9, P7506, DOI 10.1021/acsnano.5b02613
   Wan L, 2012, J MICRO-NANOLITH MEM, V11, DOI 10.1117/1.JMM.11.3.031405
   Williamson LD, 2016, ACS APPL MATER INTER, V8, P2704, DOI [10.1021/acsami.5b10562, 10.1021/acsami.5610562]
   Yoshida H, 2013, J PHOTOPOLYM SCI TEC, V26, P55
   Nealey P. F., 2012, US. Pat, Patent No. [US20120202017A1, 20120202017, US 20120202017 A1]
NR 23
TC 0
Z9 0
U1 9
U2 9
PU IOP PUBLISHING LTD
PI BRISTOL
PA TEMPLE CIRCUS, TEMPLE WAY, BRISTOL BS1 6BE, ENGLAND
SN 0957-4484
EI 1361-6528
J9 NANOTECHNOLOGY
JI Nanotechnology
PD OCT 14
PY 2016
VL 27
IS 41
AR 415601
DI 10.1088/0957-4484/27/41/415601
PG 6
WC Nanoscience & Nanotechnology; Materials Science, Multidisciplinary;
   Physics, Applied
SC Science & Technology - Other Topics; Materials Science; Physics
GA EL9XG
UT WOS:000394972800001
ER

PT J
AU Suzuki, M
   Kondo, Y
   Ariake, J
AF Suzuki, Motohiro
   Kondo, Yuji
   Ariake, Jun
TI Direct measurement of single-dot coercivity and statistical analysis of
   switching field distribution in bit-patterned media using scanning
   hard-X-ray nanoprobe
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article
ID MAGNETIC FORCE MICROSCOPY; MAGNETOMETRY; ANISOTROPY; REVERSAL
AB To investigate the possible sources of the switching field distribution in bit-patterned media, we applied a scanning hard-X-ray nanoprobe technique based on X-ray magnetic circular dichroism spectroscopy to an array of Co-Pt dots with the typical diameters of 200 nm. Element-specific magnetization curves at the Pt L-3 edge were measured for individual dots isolated from each other, and the magnetization switching field (coercivity) values were determined for more than 100 individual dots. To assess the effect of dot diameters as a possible source of switching field distribution, a statistical analysis of the coercivity values and dot diameters measured for many dots was performed. The resulting switching field distribution had a mean of < HSWi > = 1.80 kOe and a standard deviation of sigma H-SW = 0.64 kOe. The relative deviation of sigma HSW/< HSWi > = 36% was not in good agreement with the relative dispersion in a dot diameter of sigma D/< Di > = 2.7%, and no clear correlation between the coercivity and dot diameter was observed. These results may suggest other possible sources of switching field distribution than dot diameter, such as dispersion in the c-axis orientation and in magnetocrystalline anisotropy. Published by AIP Publishing.
C1 [Suzuki, Motohiro] Japan Synchrotron Radiat Res Inst JASRI, 1-1-1 Kouto, Sayo, Hyogo 6795198, Japan.
   [Kondo, Yuji; Ariake, Jun] Akita Ind Technol Ctr AIT, 4-21 Sanuki, Akita 0101623, Japan.
RP Suzuki, M (reprint author), Japan Synchrotron Radiat Res Inst JASRI, 1-1-1 Kouto, Sayo, Hyogo 6795198, Japan.
EM m-suzuki@spring8.or.jp
FU Research-Network Building Program for the Reduction of Carbon Dioxide
   Emission, JSPS KAKENHI Grant [23360016]; Green IT Project of New Energy
   and Industrial Technology Development, Japan
FX The authors thank Naomi Kawamura and Masaichiro Mizumaki for their
   technical assistance. The synchrotron radiation experiments were
   performed at the BL39XU of SPring-8 with the approval of the Japan
   Synchrotron Radiation Research Institute (JASRI) (Proposal Nos.
   2011B1887, 2011B2098, and 2012B1328). This work was supported by the
   Research-Network Building Program for the Reduction of Carbon Dioxide
   Emission, JSPS KAKENHI Grant No. 23360016, and the Green IT Project of
   New Energy and Industrial Technology Development, Japan.
CR Bai J, 2004, J APPL PHYS, V96, P1133, DOI 10.1063/1.1762714
   Fischer P, 2011, MAT SCI ENG R, V72, P81, DOI 10.1016/j.mser.2011.03.002
   Hellwig O, 2007, APPL PHYS LETT, V90, DOI 10.1063/1.2730744
   Hosaka S, 2012, ADV MATER RES-SWITZ, V490-495, P292, DOI 10.4028/www.scientific.net/AMR.490-495.292
   Ishio S, 2014, J MAGN MAGN MATER, V360, P205, DOI 10.1016/j.jmmm.2014.02.049
   Kihara N, 2012, J VAC SCI TECHNOL B, V30, DOI 10.1116/1.4763356
   Kikitsu A, 2009, J MAGN MAGN MATER, V321, P526, DOI 10.1016/j.jmmm.2008.05.039
   Kikuchi N, 2005, IEEE T MAGN, V41, P3613, DOI 10.1109/TMAG.2005.854784
   Kondo Y, 2008, J MAGN MAGN MATER, V320, P3157, DOI 10.1016/j.jmmm.2008.08.096
   Kondo Y., 2010, Journal of the Magnetics Society of Japan, V34, P484, DOI 10.3379/msjmag.1006R003
   Kondo Y, 2011, PHYSCS PROC, V16, DOI 10.1016/j.phpro.2011.06.106
   Lau JW, 2007, J APPL PHYS, V102, DOI 10.1063/1.2761850
   Lau JW, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2822439
   Nolle D, 2011, MICROSC MICROANAL, V17, P834, DOI 10.1017/S1431927611000560
   Pfau B, 2011, APPL PHYS LETT, V99, DOI 10.1063/1.3623488
   Richter HJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2209179
   Ross C, 2001, ANN REV MATER RES, V31, P203, DOI 10.1146/annurev.matsci.31.1.203
   Shaw JM, 2010, PHYS REV B, V82, DOI 10.1103/PhysRevB.82.144437
   Stangl J., 2013, NANOBEAM XRAY SCATTE
   Suzuki M, 2013, J PHYS CONF SER, V430, DOI 10.1088/1742-6596/430/1/012017
   Suzuki M, 2007, AIP CONF PROC, V879, P1699
   Thomson T, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.257204
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
   Yamaoka T, 2006, JPN J APPL PHYS 1, V45, P2230, DOI 10.1143/JJAP.45.2230
   Yamauchi K, 2011, J PHYS-CONDENS MAT, V23, DOI 10.1088/0953-8984/23/39/394206
   Yan HF, 2014, J PHYS D APPL PHYS, V47, DOI 10.1088/0022-3727/47/26/263001
NR 26
TC 0
Z9 0
U1 1
U2 1
PU AMER INST PHYSICS
PI MELVILLE
PA 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
SN 0021-8979
EI 1089-7550
J9 J APPL PHYS
JI J. Appl. Phys.
PD OCT 14
PY 2016
VL 120
IS 14
AR 144503
DI 10.1063/1.4964810
PG 5
WC Physics, Applied
SC Physics
GA EA3VK
UT WOS:000386535400049
ER

PT J
AU Gross, JH
   Johnson, KT
AF Gross, Justin H.
   Johnson, Kaylee T.
TI Twitter Taunts and Tirades: Negative Campaigning in the Age of Trump
SO PS-POLITICAL SCIENCE & POLITICS
LA English
DT Article
ID STRATEGY; DETERMINANTS; MESSAGES
AB What drives candidates to go negative and against which opponents? Using a unique dataset consisting of all inter-candidate tweets by the 17 Republican presidential candidates in the 2016 primaries, we assess predictors of negative affect online. Twitter is a free platform, and candidates therefore face no resource limitations when using it; this makes Twitter a wellspring of information about campaign messaging, given a level playing-field. Moreover, Twitter's 140-character limit acts as a liberating constraint, leading candidates to issue sound bites ready for potential distribution not only online, but also through conventional media, as tweets become news. We find tweet negativity and overall rate of tweeting increases as the campaign season progresses. Unsurprisingly, the front-runner and eventual nominee, Donald Trump, sends and receives the most negative tweets and is more likely than his opponents to strike out against even those opponents who are polling poorly. However, candidates overwhelmingly punch upwards against those ahead of them in the polls, and this pattern goes beyond attacks against those near the top. Sixty of 136 dyads are characterized by lopsided negativity in one direction and only one of these 60 involves a clearly higher status candidate on the offensive.
C1 [Gross, Justin H.] Univ Massachusetts, Polit Sci, Amherst, MA 01003 USA.
   [Johnson, Kaylee T.] Univ Massachusetts, Amherst, MA 01003 USA.
RP Gross, JH (reprint author), Univ Massachusetts, Polit Sci, Amherst, MA 01003 USA.
EM jhgross@polsci.umass.edu; ktjohnson@polsci.umass.edu
CR American Press Institute, 2016, NEW UND WHAT MAK PEO
   Conway BA, 2013, AM BEHAV SCI, V57, P1596, DOI 10.1177/0002764213489014
   Csardi G., 2006, INTERJOURNAL, V2006, P1695
   Damore DF, 2002, POLIT RES QUART, V55, P669, DOI 10.2307/3088036
   Djupe PA, 2002, POLIT RES QUART, V55, P845, DOI 10.2307/3088082
   Druckman JN, 2010, POLIT COMMUN, V27, P88, DOI 10.1080/10584600903502607
   Flowers JF, 2003, AM J POLIT SCI, V47, P259, DOI 10.1111/1540-5907.00018
   Graham T, 2013, INFORM COMMUN SOC, V16, P692, DOI 10.1080/1369118X.2013.785581
   Hale JF, 1996, SOC SCI QUART, V77, P329
   Haynes AA, 1998, POLIT RES QUART, V51, P691, DOI 10.2307/3088045
   Haynes AA, 2002, POLIT RES QUART, V55, P633, DOI 10.2307/3088034
   Lee Jasmine C., 2016, 239 PEOPLE PLACES TH
   John Thielmann, 1998, J POLIT, V60, P1050, DOI [10.2307/2647730, DOI 10.2307/2647730]
   Kahn KF, 1999, AM POLIT SCI REV, V93, P877, DOI 10.2307/2586118
   Lee Kaid Lynda, 1997, AM BEHAV SCI, V40, P877
   Peterson DAM, 2005, POLIT RES QUART, V58, P45, DOI 10.2307/3595594
   R Core Team, 2013, R LANG ENV STAT COMP
   Richard Lau, 2007, AM POLIT SCI REV, V69, P851
   Lau Richard R., 2009, ANNU REV POLIT SCI, V12, P285, DOI 10.1146/annurev.polisci.10.071905.101448
   Lau Richard R., 2001, PARTY POLIT, V7, P69, DOI 10.1177/1354068801007001004
   SKAPERDAS S, 1995, AM POLIT SCI REV, V89, P49, DOI 10.2307/2083074
   Stephen Ansolabehere, 1994, AM POLIT SCI REV, V88, P901
   SURLIN SH, 1977, JOURNALISM QUART, V54, P89
   Vergeer M, 2013, J COMPUT-MEDIAT COMM, V18, P399, DOI 10.1111/jcc4.12023
NR 24
TC 0
Z9 0
U1 12
U2 12
PU CAMBRIDGE UNIV PRESS
PI NEW YORK
PA 32 AVENUE OF THE AMERICAS, NEW YORK, NY 10013-2473 USA
SN 1049-0965
EI 1537-5935
J9 PS-POLIT SCI POLIT
JI PS-Polit. Sci. Polit.
PD OCT
PY 2016
VL 49
IS 4
BP 748
EP 754
DI 10.1017/S1049096516001700
PG 7
WC Political Science
SC Government & Law
GA EA5DH
UT WOS:000386639000021
ER

PT J
AU Neumann, A
   Frauen, A
   Vollmers, J
   Meyer, A
   Oepen, HP
AF Neumann, Alexander
   Frauen, Axel
   Vollmers, Julian
   Meyer, Andreas
   Oepen, Hans Peter
TI Structure-induced spin reorientation in magnetic nanostructures
SO PHYSICAL REVIEW B
LA English
DT Article
ID BIT PATTERNED MEDIA; RANDOM-ACCESS MEMORY; LATTICE-PARAMETERS; ULTRATHIN
   FILMS; SURFACE STRESS; ANISOTROPY; REVERSAL; LOGIC; SIZE; NANOPARTICLES
AB We report on structuring-induced changes of the magnetic anisotropy of cylindrical nanostructures which are carved out of thin Pt/Co/Pt films. The magnetic properties of films and structures with a diameter of about 34 nm were investigated via magneto-optic Kerr effect. The magnetic anisotropy is determined for both films and nanostructures for varying Co thicknesses (0.5-7 nm). In general, the nanostructures exhibit larger perpendicular anisotropy than the films. On thickness increase of the Co layer two spin reorientation transitions at about 2.2 and 5 nm are found. At 2.2 nm the nanostructures exhibit the transition from perpendicular to in-plane orientation of magnetization while at 5 nm the reversed transition is found. The variation of the magnetic anisotropy of the Co nanostructures is not solely caused by the change of shape anisotropy. The net change, corrected for the shape, reveals a reduction of strain in the thinnest Co layers while the increase of the anisotropy of the nanostructures at higher Co thicknesses is caused by a transformation of the Co lattice from fcc to hcp.
C1 [Neumann, Alexander; Frauen, Axel; Vollmers, Julian; Oepen, Hans Peter] Univ Hamburg, Inst Angew Phys, Jungiusstr 11, D-20355 Hamburg, Germany.
   [Meyer, Andreas] Univ Hamburg, Inst Phys Chem, Grindelallee 117, D-20146 Hamburg, Germany.
   [Neumann, Alexander] Univ Lubeck, Inst Med Engn, Ratzeburger Allee 160, D-23562 Lubeck, Germany.
RP Neumann, A (reprint author), Univ Hamburg, Inst Angew Phys, Jungiusstr 11, D-20355 Hamburg, Germany.; Neumann, A (reprint author), Univ Lubeck, Inst Med Engn, Ratzeburger Allee 160, D-23562 Lubeck, Germany.
EM neumann@imt.uni-luebeck.de
FU DFG [Sonderforschungsbereich SFB 668]
FX We are grateful to C. Thonnissen, G. Winkler, and A. Kobs for numerous
   helpful discussions. We thank S. Freercks for the assistance with the
   experiments. Funding by the DFG via the Sonderforschungsbereich SFB 668
   is gratefully acknowledged.
CR Allwood DA, 2005, SCIENCE, V309, P1688, DOI 10.1126/science.1108813
   Aoyama N, 2010, IEEE T MAGN, V46, P3648, DOI 10.1109/TMAG.2010.2049364
   BETTERIDGE W, 1979, PROG MATER SCI, V24, P51
   Campiglio P, 2011, PHYS REV B, V84, DOI 10.1103/PhysRevB.84.235443
   Costa-Kramer JL, 2000, APPL PHYS LETT, V76, P3091, DOI 10.1063/1.126533
   Cowburn RP, 2003, J APPL PHYS, V93, P9310, DOI 10.1063/1.1574596
   Cowburn RP, 2000, J APPL PHYS, V87, P7082, DOI 10.1063/1.372938
   Delaey L., 2005, PHASE TRANSFORMATION, P583, DOI 10.1002/352760264X.ch9
   Dobisz EA, 2008, P IEEE, V96, P1836, DOI 10.1109/JPROC.2008.2007600
   GURTIN ME, 1978, INT J SOLIDS STRUCT, V14, P431, DOI 10.1016/0020-7683(78)90008-2
   Ibach H, 2009, SURF SCI, V603, P2352, DOI 10.1016/j.susc.2009.04.024
   Imre A, 2006, SCIENCE, V311, P205, DOI 10.1126/science.1120506
   Ishio S, 2014, J MAGN MAGN MATER, V360, P205, DOI 10.1016/j.jmmm.2014.02.049
   Jiang Q, 2001, J PHYS CHEM B, V105, P6275, DOI 10.1021/jp010995n
   Kalezhi J, 2009, IEEE T MAGN, V45, P3531, DOI 10.1109/TMAG.2009.2022407
   Khajetoorians AA, 2011, SCIENCE, V332, P1062, DOI 10.1126/science.1201725
   Kikitsu A, 2013, IEEE T MAGN, V49, P693, DOI 10.1109/TMAG.2012.2226566
   Kirk KJ, 2000, CONTEMP PHYS, V41, P61, DOI 10.1080/001075100181187
   Kobs A., 2013, THESIS
   Kuch W, 2003, NAT MATER, V2, P505, DOI 10.1038/nmat947
   Lee J, 2011, APPL PHYS LETT, V99, DOI 10.1063/1.3623752
   Lee JW, 2002, PHYS REV B, V6617, P2409, DOI 10.1103/PhysRevB.66.172409
   Millev YT, 2003, J PHYS D APPL PHYS, V36, P2945, DOI 10.1088/0022-3727/36/23/012
   Neumann A., 2012, OPEN SURF SCI J, V4, P55
   Neumann A, 2014, NEW J PHYS, V16, DOI 10.1088/1367-2630/16/8/083012
   Neumann A, 2013, NANO LETT, V13, P2199, DOI 10.1021/nl400728r
   Ouazi S, 2012, NAT COMMUN, V3, DOI 10.1038/ncomms2316
   Pei WL, 2011, ACTA MATER, V59, P4818, DOI 10.1016/j.actamat.2011.04.024
   Plumer M., 2001, PHYS ULTRAHIGH DENSI
   Qi WH, 2005, J NANOPART RES, V7, P51, DOI 10.1007/s11051-004-7771-9
   Rizzo ND, 2002, APPL PHYS LETT, V80, P2335, DOI 10.1063/1.1462872
   Ross CA, 1999, J VAC SCI TECHNOL B, V17, P3168, DOI 10.1116/1.590974
   Rusponi S, 2003, NAT MATER, V2, P546, DOI 10.1038/nmat930
   Sander D, 1999, J MAGN MAGN MATER, V200, P439, DOI 10.1016/S0304-8853(99)00310-8
   Sander D, 1999, REP PROG PHYS, V62, P809, DOI 10.1088/0034-4885/62/5/204
   Shaw JM, 2008, PHYS REV B, V78, DOI 10.1103/PhysRevB.78.024414
   STEARNS MB, 1986, LANDOLT BORNSTEIN 3A, V19, P24
   Stefanowicz W, 2014, APPL PHYS LETT, V104, DOI 10.1063/1.4860985
   Stillrich H, 2008, ADV FUNCT MATER, V18, P76, DOI 10.1002/adfm.200700444
   Stillrich H, 2010, J MAGN MAGN MATER, V322, P1353, DOI 10.1016/j.jmmm.2009.09.039
   Terris BD, 2009, J MAGN MAGN MATER, V321, P512, DOI 10.1016/j.jmmm.2008.05.046
   Toledano P, 2001, PHYS REV B, V64, DOI 10.1103/PhysRevB.64.144104
   Wellhofer M, 2005, J MAGN MAGN MATER, V292, P345, DOI 10.1016/j.jmmm.2004.11.150
   Wolfer WG, 2011, ACTA MATER, V59, P7736, DOI 10.1016/j.actamat.2011.08.033
   WOLTERSDORF J, 1981, SURF SCI, V106, P64, DOI 10.1016/0039-6028(81)90182-5
   Zaman SS, 2011, J APPL PHYS, V110, DOI 10.1063/1.3609078
NR 46
TC 0
Z9 0
U1 10
U2 16
PU AMER PHYSICAL SOC
PI COLLEGE PK
PA ONE PHYSICS ELLIPSE, COLLEGE PK, MD 20740-3844 USA
SN 2469-9950
EI 2469-9969
J9 PHYS REV B
JI Phys. Rev. B
PD SEP 26
PY 2016
VL 94
IS 9
AR 094430
DI 10.1103/PhysRevB.94.094430
PG 6
WC Physics, Condensed Matter
SC Physics
GA DX0OS
UT WOS:000384063300002
ER

PT J
AU Nguyen, CD
   Lee, J
AF Chi Dinh Nguyen
   Lee, Jaejin
TI Elimination of two-dimensional intersymbol interference through the use
   of a 9/12 two-dimensional modulation code
SO IET COMMUNICATIONS
LA English
DT Article
DE intersymbol interference; interference suppression; magnetic recording;
   modulation coding; two-dimensional intersymbol interference;
   two-dimensional modulation code; 2D modulation code; 2D intersymbol
   interference elimination; high-density storage systems; next generation
   data-storage systems; holographic data storage; bit-patterned media
   recording; 2D magnetic recording; area-density; 2D ISI problem; 1D ISI;
   intertrack interference; adjacent tracks; quality assessment; BPMR
   system
ID BIT-PATTERNED MEDIA; DATA-STORAGE-SYSTEMS; TURBO EQUALIZATION; CHANNELS;
   NOISE
AB This study presents a 9/12 two-dimensional (2D) modulation code as a way to overcome 2D intersymbol interference (ISI) in high-density storage systems. The next generation of data-storage systems is being continually developed to satisfy a massive demand for reliable storage regarding enormous amounts of data. Holographic data storage, bit-patterned media recording (BPMR), and 2D magnetic recording are promising candidates for the attainment of area-density increases that are beyond the capacities of conventional storage systems. One of the main challenges for these systems is a 2D ISI problem consisting of 1D ISI from neighbour bits and intertrack interference from adjacent tracks. The proposed modulation code maps every 9 bit sequence of user data into a 2D output array of a 3-by-4 size so that the fatal 2D ISI patterns are avoided in every output array. For the assessment of the quality of the proposed modulation code, a simulation model is carried out in a BPMR system. The results show that the proposed modulation code offers a gain of approximate to 2 dB over that of a system without encoding. In particular, a gain of approximate to 1 dB is obtained over that of a 6/8 modulation code regarding the same code rate.
C1 [Chi Dinh Nguyen; Lee, Jaejin] Soongsil Univ, Sch Elect & Engn, 369 Sangdo Ro, Seoul 06987, South Korea.
RP Lee, J (reprint author), Soongsil Univ, Sch Elect & Engn, 369 Sangdo Ro, Seoul 06987, South Korea.
EM zlee@ssu.ac.kr
FU Basic Science Research Program through National Research Foundation of
   Korea, Ministry of Education [NRF-2013R1A1A2059077]
FX This work was supported by the Basic Science Research Program through
   the National Research Foundation of Korea, Ministry of Education, under
   grant NRF-2013R1A1A2059077.
CR Albrecht TR, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2015.2397880
   Groenland JPJ, 2007, IEEE T MAGN, V43, P2307, DOI 10.1109/TMAG.2007.893137
   Jeon S, 2010, IEEE T MAGN, V46, P2248, DOI 10.1109/TMAG.2010.2043068
   Kaynak MN, 2004, IEEE T MAGN, V40, P3087, DOI 10.1109/TMAG.2004.828996
   Keskinoz M, 2008, IEEE T MAGN, V44, P533, DOI 10.1109/TMAG.2007.914966
   Kim B, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2014.2304556
   Kim J., 2010, JPN J APPL PHYS, V49
   Kim J, 2011, IEEE T MAGN, V47, P594, DOI 10.1109/TMAG.2010.2100371
   Kovintavewat P, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2014.2316203
   Nabavi S, 2009, IEEE T MAGN, V45, P3523, DOI 10.1109/TMAG.2009.2022493
   Nakamura Y, 2012, IEEE T MAGN, V48, P4602, DOI 10.1109/TMAG.2012.2194989
   Ng Y, 2009, IEEE T MAGN, V45, P3535, DOI 10.1109/TMAG.2009.2024427
   Nguyen CD, 2015, ELECTRON LETT, V51, P1857, DOI 10.1049/el.2015.2308
   Pansatiankul DE, 2003, APPL OPTICS, V42, P275, DOI 10.1364/AO.42.000275
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Shiroishi Y, 2009, IEEE T MAGN, V45, P3816, DOI 10.1109/TMAG.2009.2024879
   Tsai HF, 2005, IEEE T CONSUM ELECTR, V51, P864, DOI 10.1109/TCE.2005.1510496
   Wood R, 2000, IEEE T MAGN, V36, P36, DOI 10.1109/20.824422
   Zhu Y, 2010, IET COMMUN, V4, P1809, DOI 10.1049/iet-com.2009.0643
NR 19
TC 1
Z9 1
U1 0
U2 0
PU INST ENGINEERING TECHNOLOGY-IET
PI HERTFORD
PA MICHAEL FARADAY HOUSE SIX HILLS WAY STEVENAGE, HERTFORD SG1 2AY, ENGLAND
SN 1751-8628
EI 1751-8636
J9 IET COMMUN
JI IET Commun.
PD SEP 20
PY 2016
VL 10
IS 14
BP 1730
EP 1735
DI 10.1049/iet-com.2016.0200
PG 6
WC Engineering, Electrical & Electronic
SC Engineering
GA DX2FP
UT WOS:000384183500006
ER

PT J
AU Streubel, R
   Fischer, P
   Kronast, F
   Kravchuk, VP
   Sheka, DD
   Gaididei, Y
   Schmidt, OG
   Makarov, D
AF Streubel, Robert
   Fischer, Peter
   Kronast, Florian
   Kravchuk, Volodymyr P.
   Sheka, Denis D.
   Gaididei, Yuri
   Schmidt, Oliver G.
   Makarov, Denys
TI Magnetism in curved geometries
SO JOURNAL OF PHYSICS D-APPLIED PHYSICS
LA English
DT Review
DE magnetic helix; magnetic shell; Dzyaloshinskii-Moriya interaction;
   curvilinear magnetism; shapeable magnetoelectronics; curved magnetic
   thin films; magnetic tubes
ID X-RAY MICROSCOPY; DOMAIN-WALL MOTION; GLANCING ANGLE DEPOSITION;
   POLARIZED SECONDARY ELECTRONS; BIT PATTERNED MEDIA; CIRCULAR-DICHROISM;
   THIN-FILMS; MAGNETIZATION REVERSAL; DIFFRACTION MICROSCOPY; FEPT
   NANOPARTICLES
AB Extending planar two-dimensional structures into the three-dimensional space has become a general trend in multiple disciplines, including electronics, photonics, plasmonics and magnetics. This approach provides means to modify conventional or to launch novel functionalities by tailoring the geometry of an object, e.g. its local curvature. In a generic electronic system, curvature results in the appearance of scalar and vector geometric potentials inducing anisotropic and chiral effects. In the specific case of magnetism, even in the simplest case of a curved anisotropic Heisenberg magnet, the curvilinear geometry manifests two exchange-driven interactions, namely effective anisotropy and antisymmetric exchange, i.e. Dzyaloshinskii-Moriya-like interaction. As a consequence, a family of novel curvaturedriven effects emerges, which includes magnetochiral effects and topologically induced magnetization patterning, resulting in theoretically predicted unlimited domain wall velocities, chirality symmetry breaking and Cherenkov-like effects for magnons. The broad range of altered physical properties makes these curved architectures appealing in view of fundamental research on e.g. skyrmionic systems, magnonic crystals or exotic spin configurations. In addition to these rich physics, the application potential of three-dimensionally shaped objects is currently being explored as magnetic field sensorics for magnetofluidic applications, spin-wave filters, advanced magneto-encephalography devices for diagnosis of epilepsy or for energy-efficient racetrack memory devices. These recent developments ranging from theoretical predictions over fabrication of three-dimensionally curved magnetic thin films, hollow cylinders or wires, to their characterization using integral means as well as the development of advanced tomography approaches are in the focus of this review.
C1 [Streubel, Robert; Schmidt, Oliver G.; Makarov, Denys] IFW Dresden, Inst Integrat Nanosci, D-01069 Dresden, Germany.
   [Streubel, Robert; Fischer, Peter] Lawrence Berkeley Natl Lab, Div Mat Sci, Berkeley, CA 94720 USA.
   [Fischer, Peter] UC Santa Cruz, Dept Phys, Santa Cruz, CA 95064 USA.
   [Kronast, Florian] Helmholtz Zentrum Berlin Mat & Energie GmbH, D-12489 Berlin, Germany.
   [Kravchuk, Volodymyr P.; Gaididei, Yuri] Natl Acad Sci Ukraine, Bogolyubov Inst Theoret Phys, UA-03680 Kiev, Ukraine.
   [Sheka, Denis D.] Taras Shevchenko Natl Univ Kyiv, UA-01601 Kiev, Ukraine.
   [Schmidt, Oliver G.] Tech Univ Chemnitz, Mat Syst Nanoelect, D-09107 Chemnitz, Germany.
   [Makarov, Denys] Helmholtz Zentrum Dresden Rossendorf eV, Inst Ion Beam Phys & Mat Res, D-01328 Dresden, Germany.
RP Streubel, R (reprint author), IFW Dresden, Inst Integrat Nanosci, D-01069 Dresden, Germany.; Streubel, R (reprint author), Lawrence Berkeley Natl Lab, Div Mat Sci, Berkeley, CA 94720 USA.
EM streubel@lbl.gov; d.makarov@hzdr.de
RI Fischer, Peter/A-3020-2010; Makarov, Denys/G-1025-2011
OI Fischer, Peter/0000-0002-9824-9343; 
FU European Research Council under the European Union's Seventh Framework
   program (FP7)/ERC grant [306277]; Future and Emerging Technologies (FET)
   programme under FET-Open grant [618083]; German Science Foundation (DFG)
   [MA 5144/1-1, MA 5144/2-1, MA 5144/3-1, SCHM 1298/14-1]; DFG [1713];
   Office of Science, Office of Basic Energy Sciences, Materials Sciences
   and Engineering Division, of the U.S. Department of Energy
   [DE-AC02-05-CH11231]
FX We appreciate insightful discussions with Dr U K Rossler, Dr C Ortix, Dr
   J I Monch, D Karnaushenko and Prof R Schafer (all IFW Dresden), Prof M
   Poggio (University of Basel), Prof R Hertel (University of Strasbourg),
   Dr A Kakay, Dr K Lenz and Prof J Fassbender (all Helmholtz-Zentrum
   Dresden-Rossendorf), Prof M Klaui (University of Mainz), Prof P Landeros
   and Dr J Otalora (Universidad Tecnica Federico Santa Maria), Prof M
   Albrecht (University of Augsburg), Dr A A Unal, Dr F Radu and Dr R
   Abrudan (all Helmholtz-Zentrum Berlin, BESSY II), Dr L Baraban (Dresden
   University of Technology), Prof K Liu (University of California, Davis),
   Prof J Deutsch (University of California, Santa Cruz), Dr A Petford-Long
   and Dr C Phatak (all Argonne National Laboratory) and Dr P Ercius
   (Lawrence Berkeley National Laboratory). We thank Dr M-Y Im (Lawrence
   Berkeley National Laboratory) for experimental help with the TXM at the
   Lawrence Berkeley National Laboratory. This work was financially
   supported in part via the European Research Council under the European
   Union's Seventh Framework program (FP7/2007-2013)/ERC grant agreement n.
   306277, the Future and Emerging Technologies (FET) programme under
   FET-Open grant number 618083, the German Science Foundation (DFG) grant
   MA 5144/1-1, MA 5144/2-1, MA 5144/3-1, SCHM 1298/14-1 and the DFG
   Research Unit 1713. RS and PF acknowledge financial support by the
   Director, Office of Science, Office of Basic Energy Sciences, Materials
   Sciences and Engineering Division, of the U.S. Department of Energy
   under Contract No. DE-AC02-05-CH11231 in the Nonequilibrium Magnetic
   Materials program.
CR Adeyeye AO, 2008, J PHYS D APPL PHYS, V41, DOI 10.1088/0022-3727/41/15/153001
   AHARONOV Y, 1959, PHYS REV, V115, P485, DOI 10.1103/PhysRev.115.485
   Albrecht M, 2005, NAT MATER, V4, P203, DOI 10.1038/nmat1324
   Albrecht M, 2012, OPEN SURF SCI J, V4, P42
   Albrecht TR, 2013, IEEE T MAGN, V49, P773, DOI 10.1109/TMAG.2012.2227303
   Albrecht TR, 2009, NANOSCALE MAGNETIC MATERIALS AND APPLICATIONS, P237, DOI 10.1007/978-0-387-85600-1_9
   Allwood DA, 2005, SCIENCE, V309, P1688, DOI 10.1126/science.1108813
   Allwood DA, 2002, SCIENCE, V296, P2003, DOI 10.1126/science.1070595
   Aoki H., 2001, PHYS REV B, V65, DOI 10.1103/PhysRevB.65.035102
   ARNOLD JR, 1983, SCIENCE, V219, P383, DOI 10.1126/science.219.4583.383
   Atkinson D, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2832771
   Awschalom D.D., 2013, SEMICONDUCTOR SPINTR
   Bachmann J, 2007, J AM CHEM SOC, V129, P9554, DOI 10.1021/ja072465w
   BAEZ AV, 1961, J OPT SOC AM, V51, P405, DOI 10.1364/JOSA.51.000405
   BAGGULEY DM, 1967, P PHYS SOC LOND, V90, P1029, DOI 10.1088/0370-1328/90/4/315
   Balhorn F, 2012, APPL PHYS LETT, V100, DOI 10.1063/1.3700809
   Balhorn F, 2010, PHYS REV LETT, V104, DOI 10.1103/PhysRevLett.104.037205
   Ball DK, 2014, NANOTECHNOLOGY, V25, DOI 10.1088/0957-4484/25/8/085703
   Baraban L, 2012, SOFT MATTER, V8, P48, DOI 10.1039/c1sm06512b
   Baraban L, 2013, ACS NANO, V7, P1360, DOI 10.1021/nn305726m
   Baraban L, 2013, NANOSCALE, V5, P1332, DOI 10.1039/c2nr32662k
   Baraban L, 2012, ACS NANO, V6, P3383, DOI 10.1021/nn300413p
   Baraban L, 2008, PHYS REV E, V77, DOI 10.1103/PhysRevE.77.031407
   Barbe C, 2004, ADV MATER, V16, P1959, DOI 10.1002/adma.200400771
   Barbic M, 2001, IEEE T MAGN, V37, P1657, DOI 10.1109/20.950929
   Beche A, 2014, NAT PHYS, V10, P26, DOI [10.1038/nphys2816, 10.1038/NPHYS2816]
   Bedau D, 2007, PHYS REV LETT, V99, DOI 10.1103/PhysRevLett.99.146601
   Belov VV, 2007, DOKL MATH, V75, P147, DOI 10.1134/S1064562407010401
   Belov VV, 2005, PHYS-USP+, V48, P962, DOI 10.1070/PU2005v048n09ABEH005748
   Belov VV, 2004, THEOR MATH PHYS+, V141, P1562, DOI 10.1023/B:TAMP.0000046563.43563.e6
   BERRY MV, 1984, PROC R SOC LON SER-A, V392, P45, DOI 10.1098/rspa.1984.0023
   Biermanns A, 2008, J APPL PHYS, V104, DOI 10.1063/1.2973037
   Bita I, 2008, SCIENCE, V321, P939, DOI 10.1126/science.1159352
   Bittner S, 2013, PHYS REV E, V87, DOI 10.1103/PhysRevE.87.042912
   Biziere N, 2013, NANO LETT, V13, P2053, DOI 10.1021/nl400317j
   Bliokh KY, 2012, PHYS REV X, V2, DOI 10.1103/PhysRevX.2.041011
   Bobek T, 2007, ADV MATER, V19, P4375, DOI 10.1002/adma.200701163
   Bode M, 2003, REP PROG PHYS, V66, P523, DOI 10.1088/0034-4885/66/4/203
   Bogart LK, 2009, PHYS REV B, V79, DOI 10.1103/PhysRevB.79.054414
   Bowick MJ, 2009, ADV PHYS, V58, P449, DOI 10.1080/00018730903043166
   Bradley RM, 2011, PHYS REV B, V83, DOI 10.1103/PhysRevB.83.195410
   BRADLEY RM, 1988, J VAC SCI TECHNOL A, V6, P2390, DOI 10.1116/1.575561
   Brombacher C, 2010, APPL PHYS LETT, V97, DOI 10.1063/1.3486679
   Buchter A, 2013, PHYS REV LETT, V111, DOI 10.1103/PhysRevLett.111.067202
   Buckanie NM, 2013, ULTRAMICROSCOPY, V130, P49, DOI 10.1016/j.ultramic.2013.03.007
   Bufon CCB, 2010, NANO LETT, V10, P2506, DOI 10.1021/nl1010367
   BURGESS M, 1993, PHYS REV A, V48, P1861, DOI 10.1103/PhysRevA.48.1861
   Burmeister F, 1997, LANGMUIR, V13, P2983, DOI 10.1021/la9621123
   Burn DM, 2014, PHYS REV B, V90, DOI 10.1103/PhysRevB.90.144414
   CARCIA PF, 1985, APPL PHYS LETT, V47, P178, DOI 10.1063/1.96254
   CARLSON WD, 1992, SCIENCE, V257, P1236, DOI 10.1126/science.257.5074.1236
   CARRA P, 1993, PHYS REV LETT, V70, P694, DOI 10.1103/PhysRevLett.70.694
   Carrascosa JL, 2009, J STRUCT BIOL, V168, P234, DOI 10.1016/j.jsb.2009.07.009
   Carvalho-Santos VL, 2015, J APPL PHYS, V117, DOI 10.1063/1.4918565
   Carvalho-Santos VL, 2010, J APPL PHYS, V108, DOI 10.1063/1.3487924
   Carvalho-Santos VL, 2008, PHYS REV B, V77, DOI 10.1103/PhysRevB.77.134450
   Carvalho-Santos VL, 2012, PHYS LETT A, V376, P3551, DOI 10.1016/j.physleta.2012.10.027
   Castro M, 2005, PHYS REV LETT, V94, DOI 10.1103/PhysRevLett.94.016102
   Catalan G, 2012, REV MOD PHYS, V84, P119, DOI 10.1103/RevModPhys.84.119
   Chan WL, 2007, J APPL PHYS, V101, DOI 10.1063/1.2749198
   Chaplik AV, 2004, NEW J PHYS, V6, DOI 10.1088/1367-2630/6/1/033
   Chapman HN, 2007, NATURE, V448, P676, DOI 10.1038/nature06049
   Chapman HN, 2010, NAT PHOTONICS, V4, P833, DOI 10.1038/nphoton.2010.240
   CHEN CT, 1990, PHYS REV B, V42, P7262, DOI 10.1103/PhysRevB.42.7262
   CHEN CT, 1995, PHYS REV LETT, V75, P152, DOI 10.1103/PhysRevLett.75.152
   Chen G, 2013, PHYS REV LETT, V110, DOI 10.1103/PhysRevLett.110.177204
   Chen G, 2015, ADV MATER, V27, P5738, DOI 10.1002/adma.201500160
   Chen JP, 2013, J APPL PHYS, V113, DOI 10.1063/1.4790483
   CHILDRESS JR, 1994, J APPL PHYS, V75, P6412, DOI 10.1063/1.355368
   Choe SB, 2004, SCIENCE, V304, P420, DOI 10.1126/science.1095068
   Chong YT, 2010, ADV MATER, V22, P2435, DOI 10.1002/adma.200904321
   Cortes-Ortuno D, 2013, J PHYS-CONDENS MAT, V25, DOI 10.1088/0953-8984/25/15/156001
   Cuoghi G, 2009, PHYS REV B, V79, DOI 10.1103/PhysRevB.79.073410
   Curcic M, 2008, PHYS REV LETT, V101, DOI 10.1103/PhysRevLett.101.197204
   Da Col S, 2014, PHYS REV B, V89, DOI 10.1103/PhysRevB.89.180405
   DACOSTA RCT, 1981, PHYS REV A, V23, P1982, DOI 10.1103/PhysRevA.23.1982
   DANDOLOFF R, 1995, PHYS REV LETT, V74, P813, DOI 10.1103/PhysRevLett.74.813
   Dandoloff R, 2011, J PHYS A-MATH THEOR, V44, DOI 10.1088/1751-8113/44/4/045203
   De Graef M, 2001, J APPL PHYS, V89, P7177, DOI 10.1063/1.1355337
   de Oliveira EJL, 2016, PHYS REV E, V93, DOI 10.1103/PhysRevE.93.012703
   de Gennes P. G., 1993, PHYS LIQUID CRYSTALS
   DENBROEDER FJA, 1991, J MAGN MAGN MATER, V93, P562, DOI 10.1016/0304-8853(91)90404-X
   Deneke C, 2004, APPL PHYS LETT, V84, P4475, DOI 10.1063/1.1755835
   Deneke C, 2002, SEMICOND SCI TECH, V17, P1278, DOI 10.1088/0268-1242/17/12/312
   Deneke C, 2006, APPL PHYS LETT, V89, DOI 10.1063/1.2424541
   Deneke C, 2009, NANOTECHNOLOGY, V20, DOI 10.1088/0957-4484/20/4/045703
   Deneke C, 2008, PHYS STATUS SOLIDI C, V5, P2704, DOI 10.1002/pssc.200779293
   Deneke C, 2007, APPL PHYS LETT, V90, DOI 10.1063/1.2742323
   Deneke C, 2009, J PHYS D APPL PHYS, V42, DOI 10.1088/0022-3727/42/10/103001
   DEROSIER DJ, 1968, NATURE, V217, P130, DOI 10.1038/217130a0
   DEWITT BS, 1957, REV MOD PHYS, V29, P377, DOI 10.1103/RevModPhys.29.377
   Dick B, 2003, J VAC SCI TECHNOL B, V21, P23, DOI 10.1116/1.1529652
   Dick B, 2000, J VAC SCI TECHNOL A, V18, P1838, DOI 10.1116/1.582481
   Dierolf M, 2010, NATURE, V467, P436, DOI 10.1038/nature09419
   Dietrich C, 2008, PHYS REV B, V77, DOI 10.1103/PhysRevB.77.174427
   Donnelly C, 2015, PHYS REV LETT, V114, DOI 10.1103/PhysRevLett.114.115501
   Dreyfus R, 2005, NATURE, V437, P862, DOI 10.1038/nature04090
   DUDEN T, 1995, REV SCI INSTRUM, V66, P2861, DOI 10.1063/1.1145569
   Dumas T, 2013, PLOS ONE, V8, DOI 10.1371/journal.pone.0074145
   Dunin-Borkowski RE, 1998, SCIENCE, V282, P1868, DOI 10.1126/science.282.5395.1868
   DZIALOSHINSKII IE, 1957, SOV PHYS JETP-USSR, V5, P1259
   DZYALOSHINSKY I, 1958, J PHYS CHEM SOLIDS, V4, P241, DOI 10.1016/0022-3697(58)90076-3
   Ebbens SJ, 2010, SOFT MATTER, V6, P726, DOI 10.1039/b918598d
   Eimuller T, 2008, PHYS REV B, V77, DOI 10.1103/PhysRevB.77.134415
   Eisebitt S, 2004, NATURE, V432, P885, DOI 10.1038/nature03139
   El Gabaly F, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.147202
   ENGEL BN, 1991, PHYS REV LETT, V67, P1910, DOI 10.1103/PhysRevLett.67.1910
   Entin MV, 2002, PHYS REV B, V66, DOI 10.1103/PhysRevB.66.205308
   Evans ND, 2006, MATER TODAY, V9, P26, DOI 10.1016/S1369-7021(06)71740-0
   Facsko S, 2004, PHYS REV B, V69, DOI 10.1103/PhysRevB.69.153412
   Facsko S, 1999, SCIENCE, V285, P1551, DOI 10.1126/science.285.5433.1551
   Fassbender J, 2009, NEW J PHYS, V11, DOI 10.1088/1367-2630/11/12/125002
   Faustini M, 2012, CHEM MATER, V24, P1072, DOI 10.1021/cm2033492
   Ferrari G, 2008, PHYS REV LETT, V100, DOI 10.1103/PhysRevLett.100.230403
   Fischer P, 1996, Z PHYS B CON MAT, V101, P313, DOI 10.1007/s002570050214
   Fischer P, 2001, REV SCI INSTRUM, V72, P2322, DOI 10.1063/1.1351840
   Fischer P, 2006, MATER TODAY, V9, P26, DOI 10.1016/S1369-7021(05)71335-3
   Fomin VM, 2013, PHYS REV E, V87, DOI 10.1103/PhysRevE.87.052122
   Fomin VM, 2012, NANO LETT, V12, P1282, DOI 10.1021/nl203765f
   Fomin VM, 2011, PHYS REV B, V84, DOI 10.1103/PhysRevB.84.174303
   Freimuth F, 2014, J PHYS-CONDENS MAT, V26, DOI 10.1088/0953-8984/26/10/104202
   Freitas WA, 2005, PHYS LETT A, V336, P412, DOI 10.1016/j.physleta.2004.12.039
   Fritzsche M, 2012, APPL PHYS LETT, V100, DOI 10.1063/1.4721662
   Funke ME, 2011, EPILEPSIA, V52, P10, DOI 10.1111/j.1528-1167.2011.03144.x
   GABOR D, 1948, NATURE, V161, P777, DOI 10.1038/161777a0
   Gaididei YB, 2000, PHYS REV E, V62, pR53, DOI 10.1103/PhysRevE.62.R53
   Gaididei YB, 2005, NEW J PHYS, V7, DOI 10.1088/1367-2630/7/1/052
   Gaididei Y, 2014, PHYS REV LETT, V112, DOI 10.1103/PhysRevLett.112.257203
   Galanakis I, 2002, PHYS REV B, V66, DOI 10.1103/PhysRevB.66.174429
   Ganser BK, 1999, SCIENCE, V283, P80, DOI 10.1126/science.283.5398.80
   Gauthier D, 2010, PHYS REV LETT, V105, DOI 10.1103/PhysRevLett.105.093901
   Gerhardt T, 2011, J PHYS CONDENS MATT, V24
   Gibbs JG, 2014, NANOSCALE, V6, P9457, DOI 10.1039/c4nr00403e
   Gidon S, 2004, APPL PHYS LETT, V85, P6392, DOI 10.1063/1.1834718
   Gierster L, 2015, REV SCI INSTRUM, V86, DOI 10.1063/1.4907402
   Giewekemeyer K, 2010, P NATL ACAD SCI USA, V107, P529, DOI 10.1073/pnas.0905846107
   Glass R, 2003, ADV FUNCT MATER, V13, P569, DOI 10.1002/adfm.200304331
   Glathe S, 2012, PHYS REV B, V85, DOI 10.1103/PhysRevB.85.024405
   Gonzalez AL, 2010, J MAGN MAGN MATER, V322, P530, DOI 10.1016/j.jmmm.2009.10.010
   Gorria C, 2004, PHYS REV B, V69, DOI 10.1103/PhysRevB.69.134506
   Grobis MK, 2011, IEEE T MAGN, V47, P6, DOI 10.1109/TMAG.2010.2076798
   Gunther CM, 2011, NAT PHOTONICS, V5, P99, DOI [10.1038/nphoton.2010.287, 10.1038/NPHOTON.2010.287]
   Gunther CM, 2010, PHYS REV B, V81, DOI 10.1103/PhysRevB.81.064411
   Guhr IL, 2007, J PHYS D APPL PHYS, V40, P3005, DOI 10.1088/0022-3727/40/10/S02
   Guimaraes AP, 2009, NANOSCI TECHNOL, P1
   Guo VW, 2006, J APPL PHYS, V99, DOI 10.1063/1.2169540
   Guslienko KY, 2010, PHYS REV B, V81, DOI 10.1103/PhysRevB.81.014414
   Guslienko KY, 2008, PHYS REV LETT, V101, DOI 10.1103/PhysRevLett.101.247203
   HASHIMOTO S, 1989, J APPL PHYS, V66, P4909, DOI 10.1063/1.343760
   Hayashi M, 2008, SCIENCE, V320, P209, DOI 10.1126/science.1154587
   Hayashi M, 2006, PHYS REV LETT, V97, DOI 10.1103/PhysRevLett.97.207205
   Haynes CL, 2001, J PHYS CHEM B, V105, P5599, DOI 10.1021/jp010657m
   Hayward TJ, 2010, PHYS REV B, V81, DOI 10.1103/PhysRevB.81.020410
   Hayward TJ, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3275752
   He YP, 2007, SMALL, V3, P153, DOI 10.1002/smll.200600375
   Heinze S, 2000, SCIENCE, V288, P1805, DOI 10.1126/science.288.5472.1805
   Heinze S, 2011, NAT PHYS, V7, P713, DOI [10.1038/nphys2045, 10.1038/NPHYS2045]
   Hellwig O, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3293301
   Hellwig O, 2007, J MAGN MAGN MATER, V319, P13, DOI 10.1016/j.jmmm.2007.04.035
   Herfort J, 2006, PHYSICA E, V32, P371, DOI 10.1016/j.physe.2005.12.065
   Herfort J, 2003, APPL PHYS LETT, V83, P3912, DOI 10.1063/1.1625426
   Hertel R, 2013, SPIN-SINGAPORE, V3, DOI 10.1142/S2010324713400092
   Hodges MPP, 2014, J APPL PHYS, V116, DOI 10.1063/1.4896356
   Howse JR, 2007, PHYS REV LETT, V99, DOI 10.1103/PhysRevLett.99.048102
   Hubert A., 1998, MAGNETIC DOMAINS ANA
   Hummel E, 2012, PLOS ONE, V7, DOI 10.1371/journal.pone.0053293
   Im MY, 2012, NAT COMMUN, V3, DOI 10.1038/ncomms1978
   Ionescu A, 2005, PHYS REV B, V71, DOI 10.1103/PhysRevB.71.094401
   Irvine DJ, 2011, NAT MATER, V10, P342, DOI 10.1038/nmat3014
   Ivanov AA, 2011, PHYS SOLID STATE+, V53, P2441, DOI 10.1134/S1063783411120079
   Jensen B, 2009, PHYS REV A, V80, DOI 10.1103/PhysRevA.80.052109
   JENSEN H, 1971, ANN PHYS-NEW YORK, V63, P586, DOI 10.1016/0003-4916(71)90031-5
   Jin-Phillipp NY, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2164913
   Johannsen M, 2005, INT J HYPERTHER, V21, P637, DOI 10.1080/02656730500158360
   Johnson MT, 1996, REP PROG PHYS, V59, P1409, DOI 10.1088/0034-4885/59/11/002
   Jordan A, 2001, J MAGN MAGN MATER, V225, P118, DOI 10.1016/S0304-8853(00)01239-7
   Kaczmarz S, 1937, B ACAD POLON SCI L A, V35, P355
   Kak A C, 1988, PRINCIPLES COMPUTERI, V33
   Kamien RD, 2002, REV MOD PHYS, V74, P953, DOI 10.1103/RevModPhys.74.953
   Kaplan L, 1997, PHYS REV A, V56, P2592, DOI 10.1103/PhysRevA.56.2592
   Kappenberger P, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3176937
   Kardjilov N, 2008, NAT PHYS, V4, P399, DOI 10.1038/nphys912
   Karnaushenko D, 2015, ADV MATER, V27, P6797, DOI 10.1002/adma.201503696
   Karnaushenko D, 2015, ADV MATER, V27, P6582, DOI 10.1002/adma.201503127
   Karnaushenko D, 2015, ADV MATER, V27, P880, DOI 10.1002/adma.201403907
   Karnaushenko D, 2012, ADV MATER, V24, P4518, DOI 10.1002/adma.201201190
   Karnaushenko DD, 2015, NPG ASIA MATER, V7, DOI 10.1038/am.2015.53
   Keller A, 2009, APPL PHYS LETT, V94, DOI 10.1063/1.3136765
   Keller A, 2008, NANOTECHNOLOGY, V19, DOI 10.1088/0957-4484/19/13/135303
   Kim JH, 1996, J APPL PHYS, V80, P3121, DOI 10.1063/1.363124
   Kim JS, 2014, NAT COMMUN, V5, DOI 10.1038/ncomms4429
   Kimling J, 2011, PHYS REV B, V84, DOI 10.1103/PhysRevB.84.174406
   KINNEY JH, 1993, SCIENCE, V260, P789, DOI 10.1126/science.260.5109.789
   KIRZ J, 1985, REV SCI INSTRUM, V56, P1, DOI 10.1063/1.1138464
   Klaui M, 2005, APPL PHYS LETT, V87, DOI 10.1063/1.2042542
   Klaui M, 2003, PHYS REV LETT, V90, DOI 10.1103/PhysRevLett.90.097202
   Klaui M, 2003, J PHYS-CONDENS MAT, V15, pR985
   Kline TR, 2005, ANGEW CHEM INT EDIT, V44, P744, DOI 10.1002/anie.200461890
   KOIKE K, 1984, APPL PHYS LETT, V45, P585, DOI 10.1063/1.95290
   KOIKE K, 1984, JPN J APPL PHYS 2, V23, pL187, DOI 10.1143/JJAP.23.L187
   Korte AP, 2009, J PHYS-CONDENS MAT, V21, DOI 10.1088/0953-8984/21/49/495301
   Kosiorek A, 2004, NANO LETT, V4, P1359, DOI 10.1021/nl049361t
   Kravchuk VP, 2012, PHYS REV B, V85, DOI 10.1103/PhysRevB.85.144433
   Kronast F, 2010, SURF INTERFACE ANAL, V42, P1532, DOI 10.1002/sia.3561
   Kumar A, 2006, PHYS REV B, V73, DOI 10.1103/PhysRevB.73.064421
   Kuratsuji H, 2012, PHYS REV E, V85, DOI 10.1103/PhysRevE.85.031150
   Kuzyk A, 2012, NATURE, V483, P311, DOI 10.1038/nature10889
   Landeros P, 2007, APPL PHYS LETT, V90, DOI 10.1063/1.2437655
   Landeros P, 2010, J APPL PHYS, V108, DOI 10.1063/1.3466747
   Landeros P, 2009, J PHYS D APPL PHYS, V42, DOI 10.1088/0022-3727/42/22/225002
   Landeros P, 2009, PHYS REV B, V79, DOI 10.1103/PhysRevB.79.024404
   Lange A, 2008, MATER TEST, V50, P272
   Le Guyader L, 2015, NAT COMMUN, V6, DOI 10.1038/ncomms6839
   Lebedev MA, 2006, TRENDS NEUROSCI, V29, P536, DOI 10.1016/j.tins.2006.07.004
   Lee J, 2014, NANOTECHNOLOGY, V25, DOI 10.1088/0957-4484/25/4/045604
   Lee W, 2008, NAT NANOTECHNOL, V3, P234, DOI 10.1038/nnano.2008.54
   Lewis ER, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3246154
   LI XF, 1989, PHYS REV A, V39, P5751, DOI 10.1103/PhysRevA.39.5751
   LICHTE H, 1986, ULTRAMICROSCOPY, V20, P293, DOI 10.1016/0304-3991(86)90193-2
   Liedke MO, 2013, PHYS REV B, V87, DOI 10.1103/PhysRevB.87.024424
   Liedke MO, 2012, APPL PHYS LETT, V100, DOI 10.1063/1.4729151
   Lim J, 2011, ACS NANO, V5, P217, DOI 10.1021/nn102383s
   LIN CJ, 1991, J MAGN MAGN MATER, V93, P194, DOI 10.1016/0304-8853(91)90329-9
   Lin GG, 2014, LAB CHIP, V14, P4050, DOI 10.1039/c4lc00751d
   LIOU SH, 1993, J APPL PHYS, V73, P6766, DOI 10.1063/1.352479
   Liu BC, 1999, BRAIN TOPOGR, V11, P291
   Liu ZW, 2007, SCIENCE, V315, P1686, DOI 10.1126/science.1137368
   Loget G, 2011, NAT COMMUN, V2, DOI 10.1038/ncomms1550
   Lohau J, 2001, APPL PHYS LETT, V78, P990, DOI 10.1063/1.1347390
   Lopez-Leon T, 2011, NAT PHYS, V7, P391, DOI [10.1038/nphys1920, 10.1038/NPHYS1920]
   Lopez-Lopez JA, 2012, J MAGN MAGN MATER, V324, P2024, DOI 10.1016/j.jmmm.2012.01.040
   Luchnikov V, 2005, ADV MATER, V17, P1177, DOI 10.1002/adma.200401836
   Magarill LI, 2005, PHYS-USP+, V48, P953, DOI 10.1070/PU2005v048n09ABEH005730
   Makarov D, 2009, J APPL PHYS, V106, DOI 10.1063/1.3260243
   Makarov D, 2008, APPL PHYS LETT, V93, DOI 10.1063/1.2993334
   Makarov D, 2016, APPL PHYS REV, V3, DOI 10.1063/1.4938497
   Makarov D, 2013, CHEMPHYSCHEM, V14, P1771, DOI 10.1002/cphc.201300162
   Makhfudz I, 2012, PHYS REV LETT, V109, DOI 10.1103/PhysRevLett.109.217201
   Mamin HJ, 1995, IBM J RES DEV, V39, P681
   Manke I, 2010, NAT COMMUN, V1, DOI 10.1038/ncomms1125
   Manyuhina OV, 2014, PHYS REV E, V90, DOI 10.1103/PhysRevE.90.022713
   Marchesini S, 2008, NAT PHOTONICS, V2, P560, DOI 10.1038/nphoton.2008.154
   Mark AG, 2013, NAT MATER, V12, P802, DOI [10.1038/nmat3685, 10.1038/NMAT3685]
   Mathias S, 2012, P NATL ACAD SCI USA, V109, P4792, DOI 10.1073/pnas.1201371109
   McMahon HT, 2005, NATURE, V438, P590, DOI 10.1038/nature04396
   MCNULTY I, 1992, SCIENCE, V256, P1009, DOI 10.1126/science.256.5059.1009
   MCPHERSON A, 1987, J OPT SOC AM B, V4, P595, DOI 10.1364/JOSAB.4.000595
   Mei YF, 2008, ADV MATER, V20, P4085, DOI 10.1002/adma.200801589
   Melzer M, 2015, ADV MATER, V27, P1274, DOI 10.1002/adma.201405027
   Melzer M, 2015, NAT COMMUN, V6, DOI 10.1038/ncomms7080
   Melzer M, 2012, ADV MATER, V24, P6468, DOI 10.1002/adma.201201898
   Melzer M, 2012, RSC ADV, V2, P2284, DOI 10.1039/c2ra01062c
   Melzer M, 2011, NANO LETT, V11, P2522, DOI 10.1021/nl201108b
   MICHELETTO R, 1995, LANGMUIR, V11, P3333, DOI 10.1021/la00009a012
   Midgley P. A., 2009, NAT MATER, V8, P1476
   MILNOR J, 1978, AM MATH MON, V85, P521, DOI 10.2307/2320860
   Monch I, 2011, ACS NANO, V5, P7436, DOI 10.1021/nn202351j
   MOLLENSTEDT G, 1956, Z PHYS, V145, P377, DOI 10.1007/BF01326780
   Moser JKN, 2010, J APPL PHYS, V107, DOI 10.1063/1.3350909
   Moura-Melo WA, 2007, PHYS LETT A, V360, P472, DOI 10.1016/j.physleta.2006.07.009
   Muller C, 2012, APPL PHYS LETT, V100, DOI 10.1063/1.3676269
   Muller C, 2012, NANOSCALE, V4, P7155, DOI 10.1039/c2nr32086j
   Mulders AM, 2005, PHYS REV B, V7121, P4422, DOI 10.1103/PhysRevB.71.214422
   Nakatani Y, 2003, NAT MATER, V2, P521, DOI 10.1038/nmat931
   Napoli G, 2013, INT J NONLIN MECH, V49, P66, DOI 10.1016/j.ijnonlinmec.2012.09.007
   Napoli G, 2013, SOFT MATTER, V9, P8378, DOI 10.1039/c3sm50605c
   Napoli G, 2012, PHYS REV E, V85, DOI 10.1103/PhysRevE.85.061701
   Napoli G, 2012, PHYS REV LETT, V108, DOI 10.1103/PhysRevLett.108.207803
   Nelson D., 2004, STAT MECH MEMBRANES
   Nielsch K, 2000, ADV MATER, V12, P582, DOI 10.1002/(SICI)1521-4095(200004)12:8<582::AID-ADMA582>3.0.CO;2-3
   Nielsch K, 2002, J MAGN MAGN MATER, V249, P234, DOI 10.1016/S0304-8853(02)00536-X
   NIEMANN B, 1976, APPL OPTICS, V15, P1883, DOI 10.1364/AO.15.001883
   Nissen D, 2015, NANOTECHNOLOGY, V26, DOI 10.1088/0957-4484/26/46/465706
   Nolting F, 2000, NATURE, V405, P767, DOI 10.1038/35015515
   Nyquist H., 1928, T AIEE, V47, P617, DOI [DOI 10.1109/T-AIEE.1928.5055024, 10.1109/T-AIEE.1928.5055024]
   OEPEN HP, 1989, PHYS REV LETT, V62, P819, DOI 10.1103/PhysRevLett.62.819
   Oepen HP, 2005, NANOSCI TECHNOL, P137
   Ortix C, 2015, PHYS REV B, V91, DOI 10.1103/PhysRevB.91.245412
   Ortix C, 2011, PHYS REV B, V84, DOI 10.1103/PhysRevB.84.045438
   Ostler TA, 2012, NAT COMMUN, V3, DOI 10.1038/ncomms1666
   Otalora JA, 2013, J MAGN MAGN MATER, V341, P86, DOI 10.1016/j.jmmm.2013.04.014
   Otalora JA, 2012, J PHYS-CONDENS MAT, V24, DOI 10.1088/0953-8984/24/43/436007
   Otalora JA, 2012, APPL PHYS LETT, V100, DOI 10.1063/1.3687154
   Paetzelt H, 2006, PHYS STATUS SOLIDI A, V203, P817, DOI 10.1002/pssa.200521244
   Paganin D, 1998, PHYS REV LETT, V80, P2586, DOI 10.1103/PhysRevLett.80.2586
   Palmstrom C, 2003, MRS BULL, V28, P725, DOI 10.1557/mrs2003.213
   Park SH, 2007, PHYS STATUS SOLIDI C, V4, P4516, DOI 10.1002/pssc.200777147
   Parkin SSP, 2008, SCIENCE, V320, P190, DOI 10.1126/science.1145799
   Paxton WF, 2004, J AM CHEM SOC, V126, P13424, DOI 10.1021/ja047697z
   Pendry JB, 2002, J PHYS-CONDENS MAT, V14, P8463, DOI 10.1088/0953-8984/14/36/306
   Pendry JB, 2003, OPT EXPRESS, V11, P755, DOI 10.1364/OE.11.000755
   Pendry JB, 2000, PHYS REV LETT, V85, P3966, DOI 10.1103/PhysRevLett.85.3966
   Perez N, 2015, APPL PHYS LETT, V106, DOI 10.1063/1.4918652
   Petit D, 2010, APPL PHYS LETT, V97, DOI 10.1063/1.3523351
   Pfeifer MA, 2006, NATURE, V442, P63, DOI 10.1038/nature04867
   Phatak C, 2008, ULTRAMICROSCOPY, V108, P503, DOI 10.1016/j.ultramic.2007.08.002
   Phatak C, 2011, PHYS REV B, V83, DOI 10.1103/PhysRevB.83.174431
   Phatak C, 2010, PHYS REV LETT, V104, DOI 10.1103/PhysRevLett.104.253901
   Pietzsch O, 2000, PHYS REV LETT, V84, P5212, DOI 10.1103/PhysRevLett.84.5212
   Piramanayagam SN, 2007, J APPL PHYS, V102, DOI 10.1063/1.2750414
   Pismen L. M., 1999, VORTICES NONLINEAR F
   Pratzer M, 2001, PHYS REV LETT, V87, DOI 10.1103/PhysRevLett.87.127201
   Prinz VY, 2000, PHYSICA E, V6, P828, DOI 10.1016/S1386-9477(99)00249-0
   Pylypovskyi OV, 2016, SCI REP-UK, V6, DOI 10.1038/srep23316
   Pylypovskyi OV, 2015, PHYS REV LETT, V114, DOI 10.1103/PhysRevLett.114.197204
   Radon J., 1917, BER VERH SACHS AK MN, V69, P262
   Rao KSRK, 2000, JPN J APPL PHYS 2, V39, pL457
   Ravasio A, 2009, PHYS REV LETT, V103, DOI 10.1103/PhysRevLett.103.028104
   Redl FX, 2004, J AM CHEM SOC, V126, P14583, DOI 10.1021/ja046808r
   Rehbein S, 2009, PHYS REV LETT, V103, DOI 10.1103/PhysRevLett.103.110801
   Rodenburg JM, 2008, ADV IMAG ELECT PHYS, V150, P87, DOI 10.1016/S1076-5670(07)00003-1
   Rodenburg JM, 2004, APPL PHYS LETT, V85, P4795, DOI 10.1063/1.1823034
   Romming N, 2013, SCIENCE, V341, P636, DOI 10.1126/science.1240573
   Ross C, 2001, ANN REV MATER RES, V31, P203, DOI 10.1146/annurev.matsci.31.1.203
   Rothemund PWK, 2006, NATURE, V440, P297, DOI 10.1038/nature04586
   Roy S, 2011, NAT PHOTONICS, V5, P243, DOI [10.1038/nphoton.2011.11, 10.1038/NPHOTON.2011.11]
   Ruffer D, 2012, NANOSCALE, V4, P4989, DOI 10.1039/c2nr31086d
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Ruiz R, 2011, ACS NANO, V5, P79, DOI 10.1021/nn101561p
   Sakdinawat A, 2007, OPT LETT, V32, P2635, DOI 10.1364/OL.32.002635
   Sapozhnikov MV, 2012, PHYS REV B, V85, DOI 10.1103/PhysRevB.85.054402
   Saxena A, 1998, PHYSICA A, V261, P13, DOI 10.1016/S0378-4371(98)00378-1
   SCHARPF O, 1978, J APPL CRYSTALLOGR, V11, P626, DOI 10.1107/S0021889878014077
   Schattschneider P, 2006, NATURE, V441, P486, DOI 10.1038/nature04778
   Schattschneider P, 2011, ULTRAMICROSCOPY, V111, P1461, DOI 10.1016/j.ultramic.2011.07.004
   SCHEINFEIN MR, 1990, REV SCI INSTRUM, V61, P2501, DOI 10.1063/1.1141908
   SCHMAHL G, 1969, OPTIK, V29, P577
   Schmidt OG, 2001, NATURE, V410, P168, DOI 10.1038/35065525
   Schneider G, 2010, NAT METHODS, V7, P985, DOI [10.1038/nmeth.1533, 10.1038/NMETH.1533]
   Schneider M, 2002, J APPL PHYS, V92, P1466, DOI 10.1063/1.1490623
   SCHRYER NL, 1974, J APPL PHYS, V45, P5406, DOI 10.1063/1.1663252
   Schumacher O, 2005, APPL PHYS LETT, V86, DOI 10.1063/1.1897056
   Schumann J, 2012, NANOTECHNOLOGY, V23, DOI 10.1088/0957-4484/23/25/255701
   SCHUTZ G, 1987, PHYS REV LETT, V58, P737, DOI 10.1103/PhysRevLett.58.737
   Sebastian T, 2015, FRONT PHYS, V3, DOI 10.3389/fphy.2015.00035
   Segatti A, 2014, PHYS REV E, V90, DOI 10.1103/PhysRevE.90.012501
   Sellmyer DJ, 2001, J PHYS-CONDENS MAT, V13, pR433, DOI 10.1088/0953-8984/13/25/201
   Shapiro D, 2005, P NATL ACAD SCI USA, V102, P15343, DOI 10.1073/pnas.0503305102
   Shchukin VA, 1999, REV MOD PHYS, V71, P1125, DOI 10.1103/RevModPhys.71.1125
   Sheka DD, 2004, PHYS REV B, V69, DOI 10.1103/PhysRevB.69.054429
   Sheka DD, 2015, PHYS REV B, V92, DOI 10.1103/PhysRevB.92.054417
   Sheka DD, 2015, J PHYS A-MATH THEOR, V48, DOI 10.1088/1751-8113/48/12/125202
   Sheka DD, 2013, SPIN-SINGAPORE, V3, DOI 10.1142/S2010324713400031
   Shinjo T, 2000, SCIENCE, V289, P930, DOI 10.1126/science.289.5481.930
   SIGMUND P, 1969, PHYS REV, V184, P383, DOI 10.1103/PhysRev.184.383
   Sloika MI, 2014, APPL PHYS LETT, V104, DOI 10.1063/1.4884957
   Smith EJ, 2011, SOFT MATTER, V7, P11309, DOI 10.1039/c1sm06416a
   Smith EJ, 2011, PHYS REV LETT, V107, DOI 10.1103/PhysRevLett.107.097204
   Soares MM, 2008, PHYS REV B, V77, DOI 10.1103/PhysRevB.77.224405
   Solovev AA, 2012, ACS NANO, V6, P1751, DOI 10.1021/nn204762w
   Solovev AA, 2010, ADV FUNCT MATER, V20, P2430, DOI 10.1002/adfm.200902376
   Songmuang R, 2006, APPL PHYS LETT, V89, DOI 10.1063/1.2390647
   Sonntag A, 2014, PHYS REV LETT, V113, DOI 10.1103/PhysRevLett.113.077202
   Stohr J, 1995, J ELECTRON SPECTROSC, V75, P253, DOI 10.1016/0368-2048(95)02537-5
   Stohr J, 1998, SURF REV LETT, V5, P1297, DOI 10.1142/S0218625X98001638
   Stohr J, 2006, SOLID STATE SCI, V75
   Streubel R, 2015, THESIS
   Streubel R, 2016, APPL PHYS LETT, V108, DOI 10.1063/1.4941045
   Streubel R, 2015, PHYS REV B, V92, DOI 10.1103/PhysRevB.92.104431
   Streubel R, 2015, APPL PHYS LETT, V107, DOI 10.1063/1.4931101
   Streubel R, 2015, NAT COMMUN, V6, DOI 10.1038/ncomms8612
   Streubel R, 2015, SCI REP-UK, V5, DOI 10.1038/srep08787
   Streubel R, 2014, NANO LETT, V14, P3981, DOI 10.1021/nl501333h
   Streubel R, 2014, ADV MATER, V26, P316, DOI 10.1002/adma.201303003
   Streubel R, 2013, SPIN-SINGAPORE, V3, DOI 10.1142/S2010324713400018
   Streubel R, 2012, APPL PHYS LETT, V101, DOI 10.1063/1.4756708
   Streubel R, 2012, NANO LETT, V12, P3961, DOI 10.1021/nl301147h
   Streubel R, 2012, PHYS REV B, V85, DOI 10.1103/PhysRevB.85.174429
   Sun SH, 2006, ADV MATER, V18, P393, DOI 10.1002/adma.200501464
   Sun SH, 2000, SCIENCE, V287, P1989, DOI 10.1126/science.287.5460.1989
   Tanigaki T, 2015, NANO LETT, V15, P1309, DOI 10.1021/nl504473a
   Teichert C, 2003, APPL PHYS A-MATER, V76, P653, DOI 10.1007/s00339-002-2010-7
   Teichert C, 1999, APPL PHYS LETT, V74, P588, DOI 10.1063/1.123154
   Teichert C, 2009, J PHYS-CONDENS MAT, V21, DOI 10.1088/0953-8984/21/22/224025
   Terris BD, 2009, J MAGN MAGN MATER, V321, P512, DOI 10.1016/j.jmmm.2008.05.046
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Thiaville A, 2005, EUROPHYS LETT, V69, P990, DOI 10.1209/epl/i2004-10452-6
   Thiaville A, 2004, J APPL PHYS, V95, P7049, DOI 10.1063/1.1667804
   Thiaville A, 2006, TOP APPL PHYS, V101, P161
   Thibault P, 2008, SCIENCE, V321, P379, DOI 10.1126/science.1158573
   THIELE AA, 1973, PHYS REV LETT, V30, P230, DOI 10.1103/PhysRevLett.30.230
   THOLE BT, 1992, PHYS REV LETT, V68, P1943, DOI 10.1103/PhysRevLett.68.1943
   Tkachenko VS, 2013, LOW TEMP PHYS+, V39, P163, DOI 10.1063/1.4792133
   Tkachenko VS, 2012, APPL PHYS LETT, V101, DOI 10.1063/1.4757994
   Tomita S, 2014, PHYS REV LETT, V113, DOI 10.1103/PhysRevLett.113.235501
   TONNER BP, 1988, REV SCI INSTRUM, V59, P853, DOI 10.1063/1.1139792
   Tripathi A, 2011, P NATL ACAD SCI USA, V108, P13393, DOI 10.1073/pnas.1104304108
   Tripp SL, 2003, ANGEW CHEM INT EDIT, V42, P5591, DOI 10.1002/anie.200352825
   Turgut E, 2013, PHYS REV LETT, V110, DOI 10.1103/PhysRevLett.110.197201
   Turner AM, 2010, REV MOD PHYS, V82, P1301, DOI 10.1103/RevModPhys.82.1301
   Uhlir V, 2010, PHYS REV B, V81, DOI 10.1103/PhysRevB.81.224418
   Ulbrich TC, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.077202
   Urena EB, 2009, J PHYS D APPL PHYS, V42, DOI 10.1088/0022-3727/42/5/055001
   Valadares LF, 2010, SMALL, V6, P565, DOI 10.1002/smll.200901976
   Vansteenkiste A, 2009, NEW J PHYS, V11, DOI 10.1088/1367-2630/11/6/063006
   Vazquez M, 2011, PHYS STATUS SOLIDI B, V248, P2368, DOI 10.1002/pssb.201147092
   Verbeeck J, 2010, NATURE, V467, P301, DOI 10.1038/nature09366
   Vettiger P, 2002, IEEE T NANOTECHNOL, V1, P39, DOI 10.1109/TNANO.2002.1005425
   Vitelli V, 2004, PHYS REV LETT, V93, DOI 10.1103/PhysRevLett.93.215301
   Vock S, 2014, APPL PHYS LETT, V105, DOI 10.1063/1.4900998
   Volkov VV, 2002, MICRON, V33, P411, DOI 10.1016/S0968-4328(02)00017-3
   Wachowiak A, 2002, SCIENCE, V298, P577, DOI 10.1126/science.1075302
   Wang TH, 2012, PHYS REV LETT, V108, DOI 10.1103/PhysRevLett.108.267403
   Wang YL, 2016, ANN PHYS-NEW YORK, V364, P68, DOI 10.1016/j.aop.2015.10.019
   Weber DP, 2012, NANO LETT, V12, P6139, DOI 10.1021/nl302950u
   Wegrowe JE, 1999, PHYS REV LETT, V82, P3681, DOI 10.1103/PhysRevLett.82.3681
   Wolf SA, 2001, SCIENCE, V294, P1488, DOI 10.1126/science.1065389
   Xu P, 2008, NAT NANOTECHNOL, V3, P97, DOI 10.1038/nnano.2008.1
   YABLONOVITCH E, 1987, APPL PHYS LETT, V51, P2222, DOI 10.1063/1.98946
   Yan M, 2013, PHYS REV B, V88, DOI 10.1103/PhysRevB.88.220412
   Yan M, 2012, APPL PHYS LETT, V100, DOI 10.1063/1.4727909
   Yan M, 2011, APPL PHYS LETT, V99, DOI 10.1063/1.3643037
   Yan M, 2010, PHYS REV LETT, V104, DOI 10.1103/PhysRevLett.104.057201
   Yershov KV, 2016, PHYS REV B, V93, DOI 10.1103/PhysRevB.93.094418
   Yershov KV, 2015, PHYS REV B, V92, DOI 10.1103/PhysRevB.92.104412
   Yershov KV, 2015, J APPL PHYS, V117, DOI 10.1063/1.4913486
   Yoneya M, 2008, PHYS REV B, V78, DOI 10.1103/PhysRevB.78.064419
   YOUNG NO, 1959, NATURE, V183, P104, DOI 10.1038/183104a0
   Zakeri K, 2010, PHYS REV LETT, V104, DOI 10.1103/PhysRevLett.104.137203
   Zakeri K, 2014, PHYS REP, V545, P47, DOI 10.1016/j.physrep.2014.08.001
   Zhang W, 2010, PHYS REV B, V81, DOI 10.1103/PhysRevB.81.064433
   Zhao YP, 2002, NANO LETT, V2, P351, DOI 10.1021/nl0157041
   Zhu DL, 2010, PHYS REV LETT, V105, DOI 10.1103/PhysRevLett.105.043901
   Zhu J, 2009, NANO LETT, V9, P279, DOI 10.1021/nl802886y
   Ziberi B, 2005, PHYS REV B, V72, DOI 10.1103/PhysRevB.72.235310
NR 425
TC 6
Z9 6
U1 31
U2 49
PU IOP PUBLISHING LTD
PI BRISTOL
PA TEMPLE CIRCUS, TEMPLE WAY, BRISTOL BS1 6BE, ENGLAND
SN 0022-3727
EI 1361-6463
J9 J PHYS D APPL PHYS
JI J. Phys. D-Appl. Phys.
PD SEP 14
PY 2016
VL 49
IS 36
AR 363001
DI 10.1088/0022-3727/49/36/363001
PG 45
WC Physics, Applied
SC Physics
GA DX0LK
UT WOS:000384052800001
ER

PT J
AU Vivero, RJ
   Jaramillo, NG
   Cadavid-Restrepo, G
   Soto, SIU
   Herrera, CXM
AF Jose Vivero, Rafael
   Gil Jaramillo, Natalia
   Cadavid-Restrepo, Gloria
   Uribe Soto, Sandra I.
   Moreno Herrera, Claudia Ximena
TI Structural differences in gut bacteria communities in developmental
   stages of natural populations of Lutzomyia evansi from Colombia's
   Caribbean coast
SO PARASITES & VECTORS
LA English
DT Article
DE Sand flies; Immature; Adults; Vector; Gut; Microbiota
ID 16S RIBOSOMAL-RNA; DIPTERA-PSYCHODIDAE; SAND FLIES; LEISHMANIA
   TRANSMISSION; MICROBIAL COMMUNITY; GENE-SEQUENCES; INSECT VECTORS;
   LONGIPALPIS; DIVERSITY; IDENTIFICATION
AB Background: Lutzomyia evansi, a phlebotomine insect endemic to Colombia's Caribbean coast, is considered to be the main vector of visceral and cutaneous leishmaniasis in the region. Although insects of this species can harbor pathogenic and non-pathogenic microorganisms in their intestinal microbiota, there is little information available about the diversity of gut bacteria present in Lutzomyia evansi. In this study, conventional microbiological methods and molecular tools were used to assess the composition of bacterial communities associated with Lutzomyia evansi guts in immature and adult stages of natural populations from the department of Sucre (Caribbean coast of Colombia).
   Methods: Sand flies were collected from two locations (peri-urban and jungle biotype) in the Department of Sucre (Caribbean coast of Colombia). A total of 752 Lutzomyia evansi intestines were dissected. In this study, 125 bacterial strains were isolated from different culture media (LB Agar, MacConkey Agar). Different methods were used for bacterial identification, including ribosomal intergenic spacer analysis (RISA) and analysis of the 16S rRNA and gyrB gene sequences. The genetic profiles of the bacterial populations were generated and temporal temperature gradient gel electrophoresis (TTGE) was used to compare them with total gut DNA. We also used PCR and DNA sequence analysis to determine the presence of Wolbachia endosymbiont bacteria and Leishmania parasites.
   Results: The culture-dependent technique showed that the dominant intestinal bacteria isolated belong to Acinetobacter, Enterobacter, Pseudomonas, Ochrobactrum, Shinella and Paenibacillus in the larval stage; Lysobacter, Microbacterium, Streptomyces, Bacillus and Rummeliibacillus in the pupal stage; and Staphylococcus, Streptomyces, Brevibacterium, Acinetobacter, Enterobacter and Pantoea in the adult stage. Statistical analysis revealed significant differences between the fingerprint patterns of the PCR-TTGE bands in bacterial communities from immature and adult stages. Additionally, differences were found in bacterial community structure in fed females, unfed females, males and larvae. The intestinal bacteria detected by PCR-TTGE were Enterobacter cloacae and Bacillus thuringiensis, which were present in different life stages of Lu. evansi, and Burkholderia cenocepacia and Bacillus gibsonii, which were detected only in the larval stage. Wolbachia and Leishmania were not detected in gut samples of Lutzomyia evansi.
   Conclusions: The analyses conducted using microbiological and molecular approaches indicated significant variations in the bacterial communities associated with the gut of Lu. evansi, depending on the developmental stage and food source. We propose that these elements affect microbial diversity in L. evansi guts and may in turn influence pathogen transmission to humans bitten by this insect.
C1 [Jose Vivero, Rafael; Uribe Soto, Sandra I.] Univ Nacl Colombia, Grp Invest Sistemat Mol, St 59 A 63-20, Medellin 050003, Colombia.
   [Jose Vivero, Rafael; Uribe Soto, Sandra I.] SIU, Univ Antioquia, Lab 632, PECET, St 62 52-59,Lab 632, Medellin 050003, Colombia.
   [Jose Vivero, Rafael; Gil Jaramillo, Natalia; Cadavid-Restrepo, Gloria; Moreno Herrera, Claudia Ximena] Univ Nacl Colombia Sede Medellin, Lab Biol Celular & Mol, Grp Microbiodiversidad & Bioprospecc, St 59 A 63-20, Medellin 050003, Colombia.
RP Vivero, RJ (reprint author), Univ Nacl Colombia, Grp Invest Sistemat Mol, St 59 A 63-20, Medellin 050003, Colombia.; Vivero, RJ (reprint author), SIU, Univ Antioquia, Lab 632, PECET, St 62 52-59,Lab 632, Medellin 050003, Colombia.; Vivero, RJ (reprint author), Univ Nacl Colombia Sede Medellin, Lab Biol Celular & Mol, Grp Microbiodiversidad & Bioprospecc, St 59 A 63-20, Medellin 050003, Colombia.
EM rajovigo2001@yahoo.com
OI Moreno Herrera, Claudia Ximena/0000-0002-8132-5223
FU Administrative Department of Science, Technology and Innovation
   (COLCIENCIAS) [695-2014]; Grupo de Microbiodiversidad y Bioprospeccion;
   Grupo de Investigacion en Sistematica Molecular, Universidad Nacional de
   Colombia at Medellin
FX This study was funded by the Administrative Department of Science,
   Technology and Innovation (COLCIENCIAS code # 695-2014; Administrative
   Department of Science, Technology and Innovation; National Call 528 for
   doctoral studies in Colombia, 2011); Grupo de Microbiodiversidad y
   Bioprospeccion and Grupo de Investigacion en Sistematica Molecular,
   Universidad Nacional de Colombia at Medellin. The funders had no role in
   the study design, data collection and analysis, decision to publish or
   preparation of the manuscript.
CR Acevedo M, 2008, B DIR MALARIOL SANEA, V48, P2
   Akhoundi M, 2012, PLOS ONE, V7, DOI 10.1371/journal.pone.0050259
   Amora S, NEOTROP ENTOMOL
   Azambuja P, 2005, TRENDS PARASITOL, V21, P568, DOI 10.1016/j.pt.2005.09.011
   Boua B, 2011, ENFERM INFEC MICR CL, V29, P601
   Braig HR, 1998, J BACTERIOL, V180, P2373
   Braks MAH, 1999, PARASITOL TODAY, V15, P409, DOI 10.1016/S0169-4758(99)01514-8
   Brazil RP, 2013, REV SOC BRAS MED TRO, V46, P263, DOI 10.1590/0037-8682-0101-2013
   Broderick N, 2006, PNAS, V103
   Chakraborty U, 2006, J BASIC MICROB, V46, P186, DOI 10.1002/jobm.200510050
   CHANIOTIS BN, 1974, J MED ENTOMOL, V11, P73
   Chavshin AR, 2014, PARASITE VECTOR, V7, DOI 10.1186/1756-3305-7-419
   Cochero Suljey, 2007, Rev Cubana Med Trop, V59, P35
   Contreras Gutierrez M. A., 2014, PLoS ONE, V9, pr85496, DOI 10.1371/journal.pone.0085496
   Contreras-Gutierrez MA, 2013, MEFLG, V5, P7
   Dahllo F, 2000, APPL ENVIRON MICROB, V66, P3376
   De Gaio AO, 2011, PARASITE VECTOR, V4, P105
   Degnan PH, 2012, ISME J, V6, P183, DOI 10.1038/ismej.2011.74
   DeMaio J, 1996, AM J TROP MED HYG, V54, P219
   Dillon RJ, 2004, ANNU REV ENTOMOL, V49, P71, DOI 10.1146/annurev.ento.49.061802.123416
   Dillon RJ, 1996, ANN TROP MED PARASIT, V90, P669
   Dong YM, 2009, PLOS PATHOG, V5, DOI 10.1371/journal.ppat.1000423
   Doughari HJ, 2011, MICROBES ENVIRON, V26, P101, DOI 10.1264/jsme2.ME10179
   Eleftherianos I, 2013, FRONT PHYSIOL, V15, P4
   Engel P, 2013, FEMS MICROBIOL REV, V37, P699, DOI 10.1111/1574-6976.12025
   Espejo RT, 1998, MICROBIOL-UK, V144, P1611
   Estrada S, 2001, APPL ENVIRON MICROB, V67, P2790
   Ferro C, 1998, I NACL SALUD 1917 19, P219
   Floate KD, 2006, BIOCONTROL SCI TECHN, V16, P767, DOI 10.1080/09583150600699606
   Fraga J, 2010, INFECT GENET EVOL, V10, P238, DOI 10.1016/j.meegid.2009.11.007
   Golczer G, 2008, REV COLOMB ENTOMOL, V34, P199
   Gomes T, 2010, PLOS NEGLECT TROP D, V4, pe638, DOI [10.1371/journal.pntd.0000638, DOI 10.1371/JOURNAL.PNTD.0000638]
   Gomez AM, 2011, SOIL BIOL BIOCHEM, V43, P1275, DOI 10.1016/j.soilbio.2011.02.018
   González Camila, 2006, Biomédica, V26, P64
   Gouveia C, 2008, NEOTROP ENTOMOL, V37, P597, DOI 10.1590/S1519-566X2008000500016
   Guernaoui S, 2011, J VECTOR ECOL, V36, pS144, DOI 10.1111/j.1948-7134.2011.00124.x
   Hall T.A., 1999, NUCL ACIDS S SER, V41, P95, DOI DOI 10.1021/BK-1999-0734.CH008
   Hammer O, 2001, PALAEONTOL ELECTRON, V4, P9, DOI DOI 10.1016/J.BCP.2008.05.025
   Haouas N, 2007, AM J TROP MED HYG, V77, P1054
   Hebert PDN, 2003, P ROY SOC B-BIOL SCI, V270, P313, DOI 10.1098/rspb.2002.2218
   Hernandez-Camacho J., 1992, DIVERSIDAD BIOL IBER, P105
   Hillesland H, 2008, AM J TROP MED HYG, V79, P881
   Hurwitz I, 2011, PARASITE VECTOR, V4, DOI 10.1186/1756-3305-4-82
   Husseneder C, 2005, APPL MICROBIOL BIOT, V68, P360, DOI 10.1007/s00253-005-1914-5
   Janson EM, 2008, EVOLUTION, V62, P997, DOI 10.1111/j.1558-5646.2008.00348.x
   Janssen PH, 2006, APPL ENVIRON MICROB, V72, P1719, DOI 10.1128/AEM.72.3.1719-1728.2006
   Vivero RJ, 2015, PARASITE VECTOR, V8, DOI 10.1186/s13071-015-0711-y
   Kikuchi Y, 2005, APPL ENVIRON MICROB, V71, P4035, DOI 10.1128/AEM.71.7.4035-4043.2005
   KIMURA M, 1980, J MOL EVOL, V16, P111, DOI 10.1007/BF01731581
   Koeppel A, 2008, P NATL ACAD SCI USA, V105, P2504, DOI 10.1073/pnas.0712205105
   Maleki-Ravasan N, 2014, J ARTHROPOD-BORNE DI, V8, P69
   Malhotra J, 2012, J BACTERIOL, V194, P5156, DOI 10.1128/JB.01194-12
   Manguin S, 2013, ANOPHELES MOSQUITOES - NEW INSIGHTS INTO MALARIA VECTORS, P549, DOI 10.5772/55610
   Martin DP, 2005, BIOINFORMATICS, V21, P260, DOI 10.1093/bioinformatics/bth490
   McCarthy CB, 2011, PLOS NEGLECT TROP D, V5, DOI 10.1371/journal.pntd.0001304
   Meijerink J, 1999, J INSECT PHYSIOL, V45, P365, DOI 10.1016/S0022-1910(98)00135-8
   Minard G, 2013, PARASITE VECTOR, V6, DOI 10.1186/1756-3305-6-146
   Mohammadi SA, 2003, CROP SCI, V43, P1235
   Moreno CX, 2006, ENVIRON MICROBIOL, V8, P761, DOI 10.1111/j.1462-2920.2006.00955.x
   Mukhopadhyay J, 2012, PLOS ONE, V7, DOI 10.1371/journal.pone.0035748
   MUYZER G, 1993, APPL ENVIRON MICROB, V59, P695
   Neil L, 1979, P NATL ACAD SCI USA, V76, P5269
   Ngwa CJ, 2013, J MED ENTOMOL, V50, P404, DOI 10.1603/ME12180
   Oliveira S M, 2000, Rev Soc Bras Med Trop, V33, P319
   Oliveira S, 2001, CAD SAUDE PUBLICA, V17, P229
   Peixoto RS, 2002, LETT APPL MICROBIOL, V35, P316, DOI 10.1046/j.1472-765X.2002.01183.x
   Peterkova-Koci K, 2012, PARASITE VECTOR, V5, DOI 10.1186/1756-3305-5-145
   Pidiyar VJ, 2004, AM J TROP MED HYG, V70, P597
   Rademaker JLW, 1997, DNA MARKERS, P151
   Raffa K, 2008, RES FORUM INVASIVE S, P61
   Rani A, 2009, BMC MICROBIOL, V9, DOI 10.1186/1471-2180-9-96
   SAITOU N, 1987, MOL BIOL EVOL, V4, P406
   Sanchez-Contreras M, 2008, BIOTECHNOL GENET ENG, V25, P203
   Sant'Anna MRV, 2014, PARASITE VECTOR, V7, DOI 10.1186/1756-3305-7-329
   Sant'Anna MRV, 2012, PLOS ONE, V7, DOI 10.1371/journal.pone.0042531
   Sezen K, 2013, TURK BIYO MUC DERG, V4, P89
   Tamura K, 2011, MOL BIOL EVOL, V28, P2731, DOI 10.1093/molbev/msr121
   Tang YS, 1998, MED VET ENTOMOL, V12, P13, DOI 10.1046/j.1365-2915.1998.00063.x
   Tchioffo M, 2012, PLOS PATHOG, V8, DOI [10.1371/journal.ppat.1002742, DOI 10.1371/JOURNAL.PPAT.1002742]
   Travi BL, 2002, J MED ENTOMOL, V39, P451, DOI 10.1603/0022-2585-39.3.451
   Vargas A, 2012, MEFLG, V4, P13
   Vivero R, 2013, MALARIOL SALUD AMB, V3, P1
   Volf P, 2002, FOLIA PARASIT, V49, P73
   Wang LT, 2007, INT J SYST EVOL MICR, V57, P1846, DOI 10.1099/ijs.0.64685-0
   YAMAMOTO S, 1995, APPL ENVIRON MICROB, V61, P1104
   Young David G., 1994, Memoirs of the American Entomological Institute (Gainesville), V54, P1
   Zhou WG, 1998, P ROY SOC B-BIOL SCI, V265, P509
NR 87
TC 0
Z9 0
U1 9
U2 16
PU BIOMED CENTRAL LTD
PI LONDON
PA 236 GRAYS INN RD, FLOOR 6, LONDON WC1X 8HL, ENGLAND
SN 1756-3305
J9 PARASITE VECTOR
JI Parasites Vectors
PD SEP 13
PY 2016
VL 9
AR 496
DI 10.1186/s13071-016-1766-0
PG 20
WC Parasitology
SC Parasitology
GA DW7SI
UT WOS:000383851300001
PM 27618991
ER

PT J
AU Oezelt, H
   Kovacs, A
   Fischbacher, J
   Matthes, P
   Kirk, E
   Wohlhuter, P
   Heyderman, LJ
   Albrecht, M
   Schrefl, T
AF Oezelt, Harald
   Kovacs, Alexander
   Fischbacher, Johann
   Matthes, Patrick
   Kirk, Eugenie
   Wohlhuter, Phillip
   Heyderman, Laura Jane
   Albrecht, Manfred
   Schrefl, Thomas
TI Switching field distribution of exchange coupled ferri-/ferromagnetic
   composite bit patterned media
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article
ID THIN-FILMS; TB/IN(2)
AB We investigate the switching field distribution and the resulting bit error rate of exchange coupled ferri-/ferromagnetic bilayer island arrays by micromagnetic simulations. Using islands with varying microstructure and anisotropic properties, the intrinsic switching field distribution is computed. The dipolar contribution to the switching field distribution is obtained separately by using a model of a triangular patterned island array resembling 1: 4Tb/in(2) bit patterned media. Both contributions are computed for different thicknesses of the soft exchange coupled ferrimagnet and also for ferromagnetic single phase FePt islands. A bit patterned media with a bilayer structure of FeGd(5 nm)/FePt(5 nm) shows a bit error rate of 10(-4) with a write field of 1: 16 T. Published by AIP Publishing.
C1 [Oezelt, Harald; Kovacs, Alexander; Fischbacher, Johann; Schrefl, Thomas] Danube Univ Krems, Ctr Integrated Sensor Syst, A-2700 Wiener Neustadt, Austria.
   [Matthes, Patrick; Albrecht, Manfred] Univ Augsburg, Inst Phys, D-86159 Augsburg, Germany.
   [Kirk, Eugenie; Wohlhuter, Phillip; Heyderman, Laura Jane] Swiss Fed Inst Technol, Dept Mat, Lab Mesoscop Syst, CH-8093 Zurich, Switzerland.
   [Kirk, Eugenie; Wohlhuter, Phillip; Heyderman, Laura Jane] Paul Scherrer Inst, Lab Micro & Nanotechnol, CH-5232 Villigen, Switzerland.
RP Oezelt, H (reprint author), Danube Univ Krems, Ctr Integrated Sensor Syst, A-2700 Wiener Neustadt, Austria.
EM harald.oezelt@donau-uni.ac.at
RI Heyderman, Laura/E-7959-2015
OI Ozelt, Harald/0000-0002-3754-3565
FU Austrian Science Fund (FWF) [I821]; German Research Foundation (DFG) [AL
   618/17-1]; Swiss National Science Foundation (SNF) [200021L_137509];
   Vienna Science and Technology Fund (WWTF) [MA14-044]
FX We gratefully acknowledge the financial support provided by the Austrian
   Science Fund (FWF Grant No. I821), the German Research Foundation (DFG
   Grant No. AL 618/17-1), the Swiss National Science Foundation (SNF Grant
   No. 200021L_137509), and the Vienna Science and Technology Fund (WWTF
   Grant No. MA14-044).
CR Albrecht M, 2002, APPL PHYS LETT, V81, P2875, DOI 10.1063/1.1512946
   Albrecht TR, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2015.2397880
   Brown W. F., 1959, J APPL PHYS, V30, pS62, DOI 10.1063/1.2185970
   Dean J, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2905292
   Dittrich R, 2002, J MAGN MAGN MATER, V250, pL12
   Dobin AY, 2007, J APPL PHYS, V101, DOI 10.1063/1.2714271
   Dong Y, 2011, IEEE T MAGN, V47, P2652, DOI 10.1109/TMAG.2011.2148112
   Goncharov A, 2007, APPL PHYS LETT, V91, DOI 10.1063/1.2804609
   Greaves SJ, 2008, IEEE T MAGN, V44, P3430, DOI 10.1109/TMAG.2008.2002365
   HAGEDORN FB, 1970, J APPL PHYS, V41, P2491, DOI 10.1063/1.1659251
   Hauet T, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3276911
   Hellwig O, 2007, APPL PHYS LETT, V90, DOI 10.1063/1.2730744
   Kikitsu A, 2009, J MAGN MAGN MATER, V321, P526, DOI 10.1016/j.jmmm.2008.05.039
   Kovacs A, 2016, J APPL PHYS, V120, DOI 10.1063/1.4954888
   Krone P, 2011, J APPL PHYS, V109, DOI 10.1063/1.3583653
   Kronmuller H, 2002, PHYSICA B, V319, P122, DOI 10.1016/S0921-4526(02)01113-4
   Lee J, 2011, APPL PHYS LETT, V99, DOI 10.1063/1.3623752
   MANSURIPUR M, 1991, J APPL PHYS, V69, P4844, DOI 10.1063/1.348250
   Mansuripur M., 1995, PHYSICAL PRINCIPLES, P652
   Muraoka Hiroaki, 2008, IEEE Transactions on Magnetics, V44, P3423, DOI 10.1109/TMAG.2008.2001654
   Muraoka H, 2011, IEEE T MAGN, V47, P26, DOI 10.1109/TMAG.2010.2080354
   Oezelt H, 2015, J MAGN MAGN MATER, V381, P28, DOI 10.1016/j.jmmm.2014.12.045
   Oezelt H, 2015, J APPL PHYS, V117, DOI 10.1063/1.4906288
   Pfau B, 2014, APPL PHYS LETT, V105, DOI 10.1063/1.4896982
   Pfau B, 2011, APPL PHYS LETT, V99, DOI 10.1063/1.3623488
   Piramanayagam SN, 2009, J MAGN MAGN MATER, V321, P485, DOI 10.1016/j.jmmm.2008.05.007
   Quey R, 2011, COMPUT METHOD APPL M, V200, P1729, DOI 10.1016/j.cma.2011.01.002
   Repain V, 2004, J APPL PHYS, V95, P2614, DOI 10.1063/1.1645973
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Sbiaa R, 2009, J APPL PHYS, V105, DOI 10.1063/1.3093699
   Schrefl T., 2007, HDB MAGNETISM ADV MA, P1
   Shukh A, 2004, IEEE T MAGN, V40, P2585, DOI 10.1109/TMAG.2004.829315
   SKOMSKI R, 1993, PHYS REV B, V48, P15812, DOI 10.1103/PhysRevB.48.15812
   STONER EC, 1948, PHILOS TR R SOC S-A, V240, P599, DOI 10.1098/rsta.1948.0007
   Suess D, 2005, APPL PHYS LETT, V87, DOI 10.1063/1.1951053
   Suess D, 2007, J MAGN MAGN MATER, V308, P183, DOI 10.1016/j.jmmm.2006.05.021
   Terris BD, 2007, MICROSYST TECHNOL, V13, P189, DOI 10.1007/s00542-006-0144-9
   Thomson T, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.257204
   Victora RH, 2008, P IEEE, V96, P1799, DOI 10.1109/JPROC.2008.2004314
   Victora RH, 2002, IEEE T MAGN, V38, P1886, DOI 10.1109/TMAG.2002.802791
NR 40
TC 0
Z9 0
U1 11
U2 22
PU AMER INST PHYSICS
PI MELVILLE
PA 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
SN 0021-8979
EI 1089-7550
J9 J APPL PHYS
JI J. Appl. Phys.
PD SEP 7
PY 2016
VL 120
IS 9
AR 093904
DI 10.1063/1.4962213
PG 8
WC Physics, Applied
SC Physics
GA DW9KN
UT WOS:000383978100015
ER

PT J
AU Wang, Y
   Kumar, BVKV
AF Wang, Yao
   Kumar, B. V. K. Vijaya
TI Bidirectional Decision Feedback Modified Viterbi Detection (BD-DFMV) for
   Shingled Bit-Patterned Magnetic Recording (BPMR) With 2D Sectors and
   Alternating Track Widths
SO IEEE JOURNAL ON SELECTED AREAS IN COMMUNICATIONS
LA English
DT Article
DE Shingled magnetic recording; bit patterned media; decision feedback
   detection; modified Viterbi; alternating track widths
ID INTERSYMBOL INTERFERENCE; MEDIA; EQUALIZER; TB/IN(2)
AB Shingled bit-patterned media (BPM) recording is a promising candidate to improve the magnetic recording density above 1 Tb/in(2) while keeping the conventional writer design. However, shingled magnetic recording (SMR) leads to a narrower track pitch, and thus increased inter-track interference motivating the investigation of array readers and 2-D sectors. In this paper, we investigate SMR on BPM with 2-D sectors at the channel density of 3.71 Tb/in(2). Use of 2-D sectors allows the possibility of using either hard or soft information from already detected tracks in that 2-D sector to improve the detection performance on the current track. An important question in this context is whether all tracks in a 2-D sector should be of the same nominal width or if there is a potential benefit to using different widths for adjacent tracks. Based on our investigation, we show that alternating track widths [i.e., one less-trimmed (fat) track followed by one more-trimmed (narrow) track] are beneficial to a bit error rate (BER) perspective. In particular, we propose and investigate the use of a bidirectional decision feedback modified Viterbi (BD-DFMV) detector to improve the BER performance. Our simulations indicate that for a hypothetical 2-D sector with 13 tracks and 5% media noise and at the target BER of 10(-2), using alternating track widths and readback with a single reader, the BD-DFMV algorithm can provide about 1.6 dB signal-to-noise ratio (SNR) gain, compared with using the same detection algorithm but on a 2-D sector with uniform track widths. When using a reader array instead of a single reader, this SNR gain improves to about 2.0 dB. The alternating track width structure also appears to provide more robustness to track mis-registration compared with the 2-D uniform track width case.
C1 [Wang, Yao; Kumar, B. V. K. Vijaya] Carnegie Mellon Univ, Dept Elect & Comp Engn, Pittsburgh, PA 15213 USA.
RP Wang, Y (reprint author), Carnegie Mellon Univ, Dept Elect & Comp Engn, Pittsburgh, PA 15213 USA.
EM yaowang@andrew.cmu.edu; kumar@ece.cmu.edu
FU CMU-SYSU Collaborative Innovation Research Center (CIRC)
FX This work was supported by the CMU-SYSU Collaborative Innovation
   Research Center (CIRC).
CR Bita I, 2008, SCIENCE, V321, P939, DOI 10.1126/science.1159352
   Brace P., 2015, P FLASH MEM SUMM SAN, P1
   Chan KS, 2010, IEEE T MAGN, V46, P804, DOI 10.1109/TMAG.2009.2035635
   Chen YM, 2010, IEEE J SEL AREA COMM, V28, P167, DOI 10.1109/JSAC.2010.100205
   Matcha CK, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2015.2451112
   Mathew G, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2013.2283221
   Nabavi S, 2007, IEEE ICC, P6249, DOI 10.1109/ICC.2007.1035
   Nabavi S, 2007, IEEE T MAGN, V43, P2274, DOI 10.1109/TMAG.2007.893479
   Radhakrishnan R., 2004, P ISITA MELB VIC AUS, P674
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Wang SM, 2013, IEEE T MAGN, V49, P3644, DOI 10.1109/TMAG.2012.2237545
   Wang Y, 2016, IEEE T MAGN, V52, DOI 10.1109/TMAG.2015.2511721
   Wang Y, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2015.2464786
   Wang Y, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2014.2321389
   Wu YX, 2003, IEEE T MAGN, V39, P2115, DOI 10.1109/TMAG.2003.814291
   Zheng JP, 2013, IEEE T MAGN, V49, P4768, DOI 10.1109/TMAG.2013.2242333
NR 17
TC 0
Z9 0
U1 1
U2 1
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0733-8716
EI 1558-0008
J9 IEEE J SEL AREA COMM
JI IEEE J. Sel. Areas Commun.
PD SEP
PY 2016
VL 34
IS 9
BP 2450
EP 2462
DI 10.1109/JSAC.2016.2603620
PG 13
WC Engineering, Electrical & Electronic; Telecommunications
SC Engineering; Telecommunications
GA DZ9ZG
UT WOS:000386241500014
ER

PT J
AU Nguyen, CD
   Lee, J
AF Chi Dinh Nguyen
   Lee, Jaejin
TI Extending the Routes of the Soft Information in Turbo Equalization for
   Bit-Patterned Media Recording
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Bit-patterned media recording (BPMR); intertrack interference; soft
   output Viterbi algorithm; turbo equalization (TE)
ID LDPC CODES; STORAGE; PERFORMANCE; CHANNELS; SOVA
AB This paper presents a new framework of turbo equalization (TE) to overcome 2-D intersymbol interference (2-D ISI) for bit-patterned media recording (BPMR). The BPMR has been developed for the next generation of hard disk drives aiming to extend storage density. One of the main challenges for the system is 2-D ISI, i.e., 1-D ISI from neighbor bits and intertrack interference from adjacent tracks. The conventional TE is the iterative process between an equalizer (or detector) and a decoder. We construct a new scheme of TE where the soft information from the decoder is fed back not only to the equalizer but, at the same time, also to the detector. The proposed scheme is to exploit full advantage of a priori information from the decoder. The results show that the proposed model is approximately 0.4 dB better than the conventional TE solution at 0% track misregistration.
C1 [Chi Dinh Nguyen; Lee, Jaejin] Soongsil Univ, Sch Elect Engn, Seoul 156743, South Korea.
RP Lee, J (reprint author), Soongsil Univ, Sch Elect Engn, Seoul 156743, South Korea.
EM zlee@ssu.ac.kr
FU Basic Science Research Program through National Research Foundation of
   Korea, Ministry of Education [NRF-2013R1A1A2059077]
FX This work was supported by the Basic Science Research Program through
   the National Research Foundation of Korea, Ministry of Education, under
   Grant NRF-2013R1A1A2059077.
CR Albrecht TR, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2015.2397880
   Aviran S, 2005, IEEE T MAGN, V41, P2959, DOI 10.1109/TMAG.2005.854456
   DOUILLARD C, 1995, EUR T TELECOMMUN, V6, P507, DOI 10.1002/ett.4460060506
   Jeon S, 2010, IEEE T MAGN, V46, P2248, DOI 10.1109/TMAG.2010.2043068
   Kim J., 2010, JPN J APPL PHYS, V49
   Kim J, 2009, IEEE T MAGN, V45, P2260, DOI 10.1109/TMAG.2009.2016260
   Nakamura Y, 2012, IEEE T MAGN, V48, P4602, DOI 10.1109/TMAG.2012.2194989
   Nguyen C. D., 2015, P IEEE INT C CONS EL, P147
   Nutter PW, 2005, IEEE T MAGN, V41, P3214, DOI 10.1109/TMAG.2005.854780
   Nutter PW, 2005, IEEE T MAGN, V41, P4327, DOI 10.1109/TMAG.2005.856586
   Nutter PW, 2004, IEEE T MAGN, V40, P3551, DOI 10.1109/TMAG.2004.835697
   Rad FR, 2005, IEEE T MAGN, V41, P2998, DOI 10.1109/TMAG.2005.854447
   Shiroishi Y, 2009, IEEE T MAGN, V45, P3816, DOI 10.1109/TMAG.2009.2024879
   Tuchler M, 2002, IEEE T SIGNAL PROCES, V50, P673, DOI 10.1109/78.984761
NR 14
TC 1
Z9 1
U1 4
U2 4
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD SEP
PY 2016
VL 52
IS 9
AR 3101006
DI 10.1109/TMAG.2016.2573769
PG 6
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA DU8IA
UT WOS:000382455300008
ER

PT J
AU Wang, Y
   Kumar, BVKV
AF Wang, Yao
   Kumar, B. V. K. Vijaya
TI Micromagnetics-Based Analysis of Multi-Track Detection With Simplified
   2-D Write Precompensation on Shingled Magnetic Recording
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE 2-D data-dependent noise; 2-D nonlinear transition shift (NLTS); 2-D
   write precompensation (WPC); shingled magnetic recording (SMR);
   multi-track detection
ID NONLINEAR TRANSITION SHIFT; BIT-PATTERNED MEDIA; CHANNEL; SIGNAL; NOISE
AB In shingled magnetic recording systems, a shingled writer is used to write narrow tracks by overlapping the previous tracks, which also leads to severe inter-track interference, jitter, and nonlinear transition shift (NLTS) in the cross-track direction. To deal with these challenges, we propose a simplified 2-D write precompensation (WPC) scheme that adjusts the write current magnitude instead of the timing, to mitigate the 2-D NLTS in the writing process. In the proposed WPC scheme, the WPC is only implemented for the few specific patterns that seem to cause large media noise mean and variance. During the training period, the optimum write field for current transition being written is obtained by subtracting demagnetizing field from the previous neighboring bits in the current and nearest previous tracks from a fixed write field, and the optimum writing current is determined by minimizing the mean-squared error between the needed field and the available fields within a writer field library. Then, the specific bits producing the dominant demagnetizing field and the obtained optimum writing current are stored in a lookup table during the training period. During the writing process, we can obtain the optimum writing current by matching the specific previous written bits against the bit patterns in the lookup table, avoiding the need for computing the demagnetizing field and optimum writing current for every written bit. Here, two simplified WPC schemes are investigated corresponding to precompensating two sets of data patterns. For readback, a joint pattern-dependent noise-predictive (PDNP) detector is investigated to further whiten the 2-D media noise. Simulations indicate that at the target bit error rate of 10(-2), the proposed simplified WPC schemes combined with the joint PDNP detector can provide the density gains of as high as 22% compared with the system without WPC and detected with a joint Bahl-Cocke-Jelinek-Raviv detector.
C1 [Wang, Yao; Kumar, B. V. K. Vijaya] Carnegie Mellon Univ, Ctr Data Storage Syst, Pittsburgh, PA 15213 USA.
RP Wang, Y (reprint author), Carnegie Mellon Univ, Ctr Data Storage Syst, Pittsburgh, PA 15213 USA.
EM yaowang@andrew.cmu.edu
FU CMU-SYSU Collaborative Innovation Research Center
FX This work was supported by the CMU-SYSU Collaborative Innovation
   Research Center.
CR Barry JR, 2016, IEEE T MAGN, V52, DOI 10.1109/TMAG.2015.2483593
   Bertram H. N., 1994, THEORY MAGNETIC RECO, P245, DOI 10.1017/CBO9780511623066.010
   Chan KS, 2010, IEEE T MAGN, V46, P804, DOI 10.1109/TMAG.2009.2035635
   Chang W, 2010, IEEE T MAGN, V46, P3899, DOI 10.1109/TMAG.2010.2056926
   CHE XD, 1995, IEEE T MAGN, V31, P3021, DOI 10.1109/20.490257
   Galbraith R, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2013.2291875
   Kong LJ, 2013, IEEE T MAGN, V49, P2823, DOI 10.1109/TMAG.2013.2248351
   Lim F, 2005, GLOB TELECOMM CONF, P58
   Lin MY, 2015, J APPL PHYS, V117, DOI 10.1063/1.4913895
   Lippman T, 2015, J APPL PHYS, V117, DOI 10.1063/1.4914051
   Moon J, 2001, IEEE J SEL AREA COMM, V19, P730, DOI 10.1109/49.920181
   MOON JY, 1995, IEEE T MAGN, V31, P1083, DOI 10.1109/20.364789
   Muraoka H, 1996, IEEE T MAGN, V32, P3926, DOI 10.1109/20.539219
   Nabavi S, 2007, IEEE ICC, P6249, DOI 10.1109/ICC.2007.1035
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Salo M, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2013.2283074
   Senanan K, 2002, IEEE T MAGN, V38, P1664, DOI 10.1109/TMAG.2002.1017753
   Suzutou R, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2015.2445372
   TANG Y, 1991, IEEE T MAGN, V27, P5316, DOI 10.1109/20.278824
   Vasic B., 2013, IEEE T MAGN, V51
   Wang Y, 2016, IEEE T MAGN, V52, DOI 10.1109/TMAG.2015.2511721
   Wang Y, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2015.2437875
   Wang Y, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2014.2359391
   Wang Y, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2014.2321389
   Wang Y, 2012, IEEE MAGN LETT, V3, DOI 10.1109/LMAG.2012.2226935
   Wood R, 2009, IEEE T MAGN, V45, P917, DOI 10.1109/TMAG.2008.2010676
   Wu Z, 2008, IEEE ICC, P1972, DOI 10.1109/ICC.2008.378
   Yao J, 2015, IEEE ICC, P418, DOI 10.1109/ICC.2015.7248357
   Zhu JG, 2013, IEEE T MAGN, V49, P765, DOI 10.1109/TMAG.2012.2231855
NR 29
TC 0
Z9 0
U1 6
U2 6
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD SEP
PY 2016
VL 52
IS 9
AR 3002011
DI 10.1109/TMAG.2016.2569530
PG 11
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA DU8IA
UT WOS:000382455300007
ER

PT J
AU Arbelaez-Echeverri, OD
   Agudelo-Giraldo, JD
   Restrepo-Parra, E
AF Arbelaez-Echeverri, O. D.
   Agudelo-Giraldo, J. D.
   Restrepo-Parra, E.
TI Atomistic simulation of static magnetic properties of bit patterned
   media
SO PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES
LA English
DT Article
DE Bit patterned media; Atomistic simulation; LLG equation; Bit patterned
   media
ID RECORDING MEDIA; ISING-MODEL; LATTICE; NOISE
AB In this work we present a new design of Co based bit pattern media with out-of-plane uni-axial anisotropy induced by interface effects. Our model features the inclusion of magnetic impurities in the nonmagnetic matrix. After the material model was refined during three iterations using Monte Carlo simulations, further simulations were performed using an atomistic integrator of Landau-Lifshitz-Gilbert equation with Langevin dynamics to study the behavior of the system paying special attention to the super-paramagnetic limit. Our model system exhibits three magnetic phase transitions, one due to the magnetically doped matrix material and the weak magnetic interaction between the nano-structures in the system. The different magnetic phases of the system as well as the features of its phase diagram are explained. (C) 2016 Published by Elsevier B.V.
C1 [Arbelaez-Echeverri, O. D.; Agudelo-Giraldo, J. D.; Restrepo-Parra, E.] Univ Nacl Colombia, Dept Fis & Quim, Manizales 127, Colombia.
   [Arbelaez-Echeverri, O. D.; Agudelo-Giraldo, J. D.; Restrepo-Parra, E.] Acad Res Grp, PCM Computat Applicat, Cali, Colombia.
RP Arbelaez-Echeverri, OD (reprint author), Univ Nacl Colombia, Dept Fis & Quim, Manizales 127, Colombia.; Arbelaez-Echeverri, OD (reprint author), Acad Res Grp, PCM Computat Applicat, Cali, Colombia.
EM odarbelaeze@unal.edu.co; jdagudelog@unal.edu.co; erestrepopa@unal.edu.co
FU Direccion de Investigaciones of the Universidad Nacional de Colombia
   [23088, 23046]
FX The authors gratefully acknowledge the financial support from the
   Direccion de Investigaciones of the Universidad Nacional de Colombia
   during the course of this research under the projects 23088 and 23046.
   They also want to acknowledge R.F.L. Evans and other members of the
   Computational Magnetism Group of the University of York for the
   insightful conversations during the development of the model.
CR Albrecht TR, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2015.2397880
   Albrecht TR, 2013, IEEE T MAGN, V49, P773, DOI 10.1109/TMAG.2012.2227303
   Bridson R., 2007, TECHNICAL REPORT, DOI [10.1145/1278780.1278807, DOI 10.1145/1278780.1278807.2.1]
   Duman T., 2007, IEEE T MAGN, V43, P3517
   Evans RFL, 2015, PHYS REV B, V91, DOI 10.1103/PhysRevB.91.144425
   Evans RFL, 2014, J PHYS-CONDENS MAT, V26, DOI 10.1088/0953-8984/26/10/103202
   Hellwig O, 2007, APPL PHYS LETT, V90, DOI 10.1063/1.2730744
   Johnson MT, 1996, REP PROG PHYS, V59, P1409, DOI 10.1088/0034-4885/59/11/002
   Kalezhi J, 2009, IEEE T MAGN, V45, P3531, DOI 10.1109/TMAG.2009.2022407
   Kikitsu A, 2009, J MAGN MAGN MATER, V321, P526, DOI 10.1016/j.jmmm.2008.05.039
   Lima FWS, 2008, PHYSICA A, V387, P1545, DOI 10.1016/j.physa.2007.10.073
   Lima FWS, 2014, J PHYS CONF SER, V487, DOI 10.1088/1742-6596/487/1/012011
   Lima FWS, 2000, PHYSICA A, V283, P100, DOI 10.1016/S0378-4371(00)00134-5
   Nabavi S, 2009, IEEE T MAGN, V45, P3523, DOI 10.1109/TMAG.2009.2022493
   Nabavi S, 2008, IEEE T MAGN, V44, P3789, DOI 10.1109/TMAG.2008.2002387
   Neumann A, 2014, NEW J PHYS, V16, DOI 10.1088/1367-2630/16/8/083012
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Richter HJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2209179
   Schrenk KJ, 2013, PHYS REV E, V87, DOI 10.1103/PhysRevE.87.032123
   Terris BD, 2009, J MAGN MAGN MATER, V321, P512, DOI 10.1016/j.jmmm.2008.05.046
   Thomson T, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.257204
   van de Veerdonk RJM, 2003, IEEE T MAGN, V39, P590, DOI 10.1109/TMAG.2002.806339
   vanderMarck SC, 1997, PHYS REV E, V55, P1514, DOI 10.1103/PhysRevE.55.1514
   Weller D, 1999, IEEE T MAGN, V35, P4423, DOI 10.1109/20.809134
   Yang JKW, 2011, NANOTECHNOLOGY, V22, DOI 10.1088/0957-4484/22/38/385301
NR 25
TC 0
Z9 0
U1 3
U2 4
PU ELSEVIER SCIENCE BV
PI AMSTERDAM
PA PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
SN 1386-9477
EI 1873-1759
J9 PHYSICA E
JI Physica E
PD SEP
PY 2016
VL 83
BP 486
EP 490
DI 10.1016/j.physe.2015.12.016
PG 5
WC Nanoscience & Nanotechnology; Physics, Condensed Matter
SC Science & Technology - Other Topics; Physics
GA DR9MS
UT WOS:000380221400068
ER

PT J
AU Xiong, SS
   Wan, L
   Ishida, Y
   Chapuis, YA
   Craig, GSW
   Ruiz, R
   Nealey, PF
AF Xiong, Shisheng
   Wan, Lei
   Ishida, Yoshihito
   Chapuis, Yves-Andre
   Craig, Gordon S. W.
   Ruiz, Ricardo
   Nealey, Paul F.
TI Directed Self-Assembly of Triblock Copolymer on Chemical Patterns for
   Sub-10-nm Nanofabrication via Solvent Annealing
SO ACS NANO
LA English
DT Article
DE directed self-assembly; ABA triblock copolymer; PS-b-P2VP; chemical
   contrast pattern; solvent annealing; lithography; pattern transfer
ID ORDER-DISORDER TRANSITION; BLOCK-COPOLYMER; THIN-FILMS; DENSITY
   MULTIPLICATION; SELECTIVE SOLVENTS; DIBLOCK COPOLYMER; PHASE-BEHAVIOR;
   LITHOGRAPHY; VAPOR; ORIENTATION
AB Directed self-assembly (DSA) of block copolymers (BCPs) is a leading strategy to pattern at sublithographic resolution in the technology roadmap for semiconductors and is the only known solution to fabricate nanoimprint templates for the production of bit pattern media. While great progress has been made to implement 111 block copolymer lithography with features in the range of 10-20 nm, patterning solutions below 10 mu are still not mature. Many BCP systems self-assemble at this length scale, but challenges remain in simultaneously tuning the interfacial energy atop the film to control the orientation of BCP domains, designing materials, templates, and processes for ultra-high-density DSA, and establishing a robust pattern transfer strategy. Among the various solutions to achieve domains that are perpendicular to the substrate, solvent annealing is advantageous because it is a versatile method that can be applied to a diversity of materials. Here we report a DSA process based on chemical contrast templates and solvent annealing to fabricate 8 nm features on a 16 nm pitch. To make this possible, a number of innovations were brought in concert with a common platform: (1) assembling the BCP in the phase-separated, solvated state, (2) identifying a larger process window for solvated triblock vs diblock BCPs as a function of solvent volume fraction, (3) employing templates for sub-10-nm BCP systems accessible by lithography, and (4) integrating a robust pattern transfer strategy by vapor infiltration of organometallic precursors for selective metal oxide synthesis to prepare an inorganic hard mask.
C1 [Xiong, Shisheng; Ishida, Yoshihito; Craig, Gordon S. W.; Nealey, Paul F.] Univ Chicago, Inst Mol Engn, Chicago, IL 60637 USA.
   [Wan, Lei; Chapuis, Yves-Andre; Ruiz, Ricardo] HGST, San Jose, CA 95135 USA.
   [Ishida, Yoshihito] Kanagawa Univ, Dept Chem, Fac Engn, Tokyo, Japan.
   [Chapuis, Yves-Andre] Lam Res Corp, Fremont, CA 94538 USA.
RP Nealey, PF (reprint author), Univ Chicago, Inst Mol Engn, Chicago, IL 60637 USA.
EM nealey@uchicago.edu
OI Ruiz, Ricardo/0000-0002-1698-4281
FU U.S. Department of Energy, Office of Science, Office of Basic Energy
   Sciences-Materials Science; Advanced Storage Technology Corporation;
   HGST, a Western Digital Company
FX This work is supported by the U.S. Department of Energy, Office of
   Science, Office of Basic Energy Sciences-Materials Science. S.X.
   received support from the Advanced Storage Technology Corporation. R.R.,
   L.W., and Y.C. were supported by their employer, HGST, a Western Digital
   Company. S.X. would like to acknowledge HGST, a Western Digital Company,
   for offering opportunities to use the facilities to conduct research at
   the San Jose research center. The authors also thank K. C. Patel for
   technical assistance and acknowledge helpful discussions with S.-M. Hur,
   G. Khaira, A. Ramirez, and C. Arges.
CR Albrecht TR, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2015.2397880
   BALSARA NP, 1992, MACROMOLECULES, V25, P3896, DOI 10.1021/ma00041a011
   Bates CM, 2012, SCIENCE, V338, P775, DOI 10.1126/science.1226046
   BATES FS, 1990, J CHEM PHYS, V92, P6255, DOI 10.1063/1.458350
   BATES FS, 1990, ANNU REV PHYS CHEM, V41, P525, DOI 10.1146/annurev.pc.41.100190.002521
   Bosworth JK, 2010, J PHOTOPOLYM SCI TEC, V23, P145, DOI 10.2494/photopolymer.23.145
   Chang JB, 2012, ACS NANO, V6, P2071, DOI 10.1021/nn203767s
   Chavis MA, 2015, ADV FUNCT MATER, V25, P3057, DOI 10.1002/adfm.201404053
   Cushen J, 2015, ACS APPL MATER INTER, V7, P13476, DOI 10.1021/acsami.5b02481
   Cushen JD, 2014, J POLYM SCI POL PHYS, V52, P36, DOI 10.1002/polb.23408
   DAI KH, 1994, POLYMER, V35, P157, DOI 10.1016/0032-3861(94)90065-5
   Delgadillo PAR, 2012, J MICRO-NANOLITH MEM, V11, DOI 10.1117/1.JMM.11.3.031302
   Delgadillo PAR, 2012, J PHOTOPOLYM SCI TEC, V25, P77, DOI 10.2494/photopolymer.25.77
   Edwards EW, 2007, MACROMOLECULES, V40, P90, DOI 10.1021/ma0607564
   Edwards EW, 2004, ADV MATER, V16, P1315, DOI 10.1002/adma.200400763
   FREDRICKSON GH, 1989, MACROMOLECULES, V22, P1238, DOI 10.1021/ma00193a040
   FREDRICKSON GH, 1987, J CHEM PHYS, V87, P697, DOI 10.1063/1.453566
   Gu XD, 2014, ADV MATER, V26, P273, DOI 10.1002/adma.201302562
   HELFAND E, 1976, MACROMOLECULES, V9, P879, DOI 10.1021/ma60054a001
   Hur SM, 2015, ACS MACRO LETT, V4, P11, DOI 10.1021/mz500705q
   Ji S, 2008, MACROMOLECULES, V41, P9098, DOI 10.1021/ma801861h
   Jung YS, 2007, NANO LETT, V7, P2046, DOI 10.1021/nl070924l
   Jung YS, 2010, NANO LETT, V10, P1000, DOI 10.1021/nl904141r
   Kim S, 2013, ACS NANO, V7, P9905, DOI 10.1021/nn403616r
   Kim S, 2012, ACS MACRO LETT, V1, P11, DOI 10.1021/mz2000169
   Kim SH, 2004, ADV MATER, V16, P226, DOI 10.1002/adma.200304906
   Liu CC, 2013, MACROMOLECULES, V46, P1415, DOI 10.1021/ma302464n
   Liu CC, 2011, J VAC SCI TECHNOL B, V29, DOI 10.1116/1.3644341
   Liu CC, 2011, MACROMOLECULES, V44, P1876, DOI 10.1021/ma102856t
   Lodge TP, 2003, MACROMOLECULES, V36, P816, DOI 10.1021/ma0209601
   LODGE TP, 1995, J POLYM SCI POL PHYS, V33, P2289, DOI 10.1002/polb.1995.090331614
   MATSEN MW, 1994, MACROMOLECULES, V27, P187, DOI 10.1021/ma00079a027
   Matsen MW, 1999, J CHEM PHYS, V111, P7139, DOI 10.1063/1.480006
   MILNER ST, 1994, MACROMOLECULES, V27, P2333, DOI 10.1021/ma00086a057
   Mori K, 2001, POLYMER, V42, P3009, DOI 10.1016/S0032-3861(00)00663-7
   Paik MY, 2010, MACROMOLECULES, V43, P4253, DOI 10.1021/ma902646t
   Park S, 2009, SCIENCE, V323, P1030, DOI 10.1126/science.1168108
   Read DT, 1996, J RES NATL INST STAN, V101, P47, DOI 10.6028/jres.101.007
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Ruiz R, 2012, J VAC SCI TECHNOL B, V30, DOI 10.1116/1.4758773
   Schulz MF, 1996, MACROMOLECULES, V29, P2857, DOI 10.1021/ma951714a
   Sinturel C, 2013, MACROMOLECULES, V46, P5399, DOI 10.1021/ma400735a
   Sun ZW, 2015, ADV MATER, V27, P4364, DOI 10.1002/adma.201501585
   Tada Y, 2012, MACROMOLECULES, V45, P292, DOI 10.1021/ma201822a
   Tseng YC, 2011, J PHYS CHEM C, V115, P17725, DOI 10.1021/jp205532e
   Vora A, 2014, J PHOTOPOLYM SCI TEC, V27, P419
   Wan L, 2016, SOFT MATTER, V12, P2914, DOI 10.1039/c5sm02829a
   Williamson LD, 2016, ACS APPL MATER INTER, V8, P2704, DOI [10.1021/acsami.5b10562, 10.1021/acsami.5610562]
   Yi H, 2012, ADV MATER, V24, P3107, DOI 10.1002/adma.201200265
   Yoshida H, 2013, J PHOTOPOLYM SCI TEC, V26, P55
   Zhang JQ, 2016, NANO LETT, V16, P728, DOI 10.1021/acs.nanolett.5b04602
   Nealey P. F., 2016, U. S. Patent, Patent No. [9,299,381, 9299381]
NR 52
TC 3
Z9 3
U1 36
U2 59
PU AMER CHEMICAL SOC
PI WASHINGTON
PA 1155 16TH ST, NW, WASHINGTON, DC 20036 USA
SN 1936-0851
EI 1936-086X
J9 ACS NANO
JI ACS Nano
PD AUG
PY 2016
VL 10
IS 8
BP 7855
EP 7865
DI 10.1021/acsnano.6b03667
PG 11
WC Chemistry, Multidisciplinary; Chemistry, Physical; Nanoscience &
   Nanotechnology; Materials Science, Multidisciplinary
SC Chemistry; Science & Technology - Other Topics; Materials Science
GA DU1HP
UT WOS:000381959100069
PM 27482932
ER

PT J
AU Jia, R
   Yang, HG
   Lin, CY
   Chen, R
   Wang, XG
   Guo, ZH
AF Jia, Rui
   Yang, Hai-Gang
   Lin, Colin Yu
   Chen, Rui
   Wang, Xin-Gang
   Guo, Zhen-Hong
TI A Computationally Efficient Reconfigurable FIR Filter Architecture Based
   on Coefficient Occurrence Probability
SO IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND
   SYSTEMS
LA English
DT Article
DE Architecture design; canonic signed digit (CSD); digital front-end;
   reconfigurable finite-impulse response (FIR) filter; statistical
   analysis; synthesis
ID COMMON SUBEXPRESSION ELIMINATION; LOW-COMPLEXITY; HIGH-SPEED; LOW-POWER;
   MULTIPLIER BLOCKS; RADIO RECEIVERS; DIGITAL-FILTERS; ALGORITHM; DESIGN;
   IMPLEMENTATION
AB Reconfigurable digital filter is being widely used in applications such as communication and signal processing. Its performance, power consumption, and logic resource utilization are the major factors to be taken into consideration when designing the filters. This paper proposes a concise canonic signed digit coefficient grouping method aiming at reducing the number of common subexpressions (CSs). Further, we statistically analyze every CS occurance for numerous sorts of the finite-impulse response (FIR) filters and obtain characterization of the distribution behavior for all the possible CS patterns in a 16-bit coefficient. Thus, a novel processing element structure is proposed to form a medium-grain array for computationally efficient realization of reconfigurable FIR filter. The experiment results suggest such design implementations typically achieve 21% reduction in silicon area, 20% decrease in power consumption, and 14% improvement in operation speed in comparison to other conventional FIR architectures.
C1 [Jia, Rui; Yang, Hai-Gang; Lin, Colin Yu; Chen, Rui; Wang, Xin-Gang; Guo, Zhen-Hong] Chinese Acad Sci, Inst Elect, Syst Programmable Chip Res Dept, Beijing 100190, Peoples R China.
RP Yang, HG (reprint author), Chinese Acad Sci, Inst Elect, Syst Programmable Chip Res Dept, Beijing 100190, Peoples R China.
EM yanghg@mail.ie.ac.cn
FU National Natural Science Foundation of China [61271149, 61404140]
FX This work was supported by the National Natural Science Foundation of
   China under Grant 61271149 and Grant 61404140. This paper was
   recommended by Associate Editor A. Macii. (Corresponding author:
   Hai-Gang Yang.)
CR Avizienis A., 1961, Institute of Radio Engineers Transactions on Electronic Computers, VEC-10, P389
   Chen JJ, 2015, IEEE T CIRCUITS-I, V62, P224, DOI 10.1109/TCSI.2014.2348072
   Chen JJ, 2009, IEEE T COMPUT AID D, V28, P1844, DOI 10.1109/TCAD.2009.2030446
   Chen KH, 2006, IEEE T CIRCUITS-II, V53, P617, DOI 10.1109/TCSII.2006.875373
   Chen TY, 2011, IEEE SIGNAL PROC LET, V18, P427, DOI 10.1109/LSP.2011.2148713
   Chenghuan X., 2003, P 5 INT C APPL SPEC, V2, P783
   Darak SJ, 2014, IEEE T VLSI SYST, V22, P1202, DOI 10.1109/TVLSI.2013.2263813
   Demirsoy SS, 2004, CONF REC ASILOMAR C, P461
   Demirsoy S.S., 2003, P INT S CIRC SYST IS, V4
   DEMPSTER AG, 1995, IEEE T CIRCUITS-II, V42, P569, DOI 10.1109/82.466647
   Ding WA, 2015, IEEE INT SYMP CIRC S, P2960, DOI 10.1109/ISCAS.2015.7169308
   Grayver E., 2000, P IEEE ISCAS MAY, V5, P341
   Hartley RI, 1996, IEEE T CIRCUITS-II, V43, P677, DOI 10.1109/82.539000
   Hatai I, 2015, IEEE T CIRCUITS-I, V62, P1071, DOI 10.1109/TCSI.2015.2388838
   Hautala I., 2013, P IEEE INT C AC SPEE, P2664
   Hentschel T., 1999, CDMA TECHNIQUES 3 GE, P257
   Lee SJ, 2011, IEEE T VLSI SYST, V19, P2221, DOI 10.1109/TVLSI.2010.2088142
   Mahesh R, 2008, IEEE T COMPUT AID D, V27, P217, DOI 10.1109/TCAD.2007.907064
   Mahesh R, 2011, IEEE T AERO ELEC SYS, V47, P1241, DOI 10.1109/TAES.2011.5751255
   Mahesh R, 2010, IEEE T COMPUT AID D, V29, P275, DOI 10.1109/TCAD.2009.2035548
   Martinez-Peiro M, 2002, IEEE T CIRCUITS-II, V49, P196, DOI 10.1109/TCSII.2002.1013866
   Moreano N, 2005, IEEE T COMPUT AID D, V24, P969, DOI 10.1109/TCAD.2005.850844
   Norberg EJ, 2011, J LIGHTWAVE TECHNOL, V29, P1611, DOI 10.1109/JLT.2011.2134073
   Pan Y, 2014, IEEE T CIRCUITS-I, V61, P455, DOI 10.1109/TCSI.2013.2278331
   Park J, 2004, IEEE J SOLID-ST CIRC, V39, P348, DOI 10.1109/JSSC.2003.821785
   Pasko R, 1999, IEEE T COMPUT AID D, V18, P58, DOI 10.1109/43.739059
   Potkonjak M, 1996, IEEE T COMPUT AID D, V15, P151, DOI 10.1109/43.486662
   Rissa T, 2002, 2002 IEEE INTERNATIONAL CONFERENCE ON FIELD-PROGRAMMABLE TECHNOLOGY (FPT), PROCEEDINGS, P52, DOI 10.1109/FPT.2002.1188664
   Sadeghipour KD, 2011, IEICE ELECTRON EXPR, V8, P902, DOI 10.1587/elex.8.902
   Smitha KG, 2012, J SIGNAL PROCESS SYS, V67, P229, DOI 10.1007/s11265-010-0549-7
   Tang ZW, 2002, IEEE T CONSUM ELECTR, V48, P834, DOI 10.1109/TCE.2003.1196409
   Vinod AP, 2006, IEEE T WIREL COMMUN, V5, P1669, DOI [10.1109/TWC.2006.1673078, 10.1109/TWC.2006.03582]
   Wang Y, 2005, IEEE T CIRCUITS-I, V52, P1845, DOI 10.1109/TCSI.2005.852208
   Yao CY, 2014, IEEE T CIRCUITS-I, V61, P202, DOI 10.1109/TCSI.2013.2268551
NR 34
TC 0
Z9 0
U1 4
U2 8
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0278-0070
EI 1937-4151
J9 IEEE T COMPUT AID D
JI IEEE Trans. Comput-Aided Des. Integr. Circuits Syst.
PD AUG
PY 2016
VL 35
IS 8
BP 1297
EP 1308
DI 10.1109/TCAD.2015.2504922
PG 12
WC Computer Science, Hardware & Architecture; Computer Science,
   Interdisciplinary Applications; Engineering, Electrical & Electronic
SC Computer Science; Engineering
GA DR7EB
UT WOS:000380061700006
ER

PT J
AU Tacchi, S
   Pini, MG
   Rettori, A
   Varvaro, G
   di Bona, A
   Valeri, S
   Albertini, F
   Lupo, P
   Casoli, F
AF Tacchi, S.
   Pini, M. G.
   Rettori, A.
   Varvaro, G.
   di Bona, A.
   Valeri, S.
   Albertini, F.
   Lupo, P.
   Casoli, F.
TI Tunable spin-wave frequency gap in anisotropy-graded FePt films obtained
   by ion irradiation
SO PHYSICAL REVIEW B
LA English
DT Article
ID EXCHANGE-COUPLED COMPOSITE; BIT PATTERNED MEDIA; ROTATABLE ANISOTROPY;
   THIN-FILMS; PERPENDICULAR ANISOTROPY; RECORDING MEDIA; MAGNETIC-FILMS;
   L1(0) FEPT; NI-FE; MULTILAYERS
AB The effect of graded anisotropy on static and dynamic magnetic properties of Ar+-irradiated FePt films has been investigated by static magnetometry, magnetic force microscopy, and Brillouin light scattering from thermally excited spin waves. A gradual variation of magnetic anisotropy with film thickness was obtained by Ar+ irradiation. The irradiation incidence angle influences the anisotropy profile: on decreasing a, a decreasing thickness of the hard L1(0) phase and an increasing thickness of the soft A1 phase were obtained. Accordingly, the zero-field spin-wave frequency gap was found to decrease. In the sample with the highest soft-phase thickness the spin-wave frequency gap takes a substantial value (nu(0) approximate to 6 GHz), which could be reproduced assuming the presence of a nonzero "rotatable" anisotropy (i.e., any direction in the film plane can be established as the easy axis by the application of a saturating magnetic field along this direction). The hypothesis is supported by both magnetometry and magnetic force microscopy data.
C1 [Tacchi, S.] Univ Perugia, Dipartimento Fis & Geol, Unita Perugia, CNR,IOM, I-06123 Perugia, Italy.
   [Pini, M. G.] CNR, ISC, Unita Firenze, I-50019 Sesto Fiorentino, FI, Italy.
   [Rettori, A.] Univ Florence, Dipartimento Fis & Astron, I-50019 Sesto Fiorentino, FI, Italy.
   [Rettori, A.; di Bona, A.; Valeri, S.] CNR, NANO, Ist Nanosci, Via Campi 213-A, I-41125 Modena, Italy.
   [Varvaro, G.] CNR, ISM, Area Ric Roma 1, I-00015 Rome, Italy.
   [Valeri, S.] Univ Modena & Reggio Emilia, Dipartimento Sci Fis Informat & Matemat, Via Campi 213-A, I-41125 Modena, Italy.
   [Albertini, F.; Casoli, F.] CNR, IMEM, I-43124 Parma, Italy.
   [Lupo, P.] Natl Univ Singapore, Dept Elect & Comp Engn, Informat Storage Mat Lab, 1 Engn Dr 3, Singapore 1175766, Singapore.
RP Casoli, F (reprint author), CNR, IMEM, I-43124 Parma, Italy.
EM casoli@imem.cnr.it
RI Valeri, Sergio/O-2806-2016; Casoli, Francesca/A-7043-2012
OI Valeri, Sergio/0000-0002-2975-3933; Casoli,
   Francesca/0000-0002-4323-0362
FU Italian Ministero dell'Istruzione, dell'Universita e della Ricerca,
   under PRIN Project [20084LFC29, 2010ECA8P3]
FX We acknowledge financial support by the Italian Ministero
   dell'Istruzione, dell'Universita e della Ricerca, under PRIN2008 Project
   No. 20084LFC29 and PRIN2010 Project No. 2010ECA8P3.
CR Abes M, 2006, MAT SCI ENG B-SOLID, V126, P207, DOI 10.1016/j.mseb.2005.09.030
   Abes M, 2004, J APPL PHYS, V96, P7420, DOI 10.1063/1.1807522
   Albertini F, 2008, J APPL PHYS, V104, DOI [10.1063/1.2975217, 10.1063/1.2975247]
   Albrecht TR, 2013, IEEE T MAGN, V49, P773, DOI 10.1109/TMAG.2012.2227303
   Alexandrakis V, 2011, J APPL PHYS, V109, DOI 10.1063/1.3556773
   AlvarezPrado LM, 1997, PHYS REV B, V56, P3306, DOI 10.1103/PhysRevB.56.3306
   Amato M, 1999, PHYS REV B, V60, P3414, DOI 10.1103/PhysRevB.60.3414
   Barturen M, 2012, APPL PHYS LETT, V101, DOI 10.1063/1.4748122
   Barturen M, 2013, EUR PHYS J B, V86, DOI 10.1140/epjb/e2013-30678-2
   Blachowicz T, 2007, PHYS REV B, V75, DOI 10.1103/PhysRevB.75.054425
   Bonanni V, 2010, APPL PHYS LETT, V97, DOI 10.1063/1.3515907
   Carlotti G, 1999, RIV NUOVO CIMENTO, V22, P1, DOI 10.1007/BF02872273
   Casoli F, 2015, J APPL PHYS, V117, DOI 10.1063/1.4913292
   Casoli F., 2016, ULTRAHIGH DENSITY MA, P279
   Cebollada A., 2002, MAGNETIC NANOSTRUCTU, P93
   Chai GZ, 2012, SCI REP-UK, V2, DOI 10.1038/srep00832
   Chang LV, 2012, NANOTECHNOLOGY, V23, DOI 10.1088/0957-4484/23/27/275705
   Chiang CC, 2011, APPL PHYS LETT, V99, DOI 10.1063/1.3664129
   di Bona A, 2013, ACTA MATER, V61, P4840, DOI 10.1016/j.actamat.2013.04.064
   FUJIWARA H, 1964, APPL PHYS LETT, V4, P199, DOI 10.1063/1.1753938
   Gaur N, 2011, J APPL PHYS, V110, DOI 10.1063/1.3653823
   Goll D, 2008, J APPL PHYS, V104, DOI 10.1063/1.2999337
   Guarisco D, 2003, J APPL PHYS, V93, P6745, DOI 10.1063/1.1557713
   Gubbiotti G, 1998, J PHYS-CONDENS MAT, V10, P2171, DOI 10.1088/0953-8984/10/9/019
   Hasegawa T, 2006, J APPL PHYS, V99, DOI 10.1063/1.2177382
   Hubert A., 1998, MAGNETIC DOMAINS ANA
   Kirby BJ, 2010, PHYS REV B, V81, DOI 10.1103/PhysRevB.81.100405
   KNELLER EF, 1991, IEEE T MAGN, V27, P3588, DOI 10.1109/20.102931
   Krone P, 2010, APPL PHYS LETT, V97, DOI 10.1063/1.3481668
   LEHRER SS, 1963, J APPL PHYS, V34, P1207, DOI 10.1063/1.1729437
   Makarov D, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3309417
   McDaniel TW, 2005, J PHYS-CONDENS MAT, V17, pR315, DOI 10.1088/0953-8984/17/7/R01
   Okamoto S, 2002, PHYS REV B, V66, DOI 10.1103/PhysRevB.66.024413
   Prosen R.J., 1961, Journal of Applied Physics, V32, p91S, DOI 10.1063/1.2000512
   RAMESH M, 1988, J MAGN MAGN MATER, V74, P123, DOI 10.1016/0304-8853(88)90058-3
   Rong CB, 2006, ADV MATER, V18, P2984, DOI 10.1002/adma.200601904
   Rottmayer RE, 2006, IEEE T MAGN, V42, P2417, DOI 10.1109/TMAG.2006.879572
   Leva ES, 2010, PHYS REV B, V82, DOI 10.1103/PhysRevB.82.144410
   Shiroishi Y, 2009, IEEE T MAGN, V45, P3816, DOI 10.1109/TMAG.2009.2024879
   SPAIN RJ, 1963, APPL PHYS LETT, V3, P208, DOI 10.1063/1.1753851
   Stamps RL, 2014, J PHYS D APPL PHYS, V47, DOI 10.1088/0022-3727/47/33/333001
   Suess D, 2006, APPL PHYS LETT, V89, DOI 10.1063/1.2347894
   Suess D, 2005, J MAGN MAGN MATER, V290, P551, DOI 10.1016/j.jmmm.2004.11.525
   Suess D, 2009, J MAGN MAGN MATER, V321, P545, DOI 10.1016/j.jmmm.2008.06.041
   Suess D, 2005, APPL PHYS LETT, V87, DOI 10.1063/1.1951053
   Tacchi S, 2014, J PHYS D APPL PHYS, V47, DOI 10.1088/0022-3727/47/49/495004
   Tacchi S, 2014, PHYS REV B, V89, DOI 10.1103/PhysRevB.89.024411
   Tacchi S, 2013, PHYS REV B, V87, DOI 10.1103/PhysRevB.87.144426
   Terris BD, 2000, J APPL PHYS, V87, P7004, DOI 10.1063/1.372912
   TRALLORI L, 1994, PHYS REV LETT, V72, P1925, DOI 10.1103/PhysRevLett.72.1925
   Trallori L, 1996, INT J MOD PHYS B, V10, P1935, DOI 10.1142/S021797929600088X
   Varvaro G, 2014, J MAGN MAGN MATER, V368, P415, DOI 10.1016/j.jmmm.2014.04.058
   Varvaro G, 2012, NEW J PHYS, V14, DOI 10.1088/1367-2630/14/7/073008
   Victora RH, 2005, IEEE T MAGN, V41, P2828, DOI 10.1109/TMAG.2005.855263
   Victora RH, 2005, IEEE T MAGN, V41, P537, DOI 10.1109/TMAG.2004.838075
   Wan J, 2010, J MAGN MAGN MATER, V322, P1811, DOI 10.1016/j.jmmm.2009.12.032
   Wang H, 2013, IEEE T MAGN, V49, P707, DOI 10.1109/TMAG.2012.2230155
   Wang JP, 2005, IEEE T MAGN, V41, P3181, DOI 10.1109/TMAG.2005.855278
   Weller D, 2013, PHYS STATUS SOLIDI A, V210, P1245, DOI 10.1002/pssa.201329106
   Yuan FT, 2012, J APPL PHYS, V111, DOI 10.1063/1.3679382
   Zha CL, 2010, APPL PHYS LETT, V97, DOI 10.1063/1.3505521
   Zhang J, 2013, APPL PHYS LETT, V102, DOI 10.1063/1.4802245
   Zhou TJ, 2009, APPL PHYS LETT, V94, DOI 10.1063/1.3116623
NR 63
TC 0
Z9 0
U1 5
U2 7
PU AMER PHYSICAL SOC
PI COLLEGE PK
PA ONE PHYSICS ELLIPSE, COLLEGE PK, MD 20740-3844 USA
SN 2469-9950
EI 2469-9969
J9 PHYS REV B
JI Phys. Rev. B
PD JUL 25
PY 2016
VL 94
IS 2
AR 024432
DI 10.1103/PhysRevB.94.024432
PG 8
WC Physics, Condensed Matter
SC Physics
GA DT4VI
UT WOS:000381478900006
ER

PT J
AU Kovacs, A
   Oezelt, H
   Schabes, ME
   Schrefl, T
AF Kovacs, A.
   Oezelt, H.
   Schabes, M. E.
   Schrefl, T.
TI Numerical optimization of writer and media for bit patterned magnetic
   recording
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article
ID DESIGNS
AB In this work, we present a micromagnetic study of the performance potential of bit-patterned (BP) magnetic recording media via joint optimization of the design of the media and of the magnetic write heads. Because the design space is large and complex, we developed a novel computational framework suitable for parallel implementation on compute clusters. Our technique combines advanced global optimization algorithms and finite-element micromagnetic solvers. Targeting data bit densities of 4 Tb/in(2), we optimize designs for centered, staggered, and shingled BP writing. The magnetization dynamics of the switching of the exchange-coupled composite BP islands of the media is treated micromagnetically. Our simulation framework takes into account not only the dynamics of on-track errors but also the thermally induced adjacent-track erasure. With co-optimized write heads, the results show superior performance of shingled BP magnetic recording where we identify two particular designs achieving write bit-error rates of 1.5 x 10(-8) and 8.4 x 10(-8), respectively. A detailed description of the key design features of these designs is provided and contrasted with centered and staggered BP designs which yielded write bit error rates of only 2.8 x 10(-3) (centered design) and 1.7 x 10(-2) (staggered design) even under optimized conditions. Published by AIP Publishing.
C1 [Kovacs, A.; Oezelt, H.; Schrefl, T.] Danube Univ Krems, Ctr Integrated Sensor Syst, A-2700 Wiener Neustadt, Austria.
   [Schabes, M. E.] Spin Transfer Technol, 45500 Northport Loop West, Fremont, CA 94538 USA.
RP Kovacs, A (reprint author), Danube Univ Krems, Ctr Integrated Sensor Syst, A-2700 Wiener Neustadt, Austria.
EM alexander.kovacs@donau-uni.ac.at
OI Ozelt, Harald/0000-0002-3754-3565
FU ASTC/IDEMA; Austrian Science Fund (FWF) [I821]; Vienna Science and
   Technology Fund (WWTF) [MA14-044]
FX We acknowledge the financial support from ASTC/IDEMA, the Austrian
   Science Fund (FWF Project No. I821), and the Vienna Science and
   Technology Fund (WWTF Grant No. MA14-044).
CR Adams B. M., 2015, SAND20144633
   Bashir MA, 2012, J MAGN MAGN MATER, V324, P269, DOI 10.1016/j.jmmm.2010.11.081
   Damblin G, 2013, J SIMUL, V7, P276, DOI 10.1057/jos.2013.16
   Dean J, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2905292
   Dong Y, 2012, J APPL PHYS, V111, DOI 10.1063/1.3675152
   Fukuda H, 2012, IEEE T MAGN, V48, P3895, DOI 10.1109/TMAG.2012.2197813
   Jones DR, 1998, J GLOBAL OPTIM, V13, P455, DOI 10.1023/A:1008306431147
   Kalezhi J, 2012, J APPL PHYS, V111, DOI 10.1063/1.3691947
   Kovacs A, 2014, J APPL PHYS, V115, DOI 10.1063/1.4859055
   Kryder MH, 2005, J MAGN MAGN MATER, V287, P449, DOI 10.1016/j.jmmm.2004.10.075
   Muraoka Hiroaki, 2008, IEEE Transactions on Magnetics, V44, P3423, DOI 10.1109/TMAG.2008.2001654
   Muraoka H, 2011, IEEE T MAGN, V47, P26, DOI 10.1109/TMAG.2010.2080354
   PARK JS, 1994, J STAT PLAN INFER, V39, P95, DOI 10.1016/0378-3758(94)90115-5
   Richter HJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2209179
   Richter HJ, 1999, IEEE T MAGN, V35, P2790, DOI 10.1109/20.800987
   Schabes ME, 2008, J MAGN MAGN MATER, V320, P2880, DOI 10.1016/j.jmmm.2008.07.035
   Schrefl T, 2005, IEEE T MAGN, V41, P3064, DOI 10.1109/TMAG.2005.855227
   Shen X, 2008, J APPL PHYS, V103, DOI 10.1063/1.2838289
   Terris BD, 2005, IEEE T MAGN, V41, P2822, DOI 10.1109/TMAG.2005.855264
   Tsiantos VD, 2003, J APPL PHYS, V93, P8576, DOI 10.1063/1.1557853
   Wood R, 2000, IEEE T MAGN, V36, P36, DOI 10.1109/20.824422
NR 21
TC 1
Z9 1
U1 2
U2 7
PU AMER INST PHYSICS
PI MELVILLE
PA 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
SN 0021-8979
EI 1089-7550
J9 J APPL PHYS
JI J. Appl. Phys.
PD JUL 7
PY 2016
VL 120
IS 1
AR 013902
DI 10.1063/1.4954888
PG 7
WC Physics, Applied
SC Physics
GA DR0FR
UT WOS:000379583900006
ER

PT J
AU Tipcharoen, W
   Warisarn, C
   Kaewrawang, A
   Kovintavewat, P
AF Tipcharoen, Warunee
   Warisarn, Chanon
   Kaewrawang, Arkom
   Kovintavewat, Piya
TI Effect of hotspot position fluctuation to writing capability in
   heated-dot magnetic recording
SO JAPANESE JOURNAL OF APPLIED PHYSICS
LA English
DT Article; Proceedings Paper
CT 15th Magnetics and Optics Research International Symposium (MORIS)
CY NOV 29-DEC 02, 2015
CL Toyohashi Univ Technol, Penang, MALAYSIA
SP Japan Soc Promot Sci, 147th Comm Amorphous & Nano Crystalline Mat, Magnet Soc Japan, Japan Soc Appl Phys, IEEE Magnet Soc, IEEE Magnet Soc Japan Chapter, Phys Soc Japan, Inst Elect, Informat & Commun Engineers, Inst Image Informat & Televis Engineers, Inst Elect Engineers Japan, Opt Soc Japan, Japan Optomechatron Assoc
HO Toyohashi Univ Technol
ID MEDIA; FILMS
AB This work presents the effect of hotspot position fluctuation to writing capability in heated-dot magnetic recording systems at an areal density ( AD) beyond 2 Tbpsi via a micromagnetic modeling. At high ADs, the hotspot and the write field gradient may not be correctly focused on the target island because the bit islands are closely positioned to one another. This may lead to the overwriting/erasing of the previously written islands, which can severely affect the recording performance. Therefore, this work studies the 3-by-3 data patterns that easily cause an error when the hotspot and write head positions are fluctuated by various island pitches. Simulation results indicate that the data pattern that leads to the highest/ lowest error occurrence frequency is the one with the first, second and fourth islands having the opposite/same magnetization direction to/as the write field, regardless of the magnetization direction of the third island. This result can, for example, be utilized to design a two-dimensional modulation code to prevent such destructive data patterns, thus helping enhance the overall system performance. (C) 2016 The Japan Society of Applied Physics
C1 [Tipcharoen, Warunee; Warisarn, Chanon] King Mongkuts Inst Technol Ladkrabang, Coll Data Storage Innovat, Bangkok 10520, Thailand.
   [Kaewrawang, Arkom] Khon Kaen Univ, Magnet Mat & Data Storage Res Lab, Khon Kaen 40002, Thailand.
   [Kovintavewat, Piya] Nakhon Pathom Rajabhat Univ, Data Storage Technol Res Ctr, Nakhon Pathom 73000, Thailand.
RP Warisarn, C (reprint author), King Mongkuts Inst Technol Ladkrabang, Coll Data Storage Innovat, Bangkok 10520, Thailand.; Kovintavewat, P (reprint author), Nakhon Pathom Rajabhat Univ, Data Storage Technol Res Ctr, Nakhon Pathom 73000, Thailand.
EM chanon.wa@kmitl.ac.th; piya@npru.ac.th
FU College of Data Storage Innovation KMITL, Thailand Research Fund (TRF);
   Research and Development Institute, Nakhon Pathom Rajabhat University,
   Thailand
FX This work was supported in part by College of Data Storage Innovation
   KMITL, Thailand Research Fund (TRF), and in part by Research and
   Development Institute, Nakhon Pathom Rajabhat University, Thailand.
CR Akagi F, 2007, J APPL PHYS, V101, DOI 10.1063/1.2710546
   Akagi F, 2012, J MAGN MAGN MATER, V324, P309, DOI 10.1016/j.jmmm.2010.11.082
   Arrayangkool A, 2015, J APPL PHYS, V117, DOI 10.1063/1.4913894
   Chan KS, 2009, IEEE T MAGN, V45, P3837, DOI 10.1109/TMAG.2009.2024001
   Chen YJ, 2015, J APPL PHYS, V117, DOI 10.1063/1.4914362
   Donahue M, 1999, 6376 NISTIR
   Evans RFL, 2012, APPL PHYS LETT, V100, DOI 10.1063/1.3691196
   Ghoreyshi A, 2014, J APPL PHYS, V115, DOI 10.1063/1.4864243
   Kryder MH, 2008, P IEEE, V96, P1810, DOI 10.1109/JPROC.2008.2004315
   Lim F, 2010, IEEE T MAGN, V46, P1548, DOI 10.1109/TMAG.2009.2038281
   Miltat J. E., 2007, HDB MAGNETISM ADV MA, P742
   Niarchos D, 2003, SENSOR ACTUAT A-PHYS, V109, P165, DOI 10.1016/j.sna.2003.09.009
   Okamoto S, 2002, PHYS REV B, V66, DOI 10.1103/PhysRevB.66.024413
   Piramanayagam SN, 2007, J APPL PHYS, V102, DOI 10.1063/1.2750414
   Richter HJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2209179
   Rottmayer RE, 2006, IEEE T MAGN, V42, P2417, DOI 10.1109/TMAG.2006.879572
   Schrelf T., 2006, HDB ADV MAGNETIC MAT, P129
   Shiroishi Y, 2009, IEEE T MAGN, V45, P3816, DOI 10.1109/TMAG.2009.2024879
   Thiele JU, 2003, APPL PHYS LETT, V82, P2859, DOI 10.1063/1.1571232
   Thiele JU, 2002, J APPL PHYS, V91, P6595, DOI 10.1063/1.1470254
   Tipcharoen W., 2015, ADV MATER SCI ENG, V2015
   Wang F, 2014, CHINESE PHYS B, V23, DOI 10.1088/1674-1056/23/3/036802
   Wang Y, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2015.2437875
   Weller D, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2013.2281027
   Wood R, 2001, J MAGN MAGN MATER, V235, P1, DOI 10.1016/S0304-8853(01)00290-6
   Wood R, 2009, J MAGN MAGN MATER, V321, P555, DOI 10.1016/j.jmmm.2008.07.027
   Xu BX, 2012, J APPL PHYS, V111, DOI 10.1063/1.3671421
   Xu BX, 2013, IEEE T MAGN, V49, P2559, DOI 10.1109/TMAG.2013.2257703
   Yamashita M, 2012, IEEE T MAGN, V48, P4586, DOI 10.1109/TMAG.2012.2194988
   Yamashita M, 2012, J APPL PHYS, V111, DOI 10.1063/1.3680535
   Ye HB, 2002, IEEE T MAGN, V38, P2180, DOI 10.1109/TMAG.2002.801859
   Zhang J, 2012, J APPL PHYS, V111, DOI 10.1063/1.3702876
NR 32
TC 1
Z9 1
U1 1
U2 1
PU IOP PUBLISHING LTD
PI BRISTOL
PA TEMPLE CIRCUS, TEMPLE WAY, BRISTOL BS1 6BE, ENGLAND
SN 0021-4922
EI 1347-4065
J9 JPN J APPL PHYS
JI Jpn. J. Appl. Phys.
PD JUL
PY 2016
VL 55
IS 7
SI 3
AR 07MB01
DI 10.7567/JJAP.55.07MB01
PG 4
WC Physics, Applied
SC Physics
GA EJ2IP
UT WOS:000393033700015
ER

PT J
AU Lin, W
   Chang, CY
AF Lin, Wei
   Chang, Chun-Yen
TI Superior Data Retention for Sub-20 nm Triple Level Per Cell NAND Flash
   Memory by Using a Novel Data Programming Method
SO JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY
LA English
DT Article
DE NAND Flash Memory; Pattern Dependent Data Retention; eMMC; Reflow
ID ELECTRON-INJECTION SPREAD; GATE; MODEL
AB This work presents a novel data programming method for sub-20 nm triple level per cell (TLC) NAND Flash memory. The proposed method improves data retention ability and reduces the data failure rate of Embedded Multi Media Card (eMMC) during the high temperature reflow of surface mount technology (SMT). More than owing to the high temperature stress, the failure is closely related to the data pattern of the adjacent cell array. The proposed data programming method generates an optimized dummy data pattern based on the data of the last data word line (WL) and, then, programs the optimized dummy data pattern to the word line next to the data edge one to suppress the abrupt electrical potential energy drops caused by the erase data. The graded electrical potential energy can thus reduce the electric field and electron tunneling probability. Furthermore, the row bit error rate (RBER) with the high temperature stress of the last data word line can be reduced 85% by using the novel data programming method. This work also attempts to identify the root cause of the temperature and adjacent data pattern dependent retention by measuring and performing statistical analysis of a sub-20 nm TLC NAND Flash memory chip. 3D numerical simulation with comprehensive quantum tunneling models is also conducted to facilitate the theoretical analysis. Statistical and numerical analysis results indicate that a severe threshold voltage (Vth) shift of the memory cell occurs when the adjacent floating gate (FG) has both high and low Vth states. Above results demonstrate the feasibility of the proposed data programming method in generating the optimized dummy data pattern.
C1 [Lin, Wei; Chang, Chun-Yen] Natl Chiao Tung Univ, Dept Elect Engn, Hsinchu 30010, Taiwan.
RP Chang, CY (reprint author), Natl Chiao Tung Univ, Dept Elect Engn, Hsinchu 30010, Taiwan.
CR Bae S., 2009, T ELECT DEVICES, V53, P1624
   Cho B., 2011, INT MEM WORKSH MONT, P1
   Compagnoni CM, 2008, IEEE T ELECTRON DEV, V55, P3192, DOI 10.1109/TED.2008.2003332
   Compagnoni CM, 2010, IEEE ELECTR DEVICE L, V31, P1196, DOI 10.1109/LED.2010.2066253
   Compagnoni CM, 2009, IEEE ELECTR DEVICE L, V30, P769, DOI 10.1109/LED.2009.2021494
   Goda A., 2007, IEDM, P211
   Ieong M, 1998, INTERNATIONAL ELECTRON DEVICES MEETING 1998 - TECHNICAL DIGEST, P733, DOI 10.1109/IEDM.1998.746461
   Jimenez-Molinos F, 2002, J APPL PHYS, V91, P5116, DOI 10.1063/1.1461062
   Joe S., 2010, ELECT DEVICE LETT, V31, P635
   Lee J., 2002, ELECT DEVICE LETT, V23, P264
   Li F., 2003, DEV RES C SALT LAK C, P47
   Molas G., 2004, IEDM, P887
   Palma A, 1997, PHYS REV B, V56, P9565, DOI 10.1103/PhysRevB.56.9565
   Park M., 2009, ELECT DEVICE LETT, V30, P174
   Quader K. N., 2012, INT MEM WORKSH MIL I, P1
   Register LF, 1999, APPL PHYS LETT, V74, P457, DOI 10.1063/1.123060
   Seidel K, 2009, NVMTS: 2009 10TH ANNUAL NON-VOLATILE MEMORY TECHNOLOGY SYMPOSIUM, P67, DOI 10.1109/NVMT.2009.5429788
NR 17
TC 0
Z9 0
U1 3
U2 3
PU AMER SCIENTIFIC PUBLISHERS
PI VALENCIA
PA 26650 THE OLD RD, STE 208, VALENCIA, CA 91381-0751 USA
SN 1533-4880
EI 1533-4899
J9 J NANOSCI NANOTECHNO
JI J. Nanosci. Nanotechnol.
PD JUL
PY 2016
VL 16
IS 7
BP 7772
EP 7778
DI 10.1166/jnn.2016.9063
PG 7
WC Chemistry, Multidisciplinary; Nanoscience & Nanotechnology; Materials
   Science, Multidisciplinary; Physics, Applied; Physics, Condensed Matter
SC Chemistry; Science & Technology - Other Topics; Materials Science;
   Physics
GA EB1HM
UT WOS:000387100400165
ER

PT J
AU Greaves, SJ
   Kanai, Y
   Muraoka, H
AF Greaves, Simon John
   Kanai, Yasushi
   Muraoka, Hiroaki
TI Microwave-Assisted Magnetic Recording on Dual-Thickness and Dual-Layer
   Bit-Patterned Media
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT 13th Joint Magnetism and Magnetic Materials (MMM)/Intermag Conference
CY JAN 11-15, 2016
CL San Diego, CA
SP Amer Inst Phys, IEEE Magnet soc
DE Bit-patterned media (BPM); micromagnetics; microwave-assisted magnetic
   recording (MAMR)
AB This paper describes how microwave-assisted magnetic recording can be used to reduce adjacent track erasure and increase areal density in dual-thickness and dual-layer bit-patterned media. By tuning the high-frequency magnetic field, selective switching of dots in different layers or dots with different thicknesses can be achieved. Offsetting arrays of dots in different layers makes it easier to detect the signal from each layer, and areal densities of 5 Tb/in(2), or more, may be possible.
C1 [Greaves, Simon John; Muraoka, Hiroaki] Tohoku Univ, Elect Commun Res Inst, Sendai, Miyagi 9808577, Japan.
   [Kanai, Yasushi] Niigata Inst Technol, Dept Informat & Elect Engn, Kashiwazaki 9451195, Japan.
RP Greaves, SJ (reprint author), Tohoku Univ, Elect Commun Res Inst, Sendai, Miyagi 9808577, Japan.
EM simon@riec.tohoku.ac.jpb
CR Greaves S, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2014.2361751
   Rivkin K, 2014, J APPL PHYS, V115, DOI 10.1063/1.4882063
   Wang JP, 2005, IEEE T MAGN, V41, P3181, DOI 10.1109/TMAG.2005.855278
   Winkler G, 2009, APPL PHYS LETT, V94, DOI 10.1063/1.3152293
   Zhu JG, 2008, IEEE T MAGN, V44, P125, DOI 10.1109/TMAG.2007.911031
NR 5
TC 2
Z9 2
U1 1
U2 1
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUL
PY 2016
VL 52
IS 7
AR 3000904
DI 10.1109/TMAG.2015.2506171
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA DR5EC
UT WOS:000379924800047
ER

PT J
AU Oshima, D
   Tanimoto, M
   Kato, T
   Fujiwara, Y
   Nakamura, T
   Kotani, Y
   Tsunashima, S
   Iwata, S
AF Oshima, D.
   Tanimoto, M.
   Kato, T.
   Fujiwara, Y.
   Nakamura, T.
   Kotani, Y.
   Tsunashima, S.
   Iwata, S.
TI Ion Irradiation-Induced Magnetic Transition of MnGa Alloy Films Studied
   by X-Ray Magnetic Circular Dichroism and Low-Temperature Hysteresis
   Loops
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT 13th Joint Magnetism and Magnetic Materials (MMM)/Intermag Conference
CY JAN 11-15, 2016
CL San Diego, CA
SP Amer Inst Phys, IEEE Magnet soc
DE Bit-patterned media (BPM); ion irradiation; MnGa; X-ray magnetic
   circular dichroism (XMCD)
ID PATTERNED MEDIA; DEPENDENCE; ANISOTROPY; FIELDS
AB The ion irradiation-induced magnetic transition of L1(0)-MnGa alloy films was studied in detail by measuring X-ray magnetic circular dichroism (XMCD) and the temperature dependence of their hysteresis loops. The XMCD of (001)-oriented MnGa films exhibited different spectral shapes depending on whether magnetization was parallel or perpendicular to the film plane; that is considered to be the origin of the large perpendicular magnetic anisotropy of the L1(0)-MnGa. The anisotropy of XMCD spectra was not influenced by the ion irradiation to the MnGa, while the intensity of the XMCD signal decreased with increasing ion dose. From the measurement of hysteresis loops at low temperature, the significant increase of coercivity H-c in the ion-irradiated MnGa was found by lowering the temperature, while only a slight increase of H-c was observed in the as-prepared MnGa. These results suggest that the ion-irradiated MnGa film has a composite structure of L1(0)-ordered MnGa nanocrystals separated by an A1-disordered MnGa matrix, and that increasing the ion dose results in an increase in the volume ratio of A1-MnGa to L1(0)-MnGa in the film.
C1 [Oshima, D.; Iwata, S.] Nagoya Univ, Inst Mat & Syst Sustainabil, Adv Measurement Technol Ctr, Nagoya, Aichi 4648603, Japan.
   [Tanimoto, M.] Nagoya Univ, Dept Quantum Engn, Nagoya, Aichi 4648603, Japan.
   [Kato, T.] Nagoya Univ, Dept Elect Engn & Comp Sci, Nagoya, Aichi 4648603, Japan.
   [Fujiwara, Y.] Mie Univ, Dept Engn Phys, Tsu, Mie 5148507, Japan.
   [Nakamura, T.; Kotani, Y.] Japan Synchrotron Radiat Res Inst, Sayo 6795198, Japan.
   [Tsunashima, S.] Nagoya Ind Sci Res Inst, Dept Res, Nagoya, Aichi 4640819, Japan.
RP Oshima, D (reprint author), Nagoya Univ, Inst Mat & Syst Sustainabil, Adv Measurement Technol Ctr, Nagoya, Aichi 4648603, Japan.
EM oshima@nuee.nagoya-u.ac.jp
RI Kato, Takeshi/I-2654-2013
CR BRUNO P, 1989, PHYS REV B, V39, P865, DOI 10.1103/PhysRevB.39.865
   CALLEN ER, 1960, J PHYS CHEM SOLIDS, V16, P310, DOI 10.1016/0022-3697(60)90161-X
   CARR WJ, 1958, PHYS REV, V109, P1971, DOI 10.1103/PhysRev.109.1971
   CARRA P, 1993, PHYS REV LETT, V70, P694, DOI 10.1103/PhysRevLett.70.694
   Chappert C, 1998, SCIENCE, V280, P1919, DOI 10.1126/science.280.5371.1919
   Ferre J, 1999, J MAGN MAGN MATER, V198-99, P191, DOI 10.1016/S0304-8853(98)01084-1
   Gaur N, 2013, SCI REP-UK, V3, DOI 10.1038/srep01907
   Hyndman R, 2001, J APPL PHYS, V90, P3843, DOI 10.1063/1.1401803
   Kato T, 2009, J APPL PHYS, V106, DOI 10.1063/1.3212967
   Kato T, 2009, J APPL PHYS, V105, DOI 10.1063/1.3072024
   Kikitsu A, 2007, IEEE T MAGN, V43, P3685, DOI 10.1109/TMAG.2007.902970
   Kota Y, 2012, J PHYS SOC JPN, V81, DOI 10.1143/JPSJ.81.084705
   Kotsugi M, 2013, J MAGN MAGN MATER, V326, P235, DOI 10.1016/j.jmmm.2012.09.008
   Okamoto S, 2002, PHYS REV B, V66, DOI 10.1103/PhysRevB.66.024413
   Oshima D, 2013, IEEE T MAGN, V49, P3608, DOI 10.1109/TMAG.2013.2249501
   Oshima D, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2014.2332975
   Oshima D, 2012, J MAGN MAGN MATER, V324, P1617, DOI 10.1016/j.jmmm.2011.12.019
   Peng QZ, 2004, IEEE T MAGN, V40, P2446, DOI 10.1109/TMAG.2004.829021
   SHARROCK MP, 1994, J APPL PHYS, V76, P6413, DOI 10.1063/1.358282
   Suharyadi E, 2006, IEEE T MAGN, V42, P2972, DOI 10.1109/TMAG.2006.880076
   Suharyadi E, 2005, IEEE T MAGN, V41, P3595, DOI 10.1109/TMAG.2005.854735
   Teramura Y, 1996, J PHYS SOC JPN, V65, P1053, DOI 10.1143/JPSJ.65.1053
   Terris BD, 1999, APPL PHYS LETT, V75, P403, DOI 10.1063/1.124389
   THOLE BT, 1992, PHYS REV LETT, V68, P1943, DOI 10.1103/PhysRevLett.68.1943
NR 24
TC 0
Z9 0
U1 5
U2 5
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUL
PY 2016
VL 52
IS 7
AR 3201804
DI 10.1109/TMAG.2016.2527050
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA DR5EC
UT WOS:000379924800069
ER

PT J
AU Suzuto, R
   Nakamura, Y
   Osawa, H
   Okamoto, Y
   Kanai, Y
   Muraoka, H
AF Suzuto, R.
   Nakamura, Y.
   Osawa, H.
   Okamoto, Y.
   Kanai, Y.
   Muraoka, H.
TI Effect of Reader Sensitivity Rotation in TDMR With Head Skew
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT 13th Joint Magnetism and Magnetic Materials (MMM)/Intermag Conference
CY JAN 11-15, 2016
CL San Diego, CA
SP Amer Inst Phys, IEEE Magnet soc
DE 2-D magnetic recording (TDMR); reader sensitivity rotation; shingled
   magnetic recording (SMR)
ID PATTERNED MEDIUM; INFORMATION; MEDIA; PMR
AB The 2-D magnetic recording (TDMR) by shingled magnetic recording (SMR) draws attention as a technology to increase the recording densities in a hard disk drive. The magnetization pattern is curved by the write field at the corner of the writer in SMR, and the information to read/write (R/W) channel performance is feared. Therefore, it is possible that the bit error rate performance is improved by fitting the reader sensitivity to the bit shape. In this paper, we evaluate the effect of reader sensitivity rotation in the TDMR R/W channel with head skew under a specification of 4 wTb/in(2) by computer simulation, applying the low-density parity-check coding and the iterative decoding system with the 2-D finite impulse response filter. The results show that the rotated reader sensitivity fits the recorded bit magnetization shape, and the error-free skew range increases to -3 degrees similar to 6 degrees. Therefore, the reader sensitivity rotation is considered to be an effective way to improve the skew margin in the TDMR system.
C1 [Suzuto, R.; Nakamura, Y.; Osawa, H.; Okamoto, Y.] Ehime Univ, Grad Sch Sci & Engn, Matsuyama, Ehime 7908577, Japan.
   [Kanai, Y.] Niigata Inst Technol, Dept Informat & Elect Engn, Kashiwazaki 9451195, Japan.
   [Muraoka, H.] Tohoku Univ, Elect Commun Res Inst, Sendai, Miyagi 9808577, Japan.
RP Suzuto, R (reprint author), Ehime Univ, Grad Sch Sci & Engn, Matsuyama, Ehime 7908577, Japan.
EM suzutou@rec.ee.ehime-u.ac.jp
CR GALLAGER RG, 1962, IRE T INFORM THEOR, V8, P21, DOI 10.1109/TIT.1962.1057683
   Hwang E, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2014.2357774
   Kanai Y, 2010, IEEE T MAGN, V46, P715, DOI 10.1109/TMAG.2009.2038354
   KRETZMER ER, 1966, IEEE T COMMUN TECHN, VCO14, P67, DOI 10.1109/TCOM.1966.1089288
   Miles JJ, 2003, IEEE T MAGN, V39, P1876, DOI 10.1109/TMAG.2003.813785
   Nakamura Y, 2008, J MAGN MAGN MATER, V320, P3132, DOI 10.1016/j.jmmm.2008.08.024
   Nakamura Y., 2015, TMRC, pP1
   Nakamura Y., 2015, J APPL PHYS, V117
   Nakamura Y, 2007, IEEE T MAGN, V43, P2277, DOI 10.1109/TMAG.2007.893421
   Nakamura Y, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2014.2318335
   Seigler MA, 2008, IEEE T MAGN, V44, P119, DOI 10.1109/TMAG.2007.911029
   Suzuki Y, 2005, J MAGN MAGN MATER, V287, P138, DOI 10.1016/j.jmmm.2004.10.022
   Suzutou R, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2015.2445372
   Vasic B, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2014.2356455
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
   Wood R, 2009, IEEE T MAGN, V45, P917, DOI 10.1109/TMAG.2008.2010676
   Yamashita M, 2013, IEICE T ELECTRON, VE96C, P1504, DOI 10.1587/transele.E96.C.1504
   Zhu JG, 2008, IEEE T MAGN, V44, P125, DOI 10.1109/TMAG.2007.911031
NR 18
TC 0
Z9 0
U1 0
U2 0
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUL
PY 2016
VL 52
IS 7
AR 3001604
DI 10.1109/TMAG.2016.2531088
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA DR5EC
UT WOS:000379924800054
ER

PT J
AU Wang, Y
   Kumar, BVKV
AF Wang, Yao
   Kumar, B. V. K. Vijaya
TI Multi-Track Joint Detection for Shingled Magnetic Recording on Bit
   Patterned Media With 2-D Sectors
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT 13th Joint Magnetism and Magnetic Materials (MMM)/Intermag Conference
CY JAN 11-15, 2016
CL San Diego, CA
SP Amer Inst Phys, IEEE Magnet soc
DE Bit patterned media (BPM); decision feedback detection (DFD);
   multi-track joint detection; shingled writing
ID INTERSYMBOL INTERFERENCE; EQUALIZER; TB/IN(2)
AB Shingled writing on bit patterned media (BPM) is a promising technology to further increase the areal density beyond 1 Tbit/in(2) without drastic changes in writer design. In this paper, a shingled writer is modeled for writing a 2-D sector on BPM, and in particular, we investigate the potential benefit of leaving the last track in the 2-D sector untrimmed, making it fatter than the other tracks in that 2-D sector. During detection, the more reliable information from the last untrimmed (i.e., the fat) track is used as a priori information for detecting the data in the other tracks in that 2-D sector. The simulation results indicate that for 2-D sector with ten tracks (at 3.64 Tbits/in(2) channel bit density) and 5% media noise and at a target bit error rate of 10(-3), using the fat track information, 2-D equalizer +2-D target + symbol-based pattern-dependent noise-predictive detector detecting a single track can provide about 2.9 dB SNR gain compared with that with the same joint detection method using uniform tracks at the same areal density. However, the latency increases due to the decision feedback detection. We can reduce this latency penalty by detecting three tracks at a time, but the SNR gain then reduces to 0.9 dB.
C1 [Wang, Yao; Kumar, B. V. K. Vijaya] Carnegie Mellon Univ, Ctr Data Storage Syst, Pittsburgh, PA 15213 USA.
RP Wang, Y (reprint author), Carnegie Mellon Univ, Ctr Data Storage Syst, Pittsburgh, PA 15213 USA.
EM yaowang@andrew.cmu.edu
CR Chan KS, 2010, IEEE T MAGN, V46, P804, DOI 10.1109/TMAG.2009.2035635
   Chen YM, 2010, IEEE J SEL AREA COMM, V28, P167, DOI 10.1109/JSAC.2010.100205
   Masaaki F., 2012, IEICE T ELECTRON, VE95-C, P163
   Moon J, 2001, IEEE J SEL AREA COMM, V19, P730, DOI 10.1109/49.920181
   Nabavi S, 2007, IEEE ICC, P6249, DOI 10.1109/ICC.2007.1035
   Okamoto Y, 2011, IEEE T MAGN, V47, P3570, DOI 10.1109/TMAG.2011.2158075
   Ozaki K., 2010, PHYS PROCEDIA, V16, P83
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Wang SM, 2013, IEEE T MAGN, V49, P3644, DOI 10.1109/TMAG.2012.2237545
   Wang Y, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2015.2464786
   Wang Y, 2012, IEEE MAGN LETT, V3, DOI 10.1109/LMAG.2012.2226935
   Wood R, 2009, IEEE T MAGN, V45, P917, DOI 10.1109/TMAG.2008.2010676
   Wu YX, 2003, IEEE T MAGN, V39, P2115, DOI 10.1109/TMAG.2003.814291
NR 13
TC 3
Z9 3
U1 0
U2 1
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUL
PY 2016
VL 52
IS 7
AR 3001507
DI 10.1109/TMAG.2015.2511721
PG 7
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA DR5EC
UT WOS:000379924800053
ER

PT J
AU Wang, Y
   Yuan, B
   Parhi, KK
AF Wang, Yao
   Yuan, Bo
   Parhi, Keshab K.
TI Improved BER Performance With Rotated Head Array and 2-D Detector in
   Two-Dimensional Magnetic Recording
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT 13th Joint Magnetism and Magnetic Materials (MMM)/Intermag Conference
CY JAN 11-15, 2016
CL San Diego, CA
SP Amer Inst Phys, IEEE Magnet soc
DE Multi-track detection; rotated head array (RHA); two-dimensional
   magnetic recording (TDMR)
ID NOISE; MEDIA
AB Two-dimensional magnetic recording is a promising candidate to further extend the areal density above 1 Tb/in(2) density while using a conventional writer and media. During the writing process, a shingled writer is usually used to write narrow tracks by overlapping previous tracks, which brings severe intertrack interference (ITI), fewer grains per channel bit and corresponding lower signal-tonoise ratio (SNR). As a consequence, for the current shingled magnetic recording system, a normally oriented head array (NHA) is usually implemented to detect a single track by using 2-D signal processing to mitigate the ITI and media noise. Then, a rotated head array (RHA) has been found to effectively avoid the ITI and regain the lost down-track resolution using signal processing. Correspondingly, in this paper, the RHA is investigated to simultaneously detect three tracks with 1-D and joint pattern-dependent noise-predictive (PDNP) Bahl-Cocke-Jelinek-Raviv (BCJR) detectors. Simulation indicates that, for the perfect writing at the 6 nm Voronoi grains, if the 1-D PDNP BCJR detector is implemented, the RHA combined with a designed 2-D equalizer producing multiple equalized waveforms can provide 16% density gains compared with the NHA with a 2-D equalizer and 1-D target at the target bit error rate (BER) of 10(-2). If the joint PDNP BCJR detector is implemented, the RHA can provide 25% density gain compared with that for the NHA with the same detection algorithm at the target BER of 10(-2). With respect to error correction, a longer codeword length of binary low density parity check code can be used for decoding of the multi-track detection compared with that for the single-track detection, which provides an extra SNR gain.
C1 [Wang, Yao] Carnegie Mellon Univ, Dept Elect & Comp Engn, Pittsburgh, PA 15213 USA.
   [Yuan, Bo] CUNY, Dept Elect Engn, New York, NY 10031 USA.
   [Parhi, Keshab K.] Univ Minnesota, Dept Elect & Comp Engn, Minneapolis, MN 55455 USA.
RP Wang, Y (reprint author), Carnegie Mellon Univ, Dept Elect & Comp Engn, Pittsburgh, PA 15213 USA.
EM yaowang@andrew.cmu.edu
CR BAHL LR, 1974, IEEE T INFORM THEORY, V20, P284, DOI 10.1109/TIT.1974.1055186
   Chan KS, 2010, IEEE T MAGN, V46, P804, DOI 10.1109/TMAG.2009.2035635
   Hocevar D., 2004, P IEEE WORKSH SIGN P, P107
   Lamberton R, 2007, IEEE T MAGN, V43, P645, DOI 10.1109/TMAG.2006.888213
   Mathew G, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2013.2283221
   Moon J, 2001, IEEE J SEL AREA COMM, V19, P730, DOI 10.1109/49.920181
   Nabavi S, 2007, IEEE ICC, P6249, DOI 10.1109/ICC.2007.1035
   Nakamura Y, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2014.2318335
   Radhakrishnan R, 2014, 2014 INTERNATIONAL SYMPOSIUM ON INFORMATION THEORY AND ITS APPLICATIONS (ISITA), P674
   Smith N, 2001, APPL PHYS LETT, V78, P1448, DOI 10.1063/1.1352694
   Vasic B, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2014.2356455
   Victora RH, 2012, IEEE T MAGN, V48, P1697, DOI 10.1109/TMAG.2011.2173310
   Wang Y, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2015.2437875
   Wang Y, 2012, IEEE MAGN LETT, V3, DOI 10.1109/LMAG.2012.2226935
   Wood R, 2009, IEEE T MAGN, V45, P917, DOI 10.1109/TMAG.2008.2010676
   Zheng N, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2014.2300133
NR 16
TC 0
Z9 0
U1 0
U2 0
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUL
PY 2016
VL 52
IS 7
AR 3001706
DI 10.1109/TMAG.2015.2513381
PG 6
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA DR5EC
UT WOS:000379924800055
ER

PT J
AU Yang, E
   Liu, ZW
   Arora, H
   Wu, TW
   Ayanoor-Vitikkate, V
   Spoddig, D
   Bedau, D
   Grobis, M
   Gurney, BA
   Albrecht, TR
   Terris, B
AF Yang, En
   Liu, Zuwei
   Arora, Hitesh
   Wu, Tsai-Wei
   Ayanoor-Vitikkate, Vipin
   Spoddig, Detlef
   Bedau, Daniel
   Grobis, Michael
   Gurney, Bruce A.
   Albrecht, Thomas R.
   Terris, Bruce
TI Template-Assisted Direct Growth of 1 Td/in(2) Bit Patterned Media
SO NANO LETTERS
LA English
DT Article
DE Templated growth; Bit Patterned Media; epitaxial growth; BPM servo;
   nanostructure; self-assembly
ID LITHOGRAPHY
AB We present a method for growing bit patterned magnetic recording media using directed growth of sputtered granular perpendicular magnetic recording media. The grain nucleation is templated using an epitaxial seed layer, which contains Pt pillars separated by amorphous metal oxide. The scheme enables the creation of both templated data and servo regions suitable for high density hard disk drive operation. We illustrate the importance of using a process that is both topographically and chemically driven to achieve high quality media.
C1 [Yang, En; Liu, Zuwei; Arora, Hitesh; Wu, Tsai-Wei; Ayanoor-Vitikkate, Vipin; Spoddig, Detlef; Bedau, Daniel; Grobis, Michael; Gurney, Bruce A.; Albrecht, Thomas R.; Terris, Bruce] HGST, San Jose Res Ctr, San Jose, CA 95135 USA.
RP Yang, E (reprint author), HGST, San Jose Res Ctr, San Jose, CA 95135 USA.
EM en.yang@hgst.com
CR Albrecht TR, 2013, IEEE T MAGN, V49, P773, DOI 10.1109/TMAG.2012.2227303
   Albrecht T. R., 2015, IEEE T MAGN, V51, P1
   Cheng JY, 2010, ACS NANO, V4, P4815, DOI 10.1021/nn100686v
   Donald S., 1995, THIN FILM DEPOSITION
   Dong Q, 2012, ADV MATER, V24, P1034, DOI 10.1002/adma.201104171
   Hogg R. C., 2013, NANOTECHNOLOGY, V24
   Hoinville J, 2003, J APPL PHYS, V93, P7187, DOI 10.1063/1.1555896
   Kikitsu A, 2009, J MAGN MAGN MATER, V321, P526, DOI 10.1016/j.jmmm.2008.05.039
   Kim C, 2007, APPL PHYS LETT, V91, DOI 10.1063/1.2802038
   Lubarda MV, 2011, IEEE T MAGN, V47, P18, DOI 10.1109/TMAG.2010.2089610
   McDaniel TW, 2005, J PHYS-CONDENS MAT, V17, pR315, DOI 10.1088/0953-8984/17/7/R01
   Navas D, 2015, ADV MATER INTERFACES, V2, DOI 10.1002/admi.201400551
   Obukhov Y, 2016, IEEE T MAGN, V52, DOI 10.1109/TMAG.2015.2492475
   Ruiz R, 2011, ACS NANO, V5, P79, DOI 10.1021/nn101561p
   Sundar V, 2014, NANO LETT, V14, P1609, DOI 10.1021/nl500061t
   Yang E., 2014, Perpendicular magnetic recording disk with patterned servo regions and templated growth method for making the disk, Patent No. [US8824084 B1, 8824084]
   Gurney B., 2014, Method for making a perpendicular magnetic recording disk with template layer formed of nanoparticles embedded in a polymer material, Patent No. [US20140231383 A1, 20140231383]
NR 17
TC 0
Z9 0
U1 3
U2 8
PU AMER CHEMICAL SOC
PI WASHINGTON
PA 1155 16TH ST, NW, WASHINGTON, DC 20036 USA
SN 1530-6984
EI 1530-6992
J9 NANO LETT
JI Nano Lett.
PD JUL
PY 2016
VL 16
IS 7
BP 4726
EP 4730
DI 10.1021/acs.nanolett.6b02345
PG 5
WC Chemistry, Multidisciplinary; Chemistry, Physical; Nanoscience &
   Nanotechnology; Materials Science, Multidisciplinary; Physics, Applied;
   Physics, Condensed Matter
SC Chemistry; Science & Technology - Other Topics; Materials Science;
   Physics
GA DR3HL
UT WOS:000379794200109
PM 27295317
ER

PT J
AU Rodriguez, AD
   Clemente, P
   Tajahuerce, E
   Lancis, J
AF Rodriguez, A. D.
   Clemente, P.
   Tajahuerce, E.
   Lancis, J.
TI Dual-mode optical microscope based on single-pixel imaging
SO OPTICS AND LASERS IN ENGINEERING
LA English
DT Article
DE Microscopy; Reflection; Transmission; Resolution; Computational imaging
ID STRUCTURED-ILLUMINATION MICROSCOPY; DIGITAL MICROMIRROR DEVICE; ARRAY
   MICROSCOPE; FLUORESCENCE MICROSCOPY; RESOLUTION LIMIT; SCATTERING MEDIA;
   WIDE-FIELD; TRANSMISSION; SUPERRESOLUTION; REFLECTION
AB We demonstrate an inverted microscope that can image specimens in both reflection and transmission modes simultaneously with a single light source. The microscope utilizes a digital micromirror device (DMD) for patterned illumination altogether with two single-pixel photosensors for efficient light detection. The system, a scan-less device with no moving parts, works by sequential projection of a set of binary intensity patterns onto the sample that are codified onto a modified commercial DMD. Data to be displayed are geometrically transformed before written into a 'memory cell to cancel optical artifacts coming from the diamond-like shaped structure of the micromirror array. The 24-bit color depth of the display is fully exploited to increase the frame rate by a factor of 24, which makes the technique practicable for real samples. Our commercial DMD-based LED-illumination is cost effective and can be easily coupled as an add-on module for already existing inverted microscopes. The reflection and transmission information provided by our dual microscope complement each other and can be useful for imaging non-uniform samples and to prevent self-shadowing effects. (C) 2016 Elsevier Ltd. All rights reserved.
C1 [Rodriguez, A. D.; Tajahuerce, E.; Lancis, J.] Univ Jaume 1, Inst Noyes Tecnol Imatge INIT, Castellon de La Plana 12071, Spain.
   [Clemente, P.] Univ Jaume 1, SCIC, Castellon de La Plana 12071, Spain.
RP Rodriguez, AD (reprint author), Univ Jaume 1, Inst Noyes Tecnol Imatge INIT, Castellon de La Plana 12071, Spain.
RI ; Lancis, Jesus/L-1484-2014
OI Rodriguez, Angel David/0000-0001-8698-6760; Lancis,
   Jesus/0000-0002-7336-6930
FU MINECO [FIS2013-40666-P]; Generalitat Valenciana [PROMETEO/2012/021,
   ISIC/2012/013]; Universitat Jaume I [P1-1B2012-55, PREDOC/2012/41]
FX This work was supported by MINECO through projects FIS2013-40666-P, the
   Generalitat Valenciana PROMETEO/2012/021, ISIC/2012/013, and by the
   Universitat Jaume I P1-1B2012-55. A.D. Rodriguez acknowledges grant
   PREDOC/2012/41 from Universitat Jaume I. Thanks also to Dr. Tatiana Pina
   and Dr. Josep Jaques from Universitat Jaume I for providing us the
   biological samples.
CR Allen JR, 2014, CHEMPHYSCHEM, V15, P566, DOI 10.1002/cphc.201301086
   Assmann M, 2013, SCI REP-UK, V3, DOI 10.1038/srep01545
   Betzig E, 2006, SCIENCE, V313, P1642, DOI 10.1126/science.1127344
   Bianchi S, 2013, OPT LETT, V38, P4935, DOI 10.1364/OL.38.004935
   Candes EJ, 2006, IEEE T INFORM THEORY, V52, P489, DOI 10.1109/TIT.2005.862083
   Candes E. J., L1 MAGIC
   Coskun AF, 2014, CURR OPIN BIOTECH, V25, P8, DOI 10.1016/j.copbio.2013.08.008
   Dan W, 2013, SCI REP, V3, DOI DOI 10.1038/SREP01116
   Donoho DL, 2006, IEEE T INFORM THEORY, V52, P1289, DOI 10.1109/TIT.2006.871582
   Duarte MF, 2008, IEEE SIGNAL PROC MAG, V25, P83, DOI 10.1109/MSP.2007.914730
   Duran V, 2015, OPT EXPRESS, V23, P14424, DOI 10.1364/OE.23.014424
   Edgar MP, 2015, SCI REP-UK, V5, DOI 10.1038/srep10669
   Fukano T, 2003, APPL OPTICS, V42, P4119, DOI 10.1364/AO.42.004119
   Greenberg J, 2014, OPT LETT, V39, P111, DOI 10.1364/OL.39.000111
   Gustafsson MGL, 2000, J MICROSC-OXFORD, V198, P82, DOI 10.1046/j.1365-2818.2000.00710.x
   Gustafsson MGL, 2005, P NATL ACAD SCI USA, V102, P13081, DOI 10.1073/pnas.0406877102
   Hanley QS, 1999, J MICROSC-OXFORD, V196, P317
   HELL SW, 1994, OPT LETT, V19, P780, DOI 10.1364/OL.19.000780
   Lee M, 2011, BIOMED OPT EXPRESS, V2, P2721, DOI 10.1364/BOE.2.002721
   Mahalati RN, 2013, OPT EXPRESS, V21, P1656, DOI 10.1364/OE.21.001656
   Martial FP, 2012, PLOS ONE, V7, DOI 10.1371/journal.pone.0043942
   Moerner WE, 2015, ANGEW CHEM INT EDIT, V54, P8067, DOI 10.1002/anie.201501949
   Ozcan A, 2014, LAB CHIP, V14, P3187, DOI 10.1039/c4lc00010b
   Papagiakoumou E, 2013, BIOL CELL, V105, P443, DOI 10.1111/boc.201200087
   Prevedel R, 2014, NAT METHODS, V11, P727, DOI [10.1038/nmeth.2964, 10.1038/NMETH.2964]
   Radwell N, 2014, OPTICA, V1, P285, DOI 10.1364/OPTICA.1.000285
   Rodriguez AD, 2014, OPT LETT, V39, P3888, DOI 10.1364/OL.39.003888
   Sakai S, 2013, NEUROSCI RES, V75, P59, DOI 10.1016/j.neures.2012.03.009
   Saxena M, 2015, ADV OPT PHOTONICS, V7, P241, DOI 10.1364/AOP.7.000241
   SLOANE NJA, 1976, APPL OPTICS, V15, P107, DOI 10.1364/AO.15.000107
   Studer V, 2012, P NATL ACAD SCI USA, V109, pE1679, DOI 10.1073/pnas.1119511109
   Tajahuerce E, 2014, OPT EXPRESS, V22, P16945, DOI 10.1364/OE.22.016945
   Talaikova NA, 2015, PROC SPIE, V9529, DOI 10.1117/12.2181946
   Tian L, 2015, OPTICA, V2, P104, DOI 10.1364/OPTICA.2.000104
   van den Berg E, 2013, P NATL ACAD SCI USA, V110, pE2752, DOI 10.1073/pnas.1216318110
   Verveer PJ, 1998, J MICROSC-OXFORD, V189, P192
   Watts CM, 2014, NAT PHOTONICS, V8, P605, DOI [10.1038/nphoton.2014.139, 10.1038/NPHOTON.2014.139]
   Wei PK, 1995, ULTRAMICROSCOPY, V61, P237, DOI 10.1016/0304-3991(95)00109-3
   Wilson T, 2011, J MICROSC-OXFORD, V244, P113, DOI 10.1111/j.1365-2818.2011.03549.x
   Wu YH, 2010, OPT EXPRESS, V18, P24565, DOI 10.1364/OE.18.024565
   Xu DL, 2013, J BIOMED OPT, V18, DOI 10.1117/1.JBO.18.6.060503
   Yu WK, 2015, APPL OPTICS, V54, P363, DOI 10.1364/AO.54.000363
   Yu WK, 2014, SCI REP-UK, V4, DOI 10.1038/srep05834
   Zheng GA, 2013, NAT PHOTONICS, V7, P739, DOI [10.1038/nphoton.2013.187, 10.1038/NPHOTON.2013.187]
NR 44
TC 5
Z9 5
U1 11
U2 28
PU ELSEVIER SCI LTD
PI OXFORD
PA THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD OX5 1GB, OXON, ENGLAND
SN 0143-8166
EI 1873-0302
J9 OPT LASER ENG
JI Opt. Lasers Eng.
PD JUL
PY 2016
VL 82
BP 87
EP 94
DI 10.1016/j.optlaseng.2016.02.004
PG 8
WC Optics
SC Optics
GA DJ3CG
UT WOS:000374081800011
ER

PT J
AU Speliotis, T
   Giannopoulos, G
   Niarchos, D
   Li, WF
   Hadjipanayis, G
   Barucca, G
   Agostinelli, E
   Laureti, S
   Peddis, D
   Testa, AM
   Varvaro, G
AF Speliotis, Th.
   Giannopoulos, G.
   Niarchos, D.
   Li, W. F.
   Hadjipanayis, G.
   Barucca, G.
   Agostinelli, E.
   Laureti, S.
   Peddis, D.
   Testa, A. M.
   Varvaro, G.
TI Ledge-type Co/L1(0)-FePt exchange-coupled composites
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article
ID BIT PATTERNED MEDIA; MAGNETIC RECORDING MEDIA; PERPENDICULAR MEDIA;
   L1(0) FEPT; THIN-FILMS; PERMANENT-MAGNETS; NANOCOMPOSITES; OPTIMIZATION;
   ANISOTROPY; FUTURE
AB FePt-based exchange-coupled composites consisting of a magnetically hard L1(0)-FePt phase exchange-coupled with a soft ferromagnetic material are promising candidates for future ultra-high density (>1 Tbit/in(2)) perpendicular magnetic recording media, also being of interest for other applications including spin torque oscillators and micro-electro-mechanical systems, among others. In this paper, the effect of the thickness of a soft Co layer (3 < th(Co) < 20 nm) on the magnetic behavior of ledge-type fcc(100)-Co/L1(0)(001)-FePt composites deposited on an MgO (100) substrate is systematically studied by combining morpho-structural analyses and angular magnetization measurements. Starting from a film consisting of isolated L1(0)(001)-FePt islands, the ledge-type structure was obtained by depositing a Co layer that either covered the FePt islands or filled-up the inter-island region, gradually forming a continuous layer with increasing Co thickness. A perpendicular anisotropy was maintained up to th(Co) similar to 9.5 nm and a significant reduction in the coercivity (about 50% for th(Co) similar to 3 nm) with the increase in thCo was observed, indicating that, by coupling hard FePt and soft Co phases in a ledge-type configuration, the writability can be greatly improved. Recoil loops' measurements confirmed the exchange-coupled behavior, reinforcing a potential interest in these systems for future magnetic recording media. Published by AIP Publishing.
C1 [Speliotis, Th.; Giannopoulos, G.; Niarchos, D.] NCSR Demokritos, Inst Nanosci & Nanotechnol, Athens 15310, Greece.
   [Li, W. F.; Hadjipanayis, G.] Univ Delaware, Dept Phys, Newark, DE 19716 USA.
   [Barucca, G.] Univ Politecn Marche, SIMAU, Via Brecce Bianche, Ancona, Italy.
   [Agostinelli, E.; Laureti, S.; Peddis, D.; Testa, A. M.; Varvaro, G.] ISM CNR, Area Ric RM1, Via Salaria Km 29,300,PB 10, I-00015 Rome, Italy.
RP Varvaro, G (reprint author), ISM CNR, Area Ric RM1, Via Salaria Km 29,300,PB 10, I-00015 Rome, Italy.
EM gaspare.varvaro@ism.cnr.it
RI Agostinelli, Elisabetta/H-2161-2013
OI Agostinelli, Elisabetta/0000-0003-2679-2360; testa, alberto
   maria/0000-0002-1898-2730
FU European Commission [FP7-ICT-2007-2-224001]; MIUR [FIRB2010 - NANOREST]
FX The authors would like to acknowledge E. Patrizi for technical
   assistance in magnetic measurements. This work was financially supported
   by the European Commission FP7 project TERAMAGSTOR (Contract No.
   FP7-ICT-2007-2-224001), and by MIUR under project FIRB2010 - NANOREST.
CR Alexandrakis V, 2011, J APPL PHYS, V109, DOI 10.1063/1.3556773
   Asti G, 2006, PHYS REV B, V73, DOI 10.1103/PhysRevB.73.094406
   Balamurugan B, 2012, SCRIPTA MATER, V67, P542, DOI 10.1016/j.scriptamat.2012.03.034
   Bashir MA, 2009, IEEE T MAGN, V45, P3851, DOI 10.1109/TMAG.2009.2023621
   Bertero GA, 2002, IEEE T MAGN, V38, P1627, DOI 10.1109/TMAG.2002.1017746
   Breitling A, 2009, PHYS STATUS SOLIDI-R, V3, P130, DOI 10.1002/pssr.200903074
   Casoli F, 2010, ACTA MATER, V58, P3594, DOI 10.1016/j.actamat.2010.02.029
   Casoli F, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2905294
   Casoli F., ULTRAHIGH DENSITY MA, P279
   Choe G, 2009, IEEE T MAGN, V45, P2694, DOI 10.1109/TMAG.2009.2018644
   Choi Y, 2007, APPL PHYS LETT, V91, DOI 10.1063/1.2752534
   Chowdhury P, 2013, J MAGN MAGN MATER, V342, P74, DOI 10.1016/j.jmmm.2013.04.008
   Crew DC, 2001, J MAGN MAGN MATER, V233, P257, DOI 10.1016/S0304-8853(01)00277-3
   Crew DC, 1999, J APPL PHYS, V86, P3278, DOI 10.1063/1.371202
   di Bona A, 2013, ACTA MATER, V61, P4840, DOI 10.1016/j.actamat.2013.04.064
   Dobin A. Y., 2006, APPL PHYS LETT, V89
   Giannopoulos G, 2015, J APPL PHYS, V117, DOI 10.1063/1.4922506
   Giannopoulos G, 2013, J MAGN MAGN MATER, V325, P75, DOI 10.1016/j.jmmm.2012.08.003
   Goh CK, 2009, J APPL PHYS, V105, DOI 10.1063/1.3109243
   Goll D, 2008, APPL PHYS LETT, V93, DOI 10.1063/1.3001589
   Goll D, 2009, APPL PHYS LETT, V94, DOI 10.1063/1.3078286
   Goll D, 2013, PHYS STATUS SOLIDI A, V210, P1261, DOI 10.1002/pssa.201329017
   Huang LS, 2013, J APPL PHYS, V114, DOI 10.1063/1.4828868
   Jiang JS, 2014, J PHYS-CONDENS MAT, V26, DOI 10.1088/0953-8984/26/6/064214
   KNELLER EF, 1991, IEEE T MAGN, V27, P3588, DOI 10.1109/20.102931
   Laureti S, 2014, J APPL CRYSTALLOGR, V47, P1722, DOI 10.1107/S1600576714019268
   Lewis LH, 2013, METALL MATER TRANS A, V44A, P2, DOI 10.1007/s11661-012-1278-2
   Lomakin V, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2831732
   Lubarda MV, 2011, IEEE T MAGN, V47, P18, DOI 10.1109/TMAG.2010.2089610
   Lyubina J, 2005, J PHYS-CONDENS MAT, V17, P4157, DOI 10.1088/0953-8984/17/26/014
   Ma B, 2011, J APPL PHYS, V109, DOI 10.1063/1.3569845
   Ma B, 2010, IEEE T MAGN, V46, P2345, DOI 10.1109/TMAG.2009.2039858
   Nguyen TNA, 2011, APPL PHYS LETT, V98, DOI 10.1063/1.3580612
   Nolan TP, 2011, IEEE T MAGN, V47, P63, DOI 10.1109/TMAG.2010.2089045
   Pan CT, 2005, J MAGN MAGN MATER, V285, P422, DOI 10.1016/j.jmmm.2004.08.027
   Rong CB, 2006, ADV MATER, V18, P2984, DOI 10.1002/adma.200601904
   Shima T, 2002, APPL PHYS LETT, V81, P1050, DOI 10.1063/1.1498504
   Skomski R, 2008, J APPL PHYS, V103, DOI 10.1063/1.2835483
   Skomski R, 2013, IEEE T MAGN, V49, P3215, DOI 10.1109/TMAG.2013.2248139
   Sonobe Y, 2001, J MAGN MAGN MATER, V235, P424, DOI 10.1016/S0304-8853(01)00401-2
   Suess D, 2009, J MAGN MAGN MATER, V321, P545, DOI 10.1016/j.jmmm.2008.06.041
   Thiele JU, 2003, APPL PHYS LETT, V82, P2859, DOI 10.1063/1.1571232
   Varvaro G, 2014, J MAGN MAGN MATER, V368, P415, DOI 10.1016/j.jmmm.2014.04.058
   Varvaro G, 2012, NEW J PHYS, V14, DOI 10.1088/1367-2630/14/7/073008
   Victora RH, 2005, IEEE T MAGN, V41, P537, DOI 10.1109/TMAG.2004.838075
   Wang BC, 2014, J APPL PHYS, V115, DOI 10.1063/1.4870463
   Wang H, 2013, IEEE T MAGN, V49, P707, DOI 10.1109/TMAG.2012.2230155
   Wang H, 2012, J APPL PHYS, V111, DOI 10.1063/1.3677793
   Weller D, 2013, PHYS STATUS SOLIDI A, V210, P1245, DOI 10.1002/pssa.201329106
   Zhu JG, 2011, IEEE T MAGN, V47, P4066, DOI 10.1109/TMAG.2011.2157483
   Zimanyi GT, 2008, J APPL PHYS, V103, DOI 10.1063/1.2835690
NR 51
TC 0
Z9 0
U1 9
U2 14
PU AMER INST PHYSICS
PI MELVILLE
PA 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
SN 0021-8979
EI 1089-7550
J9 J APPL PHYS
JI J. Appl. Phys.
PD JUN 21
PY 2016
VL 119
IS 23
AR 233904
DI 10.1063/1.4953766
PG 6
WC Physics, Applied
SC Physics
GA DQ2NK
UT WOS:000379038800010
ER

PT J
AU Vogler, C
   Abert, C
   Bruckner, F
   Suess, D
   Praetorius, D
AF Vogler, Christoph
   Abert, Claas
   Bruckner, Florian
   Suess, Dieter
   Praetorius, Dirk
TI Areal density optimizations for heat-assisted magnetic recording of
   high-density media
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article
AB Heat-assisted magnetic recording (HAMR) is hoped to be the future recording technique for high-density storage devices. Nevertheless, there exist several realization strategies. With a coarsegrained Landau-Lifshitz-Bloch model, we investigate in detail the benefits and disadvantages of a continuous and pulsed laser spot recording of shingled and conventional bit-patterned media. Additionally, we compare single-phase grains and bits having a bilayer structure with graded Curie temperature, consisting of a hard magnetic layer with high TC and a soft magnetic one with low TC, respectively. To describe the whole write process as realistically as possible, a distribution of the grain sizes and Curie temperatures, a displacement jitter of the head, and the bit positions are considered. For all these cases, we calculate bit error rates of various grain patterns, temperatures, and write head positions to optimize the achievable areal storage density. Within our analysis, shingled HAMR with a continuous laser pulse moving over the medium reaches the best results and thus has the highest potential to become the next-generation storage device. Published by AIP Publishing.
C1 [Vogler, Christoph] TU Wien, Inst Solid State Phys, Wiedner Hauptstr 8-10, A-1040 Vienna, Austria.
   [Vogler, Christoph; Praetorius, Dirk] TU Wien, Inst Anal & Sci Comp, Wiedner Hauptstr 8-10, A-1040 Vienna, Austria.
   [Abert, Claas; Bruckner, Florian; Suess, Dieter] TU Wien, Inst Solid State Phys, Christian Doppler Lab Adv Magnet Sensing & Mat, Wiedner Hauptstr 8-10, A-1040 Vienna, Austria.
RP Vogler, C (reprint author), TU Wien, Inst Solid State Phys, Wiedner Hauptstr 8-10, A-1040 Vienna, Austria.; Vogler, C (reprint author), TU Wien, Inst Anal & Sci Comp, Wiedner Hauptstr 8-10, A-1040 Vienna, Austria.
EM christoph.vogler@tuwien.ac.at
RI Suess, Dieter/H-7475-2012
OI Suess, Dieter/0000-0001-5453-9974
FU Vienna Science and Technology Fund (WWTF) [MA14-044]; Advanced Storage
   Technology Consortium (ASTC); Austrian Science Fund (FWF) [F4112 SFB
   ViCoM, I2214-N20]; CD-laboratory AMSEN - Austrian Federal Ministry of
   Economy, Family and Youth; National Foundation for Research, Technology
   and Development
FX The authors would like to thank the Vienna Science and Technology Fund
   (WWTF) under grant No. MA14-044, the Advanced Storage Technology
   Consortium (ASTC), and the Austrian Science Fund (FWF) under Grant Nos.
   F4112 SFB ViCoM and I2214-N20 for financial support. The support from
   the CD-laboratory AMSEN (financed by the Austrian Federal Ministry of
   Economy, Family and Youth, the National Foundation for Research,
   Technology and Development) is acknowledged. The computational results
   presented have been achieved using the Vienna Scientific Cluster (VSC).
CR Atxitia U, 2007, APPL PHYS LETT, V91, DOI 10.1063/1.2822807
   Bunce C, 2010, PHYS REV B, V81, DOI 10.1103/PhysRevB.81.174428
   Chubykalo-Fesenko O, 2006, PHYS REV B, V74, DOI 10.1103/PhysRevB.74.094436
   Evans RFL, 2014, J PHYS-CONDENS MAT, V26, DOI 10.1088/0953-8984/26/10/103202
   Evans RFL, 2012, PHYS REV B, V85, DOI 10.1103/PhysRevB.85.014433
   Garanin DA, 2004, PHYS REV B, V70, DOI 10.1103/PhysRevB.70.212409
   Garanin DA, 1997, PHYS REV B, V55, P3050, DOI 10.1103/PhysRevB.55.3050
   Greaves S, 2012, IEEE T MAGN, V48, P1794, DOI 10.1109/TMAG.2012.2187776
   Kazantseva N, 2008, PHYS REV B, V77, DOI 10.1103/PhysRevB.77.184428
   Kryder MH, 2008, P IEEE, V96, P1810, DOI 10.1109/JPROC.2008.2004315
   McDaniel TW, 2012, J APPL PHYS, V112, DOI 10.1063/1.4733311
   MEE CD, 1967, IEEE T MAGN, VMAG3, P72, DOI 10.1109/TMAG.1967.1066003
   Mendil J, 2014, SCI REP-UK, V4, DOI 10.1038/srep03980
   Richter HJ, 2012, J APPL PHYS, V111, DOI 10.1063/1.3681297
   Rottmayer RE, 2006, IEEE T MAGN, V42, P2417, DOI 10.1109/TMAG.2006.879572
   Schieback C, 2009, PHYS REV B, V80, DOI 10.1103/PhysRevB.80.214403
   Suess D, 2016, SCI REP-UK, V6, DOI 10.1038/srep27048
   Suess D, 2005, APPL PHYS LETT, V87, DOI 10.1063/1.1951053
   Vogler C, 2016, APPL PHYS LETT, V108, DOI 10.1063/1.4943629
   Vogler C, 2014, PHYS REV B, V90, DOI 10.1103/PhysRevB.90.214431
   Wang Y, 2013, IEEE T MAGN, V49, P5208, DOI 10.1109/TMAG.2013.2260349
   Zhu JG, 2013, IEEE T MAGN, V49, P765, DOI 10.1109/TMAG.2012.2231855
   Zhu JG, 2015, IEEE MAGN LETT, V6, DOI 10.1109/LMAG.2015.2427117
   Kobayashi H., 1984, Japan patent application, Patent No. [JPS57113402, 57113402]
   Lewicki G. W., 1969, U. S. patent application, Patent No. [US3626114, 3626114]
NR 25
TC 3
Z9 3
U1 1
U2 3
PU AMER INST PHYSICS
PI MELVILLE
PA 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
SN 0021-8979
EI 1089-7550
J9 J APPL PHYS
JI J. Appl. Phys.
PD JUN 14
PY 2016
VL 119
IS 22
AR 223903
DI 10.1063/1.4953390
PG 12
WC Physics, Applied
SC Physics
GA DQ0XP
UT WOS:000378925400010
ER

PT J
AU Unal, AA
   Valencia, S
   Radu, F
   Marchenko, D
   Merazzo, KJ
   Vazquez, M
   Sanchez-Barriga, J
AF Uenal, A. A.
   Valencia, S.
   Radu, F.
   Marchenko, D.
   Merazzo, K. J.
   Vazquez, M.
   Sanchez-Barriga, J.
TI Ferrimagnetic DyCo5 Nanostructures for Bits in Heat-Assisted Magnetic
   Recording
SO PHYSICAL REVIEW APPLIED
LA English
DT Article
ID ANODIC ALUMINA; SPIN REORIENTATION; NANOWIRE ARRAYS; ANTIDOT ARRAYS;
   SUPERLATTICES; FABRICATION; MAGNETORESISTANCE; NANOPARTICLES;
   TEMPERATURE; MEDIA
AB Increasing the magnetic data recording density requires reducing the size of the individual memory elements of a recording layer as well as employing magnetic materials with temperature-dependent functionalities. Therefore, we predict that the near future of magnetic data storage technology involves a combination of energy-assisted recording on nanometer-scale magnetic media. We present the potential of heat-assisted magnetic recording on a patterned sample; a ferrimagnetic alloy composed of a rare-earth and a transition metal DyCo5, which is grown on a hexagonal-ordered nanohole array membrane. The magnetization of the antidot array sample is out-of-plane oriented at room temperature and rotates towards in plane upon heating above its magnetic anisotropy reorientation temperature (T-R) of 350 K, just above room temperature. Upon cooling back to room temperature (below T-R), we observe a well-defined and unexpected in-plane magnetic domain configuration modulating with 45 nm. We discuss the underlying mechanisms giving rise to this behavior by comparing the magnetic properties of the patterned sample with the ones of its extended thin-film counterpart. Our results pave the way for future applications of ferrimagnetic antidot arrays of superior functionality in magnetic nanodevices near room temperature.
C1 [Uenal, A. A.; Valencia, S.; Radu, F.; Marchenko, D.; Sanchez-Barriga, J.] Elektronenspeicherring BESSY II, Helmholtz Zentrum Berlin Mat & Energie, Albert Einstein Str 15, D-12489 Berlin, Germany.
   [Merazzo, K. J.; Vazquez, M.] CSIC, Inst Ciencia Mat Madrid, Plaza Murillo 2, E-28049 Madrid, Spain.
RP Sanchez-Barriga, J (reprint author), Elektronenspeicherring BESSY II, Helmholtz Zentrum Berlin Mat & Energie, Albert Einstein Str 15, D-12489 Berlin, Germany.
EM jaime.sanchez-barriga@helmholtz-berlin.de
RI Marchenko, Dmitry/H-5242-2013; Sanchez-Barriga, Jaime/I-3493-2013; Radu,
   Florin/B-6725-2011
OI Marchenko, Dmitry/0000-0003-1496-4161; Sanchez-Barriga,
   Jaime/0000-0001-9947-6700; Radu, Florin/0000-0003-0284-7937
FU MINECO [MAT2013-48054-C2-1-R]
FX K. J. M. and M. V. gratefully acknowledge the support from MINECO under
   Project No. MAT2013-48054-C2-1-R.
CR Abrudan R, 2015, REV SCI INSTRUM, V86, DOI 10.1063/1.4921716
   Albrecht TR, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2015.2397880
   BAIBICH MN, 1988, PHYS REV LETT, V61, P2472, DOI 10.1103/PhysRevLett.61.2472
   Bennemann K, 2010, J PHYS-CONDENS MAT, V22, DOI 10.1088/0953-8984/22/24/243201
   BINASCH G, 1989, PHYS REV B, V39, P4828, DOI 10.1103/PhysRevB.39.4828
   Desvaux C, 2005, NAT MATER, V4, P750, DOI 10.1038/nmat1480
   Donahue M, 1999, 6376 NISTIR
   Kronast F, 2010, SURF INTERFACE ANAL, V42, P1532, DOI 10.1002/sia.3561
   Kryder MH, 2008, P IEEE, V96, P1810, DOI 10.1109/JPROC.2008.2004315
   Li AP, 1999, ADV MATER, V11, P483, DOI 10.1002/(SICI)1521-4095(199904)11:6<483::AID-ADMA483>3.0.CO;2-I
   Martin JI, 2003, J MAGN MAGN MATER, V256, P449, DOI 10.1016/S0304-8853(02)00898-3
   MASUDA H, 1995, SCIENCE, V268, P1466, DOI 10.1126/science.268.5216.1466
   McDaniel TW, 2012, J APPL PHYS, V112, DOI 10.1063/1.4764336
   Merazzo KJ, 2012, PHYS REV B, V85, DOI 10.1103/PhysRevB.85.184427
   Merazzo KJ, 2011, J APPL PHYS, V109, DOI 10.1063/1.3544483
   Molina-Ruiz M, 2011, PHYS REV B, V83, DOI 10.1103/PhysRevB.83.140407
   Parkin SSP, 1999, J APPL PHYS, V85, P5828, DOI 10.1063/1.369932
   Parkin SSP, 2004, NAT MATER, V3, P862, DOI 10.1038/nmat1256
   Radu F, 2012, NAT COMMUN, V3, DOI 10.1038/ncomms1728
   Ross C, 2001, ANN REV MATER RES, V31, P203, DOI 10.1146/annurev.matsci.31.1.203
   Ruiz-Feal I, 2002, J MAGN MAGN MATER, V242, P597, DOI 10.1016/S0304-8853(01)01108-8
   Sanchez-Barriga J, 2007, J MAGN MAGN MATER, V312, P99, DOI 10.1016/j.jmmm.2006.09.020
   Sanchez-Barriga J, 2009, PHYS REV B, V80, DOI 10.1103/PhysRevB.80.184424
   Sander D, 2004, J PHYS-CONDENS MAT, V16, pR603, DOI 10.1088/0953-8984/16/20/R01
   Stamps RL, 2014, J PHYS D APPL PHYS, V47, DOI 10.1088/0022-3727/47/33/333001
   Stipe BC, 2010, NAT PHOTONICS, V4, P484, DOI 10.1038/nphoton.2010.90
   Sun SH, 2000, SCIENCE, V287, P1989, DOI 10.1126/science.287.5460.1989
   Thiele JU, 2002, J APPL PHYS, V91, P6595, DOI 10.1063/1.1470254
   TSUSHIMA T, 1983, J MAGN MAGN MATER, V31-4, P197, DOI 10.1016/0304-8853(83)90213-5
   Vasquez M, 2008, J MAGN MAGN MATER, V320, P1978, DOI 10.1016/j.jmmm.2008.02.053
   Weller D, 2013, PHYS STATUS SOLIDI A, V210, P1245, DOI 10.1002/pssa.201329106
   Xiao ZL, 2002, APPL PHYS LETT, V81, P2869, DOI 10.1063/1.1512993
   Yin AJ, 2001, APPL PHYS LETT, V79, P1039, DOI 10.1063/1.1389765
   Radu F., 2015, U.S. Patent No, Patent No. [14,383,131, 14383131, US 14,383,131]
NR 34
TC 0
Z9 0
U1 2
U2 7
PU AMER PHYSICAL SOC
PI COLLEGE PK
PA ONE PHYSICS ELLIPSE, COLLEGE PK, MD 20740-3844 USA
SN 2331-7019
J9 PHYS REV APPL
JI Phys. Rev. Appl.
PD JUN 13
PY 2016
VL 5
IS 6
AR 064007
DI 10.1103/PhysRevApplied.5.064007
PG 8
WC Physics, Applied
SC Physics
GA DO5HE
UT WOS:000377813400002
ER

PT J
AU Wasko, DK
   Bullard, SG
AF Wasko, Dennis K.
   Bullard, Stephan G.
TI An Analysis of Media-Reported Venomous Snakebites in the United States,
   2011-2013
SO WILDERNESS & ENVIRONMENTAL MEDICINE
LA English
DT Article
DE snakes; snakebite; envenomation; rattlesnake; cottonmouth; mass media
ID RATTLESNAKE BITES; AMERICAN ASSOCIATION; RISK-TAKING; SNAKES;
   ENVENOMATION; ADOLESCENCE; ANAPHYLAXIS; SEVERITY; DEATHS
AB Background.-Venomous snakebite is a widespread natural hazard in the United States. A common perception exists that the majority of these snakebites are "illegitimate," resulting from deliberate interaction with snakes (such as attempting to move or kill the animal), but there is little quantitative information available regarding the conditions under which bites occur.
   Methods.-To better understand the circumstances under which victims are bitten, we compiled a dataset of media-reported snakebites in the United States between 2011 and 2013. A total of 332 reported snakebites were recorded. Of these, 307 were from snakes encountered under natural circumstances and 25 were under captive-care conditions.
   Results.-Most reported victims were adult males. Although some bites occurred during intentional handling of snakes and such activity may relate to bite severity, the majority of victims reported being unaware of the snake before they were bitten. Accidentally stepping on or placing the hands near an unseen snake were the activities most frequently associated with bites under natural conditions.
   Conclusions.-Although bias in snakebite reporting patterns by the media is likely, across the United States "legitimate" bites from unseen snakes appear to be the norm.
C1 [Wasko, Dennis K.; Bullard, Stephan G.] Univ Hartford, Hillyer Coll, Dept Math & Sci, Hartford, CT 06002 USA.
RP Wasko, DK (reprint author), Univ Hartford, Hillyer Coll, 200 Bloomfield Ave, Hartford, CT 06002 USA.
EM wasko@hartford.edu
CR Bosak Adam R, 2014, J Med Toxicol, V10, P229, DOI 10.1007/s13181-013-0373-0
   Bronstein AC, 2012, CLIN TOXICOL, V50, P911, DOI 10.3109/15563650.2012.746424
   BUSH SP, 1995, ANN EMERG MED, V25, P845, DOI 10.1016/S0196-0644(95)70218-0
   BUTNER AN, 1983, WESTERN J MED, V139, P179
   Campbell BT, 2008, J PEDIATR SURG, V43, P1338, DOI 10.1016/j.jpedsurg.2007.11.011
   Corbett SW, 2005, AM J EMERG MED, V23, P759, DOI 10.1016/j.ajem.2005.03.008
   CRUZ NS, 1994, PEDIATR EMERG CARE, V10, P30, DOI 10.1097/00006565-199402000-00009
   CURRY SC, 1989, ANN EMERG MED, V18, P658, DOI 10.1016/S0196-0644(89)80523-2
   Dorcas Michael E., 2011, INVASIVE PYTHONS US
   DOWNEY DJ, 1991, J TRAUMA, V31, P1380, DOI 10.1097/00005373-199110000-00011
   ELLIS EF, 1965, J AMER MED ASSOC, V193, P401
   Gardner M, 2005, DEV PSYCHOL, V41, P625, DOI 10.1037/0012-1649.41.4.625
   GERKIN R, 1987, ANN EMERG MED, V16, P813, DOI 10.1016/S0196-0644(87)80584-X
   Gibbons JW, 2002, COPEIA, P195, DOI 10.1643/0045-8511(2002)002[0195:DBOCAP]2.0.CO;2
   Gold BS, 2002, NEW ENGL J MED, V347, P347, DOI 10.1056/NEJMra013477
   Gold BS, 2004, EMERG MED CLIN N AM, V22, P423, DOI 10.1016/j.emc.2004.01.007
   Gutierrez JM, 2006, PLOS MED, V3, P727, DOI 10.1371/journal.pmed.0030150
   Hayes William K., 2002, P207
   Hayes WK, 2010, WILD ENVIRON MED, V21, P35, DOI 10.1016/j.wem.2010.01.006
   Hillier LM, 1998, J PEDIATR PSYCHOL, V23, P229, DOI 10.1093/jpepsy/23.4.229
   Kasturiratne A, 2008, PLOS MED, V5, P1591, DOI 10.1371/journal.pmed.0050218
   Langley R, 2009, CLIN TOXICOL, V47, P44, DOI 10.1080/15563650801968313
   MINTON SA, 1987, NORTHWEST SCI, V61, P130
   Minton SA, 1996, WILD ENVIRON MED, V7, P297, DOI 10.1580/1080-6032(1996)007[0297:BBNNVS]2.3.CO;2
   Morgan DL, 2007, SOUTH MED J, V100, P152
   Mowry JB, 2014, CLIN TOXICOL, V52, P1032, DOI 10.3109/15563650.2014.987397
   Mowry JB, 2013, CLIN TOXICOL, V51, P949, DOI 10.3109/15563650.2013.863906
   O'Neil ME, 2007, WILD ENVIRON MED, V18, P281, DOI 10.1580/06-WEME-OR-080R1.1
   PARRISH HM, 1966, PUBLIC HEALTH REP, V81, P269, DOI 10.2307/4592691
   Scharman EJ, 2001, ANN EMERG MED, V38, P55, DOI 10.1067/mem.2001.116148
   Seifert SA, 2007, CLIN TOXICOL, V45, P571, DOI 10.1080/15563650701382748
   Steinberg L, 2007, CURR DIR PSYCHOL SCI, V16, P55, DOI 10.1111/j.1467-8721.2007.00475.x
   Thorson A, 2003, J TOXICOL-CLIN TOXIC, V41, P29, DOI 10.1081/CLT-120018268
   Titus V, 2007, P 2007 INT C EC TRAN, V207, P378
   Walter FG, 2012, SOUTH MED J, V105, P313, DOI 10.1097/SMJ.0b013e318257c2d5
   Warrell DA, 2010, GUIDELINES MANAGEMEN
   Warrell DA, 2010, LANCET, V375, P77, DOI 10.1016/S0140-6736(09)61754-2
NR 37
TC 1
Z9 1
U1 2
U2 2
PU ELSEVIER SCIENCE INC
PI NEW YORK
PA 360 PARK AVE SOUTH, NEW YORK, NY 10010-1710 USA
SN 1080-6032
EI 1545-1534
J9 WILD ENVIRON MED
JI Wildern. Environ. Med.
PD JUN
PY 2016
VL 27
IS 2
BP 219
EP 226
PG 8
WC Public, Environmental & Occupational Health; Sport Sciences
SC Public, Environmental & Occupational Health; Sport Sciences
GA DP4LP
UT WOS:000378467700008
PM 27161436
ER

PT J
AU Watanabe, T
   Taniguchi, K
   Suzuki, K
   Iyama, H
   Kishimoto, S
   Sato, T
   Kobayashi, H
AF Watanabe, Tsuyoshi
   Taniguchi, Kazutake
   Suzuki, Kouta
   Iyama, Hiromasa
   Kishimoto, Shuji
   Sato, Takashi
   Kobayashi, Hideo
TI Nanohole and dot patterning processes on quartz substrate by R-theta
   electron beam lithography and nanoimprinting
SO JAPANESE JOURNAL OF APPLIED PHYSICS
LA English
DT Article; Proceedings Paper
CT 28th International Microprocesses and Nanotechnology Conference (MNC)
CY NOV 10-13, 2015
CL Toyama, JAPAN
SP Japan Soc Appl Phys, Inst Elect Engineers Japan, Inst Elect, Informat & Commun Engineers, Japan Soc Precis Engn, Japan Soc Mech Engineers, Japanese Soc Synchrotron Radiat Res, Japanese Soc Microscopy, Surface Sci Soc Japan, Vacuum Soc Japan
ID IMPRINT LITHOGRAPHY; STORAGE; MEDIA
AB Fine hole and dot patterns with bit pitches (bp's) of less than 40nm were fabricated in the circular band area of a quartz substrate by R-theta electron beam lithography (EBL), reactive ion etching (RIE), and nanoimprinting. These patterning processes were studied to obtain minimum pitch sizes of hole and dot patterns without pattern collapse. The patterning on the circular band was aimed to apply these patterning processes to future high-density bit-patterned media (BPM) for hard disk drive (HDD) and permanent memory for the long life archiving of digital data. In hole patterning, a minimum-22-nm-bp and 8.2-nm-diameter pattern (1.3 Tbit/in.(2)) was obtained on a quartz substrate by optimizing the R-theta EBL and RIE processes. Dot patterns were replicated on another quartz substrate by nanoimprinting using a hole-patterned quartz substrate as a master mold followed by RIE. In dot patterning, a minimum-30-nm-bp and 18.5-nm-diameter pattern (0.7 Tbit/in.(2)) was obtained by introducing new descum conditions. It was observed that the minimum bp of successful patterning increased as the fabrication process proceeded, i.e., from 20 nm bp in the first EBL process to 30 nm bp in the last quartz dot patterning process. From the measured diameters of the patterns, it was revealed that pattern collapse was apt to occur when the value of average diameter plus 3 sigma of diameter was close to the bp. It was suggested that multiple fabrication processes caused the degradation of pattern quality; therefore, hole patterning is more suitable than dot patterning for future applications owing to the lower quality degradation by its simple fabrication process. (C) 2016 The Japan Society of Applied Physics
C1 [Watanabe, Tsuyoshi; Taniguchi, Kazutake; Suzuki, Kouta; Iyama, Hiromasa; Kishimoto, Shuji; Sato, Takashi; Kobayashi, Hideo] HOYA Corp, Blanks Div, Yamanashi 4088550, Japan.
RP Watanabe, T (reprint author), HOYA Corp, Blanks Div, Yamanashi 4088550, Japan.
EM tsuyoshi.watanabe@hoya.com
CR Brooks C., 2010, P SOC PHOTO-OPT INS, V7823
   Chou SY, 1997, J VAC SCI TECHNOL B, V15, P2897, DOI 10.1116/1.589752
   CHOU SY, 1995, APPL PHYS LETT, V67, P3114, DOI 10.1063/1.114851
   Chou SY, 1996, J VAC SCI TECHNOL B, V14, P4129, DOI 10.1116/1.588605
   Glezer EN, 1996, OPT LETT, V21, P2023, DOI 10.1364/OL.21.002023
   Higashiki T., 2012, TOSHIBA REV, V67, P2
   Higashiki T, 2011, PROC SPIE, V7970, DOI 10.1117/12.882940
   Hiraka T., 2009, P SOC PHOTO-OPT INS, V7379
   Imai R, 2015, JPN J APPL PHYS, V54, DOI 10.7567/JJAP.54.09MC02
   Inazuki Y., 2008, P SOC PHOTO-OPT INS, V7122
   Iyama H, 2010, PROC SPIE, V7748, DOI 10.1117/12.869098
   Kikitsu A, 2009, J MAGN MAGN MATER, V321, P526, DOI 10.1016/j.jmmm.2008.05.039
   Kobayashi H, 2013, PROC SPIE, V8880, DOI 10.1117/12.2027870
   Kobayashi H, 2012, PROC SPIE, V8522, DOI 10.1117/12.973668
   Matsui S, 2001, J VAC SCI TECHNOL B, V19, P2801, DOI 10.1116/1.1417547
   Nakasugi T., 2012, TOSHIBA REV, V67, P41
   Sasaki S., 2008, P SOC PHOTO-OPT INS, V7122
   Schmid GM, 2008, P SOC PHOTO-OPT INS, V6921, P92109, DOI 10.1117/12.772956
   Selinidis K, 2008, PROC SPIE, V7028, DOI 10.1117/12.793034
   Selinidis KS, 2011, PROC SPIE, V8166, DOI 10.1117/12.898865
   Shefter M., 2007, THE DIGITAL DILEMMA, P2
   Shiozawa M, 2014, J LASER MICRO NANOEN, V9, DOI 10.2961/jlmn.2014.01.0001
   Terris BD, 2007, MICROSYST TECHNOL, V13, P189, DOI 10.1007/s00542-006-0144-9
   Thompson E, 2003, P SOC PHOTO-OPT INS, V5037, P1019, DOI 10.1117/12.490141
   Watanabe T, 2014, JPN J APPL PHYS, V53, DOI 10.7567/JJAP.53.06JK05
   Wood RW, 2002, IEEE T MAGN, V38, P1711, DOI 10.1109/TMAG.2002.1017761
   Yoneda I, 2008, P SOC PHOTO-OPT INS, V6921, P92104, DOI 10.1117/12.771149
   Yoshitake S, 2007, P SOC PHOTO-OPT INS, V6730, pE7300, DOI 10.1117/12.747568
   Yuxiang Y., 2009, IEEE S VLSI CIRC, P26
NR 29
TC 0
Z9 0
U1 5
U2 11
PU IOP PUBLISHING LTD
PI BRISTOL
PA TEMPLE CIRCUS, TEMPLE WAY, BRISTOL BS1 6BE, ENGLAND
SN 0021-4922
EI 1347-4065
J9 JPN J APPL PHYS
JI Jpn. J. Appl. Phys.
PD JUN
PY 2016
VL 55
IS 6
SI 1
AR 06GM03
DI 10.7567/JJAP.55.06GM03
PG 5
WC Physics, Applied
SC Physics
GA DO0QT
UT WOS:000377484100072
ER

PT J
AU Suess, D
   Fuger, M
   Abert, C
   Bruckner, F
   Vogler, C
AF Suess, D.
   Fuger, M.
   Abert, C.
   Bruckner, F.
   Vogler, C.
TI Superior bit error rate and jitter due to improved switching field
   distribution in exchange spring magnetic recording media
SO SCIENTIFIC REPORTS
LA English
DT Article
ID COUPLED COMPOSITE MEDIA; MICROMAGNETIC SIMULATION; THERMAL FLUCTUATIONS;
   PARTICLES; ELEMENTS
AB We report two effects that lead to a significant reduction of the switching field distribution in exchange spring media. The first effect relies on a subtle mechanism of the interplay between exchange coupling between soft and hard layers and anisotropy that allows significant reduction of the switching field distribution in exchange spring media. This effect reduces the switching field distribution by about 30% compared to single-phase media. A second effect is that due to the improved thermal stability of exchange spring media over single-phase media, the jitter due to thermal fluctuation is significantly smaller for exchange spring media than for single-phase media. The influence of this overall improved switching field distribution on the transition jitter in granular recording and the bit error rate in bit-patterned magnetic recording is discussed. The transition jitter in granular recording for a distribution of K-hard values of 3% in the hard layer, taking into account thermal fluctuations during recording, is estimated to be alpha = 0.78 nm, which is similar to the best reported calculated jitter in optimized heat-assisted recording media.
C1 [Suess, D.; Abert, C.; Bruckner, F.] TU Wien, Inst Solid State Phys, Christian Doppler Lab Adv Magnet Sensing & Mat, Wiedner Hauptstr 8-10, A-1040 Vienna, Austria.
   [Fuger, M.; Vogler, C.] TU Wien, Inst Solid State Phys, Wiedner Hauptstr 8-10, A-1040 Vienna, Austria.
RP Suess, D (reprint author), TU Wien, Inst Solid State Phys, Christian Doppler Lab Adv Magnet Sensing & Mat, Wiedner Hauptstr 8-10, A-1040 Vienna, Austria.
EM dieter.suess@tuwien.ac.at
RI Suess, Dieter/H-7475-2012
OI Suess, Dieter/0000-0001-5453-9974
CR Alexandrakis V, 2010, J APPL PHYS, V107, DOI 10.1063/1.3275925
   Berger A, 2008, APPL PHYS LETT, V93, DOI 10.1063/1.2985903
   Breth L, 2012, J APPL PHYS, V112, DOI 10.1063/1.4737413
   Dittrich R, 2002, J MAGN MAGN MATER, V250, pL12
   Forster H, 2003, IEEE T MAGN, V39, P2513, DOI 10.1109/TMAG.2003.816458
   FREDKIN DR, 1990, IEEE T MAGN, V26, P415, DOI 10.1109/20.106342
   Garcia-Palacios JL, 1998, PHYS REV B, V58, P14937, DOI 10.1103/PhysRevB.58.14937
   Goll D, 2008, J APPL PHYS, V104, DOI 10.1063/1.2999337
   Hauet T, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3276911
   Ju G., 2015, IEEE T MAGN, V51, P1
   Jung HS, 2008, J MAGN MAGN MATER, V320, P3151, DOI 10.1016/j.jmmm.2008.08.077
   Jung HS, 2007, IEEE T MAGN, V43, P2088, DOI 10.1109/TMAG.2007.892859
   Kondorsky E, 1940, J PHYS-USSR, V2, P161
   Lee J, 2011, APPL PHYS LETT, V98, DOI 10.1063/1.3595307
   LYBERATOS A, 1993, J APPL PHYS, V73, P6501, DOI 10.1063/1.352594
   Oates CJ, 2002, J APPL PHYS, V91, P1417, DOI 10.1063/1.1428804
   Scholz W, 2001, J MAGN MAGN MATER, V233, P296, DOI 10.1016/S0304-8853(01)00032-4
   Suess D, 2006, APPL PHYS LETT, V89, DOI 10.1063/1.2347894
   Suess D, 2005, J MAGN MAGN MATER, V290, P551, DOI 10.1016/j.jmmm.2004.11.525
   Suess D, 2015, J APPL PHYS, V117, DOI 10.1063/1.4918609
   Suess D, 2007, PHYS REV B, V75, DOI 10.1103/PhysRevB.75.174430
   Suess D, 2009, J MAGN MAGN MATER, V321, P545, DOI 10.1016/j.jmmm.2008.06.041
   Suess D, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2908052
   Suess D, 2002, J MAGN MAGN MATER, V248, P298, DOI 10.1016/S0304-8853(02)00341-4
   Suess D., 2013, ASTC REV M SANT CLAR
   Suess D, 2007, J MAGN MAGN MATER, V308, P183, DOI 10.1016/j.jmmm.2006.05.021
   Suss D, 1999, J MAGN MAGN MATER, V196, P617, DOI 10.1016/S0304-8853(98)00868-3
   Tsiantos V, 2003, SENSOR ACTUAT A-PHYS, V106, P134, DOI 10.1016/S0924-4247(03)00151-1
   VICTORA RH, 1989, PHYS REV LETT, V63, P457, DOI 10.1103/PhysRevLett.63.457
   Victora RH, 2005, IEEE T MAGN, V41, P537, DOI 10.1109/TMAG.2004.838075
   Vogler C., 2015, ARXIV151203690CONDMA
   Wang H., 2012, IEEE MAGN LETT, V3
   Wang J, 2016, ACTA MATER, V111, P47, DOI 10.1016/j.actamat.2016.03.001
   Wang JP, 2007, IEEE T MAGN, V43, P682, DOI 10.1109/TMAG.2006.888233
   Wang JP, 2005, IEEE T MAGN, V41, P3181, DOI 10.1109/TMAG.2005.855278
   Wang JP, 2005, APPL PHYS LETT, V86, P42504, DOI 10.1063/1.1896431
   Wang XB, 2010, APPL PHYS LETT, V97, DOI 10.1063/1.3486167
   Zhou TJ, 2009, APPL PHYS LETT, V94, DOI 10.1063/1.3116623
NR 38
TC 1
Z9 1
U1 4
U2 6
PU NATURE PUBLISHING GROUP
PI LONDON
PA MACMILLAN BUILDING, 4 CRINAN ST, LONDON N1 9XW, ENGLAND
SN 2045-2322
J9 SCI REP-UK
JI Sci Rep
PD JUN 1
PY 2016
VL 6
AR 27048
DI 10.1038/srep27048
PG 13
WC Multidisciplinary Sciences
SC Science & Technology - Other Topics
GA DN6DW
UT WOS:000377163300001
PM 27245287
ER

PT J
AU Sathyan, A
   Thirugnanam, M
   Hazra, S
AF Sathyan, Anil
   Thirugnanam, Mythili
   Hazra, Sumit
TI A NOVEL RGB BASED STEGANOGRAPHY USING PRIME COMPONENT ALTERATION
   TECHNIQUE
SO IIOAB JOURNAL
LA English
DT Article
DE Steganography; RGB; First Component Alternate; LSB; Steganalysis
ID IMAGES
AB Steganography is the science with the help of which secret or confidential data is hidden within any media like text, images, audio or video and protocol-based network. As privacy concerns continue to develop, it is in widespread use because it enables to hide the secret data in cover images. Steganographic techniques are best suited for digital image processing. In general, Steganography is classified into spatial and transform domain techniques. This paper presents a new RGB based algorithm in spatial domain called Prime Pixel Alternation technique. In the present scenario, many spatial domain algorithms like LSB, first component alternate, pixel indicator are usually used for steganography since they are easier to implement and less complex. Even though their hiding capacity is high, they are more prone to steganalysis. A new RGB-based algorithm is designed to store data in Random prime numbered multiple pixel locations and the encrypted key is also stored along with the data in a co-prime location (co-prime to the aforesaid 3 numbers). This algorithm requires to choose 3 random numbers to store data in R(Red), G(Green) and B(Blue) components of the cover image(24 bit image). Blue component is given the priority to store more data (lowest prime no: multiple pixel location) because a research was conducted by Hecht [14], which reveals that the blue objects, if visually perceived, are intense and are comparatively less distinct than the red and green objects. Since the key size is fixed, it is stored in coprime pixel locations, which will be least in number. Key bits will be stored in R, G, B components one at a time in a cyclic manner, in the above mentioned co-prime locations, in which the security is improved. A null terminator bit pattern may be used to indicate end of key or data. The reverse process of the encoding algorithm is used to decode the message.
C1 [Sathyan, Anil; Thirugnanam, Mythili; Hazra, Sumit] VIT Univ, Sch Comp Sci & Engn, Vellore, Tamil Nadu, India.
RP Sathyan, A (reprint author), VIT Univ, Sch Comp Sci & Engn, Vellore, Tamil Nadu, India.
EM anil.sathyan2015@vit.ac.in
FU School of Computing Sciences and Engineering, VIT University; SCOPE, VIT
   University, India
FX We would like to thank the School of Computing Sciences and Engineering,
   VIT University and Special thanks to Dean SCOPE, for his kind guidance
   and support along with our guide Dr(Mrs.) Mythili Thirugnanam without
   whom it would not have been possible to complete this mammoth task. This
   work has been (Partially) supported by the research program in SCOPE,
   VIT University, India.
CR Amanpreet Kaur, 2010, ARXIV100119722010
   Kumar Archana, ENHANCED STEGANOGRAP
   Fillatre L, 2012, IEEE T SIGNAL PROCES, V60, P556, DOI 10.1109/TSP.2011.2174231
   Gouthamanaath MG, INT J COMPUTER APPL
   Hecht E., 1987, OPTICS
   Hong W, 2012, IEEE T INF FOREN SEC, V7, P176, DOI 10.1109/TIFS.2011.2155062
   Hemalatha S, 2013, SPEED UP IMPROVEMENT
   Luo WQ, 2010, IEEE T INF FOREN SEC, V5, P201, DOI 10.1109/TIFS.2010.2041812
   Mahimah P, 2013, COMP INT COMP RES IC
   Divya M, 2014, ACCELERATION LSB ALG
   Rengarajan Amirtharajan, 2012, REC ADV COMP SOFTW S
   Sharma P. K, 2012, INT J MICROBIAL RESO, V1, P5
   Vinit Agham, 2014, INF COMM EMB SYST IC
   Yang CH, 2008, IEEE T INF FOREN SEC, V3, P488, DOI 10.1109/TIFS.2008.926097
NR 14
TC 0
Z9 0
U1 0
U2 0
PU INST INTEGRATIVE OMICS & APPLIED BIOTECHNOLOGY
PI KOLKATA
PA NONAKURI, PURBA MEDINIPUR, WEST BENGAL, KOLKATA, 721 172, INDIA
SN 0976-3104
J9 IIOAB J
JI IIOAB J.
PD MAY
PY 2016
VL 7
IS 5
SI SI
BP 58
EP 73
PG 16
WC Biochemistry & Molecular Biology
SC Biochemistry & Molecular Biology
GA EP2EY
UT WOS:000397197100005
ER

PT J
AU Liu, S
   Cui, TJ
   Xu, Q
   Bao, D
   Du, LL
   Wan, X
   Tang, WX
   Ouyang, CM
   Zhou, XY
   Yuan, H
   Ma, HF
   Jiang, WX
   Han, JG
   Zhang, WL
   Cheng, Q
AF Liu, Shuo
   Cui, Tie Jun
   Xu, Quan
   Bao, Di
   Du, Liangliang
   Wan, Xiang
   Tang, Wen Xuan
   Ouyang, Chunmei
   Zhou, Xiao Yang
   Yuan, Hao
   Ma, Hui Feng
   Jiang, Wei Xiang
   Han, Jiaguang
   Zhang, Weili
   Cheng, Qiang
TI Anisotropic coding metamaterials and their powerful manipulation of
   differently polarized terahertz waves
SO LIGHT-SCIENCE & APPLICATIONS
LA English
DT Article
DE anisotropic metamaterial design; coding metamaterial; metasurface;
   terahertz waves
ID 3-DIMENSIONAL BROAD-BAND; GROUND-PLANE CLOAK; METASURFACE HOLOGRAMS;
   PHASE DISCONTINUITIES; VISIBLE-LIGHT; REFRACTION; REFLECTION;
   EFFICIENCY; INDEX; LENS
AB Metamaterials based on effective media can be used to produce a number of unusual physical properties (for example, negative refraction and invisibility cloaking) because they can be tailored with effective medium parameters that do not occur in nature. Recently, the use of coding metamaterials has been suggested for the control of electromagnetic waves through the design of coding sequences using digital elements '0' and '1,' which possess opposite phase responses. Here we propose the concept of an anisotropic coding metamaterial in which the coding behaviors in different directions are dependent on the polarization status of the electromagnetic waves. We experimentally demonstrate an ultrathin and flexible polarization-controlled anisotropic coding metasurface that functions in the terahertz regime using specially designed coding elements. By encoding the elements with elaborately designed coding sequences (both 1-bit and 2-bit sequences), the x- and y-polarized waves can be anomalously reflected or independently diffused in three dimensions. The simulated far-field scattering patterns and near-field distributions are presented to illustrate the dual-functional performance of the encoded metasurface, and the results are consistent with the measured results. We further demonstrate the ability of the anisotropic coding metasurfaces to generate a beam splitter and realize simultaneous anomalous reflections and polarization conversions, thus providing powerful control of differently polarized electromagnetic waves. The proposed method enables versatile beam behaviors under orthogonal polarizations using a single metasurface and has the potential for use in the development of interesting terahertz devices.
C1 [Liu, Shuo; Cui, Tie Jun; Bao, Di; Wan, Xiang; Tang, Wen Xuan; Zhou, Xiao Yang; Ma, Hui Feng; Jiang, Wei Xiang; Cheng, Qiang] Southeast Univ, State Key Lab Millimeter Waves, Nanjing 210096, Jiangsu, Peoples R China.
   [Liu, Shuo; Bao, Di; Wan, Xiang; Tang, Wen Xuan; Zhou, Xiao Yang; Ma, Hui Feng; Jiang, Wei Xiang] Southeast Univ, Synerget Innovat Ctr Wireless Commun Technol, Nanjing 210096, Jiangsu, Peoples R China.
   [Cui, Tie Jun; Zhang, Weili; Cheng, Qiang] Cooperat Innovat Ctr Terahertz Sci, Chengdu 610054, Peoples R China.
   [Xu, Quan; Du, Liangliang; Ouyang, Chunmei; Han, Jiaguang; Zhang, Weili] Tianjin Univ, Ctr Terahertz Waves, Tianjin 300072, Peoples R China.
   [Zhou, Xiao Yang; Yuan, Hao] Tianjin Univ, Coll Precis Instrument & Optoelect Engn, Tianjin 300072, Peoples R China.
   Jiangsu Xuantu Technol Co Ltd, Nanjing 211111, Jiangsu, Peoples R China.
RP Cui, TJ (reprint author), Southeast Univ, State Key Lab Millimeter Waves, Nanjing 210096, Jiangsu, Peoples R China.; Cui, TJ (reprint author), Cooperat Innovat Ctr Terahertz Sci, Chengdu 610054, Peoples R China.
EM tjcui@seu.edu.cn
RI Zhang, Weili/C-5416-2011; Liu, Shuo/I-7922-2016
OI Zhang, Weili/0000-0002-8591-0200; 
FU National Science Foundation of China [61571117, 61522106, 61138001,
   61302018, 61401089]; Natural Science Foundation of the Jiangsu Province
   [BK2012019]; 111 Project [111-2-05]
FX This work was supported by the National Science Foundation of China
   (61571117, 61522106, 61138001, 61302018 and 61401089), Natural Science
   Foundation of the Jiangsu Province (BK2012019), and the 111 Project
   (111-2-05).
CR Aieta F, 2012, NANO LETT, V12, P1702, DOI 10.1021/nl300204s
   Chen HT, 2009, NAT PHOTONICS, V3, P148, DOI 10.1038/NPHOTON.2009.3
   Chen WT, 2014, NANO LETT, V14, P225, DOI 10.1021/nl403811d
   Chen XZ, 2012, NAT COMMUN, V3, DOI 10.1038/ncomms2207
   Cheng Q, 2010, NEW J PHYS, V12, DOI 10.1088/1367-2630/12/6/063006
   Cui TJ, 2014, LIGHT-SCI APPL, V3, DOI 10.1038/lsa.2014.99
   Cui TJ, 2010, METAMATERIALS: THEORY, DESIGN, AND APPLICATIONS, P1, DOI 10.1007/978-1-4419-0573-4
   Gao LH, 2015, LIGHT-SCI APPL, V4, DOI 10.1038/lsa.2015.97
   Della Giovampaola C., 2014, NAT MATER, V13, P1115, DOI DOI 10.1038/NMAT4082
   Holloway CL, 2012, IEEE ANTENN PROPAG M, V54, P10, DOI 10.1109/MAP.2012.6230714
   Kabashin AV, 2009, NAT MATER, V8, P867, DOI [10.1038/nmat2546, 10.1038/NMAT2546]
   Kats MA, 2012, P NATL ACAD SCI USA, V109, P12364, DOI 10.1073/pnas.1210686109
   Li YB, 2014, SCI REP-UK, V4, DOI 10.1038/srep06921
   Li ZF, 2009, PHYS REV E, V79, DOI 10.1103/PhysRevE.79.026610
   Liang LJ, 2015, ADV OPT MATER, V3, P1374, DOI 10.1002/adom.201500206
   Liu LX, 2014, ADV MATER, V26, P5031, DOI 10.1002/adma.201401484
   Liu R, 2009, SCIENCE, V323, P366, DOI 10.1126/science.1166949
   Liu RP, 2007, PHYS REV E, V76, DOI 10.1103/PhysRevE.76.026606
   Liu S, 2014, OPT EXPRESS, V22, P13403, DOI 10.1364/OE.22.013403
   Ma HF, 2010, NAT COMMUN, V1, DOI 10.1038/ncomms1126
   Ma HF, 2010, NAT COMMUN, V1, DOI 10.1038/ncomms1023
   Magnus F, 2008, NAT MATER, V7, P295, DOI 10.1038/nmat2126
   Monticone F, 2013, PHYS REV LETT, V110, DOI 10.1103/PhysRevLett.110.203903
   Ni XJ, 2013, NAT COMMUN, V4, DOI 10.1038/ncomms3807
   Ni XJ, 2013, LIGHT-SCI APPL, V2, DOI 10.1038/lsa.2013.28
   Ni XJ, 2012, SCIENCE, V335, P427, DOI 10.1126/science.1214686
   Pendry JB, 2000, PHYS REV LETT, V85, P3966, DOI 10.1103/PhysRevLett.85.3966
   Schurig D, 2006, SCIENCE, V314, P977, DOI 10.1126/science.1133628
   Shelby RA, 2001, SCIENCE, V292, P77, DOI 10.1126/science.1058847
   Shen XP, 2012, APPL PHYS LETT, V101, DOI 10.1063/1.4757879
   Shin H, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.239903
   Smith DR, 2000, PHYS REV LETT, V84, P4184, DOI 10.1103/PhysRevLett.84.4184
   Sun SL, 2012, NAT MATER, V11, P426, DOI [10.1038/nmat3292, 10.1038/NMAT3292]
   Yao Y, 2013, NANO LETT, V13, P1257, DOI 10.1021/nl3047943
   Ye YQ, 2010, J OPT SOC AM B, V27, P498, DOI 10.1364/JOSAB.27.000498
   Yu NF, 2012, NANO LETT, V12, P6328, DOI 10.1021/nl303445u
   Yu NF, 2011, SCIENCE, V334, P333, DOI 10.1126/science.1210713
   Zhang J, 2013, APPL PHYS LETT, V103, DOI 10.1063/1.4824898
   Zheng GX, 2015, NAT NANOTECHNOL, V10, P308, DOI [10.1038/nnano.2015.2, 10.1038/NNANO.2015.2]
NR 39
TC 24
Z9 24
U1 57
U2 102
PU CHINESE ACAD SCIENCES, CHANGCHUN INST OPTICS FINE MECHANICS AND PHYSICS
PI CHANGCHUN
PA 3888, DONGNANHU ROAD, CHANGCHUN, 130033, PEOPLES R CHINA
SN 2047-7538
J9 LIGHT-SCI APPL
JI Light-Sci. Appl.
PD MAY
PY 2016
VL 5
AR e16076
DI 10.1038/lsa.2016.76
PG 11
WC Optics
SC Optics
GA DM5ZH
UT WOS:000376428600003
ER

PT J
AU Wodarz, S
   Abe, J
   Homma, T
AF Wodarz, Siggi
   Abe, Junya
   Homma, Takayuki
TI Analysis and Control of the Initial Electrodeposition Stages of Co-Pt
   Nanodot Arrays
SO ELECTROCHIMICA ACTA
LA English
DT Article
DE Electrodeposition; Initial deposition; Nanodot array; Bit-patterned
   media; CoPt alloy
ID BIT-PATTERNED MEDIA; ELECTRON-BEAM LITHOGRAPHY; RECORDING MEDIA;
   FABRICATION; DENSITY; FILMS; CHALLENGES; NUCLEATION; ANISOTROPY; STORAGE
AB We have fabricated Co-Pt nanodot arrays by combining electrodeposition with electron beam lithography (EBL) for applications in ultra-high density magnetic recording media, such as bit-patterned media (BPM). In this work, we analyzed the initial nucleation and growth of Co-Pt inside nanopores to achieve nanodot arrays with high deposition uniformity, as well as magnetic properties. At -900 mV (vs. Ag/AgCl), multiple nuclei of 2.0-3.0 nm in size were randomly distributed, even in nanopores with a 10 nm diameter, which could result in a lack of uniformity in the magnetic properties. The number of nuclei was then reduced by applying a less negative potential (>-700 mV vs. Ag/AgCl) to deposit a single nucleus inside each nanopore. As a result, a single grain of 5.0-10 nm in size was successfully deposited inside the nanopore, which could induce uniform magnetic properties in each nanodot. In addition, at less negative potentials, the coercivity of the Co-Pt films increased, which was induced by the epitaxial-like growth of Co-Pt from the Ru substrate. Cross-sectional TEM analysis suggested that Co-Pt deposited with a less negative potential was single crystalline with uniform hcp lattice fringes in the direction perpendicular to the Ru interface, indicating the formation of highly uniform nanodot arrays with high perpendicular magnetic anisotropy. (C) 2015 Elsevier Ltd. All rights reserved.
C1 [Wodarz, Siggi; Abe, Junya; Homma, Takayuki] Waseda Univ, Dept Appl Chem, Shinjuku Ku, Tokyo 1698555, Japan.
RP Homma, T (reprint author), Waseda Univ, Dept Appl Chem, Shinjuku Ku, Tokyo 1698555, Japan.
EM t.homma@waseda.jp
FU JSPS KAKENHI Grant [25249104]
FX This work was supported in part by JSPS KAKENHI Grant Number 25249104.
CR Cheng JY, 2001, ADV MATER, V13, P1174, DOI 10.1002/1521-4095(200108)13:15<1174::AID-ADMA1174>3.0.CO;2-Q
   Hachisu T, 2012, J MAGN MAGN MATER, V324, P303, DOI 10.1016/j.jmmm.2010.12.023
   Hellwig O, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3293301
   Homma Takayuki, 2015, ECS Transactions, V64, P1, DOI 10.1149/06431.0001ecst
   Jeong GH, 2008, J MAGN MAGN MATER, V320, P2985, DOI 10.1016/j.jmmm.2008.08.095
   Kryder MH, 2008, P IEEE, V96, P1810, DOI 10.1109/JPROC.2008.2004315
   Lodder JC, 2004, J MAGN MAGN MATER, V272, P1692, DOI 10.1016/j.jmmm.2003.12.259
   McClelland GM, 2002, APPL PHYS LETT, V81, P1483, DOI 10.1063/1.1501763
   Ouchi T, 2008, J MAGN MAGN MATER, V320, P3104, DOI 10.1016/j.jmmm.2008.08.022
   Ouchi T, 2010, ELECTROCHIM ACTA, V55, P8081, DOI 10.1016/j.electacta.2010.02.073
   Ouchi T, 2010, IEEE T MAGN, V46, P2224, DOI 10.1109/TMAG.2010.2040068
   Pattanaik G, 2006, J APPL PHYS, V99, DOI 10.1063/1.2150805
   Piramanayagam SN, 2009, J MAGN MAGN MATER, V321, P485, DOI 10.1016/j.jmmm.2008.05.007
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Romankiw LT, 1997, ELECTROCHIM ACTA, V42, P2985, DOI 10.1016/S0013-4686(97)00146-1
   SCHARIFKER B, 1983, ELECTROCHIM ACTA, V28, P879, DOI 10.1016/0013-4686(83)85163-9
   SCHARIFKER BR, 1984, J ELECTROANAL CHEM, V177, P13, DOI 10.1016/0022-0728(84)80207-7
   Shiroishi Y, 2009, IEEE T MAGN, V45, P3816, DOI 10.1109/TMAG.2009.2024879
   Sun SH, 2000, SCIENCE, V287, P1989, DOI 10.1126/science.287.5460.1989
   Terris BD, 2009, J MAGN MAGN MATER, V321, P512, DOI 10.1016/j.jmmm.2008.05.046
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Ustarroz J, 2012, J PHYS CHEM C, V116, P2322, DOI 10.1021/jp210276z
   Weller D, 2000, IEEE T MAGN, V36, P10, DOI 10.1109/20.824418
   Wodarz S., 2015, ECS T, V64, P99
   Yang X, 2007, J VAC SCI TECHNOL B, V25, P2202, DOI 10.1116/1.2798711
   Yang XM, 2009, ACS NANO, V3, P1844, DOI 10.1021/nn900073r
   Zana I, 2005, J MAGN MAGN MATER, V292, P266, DOI 10.1016/j.jmmm.2004.11.141
   Zana I, 2003, ELECTROCHEM SOLID ST, V6, pC153, DOI 10.1149/1.1619648
NR 28
TC 1
Z9 1
U1 9
U2 28
PU PERGAMON-ELSEVIER SCIENCE LTD
PI OXFORD
PA THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD OX5 1GB, ENGLAND
SN 0013-4686
EI 1873-3859
J9 ELECTROCHIM ACTA
JI Electrochim. Acta
PD APR 10
PY 2016
VL 197
BP 330
EP 335
DI 10.1016/j.electacta.2015.11.136
PG 6
WC Electrochemistry
SC Electrochemistry
GA DH8OO
UT WOS:000373054200038
ER

PT J
AU Best, PB
   Photopoulou, T
AF Best, Peter B.
   Photopoulou, Theoni
TI Identifying the "demon whale-biter": Patterns of scarring on large
   whales attributed to a cookie-cutter shark Isistius sp
SO PLOS ONE
LA English
DT Article
ID SQUALOID SHARK; KILLER WHALES; SOUTH-AFRICA; BRASILIENSIS; MOVEMENTS;
   CETACEANS; TRANSPORT; FISHES; WOUNDS; HAWAII
AB The presence of crater-like wounds on cetaceans and other large marine vertebrates and invertebrates has been attributed to various organisms. We review the evidence for the identity of the biting agent responsible for crater wounds on large whales, using data collected from sei (Balaenoptera borealis), fin (B. physalus), inshore and offshore Bryde's (B. brydeii sp) and sperm whales (Physeter macrocephalus) examined at the Donkergat whaling station, Saldanha Bay, South Africa between March and October 1963. We then analyse the intensity and trends in its predation on large whales. Despite the scarcity of local records, we conclude that a cookie-cutter shark Isistius sp is the most likely candidate. We make inferences about the trends in (1) total counts of unhealed bitemarks, and (2) the proportion of unhealed bitemarks that were recent. We use day of the year; reproductive class, social grouping or sex; depth interval and body length as candidate covariates. The models with highest support for total counts of unhealed bitemarks involve the day of the year in all species. Depth was an important predictor in all species except offshore Bryde's whales. Models for the proportion of recent bites were only informative for sei and fin whales. We conclude that temporal scarring patterns support what is currently hypothesized about the distribution and movements of these whale species, given that Isistius does not occur in the Antarctic and has an oceanic habitat. The incidence of fresh bites confirms the presence of Isistius in the region. The lower numbers of unhealed bites on medium-sized sperm whales suggests that this group spends more time outside the area in which bites are incurred, providing a clue to one of the biggest gaps in our understanding of the movements of mature and maturing sperm males.
C1 [Best, Peter B.] Univ Pretoria, Dept Zool & Entomol, Mammal Res Inst, ZA-0002 Pretoria, South Africa.
   [Photopoulou, Theoni] Univ Cape Town, Dept Stat Sci, Ctr Stat Ecol Environm & Conservat, ZA-7700 Rondebosch, South Africa.
RP Photopoulou, T (reprint author), Univ Cape Town, Dept Stat Sci, Ctr Stat Ecol Environm & Conservat, ZA-7700 Rondebosch, South Africa.
EM theoni.photopoulou@gmail.com
CR Barton K., 2013, MUMIN MULTIMODEL INF
   Bass AJ, 1976, SHARKS E COAST SO AF, VIV
   Berzin A, 1972, ISR PROGR SCI TRANSL
   Best P.B., 1979, Behavior of Marine Animals, V3, P227
   Best PB, 2001, MAR ECOL PROG SER, V220, P277, DOI 10.3354/meps220277
   Best PB, 1999, S AFR J MARINE SCI, V21, P393
   Best PB, 2007, WHALES DOLPHINS SO A
   Best PB, 1977, REPORTS INT WHALING, V1, P10
   Best Peter B., 1996, Report of the International Whaling Commission, V46, P315
   Best Peter B., 2001, Journal of Cetacean Research and Management Special Issue, V2, P161
   CLARKE MR, 1972, J MAR BIOL ASSOC UK, V52, P599
   Collett R, 1886, P ZOOL SOC LOND, V18, P243
   Dwyer SL, 2011, AQUAT MAMM, V37, P111, DOI 10.1578/AM.37.2.2011.111
   Fristrup KM, 2002, MAR MAMMAL SCI, V18, P42, DOI 10.1111/j.1748-7692.2002.tb01017.x
   Goodall Thomas B., 1913, Zoologist London, V17
   Hoyos-Padilla M, 2013, PAC SCI, V67, P129, DOI 10.2984/67.1.10
   International Whaling Commission, 1946, SCHED INT CONV REG W
   ISOUCHI T, 1970, Japanese Journal of Ichthyology, V17, P124
   Ivashin M, 1978, REP INT WHAL COMM, V199
   Jahn A. E., 1988, BIOL OCEANOGRAPHY, V5, P297
   Jones E., 1971, Fishery Bull US natn Ocean atmos Admn, V69, P791
   Krefft G., 1953, Zoologischer Anzeiger, V150, P275
   Mackintosh N. A., 1929, Discovery Reports Cambridge, V1, P257
   Mate BR, 2011, MAR MAMMAL SCI, V27, P455, DOI 10.1111/j.1748-7692.2010.00412.x
   MATTHEWS L. HARRISON, 1938, DISCOVERY REPTS [GOVT DEPENDENCIES FALKLAND ISLANDS], V17, P183
   MATTHEWS L. HARRISON, 1938, DISCOVERY REPTS [GOVT DEPENDENCIES FALKLAND ISLANDS], V17, P93
   McSweeney DJ, 2007, MAR MAMMAL SCI, V23, P666, DOI 10.1111/j.1748-7692.2007.00135.x
   Moore Michael, 2003, Aquatic Mammals, V29, P383, DOI 10.1578/01675420360736569
   North American Cartographic Information Society, 2013, NAT EARTH DAT
   Olsen O, 1913, P ZOOL SOC LOND, V1913, P1073
   Papastamatiou YP, 2010, ENVIRON BIOL FISH, V88, P361, DOI 10.1007/s10641-010-9649-2
   Penry G, 2010, BIOL S AFRICAN BRYDE
   PIKE G. C., 1951, JOUR FISH RES BD CANADA, V8, P275
   de la Gala-Hernandez SR, 2008, CAN J ZOOL, V86, P307, DOI 10.1139/Z07-141
   Shevchenko V, 1971, T ALANTNIRO, V39, P67
   Shevchenko V., 1970, PRIRODA, V6, P72
   Shevchenko V., 1977, REP INT WHAL COMMN, P130
   Souto Luciano Raimundo Alardo, 2007, Biotemas, V20, P19
   Wagenmakers EJ, 2004, PSYCHON B REV, V11, P192, DOI 10.3758/BF03206482
   Whitehead H., 2003, SPERM WHALES SOCIAL
   Widder EA, 1998, ENVIRON BIOL FISH, V53, P267, DOI 10.1023/A:1007498915860
   Williams R, 2009, MAR MAMMAL SCI, V25, P327, DOI 10.1111/j.1748-7692.2008.00255.x
   Wiseman N., 2008, GENETIC IDENTITY ECO
   Wood SN, 2011, J R STAT SOC B, V73, P3, DOI 10.1111/j.1467-9868.2010.00749.x
NR 44
TC 1
Z9 1
U1 5
U2 21
PU PUBLIC LIBRARY SCIENCE
PI SAN FRANCISCO
PA 1160 BATTERY STREET, STE 100, SAN FRANCISCO, CA 94111 USA
SN 1932-6203
J9 PLOS ONE
JI PLoS One
PD APR 7
PY 2016
VL 11
IS 4
AR e0152643
DI 10.1371/journal.pone.0152643
PG 20
WC Multidisciplinary Sciences
SC Science & Technology - Other Topics
GA DI6KO
UT WOS:000373608000031
PM 27055057
ER

PT J
AU Grafe, J
   Weigand, M
   Trager, N
   Schutz, G
   Goering, EJ
   Skripnik, M
   Nowak, U
   Haering, F
   Ziemann, P
   Wiedwald, U
AF Graefe, Joachim
   Weigand, Markus
   Traeger, Nick
   Schuetz, Gisela
   Goering, Eberhard J.
   Skripnik, Maxim
   Nowak, Ulrich
   Haering, Felix
   Ziemann, Paul
   Wiedwald, Ulf
TI Geometric control of the magnetization reversal in antidot lattices with
   perpendicular magnetic anisotropy
SO PHYSICAL REVIEW B
LA English
DT Article
ID PERMALLOY ARRAYS; FILMS; NANOSTRUCTURES; DEPENDENCE; CURVES; ORDER
AB While themagnetic properties of nanoscaled antidot lattices in in-plane magnetized materials have widely been investigated, much less is known about the microscopic effect of hexagonal antidot lattice patterning on materials with perpendicular magnetic anisotropy. By using a combination of first-order reversal curve measurements, magnetic x-ray microscopy, and micromagnetic simulations we elucidate the microscopic origins of the switching field distributions that arise from the introduction of antidot lattices into out-of-plane magnetized GdFe thin films. Depending on the geometric parameters of the antidot lattice we find two regimes with different magnetization reversal processes. For small antidots, the reversal process is dominated by the exchange interaction and domain wall pinning at the antidots drives up the coercivity of the system. On the other hand, for large antidots the dipolar interaction is dominating which leads to fragmentation of the system into very small domains that can be envisaged as a basis for a bit patterned media.
C1 [Graefe, Joachim; Weigand, Markus; Traeger, Nick; Schuetz, Gisela; Goering, Eberhard J.] Max Planck Inst Intelligent Syst, Stuttgart, Germany.
   [Skripnik, Maxim; Nowak, Ulrich] Univ Konstanz, Dept Phys, Constance, Germany.
   [Haering, Felix; Ziemann, Paul] Univ Ulm, Inst Solid State Phys, D-89069 Ulm, Germany.
   [Wiedwald, Ulf] Univ Duisburg Essen, Fac Phys, Duisburg, Germany.
   [Wiedwald, Ulf] Univ Duisburg Essen, Ctr Nanointegrat CENIDE, Duisburg, Germany.
RP Grafe, J; Goering, EJ (reprint author), Max Planck Inst Intelligent Syst, Stuttgart, Germany.
EM graefe@is.mpg.de; goering@is.mpg.de
RI Wiedwald, Ulf/E-4625-2011
OI Grafe, Joachim/0000-0002-4597-5923
FU Baden-Wurttemberg Stiftung
FX The authors would like to thank Michael Bechtel for support during beam
   times and Bernd Ludescher for thin film deposition. Furthermore, we are
   grateful to Ulrike Eigenthaler for performing SEM measurements.
   Helmholtz Zentrum Berlin is acknowledged for allocating beam time at the
   BESSY II synchrotron radiation facility. Financial support by the
   Baden-Wurttemberg Stiftung in the framework of the Kompetenznetz
   Funktionelle Nanostrukturen is gratefully acknowledged.
CR Amaladass E, 2007, APPL PHYS LETT, V91, DOI 10.1063/1.2802075
   Beron F, 2011, NEW J PHYS, V13, DOI 10.1088/1367-2630/13/1/013035
   Beron F, 2010, ELECTRODEPOSITED NANOWIRES AND THEIR APPLICATIONS, P167
   Castano FJ, 2004, APPL PHYS LETT, V85, P2872, DOI 10.1063/1.1800281
   Cowburn RP, 1997, APPL PHYS LETT, V70, P2309, DOI 10.1063/1.118845
   Ctistis G, 2009, NANO LETT, V9, P1, DOI 10.1021/nl801811t
   Davies JE, 2004, PHYS REV B, V70, DOI 10.1103/PhysRevB.70.224434
   Davies JE, 2005, APPL PHYS LETT, V86, DOI 10.1063/1.1954898
   Davies R, 2011, SURF SCI, V605, P1754, DOI 10.1016/j.susc.2011.06.017
   Dobrota CI, 2015, PHYSICA B, V457, P280, DOI 10.1016/j.physb.2014.10.006
   Dobrota CI, 2013, J APPL PHYS, V113, DOI 10.1063/1.4789613
   Evans RFL, 2012, PHYS REV B, V85, DOI 10.1103/PhysRevB.85.014433
   Gawronski P, 2012, EPL-EUROPHYS LETT, V100, DOI 10.1209/0295-5075/100/17007
   Grafe J, 2016, PHYS REV B, V93, DOI 10.1103/PhysRevB.93.014406
   Grafe J, 2015, NANOTECHNOLOGY, V26, DOI 10.1088/0957-4484/26/22/225203
   Grafe J, 2014, REV SCI INSTRUM, V85, DOI 10.1063/1.4865135
   Haering F., 2013, NANOTECHNOLOGY, V24, DOI DOI 10.1088/0957-4484/24/46/465709
   Haering F, 2013, NANOTECHNOLOGY, V24, DOI 10.1088/0957-4484/24/5/055305
   Harrison RJ, 2008, GEOCHEM GEOPHY GEOSY, V9, DOI 10.1029/2008GC001987
   Heyderman LJ, 2013, NAT NANOTECHNOL, V8, P705, DOI 10.1038/nnano.2013.193
   Heyderman LJ, 2006, PHYS REV B, V73, DOI 10.1103/PhysRevB.73.214429
   Huang YC, 2012, J APPL PHYS, V111, DOI 10.1063/1.3689446
   Jalil MBA, 2003, J APPL PHYS, V93, P7053, DOI 10.1063/1.1557394
   Kazantseva N, 2008, PHYS REV B, V77, DOI 10.1103/PhysRevB.77.184428
   Laguna MR, 2001, PHYS REV B, V64, DOI 10.1103/PhysRevB.64.104505
   Lenk B, 2011, PHYS REP, V507, P107, DOI 10.1016/j.physrep.2011.06.003
   Mallick S, 2015, J MAGN MAGN MATER, V382, P158, DOI 10.1016/j.jmmm.2015.01.049
   Mengotti E, 2011, NAT PHYS, V7, P68, DOI [10.1038/nphys1794, 10.1038/NPHYS1794]
   Merazzo KJ, 2012, PHYS REV B, V85, DOI 10.1103/PhysRevB.85.184427
   Morgan J P, 2010, NATURE PHYS, V7, P75
   Navas D, 2012, NEW J PHYS, V14, DOI 10.1088/1367-2630/14/11/113001
   Nolle D, 2012, REV SCI INSTRUM, V83, DOI 10.1063/1.4707747
   Pechan MJ, 2005, J APPL PHYS, V97, DOI [10.1063/1.1857412, 10.1063/1.1854712]
   Pike CR, 2005, PHYS REV B, V71, DOI 10.1103/PhysRevB.71.134407
   Pike CR, 1999, J APPL PHYS, V85, P6660, DOI 10.1063/1.370176
   Plettl A, 2009, ADV FUNCT MATER, V19, P3279, DOI 10.1002/adfm.200900907
   Proenca MP, 2013, NANOTECHNOLOGY, V24, DOI 10.1088/0957-4484/24/47/475703
   Rasband W. S, 2016, IMAGEJ
   Roberts AP, 2000, J GEOPHYS RES-SOL EA, V105, P28461, DOI 10.1029/2000JB900326
   Skripnik M., 2014, THESIS U KONSTANZ
   Thevenaz P, 1998, IEEE T IMAGE PROCESS, V7, P27, DOI 10.1109/83.650848
   Torres L, 1998, APPL PHYS LETT, V73, P3766, DOI 10.1063/1.122888
   Tripathy D, 2011, NEW J PHYS, V13, DOI 10.1088/1367-2630/13/2/023035
   Wang CC, 2006, NANOTECHNOLOGY, V17, P1629, DOI 10.1088/0957-4484/17/6/015
   Wang CC, 2003, J APPL PHYS, V94, P6644, DOI 10.1063/1.1620682
   Wiedwald U, 2012, BEILSTEIN J NANOTECH, V3, P831, DOI 10.3762/bjnano.3.93
   Yu HM, 2013, NAT COMMUN, V4, DOI 10.1038/ncomms3702
NR 47
TC 5
Z9 5
U1 9
U2 20
PU AMER PHYSICAL SOC
PI COLLEGE PK
PA ONE PHYSICS ELLIPSE, COLLEGE PK, MD 20740-3844 USA
SN 2469-9950
EI 2469-9969
J9 PHYS REV B
JI Phys. Rev. B
PD MAR 28
PY 2016
VL 93
IS 10
AR 104421
DI 10.1103/PhysRevB.93.104421
PG 9
WC Physics, Condensed Matter
SC Physics
GA DH5AX
UT WOS:000372798400002
ER

PT J
AU Vogler, C
   Abert, C
   Bruckner, F
   Suess, D
   Praetorius, D
AF Vogler, Christoph
   Abert, Claas
   Bruckner, Florian
   Suess, Dieter
   Praetorius, Dirk
TI Heat-assisted magnetic recording of bit-patterned media beyond 10
   Tb/in(2)
SO APPLIED PHYSICS LETTERS
LA English
DT Article
AB The limits of areal storage density that is achievable with heat-assisted magnetic recording are unknown. We addressed this central question and investigated the areal density of bit-patterned media. We analyzed the detailed switching behavior of a recording bit under various external conditions, allowing us to compute the bit error rate of a write process (shingled and conventional) for various grain spacings, write head positions, and write temperatures. Hence, we were able to optimize the areal density yielding values beyond 10 Tb/in(2). Our model is based on the Landau-Lifshitz-Bloch equation and uses hard magnetic recording grains with a 5-nm diameter and 10-nm height. It assumes a realistic distribution of the Curie temperature of the underlying material, grain size, as well as grain and head position. (C) 2016 AIP Publishing LLC.
C1 [Vogler, Christoph] TU Wien, Inst Solid State Phys, Wiedner Hauptstr 8-10, A-1040 Vienna, Austria.
   [Abert, Claas; Bruckner, Florian; Suess, Dieter] TU Wien, Christian Doppler Lab Adv Magnet Sensing & Mat, Inst Solid State Phys, Wiedner Hauptstr 8-10, A-1040 Vienna, Austria.
   [Vogler, Christoph; Praetorius, Dirk] TU Wien, Inst Anal & Sci Comp, Wiedner Hauptstr 8-10, A-1040 Vienna, Austria.
RP Vogler, C (reprint author), TU Wien, Inst Solid State Phys, Wiedner Hauptstr 8-10, A-1040 Vienna, Austria.
EM christoph.vogler@tuwien.ac.at
RI Suess, Dieter/H-7475-2012
OI Suess, Dieter/0000-0001-5453-9974
FU Vienna Science and Technology Fund (WWTF) [MA14-044]; Austrian Science
   Fund (FWF) [F4112 SFB ViCoM]; Advanced Storage Technology Consortium
   (ASTC); CD-Laboratory AMSEN - Austrian Federal Ministry of Economy,
   Family and Youth; CD-Laboratory AMSEN - National Foundation for
   Research, Technology and Development
FX The authors would like to thank the Vienna Science and Technology Fund
   (WWTF) under Grant No. MA14-044, the Austrian Science Fund (FWF): F4112
   SFB ViCoM, and the Advanced Storage Technology Consortium (ASTC) for
   financial support. Support from the CD-Laboratory AMSEN (financed by the
   Austrian Federal Ministry of Economy, Family and Youth, the National
   Foundation for Research, Technology and Development) is acknowledged.
   The computational results presented have been achieved using the Vienna
   Scientific Cluster (VSC).
CR Atxitia U, 2007, APPL PHYS LETT, V91, DOI 10.1063/1.2822807
   Bunce C, 2010, PHYS REV B, V81, DOI 10.1103/PhysRevB.81.174428
   Chubykalo-Fesenko O, 2006, PHYS REV B, V74, DOI 10.1103/PhysRevB.74.094436
   Evans RFL, 2012, PHYS REV B, V85, DOI 10.1103/PhysRevB.85.014433
   Garanin DA, 2004, PHYS REV B, V70, DOI 10.1103/PhysRevB.70.212409
   Greaves S, 2012, IEEE T MAGN, V48, P1794, DOI 10.1109/TMAG.2012.2187776
   Ju GP, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2015.2439690
   Kazantseva N, 2008, PHYS REV B, V77, DOI 10.1103/PhysRevB.77.184428
   MAYER L, 1958, J APPL PHYS, V29, P1003, DOI 10.1063/1.1723319
   McDaniel TW, 2012, J APPL PHYS, V112, DOI 10.1063/1.4733311
   MEE CD, 1967, IEEE T MAGN, VMAG3, P72, DOI 10.1109/TMAG.1967.1066003
   Mendil J, 2014, SCI REP-UK, V4, DOI 10.1038/srep03980
   Rausch T., 2015, IEEE T MAGN, V51, P1
   Rausch T, 2013, IEEE T MAGN, V49, P730, DOI 10.1109/TMAG.2012.2218228
   Richter HJ, 2012, J APPL PHYS, V111, DOI 10.1063/1.3681297
   Rottmayer RE, 2006, IEEE T MAGN, V42, P2417, DOI 10.1109/TMAG.2006.879572
   Schieback C, 2009, PHYS REV B, V80, DOI 10.1103/PhysRevB.80.214403
   Vogler C., ARXIV151203690CONDMA
   Vogler C, 2014, PHYS REV B, V90, DOI 10.1103/PhysRevB.90.214431
   Wang Y, 2013, IEEE T MAGN, V49, P5208, DOI 10.1109/TMAG.2013.2260349
   Kobayashi H., 1984, Japan patent application, Patent No. [JPS57113402, 57113402]
   Lewicki G. W., 1969, U. S. patent application, Patent No. [US3626114, 3626114]
NR 22
TC 8
Z9 8
U1 0
U2 7
PU AMER INST PHYSICS
PI MELVILLE
PA 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
SN 0003-6951
EI 1077-3118
J9 APPL PHYS LETT
JI Appl. Phys. Lett.
PD MAR 7
PY 2016
VL 108
IS 10
AR 102406
DI 10.1063/1.4943629
PG 4
WC Physics, Applied
SC Physics
GA DH7KV
UT WOS:000372973600027
ER

PT J
AU Qin, ZL
   Cai, K
   Ng, YB
AF Qin, Zhiliang
   Cai, Kui
   Ng, Yibin
TI Iterative detection and decoding for non-binary LDPC coded
   partial-response channels with written-in errors
SO IET COMMUNICATIONS
LA English
DT Article
ID BIT-PATTERNED MEDIA; PARITY-CHECK CODES; TURBO EQUALIZATION;
   CONSTRUCTIONS
AB In this study, the authors investigate the performance of iterative detection and decoding for non-binary low-density parity-check (LDPC) coded partial-response (PR) channels, where written-in errors are present to introduce bit-flipping to LDPC code bits prior to the transmission over PR channels. From a probabilistic perspective, the written-in errors are modelled as the output of a binary symmetrical channel (BSC) with crossover probability equal to the write error probability. Several iterative receivers are presented for the considered system. Specifically, the authors propose a symbol-level Bahl-Cocke-Jelinek-Raviv (BCJR) channel detector based on a sectionalised representation of the joint BSC and PR trellis to produce directly the soft information of non-binary LDPC code symbols, thus avoiding suboptimal symbol/bit log-likelihood ratio conversions as required in bit-level detection schemes. Simulation results show that the proposed symbol-level iterative receiver provides much better bit-error-rate performance over bit-level schemes. Moreover, the proposed receiver enables non-binary LDPC codes to achieve a notable coding gain over their binary counterparts for channels affected with written-in errors.
C1 [Qin, Zhiliang; Ng, Yibin] Data Storage Inst, 5 Engn Dr 1, Singapore 117608, Singapore.
   [Cai, Kui] Singapore Univ Technol & Design, 8 Somapah Rd, Singapore 487372, Singapore.
RP Qin, ZL (reprint author), Data Storage Inst, 5 Engn Dr 1, Singapore 117608, Singapore.
EM qin_zhiliang@dsi.a-star.edu.sg
CR BAHL LR, 1974, IEEE T INFORM THEORY, V20, P284, DOI 10.1109/TIT.1974.1055186
   Benedetto S, 1998, IEEE J SEL AREA COMM, V16, P231, DOI 10.1109/49.661111
   Brink S. T., 2004, IEEE T COMMUN, V52, P670
   Chang W, 2008, IEEE T MAGN, V44, P3781, DOI 10.1109/TMAG.2008.2002368
   Davey MC, 1998, IEEE COMMUN LETT, V2, P165, DOI 10.1109/4234.681360
   Hu J, 2007, IEEE T MAGN, V43, P3517, DOI 10.1109/TMAG.2007.898307
   Jeon S, 2010, IEEE T MAGN, V46, P2248, DOI 10.1109/TMAG.2010.2043068
   Koetter R, 2004, IEEE SIGNAL PROC MAG, V21, P67, DOI 10.1109/MSP.2004.1267050
   Kschischang FR, 2001, IEEE T INFORM THEORY, V47, P498, DOI 10.1109/18.910572
   Kurkoski BM, 2002, IEEE T INFORM THEORY, V48, P1410, DOI 10.1109/TIT.2002.1003830
   Lafourcade A, 1996, IEEE T INFORM THEORY, V42, P689, DOI 10.1109/18.490504
   Li J, 2002, IEEE T COMMUN, V50, P723, DOI 10.1109/TCOMM.2002.1006554
   MacKay DJC, 1999, IEEE T INFORM THEORY, V45, P399, DOI 10.1109/18.748992
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Souvignier TV, 2000, IEEE T COMMUN, V48, P1297, DOI 10.1109/26.864167
   Spagnol C, 2009, IEEE T CIRCUITS-I, V56, P2609, DOI 10.1109/TCSI.2009.2016621
   Vasic B, 2004, IEEE T INFORM THEORY, V50, P1156, DOI 10.1109/TIT.2004.828066
   Wen L, 2015, IEEE T WIREL COMMUN, V14, P1823, DOI 10.1109/TWC.2014.2373379
   Kurtas A. E., 2004, CODING SIGNAL PROCES
   Zeng LQ, 2008, IEEE T COMMUN, V56, P545, DOI 10.1109/TCOMM.2008.060024
NR 20
TC 0
Z9 0
U1 0
U2 4
PU INST ENGINEERING TECHNOLOGY-IET
PI HERTFORD
PA MICHAEL FARADAY HOUSE SIX HILLS WAY STEVENAGE, HERTFORD SG1 2AY, ENGLAND
SN 1751-8628
EI 1751-8636
J9 IET COMMUN
JI IET Commun.
PD MAR 3
PY 2016
VL 10
IS 4
BP 399
EP 406
DI 10.1049/iet-com.2015.0615
PG 8
WC Engineering, Electrical & Electronic
SC Engineering
GA DG6PP
UT WOS:000372208100007
ER

PT J
AU Ji, SX
   Wan, L
   Liu, CC
   Nealey, PF
AF Ji, Shengxiang
   Wan, Lei
   Liu, Chi-Chun
   Nealey, Paul F.
TI Directed self-assembly of block copolymers on chemical patterns: A
   platform for nanofabrication
SO PROGRESS IN POLYMER SCIENCE
LA English
DT Review
DE Directed self-assembly; Chemical pattern; Block copolymer lithography;
   Nanofabrication; Pattern transfer; Bit-patterned media
ID SEQUENTIAL INFILTRATION SYNTHESIS; DEVICE-ORIENTED STRUCTURES;
   ELECTRON-BEAM LITHOGRAPHY; FLASH IMPRINT LITHOGRAPHY; ORDER-DISORDER
   TRANSITION; DOMAIN-BOUNDARY STRUCTURE; ATOMIC LAYER DEPOSITION; SOLVENT
   VAPOR TREATMENT; LONG-RANGE ORDER; THIN-FILMS
AB Directed self-assembly (DSA) of block copolymers (BCPs) on lithographically defined chemically nanopatterned surfaces (or chemical patterns) combines advantages of conventional photolithography and polymeric materials and shows promise for meeting a sufficiently inclusive set of manufacturing constraints for applications in semiconductors and data storage. DSA attracts attention from both academia and industry and tremendous progress has been achieved in the past decade. This review highlights the development of DSA with an emphasis on efforts toward the integration of block copolymer lithography into the current lithographic process for the fabrication of devices for integrated circuits and bit-patterned media. (C) 2015 Elsevier Ltd. All rights reserved.
C1 [Ji, Shengxiang] Chinese Acad Sci, Changchun Inst Appl Chem, Key Lab Polymer Ecomat, 5625 Renmin St, Changchun 130022, Peoples R China.
   [Wan, Lei] HGST A Western Digital Co, 3403 Yerba Buena Rd, San Jose, CA 95135 USA.
   [Liu, Chi-Chun] IBM Albany NanoTech, 257 Fuller Rd, Albany, NY 12203 USA.
   [Nealey, Paul F.] Univ Chicago, Inst Mol Engn, 5747 South Ellis Ave, Chicago, IL 60637 USA.
RP Ji, SX (reprint author), Chinese Acad Sci, Changchun Inst Appl Chem, Key Lab Polymer Ecomat, 5625 Renmin St, Changchun 130022, Peoples R China.
EM sji@ciac.ac.cn; lei.wan@hgst.com; cliu@us.ibm.com; nealey@uchicago.edu
RI Ji, Shengxiang/A-7567-2015
OI Ji, Shengxiang/0000-0003-0336-0530
FU National Natural Science Foundation of China [51173181, 51373166];
   Chinese Academy of Sciences
FX We gratefully thank the funding from the National Natural Science
   Foundation of China (Nos. 51173181, 51373166) and "The Hundred Talents
   Program" from the Chinese Academy of Sciences.
CR Albrecht TR, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2015.2397880
   ANASTASIADIS SH, 1989, PHYS REV LETT, V62, P1852, DOI 10.1103/PhysRevLett.62.1852
   Angelescu DE, 2004, ADV MATER, V16, P1736, DOI 10.1002/adma.200400643
   Bailey GE, 2007, P SOC PHOTO-OPT INS, V6521
   BANASZAK M, 1992, MACROMOLECULES, V25, P3406, DOI 10.1021/ma00039a015
   Bates CM, 2012, SCIENCE, V338, P775, DOI 10.1126/science.1226046
   Bates CM, 2011, LANGMUIR, V27, P2000, DOI 10.1021/la1042958
   BATES FS, 1982, MACROMOLECULES, V15, P589, DOI 10.1021/ma00230a073
   BATES FS, 1990, ANNU REV PHYS CHEM, V41, P525, DOI 10.1146/annurev.pc.41.100190.002521
   Bencher C, 2011, P SOC PHOTO-OPT INS, V7970
   Bencher C, 2012, P SOC PHOTO-OPT INS, V8323
   Biswas M, 2014, CHEM MATER, V26, P6135, DOI 10.1021/cm502427q
   Bita I, 2008, SCIENCE, V321, P939, DOI 10.1126/science.1159352
   Black CT, 2007, IBM J RES DEV, V51, P605
   Black CT, 2004, IEEE T NANOTECHNOL, V3, P412, DOI 10.1109/TNANO.2004.834160
   Borah D, 2013, ACS APPL MATER INTER, V5, P2004, DOI 10.1021/am302830w
   Bosworth JK, 2008, ACS NANO, V2, P1396, DOI 10.1021/nn8001505
   Bosworth JK, 2010, J PHOTOPOLYM SCI TEC, V23, P145, DOI 10.2494/photopolymer.23.145
   Chan BT, 2014, MICROELECTRON ENG, V123, P180, DOI 10.1016/j.mee.2014.07.028
   Cheng JY, 2008, ADV MATER, V20, P3155, DOI 10.1002/adma.200800826
   Cheng JY, 2003, ADV MATER, V15, P1599, DOI 10.1002/adma.200305244
   Cheng JY, 2002, APPL PHYS LETT, V81, P3657, DOI 10.1063/1.1519356
   Cheng JY, 2001, ADV MATER, V13, P1174, DOI 10.1002/1521-4095(200108)13:15<1174::AID-ADMA1174>3.0.CO;2-Q
   Cheng JY, 2004, NAT MATER, V3, P823, DOI 10.1038/nmat1211
   CHOU SY, 1994, J APPL PHYS, V76, P6673, DOI 10.1063/1.358164
   Chou SY, 1996, SCIENCE, V272, P85, DOI 10.1126/science.272.5258.85
   Chuang VP, 2009, NANO LETT, V9, P4364, DOI 10.1021/nl902646e
   Colburn M, 1999, P SOC PHOTO-OPT INS, V3676, P379, DOI 10.1117/12.351155
   Cushen JD, 2014, J POLYM SCI POL PHYS, V52, P36, DOI 10.1002/polb.23408
   Daoulas KC, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.036104
   Delcambre SP, 2012, J VAC SCI TECHNOL B, V30, DOI 10.1116/1.4766916
   Delgadillo PR, 2013, P SOC PHOTO-OPT INS, V8680
   Detcheverry FA, 2010, MACROMOLECULES, V43, P3446, DOI 10.1021/ma902332h
   Doerk GS, 2015, NANOTECHNOLOGY, V26, DOI 10.1088/0957-4484/26/8/085304
   Doerk GS, 2013, ACS NANO, V7, P276, DOI 10.1021/nn303974j
   Edwards EW, 2007, MACROMOLECULES, V40, P90, DOI 10.1021/ma0607564
   Edwards EW, 2006, MACROMOLECULES, V39, P3598, DOI 10.1021/ma052335c
   Edwards EW, 2005, J POLYM SCI POL PHYS, V43, P3444, DOI 10.1002/polb.20643
   Edwards EW, 2004, ADV MATER, V16, P1315, DOI 10.1002/adma.200400763
   Fasolka MJ, 2001, ANN REV MATER RES, V31, P323, DOI 10.1146/annurev.matsci.31.1.323
   Freer EM, 2005, NANO LETT, V5, P2014, DOI 10.1021/nl051517h
   Fukunaga K, 2000, MACROMOLECULES, V33, P947, DOI 10.1021/ma9910639
   GEHLSEN MD, 1992, MACROMOLECULES, V25, P939, DOI 10.1021/ma00028a066
   GOKAN H, 1983, J ELECTROCHEM SOC, V130, P143, DOI 10.1149/1.2119642
   Gotrik KW, 2013, NANO LETT, V13, P5117, DOI 10.1021/nl4021683
   Gronheid R, 2014, P SOC PHOTO-OPT INS, V9051
   Gronheid R, 2014, P SOC PHOTO-OPT INS, V9049
   Guarini KW, 2003, 2003 IEEE INTERNATIONAL ELECTRON DEVICES MEETING, TECHNICAL DIGEST, P541
   Guarini KW, 2001, J VAC SCI TECHNOL B, V19, P2784, DOI 10.1116/1.1421551
   Han E, 2007, ADV MATER, V19, P4448, DOI 10.1002/adma.200602708
   Han E, 2008, MACROMOLECULES, V41, P9090, DOI 10.1021/ma8018393
   Hanley KJ, 2000, MACROMOLECULES, V33, P5918, DOI 10.1021/ma000318b
   Harrison C, 2000, SCIENCE, V290, P1558, DOI 10.1126/science.290.5496.1558
   Harrison C, 2002, PHYS REV E, V66, DOI 10.1103/PhysRevE.66.011706
   Harukawa R, 2013, P SOC PHOTO-OPT INS, V8681
   HASEGAWA H, 1985, MACROMOLECULES, V18, P67, DOI 10.1021/ma00143a011
   HASHIMOTO T, 1977, MACROMOLECULES, V10, P377, DOI 10.1021/ma60056a030
   HASHIMOTO T, 1974, MACROMOLECULES, V7, P364, DOI 10.1021/ma60039a019
   Heinzer MJ, 2012, MACROMOLECULES, V45, P3480, DOI 10.1021/ma2026435
   Heinzer MJ, 2012, MACROMOLECULES, V45, P3471, DOI 10.1021/ma2026429
   Hellwig O, 2010, APPL PHYS LETT, V96
   Hirai T, 2009, ADV MATER, V21, P4334, DOI 10.1002/adma.200900518
   Ho RM, 2005, POLYMER, V46, P9362, DOI 10.1016/j.polymer.2005.07.069
   Hong AJ, 2010, NANO LETT, V10, P224, DOI 10.1021/nl903340a
   Hosaka S, 2011, MICROELECTRON ENG, V88, P2571, DOI 10.1016/j.mee.2011.01.005
   Huang CI, 1998, MACROMOLECULES, V31, P3556, DOI 10.1021/ma980007p
   Huang HY, 2003, MACROMOLECULES, V36, P4084, DOI 10.1021/ma0217581
   In I, 2006, LANGMUIR, V22, P7855, DOI 10.1021/la060748g
   Jeong JW, 2013, ACS NANO, V7, P6747, DOI 10.1021/nn401611z
   Ji SX, 2008, ADV MATER, V20, P3054, DOI 10.1002/adma.200800048
   Ji SX, 2012, ACS NANO, V6, P5440, DOI 10.1021/nn301306v
   Ji SX, 2011, ADV MATER, V23, P3692, DOI 10.1002/adma.201101813
   Ji SX, 2011, MACROMOLECULES, V44, P4291, DOI 10.1021/ma2005734
   Ji SX, 2010, MACROMOLECULES, V43, P6919, DOI 10.1021/ma1007946
   Ji SX, 2010, ACS NANO, V4, P599, DOI 10.1021/nn901342j
   Ji S, 2008, MACROMOLECULES, V41, P9098, DOI 10.1021/ma801861h
   Jin XS, 2014, POLYMER, V55, P3278, DOI 10.1016/j.polymer.2014.05.040
   Jung H, 2011, ACS NANO, V5, P6164, DOI 10.1021/nn2006943
   Jung YS, 2008, NANO LETT, V8, P3776, DOI 10.1021/nl802099k
   Jung YS, 2007, NANO LETT, V7, P2046, DOI 10.1021/nl070924l
   Jung YS, 2009, ADV MATER, V21, P2540, DOI 10.1002/adma.200802855
   Kamata Y, 2011, IEEE T MAGN, V47, P51, DOI 10.1109/TMAG.2010.2077274
   Kang HM, 2012, MACROMOLECULES, V45, P159, DOI 10.1021/ma202249n
   Kang H, 2008, J VAC SCI TECHNOL B, V26, P2495, DOI 10.1116/1.3013336
   Kato T, 2014, P SOC PHOTO-OPT INS, V9050, P1
   Kikitsu A, 2013, IEEE T MAGN, V49, P693, DOI 10.1109/TMAG.2012.2226566
   Kim E, 2013, ACS NANO, V7, P1952, DOI 10.1021/nn3051264
   Kim G, 1998, MACROMOLECULES, V31, P2569, DOI 10.1021/ma971349i
   Kim S, 2013, ACS NANO, V7, P9905, DOI 10.1021/nn403616r
   Kim SH, 2004, ADV MATER, V16, P226, DOI 10.1002/adma.200304906
   Kim SH, 2004, ADV MATER, V16, P2119, DOI 10.1002/adma.200306577
   Kim SO, 2003, NATURE, V424, P411, DOI 10.1038/nature01775
   Knoll A, 2002, PHYS REV LETT, V89, DOI 10.1103/PhysRevLett.89.035501
   Kryder MH, 2008, P IEEE, V96, P1810, DOI 10.1109/JPROC.2008.2004315
   Kuech TF, 2010, J PHYS D APPL PHYS, V43, DOI 10.1088/0022-3727/43/18/183001
   La YH, 2007, CHEM MATER, V19, P4538, DOI 10.1021/cm071208n
   Lille J, 2012, IEEE T MAGN, V48, P2757, DOI 10.1109/TMAG.2012.2192916
   Liu CC, 2010, J VAC SCI TECHNOL B, V28, pC6b30
   Liu CC, 2014, P SOC PHOTO-OPT INS, V9049
   Liu CC, 2007, J VAC SCI TECHNOL B, V25, P1963, DOI 10.1116/1.2801884
   Liu CC, 2013, MACROMOLECULES, V46, P1415, DOI 10.1021/ma302464n
   Liu CC, 2011, MACROMOLECULES, V44, P1876, DOI 10.1021/ma102856t
   Liu CC, 2010, J POLYM SCI POL PHYS, V48, P2589, DOI 10.1002/polb.22114
   Liu GL, 2012, MACROMOLECULES, V45, P3986, DOI 10.1021/ma202777s
   Liu GL, 2012, PHYS REV LETT, V108, DOI 10.1103/PhysRevLett.108.065502
   Liu GL, 2011, J VAC SCI TECHNOL B, V29, DOI 10.1116/1.3650697
   Liu GL, 2010, ADV FUNCT MATER, V20, P1251, DOI 10.1002/adfm.200902229
   Lodge TP, 2003, MACROMOLECULES, V36, P816, DOI 10.1021/ma0209601
   LODGE TP, 1995, J POLYM SCI POL PHYS, V33, P2289, DOI 10.1002/polb.1995.090331614
   Ludwigs S, 2003, NAT MATER, V2, P744, DOI 10.1038/nmat997
   Maher MJ, 2015, ACS APPL MATER INTER, V7, P3323, DOI 10.1021/am508197k
   Maher MJ, 2014, CHEM MATER, V26, P1471, DOI 10.1021/cm403813q
   Mai SM, 2000, MACROMOLECULES, V33, P5124, DOI 10.1021/ma000154z
   Mansky P, 1997, PHYS REV LETT, V79, P237, DOI 10.1103/PhysRevLett.79.237
   Mansky P, 1997, SCIENCE, V275, P1458, DOI 10.1126/science.275.5305.1458
   MANSKY P, 1995, J MATER SCI, V30, P1987, DOI 10.1007/BF00353023
   Mansky P, 1996, APPL PHYS LETT, V68, P2586, DOI 10.1063/1.116192
   MATSEN MW, 1995, J CHEM PHYS, V102, P3884, DOI 10.1063/1.468548
   MATSEN MW, 1994, MACROMOLECULES, V27, P187, DOI 10.1021/ma00079a027
   Moon HS, 2014, ADV FUNCT MATER, V24, P4343, DOI 10.1002/adfm.201304248
   Mori K, 2001, POLYMER, V42, P3009, DOI 10.1016/S0032-3861(00)00663-7
   Morin SA, 2009, ANGEW CHEM INT EDIT, V48, P2135, DOI 10.1002/anie.200805471
   Morkved TL, 1996, SCIENCE, V273, P931, DOI 10.1126/science.273.5277.931
   Muramatsu M, 2012, J MICRO-NANOLITH MEM, V11, DOI 10.1117/1.JMM.11.3.031305
   Naito K, 2002, IEEE T MAGN, V38, P1949, DOI 10.1109/TMAG.2002.802847
   NEW RMH, 1994, J VAC SCI TECHNOL B, V12, P3196, DOI 10.1116/1.587499
   Onses MS, 2011, ADV FUNCT MATER, V21, P3074, DOI 10.1002/adfm.201100300
   Paik MY, 2010, MACROMOLECULES, V43, P4253, DOI 10.1021/ma902646t
   Park C, 2001, APPL PHYS LETT, V79, P848, DOI 10.1063/1.1389766
   Park M, 1997, SCIENCE, V276, P1401, DOI 10.1126/science.276.5317.1401
   Park SM, 2007, MACROMOLECULES, V40, P5084, DOI 10.1021/ma0702344
   Park SM, 2007, ADV MATER, V19, P607, DOI 10.1002/adma.200601421
   Park SM, 2008, MACROMOLECULES, V41, P9124, DOI 10.1021/ma801039v
   Park SM, 2008, MACROMOLECULES, V41, P9118, DOI 10.1021/ma8009917
   Park S, 2009, MACROMOLECULES, V42, P1278, DOI 10.1021/ma802480s
   Park S, 2009, SCIENCE, V323, P1030, DOI 10.1126/science.1168108
   Park WI, 2012, SMALL, V8, P3762, DOI 10.1002/smll.201201407
   Patel KC, 2012, P SOC PHOTO-OPT INS, V8323
   Peinemann KV, 2007, NAT MATER, V6, P992, DOI 10.1038/nmat2038
   Peng J, 2004, J CHEM PHYS, V120, P11163, DOI 10.1063/1.1751177
   Peng Q, 2011, ACS NANO, V5, P4600, DOI 10.1021/nn2003234
   Peng Q, 2010, ADV MATER, V22, P5129, DOI 10.1002/adma.201002465
   Peters RD, 2000, LANGMUIR, V16, P4625, DOI 10.1021/1a991500c
   Phillip WA, 2010, ACS APPL MATER INTER, V2, P847, DOI 10.1021/am900882t
   Rockford L, 1999, PHYS REV LETT, V82, P2602, DOI 10.1103/PhysRevLett.82.2602
   Ross CA, 2008, MRS BULL, V33, P838, DOI 10.1557/mrs2008.179
   Rubinstein J, 2008, P SOC PHOTO-OPT INS, V6924
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Ruiz R, 2012, J VAC SCI TECHNOL B, V30, DOI 10.1116/1.4758773
   Ruiz R, 2011, ACS NANO, V5, P79, DOI 10.1021/nn101561p
   Ryu DY, 2005, SCIENCE, V308, P236, DOI 10.1126/science.1106604
   Sayan S, 2014, P SOC PHOTO-OPT INS, V9051
   Schabes ME, 2008, J MAGN MAGN MATER, V320, P2880, DOI 10.1016/j.jmmm.2008.07.035
   Schift H, 2008, J VAC SCI TECHNOL B, V26, P458, DOI 10.1116/1.2890972
   Schmid GM, 2009, J VAC SCI TECHNOL B, V27, P573, DOI 10.1116/1.3081981
   Segalman RA, 2001, ADV MATER, V13, P1152, DOI 10.1002/1521-4095(200108)13:15<1152::AID-ADMA1152>3.0.CO;2-5
   Seino Y, 2013, J MICRO-NANOLITH MEM, V12, DOI 10.1117/1.JMM.12.3.033011
   Seppala JE, 2012, ACS NANO, V6, P9855, DOI 10.1021/nn303416p
   Somervell M, 2014, P SOC PHOTO-OPT INS, V9051
   Son JG, 2012, ACS MACRO LETT, V1, P1279, DOI 10.1021/mz300475g
   Son JG, 2011, NANO LETT, V11, P2849, DOI 10.1021/nl201262f
   Stein GE, 2007, MACROMOLECULES, V40, P2453, DOI 10.1021/ma0625509
   Stoykovich MP, 2007, ACS NANO, V1, P168, DOI 10.1021/nn700164p
   Stoykovich MP, 2005, SCIENCE, V308, P1442, DOI 10.1126/science.1111041
   Tada Y, 2012, MACROMOLECULES, V45, P292, DOI 10.1021/ma201822a
   Tada Y, 2008, MACROMOLECULES, V41, P9267, DOI 10.1021/ma801542y
   TANAKA T, 1993, J ELECTROCHEM SOC, V140, pL115, DOI 10.1149/1.2220782
   Tang CB, 2008, MACROMOLECULES, V41, P4328, DOI 10.1021/ma800207n
   Tavakkoli KGA, 2012, SCIENCE, V336, P1294, DOI 10.1126/science.1218437
   Thode CJ, 2013, NANOTECHNOLOGY, V24, DOI 10.1088/0957-4484/24/15/155602
   THOMAS EL, 1987, MACROMOLECULES, V20, P2934, DOI 10.1021/ma00177a049
   Thompson DA, 2000, IBM J RES DEV, V44, P311
   Thurn-Albrecht T, 2000, SCIENCE, V290, P2126, DOI 10.1126/science.290.5499.2126
   Ting YH, 2008, J VAC SCI TECHNOL B, V26, P1684, DOI 10.1116/1.2966433
   Tseng YC, 2011, J PHYS CHEM C, V115, P17725, DOI 10.1021/jp205532e
   Vayer M, 2010, THIN SOLID FILMS, V518, P3710, DOI 10.1016/j.tsf.2009.10.015
   Wan L, 2015, ACS NANO, V9, P7506, DOI 10.1021/acsnano.5b02613
   Wan L, 2012, J MICRO-NANOLITH MEM, V11, DOI 10.1117/1.JMM.11.3.031405
   Wan L, 2009, LANGMUIR, V25, P12408, DOI 10.1021/la901648y
   Wang Q, 2003, MACROMOLECULES, V36, P1731, DOI 10.1021/ma020996t
   Wang Y, 2008, MACROMOLECULES, V41, P5799, DOI 10.1021/ma800753a
   WATANABE H, 1995, MACROMOLECULES, V28, P5006, DOI 10.1021/ma00118a032
   Welander AM, 2008, MACROMOLECULES, V41, P2759, DOI 10.1021/ma800056s
   Welander AM, 2013, MACROMOLECULES, V46, P3915, DOI 10.1021/ma3025706
   Weller D, 1999, IEEE T MAGN, V35, P4423, DOI 10.1109/20.809134
   WHITMORE MD, 1992, MACROMOLECULES, V25, P2041, DOI 10.1021/ma00033a031
   WILBUR JL, 1994, ADV MATER, V6, P600, DOI 10.1002/adma.19940060719
   Wilmes GM, 2006, MACROMOLECULES, V39, P2435, DOI 10.1021/ma0526443
   WU S, 1970, J PHYS CHEM-US, V74, P632, DOI 10.1021/j100698a026
   Xiao SG, 2005, NANOTECHNOLOGY, V16, pS324, DOI 10.1088/0957-4484/16/7/003
   Xiao SG, 2013, J MICRO-NANOLITH MEM, V12, DOI 10.1117/1.JMM.12.3.031110
   Xiao SAG, 2011, NANOTECHNOLOGY, V22, DOI 10.1088/0957-4484/22/30/305302
   Xiao SG, 2009, ADV MATER, V21, P2516, DOI 10.1002/adma.200802087
   Xu J, 2011, ADV MATER, V23, P5755, DOI 10.1002/adma.201102964
   Xuan Y, 2004, MACROMOLECULES, V37, P7301, DOI 10.1021/ma0497761
   Yamaguchi S, 2014, PROC SPIE, V9050, DOI 10.1117/12.2046136
   Yamamoto R, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2013.2284474
   Yamashita F, 2012, P SOC PHOTO-OPT INS, V83280T
   Yamashita T, 2011, ECS TRANSACTIONS, V34, P81, DOI 10.1149/1.3567563
   Yang JKW, 2010, NAT NANOTECHNOL, V5, P256, DOI [10.1038/nnano.2010.30, 10.1038/NNANO.2010.30]
   Yang X, 2013, EVID-BASED COMPL ALT, V2013, P1, DOI DOI 10.1371/J0URNAL.P0NE.0058746
   Yang XW, 2014, ADV MATER SCI ENG, DOI 10.1155/2014/697170
   Yang X, 2007, J VAC SCI TECHNOL B, V25, P2202, DOI 10.1116/1.2798711
   Yang XM, 2008, J VAC SCI TECHNOL B, V26, P2604, DOI 10.1116/1.2978487
   Yang XM, 2009, ACS NANO, V3, P1844, DOI 10.1021/nn900073r
   Yang XM, 1999, J VAC SCI TECHNOL B, V17, P3203, DOI 10.1116/1.590980
   Yang XM, 2000, MACROMOLECULES, V33, P9575, DOI 10.1021/ma001326v
   Yi H, 2012, ADV MATER, V24, P3107, DOI 10.1002/adma.201200265
   Yin J, 2013, ACS NANO, V7, P9961, DOI 10.1021/nn403847z
   Yokoyama H, 1998, MACROMOLECULES, V31, P7871, DOI 10.1021/ma9805250
   Zhang JQ, 2014, MACROMOLECULES, V47, P5711, DOI 10.1021/ma500633b
   Zhang XJ, 2010, ACS NANO, V4, P7021, DOI 10.1021/nn102387c
   Zhu JG, 2008, IEEE T MAGN, V44, P125, DOI 10.1109/TMAG.2007.911031
   [Anonymous], 2013, INT TECHNOLOGY ROADM
NR 214
TC 14
Z9 14
U1 47
U2 129
PU PERGAMON-ELSEVIER SCIENCE LTD
PI OXFORD
PA THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD OX5 1GB, ENGLAND
SN 0079-6700
EI 1873-1619
J9 PROG POLYM SCI
JI Prog. Polym. Sci.
PD MAR-APR
PY 2016
VL 54-55
BP 76
EP 127
DI 10.1016/j.progpolymsci.2015.10.006
PG 52
WC Polymer Science
SC Polymer Science
GA DK0JR
UT WOS:000374599600004
ER

PT J
AU Wang, Y
   Kumar, BVKV
   Erden, MF
   Steiner, PL
AF Wang, Yao
   Kumar, B. V. K. Vijaya
   Erden, M. Fatih
   Steiner, Philip L.
TI Relaxing Media Requirements by Using Multi-Island Two-Dimensional
   Magnetic Recording on Bit-Patterned Media
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT 26th Magnetic Recording Conference (TMRC)
CY AUG 17-19, 2015
CL Univ Minnesota, Minneapolis, MN
SP IEEE Magnet Soc, Seagate Technol, Western Digital Corp, Hoya Corp, Univ Minnesota, Ctr Micromagnet & Informat Technologies, Stanford Univ, Ctr Magnet Nanotechnol, Univ Calif Sandiego, Ctr Magnet Recording Res, Univ Alabama Tuscaloosa, Ctr Mat Informat Technol, Univ Calif Berkeley, Comp Mech Lab, Carnegie Mellon Univ, Data Storage Syst Ctr
HO Univ Minnesota
DE Bit-patterned media (BPM); multi-island; two-dimensional magnetic
   recording
ID NOISE; EQUALIZATION; TB/IN(2); ERRORS; CODES
AB We introduce and investigate a new multi-island bit representation scheme with bit-patterned media (BPM) to increase the tolerance to the reader noise and the media noise compared with the standard BPM with a single island/bit and to granular media. The key idea is to use multiple islands in two dimensions to represent one bit. The redundancy in such a multi-island representation reduces the impact of the write in errors and decreases the effect of the media noise. We show that these multi-island representations offer improved bit error rate (BER), although only one readback sample per bit is used for equalization and detection. Here, a micromagnetic writing model and a read channel including media noise are used for the simulations, where optimized writer and reader architectures with one, two, and three read elements are investigated. Simulations at a 1 Tb/in(2) channel bit density, for the target BER of 10(-2) and readback with two readers, indicate that the readback of BPM recording (BPMR) based on 1 Tdot/in(2) (1 dot/bit), 2 Tdots/in(2) (2 dots/bit), and 4 Tdots/in(2) (4 dots/bit) island density can tolerate 1, 3.1, and 3.3 dB more reader noise compared with the granular media. For readback with two readers, at 10(-2) target BER, writing with 4 Tdots/in2 and 2 Tdots/in(2) island density can tolerate the media noise (modeled by island position jitter and island size fluctuation) levels of 11% and 8.5% compared with the 1 Tdot/in(2) with the media noise level of 5%. When the channel bit density is increased to 1.5 Tb/in(2), such a multi-island approach can still provide improved reader noise and media noise tolerances compared with the standard BPMR with one bit per island and to granular media at the same density.
C1 [Wang, Yao; Kumar, B. V. K. Vijaya] Carnegie Mellon Univ, Data Storage Syst Ctr, Pittsburgh, PA 15213 USA.
   [Erden, M. Fatih] Seagate Technol, Shakopee, MN 55379 USA.
   [Steiner, Philip L.] Seagate Technol, Fremont, CA 94538 USA.
RP Wang, Y (reprint author), Carnegie Mellon Univ, Data Storage Syst Ctr, Pittsburgh, PA 15213 USA.
EM yaowang@andrew.cmu.edu
CR Asbahi M, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2013.2280018
   Dong Y, 2011, IEEE T MAGN, V47, P2652, DOI 10.1109/TMAG.2011.2148112
   Hu J, 2007, IEEE T MAGN, V43, P3517, DOI 10.1109/TMAG.2007.898307
   Moon J, 2001, IEEE J SEL AREA COMM, V19, P730, DOI 10.1109/49.920181
   MOON JY, 1995, IEEE T MAGN, V31, P1083, DOI 10.1109/20.364789
   Nabavi S, 2007, IEEE ICC, P6249, DOI 10.1109/ICC.2007.1035
   Nabavi S, 2008, IEEE T MAGN, V44, P3789, DOI 10.1109/TMAG.2008.2002387
   Ng YB, 2010, IEEE T MAGN, V46, P2268, DOI 10.1109/TMAG.2010.2043926
   Ng Y, 2009, IEEE T MAGN, V45, P3535, DOI 10.1109/TMAG.2009.2024427
   Nutter PW, 2005, IEEE T MAGN, V41, P3214, DOI 10.1109/TMAG.2005.854780
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Smith N, 2001, APPL PHYS LETT, V78, P1448, DOI 10.1063/1.1352694
   Tang Y, 2009, IEEE T MAGN, V45, P822, DOI 10.1109/TMAG.2008.2010642
   Wang SM, 2013, IEEE T MAGN, V49, P3644, DOI 10.1109/TMAG.2012.2237545
   Wang Y, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2015.2464786
   Wang Y, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2015.2437875
   Wang Y, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2014.2359391
   Wang Y, 2012, IEEE MAGN LETT, V3, DOI 10.1109/LMAG.2012.2226935
   Wang Y, 2013, IEEE T MAGN, V49, P5208, DOI 10.1109/TMAG.2013.2260349
   Yang M, 2004, IEEE T COMMUN, V52, P564, DOI 10.1109/TCOMM.2004.826367
   Zhang SH, 2010, IEEE T MAGN, V46, P1363, DOI 10.1109/TMAG.2010.2040713
NR 21
TC 1
Z9 1
U1 0
U2 3
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD FEB
PY 2016
VL 52
IS 2
AR 3000210
DI 10.1109/TMAG.2015.2476776
PN 1
PG 10
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA DG4WV
UT WOS:000372074700004
ER

PT J
AU Aksornniem, S
   Evans, RFL
   Chantrell, RW
   Silapunt, R
AF Aksornniem, Suttipan
   Evans, Richard F. L.
   Chantrell, Roy W.
   Silapunt, Rardchawadee
TI Magnetic Switching in BPM, TEAMR, and Modified TEAMR Using Dielectric
   Underlayer Media
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Atomistic spin model; electron trapping assisted recording; magnetic
   data storage device; trapping electron-assisted magnetic recording
   (TEAMR); VAMPIRE magnetic simulator
ID FILM
AB In this paper, we study the coercivity of bit-patterned media, trapping electron-assisted magnetic recording (TEAMR), and modified TEAMR (M-TEAMR) media using a dielectric underlayer. The VAMPIRE magnetic simulator is used to model three structures of recording bits and to study the M-H loops using an atomistic spin model. The results show that the magnetic switching reduction in M-TEAMR and TEAMR depends on the bit size. The percentage of magnetic switching reduction in M-TEAMR is also larger than TEAMR for all bit sizes. For a bit size of 1.6 x 1.6 x 3.2 nm(3), the percentage of magnetic switching reduction in M-TEAMR is approximately four times higher than that in TEAMR.
C1 [Aksornniem, Suttipan; Silapunt, Rardchawadee] King Mongkuts Univ Technol Thonburi, Dept Elect & Telecommun Engn, Bangkok 10140, Thailand.
   [Aksornniem, Suttipan; Evans, Richard F. L.; Chantrell, Roy W.] Univ York, Dept Phys, York YO10 5DD, N Yorkshire, England.
RP Silapunt, R (reprint author), King Mongkuts Univ Technol Thonburi, Dept Elect & Telecommun Engn, Bangkok 10140, Thailand.
EM rardchawadee.sil@kmutt.ac.th
RI Chantrell, Roy/J-9898-2015; Evans, Richard/F-4230-2010
OI Chantrell, Roy/0000-0001-5410-5615; Evans, Richard/0000-0002-2378-8203
FU Thailand Research Fund through the Royal Golden Jubilee Ph.D. Program
   [PHD/0115/2553]; King Mongkut's University of Technology Thonburi;
   Seagate Technology (Thailand); University of York
FX This work was supported in part by the Thailand Research Fund through
   the Royal Golden Jubilee Ph.D. Program under Grant PHD/0115/2553, in
   part by the King Mongkut's University of Technology Thonburi, in part by
   Seagate Technology (Thailand), and in part by the University of York.
   The authors would like to thank all the members of the Computational
   Magnetism Group at the University of York for their help throughout the
   course of this work.
CR Aksornniem S, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2014.2331024
   Baxter A., 2014, SSD VS HDD
   Cuadrado R, 2014, APPL PHYS LETT, V105, DOI 10.1063/1.4898574
   Dai ZR, 2001, NANO LETT, V1, P443, DOI 10.1021/nl0100421
   Evans RFL, 2014, J PHYS-CONDENS MAT, V26, DOI 10.1088/0953-8984/26/10/103202
   Evans R. F. L., 2014, VAMPIRE ATOMISTIC SI
   Garcia-Palacios JL, 1998, PHYS REV B, V58, P14937, DOI 10.1103/PhysRevB.58.14937
   Gubbins M., 2014, DATA STORAGE HAMR
   Kryder MH, 2008, P IEEE, V96, P1810, DOI 10.1109/JPROC.2008.2004315
   LYBERATOS A, 1993, J PHYS-CONDENS MAT, V5, P8911, DOI 10.1088/0953-8984/5/47/016
   Matsumoto K, 2006, FUJITSU SCI TECH J, V42, P158
   Pan L, 2009, NAT PHOTONICS, V3, P186, DOI 10.1038/nphoton.2009.40
   Perumal A, 2008, APPL PHYS EXPRESS, V1, DOI 10.1143/APEX.1.101301
   Varaprasad BSDCS, 2013, JOM-US, V65, P853, DOI 10.1007/s11837-013-0620-5
   Victora RH, 2005, IEEE T MAGN, V41, P2828, DOI 10.1109/TMAG.2005.855263
   Weisheit M, 2007, SCIENCE, V315, P349, DOI 10.1126/science.1136629
   Zhou TJ, 2010, IEEE T MAGN, V46, P738, DOI 10.1109/TMAG.2009.2037331
   Zhou TJ, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3276553
   Zhu JG, 2008, IEEE T MAGN, V44, P125, DOI 10.1109/TMAG.2007.911031
NR 19
TC 0
Z9 0
U1 0
U2 2
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD FEB
PY 2016
VL 52
IS 2
AR 3200405
DI 10.1109/TMAG.2015.2490626
PN 2
PG 5
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA DG4WY
UT WOS:000372075000013
ER

PT J
AU Briffa, JA
   Buttigieg, V
AF Briffa, Johann A.
   Buttigieg, Victor
TI A MAP Decoder for TVB Codes on a Generalized Iyengar-Siegel-Wolf BPMR
   Markov Channel Model
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Bit-patterned media; high-density magnetic recording; insertion-deletion
   correction; written-in errors
ID INSERTIONS; DELETIONS; SUBSTITUTIONS; MEDIA
AB We present a generalization of the Iyengar-Siegel-Wolf Markov channel model for bit-patterned media recording media to allow negative drift, and adapt the maximum a posteriori decoder for time-varying block codes to work on this generalized model while minimizing complexity. We also describe a method for designing near-optimal codes for this channel using simulated annealing, obtaining better performance than alternative designs. In concatenation with a (999, 888)(16) low-density parity-check (LDPC) code, we achieve a frame error rate (FER) of 10(-3) at a channel error rate that is 1.73x higher than the best result with existing designs. A simple extension to include substitution errors allows the channel to approximate the dependent insertion, deletion, and substitution (DIDS) channel, with a decoding complexity that is 10x lower than that of Wu and Armand's RC2 decoder. The performance in the absence of burst errors is almost identical. When the DIDS channel includes burst substitution errors, our decoder performs worse than the RC2 decoder, but maintains its complexity advantage. For the same concatenated code, our decoder achieves an FER of 10(-3) at a channel error rate that is 1.68x lower than the RC2 decoder. Finally, simulation results show that our code designs improve on existing constructions for the DIDS channel.
C1 [Briffa, Johann A.; Buttigieg, Victor] Univ Malta, Dept Commun & Comp Engn, Msida 2080, Malta.
RP Briffa, JA (reprint author), Univ Malta, Dept Commun & Comp Engn, Msida 2080, Malta.
EM johann.briffa@um.edu.mt
CR BAHL LR, 1975, IEEE T INFORM THEORY, V21, P404, DOI 10.1109/TIT.1975.1055419
   Briffa J. A., 2014, IET J ENG        JUN
   Briffa J. A., 2014, J ENG            JUN
   Briffa J. A., DATA SETS
   Davey MC, 2001, IEEE T INFORM THEORY, V47, P687, DOI 10.1109/18.910582
   Gallager R. G., 1961, 2502 MIT LINC LAB
   Iyengar AR, 2011, IEEE T MAGN, V47, P35, DOI 10.1109/TMAG.2010.2080667
   Press W. H., 2007, NUMERICAL RECIPES C
   Ratzer EA, 2005, ANN TELECOMMUN, V60, P29
   van Laarhoven P. J. M., 1987, SIMULATED ANNEALING
   Wood R, 2009, IEEE T MAGN, V45, P917, DOI 10.1109/TMAG.2008.2010676
   Wu T., 2014, IEEE T MAGN, V50
   Wu T, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2015.2421278
   Wu T, 2013, IEEE T MAGN, V49, P3779, DOI 10.1109/TMAG.2013.2250262
   Wu T, 2013, IEEE T MAGN, V49, P489, DOI 10.1109/TMAG.2012.2208120
NR 15
TC 0
Z9 0
U1 0
U2 0
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD FEB
PY 2016
VL 52
IS 2
AR 3100609
DI 10.1109/TMAG.2015.2488585
PN 2
PG 9
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA DG4WY
UT WOS:000372075000011
ER

PT J
AU Obukhov, Y
   Jubert, PO
   Bedau, D
   Grobis, M
AF Obukhov, Yuri
   Jubert, Pierre-Olivier
   Bedau, Daniel
   Grobis, Michael
TI 2-D Decoding Algorithms and Recording Techniques for Bit Patterned Media
   Feasibility Demonstrations
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE 2-D decoding; bit-patterned media (BPM); decision feedback equalization;
   drag tester; intertrack interference (ITI); magnetic recording; static
   tester; Viterbi; write synchronization
ID VITERBI ALGORITHM; INTERFERENCE; STORAGE
AB Recording experiments and decoding algorithms are presented for evaluating the bit error rate (BER) of state-of-the-art magnetic bit-patterned media (BPM). The recording experiments are performed with a static tester and conventional hard-disk drive heads. As the reader dimensions are larger than the bit dimensions in both the down-track and the cross-track directions, a 2-D bit-decoding algorithm is required. Two such algorithms are presented in detail together with the methodology implemented to accurately retrieve island positions during recording. Using these techniques, a 1.6 Td/in(2) magnetic BPM is demonstrated to support 2-D BER below 1e-2 under shingled magnetic recording conditions.
C1 [Obukhov, Yuri; Jubert, Pierre-Olivier; Bedau, Daniel; Grobis, Michael] Western Digital Co, HGST, San Jose, CA 95135 USA.
RP Grobis, M (reprint author), Western Digital Co, HGST, San Jose, CA 95135 USA.
EM michael.grobis@hgst.com
CR Aign T, 1998, PHYS REV LETT, V81, P5656, DOI 10.1103/PhysRevLett.81.5656
   Albrecht TR, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2015.2397880
   Albrecht TR, 2013, IEEE T MAGN, V49, P773, DOI 10.1109/TMAG.2012.2227303
   Albrecht TR, 2009, NANOSCALE MAGNETIC MATERIALS AND APPLICATIONS, P237, DOI 10.1007/978-0-387-85600-1_9
   Chang W, 2010, IEEE T MAGN, V46, P3899, DOI 10.1109/TMAG.2010.2056926
   Damen MO, 2003, IEEE T INFORM THEORY, V49, P2389, DOI 10.1109/TIT.2003.817444
   Grobis M, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3304166
   Kamata Y., 2013, IEEE T MAGN, V49, P693
   Karakulak S, 2010, IEEE T MAGN, V46, P3639, DOI 10.1109/TMAG.2010.2049116
   Keskinoz M, 2008, IEEE T MAGN, V44, P533, DOI 10.1109/TMAG.2007.914966
   Koo K, 2013, IEEE T MAGN, V49, P2555, DOI 10.1109/TMAG.2013.2251614
   Li J, 2000, IEEE T SIGNAL PROCES, V48, P517, DOI 10.1109/78.823977
   Moser A, 1999, J APPL PHYS, V85, P5018, DOI 10.1063/1.370077
   Nabavi S, 2007, IEEE T MAGN, V43, P2274, DOI 10.1109/TMAG.2007.893479
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Ross C, 2001, ANN REV MATER RES, V31, P203, DOI 10.1146/annurev.matsci.31.1.203
   Schabes ME, 2008, J MAGN MAGN MATER, V320, P2880, DOI 10.1016/j.jmmm.2008.07.035
   Taratorin A., 2004, MAGNETIC RECORDING S
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Vasic B., 2004, CODING SIGNAL PROCES
   VITERBI AJ, 1967, IEEE T INFORM THEORY, V13, P260, DOI 10.1109/TIT.1967.1054010
   Weller D, 1999, IEEE T MAGN, V35, P4423, DOI 10.1109/20.809134
   Wu YX, 2003, IEEE T MAGN, V39, P2115, DOI 10.1109/TMAG.2003.814291
   Xiao SG, 2014, ACS NANO, V8, P11854, DOI 10.1021/nn505630t
NR 24
TC 2
Z9 2
U1 0
U2 0
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD FEB
PY 2016
VL 52
IS 2
AR 3000709
DI 10.1109/TMAG.2015.2492475
PN 2
PG 9
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA DG4WY
UT WOS:000372075000010
ER

PT J
AU Romeira, B
   Avo, R
   Figueiredo, JML
   Barland, S
   Javaloyes, J
AF Romeira, B.
   Avo, R.
   Figueiredo, Jose M. L.
   Barland, S.
   Javaloyes, J.
TI Regenerative memory in time-delayed neuromorphic photonic resonators
SO SCIENTIFIC REPORTS
LA English
DT Article
ID CAVITY SOLITONS; EXCITABLE MEDIA; FEEDBACK; SYSTEM; OSCILLATOR;
   DYNAMICS; PATTERNS; DEVICES; SPIKING; DRIVEN
AB We investigate a photonic regenerative memory based upon a neuromorphic oscillator with a delayed self-feedback (autaptic) connection. We disclose the existence of a unique temporal response characteristic of localized structures enabling an ideal support for bits in an optical buffer memory for storage and reshaping of data information. We link our experimental implementation, based upon a nanoscale nonlinear resonant tunneling diode driving a laser, to the paradigm of neuronal activity, the FitzHugh-Nagumo model with delayed feedback. This proof-of-concept photonic regenerative memory might constitute a building block for a new class of neuron-inspired photonic memories that can handle high bit-rate optical signals.
C1 [Romeira, B.; Avo, R.; Figueiredo, Jose M. L.] Univ Algarve, Dept Fis, CEOT, P-8005139 Faro, Portugal.
   [Barland, S.] Univ Nice Sophia Antipolis, Inst Nonlinear Nice, CNRS, UMR 7335, F-06560 Valbonne, France.
   [Javaloyes, J.] Univ Illes Balears, Dept Fis, Mallorca 07122, Spain.
RP Javaloyes, J (reprint author), Univ Illes Balears, Dept Fis, C-Valldemossa Km 7-5, Mallorca 07122, Spain.
EM julien.javaloyes@uib.es
RI Romeira, Bruno/A-2903-2009; Figueiredo, Jose/B-3378-2008
OI Romeira, Bruno/0000-0002-1485-6665; Figueiredo, Jose/0000-0001-5668-7073
FU Fundacao para a Ciencia e a Tecnologia, Portugal
   [WOWi-PTDC/EEA-TEL/100755/2008, CEOT-UID/Multi/00631/2013]; European
   Commission under the Horizon 2020 Programme [645369]; Region
   Provence-Alpes-Cote d'Azur [DEB 12-1538]; Ramon y Cajal program; project
   RANGER [TEC2012-38864-C03-01]
FX We would like to thank Gary Ternent, University of Glasgow, UK, for the
   fabrication of the RTD devices employed in this work, Charles Ironside,
   Curtin University, Perth, Western Australia, for the fruitful
   discussions on RTD optoelectronic devices, and thank Raquel Luis for the
   artistic representation of the neuron. R.A., B.R. and J.F. acknowledge
   support from the Fundacao para a Ciencia e a Tecnologia, Portugal,
   through the research grants WOWi-PTDC/EEA-TEL/100755/2008, &
   CEOT-UID/Multi/00631/2013, and support from European Commission under
   the Horizon 2020 Programme, grant agreement no. 645369 (iBROW project).
   S.B. acknowledges support from Region Provence-Alpes-Cote d'Azur through
   grant number DEB 12-1538. J.J. acknowledges and financial support from
   the Ramon y Cajal program and project RANGER (TEC2012-38864-C03-01).
CR AIDA T, 1992, IEEE J QUANTUM ELECT, V28, P686, DOI 10.1109/3.124994
   Astrov YA, 2001, PHYS LETT A, V283, P349, DOI 10.1016/S0375-9601(01)00257-2
   Barbay S, 2011, OPT LETT, V36, P4476, DOI 10.1364/OL.36.004476
   Barland S, 2002, NATURE, V419, P699, DOI 10.1038/nature01049
   BENOIT E., 1981, COLLECTANEA MATH BAR, V31, P37
   Branco T, 2009, NAT REV NEUROSCI, V10, P373, DOI 10.1038/nrn2634
   Buric N, 2003, PHYS REV E, V67, DOI 10.1103/PhysRevE.67.066222
   Coullet P, 2004, CHAOS, V14, P193, DOI 10.1063/1.1642311
   Descalzi O., 2011, LECT NOTES PHYS, V751
   Engelborghs K., 2001, DDE BIFTOOL V 2 00 M
   Fitzhugh R., 1955, B MATH BIOPHYS, V17, P257, DOI DOI 10.1007/BF02477753)
   Flight MH, 2009, NAT REV NEUROSCI, V10, P316, DOI [10.1038/nrn2637, 10.1038/nrn2638]
   Garbin B., 2015, NAT COM, V6
   Giacomelli G, 1996, PHYS REV LETT, V76, P2686, DOI 10.1103/PhysRevLett.76.2686
   Hachair X, 2006, IEEE J SEL TOP QUANT, V12, P339, DOI 10.1109/JSTQE.2006.872711
   Herrmann CS, 2004, INT J BIFURCAT CHAOS, V14, P623, DOI 10.1142/S0218127404009338
   HODGKIN AL, 1952, J PHYSIOL-LONDON, V116, P424
   HODGKIN AL, 1952, J PHYSIOL-LONDON, V117, P500
   IKEDA K, 1979, OPT COMMUN, V30, P257, DOI 10.1016/0030-4018(79)90090-7
   Indiveri G., 2011, FRONTIERS NEUROSCIEN, V5
   Izhikevich EM, 2007, DYNAMICAL SYSTEMS NE
   Jo SH, 2010, NANO LETT, V10, P1297, DOI 10.1021/nl904092h
   Keener JP, 2008, MATH PHYSL CELLULAR, V1
   Kelleher B, 2010, PHYS REV E, V81, DOI 10.1103/PhysRevE.81.036204
   Kuzum D, 2012, NANO LETT, V12, P2179, DOI 10.1021/nl201040y
   LEE KJ, 1994, NATURE, V369, P215, DOI 10.1038/369215a0
   Leo F, 2010, NAT PHOTONICS, V4, P471, DOI [10.1038/NPHOTON.2010.120, 10.1038/nphoton.2010.120]
   Lienard A., 1928, Revue Generale de l'Electricite, V23, P901
   Lienard A., 1928, REV GEN ELECTR, V23, P946
   Loos H.V.D., 1972, BRAIN RES, V48, P355
   Marconi M, 2014, PHYS REV LETT, V112, DOI 10.1103/PhysRevLett.112.223901
   Marino F, 2014, PHYS REV LETT, V112, DOI 10.1103/PhysRevLett.112.103901
   Merolla PA, 2014, SCIENCE, V345, P668, DOI 10.1126/science.1254642
   MERON E, 1992, PHYS REP, V218, P1, DOI 10.1016/0370-1573(92)90098-K
   MOSES E, 1987, PHYS REV A, V35, P2757, DOI 10.1103/PhysRevA.35.2757
   NAGUMO J, 1962, P IRE, V50, P2061, DOI 10.1109/JRPROC.1962.288235
   NEYER A, 1982, IEEE J QUANTUM ELECT, V18, P2009, DOI 10.1109/JQE.1982.1071487
   Nicolis G., 1977, SELF ORG NONEQUILIBR
   NIEDERNOSTHEIDE FJ, 1992, PHYS STATUS SOLIDI B, V172, P249, DOI 10.1002/pssb.2221720123
   Peil M, 2009, PHYS REV E, V79, DOI 10.1103/PhysRevE.79.026208
   Press W. H., 2007, NUMERICAL RECIPES AR
   PYRAGAS K, 1992, PHYS LETT A, V170, P421, DOI 10.1016/0375-9601(92)90745-8
   Romeira B., 2014, OPT QUANT ELECTRON, P1
   Romeira B, 2015, J LIGHTWAVE TECHNOL, V33, P503, DOI 10.1109/JLT.2014.2376775
   Romeira B, 2013, OPT EXPRESS, V21, P20931, DOI 10.1364/OE.21.020931
   Romeira B, 2013, IEEE J QUANTUM ELECT, V49, P31, DOI 10.1109/JQE.2012.2225415
   Samardak A., 2011, J APPL PHYS, V109
   Scholl E, 2009, PHILOS T R SOC A, V367, P1079, DOI 10.1098/rsta.2008.0258
   Selmi F, 2014, PHYS REV LETT, V112, DOI 10.1103/PhysRevLett.112.183902
   Stepan G, 2009, PHILOS T R SOC A, V367, P1059, DOI 10.1098/rsta.2008.0279
   Tait AN, 2014, J LIGHTWAVE TECHNOL, V32, P4029, DOI 10.1109/JLT.2014.2345652
   TYSON JJ, 1988, PHYSICA D, V32, P327, DOI 10.1016/0167-2789(88)90062-0
   Umbanhowar PB, 1996, NATURE, V382, P793, DOI 10.1038/382793a0
   Weicker L, 2014, PHYS REV E, V89, DOI 10.1103/PhysRevE.89.012908
   WU J, 1984, PHYS REV LETT, V52, P1421, DOI 10.1103/PhysRevLett.52.1421
   Yacomotti AM, 2002, PHYS REV E, V66, DOI 10.1103/PhysRevE.66.036227
NR 56
TC 7
Z9 7
U1 3
U2 13
PU NATURE PUBLISHING GROUP
PI LONDON
PA MACMILLAN BUILDING, 4 CRINAN ST, LONDON N1 9XW, ENGLAND
SN 2045-2322
J9 SCI REP-UK
JI Sci Rep
PD JAN 19
PY 2016
VL 6
AR 19510
DI 10.1038/srep19510
PG 12
WC Multidisciplinary Sciences
SC Science & Technology - Other Topics
GA DB1SS
UT WOS:000368289800003
PM 26781583
ER

PT J
AU Tipcharoen, W
   Warisarn, C
   Kovintavewat, P
AF Tipcharoen, Warunee
   Warisarn, Chanon
   Kovintavewat, Piya
TI Effects of Island Volume and Hotspot Position Fluctuation for Heated-Dot
   Magnetic Recording
SO IEEE MAGNETICS LETTERS
LA English
DT Article
DE Information storage; bit-patterned media; heat-assisted magnetic
   recording; write errors
ID BIT-PATTERNED MEDIA; PERFORMANCE EVALUATION
AB Heated-dot magnetic recording (HDMR), which employs the laser to heat a bit-patterned medium before recording data, is a promising technology to achieve an ultra-high recording density. Generally, many parameters can cause an error during the writing process in an HDMR system; however, this letter investigates only the effect of bit island volume, bit island position fluctuation, and hotspot position fluctuation. Specifically, three bit island volumes are considered, i.e., 1100, 860, and 620 nm(3). In addition, we also study the 3-by-3 data patterns that easily cause an error when the hotspot and write head positions have fluctuated. To achieve an error-free writing process, the heating temperature is studied using the Brillouin function for thermal calculations. Implementation of treating the hotspot and evaluating the thermal effect is explicitly described. Simulation results indicate that the smaller the position variation, the lower the error percentage. Moreover, we found that the error percentage is decreased as the heating temperature is increased. Finally, it is apparent that the smaller the island volume, the lower the error percentage.
C1 [Tipcharoen, Warunee; Warisarn, Chanon] King Mongkuts Inst Technol Ladkrabang, Coll Adv Mfg Innovat, Bangkok 10520, Thailand.
   [Kovintavewat, Piya] Nakhon Pathom Rajabhat Univ, Data Storage Technol Res Ctr, Muang 73000, Nakhon Pathom, Thailand.
RP Warisarn, C (reprint author), King Mongkuts Inst Technol Ladkrabang, Coll Adv Mfg Innovat, Bangkok 10520, Thailand.
EM chanon.wa@kmitl.ac.th
FU Thailand Research Fund (TRF), College of Advanced Manufacturing
   Innovation, KMITL; Research and Development Institute, Nakhon Pathom
   Rajabhat University, Thailand
FX This work was supported in part by the Thailand Research Fund (TRF),
   College of Advanced Manufacturing Innovation, KMITL, and in part by the
   Research and Development Institute, Nakhon Pathom Rajabhat University,
   Thailand.
CR Akagi F, 2012, J MAGN MAGN MATER, V324, P309, DOI 10.1016/j.jmmm.2010.11.082
   Asbahi M, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2013.2280018
   Donahue M, 1999, 6376 NISTIR
   Ghoreyshi A, 2014, J APPL PHYS, V115, DOI 10.1063/1.4864243
   Kryder MH, 2008, P IEEE, V96, P1810, DOI 10.1109/JPROC.2008.2004315
   Lin MY, 2013, IEEE T MAGN, V49, P723, DOI 10.1109/TMAG.2012.2226708
   Nutter PW, 2008, IEEE T MAGN, V44, P3797, DOI 10.1109/TMAG.2008.2002516
   Thiele JU, 2002, J APPL PHYS, V91, P6595, DOI 10.1063/1.1470254
   Tipcharoen W, 2016, JPN J APPL PHYS, V55, DOI 10.7567/JJAP.55.07MB01
   Vogler C, 2016, APPL PHYS LETT, V108, DOI 10.1063/1.4943629
   Wang F, 2014, CHINESE PHYS B, V23, DOI 10.1088/1674-1056/23/3/036802
   Wang F, 2011, MATER CHEM PHYS, V126, P843, DOI 10.1016/j.matchemphys.2010.12.031
   Xu BX, 2012, J APPL PHYS, V111, DOI 10.1063/1.3671421
   Yamashita M, 2012, IEEE T MAGN, V48, P4586, DOI 10.1109/TMAG.2012.2194988
   Zhang J, 2012, J APPL PHYS, V111, DOI 10.1063/1.3702876
NR 15
TC 0
Z9 0
U1 2
U2 2
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 1949-307X
J9 IEEE MAGN LETT
JI IEEE Magn. Lett.
PY 2016
VL 7
AR 4505404
DI 10.1109/LMAG.2016.2594167
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA ET0UJ
UT WOS:000399979200001
ER

PT J
AU Adamatzky, A
AF Adamatzky, Andrew
TI On Half-Adders Based on Fusion of Signal Carriers: Excitation, Fluidics,
   and Electricity
SO COMPLEX SYSTEMS
LA English
DT Article
ID BELOUSOV-ZHABOTINSKY MEDIUM; LOGIC GATES; MODEL; PROPAGATION; MOLECULE;
   DIODES
AB Likely outcomes of a collision between two objects are annihilation, reflection, or fusion. We show how to construct a one-bit adder with patterns that fuse on impact. A fusion gate has two inputs and three outputs. When a signal is generated on a single input, the object propagates along its own output trajectory. When both inputs are active, the objects collide at a junction of input trajectories, fuse, and propagate along a dedicated output trajectory. Thus two outputs produce conjunction of one signal with negation of another signal, and the third output produces conjunction of input signals. By merging two outputs in one, we make a one-bit half-adder: one output is the conjunction of input signals; another output is the exclusive disjunction of the signals. We discuss blueprints of the half-adders realized with two types of physical signal carriers-wave fragments in excitable medium-and high-velocity jet streams. We also propose an electrical circuit analogous to a fusion half-adder. By running fusion half-adders in reverse, we find that despite realizing the same functions when in a straight mode, all devices implement different functions when their inputs are swapped with outputs.
C1 [Adamatzky, Andrew] Univ West England, Bristol, Avon, England.
RP Adamatzky, A (reprint author), Univ West England, Bristol, Avon, England.
CR Adamatzky A, 2004, CHAOS SOLITON FRACT, V21, P1259, DOI 10.1016/j.chaos.2003.12.068
   Adamatzky A., SLIME MOULD LOGICAL
   Adamatzky A, 2007, CHAOS SOLITON FRACT, V34, P307, DOI 10.1016/j.chaos.2006.03.095
   Adamatzky A, 2015, PHYS REV E, V92, DOI 10.1103/PhysRevE.92.032811
   Adamatzky A, 2011, ISR J CHEM, V51, P56, DOI 10.1002/ijch.201000046
   Adarnatzky A, 2009, PHYS LETT A, V373, P952, DOI 10.1016/j.physleta.2008.12.070
   Andreasson J, 2004, J AM CHEM SOC, V126, P15926, DOI 10.1021/ja045577l
   Andreasson J, 2006, J AM CHEM SOC, V128, P16259, DOI 10.1021/ja0654579
   Ashkenasy G, 2004, J AM CHEM SOC, V126, P11140, DOI 10.1021/ja046745c
   Baron R, 2006, ANGEW CHEM INT EDIT, V45, P1572, DOI 10.1002/anie.200503314
   Beato V, 2003, P SOC PHOTO-OPT INS, V5114, P353, DOI 10.1117/12.490183
   Belousov B. P., 1959, COLLECTION SHORT PAP, P1
   Belsterling C.A., 1971, FLUIDIC SYSTEMS DESI
   Conway A., 1971, A GUIDE TO FLUIDICS
   Costello B, 2011, CHEM PHYS, V381, P88, DOI 10.1016/j.chemphys.2011.01.014
   Costello BD, 2009, PHYS REV E, V79, DOI 10.1103/PhysRevE.79.026114
   Duchemin I, 2005, CHEM PHYS LETT, V406, P167, DOI 10.1016/j.cplett.2005.02.090
   Ellenbogen JC, 2000, P IEEE, V88, P386, DOI 10.1109/5.838115
   FIELD RJ, 1974, J CHEM PHYS, V60, P1877, DOI 10.1063/1.1681288
   Gorecka JN, 2009, INT J UNCONV COMPUT, V5, P129
   Gorecki J, 2003, J PHYS CHEM A, V107, P1664, DOI 10.1021/jp021041f
   Gorecki J, 2014, PHYS REV E, V89, DOI 10.1103/PhysRevE.89.042910
   Gunji Yukio-Pegio, 2011, Complex Systems, V20, P93
   Guo XF, 2004, J PHYS CHEM B, V108, P11942, DOI 10.1021/jp047706q
   Hobbs E. V., 1963, TR1114 HARR DIAM LAB
   Ikeda M, 2014, NAT CHEM, V6, P511, DOI [10.1038/nchem.1937, 10.1038/NCHEM.1937]
   Jones J, 2010, BIOSYSTEMS, V101, P51, DOI 10.1016/j.biosystems.2010.04.005
   Kapral R., 1995, CHEM WAVES PATTERNS
   Katz E, 2010, CHEM SOC REV, V39, P1835, DOI 10.1039/b806038j
   KUHNERT L, 1986, NATURE, V319, P393, DOI 10.1038/319393a0
   Langford SJ, 2003, J AM CHEM SOC, V125, P11198, DOI 10.1021/ja036909
   Lederman H, 2006, BIOCHEMISTRY-US, V45, P1194, DOI 10.1021/bi051871u
   Moylan MJ., 1968, FLUID LOGIC SIMPLE T
   Rackham O, 2005, J AM CHEM SOC, V127, P17584, DOI 10.1021/ja055338d
   Rosello-Merino M., 2009, INT J UNCONV COMPUT, V6, P163
   Sendina-Nadal I, 2001, PHYS REV LETT, V86, P1646, DOI 10.1103/PhysRevLett.86.1646
   Stojanovic MN, 2003, J AM CHEM SOC, V125, P6673, DOI 10.1021/ja0296632
   Toth R., 2010, THEORETICAL TECHNOLO, P162, DOI DOI 10.4018/978-1-60960-186-7.CH011
   Tsuda S, 2004, BIOSYSTEMS, V73, P45, DOI 10.1016/j.biosystems.2003.08.001
   Whiting JGH, 2014, BIOSYSTEMS, V124, P21, DOI 10.1016/j.biosystems.2014.08.001
   WINFREE AT, 1984, J CHEM EDUC, V61, P661
   ZHABOTINSKII A. M., 1964, BIOFIZIKA, V9, P306
NR 42
TC 0
Z9 0
U1 0
U2 0
PU COMPLEX SYSTEMS PUBLICATIONS INC
PI CHAMPAIGN
PA PO BOX 6149, CHAMPAIGN, IL 61826 USA
SN 0891-2513
J9 COMPLEX SYST
JI Complex Syst.
PY 2016
VL 25
IS 3
BP 237
EP 254
PG 18
WC Mathematics, Interdisciplinary Applications
SC Mathematics
GA EE7ND
UT WOS:000389805100004
ER

PT J
AU Suharyadi, E
   Oshima, D
   Kato, T
   Iwata, S
AF Suharyadi, Edi
   Oshima, Daiki
   Kato, Takeshi
   Iwata, Satoshi
TI Nanoscale patterning of CrPt3 magnetic thin films by using ion beam
   irradiation
SO Results in Physics
LA English
DT Article
DE Ordered L1(2) alloy films; CrPt3; Ion irradiation; Planar patterned
   media
ID MEDIA
AB We have successfully fabricated planar patterned CrPt3 ordered L1(2) alloy films by Kr+ ion irradiation. Planar-patterned CrPt3 nanodots with various bit sizes from 200 nm to 50 nm were successfully fabricated by 30 keV Kr+ ion irradiation at a dose of 2 x 10(14) ions/cm(2), where e-beam lithography was used for creating the resist mask. We have confirmed that the nanofabrication process didn't change the magnetic properties of CrPt3 ordered L1(2) alloy films. As-prepared film exhibited perpendicular hysteresis loop with the coercivity of 5.5 kOe. The typical perpendicular maze domain structure with the stripe structure was clearly seen in as-prepared CrPt3 film. Magnetic force microscopy (MFM) images of patterned CrPt3 nanodots indicated that each un-irradiated bit consists of localized perpendicular magnetic domain structures, which corresponds to perpendicular magnetization direction. Nanodots with bit size 680 nm show either dark or bright contrast, suggesting single domain structure. No magnetic contrast in irradiated space is due to the suppressing of the magnetization by Kr+ ion irradiation. (C) 2016 The Authors. Published by Elsevier B.V.
C1 [Suharyadi, Edi] Gadjah Mada Univ, Dept Phys, Sekip Utara BLS 21, Yogyakarta 55281, Indonesia.
   [Oshima, Daiki; Iwata, Satoshi] Nagoya Univ, Inst Mat & Syst Sustainabil, Chikusa Ku, Furo Cho, Nagoya, Aichi 4648603, Japan.
   [Kato, Takeshi] Nagoya Univ, Grad Sch Engn, Dept Elect Engn & Comp Sci, Chikusa Ku, Furo Cho, Nagoya, Aichi 4648603, Japan.
RP Suharyadi, E (reprint author), Gadjah Mada Univ, Dept Phys, Sekip Utara BLS 21, Yogyakarta 55281, Indonesia.
EM esuharyadi@ugm.ac.id
CR Aign T, 1998, PHYS REV LETT, V81, P5656, DOI 10.1103/PhysRevLett.81.5656
   Albrecht M, 2002, APPL PHYS LETT, V81, P2875, DOI 10.1063/1.1512946
   Chappert C, 1998, SCIENCE, V280, P1919, DOI 10.1126/science.280.5371.1919
   Cho J, 1999, J APPL PHYS, V86, P3149, DOI 10.1063/1.371181
   Ferre J, 1999, J MAGN MAGN MATER, V198-99, P191, DOI 10.1016/S0304-8853(98)01084-1
   Hyndman R, 2001, J APPL PHYS, V90, P3843, DOI 10.1063/1.1401803
   Kato T, 2009, J APPL PHYS, V106, DOI 10.1063/1.3212967
   Koike K, 2001, APPL PHYS LETT, V78, P784, DOI 10.1063/1.1345804
   Maret M, 2000, J MAGN MAGN MATER, V218, P151, DOI 10.1016/S0304-8853(00)00367-X
   Maret M, 2005, J PHYS-CONDENS MAT, V17, P2529, DOI 10.1088/0953-8984/17/17/001
   Rettner CT, 2002, IEEE T MAGN, V38, P1725, DOI 10.1109/TMAG.2002.1017763
   Suharyadi E, 2006, IEEE T MAGN, V42, P2972, DOI 10.1109/TMAG.2006.880076
   Suharyadi E, 2005, IEEE T MAGN, V41, P3595, DOI 10.1109/TMAG.2005.854735
   Terris BD, 1999, APPL PHYS LETT, V75, P403, DOI 10.1063/1.124389
NR 14
TC 1
Z9 1
U1 1
U2 1
PU ELSEVIER SCIENCE BV
PI AMSTERDAM
PA PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
SN 2211-3797
J9 RESULTS PHYS
JI Results Phys.
PY 2016
VL 6
BP 186
EP 188
DI 10.1016/j.rinp.2016.03.010
PG 3
WC Materials Science, Multidisciplinary; Physics, Multidisciplinary
SC Materials Science; Physics
GA EE7BU
UT WOS:000389770300046
ER

PT J
AU Meng, ZG
   Li, GJ
   Ng, SM
   Wong, HF
   Yiu, SC
   Ho, CL
   Leung, CW
   Wong, WY
AF Meng, Zhengong
   Li, Guijun
   Ng, Sheung-Mei
   Wong, Hon-Fai
   Yiu, Sze-Chun
   Ho, Cheuk-Lam
   Leung, Chi-Wah
   Wong, Wai-Yeung
TI Nanopatterned L1(0)-FePt nanoparticles from single-source metallopolymer
   precursors for potential application in ferromagnetic bit-patterned
   media magnetic recording
SO POLYMER CHEMISTRY
LA English
DT Article
ID DATA-STORAGE MEDIA; FEPT NANOPARTICLES; NANOIMPRINT LITHOGRAPHY;
   REDUCTION; TEMPERATURE; COMPLEXES; IMPRINT; ALLOYS; GROWTH; ARRAYS
AB Bit-patterned media (BPM) with a precise stoichiometry ratio of Fe and Pt atoms are promising for future high areal density magnetic recording. Here, we report a new FePt-containing metallopolymer P as the single-source precursor for the synthesis of magnetic metal alloy nanoparticles. This polymer was synthesized from a random copolymer poly(styrene-4-ethynylstyrene) PES-PS and the bimetallic precursor TPy-FePt ([Pt(4'-ferrocenyl-(N<^>N<^>N))Cl]Cl) by the CuI-catalyzed dehydrohalogenation. After pyrolysis of P, the stoichiometry of Fe and Pt atoms in the synthesized nanoparticles is nearly close to 1 : 1, which is more precise than that by using TPy-FePt as the precursor. Also, polymer P is more suitable for patterning by high-throughput nanoimprint lithography (NIL) compared to TPy-FePt. Ferromagnetic nanolines, potentially useful for fabricating bit-patterned magnetic recording media, were successfully obtained from P and fully characterized.
C1 [Meng, Zhengong; Yiu, Sze-Chun; Ho, Cheuk-Lam; Wong, Wai-Yeung] Hong Kong Baptist Univ, Inst Mol Funct Mat, Dept Chem, Partner State Key Lab Environm & Biol Anal, Waterloo Rd, Kowloon Tong, Hong Kong, Peoples R China.
   [Meng, Zhengong; Yiu, Sze-Chun; Ho, Cheuk-Lam; Wong, Wai-Yeung] Hong Kong Baptist Univ, Inst Adv Mat, Waterloo Rd, Kowloon Tong, Hong Kong, Peoples R China.
   [Li, Guijun; Ng, Sheung-Mei; Wong, Hon-Fai; Leung, Chi-Wah] Hong Kong Polytech Univ, Dept Appl Phys, Hong Kong, Hong Kong, Peoples R China.
   [Ho, Cheuk-Lam; Wong, Wai-Yeung] Shenzhen Virtual Univ Pk, HKBU Inst Res & Continuing Educ, Shenzhen 518057, Peoples R China.
RP Ho, CL; Wong, WY (reprint author), Hong Kong Baptist Univ, Inst Mol Funct Mat, Dept Chem, Partner State Key Lab Environm & Biol Anal, Waterloo Rd, Kowloon Tong, Hong Kong, Peoples R China.; Ho, CL; Wong, WY (reprint author), Hong Kong Baptist Univ, Inst Adv Mat, Waterloo Rd, Kowloon Tong, Hong Kong, Peoples R China.; Leung, CW (reprint author), Hong Kong Polytech Univ, Dept Appl Phys, Hong Kong, Hong Kong, Peoples R China.; Ho, CL; Wong, WY (reprint author), Shenzhen Virtual Univ Pk, HKBU Inst Res & Continuing Educ, Shenzhen 518057, Peoples R China.
EM clamho@hkbu.edu.hk; dennis.leung@polyu.edu.hk; rwywong@hkbu.edu.hk
RI Li, Guijun/N-6865-2013
OI Li, Guijun/0000-0001-6259-3209
FU Hong Kong Baptist University [FRG1/13-14/066, FRG2/13-14/078,
   FRG2/13-14/083]; National Natural Science Foundation of China [21504074,
   51373145]; Science, Technology and Innovation Committee of Shenzhen
   Municipality [JCYJ20140818163041143, JCYJ 20140419130507116]; Hong Kong
   Research Grants Council [HKBU203312]; Areas of Excellence Scheme,
   University Grants Committee of HKSAR [AoE/P-03/08]; Mr Kwok Yat Wai and
   Madam Kwok Chung Bo Fun Graduate School Development Fund; RGC-GRF (The
   Hong Kong Polytechnic University) [153015/14P]; Hong Kong Polytechnic
   University [1-ZE25]
FX C.-L. Ho thanks Hong Kong Baptist University (FRG1/13-14/066 and
   FRG2/13-14/078) the National Natural Science Foundation of China (Grant
   No. 21504074) and the Science, Technology and Innovation Committee of
   Shenzhen Municipality (JCYJ20140818163041143) for their financial
   support. W.-Y. Wong acknowledges the financial support from the National
   Natural Science Foundation of China (Grant No. 51373145), the Hong Kong
   Research Grants Council (HKBU203312), the Areas of Excellence Scheme,
   University Grants Committee of HKSAR (AoE/P-03/08), the Science,
   Technology and Innovation Committee of Shenzhen Municipality (JCYJ
   20140419130507116) and Hong Kong Baptist University (FRG2/13-14/083).
   S.-C. Yiu acknowledges the support from "Mr Kwok Yat Wai and Madam Kwok
   Chung Bo Fun Graduate School Development Fund". C.-W. Leung acknowledges
   the support of RGC-GRF (The Hong Kong Polytechnic University 153015/14P)
   and The Hong Kong Polytechnic University (1-ZE25).
CR Bauer JC, 2008, J MATER CHEM, V18, P275, DOI 10.1039/b712035d
   Burkert T, 2005, PHYS REV B, V71, DOI 10.1103/PhysRevB.71.134411
   Capobianchi A, 2009, CHEM MATER, V21, P2007, DOI 10.1021/cm9003992
   Chiang WH, 2008, ADV MATER, V20, P4857, DOI 10.1002/adma.200801006
   Chou SY, 1997, J VAC SCI TECHNOL B, V15, P2897, DOI 10.1116/1.589752
   CHOU SY, 1995, APPL PHYS LETT, V67, P3114, DOI 10.1063/1.114851
   CONSTABLE EC, 1994, J CHEM SOC DALTON, P645, DOI 10.1039/dt9940000645
   Dong QC, 2015, J MATER CHEM C, V3, P734, DOI 10.1039/c4tc02058h
   Dong QC, 2014, ADV FUNCT MATER, V24, P857, DOI 10.1002/adfm.201301143
   Dong Q, 2012, ADV MATER, V24, P1034, DOI 10.1002/adma.201104171
   Elkins KE, 2003, NANO LETT, V3, P1647, DOI 10.1021/nl034743w
   Ethirajan A, 2007, ADV MATER, V19, P406, DOI 10.1002/adma.200601759
   Guo SJ, 2012, J AM CHEM SOC, V134, P2492, DOI 10.1021/ja2104334
   Harpeness R, 2005, J MATER CHEM, V15, P698, DOI 10.1039/b411829d
   Hyeon T, 2003, CHEM COMMUN, P927, DOI 10.1039/b207789b
   Jiang HL, 2011, J AM CHEM SOC, V133, P1304, DOI 10.1021/ja1099006
   Kang E, 2011, ACS NANO, V5, P1018, DOI 10.1021/nn102451y
   Kang S, 2002, NANO LETT, V2, P1033, DOI [10.1021/nl025614b, 10.1021/nl25614b]
   Li GJ, 2011, THIN SOLID FILMS, V519, P8307, DOI 10.1016/j.tsf.2011.03.088
   Li Q, 2015, NANO LETT, V15, P2468, DOI 10.1021/acs.nanolett.5b00320
   Liu C, 2004, J PHYS CHEM B, V108, P6121, DOI 10.1021/jp0312971
   Liu K, 2008, ANGEW CHEM INT EDIT, V47, P1255, DOI 10.1002/anie.200703199
   Liu WJ, 2014, CHEM ENG J, V236, P448, DOI 10.1016/j.cej.2013.10.062
   Liu Y, 2014, J SOLID STATE CHEM, V209, P69, DOI 10.1016/j.jssc.2013.10.027
   Margeat O, 2007, PHYS REV B, V75, DOI 10.1103/PhysRevB.75.134410
   Mitra K, 2014, DALTON T, V43, P751, DOI 10.1039/c3dt51922h
   Morecroft D, 2009, J VAC SCI TECHNOL B, V27, P2837, DOI 10.1116/1.3264670
   Peng XH, 2008, CHEM SOC REV, V37, P1619, DOI 10.1039/b716441f
   Saita S, 2005, CHEM MATER, V17, P3705, DOI 10.1021/cm050568c
   Schift H, 2008, J VAC SCI TECHNOL B, V26, P458, DOI 10.1116/1.2890972
   Shim J, 2012, ACS NANO, V6, P6870, DOI 10.1021/nn301692y
   Song HM, 2006, CHEM COMMUN, P1292, DOI 10.1039/b516831g
   Song HM, 2009, J MATER CHEM, V19, P3677, DOI 10.1039/b818838f
   Spatz JP, 2000, LANGMUIR, V16, P407, DOI 10.1021/1a990070n
   Sun SH, 2006, ADV MATER, V18, P393, DOI 10.1002/adma.200501464
   Sun SH, 2000, SCIENCE, V287, P1989, DOI 10.1126/science.287.5460.1989
   Tang B, 2009, J AM CHEM SOC, V131, P3016, DOI 10.1021/ja809149g
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   TSUDA K, 1993, MACROMOLECULES, V26, P6985, DOI 10.1021/ma00077a041
   Weller D, 2001, IEEE T MAGN, V37, P2185, DOI 10.1109/20.951119
   Wellons MS, 2007, CHEM MATER, V19, P2483, DOI 10.1021/cm062455e
   Xing LB, 2012, CHEM COMMUN, V48, P10886, DOI 10.1039/c2cc35960j
NR 42
TC 4
Z9 4
U1 7
U2 11
PU ROYAL SOC CHEMISTRY
PI CAMBRIDGE
PA THOMAS GRAHAM HOUSE, SCIENCE PARK, MILTON RD, CAMBRIDGE CB4 0WF, CAMBS,
   ENGLAND
SN 1759-9954
EI 1759-9962
J9 POLYM CHEM-UK
JI Polym. Chem.
PY 2016
VL 7
IS 27
BP 4467
EP 4475
DI 10.1039/c6py00714g
PG 9
WC Polymer Science
SC Polymer Science
GA DQ8WT
UT WOS:000379493000004
ER

PT J
AU Tabakovic, I
   Qiu, JM
   Dragos, O
AF Tabakovic, Ibro
   Qiu, Jiao-Ming
   Dragos, Oana
TI Electrodeposition of Thin CoPt Films with Very High Perpendicular
   Anisotropy from Hexachloroplatinate Solution: Effect of Saccharin
   Additive and Electrode Substrate
SO JOURNAL OF THE ELECTROCHEMICAL SOCIETY
LA English
DT Article
ID FE-PT FILMS; HARD MAGNETIC-PROPERTIES; MEDIA; TRANSFORMATION; MORPHOLOGY
AB The CoPt films with 9.7-91 at% Co and thicknesses of 15-20 nm were obtained from a new designed stable hexachloroplatinate solution at a controlled potential deposition. The effects of the substrate (Ru and Cu) and an organic additive (saccharin) on composition, crystal structure and magnetic properties of the CoPt films were studied. It was demonstrated that a Ru electrode substrate provides well-defined surface for the epitaxial growth of hcp phase, resulting in high perpendicular anisotropy. The addition of saccharin (Sacc) as an organic additive into the plating solution caused a dramatic improvement of the epitaxial growth of CoPt film on the Ru substrate. At the film thickness of interest, for bit-patterned media BPM (15-20 nm), the out-of-plane coercivity showed the highest value of 6700 Oe and the squarness M-r/M-s similar to 1. (C) The Author(s) 2016. Published by ECS. This is an open access article distributed under the terms of the Creative Commons Attribution 4.0 License (CC BY, http://creativecommons.org/licenses/by/4.0/), which permits unrestricted reuse of the work in any medium, provided the original work is properly cited. All rights reserved.
C1 [Tabakovic, Ibro; Qiu, Jiao-Ming] Univ Minnesota, ECE Dept, Minneapolis, MN 55435 USA.
   [Dragos, Oana] Natl Inst R&D Tech Phys, Iasi, Romania.
RP Tabakovic, I (reprint author), Univ Minnesota, ECE Dept, Minneapolis, MN 55435 USA.
EM tabakovicibro@gmail.com
FU European Commission [FP7-REGPOT-2012-2013-1, 316194]
FX The authors (I. T. and J. -M. Q.) are grateful for the early support of
   this work by Seagate Technology. This work was partially supported by
   European Commission through FP7-REGPOT-2012-2013-1 NANOSENS project
   (Grant Agreement No. 316194).
CR Dragos O, 2016, J ELECTROCHEM SOC, V163, pD83, DOI 10.1149/2.0771603jes
   Egelhoff T. S., 2005, J ELECTROCHEM SOC, V152, pC27
   Futamoto M, 2012, ECS TRANSACTIONS, V50, P59, DOI 10.1149/05010.0059ecst
   Ghidini M, 2006, J APPL PHYS, V100, DOI 10.1063/1.2357869
   Jyoko Y, 2001, ELECTROCHIM ACTA, V47, P371, DOI 10.1016/S0013-4686(01)00589-8
   Kryder MH, 2008, P IEEE, V96, P1810, DOI 10.1109/JPROC.2008.2004315
   Leistner K, 2004, J APPL PHYS, V95, P7267, DOI 10.1063/1.1667438
   Liang DF, 2010, ELECTROCHIM ACTA, V55, P8100, DOI 10.1016/j.electacta.2010.02.074
   Liang DF, 2010, ACS APPL MATER INTER, V2, P961, DOI 10.1021/am100066x
   Lim BC, 2004, J MAGN MAGN MATER, V271, P431, DOI 10.1016/j.jmmm.2003.09.052
   Mallett JJ, 2005, ELECTROCHEM SOLID ST, V8, pC15, DOI 10.1149/1.1833651
   Mitsuzuka K, 2007, IEEE T MAGN, V43, P2160, DOI 10.1109/TMAG.2007.893129
   Moudler J. M., 1992, HANDBOOK OF X RAY PH
   Pattanaik G, 2006, J APPL PHYS, V99, DOI 10.1063/1.2150805
   Pattanaik G, 2006, J ELECTROCHEM SOC, V153, pC6, DOI 10.1149/1.2128106
   Pattanaik G, 2006, APPL PHYS LETT, V89, DOI 10.1063/1.2339070
   Rhen FMF, 2003, IEEE T MAGN, V39, P2699, DOI 10.1109/TMAG.2003.815566
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Rozman KZ, 2007, J MAGN MAGN MATER, V314, P116, DOI 10.1016/j.jmmm.2007.02.146
   Shimatsu T, 2006, J APPL PHYS, V99, DOI 10.1063/1.2167351
   Shimatsu T, 2004, IEEE T MAGN, V40, P2483, DOI [10.1109/TMAG.2004.832448, 10.1109/tmag.2004.832448]
   Sirtori V, 2011, ACS APPL MATER INTER, V3, P1800, DOI 10.1021/am200267u
   Tabakovic I, 2006, J ELECTROCHEM SOC, V153, pC586, DOI 10.1149/1.2207821
   Tabakovic I., 2016, J ELECTROCHEM SOC, V162, pD291
   Terris BD, 2009, J MAGN MAGN MATER, V321, P512, DOI 10.1016/j.jmmm.2008.05.046
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Vokoun D, 2006, J APPL PHYS, V99, DOI 10.1063/1.2164410
   Whalen JJ, 2005, J ELECTROCHEM SOC, V152, pC738, DOI 10.1149/1.2047407
   Wierman KW, 2002, J APPL PHYS, V91, P8031, DOI 10.1063/1.1447498
   Wodarz S., 2015, ELECTROCHIM ACTA IN
   Zana I, 2004, J MAGN MAGN MATER, V272, P1698, DOI 10.1016/j.jmmm.2003.12.262
   Zana I, 2003, ELECTROCHEM SOLID ST, V6, pC153, DOI 10.1149/1.1619648
   Tabakovic I., 2010, Pat. Appl., Patent No. [US 2010/ 0247960, 0247960]
NR 33
TC 2
Z9 2
U1 8
U2 13
PU ELECTROCHEMICAL SOC INC
PI PENNINGTON
PA 65 SOUTH MAIN STREET, PENNINGTON, NJ 08534 USA
SN 0013-4651
EI 1945-7111
J9 J ELECTROCHEM SOC
JI J. Electrochem. Soc.
PY 2016
VL 163
IS 7
BP D287
EP D294
DI 10.1149/2.0491607jes
PG 8
WC Electrochemistry; Materials Science, Coatings & Films
SC Electrochemistry; Materials Science
GA DN9PW
UT WOS:000377412900078
ER

PT J
AU Bird, SM
   El-Zubir, O
   Rawlings, AE
   Leggett, GJ
   Staniland, SS
AF Bird, S. M.
   El-Zubir, O.
   Rawlings, A. E.
   Leggett, G. J.
   Staniland, S. S.
TI A novel design strategy for nanoparticles on nanopatterns:
   interferometric lithographic patterning of Mms6 biotemplated magnetic
   nanoparticles
SO JOURNAL OF MATERIALS CHEMISTRY C
LA English
DT Article
ID SELF-ASSEMBLED MONOLAYERS; DIP-PEN NANOLITHOGRAPHY; DATA-STORAGE;
   MAGNETOSOME MEMBRANE; PROTEIN MMS6; FABRICATION; BACTERIA; ROUTES;
   BIOMINERALIZATION; NANOSTRUCTURES
AB Nanotechnology demands the synthesis of highly precise, functional materials, tailored for specific applications. One such example is bit patterned media. These high-density magnetic data-storage materials require specific and uniform magnetic nanoparticles (MNPs) to be patterned over large areas (cm(2) range) in exact nanoscale arrays. However, the realisation of such materials for nanotechnology applications depends upon reproducible fabrication methods that are both precise and environmentally-friendly, for cost-effective scale-up. A potentially ideal biological fabrication methodology is biomineralisation. This is the formation of inorganic minerals within organisms, and is known to be highly controlled down to the nanoscale whilst being carried out under ambient conditions. The magnetotactic bacterium Magnetospirillum magneticum AMB-1 uses a suite of dedicated biomineralisation proteins to control the formation of magnetite MNPs within their cell. One of these proteins, Mms6, has been shown to control formation of magnetite MNPs in vitro. We have previously used Mms6 on micro-contact printed (mu CP) patterned self-assembled monolayer (SAM) surfaces to control the formation and location of MNPs in microscale arrays, offering a bioinspired and green-route to fabrication. However, mCP cannot produce patterns reliably with nanoscale dimensions, and most alternative nanofabrication techniques are slow and expensive. Interferometric lithography (IL) uses the interference of laser light to produce nanostructures over large areas via a simple process implemented under ambient conditions. Here we combine the bottom-up biomediated approach with a top down IL methodology to produce arrays of uniform magnetite MNPs (86 +/- 21 nm) with a period of 357 nm. This shows a potentially revolutionary strategy for the production of magnetic arrays with nanoscale precision in a process with low environmental impact, which could be scaled readily to facilitate large-scale production of nanopatterned surface materials for technological applications.
C1 [Bird, S. M.; El-Zubir, O.; Rawlings, A. E.; Leggett, G. J.; Staniland, S. S.] Univ Sheffield, Dept Chem, Dainton Bldg, Sheffield S3 7HF, S Yorkshire, England.
   [El-Zubir, O.] Newcastle Univ, Sch Chem, Chem Nanosci Labs, Bedson Bldg, Newcastle Upon Tyne NE1 7RU, Tyne & Wear, England.
RP Staniland, SS (reprint author), Univ Sheffield, Dept Chem, Dainton Bldg, Sheffield S3 7HF, S Yorkshire, England.
EM s.s.staniland@sheffield.ac.uk
FU BBSRC [BB/H005412/2]; EPSRC [EP/J500458/1, EP/I012060/1]
FX The authors would like to thank Stephen Baldwin for the pTTQ18 based
   parent vector. We would also like to thank Rebecca Savage and Jamie
   Hobbs for their help with obtaining MFM images and Nik Reeves-McLaren
   for support with XRD. Thanks also to Jonathan Bramble for assistance
   with MFM plotting, and Johanna Galloway for general discussions. We
   thank the BBSRC (BB/H005412/2) for funding this work, and the EPSRC for
   funding Scott Bird (CDT studentship (EP/J500458/1)), the interferometer
   and Osama El-Zubir (EP/I012060/1).
CR Amemiya Y, 2007, BIOMATERIALS, V28, P5381, DOI 10.1016/j.biomaterials.2007.07.051
   Arakaki A, 2003, J BIOL CHEM, V278, P8745, DOI 10.1074/jbc.M211729200
   Bellini S, 2009, CHIN J OCEANOL LIMN, V27, P3, DOI 10.1007/s00343-009-0003-5
   Bellini S, 2009, CHIN J OCEANOL LIMN, V27, P6, DOI 10.1007/s00343-009-0006-2
   BERGGREN KK, 1995, SCIENCE, V269, P1255, DOI 10.1126/science.7652572
   Bird SM, 2016, RSC ADV, V6, P7356, DOI 10.1039/c5ra16469a
   Bird SM, 2015, NANOSCALE, V7, P7340, DOI 10.1039/c5nr00651a
   BLAKEMORE R, 1975, SCIENCE, V190, P377, DOI 10.1126/science.170679
   Brewer NJ, 2005, J PHYS CHEM B, V109, P11247, DOI 10.1021/jp0443299
   Brott LL, 2001, NATURE, V413, P291, DOI 10.1038/35095031
   Brueck SRJ, 2005, P IEEE, V93, P1704, DOI 10.1109/JPROC.2005.853538
   El Zubir O, 2013, NANOSCALE, V5, P11125, DOI 10.1039/c3nr04701f
   Ely T. O., 2000, J PHYS CHEM B, V104, P695, DOI DOI 10.1021/JP9924427
   Faraji M, 2010, J IRAN CHEM SOC, V7, P1
   Galloway J. M., 2013, MATER RES SOC S P, V1569, P231
   Galloway JM, 2015, ADV FUNCT MATER, V25, P4590, DOI 10.1002/adfm.201501090
   Galloway JM, 2012, J NANO RES-SW, V17, P127, DOI 10.4028/www.scientific.net/JNanoR.17.127
   Galloway JM, 2012, SMALL, V8, P204, DOI 10.1002/smll.201101627
   Galloway JM, 2011, J MATER CHEM, V21, P15244, DOI [10.1039/c1jm12003d/, 10.1039/c1jm12003d]
   Ginger DS, 2004, ANGEW CHEM INT EDIT, V43, P30, DOI 10.1002/anie.200300608
   GORBY YA, 1988, J BACTERIOL, V170, P834
   Grunberg K, 2004, APPL ENVIRON MICROB, V70, P1040, DOI 10.1128/AEM.70.2.1040-1050.2004
   Guivar J.A.R., 2014, ADV NANOPART, V2014
   Horcas I, 2007, REV SCI INSTRUM, V78, DOI 10.1063/1.2432410
   Hutt DA, 1996, J PHYS CHEM-US, V100, P6657, DOI 10.1021/jp952734h
   Klem MT, 2005, ADV FUNCT MATER, V15, P1489, DOI 10.1002/adfm.200400453
   LANGFORD JI, 1978, J APPL CRYSTALLOGR, V11, P102, DOI 10.1107/S0021889878012844
   Laurent S, 2008, CHEM REV, V108, P2064, DOI 10.1021/cr068445e
   Metzler RA, 2008, LANGMUIR, V24, P2680, DOI 10.1021/la7031237
   Moxey M, 2015, ACS NANO, V9, P6262, DOI 10.1021/acsnano.5b01636
   Naik RR, 2002, NAT MATER, V1, P169, DOI 10.1038/nmat758
   Nikogeorgos N, 2012, LANGMUIR, V28, P17709, DOI 10.1021/la304246e
   Patterson AL, 1939, PHYS REV, V56, P978, DOI 10.1103/PhysRev.56.978
   Piner RD, 1999, SCIENCE, V283, P661, DOI 10.1126/science.283.5402.661
   Piramanayagam S. N., 2011, DEV DATA STORAGE MAT
   Qin D, 2010, NAT PROTOC, V5, P491, DOI 10.1038/nprot.2009.234
   Rawlings AE, 2015, CHEM SCI, V6, P5586, DOI 10.1039/c5sc01472g
   Reddy LH, 2012, CHEM REV, V112, P5818, DOI 10.1021/cr300068p
   REGAZZONI AE, 1981, J INORG NUCL CHEM, V43, P1489, DOI 10.1016/0022-1902(81)80322-3
   Reiss BD, 2004, NANO LETT, V4, P1127, DOI 10.1021/nl049825n
   Schneider CA, 2012, NAT METHODS, V9, P671, DOI 10.1038/nmeth.2089
   Sun SH, 2000, SCIENCE, V287, P1989, DOI 10.1126/science.287.5460.1989
   Tamerler C, 2003, MATER RES SOC SYMP P, V773, P101
   Terris BD, 2007, MICROSYST TECHNOL, V13, P189, DOI 10.1007/s00542-006-0144-9
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Tiede C, 2014, PROTEIN ENG DES SEL, V27, P145, DOI 10.1093/protein/gzu007
   Tizazu G, 2011, NANOSCALE, V3, P2511, DOI 10.1039/c0nr00994f
   Tsargorodska A, 2014, ACS NANO, V8, P7858, DOI 10.1021/nn5014319
   Wang B, 2006, BIOMACROMOLECULES, V7, P1203, DOI 10.1021/bm060030f
   Wang L., 2011, BIOMACROMOLECULES, V13, P98
   Weller D, 2000, IEEE T MAGN, V36, P10, DOI 10.1109/20.824418
   Zharnikov M, 2002, J VAC SCI TECHNOL B, V20, P1793, DOI 10.1116/1.1514665
NR 52
TC 5
Z9 5
U1 5
U2 14
PU ROYAL SOC CHEMISTRY
PI CAMBRIDGE
PA THOMAS GRAHAM HOUSE, SCIENCE PARK, MILTON RD, CAMBRIDGE CB4 0WF, CAMBS,
   ENGLAND
SN 2050-7526
EI 2050-7534
J9 J MATER CHEM C
JI J. Mater. Chem. C
PY 2016
VL 4
IS 18
BP 3948
EP 3955
DI 10.1039/c5tc03895b
PG 8
WC Materials Science, Multidisciplinary; Physics, Applied
SC Materials Science; Physics
GA DL5RQ
UT WOS:000375694900007
ER

PT J
AU Zheng, N
   Li, JP
   Dahandeh, S
   Zhang, T
AF Zheng, Ning
   Li, Jiangpeng
   Dahandeh, Shafa
   Zhang, Tong
TI Self-Directed Equalization for Magnetic Recording Channels With
   Multi-Sensor Read Head
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Cosine similarity; equalizer bank; least-mean-square; multi-sensor; read
   head offset; self-directed equalization
ID BIT-PATTERNED MEDIA; PERFORMANCE
AB Today, adaptive equalization is generally used to capture the run-time read channel dynamics in the presence of a random read-head offset. An adaptive equalizer updates its coefficients using a certain adaptive signal-processing algorithm, e. g., least-mean-square algorithm. This paper proposes a self-directed equalization strategy for the emerging very high-density magnetic recording drives with a multi-sensor read head. The key idea is to exploit the spatial diversity of readback signals from different read sensors to accurately estimate run-time read-head offsets, based upon which the equalizer coefficients are accordingly self-configured in order to improve the equalization performance. This paper presents specific methods to practically implement this design strategy, and its effectiveness has been well demonstrated through the simulations with a Voronoi-based channel model.
C1 [Zheng, Ning; Li, Jiangpeng; Zhang, Tong] Rensselaer Polytech Inst, Troy, NY 12180 USA.
   [Dahandeh, Shafa] Western Digital Corp, Irvine, CA 92612 USA.
RP Zheng, N (reprint author), Rensselaer Polytech Inst, Troy, NY 12180 USA.
EM ningzhengrpi@gmail.com
FU Advanced Storage Technology Consortium
FX This work was supported by a grant from the Advanced Storage Technology
   Consortium.
CR Duda R. O., 2000, PATTERN CLASSIFICATI
   Elidrissi MR, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2014.2319088
   Iyengar AR, 2011, IEEE T MAGN, V47, P35, DOI 10.1109/TMAG.2010.2080667
   Karakulak S, 2010, IEEE T MAGN, V46, P3639, DOI 10.1109/TMAG.2010.2049116
   Lim F, 2010, IEEE T MAGN, V46, P1548, DOI 10.1109/TMAG.2009.2038281
   Miura K, 2009, IEEE T MAGN, V45, P3722, DOI 10.1109/TMAG.2009.2023850
   Nabavi S, 2007, IEEE ICC, P6249, DOI 10.1109/ICC.2007.1035
   Seigler MA, 2008, IEEE T MAGN, V44, P119, DOI 10.1109/TMAG.2007.911029
   Weller D, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2013.2281027
   Wood R, 2009, IEEE T MAGN, V45, P917, DOI 10.1109/TMAG.2008.2010676
   Yamashita M, 2012, IEEE T MAGN, V48, P4586, DOI 10.1109/TMAG.2012.2194988
   Yamashita M, 2011, IEEE T MAGN, V47, P3558, DOI 10.1109/TMAG.2011.2157808
   Zheng N, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2014.2362882
   Zheng N, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2014.2300133
NR 14
TC 0
Z9 0
U1 0
U2 0
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JAN
PY 2016
VL 52
IS 1
AR 3300306
DI 10.1109/TMAG.2015.2479581
PG 6
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA DG4VP
UT WOS:000372071500006
ER

PT J
AU Wan, L
   Ji, SX
   Liu, CC
   Craig, GSW
   Nealey, PF
AF Wan, Lei
   Ji, Shengxiang
   Liu, Chi-Chun
   Craig, Gordon S. W.
   Nealey, Paul F.
TI Directed self-assembly of solvent-vapor-induced non-bulk block copolymer
   morphologies on nanopatterned substrates
SO SOFT MATTER
LA English
DT Article
ID SYMMETRIC DIBLOCK COPOLYMER; DEVICE-ORIENTED STRUCTURES; BIT-PATTERNED
   MEDIA; THIN-FILMS; DENSITY MULTIPLICATION; TRIBLOCK COPOLYMER;
   CHEMICAL-PATTERNS; AREAL DENSITY; LITHOGRAPHY; FABRICATION
AB We report a study on directed self-assembly (DSA) with solvent annealing to induce the formation of non-bulk block copolymer microdomains on chemical patterns. Ultrathin films of symmetric polystyrene-block-poly(methyl methacrylate) (PS-b-PMMA) display morphologies of PMMA dots, stripes, and PS hexagons with increasing exposure time to acetone vapor, a PMMA-selective solvent. All three nanostructures form long-range-ordered and registered arrays on striped chemical patterns with periods (L-S) commensurate to the solvated PS-b-PMMA microdomain period (L-0,L-s). Solvent annealing is shown to facilitate DSA on non-regular chemical patterns, on which the local periods are incommensurate to L0, s. DSA with feature density multiplication, via solvent annealing, is also demonstrated.
C1 [Wan, Lei] HGST, San Jose Res Ctr, 3403 Yerba Buena Rd, San Jose, CA 95135 USA.
   [Ji, Shengxiang] Chinese Acad Sci, Changchun Inst Appl Chem, Key Lab Polymer Ecomat, 5625 Renmin St, Changchun 130022, Peoples R China.
   [Liu, Chi-Chun] IBM Albany NanoTech, 257 Fuller Rd, Albany, NY 12203 USA.
   [Craig, Gordon S. W.; Nealey, Paul F.] Univ Chicago, Inst Mol Engn, 5747 South Ellis Ave, Chicago, IL 60637 USA.
RP Nealey, PF (reprint author), Univ Chicago, Inst Mol Engn, 5747 South Ellis Ave, Chicago, IL 60637 USA.
EM nealey@uchicago.edu
RI Ji, Shengxiang/A-7567-2015
OI Ji, Shengxiang/0000-0003-0336-0530
FU U.S. Department of Energy, Office of Science, Office of Basic Energy
   Sciences-Materials Science; National Natural Science Foundation of China
   [51173181, 51373166]; Chinese Academy of Sciences
FX This work is supported by the U.S. Department of Energy, Office of
   Science, Office of Basic Energy Sciences-Materials Science. SJ
   acknowledges the financial support from the National Natural Science
   Foundation of China (No. 51173181, 51373166) and "The Hundred Talents
   Program" from the Chinese Academy of Sciences.
CR Albrecht TR, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2015.2397880
   Bang J, 2009, ADV MATER, V21, P4769, DOI 10.1002/adma.200803302
   BATES FS, 1990, ANNU REV PHYS CHEM, V41, P525, DOI 10.1146/annurev.pc.41.100190.002521
   Bencher C, 2011, PROC SPIE, V7970, DOI 10.1117/12.881293
   Bita I, 2008, SCIENCE, V321, P939, DOI 10.1126/science.1159352
   Black CT, 2007, IBM J RES DEV, V51, P605
   Bosworth JK, 2008, ACS NANO, V2, P1396, DOI 10.1021/nn8001505
   Bosworth JK, 2010, J PHOTOPOLYM SCI TEC, V23, P145, DOI 10.2494/photopolymer.23.145
   Chavis MA, 2015, ADV FUNCT MATER, V25, P3057, DOI 10.1002/adfm.201404053
   Cheng JY, 2008, ADV MATER, V20, P3155, DOI 10.1002/adma.200800826
   Cheng JY, 2006, NANO LETT, V6, P2099, DOI 10.1021/nl061563x
   Cheng JY, 2010, ACS NANO, V4, P4815, DOI 10.1021/nn100686v
   Cheng JY, 2002, APPL PHYS LETT, V81, P3657, DOI 10.1063/1.1519356
   Cheng JY, 2004, NAT MATER, V3, P823, DOI 10.1038/nmat1211
   Chuang VP, 2009, NANO LETT, V9, P4364, DOI 10.1021/nl902646e
   Edwards EW, 2005, J POLYM SCI POL PHYS, V43, P3444, DOI 10.1002/polb.20643
   Edwards EW, 2004, ADV MATER, V16, P1315, DOI 10.1002/adma.200400763
   Fasolka MJ, 1997, PHYS REV LETT, V79, P3018, DOI 10.1103/PhysRevLett.79.3018
   Fasolka MJ, 2000, MACROMOLECULES, V33, P5702, DOI 10.1021/ma990021h
   GIDO SP, 1993, MACROMOLECULES, V26, P2636, DOI 10.1021/ma00062a040
   Grason GM, 2006, PHYS REP, V433, P1, DOI 10.1016/j.physrep.2006.08.001
   Hellwig O, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3293301
   Huinink HP, 2000, J CHEM PHYS, V112, P2452, DOI 10.1063/1.480811
   Jeong JW, 2011, NANO LETT, V11, P4095, DOI 10.1021/nl2016224
   Ji SX, 2012, ACS NANO, V6, P5440, DOI 10.1021/nn301306v
   Jung YS, 2009, ADV MATER, V21, P2540, DOI 10.1002/adma.200802855
   Kim HC, 2010, CHEM REV, V110, P146, DOI 10.1021/cr900159v
   Kim SH, 2004, ADV MATER, V16, P2119, DOI 10.1002/adma.200306577
   Kim SO, 2003, NATURE, V424, P411, DOI 10.1038/nature01775
   Knoll A, 2002, PHYS REV LETT, V89, DOI 10.1103/PhysRevLett.89.035501
   Lescanec RL, 1998, MACROMOLECULES, V31, P1680, DOI 10.1021/ma971426+
   Liu CC, 2011, MACROMOLECULES, V44, P1876, DOI 10.1021/ma102856t
   Liu GL, 2010, ADV FUNCT MATER, V20, P1251, DOI 10.1002/adfm.200902229
   Mansky P, 1997, SCIENCE, V275, P1458, DOI 10.1126/science.275.5305.1458
   Matsen MW, 1997, J CHEM PHYS, V106, P2436, DOI 10.1063/1.473153
   Morkved TL, 1997, EUROPHYS LETT, V40, P643, DOI 10.1209/epl/i1997-00517-6
   Morris MA, 2015, MICROELECTRON ENG, V132, P207, DOI 10.1016/j.mee.2014.08.009
   Paik MY, 2010, MACROMOLECULES, V43, P4253, DOI 10.1021/ma902646t
   Park SM, 2008, MACROMOLECULES, V41, P9118, DOI 10.1021/ma8009917
   Park S, 2008, ACS NANO, V2, P766, DOI 10.1021/nn7004415
   Park S, 2009, MACROMOLECULES, V42, P1278, DOI 10.1021/ma802480s
   Park S, 2009, SCIENCE, V323, P1030, DOI 10.1126/science.1168108
   Peng J, 2004, J CHEM PHYS, V120, P11163, DOI 10.1063/1.1751177
   Peng J, 2006, J CHEM PHYS, V125, DOI 10.1063/1.2219446
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Russell T. P., 2011, ACS NANO, V5, P2855
   Segalman RA, 2001, ADV MATER, V13, P1152, DOI 10.1002/1521-4095(200108)13:15<1152::AID-ADMA1152>3.0.CO;2-5
   Sinturel C, 2013, MACROMOLECULES, V46, P5399, DOI 10.1021/ma400735a
   Sioula S, 1998, MACROMOLECULES, V31, P5272, DOI 10.1021/ma971848j
   Solak HH, 2003, MICROELECTRON ENG, V67-8, P56, DOI 10.1016/S0167-9317(03)00059-5
   Stoykovich MP, 2007, ACS NANO, V1, P168, DOI 10.1021/nn700164p
   Stoykovich MP, 2005, SCIENCE, V308, P1442, DOI 10.1126/science.1111041
   Tada Y, 2012, MACROMOLECULES, V45, P292, DOI 10.1021/ma201822a
   Tada Y, 2008, MACROMOLECULES, V41, P9267, DOI 10.1021/ma801542y
   Wan LS, 2013, J VAC SCI TECHNOL B, V31, DOI 10.1116/1.4818882
   Wang Y, 2008, MACROMOLECULES, V41, P5799, DOI 10.1021/ma800753a
   Wu YH, 2015, ACS APPL MATER INTER, V7, P16536, DOI 10.1021/acsami.5b03977
   Xiao SG, 2005, NANOTECHNOLOGY, V16, pS324, DOI 10.1088/0957-4484/16/7/003
   Xiao SG, 2009, ADV MATER, V21, P2516, DOI 10.1002/adma.200802087
   Xu J, 2011, ADV MATER, V23, P5755, DOI 10.1002/adma.201102964
   Xuan Y, 2004, MACROMOLECULES, V37, P7301, DOI 10.1021/ma0497761
   Yang XM, 2009, ACS NANO, V3, P1844, DOI 10.1021/nn900073r
NR 62
TC 8
Z9 8
U1 9
U2 29
PU ROYAL SOC CHEMISTRY
PI CAMBRIDGE
PA THOMAS GRAHAM HOUSE, SCIENCE PARK, MILTON RD, CAMBRIDGE CB4 0WF, CAMBS,
   ENGLAND
SN 1744-683X
EI 1744-6848
J9 SOFT MATTER
JI Soft Matter
PY 2016
VL 12
IS 11
BP 2914
EP 2922
DI 10.1039/c5sm02829a
PG 9
WC Chemistry, Physical; Materials Science, Multidisciplinary; Physics,
   Multidisciplinary; Polymer Science
SC Chemistry; Materials Science; Physics; Polymer Science
GA DG6VB
UT WOS:000372223100012
PM 26891026
ER

PT J
AU Fujihira, Y
   Hachisu, T
   Shitanda, S
   Aikawa, K
   Sugiyama, A
   Mizuno, J
   Shoji, S
   Asahi, T
   Osaka, T
AF Fujihira, Yoshiki
   Hachisu, Takuma
   Shitanda, Suguru
   Aikawa, Kenichiro
   Sugiyama, Atsushi
   Mizuno, Jun
   Shoji, Shuichi
   Asahi, Toru
   Osaka, Tetsuya
TI Promotion of Self-Assembly Patterning of FePt Nanoparticles by Tuning
   the Concentration of Oleylamine/Oleic Acid Surfactants in a Coating
   Solution
SO JOURNAL OF THE ELECTROCHEMICAL SOCIETY
LA English
DT Article
ID FABRICATION; MONOLAYERS; PARTICLES; NANOCUBES; FORCES; AGENTS; LAYERS;
   MEDIA; FILMS
AB To provide a bit-patterned perpendicular magnetic recording medium consisting of an array of FePt magnetic nanoparticles, the effect of the total dispersant concentrations of oleylamine and oleic acid in a FePt-nanoparticle/toluene coating solution on a self-assembled nanoparticle array with a long-range periodicity on a flat SiO2/Si substrate and two patterned substrates, respectively, was examined. At a surfactant concentration greater than 0.8 vol%, FePt nanoparticles with an average size of 4.4 nm were arrayed in a two-dimensional and hexagonal-close-packed ordered array with 8.3-nm pitches on the flat surface. Self-assembled nanoparticles were arrayed on the bottom surface of the patterned trench, the array exhibited a hexagonal-close-packed structure. Furthermore the line defects in the arrays are caused by the waviness of the trench walls, and the surface roughness. (C) 2016 The Electrochemical Society. All rights reserved.
C1 [Fujihira, Yoshiki; Shitanda, Suguru; Aikawa, Kenichiro; Shoji, Shuichi; Asahi, Toru; Osaka, Tetsuya] Waseda Univ, Grad Sch Adv Sci & Engn, Shinjuku Ku, Tokyo 1698555, Japan.
   [Hachisu, Takuma; Sugiyama, Atsushi; Mizuno, Jun; Shoji, Shuichi; Osaka, Tetsuya] Waseda Univ, Res Org Nano & Life Innovat, Shinjuku Ku, Tokyo 1620041, Japan.
   [Shoji, Shuichi; Asahi, Toru; Osaka, Tetsuya] Waseda Univ, Fac Sci & Engn, Shinjuku Ku, Tokyo 1698555, Japan.
RP Osaka, T (reprint author), Waseda Univ, Grad Sch Adv Sci & Engn, Shinjuku Ku, Tokyo 1698555, Japan.; Osaka, T (reprint author), Waseda Univ, Res Org Nano & Life Innovat, Shinjuku Ku, Tokyo 1620041, Japan.; Osaka, T (reprint author), Waseda Univ, Fac Sci & Engn, Shinjuku Ku, Tokyo 1698555, Japan.
EM osakatets@waseda.jp
FU Adaptable and Seamless Technology Transfer Program through target-driven
   RD (A-STEP) [AS2311562B]
FX This work was promoted by the Adaptable and Seamless Technology Transfer
   Program through target-driven R&D (A-STEP) (AS2311562B). In addition,
   this work was partly executed in co-operation with Waseda University and
   JX Nippon Oil & Energy Corporation. Y.F. also acknowledges the Leading
   Graduate Program in Science and Engineering, Waseda University from
   MEXT, Japan.
CR Aleksandrovic V, 2008, ACS NANO, V2, P1123, DOI 10.1021/nn800147a
   Chen J, 2013, APPL SURF SCI, V270, P6, DOI 10.1016/j.apsusc.2012.11.165
   Chen M, 2006, J AM CHEM SOC, V128, P7132, DOI 10.1021/ja061704x
   Hachisu T, 2008, CHEM LETT, V37, P840, DOI 10.1246/cl.2008.840
   Hachisu T, 2011, ECS TRANSACTIONS, V33, P107, DOI 10.1149/1.3573592
   Hachisu T, 2012, J MAGN MAGN MATER, V324, P303, DOI 10.1016/j.jmmm.2010.12.023
   Hu MH, 2001, APPL SURF SCI, V181, P307, DOI 10.1016/S0169-4332(01)00399-3
   Johnston-Peck AC, 2011, LANGMUIR, V27, P5040, DOI 10.1021/la200005q
   Kamata Y, 2007, JPN J APPL PHYS 1, V46, P999, DOI 10.1143/JJAP.46.999
   Kim C, 2010, J NANOSCI NANOTECHNO, V10, P233, DOI 10.1166/jnn.2010.1514
   KRALCHEVSKY PA, 1994, LANGMUIR, V10, P23, DOI 10.1021/la00013a004
   Mehraeen S, 2015, LANGMUIR, V31, P8548, DOI 10.1021/acs.langmuir.5b01696
   Prakash A, 2009, ACS NANO, V3, P2139, DOI 10.1021/nn900373b
   Smilgies DM, 2012, J PHYS CHEM B, V116, P6017, DOI 10.1021/jp3015436
   Stoykovich MP, 2006, MATER TODAY, V9, P20, DOI 10.1016/S1369-7021(06)71619-4
   Sun SH, 2000, SCIENCE, V287, P1989, DOI 10.1126/science.287.5460.1989
   Terris BD, 2009, J MAGN MAGN MATER, V321, P512, DOI 10.1016/j.jmmm.2008.05.046
   Yang HT, 2010, LANGMUIR, V26, P13173, DOI 10.1021/la101721v
   Yang HT, 2010, LANGMUIR, V26, P12598, DOI 10.1021/la1021643
NR 19
TC 0
Z9 0
U1 7
U2 27
PU ELECTROCHEMICAL SOC INC
PI PENNINGTON
PA 65 SOUTH MAIN STREET, PENNINGTON, NJ 08534 USA
SN 0013-4651
EI 1945-7111
J9 J ELECTROCHEM SOC
JI J. Electrochem. Soc.
PY 2016
VL 163
IS 5
BP D171
EP D174
DI 10.1149/2.0581605jes
PG 4
WC Electrochemistry; Materials Science, Coatings & Films
SC Electrochemistry; Materials Science
GA DE8DT
UT WOS:000370866700063
ER

PT J
AU Ricci, JA
   Vargas, CR
   Singhal, D
   Lee, BT
AF Ricci, Joseph A.
   Vargas, Christina R.
   Singhal, Dhruv
   Lee, Bernard T.
TI Shark attack-related injuries: Epidemiology and implications for plastic
   surgeons
SO JOURNAL OF PLASTIC RECONSTRUCTIVE AND AESTHETIC SURGERY
LA English
DT Article
DE Shark attack; Animal bites; Infections; Multi-trauma
ID BITE
AB Background and aim: The increased media attention to shark attacks has led to a heightened fear and public awareness. Although few sharks are considered dangerous, attacks on humans can result in large soft tissue defects necessitating the intervention of reconstructive surgeons. This study aims to evaluate and describe the characteristics of shark-related injuries in order to improve treatment.
   Methods: The Global Shark Accident File, maintained by the Shark Research Institute (Princeton, NJ, USA), is a compilation of all known worldwide shark attacks. Database records since the 1900s were reviewed to identify differences between fatal and nonfatal attacks, including: geography, injury pattern, shark species, and victim activity.
   Results: Since the 1900s, there have been 5034 reported shark attacks, of which 1205 (22.7%) were fatal. Although the incidence of attacks per decade has increased, the percentage of fatalities has decreased. Characteristics of fatal attacks included swimming (p = 0.001), boating (p = 0.001), three or more bite sites (p = 0.03), limb loss (p = 0.001), or tiger shark attack (p = 0.002). The most common attacks were bites to the legs (41.8%) or arms (18.4%), with limb loss occurring in 7% of attacks. Geographically, the majority of attacks occurred in North America (36.7%) and Australia (26.5%). Most attacks in the USA occurred in Florida (49.1%) and California (13.6%).
   Conclusions: Although rare, shark attacks result in devastating injuries to patients. As these injuries often involve multiple sites and limb loss, this creates a significant challenge for reconstructive surgeons. Proper identification of the characteristics of the attack can aid in providing optimal care for those affected. (C) 2015 British Association of Plastic, Reconstructive and Aesthetic Surgeons. Published by Elsevier Ltd. All rights reserved.
C1 [Ricci, Joseph A.; Vargas, Christina R.; Lee, Bernard T.] Harvard Univ, Beth Israel Deaconess Med Ctr, Dept Surg, Div Plast & Reconstruct Surg,Med Sch, Boston, MA 02215 USA.
   [Singhal, Dhruv] Univ Florida, Univ Florida Hlth Syst, Sch Med, Dept Surg,Div Plast & Reconstruct Surg, Gainesville, FL USA.
RP Lee, BT (reprint author), Beth Israel Deaconess Med Ctr, Dept Surg, Div Plast & Reconstruct Surg, 110 Francis St,Suite 5A, Boston, MA 02215 USA.
EM jaricci@partners.org; christinarvargas@gmail.com;
   dhruv.x.singhal@gmail.com; btlee@bidmc.harvard.edu
RI Lee, Bernard/K-1106-2016
OI Lee, Bernard/0000-0002-5533-3166
CR Atwater J, 2014, ABC NEWS        1114
   BALDRIDGE HD, 1969, MIL MED, V134, P130
   BUCK JD, 1984, J CLIN MICROBIOL, V20, P849
   Burnett JW, 1998, CUTIS, V61, P317
   Byard RW, 2000, AM J FOREN MED PATH, V21, P225, DOI 10.1097/00000433-200009000-00008
   Caldicott DGE, 2001, INJURY, V32, P445, DOI 10.1016/S0020-1383(01)00041-9
   Charlesworth D, 1976, SA Nurs J, V43, P24
   Curtis TH, 2014, PLOS ONE, V9, DOI 10.1371/journal.pone.0099240
   DAVIES D H, 1962, J R Nav Med Serv, V48, P110
   Edmonds C, 1976, Aust Fam Physician, V5, P381
   Fingland F, 1978, Nurs Times, V74, P868
   Fingland F, 1977, SA Nurs J, V44, P22
   Guidera K J, 1991, J Orthop Trauma, V5, P204, DOI 10.1097/00005131-199105020-00015
   HOWARD RJ, 1993, AM J SURG, V166, P563, DOI 10.1016/S0002-9610(05)81154-7
   Institute SR, 2014, GLOB SHARK ATT FIL
   Jolly HA, 2014, SHARK DETERRENT WET
   Lovgren S, 2005, JAWS 30 FILM STOKED
   PAVIA AT, 1989, ANN INTERN MED, V111, P85
   Rosen A, 2014, RES TAG SUMMERS 1 GR
   Royle JA, 1997, PEDIATR INFECT DIS J, V16, P531, DOI 10.1097/00006454-199705000-00019
   Skomal GB, 2012, IMPLICATIONS INCREAS
   Unger NR, 2014, PLOS ONE, V9, DOI 10.1371/journal.pone.0104577
   Wilkinson A, 2013, CAPE FEAR TRACKING S
   [Anonymous], 1990, FATAL VOYAGE SINKING
NR 24
TC 1
Z9 1
U1 3
U2 17
PU ELSEVIER SCI LTD
PI OXFORD
PA THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD OX5 1GB, OXON, ENGLAND
SN 1748-6815
EI 1878-0539
J9 J PLAST RECONSTR AES
JI J. Plast. Reconstr. Aesthet. Surg.
PD JAN
PY 2016
VL 69
IS 1
BP 108
EP 114
DI 10.1016/j.bjps.2015.08.029
PG 7
WC Surgery
SC Surgery
GA CZ6UP
UT WOS:000367236800021
PM 26460789
ER

PT J
AU Bao, YP
   Wen, TL
   Samia, ACS
   Khandhar, A
   Krishnan, KM
AF Bao, Yuping
   Wen, Tianlong
   Samia, Anna Cristina S.
   Khandhar, Amit
   Krishnan, Kannan M.
TI Magnetic nanoparticles: material engineering and emerging applications
   in lithography and biomedicine
SO JOURNAL OF MATERIALS SCIENCE
LA English
DT Article
ID IRON-OXIDE NANOPARTICLES; CORE-SHELL NANOPARTICLES; LARGE-SCALE
   SYNTHESIS; SENTINEL LYMPH-NODE; ELECTRON-BEAM LITHOGRAPHY; TRANSFER
   RADICAL POLYMERIZATION; MONONUCLEAR PHAGOCYTE SYSTEM; SELF-ASSEMBLED
   MONOLAYERS; IMAGING CONTRAST AGENTS; BIT PATTERNED MEDIA
AB We present an interdisciplinary overview of material engineering and emerging applications of iron oxide nanoparticles. We discuss material engineering of nanoparticles in the broadest sense, emphasizing size and shape control, large-area self-assembly, composite/hybrid structures, and surface engineering. This is followed by a discussion of several nontraditional, emerging applications of iron oxide nanoparticles, including nanoparticle lithography, magnetic particle imaging, magnetic guided drug delivery, and positive contrast agents for magnetic resonance imaging. We conclude with a succinct discussion of the pharmacokinetics pathways of iron oxide nanoparticles in the human body-an important and required practical consideration for any in vivo biomedical application, followed by a brief outlook of the field.
C1 [Bao, Yuping] Univ Alabama, Chem & Biol Engn, Tuscaloosa, AL 35487 USA.
   [Wen, Tianlong] Univ Elect Sci & Technol China, State Key Lab Elect Thin Films & Integrated Devic, Chengdu 610054, Peoples R China.
   [Samia, Anna Cristina S.] Case Western Reserve Univ, Chem, Cleveland, OH 44106 USA.
   [Khandhar, Amit] Lodespin Labs, Seattle, WA 98145 USA.
   [Krishnan, Kannan M.] Univ Washington, Mat Sci & Engn, Seattle, WA 98195 USA.
RP Krishnan, KM (reprint author), Univ Washington, Mat Sci & Engn, Seattle, WA 98195 USA.
EM ybao@eng.ua.edu; halong@uestc.edu.cn; anna.samia@case.edu;
   amit@lodespin.com; kannanmk@u.washington.edu
RI Wen, Tianlong/E-7537-2011
OI Wen, Tianlong/0000-0002-5521-2815; Khandhar, Amit/0000-0003-4049-1855
FU NSF [DMR 0907204, DMR 114993]; Ralph Power Junior Faculty Enhancement
   Award; National Natural Science Foundation of China [51401046,
   61131005]; NSF-CAREER Grant [DMR-1253358]; NIH/NIBIB [1R41EB013520-01,
   2R42EB013520-02A1]; NSF/DMR [0203069];  [NIH 1R01EB013689-01/NIBIB]; 
   [NSF/DMR-0501421]
FX Y. Bao was partially supported by NSF-DMR 0907204, DMR 114993, and Ralph
   Power Junior Faculty Enhancement Award. T. Wen acknowledges the
   financial support from the National Natural Science Foundation of China
   under contract # 51401046 and # 61131005. A. C. S. Samia is supported by
   an NSF-CAREER Grant (DMR-1253358). A. Khandhar and Kannan M. Krishnan
   acknowledge support from the NIH/NIBIB grant nos. 1R41EB013520-01 and
   2R42EB013520-02A1. Kannan M. Krishnan was also supported under grant
   nos. NIH 1R01EB013689-01/NIBIB, NSF/DMR-0501421, and NSF/DMR #0203069.
CR Achilleos DS, 2010, MATERIALS, V3, P1981, DOI 10.3390/ma3031981
   Advanced Magnetics, 1996, DRUG NEWS PERSPECT, V9, P422
   Aggarwal P, 2009, ADV DRUG DELIVER REV, V61, P428, DOI 10.1016/j.addr.2009.03.009
   Ahmed M, 2014, LANCET ONCOL, V15, pE351, DOI 10.1016/S1470-2045(13)70590-4
   Alba M, 2013, ANGEW CHEM INT EDIT, V52, P6459, DOI 10.1002/anie.201302285
   Albrecht TR, 2013, IEEE T MAGN, V49, P773, DOI 10.1109/TMAG.2012.2227303
   Alexis F, 2008, MOL PHARMACEUT, V5, P505, DOI 10.1021/mp800051m
   Almeida JPM, 2011, NANOMEDICINE-UK, V6, P815, DOI [10.2217/nnm.11.79, 10.2217/NNM.11.79]
   Andrews NC, 1999, NEW ENGL J MED, V341, P1986, DOI 10.1056/NEJM199912233412607
   Arami H, 2015, BIOMATERIALS, V52, P251, DOI 10.1016/j.biomaterials.2015.02.040
   Arami H, 2014, J APPL PHYS, V115, DOI 10.1063/1.4867756
   Baiu DC, 2013, CURR PHARM DESIGN, V19, P6606
   Balachova OV, 2000, MICROELECTR J, V31, P213, DOI 10.1016/S0026-2692(99)00140-8
   Baldi G, 2007, J MAGN MAGN MATER, V311, P10, DOI 10.1016/j.jmmm.2006.11.157
   Bao Y, 2005, J APPL PHYS, V97, DOI 10.1063/1.1853991
   Bao Y, 2009, LANGMUIR, V26, P478, DOI DOI 10.1021/LA902120E
   Bao YP, 2005, J PHYS CHEM B, V109, P7220, DOI 10.1021/jp044363n
   Bao YP, 2007, J PHYS CHEM C, V111, P1941, DOI 10.1021/jp066871y
   Bao YP, 2004, J MAGN MAGN MATER, V272, pE1367, DOI 10.1016/j.jmmm.2003.12.219
   Bao YP, 2010, LANGMUIR, V26, P478, DOI 10.1021/la902120e
   Barakat NS, 2009, NANOMEDICINE-UK, V4, P799, DOI [10.2217/nnm.09.66, 10.2217/NNM.09.66]
   Beard JL, 1996, NUTR REV, V54, P295
   Bigioni TP, 2006, NAT MATER, V5, P265, DOI 10.1038/nmat1611
   Bin Y, 2007, POLYM J, V39, P598, DOI 10.1295/polymj.PJ2006229
   Bishop KJM, 2009, SMALL, V5, P1600, DOI 10.1002/smll.200900358
   Bourrinet P, 2006, INVEST RADIOL, V41, P313, DOI 10.1097/01.rli.0000197669.80475.dd
   Braet F, 2002, COMP HEPATOL, V1, P1, DOI DOI 10.1186/1476-5926-1-1.PUBMED:12437787
   Brisset JC, 2011, MOL IMAGING BIOL, V13, P672, DOI 10.1007/s11307-010-0402-1
   Broers AN, 1996, MICROELECTRON ENG, V32, P131, DOI 10.1016/0167-9317(95)00368-1
   Bulte JW, 2008, P INT SOC MAG RESON, V16, P201
   Cao G., 2011, NANOSTRUCTURES NANOM
   Carpenter EE, 2001, J MAGN MAGN MATER, V225, P17, DOI 10.1016/S0304-8853(00)01222-1
   Casbeer E, 2012, SEP PURIF TECHNOL, V87, P1, DOI 10.1016/j.seppur.2011.11.034
   Cesta MF, 2006, TOXICOL PATHOL, V34, P455, DOI 10.1080/01926230600867743
   Chen HM, 1997, PHARMACEUT RES, V14, P537, DOI 10.1023/A:1012124205524
   Chen ML, 2012, LANGMUIR, V28, P16469, DOI 10.1021/la303957y
   Cheng GJ, 2005, LANGMUIR, V21, P12055, DOI 10.1021/la0506473
   Chern CS, 2006, PROG POLYM SCI, V31, P443, DOI 10.1016/j.progpolymsci.2006.02.001
   Choi HS, 2007, NAT BIOTECHNOL, V25, P1165, DOI [10.1038/nbtl340, 10.1038/nbt1340]
   Chouly C, 1996, J MICROENCAPSUL, V13, P245, DOI 10.3109/02652049609026013
   Claridge SA, 2009, ACS NANO, V3, P244, DOI 10.1021/nn800820e
   Clift MJD, 2008, TOXICOL APPL PHARM, V232, P418, DOI 10.1016/j.taap.2008.06.009
   Corr SA, 2008, NANOSCALE RES LETT, V3, P87, DOI 10.1007/s11671-008-9122-8
   Cuppoletti J, 2011, METAL CERAMIC POLYM
   Damasceno PF, 2012, SCIENCE, V337, P453, DOI 10.1126/science.1220869
   Deegan RD, 1997, NATURE, V389, P827, DOI 10.1038/39827
   DENKOV ND, 1992, LANGMUIR, V8, P3183, DOI 10.1021/la00048a054
   Ding T, 2009, ADV MATER, V21, P1936, DOI 10.1002/adma.200803564
   Ding XB, 1998, REACT FUNCT POLYM, V38, P11, DOI 10.1016/S1381-5148(97)00154-5
   Douek M, 2014, ANN SURG ONCOL, V21, P1237, DOI 10.1245/s10434-013-3379-6
   EDELMAN ER, 1993, BIOMATERIALS, V14, P621, DOI 10.1016/0142-9612(93)90182-2
   Eibofner F, 2010, MAGN RESON MED, V64, P1027, DOI 10.1002/mrm.22498
   Fang C, 2006, EUR J PHARM SCI, V27, P27, DOI 10.1016/j.ejps.2005.08.002
   Fasolka MJ, 2001, ANN REV MATER RES, V31, P323, DOI 10.1146/annurev.matsci.31.1.323
   Ferguson RM, 2015, IEEE T MED IMAGING, V34, P1077, DOI 10.1109/TMI.2014.2375065
   Ferguson RM, 2011, MED PHYS, V38, P1619, DOI 10.1118/1.3554646
   Ferguson RM, 2009, J MAGN MAGN MATER, V321, P1548, DOI 10.1016/j.jmmm.2009.02.083
   Ferguson RM, 2013, BIOMED ENG-BIOMED TE, V58, P493, DOI 10.1515/bmt-2012-0058
   Ferguson RM, 2012, J APPL PHYS, V111
   Filipcsei G, 2007, ADV POLYM SCI, V206, P137, DOI 10.1007/12_2006_104
   Frei SSEH, 1957, PHYS REV, V106, P446
   Fuchigami T, 2012, BIOMATERIALS, V33, P1682, DOI 10.1016/j.biomaterials.2011.11.016
   Galeotti F, 2011, J COLLOID INTERF SCI, V360, P540, DOI 10.1016/j.jcis.2011.04.076
   Galvez N, 2008, J AM CHEM SOC, V130, P8062, DOI 10.1021/ja800492z
   Ganz T, 2013, PHYSIOL REV, V93, P1721, DOI 10.1152/physrev.00008.2013
   Gao YH, 2004, APPL PHYS LETT, V84, P3361, DOI 10.1063/1.1723687
   Gazeau F, 2008, NANOMEDICINE-UK, V3, P831, DOI 10.2217/17435889.3.6.831
   GILCHRIST RK, 1957, ANN SURG, V146, P596
   Gleich B, 2005, NATURE, V435, P1214, DOI 10.1038/nature03808
   Glotzer SC, 2012, NATURE, V481, P450, DOI 10.1038/481450a
   Gong Ping, 2007, V381, P59
   Gonzales M, 2005, J MAGN MAGN MATER, V293, P265, DOI 10.1016/j.jmmm.2005.02.020
   Gonzales-Weimuller M, 2009, J MAGN MAGN MATER, V321, P1947, DOI 10.1016/j.jmmm.2008.12.017
   Goodwill PW, 2012, ADV MATER, V24, P3870, DOI 10.1002/adma.201200221
   Goodwill PW, 2010, IEEE T MED IMAGING, V29, P851
   Goodwill PW, 2009, IEEE T MED IMAGING, V28, P231
   Goodwill PW, 2011, P SPIE7, V7965
   Grumezescu AM, 2015, NANOSCALE RES LETT, V17, P1029
   Grzelczak M, 2010, ACS NANO, V4, P3591, DOI 10.1021/nn100869j
   Guardia P, 2012, ACS NANO, V6, P3080, DOI 10.1021/nn2048137
   Guo DD, 2008, J NANOSCI NANOTECHNO, V8, P2301, DOI 10.1166/jnn.2008.311
   Gupta AK, 2005, BIOMATERIALS, V26, P3995, DOI 10.1016/j.biomaterials.2004.10.012
   Hafeli UO, 2004, INT J PHARM, V277, P19, DOI 10.1016/j.ijpharm.2003.03.002
   HAFELI UO, 1995, NUCL MED BIOL, V22, P147, DOI 10.1016/0969-8051(94)00124-3
   Hai HT, 2010, J COLLOID INTERF SCI, V346, P37, DOI 10.1016/j.jcis.2010.02.025
   HAMM B, 1994, JMRI-J MAGN RESON IM, V4, P659, DOI 10.1002/jmri.1880040508
   Han SB, 2007, SOL ENERGY, V81, P623, DOI 10.1016/j.solener.2006.08.012
   Han ST, 2012, ADV MATER, V24, P3556, DOI 10.1002/adma.201201195
   Hasebroock KM, 2009, EXPERT OPIN DRUG MET, V5, P403, DOI [10.1517/17425250902873796 , 10.1517/17425250902873796]
   Hawkins BT, 2005, PHARMACOL REV, V57, P173, DOI 10.1124/pr.57.2.4
   He JB, 2010, SMALL, V6, P1449, DOI 10.1002/smll.201000114
   Henzie J, 2013, P NATL ACAD SCI USA, V110, P6640, DOI 10.1073/pnas.1218616110
   Hermanson GT, 2008, BIOCONJUGATE TECHNIQUES, 2ND EDITION, P1, DOI 10.1016/B978-0-12-370501-3.00001-1
   Hogg CR, 2010, IEEE T MAGN, V46, P2307, DOI 10.1109/TMAG.2010.2040145
   Huang JX, 2005, NAT MATER, V4, P896, DOI 10.1038/nmat1517
   Hufschmid R, 2015, NANOSCALE, V7, P11142, DOI 10.1039/c5nr01651g
   Hume DA, 2006, CURR OPIN IMMUNOL, V18, P49, DOI 10.1016/j.coi.2005.11.008
   Hyeon T, 2001, J AM CHEM SOC, V123, P12798, DOI 10.1021/ja016812s
   Iglesias O, 2001, PHYS REV B, V63, DOI 10.1103/PhysRevB.63.184416
   Issa B, 2013, INT J MOL SCI, V14, P21266, DOI 10.3390/ijms141121266
   Ito A, 2005, J BIOSCI BIOENG, V100, P1, DOI 10.1263/jbb.100.1
   Jain RK, 1998, NAT MED, V4, P655, DOI 10.1038/nm0698-655
   Jain TK, 2008, BIOMATERIALS, V29, P4012, DOI 10.1016/j.biomaterials.2008.07.004
   Jia CJ, 2008, J AM CHEM SOC, V130, P16968, DOI 10.1021/ja805152t
   Jiao PF, 2011, J AM CHEM SOC, V133, P13918, DOI 10.1021/ja206118a
   Jin YD, 2010, NAT COMMUN, V1, DOI 10.1038/ncomms1042
   Jokerst JV, 2011, NANOMEDICINE-UK, V6, P715, DOI [10.2217/nnm.11.19, 10.2217/NNM.11.19]
   Jones CD, 2000, MACROMOLECULES, V33, P8301, DOI 10.1021/ma001398m
   Jones MR, 2011, J AM CHEM SOC, V133, P18865, DOI 10.1021/ja206777k
   Joseyphus RJ, 2008, J MATER SCI, V43, P2402, DOI 10.1007/s10853-007-1951-9
   Kachkachi H, 2000, EUR PHYS J B, V14, P681, DOI 10.1007/s100510051079
   Kanjanaboos P, 2011, NANO LETT, V11, P2567, DOI 10.1021/nl2014873
   Keil D, 2001, J VAC SCI TECHNOL B, V19, P2082, DOI 10.1116/1.1414116
   Keng PY, 2011, CHEM MATER, V23, P1120, DOI 10.1021/cm102319d
   Khandhar AP, 2013, BIOMATERIALS, V34, P3837, DOI 10.1016/j.biomaterials.2013.01.087
   Kikitsu A, 2013, IEEE T MAGN, V49, P693, DOI 10.1109/TMAG.2012.2226566
   Kim BH, 2011, J AM CHEM SOC, V133, P12624, DOI 10.1021/ja203340u
   Kim D, 2007, J AM CHEM SOC, V129, P5812, DOI 10.1021/ja070667m
   Kim MH, 2005, ADV FUNCT MATER, V15, P1329, DOI 10.1002/adfm.200400602
   Kim TH, 2011, NAT PHOTONICS, V5, P176, DOI [10.1038/nphoton.2011.12, 10.1038/NPHOTON.2011.12]
   KITTEL C, 1949, REV MOD PHYS, V21, P541, DOI 10.1103/RevModPhys.21.541
   Klimberg VS, 1999, ANN SURG, V229, P860, DOI 10.1097/00000658-199906000-00013
   Kloust H, 2012, LANGMUIR, V28, P7276, DOI 10.1021/la300231r
   Knopp, 2012, MAGNETIC PARTICLE IM
   Koseoglu Y, 2008, J NANOSCI NANOTECHNO, V8, P584, DOI 10.1166/jnn.2008.B012
   Kost J, 2012, ADV DRUG DELIVER REV, V64, P327, DOI 10.1016/j.addr.2012.09.014
   Kovalenko MV, 2007, J AM CHEM SOC, V129, P6352, DOI 10.1021/ja0692478
   Krishnan KM, 2010, IEEE T MAGN, V46, P2523, DOI 10.1109/TMAG.2010.2046907
   Krishnan KM, 2006, J MATER SCI, V41, P793, DOI 10.1007/s10853-006-6564-1
   Kumar UN, 2010, J MATER CHEM, V20, P3404, DOI 10.1039/b923000a
   Kwon KW, 2006, CHEM MATER, V18, P6357, DOI 10.1021/cm0621390
   Kwon SG, 2007, J AM CHEM SOC, V129, P12571, DOI 10.1021/ja074633q
   Lalatonne Y, 2004, NAT MATER, V3, P121, DOI 10.1038/nmat1054
   Lee DE, 2012, CHEM SOC REV, V41, P2656, DOI 10.1039/c2cs15261d
   Lee H, 2007, SCIENCE, V318, P426, DOI 10.1126/science.1147241
   Lee H, 2009, ADV MATER, V21, P431, DOI 10.1002/adma.200801222
   Lee JH, 2013, MOL CELLS, V35, P274, DOI 10.1007/s10059-013-0103-0
   Lee JH, 2011, NAT NANOTECHNOL, V6, P418, DOI [10.1038/nnano.2011.95, 10.1038/NNANO.2011.95]
   Lee N, 2012, NANO LETT, V12, P3127, DOI 10.1021/nl3010308
   LERCEL MJ, 1995, J VAC SCI TECHNOL B, V13, P1139, DOI 10.1116/1.588225
   Li QL, 2010, J ALLOY COMPD, V505, P523, DOI 10.1016/j.jallcom.2010.06.132
   Li XT, 2011, EUR POLYM J, V47, P1877, DOI 10.1016/j.eurpolymj.2011.07.010
   Li Z, 2012, ADV FUNCT MATER, V22, P2387, DOI 10.1002/adfm.201103123
   Liang QL, 2014, ANAL CHEM, V86, P8496, DOI 10.1021/ac502422a
   Liddle JA, 2004, J VAC SCI TECHNOL B, V22, P3409, DOI 10.1116/1.1821572
   Lim EK, 2011, ADV MATER, V23, P2436, DOI 10.1002/adma.201100351
   Lin CH, 2012, J NANOMATER, DOI 10.1155/2012/734842
   Lin XM, 2001, J PHYS CHEM B, V105, P3353, DOI 10.1021/jp0102062
   Liu B, 2013, J PHYS CHEM C, V117, P6363, DOI 10.1021/jp311467b
   Longmire M, 2008, NANOMEDICINE-UK, V3, P703, DOI 10.2217/17435889.3.5.703
   Lopes WA, 2001, NATURE, V414, P735, DOI 10.1038/414735a
   Lu F, 2013, CHEM COMMUN, V49, P11436, DOI 10.1039/c3cc46658b
   Lu M, 2010, AM J HEMATOL, V85, P315, DOI 10.1002/ajh.21656
   Ludtke-Buzug K, 2010, 8 INT C SCI CLIN APP
   Lunov O, 2010, BIOMATERIALS, V31, P9015, DOI 10.1016/j.biomaterials.2010.08.003
   Luo LB, 2006, CHEM COMMUN, P793, DOI 10.1039/b516048k
   MAACK T, 1979, KIDNEY INT, V16, P251, DOI 10.1038/ki.1979.128
   Macher T, 2015, ADV FUNCT MATER, V25, P490, DOI 10.1002/adfm.201403436
   Majetich SA, 2006, J PHYS D APPL PHYS, V39, pR407, DOI 10.1088/0022-3727/39/21/R02
   Majetich SA, 2011, ACS NANO, V5, P6081, DOI 10.1021/nn202883f
   Majetich SA, 2013, MRS BULL, V38, P899, DOI 10.1557/mrs.2013.230
   Mangrulkar PA, 2012, NANOSCALE, V4, P5202, DOI 10.1039/c2nr30819c
   Markov DE, 2010, PHYS MED BIOL, V55, P6461, DOI 10.1088/0031-9155/55/21/008
   Mashhadizadeh MH, 2012, J NANOMED NANOTECHNO, V3
   Masotti A, 2013, INT J MOL SCI, V14, P24619, DOI 10.3390/ijms141224619
   Matuszewski L, 2005, RADIOLOGY, V235, P155, DOI 10.1148/radiol.2351040094
   McBain SC, 2008, INT J NANOMED, V3, P169
   Metz S, 2004, EUR RADIOL, V14, P1851, DOI 10.1007/s00330-004-2405-2
   MEYERS PH, 1963, AMER J ROENTGENOL RA, V90, P1068
   Millan A, 2007, J MAGN MAGN MATER, V312, pL5, DOI 10.1016/j.jmmm.2006.09.011
   Modak S, 2007, CANCER INVEST, V25, P67, DOI 10.1080/07357900601130763
   Moghimi SM, 2001, PHARMACOL REV, V53, P283
   Mohapatra J, 2013, CRYSTENGCOMM, V15, P524, DOI 10.1039/c2ce25957e
   Moraes J, 2013, CHEM COMMUN, V49, P9077, DOI 10.1039/c3cc45319g
   Mueggenburg KE, 2007, NAT MATER, V6, P656, DOI 10.1038/nmat1965
   Murray CB, 2000, ANNU REV MATER SCI, V30, P545, DOI 10.1146/annurev.matsci.30.1.545
   Namdeo M, 2008, J NANOSCI NANOTECHNO, V8, P3247, DOI 10.1166/jnn.2008.399
   Nasongkla N, 2006, NANO LETT, V6, P2427, DOI 10.1021/nl061412u
   Nie ZH, 2010, NAT NANOTECHNOL, V5, P15, DOI [10.1038/nnano.2009.453, 10.1038/NNANO.2009.453]
   Okuhata Y, 1999, ADV DRUG DELIVER REV, V37, P121, DOI 10.1016/S0169-409X(98)00103-3
   Owens DE, 2006, INT J PHARM, V307, P93, DOI 10.1016/j.ijpharm.2005.10.010
   Pablico-Lansigan MH, 2013, NANOSCALE, V5, P4040, DOI 10.1039/c3nr00544e
   Palchoudhury S, 2012, CHEM COMMUN, V48, P10499, DOI 10.1039/c2cc35945f
   Palchoudhury S, 2011, J APPL PHYS, V109, DOI 10.1063/1.3549600
   Palchoudhury S, 2011, NANO LETT, V11, P1141, DOI 10.1021/nl200136j
   Palchoudhury S, 2010, J APPL PHYS, V107, DOI 10.1063/1.3355899
   Pan GL, 2008, MAT SCI ENG A-STRUCT, V492, P383, DOI 10.1016/j.msea.2008.05.026
   Pankhurst QA, 2003, J PHYS D APPL PHYS, V36, pR167, DOI 10.1088/0022-3727/36/13/201
   Park J, 2004, NAT MATER, V3, P891, DOI 10.1038/nmat1251
   Park JY, 2009, EUR J INORG CHEM, P2477, DOI 10.1002/ejic.200900173
   Park JH, 2008, ADV MATER, V20, P1630, DOI 10.1002/adma.200800004
   Park JN, 2010, NANOTECHNOLOGY, V21, DOI 10.1088/0957-4484/21/22/225708
   Park M, 2011, CHEM MATER, V23, P3318, DOI 10.1021/cm200414c
   Peddis D, 2013, CHEM MATER, V25, P2005, DOI 10.1021/cm303352r
   Peddis D, 2009, CHEM-EUR J, V15, P7822, DOI 10.1002/chem.200802513
   Plank Christian, 2011, Ther Deliv, V2, P717
   Plate NA, 1989, POLYM SCI USSR, V31, P220, DOI 10.1016/0032-3950(89)90373-0
   Prabhakar U, 2013, CANCER RES, V73, P2412, DOI 10.1158/0008-5472.CAN-12-4561
   Prakash A, 2009, ACS NANO, V3, P2139, DOI 10.1021/nn900373b
   Puntes VF, 2004, NAT MATER, V3, P263, DOI 10.1038/nmat1094
   Puntes VF, 2002, TOP CATAL, V19, P145, DOI 10.1023/A:1015252904412
   Puntes VF, 2001, SCIENCE, V291, P2115, DOI 10.1126/science.1057553
   Ranjan R, 2007, MACROMOLECULES, V40, P6217, DOI 10.1021/ma0705873
   Reimer P, 2003, EUR RADIOL, V13, P1266, DOI 10.1007/s00330-002-1721-7
   Rockenberger J, 1999, J AM CHEM SOC, V121, P11595, DOI 10.1021/ja993280v
   Rong MZ, 2001, POLYMER, V42, P3301, DOI 10.1016/S0032-3861(00)00741-2
   Ross CA, 1999, J VAC SCI TECHNOL B, V17, P3168, DOI 10.1116/1.590974
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Sarin Hemant, 2010, J Angiogenes Res, V2, P14, DOI 10.1186/2040-2384-2-14
   Sattel TF, 2009, J PHYS D, V42
   Scherer C, 2005, BRAZ J PHYS, V35, P718, DOI 10.1590/S0103-97332005000400018
   Schlenoff JB, 2014, LANGMUIR, V30, P9625, DOI 10.1021/la500057j
   Schmidt AM, 2005, MACROMOL RAPID COMM, V26, P93, DOI 10.1002/marc.200400426
   Seshadri K, 1996, J PHYS CHEM-US, V100, P15900, DOI 10.1021/jp960705g
   Shavel A, 2007, ADV FUNCT MATER, V17, P3870, DOI 10.1002/adfm.200700494
   Shevchenko EV, 2006, NATURE, V439, P55, DOI 10.1038/nature04414
   Shuai XT, 2003, MACROMOLECULES, V36, P5751, DOI 10.1021/ma034390w
   Singh A, 2012, ACS NANO, V6, P3339, DOI 10.1021/nn300331x
   Situ SF, 2014, ACS APPL MATER INTER, V6, P20154, DOI 10.1021/am505744m
   Slowing II, 2008, ADV DRUG DELIVER REV, V60, P1278, DOI 10.1016/j.addr.2008.03.012
   [Anonymous], 2004, J AM CHEM SOC, DOI DOI 10.1021/JA049931R
   Stepanov GV, 2008, J PHYS-CONDENS MAT, V20, DOI 10.1088/0953-8984/20/20/204121
   STORM G, 1995, ADV DRUG DELIVER REV, V17, P31, DOI 10.1016/0169-409X(95)00039-A
   Stoykovich MP, 2006, MATER TODAY, V9, P20, DOI 10.1016/S1369-7021(06)71619-4
   Strijkers GJ, 2007, ANTI-CANCER AGENT ME, V7, P291, DOI 10.2174/187152007780618135
   Stuart B., 2004, INFRARED SPECTROSCOP
   Su KH, 2003, NANO LETT, V3, P1087, DOI 10.1021/nl034197f
   Sun SH, 2000, SCIENCE, V287, P1989, DOI 10.1126/science.287.5460.1989
   Taboada E, 2007, LANGMUIR, V23, P4583, DOI 10.1021/la063415s
   Talapin DV, 2007, NANO LETT, V7, P1213, DOI 10.1021/nl070058c
   Talapin DV, 2005, SCIENCE, V310, P86, DOI 10.1126/science.1116703
   Tanahashi M, 2010, MATERIALS, V3, P1593, DOI 10.3390/ma3031593
   Terreno E, 2010, CHEM REV, V110, P3019, DOI 10.1021/cr100025t
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Thevenot J, 2013, CHEM SOC REV, V42, P7099, DOI 10.1039/c3cs60058k
   Thill M, 2014, BREAST, V23, P175, DOI 10.1016/j.breast.2014.01.004
   Tromsdorf UI, 2009, NANO LETT, V9, P4434, DOI 10.1021/nl902715v
   Tseng AA, 2003, IEEE T ELECTRON PACK, V26, P141, DOI 10.1109/TEPM.2003.817714
   Vestal CR, 2003, J AM CHEM SOC, V125, P9828, DOI 10.1021/ja035474n
   Vestal CR, 2002, J AM CHEM SOC, V124, P14312, DOI 10.1021/ja0274709
   Vieu C, 2000, APPL SURF SCI, V164, P111, DOI 10.1016/S0169-4332(00)00352-4
   Wang D, 2013, POLYM ADVAN TECHNOL, V24, P70, DOI 10.1002/pat.3051
   Wang HL, 2004, J MAGN MAGN MATER, V272, pE1279, DOI 10.1016/j.jmmm.2004.01.050
   Wang LY, 2005, J PHYS CHEM B, V109, P21593, DOI 10.1021/jp0543429
   Wang XY, 2002, ANAL SCI, V18, P931, DOI 10.2116/analsci.18.931
   Wang Y, 2003, NANO LETT, V3, P789, DOI 10.1021/nl034211o
   Waters EA, 2008, BASIC RES CARDIOL, V103, P114, DOI 10.1007/s00395-008-0711-6
   Weizenecker J, 2007, PHYS MED BIOL, V52, P6363, DOI 10.1088/0031-9155/52/21/001
   Weizenecker J, 2009, PHYS MED BIOL, V54, pL1, DOI 10.1088/0031-9155/54/5/L01
   Wen TL, 2015, NANOSCALE, V7, P4906, DOI 10.1039/c4nr07489k
   Wen TL, 2014, J COLLOID INTERF SCI, V419, P79, DOI 10.1016/j.jcis.2013.12.018
   Wen TL, 2012, NANO LETT, V12, P5873, DOI 10.1021/nl3032372
   Wen TL, 2011, ACS NANO, V5, P8868, DOI 10.1021/nn2037048
   Wen TL, 2011, J PHYS D APPL PHYS, V44, DOI 10.1088/0022-3727/44/39/393001
   Wen TL, 2011, J APPL PHYS, V109, DOI 10.1063/1.3544493
   Wen TL, 2010, J PHYS CHEM C, V114, P14838, DOI 10.1021/jp1053666
   Wen TL, 2010, J APPL PHYS, V107, DOI 10.1063/1.3350901
   Wen TL, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3213561
   Whitesides GM, 2002, SCIENCE, V295, P2418, DOI 10.1126/science.1070821
   Wiley DT, 2013, P NATL ACAD SCI USA, V110, P8662, DOI 10.1073/pnas.1307152110
   Wisse E, 2008, GENE THER, V15, P1193, DOI 10.1038/gt.2008.60
   Wong SL, 2012, J CLIN ONCOL, V30, P2912, DOI 10.1200/JCO.2011.40.3519
   Wu LH, 2014, NANO LETT, V14, P3395, DOI 10.1021/nl500904a
   Xie J, 2006, PURE APPL CHEM, V78, P1003, DOI 10.1351/pac200678051003
   Xie J, 2009, CURR MED CHEM, V16, P1278
   Xu F, 2011, LANGMUIR, V27, P3106, DOI 10.1021/la1050404
   Xu YL, 2015, NANOSCALE, V7, P12641, DOI 10.1039/c5nr03096j
   Xu YL, 2014, J MATER CHEM B, V2, P6198, DOI 10.1039/c4tb00840e
   Xu YL, 2012, LANGMUIR, V28, P8767, DOI 10.1021/la301200g
   Xu YL, 2011, LANGMUIR, V27, P8990, DOI 10.1021/la201652h
   Xu ZC, 2010, NANOSCALE, V2, P1027, DOI 10.1039/b9nr00400a
   YAMAKI M, 1995, LANGMUIR, V11, P2975, DOI 10.1021/la00008a021
   Yamamoto K, 2011, APPL PHYS LETT, V98, DOI 10.1063/1.3556562
   Yang TI, 2008, J MAGN MAGN MATER, V320, P2714, DOI 10.1016/j.jmmm.2008.06.008
   Yin YD, 2001, J AM CHEM SOC, V123, P8718, DOI 10.1021/ja011048v
   Yoshida S, 2001, CANCER RES, V61, P4244
   Young AG, 2008, LANGMUIR, V24, P3841, DOI 10.1021/la703655v
   Yu WW, 2004, CHEM COMMUN, P2306, DOI 10.1039/b409601k
   Yunker PJ, 2011, NATURE, V476, P308, DOI 10.1038/nature10344
   Zhang JH, 2010, ADV MATER, V22, P4249, DOI 10.1002/adma.201000755
   Zhang W, 2012, APPL PHYS LETT, V101, DOI 10.1063/1.4754610
   Zhou SQ, 1998, J PHYS CHEM B, V102, P1364, DOI 10.1021/jp972990p
   Zhu HT, 2011, MAGN RESON IMAGING, V29, P891, DOI 10.1016/j.mri.2011.04.011
   Zrinyi M, 1996, J CHEM PHYS, V104, P8750
NR 284
TC 15
Z9 15
U1 17
U2 115
PU SPRINGER
PI NEW YORK
PA 233 SPRING ST, NEW YORK, NY 10013 USA
SN 0022-2461
EI 1573-4803
J9 J MATER SCI
JI J. Mater. Sci.
PD JAN
PY 2016
VL 51
IS 1
BP 513
EP 553
DI 10.1007/s10853-015-9324-2
PG 41
WC Materials Science, Multidisciplinary
SC Materials Science
GA CV4GZ
UT WOS:000364226400040
PM 26586919
ER

PT J
AU Bahrami, M
   Matcha, CK
   Khatami, SM
   Roy, S
   Srinivasa, SG
   Vasic, B
AF Bahrami, Mohsen
   Matcha, Chaitanya Kumar
   Khatami, Seyed Mehrdad
   Roy, Shounak
   Srinivasa, Shayan Garani
   Vasic, Bane
TI Investigation Into Harmful Patterns Over Multitrack Shingled Magnetic
   Detection Using the Voronoi Model
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE 2-D magnetic recording (TDMR) systems; 2-D no-isolated-bit (n.i.b)
   constraint; bit-error rate (BER); generalized belief propagation (GBP)
   algorithm; multitrack detection
ID MEDIA
AB Two-dimensional magnetic recording 2-D (TDMR) is a promising technology for next generation magnetic storage systems based on a systems-level framework involving sophisticated signal processing at the core. The TDMR channel suffers from severe jitter noise along with electronic noise that needs to be mitigated during signal detection and recovery. Recently, we developed noise prediction-based techniques coupled with advanced signal detectors to work with these systems. However, it is important to understand the role of harmful patterns that can be avoided during the encoding process. In this paper, we investigate the Voronoi-based media model to study the harmful patterns over multitrack shingled recording systems. Through realistic quasi-micromagnetic simulation studies, we identify 2-D data patterns that contribute to high media noise. We look into the generic Voronoi model and present our analysis on multitrack detection with constrained coded data. We show that the 2-D constraints imposed on input patterns result in an order of magnitude improvement in the bit-error rate for the TDMR systems. The use of constrained codes can reduce the complexity of 2-D intersymbol interference (ISI) signal detection, since the lesser 2-D ISI span can be accommodated at the cost of a nominal code rate loss. However, a system must be designed carefully so that the rate loss incurred by a 2-D constraint does not offset the detector performance gain due to more distinguishable readback signals.
C1 [Bahrami, Mohsen; Khatami, Seyed Mehrdad; Vasic, Bane] Univ Arizona, Dept Elect & Comp Engn, Tucson, AZ 85721 USA.
   [Matcha, Chaitanya Kumar; Roy, Shounak; Srinivasa, Shayan Garani] Indian Inst Sci, Dept Elect Syst Engn, Bengaluru 560012, Karnataka, India.
RP Bahrami, M (reprint author), Univ Arizona, Dept Elect & Comp Engn, Tucson, AZ 85721 USA.
EM bahrami@email.arizona.edu
FU International Disk Drive Equipment and Materials Association-Advanced
   Storage Technology Consortium (IDEMA-ASTC); National Science Foundation
   [CCF-0963726, CCF-1314147]; U.S. Department of State Bureau of
   Educational and Cultural Affairs through the Fulbright Scholar Programs;
   Department of Science and Technology through the Government of India
   [SERB/F/3371/2013-14]
FX This work was supported in part by International Disk Drive Equipment
   and Materials Association-Advanced Storage Technology Consortium
   (IDEMA-ASTC) and in part by the National Science Foundation under Grant
   CCF-0963726 and Grant CCF-1314147. The work of B. Vasic was supported by
   the U.S. Department of State Bureau of Educational and Cultural Affairs
   through the Fulbright Scholar Programs. The work of S. G. Srinivasa was
   supported by the Department of Science and Technology through the
   Government of India under Grant SERB/F/3371/2013-14.
CR BAHL LR, 1974, IEEE T INFORM THEORY, V20, P284, DOI 10.1109/TIT.1974.1055186
   Chen YM, 2013, IEEE T COMMUN, V61, P3219, DOI 10.1109/TCOMM.2013.070213.120852
   Dunbar D, 2006, ACM T GRAPHIC, V25, P503, DOI 10.1145/1141911.1141915
   Khatami M, 2014, IEEE ICC, P3889, DOI 10.1109/ICC.2014.6883928
   Khatami S., 2015, P IEEE INT S INF THE, P1
   Khatami SM, 2013, IEEE T MAGN, V49, P3699, DOI 10.1109/TMAG.2013.2244063
   Krishnan AR, 2009, IEEE T MAGN, V45, P3830, DOI 10.1109/TMAG.2009.2023233
   Matcha CK, 2014, 2014 INTERNATIONAL SYMPOSIUM ON INFORMATION THEORY AND ITS APPLICATIONS (ISITA), P679
   Rottmayer RE, 2006, IEEE T MAGN, V42, P2417, DOI 10.1109/TMAG.2006.879572
   Sabato G, 2012, IEEE T COMMUN, V60, P669, DOI 10.1109/TCOMM.2012.122211.110026
   Singla N, 2002, IEEE T MAGN, V38, P2328, DOI 10.1109/TMAG.2002.801894
   Srinivasa SG, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2013.2290007
   Terris BD, 2007, MICROSYST TECHNOL, V13, P189, DOI 10.1007/s00542-006-0144-9
   Vasic B., 2014, P IEEE MAGN REC C TM, P1
   Wood R, 2009, IEEE T MAGN, V45, P917, DOI 10.1109/TMAG.2008.2010676
   Wu YX, 2003, IEEE T MAGN, V39, P2115, DOI 10.1109/TMAG.2003.814291
   Yedidia JS, 2005, IEEE T INFORM THEORY, V51, P2282, DOI 10.1109/TIT.2005.850085
NR 17
TC 3
Z9 3
U1 1
U2 1
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD DEC
PY 2015
VL 51
IS 12
AR 3102307
DI 10.1109/TMAG.2015.2460213
PG 7
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA DG4JJ
UT WOS:000372038200003
ER

PT J
AU Wang, Y
   Yao, J
   Kumar, BVKV
AF Wang, Yao
   Yao, Jun
   Kumar, B. V. K. Vijaya
TI 2-D Write/Read Channel Model for Bit-Patterned Media Recording With
   Large Media Noise
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE 2-D data dependence; bit-patterned media recording (BPMR); media noise
ID WRITTEN-IN ERRORS; TB/IN(2)
AB A 2-D write/read channel model, which can accurately capture the media, writer, and reader characteristics, is proposed and investigated for very-high-density bit-patterned media recording (BPMR) system with large media noise. For the write process, a 2-D data-dependent write channel combined with a micromagnetic model of the writer is investigated for BPMR. In order to better understand the proposed channel model, several 2-D patterns are investigated, and the corresponding write failure events are studied. It is observed that the write error rates (WERs) are different for different 2-D patterns due to the 2-D data-dependent nature of the write-in errors, even though the write failure rates are the same for these different 2-D patterns. For the readback process, a read channel, including media noise, is combined with the write channel, and the bit error rates (BERs) are studied for various 2-D patterns as a function of media jitter and write clock phase drift. It is observed that the 2-D pattern corresponding to four identical bits in a square pattern provides the best performance at a target BER of 10(-2) , because it can provide adequate tolerance to media noise and interference in down-track and cross-track (CT) directions. The difference between the WER and the BER after readback is studied for various 2-D patterns, and the pattern corresponding to 4 bits with transitions in the CT direction is found to exhibit the largest difference among the studied patterns due to the fact that inter-track interference is more severe than the inter-symbol interference. These results motivate possible inclusion of 2-D modulation codes in BPMR channel to avoid certain bit patterns.
C1 [Wang, Yao; Yao, Jun; Kumar, B. V. K. Vijaya] Carnegie Mellon Univ, Dept Elect & Comp Engn, Ctr Data Storage Syst, Pittsburgh, PA 15213 USA.
RP Wang, Y (reprint author), Carnegie Mellon Univ, Dept Elect & Comp Engn, Ctr Data Storage Syst, Pittsburgh, PA 15213 USA.
EM yaowang@andrew.cmu.edu
FU Carnegie Mellon University - Sun Yat-sen University Collaborative
   Innovation Research Center
FX This work was supported by the Carnegie Mellon University - Sun Yat-sen
   University Collaborative Innovation Research Center.
CR Asbahi M, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2013.2280018
   BAHL LR, 1974, IEEE T INFORM THEORY, V20, P284, DOI 10.1109/TIT.1974.1055186
   Dong Y, 2011, IEEE T MAGN, V47, P2652, DOI 10.1109/TMAG.2011.2148112
   Hu J, 2007, IEEE T MAGN, V43, P3517, DOI 10.1109/TMAG.2007.898307
   Iyengar AR, 2011, IEEE T MAGN, V47, P35, DOI 10.1109/TMAG.2010.2080667
   Moon J, 2001, IEEE J SEL AREA COMM, V19, P730, DOI 10.1109/49.920181
   Nabavi S, 2007, IEEE ICC, P6249, DOI 10.1109/ICC.2007.1035
   Nabavi S, 2008, IEEE T MAGN, V44, P3789, DOI 10.1109/TMAG.2008.2002387
   Ng Y, 2009, IEEE T MAGN, V45, P3535, DOI 10.1109/TMAG.2009.2024427
   Nutter PW, 2005, IEEE T MAGN, V41, P3214, DOI 10.1109/TMAG.2005.854780
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Tang Y, 2009, IEEE T MAGN, V45, P822, DOI 10.1109/TMAG.2008.2010642
   Terris BD, 2009, J MAGN MAGN MATER, V321, P512, DOI 10.1016/j.jmmm.2008.05.046
   Victora RH, 2005, IEEE T MAGN, V41, P537, DOI 10.1109/TMAG.2004.838075
   Wang SM, 2013, IEEE T MAGN, V49, P3644, DOI 10.1109/TMAG.2012.2237545
   Wang Y, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2014.2359391
   Wang Y, 2012, IEEE MAGN LETT, V3, DOI 10.1109/LMAG.2012.2226935
   Wu T, 2013, IEEE T MAGN, V49, P489, DOI 10.1109/TMAG.2012.2208120
   Zhang SH, 2011, IEEE T MAGN, V47, P2555, DOI 10.1109/TMAG.2011.2155628
   Zhang SH, 2010, IEEE T MAGN, V46, P1363, DOI 10.1109/TMAG.2010.2040713
NR 20
TC 14
Z9 14
U1 0
U2 0
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD DEC
PY 2015
VL 51
IS 12
AR 3002611
DI 10.1109/TMAG.2015.2464786
PG 11
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA DG4JJ
UT WOS:000372038200002
ER

PT J
AU Warisarn, C
   Kovintavewat, P
AF Warisarn, Chanon
   Kovintavewat, Piya
TI Soft-Output Decoding Approach of 2D Modulation Codes in Bit-Patterned
   Media Recording Systems
SO IEICE TRANSACTIONS ON ELECTRONICS
LA English
DT Article
DE bit-patterned media recording; log-likelihood ratio; modulation code;
   two-dimensional interference
AB The two-dimensional (2D) interference is one of the major impairments in bit-patterned media recording (BPMR) systems due to small bit and track pitches, especially at high recording densities. To alleviate this problem, we introduced a rate-4/5 constructive inter-track interference (CITI) coding scheme to prevent the destructive data patterns to be written onto a magnetic medium for an uncoded BPMR system, i.e., without error-correction codes. Because the CITI code produces only the hard decision, it cannot be employed in a coded BPMR system that uses a low-density parity-check (LDPC) code. To utilize it in an iterative decoding scheme, we propose a soft CITI coding scheme based on the log-likelihood ratio algebra implementation in Boolean logic mappings in order that the soft CITI coding scheme together with a modified 2D soft-output Viterbi algorithm (SOVA) detector and a LDPC decoder will jointly perform iterative decoding. Simulation results show that the proposed scheme provides a significant performance improvement, in particular when an areal density (AD) is high and/or the position jitter is large. Specifically, at a bit-error rate of 10(-4) and no position jitter, the proposed system can provide approximately 1.8 and 3.5 dB gain over the conventional coded system without using the CITI code at the ADs of 2.5 and 3.0 Tera-bit per square inch (Tb/in(2)), respectively.
C1 [Warisarn, Chanon] King Mongkuts Inst Technol Ladkrabang, Coll Data Storage Innovat D STAR, Bangkok 10520, Thailand.
   [Kovintavewat, Piya] Nakhon Pathom Rajabhat Univ, Data Storage Technol Res Ctr, Nakhon Pathom 73000, Thailand.
RP Warisarn, C (reprint author), King Mongkuts Inst Technol Ladkrabang, Coll Data Storage Innovat D STAR, Bangkok 10520, Thailand.
EM kwchanon@kmitl.ac.th; piya@npru.ac.th
FU Thailand Research Fund (TRF); King Mongkut's Institute of Technology
   Ladkrabang Research Fund, KMITL, Thailand
FX This work was supported by the Thailand Research Fund (TRF) and King
   Mongkut's Institute of Technology Ladkrabang Research Fund, KMITL,
   Thailand. The authors would like to thank Assoc. Prof. Dr. Pornchai
   Supnithi for his valuable suggestion.
CR Albrecht TR, 2009, NANOSCALE MAGNETIC MATERIALS AND APPLICATIONS, P237, DOI 10.1007/978-0-387-85600-1_9
   Arrayangkool A, 2014, J APPL PHYS, V115, DOI 10.1063/1.4855955
   Arrayangkool A, 2013, IEICE T ELECTRON, VE96C, P1490, DOI 10.1587/transele.E96.C.1490
   Berrou C., 1993, P IEEE INT C COMM IC, V2, P1064, DOI DOI 10.1109/ICC.1993.397441
   Busyatras W, 2015, IEICE T ELECTRON, VE98C, P892, DOI 10.1587/transele.E98.C.892
   Djuric N., 2005, P EUROCON 05 NOV, P490
   Djuric N., 2006, P ICC 06 JUN, P1255
   GALLAGER RG, 1962, IRE T INFORM THEOR, V8, P21, DOI 10.1109/TIT.1962.1057683
   Glavieux A., 1997, P INT S TURB COD REL, P96
   HAGENAUER J, 1989, DALLAS GLOBECOM 89, VOLS 1-3, P1680, DOI 10.1109/GLOCOM.1989.64230
   Kovintavewat P, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2014.2316203
   Losuwan T., 2012, P APMRC 2012 SEPT
   Nabavi S., 2008, THESIS CARNEGIE MELL
   Nabavi S, 2009, IEEE T MAGN, V45, P3523, DOI 10.1109/TMAG.2009.2022493
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Warisarn C, 2014, J APPL PHYS, V115, DOI 10.1063/1.4866849
   Wicker S. B., 1995, ERROR CONTROL SYSTEM
NR 18
TC 1
Z9 1
U1 1
U2 3
PU IEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG
PI TOKYO
PA KIKAI-SHINKO-KAIKAN BLDG, 3-5-8, SHIBA-KOEN, MINATO-KU, TOKYO, 105-0011,
   JAPAN
SN 1745-1353
J9 IEICE T ELECTRON
JI IEICE Trans. Electron.
PD DEC
PY 2015
VL E98C
IS 12
BP 1187
EP 1192
DI 10.1587/transele.E98.C.1187
PG 6
WC Engineering, Electrical & Electronic
SC Engineering
GA DC0JL
UT WOS:000368903000017
ER

PT J
AU An, HY
   Wang, J
   Szivos, J
   Harumoto, T
   Muraishi, S
   Safran, G
   Nakamura, Y
   Shi, J
AF An, Hongyu
   Wang, Jian
   Szivos, Janos
   Harumoto, Takashi
   Muraishi, Shinji
   Safran, Gyorgy
   Nakamura, Yoshio
   Shi, Ji
TI Perpendicular coercivity enhancement of CoPt/TiN films by nitrogen
   incorporation during deposition
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article
ID BIT-PATTERNED MEDIA; MAGNETIC-PROPERTIES; THIN-FILMS
AB The effect of N incorporation on the structure and magnetic properties of CoPt thin films deposited on glass substrates with TiN seed layers has been investigated. During the deposition of CoPt, introducing 20% N-2 into Ar atmosphere promotes the (001) texture and enhances the perpendicular coercivity of CoPt film compared with the film deposited in pure Ar and post-annealed under the same conditions. From the in situ x-ray diffraction results, it is confirmed that N incorporation expands the lattice parameter of CoPt, which favors the epitaxial growth of CoPt on TiN. During the post-annealing process, N releases from CoPt film and promotes the L1(0) ordering transformation of CoPt. (C) 2015 AIP Publishing LLC.
C1 [An, Hongyu; Harumoto, Takashi; Muraishi, Shinji; Nakamura, Yoshio; Shi, Ji] Tokyo Inst Technol, Dept Met & Ceram Sci, Meguro Ku, Tokyo 1528552, Japan.
   [Wang, Jian] NIMS, Tsukuba, Ibaraki 3050047, Japan.
   [Szivos, Janos; Safran, Gyorgy] Hungarian Acad Sci, Res Inst Tech Phys & Mat Sci, H-1121 Budapest, Hungary.
RP Shi, J (reprint author), Tokyo Inst Technol, Dept Met & Ceram Sci, Meguro Ku, 2-12-1 Ookayama, Tokyo 1528552, Japan.
EM Shi.j.aa@m.titech.ac.jp
CR An HY, 2015, J PHYS D APPL PHYS, V48, DOI 10.1088/0022-3727/48/15/155001
   Bublat T, 2011, NANOTECHNOLOGY, V22, DOI 10.1088/0957-4484/22/31/315301
   Dong KF, 2014, APPL PHYS LETT, V104, DOI 10.1063/1.4878263
   Jeong S, 2000, IEEE T MAGN, V36, P2336, DOI 10.1109/20.908421
   Liao JW, 2013, APPL PHYS LETT, V102, DOI 10.1063/1.4793189
   MALLINSON JC, 1991, IEEE T MAGN, V27, P3519, DOI 10.1109/20.102923
   McCallum AT, 2011, APPL PHYS LETT, V98, DOI 10.1063/1.3599573
   Perumal A, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2830708
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Richter HJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2209179
   Shimatsu T, 2011, J APPL PHYS, V109, DOI 10.1063/1.3556697
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Wang HY, 2004, J APPL PHYS, V95, P2564, DOI 10.1063/1.1643785
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
   You CY, 2005, J APPL PHYS, V98, DOI 10.1063/1.1943509
NR 15
TC 0
Z9 0
U1 3
U2 3
PU AMER INST PHYSICS
PI MELVILLE
PA 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
SN 0021-8979
EI 1089-7550
J9 J APPL PHYS
JI J. Appl. Phys.
PD NOV 28
PY 2015
VL 118
IS 20
AR 203907
DI 10.1063/1.4936365
PG 4
WC Physics, Applied
SC Physics
GA CY3NP
UT WOS:000366316800012
ER

PT J
AU Busyatras, W
   Warisarn, C
   Myint, LMM
   Supnithi, P
   Kovintavewat, P
AF Busyatras, Wiparat
   Warisarn, Chanon
   Myint, Lin M. M.
   Supnithi, Pornchai
   Kovintavewat, Piya
TI An Iterative TMR Mitigation Method Based on Readback Signal for
   Bit-Patterned Media Recording
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT IEEE International Magnetics Conference (Intermag)
CY MAY 11-15, 2015
CL Beijing, PEOPLES R CHINA
SP IEEE, Tsinghua Univ, Inst Phys, Chinese Acad Sci, Beijing Univ, Chinese Phys Soc, Chinese Inst Elect, Chinese Mat Res Soc
DE 2-D equalization; bit-patterned media recording (BPMR); intertrack
   interference; track misregistration (TMR)
ID TRACK MISREGISTRATION
AB Off-track condition or track misregistration (TMR) is one of the most significant problems in the extremely high-density bit-patterned media recording (BPMR) system, since a track pitch becomes narrower. Typically, the TMR can be detected and handled by a servo system; however, it requires some special data to be inserted in the tracks so as to estimate the amount of head offset. Nonetheless, this paper proposes an iterative TMR mitigation method for BPMR systems based on the readback signals. First, we design several pairs of the 2-D asymmetric target and its corresponding 2-D equalizer that match the BPMR channel for each TMR level. Then, we exploit the three adjacent data tracks obtained from the low-density parity-check decoders to estimate the TMR level. Last, a pair of the 2-D asymmetric target and its corresponding 2-D equalizer that is best fit to the estimated TMR level will be used to alleviate the TMR effect in the readback signal for the next global iteration. Simulation results indicate that the proposed system can effectively estimate the TMR level and performs better than the conventional system without a TMR mitigation method, especially when the TMR level is high and/or the position jitter is large.
C1 [Busyatras, Wiparat; Warisarn, Chanon] King Mongkuts Inst Technol Ladkrabang, Coll Data Storage Innovat, Bangkok 10520, Thailand.
   [Myint, Lin M. M.] Shinawatra Univ, Sch Informat Technol, Pathum Thani 12160, Thailand.
   [Supnithi, Pornchai] King Mongkuts Inst Technol Ladkrabang, Fac Engn, Bangkok 10520, Thailand.
   [Kovintavewat, Piya] Nakhon Pathom Rajabhat Univ, Data Storage Technol Res Ctr, Nakhon Pathom 73000, Thailand.
RP Warisarn, C (reprint author), King Mongkuts Inst Technol Ladkrabang, Coll Data Storage Innovat, Bangkok 10520, Thailand.
EM kwchanon@kmitl.ac.th
OI MYINT, LIN/0000-0002-8492-8337
CR Busyatras W., 2014, P ITC CSCC PHUK THAI, P881
   Chang YB, 2002, IEEE T MAGN, V38, P1441, DOI 10.1109/20.996050
   Ehrlich R, 1999, IEEE T MAGN, V35, P885, DOI 10.1109/20.753803
   GALLAGER RG, 1962, IRE T INFORM THEOR, V8, P21, DOI 10.1109/TIT.1962.1057683
   He LN, 1998, IEEE T MAGN, V34, P2348, DOI 10.1109/20.703877
   Jin Z, 2002, IEEE T MAGN, V38, P1429, DOI 10.1109/20.996046
   MOON JY, 1995, IEEE T MAGN, V31, P1083, DOI 10.1109/20.364789
   Myint LMM, 2012, IEEE T MAGN, V48, P4590, DOI 10.1109/TMAG.2012.2204963
   Nabavi S., 2008, THESIS
   Nabavi S, 2007, IEEE T MAGN, V43, P2274, DOI 10.1109/TMAG.2007.893479
   Ng Y, 2012, IEEE T MAGN, V48, P1976, DOI 10.1109/TMAG.2011.2181183
   Nutter PW, 2005, IEEE T MAGN, V41, P3214, DOI 10.1109/TMAG.2005.854780
NR 12
TC 0
Z9 0
U1 2
U2 2
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD NOV
PY 2015
VL 51
IS 11
AR 3002104
DI 10.1109/TMAG.2015.2445381
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA CW1SB
UT WOS:000364770500251
ER

PT J
AU Dai, XY
   Li, H
   Shen, SN
   Cai, M
   Wu, SJ
AF Dai, Xiangyu
   Li, Hui
   Shen, Shengnan
   Cai, Mang
   Wu, Shijing
TI Numerical Simulation of Bearing Force Over Bit-Patterned Media using 3-D
   DSMC Method
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT IEEE International Magnetics Conference (Intermag)
CY MAY 11-15, 2015
CL Beijing, PEOPLES R CHINA
SP IEEE, Tsinghua Univ, Inst Phys, Chinese Acad Sci, Beijing Univ, Chinese Phys Soc, Chinese Inst Elect, Chinese Mat Res Soc
DE Bearing force; bit-patterned media (BPM); direct simulation Monte Carlo
   (DSMC) method; helium
ID MONTE-CARLO METHOD; FLYING CHARACTERISTICS; DISCRETE-TRACK; AIR-BEARING;
   SLIDER
AB Nowadays, hard disk drive filling with helium has emerged to achieve highly stable magnetic recording. The bearing force in helium is different from that in air. This paper uses the 3-D direct simulation Monte Carlo method to investigate the bearing force over bit-patterned media in the filling gases of air and helium under different conditions, including groove depth, ambient temperature, slider surface temperature, rotation speed of the disk, and different velocity losses during the collision process between the gas molecules and the slider.
C1 [Dai, Xiangyu; Li, Hui; Shen, Shengnan; Cai, Mang; Wu, Shijing] Wuhan Univ, Sch Power & Mech Engn, Wuhan 430072, Peoples R China.
RP Li, H (reprint author), Wuhan Univ, Sch Power & Mech Engn, Wuhan 430072, Peoples R China.
EM li_hui@whu.edu.cn
CR Albrecht TR, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2015.2397880
   Alexander F., 1982, GAS DYNAMICS DIRECT
   Bertram HN, 2000, IEEE T MAGN, V36, P4, DOI 10.1109/20.824417
   Cercignani C, 2000, RAREFIED GAS DYNAMIC
   Duwensee M., 2009, T ASME J TRIBOL, V131
   Huang WD, 1998, IEEE T MAGN, V34, P1810, DOI 10.1109/20.706714
   Huang WD, 1997, PHYS FLUIDS, V9, P1764, DOI 10.1063/1.869293
   Knigge BE, 2008, IEEE T MAGN, V44, P3656, DOI 10.1109/TMAG.2008.2002613
   Li H, 2010, J ADV MECH DES SYST, V4, P49, DOI 10.1299/jamdsm.4.49
   Li JH, 2007, J TRIBOL-T ASME, V129, P712, DOI 10.1115/1.2768069
   Liu C. Y., 1961, RAREFIED GAS DYN, P391
   Liu N, 2010, TRIBOL LETT, V37, P93, DOI 10.1007/s11249-009-9494-7
   Liu N, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3268468
   Marchon B., 2013, ADV TRIBOL, V2013, DOI 10.1155/2013/521086
   Myo KS, 2011, IEEE T MAGN, V47, P2660, DOI 10.1109/TMAG.2011.2159965
   Zhou WD, 2009, TRIBOL LETT, V33, P179, DOI 10.1007/s11249-008-9405-3
   Suzuki H., 2009, U.S. Patent, Patent No. [2009/0097163 A1, 20090097163]
   Kouno K., 2009, U.S. Patent, Patent No. [2009/0168233 A1, 20090168233]
   Uefune K., 2009, U.S. Patent, Patent No. [2009/0241322 A1, 20090241322]
NR 19
TC 1
Z9 1
U1 0
U2 8
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD NOV
PY 2015
VL 51
IS 11
AR 7209804
DI 10.1109/TMAG.2015.2449859
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA CW1SB
UT WOS:000364770500416
ER

PT J
AU Fu, SD
   Xu, L
   Lomakin, V
   Torabi, A
   Lengsfield, B
AF Fu, Sidi
   Xu, Lei
   Lomakin, Vitaliy
   Torabi, Adam
   Lengsfield, Byron
TI Modeling Perpendicular Magnetic Multilayered Oxide Media With
   Discretized Magnetic Layers
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT IEEE International Magnetics Conference (Intermag)
CY MAY 11-15, 2015
CL Beijing, PEOPLES R CHINA
SP IEEE, Tsinghua Univ, Inst Phys, Chinese Acad Sci, Beijing Univ, Chinese Phys Soc, Chinese Inst Elect, Chinese Mat Res Soc
DE Discretized cap layer; exchange coupled composite (ECC) media;
   micromagnetics; perpendicular magnetic recording
ID COMPOSITE MEDIA
AB A discretized magnetic media model is developed to improve our ability to describe the high-frequency recording performance of perpendicular magnetic media. The new model differs from the traditional macrospin model in that the magnetic grains are subdivided into cells, which have varying magnetic properties and independent magnetic moments. This discretized media model has two realizations: one with a discretized magnetic boundary and one without the magnetic boundary. We focus on the resolution and the signal-to-noise ratio obtained from a high-density bit pattern as the bit length approaches the grain pitch. Simulation results demonstrating the impact of a discretized cap in this recording regime will be discussed. The increased computational effort needed to perform a simulation using this discretized media model, and has been addressed by porting this model to a cluster of graphics processing units.
C1 [Fu, Sidi; Lomakin, Vitaliy] Univ Calif San Diego, Ctr Magnet Recording Res, La Jolla, CA 92093 USA.
   [Fu, Sidi; Lomakin, Vitaliy] Univ Calif San Diego, Dept Elect & Comp Engn, La Jolla, CA 92093 USA.
   [Xu, Lei; Torabi, Adam; Lengsfield, Byron] HGST, San Jose, CA 95135 USA.
RP Fu, SD (reprint author), Univ Calif San Diego, Ctr Magnet Recording Res, La Jolla, CA 92093 USA.
EM s6fu@ucsd.edu
CR Chang R, 2011, J APPL PHYS, V109, DOI 10.1063/1.3563081
   Choe G, 2011, IEEE T MAGN, V47, P55, DOI 10.1109/TMAG.2010.2074190
   Fu S, 2015, J APPL PHYS, V117, DOI 10.1063/1.4918638
   NVidia, 2015, CUDA C PROGRAMMING G
   Saharan L, 2011, J APPL PHYS, V110, DOI 10.1063/1.3662919
   Tang K, 2008, IEEE T MAGN, V44, P3507, DOI 10.1109/TMAG.2008.2002616
   Victora RH, 2005, IEEE T MAGN, V41, P2828, DOI 10.1109/TMAG.2005.855263
   Victora RH, 2005, IEEE T MAGN, V41, P537, DOI 10.1109/TMAG.2004.838075
   Wismayer MP, 2006, J APPL PHYS, V99, DOI 10.1063/1.2165798
   Zhu JG, 1996, J APPL PHYS, V79, P4906, DOI 10.1063/1.361582
NR 10
TC 2
Z9 2
U1 0
U2 1
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD NOV
PY 2015
VL 51
IS 11
AR 3001704
DI 10.1109/TMAG.2015.2438830
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA CW1SB
UT WOS:000364770500247
ER

PT J
AU Kong, LJ
   He, LW
   Chen, PP
   Han, GJ
   Fang, Y
AF Kong, Lingjun
   He, Liwen
   Chen, Pingping
   Han, Guojun
   Fang, Yi
TI Protograph-Based Quasi-Cyclic LDPC Coding for Ultrahigh Density Magnetic
   Recording Channels
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT IEEE International Magnetics Conference (Intermag)
CY MAY 11-15, 2015
CL Beijing, PEOPLES R CHINA
SP IEEE, Tsinghua Univ, Inst Phys, Chinese Acad Sci, Beijing Univ, Chinese Phys Soc, Chinese Inst Elect, Chinese Mat Res Soc
DE 2-D intersymbol interference (ISI) channels; low-density parity-check
   (LDPC) codes; protograph LDPC codes; quasi-cyclic (QC) LDPC codes
ID 2-DIMENSIONAL INTERSYMBOL INTERFERENCE; PARTIAL-RESPONSE CHANNELS;
   MEDIA; CODES; EQUALIZATION
AB In this paper, protograph-based quasi-cyclic (QC) low-density parity-check (LDPC) codes are proposed for the efficient structure coding of LDPC codes in 2-D intersymbol interference (ISI) ultrahigh density magnetic recording channels, such as bit-patterned magnetic recording and 2-D magnetic recording, where a reduced-complexity 2-D detector based on the iterative row-column soft detection feedback with Gaussian approximation is employed instead of the full 2-D Bahl-Cocke-Jelinek-Raviv detector. The proposed protograph-based codes, whose base matrices are constructed according to the degree sequences for 2-D-ISI channels, have a low-complexity QC encoder structure with a readily parallelizable protograph decoder structure. Simulation results show that the proposed protograph-based QC-LDPC codes outperform the random LDPC codes optimized for additive white Gaussian noise channels. Furthermore, the performance of the QC codes is similar to that exhibited by ISI-optimized random LDPC codes designed for 2-D-ISI channels, while retaining the implementational benefits.
C1 [Kong, Lingjun; He, Liwen] Nanjing Univ Posts & Telecommun, Sch Comp Sci & Technol, Nanjing 210003, Jiangsu, Peoples R China.
   [Chen, Pingping] Fuzhou Univ, Coll Phys & Informat Engn, Fuzhou 350001, Peoples R China.
   [Han, Guojun; Fang, Yi] Guangdong Univ Technol, Sch Informat Engn, Guangzhou 511300, Guangdong, Peoples R China.
RP Kong, LJ (reprint author), Nanjing Univ Posts & Telecommun, Sch Comp Sci & Technol, Nanjing 210003, Jiangsu, Peoples R China.
EM ljkong@njupt.edu.cn
CR BAHL LR, 1974, IEEE T INFORM THEORY, V20, P284, DOI 10.1109/TIT.1974.1055186
   Cheng TK, 2007, IEEE SIGNAL PROC LET, V14, P433, DOI 10.1109/LSP.2006.891329
   Guan YL, 2014, INT CONF COMPUT NETW, P194, DOI 10.1109/ICCNC.2014.6785330
   Karakulak S, 2010, IEEE T MAGN, V46, P3639, DOI 10.1109/TMAG.2010.2049116
   Kavcic A, 2003, IEEE T INFORM THEORY, V49, P1636, DOI 10.1109/TIT.2003.813563
   Kong LJ, 2013, IEEE T MAGN, V49, P2823, DOI 10.1109/TMAG.2013.2248351
   Kurkoski BM, 2008, IEICE T FUND ELECTR, VE91A, P2696, DOI 10.1093/ietfec/e91-a.10.2696
   Ng Y, 2009, IEEE T MAGN, V45, P3535, DOI 10.1109/TMAG.2009.2024427
   Thangaraj A, 2002, IEEE T MAGN, V38, P2307, DOI 10.1109/TMAG.2002.801875
   Varnica N, 2003, IEEE COMMUN LETT, V7, P168, DOI 10.1109/LCOMM.2003.810000
   Wood R, 2009, IEEE T MAGN, V45, P917, DOI 10.1109/TMAG.2008.2010676
   Yao J, 2012, IEEE T COMMUN, V60, P3548, DOI 10.1109/TCOMM.2012.091112.110433
   Zheng JP, 2013, IEEE T MAGN, V49, P4768, DOI 10.1109/TMAG.2013.2242333
NR 13
TC 0
Z9 0
U1 3
U2 3
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD NOV
PY 2015
VL 51
IS 11
AR 3101604
DI 10.1109/TMAG.2015.2437397
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA CW1SB
UT WOS:000364770500257
ER

PT J
AU Koonkarnkhai, S
   Kovintavewat, P
   Keeratiwintakorn, P
AF Koonkarnkhai, Santi
   Kovintavewat, Piya
   Keeratiwintakorn, Phongsak
TI Study of Fractionally Spaced Equalizers for Bit-Patterned Media
   Recording
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT IEEE International Magnetics Conference (Intermag)
CY MAY 11-15, 2015
CL Beijing, PEOPLES R CHINA
SP IEEE, Tsinghua Univ, Inst Phys, Chinese Acad Sci, Beijing Univ, Chinese Phys Soc, Chinese Inst Elect, Chinese Mat Res Soc
DE Bit-patterned media recording (BPMR); fractionally spaced equalizer
   (FSE); oversampled system; target and equalizer design
ID INTERFERENCE
AB Bit-patterned media recording (BPMR) is a promising technology to enhance the areal density (AD) of hard disk drives beyond the limit imposed by the current perpendicular recording technology. Practically, a T-spaced equalizer is employed in a conventional (symbol-rate) BPMR system to shape the overall channel response to a target response before performing the data-detection process, where T is a bit period. Because the BPMR channel response has a large excess bandwidth, we propose to use a fractionally spaced equalizer (FSE) in the oversampled BPMR system so as to improve the system performance. A design of the FSE and its corresponding 1-D and 2-D targets is given. Thus, we compare the performance of the oversampled BPMR system with the symbolrate one. Results indicate that the oversampled system performs better than the symbol-rate one in terms of bit-error rate (BER). Specifically, at BER = 10(-4) and no media noise, the oversampled system can provide similar to 1 dB gain at the ADs of 2 and 2.5 Tb/in(2) over the symbol-rate system. In addition, we found that the oversampled system is more robust to media noise than the symbol-rate one.
C1 [Koonkarnkhai, Santi; Kovintavewat, Piya] Nakhon Pathom Rajabhat Univ, Data Storage Technol Res Ctr, Nakhon Pathom 73000, Thailand.
   [Keeratiwintakorn, Phongsak] King Mongkuts Univ Technol North Bangkok, Dept Elect & Comp Engn, Bangkok 10800, Thailand.
RP Kovintavewat, P (reprint author), Nakhon Pathom Rajabhat Univ, Data Storage Technol Res Ctr, Nakhon Pathom 73000, Thailand.
EM piya@npru.ac.th
RI KEERATIWINTAKORN, Phongsak/D-7616-2016
OI KEERATIWINTAKORN, Phongsak/0000-0002-0402-6035
CR Chang W, 2010, IEEE T MAGN, V46, P3899, DOI 10.1109/TMAG.2010.2056926
   FORNEY GD, 1972, IEEE T INFORM THEORY, V18, P363, DOI 10.1109/TIT.1972.1054829
   Karakulak S., 2010, THESIS
   Kovintavewat P., 2003, P IEEE JOINT N AM PE, P43
   MOON JY, 1995, IEEE T MAGN, V31, P1083, DOI 10.1109/20.364789
   Nabavi S., 2008, THESIS
   Nabavi S, 2008, IEEE T MAGN, V44, P3789, DOI 10.1109/TMAG.2008.2002387
   Ng Y, 2012, IEEE T MAGN, V48, P1976, DOI 10.1109/TMAG.2011.2181183
   Qureshi S. U. H., 1977, P NTC LOS ANG CA US
   Shiroishi Y, 2009, IEEE T MAGN, V45, P3816, DOI 10.1109/TMAG.2009.2024879
   Song S.M., 2010, THESIS
   UNGERBOECK G, 1976, IEEE T COMMUN, V24, P856, DOI 10.1109/TCOM.1976.1093381
NR 12
TC 0
Z9 0
U1 0
U2 3
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD NOV
PY 2015
VL 51
IS 11
AR 3001604
DI 10.1109/TMAG.2015.2437891
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA CW1SB
UT WOS:000364770500246
ER

PT J
AU Park, J
   Lengsfield, B
   Galbraith, R
   Wood, R
   Fu, SD
AF Park, Jihoon
   Lengsfield, Byron
   Galbraith, Rick
   Wood, Roger
   Fu, Sidi
TI Optimization of Magnetic Read Widths in Two-Dimensional Magnetic
   Recording Based on Micromagnetic Simulations
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT IEEE International Magnetics Conference (Intermag)
CY MAY 11-15, 2015
CL Beijing, PEOPLES R CHINA
SP IEEE, Tsinghua Univ, Inst Phys, Chinese Acad Sci, Beijing Univ, Chinese Phys Soc, Chinese Inst Elect, Chinese Mat Res Soc
DE Magnetic read width (MRW); micromagnetic waveform; pseudorandom binary
   sequence (PRBS); shingled magnetic recording (SMR); software channel;
   two-dimensional magnetic recording (TDMR); waveform combining
ID OXIDE MEDIA; WRITEABILITY
AB Optimization of magnetic read widths (MRWs) and reader positions in two-dimensional magnetic recording (TDMR) is explored in order to maximize an areal density (AD) gain over shingled magnetic recording (SMR). The optimization is based on micromagnetic waveforms from 511-bit maximal-length pseudorandom binary sequence (PRBS) patterns. The identical MRWs for two readers are initially considered and the best reader offset is found in order to achieve the largest AD gain. Given the best reader offset, the MRWs for the two readers are changed to further enhance the AD gain. A software channel is utilized to identify the major contribution of the TDMR AD gain.
C1 [Park, Jihoon; Lengsfield, Byron; Wood, Roger] HGST, San Jose, CA 95119 USA.
   [Galbraith, Rick] HGST, Rochester, MN 55901 USA.
   [Fu, Sidi] Univ Calif San Diego, Ctr Magnet Recording Res, La Jolla, CA 92093 USA.
RP Park, J (reprint author), HGST, San Jose, CA 95119 USA.
EM jihoon.park@hitachigst.com
CR Choe G, 2011, IEEE T MAGN, V47, P55, DOI 10.1109/TMAG.2010.2074190
   Choe G, 2010, IEEE T MAGN, V46, P1802, DOI 10.1109/TMAG.2009.2038928
   Choe G, 2009, IEEE T MAGN, V45, P2694, DOI 10.1109/TMAG.2009.2018644
   Galbraith R, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2013.2291875
   Wood R., 2014, P 25 MAGN REC C TMRC
   Wood R, 2009, IEEE T MAGN, V45, P917, DOI 10.1109/TMAG.2008.2010676
NR 6
TC 0
Z9 0
U1 1
U2 1
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD NOV
PY 2015
VL 51
IS 11
AR 3002504
DI 10.1109/TMAG.2015.2457395
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA CW1SB
UT WOS:000364770500255
ER

PT J
AU Saito, H
AF Saito, Hidetoshi
TI Signal-Processing Schemes for Multi-Track Recording and Simultaneous
   Detection Using High Areal Density Bit-Patterned Media Magnetic
   Recording
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT IEEE International Magnetics Conference (Intermag)
CY MAY 11-15, 2015
CL Beijing, PEOPLES R CHINA
SP IEEE, Tsinghua Univ, Inst Phys, Chinese Acad Sci, Beijing Univ, Chinese Phys Soc, Chinese Inst Elect, Chinese Mat Res Soc
DE 2-D magnetic recording (TDMR); bit-patterned media (BPM); generalized
   partial response (GPR)
ID EQUALIZATION
AB Recent magnetic recording technologies have opened the possibility of reaching densities of 10 Tb/in(2). A 2-D magnetic recording (TDMR) scheme has pointed out one of the key technologies for increasing areal density. From the viewpoint of signal processing for TDMR, a recording system is desirable or preferable to be capable of allowing to get readback signals from a group of adjacent parallel tracks and detect recorded data written in these tracks simultaneously. This paper proposes a novel signal processing scheme with coding and detection for bit-patterned media recording (BPMR) which is considered to be TDMR using bit-patterned media. Actually, the proposed signal processing scheme for BPMR gets mixed readback signal sequences from the parallel tracks using a single reading head and these readback signal sequences are equalized to a frequency response given by a desired 2-D generalized partial response system. In decoding process, a single maximum likelihood sequence detector is capable of detecting the equalized signal sequence, and it leads to an increase in the effective transfer rate because the recorded data on the parallel tracks are decoded for each time slot.
C1 [Saito, Hidetoshi] Kogakuin Univ, Sch Adv Engn, Dept Appl Phys, Tokyo 1638677, Japan.
RP Saito, H (reprint author), Kogakuin Univ, Sch Adv Engn, Dept Appl Phys, Tokyo 1638677, Japan.
EM h-saito@cc.kogakuin.ac.jp
CR Brickner B, 1997, IEEE T MAGN, V33, P2749, DOI 10.1109/20.617718
   Chang W, 2011, IEEE T MAGN, V47, P2551, DOI 10.1109/TMAG.2011.2151839
   Karakulak S, 2010, IEEE T MAGN, V46, P3639, DOI 10.1109/TMAG.2010.2049116
   Nabavi S., 2008, THESIS
   Nabavi S, 2007, IEEE ICC, P6249, DOI 10.1109/ICC.2007.1035
   Ng Y, 2009, IEEE T MAGN, V45, P3535, DOI 10.1109/TMAG.2009.2024427
   Ordentlich E, 2011, IEEE T INFORM THEORY, V57, P7661, DOI 10.1109/TIT.2011.2170108
   Wood R, 2009, IEEE T MAGN, V45, P917, DOI 10.1109/TMAG.2008.2010676
   Wu T., 2014, IEEE T MAGN, V50
   Zhang Y, 2011, MATH COMPUT MODEL, V53, P1810, DOI 10.1016/j.mcm.2010.12.059
   Zheng WX, 1999, J FRANKLIN I, V336, P1309, DOI 10.1016/S0016-0032(99)00038-1
NR 11
TC 0
Z9 0
U1 1
U2 4
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD NOV
PY 2015
VL 51
IS 11
AR 3101404
DI 10.1109/TMAG.2015.2436717
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA CW1SB
UT WOS:000364770500259
ER

PT J
AU Talbot, JE
   Kalezhi, J
   Miles, J
AF Talbot, Jennifer E.
   Kalezhi, Josephat
   Miles, Jim
TI Determining the Anisotropy of Bit-Patterned Media for Optimal
   Performance
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT IEEE International Magnetics Conference (Intermag)
CY MAY 11-15, 2015
CL Beijing, PEOPLES R CHINA
SP IEEE, Tsinghua Univ, Inst Phys, Chinese Acad Sci, Beijing Univ, Chinese Phys Soc, Chinese Inst Elect, Chinese Mat Res Soc
DE Bit-patterned media (BPM); exchange coupled composite (ECC); magnetic
   recording; write-window
AB In conventional recording theory, the transition width should be minimized by writing the transition at the location of the maximum head-field gradient, and this should be achieved by setting the coercivity equal to the head field at the location of the maximum head-field gradient (taking appropriate account of the variation of coercivity with field angle). A natural assumption in bit-patterned media is that the system could be optimized by setting the island switching field in a similar manner. In this paper, we investigate what strategy of optimization gives the minimum error rate or the maximum write-window.
C1 [Talbot, Jennifer E.; Miles, Jim] Univ Manchester, Manchester M13 9PL, Lancs, England.
   [Kalezhi, Josephat] Copperbelt Univ, Kitwe 21692, Zambia.
RP Talbot, JE (reprint author), Univ Manchester, Manchester M13 9PL, Lancs, England.
EM jennifer.talbot-2@postgrad.manchester.ac.uk
CR Dobin A., 2006, P IEEE INT MAGN C IN, P260
   Kalezhi J, 2012, J APPL PHYS, V111, DOI 10.1063/1.3691947
   Kalezhi J, 2011, IEEE T MAGN, V47, P2540, DOI 10.1109/TMAG.2011.2157993
   Kalezhi J, 2010, IEEE T MAGN, V46, P3752, DOI 10.1109/TMAG.2010.2052626
   Middleton B. K., 1996, MAGNETIC RECORDING T
   Richter HJ, 2011, IEEE T MAGN, V47, P4769, DOI 10.1109/TMAG.2011.2160274
   Richter HJ, 2009, J MAGN MAGN MATER, V321, P467, DOI 10.1016/j.jmmm.2008.04.161
   Richter HJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2209179
   Shiroishi Y, 2009, IEEE T MAGN, V45, P3816, DOI 10.1109/TMAG.2009.2024879
   Talbot JE, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2014.2308481
   Victora RH, 2005, IEEE T MAGN, V41, P537, DOI 10.1109/TMAG.2004.838075
   Weller D, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2013.2281027
NR 12
TC 0
Z9 0
U1 1
U2 4
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD NOV
PY 2015
VL 51
IS 11
AR 2301304
DI 10.1109/TMAG.2015.2441134
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA CW1SB
UT WOS:000364770500145
ER

PT J
AU Victora, RH
   Wang, SM
AF Victora, R. H.
   Wang, Sumei
TI Simulation of Expected Areal Density Gain for Heat-Assisted Magnetic
   Recording Relative to Other Advanced Recording Schemes
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT IEEE International Magnetics Conference (Intermag)
CY MAY 11-15, 2015
CL Beijing, PEOPLES R CHINA
SP IEEE, Tsinghua Univ, Inst Phys, Chinese Acad Sci, Beijing Univ, Chinese Phys Soc, Chinese Inst Elect, Chinese Mat Res Soc
DE Bit patterned media (BPM); heat-assisted magnetic recording (HAMR);
   shingled magnetic recording
ID MEDIA
AB In this paper, we review our latest progress for heat-assisted magnetic recording (HAMR) systems. The temperature distribution has been computed using the finite difference time domain technique and by solving the heat diffusion equation. Magnetic behavior has been calculated using a renormalized cell technique (granular media) and atomistic simulation [bit-patterned media (BPM)]. We find that the ultimate density of HAMR on granular media depends greatly on grain size, with a 5 nm grain pitch yielding similar to 4 Tb/in(2). We were unable to exceed similar to 5.8 Tb/in(2) on BPM owing to excessive heating of the adjacent track, causing adjacent track erasure to date. Shingled recording on granular media, using two dimensional magnetic recording (TDMR) detection depends greatly on the mechanical systems, with likely user densities reaching similar to 2.5 Tb/in(2). Finally, shingled recording without heat assist on BPM yielded an unexpectedly high density of similar to 8 Tb/in(2).
C1 [Victora, R. H.; Wang, Sumei] Univ Minnesota, Dept Elect & Comp Engn, Ctr Micromagnet & Informat Technol, Minneapolis, MN 55455 USA.
RP Wang, SM (reprint author), Univ Minnesota, Dept Elect & Comp Engn, Ctr Micromagnet & Informat Technol, Minneapolis, MN 55455 USA.
EM wang3936@umn.edu
CR BROWN WF, 1963, PHYS REV, V130, P1677, DOI 10.1103/PhysRev.130.1677
   Dittrich R., 2002, J MAGN MAGN MATER, V250, P12, DOI 10.1016/S0304-8853(02)00388-8
   Dong Y, 2011, IEEE T MAGN, V47, P2652, DOI 10.1109/TMAG.2011.2148112
   Huang PW, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2014.2318040
   Kunz K. S., 1993, THE FINITE DIFFERENC
   Pisana S, 2014, APPL PHYS LETT, V104, DOI 10.1063/1.4873543
   Stipe BC, 2010, NAT PHOTONICS, V4, P484, DOI 10.1038/nphoton.2010.90
   Victora RH, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2014.2353660
   Victora RH, 2013, IEEE T MAGN, V49, P751, DOI 10.1109/TMAG.2012.2219300
   Wang SM, 2013, IEEE T MAGN, V49, P3644, DOI 10.1109/TMAG.2012.2237545
   Wang Y, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2014.2321389
   Wang Y, 2012, IEEE MAGN LETT, V3, DOI 10.1109/LMAG.2012.2226935
   Wang Y, 2013, IEEE T MAGN, V49, P5208, DOI 10.1109/TMAG.2013.2260349
NR 13
TC 0
Z9 0
U1 4
U2 8
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD NOV
PY 2015
VL 51
IS 11
AR 3201307
DI 10.1109/TMAG.2015.2436819
PG 7
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA CW1SB
UT WOS:000364770500272
ER

PT J
AU Wang, H
   Tang, YS
   Park, J
   Xu, L
   Song, M
AF Wang, Hao
   Tang, Yaw-Shing
   Park, Jihoon
   Xu, Lei
   Song, Mark
TI Thermal Stability Analysis on Pattern-Dependent BER and SNR Decay
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT IEEE International Magnetics Conference (Intermag)
CY MAY 11-15, 2015
CL Beijing, PEOPLES R CHINA
SP IEEE, Tsinghua Univ, Inst Phys, Chinese Acad Sci, Beijing Univ, Chinese Phys Soc, Chinese Inst Elect, Chinese Mat Res Soc
DE Bit error rate (BER) decay; pattern dependent; pseudorandom binary
   sequence (PRBS); signal-to-noise ratio (SNR) decay; thermal stability
ID NONLINEAR DISTORTIONS; NOISE; MEDIA
AB Drive-level pattern-dependent bit error rate (BER) and signal-to-noise ratio (SNR) degradation during thermal decay were studied. A 511 bit pseudorandom binary sequence was used to help reveal the fundamental relationship between degradation trends of SNR and BER. Degradation profiles of both SNR and BER within specific patterns were plotted and analyzed. In the short-term thermal decay, SNR mostly decayed at the nontransition part, while BER mostly decayed at the transition part. It was found that transition BER degradation was caused by the degradation of nontransition SNR, while nontransition bits hardly have any error until nontransition SNR degradation reached certain levels. It was difficult to observe nontransition BER degradation in thermal stability experiments, which were normally limited by time. Simulation is necessary to assist the prediction of thermal decay performance.
C1 [Wang, Hao; Tang, Yaw-Shing; Park, Jihoon; Xu, Lei; Song, Mark] HGST, San Jose, CA 95138 USA.
RP Wang, H (reprint author), HGST, San Jose, CA 95138 USA.
EM hao.wang@hgst.com
CR Arnoldussen TC, 2000, IEEE T MAGN, V36, P92, DOI 10.1109/20.824431
   Charap SH, 1997, IEEE T MAGN, V33, P978, DOI 10.1109/20.560142
   Evans RFL, 2012, APPL PHYS LETT, V100, DOI 10.1063/1.3691196
   Shi ZP, 2009, J APPL PHYS, V105, DOI 10.1063/1.3073658
   Taratorin A, 2000, IEEE T MAGN, V36, P80, DOI 10.1109/20.824429
   Weller D, 1999, IEEE T MAGN, V35, P4423, DOI 10.1109/20.809134
   Zhu WZ, 2004, IEEE T MAGN, V40, P2610, DOI 10.1109/TMAG.2004.829311
NR 7
TC 0
Z9 0
U1 1
U2 1
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD NOV
PY 2015
VL 51
IS 11
AR 3001104
DI 10.1109/TMAG.2015.2434401
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA CW1SB
UT WOS:000364770500241
ER

PT J
AU Nguyen, PM
   Armand, MA
AF Nguyen, Phan-Minh
   Armand, Marc A.
TI On Capacity Formulation With Stationary Inputs and Application to a
   Bit-Patterned Media Recording Channel Model
SO IEEE TRANSACTIONS ON INFORMATION THEORY
LA English
DT Article
DE Channel capacity; stationary inputs; stationary and ergodic channel;
   bit-symmetry; bit-patterned media recording; lower/upper bounds; series
   expansion
ID ASYMPTOTICALLY MEAN STATIONARY; MARKOV CHANNELS; ERRORS
AB In this correspondence, we illustrate among other things the use of the stationarity property of the set of capacity-achieving inputs in capacity calculations. In particular, as a case study, we consider a bit-patterned media recording channel model and formulate new lower and upper bounds on its capacity that yield improvements over existing results. Inspired by the observation that the new bounds are tight at low noise levels, we also characterize the capacity of this model as a series expansion in the low-noise regime. The key to these results is the realization of stationarity in the supremizing input set in the capacity formula. While the property is prevalent in capacity formulations in the ergodic-theoretic literature, we show that this realization is possible in the Shannon-theoretic framework where a channel is defined as a sequence of finite-dimensional conditional probabilities, by defining a new class of consistent stationary and ergodic channels.
C1 [Nguyen, Phan-Minh; Armand, Marc A.] Natl Univ Singapore, Dept Elect & Comp Engn, Singapore 117576, Singapore.
RP Nguyen, PM (reprint author), Stanford Univ, Dept Elect Engn, Stanford, CA 94305 USA.
EM npminh@stanford.edu; eleama@nus.edu.sg
FU Singapore National Research Foundation within the Prime Minister's
   Office [NRF-CRP 4-2008-06]
FX Manuscript received June 29, 2014; revised February 19, 2015; accepted
   September 1, 2015. Date of publication October 1, 2015; date of current
   version October 16, 2015. This work was supported by the Singapore
   National Research Foundation within the Prime Minister's Office under
   Award NRF-CRP 4-2008-06.
CR Adler R. L., 1961, P AM MATH SOC, V12, P924, DOI 10.2307/2034392
   Arnold DM, 2006, IEEE T INFORM THEORY, V52, P3498, DOI 10.1109/TIT.2006.878110
   Boyd S, 2004, CONVEX OPTIMIZATION
   Cover TM, 2006, ELEMENTS INFORM THEO
   Dobrushin R. L., 1967, PROBL PEREDACHI INF, V3, P18
   Dobrushin R. L., 1963, AM MATH SOC T, V33, P323
   El Gamal A., 2012, NETWORK INFORM THEOR
   Feinstein A., 1959, Information and Control, V2, P25, DOI 10.1016/S0019-9958(59)90066-X
   FONTANA RJ, 1981, IEEE T INFORM THEORY, V27, P308, DOI 10.1109/TIT.1981.1056348
   Gallager R., 1968, INFORM THEORY RELIAB
   GRAY RM, 1979, IEEE T INFORM THEORY, V25, P292, DOI 10.1109/TIT.1979.1056045
   GRAY RM, 1987, IEEE T INFORM THEORY, V33, P656, DOI 10.1109/TIT.1987.1057355
   Gray R. M., 1990, ENTROPY INFORM THEOR
   Gray RM, 2009, PROBABILITY, RANDOM PROCESSES, AND ERGODIC PROPERTIES, SECOND EDITION, pXXI
   Iyengar AR, 2011, IEEE T MAGN, V47, P35, DOI 10.1109/TMAG.2010.2080667
   Kanoria Y, 2013, IEEE T INFORM THEORY, V59, P6192, DOI 10.1109/TIT.2013.2262020
   Kanoria Y, 2010, IEEE INT SYMP INFO, P1002, DOI 10.1109/ISIT.2010.5513745
   Keele R. C., 2012, THESIS U OKLAHOMA NO
   KIEFFER JC, 1981, SIAM J MATH ANAL, V12, P293, DOI 10.1137/0512027
   Mazumdar A, 2011, IEEE T INFORM THEORY, V57, P7403, DOI 10.1109/TIT.2011.2158514
   Parthasarathy K. R., 1961, ILLINOIS J MATH, V5, P299
   Polyanskiy Y, 2010, IEEE T INFORM THEORY, V56, P2307, DOI 10.1109/TIT.2010.2043769
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Shiroishi Y, 2009, IEEE T MAGN, V45, P3816, DOI 10.1109/TMAG.2009.2024879
   SUJAN S, 1981, KYBERNETIKA, V17, P222
   Tan Vincent Y. F., 2014, Foundations and Trends in Communications and Information Theory, V11, P1, DOI 10.1561/0100000086
   VERDU S, 1994, IEEE T INFORM THEORY, V40, P1147, DOI 10.1109/18.335960
   Wu T, 2013, IEEE T MAGN, V49, P489, DOI 10.1109/TMAG.2012.2208120
   Zhang SH, 2011, IEEE T MAGN, V47, P2555, DOI 10.1109/TMAG.2011.2155628
NR 29
TC 0
Z9 0
U1 0
U2 0
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9448
EI 1557-9654
J9 IEEE T INFORM THEORY
JI IEEE Trans. Inf. Theory
PD NOV
PY 2015
VL 61
IS 11
BP 5906
EP 5930
DI 10.1109/TIT.2015.2481878
PG 25
WC Computer Science, Information Systems; Engineering, Electrical &
   Electronic
SC Computer Science; Engineering
GA CU1CI
UT WOS:000363256500015
ER

PT J
AU Li, YP
   Brennan, PC
   Lee, W
   Nickson, C
   Pietrzyk, MW
   Ryan, EA
AF Li, Yanpeng
   Brennan, Patrick C.
   Lee, Warwick
   Nickson, Carolyn
   Pietrzyk, Mariusz W.
   Ryan, Elaine A.
TI An Investigation into the Consistency in Mammographic Density
   Identification by Radiologists: Effect of Radiologist Expertise and
   Mammographic Appearance
SO JOURNAL OF DIGITAL IMAGING
LA English
DT Article
DE Mammographic density (MD); Observer variation; Density segmentation;
   Mammography
ID BREAST-CANCER RISK; BI-RADS CATEGORIES; VARIABILITY; SOFTWARE; PATTERNS;
   MARKERS
AB The aim of this work is to investigate how radiologist expertise and image appearance may have an impact on inter-reader variability of mammographic density (MD) identification. Seventeen radiologists, divided into three expertise groups, were asked to manually segment the areas they consider to be MD in 40 clinical images. The variation in identification of MD for each image was quantified by finding the range of segmentation areas. The impact of radiologist expertise and image appearance on this variation was explored. The range of areas chosen by participating radiologists varied from 7 to 73 % across the 40 images, with a mean range of 35+/-13 %. Participants with high expertise were more likely to choose similar areas to one another, compared to participants with medium and low expertise levels (mean range were 19+/-10 %, 29+/-13 % and 25+/-14 %, respectively, p<0.0001). There was a significantly higher average grey level for the area segmented by all radiologists as MD compared to the area of variation, with mean grey level value for 8-bit images being 146+/-19 vs. 99+/-14, respectively. MD segmentation borders were consistent in areas where there was a sharp intensity change within a short distance. In conclusion, radiologists with high expertise tend to have a higher agreement when identifying MD. Tissues which have a lower contrast and a less visually sharp gradient change at the interface between high density tissue and adipose background lead to inter-reader variation in choosing mammographic density.
C1 [Li, Yanpeng; Brennan, Patrick C.; Ryan, Elaine A.] Univ Sydney, Fac Hlth Sci, Lidcombe, NSW 2141, Australia.
   [Lee, Warwick] Canc Inst NSW, Eveleigh, NSW 2015, Australia.
   [Nickson, Carolyn] Univ Melbourne, Melbourne Sch Populat & Global Hlth, Parkville, Vic 3010, Australia.
   [Pietrzyk, Mariusz W.] Inst Phys, London W1B 1NT, England.
RP Li, YP (reprint author), Univ Sydney, Fac Hlth Sci, Cumberland Campus C42,M219,East St, Lidcombe, NSW 2141, Australia.
EM yali3465@uni.sydney.edu.au
RI Ryan, Elaine/C-2370-2009
CR AL Mousa DS, 2014, CLIN RADIOL, V69, P333, DOI 10.1016/j.crad.2013.11.014
   Berg WA, 2000, AM J ROENTGENOL, V174, P1769
   Boyd N, 2009, CANCER EPIDEM BIOMAR, V18, P1754, DOI 10.1158/1055-9965.EPI-09-0107
   Ciatto S, 2005, BREAST, V14, P269, DOI 10.1016/j.breast.2004.12.004
   Ciatto S, 2012, BREAST, V21, P503, DOI 10.1016/j.breast.2012.01.005
   Heine JJ, 2012, J NATL CANCER I, V104, P1028, DOI 10.1093/jnci/djs254
   Ho JM, 2014, AM J ROENTGENOL, V203, P449, DOI 10.2214/AJR.13.11969
   Huo CW, 2014, BREAST CANCER RES TR, V144, P479, DOI 10.1007/s10549-014-2901-2
   Jeffreys M, 2008, BRIT J CANCER, V98, P210, DOI 10.1038/sj.bjc.6604122
   Lee HN, 2015, ACTA RADIOL, V56, P1061, DOI 10.1177/0284185114554674
   Martin KE, 2006, RADIOLOGY, V240, P656, DOI 10.1148/radiol.2402041947
   McCormack VA, 2006, CANCER EPIDEM BIOMAR, V15, P1159, DOI 10.1158/1055-9965-EPI-06-0034
   Nicholson BT, 2006, ACAD RADIOL, V13, P1143, DOI 10.1016/j.acra.2006.06.005
   Ooms EA, 2007, BREAST, V16, P568, DOI 10.1016/j.breast.2007.04.007
   Rawashdeh MA, 2013, RADIOLOGY, V269, P61, DOI 10.1148/radiol.13122581
   Redondo A, 2012, BRIT J RADIOL, V85, P1465, DOI 10.1259/bjr/21256379
   Reed WM, 2010, ACAD RADIOL, V17, P1409, DOI 10.1016/j.acra.2010.06.016
   Salvatore M, 2014, RADIOLOGY, V270, P67, DOI 10.1148/radiol.13130733
   Scheel JR, 2014, AM J OBSTET GYNECOL, V212, P9
   Sickles EA, 2013, ACR BI RADS ATLAS BR
   Tagliafico A, 2009, BREAST, V18, P35, DOI 10.1016/j.breast.2008.09.005
   WOLFE JN, 1976, AM J ROENTGENOL, V126, P1130
   Yaffe MJ, 2008, BREAST CANCER RES, V10, DOI 10.1186/bcr2102
NR 23
TC 1
Z9 1
U1 0
U2 4
PU SPRINGER
PI NEW YORK
PA 233 SPRING ST, NEW YORK, NY 10013 USA
SN 0897-1889
EI 1618-727X
J9 J DIGIT IMAGING
JI J. Digit. Imaging
PD OCT
PY 2015
VL 28
IS 5
BP 626
EP 632
DI 10.1007/s10278-015-9814-4
PG 7
WC Radiology, Nuclear Medicine & Medical Imaging
SC Radiology, Nuclear Medicine & Medical Imaging
GA CV8HB
UT WOS:000364522100013
PM 26259522
ER

PT J
AU Homma, T
AF Homma, Takayuki
TI Electrochemical Processes for the Fabrication of Functional Micro-nano
   Structures and Devices: Mechanistic Understanding and Process
   Development
SO ELECTROCHEMISTRY
LA English
DT Article
DE Electrodeposition; Electroless Deposition; Micro-nano Fabrication
   Process; Ab Initio Calculation
ID ELECTROLESS DEPOSITION PROCESS; LATERALLY-ENHANCED GROWTH; BIT-PATTERNED
   MEDIA; SI WAFER SURFACES; HYPOPHOSPHITE IONS; METAL-SURFACES;
   ELECTRODEPOSITION PROCESS; AU ELECTRODEPOSITION; DIMETHYLAMINE BORANE;
   THEORETICAL-ANALYSIS
AB Electrochemical approaches for the fabrication of functional micro-nano structures and devices were comprehensively described primarily on the basis of the results obtained from previous studies conducted by the author's group with the aim of demonstrating the potential for achieving further precise controllability. First, a theoretical study was conducted for investigating the processes, mainly focusing upon electroless deposition to present an approach for analyzing its reaction mechanism from the molecular level. These approaches could be powerful tools for elucidating the overall process and could contribute toward achieving the precise design of processes. Second, some experimental approaches for achieving the precise control of micro-nano fabrication of functional structures, such as maskless and electroless fabrication of metal nano-patterns, lateral enhanced electrodeposition to form ultrathin layers, as well as the nanostructures for various devices by through-mask electrochemical deposition, were introduced to demonstrate high capability of the processes for nanoscale fabrication in various applications. (C) The Electrochemical Society of Japan, All rights reserved.
C1 Waseda Univ, Dept Appl Chem, Shinjuku Ku, Tokyo 1698555, Japan.
RP Homma, T (reprint author), Waseda Univ, Dept Appl Chem, Shinjuku Ku, Tokyo 1698555, Japan.
EM t.homma@waseda.jp
FU MEXT; JST; JSPS; SRC
FX The results described herein were obtained by collaboration and
   discussions with a number of collaborators, and the author would like to
   sincerely thank Prof. T. Osaka, Prof. Y Yamazaki, Prof. S. Shoji, Prof.
   H. Nakai, Prof. C. E. D. Chidsey, Prof. M. Chemla, Prof. Y. Fukunaka,
   Prof. M. Yanagisawa, Prof. M. Saito, Prof. H. Sato, Dr. N. Kubo, Dr. T.
   Shimada, Dr. K. Sakata, Dr. T. Ouchi, Dr. M. Kunimoto, Dr. C. Kobayashi,
   Dr. B. Jiang, Dr. C. P. Lin, and many colleagues for their cooperation,
   continuous encouragement as well as help with experiments. The financial
   support from MEXT, JST, JSPS, and SRC, as well as several organizations,
   is also greatly acknowledged.
CR Abrantes LM, 1997, J CHEM SOC FARADAY T, V93, P1119, DOI 10.1039/a606732h
   Andricacos PC, 1998, IBM J RES DEV, V42, P567
   Chemla M, 2003, J ELECTROANAL CHEM, V559, P111, DOI 10.1016/S0022-0728(02)01280-9
   Chik H, 2004, MAT SCI ENG R, V43, P103, DOI 10.1016/j.mser.2003.12.001
   Choeng W. J., 2004, APPL SURF SCI, V229, P282
   DECKERT CA, 1995, PLAT SURF FINISH, V82, P58
   Homma T, 2005, J PHYS CHEM B, V109, P5724, DOI 10.1021/jp045822n
   Homma Takayuki, 2015, ECS Transactions, V64, P1, DOI 10.1149/06431.0001ecst
   Homma T, 2003, J ELECTROANAL CHEM, V559, P131, DOI 10.1016/S0022-0728(03)00042-1
   Homma T, 2003, J ELECTROANAL CHEM, V559, P143, DOI 10.1016/S0022-0728(02)01282-2
   Homma T, 2003, ELECTROCHIM ACTA, V48, P3115, DOI 10.1016/S0013-4686(03)00339-6
   Homma T, 1999, J PHYS CHEM B, V103, P1774, DOI 10.1021/jp982116b
   Homma T, 1998, J PHYS CHEM B, V102, P7919, DOI 10.1021/jp982109n
   Homma T, 2009, J ELECTROCHEM SOC, V156, pH475, DOI 10.1149/1.3106085
   Jiang B, 2013, J ELECTROCHEM SOC, V160, pD366, DOI 10.1149/2.073309jes
   Jiang B, 2013, ELECTROCHEMISTRY, V81, P674, DOI 10.5796/electrochemistry.81.674
   Jiang B, 2013, ELECTROCHIM ACTA, V100, P317, DOI 10.1016/j.electacta.2012.09.074
   JORGENSEN WL, 1983, J CHEM PHYS, V79, P926, DOI 10.1063/1.445869
   Kervennic YV, 2002, APPL PHYS LETT, V80, P321, DOI 10.1063/1.1433914
   KIVEL J, 1965, J ELECTROCHEM SOC, V112, P1201, DOI 10.1149/1.2423399
   Kobayashi C, 2011, ECS TRANSACTIONS, V33, P1, DOI 10.1149/1.3576071
   Kobayashi C, 2013, ELECTROCHEMISTRY, V81, P236, DOI 10.5796/electrochemistry.81.236
   Kobayashi C, 2012, ELECTROCHIM ACTA, V74, P235, DOI 10.1016/j.electacta.2012.04.071
   Kubo N, 2005, ELECTROCHIM ACTA, V51, P834, DOI 10.1016/j.electacta.2005.04.058
   Kunimoto M, 2013, ELECTROCHIM ACTA, V100, P311, DOI 10.1016/j.electacta.2012.09.070
   Kunimoto M, 2012, ELECTROCHEMISTRY, V80, P222, DOI 10.5796/electrochemistry.80.222
   Kunimoto M, 2012, ELECTROCHEMISTRY, V80, P126, DOI 10.5796/electrochemistry.80.126
   Kunimoto M, 2011, J ELECTROCHEM SOC, V158, pD626, DOI 10.1149/1.3623782
   Kunimoto M, 2011, J ELECTROCHEM SOC, V158, pD585, DOI 10.1149/1.3609000
   LEHMANN V, 1993, J ELECTROCHEM SOC, V140, P2836, DOI 10.1149/1.2220919
   Li J, 2002, J ELECTROCHEM SOC, V149, pC631, DOI 10.1149/1.1517582
   LI J, 1992, MATER SCI REP, V9, P1, DOI 10.1016/0920-2307(92)90011-O
   Liu B, 2005, ELECTROCHIM ACTA, V50, P3041, DOI 10.1016/j.electacta.2004.12.041
   Mallory G. O., 1990, ELECTROLESS PLATING
   MASUDA H, 1995, SCIENCE, V268, P1466, DOI 10.1126/science.268.5216.1466
   Niwa D, 2004, J PHYS CHEM B, V108, P9900, DOI 10.1021/jp037159t
   OHNO I, 1991, MAT SCI ENG A-STRUCT, V146, P33, DOI 10.1016/0921-5093(91)90266-P
   OHNO I, 1985, J ELECTROCHEM SOC, V132, P2323, DOI 10.1149/1.2113572
   Ouchi T, 2008, J MAGN MAGN MATER, V320, P3104, DOI 10.1016/j.jmmm.2008.08.022
   Ouchi T, 2011, ELECTROCHIM ACTA, V56, P9575, DOI 10.1016/j.electacta.2011.04.085
   Ouchi T, 2010, ELECTROCHIM ACTA, V55, P8081, DOI 10.1016/j.electacta.2010.02.073
   Ouchi T, 2010, IEEE T MAGN, V46, P2224, DOI 10.1109/TMAG.2010.2040068
   Richter HJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2209179
   Romankiw LT, 1997, ELECTROCHIM ACTA, V42, P2985, DOI 10.1016/S0013-4686(97)00146-1
   Sakata K, 2005, ELECTROCHIM ACTA, V51, P1000, DOI 10.1016/j.electacta.2005.05.061
   Sakata K, 2012, ELECTROCHEM COMMUN, V25, P144, DOI 10.1016/j.elecom.2012.08.030
   Sato H, 2005, ELECTROCHIM ACTA, V51, P844, DOI 10.1016/j.electacta.2005.04.067
   Sato H, 2005, J ELECTROANAL CHEM, V584, P28, DOI 10.1016/j.jelechem.2004.11.001
   Sato H, 2005, ELECTROCHEMISTRY, V73, P275
   Sato H, 2010, ELECTROCHEM COMMUN, V12, P765, DOI 10.1016/j.elecom.2010.03.028
   Schultze JW, 2005, ELECTROCHIM ACTA, V51, P775, DOI 10.1016/j.electacta.2005.04.073
   Shimada T, 2005, ELECTROCHIM ACTA, V51, P906, DOI 10.1016/j.electacta.2005.04.051
   Uda K, 2015, ELECTROCHIM ACTA, V153, P515, DOI 10.1016/j.electacta.2014.12.019
   VANDENMEERAKKER JEAM, 1981, J APPL ELECTROCHEM, V11, P395
   VANDENMEERAKKER JEAM, 1990, J APPL ELECTROCHEM, V20, P85
   VANDENMEERAKKER JEAM, 1981, J APPL ELECTROCHEM, V11, P387
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
   Wodarz S., 2015, ECS T, V64, P99
   Zeng Y, 2005, J MOL STRUC-THEOCHEM, V724, P81, DOI 10.1016/j.theochem.2005.03.014
   Paunovic M., 2006, FUNDAMENTALS ELECTRO, V2nd
NR 60
TC 0
Z9 0
U1 3
U2 15
PU ELECTROCHEMICAL SOC JAPAN
PI TOKYO
PA ARUSUICHIGAYA202, 4-8-30, KUDANMINAMI, CHIYODA-KU, TOKYO, 102-0074,
   JAPAN
SN 1344-3542
J9 ELECTROCHEMISTRY
JI Electrochemistry
PD SEP
PY 2015
VL 83
IS 9
BP 680
EP 687
DI 10.5796/electrochemistry.83.680
PG 8
WC Electrochemistry
SC Electrochemistry
GA CR4YD
UT WOS:000361345100002
ER

PT J
AU Wong, SK
   Sbiaa, R
   Piramanayagam, SN
   Tahmasebi, T
AF Wong, Seng-Kai
   Sbiaa, Rachid
   Piramanayagam, Seidikkurippu N.
   Tahmasebi, Taiebeh
TI Magnetic Properties and Magnetization Reversal of Thin Films and
   Nanodots Consisting of Exchange-Coupled Composite Co/Pd Multi-Layer and
   Co Layer With Orthogonal Anisotropies
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Anomalous Hall effect (AHE); bit-patterned media (BPM); Co/Pd
   multi-layers; exchange interaction; perpendicular and in-plane
   anisotropy
ID PERPENDICULAR-ANISOTROPY; TUNNEL-JUNCTION; MEDIA; MAGNETORESISTANCE;
   SINGLE; PD/CO
AB We report on the fabrication and measurement of the switching characteristics of Co/Pd multi-layer thin films and nanodots. We used the method of anomalous Hall effect to obtain the hysteresis curves of both in-plane and out-of-plane magnetization. While Co/Pd thin film is found to switch by nucleation followed by domain propagation, Co/Pd nanodots switch by quasi-coherent rotation. We found that the coercivity of Co/Pd increases by a power law with respect to decreasing dots size. The coercivity can be reduced by exchange coupling the Co/Pd multi-layer to a 2 nm thick Co layer. Adding a Cu spacer layer between the Co/Pd multi-layer and Co layer provides a reliable way to modulate the strength of exchange coupling and tailoring the coercivity. As the Cu spacer becomes thicker, the coercivity increases. The exchange energy density is estimated to be 14.6 Merg/cm(3) and the exchange constant, 2.92 erg/cm(2). The dependence of saturation field and coercivity on the thickness of the Cu spacer layer is fitted to the same empirical model and the exchange interaction is found to decay exponentially with distance. The exchange-coupled samples switch by quasi-domain propagation for both thin films and nanodots.
C1 [Wong, Seng-Kai; Piramanayagam, Seidikkurippu N.; Tahmasebi, Taiebeh] Data Storage Inst, Agcy Sci Technol & Res, Singapore 117608, Singapore.
   [Sbiaa, Rachid] Sultan Qaboos Univ, Dept Phys, Muscat 123, Oman.
   [Tahmasebi, Taiebeh] Global Foundries, Singapore 738406, Singapore.
RP Wong, SK (reprint author), Data Storage Inst, Agcy Sci Technol & Res, Singapore 117608, Singapore.
EM wong_seng_kai@dsi.a-star.edu.sg
RI Sbiaa, Rachid/I-8038-2013; Piramanayagam, SN/A-4192-2008
OI Piramanayagam, SN/0000-0002-3178-2960
FU Data Storage Institute; Agency for Science, Technology and Research,
   Singapore through Bit Patterned Media Project
FX This work was supported by the Data Storage Institute, Agency for
   Science, Technology and Research, Singapore, through the Bit Patterned
   Media Project.
CR Abes M., 2009, J APPL PHYS, V105
   Alexandrou M, 2010, J APPL PHYS, V108, DOI 10.1063/1.3475485
   Belmeguenai M, 2005, J APPL PHYS, V97, DOI 10.1063/1.1868057
   CARCIA PF, 1985, APPL PHYS LETT, V47, P178, DOI 10.1063/1.96254
   DRAAISMA HJG, 1987, J MAGN MAGN MATER, V66, P351, DOI 10.1016/0304-8853(87)90169-7
   ENGEL BN, 1991, PHYS REV LETT, V67, P1910, DOI 10.1103/PhysRevLett.67.1910
   Gokemeijer NJ, 1997, PHYS REV LETT, V79, P4270, DOI 10.1103/PhysRevLett.79.4270
   Hauet T, 2011, APPL PHYS LETT, V98, DOI 10.1063/1.3581896
   Hellwig O., 2010, APPL PHYS LETT, V96
   Hellwig O., 2009, APPL PHYS LETT, V95
   Hu B, 2011, J APPL PHYS, V109, DOI 10.1063/1.3544306
   Hu G, 2005, J APPL PHYS, V97, DOI 10.1063/1.1849572
   Ikeda S, 2010, NAT MATER, V9, P721, DOI [10.1038/nmat2804, 10.1038/NMAT2804]
   Jiles D. C., 1998, INTRO MAGNETISM MAGN, V2nd, P152
   Johnson MT, 1996, REP PROG PHYS, V59, P1409, DOI 10.1088/0034-4885/59/11/002
   Kikuchi N, 2003, APPL PHYS LETT, V82, P4313, DOI 10.1063/1.1580994
   Krone P, 2010, APPL PHYS LETT, V97, DOI 10.1063/1.3481668
   Lau JW, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2822439
   Lau JW, 2011, PHYS REV B, V84, DOI 10.1103/PhysRevB.84.214427
   Law R, 2009, APPL PHYS LETT, V94, DOI 10.1063/1.3083546
   Law R, 2008, IEEE T MAGN, V44, P2612, DOI 10.1109/TMAG.2008.2002631
   Lee J, 2011, APPL PHYS LETT, V99, DOI 10.1063/1.3623752
   Li WM, 2011, J APPL PHYS, V109, DOI 10.1063/1.3563069
   Mattheis R, 1999, J MAGN MAGN MATER, V198-99, P216, DOI 10.1016/S0304-8853(98)01067-1
   Meng H, 2012, APPL PHYS LETT, V100, DOI 10.1063/1.3695168
   Nguyen TNA, 2011, APPL PHYS LETT, V98, DOI 10.1063/1.3580612
   Park JH, 2008, J APPL PHYS, V103, DOI 10.1063/1.2838754
   PARKIN SSP, 1990, PHYS REV LETT, V64, P2304, DOI 10.1103/PhysRevLett.64.2304
   Pfau B., 2011, APPL PHYS LETT, V99
   Piramanayagam S. N., 2009, J APPL PHYS, V105
   Ranjbar M, 2010, IEEE T MAGN, V46, P1787, DOI 10.1109/TMAG.2010.2043226
   Sbiaa R, 2011, PHYS STATUS SOLIDI-R, V5, P413, DOI 10.1002/pssr.201105420
   SBIAA R, 1995, IEEE T MAGN, V31, P3274, DOI 10.1109/20.490347
   Sbiaa R, 2009, J APPL PHYS, V106, DOI 10.1063/1.3173546
   Sbiaa R, 2009, J APPL PHYS, V105, DOI 10.1063/1.3093699
   Shaw J. M., 2007, J APPL PHYS, V101
   Stiles MD, 1999, J MAGN MAGN MATER, V200, P322, DOI 10.1016/S0304-8853(99)00334-0
   Tannous C, 2008, EUR J PHYS, V29, P475, DOI 10.1088/0143-0807/29/3/008
   Thiyagarajah N, 2012, APPL PHYS LETT, V101, DOI 10.1063/1.4768944
   Thomson T, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.257204
   Wang JP, 2005, IEEE T MAGN, V41, P3181, DOI 10.1109/TMAG.2005.855278
   Wang JP, 2005, APPL PHYS LETT, V86, P42504, DOI 10.1063/1.1896431
   Wong SK, 2010, IEEE T MAGN, V46, P2409, DOI 10.1109/TMAG.2009.2039202
   Wong SK, 2009, J APPL PHYS, V106, DOI 10.1063/1.3240346
   Yakushiji K, 2010, APPL PHYS LETT, V97, DOI 10.1063/1.3524230
   Yang PY, 2010, J APPL PHYS, V107, DOI 10.1063/1.3385314
   Yoo I, 2005, J APPL PHYS, V97, pC919, DOI 10.1063/1.1854282
NR 47
TC 0
Z9 0
U1 1
U2 15
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD SEP
PY 2015
VL 51
IS 9
AR 6100909
DI 10.1109/TMAG.2014.2377011
PG 9
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA CQ2BU
UT WOS:000360405200008
ER

PT J
AU Singh, EM
   Kaur, ES
AF Singh, Er Manavdeep
   Kaur, Er Sukhpreet
TI Novel Approach to reduce BER in Cognitive Radio
SO INTERNATIONAL JOURNAL OF COMPUTER SCIENCE AND NETWORK SECURITY
LA English
DT Article
DE BER; Cognitive Radio; FHSS; DSSS
ID PATTERNED MEDIA
AB In this research paper a technique is introduced to improve Bit Error Rate in cognitive radio. In this paper the FHSS of 32-bit and DSSS of 16-bit is implemented in the network. After implementation of proposed technique results are produced which shown that the proposed approach is far better than that of existing work to reduce BER in a network. Network consists of both wired and wireless topologies.
C1 [Singh, Er Manavdeep; Kaur, Er Sukhpreet] Shri Guru Granth Sahib World Univ, Fatehgarh Sahib, Punjab, India.
RP Singh, EM (reprint author), Shri Guru Granth Sahib World Univ, Fatehgarh Sahib, Punjab, India.
CR Fidler J, 2006, PHYSICA B, V372, P312, DOI 10.1016/j.physb.2005.10.074
   Gnauck AH, 2005, J LIGHTWAVE TECHNOL, V23, P115, DOI 10.1109/JLT.2004.840357
   Hoeher P., 2000, P 2 INT S TURB COD R, P43
   Land I., 2000, P IEEE INT S INF THE, P415
   Livshitz B, 2009, J APPL PHYS, V105, DOI 10.1063/1.3072442
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Schabes M. E., 2000, J MAGNETISM MAGNETIC, V320, P2880
   Sinkin OV, 2003, J LIGHTWAVE TECHNOL, V21, P61, DOI 10.1109/JLT.2003.808628
   van den Borne D., 2006, P OFC 06 AN CA 5 10
   Yu Tang, 2011, IEEE T, P1239
NR 10
TC 0
Z9 0
U1 0
U2 1
PU INT JOURNAL COMPUTER SCIENCE & NETWORK SECURITY-IJCSNS
PI SEOUL
PA DAE-SANG OFFICE 301, SANGDO 5 DONG 509-1, SEOUL, 00000, SOUTH KOREA
SN 1738-7906
J9 INT J COMPUT SCI NET
JI Int. J. Comput. Sci. Netw. Secur.
PD AUG 30
PY 2015
VL 15
IS 8
BP 84
EP 87
PG 4
WC Computer Science, Information Systems
SC Computer Science
GA CX2MT
UT WOS:000365531800016
ER

PT J
AU Li, Z
   Zhang, W
   Krishnan, KM
AF Li, Zheng
   Zhang, Wei
   Krishnan, Kannan M.
TI Large-area patterning of sub-100 nm epitaxial L1(0) FePt dots array via
   nanoimprint lithography
SO AIP ADVANCES
LA English
DT Article
ID THIN-FILMS; MEDIA; MAGNETIZATION; TEMPERATURE; FABRICATION; FEPT(001);
   MAGNETS; FIELD
AB Bit-patterned media, a promising candidate for next generation high density magnetic recording, requires sub-100 nm dots array on a wafer scale, a high degree of patterning control of the size distribution, and a material with high perpendicular anisotropy. In this work, large area (0.75 cm x 0.75 cm) dots array was achieved by nanoimprint lithography and ion milling from L1(0) FePt thin films that are pre-sputtered at 450 degrees C with both high crystalline quality and good chemical order. The sub-100 nm dots are decoupled from each other and show both narrow size distributions and high coercivity values on the order of 11 kOe. Our work would cast light for the application of bit-patterned media. (C) 2015 Author(s).
C1 [Li, Zheng; Zhang, Wei; Krishnan, Kannan M.] Univ Washington, Dept Mat Sci & Engn, Seattle, WA 98195 USA.
RP Krishnan, KM (reprint author), Univ Washington, Dept Mat Sci & Engn, Seattle, WA 98195 USA.
EM kannanmk@uw.edu
FU NSF-DMR [1063489]; China Scholarship Council (CSC)
FX This work was supported by NSF-DMR under Grant No. 1063489. Part of this
   work was conducted at the University of Washington-Washington
   Nanofabrication Facility (UW WNF), a national user facility that is part
   of the National Nanotechnology Infrastructure Network (NNIN). Z.L. would
   like to acknowledge China Scholarship Council (CSC) for partial
   financial support.
CR Breitling A, 2009, PHYS STATUS SOLIDI-R, V3, P130, DOI 10.1002/pssr.200903074
   Bublat T, 2011, J APPL PHYS, V110, DOI 10.1063/1.3646550
   Bublat T, 2011, NANOTECHNOLOGY, V22, DOI 10.1088/0957-4484/22/31/315301
   Chen JS, 2006, J MAGN MAGN MATER, V303, P309, DOI 10.1016/j.jmmm.2006.01.106
   Chou SY, 1996, J VAC SCI TECHNOL B, V14, P4129, DOI 10.1116/1.588605
   Dittrich R, 2005, J APPL PHYS, V97, DOI 10.1063/1.1851931
   Dong Q., 2012, ADV MATER, V24, P1033
   ECKERT D, 1990, J MAGN MAGN MATER, V83, P197, DOI 10.1016/0304-8853(90)90483-7
   Guo LJ, 2007, ADV MATER, V19, P495, DOI 10.1002/adma.200600882
   Jamet JP, 1998, PHYS REV B, V57, P14320, DOI 10.1103/PhysRevB.57.14320
   KLEMMER T, 1995, SCRIPTA METALL MATER, V33, P1793, DOI 10.1016/0956-716X(95)00413-P
   KNELLER EF, 1991, IEEE T MAGN, V27, P3588, DOI 10.1109/20.102931
   Kryder MH, 2008, P IEEE, V96, P1810, DOI 10.1109/JPROC.2008.2004315
   Kwon BS, 2015, ADV MATER INTERFACES, V2, DOI 10.1002/admi.201400511
   Kwon BS, 2014, J APPL PHYS, V115, DOI 10.1063/1.4862519
   Lau JW, 2011, PHYS REV B, V84, DOI 10.1103/PhysRevB.84.214427
   Li GQ, 2003, J APPL PHYS, V94, P5672, DOI 10.1063/1.1618937
   Li Z, 2014, J APPL PHYS, V115, DOI 10.1063/1.4859996
   Li Z, 2013, J APPL PHYS, V113, DOI 10.1063/1.4794137
   Maeda T, 2005, IEEE T MAGN, V41, P3331, DOI 10.1109/TMAG.2005.855203
   MAURI D, 1987, J APPL PHYS, V62, P3047, DOI 10.1063/1.339367
   McCallum AT, 2011, APPL PHYS LETT, V98, DOI 10.1063/1.3599573
   Pan L, 2009, NAT PHOTONICS, V3, P186, DOI 10.1038/nphoton.2009.40
   Perumal A, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2830708
   Platt CL, 2002, J APPL PHYS, V92, P6104, DOI 10.1063/1.1516870
   Richter HJ, 2007, J PHYS D APPL PHYS, V40, pR149, DOI 10.1088/0022-3727/40/9/R01
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Seki T, 2004, IEEE T MAGN, V40, P2522, DOI 10.1109/TMAG.2004.832108
   Seki T, 2003, APPL PHYS LETT, V82, P2461, DOI 10.1063/1.1567053
   Shaw JM, 2010, PHYS REV B, V82, DOI 10.1103/PhysRevB.82.144437
   Srinivasan K., 2011, DEV DATA STORAGE MAT
   Terris BD, 2009, J MAGN MAGN MATER, V321, P512, DOI 10.1016/j.jmmm.2008.05.046
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Thomson T, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.257204
   Vaictora R. H., 2005, IEEE T MAGN, V41, P2828
   Victora RH, 2005, IEEE T MAGN, V41, P537, DOI 10.1109/TMAG.2004.838075
   Weller D, 1999, IEEE T MAGN, V35, P4423, DOI 10.1109/20.809134
   Wood R, 2000, IEEE T MAGN, V36, P36, DOI 10.1109/20.824422
   Zhang W, 2011, J MICROMECH MICROENG, V21, DOI 10.1088/0960-1317/21/4/045024
   Zhang W, 2014, J MICROMECH MICROENG, V24, DOI 10.1088/0960-1317/24/9/093001
   Zhang W, 2010, J APPL PHYS, V107, DOI 10.1063/1.3367959
NR 41
TC 5
Z9 5
U1 2
U2 12
PU AMER INST PHYSICS
PI MELVILLE
PA 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
SN 2158-3226
J9 AIP ADV
JI AIP Adv.
PD AUG
PY 2015
VL 5
IS 8
AR 087165
DI 10.1063/1.4929578
PG 8
WC Nanoscience & Nanotechnology; Materials Science, Multidisciplinary;
   Physics, Applied
SC Science & Technology - Other Topics; Materials Science; Physics
GA CQ5OW
UT WOS:000360655900074
ER

PT J
AU Santagati, GE
   Melodia, T
   Galluccio, L
   Palazzo, S
AF Santagati, G. Enrico
   Melodia, Tommaso
   Galluccio, Laura
   Palazzo, Sergio
TI Medium Access Control and Rate Adaptation for Ultrasonic Intrabody
   Sensor Networks
SO IEEE-ACM TRANSACTIONS ON NETWORKING
LA English
DT Article
DE Acoustic communications; body area networks; medium access control;
   sensor networks; ultrasonic networking
ID RADIO; MHZ; UWB
AB The use of wirelessly internetworked miniaturized biomedical devices is promising a significant leap forward in medical treatment of many pervasive diseases. Recognizing the limitations of traditional radio-frequency wireless communications in interconnecting devices within the human body, in this paper, we propose for the first time to develop network protocols for implantable devices based on ultrasonic transmissions. We start off by assessing the theoretical feasibility of using ultrasonic waves in human tissues and by deriving an accurate channel model for ultrasonic intrabody communications. Then, we propose a new ultrasonic transmission and multiple access technique, which we refer to as Ultrasonic WideBand (UsWB). UsWB is based on the idea of transmitting information bits spread over very short pulses following a time-hopping pattern. The short impulse duration results in limited reflection and scattering effects, and the low duty cycle reduces the impact of thermal and mechanical effects, which may be detrimental for human health. We then develop a multiple access technique with distributed control to enable efficient simultaneous access by mutually interfering devices based on minimal and localized information exchange and on measurements at the receiver only. Finally, we demonstrate the performance of UsWB through a multiscale simulator that models the proposed communication system at the acoustic wave level, at the physical (bit) level, and at the network (packet) level. We also validate the simulation results by comparing them to experimental results obtained with a software-defined testbed.
C1 [Santagati, G. Enrico; Melodia, Tommaso] SUNY Buffalo, Dept Elect Engn, Buffalo, NY 14260 USA.
   [Galluccio, Laura; Palazzo, Sergio] Univ Catania, Dipartimento Ingn Elettr Elettron & Informat, I-95127 Catania, Italy.
RP Santagati, GE (reprint author), SUNY Buffalo, Dept Elect Engn, Buffalo, NY 14260 USA.
EM santagat@buffalo.edu; tmelodia@buffalo.edu;
   laura.galluccio@dieei.unict.it; sergio.palazzo@dieei.unict.it
OI Galluccio, Laura/0000-0001-6644-0787
FU US National Science Foundation [CNS-1253309]
FX Manuscript received May 22, 2013; revised November 23, 2013 and February
   05, 2014; accepted April 03, 2014; approved by IEEE/ACM TRANSACTIONS ON
   NETWORKING Editor Y. Liu. Date of publication April 29, 2014; date of
   current version August 14, 2015. This work is based on material
   supported in part by the US National Science Foundation under Grant
   CNS-1253309. A preliminary shorter version of this paper appeared in the
   Proceedings of the IEEE International Conference on Sensor, Mesh and Ad
   Hoc Communications and Networks (SECON), New Orleans, LA, USA, June
   24-27, 2013.
CR Baccarelli E, 2005, IEEE T COMMUN, V53, P1283, DOI 10.1109/TCOMM.2005.852818
   Blackstock D.T., 2000, FUNDAMENTALS PHYS AC
   Boyd S, 2007, OPTIM ENG, V8, P67, DOI 10.1007/s11081-007-9001-7
   Chavez-Santiago R., 2012, J ELECT COMPUT ENG, V2012
   CHEUNG AY, 1984, CANCER RES, V44, P4736
   [Anonymous], TISS SIM PHANT TECHN
   Cox BT, 2007, J ACOUST SOC AM, V121, P3453, DOI 10.1121/1.2717409
   Cuomo F, 2002, IEEE J SEL AREA COMM, V20, P1722, DOI 10.1109/JSAC.2002.805309
   Davilis Y, 2010, IEEE T INF TECHNOL B, V14, P650, DOI 10.1109/TITB.2009.2039755
   Ettus, USRP UN SOFTW RAD PE
   Gallo JA, 2004, J ORTHOP SPORT PHYS, V34, P395
   Galluccio L., 2012, P 9 ANN C WIR ON DEM, P182
   Gupta S. K., 2013, BODY AREA NETWORKS S
   Hill C. R., 1978, ULTRASONIC ATTENUATI
   Hogg T., 2012, NANO COMMUNICATION N, V3, P83, DOI DOI 10.1016/J.NANCOM.2012.02.002
   IEEE Piscataway NJ USA, 1999, IEEE STAND SAF LEV R
   Johansson J, 2006, ULTRASONICS, V44, P1, DOI 10.1016/j.ultras.2005.06.004
   Jordan T., 2002, CHARACTERIZATION PIE
   Karapistoli E., 2012, P ICUMT ST PET RUSS, P834
   Lacaze E, 2001, ULTRASON, P1139, DOI 10.1109/ULTSYM.2001.991919
   Lee M. M., 2006, P SOC PHOTO-OPT INS, V6082
   Lockwood GR, 1996, IEEE ENG MED BIOL, V15, P60, DOI 10.1109/51.544513
   Melodia T, 2013, ADV UNDERWATER ACOUS
   Merz R, 2005, WIREL COMMUN MOB COM, V5, P567, DOI 10.1002/wcm.313
   National Physical Laboratory, TABL PHYS CHEM CONST
   Nesterov Y., 1994, SIAM STUDIES APPL MA, V13
   Oberholzer G, 2011, Proceedings 2011 10th International Conference on Information Processing in Sensor Networks (IPSN 2010), P211
   Olympus, 2006, ULTR TRANSD TECHN NO
   Rappaport T. S., 1999, WIRELESS COMMUNICATI
   REID JM, 1959, P IRE, V47, P1963, DOI 10.1109/JRPROC.1959.287211
   Santagati G. E., 2013, P IEEE C SENS MESH A, P104
   Santagati G. E., 2014, P IEEE INFO IN PRESS
   Shen XM, 2005, IEEE T VEH TECHNOL, V54, P1663, DOI 10.1109/TVT.2005.853888
   Shung K. K., 2006, DIAGNOSTIC ULTRASOUN
   Smith R, 2012, J PHYS CONF SER, V353, DOI 10.1088/1742-6596/353/1/012001
   THURSTON.FL, 1970, IEEE T IND EL CON IN, VIE17, P167, DOI 10.1109/TIECI.1970.230441
   Win MZ, 2000, IEEE T COMMUN, V48, P679, DOI 10.1109/26.843135
   Yamamoto N., 2002, P IEEE ICC, P3535
   Yang LQ, 2004, IEEE SIGNAL PROC MAG, V21, P26
NR 39
TC 10
Z9 10
U1 0
U2 3
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 1063-6692
EI 1558-2566
J9 IEEE ACM T NETWORK
JI IEEE-ACM Trans. Netw.
PD AUG
PY 2015
VL 23
IS 4
BP 1121
EP 1134
DI 10.1109/TNET.2014.2316675
PG 14
WC Computer Science, Hardware & Architecture; Computer Science, Theory &
   Methods; Engineering, Electrical & Electronic; Telecommunications
SC Computer Science; Engineering; Telecommunications
GA CP7KX
UT WOS:000360067600008
ER

PT J
AU Busyatras, W
   Warisarn, C
   Myint, LMM
   Kovintavewat, P
AF Busyatras, Wiparat
   Warisarn, Chanon
   Myint, Lin M. M.
   Kovintavewat, Piya
TI A TMR Mitigation Method Based on Readback Signal in Bit-Patterned Media
   Recording
SO IEICE TRANSACTIONS ON ELECTRONICS
LA English
DT Article; Proceedings Paper
CT International Topical Meeting on Microwave Photonics / 9th Asia-Pacific
   Microwave Photonics Conference (MWP/APMP)
CY OCT 20-23, 2014
CL Sapporo, JAPAN
DE bit-patterned media recording; estimation method; signal-to-noise ratio;
   track mis-registration; two-dimensional equalization
ID TRACK MISREGISTRATION; INTERFERENCE; EQUALIZATION
AB Track mis-registration (TMR) is one of the major problems in high-density magnetic recording systems such as bit-patterned media recording (BPMR). In general, TMR results from the misalignment between the center of the read head and that of the main track, which can deteriorate the system performance. Although TMR can be handled by a servo system, this paper proposes a novel method to alleviate the TMR effect, based on the readback signal. Specifically, the readback signal is directly used to estimate a TMR level and is then further processed by the suitable target and equalizer designed for such a TMR level. Simulation results indicate that the proposed method can sufficiently estimate the TMR level and then helps improve the system performance if compared to the conventional receiver that does not employ a TMR mitigation method, especially when an areal density is high and/or a TMR level is large.
C1 [Busyatras, Wiparat; Warisarn, Chanon] King Mongkuts Inst Technol Ladkrabang, Coll Data Storage Innovat D STAR, Bangkok 10520, Thailand.
   [Myint, Lin M. M.] Shinawatra Univ, Sch Informat Technol, Pathum Thani 12160, Thailand.
   [Kovintavewat, Piya] Nakhon Pathom Rajabhat Univ, Data Storage Technol Res Ctr, Nakhon Pathom 73000, Thailand.
RP Warisarn, C (reprint author), King Mongkuts Inst Technol Ladkrabang, Coll Data Storage Innovat D STAR, Bangkok 10520, Thailand.
EM kwchanon@kmitl.ac.th; piya@npru.ac.th
FU College of Data Storage Innovation (D*STAR); King Mongkut's Institute of
   Technology Ladkrabang Research Fund, KMITL, Thailand
FX This work was supported by College of Data Storage Innovation (D*STAR)
   and King Mongkut's Institute of Technology Ladkrabang Research Fund,
   KMITL, Thailand.
CR Arrayangkool A, 2013, IEICE T ELECTRON, VE96C, P1490, DOI 10.1587/transele.E96.C.1490
   Chang W, 2010, IEEE T MAGN, V46, P3899, DOI 10.1109/TMAG.2010.2056926
   Chang YB, 2002, IEEE T MAGN, V38, P1441, DOI 10.1109/20.996050
   He LN, 1998, IEEE T MAGN, V34, P2348, DOI 10.1109/20.703877
   Karakulak S, 2010, IEEE T MAGN, V46, P3639, DOI 10.1109/TMAG.2010.2049116
   Koonkamkhai S., 2011, P 2011 NSREC RAD EFF, P1, DOI DOI 10.1109/REDW.2010.6062528
   MOON JY, 1995, IEEE T MAGN, V31, P1083, DOI 10.1109/20.364789
   Myint LMM, 2012, IEEE T MAGN, V48, P4590, DOI 10.1109/TMAG.2012.2204963
   Nabavi S., 2008, THESIS CARNEGIE MELL
   Nabavi S, 2007, IEEE T MAGN, V43, P2274, DOI 10.1109/TMAG.2007.893479
NR 10
TC 1
Z9 1
U1 2
U2 5
PU IEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG
PI TOKYO
PA KIKAI-SHINKO-KAIKAN BLDG, 3-5-8, SHIBA-KOEN, MINATO-KU, TOKYO, 105-0011,
   JAPAN
SN 1745-1353
J9 IEICE T ELECTRON
JI IEICE Trans. Electron.
PD AUG
PY 2015
VL E98C
IS 8
BP 892
EP 898
DI 10.1587/transele.E98.C.892
PG 7
WC Engineering, Electrical & Electronic
SC Engineering
GA CO9VH
UT WOS:000359523700020
ER

PT J
AU Wu, T
   Armand, MA
AF Wu, Tong
   Armand, Marc A.
TI Marker Codes on BPMR Write Channel With Data-Dependent Written-in Errors
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Bit-patterned media (BPM); Davey-MacKay (DM) construction; marker code;
   written-in errors
ID BIT-PATTERNED MEDIA; INSERTIONS; DELETIONS
AB The performance of bit-patterned media recording is limited, in part, by written-in errors in the write channel, which has recently been modeled by a channel introducing data-dependent insertion, deletion, and substitution (DIDS) errors. The Davey-MacKay (DM) construction has shown promising error performance on the DIDS channel, where synchronization errors are sparse and burst error lengths before and after each synchronization error are short. In this paper, we consider marker codes with a nonbinary low-density parity-check code as the outer code for the DIDS channel. Our contributions are twofold. First, we propose two computationally efficient inner decoding schemes for the DM and marker code constructions. One is suitable when the burst errors in the DIDS channel are short, and the other when the burst errors are long. Second, our computer simulations show that marker codes can increasingly outperform DM codes as the burst error length increases, and thus provide greater robustness against burst errors on the DIDS channel.
C1 [Wu, Tong; Armand, Marc A.] Natl Univ Singapore, Dept Elect & Comp Engn, Singapore 117576, Singapore.
RP Armand, MA (reprint author), Natl Univ Singapore, Dept Elect & Comp Engn, Singapore 117576, Singapore.
EM eleama@nus.edu.sg
FU Singapore National Research Foundation through its CRP award
   [NRF-CRP4-2008-06]
FX The authors would like to thank the anonymous reviewers for their
   insightful comments and suggestions, which helped to improve the quality
   of this paper. This work was supported by the Singapore National
   Research Foundation through its CRP award, No. NRF-CRP4-2008-06.
CR Davey MC, 2001, IEEE T INFORM THEORY, V47, P687, DOI 10.1109/18.910582
   Declercq D, 2007, IEEE T COMMUN, V55, P633, DOI 10.1109/TCOMM.2007.894088
   Hu XY, 2005, IEEE T INFORM THEORY, V51, P386, DOI 10.1109/TIT.2004.839541
   Iyengar AR, 2011, IEEE T MAGN, V47, P35, DOI 10.1109/TMAG.2010.2080667
   Jiao XP, 2011, 2011 IEEE INTERNATIONAL SYMPOSIUM ON INFORMATION THEORY PROCEEDINGS (ISIT), P742, DOI 10.1109/ISIT.2011.6034232
   Keele R. C., 2012, THESIS U OKLAHOMA NO
   Ng YB, 2010, IEEE T MAGN, V46, P2268, DOI 10.1109/TMAG.2010.2043926
   Nguyen P.-M., 2014, P 25 MAGN REC C TRMC, P129
   Ratzer EA, 2005, ANN TELECOMMUN, V60, P29
   Ratzer E. A., 2000, P 2 INT S TURB COD R, P149
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   SELLERS FF, 1962, IRE T INFORM THEOR, V8, P35, DOI 10.1109/TIT.1962.1057684
   Wang F, 2011, IEEE T COMMUN, V59, P1287, DOI 10.1109/TCOMM.2011.030411.100546
   Wu T., 2014, IEEE T MAGN, V50
   Wu T, 2013, IEEE T MAGN, V49, P489, DOI 10.1109/TMAG.2012.2208120
NR 15
TC 1
Z9 1
U1 0
U2 1
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD AUG
PY 2015
VL 51
IS 8
AR 3101007
DI 10.1109/TMAG.2015.2421278
PG 7
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA CN7KS
UT WOS:000358613900004
ER

PT J
AU Sharov, A
   Roth, RM
AF Sharov, Artyom
   Roth, Ron M.
TI New Bounds and Constructions for Granular Media Coding
SO IEEE TRANSACTIONS ON INFORMATION THEORY
LA English
DT Article
DE Asymmetric error-correcting codes; convex optimization;
   Gilbert-Varshamov bound; grain-correcting codes; grain-detecting codes;
   granular media; linear programming; lower bounds; magnetic recording;
   Markov chain; upper bounds
ID ERROR-CORRECTING CODES; CONSTANT WEIGHT CODES; BIT-PATTERNED MEDIA
AB Improved lower and upper bounds on the size and the rate of grain-correcting codes are presented. The lower bound is Gilbert-Varshamov-like combined with a construction by Gabrys et al., and it improves on the previously best known lower bounds on the asymptotic rate of [tau n]-grain-correcting codes of length n on the interval [0, 0.0668]. One of the two newly presented upper bounds improves on the best known upper bounds on the asymptotic rate of [tau n]-grain-correcting codes of length n on the interval tau is an element of (0, 1/8] and meets the lower bound of 1/2 for tau >= 1/8. Moreover, in a nonasymptotic regime, both upper bounds improve on the previously best known results on the largest size of t-grain-correcting codes of length n, for certain values of n and t. Constructions of 1-grain-correcting codes based on a partitioning technique are presented for lengths up to 18. Finally, a lower bound of 1/2 log(2) n on the minimum redundancy of infinity-grain-detecting codes of length n is presented.
C1 [Sharov, Artyom; Roth, Ron M.] Technion Israel Inst Technol, Dept Comp Sci, IL-32000 Haifa, Israel.
RP Sharov, A (reprint author), Technion Israel Inst Technol, Dept Comp Sci, IL-32000 Haifa, Israel.
EM sharov@cs.technion.ac.il; ronny@cs.technion.ac.il
FU Israel Science Foundation [1092/12]
FX Manuscript received December 29, 2014; accepted June 2, 2015. Date of
   publication June 16, 2015; date of current version July 10, 2015. This
   work was supported by the Israel Science Foundation under Grant 1092/12.
   This paper was presented at the 51st Annual Allerton Conference on
   Communication, Control, and Computing, in 2013, and at the 2014 IEEE
   International Symposium on Information Theory.
CR AlBassam S, 1997, IEEE T INFORM THEORY, V43, P1619, DOI 10.1109/18.623162
   BROUWER AE, 1990, IEEE T INFORM THEORY, V36, P1334, DOI 10.1109/18.59932
   CONSTANTIN SD, 1979, INFORM CONTROL, V40, P20, DOI 10.1016/S0019-9958(79)90329-2
   Cover T. M., 1991, ELEMENTS INFORM THEO
   CSISZAR I, 1987, IEEE T INFORM THEORY, V33, P788, DOI 10.1109/TIT.1987.1057385
   Cullina D, 2014, IEEE INT SYMP INFO, P1266, DOI 10.1109/ISIT.2014.6875036
   DELSARTE P, 1981, IEEE T INFORM THEORY, V27, P125, DOI 10.1109/TIT.1981.1056290
   Fazeli A, 2014, IEEE INT SYMP INFO, P1261, DOI 10.1109/ISIT.2014.6875035
   Fazeli A, 2014, IEEE INT SYMP INFO, P1256, DOI 10.1109/ISIT.2014.6875034
   Ferrari L, 2010, GRAPH COMBINATOR, V26, P51, DOI 10.1007/s00373-010-0895-z
   Gabrys R, 2015, IEEE T INFORM THEORY, V61, P2256, DOI 10.1109/TIT.2015.2409860
   Greaves S, 2010, IEEE T MAGN, V46, P1460, DOI 10.1109/TMAG.2010.2043221
   Iyengar AR, 2011, IEEE T MAGN, V47, P35, DOI 10.1109/TMAG.2010.2080667
   Kashyap N, 2014, IEEE T INFORM THEORY, V60, P4699, DOI 10.1109/TIT.2014.2329008
   KLOVE T, 1981, IEEE T INFORM THEORY, V27, P128, DOI 10.1109/TIT.1981.1056291
   Knuth Donald Ervin, 2011, ART COMPUTER PRO A 1, V4A
   KOLESNIK VD, 1991, IEEE T INFORM THEORY, V37, P778, DOI 10.1109/18.79947
   Kulkarni AA, 2013, IEEE T INFORM THEORY, V59, P5115, DOI 10.1109/TIT.2013.2257917
   Luenberger D. G., 1973, INTRO LINEAR NONLINE
   Macwilliams F., 1977, THEORY ERROR CORRECT
   Marcus B. H., 1998, HDB CODING THEORY
   Mazumdar A, 2011, IEEE T INFORM THEORY, V57, P7403, DOI 10.1109/TIT.2011.2158514
   Parry W., 1982, LONDON MATH SOC LECT, V67
   Rockafellar R., 1970, CONVEX ANAL
   Sharov A, 2014, IEEE T INFORM THEORY, V60, P2010, DOI 10.1109/TIT.2014.2301811
   Sharov A, 2013, ANN ALLERTON CONF, P637, DOI 10.1109/Allerton.2013.6736585
   Sperner E, 1928, MATH Z, V27, P544, DOI 10.1007/BF01171114
   VANPUL CLM, 1989, IEEE T INFORM THEORY, V35, P1324, DOI 10.1109/18.45293
   WEBER JH, 1988, IEEE T INFORM THEORY, V34, P1321, DOI 10.1109/18.21262
   WEBER JH, 1994, IEEE T INFORM THEORY, V40, P2073, DOI 10.1109/18.340484
   Wood R, 2009, IEEE T MAGN, V45, P917, DOI 10.1109/TMAG.2008.2010676
NR 31
TC 0
Z9 0
U1 1
U2 2
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9448
EI 1557-9654
J9 IEEE T INFORM THEORY
JI IEEE Trans. Inf. Theory
PD AUG
PY 2015
VL 61
IS 8
BP 4227
EP 4238
DI 10.1109/TIT.2015.2445758
PG 12
WC Computer Science, Information Systems; Engineering, Electrical &
   Electronic
SC Computer Science; Engineering
GA CM8HI
UT WOS:000357939400006
ER

PT J
AU Wan, L
   Ruiz, R
   Gao, H
   Patel, KC
   Albrecht, TR
AF Wan, Lei
   Ruiz, Ricardo
   Gao, He
   Patel, Kanaiyalal C.
   Albrecht, Thomas R.
TI The Limits of Lamellae-Forming PS-b-PMMA Block Copolymers for
   Lithography
SO ACS NANO
LA English
DT Article
DE block copolymer lithography; pattern transfer; bit-patterned media;
   rotary e-beam lithography; nanoimprint template fabrication; PS-b-PMMA;
   lamellae
ID PATTERNED MEDIA; DENSITY MULTIPLICATION; CHEMICAL-PATTERNS;
   GRAPHOEPITAXY; FABRICATION; POLYMERS; TEMPLATES; SURFACES; BRUSHES;
   DEVICE
AB We explore the lithographic limits of lamellae-forming PS-b-PMMA block copolymers by performing directed self-assembly and pattern transfer on a range of PS-b-PMMA materials having a full pitch from 27 to 18.5 nm. While directed self-assembly on chemical contrast patterns was successful with all the materials used in this study, clean removal of PMMA domains and subsequent pattern transfer could only be sustained down to 22 nm full pitch. We attribute this limitation to the width of the interface, which may represent more than half of the domain width for materials with a critical dimension below 10 nm. With the limit of pattern transfer for PS-b-PMMA set at similar to 11 nm, we propose an integration scheme suitable for bit patterned media for densities above 1.6 Tdot/in(2), which require features below this limit. Directed self-assembly was carried out on chemical contrast patterns made by a rotary e-beam lithography system, and pattern transfer was carried out to demonstrate fabrication of large area (up to 25 mm-wide annular band of circular tracks) nanoimprint templates for bit patterned media. We also demonstrate compatibility with hard disk drive architecture by fabricating patterns with skewed radial lines with constant angular pitch and with servo patterns that are needed in hard disk drives to generate a radial positional error signal (PES).
C1 [Wan, Lei; Ruiz, Ricardo; Gao, He; Patel, Kanaiyalal C.; Albrecht, Thomas R.] HGST, San Jose Res Ctr, San Jose, CA 95135 USA.
RP Wan, L (reprint author), HGST, San Jose Res Ctr, 3403 Yerba Buena Rd, San Jose, CA 95135 USA.
EM lei.wan@hgst.com
OI Ruiz, Ricardo/0000-0002-1698-4281
CR Albrecht TR, 2009, NANOSCALE MAGNETIC MATERIALS AND APPLICATIONS, P237, DOI 10.1007/978-0-387-85600-1_9
   Albrecht T. R., 2015, IEEE T MAGN, V51, P1
   ANASTASIADIS SH, 1989, PHYS REV LETT, V62, P1852, DOI 10.1103/PhysRevLett.62.1852
   BATES FS, 1990, ANNU REV PHYS CHEM, V41, P525, DOI 10.1146/annurev.pc.41.100190.002521
   Bencher C, 2011, PROC SPIE, V7970, DOI 10.1117/12.881293
   Cheng JY, 2008, ADV MATER, V20, P3155, DOI 10.1002/adma.200800826
   Cheng JY, 2002, APPL PHYS LETT, V81, P3657, DOI 10.1063/1.1519356
   Cheng JY, 2004, NAT MATER, V3, P823, DOI 10.1038/nmat1211
   Chevalier X, 2013, J MICRO-NANOLITH MEM, V12, DOI 10.1117/1.JMM.12.3.031102
   Delgadillo PR, 2013, PROC SPIE, V8680, DOI 10.1117/12.2011674
   Hadjichristidis N, 2003, BLOCK COPOLYMERS SYN
   Han E, 2007, ADV MATER, V19, P4448, DOI 10.1002/adma.200602708
   HELFAND E, 1971, J POLYM SCI POL LETT, V9, P741, DOI 10.1002/pol.1971.110091006
   Kim SO, 2003, NATURE, V424, P411, DOI 10.1038/nature01775
   LEIBLER L, 1980, MACROMOLECULES, V13, P1602, DOI 10.1021/ma60078a047
   Lille J, 2012, IEEE T MAGN, V48, P2757, DOI 10.1109/TMAG.2012.2192916
   Liu CC, 2013, MACROMOLECULES, V46, P1415, DOI 10.1021/ma302464n
   Liu CC, 2011, MACROMOLECULES, V44, P1876, DOI 10.1021/ma102856t
   Liu GL, 2011, J VAC SCI TECHNOL B, V29, DOI 10.1116/1.3650697
   Mansky P, 1997, SCIENCE, V275, P1458, DOI 10.1126/science.275.5305.1458
   Naito K, 2002, IEEE T MAGN, V38, P1949, DOI 10.1109/TMAG.2002.802847
   Park SM, 2011, ACS NANO, V5, P8523, DOI 10.1021/nn201391d
   Patel KC, 2012, PROC SPIE, V8323, DOI 10.1117/12.916589
   Rathsack B, 2012, PROC SPIE, V8323, DOI 10.1117/12.916311
   Resnick DJ, 2005, MATER TODAY, V8, P34, DOI 10.1016/S1369-7021(05)00700-5
   Rockford L, 1999, PHYS REV LETT, V82, P2602, DOI 10.1103/PhysRevLett.82.2602
   Ross CA, 2008, MRS BULL, V33, P838, DOI 10.1557/mrs2008.179
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Ruiz R, 2011, ACS NANO, V5, P79, DOI 10.1021/nn101561p
   Ryu DY, 2005, SCIENCE, V308, P236, DOI 10.1126/science.1106604
   Segalman RA, 2001, ADV MATER, V13, P1152, DOI 10.1002/1521-4095(200108)13:15<1152::AID-ADMA1152>3.0.CO;2-5
   Sivaniah E, 2008, MACROMOLECULES, V41, P2584, DOI 10.1021/ma702465t
   Stoykovich MP, 2005, SCIENCE, V308, P1442, DOI 10.1126/science.1111041
   Sunday DF, 2015, J POLYM SCI POL PHYS, V53, P595, DOI 10.1002/polb.23675
   Terris BD, 2007, MICROSYST TECHNOL, V13, P189, DOI 10.1007/s00542-006-0144-9
   Tsai HY, 2015, PROC SPIE, V9423, DOI 10.1117/12.2084845
   Tsai HY, 2014, ACS NANO, V8, P5227, DOI 10.1021/nn501300b
   Tsai H. Y., 2012, J VAC SCI TECHNOL B, V30, P6
   WALTON DG, 1994, MACROMOLECULES, V27, P6225, DOI 10.1021/ma00099a045
   Wan L., 2012, J MICRO-NANOLITH MEM, V11
   Xiao SG, 2005, NANOTECHNOLOGY, V16, pS324, DOI 10.1088/0957-4484/16/7/003
   Xiao SG, 2013, J MICRO-NANOLITH MEM, V12, DOI 10.1117/1.JMM.12.3.031110
   Xiao SG, 2009, ADV MATER, V21, P2516, DOI 10.1002/adma.200802087
   Yamamoto R, 2012, JPN J APPL PHYS, V51, DOI 10.1143/JJAP.51.046503
   Yang X. M., 2013, J NANOMATER, V2013
   Yang XM, 2014, J MICRO-NANOLITH MEM, V13, DOI 10.1117/1.JMM.13.3.031307
   Yang XM, 2009, ACS NANO, V3, P1844, DOI 10.1021/nn900073r
   Richter H., 2007, U. S. Patent, Patent No. [11/430,809, 11430809]
   Rubin K. A., 2005, U. S. Patent, Patent No. [10/042,132, 10042132]
NR 49
TC 26
Z9 26
U1 7
U2 65
PU AMER CHEMICAL SOC
PI WASHINGTON
PA 1155 16TH ST, NW, WASHINGTON, DC 20036 USA
SN 1936-0851
EI 1936-086X
J9 ACS NANO
JI ACS Nano
PD JUL
PY 2015
VL 9
IS 7
BP 7506
EP 7514
DI 10.1021/acsnano.5b02613
PG 9
WC Chemistry, Multidisciplinary; Chemistry, Physical; Nanoscience &
   Nanotechnology; Materials Science, Multidisciplinary
SC Chemistry; Science & Technology - Other Topics; Materials Science
GA CO0EP
UT WOS:000358823200088
PM 26046475
ER

PT J
AU Arellano, N
   Berman, D
   Frommer, J
   Imaino, W
   Jiang, X
   Jubert, PO
   McClelland, G
   Rettner, C
   Topuria, T
AF Arellano, Noel
   Berman, David
   Frommer, Jane
   Imaino, Wayne
   Jiang, Xin
   Jubert, Pierre-Olivier
   McClelland, Gary
   Rettner, Charles
   Topuria, Teya
TI Bit-Patterned Media on Plastic Tape With Feature Density of 100
   Gigadot/in(2)
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Bit-patterned media (BPM); magnetic tape recording; plastic substrate;
   thermal embossing
ID AREAL DENSITY; GB/IN(2)
AB A method of producing a bit-patterned media on a flexible substrate using a low-cost, hot nanoimprinting process is investigated. Using a topographic master with features as small as 40 nm, a flexible plastic substrate is patterned with high fidelity. Magnetic material is sputter-deposited onto the patterned substrate to produce a magnetic tape media with densities as high as 100 Gigadot/in(2). Magnetic recording characteristics of the coated bit-patterned tape is evaluated in an apparatus which slides a recording head on the media with a high-resolution positioning capability.
C1 [Arellano, Noel; Berman, David; Frommer, Jane; Imaino, Wayne; Jiang, Xin; Jubert, Pierre-Olivier; McClelland, Gary; Rettner, Charles; Topuria, Teya] IBM Res Almaden, San Jose, CA 95120 USA.
RP Imaino, W (reprint author), IBM Res Almaden, San Jose, CA 95120 USA.
EM wayne1@us.ibm.com
CR Albrecht M, 2003, IEEE T MAGN, V39, P2323, DOI 10.1109/TMAG.2003.816285
   Albrecht TR, 2013, IEEE T MAGN, V49, P773, DOI 10.1109/TMAG.2012.2227303
   Argumedo AJ, 2008, IBM J RES DEV, V52, P513
   Berman D, 2009, IEEE T MAGN, V45, P3584, DOI 10.1109/TMAG.2009.2021397
   Cherubini G, 2011, IEEE T MAGN, V47, P137, DOI 10.1109/TMAG.2010.2076797
   Dobisz EA, 2012, J VAC SCI TECHNOL B, V30, DOI 10.1116/1.4757955
   Grobis M., 2010, APPL PHYS LETT, V96
   Grobis MK, 2011, IEEE T MAGN, V47, P6, DOI 10.1109/TMAG.2010.2076798
   Hauet T, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3276911
   Hellwig O, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3293301
   Hellwig O, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3271679
   Information Storage Industry Consortium, 2012 2022 INT MAGN T
   Jubert P.-O., 2014, IEEE T MAGN, V50
   Matsunuma S, 2012, J MAGN MAGN MATER, V324, P260, DOI 10.1016/j.jmmm.2010.12.030
   McClelland GM, 2002, APPL PHYS LETT, V81, P1483, DOI 10.1063/1.1501763
   Moritz J, 2002, IEEE T MAGN, V38, P1731, DOI 10.1109/TMAG.2002.1017764
   Richter HJ, 2012, J APPL PHYS, V111, DOI 10.1063/1.3681297
   Tachibana J., 2014, IEEE INT MAGN C MAY
   Thomson T, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.257204
   Foster M. S., 1989, U.S. Patent, Patent No. [4 836 874, 4836874]
NR 20
TC 0
Z9 0
U1 1
U2 6
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUL
PY 2015
VL 51
IS 7
AR 3200705
DI 10.1109/TMAG.2015.2394447
PG 5
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA CM3OO
UT WOS:000357592000010
ER

PT J
AU Liang, DF
   Ge, SY
   Zangari, G
AF Liang, Defu
   Ge, Siyuan
   Zangari, Giovanni
TI Structure, Magnetic Properties, and Phase Transformations in
   Electrodeposited Fe-Rich Fe-Pt Films
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Fe-Pt; magnetic films; magnetic hardening; phase transformation
ID ALKALINE COMPLEXING ELECTROLYTE; BIT PATTERNED MEDIA;
   MARTENSITIC-TRANSFORMATION; GIANT MAGNETOSTRICTION; PERMANENT-MAGNETS;
   THIN-FILMS; FE3PT; ALLOYS
AB Fe rich Fe-Pt films with 56 at.%-75 at.% Fe are electrodeposited from an alkaline solution. A face-centered cubic (111) texture is clearly observed for as-deposited films with <62 at.% Fe, while a body centered cubic (110) orientation is seen for higher Fe fraction. After annealing in forming gas for 1 h at or above 400 degrees C, a transformation to a face centered tetragonal (FCT) L1(0) phase was observed below 62 Fe at.%. With increasing Fe content, the annealed films show a texture change from (200) to (002); films with <72% Fe show coercivity similar to 7 kOe while films with Fe above that value show small coercivity. Of particular interest are the 75 at.% films; these show a FCT structure after annealing at or above 450 degrees C, which differs from the L1(0) structure and is characterized by low anisotropy; in contrast, a relatively high out of plane coercivity (1-3 kOe) is observed in 75 at.% films in the as-deposited or annealed conditions up to 350 degrees C.
C1 [Liang, Defu; Ge, Siyuan; Zangari, Giovanni] Univ Virginia, Dept Mat Sci & Engn, Ctr Environm Sci & Engn, Charlottesville, VA 22904 USA.
RP Liang, DF (reprint author), Univ Virginia, Dept Mat Sci & Engn, Ctr Environm Sci & Engn, Charlottesville, VA 22904 USA.
EM dl3uc@virginia.edu
FU National Science Foundation [NSF DMR 1207351]
FX This work was supported by the National Science Foundation under Award
   NSF DMR 1207351.
CR Berry D. C., 2006, J APPL PHYS, V99
   Cugat O, 2003, IEEE T MAGN, V39, P3607, DOI 10.1109/TMAG.2003.816763
   Fredriksson P, 2001, CALPHAD, V25, P535, DOI 10.1016/S0364-5916(02)00006-8
   Grobis MK, 2011, IEEE T MAGN, V47, P6, DOI 10.1109/TMAG.2010.2076798
   Gutfleisch O, 2005, ADV ENG MATER, V7, P208, DOI 10.1002/adem.200400183
   Hsiao SN, 2008, IEEE T MAGN, V44, P3902, DOI 10.1109/TMAG.2008.2002253
   Kakeshita T, 2000, APPL PHYS LETT, V77, P1502, DOI 10.1063/1.1290694
   Kakeshita T, 2002, MRS BULL, V27, P105, DOI 10.1557/mrs2002.45
   Kikitsu A, 2009, J MAGN MAGN MATER, V321, P526, DOI 10.1016/j.jmmm.2008.05.039
   KNELLER EF, 1991, IEEE T MAGN, V27, P3588, DOI 10.1109/20.102931
   Kryder MH, 2008, P IEEE, V96, P1810, DOI 10.1109/JPROC.2008.2004315
   Liang DF, 2011, ELECTROCHIM ACTA, V56, P10567, DOI 10.1016/j.electacta.2011.01.085
   Liang DF, 2011, J ELECTROCHEM SOC, V158, pD149, DOI 10.1149/1.3530786
   Liang DF, 2010, ELECTROCHIM ACTA, V55, P8100, DOI 10.1016/j.electacta.2010.02.074
   Liang DF, 2010, ACS APPL MATER INTER, V2, P961, DOI 10.1021/am100066x
   McCallum RW, 2014, ANNU REV MATER RES, V44, P451, DOI 10.1146/annurev-matsci-070813-113457
   Okamoto H., 1993, PHASE DIAGRAMS BINAR, V9, P319
   Romankiw LT, 1997, ELECTROCHIM ACTA, V42, P2985, DOI 10.1016/S0013-4686(97)00146-1
   SKOMSKI R, 1993, PHYS REV B, V48, P15812, DOI 10.1103/PhysRevB.48.15812
   Yamamoto H, 2008, IEEE T MAGN, V44, P2868, DOI 10.1109/TMAG.2008.2001993
   Yamamoto M, 2011, J ALLOY COMPD, V509, P8530, DOI 10.1016/j.jallcom.2011.06.035
   Yamamoto T, 2010, MATER TRANS, V51, P896, DOI 10.2320/matertrans.M2009400
   Yan SS, 2001, PHYS REV B, V64
NR 23
TC 0
Z9 0
U1 3
U2 14
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUL
PY 2015
VL 51
IS 7
AR 2100309
DI 10.1109/TMAG.2015.2394326
PG 9
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA CM3OO
UT WOS:000357592000005
ER

PT J
AU Singh, M
   Kaur, S
AF Singh, Manavdeep
   Kaur, Sukhpreet
TI Novel Approach to reduce BER in Cognitive Radio
SO INTERNATIONAL JOURNAL OF COMPUTER SCIENCE AND NETWORK SECURITY
LA English
DT Article
DE BER; Cognitive Radio; FHSS; DSSS
ID PATTERNED MEDIA
AB In this research paper a technique is introduced to improve Bit Error Rate in cognitive radio. In this paper the FHSS of 32-bit and DSSS of 16-bit is implemented in the network. After implementation of proposed technique results are produced which shown that the proposed approach is far better than that of existing work to reduce BER in a network. Network consists of both wired and wireless topologies.
C1 [Singh, Manavdeep; Kaur, Sukhpreet] Shri Guru Granth Sahib World Univ, Sahib, Punjab, India.
RP Singh, M (reprint author), Shri Guru Granth Sahib World Univ, Sahib, Punjab, India.
CR Fidler J, 2006, PHYSICA B, V372, P312, DOI 10.1016/j.physb.2005.10.074
   Gnauck AH, 2005, J LIGHTWAVE TECHNOL, V23, P115, DOI 10.1109/JLT.2004.840357
   Hoeher P., 2000, P 2 INT S TURB COD R, P43
   Land I., 2000, P IEEE INT S INF THE, P415
   Livshitz B, 2009, J APPL PHYS, V105, DOI 10.1063/1.3072442
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Schabes M. E., 2000, J MAGNETISM MAGNETIC, V320, P2880
   Sinkin OV, 2003, J LIGHTWAVE TECHNOL, V21, P61, DOI 10.1109/JLT.2003.808628
   van den Borne D., 2006, P OFC 06 AN CA 5 10
   Yu Tang, 2011, RES MODULATION DEMOD, P1239
NR 10
TC 0
Z9 0
U1 0
U2 0
PU INT JOURNAL COMPUTER SCIENCE & NETWORK SECURITY-IJCSNS
PI SEOUL
PA DAE-SANG OFFICE 301, SANGDO 5 DONG 509-1, SEOUL, 00000, SOUTH KOREA
SN 1738-7906
J9 INT J COMPUT SCI NET
JI Int. J. Comput. Sci. Netw. Secur.
PD JUN 30
PY 2015
VL 15
IS 6
BP 35
EP 38
PG 4
WC Computer Science, Information Systems
SC Computer Science
GA CX2LQ
UT WOS:000365528700007
ER

PT J
AU Cushen, J
   Wan, L
   Blachut, G
   Maher, MJ
   Albrecht, TR
   Ellison, CJ
   Willson, CG
   Ruiz, R
AF Cushen, Julia
   Wan, Lei
   Blachut, Gregory
   Maher, Michael J.
   Albrecht, Thomas R.
   Ellison, Christopher J.
   Willson, C. Grant
   Ruiz, Ricardo
TI Double-Patterned Sidewall Directed Self-Assembly and Pattern Transfer of
   Sub-10 nm PTMSS-b-PMOST
SO ACS APPLIED MATERIALS & INTERFACES
LA English
DT Article
DE block copolymer; directed self-assembly; top coat; silicon-containing;
   sidewall-guiding; chemical contrast patterns; density multiplication
ID COPOLYMER THIN-FILMS; FORMING BLOCK-COPOLYMERS; DIBLOCK COPOLYMERS;
   CHEMICAL-PATTERNS; ORIENTATION; DOMAINS; LITHOGRAPHY; LAMELLAE;
   POLYSTYRENE; FABRICATION
AB The directed self-assembly (DSA) of two sub-20 nm pitch: silicon-containing block copolymers (BCPs) was accomplished using, a double patterned sidewall scheme-in which each lithographic prepatterned feature produced two regions for pattern registration. In doing so, the critical dimension of the lithographic prepatterns was:relaxed by a factor of 2 compared to previously reported schemes for DSA. The key to enabling the double-patterned sidewall scheme is the exploitation of the oxidized sidewalls of cross-linked polystyrene formed, during the pattern transfer of the resist via reactive kin etching. This results in shallow trenches with two guiding interfaces per prepatterned feature. Electron loss spectroscopy was used to study and confirm the guiding mechanism of the double-patterned,sidewalls, and pattern transfer of the BCPs into a silicon substrate was achieved using reactive ion etching. The line edge roughness, width roughness, and placement error are near the target required for bit-patterned media applications, and the technique is also compatible with the needs of the semiconductor industry for high-volume manufacturing.
C1 [Cushen, Julia; Wan, Lei; Albrecht, Thomas R.; Ruiz, Ricardo] HGST, San Jose, CA 95135 USA.
   [Blachut, Gregory; Ellison, Christopher J.; Willson, C. Grant] Univ Texas Austin, McKetta Dept Chem Engn, Austin, TX 78712 USA.
   [Maher, Michael J.; Willson, C. Grant] Univ Texas Austin, Dept Chem, Austin, TX 78712 USA.
RP Cushen, J (reprint author), HGST, 3403 Yerba Buena Rd, San Jose, CA 95135 USA.
EM Julia.Cushen@hgst.com
OI Ruiz, Ricardo/0000-0002-1698-4281
FU Nissan Chemical Company; ASTC; Rashid Engineering Regents Chair;
   National Science Foundation Scalable Nanomanufacturing Program
   [1120823]; Paul D. Meek Endowed Graduate Fellowship in Engineering; IBM
   Ph.D Fellowship; Welch Foundation [F-1709]; National Science Foundation
   [DGE-1110007]
FX The authors from the University of Texas thank Nissan Chemical Company,
   the ASTC, and the Rashid Engineering Regents Chair for financial
   support. The work at UT was also supported in part by the National
   Science Foundation Scalable Nanomanufacturing Program under Grant No.
   1120823 to C.W. G.B. thanks the Paul D. Meek Endowed Graduate Fellowship
   in Engineering for support. M.M. thanks the IBM Ph.D Fellowship for
   support. C. Ellison acknowledges partial financial support from the
   Welch Foundation Grant No. F-1709. Material from UT is based upon work
   supported by the National Science Foundation Graduate Research
   Fellowship under Grant No. DGE-1110007 to M.M. Any opinion, findings,
   and conclusions or recommendations expressed in this material are those
   of the authors and do not necessarily reflect the views of the National
   Science Foundation.
CR Albrecht TR, 2013, IEEE T MAGN, V49, P773, DOI 10.1109/TMAG.2012.2227303
   Albrecht TR, 2009, NANOSCALE MAGNETIC MATERIALS AND APPLICATIONS, P237, DOI 10.1007/978-0-387-85600-1_9
   ANASTASIADIS SH, 1989, PHYS REV LETT, V62, P1852, DOI 10.1103/PhysRevLett.62.1852
   Bates CM, 2014, MACROMOLECULES, V47, P2, DOI 10.1021/ma401762n
   Bates CM, 2012, SCIENCE, V338, P775, DOI 10.1126/science.1226046
   Bates CM, 2011, LANGMUIR, V27, P2000, DOI 10.1021/la1042958
   Bencher C, 2011, PROC SPIE, V7970, DOI 10.1117/12.881293
   Cai C, 2011, IEEE T SEMICONDUCT M, V24, P145, DOI 10.1109/TSM.2011.2121096
   Cheng JY, 2008, ADV MATER, V20, P3155, DOI 10.1002/adma.200800826
   Cheng JY, 2010, ACS NANO, V4, P4815, DOI 10.1021/nn100686v
   Chevalier X, 2013, J MICRO-NANOLITH MEM, V12, DOI 10.1117/1.JMM.12.3.031102
   COULON G, 1989, MACROMOLECULES, V22, P2581, DOI 10.1021/ma00196a006
   Cushen JD, 2012, MACROMOLECULES, V45, P8722, DOI 10.1021/ma301238j
   Cushen JD, 2012, ACS NANO, V6, P3424, DOI 10.1021/nn300459r
   Delgadillo PAR, 2012, J MICRO-NANOLITH MEM, V11, DOI 10.1117/1.JMM.11.3.031302
   Dupont-Gillain CC, 2000, LANGMUIR, V16, P8194, DOI 10.1021/la000326l
   Durand WJ, 2015, J POLYM SCI POL CHEM, V53, P344, DOI 10.1002/pola.27370
   Han E, 2010, ADV MATER, V22, P4325, DOI 10.1002/adma.201001669
   Han E, 2010, LANGMUIR, V26, P1311, DOI 10.1021/la902483m
   Han E, 2008, MACROMOLECULES, V41, P9090, DOI 10.1021/ma8018393
   Han E, 2009, MACROMOLECULES, V42, P4896, DOI 10.1021/ma9002903
   Hong SW, 2012, P NATL ACAD SCI USA, V109, P1402, DOI 10.1073/pnas.1115803109
   Hong S. W., ADV MAT, V24, P4278
   Jung YS, 2007, NANO LETT, V7, P2046, DOI 10.1021/nl070924l
   Kim HC, 2008, NANOTECHNOLOGY, V19, DOI 10.1088/0957-4484/19/23/235301
   Kim J, 2013, J PHOTOPOLYM SCI TEC, V26, P573
   Kim S, 2013, ACS NANO, V7, P9905, DOI 10.1021/nn403616r
   Kim SO, 2003, NATURE, V424, P411, DOI 10.1038/nature01775
   Liu CC, 2013, MACROMOLECULES, V46, P1415, DOI 10.1021/ma302464n
   Liu CC, 2011, MACROMOLECULES, V44, P1876, DOI 10.1021/ma102856t
   Liu CC, 2010, J VAC SCI TECHNOL B, V28, pC6B30, DOI 10.1116/1.3501348
   Maher MJ, 2015, ACS APPL MATER INTER, V7, P3323, DOI 10.1021/am508197k
   Maher MJ, 2014, CHEM MATER, V26, P1471, DOI 10.1021/cm403813q
   Park SM, 2007, ADV MATER, V19, P607, DOI 10.1002/adma.200601421
   Peters RD, 2000, LANGMUIR, V16, P4625, DOI 10.1021/1a991500c
   PICKETT GT, 1993, MACROMOLECULES, V26, P3194, DOI 10.1021/ma00064a033
   Ruiz R, 2007, ADV MATER, V19, P2157, DOI 10.1002/adma.200602470
   Ruiz R, 2007, ADV MATER, V19, P587, DOI 10.1002/adma.200600287
   Ruiz R, 2012, J VAC SCI TECHNOL B, V30, DOI 10.1116/1.4758773
   Ruiz R, 2011, ACS NANO, V5, P79, DOI 10.1021/nn101561p
   Seshimo T, 2012, J PHOTOPOLYM SCI TEC, V25, P125, DOI 10.2494/photopolymer.25.125
   Tsai HY, 2014, ACS NANO, V8, P5227, DOI 10.1021/nn501300b
   WALTON DG, 1994, MACROMOLECULES, V27, P6225, DOI 10.1021/ma00099a045
   Wan L, 2012, J MICRO-NANOLITH MEM, V11, DOI 10.1117/1.JMM.11.3.031405
   Wise R, 2013, J MICRO-NANOLITH MEM, V12, DOI 10.1117/1.JMM.12.4.041311
   Yaegashi H, 2012, PROC SPIE, V8325, DOI 10.1117/12.915695
   Zhao Y, 2008, MACROMOLECULES, V41, P9948, DOI 10.1021/ma8013004
NR 47
TC 19
Z9 19
U1 9
U2 45
PU AMER CHEMICAL SOC
PI WASHINGTON
PA 1155 16TH ST, NW, WASHINGTON, DC 20036 USA
SN 1944-8244
J9 ACS APPL MATER INTER
JI ACS Appl. Mater. Interfaces
PD JUN 24
PY 2015
VL 7
IS 24
BP 13476
EP 13483
DI 10.1021/acsami.5b02481
PG 8
WC Nanoscience & Nanotechnology; Materials Science, Multidisciplinary
SC Science & Technology - Other Topics; Materials Science
GA CL6FO
UT WOS:000357063200042
PM 26004013
ER

PT J
AU Wu, XY
   Wang, F
   Wang, CL
AF Wu, Xiayan
   Wang, Fang
   Wang, Chunling
TI Design and magnetic properties of L1(0)-FePt/Fe and L1(0)-FePt exchange
   coupled graded nanodots
SO JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
LA English
DT Article
DE L1(0)-FePt; Nanoclots; Exchange coupled media; Graded media; Anisotropy
   distribution; Micromagnetic simulation
ID BIT-PATTERNED MEDIA; PERPENDICULAR MEDIA; SPRING MEDIA; THIN-FILMS;
   COMPOSITE; MICROSTRUCTURE; FABRICATION; TB/IN(2); GB/IN(2); LIMITS
AB The magnetic properties and reversal process of L1(0)-FePt/Fe and L1(0)-FePt exchange coupled graded nanoclots were investigated using the object-oriented micromagnetic framework (OOMMF), It is indicated that the increase in anisotropy gradient span of L1(0)-FePt section is favorable for the reduction in coercivity for L1(0)-FePt/Fe graded nanodots. However, the low remanence magnetization and squareness ratio caused by the large gradient span is not popular for recording media, lf the Fe soft section is removed, the low coercivity and high squareness ratio can be achieved simultaneously for L1(0)-FePt graded nanoclots with an appropriate gradient design. Therefore, the combination of exchange coupled graded structure and bit patterned media is an effective approach to balance the trilemma issues of current perpendicular magnetic recording media. (C) 2015 Elsevier B.V. All rights reserved.
C1 [Wu, Xiayan] Bradken, Welshpool, WA 6106, Australia.
   [Wu, Xiayan; Wang, Fang; Wang, Chunling] Shanxi Normal Univ, Sch Chem & Mat Sci, Key Lab Magnet Mol & Magnet Informat Mat, Minist Educ, Linfen 041004, Peoples R China.
RP Wang, F (reprint author), Shanxi Normal Univ, Sch Chem & Mat Sci, Key Lab Magnet Mol & Magnet Informat Mat, Minist Educ, Linfen 041004, Peoples R China.
EM wf_0716@163.com
FU National Natural Science Foundation of China [51101095]; Shanxi Province
   Foundations [[2012]10, [2013]9]
FX The authors would like to acknowledge the useful discussion with Prof.
   Hao Zeng of University at Buffalo-SUNY. The work was supported by the
   National Natural Science Foundation of China (Grant no. 51101095) and
   Shanxi Province Foundations (Grant nos. [2012]10 and [2013]9).
CR Bublat T, 2011, NANOTECHNOLOGY, V22, DOI 10.1088/0957-4484/22/31/315301
   Chen JS, 2010, J PHYS D APPL PHYS, V43, DOI 10.1088/0022-3727/43/18/185001
   Donahue M, 2002, OOMMF USERS GUIDE RE
   Fu BZ, 2012, IEEE MAGN LETT, V3, DOI 10.1109/LMAG.2012.2229384
   Ghidini M, 2007, J MAGN MAGN MATER, V316, P159, DOI 10.1016/j.jmmm.2007.02.040
   Goll D, 2013, PHYS STATUS SOLIDI A, V210, P1261, DOI 10.1002/pssa.201329017
   Greaves SJ, 2008, IEEE T MAGN, V44, P3430, DOI 10.1109/TMAG.2008.2002365
   Hu JF, 2008, J MAGN MAGN MATER, V320, P3068, DOI 10.1016/j.jmmm.2008.08.037
   Huang LS, 2014, J PHYS D APPL PHYS, V47, DOI 10.1088/0022-3727/47/24/245001
   Jiang H, 2005, IEEE T MAGN, V41, P2896, DOI 10.1109/TMAG.2005.855306
   Kanai Y, 2005, IEEE T MAGN, V41, P687, DOI 10.1109/TMAG.2004.839073
   Krone P, 2011, J APPL PHYS, V109, DOI 10.1063/1.3583653
   Krone P, 2010, APPL PHYS LETT, V97, DOI 10.1063/1.3481668
   Kronmuller H, 2011, PHYS STATUS SOLIDI B, V248, P2361, DOI 10.1002/pssb.201147205
   Laughlin DE, 2007, IEEE T MAGN, V43, P693, DOI 10.1109/TMAG.2006.888237
   McCallum AT, 2011, APPL PHYS LETT, V98, DOI 10.1063/1.3599573
   Niarchos D., 2008, MATER RES SOC S P, V1106, P02
   Pandey KKM, 2009, APPL PHYS LETT, V94, DOI 10.1063/1.3152765
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Richter HJ, 2009, J MAGN MAGN MATER, V321, P467, DOI 10.1016/j.jmmm.2008.04.161
   Suess D, 2006, APPL PHYS LETT, V89, DOI 10.1063/1.2347894
   Suess D, 2009, J MAGN MAGN MATER, V321, P545, DOI 10.1016/j.jmmm.2008.06.041
   Suess D, 2005, APPL PHYS LETT, V87, DOI 10.1063/1.1951053
   Suess D, 2007, J MAGN MAGN MATER, V308, P183, DOI 10.1016/j.jmmm.2006.05.021
   Victora RH, 2005, IEEE T MAGN, V41, P537, DOI 10.1109/TMAG.2004.838075
   Wang F, 2011, MATER CHEM PHYS, V126, P843, DOI 10.1016/j.matchemphys.2010.12.031
   Wang F, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3183579
   Wang H, 2013, IEEE T MAGN, V49, P707, DOI 10.1109/TMAG.2012.2230155
   Wang H, 2012, J APPL PHYS, V111, DOI 10.1063/1.3677793
   Zhang J, 2013, APPL PHYS LETT, V102, DOI 10.1063/1.4802245
   Zhang ZY, 2002, IEEE T MAGN, V38, P1861, DOI 10.1109/TMAG.2002.801782
   Zhao GP, 2006, PHYS REV B, V74, DOI 10.1103/PhysRevB.74.012409
   Zhao GP, 2008, COMP MATER SCI, V44, P117, DOI 10.1016/j.commatsci.2008.01.019
   Zhao GP, 2007, J APPL PHYS, V101, DOI 10.1063/1.2711404
NR 34
TC 2
Z9 2
U1 4
U2 45
PU ELSEVIER SCIENCE BV
PI AMSTERDAM
PA PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
SN 0304-8853
EI 1873-4766
J9 J MAGN MAGN MATER
JI J. Magn. Magn. Mater.
PD JUN 15
PY 2015
VL 384
BP 40
EP 44
DI 10.1016/j.jmmm.2015.02.022
PG 5
WC Materials Science, Multidisciplinary; Physics, Condensed Matter
SC Materials Science; Physics
GA CE8PF
UT WOS:000352105000007
ER

PT J
AU Warisarn, C
   Arrayangkool, A
   Kovintavewat, P
AF Warisarn, Chanon
   Arrayangkool, Autthasith
   Kovintavewat, Piya
TI An ITI-Mitigating 5/6 Modulation Code for Bit-Patterned Media Recording
SO IEICE TRANSACTIONS ON ELECTRONICS
LA English
DT Article
DE Bit-patterned media recording (BPMR); Euclidean distance; Inter-track
   interference (ITI); Modulation code
ID SCHEME
AB In bit-patterned media recording (BPMR), the readback signal is severely corrupted by the inter-symbol interference (ISI) and inter-track interference (ITI), especially at high recording densities, due to small bit and track pitches. One way to alleviate the ITI effect is to encode an input data sequence before recording, so as to avoid some data patterns that easily cause an error at the data detection process. This paper proposes an ITI-mitigating 5/6 modulation code for a multi-track multi-head BPMR system to eliminate the data patterns that lead to severe ITI. Specifically, each of the 5 user bits is converted into a 6-bit codeword in the form of a 3-by-2 data array, based on a look-up table. Experimental results indicate that the system with the proposed coding scheme outperforms that without coding, especially when an areal density is high and/or the position jitter is large.
C1 [Warisarn, Chanon; Arrayangkool, Autthasith] King Mongkuts Inst Technol Ladkrabang, Coll Data Storage Innovat D STAR, Bangkok 10520, Thailand.
   [Kovintavewat, Piya] Nakhon Pathom Rajabhat Univ, Data Storage Technol Res Ctr, Nakhon Pathom 73000, Thailand.
RP Warisarn, C (reprint author), King Mongkuts Inst Technol Ladkrabang, Coll Data Storage Innovat D STAR, Bangkok 10520, Thailand.
EM kwchanon@kmitl.ac.th; piya@npru.ac.th
FU College of Data Storage Innovation (D*STAR); King Mongkut's Institute of
   Technology Ladkrabang Research Fund, Thailand
FX This work was supported by College of Data Storage Innovation (D*STAR)
   and King Mongkut's Institute of Technology Ladkrabang Research Fund,
   Thailand.
CR Ahmed M. Z., 2004, J MAGNETISM MAGNETIC, V287, P432
   Arrayangkool A., 2013, P ECTI CON 2013, P126
   Arrayangkool A, 2013, IEICE T ELECTRON, VE96C, P1490, DOI 10.1587/transele.E96.C.1490
   Deza Elena, 2009, ENCY DISTANCES, P94
   Groenland JPJ, 2007, IEEE T MAGN, V43, P2307, DOI 10.1109/TMAG.2007.893137
   Karakulak S, 2010, IEEE T MAGN, V46, P3639, DOI 10.1109/TMAG.2010.2049116
   Kim J, 2010, JPN J APPL PHYS, V49, DOI 10.1143/JJAP.49.08KB04
   Kurihara Y, 2008, J MAGN MAGN MATER, V320, P3140, DOI 10.1016/j.jmmm.2008.08.026
   Nabavi S., 2007, P ICC 2007 JUN
   Nabavi S, 2009, IEEE T MAGN, V45, P3523, DOI 10.1109/TMAG.2009.2022493
   Shao XY, 2011, IEEE T MAGN, V47, P2559, DOI 10.1109/TMAG.2011.2157668
   Terris BD, 2007, MICROSYST TECHNOL, V13, P189, DOI 10.1007/s00542-006-0144-9
   Wood R, 2000, IEEE T MAGN, V36, P36, DOI 10.1109/20.824422
NR 13
TC 0
Z9 0
U1 1
U2 4
PU IEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG
PI TOKYO
PA KIKAI-SHINKO-KAIKAN BLDG, 3-5-8, SHIBA-KOEN, MINATO-KU, TOKYO, 105-0011,
   JAPAN
SN 1745-1353
J9 IEICE T ELECTRON
JI IEICE Trans. Electron.
PD JUN
PY 2015
VL E98C
IS 6
BP 528
EP 533
DI 10.1587/transele.E98.C.528
PG 6
WC Engineering, Electrical & Electronic
SC Engineering
GA CO9UZ
UT WOS:000359522900011
ER

PT J
AU Wang, Y
   Wei, D
   Cao, JW
   Wei, FL
AF Wang Ying
   Wei Dan
   Cao Jiang-Wei
   Wei Fu-Lin
TI Investigation of L1(0) FePt-based soft/hard composite bit-patterned
   media by micromagnetic simulation
SO CHINESE PHYSICS B
LA English
DT Article
DE micromagnetic simulation; composite bit patterned media; L1(0) FePt;
   switching field distribution; readout signal
ID LITHOGRAPHY
AB The soft/hard composite patterned media have potential to be the next generation of magnetic recording, but the composing modes of soft and hard materials have not been investigated systematically. L1(0) FePt-based soft/hard composite patterned media with an anisotropic constant distribution are studied by micromagnetic simulation. Square arrays and hexagonal arrays with various pitch sizes are simulated for two composing types: the soft layer that encloses the hard dots and the soft layer that covers the whole surface. It is found that the soft material can reduce the switching fields of bits effectively for all models. Compared with the first type, the second type of models possess low switching fields, narrow switching field distributions, and high gain factors due to the introduction of inter-bit exchange coupling. Furthermore, the readout waveforms of the second type are not deteriorated by the inter-bit soft layers. Since the recording density of hexagonal arrays are higher than that of square arrays with the same center-to-center distances, the readout waveforms of hexagonal arrays are a little worse, although other simulation results are similar for these two arrays.
C1 [Wang Ying; Cao Jiang-Wei; Wei Fu-Lin] Lanzhou Univ, Minist Educ, Key Lab Magnetism & Magnet Mat, Lanzhou 730000, Peoples R China.
   [Wei Dan] Tsinghua Univ, Adv Mat Lab, Dept Mat Sci & Engn, Beijing 100084, Peoples R China.
RP Wang, Y (reprint author), Lanzhou Univ, Minist Educ, Key Lab Magnetism & Magnet Mat, Lanzhou 730000, Peoples R China.
EM yingw@lzu.edu.cn
FU National Natural Science Foundation of China [51171086, 61272076]; Young
   Scientists Fund of the National Natural Science Foundation of China
   [61003041]
FX Project supported by the National Natural Science Foundation of China
   (Grant Nos. 51171086 and 61272076) and the Young Scientists Fund of the
   National Natural Science Foundation of China (Grant No. 61003041).
CR Batra S, 2004, IEEE T MAGN, V40, P319, DOI 10.1109/TMAG.2003.821163
   CHOU SY, 1994, J VAC SCI TECHNOL B, V12, P3695, DOI 10.1116/1.587642
   Goh CK, 2009, J APPL PHYS, V105, DOI 10.1063/1.3109243
   Hellwig O, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3293301
   Jia YF, 2014, CHINESE PHYS B, V23, DOI 10.1088/1674-1056/23/7/076105
   Krone P, 2010, APPL PHYS LETT, V97, DOI 10.1063/1.3481668
   Liu LW, 2013, CHINESE PHYS B, V22, DOI 10.1088/1674-1056/22/4/047503
   Liu X, 2013, CHINESE PHYS B, V22, DOI 10.1088/1674-1056/22/8/087504
   Nutter PW, 2005, IEEE T MAGN, V41, P3214, DOI 10.1109/TMAG.2005.854780
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Usov NA, 2012, APPL PHYS LETT, V101, DOI 10.1063/1.4761978
   Victora RH, 2005, IEEE T MAGN, V41, P537, DOI 10.1109/TMAG.2004.838075
   Wang JP, 2005, APPL PHYS LETT, V86, P42504, DOI 10.1063/1.1896431
   Wang Y, 2013, CHINESE PHYS B, V22, DOI 10.1088/1674-1056/22/6/068506
   Weller D, 1999, IEEE T MAGN, V35, P4423, DOI 10.1109/20.809134
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
NR 16
TC 0
Z9 0
U1 4
U2 25
PU IOP PUBLISHING LTD
PI BRISTOL
PA TEMPLE CIRCUS, TEMPLE WAY, BRISTOL BS1 6BE, ENGLAND
SN 1674-1056
EI 1741-4199
J9 CHINESE PHYS B
JI Chin. Phys. B
PD JUN
PY 2015
VL 24
IS 6
AR 068504
DI 10.1088/1674-1056/24/6/068504
PG 6
WC Physics, Multidisciplinary
SC Physics
GA CN0UU
UT WOS:000358130200099
ER

PT J
AU Arrayangkool, A
   Warisarn, C
AF Arrayangkool, A.
   Warisarn, C.
TI A two-dimensional coding design for staggered islands bit-patterned
   media recording
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article
ID SCHEME
AB This paper proposes a two dimensional (2D) staggered recorded-bit patterning (SRBP) coding scheme for staggered array bit-patterned media recording channel to alleviate the severe 2D interference, which requires no redundant bits at the expense of increased an additional memories. Specifically, a data sequence is first split into three tracks. Then, each data track is circularly shifted to find the best data pattern based on a look-up table before recording such that the shifted data tracks cause the lowest 2D interference in the readback signal. Simulation results indicate that the system with our proposed SRBP scheme outperforms that without any 2D coding, especially when an areal density (AD) is high and/or the position jitter is large. Specifically, for the system without position jitter at bit-error rate of 10(-4), the proposed scheme can provide about 1.8 and 2.3 dB gains at the AD of 2.5 and 3.0 Tb/in.(2), respectively. (C) 2015 AIP Publishing LLC.
C1 [Arrayangkool, A.; Warisarn, C.] King Mongkuts Inst Technol Ladkrabang, Coll Data Storage Innovat, Bangkok 10520, Thailand.
RP Warisarn, C (reprint author), King Mongkuts Inst Technol Ladkrabang, Coll Data Storage Innovat, Bangkok 10520, Thailand.
EM kwchanon@kmitl.ac.th
FU College of Data Storage Innovation; King Mongkut's Institute of
   Technology Ladkrabang Research Fund, KMITL, Thailand
FX This work was supported by College of Data Storage Innovation and King
   Mongkut's Institute of Technology Ladkrabang Research Fund, KMITL,
   Thailand.
CR Arrayangkool A, 2014, J APPL PHYS, V115, DOI 10.1063/1.4855955
   Arrayangkool A., 2013, P ECTI CON 2013, P126
   Arrayangkool A, 2013, IEICE T ELECTRON, VE96C, P1490, DOI 10.1587/transele.E96.C.1490
   Groenland JPJ, 2007, IEEE T MAGN, V43, P2307, DOI 10.1109/TMAG.2007.893137
   Karakulak S, 2010, IEEE T MAGN, V46, P3639, DOI 10.1109/TMAG.2010.2049116
   NABAVI S, 2007, P IEEE INT C COMM IC, P6249
   Nabavi S, 2008, IEEE T MAGN, V44, P3789, DOI 10.1109/TMAG.2008.2002387
   Ng Y, 2012, IEEE T MAGN, V48, P1976, DOI 10.1109/TMAG.2011.2181183
   Nutter PW, 2005, IEEE T MAGN, V41, P3214, DOI 10.1109/TMAG.2005.854780
   Richter HJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2209179
   Shao XY, 2011, IEEE T MAGN, V47, P2559, DOI 10.1109/TMAG.2011.2157668
   Terris BD, 2007, MICROSYST TECHNOL, V13, P189, DOI 10.1007/s00542-006-0144-9
   Timakul S, 2014, ADV MATER RES-SWITZ, V835-836, P962, DOI 10.4028/www.scientific.net/AMR.834-836.962
   Wood R, 2000, IEEE T MAGN, V36, P36, DOI 10.1109/20.824422
NR 14
TC 1
Z9 1
U1 2
U2 8
PU AMER INST PHYSICS
PI MELVILLE
PA 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
SN 0021-8979
EI 1089-7550
J9 J APPL PHYS
JI J. Appl. Phys.
PD MAY 7
PY 2015
VL 117
IS 17
AR 17A904
DI 10.1063/1.4913894
PG 4
WC Physics, Applied
SC Physics
GA CI7YW
UT WOS:000354984100102
ER

PT J
AU Carlotti, G
   Tacchi, S
   Gubbiotti, G
   Madami, M
   Dey, H
   Csaba, G
   Porod, W
AF Carlotti, G.
   Tacchi, S.
   Gubbiotti, G.
   Madami, M.
   Dey, H.
   Csaba, G.
   Porod, W.
TI Spin wave eigenmodes in single and coupled sub-150 nm rectangular
   permalloy dots
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article
AB We present the results of a Brillouin light scattering investigation of thermally excited spin wave eigenmodes in square arrays of either isolated rectangular dots of permalloy or twins of dipolarly coupled elements, placed side-by-side or head-to-tail. The nanodots, fabricated by e-beam lithography and lift-off, are 20 nm thick and have the major size D in the range between 90 nm and 150 nm. The experimental spectra show the presence of two main peaks, corresponding to modes localized either at the edges or in the center of the dots. Their frequency dependence on the dot size and on the interaction with adjacent elements has been measured and successfully interpreted on the basis of dynamical micromagnetic simulations. The latter enabled us also to describe the spatial profile of the eigenmodes, putting in evidence the effects induced by the dipolar interaction between coupled dots. In particular, in twinned dots the demagnetizing field is appreciably modified in proximity of the "internal edges" if compared to the "external" ones, leading to a splitting of the edge mode. These results can be relevant for the exploitation of sub-150 nm magnetic dots in new applications, such as magnonic metamaterials, bit-patterned storage media, and nano-magnetic logic devices. (C) 2015 AIP Publishing LLC.
C1 [Carlotti, G.; Madami, M.] Univ Perugia, Dipartimento Fis & Geol, I-06100 Perugia, Italy.
   [Tacchi, S.] CNR, IOM, Dipartimento Fis & Geol, Perugia, Italy.
   [Gubbiotti, G.; Dey, H.; Csaba, G.; Porod, W.] Univ Notre Dame, Dept Elect Engn, Ctr Nano Sci & Technol, Notre Dame, IN 46556 USA.
RP Carlotti, G (reprint author), Univ Perugia, Dipartimento Fis & Geol, I-06100 Perugia, Italy.
EM giovanni.carlotti@fisica.unipg.it
RI Csaba, Gyorgy/O-9720-2015
OI Csaba, Gyorgy/0000-0001-7592-0256; Madami, Marco/0000-0002-0727-1773
FU European Community [318287]; MIUR under PRIN [2010ECA8P3]
FX This work was supported by the European Community (FP7/2007-2013) under
   Grant No. 318287 "LANDAUER" and by the MIUR under PRIN Project No.
   2010ECA8P3 "DyNanoMag."
CR Carlotti G, 2014, J PHYS D APPL PHYS, V47, DOI 10.1088/0022-3727/47/26/265001
   Carlotti G, 1999, RIV NUOVO CIMENTO, V22, P1, DOI 10.1007/BF02872273
   Dvornik M, 2011, J APPL PHYS, V109, DOI 10.1063/1.3562509
   Keatley PS, 2013, PHYS REV LETT, V110, DOI 10.1103/PhysRevLett.110.187202
   Keatley PS, 2008, PHYS REV B, V78, DOI 10.1103/PhysRevB.78.214412
   Kruglyak VV, 2010, PHYS REV LETT, V104, DOI 10.1103/PhysRevLett.104.027201
   Liu XM, 2014, APPL PHYS LETT, V105, DOI 10.1063/1.4892635
   McMichael RD, 2005, J APPL PHYS, V97, DOI 10.1063/1.1852191
   Peng L., 2012, J APPL PHYS, V111
   Saha S, 2013, ADV FUNCT MATER, V23, P2378, DOI 10.1002/adfm.201202545
   Shaw JM, 2009, PHYS REV B, V79, DOI 10.1103/PhysRevB.79.184404
   Tacchi S, 2011, PHYS REV LETT, V107, DOI 10.1103/PhysRevLett.107.127204
   Zivieri R, 2011, PHYS REV B, V83, DOI 10.1103/PhysRevB.83.054431
NR 13
TC 2
Z9 2
U1 2
U2 17
PU AMER INST PHYSICS
PI MELVILLE
PA 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
SN 0021-8979
EI 1089-7550
J9 J APPL PHYS
JI J. Appl. Phys.
PD MAY 7
PY 2015
VL 117
IS 17
AR 17A316
DI 10.1063/1.4914878
PG 4
WC Physics, Applied
SC Physics
GA CI7YW
UT WOS:000354984100017
ER

PT J
AU Hara, A
   Muraoka, H
   Greaves, SJ
AF Hara, Akihiro
   Muraoka, Hiroaki
   Greaves, Simon J.
TI Write synchronization for position-correlated granular media
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article
ID BIT-PATTERNED-MEDIA; SERVO PATTERN
AB Jitter noise reduction can be achieved by controlling the position of magnetic grains, but write synchronization is needed to take advantage of the potential reduction. A periodic read-back response can be obtained from DC-erased bits, which is composed of rows of grains. In this paper, the feasibility of creating a clock signal for write synchronization using this periodicity of the read-back response is investigated. As a result, it was confirmed that a clock signal can be created by using the precise periodicity of the read-back response. (C) 2015 AIP Publishing LLC.
C1 [Hara, Akihiro; Muraoka, Hiroaki; Greaves, Simon J.] Tohoku Univ, RIEC, Sendai, Miyagi 9808577, Japan.
RP Hara, A (reprint author), Tohoku Univ, RIEC, Sendai, Miyagi 9808577, Japan.
EM hara@riec.tohoku.ac.jp
FU MEXT Japanese Government; Storage Research Consortium (SRC)
FX This work was partly supported by MEXT Japanese Government and the
   Storage Research Consortium (SRC).
CR Bedau D., 2014, IEEE INT MAGN C IEEE
   Hara A, 2014, J APPL PHYS, V115, DOI 10.1063/1.4866396
   Hughes EC, 2003, J APPL PHYS, V93, P7002, DOI 10.1063/1.1557937
   Kamata Y, 2011, IEEE T MAGN, V47, P51, DOI 10.1109/TMAG.2010.2077274
   Lille J, 2012, IEEE T MAGN, V48, P2757, DOI 10.1109/TMAG.2012.2192916
   Muraoka H, 1999, IEEE T MAGN, V35, P2235, DOI 10.1109/20.800784
   POTTER RI, 1974, IEEE T MAGN, VMA10, P502, DOI 10.1109/TMAG.1974.1058492
   Tang Y, 2009, IEEE T MAGN, V45, P822, DOI 10.1109/TMAG.2008.2010642
   Zhang SH, 2010, IEEE T MAGN, V46, P1645, DOI 10.1109/TMAG.2010.2042688
NR 9
TC 0
Z9 0
U1 0
U2 0
PU AMER INST PHYSICS
PI MELVILLE
PA 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
SN 0021-8979
EI 1089-7550
J9 J APPL PHYS
JI J. Appl. Phys.
PD MAY 7
PY 2015
VL 117
IS 17
AR 17A909
DI 10.1063/1.4916497
PG 4
WC Physics, Applied
SC Physics
GA CI7YW
UT WOS:000354984100107
ER

PT J
AU Lippman, T
   Brockie, R
   Coker, J
   Contreras, J
   Galbraith, R
   Garzon, S
   Hanson, W
   Leong, T
   Marley, A
   Wood, R
   Zakai, R
   Zolla, H
   Duquette, P
   Petrizzi, J
AF Lippman, Thomas
   Brockie, Richard
   Coker, Jon
   Contreras, John
   Galbraith, Rick
   Garzon, Samir
   Hanson, Weldon
   Leong, Tom
   Marley, Arley
   Wood, Roger
   Zakai, Rehan
   Zolla, Howard
   Duquette, Paul
   Petrizzi, Joe
TI Spinstand demonstration of areal density enhancement using
   two-dimensional magnetic recording
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article
ID SYSTEMS; ARRAY
AB Exponential growth of the areal density has driven the magnetic recording industry for almost sixty years. But now areal density growth is slowing down, suggesting that current technologies are reaching their fundamental limit. The next generation of recording technologies, namely, energy-assisted writing and bit-patterned media, remains just over the horizon. Two-Dimensional Magnetic Recording (TDMR) is a promising new approach, enabling continued areal density growth with only modest changes to the heads and recording electronics. We demonstrate a first generation implementation of TDMR by using a dual-element read sensor to improve the recovery of data encoded by a conventional low-density parity-check (LDPC) channel. The signals are combined with a 2D equalizer into a single modified waveform that is decoded by a standard LDPC channel. Our detection hardware can perform simultaneous measurement of the pre- and post-combined error rate information, allowing one set of measurements to assess the absolute areal density capability of the TDMR system as well as the gain over a conventional shingled magnetic recording system with identical components. We discuss areal density measurements using this hardware and demonstrate gains exceeding five percent based on experimental dual reader components. (C) 2015 AIP Publishing LLC.
C1 [Lippman, Thomas; Brockie, Richard; Contreras, John; Garzon, Samir; Leong, Tom; Marley, Arley; Wood, Roger; Zakai, Rehan; Zolla, Howard] HGST, San Jose, CA 95119 USA.
   [Coker, Jon; Galbraith, Rick; Hanson, Weldon] HGST, Rochester, MN 55901 USA.
   [Duquette, Paul; Petrizzi, Joe] Avago Technol, San Jose, CA 95131 USA.
RP Lippman, T (reprint author), HGST, San Jose, CA 95119 USA.
EM Thomas.Lippman@hgst.com
CR Chan KS, 2009, IEEE T MAGN, V45, P3837, DOI 10.1109/TMAG.2009.2024001
   Elidrissi MR, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2013.2283884
   Hwang E, 2011, IEEE T MAGN, V47, P4775, DOI 10.1109/TMAG.2011.2153209
   Jin Z, 2008, IEEE T MAGN, V44, P3718, DOI 10.1109/TMAG.2008.2003044
   Krishnan AR, 2009, IEEE T MAGN, V45, P3679, DOI 10.1109/TMAG.2009.2023244
   Mathew G, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2013.2283221
   Victora RH, 2012, IEEE T MAGN, V48, P1697, DOI 10.1109/TMAG.2011.2173310
   WALLACE RL, 1951, AT&T TECH J, V30, P1145
   Wang Y, 2012, IEEE MAGN LETT, V3, DOI 10.1109/LMAG.2012.2226935
   Wang Y, 2012, IEEE T MAGN, V48, P4582, DOI 10.1109/TMAG.2012.2202886
   Wood R., IEEE T MAGN IN PRESS
   Wood R, 2009, IEEE T MAGN, V45, P917, DOI 10.1109/TMAG.2008.2010676
   Yamashita M, 2013, IEEE T MAGN, V49, P3810, DOI 10.1109/TMAG.2013.2242437
   Yamashita M, 2011, IEEE T MAGN, V47, P3558, DOI 10.1109/TMAG.2011.2157808
NR 14
TC 3
Z9 3
U1 0
U2 1
PU AMER INST PHYSICS
PI MELVILLE
PA 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
SN 0021-8979
EI 1089-7550
J9 J APPL PHYS
JI J. Appl. Phys.
PD MAY 7
PY 2015
VL 117
IS 17
AR 172613
DI 10.1063/1.4914051
PG 5
WC Physics, Applied
SC Physics
GA CI7YW
UT WOS:000354984100554
ER

PT J
AU Morrison, C
   Miles, JJ
   Nguyen, TNA
   Fang, Y
   Dumas, RK
   Akerman, J
   Thomson, T
AF Morrison, C.
   Miles, J. J.
   Nguyen, T. N. Anh
   Fang, Y.
   Dumas, R. K.
   Akerman, J.
   Thomson, T.
TI Exchange coupling in hybrid anisotropy magnetic multilayers quantified
   by vector magnetometry
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article
ID SPIN-TORQUE OSCILLATOR; SPRING MAGNETS; MEDIA
AB Hybrid anisotropy thin film heterostructures, where layers with perpendicular and in-plane anisotropy are separated by a thin spacer, are novel materials for zero/low field spin torque oscillators and bit patterned media. Here, we report on magnetization reversal and exchange coupling in a archetypal Co/Pd (perpendicular)-NiFe (in-plane) hybrid anisotropy system studied using vector vibrating sample magnetometry. This technique allows us to quantify the magnetization reversal in each individual magnetic layer, and measure of the interlayer exchange as a function of non-magnetic spacer thickness. At large (> 1 nm) spacer thicknesses Ruderman-Kittel-Kasuya-Yosida-like exchange dominates, with orange-peel coupling providing a significant contribution only for sub-nm spacer thickness. (c) 2015 AIP Publishing LLC.
C1 [Morrison, C.; Miles, J. J.; Thomson, T.] Univ Manchester, Sch Comp Sci, Manchester M13 9PL, Lancs, England.
   [Nguyen, T. N. Anh; Akerman, J.] KTH Royal Inst Technol, Sch ICT, Mat Phys, S-16440 Kista, Sweden.
   [Nguyen, T. N. Anh] VNU HCM, Spintron Res Grp, Lab Nanotechnol LNT, Ho Chi Minh City, Vietnam.
   [Fang, Y.; Dumas, R. K.; Akerman, J.] Univ Gothenburg, Dept Phys, S-41296 Gothenburg, Sweden.
RP Morrison, C (reprint author), Univ Warwick, Dept Phys, Coventry CV4 7AL, W Midlands, England.
EM C.Morrison.2@warwick.ac.uk
RI Dumas, Randy/E-3077-2010
OI Dumas, Randy/0000-0001-5505-2172; Morrison,
   Christopher/0000-0002-2709-9982
FU EPSRC [EP/G032440/1]
FX We would like to thank the EPSRC for financial support under Grant No.
   EP/G032440/1.
CR BRUNO P, 1992, PHYS REV B, V46, P261, DOI 10.1103/PhysRevB.46.261
   Dittrich R, 2005, IEEE T MAGN, V41, P3592, DOI 10.1109/TMAG.2005.854736
   Heldt G, 2014, APPL PHYS LETT, V104, DOI 10.1063/1.4873937
   Houssameddine D, 2007, NAT MATER, V6, P447, DOI 10.1038/nmat1905
   Kalezhi J, 2012, J APPL PHYS, V111, DOI 10.1063/1.3691947
   Kalezhi J, 2011, IEEE T MAGN, V47, P2540, DOI 10.1109/TMAG.2011.2157993
   Klein T, 2006, THIN SOLID FILMS, V515, P2531, DOI 10.1016/j.tsf.2006.03.035
   McCallum AT, 2011, APPL PHYS LETT, V98, DOI 10.1063/1.3599573
   Mohseni SM, 2011, PHYS STATUS SOLIDI-R, V5, P432, DOI 10.1002/pssr.201105375
   Nguyen TNA, 2012, J MAGN MAGN MATER, V324, P3929, DOI 10.1016/j.jmmm.2012.06.043
   Nguyen TNA, 2011, APPL PHYS LETT, V98, DOI 10.1063/1.3580612
   O'Handley R. C., 2000, MODERN MAGNETIC MAT
   Rippard WH, 2010, PHYS REV B, V81, DOI 10.1103/PhysRevB.81.014426
   Saharan L, 2013, APPL PHYS LETT, V102, DOI 10.1063/1.4801316
   Suess D, 2009, J MAGN MAGN MATER, V321, P545, DOI 10.1016/j.jmmm.2008.06.041
   Thomson T, 2008, J APPL PHYS, V103, DOI 10.1063/1.2839310
   Victora RH, 2005, IEEE T MAGN, V41, P2828, DOI 10.1109/TMAG.2005.855263
   Zhou Y, 2009, NEW J PHYS, V11, DOI 10.1088/1367-2630/11/10/103028
   Zhou Y, 2009, J APPL PHYS, V105, DOI 10.1063/1.3068429
NR 19
TC 3
Z9 3
U1 7
U2 14
PU AMER INST PHYSICS
PI MELVILLE
PA 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
SN 0021-8979
EI 1089-7550
J9 J APPL PHYS
JI J. Appl. Phys.
PD MAY 7
PY 2015
VL 117
IS 17
AR 17B526
DI 10.1063/1.4917336
PG 4
WC Physics, Applied
SC Physics
GA CI7YW
UT WOS:000354984100175
ER

PT J
AU Oezelt, H
   Kovacs, A
   Wohlhuter, P
   Kirk, E
   Nissen, D
   Matthes, P
   Heyderman, LJ
   Albrecht, M
   Schrefl, T
AF Oezelt, Harald
   Kovacs, Alexander
   Wohlhueter, Phillip
   Kirk, Eugenie
   Nissen, Dennis
   Matthes, Patrick
   Heyderman, Laura Jane
   Albrecht, Manfred
   Schrefl, Thomas
TI Micromagnetic simulation of exchange coupled ferri-/ferromagnetic
   composite in bit patterned media
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article
ID FILMS
AB Ferri-/ferromagnetic exchange coupled composites are promising candidates for bit patterned media because of the ability to control the magnetic properties of the ferrimagnet by its composition. A micromagnetic model for the bilayer system is presented where we also incorporate the microstructural features of both layers. Micromagnetic finite element simulations are performed to investigate the magnetization reversal behaviour of such media. By adding the exchange coupled ferrimagnet to the ferromagnet, the switching field could be reduced by up to 40% and also the switching field distribution is narrowed. To reach these significant improvements, an interface exchange coupling strength of 2 mJ/m(2) is required. (C) 2015 AIP Publishing LLC.
C1 [Oezelt, Harald; Kovacs, Alexander; Schrefl, Thomas] Univ Appl Sci, Ind Simulat, A-3100 St Polten, Austria.
   [Wohlhueter, Phillip; Kirk, Eugenie; Heyderman, Laura Jane] ETH, Dept Mat, Lab Mesoscop Syst, CH-8093 Zurich, Switzerland.
   [Wohlhueter, Phillip; Kirk, Eugenie; Heyderman, Laura Jane] Paul Scherrer Inst, Lab Micro & Nanotechnol, CH-5232 Villigen, Switzerland.
   [Nissen, Dennis; Albrecht, Manfred] Tech Univ Chemnitz, Inst Phys, D-09126 Chemnitz, Germany.
   [Nissen, Dennis; Matthes, Patrick; Albrecht, Manfred] Univ Augsburg, Inst Phys, D-86159 Augsburg, Germany.
   [Schrefl, Thomas] Danube Univ Krems, Ctr Integrated Sensor Syst, A-2700 Wiener Neustadt, Austria.
RP Oezelt, H (reprint author), Univ Appl Sci, Ind Simulat, A-3100 St Polten, Austria.
EM harald.oezelt@fhstp.ac.at
RI Heyderman, Laura/E-7959-2015
OI Ozelt, Harald/0000-0002-3754-3565
FU Austrian Science Fund (FWF) [I821]; German Research Foundation (DFG) [AL
   618/17-1]; Swiss National Science Foundation (SNF) [200021L_137509]
FX We gratefully acknowledge the financial support provided by the Austrian
   Science Fund (FWF Grant No. I821), the German Research Foundation (DFG
   Grant No. AL 618/17-1), and the Swiss National Science Foundation (SNF
   Grant No. 200021L_137509).
CR Casoli F, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2905294
   Dean J, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3294637
   DUNAVANT DA, 1985, INT J NUMER METH ENG, V21, P1129, DOI 10.1002/nme.1620210612
   Giles R., 1991, J MAGN SOC JPN, V15, P299
   Goh CK, 2009, J APPL PHYS, V105, DOI 10.1063/1.3109243
   Hauet T, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3276911
   Jenkins D, 2003, MICROSYST TECHNOL, V10, P66, DOI 10.1007/S00542-003-0307-X
   Krone P, 2010, APPL PHYS LETT, V97, DOI 10.1063/1.3481668
   KRYDER MH, 1985, J APPL PHYS, V57, P3913, DOI 10.1063/1.334915
   MANSURIPUR M, 1988, J APPL PHYS, V63, P5809, DOI 10.1063/1.340320
   MANSURIPUR M, 1991, J APPL PHYS, V69, P4844, DOI 10.1063/1.348250
   Mansuripur M., 1995, PHYSICAL PRINCIPLES, P652
   MIMURA Y, 1978, J APPL PHYS, V49, P1208, DOI 10.1063/1.325008
   Oezelt H, 2015, J MAGN MAGN MATER, V381, P28, DOI 10.1016/j.jmmm.2014.12.045
   Quey R, 2011, COMPUT METHOD APPL M, V200, P1729, DOI 10.1016/j.cma.2011.01.002
   Sbiaa R, 2009, J APPL PHYS, V105, DOI 10.1063/1.3093699
   Schrefl T., 2007, HDB MAGNETISM ADV MA, P1
   Suess D, 2007, J MAGN MAGN MATER, V308, P183, DOI 10.1016/j.jmmm.2006.05.021
   Victora RH, 2005, IEEE T MAGN, V41, P537, DOI 10.1109/TMAG.2004.838075
NR 19
TC 5
Z9 5
U1 2
U2 20
PU AMER INST PHYSICS
PI MELVILLE
PA 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
SN 0021-8979
EI 1089-7550
J9 J APPL PHYS
JI J. Appl. Phys.
PD MAY 7
PY 2015
VL 117
IS 17
AR 17E501
DI 10.1063/1.4906288
PG 4
WC Physics, Applied
SC Physics
GA CI7YW
UT WOS:000354984100507
ER

PT J
AU Pituso, K
   Kaewrawang, A
   Buatong, P
   Siritaratiwat, A
   Kruesubthaworn, A
AF Pituso, K.
   Kaewrawang, A.
   Buatong, P.
   Siritaratiwat, A.
   Kruesubthaworn, A.
TI The temperature and electromagnetic field distributions of heat-assisted
   magnetic recording for bit-patterned media at ultrahigh areal density
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article
AB In this paper, the temperature and electromagnetic field distributions for bit-patterned media (BPM) with heat-assisted writing technology at areal density of 6.54-17.92 Tb/in(2) are investigated by the finite integral technique method. We have found that the BPM can confine temperature better than continuous media. The temperature ratio of neighbor bits to heating bit of BPM at areal density of 6.54-7.69 Tb/in(2) is lower than 65% and increases with increasing areal density. The electric field direction is toward the bit and the magnetic field circulates around the heating bit. In addition, the electric field of BPM is the same pattern as continuous media at areal density of 13.17 Tb/in(2) or above. (C) 2015 AIP Publishing LLC.
C1 [Pituso, K.; Kaewrawang, A.; Buatong, P.] Khon Kaen Univ, Fac Engn, Magnet Mat & Data Storage Res Lab, Khon Kaen 40002, Thailand.
   [Siritaratiwat, A.] Khon Kaen Univ, Fac Engn, KKU Seagate Cooperat, Khon Kaen 40002, Thailand.
   [Siritaratiwat, A.] Khon Kaen Univ, Fac Engn, EMI EMC Res Lab, Khon Kaen 40002, Thailand.
   [Kruesubthaworn, A.] Khon Kaen Univ, Fac Appl Sci & Engn, Nong Khai 43000, Thailand.
RP Pituso, K (reprint author), Khon Kaen Univ, Fac Engn, Magnet Mat & Data Storage Res Lab, Khon Kaen 40002, Thailand.
EM arkom@elec.kku.ac.th
FU Khon Kaen University, Thailand under Incubation Researcher Project;
   Office of the National Broadcasting and Telecommunications Commission
   (NBTC)
FX This work was financially supported by Khon Kaen University, Thailand
   under Incubation Researcher Project. We also thank the Office of the
   National Broadcasting and Telecommunications Commission (NBTC) for
   funding the CST Microwave Studio (R) software applied in the
   simulations, Department of Electronics and Telecommunication Education,
   Faculty of Technical Education, Rajamangala University of Technology
   Thanyaburi, Pathum Thani, Thailand and Department of Electronics
   Engineering, Faculty of Engineering, Suranaree University of Technology,
   Nakhon Ratchasima, Thailand for CST simulation software. Authors also
   thank Ms. Warunee Tipcharoen.
CR Akagi F, 2012, J MAGN MAGN MATER, V324, P309, DOI 10.1016/j.jmmm.2010.11.082
   Balanis C. A., 1989, ADV ENG ELECTROMAGNE, P20
   Cengel Y., 2007, HEAT MASS TRANSFER, p[61, 663]
   CST GmbH Germany, 2010, CST MICR STUD
   Evans RFL, 2012, APPL PHYS LETT, V100, DOI 10.1063/1.3691196
   Grobis MK, 2011, IEEE T MAGN, V47, P6, DOI 10.1109/TMAG.2010.2076798
   Katada H, 2010, IEEE T MAGN, V46, P798, DOI 10.1109/TMAG.2010.2040248
   Kikitsu A, 2007, IEEE T MAGN, V43, P3685, DOI 10.1109/TMAG.2007.902970
   Kryder MH, 2008, P IEEE, V96, P1810, DOI 10.1109/JPROC.2008.2004315
   Li ZH, 2008, J MAGN MAGN MATER, V320, P3108, DOI 10.1016/j.jmmm.2008.08.085
   Matsumoto K, 2006, FUJITSU SCI TECH J, V42, P158
   Sabau AS, 2006, JOM-US, V58, P35, DOI 10.1007/s11837-006-0178-6
   Waseda K, 2008, IEEE T MAGN, V44, P2483, DOI 10.1109/TMAG.2008.2003068
   Weiland T, 1996, INT J NUMER MODEL EL, V9, P295, DOI 10.1002/(SICI)1099-1204(199607)9:4<295::AID-JNM240>3.0.CO;2-8
   Weller D, 1999, IEEE T MAGN, V35, P4423, DOI 10.1109/20.809134
   Weller D, 2000, IEEE T MAGN, V36, P10, DOI 10.1109/20.824418
   Wu HQ, 2008, B MATER SCI, V31, P801, DOI 10.1007/s12034-008-0127-9
   Yuan L., 2006, INT MAGN C, P893, DOI 10.1109/INTMAG.2006.374924
   [Anonymous], 2005, ENG TOOL BOX
NR 19
TC 1
Z9 1
U1 2
U2 11
PU AMER INST PHYSICS
PI MELVILLE
PA 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
SN 0021-8979
EI 1089-7550
J9 J APPL PHYS
JI J. Appl. Phys.
PD MAY 7
PY 2015
VL 117
IS 17
AR 17C501
DI 10.1063/1.4906323
PG 3
WC Physics, Applied
SC Physics
GA CI7YW
UT WOS:000354984100258
ER

PT J
AU Wang, SM
   Ghoreyshi, A
   Victora, RH
AF Wang, Sumei
   Ghoreyshi, Ali
   Victora, R. H.
TI Feasibility of bit patterned media for HAMR at 5 Tb/in(2)
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article
AB We have investigated the feasibility of BPM for HAMR via Finite Difference Time Domain and atomistic simulation and we have substantiated the feasibility of 5 Tb/in(2) with two filling factors 25% and 56% even when the maximum on-track bit temperature is below the Curie temperature. The success of this underheated switching is attributed to sufficiently low anisotropy instead of reduction of Curie temperature. The temperature gradient in the cross-track direction is almost doubled if the optical head width is reduced by half, indicating the possibility of higher areal densities. Moreover, contrary to continuous media, we also found that the power absorption peaks at the bottom of the bit patterned FePt when the media is illuminated from above, which is probably due to stronger coupling there between FePt and the surrounding materials. (C) 2015 AIP Publishing LLC.
C1 [Wang, Sumei; Ghoreyshi, Ali; Victora, R. H.] Univ Minnesota, Dept Elect & Comp Engn, MINT, Minneapolis, MN 55455 USA.
RP Wang, SM (reprint author), Univ Minnesota, Dept Elect & Comp Engn, MINT, Minneapolis, MN 55455 USA.
EM wang3936@umn.edu
FU ASTC/IDEMA
FX The authors acknowledge funding from ASTC/IDEMA.
CR Ghoreyshi A, 2014, J APPL PHYS, V115, DOI 10.1063/1.4864243
   Hovorka O, 2012, APPL PHYS LETT, V101, DOI 10.1063/1.4740075
   Rong CB, 2006, ADV MATER, V18, P2984, DOI 10.1002/adma.200601904
   Sendur K, 2009, APPL PHYS LETT, V94, DOI 10.1063/1.3073049
   Stipe BC, 2010, NAT PHOTONICS, V4, P484, DOI 10.1038/nphoton.2010.90
   Victora R. H., IEEE T MAGN IN PRESS
   Wang S., 2014, IEEE T MAGN, V50
NR 7
TC 0
Z9 0
U1 1
U2 4
PU AMER INST PHYSICS
PI MELVILLE
PA 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
SN 0021-8979
EI 1089-7550
J9 J APPL PHYS
JI J. Appl. Phys.
PD MAY 7
PY 2015
VL 117
IS 17
AR 17C115
DI 10.1063/1.4915908
PG 4
WC Physics, Applied
SC Physics
GA CI7YW
UT WOS:000354984100247
ER

PT J
AU Albrecht, TR
   Arora, H
   Ayanoor-Vitikkate, V
   Beaujour, JM
   Bedau, D
   Berman, D
   Bogdanov, AL
   Chapuis, YA
   Cushen, J
   Dobisz, EE
   Doerk, G
   Gao, H
   Grobis, M
   Gurney, B
   Hanson, W
   Hellwig, O
   Hirano, T
   Jubert, PO
   Kercher, D
   Lille, J
   Liu, ZW
   Mate, CM
   Obukhov, Y
   Patel, KC
   Rubin, K
   Ruiz, R
   Schabes, M
   Wan, L
   Weller, D
   Wu, TW
   Yang, E
AF Albrecht, Thomas R.
   Arora, Hitesh
   Ayanoor-Vitikkate, Vipin
   Beaujour, Jean-Marc
   Bedau, Daniel
   Berman, David
   Bogdanov, Alexei L.
   Chapuis, Yves-Andre
   Cushen, Julia
   Dobisz, Elizabeth E.
   Doerk, Gregory
   Gao, He
   Grobis, Michael
   Gurney, Bruce
   Hanson, Weldon
   Hellwig, Olav
   Hirano, Toshiki
   Jubert, Pierre-Olivier
   Kercher, Dan
   Lille, Jeffrey
   Liu, Zuwei
   Mate, C. Mathew
   Obukhov, Yuri
   Patel, Kanaiyalal C.
   Rubin, Kurt
   Ruiz, Ricardo
   Schabes, Manfred
   Wan, Lei
   Weller, Dieter
   Wu, Tsai-Wei
   Yang, En
TI Bit-Patterned Magnetic Recording: Theory, Media Fabrication, and
   Recording Performance
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Areal density; bit-patterned media; block copolymer; Co alloys; double
   patterning; e-beam lithography; hard disk drive; interface anisotropy;
   magnetic multilayers; magnetic recording; nanoimprint lithography;
   prepatterned servo; self-assembly; sequential infiltration synthesis;
   templated growth; thermal annealing; write synchronization
ID SEQUENTIAL INFILTRATION SYNTHESIS; ATOMIC LAYER DEPOSITION;
   BLOCK-COPOLYMER; THIN-FILMS; NANOIMPRINT LITHOGRAPHY; IMPRINT
   LITHOGRAPHY; SOLVENT-VAPOR; DENSITY; STORAGE; TB/IN(2)
AB Bit-patterned media (BPM) for magnetic recording provides a route to thermally stable data recording at >1 Tb/in(2) and circumvents many of the challenges associated with extending conventional granular media technology. Instead of recording a bit on an ensemble of random grains, BPM comprises a well-ordered array of lithographically patterned isolated magnetic islands, each of which stores 1 bit. Fabrication of BPM is viewed as the greatest challenge for its commercialization. In this paper, we describe a BPM fabrication method that combines rotary-stage e-beam lithography, directed self-assembly of block copolymers, self-aligned double patterning, nanoimprint lithography, and ion milling to generate BPM based on CoCrPt alloy materials at densities up to 1.6 Td/in(2). This combination of novel fabrication technologies achieves feature sizes of <10 nm, which is significantly smaller than what conventional nanofabrication methods used in semiconductor manufacturing can achieve. In contrast to earlier work that used hexagonal arrays of round islands, our latest approach creates BPM with rectangular bit cells, which are advantageous for the integration of BPM with existing hard disk drive technology. The advantages of rectangular bits are analyzed from a theoretical and modeling point of view, and system integration requirements, such as provision of servo patterns, implementation of write synchronization, and providing for a stable head-disk interface, are addressed in the context of experimental results. Optimization of magnetic alloy materials for thermal stability, writeability, and tight switching field distribution is discussed, and a new method for growing BPM islands from a specially patterned underlayer-referred to as templated growth-is presented. New recording results at 1.6 Td/in(2) (roughly equivalent to 1.3 Tb/in(2)) demonstrate a raw error rate <10-2, which is consistent with the recording system requirements of modern hard drives. Extendibility of BPM to higher densities and its eventual combination with energy-assisted recording are explored.
C1 [Albrecht, Thomas R.; Arora, Hitesh; Ayanoor-Vitikkate, Vipin; Beaujour, Jean-Marc; Bedau, Daniel; Berman, David; Bogdanov, Alexei L.; Chapuis, Yves-Andre; Cushen, Julia; Dobisz, Elizabeth E.; Doerk, Gregory; Gao, He; Grobis, Michael; Gurney, Bruce; Hanson, Weldon; Hellwig, Olav; Hirano, Toshiki; Jubert, Pierre-Olivier; Kercher, Dan; Lille, Jeffrey; Liu, Zuwei; Mate, C. Mathew; Obukhov, Yuri; Patel, Kanaiyalal C.; Rubin, Kurt; Ruiz, Ricardo; Schabes, Manfred; Wan, Lei; Weller, Dieter; Wu, Tsai-Wei; Yang, En] HGST, San Jose, CA 95138 USA.
RP Albrecht, TR (reprint author), HGST, San Jose, CA 95138 USA.
EM thomas.albrecht@hgst.com
OI Ruiz, Ricardo/0000-0002-1698-4281
CR Albrecht TR, 2013, IEEE T MAGN, V49, P773, DOI 10.1109/TMAG.2012.2227303
   Albrecht TR, 2009, NANOSCALE MAGNETIC MATERIALS AND APPLICATIONS, P237, DOI 10.1007/978-0-387-85600-1_9
   ANASTASIADIS SH, 1989, PHYS REV LETT, V62, P1852, DOI 10.1103/PhysRevLett.62.1852
   Asbahi M, 2010, J PHYS D APPL PHYS, V43, DOI 10.1088/0022-3727/43/38/385003
   BALES GS, 1991, J VAC SCI TECHNOL A, V9, P145, DOI 10.1116/1.577116
   Bates CM, 2012, SCIENCE, V338, P775, DOI 10.1126/science.1226046
   BATES FS, 1990, ANNU REV PHYS CHEM, V41, P525, DOI 10.1146/annurev.pc.41.100190.002521
   Bencher C., 2012, P SOC PHOTO-OPT INS, V8323
   Bencher C., 2011, P SOC PHOTO-OPT INS, V7970
   Bencher Christopher, 2008, P SOC PHOTO-OPT INS, V6924
   Black CT, 2007, IBM J RES DEV, V51, P605
   Brooks C., 2010, P SOC PHOTO-OPT INS, V7823
   Bunday BD, 2004, PROC SPIE, V5375, P515, DOI 10.1117/12.535926
   Cavicchi KA, 2005, POLYMER, V46, P11635, DOI 10.1016/j.polymer.2005.09.072
   Chappert C, 1998, SCIENCE, V280, P1919, DOI 10.1126/science.280.5371.1919
   Cheng JY, 2008, ADV MATER, V20, P3155, DOI 10.1002/adma.200800826
   Cheng JY, 2010, ACS NANO, V4, P4815, DOI 10.1021/nn100686v
   Choi C, 2011, MICROSYST TECHNOL, V17, P395, DOI 10.1007/s00542-011-1222-1
   CHOU SY, 1994, J APPL PHYS, V76, P6673, DOI 10.1063/1.358164
   Chou SY, 1996, SCIENCE, V272, P85, DOI 10.1126/science.272.5258.85
   Chou SY, 1996, J APPL PHYS, V79, P6101, DOI 10.1063/1.362440
   Costner EA, 2009, ANNU REV MATER RES, V39, P155, DOI 10.1146/annurev-matsci-082908-145336
   Cushen JD, 2014, J POLYM SCI POL PHYS, V52, P36, DOI 10.1002/polb.23408
   Doerk G. S., 2013, P SOC PHOTO-OPT INS, V8680
   Dong Y, 2011, IEEE T MAGN, V47, P2652, DOI 10.1109/TMAG.2011.2148112
   Duwensee M, 2006, IEEE T MAGN, V42, P2489, DOI 10.1109/TMAG.2006.878617
   George SM, 2010, CHEM REV, V110, P111, DOI 10.1021/cr900056b
   Gong B, 2011, CHEM MATER, V23, P3476, DOI 10.1021/cm200694w
   GOTTSCHO RA, 1992, J VAC SCI TECHNOL B, V10, P2133, DOI 10.1116/1.586180
   GRAY DC, 1994, J VAC SCI TECHNOL A, V12, P354, DOI 10.1116/1.578879
   Greaves SJ, 2008, IEEE T MAGN, V44, P3430, DOI 10.1109/TMAG.2008.2002365
   Grobis M., 2010, APPL PHYS LETT, V96
   Grobis MK, 2011, IEEE T MAGN, V47, P6, DOI 10.1109/TMAG.2010.2076798
   Guarini KW, 2001, J VAC SCI TECHNOL B, V19, P2784, DOI 10.1116/1.1421551
   Hammond MR, 2005, MACROMOLECULES, V38, P6575, DOI 10.1021/ma050479l
   Hanchi J, 2011, IEEE T MAGN, V47, P46, DOI 10.1109/TMAG.2010.2071857
   Hauet T., 2009, APPL PHYS LETT, V95
   Hellwig O., 2008, APPL PHYS LETT, V93
   Hellwig O., 2007, APPL PHYS LETT, V90
   Hellwig O., 2010, APPL PHYS LETT, V96
   Hellwig O., 2009, APPL PHYS LETT, V95
   Hellwig O., 2014, J APPL PHYS, V116
   Hellwig O, 2013, SPRINGER TRAC MOD PH, V246, P189, DOI 10.1007/978-3-642-32042-2_6
   Jung YS, 2009, ADV MATER, V21, P2540, DOI 10.1002/adma.200802855
   Kalezhi J, 2012, J APPL PHYS, V111, DOI 10.1063/1.3691947
   Kikitsu A, 2013, IEEE T MAGN, V49, P693, DOI 10.1109/TMAG.2012.2226566
   Krone P, 2010, APPL PHYS LETT, V97, DOI 10.1063/1.3481668
   Kryder MH, 2008, P IEEE, V96, P1810, DOI 10.1109/JPROC.2008.2004315
   Lau J. W., 2008, APPL PHYS LETT, V92
   Lee J., 2011, APPL PHYS LETT, V99
   Li JH, 2011, TRIBOL LETT, V42, P233, DOI 10.1007/s11249-011-9767-9
   Li LP, 2011, MICROSYST TECHNOL, V17, P805, DOI 10.1007/s00542-010-1191-9
   Litvinov D, 2008, IEEE T NANOTECHNOL, V7, P463, DOI 10.1109/TNANO.2008.920183
   Liu CC, 2011, MACROMOLECULES, V44, P1876, DOI 10.1021/ma102856t
   Liu G., 2011, J VAC SCI TECHNOL B, V29, P204
   Lubarda MV, 2011, IEEE T MAGN, V47, P18, DOI 10.1109/TMAG.2010.2089610
   Mansky P, 1997, SCIENCE, V275, P1458, DOI 10.1126/science.275.5305.1458
   Marchon B., 2013, ADV TRIBOL, V2013, DOI 10.1155/2013/521086
   Mate CM, 2012, IEEE T MAGN, V48, P4448, DOI 10.1109/TMAG.2012.2205226
   Mate CM, 2005, IEEE T MAGN, V41, P626, DOI 10.1109/TMAG.2004.838057
   Millward D. B., 2014, P SOC PHOTO-OPT INS, V9054
   Moritz J, 2002, IEEE T MAGN, V38, P1731, DOI 10.1109/TMAG.2002.1017764
   Moser A, 1999, J APPL PHYS, V85, P5018, DOI 10.1063/1.370077
   Murthy AN, 2010, TRIBOL LETT, V38, P47, DOI 10.1007/s11249-009-9570-z
   Myo KS, 2011, IEEE T MAGN, V47, P2660, DOI 10.1109/TMAG.2011.2159965
   Nakajima N, 1998, PHYS REV LETT, V81, P5229, DOI 10.1103/PhysRevLett.81.5229
   NEW RMH, 1994, J VAC SCI TECHNOL B, V12, P3196, DOI 10.1116/1.587499
   Obukhov Y., BIT ERROR R IN PRESS
   Park S, 2009, SCIENCE, V323, P1030, DOI 10.1126/science.1168108
   Peng Q, 2011, ACS NANO, V5, P4600, DOI 10.1021/nn2003234
   Peng Q, 2010, ADV MATER, V22, P5129, DOI 10.1002/adma.201002465
   Pfau B., 2014, APPL PHYS LETT, V105
   Pfau B., 2011, APPL PHYS LETT, V99
   Pisana S., 2014, APPL PHYS LETT, V104
   Resnick DJ, 2003, J VAC SCI TECHNOL B, V21, P2624, DOI 10.1116/1.1618238
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Richter H. J., 2012, J APPL PHYS, V111
   Rose F, 2014, J APPL PHYS, V116, DOI 10.1063/1.4896838
   Ross CA, 2008, MRS BULL, V33, P838, DOI 10.1557/mrs2008.179
   Ruiz R., 2012, J VAN SCI TECHNOL B, V30
   Ruiz R, 2011, ACS NANO, V5, P79, DOI 10.1021/nn101561p
   Schabes ME, 2008, J MAGN MAGN MATER, V320, P2880, DOI 10.1016/j.jmmm.2008.07.035
   Shaw J. M., 2007, J APPL PHYS, V101
   Shimatsu T, 2005, IEEE T MAGN, V41, P566, DOI 10.1109/TMAG.2004.838071
   Shiramatsu T, 2006, IEEE T MAGN, V42, P2513, DOI 10.1109/TMAG.2006.880564
   Shiu W., 2009, P SOC PHOTO-OPT INS, V7274
   Singh S., 2010, P SOC PHOTO-OPT INS, V7823
   Stipe BC, 2010, NAT PHOTONICS, V4, P484, DOI 10.1038/nphoton.2010.90
   STONER EC, 1948, PHILOS TR R SOC S-A, V240, P599, DOI 10.1098/rsta.1948.0007
   Suess D, 2005, APPL PHYS LETT, V87, DOI 10.1063/1.1951053
   Sundar V, 2014, NANO LETT, V14, P1609, DOI 10.1021/nl500061t
   Tada Y, 2012, MACROMOLECULES, V45, P292, DOI 10.1021/ma201822a
   TAGAWA I, 1991, IEEE T MAGN, V27, P4975, DOI 10.1109/20.278712
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Thompson DA, 2000, IBM J RES DEV, V44, P311
   Tirumala VR, 2008, ADV MATER, V20, P1603, DOI 10.1002/adma.200701577
   Toyoda N, 2010, IEEE T MAGN, V46, P1599, DOI 10.1109/TMAG.2010.2048748
   Tsai H.-Y., 2012, J VAC SCI TECHNOL B, V30
   Tseng YC, 2011, J MATER CHEM, V21, P11722, DOI 10.1039/c1jm12461g
   Vasic B., 2004, CODING SIGNAL PROCES, V2
   Vora A, 2014, J PHOTOPOLYM SCI TEC, V27, P419
   Wan L., LIMITS LAME IN PRESS
   Wang SM, 2013, IEEE T MAGN, V49, P3644, DOI 10.1109/TMAG.2012.2237545
   Wood R, 2009, IEEE T MAGN, V45, P917, DOI 10.1109/TMAG.2008.2010676
   Xiao S., 2014, ACS NANO, V9, P11854
   Xiao SG, 2014, J POLYM SCI POL PHYS, V52, P361, DOI 10.1002/polb.23433
   Xiao SAG, 2011, NANOTECHNOLOGY, V22, DOI 10.1088/0957-4484/22/30/305302
   Yaegashi H., 2012, P SOC PHOTO-OPT INS, V8325
   Yang E., TEMPLATE AS IN PRESS
   Yang X, 2013, EVID-BASED COMPL ALT, V2013, P1, DOI DOI 10.1371/J0URNAL.P0NE.0058746
   Yang XM, 2009, ACS NANO, V3, P1844, DOI 10.1021/nn900073r
   Yoshida H, 2013, J PHOTOPOLYM SCI TEC, V26, P55
   Zhu JG, 2008, IEEE T MAGN, V44, P125, DOI 10.1109/TMAG.2007.911031
   Rubin K. A., 2005, U.S. Patent, Patent No. [6 937 421 B2, 6937421]
   Albrecht T. R., 2011, U. S. Patent, Patent No. [7 867 406 B2, 7867406]
   Hellwig O., 2012, U.S. Patent, Patent No. [8 268 461 B1, 8268461]
   Richter H., 2007, U.S. Patent, Patent No. [20070258 161 A1, 20070258161]
NR 117
TC 29
Z9 29
U1 11
U2 54
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD MAY
PY 2015
VL 51
IS 5
AR 0800342
DI 10.1109/TMAG.2015.2397880
PG 42
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA CJ0XU
UT WOS:000355204800001
ER

PT J
AU Carosino, M
   Wood, R
   Park, J
   Schabes, M
AF Carosino, Michael
   Wood, Roger
   Park, Jihoon
   Schabes, Manfred
TI Estimation and Detection on Uniform Hexagonal Array Models
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Data detection; grains per bit (GPB); hexagonal array; magnetic
   recording; patterned media
AB Magnetic recording at the highest areal density on conventional granular recording media uses similar to 10 grains to carry each bit of customer data. Efforts to reduce this number have focused on improving the resolution of the writing and reading processes and, in particular, on improving uniformity of the recording medium and on incorporating knowledge of the recording medium statistics into the detection process. This paper considers the extreme case of data detection on a perfect hexagonal array of grains. This paper looks at two aspects: 1) the estimation of the angle and positioning of the array with respect to the bit-steam and 2) the use of that information to assist data detection. At aggressive densities with very few grains per bit (GPB), the estimation proceeds well and the extra information is helpful in detection. With more GPB, the gains become small.
C1 [Carosino, Michael] Washington State Univ, Sch Elect & Comp Engn, Pullman, WA 99163 USA.
   [Wood, Roger; Park, Jihoon] Hitachi Global Storage Technol, San Jose, CA 95119 USA.
   [Schabes, Manfred] Hitachi Global Storage Technol, San Jose Res Ctr, Hitachi, CA 95135 USA.
RP Carosino, M (reprint author), Washington State Univ, Sch Elect & Comp Engn, Pullman, WA 99163 USA.
EM m.carosino@gmail.com
CR Asbahi M, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2013.2280018
   Carosino M., 2013, P 51 ALL C COMM COMP, P653
   Kavcic A, 2010, IEEE T MAGN, V46, P812, DOI 10.1109/TMAG.2009.2035636
   Krishnan AR, 2009, IEEE T MAGN, V45, P3830, DOI 10.1109/TMAG.2009.2023233
   Pan L, 2011, IEEE T MAGN, V47, P1705, DOI 10.1109/TMAG.2011.2106506
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Shiroishi Y, 2009, IEEE T MAGN, V45, P3816, DOI 10.1109/TMAG.2009.2024879
   Sun SH, 2001, IEEE T MAGN, V37, P1239, DOI 10.1109/20.950807
   Tse D., 2005, FUNDAMENTALS WIRELES, P186
   Wen T., 2014, IEEE TMRC C BERK CA
   Wood R, 2009, J MAGN MAGN MATER, V321, P555, DOI 10.1016/j.jmmm.2008.07.027
NR 11
TC 1
Z9 1
U1 1
U2 1
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD MAY
PY 2015
VL 51
IS 5
AR 3200506
DI 10.1109/TMAG.2014.2369504
PG 6
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA CJ0XU
UT WOS:000355204800009
ER

PT J
AU Naseri, S
   Hodtani, GA
AF Naseri, Sima
   Hodtani, Ghosheh Abed
TI A General Write Channel Model for Bit-Patterned Media Recording
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Bit-patterned media; channel capacity; Markov-1 rate (M1R); symmetric
   information rate (SIR)
ID ERRORS; TB/IN(2)
AB In this paper, we propose a general write channel model for bit-patterned media recording by adding physically justifiable noise and feedback to the previously studied model. First, we study the noisy writing process by discussing several sources of errors causing some extra disturbances during the write process, in addition to data-dependent write synchronization errors that were studied before. Then, for this generalized model with various input and state distributions, we obtain information rate lower and upper bounds including the previous bounds as special cases. Second, a simplified feedback in the proposed channel is considered which stems from the special features of writing, and the behavior of this channel is analyzed in response to the feedback and compared mathematically and numerically with the situation, at which the feedback is ignored.
C1 [Naseri, Sima; Hodtani, Ghosheh Abed] Ferdowsi Univ Mashhad, Dept Elect Engn, Mashhad 9177948974, Iran.
RP Hodtani, GA (reprint author), Ferdowsi Univ Mashhad, Dept Elect Engn, Mashhad 9177948974, Iran.
EM ghodtani@gmail.com
CR Chan KS, 2010, IEEE T MAGN, V46, P804, DOI 10.1109/TMAG.2009.2035635
   Cover TM, 2006, ELEMENTS INFORM THEO
   Han GJ, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2014.2328313
   Hu J, 2007, IEEE T MAGN, V43, P3517, DOI 10.1109/TMAG.2007.898307
   Iyengar AR, 2009, ANN ALLERTON CONF, P620, DOI 10.1109/ALLERTON.2009.5394916
   Iyengar AR, 2011, IEEE T MAGN, V47, P35, DOI 10.1109/TMAG.2010.2080667
   Krishnan AR, 2009, IEEE T MAGN, V45, P3679, DOI 10.1109/TMAG.2009.2023244
   Kryder MH, 2008, P IEEE, V96, P1810, DOI 10.1109/JPROC.2008.2004315
   Muraoka Hiroaki, 2008, IEEE Transactions on Magnetics, V44, P3423, DOI 10.1109/TMAG.2008.2001654
   Muraoka H, 2011, IEEE T MAGN, V47, P26, DOI 10.1109/TMAG.2010.2080354
   Nutter PW, 2008, IEEE T MAGN, V44, P3797, DOI 10.1109/TMAG.2008.2002516
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Terris BD, 2007, MICROSYST TECHNOL, V13, P189, DOI 10.1007/s00542-006-0144-9
   Weissman T., 2013, P IEEE INT C INF THE, P2538
   Wood R, 2009, IEEE T MAGN, V45, P917, DOI 10.1109/TMAG.2008.2010676
   Wu T., 2014, IEEE T MAGN, V50
   Zhang SH, 2013, IEEE T MAGN, V49, P2582, DOI 10.1109/TMAG.2013.2250265
   Zhang SH, 2010, IEEE T MAGN, V46, P1363, DOI 10.1109/TMAG.2010.2040713
   Zhu JG, 2008, IEEE T MAGN, V44, P125, DOI 10.1109/TMAG.2007.911031
NR 19
TC 0
Z9 0
U1 1
U2 1
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD MAY
PY 2015
VL 51
IS 5
AR 3000612
DI 10.1109/TMAG.2014.2364794
PG 12
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA CJ0XU
UT WOS:000355204800007
ER

PT J
AU Nakagawa, M
   Kobayashi, K
   Hattori, AN
   Ito, S
   Hiroshiba, N
   Kubo, S
   Tanaka, H
AF Nakagawa, Masaru
   Kobayashi, Kei
   Hattori, Azusa N.
   Ito, Shunya
   Hiroshiba, Nobuya
   Kubo, Shoichi
   Tanaka, Hidekazu
TI Selection of Di(meth)acrylate Monomers for Low Pollution of Fluorinated
   Mold Surfaces in Ultraviolet Nanoimprint Lithography
SO LANGMUIR
LA English
DT Article
ID BIT-PATTERNED MEDIA; UV NANOIMPRINT; IMPRINT; RESIN
AB We used fluorescence microscopy to show that low adsorption of resin components by a mold surface was necessary for continuous ultraviolet (UV) nanoimprinting, as well as generation of a low release energy on detachment of a cured resin from a template mold. This is because with low mold pollution, fracture on demolding occurred at the interface between the mold and cured resin surfaces rather than at the outermost part of the cured resin. To achieve low mold pollution, we investigated the radical photopolymerization behaviors of fluorescent UV-curable resins and the mechanical properties (fracture toughness, surface hardness, and release energy) of the cured resin films for six types of di(meth)acrylate-based monomers with similar chemical structures, in which polar hydroxy and aromatic bulky bisphenol moieties and methacryloyl or acryloyl reactive groups were present or absent. As a result, we selected bisphenol A glycerolate dimethacrylate (BPAGDM), which contains hydroxy, bisphenol, and methacryloyl moieties, which give good mechanical properties, monomer bulkiness, and mild reactivity, respectively, as a suitable base monomer for UV nanoimprinting under an easily condensable alternative chlorofluorocarbon (HFC-245fa) atmosphere. The fluorescent UV-curable BPAGDM resin was used for UV nanoimprinting and lithographic reactive ion etching of a silicon surface with 32 nm line-and-space patterns without a hard metal layer.
C1 [Nakagawa, Masaru; Kobayashi, Kei; Ito, Shunya; Hiroshiba, Nobuya; Kubo, Shoichi] Tohoku Univ, Polymer Hybrid Mat Res Ctr, Inst Multidisciplinary Res Adv Mat IMRAM, Aoba Ku, Sendai, Miyagi 9808577, Japan.
   [Nakagawa, Masaru] Japan Sci & Technol Agcy JST, Core Res Evolut Sci & Technol CREST, Chiyoda Ku, Tokyo 1020076, Japan.
   [Hattori, Azusa N.; Tanaka, Hidekazu] Osaka Univ, Inst Sci & Ind Res ISIR, Ibaraki, Osaka 5670047, Japan.
RP Nakagawa, M (reprint author), Tohoku Univ, Polymer Hybrid Mat Res Ctr, Inst Multidisciplinary Res Adv Mat IMRAM, Aoba Ku, 2-1-1 Katahira, Sendai, Miyagi 9808577, Japan.
EM nakagawa@tagen.tohoku.ac.jp
RI Hiroshiba, Nobuya/E-8128-2010
OI Hiroshiba, Nobuya/0000-0003-3459-150X
FU Nano-Macro Materials, Devices and System Research Alliance (MEXT)
FX This work was supported in part by the Nano-Macro Materials, Devices and
   System Research Alliance (MEXT). The authors thank Advantest for the
   assistance of CD-SEM measurement.
CR Albrecht TR, 2013, IEEE T MAGN, V49, P773, DOI 10.1109/TMAG.2012.2227303
   Austin MD, 2004, APPL PHYS LETT, V84, P5299, DOI 10.1063/1.1766071
   Austin MD, 2005, NANOTECHNOLOGY, V16, P1058, DOI 10.1088/0957-4484/16/8/010
   Beaulieu MR, 2014, ACS PHOTONICS, V1, P799, DOI 10.1021/ph500078f
   Bender M, 2002, MICROELECTRON ENG, V61-2, P407, DOI 10.1016/S0167-9317(02)00470-7
   Bublat T, 2011, NANOTECHNOLOGY, V22, DOI 10.1088/0957-4484/22/31/315301
   CHOU SY, 1995, APPL PHYS LETT, V67, P3114, DOI 10.1063/1.114851
   Haisma J, 1996, J VAC SCI TECHNOL B, V14, P4124, DOI 10.1116/1.588604
   Hayashi T., 2007, J PLASMA FUSION RES, V83, P341
   Higashiki T, 2011, J MICRO-NANOLITH MEM, V10, DOI 10.1117/1.3658024
   Hiroshima H, 2007, JPN J APPL PHYS 1, V46, P6391, DOI 10.1143/JJAP.46.6391
   Kim JY, 2008, APPL SURF SCI, V254, P4793, DOI 10.1016/j.apsusc.2008.01.095
   Kobayashi K, 2011, JPN J APPL PHYS, V50, DOI 10.1143/JJAP.50.06GK02
   Kobayashi K, 2010, J VAC SCI TECHNOL B, V28, pC6M50, DOI 10.1116/1.3507440
   Kobayashi K, 2010, JPN J APPL PHYS, V49, DOI 10.1143/JJAP.49.06GL07
   Kohno A, 2010, JPN J APPL PHYS, V49, DOI 10.1143/JJAP.49.06GL12
   Kubo S, 2013, JPN J APPL PHYS, V52, DOI 10.7567/JJAP.52.06GJ01
   Li WD, 2012, J VAC SCI TECHNOL B, V30, DOI 10.1116/1.4758768
   Lozano G, 2014, NANOSCALE, V6, P9223, DOI 10.1039/c4nr01391c
   Malloy M, 2011, J MICRO-NANOLITH MEM, V10, DOI 10.1117/1.3642641
   Matsui S, 2015, MICROELECTRON ENG, V133, P134, DOI 10.1016/j.mee.2014.10.016
   Ogawa T, 2011, PROC SPIE, V7970, DOI 10.1117/12.871627
   Shimazaki Y, 2013, ACS APPL MATER INTER, V5, P7661, DOI 10.1021/am402781j
   Tachi S., 1994, J JPN SOC PRECIS ENG, V60, P1559, DOI [10.2493/jjspe.60.1559., DOI 10.2493/JJSPE.60.1559]
   Truffier-Boutry D, 2010, MICROELECTRON ENG, V87, P122, DOI 10.1016/j.mee.2009.06.004
   Tsunooka M., 2008, OPTIMIZATION UV CURI, P18
   Wu K, 2007, LANGMUIR, V23, P1166, DOI 10.1021/la061736y
   Yabuki Y., 2013, AIP ADV, V3, DOI [10.1063/1.4827155, DOI 10.1063/1.4827155]
   Yang XM, 2008, J VAC SCI TECHNOL B, V26, P2604, DOI 10.1116/1.2978487
   Yang Y, 2014, ACS APPL MATER INTER, V6, P19282, DOI 10.1021/am505303a
   Yusof N. B., 2013, MICROELECTRON ENG, V110, P163, DOI [10.1016/j.mee.2013.03.041, DOI 10.1016/J.MEE.2013.03.041]
NR 31
TC 8
Z9 8
U1 2
U2 12
PU AMER CHEMICAL SOC
PI WASHINGTON
PA 1155 16TH ST, NW, WASHINGTON, DC 20036 USA
SN 0743-7463
J9 LANGMUIR
JI Langmuir
PD APR 14
PY 2015
VL 31
IS 14
BP 4188
EP 4195
DI 10.1021/acs.langmuir.5b00325
PG 8
WC Chemistry, Multidisciplinary; Chemistry, Physical; Materials Science,
   Multidisciplinary
SC Chemistry; Materials Science
GA CG3JT
UT WOS:000353177200018
PM 25793911
ER

PT J
AU Kandhakumari, G
   Stephen, S
   Sivakumar, S
   Narayanan, S
AF Kandhakumari, G.
   Stephen, S.
   Sivakumar, S.
   Narayanan, S.
TI Spoligotype patterns of Mycobacterium tuberculosis isolated from extra
   pulmonary tuberculosis patients in Puducherry, India
SO INDIAN JOURNAL OF MEDICAL MICROBIOLOGY
LA English
DT Article
DE Extrapulmonary tuberculosis; genotyping; Mycobacterium Growth Indicator
   Tube system 960; Mycobacterium tuberculosis; spoligotyping
ID DRUG-RESISTANCE; IS6110-RFLP; DIVERSITY; EPIDEMIOLOGY; MUMBAI; DELHI
AB Purpose: Genotyping studies like spoligotyping are valuable tools in understanding the genetic diversity and epidemiology of Mycobacterium tuberculosis. Though there are reports of spoligotyping of M. tuberculosis isolates from pulmonary specimens from different parts of India, spoligotyping of extra pulmonary tuberculosis isolates are very few. Puducherry has not yet recorded spoligopatterns of M. tuberculosis from either pulmonary or extra pulmonary (EPTB) specimens. The aim of this study is to analyze the spoligotype patterns of EPTB strains circulating in Puducherry and neighboring districts of Tamil Nadu. Materials and Methods: During June 2011 to December 2013, 570 EPTB specimens were processed by culturing on to Lowenstein Jensen (LJ) medium and automated Mycobacterium Growth Indicator Tube system (MGIT960). Identification of M. tuberculosis was carried out as per standard procedures, and MPT 64 antigen positivity in a commercial immunochromatography kit. Spoligotyping was carried out at National Institute of Research in Tuberculosis (ICMR), Chennai. Results: M. tuberculosis was isolated from 67 single EPTB specimens (11.8%) like pus/cold abscess (34), TB spine (10), pleural fluid (10), urine (5), tissue bit (2), lymph nodes (2), ascitic fluid (2), synovial fluid (1) and endometrial curetting (1). Among 67 isolates with 41 spoligopatterns, EAI lineage with 28 isolates (41.8%) predominated followed by 18 orphans (26.9%), 10 Beijing (14.9%) and 8 U (11.9%). BOVIS1_BCG (ST482), T1-T2 (ST78) and H3 (ST50) were represented by one strain each (1.5%). Conclusions: Spoligotyping plays a significant role in the epidemiology of tuberculosis. Three spoligotypes, T1-T2 (ST78), EAI6 (ST292) and U (ST1429) are reported for the first time in India.
C1 [Kandhakumari, G.] Mahatma Gandhi Med Coll & Res Inst, Dept Microbiol, Pondicherry, India.
   [Narayanan, S.] Natl Inst Res TB NIRT ICMR, Dept Immunol, Chennai, Tamil Nadu, India.
EM stephens4950@gmail.com
CR Abe C, 1999, J CLIN MICROBIOL, V37, P3693
   Chatterjee A, 2010, J CLIN MICROBIOL, V48, P3593, DOI 10.1128/JCM.00430-10
   Desikan P, 2012, INDIAN J MED MICROBI, V30, P470, DOI 10.4103/0255-0857.103774
   Forbes BA, 2002, BAILEY SCOTTS DIAGNO, P478
   Gutierrez MC, 2006, EMERG INFECT DIS, V12, P1367
   Joseph BV, 2013, INFECT GENET EVOL, V16, P157, DOI 10.1016/j.meegid.2013.01.012
   Kamerbeek J, 1997, J CLIN MICROBIOL, V35, P907
   Kulkarni S, 2005, RES MICROBIOL, V156, P588, DOI 10.1016/j.resmic.2005.01.005
   Mathuria JP, 2008, INFECT GENET EVOL, V8, P346, DOI 10.1016/j.meegid.2008.02.005
   Perumal AK, 2013, INT J MED SCI PUBLIC, V2, P465
   Sankar MM, 2013, TUBERCULOSIS, V93, P75, DOI 10.1016/j.tube.2012.10.005
   Shanmugam S, 2011, INFECT GENET EVOL, V11, P980, DOI 10.1016/j.meegid.2011.03.011
   Sharma P, 2008, INFECT GENET EVOL, V8, P621, DOI 10.1016/j.meegid.2008.05.002
   Singh UB, 2004, EMERG INFECT DIS, V10, P1138
   Singh UB, 2007, INFECT GENET EVOL, V7, P441, DOI 10.1016/j.meegid.2007.01.003
   Thomas SK, 2011, PLOS ONE, V6, DOI 10.1371/journal.pone.0027584
   Vadwai V, 2012, TUBERCULOSIS, V92, P264, DOI 10.1016/j.tube.2012.01.002
   Varma-Basil M, 2011, MEM I OSWALDO CRUZ, V106, P524, DOI 10.1590/S0074-02762011000500002
NR 18
TC 1
Z9 1
U1 0
U2 1
PU MEDKNOW PUBLICATIONS & MEDIA PVT LTD
PI MUMBAI
PA B-9, KANARA BUSINESS CENTRE, OFF LINK RD, GHAKTOPAR-E, MUMBAI, 400075,
   INDIA
SN 0255-0857
EI 1998-3646
J9 INDIAN J MED MICROBI
JI Indian J. Med. Microbiol.
PD APR-JUN
PY 2015
VL 33
IS 2
BP 267
EP 270
DI 10.4103/0255-0857.154871
PG 4
WC Immunology
SC Immunology
GA DE7UY
UT WOS:000370843400013
PM 25865980
ER

PT J
AU Furrer, S
   Lantz, MA
   Engelen, JBC
   Pantazi, A
   Rothuizen, HE
   Cideciyan, RD
   Cherubini, G
   Haeberle, W
   Jelitto, J
   Eleftheriou, E
   Oyanagi, M
   Kurihashi, Y
   Ishioroshi, T
   Kaneko, T
   Suzuki, H
   Harasawa, T
   Shimizu, O
   Ohtsu, H
   Noguchi, H
AF Furrer, Simeon
   Lantz, Mark A.
   Engelen, Johan B. C.
   Pantazi, Angeliki
   Rothuizen, Hugo E.
   Cideciyan, Roy D.
   Cherubini, Giovanni
   Haeberle, Walter
   Jelitto, Jens
   Eleftheriou, Evangelos
   Oyanagi, Masahito
   Kurihashi, Yuichi
   Ishioroshi, Takahiro
   Kaneko, Tetsuya
   Suzuki, Hiroyuki
   Harasawa, Takeshi
   Shimizu, Osamu
   Ohtsu, Hiroki
   Noguchi, Hitoshi
TI 85.9 Gb/in(2) Recording Areal Density on Barium Ferrite Tape
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT 25th Magnetic Recording Conference (TMRC)
CY AUG 11-14, 2014
CL Berkeley, CA
SP Seagate Technol, LSI Corp, Marvell Technol Grp Ltd, Western Digital Corp, HGST, Toshiba Corp, Hoya Corp, Headway Technologies Corp, Ube Mat Ind Ltd, Veeco Instruments, JX Nippon Min & Met, Hysitron, Heraeus MTD, Showa Denko Corp, Carnegie Mellon Univ, Data Storage Syst Ctr, Stanford Univ, Ctr Magnet Nanotechnol, Univ Alabama, Ctr Mat Informat Technol, Univ Calif Berkeley, Comp Mech Lab, Univ Calif San Diego, Ctr Magnet Recording Res, Univ Minnesota, Ctr Micromagnet & Informat Technologies
DE Magnetic recording; magnetic tape recording; signal detection; tracking
ID STEPPED-POLE WRITER; SIDE ERASURE; SERVO
AB The recording performance of a new magnetic tape based on perpendicularly oriented barium ferrite particles was investigated using a 90-nm-wide giant-magnetoresistive reader and a prototype enhanced-field write head. A linear density of 600 kb/in with a postdetection byte-error rate <3 x 10(-2) was demonstrated based on measured recording data and a software read channel that used a noise-predictive maximum likelihood detection scheme. Using a new iterative decoding architecture, a user bit-error rate of <1 x 10(-20) can be achieved at this operating point. To facilitate aggressive scaling of the track density, we made several advances in the area of the track-following servo. First, we developed an experimental low-noise tape transport. Second, we implemented an optimized servo channel that together with an experimental timing-based servo pattern enables the generation of position estimates with nanoscale resolution at a high update rate. Third, we developed a field-programmable gate array-based prototyping platform in which we have implemented the servo channel and an H-infinity-based track-following controller, enabling real-time closed-loop track-following experiments. Combining these technologies, we achieved a position-error signal (PES) with a standard deviation of 10.3 nm. This magnitude of PES in combination with a 90-nm-wide reader allows the writing and reading of 177-nm-wide tracks at 600 kb/in, for an equivalent areal density of 85.9 Gb/in(2). This paper clearly demonstrates the continued scaling potential of tape technologies based on low-cost particulate media.
C1 [Furrer, Simeon; Lantz, Mark A.; Engelen, Johan B. C.; Pantazi, Angeliki; Rothuizen, Hugo E.; Cideciyan, Roy D.; Cherubini, Giovanni; Haeberle, Walter; Jelitto, Jens; Eleftheriou, Evangelos] IBM Res Zurich, CH-8803 Ruschlikon, Switzerland.
   [Oyanagi, Masahito; Kurihashi, Yuichi; Ishioroshi, Takahiro; Kaneko, Tetsuya; Suzuki, Hiroyuki; Harasawa, Takeshi; Shimizu, Osamu; Ohtsu, Hiroki; Noguchi, Hitoshi] Fujifilm Corp, Recording Media Res Labs, Odawara, Kanagawa 2500001, Japan.
RP Lantz, MA (reprint author), IBM Res Zurich, CH-8803 Ruschlikon, Switzerland.
EM mla@zurich.ibm.com
CR Barrett RC, 1998, IEEE T MAGN, V34, P1872, DOI 10.1109/20.706730
   Bertram H. N., 1994, THEORY MAGNETIC RECO
   Cherubini G., 2007, P 17 ANN ASME INF ST, P160
   Cherubini G, 2011, IEEE T MAGN, V47, P137, DOI 10.1109/TMAG.2010.2076797
   Coker JD, 1998, IEEE T MAGN, V34, P110, DOI 10.1109/20.663468
   Engelen J. B. C., 2014, TMRC, P111
   Engelen JBC, 2015, IEEE T MAGN, V51, DOI 10.1109/TMAG.2015.2408259
   Furrer S., 2014, 25 TMRC, P115
   Furrer S, 2013, IEEE T MAGN, V49, P3706, DOI 10.1109/TMAG.2013.2239275
   Furrer S, 2012, IEEE T MAGN, V48, P4578, DOI 10.1109/TMAG.2012.2195647
   Jubert PO, 2013, IEEE T MAGN, V49, P3733, DOI 10.1109/TMAG.2013.2240268
   Jubert PO, 2012, IEEE T MAGN, V48, P3543, DOI 10.1109/TMAG.2012.2194732
   Justesen Jorn, 2007, P IEEE INF THEOR WOR, P174
   Lantz MA, 2012, IEEE T CONTR SYST T, V20, P369, DOI 10.1109/TCST.2011.2177979
   Mittelholzer T, 2008, IEEE ICC, P1991, DOI 10.1109/ICC.2008.382
   Pantazi A, 2012, MECHATRONICS, V22, P361, DOI 10.1016/j.mechatronics.2011.07.013
   Shimizu O, 2013, IEEE T MAGN, V49, P3767, DOI 10.1109/TMAG.2013.2239962
   Shimizu O, 2010, IEEE T MAGN, V46, P1607, DOI 10.1109/TMAG.2010.2040371
   Skogestad S., 1996, MULTIVARIABLE FEEDBA
   Wang S. X., 1999, MAGNETIC INFORM STOR
   Williams M. L., 1971, P AIP C, V5, P738
   Bolasna S., 2011, U. S. Patent, Patent No. [7 898 769, 7898769]
NR 22
TC 8
Z9 8
U1 0
U2 1
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD APR
PY 2015
VL 51
IS 4
AR 3100207
DI 10.1109/TMAG.2014.2355875
PN 1
PG 7
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA CJ0XF
UT WOS:000355202600010
ER

PT J
AU Hwang, E
   Oenning, T
   Mathew, G
   Rahgozar, P
   Tedja, S
   Fang, H
   Garfunkel, G
   Wu, Y
   Hu, D
   Duquette, P
   Fitch, K
   Rabbitt, C
   Petrizzi, J
   Wilson, B
   Rauschmayer, R
AF Hwang, Euiseok
   Oenning, Travis
   Mathew, George
   Rahgozar, Parviz
   Tedja, Suharli
   Fang, Han
   Garfunkel, Glen
   Wu, Yan
   Hu, David
   Duquette, Paul
   Fitch, Ken
   Rabbitt, Chad
   Petrizzi, Joseph
   Wilson, Bruce
   Rauschmayer, Richard
TI Skew-Dependent Performance Evaluation of Array-Reader-Based Magnetic
   Recording With Dual-Reader
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT 25th Magnetic Recording Conference (TMRC)
CY AUG 11-14, 2014
CL Berkeley, CA
SP Seagate Technol, LSI Corp, Marvell Technol Grp Ltd, Western Digital Corp, HGST, Toshiba Corp, Hoya Corp, Headway Technologies Corp, Ube Mat Ind Ltd, Veeco Instruments, JX Nippon Min & Met, Hysitron, Heraeus MTD, Showa Denko Corp, Carnegie Mellon Univ, Data Storage Syst Ctr, Stanford Univ, Ctr Magnet Nanotechnol, Univ Alabama, Ctr Mat Informat Technol, Univ Calif Berkeley, Comp Mech Lab, Univ Calif San Diego, Ctr Magnet Recording Res, Univ Minnesota, Ctr Micromagnet & Informat Technologies
DE 2-D equalizer; array-reader; array-reader-based magnetic recording
   (ARMR); hard disk drives (HDDs); two-dimensional magnetic recording
   (TDMR)
ID BIT-PATTERNED MEDIA
AB Array-reader-based magnetic recording (ARMR) shows potential to achieve areal density capability (ADC) beyond 1 Tb/in(2) by jointly processing multiple readback streams. Dual-reader ARMR with two read sensors and associated read channel signal processing algorithms are currently being actively investigated. In this paper, dual-reader ARMR performance is evaluated focusing on skew-induced variation in cross-track separation (CTS) between the two read sensors. Spin-stand captured waveforms based evaluation is presented for the cases where a dual-reader with certain CTS and skew is emulated using captures from a single-reader at different cross-track locations as well as for the case of actual dual-reader-based captures, where the latter also accounts for head rotation. Based on bit error rate scan along cross-track under various squeezed recording and skew conditions, squeeze-to-death margin-based ADC gain of ARMR is predicted. Dual-reader ARMR shows 5%-10% ADC gain over single-reader for CTS less than 0.6 track pitch, while showing limited gains for larger CTS. Also presented is the performance evaluation of dual-reader ARMR on spin-stand using a hardware accelerated ARMR performance evaluation platform, called Stingray, which uses four Avago read channel silicon chips and a customized field programmable gate array to enable high-speed joint equalization and detection using dual-reader readback streams.
C1 [Hwang, Euiseok; Oenning, Travis; Mathew, George; Rahgozar, Parviz; Tedja, Suharli; Fang, Han; Duquette, Paul; Fitch, Ken; Rabbitt, Chad; Petrizzi, Joseph; Wilson, Bruce; Rauschmayer, Richard] Avago Technol, San Jose, CA 95131 USA.
   [Hwang, Euiseok] Gwangju Inst Sci & Technol, Kwangju 500712, South Korea.
   [Garfunkel, Glen; Wu, Yan; Hu, David] Headway Technol Inc, Milpitas, CA 95035 USA.
RP Hwang, E (reprint author), Avago Technol, San Jose, CA 95131 USA.
EM euiseokh@gist.ac.kr
CR Albrecht TR, 2013, IEEE T MAGN, V49, P773, DOI 10.1109/TMAG.2012.2227303
   Chan KS, 2009, IEEE T MAGN, V45, P3837, DOI 10.1109/TMAG.2009.2024001
   Elidrissi MR, 2011, IEEE T MAGN, V47, P3685, DOI 10.1109/TMAG.2011.2156770
   Gantz J., 2010, 925 IDC
   Greaves S, 2009, IEEE T MAGN, V45, P3823, DOI 10.1109/TMAG.2009.2021663
   Hwang E., 2010, IEEE INT C COMM ICC, P1
   Hwang E, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2014.2320735
   Kavcic A, 2010, IEEE T MAGN, V46, P812, DOI 10.1109/TMAG.2009.2035636
   Kryder MH, 2008, P IEEE, V96, P1810, DOI 10.1109/JPROC.2008.2004315
   Mathew G, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2013.2283221
   Richter HJ, 2007, J PHYS D APPL PHYS, V40, pR149, DOI 10.1088/0022-3727/40/9/R01
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Shiroishi Y, 2009, IEEE T MAGN, V45, P3816, DOI 10.1109/TMAG.2009.2024879
   Wood R, 2009, IEEE T MAGN, V45, P917, DOI 10.1109/TMAG.2008.2010676
   Wu AQ, 2013, IEEE T MAGN, V49, P779, DOI 10.1109/TMAG.2012.2219513
   Zhu JG, 2008, IEEE T MAGN, V44, P125, DOI 10.1109/TMAG.2007.911031
NR 16
TC 3
Z9 3
U1 0
U2 0
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD APR
PY 2015
VL 51
IS 4
AR 3000307
DI 10.1109/TMAG.2014.2357774
PN 1
PG 7
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA CJ0XF
UT WOS:000355202600007
ER

PT J
AU Shahsavari, B
   Keikha, E
   Zhang, F
   Horowitz, R
AF Shahsavari, Behrooz
   Keikha, Ehsan
   Zhang, Fu
   Horowitz, Roberto
TI Adaptive Repetitive Control Design With Online Secondary Path Modeling
   and Application to Bit-Patterned Media Recording
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT 25th Magnetic Recording Conference (TMRC)
CY AUG 11-14, 2014
CL Berkeley, CA
SP Seagate Technol, LSI Corp, Marvell Technol Grp Ltd, Western Digital Corp, HGST, Toshiba Corp, Hoya Corp, Headway Technologies Corp, Ube Mat Ind Ltd, Veeco Instruments, JX Nippon Min & Met, Hysitron, Heraeus MTD, Showa Denko Corp, Carnegie Mellon Univ, Data Storage Syst Ctr, Stanford Univ, Ctr Magnet Nanotechnol, Univ Alabama, Ctr Mat Informat Technol, Univ Calif Berkeley, Comp Mech Lab, Univ Calif San Diego, Ctr Magnet Recording Res, Univ Minnesota, Ctr Micromagnet & Informat Technologies
DE Active disturbance cancelation; adaptive control; bit patterned media
   recording (BPMR); hard disk drives (HDDs); repetitive control;
   track-following servos
ID REPEATABLE RUNOUT COMPENSATION; LMS ALGORITHM; NOISE; CONVERGENCE
AB This paper presents an adaptive repetitive controller for active tracking (rejecting) of unknown periodic trajectories (disturbances). The proposed control law is based on a modified filtered-x least mean squares (MFX-LMS) algorithm with a novel variable step size that improves the convergence rate and fades the steady state excess error in a stochastic environment. A novel secondary path modeling scheme is also proposed to adaptively compensate for the dynamic mismatches between the internal model of the MFX-LMS and the real dynamic system in an online fashion. We further discuss the application of this adaptive controller in servo mechanisms for hard disk drives (HDDs) that use bit patterned media recording in which full spectrum tracking of a periodic trajectory is crucial. Finally, comprehensive numerical simulations and experimental implementations are presented for an HDD servo system that is subjected to periodic disturbances known as repeatable run-out.
C1 [Shahsavari, Behrooz; Keikha, Ehsan; Zhang, Fu; Horowitz, Roberto] Univ Calif Berkeley, Dept Mech Engn, Berkeley, CA 94720 USA.
RP Shahsavari, B (reprint author), Univ Calif Berkeley, Dept Mech Engn, Berkeley, CA 94720 USA.
EM behrooz@berkeley.edu
CR Abramovitch D, 2002, IEEE CONTR SYST MAG, V22, P28, DOI 10.1109/MCS.2002.1003997
   Akhtar MT, 2006, IEEE T AUDIO SPEECH, V14, P720, DOI 10.1109/TSA.2005.855829
   Al Mamun A., 2007, HARD DISK DRIVE MECH, V23
   Bjarnason E., 1992, P EUS 92 6 EUR SIGN, P1053
   Chen YQ, 2006, IEEE DECIS CONTR P, P2338, DOI 10.1109/CDC.2006.377581
   CHEW KK, 1989, AMER CONTR CONF CONF, P540
   Elliott S. J., 1985, APPL ADAPTIVE FILTER, V86, P32628
   ERIKSSON LJ, 1989, J ACOUST SOC AM, V85, P797, DOI 10.1121/1.397552
   FEUER A, 1985, IEEE T ACOUST SPEECH, V33, P222, DOI 10.1109/TASSP.1985.1164493
   Kempf C., 1993, IEEE Control Systems Magazine, V13, P48, DOI 10.1109/37.248004
   KIM IS, 1994, J ACOUST SOC AM, V95, P3379, DOI 10.1121/1.409957
   Ljung L., 1983, THEORY PRACTICE RECU
   Lopes PAC, 2004, IEEE SIGNAL PROC LET, V11, P148, DOI 10.1109/LSP.2003.821745
   MESSNER W, 1991, IEEE T AUTOMAT CONTR, V36, P188, DOI 10.1109/9.67294
   Regalia Phillip, 1994, ADAPTIVE IIR FILTERI, V90
   Ross C, 2001, ANN REV MATER RES, V31, P203, DOI 10.1146/annurev.matsci.31.1.203
   SACKS AH, 1995, IEEE T MAGN, V31, P1031, DOI 10.1109/20.364780
   Shahsavari B., 2014, P ASME C INF STOR PR
   Shahsavari B., 2014, P ASME DYN SYST CONT
   UNGERBOECK G, 1972, IBM J RES DEV, V16, P546
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
   Wu SC, 2006, P AMER CONTR CONF, V1-12, P382
NR 22
TC 9
Z9 9
U1 0
U2 3
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD APR
PY 2015
VL 51
IS 4
AR 9401108
DI 10.1109/TMAG.2014.2364737
PN 1
PG 8
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA CJ0XF
UT WOS:000355202600028
ER

PT J
AU Victora, RH
   Wang, SM
   Huang, PW
   Ghoreyshi, A
AF Victora, R. H.
   Wang, Sumei
   Huang, Pin-Wei
   Ghoreyshi, Ali
TI Noise Mitigation in Granular and Bit-Patterned Media for HAMR
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT 25th Magnetic Recording Conference (TMRC)
CY AUG 11-14, 2014
CL Berkeley, CA
SP Seagate Technol, LSI Corp, Marvell Technol Grp Ltd, Western Digital Corp, HGST, Toshiba Corp, Hoya Corp, Headway Technologies Corp, Ube Mat Ind Ltd, Veeco Instruments, JX Nippon Min & Met, Hysitron, Heraeus MTD, Showa Denko Corp, Carnegie Mellon Univ, Data Storage Syst Ctr, Stanford Univ, Ctr Magnet Nanotechnol, Univ Alabama, Ctr Mat Informat Technol, Univ Calif Berkeley, Comp Mech Lab, Univ Calif San Diego, Ctr Magnet Recording Res, Univ Minnesota, Ctr Micromagnet & Informat Technologies
DE Bit-patterned media (BPM); FePt; granular media; heat assisted magnetic
   recording (HAMR); noise
ID CHROMIUM
AB Feasibility of heat assisted magnetic recording for granular and bit-patterned media (BPM) is evaluated in the context of various noises. Using micromagnetic simulation of renormalized media cells, we predict that the jitter is only 0.58 nm at a head speed of 10 m/s for the bilayer structure of FeRh/FePt when the grain size is 3.2 nm, validating the possibility of 6 Tb/in(2). We propose a new structure FePt/Cr/X/FePt that uses a Cr layer to produce an antiferromagnetic coupling that mimics the behavior of FeRh/FePt. We also confirmed the consistency of our renormalization approach for cell sizes from 1.0 to 1.5 nm. The temperature distribution is analyzed for BPM for areal densities of 2.2-5 Tb/in(2). We have predicted the maximum tolerable on-track bit temperatures at different areal densities and filling factors and substantiate the feasibility of BPM at 5 Tb/in(2) by observing successful and deterministic switching under a realistic temperature distribution.
C1 [Victora, R. H.; Wang, Sumei; Huang, Pin-Wei; Ghoreyshi, Ali] Univ Minnesota, Dept Elect & Comp Engn, Ctr Micromagnet & Informat Technol, Minneapolis, MN 55455 USA.
RP Wang, SM (reprint author), Univ Minnesota, Dept Elect & Comp Engn, Ctr Micromagnet & Informat Technol, Minneapolis, MN 55455 USA.
EM wang3936@umn.edu
CR Alloyeau D, 2009, NAT MATER, V8, P940, DOI [10.1038/nmat2574, 10.1038/NMAT2574]
   Challener W. A., 2008, OPEN OPT J, V2, P67, DOI 10.2174/1874328500802010067
   Chepulskii RV, 2005, PHYS REV B, V72, DOI 10.1103/PhysRevB.72.134205
   Chernyshov A., 2014, J APPL PHYS, V115
   Evans RFL, 2012, APPL PHYS LETT, V100, DOI 10.1063/1.3691196
   Ghoreyshi A, 2014, J APPL PHYS, V115, DOI 10.1063/1.4864243
   GRIER BH, 1985, PHYS REV B, V31, P2892, DOI 10.1103/PhysRevB.31.2892
   Huang PW, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2014.2318040
   Huang P.-W., 2014, J APPL PHYS, V115
   Rong CB, 2007, J APPL PHYS, V102, DOI 10.1063/1.2773694
   Sendur K., 2009, APPL PHYS LETT, V94
   THORP JS, 1986, J MATER SCI, V21, P3091, DOI 10.1007/BF00553341
   Victora RH, 2013, IEEE T MAGN, V49, P751, DOI 10.1109/TMAG.2012.2219300
   Wang S., 2014, IEEE T MAGN, V50
   Wang XB, 2013, IEEE T MAGN, V49, P686, DOI 10.1109/TMAG.2012.2221689
   Xu BX, 2013, IEEE T MAGN, V49, P2559, DOI 10.1109/TMAG.2013.2257703
   Zabel H, 1999, J PHYS-CONDENS MAT, V11, P9303, DOI 10.1088/0953-8984/11/48/301
   Zhu JG, 2013, IEEE T MAGN, V49, P765, DOI 10.1109/TMAG.2012.2231855
NR 18
TC 3
Z9 3
U1 1
U2 7
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD APR
PY 2015
VL 51
IS 4
AR 3200307
DI 10.1109/TMAG.2014.2353660
PN 1
PG 7
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA CJ0XF
UT WOS:000355202600016
ER

PT J
AU Qiu, WL
   Chang, L
   Lee, D
   Dannangoda, C
   Martirosyan, K
   Litvinov, D
AF Qiu, Wenlan
   Chang, Long
   Lee, Dahye
   Dannangoda, Chamath
   Martirosyan, Karen
   Litvinov, Dmitri
TI Patterning of Magnetic Thin Films and Multilayers Using Nanostructured
   Tantalum Gettering Templates
SO ACS APPLIED MATERIALS & INTERFACES
LA English
DT Article
DE cobalt oxide; Co/Pd multilayer; low temperature annealing; nanoscale
   patterning; bit-patterned media
ID PD/CO MULTILAYERS; RECORDING MEDIA; ANISOTROPY; HEAD; XPS; SI
AB This work demonstrates that a nonmagnetic thin film of cobalt oxide (CoO) sandwiched between Ta seed and capping layers can be effectively reduced to a magnetic cobalt thin film by annealing at 200 degrees C, whereas CoO does not exhibit ferromagnetic properties at room temperature and is stable at up to similar to 400 degrees C. Tho CoO reduction is attributed to the thermodynamically driver gettering of oxygen by tantalum, similar to the exothermic reduction oxidation reaction Observed in thermite systems. Similarly, annealing at 200 degrees C of a nonmagnetic [CoO/Pd](N) multilayer thin film sandwiched: between Ta seed and Ta capping layers results in the conversion into a Magnetic [Co/Pd](N) multilayer, a Material With perpendicular magnetic anisotropy that is of interest for magnetic data storage applications. A nanopatterning approach is introduced where [CoO/Pd](N) multilayers is locally reduced into [Co/Pd](N) multilayers to) achieve perpendicular magnetic anisotropy nanostructured-array. This technique can potentially be adapted to nanoscale patterning of other systems for which thermodynamically favorable combination of oxide and; gettering layers can be identified:
C1 [Qiu, Wenlan; Lee, Dahye; Litvinov, Dmitri] Univ Houston, Mat Sci & Engn, Houston, TX 77204 USA.
   [Chang, Long; Litvinov, Dmitri] Univ Houston, Elect & Comp Engn, Houston, TX 77204 USA.
   [Dannangoda, Chamath; Martirosyan, Karen] Univ Texas Brownsville, Dept Phys & Astron, Brownsville, TX 78520 USA.
RP Litvinov, D (reprint author), Univ Houston, Mat Sci & Engn, Houston, TX 77204 USA.
EM Litvinov@uh.edu
FU NSF [CBET-0933140, CMMI-0927786, ECCS-0926027]
FX This research is supported in part by NSF Grants CBET-0933140,
   CMMI-0927786, and ECCS-0926027, and with the resources of the Center for
   Integrated Bio and Nanosystems. The authors thank Dr. Dieter Weller of
   Hitachi GST for fruitful discussions.
CR Atanassova E, 1998, APPL SURF SCI, V135, P71, DOI 10.1016/S0169-4332(98)00278-5
   ATANASSOVA E, 1995, APPL SURF SCI, V84, P193, DOI 10.1016/0169-4332(94)00538-9
   BENNETT WR, 1991, J APPL PHYS, V69, P4384, DOI 10.1063/1.348363
   CARCIA PF, 1985, APPL PHYS LETT, V47, P178, DOI 10.1063/1.96254
   DEMIRYONT H, 1985, APPL OPTICS, V24, P490
   DENBROEDER FJA, 1987, J APPL PHYS, V61, P4317, DOI 10.1063/1.338459
   HASHIMOTO S, 1989, J APPL PHYS, V66, P4909, DOI 10.1063/1.343760
   Hobosyan M. A., 2014, J AEROSPACE ENG, V10, P1061
   Hu B, 2011, J APPL PHYS, V109, DOI 10.1063/1.3544306
   Kim W, 2002, SURF REV LETT, V9, P931, DOI 10.1142/S0218625X02003238
   KINOSHITA K, 1991, IEEE T MAGN, V27, P4888, DOI 10.1109/20.278980
   Kryder MH, 2008, P IEEE, V96, P1810, DOI 10.1109/JPROC.2008.2004315
   LAIRSON BM, 1994, IEEE T MAGN, V30, P4014, DOI 10.1109/20.333974
   Lau JW, 2011, J PHYS D APPL PHYS, V44, DOI 10.1088/0022-3727/44/30/303001
   Lau J. W., 2008, APPL PHYS LETT, V92, P01250
   Martirosyan KS, 2013, APPL PHYS LETT, V102, DOI 10.1063/1.4790823
   Ross C, 2001, ANN REV MATER RES, V31, P203, DOI 10.1146/annurev.matsci.31.1.203
   Rottmayer RE, 2006, IEEE T MAGN, V42, P2417, DOI 10.1109/TMAG.2006.879572
   Seigler MA, 2008, IEEE T MAGN, V44, P119, DOI 10.1109/TMAG.2007.911029
   Smith D., 2006, J APP PHYS, V99
   Terris BD, 2009, J MAGN MAGN MATER, V321, P512, DOI 10.1016/j.jmmm.2008.05.046
   Terris D. B., 2007, MICROSYST TECHNOL, V13, P189
   Zier M, 2003, ANAL BIOANAL CHEM, V375, P902, DOI 10.1007/s00216-003-1788-2
NR 23
TC 1
Z9 1
U1 2
U2 20
PU AMER CHEMICAL SOC
PI WASHINGTON
PA 1155 16TH ST, NW, WASHINGTON, DC 20036 USA
SN 1944-8244
J9 ACS APPL MATER INTER
JI ACS Appl. Mater. Interfaces
PD MAR 25
PY 2015
VL 7
IS 11
BP 6014
EP 6018
DI 10.1021/am5090463
PG 5
WC Nanoscience & Nanotechnology; Materials Science, Multidisciplinary
SC Science & Technology - Other Topics; Materials Science
GA CE6TZ
UT WOS:000351972400002
PM 25761738
ER

PT J
AU Segura, V
AF Segura, Valentina
TI A three-dimensional skull ontogeny in the bobcat (Lynx rufus)
   (Carnivora: Felidae): a comparison with other carnivores
SO CANADIAN JOURNAL OF ZOOLOGY
LA English
DT Article
DE bobcats; Lynx rufus; development; felids; growth; geometric
   morphometrics
ID HYENAS CROCUTA-CROCUTA; PUMA-CONCOLOR; CRANIAL ONTOGENY; UNGULATES
   ASTRAPOTHERIA; POSTNATAL-DEVELOPMENT; MAMMALIA CARNIVORA; EARLY MIOCENE;
   BITE FORCES; BONE STRAIN; PATTERNS
AB The maturation of mammalian carnivores from a lactating juvenile to a predatory adult requires a suite of changes in both morphology and behaviour. Bobcats (Lynx rufus (Schreber, 1777)) are medium-sized cats with well-developed skulls to process large prey that can exceed their body mass. An integrated view of the skull ontogeny in the bobcat was developed to detect the relationship between shape, size (on the basis of three-dimensional geometric morphometric analysis), and life history. Dietary changes from juvenile to adults were taken into account and compared with other carnivores. Newborns were different from the remaining age stages in the behavioral and morphological characters examined, which allows us to relate them to the terminal morphology reached during the prenatal period. All findings were related to the reinforcement of the skull and the enhancement of predatory skills in adult bobcats. The final cranial shape is reached in A2 age class, after 2 years of age, and once sexual maturity has been reached. This is a pattern not followed for the rest of carnivores previously studied, which might be related to the capacity of subduing prey that exceed them in size, a behavior not common in felids of the body size of bobcats.
C1 Consejo Nacl Invest Cient & Tecn CONICET, UEL, Cordoba, Argentina.
RP Segura, V (reprint author), Consejo Nacl Invest Cient & Tecn CONICET, UEL, Cordoba, Argentina.
EM vseguragago@gmail.com
FU Short-Term Visitor Fellowship Award from NMNH; Visiting Scholarship
   Award from FMNH; Agencia Nacional de Promocion Cientifica y Tecnologica
   (ANPCyT) [PICT 2008-1798, PICT 2011-0309, PICT 2012-1583]; CONICET [PIP
   112-201101-00164]
FX I thank K. Helgen and D. Lunde (NMNH) and B. Patterson and B. Stanley
   (FMNH) for permission and access to the material under their care. I
   also thank G. Cassini, D. Flores, and F. Prevosti for their comments on
   an earlier version of the manuscript and two anonymous reviewers for
   their comments that improved the manuscript. This research was partially
   supported by a Short-Term Visitor Fellowship Award from NMNH and a
   Visiting Scholarship Award from FMNH. This is a contribution to the
   Projects PICT 2008-1798, PICT 2011-0309, and PICT 2012-1583 of the
   Agencia Nacional de Promocion Cientifica y Tecnologica (ANPCyT) and PIP
   112-201101-00164 of CONICET.
CR Abdala F, 2001, J MAMMAL, V82, P190, DOI 10.1644/1545-1542(2001)082<0190:POOTSO>2.0.CO;2
   Barghusen HR, 1972, MORPHOLOGY MAXILLOMA, P26
   Bastir M, 2009, EVOL BIOL, V36, P57, DOI 10.1007/s11692-008-9037-4
   Berge C, 2004, AM J PHYS ANTHROPOL, V124, P124, DOI 10.1002/ajpa.10333
   Biknevicius AR, 1997, ZOOL J LINN SOC-LOND, V120, P139
   Binder WJ, 2000, J ZOOL, V252, P273, DOI 10.1111/j.1469-7998.2000.tb00622.x
   Bookstein FL., 1997, MORPHOMETRIC TOOLS L
   Byron CD, 2006, ANAT REC PART A, V288A, P552, DOI 10.1002/ar.a.20322
   Carbone C, 1999, NATURE, V402, P286, DOI 10.1038/46266
   Cassini GH, 2013, AMEGHINIANA, V50, P193, DOI 10.5710/AMGH.7.04.2013.606
   Cassini GH, 2012, J MAMM EVOL, V19, P9
   Christiansen P, 2005, J ZOOL, V266, P133, DOI 10.1017/S0952836905006643
   Christiansen P, 2007, ECOLOGY, V88, P347, DOI 10.1890/0012-9658(2007)88[347:BFAEAT]2.0.CO;2
   CROWE DM, 1972, J WILDLIFE MANAGE, V36, P1330, DOI 10.2307/3799278
   CROWE DM, 1975, J MAMMAL, V56, P177, DOI 10.2307/1379615
   Dayan T, 1998, MAMMAL REV, V28, P99, DOI 10.1046/j.1365-2907.1998.00029.x
   Drake AG, 2008, P ROY SOC B-BIOL SCI, V275, P71, DOI 10.1098/rspb.2007.1169
   Emerson SB, 1993, SKULL, P384
   Ewer RF., 1973, CARNIVORES
   FELDMAN HN, 1993, ANIM BEHAV, V45, P13, DOI 10.1006/anbe.1993.1002
   Fernandes RM, 2008, ANAT SCI INT, V83, P123, DOI [10.1111/j.1447-073X.2007.00212.x, 10.1111/j.1447-073x.2007.00212.x]
   Figueirido B, 2013, EVOLUTION, V67, P1975, DOI 10.1111/evo.12059
   Figueirido B, 2011, PALEOBIOLOGY, V37, P490
   Flores DA, 2006, J MORPHOL, V267, P426, DOI 10.1002/jmor.10420
   Flores DA, 2013, ZOOLOGY, V116, P372, DOI [10.1016/j.zool.2013.07.003, 10.1016/j.zoo1.2013.07.003]
   FRITTS SH, 1978, J MAMMAL, V59, P347, DOI 10.2307/1379919
   FRITTS SH, 1978, J WILDLIFE MANAGE, V42, P533, DOI 10.2307/3800815
   GarciaPerea R, 1996, J MORPHOL, V229, P241, DOI 10.1002/(SICI)1097-4687(199609)229:3<241::AID-JMOR1>3.0.CO;2-1
   Gay SW, 1996, J MAMMAL, V77, P191, DOI 10.2307/1382720
   Giannini NP, 2010, MAMM BIOL, V75, P547, DOI 10.1016/j.mambio.2009.08.001
   GOODALL C, 1991, J ROY STAT SOC B MET, V53, P285
   Goswami A, 2006, EVOLUTION, V60, P169
   Goswami A, 2007, J MAMMAL, V88, P667, DOI 10.1644/06-MAMM-A-315R.1
   Hall E.R., 1959, THE MAMMALS OF NORTH
   Hammer O, 2001, PALAEONTOL ELECTRON, V4, P9, DOI DOI 10.1016/J.BCP.2008.05.025
   Helm JW, 1996, J EXP ZOOL, V276, P243, DOI 10.1002/(SICI)1097-010X(19961101)276:4<243::AID-JEZ1>3.0.CO;2-O
   HEMMER H, 1979, CARNIVORE, V2, P90
   HEMMER H, 1978, CARNIVORE, V1, P71
   Henderson JH, 2005, J BIOMECH, V38, P2294, DOI 10.1016/j.jbiomech.2004.07.037
   Herring SW, 1996, ANAT REC, V246, P446, DOI 10.1002/(SICI)1097-0185(199612)246:4<446::AID-AR4>3.0.CO;2-T
   Herring SW, 2000, AM J PHYS ANTHROPOL, V112, P575, DOI 10.1002/1096-8644(200008)112:4<575::AID-AJPA10>3.3.CO;2-S
   Hildebrand M., 1995, ANALYSIS OF VERTEBRA
   Holliday JA, 2004, PALEOBIOLOGY, V30, P108, DOI 10.1666/0094-8373(2004)030<0108:EOHTEO>2.0.CO;2
   HOYTE DAN, 1971, J DENT RES, V50, P1447, DOI 10.1177/00220345710500061501
   Hylander W.L., 1992, P223
   HYLANDER WL, 1991, AM J PHYS ANTHROPOL, V86, P1, DOI 10.1002/ajpa.1330860102
   JACKSON DL, 1988, J WILDLIFE MANAGE, V52, P515, DOI 10.2307/3801602
   Jackson HHT, 1961, MAMMALS OF WISCONSIN
   Jeffery N, 2002, AM J PHYS ANTHROPOL, V118, P324, DOI 10.1002/ajpa.10040
   Jimenez J.E., 2004, CANIDS FOXES WOLVES, P44
   JOHNSON N F, 1981, Wildlife Society Bulletin, V9, P203
   Johnson WE, 2006, SCIENCE, V311, P73, DOI 10.1126/science.1122277
   KELSON KR, 1946, J MAMMAL, V27, P255, DOI 10.2307/1375436
   Kitchener A., 1991, NATURAL HIST WILD CA
   Klingenberg CP, 2013, SYST BIOL, V62, P591, DOI 10.1093/sysbio/syt025
   Klingenberg CP, 2011, MOL ECOL RESOUR, V11, P353, DOI 10.1111/j.1755-0998.2010.02924.x
   La Croix S, 2011, J ZOOL, V285, P301, DOI 10.1111/j.1469-7998.2011.00847.x
   La Croix S, 2011, J MORPHOL, V272, P662, DOI 10.1002/jmor.10934
   Langer P, 2003, EVOLUTION, V57, P1196
   Lariviere Serge, 1997, Mammalian Species, V563, P1, DOI 10.2307/3504533
   Lucherini M, 2006, REV CHIL HIST NAT, V79, P169, DOI 10.4067/S0716-078X2006000200003
   Lucherini Mauro, 2004, Mastozool. neotrop., V11, P7
   MAHAN C J, 1980, Transactions of the Kansas Academy of Science, V83, P95, DOI 10.2307/3627721
   Meachen-Samuels J, 2009, BIOL J LINN SOC, V96, P784, DOI 10.1111/j.1095-8312.2008.01169.x
   Mitteroecker P, 2004, J HUM EVOL, V46, P679, DOI 10.1016/j.jhevol.2004.03.006
   Mitteroecker P, 2009, EVOLUTION, V63, P727, DOI 10.1111/j.1558-5646.2008.00587.x
   Morales MM, 2010, BIOL J LINN SOC, V100, P711
   Nowak RM, 2005, WALKERS CARNIVORES W
   O'Higgins P., 2006, TOOLS STAT SHAPE ANA
   Pares-Casanova Pere M., 2013, [Korean J. of Veterinary Research, 대한수의학회지], V53, P155
   POLLACK EM, 1950, J MAMMAL, V31, P327, DOI 10.2307/1375303
   Pucciarelli HM, 1996, AM J PHYS ANTHROPOL, V101, P173, DOI 10.1002/(SICI)1096-8644(199610)101:2<173::AID-AJPA5>3.0.CO;2-3
   R Development Core Team, 2004, R LANG ENV STAT COMP
   RADINSKY LB, 1981, BIOL J LINN SOC, V15, P369, DOI 10.1111/j.1095-8312.1981.tb00770.x
   Rice D.P., 2008, FRONTIERS ORAL BIOL, V12
   Rohen J.W., 2007, EMBRIOLOGIA FUNCIONA
   ROHLF FJ, 1990, SYST ZOOL, V39, P40, DOI 10.2307/2992207
   Ross CF, 1996, AM J PHYS ANTHROPOL, V101, P183, DOI 10.1002/(SICI)1096-8644(199610)101:2<183::AID-AJPA6>3.0.CO;2-3
   Sakaguchi M., 2012, PLOS ONE, V7, P1, DOI [DOI 10.1371/J0URNAL.P0NE.0039752), 10.1371/journal.pone.0039752]
   Segura V., 2014, THESIS U NACL LA PLA
   Segura V, 2013, ZOOL J LINN SOC-LOND, V169, P235, DOI 10.1111/zoj.12047
   Segura V, 2013, MAMMALIA, V77, P205, DOI 10.1515/mammalia-2012-0028
   Segura V, 2012, ZOOMORPHOLOGY, V131, P79, DOI 10.1007/s00435-012-0145-4
   Segura Valentina, 2009, Mastozool. neotrop., V16, P169
   Seymour K.L., 1999, THESIS U TORONTO TOR
   Sicuro FL, 2011, BIOL J LINN SOC, V103, P176, DOI 10.1111/j.1095-8312.2011.01636.x
   Sicuro FL, 2011, ZOOL J LINN SOC-LOND, V161, P414, DOI 10.1111/j.1096-3642.2010.00636.x
   Slater GJ, 2009, J EVOLUTION BIOL, V22, P2278, DOI 10.1111/j.1420-9101.2009.01845.x
   Slater GJ, 2008, PALEOBIOLOGY, V34, P403, DOI 10.1666/07061.1
   Smith KK, 1997, EVOLUTION, V51, P1663, DOI 10.2307/2411218
   SMUTS GL, 1978, J ZOOL, V185, P115
   Stys Elizabeth D., 1993, Proceedings of the Annual Conference Southeastern Association of Fish and Wildlife Agencies, V47, P80
   Sunquist M.E., 2009, HDB MAMMALS WORLD, VI, P54
   Tanner JB, 2010, J MORPHOL, V271, P353, DOI 10.1002/jmor.10802
   Thexton AJ, 2004, ARCH ORAL BIOL, V49, P567, DOI 10.1016/j.archoralbio.2004.02.002
   THOMASON JJ, 1991, CAN J ZOOL, V69, P2326, DOI 10.1139/z91-327
   Trail M.A., 1984, Proceedings of the Oklahoma Academy of Science, V64, P46
   TUMLISON R, 1984, J MAMMAL, V65, P111, DOI 10.2307/1381207
   VANVALKENBURGH B, 1987, J ZOOL, V212, P379
   Vilmann H, 1979, Gegenbaurs Morphol Jahrb, V125, P572
   Wainwright P. C., 1994, ECOLOGICAL MORPHOLOG
   Webb JN, 1999, ANIM BEHAV, V58, P983, DOI 10.1006/anbe.1999.1215
   WERDELIN L, 1983, BIOL J LINN SOC, V19, P375, DOI 10.1111/j.1095-8312.1983.tb00793.x
   Wilson LAB, 2011, J MAMMAL, V92, P407, DOI 10.1644/10-MAMM-A-209.1
   WINEGARNER CE, 1982, J MAMMAL, V63, P680, DOI 10.2307/1380281
   Wroe S, 2007, EVOLUTION, V61, P1251, DOI 10.1111/j.1558-5646.2007.00101.x
   Zar JH, 1999, BIOSTATISTICAL ANAL
   Zelditch ML, 2004, EVOL DEV, V6, P194, DOI 10.1111/j.1525-142X.2004.04025.x
   Zuccarelli Micah D., 2004, BIOS (Ocean Grove), V75, P131, DOI 10.1893/0005-3155(2004)075<0131:CMAOCV>2.0.CO;2
NR 109
TC 3
Z9 3
U1 4
U2 20
PU CANADIAN SCIENCE PUBLISHING, NRC RESEARCH PRESS
PI OTTAWA
PA 65 AURIGA DR, SUITE 203, OTTAWA, ON K2E 7W6, CANADA
SN 0008-4301
EI 1480-3283
J9 CAN J ZOOL
JI Can. J. Zool.
PD MAR
PY 2015
VL 93
IS 3
BP 225
EP 237
DI 10.1139/cjz-2014-0148
PG 13
WC Zoology
SC Zoology
GA CF0EA
UT WOS:000352214400008
ER

PT J
AU Borrero-Lopez, O
   Pajares, A
   Constantino, PJ
   Lawn, BR
AF Borrero-Lopez, Oscar
   Pajares, Antonia
   Constantino, Paul J.
   Lawn, Brian R.
TI Mechanics of microwear traces in tooth enamel
SO ACTA BIOMATERIALIA
LA English
DT Article
DE Enamel microwear; Contact mechanics; Microplasticity; Microfracture;
   Diet
ID DENTAL MICROWEAR; INDENTATION FRACTURE; MAMMALS; WEAR; DIET; TEETH;
   MORPHOLOGY; INDICATOR; TOUGHNESS; PRIMATES
AB It is hypothesized that microwear traces in natural tooth enamel can be simulated and quantified using microindentation mechanics. Microcontacts associated with particulates in the oral wear medium are modeled as sharp indenters with fixed semi-apical angle. Distinction is made between markings from static contacts (pits) and translational contacts (scratches). Relations for the forces required to produce contacts of given dimensions are derived, with particle angularity and compliance specifically taken into account so as to distinguish between different abrasives in food sources. Images of patterns made on human enamel with sharp indenters in axial and sliding loading are correlated with theoretical predictions. Special attention is given to threshold conditions for transition from a microplasticity to a microcracking mode, corresponding to mild and severe wear domains. It is demonstrated that the typical microwear trace is generated at loads on the order of 1 N - i.e. much less than the forces exerted in normal biting attesting to the susceptibility of teeth to wear in everyday mastication, especially in diets with sharp, hard and large inclusive intrinsic or extraneous particulates. Published by Elsevier Ltd. on behalf of Acta Materialia Inc.
C1 [Borrero-Lopez, Oscar; Pajares, Antonia] Univ Extremadura, Dept Ingn Mecan Energet & Mat, Badajoz 06006, Spain.
   [Constantino, Paul J.; Lawn, Brian R.] St Michaels Coll, Dept Biol, Colchester, VT 05439 USA.
   [Lawn, Brian R.] NIST, Mat Measurement Lab, Gaithersburg, MD 20899 USA.
RP Lawn, BR (reprint author), NIST, Mat Measurement Lab, Gaithersburg, MD 20899 USA.
EM brianlawn@gmail.com
RI Pajares, Antonia/I-3881-2015
OI Pajares, Antonia/0000-0002-1086-7586
FU US National Science Foundation [1118385]; NIST funding
FX We wish to thank David and Oscar Maestre for kindly providing dental
   samples from their clinic (Maxilodental Maestre, Badajoz, Spain), Maria
   Carbajo (Facility of Analysis and Characterization of Solids and
   Surfaces, UEx, Badajoz, Spain) for the SEM images in Fig. 4, and Centro
   Tecnologico Industrial de Extremadura (CETIEX, Badajoz, Spain) for use
   of their profilometer. Robert Cook (NIST) provided useful comments on
   the paper. This study was supported in part by the US National Science
   Foundation (Grant # 1118385) and from NIST funding (administered via
   Dakota Consulting Inc.).
CR ANSTIS GR, 1981, J AM CERAM SOC, V64, P533, DOI 10.1111/j.1151-2916.1981.tb10320.x
   Arsecularatne JA, 2010, J MECH BEHAV BIOMED, V3, P347, DOI 10.1016/j.jmbbm.2010.01.006
   Attin T, 1997, ARCH ORAL BIOL, V42, P243, DOI 10.1016/0003-9969(06)00073-2
   Borrero-Lopez O, 2014, J MECH BEHAV BIOMED, V37, P226, DOI 10.1016/j.jmbbm.2014.05.023
   BOYDE A, 1982, ANAT EMBRYOL, V165, P193, DOI 10.1007/BF00305477
   Chai H, 2009, P NATL ACAD SCI USA, V106, P7289, DOI 10.1073/pnas.0902466106
   CHO SJ, 1989, J AM CERAM SOC, V72, P1249, DOI 10.1111/j.1151-2916.1989.tb09718.x
   Cuy JL, 2002, ARCH ORAL BIOL, V47, P281, DOI 10.1016/S0003-9969(02)00006-7
   Damuth J, 2011, BIOL REV, V86, P733, DOI 10.1111/j.1469-185X.2011.00176.x
   Fortelius M., 1985, ACTA ZOOL FENN, V180, P1
   GRINE FE, 1981, S AFR J SCI, V77, P203
   GRINE FE, 1988, NATURE, V333, P765, DOI 10.1038/333765a0
   He LH, 2007, APPL PHYS LETT, V90
   He LH, 2006, BIOMATERIALS, V27, P4388, DOI 10.1016/j.biomaterials.2006.03.045
   He LH, 2007, BIOMATERIALS, V28, P4512, DOI 10.1016/j.biomaterials.2007.06.020
   He LH, 2007, J DENT, V35, P431, DOI 10.1016/j.jdent.2006.12.002
   Hutchings I. M., 1992, TRIBOLOGY FRICTION W
   JANIS CM, 1988, BIOL REV, V63, P197, DOI 10.1111/j.1469-185X.1988.tb00630.x
   Johnson K. L., 1985, CONTACT MECH
   LAWN B, 1975, J MATER SCI, V10, P1049, DOI 10.1007/BF00823224
   LAWN BR, 1977, J MATER SCI, V12, P2195, DOI 10.1007/BF00552240
   LAWN BR, 1979, J AM CERAM SOC, V62, P347, DOI 10.1111/j.1151-2916.1979.tb19075.x
   LAWN BR, 1975, J MATER SCI, V10, P2016, DOI 10.1007/BF00557479
   LAWN BR, 1981, J MATER SCI, V16, P2745, DOI 10.1007/BF02402837
   Lawn BR, 2012, J MATER SCI, V47, P1, DOI 10.1007/s10853-011-5865-1
   Lawn BR, 2009, J MECH BEHAV BIOMED, V2, P33, DOI 10.1016/j.jmbbm.2008.05.007
   Lee JJW, 2011, BIOL REV, V86, P959, DOI 10.1111/j.1469-185X.2011.00181.x
   Lucas P, 2008, BIOESSAYS, V30, P374, DOI 10.1002/bies.20729
   Lucas PW, 2013, J R SOC INTERFACE, V10, DOI 10.1098/rsif.2012.0923
   Lucas P. W., 2004, DENT FUNCTIONAL MORP
   MARSHALL DB, 1982, J AM CERAM SOC, V65, P561, DOI 10.1111/j.1151-2916.1982.tb10782.x
   Myoung S, 2009, J BIOMECH, V42, P1947, DOI 10.1016/j.jbiomech.2009.05.013
   Osborn JW, 1981, DENT ANATOMY EMBRYOL, V1
   Pharr GM, 1998, MAT SCI ENG A-STRUCT, V253, P151, DOI 10.1016/S0921-5093(98)00724-2
   Piperno D. R., 2006, PHYTOLITHS COMPREHEN
   Rabenold D, 2014, J HUMAN EVOL, V2014
   Sanson G, 2006, AM J BOT, V93, P1531, DOI 10.3732/ajb.93.10.1531
   Scott RS, 2006, J HUM EVOL, V51, P339, DOI 10.1016/j.jhevol.2006.04.006
   SNEDDON IN, 1948, P CAMB PHILOS SOC, V44, P492
   SWAIN MV, 1979, P ROY SOC LOND A MAT, V366, P575, DOI 10.1098/rspa.1979.0070
   Tabor D., 1951, HARDNESS METALS
   TEAFORD MF, 1988, SCANNING MICROSCOPY, V2, P1149
   Teaford MF, 2000, P NATL ACAD SCI USA, V97, P13506, DOI 10.1073/pnas.260368897
   Ungar P, 1998, EVOL ANTHROPOL, V6, P205, DOI 10.1002/(SICI)1520-6505(1998)6:6<205::AID-EVAN3>3.0.CO;2-9
   Ungar PS, 2011, SCIENCE, V334, P190, DOI 10.1126/science.1207701
   Ungar PS, 2010, MAMMAL TEETH
   WALKER A, 1978, SCIENCE, V201, P908, DOI 10.1126/science.684415
NR 47
TC 5
Z9 5
U1 3
U2 21
PU ELSEVIER SCI LTD
PI OXFORD
PA THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD OX5 1GB, OXON, ENGLAND
SN 1742-7061
EI 1878-7568
J9 ACTA BIOMATER
JI Acta Biomater.
PD MAR 1
PY 2015
VL 14
BP 146
EP 153
DI 10.1016/j.actbio.2014.11.047
PG 8
WC Engineering, Biomedical; Materials Science, Biomaterials
SC Engineering; Materials Science
GA CB6JR
UT WOS:000349733800015
PM 25484336
ER

PT J
AU Zhang, ZB
   Peng, X
   Zhou, H
   Lin, H
   Sun, H
AF Zhang, Z. B.
   Peng, X.
   Zhou, H.
   Lin, H.
   Sun, H.
TI Characterizing preferential flow in cracked paddy soils using computed
   tomography and breakthrough curve
SO SOIL & TILLAGE RESEARCH
LA English
DT Article
DE Macropore characteristics; Paddy soil cracks; Preferential flow;
   Computed tomography; Breakthrough curve
ID SOLUTE TRANSPORT; WATER-FLOW; MACROPORE CHARACTERISTICS; STRUCTURED
   SOILS; DRYING CYCLES; POROUS-MEDIA; RICE; SHRINKAGE; VERTISOL; PATTERNS
AB Soil cracks generated in paddy fields may change soil structure and provide pathways for preferential flow. However, the quantitative relationship between soil cracks and preferential flow remain unclear in paddy soils. The objectives of this study were to (1) reveal the effect of soil cracking on soil structure and preferential flow, (2) find a quantitative relationship between characteristics of soil structure and preferential flow in two paddy fields. Two paddy fields, one cultivated for 20 years (YPF) and the other cultivated for more than 100 years (OPF), were subjected to either alternate flooding and drying (AFD) or continuous flooding (CF) (as a control) during rice growing season. Undisturbed soil columns (10 cm in diameter and 20 cm in height) were sampled in the four plots. Macropores (including cracks) were quantified using computed tomography (CT), and preferential flow was assessed by breakthrough curve (BTC). The results showed that the presence of soil cracks under the AFD increased average macropore length but decreased the number of macropores significantly (P < 0.05), and it also changed macropore size distribution and macropore area density distribution with soil depth. The three-dimensional structures of soil cracks were complicated but can be quantified using CT. The BTCs were well fitted by the convection-dispersion model (CDE) as well as by the two-region (mobile-immobile) transport model. Quick breakthrough, long tail and asymmetrical shape of BTCs for all soil columns indicated the extensiveness of preferential flow in these paddy fields. The relationships between soil macropore features and solute dispersivity parameters (lambda and lambda(eff)) were poor (P>0.05). Both the shape of BTCs and fitting parameters demonstrated that soil cracks (5.31-11.9 cm depth) did not increase preferential flow because they did not perforate through the dense plow pan. Soil columns in the CF plots displayed a bit more preferential flow due to a deeper macropore distribution as compared with the AFD plots. While macropore features were different at the two paddy soils, the difference in preferential flow was reduced due to the presence of plow pan. This study demonstrates that soil cracks significantly affect macropore structure but their impact on preferential flow may be poor when they do not penetrate through the plow pan. (C) 2014 Elsevier B.V. All rights reserved.
C1 [Zhang, Z. B.; Peng, X.; Zhou, H.] Chinese Acad Sci, Inst Soil Sci, State Key Lab Soil & Sustainable Agr, Nanjing 210008, Jiangsu, Peoples R China.
   [Lin, H.] Penn State Univ, Dept Ecosyst Sci & Management, University Pk, PA 16802 USA.
   [Sun, H.] Sichuan Univ, Dept Environm Sci, Chengdu 610065, Peoples R China.
RP Peng, X (reprint author), Chinese Acad Sci, Inst Soil Sci, State Key Lab Soil & Sustainable Agr, Nanjing 210008, Jiangsu, Peoples R China.
EM xhpeng@issas.ac.cn; sunhuifiles@gmail.com
RI Lin, Henry/E-8234-2011
FU Natural Science Foundation of China [41171180]; National Key Technology
   R&D Program of China [2011BAD31804]
FX This work was supported by Natural Science Foundation of China (Code:
   41171180) and the National Key Technology R&D Program of China
   (2011BAD31804). Dr. X. Peng gratefully thanks the "100 Talents Program"
   from Chinese Academy of Sciences. We appreciate the two anonymous
   reviewers for their excellent comments that benefit the improvement of
   this paper. We also acknowledge Isaac Hopkins for his revision of
   English of this paper.
CR Abou Najm MR, 2010, WATER RESOUR RES, V46, DOI 10.1029/2009WR008594
   Allaire SE, 2009, J HYDROL, V378, P179, DOI 10.1016/j.jhydrol.2009.08.013
   Allaire-Leung SE, 2000, J CONTAM HYDROL, V41, P283, DOI 10.1016/S0169-7722(99)00079-0
   ANDERSON SH, 1990, GEODERMA, V46, P13, DOI 10.1016/0016-7061(90)90004-S
   Angulo-Jaramillo R, 2000, SOIL TILL RES, V55, P1, DOI 10.1016/S0167-1987(00)00098-2
   Bandyopadhyay KK, 2003, SOIL TILL RES, V71, P133, DOI 10.1016/S0167-1987(03)00043-6
   Bear J., 2013, DYNAMICS FLUIDS PORO
   Bejat L, 2000, SOIL SCI SOC AM J, V64, P818
   BEVEN K, 1982, WATER RESOUR RES, V18, P1311, DOI 10.1029/WR018i005p01311
   Bolte S, 2006, J MICROSC-OXFORD, V224, P213, DOI 10.1111/j.1365-2818.2006.01706.x
   Cabangon RJ, 2000, SOIL TILL RES, V56, P105, DOI 10.1016/S0167-1987(00)00125-2
   Chen X., 2007, CHINA GEODERMA, V142, P136
   Cnudde V, 2006, APPL GEOCHEM, V21, P826, DOI 10.1016/j.apgeochem.2006.02.010
   DASOG GS, 1993, SOIL SCI, V156, P424, DOI 10.1097/00010694-199312000-00007
   Doube M, 2010, BONE, V47, P1076, DOI 10.1016/j.bone.2010.08.023
   Favre F, 1997, GEODERMA, V78, P113, DOI 10.1016/S0016-7061(97)00030-X
   Greve A, 2010, J HYDROL, V393, P105, DOI 10.1016/j.jhydrol.2010.03.007
   HAN NW, 1985, AICHE J, V31, P277, DOI 10.1002/aic.690310215
   Hardie MA, 2012, HYDROL PROCESS, V26, P3079, DOI 10.1002/hyp.8325
   Haws NW, 2004, J CONTAM HYDROL, V75, P257, DOI 10.1016/j.jconhyd.2004.07.001
   Janssen M, 2007, SOIL TILL RES, V94, P133, DOI 10.1016/j.still.2006.07.010
   Jarvis NJ, 2007, EUR J SOIL SCI, V58, P523, DOI 10.1111/j.1365-2389.2007.00915.x
   Klute A., 1986, METHODS SOIL ANAL 1
   Kohne JM, 2009, J CONTAM HYDROL, V104, P4, DOI 10.1016/j.jconhyd.2008.10.002
   Liu CW, 2004, HYDROL PROCESS, V18, P2503, DOI 10.1002/hyp.1478
   Liu CW, 2003, GEODERMA, V117, P169, DOI 10.1016/S0016-7061(03)00165-4
   Lu R.K., 2000, SOIL AGR CHEM ANAL
   Luo LF, 2008, SOIL SCI SOC AM J, V72, P1058, DOI 10.2136/sssaj2007.0179
   Luo LF, 2010, SOIL SCI SOC AM J, V74, P1929, DOI 10.2136/sssaj2010.0062
   Luo LF, 2010, J HYDROL, V393, P53, DOI 10.1016/j.jhydrol.2010.03.031
   MathWorks I, 2010, MATLAB LANG TECHN CO
   Mori Y, 1999, SOIL SCI SOC AM J, V63, P733
   Naveed M, 2013, SOIL SCI SOC AM J, V77, P403, DOI 10.2136/sssaj2012.0134
   Peng X, 2007, SOIL SCI SOC AM J, V71, P1095, DOI 10.2136/sssaj2006.0156
   Peng X, 2006, SOIL TILL RES, V91, P173, DOI 10.1016/j.still.2005.12.012
   Peng X, 2012, SOIL TILL RES, V125, P89, DOI 10.1016/j.still.2012.04.001
   Peth S, 2010, SOIL TILL RES, V111, P3, DOI 10.1016/j.sti11.2010.02.007
   RAO PSC, 1980, SOIL SCI SOC AM J, V44, P1139
   Rasband W, 2013, IMAGEJ 1 48E
   RingroseVoase AJ, 1996, GEODERMA, V71, P245, DOI 10.1016/0016-7061(96)00008-0
   Sander T, 2008, GEODERMA, V145, P303, DOI 10.1016/j.geoderma.2008.03.024
   Sander T, 2007, VADOSE ZONE J, V6, P105, DOI 10.2136/vzj2006.0035
   Schaap MG, 2006, VADOSE ZONE J, V5, P27, DOI 10.2136/vzj2005.0005
   SEYFRIED MS, 1987, SOIL SCI SOC AM J, V51, P1434
   Toride N, 1995, CXTFIT CODE ESTIMATI
   Tuong TP, 1996, SOIL SCI SOC AM J, V60, P872
   VALOCCHI AJ, 1985, WATER RESOUR RES, V21, P808, DOI 10.1029/WR021i006p00808
   VANGENUCHTEN MT, 1976, SOIL SCI SOC AM J, V40, P473
   Vervoort RW, 1999, WATER RESOUR RES, V35, P913, DOI 10.1029/98WR02289
   WATSON KW, 1986, SOIL SCI SOC AM J, V50, P578
   WOPEREIS MCS, 1994, SOIL TILL RES, V29, P1, DOI 10.1016/0167-1987(94)90097-3
   Working Group I.U.S.S.W.R.B, 2006, WORLD SOIL RES REP
   Yang CM, 2004, AGR WATER MANAGE, V70, P67, DOI 10.1016/j.agwat.2004.05.003
   Yang T, 2013, SOIL SCI, V178, P157, DOI 10.1097/SS.0b013e318299677d
   Yoshida S, 2001, SOIL SCI PLANT NUTR, V47, P519
   Zhang ZB, 2014, GEODERMA, V228, P114, DOI 10.1016/j.geoderma.2013.07.026
   Zhang ZB, 2013, GEODERMA, V192, P12, DOI 10.1016/j.geoderma.2012.08.009
NR 57
TC 7
Z9 8
U1 9
U2 58
PU ELSEVIER SCIENCE BV
PI AMSTERDAM
PA PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
SN 0167-1987
EI 1879-3444
J9 SOIL TILL RES
JI Soil Tillage Res.
PD MAR
PY 2015
VL 146
SI SI
BP 53
EP 65
DI 10.1016/j.still.2014.05.016
PN A
PG 13
WC Soil Science
SC Agriculture
GA AY5CT
UT WOS:000347591600008
ER

PT J
AU Doerk, GS
   Gao, H
   Wan, L
   Lille, J
   Patel, KC
   Chapuis, YA
   Ruiz, R
   Albrecht, TR
AF Doerk, Gregory S.
   Gao, He
   Wan, Lei
   Lille, Jeff
   Patel, K. C.
   Chapuis, Yves-Andre
   Ruiz, Ricardo
   Albrecht, Thomas R.
TI Transfer of self-aligned spacer patterns for single-digit
   nanofabrication
SO NANOTECHNOLOGY
LA English
DT Article
DE double patterning; directed self-assembly; nanoimprint lithography;
   patterned media; atomic layer deposition
ID ATOMIC LAYER DEPOSITION; DIAMOND-LIKE CARBON; BLOCK-COPOLYMERS;
   LITHOGRAPHY; MEDIA; MULTIPLICATION; TEMPLATES; FEATURES; DENSITY; FILMS
AB We report the transfer of sub-10 nm half-pitch grating patterns created through a combination of block copolymer directed self-assembly and sidewall spacer-based self-aligned double patterning into Si substrates. Low substrate bias reactive ion etching of TiOx conformally deposited onto carbon mandrels using atomic layer deposition renders distinct, pitch-halved spacers with minimal etch byproduct redeposition. Independent spacer and mandrel width control and the use of an underlying CrNx hard mask deposited by reactive sputtering facilitates etching of Si lines with low roughness and fine placement control. The insights into pattern transfer presented here are directly applicable to the fabrication of rectangular bit pattern nanoimprint templates at densities above 1.5 Td in(-2).
C1 [Doerk, Gregory S.; Gao, He; Wan, Lei; Lille, Jeff; Patel, K. C.; Chapuis, Yves-Andre; Ruiz, Ricardo; Albrecht, Thomas R.] HGST, San Jose, CA 95135 USA.
RP Doerk, GS (reprint author), HGST, 3403 Yerba Buena Rd, San Jose, CA 95135 USA.
EM gregory.doerk@hgst.com
OI Ruiz, Ricardo/0000-0002-1698-4281
CR Albrecht TR, 2013, IEEE T MAGN, V49, P773, DOI 10.1109/TMAG.2012.2227303
   Bangsaruntip S., 2009, IEDM, P1, DOI DOI 10.1109/IEDM.2009.5424364
   Bates CM, 2012, SCIENCE, V338, P775, DOI 10.1126/science.1226046
   Bencher C, 2011, SPIE ADV LITHOGRAPHY
   Bita I, 2008, SCIENCE, V321, P939, DOI 10.1126/science.1159352
   Cheng JY, 2008, ADV MATER, V20, P3155, DOI 10.1002/adma.200800826
   Cheng JY, 2004, NAT MATER, V3, P823, DOI 10.1038/nmat1211
   Dhuey S, 2013, NANOTECHNOLOGY, V24, DOI 10.1088/0957-4484/24/10/105303
   Doerk GS, 2013, ACS NANO, V7, P276, DOI 10.1021/nn303974j
   GOTTSCHO RA, 1992, J VAC SCI TECHNOL B, V10, P2133, DOI 10.1116/1.586180
   GRAY DC, 1994, J VAC SCI TECHNOL A, V12, P354, DOI 10.1116/1.578879
   Grill A, 1999, DIAM RELAT MATER, V8, P428, DOI 10.1016/S0925-9635(98)00262-3
   Inoue S, 2002, VACUUM, V66, P227, DOI 10.1016/S0042-207X(02)00146-X
   Kim R-H, 2010, SPIE ADV LITHOGRAPHY
   Kim SO, 2003, NATURE, V424, P411, DOI 10.1038/nature01775
   Lercel MJ, 1996, J VAC SCI TECHNOL A, V14, P1844, DOI 10.1116/1.580347
   Lille J, 2011, SPIE PHOTOMASK TECHN
   Moon HS, 2014, ADV FUNCT MATER, V24, P4343, DOI 10.1002/adfm.201304248
   Moseler M, 2005, SCIENCE, V309, P1545, DOI 10.1126/science.1114577
   Norasetthekul S, 2001, APPL SURF SCI, V185, P27, DOI 10.1016/S0169-4332(01)00562-1
   Olynick DL, 2005, J VAC SCI TECHNOL B, V23, P2073, DOI [10.1116/1.2050669, 10.1113/1.2050669]
   Patel K C, 2012, SPIE ADV LITHOGRAPHY
   Peng Q, 2010, ADV MATER, V22, P5129, DOI 10.1002/adma.201002465
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Ruiz R, 2012, J VAC SCI TECHNOL B, V30, DOI 10.1116/1.4758773
   Ruiz R, 2011, ACS NANO, V5, P79, DOI 10.1021/nn101561p
   Schabes ME, 2008, J MAGN MAGN MATER, V320, P2880, DOI 10.1016/j.jmmm.2008.07.035
   Schonbachler E, 1997, J VAC SCI TECHNOL B, V15, P2011, DOI 10.1116/1.589593
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Vyvoda MA, 1998, J VAC SCI TECHNOL A, V16, P3247, DOI 10.1116/1.581530
   Wan L, 2012, J MICRO-NANOLITH MEM, V11, DOI 10.1117/1.JMM.11.3.031405
   Xiao SG, 2013, J MICRO-NANOLITH MEM, V12, DOI 10.1117/1.JMM.12.3.031110
   Yang XM, 2009, ACS NANO, V3, P1844, DOI 10.1021/nn900073r
   Yu ZN, 2012, J VAC SCI TECHNOL B, V30, DOI 10.1116/1.4732121
NR 34
TC 6
Z9 6
U1 4
U2 32
PU IOP PUBLISHING LTD
PI BRISTOL
PA TEMPLE CIRCUS, TEMPLE WAY, BRISTOL BS1 6BE, ENGLAND
SN 0957-4484
EI 1361-6528
J9 NANOTECHNOLOGY
JI Nanotechnology
PD FEB 27
PY 2015
VL 26
IS 8
AR 085304
DI 10.1088/0957-4484/26/8/085304
PG 9
WC Nanoscience & Nanotechnology; Materials Science, Multidisciplinary;
   Physics, Applied
SC Science & Technology - Other Topics; Materials Science; Physics
GA CA9LH
UT WOS:000349244600012
PM 25656564
ER

PT J
AU Lin, CH
   Polisetty, S
   O'Brien, L
   Baruth, A
   Hilimyer, MA
   Leighton, C
   Gladfelter, WL
AF Lin, Chun-Hao
   Polisetty, Srinivas
   O'Brien, Liam
   Baruth, Andrew
   Hilimyer, Marc A.
   Leighton, Chris
   Gladfelter, Wayne L.
TI Size-Tuned ZnO Nanocrucible Arrays for Magnetic Nanodot Synthesis via
   Atomic Layer Deposition-Assisted Block Polymer Lithography
SO ACS NANO
LA English
DT Article
DE atomic layer deposition; block copolymer; nanolithography; bit patterned
   media; nanocrucible; magnetic nanodots
ID SEQUENTIAL INFILTRATION SYNTHESIS; COPOLYMER LITHOGRAPHY; EMERGING
   TRENDS; THIN-FILMS; TEMPLATES; NANOLITHOGRAPHY; FABRICATION;
   MULTIPLICATION; ROUTE
AB Low-temperature atomic layer deposition of conformal ZnO on a self-assembled block polymer lithographic template comprising well-ordered, vertically aligned cylindrical pores within a poly(styrene) (PS) matrix was used to produce nanocrucible templates with pore diameters tunable via ZnO thickness. Starting from a PS template with a hexagonal array of 30 nm diameter pores on a 45 nm pitch, the ZnO thickness was progressively increased to narrow the pore diameter to as low as 14 nm. Upon removal of the PS by heat treatment in air at 500 degrees C to form an array of size-tunable ZnO nanocrucibles, permalloy (Ni80Fe20) was evaporated at normal incidence, filling the pores and creating an overlayer. Argon ion beam milling was then used to etch back the overlayer (a Damascene-type process), leaving a well-ordered array of isolated ZnO nanocrucibles filled with permalloy nanodots. Microscopy and temperature-dependent magnetometry verified the diameter reduction with increasing ZnO thickness. The largest diameter (30 nm) dots exhibit a ferromagnetic multidomain/vortex state at 300 K, with relatively weakly temperature-dependent coercivity. Reducing the diameter leads to a crossover to a single-domain state and eventually superparamagnetism at sufficiently high temperature, in quantitative agreement with expectations. We argue that this approach could render this form of block polymer lithography compatible with high-temperature processing (as required for technologically important high perpendicular anisotropy ordered alloys, for instance), in addition to enabling separation-dependent studies to probe interdot magnetostatic interactions
C1 [Lin, Chun-Hao; Hilimyer, Marc A.; Gladfelter, Wayne L.] Univ Minnesota Twin Cities, Dept Chem, Minneapolis, MN 55455 USA.
   [Polisetty, Srinivas; O'Brien, Liam; Baruth, Andrew; Leighton, Chris] Univ Minnesota Twin Cities, Dept Chem Engn & Mat Sci, Minneapolis, MN 55455 USA.
   [Baruth, Andrew] Creighton Univ, Dept Phys, Omaha, NE 68178 USA.
   [O'Brien, Liam] Univ Cambridge, Cavendish Lab, Cambridge CB3 0HE, England.
RP Gladfelter, WL (reprint author), Univ Minnesota Twin Cities, Dept Chem, Minneapolis, MN 55455 USA.
EM hillmyer@umn.edu; leighton@umn.edu; wlg@umn.edu
RI O'Brien, Liam/H-1994-2012
OI O'Brien, Liam/0000-0002-0136-8603; Baruth, Andrew/0000-0002-1058-5175
FU National Science Foundation (NSF) through the University of Minnesota
   MSREC [DMR-0819885, DMR-1420013]; NSF through the MRSEC program;
   Minnesota Nano Center
FX Work was supported primarily by the National Science Foundation (NSF)
   through the University of Minnesota MSREC under Award Number DMR-0819885
   and DMR-1420013. Parts of this work were carried out in the
   Characterization Facility, University of Minnesota, which receives
   partial support from the NSF through the MRSEC program, as well as the
   Minnesota Nano Center.
CR Bandic ZZ, 2008, MRS BULL, V33, P831, DOI 10.1557/mrs2008.178
   Bang J, 2009, ADV MATER, V21, P4769, DOI 10.1002/adma.200803302
   Baruth A, 2014, ACS APPL MATER INTER, V6, P13770, DOI 10.1021/am503199d
   Baruth A, 2011, ACS APPL MATER INTER, V3, P3472, DOI 10.1021/am200693x
   Bates CM, 2014, MACROMOLECULES, V47, P2, DOI 10.1021/ma401762n
   BATES FS, 1991, SCIENCE, V251, P898, DOI 10.1126/science.251.4996.898
   Black CT, 2007, ACS NANO, V1, P147, DOI 10.1021/nn7002663
   Cheng JY, 2001, ADV MATER, V13, P1174, DOI 10.1002/1521-4095(200108)13:15<1174::AID-ADMA1174>3.0.CO;2-Q
   Dumas RK, 2007, APPL PHYS LETT, V91, DOI 10.1063/1.2807276
   Elam JW, 2003, CHEM MATER, V15, P3507, DOI 10.1021/cm0303080
   George SM, 2010, CHEM REV, V110, P111, DOI 10.1021/cr900056b
   Griffiths R. A., 2013, J PHYS D, V46
   Hamley IW, 2009, PROG POLYM SCI, V34, P1161, DOI 10.1016/j.progpolymsci.2009.06.003
   Jung YS, 2007, NANO LETT, V7, P2046, DOI 10.1021/nl070924l
   Kumagai H., 2007, AZOJOMO, DOI [10.2240/azojomo0246, DOI 10.2240/AZOJOMO0246]
   Lazzari M, 2003, ADV MATER, V15, P1583, DOI 10.1002/adma.200300382
   Luo M, 2013, MACROMOLECULES, V46, P7567, DOI 10.1021/ma401112y
   Moon HS, 2014, ADV FUNCT MATER, V24, P4343, DOI 10.1002/adfm.201304248
   Olayo-Valles R, 2004, J MATER CHEM, V14, P2729, DOI 10.1039/b408639b
   Park S, 2008, ACS NANO, V2, P766, DOI 10.1021/nn7004415
   Peng Q, 2011, ACS NANO, V5, P4600, DOI 10.1021/nn2003234
   Peng Q, 2010, ADV MATER, V22, P5129, DOI 10.1002/adma.201002465
   Ramanathan M, 2013, J MATER CHEM C, V1, P2080, DOI 10.1039/c3tc00930k
   Ross CA, 2008, MRS BULL, V33, P838, DOI 10.1557/mrs2008.179
   Ross C. A., 2002, PHYS REV B, V65
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Scholz W, 2003, J MAGN MAGN MATER, V266, P155, DOI 10.1016/S0304-8853(03)00466-9
   Sinturel C, 2013, MACROMOLECULES, V46, P5399, DOI 10.1021/ma400735a
   Stoykovich MP, 2007, ACS NANO, V1, P168, DOI 10.1021/nn700164p
   Tang CB, 2008, SCIENCE, V322, P429, DOI 10.1126/science.1162950
   Thurn-Albrecht T, 2000, SCIENCE, V290, P2126, DOI 10.1126/science.290.5499.2126
   Thurn-Albrecht T, 2000, ADV MATER, V12, P787, DOI 10.1002/(SICI)1521-4095(200006)12:11<787::AID-ADMA787>3.0.CO;2-1
   Tseng YC, 2012, ADV MATER, V24, P2608, DOI 10.1002/adma.201104871
   Tseng YC, 2011, J PHYS CHEM C, V115, P17725, DOI 10.1021/jp205532e
   Tseng YC, 2011, J MATER CHEM, V21, P11722, DOI 10.1039/c1jm12461g
   Warner E. J., 2013, J VAC SCI TECHNOL A, V31
   Xiao SG, 2005, NANOTECHNOLOGY, V16, pS324, DOI 10.1088/0957-4484/16/7/003
   Yuan H., 1930, J VAC SCI TECHNOL A, V30
NR 38
TC 6
Z9 6
U1 7
U2 60
PU AMER CHEMICAL SOC
PI WASHINGTON
PA 1155 16TH ST, NW, WASHINGTON, DC 20036 USA
SN 1936-0851
EI 1936-086X
J9 ACS NANO
JI ACS Nano
PD FEB
PY 2015
VL 9
IS 2
BP 1379
EP 1387
DI 10.1021/nn505731n
PG 9
WC Chemistry, Multidisciplinary; Chemistry, Physical; Nanoscience &
   Nanotechnology; Materials Science, Multidisciplinary
SC Chemistry; Science & Technology - Other Topics; Materials Science
GA CB9GR
UT WOS:000349940500035
PM 25603043
ER

PT J
AU Messerschmitt, DG
AF Messerschmitt, David G.
TI Design for minimum energy in interstellar communication
SO ACTA ASTRONAUTICA
LA English
DT Article
DE Interstellar communication; Starships; SETI; METI
ID SETI
AB Microwave digital communication at interstellar distances is the foundation of extraterrestrial civilization (SETI and METI) communication of information-bearing signals. Large distances demand large transmitted power and/or large antennas, while the propagation is transparent over a wide bandwidth. Recognizing a fundamental tradeoff, reduced energy delivered to the receiver at the expense of wide bandwidth (the opposite of terrestrial objectives) is advantageous. Wide bandwidth also results in simpler design and implementation, allowing circumvention of dispersion and scattering arising in the interstellar medium and motion effects and obviating any related processing. The minimum energy delivered to the receiver per bit of information is determined by cosmic microwave background alone. By mapping a single bit onto a carrier burst, the Morse code invented for the telegraph in 1836 comes closer to this minimum energy than approaches used in modern terrestrial radio. Rather than the terrestrial approach of adding phases and amplitudes increases information capacity while minimizing bandwidth, adding multiple time-frequency locations for carrier bursts increases capacity while minimizing energy per information bit. The resulting location code is simple and yet can approach the minimum energy as bandwidth is expanded. It is consistent with easy discovery, since carrier bursts are energetic and straightforward modifications to post-detection pattern recognition can identify burst patterns. Time and frequency coherence constraints leading to simple signal discovery are addressed, and observations of the interstellar medium by transmitter and receiver constrain the burst parameters and limit the search scope. (C) 2014 IAA. Published by Elsevier Ltd. All rights reserved.
C1 Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA.
RP Messerschmitt, DG (reprint author), Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA.
EM messer@eecs.berkeley.edu
FU National Aeronautics and Space Administration
FX Early phases of this research were supported in part by a grant from the
   National Aeronautics and Space Administration to the SETI Institute. Ian
   S. Morrison of the Australian Centre for Astrobiology has maintained an
   invaluable ongoing dialog on these issues. James Benford of Microwave
   Sciences offered a wealth of valuable suggestions on how to communicate
   with the intended audience of physicists and astronomers. The following
   individuals participated in many discussions of issues surrounding
   interstellar communication: Gerry Harp and Jill Tarter of the SETI
   Institute, and Andrew Siemion and Dan Werthimer of the Space Sciences
   Laboratory at Berkeley. Samantha Blair of the Joint ALMA Observatory was
   an early collaborator on interstellar scattering, and was assisted by
   William Coles of the University of California at San Diego. David Tse of
   Stanford University pointed out literature pertinent to power-efficient
   design. Anonymous reviewers provided many helpful suggestions.
CR Barry J. R., 2004, DIGITAL COMMUNICATIO
   Benford J, 2010, ASTROBIOLOGY, V10, P475, DOI 10.1089/ast.2009.0393
   Berrou C., 1993, IEEE INT C COMM, V2, P1064, DOI DOI 10.1109/ICC.1993.397441
   Blair S.K., 2011, COMMUNICATIONS EXTRA
   COCCONI G, 1959, NATURE, V184, P844, DOI 10.1038/184844a0
   Fano Robert M., 1961, TRANSMISSION INFORM
   Fridman PA, 2011, ACTA ASTRONAUT, V69, P777, DOI 10.1016/j.actaastro.2011.05.034
   Gallager R., 1968, INFORM THEORY RELIAB
   Gallager RG, 2008, PRINCIPLES OF DIGITAL COMMUNICATION, P1, DOI 10.1017/CBO9780511813498
   Hemmati H., 2006, DEEP SPACE OPTICAL C, V11
   Howard AW, 2004, ASTROPHYS J, V613, P1270, DOI 10.1086/423300
   JONES HW, 1995, ASTR SOC P, V74, P369
   Kennedy R. S., 1969, FADING DISPERSIVE CO
   Korpela E, 2001, COMPUT SCI ENG, V3, P78, DOI 10.1109/5992.895191
   Lorimer D. R., 2005, HDB PULSAR ASTRONOMY
   MacKay DJC, 1996, ELECTRON LETT, V32, P1645, DOI 10.1049/el:19961141
   Messerschmitt DG, 2012, ACTA ASTRONAUT, V81, P227, DOI 10.1016/j.actaastro.2012.07.024
   Messerschmitt DG, 2012, ACTA ASTRONAUT, V78, P80, DOI 10.1016/j.actaastro.2011.10.005
   Messerschmitt D.G., 2014, MODELING INTERSTELLA
   Messerschmitt D.G., 2014, RELATIVISTIC TIME WA
   Messerschmitt D.G., 2013, ARXIV13054684
   Messerschmitt D.G., 2008, UCBEECS200878
   NARAYAN R, 1992, PHILOS T ROY SOC A, V341, P151, DOI 10.1098/rsta.1992.0090
   SHANNON CE, 1948, AT&T TECH J, V27, P623
   Silver H.W., 2014, ARRL HDB RADIO COMMU
   Simon M. K., 2005, BANDWIDTH EFFICIENT, V2
   Standage Tom, 1998, VICTORIAN INTERNET R
   Taylor J., 2005, JT65 COMMUNICATIONS
   Telatar IE, 2000, IEEE T INFORM THEORY, V46, P1384, DOI 10.1109/18.850678
   Tse D., 2005, FUNDAMENTALS WIRELES
NR 30
TC 1
Z9 1
U1 0
U2 8
PU PERGAMON-ELSEVIER SCIENCE LTD
PI OXFORD
PA THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD OX5 1GB, ENGLAND
SN 0094-5765
EI 1879-2030
J9 ACTA ASTRONAUT
JI Acta Astronaut.
PD FEB-MAR
PY 2015
VL 107
BP 20
EP 39
DI 10.1016/j.actaastro.2014.11.007
PG 20
WC Engineering, Aerospace
SC Engineering
GA CA6XQ
UT WOS:000349061200003
ER

PT J
AU Al Islam, ABMA
   Raghunathan, V
AF Al Islam, A. B. M. Alim
   Raghunathan, Vijay
TI iTCP: an intelligent TCP with neural network based end-to-end congestion
   control for ad-hoc multi-hop wireless mesh networks
SO WIRELESS NETWORKS
LA English
DT Article
DE Wireless mesh networks; Congestion control; Neural networks
ID ATM NETWORKS; TRANSMISSION; PERFORMANCE; INTERNET; CHANNEL; SYSTEMS;
   IMPACT
AB Maintaining the performance of reliable transport protocols, such as transmission control protocol (TCP), over wireless mesh networks (WMNs) is a challenging problem due to the unique characteristics of data transmission over WMNs. The unique characteristics include multi-hop communication over lossy and non-deterministic wireless mediums, data transmission in the absence of a base station, similar traffic patterns over neighboring mesh nodes, etc. One of the reasons for the poor performance of conventional TCP variants over WMNs is that the congestion control mechanisms in conventional TCP variants do not explicitly account for these unique characteristics. To address this problem, this paper proposes a novel artificial intelligence based congestion control technique for reliable data transfer over WMNs. The synergy with artificial intelligence is established by exploiting a carefully designed neural network (NN) in the congestion control mechanism. We analyze the proposed NN based congestion control technique in detail and incorporate it into TCP to create a new variant that we name as intelligent TCP or iTCP. We evaluate the performance of iTCP using both ns-2 simulations and real testbed experiments. Our evaluation results demonstrate that our proposed congestion control technique exhibits a significant improvement in total network throughput and average energy consumption per transmitted bit compared to the congestion control techniques used in other TCP variants.
C1 [Al Islam, A. B. M. Alim; Raghunathan, Vijay] Purdue Univ, Sch ECE, W Lafayette, IN 47907 USA.
   [Al Islam, A. B. M. Alim] Bangladesh Univ Engn & Technol, Dept CSE, Dhaka 1000, Bangladesh.
RP Al Islam, ABMA (reprint author), Purdue Univ, Sch ECE, W Lafayette, IN 47907 USA.
EM razi_bd@yahoo.com; vr@purdue.edu
CR Abdeljaouad I, 2010, 2010 25th Biennial Symposium on Communications (QBSC), DOI 10.1109/BSC.2010.5472999
   Akyildiz IF, 2005, COMPUT NETW, V47, P445, DOI 10.1016/j.comnet.2004.12.001
   Akyildiz IF, 2004, IEEE WIREL COMMUN, V11, P16, DOI 10.1109/MWC.2004.1325888
   Arvidsson A., 2002, P 15 ITC SPEC SEM IN
   Aziz A., 2009, 6 ANN IEEE COMM SOC, P1
   Aziz A, 2011, IEEE ACM T NETWORK, V19, P1178, DOI 10.1109/TNET.2010.2102771
   Bakshi BS, 1997, INT CON DISTR COMP S, P365, DOI 10.1109/ICDCS.1997.598070
   Balakrishnan H., 1995, MOBICOM, V95, P2
   Bivens, 2002, INT J SMART ENG SYST, V4, P243, DOI 10.1080/10255810215019
   BRAKMO LS, 1995, IEEE J SEL AREA COMM, V13, P1465, DOI 10.1109/49.464716
   Brosh E, 2010, IEEE ACM T NETWORK, V18, P1478, DOI 10.1109/TNET.2010.2050780
   Bruno R, 2005, IEEE COMMUN MAG, V43, P123, DOI 10.1109/MCOM.2005.1404606
   Casetti C, 2002, WIREL NETW, V8, P467, DOI 10.1023/A:1016590112381
   Chen LJ, 2005, IEEE INFOCOM SER, P2212
   Chen X., 1991, GLOB TEL C 1991 GLOB, P115
   Cho HC, 2005, P AMER CONTR CONF, P3480, DOI 10.1109/ACC.2005.1470511
   Coley G., 2012, BEAGLEBONE REV A3 SY
   Combs G., 2008, WIRESHARK NETWORK PR
   Dhoble K., 2012, 2012 INT JOINT C NEU, P1
   Douligeris C, 1999, ENG APPL ARTIF INTEL, V12, P453, DOI 10.1016/S0952-1976(99)00013-5
   Dreibholz T, 2010, INT CON ADV INFO NET, P312, DOI 10.1109/AINA.2010.117
   Du Shu-xin, 2004, J Zhejiang Univ Sci, V5, P1124, DOI 10.1631/jzus.2004.1124
   Duong L. M., 2012, THESIS U PARIS SUD P
   Dutta A, 2004, 2004 IEEE 15TH INTERNATIONAL SYMPOSIUM ON PERSONAL, INDOOR AND MOBILE RADIO COMMUNICATIONS, VOLS 1-4, PROCEEDINGS, P1527, DOI 10.1109/PIMRC.2004.1368255
   Dutta A., 2001, 3G WIRELESS      MAY, P7
   Dutta A., 2006, WIRELESS PERSONAL MU, P6
   Efe MO, 2008, NEURAL PROCESS LETT, V28, P63, DOI 10.1007/s11063-008-9082-0
   ElRakabawy S.M., 2005, P 6 ACM INT S MOB AD, P288, DOI 10.1145/1062689.1062726
   Fei X, 2000, J COMPUT SCI TECHNOL, V15, P144, DOI 10.1007/BF02948798
   Floyd S., 2000, EXTENSION SELECTIVE
   Floyd S., 2003, HIGHSPEED TCP LARGE
   Floyd S, 1994, COMPUT COMMUN REV, V24, P8
   Floyd S., 1999, 2582 RFC
   Fu CP, 2003, IEEE J SEL AREA COMM, V21, P216, DOI 10.1109/JSAC.2002.807336
   Fu ZH, 2005, IEEE T MOBILE COMPUT, V4, P209, DOI 10.1109/TMC.2005.30
   Fu ZH, 2003, IEEE INFOCOM SER, P1744
   Gandikota VR, 2008, IEEE T MOBILE COMPUT, V7, P1184, DOI 10.1109/TMC.2008.42
   Gilmore J. F., 1995, J INTELL TRANSPORT S, V2, P231, DOI 10.1080/10248079508903828
   Gupta S., 2012, IJCA COMMUNICATION S
   Ha S., 2008, ACM SIGOPS OPER SYST, V42, P64, DOI DOI 10.1145/1400097.1400105
   Habachi O., 2012, ONLINE LEARNING BASE
   Habib I, 1997, COMPUT NETWORKS ISDN, V29, P325, DOI 10.1016/S0169-7552(96)00099-2
   Hecht-Nielsen R., 1989, IJCNN: International Joint Conference on Neural Networks (Cat. No.89CH2765-6), P593, DOI 10.1109/IJCNN.1989.118638
   Hirel J., 2011, 2011 IEEE International Conference on Robotics and Biomimetics (ROBIO), DOI 10.1109/ROBIO.2011.6181522
   Holland G, 2002, WIREL NETW, V8, P275, DOI 10.1023/A:1013798127590
   Holland G., 2001, P 7 ANN INT C MOB CO, P236, DOI DOI 10.1145/381677.381700
   HOPFIELD JJ, 1982, P NATL ACAD SCI-BIOL, V79, P2554, DOI 10.1073/pnas.79.8.2554
   Houmkozlis CN, 2009, IEEE T NEURAL NETWOR, V20, P527, DOI 10.1109/TNN.2009.2013463
   Hull B., 2004, P 2 INT C EMB NETW S, P134, DOI DOI 10.1145/1031495.1031512
   Islam A. B. M. A. A., 2010, WIRELESS SENSOR NETW, V2, P129
   Islam A. B. M. A. A., 2012, 2012 IEEE 20 INT S M, P31
   Islam A. B. M. A. A., 2012, EMBEDDED SYSTEMS LET, V4, P102
   Islam A. B. M. A. A., 2012, INT J COMMUNICATIONS, V5, P368
   Islam A.R., 2011, 2011 P 20 INT C COMP, P1
   Islam A. B. M. A. A., 2011, 2011 IEEE WIR COMM N, P677
   Jacobson V., 1988, P SIGCOMM C MAY, V18, P314, DOI DOI 10.1145/52325.52356
   Jagannathan S, 2002, AUTOMATICA, V38, P815, DOI 10.1016/S0005-1098(01)00259-X
   Jehan M., 2011, INT J COMPUTER NETWO, V3, P151
   Jin C., 2004, INFOCOM 2004, V4, P2490, DOI DOI 10.1109/INFC0M.2004.1354670
   Karn P., 1987, COMPUT COMMUN REV, V17, P2
   Liu C., 2007, P INT C PAR PROC SEP, P71
   Liu J, 2001, IEEE J SEL AREA COMM, V19, P1300, DOI 10.1109/49.932698
   Liu S., 2006, P INT C PERF EV METH
   Lochert C, 2007, WIREL COMMUN MOB COM, V7, P655, DOI 10.1002/wcm.524
   Lundsten E., 2002, IMPROVING 3D PERFORM
   Marfia G, 2008, ACM S MODEL ANAL SIM, P2
   Mathis M., 1996, P ACM SIGCOMM 96, P281
   Molle C., 2009, IEEE 69 VEH TECHN C, P1
   Murty RN, 2008, 2008 IEEE CONFERENCE ON TECHNOLOGIES FOR HOMELAND SECURITY, VOLS 1 AND 2, P583, DOI 10.1109/THS.2008.4534518
   Oyman O, 2007, IEEE COMMUN MAG, V45, P116, DOI 10.1109/MCOM.2007.4378330
   Paxson V., 2000, 2988 RFC
   Perkins C.E., 1994, COMPUT COMMUN REV, V24, P234, DOI DOI 10.1145/190314.190336
   Peterson L., 2007, COMPUTER NETWORKS SY
   [Anonymous], 2012, EUR J SCI RES
   Qi B., 2010, 2010 7 INT C INF TEC, P862, DOI 10.1109/ITNG.2010.229
   Raghunathan V, 2002, IEEE SIGNAL PROC MAG, V19, P40, DOI 10.1109/79.985679
   Rangwala S, 2011, IEEE ACM T NETWORK, V19, P1797, DOI 10.1109/TNET.2011.2146272
   Rangwala S, 2008, MOBICOM'08: PROCEEDINGS OF THE FOURTEENTH ACM INTERNATIONAL CONFERENCE ON MOBILE COMPUTING AND NETWORKING, P291, DOI 10.1145/1409944.1409978
   Rath H. K., 2008, P NCC
   Rouhani M., 2010, 2010 2 INT C COMP IN
   Sankarasubramaniam Y., 2003, P 4 ACM INT S MOB AD, P177, DOI DOI 10.1145/778415.778437
   Scheuermann B, 2008, AD HOC NETW, V6, P260, DOI 10.1016/j.adhoc.2007.01.001
   Sen J, 2010, ARXIV10111956
   Shiang HP, 2012, IEEE T MULTIMEDIA, V14, P896, DOI 10.1109/TMM.2012.2187178
   Shih E., 2001, P 7 ANN INT C MOB CO, P272, DOI DOI 10.1145/381677.381703
   Siekkinen M, 2007, LECT NOTES COMPUT SC, V4516, P962
   Song K. T. J., 2006, P PFLDNET 2006
   Stathopoulos T, 2007, IEEE INFOCOM SER, P2252, DOI 10.1109/INFCOM.2007.260
   Stevens W., 1997, 2001 RFC
   Su Y, 2005, LECT NOTES COMPUT SC, V3552, P313
   Sundaresan K, 2005, IEEE T MOBILE COMPUT, V4, P588, DOI 10.1109/TMC.2005.81
   Tonnesen A., 2010, OLSRD AD HOC WIRELES
   Vlachos KG, 2007, 2007 FOURTH INTERNATIONAL CONFERENCE ON BROADBAND COMMUNICATIONS, NETWORKS & SYSTEMS, VOLS 1 AND 2, P24, DOI 10.1109/BROADNETS.2007.4550400
   Wan C.-Y., 2005, SENSYS 05, P116
   Wang JL, 2004, INTELL AUTOM SOFT CO, V10, P221
   Wei D. X., 2006, P 2006 WORKSH NS 2 I, P9, DOI DOI 10.1145/1190455.1190463
   Wischik D., 2011, P US NSDI
   Wu H., 2005, ACM T MULTIM COMPUT, V1, P315, DOI DOI 10.1145/1111604.1111605
   Wu H., 2010, P 6 INT C
   Xu C., 2009, 9 INT C EL MEAS INST, P4
   Xu K., 2003, P 9 ANN INT C MOB CO, P16, DOI DOI 10.1145/938985.938988
   Xu LS, 2004, IEEE INFOCOM SER, P2514
   Yi Y, 2007, IEEE ACM T NETWORK, V15, P133, DOI [10.1109/TNET.2006.890121, 10.1109/TNET.206.890121]
   Zhang GH, 2007, AD HOC NETW, V5, P769, DOI 10.1016/j.adhoc.2006.12.002
   Lee J., 2012, US Patent, Patent No. [8,102,768, 8102768]
   Ruutu J., 2005, EP Patent, Patent No. [1,303,970, 1303970]
NR 106
TC 2
Z9 2
U1 1
U2 8
PU SPRINGER
PI DORDRECHT
PA VAN GODEWIJCKSTRAAT 30, 3311 GZ DORDRECHT, NETHERLANDS
SN 1022-0038
EI 1572-8196
J9 WIREL NETW
JI Wirel. Netw.
PD FEB
PY 2015
VL 21
IS 2
BP 581
EP 610
DI 10.1007/s11276-014-0799-6
PG 30
WC Computer Science, Information Systems; Engineering, Electrical &
   Electronic; Telecommunications
SC Computer Science; Engineering; Telecommunications
GA AZ8EY
UT WOS:000348448900017
ER

PT J
AU Elyasi, M
   Bhatia, CS
   Yang, H
AF Elyasi, Mehrdad
   Bhatia, Charanjit S.
   Yang, Hyunsoo
TI Magnetization reversal using excitation of collective modes in nanodot
   matrices
SO SCIENTIFIC REPORTS
LA English
DT Article
ID OSCILLATOR DRIVEN; DOT ARRAYS; FIELD; NANOPARTICLES; SPECTRA
AB The large arrays of magnetic dots are the building blocks of magnonic crystals and the emerging bit patterned media for future recording technology. In order to fully utilize the functionalities of high density magnetic nanodots, a method for the selective reversal of a single nanodot in a matrix of dots is desired. We have proposed a method for magnetization reversal of a single nanodot with microwave excitation in a matrix of magneto-statically interacting dots. The method is based on the excitation of collective modes and the spatial anomaly in the microwave power absorption. We perform numerical simulations to demonstrate the possibility of switching a single dot from any initial state of a 3 by 3 matrix of dots, and develop a theoretical model for the phenomena. We discuss the applicability of the proposed method for introducing defect modes in magnonic crystals as well as for future magnetic recording.
C1 [Elyasi, Mehrdad; Bhatia, Charanjit S.; Yang, Hyunsoo] Natl Univ Singapore, Dept Elect & Comp Engn, Singapore 117576, Singapore.
RP Yang, H (reprint author), Natl Univ Singapore, Dept Elect & Comp Engn, 4 Engn Dr 3, Singapore 117576, Singapore.
EM eleyang@nus.edu.sg
FU National Research Foundation, Prime Minister's Office, Singapore under
   its Competitive Research Programme (CRP) [NRF-CRP 4-2008-06]
FX This research is supported by the National Research Foundation, Prime
   Minister's Office, Singapore under its Competitive Research Programme
   (CRP Award No. NRF-CRP 4-2008-06).
CR Adolff CF, 2013, PHYS REV B, V88, DOI 10.1103/PhysRevB.88.224425
   Beleggia M, 2004, J MAGN MAGN MATER, V278, P270, DOI 10.1016/j.jmmm.2003.12.1314
   Bertotti G, 2009, NONLINEAR MAGNETIZATION DYNAMICS IN NANOSYSTEMS
   Bertotti G, 2001, PHYS REV LETT, V86, P724, DOI 10.1103/PhysRevLett.86.724
   Deac AM, 2008, NAT PHYS, V4, P803, DOI 10.1038/nphys1036
   Demidov VE, 2012, NAT MATER, V11, P1028, DOI [10.1038/nmat3459, 10.1038/NMAT3459]
   Di K, 2014, PHYS REV B, V90, DOI 10.1103/PhysRevB.90.060405
   Ding J, 2011, PHYS REV LETT, V107, DOI 10.1103/PhysRevLett.107.047205
   Galkin AY, 2006, PHYS REV B, V74, DOI 10.1103/PhysRevB.74.144419
   Guslienko KY, 1999, APPL PHYS LETT, V75, P394, DOI 10.1063/1.124386
   Houssameddine D, 2007, NAT MATER, V6, P447, DOI 10.1038/nmat1905
   Igarashi M, 2012, IEEE T MAGN, V48, P3284, DOI 10.1109/TMAG.2012.2200882
   Jain S, 2012, NAT COMMUN, V3, DOI 10.1038/ncomms2331
   Kakazei GN, 2004, APPL PHYS LETT, V85, P443, DOI 10.1063/1.1772868
   Kammerer M, 2012, PHYS REV B, V86, DOI 10.1103/PhysRevB.86.134426
   Kovalev AS, 2002, LOW TEMP PHYS+, V28, P921, DOI 10.1063/1.1531396
   Kruglyak VV, 2005, PHYS REV B, V71, DOI 10.1103/PhysRevB.71.220409
   Lenk B, 2011, PHYS REP, V507, P107, DOI 10.1016/j.physrep.2011.06.003
   Liu LQ, 2012, PHYS REV LETT, V109, DOI 10.1103/PhysRevLett.109.186602
   Lu L, 2013, APPL PHYS LETT, V103, DOI 10.1063/1.4816798
   Nembach HT, 2007, APPL PHYS LETT, V90, DOI 10.1063/1.2450645
   Okamoto S, 2008, APPL PHYS LETT, V93, DOI 10.1063/1.2977474
   Okamoto S, 2008, APPL PHYS LETT, V93, DOI 10.1063/1.2996573
   Okamoto S, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2013.2281400
   Pigeau B, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3373833
   Podbielski J, 2007, PHYS REV LETT, V99, DOI 10.1103/PhysRevLett.99.207202
   Pribiag VS, 2007, NAT PHYS, V3, P498, DOI 10.1038/nphys619
   Rao S, 2014, APPL PHYS LETT, V104, DOI 10.1063/1.4869488
   Saha S, 2013, ADV FUNCT MATER, V23, P2378, DOI 10.1002/adfm.201202545
   Scholz W, 2008, J APPL PHYS, V103, DOI 10.1063/1.2838332
   Seki T, 2013, NAT COMMUN, V4, DOI 10.1038/ncomms2737
   Shibata J, 2004, PHYS REV B, V70, DOI 10.1103/PhysRevB.70.012404
   Tanaka T, 2013, J APPL PHYS, V113, DOI 10.1063/1.4801888
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Thiele JU, 1998, J APPL PHYS, V84, P5686, DOI 10.1063/1.368831
   Thirion C, 2003, NAT MATER, V2, P524, DOI 10.1038/nmat946
   Verba R, 2013, PHYS REV B, V87, DOI 10.1103/PhysRevB.87.134419
   Verba R, 2012, PHYS REV B, V85, DOI 10.1103/PhysRevB.85.014427
   Vogel A, 2011, APPL PHYS LETT, V99, DOI 10.1063/1.3614551
   Woltersdorf G, 2007, PHYS REV LETT, V99, DOI 10.1103/PhysRevLett.99.227207
   Yanes R, 2009, PHYS REV B, V79, DOI 10.1103/PhysRevB.79.224427
   Zhang SL, 2014, SCI REP-UK, V4, DOI 10.1038/srep06109
   Zhu JG, 2008, IEEE T MAGN, V44, P125, DOI 10.1109/TMAG.2007.911031
NR 43
TC 2
Z9 2
U1 2
U2 14
PU NATURE PUBLISHING GROUP
PI LONDON
PA MACMILLAN BUILDING, 4 CRINAN ST, LONDON N1 9XW, ENGLAND
SN 2045-2322
J9 SCI REP-UK
JI Sci Rep
PD JAN 20
PY 2015
VL 5
AR 7908
DI 10.1038/srep07908
PG 8
WC Multidisciplinary Sciences
SC Science & Technology - Other Topics
GA AZ1XL
UT WOS:000348028300027
PM 25601554
ER

PT J
AU Kampen, H
   Medlock, JM
   Vaux, AGC
   Koenraadt, CJM
   van Vliet, AJH
   Bartumeus, F
   Oltra, A
   Sousa, CA
   Chouin, S
   Werner, D
AF Kampen, Helge
   Medlock, Jolyon M.
   Vaux, Alexander G. C.
   Koenraadt, Constantianus J. M.
   van Vliet, Arnold J. H.
   Bartumeus, Frederic
   Oltra, Aitana
   Sousa, Carla A.
   Chouin, Sebastien
   Werner, Doreen
TI Approaches to passive mosquito surveillance in the EU
SO PARASITES & VECTORS
LA English
DT Article
DE Passive surveillance; Community participation; Citizen science; Invasive
   mosquitoes; Vectors; Mosquito inventory
ID JAPONICUS-JAPONICUS THEOBALD; STEGOMYIA ALBOPICTUS SKUSE;
   AEDES-ALBOPICTUS; CITIZEN SCIENCE; INVASIVE MOSQUITOS; CHIKUNGUNYA
   VIRUS; 1901 DIPTERA; LIFE STAGES; 1ST RECORD; EUROPE
AB The recent emergence in Europe of invasive mosquitoes and mosquito-borne disease associated with both invasive and native mosquito species has prompted intensified mosquito vector research in most European countries. Central to the efforts are mosquito monitoring and surveillance activities in order to assess the current species occurrence, distribution and, when possible, abundance, in order to permit the early detection of invasive species and the spread of competent vectors. As active mosquito collection, e.g. by trapping adults, dipping preimaginal developmental stages or ovitrapping, is usually cost-, time- and labour-intensive and can cover only small parts of a country, passive data collection approaches are gradually being integrated into monitoring programmes. Thus, scientists in several EU member states have recently initiated programmes for mosquito data collection and analysis that make use of sources other than targeted mosquito collection. While some of them extract mosquito distribution data from zoological databases established in other contexts, community-based approaches built upon the recognition, reporting, collection and submission of mosquito specimens by citizens are becoming more and more popular and increasingly support scientific research. Based on such reports and submissions, new populations, extended or new distribution areas and temporal activity patterns of invasive and native mosquito species were found. In all cases, extensive media work and communication with the participating individuals or groups was fundamental for success. The presented projects demonstrate that passive approaches are powerful tools to survey the mosquito fauna in order to supplement active mosquito surveillance strategies and render them more focused. Their ability to continuously produce biological data permits the early recognition of changes in the mosquito fauna that may have an impact on biting nuisance and the risk of pathogen transmission associated with mosquitoes. International coordination to explore synergies and increase efficiency of passive surveillance programmes across borders needs to be established.
C1 [Kampen, Helge] Friedrich Loeffler Inst, Fed Res Inst Anim Hlth, Inst Infectol, D-17493 Greifswald, Insel Riems, Germany.
   [Medlock, Jolyon M.; Vaux, Alexander G. C.] Publ Hlth England, Salisbury, Wilts, England.
   [Koenraadt, Constantianus J. M.; van Vliet, Arnold J. H.] Wageningen Univ, NL-6700 AP Wageningen, Netherlands.
   [Bartumeus, Frederic; Oltra, Aitana] CEAB CSIC, ICREA Movement Ecol Lab, Girona, Spain.
   [Sousa, Carla A.] Univ Nova Lisboa, Inst Higiene & Med Trop, P-1200 Lisbon, Portugal.
   [Chouin, Sebastien] EID Atlantique, Rochefort Sur Mer, France.
   [Werner, Doreen] Leibniz Ctr Agr Landscape Res, Inst Land Use Syst, Muncheberg, Germany.
RP Kampen, H (reprint author), Friedrich Loeffler Inst, Fed Res Inst Anim Hlth, Inst Infectol, Suedufer 10, D-17493 Greifswald, Insel Riems, Germany.
EM helge.kampen@fli.bund.de
RI Sousa, Carla /G-6531-2012
OI Sousa, Carla /0000-0002-2386-7577
FU Science and Technology Support Program of Sichuan Province [2015SZ0201];
   Special Fund for Agroscientific Research in the Public Interest
   [201203062]; Chang-jiang Scholars and the Innovative Research Team in
   University [IRT0848]
FX This research was supported by Science and Technology Support Program of
   Sichuan Province (Grant No. 2015SZ0201), Special Fund for Agroscientific
   Research in the Public Interest (Grant No. 201203062) and Chang-jiang
   Scholars and the Innovative Research Team in University (Grant No.
   IRT0848).
CR Alarcon-Elbal Pedro Ma, 2013, Anales de Biologia, V35, P95, DOI 10.6018/analesbio.0.35.14
   ALMEIDA A.P., 2007, EUROSURVEILLANCE, V12, pe3311
   Aranda C, 2006, MED VET ENTOMOL, V20, P150, DOI 10.1111/j.1365-2915.2006.00605.x
   Bonney R, 2014, SCIENCE, V343, P1436, DOI 10.1126/science.1251554
   Collantes Francisco, 2011, Anales de Biologia, V33, P99
   Delacour-Estrella S., 2010, Boletin de la SEA, V47, P440
   Delatte H, 2008, PARASITE, V15, P3
   Dickinson JL, 2012, FRONT ECOL ENVIRON, V10, P291, DOI 10.1890/110236
   ECDC, 2012, GUID SURV INV MOSQ S
   ECDC, 2014, GUID SURV NAT MOSQ S
   Engler O, 2013, INT J ENV RES PUB HE, V10, P4869, DOI 10.3390/ijerph10104869
   Eritja R, 2005, BIOL INVASIONS, V7, P87, DOI 10.1007/s10530-004-9637-6
   Lefait Robin R, 2009, LA LUTTE ANTIVECTORI
   Ganushkina L. A., 2013, Meditsinskaya Parazitologiya i Parazitarnye Bolezni, P45
   Genchi C, 2011, VECTOR-BORNE ZOONOT, V11, P1307, DOI 10.1089/vbz.2010.0247
   Gjenero-Margan I., 2011, EUROSURVEILLANCE, V16
   Golding N, 2012, PARASITE VECTOR, V5, P2
   Grandadam M, 2011, EMERG INFECT DIS, V17, P910, DOI 10.3201/eid1705.101873
   Gratz NG, 2004, MED VET ENTOMOL, V18, P215, DOI 10.1111/j.0269-283X.2004.00513.x
   Hecker S, 2014, MITT DEUT GES ALLGEM, V19, P131
   Hubalek Z, 2008, PARASITOL RES, V103, pS29, DOI 10.1007/s00436-008-1064-7
   Instituto Nacional de Saude Governo de Portugal, 2014, REVIVE RED VIG VET
   Kampen H, 2013, J EUR MOSQ CONTROL A, V31, P36
   Kampen H, 2014, PARASITE VECTOR, V7, DOI 10.1186/1756-3305-7-59
   Kampen H, 2012, PARASITE VECTOR, V5, DOI 10.1186/1756-3305-5-284
   Knudsen A. B., 1995, Parassitologia (Rome), V37, P91
   LA RUCHE G, 2010, EUROSURVEILLANCE, V15
   Lundstrom JO, 1999, J VECTOR ECOL, V24, P1
   Bueno Mari R, 2010, B ASOC ESPAN ENTOMOL, V33, P529
   Medlock J. M., 2012, European Mosquito Bulletin, P15
   MEDLOCK J. M., 2012, VET REC, V15, P278
   Medlock JM, 2012, VECTOR-BORNE ZOONOT, V12, P435, DOI 10.1089/vbz.2011.0814
   Miquel M, 2013, J EUROPEAN MOSQ CONT, V31, P8
   ProMed-mail, 2014, PROMED MAIL     1116
   Rees Alun T., 1990, Dipterists Digest, V6, P7
   Rees Alun T., 1996, Dipterists Digest Second Series, V3, P5
   Rees Alun T., 1995, Dipterists Digest Second Series, V2, P41
   Rees Alun T., 1994, Dipterists Digest Second Series, V1, P36
   Rees Alun T., 1992, Dipterists Digest, V11, P22
   Rees A, 1989, BRIT MOSQUITO GROUP, V6, P1
   Reinert JF, 2004, ZOOL J LINN SOC-LOND, V142, P289, DOI 10.1111/j.1096-3642.2004.00144.x
   Reinert JF, 2006, ZOOL J LINN SOC-LOND, V148, P1, DOI 10.1111/j.1096-3642.2006.00254.x
   Reiter P, 1998, J AM MOSQUITO CONTR, V14, P83
   Rezza G, 2007, LANCET, V370, P1840, DOI 10.1016/S0140-6736(07)61779-6
   RODHAIN F, 1993, B SOC PATHOL EXOT, V86, P3
   Rodhain F, 1996, B SOC PATHOL EXOT, V89, P137
   Roiz D, 2007, J VECTOR ECOL, V32, P10, DOI 10.3376/1081-1710(2007)32[10:ASOMBI]2.0.CO;2
   Roiz D, 2007, B SEA, V1, P523
   ROSEN L, 1986, AM J TROP MED HYG, V35, P642
   Schaffner F, 2000, CR ACAD SCI III-VIE, V323, P373, DOI 10.1016/S0764-4469(00)00143-8
   Schaffner F, 2013, CLIN MICROBIOL INFEC, V19, P685, DOI 10.1111/1469-0691.12189
   Schaffner F, 2014, LANCET INFECT DIS, V14, P1044, DOI 10.1016/S1473-3099(14)70925-9
   Scholte E., 2010, EUROSURVEILLANCE, V11, P15
   Scholte EJ, 2007, ECOL CONT VECTOR-BOR, V1, P241
   Service MW, 1970, ENV HLTH, V78, P569
   Sinka ME, 2010, PARASITE VECTOR, V3, DOI 10.1186/1756-3305-3-117
   SNOW K R, 1986, Environmental Health (London), V94, P267
   Snow KR, 1996, ENV HLTH, V104, P294
   SOUSA C. A., 2012, EUROSURVEILLANCE, V17
   TABACHNICK W J, 1991, American Entomologist, V37, P14
   Tatem AJ, 2012, PARASITOLOGY, V139, P1816, DOI 10.1017/S0031182012000352
   Vezzani R, 2007, TROP MED INT HEALTH, V12, P299
   Werner D, 2015, PARASITOL RES, V114, P831, DOI 10.1007/s00436-014-4244-7
   Werner D, 2013, PARASITOL RES, V112, P3665, DOI 10.1007/s00436-013-3564-3
NR 64
TC 15
Z9 16
U1 4
U2 28
PU BIOMED CENTRAL LTD
PI LONDON
PA 236 GRAYS INN RD, FLOOR 6, LONDON WC1X 8HL, ENGLAND
SN 1756-3305
J9 PARASITE VECTOR
JI Parasites Vectors
PD JAN 8
PY 2015
VL 8
AR 9
DI 10.1186/s13071-014-0604-5
PG 13
WC Parasitology
SC Parasitology
GA CB5XP
UT WOS:000349701600001
PM 25567671
ER

PT J
AU Kise, K
   Omachi, S
   Uchida, S
   Iwamura, M
   Liwicki, M
AF Kise, Koichi
   Omachi, Shinichiro
   Uchida, Seiichi
   Iwamura, Masakazu
   Liwicki, Marcus
TI Data Embedding into Characters
SO IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS
LA English
DT Article
DE data embedding; character recognition; handwriting; supplementary
   information; character design; geometric invariant; pen device
ID RECOVERY; RECOGNITION; INFORMATION; IMAGES; PEN
AB This paper reviews several trials of re-designing conventional communication medium, i.e., characters, for enriching their functions by using data-embedding techniques. For example, characters are redesigned to have better machine-readability even under various geometric distortions by embedding a geometric invariant into each character image to represent class label of the character. Another example is to embed various information into handwriting trajectory by using a new pen device, called a data-embedding pen. An experimental result showed that we can embed 32-bit information into a handwritten line of 5 cm length by using the pen device. In addition to those applications, we also discuss the relationship between data-embedding and pattern recognition in a theoretical point of view. Several theories tell that if we have appropriate supplementary information by data-embedding, we can enhance pattern recognition performance up to 100%.
C1 [Kise, Koichi; Iwamura, Masakazu] Osaka Prefecture Univ, Osaka 5998531, Japan.
   [Omachi, Shinichiro] Tohoku Univ, Sendai, Miyagi 9808579, Japan.
   [Uchida, Seiichi] Kyushu Univ, Fukuoka 8190395, Japan.
   [Liwicki, Marcus] DFKI, Kaiserslautern, Germany.
RP Kise, K (reprint author), Osaka Prefecture Univ, Osaka 5998531, Japan.
EM uchida@ait.kyushu-u.ac.jp
RI U-ID, Kyushu/C-5291-2016
CR The British Computer Society, 1966, CHAR REC 1967
   DOERMANN DS, 1995, INT J COMPUT VISION, V15, P143, DOI 10.1007/BF01450853
   Garey M. R., 1979, COMPUTERS INTRACTABI
   Hecht DL, 2001, COMPUTER, V34, P47, DOI 10.1109/2.910893
   Iwamura M., 2007, IEICE T INF SYST J D, VJ90-D, P460
   Iwamura M., 2010, IEICE T INF SYST J D, VJ93-D, P579
   Iwamura M., 2005, P 1 INT WORKSH CAM B, P68
   Karatzas D, 2013, PROC INT CONF DOC, P1484, DOI 10.1109/ICDAR.2013.221
   Kato Y, 2000, IEEE T PATTERN ANAL, V22, P938, DOI 10.1109/34.877517
   Liang J., 2005, International Journal on Document Analysis and Recognition, V7, P84, DOI 10.1007/s10032-004-0138-z
   Liwicki M., 2010, P 9 INT WORKSH DOC A
   Liwicki M., 2010, P 12 INT C FRONT HAN, P51
   Liwicki M, 2014, PATTERN RECOGN LETT, V35, P246, DOI 10.1016/j.patrec.2012.09.001
   Liwicki M, 2011, PROC INT CONF DOC, P1384, DOI 10.1109/ICDAR.2011.278
   Moravec K.L.C., 2002, P BRIT MACH VIS C, P698
   MORI S, 1992, P IEEE, V80, P1029, DOI 10.1109/5.156468
   Nel EM, 2005, IEEE T PATTERN ANAL, V27, P1733, DOI 10.1109/TPAMI.2005.221
   Okamoto A., 2001, IEICE T FUND ELECTR, VJ84-A, P1037
   Omachi S, 2006, INT C PATT RECOG, P1098
   Rice S. v., 1999, OPTICAL CHARACTER RE
   Uchida S., 2005, P 1 INT WORKSH CAM B, P60
   Uchida S., 2007, P 9 INT C DOC AN REC, V1, P437
   Uchida S., 2006, P 10 INT WORKSH FRON
   Uchida S., 2014, HDB DOCUMENT IMAGE P
   Uchida S, 2006, INT C PATT RECOG, P1134
NR 25
TC 0
Z9 0
U1 0
U2 3
PU IEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG
PI TOKYO
PA KIKAI-SHINKO-KAIKAN BLDG, 3-5-8, SHIBA-KOEN, MINATO-KU, TOKYO, 105-0011,
   JAPAN
SN 1745-1361
J9 IEICE T INF SYST
JI IEICE Trans. Inf. Syst.
PD JAN
PY 2015
VL E98D
IS 1
BP 10
EP 20
DI 10.1587/transinf.2014MUI0002
PG 11
WC Computer Science, Information Systems; Computer Science, Software
   Engineering
SC Computer Science
GA CK9VX
UT WOS:000356588700002
ER

PT J
AU Bird, SM
   Galloway, JM
   Rawlings, AE
   Bramble, JP
   Staniland, SS
AF Bird, Scott M.
   Galloway, Johanna M.
   Rawlings, Andrea E.
   Bramble, Jonathan P.
   Staniland, Sarah S.
TI Taking a hard line with biotemplating: cobalt-doped magnetite magnetic
   nanoparticle arrays
SO NANOSCALE
LA English
DT Article
ID IRON-OXIDE NANOPARTICLES; BIOMEDICAL APPLICATIONS; MAGNETOTACTIC
   BACTERIA; PATTERNED MEDIA; PROTEIN MMS6; DATA-STORAGE; SIZE; ADSORPTION;
   SURFACES; FERRITE
AB Rapid advancements made in technology, and the drive towards miniaturisation, means that we require reliable, sustainable and cost effective methods of manufacturing a wide range of nanomaterials. In this bioinspired study, we take advantage of millions of years of evolution, and adapt a biomineralisation protein for surface patterning of biotemplated magnetic nanoparticles (MNPs). We employ soft-lithographic micro-contact printing to pattern a recombinant version of the biomineralisation protein Mms6 (derived from the magnetotactic bacterium Magnetospirillum magneticum AMB-1). The Mms6 attaches to gold surfaces via a cysteine residue introduced into the N-terminal region. The surface bound protein biotemplates highly uniform MNPs of magnetite onto patterned surfaces during an aqueous mineralisation reaction (with a mean diameter of 90 +/- 15 nm). The simple addition of 6% cobalt to the mineralisation reaction maintains the uniformity in grain size (with a mean diameter of 84 +/- 14 nm), and results in the production of MNPs with a much higher coercivity (increased from approximate to 156 Oe to approximate to 377 Oe). Biotemplating magnetic nanoparticles on patterned surfaces could form a novel, environmentally friendly route for the production of bit-patterned media, potentially the next generation of ultra-high density magnetic data storage devices. This is a simple method to fine-tune the magnetic hardness of the surface biotemplated MNPs, and could easily be adapted to biotemplate a wide range of different nanomaterials on surfaces to create a range of biologically templated devices.
C1 [Bird, Scott M.; Rawlings, Andrea E.; Bramble, Jonathan P.; Staniland, Sarah S.] Univ Sheffield, Dept Chem, Sheffield S3 7HF, S Yorkshire, England.
   [Galloway, Johanna M.] Univ Leeds, Dept Phys & Astron, Leeds LS2 9JT, W Yorkshire, England.
RP Staniland, SS (reprint author), Univ Sheffield, Dept Chem, Dainton Bldg, Sheffield S3 7HF, S Yorkshire, England.
EM s.s.staniland@sheffield.ac.uk
RI galloway, johanna/K-5082-2012; Chapon, Laurent/A-1653-2011
OI galloway, johanna/0000-0003-3998-0870; 
FU BBSRC [BB/H005412/2]; EPSRC [EP/J500458/1, EP/K503071/1]
FX We thank the BBSRC (BB/H005412/2) for funding this work and the EPSRC
   for funding Scott Bird (CDT studentship (EP/J500458/1)) and Johanna
   Galloway (Post-Doctoral Prize Fellowship (EP/K503071/1)).
CR Amemiya Y, 2007, BIOMATERIALS, V28, P5381, DOI 10.1016/j.biomaterials.2007.07.051
   Arakaki A, 2003, J BIOL CHEM, V278, P8745, DOI 10.1074/jbc.M211729200
   Arakaki A., 2009, MRS ONLINE P LIB, V1187, pKK03
   Bellini S, 2009, CHIN J OCEANOL LIMN, V27, P3, DOI 10.1007/s00343-009-0003-5
   Bellini S, 2009, CHIN J OCEANOL LIMN, V27, P6, DOI 10.1007/s00343-009-0006-2
   BERKOWIT.AE, 1968, J APPL PHYS, V39, P1261, DOI 10.1063/1.1656256
   BLAKEMORE R, 1975, SCIENCE, V190, P377, DOI 10.1126/science.170679
   Blundell S., 2003, AM J PHYS, V71, P94, DOI 10.1119/1.1522704
   Charap SH, 1997, IEEE T MAGN, V33, P978, DOI 10.1109/20.560142
   DUEVEL RV, 1992, ANAL CHEM, V64, P337, DOI 10.1021/ac00028a003
   DUNLOP DJ, 1973, J GEOPHYS RES, V78, P1780, DOI 10.1029/JB078i011p01780
   Ely T. O., 2000, J PHYS CHEM B, V104, P695, DOI DOI 10.1021/JP9924427
   Faraji M, 2010, J IRAN CHEM SOC, V7, P1
   Galloway J. M., 2013, MATER RES SOC S P, V1569, P231
   Galloway JM, 2012, J MATER CHEM, V22, P12423, DOI 10.1039/c2jm31620j
   Galloway JM, 2012, J NANO RES-SW, V17, P127, DOI 10.4028/www.scientific.net/JNanoR.17.127
   Galloway JM, 2012, SMALL, V8, P204, DOI 10.1002/smll.201101627
   Galloway JM, 2011, J MATER CHEM, V21, P15244, DOI [10.1039/c1jm12003d/, 10.1039/c1jm12003d]
   [Anonymous], 2013, GRAPHPAD PRISM VERS
   Gupta AK, 2005, BIOMATERIALS, V26, P3995, DOI 10.1016/j.biomaterials.2004.10.012
   Hoinville J, 2003, J APPL PHYS, V93, P7187, DOI 10.1063/1.1555896
   Horcas I, 2007, REV SCI INSTRUM, V78, DOI 10.1063/1.2432410
   Jeong U, 2007, ADV MATER, V19, P33, DOI 10.1002/adma.200600674
   Kihal A, 2009, PHYSCS PROC, V2, P665, DOI 10.1016/j.phpro.2009.11.008
   Klem MT, 2005, ADV FUNCT MATER, V15, P1489, DOI 10.1002/adfm.200400453
   Krzeminski L, 2011, J PHYS CHEM B, V115, P12607, DOI 10.1021/jp205852u
   Laurent S, 2008, CHEM REV, V108, P2064, DOI 10.1021/cr068445e
   Lu AH, 2007, ANGEW CHEM INT EDIT, V46, P1222, DOI 10.1002/anie.200602866
   Ma M, 2004, J MAGN MAGN MATER, V268, P33, DOI 10.1016/S0304-8853(03)00426-8
   Mao CB, 2004, SCIENCE, V303, P213, DOI 10.1126/science.1092740
   Mayes E, 2003, IEEE T MAGN, V39, P624, DOI 10.1109/TMAG.2003.808982
   McNicholas S, 2011, ACTA CRYSTALLOGR D, V67, P386, DOI 10.1107/S0907444911007281
   Metzler RA, 2008, LANGMUIR, V24, P2680, DOI 10.1021/la7031237
   Mornet S, 2006, PROG SOLID STATE CH, V34, P237, DOI 10.1016/j.progsolidstchem.2005.11.010
   MOSKOWITZ BM, 1979, IEEE T MAGN, V15, P1241, DOI 10.1109/TMAG.1979.1060319
   Moumen N, 1996, J PHYS CHEM-US, V100, P14410, DOI 10.1021/jp953324w
   Naik RR, 2002, NAT MATER, V1, P169, DOI 10.1038/nmat758
   Odom TW, 2002, LANGMUIR, V18, P5314, DOI 10.1021/la020169l
   Patterson AL, 1939, PHYS REV, V56, P978, DOI 10.1103/PhysRev.56.978
   Piramanayagam S. N., 2011, DEV DATA STORAGE MAT
   PRIME KL, 1993, J AM CHEM SOC, V115, P10714, DOI 10.1021/ja00076a032
   Prozorov T, 2007, ACS NANO, V1, P228, DOI 10.1021/nn700194h
   Reddy LH, 2012, CHEM REV, V112, P5818, DOI 10.1021/cr300068p
   REGAZZONI AE, 1981, J INORG NUCL CHEM, V43, P1489, DOI 10.1016/0022-1902(81)80322-3
   Reiss BD, 2004, NANO LETT, V4, P1127, DOI 10.1021/nl049825n
   Rodahl M, 1997, FARADAY DISCUSS, V107, P229, DOI 10.1039/a703137h
   Rodrigues RC, 2013, CHEM SOC REV, V42, P6290, DOI 10.1039/c2cs35231a
   Sauerbrey G. Z., 1959, PHYSIK, V155, P206, DOI DOI 10.1021/AM505510M
   Schneider CA, 2012, NAT METHODS, V9, P671, DOI 10.1038/nmeth.2089
   Sorescu M, 2001, J MATER SYNTH PROCES, V9, P119, DOI 10.1023/A:1013241312932
   Studier FW, 2005, PROTEIN EXPRES PURIF, V41, P207, DOI 10.1016/j.pep.2005.01.016
   Sun SH, 2000, SCIENCE, V287, P1989, DOI 10.1126/science.287.5460.1989
   Tamerler C, 2003, PROG ORG COAT, V47, P267, DOI 10.1016/j.porgcoat.2003.08.014
   Telling N., 2009, APPL PHYS LETT, V95
   Terris BD, 2007, MICROSYST TECHNOL, V13, P189, DOI 10.1007/s00542-006-0144-9
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Thomson T, 2004, J APPL PHYS, V96, P1197, DOI 10.1063/1.1759393
   Tizazu G, 2011, NANOSCALE, V3, P2511, DOI 10.1039/c0nr00994f
   Tsang S. C., 2004, ANGEW CHEM, V116, P5763, DOI DOI 10.1002/ANGE.200460552
   Uchida M, 2007, ADV MATER, V19, P1025, DOI 10.1002/adma.200601168
   Voinova MV, 1999, PHYS SCRIPTA, V59, P391, DOI 10.1238/Physica.Regular.059a00391
   Wang B, 2006, BIOMACROMOLECULES, V7, P1203, DOI 10.1021/bm060030f
   Wang LJ, 2012, BIOMACROMOLECULES, V13, P98, DOI 10.1021/bm201278u
   Weller D, 2000, IEEE T MAGN, V36, P10, DOI 10.1109/20.824418
   Xu D, 2012, PROTEINS, V80, P1715, DOI 10.1002/prot.24065
   Yamashita K, 2006, SMALL, V2, P1148, DOI 10.1002/smll.200600220
   Zhang D, 2010, NANOSCALE, V2, P917, DOI 10.1039/c0nr00065e
   Zhou C, 2004, LANGMUIR, V20, P5870, DOI 10.1021/la036251d
NR 68
TC 18
Z9 18
U1 6
U2 53
PU ROYAL SOC CHEMISTRY
PI CAMBRIDGE
PA THOMAS GRAHAM HOUSE, SCIENCE PARK, MILTON RD, CAMBRIDGE CB4 0WF, CAMBS,
   ENGLAND
SN 2040-3364
EI 2040-3372
J9 NANOSCALE
JI Nanoscale
PY 2015
VL 7
IS 16
BP 7340
EP 7351
DI 10.1039/c5nr00651a
PG 12
WC Chemistry, Multidisciplinary; Nanoscience & Nanotechnology; Materials
   Science, Multidisciplinary; Physics, Applied
SC Chemistry; Science & Technology - Other Topics; Materials Science;
   Physics
GA CF9SC
UT WOS:000352905700052
PM 25825205
ER

PT J
AU Tipcharoen, W
   Kaewrawang, A
   Siritaratiwat, A
AF Tipcharoen, Warunee
   Kaewrawang, Arkom
   Siritaratiwat, Apirat
TI Design and Micromagnetic Simulation of Fe/L1(0)-FePt/Fe Trilayer for
   Exchange Coupled Composite Bit Patterned Media at Ultrahigh Areal
   Density
SO ADVANCES IN MATERIALS SCIENCE AND ENGINEERING
LA English
DT Article
ID MAGNETIC-PROPERTIES
AB Exchange coupled composite bit patterned media (ECC-BPM) are one candidate to solve the trilemma issues, overcome superparamagnetic limitations, and obtain ultrahigh areal density. In this work, the ECC continuous media and ECC-BPM of Fe/L1(0)-FePt/Fe trilayer schemes are proposed and investigated based on the Landau-Lifshitz-Gilbert equation. The switching field, H-sw, of the hard phase in the proposed continuous ECC trilayer media structure is reduced below the maximum write head field at interlayer exchange coupling between hard and soft phases, A(ex), higher than 20pJ/m and its value is lower than that for continuous L1(0)-FePt single layer media and L1(0)-FePt/Fe bilayer. Furthermore, the H-sw of the proposed ECC-BPM is lower than the maximum write head field with exchange coupling coefficient between neighboring dots of 5 pJ/m and A(ex) over 10 pJ/m. Therefore, the proposed ECC-BPM trilayer has the highest potential and is suitable for ultrahigh areal density magnetic recording technology at ultrahigh areal density. The results of this work may be gainful idea for nanopatterning in magnetic media nanotechnology.
C1 [Tipcharoen, Warunee; Kaewrawang, Arkom] Khon Kaen Univ, Fac Engn, Dept Elect Engn, Magnet Mat & Data Storage Res Lab, Khon Kaen, Thailand.
   [Siritaratiwat, Apirat] Khon Kaen Univ, Fac Engn, Dept Elect Engn, KKU Seagate Cooperat & EMC EMI Res Lab, Khon Kaen, Thailand.
RP Kaewrawang, A (reprint author), Khon Kaen Univ, Fac Engn, Dept Elect Engn, Magnet Mat & Data Storage Res Lab, Khon Kaen, Thailand.
EM arkom.kaewrawang@gmail.com
FU Khon Kaen University, Thailand, under Incubation Researcher Project;
   Thailand Research Fund (TRF); Khon Kaen University [TRG5780125]
FX This work is financially supported by Khon Kaen University, Thailand,
   under Incubation Researcher Project. This work is also financially
   supported by Thailand Research Fund (TRF) and Khon Kaen University,
   Grant no. TRG5780125. TRF and Khon Kaen University are not always
   necessarily in agreement with the authors' discussions in this paper.
   The authors deeply thank Assistant Professor Dr. Anupap Meesomboon, Dr.
   Sataporn Pornpromlikit, and Dr. Ian Thomas for suggestions.
CR Donahue M. J., 2002, OBJECT ORIENTED MICR
   Fullerton EE, 1998, PHYS REV B, V58, P12193, DOI 10.1103/PhysRevB.58.12193
   Hauet T, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3276911
   Hwang M, 2000, IEEE T MAGN, V36, P3173, DOI 10.1109/20.908726
   Kapoor M, 2006, J APPL PHYS, V99, DOI 10.1063/1.2163850
   Krone P, 2010, APPL PHYS LETT, V97, DOI 10.1063/1.3481668
   Kryder MH, 2008, P IEEE, V96, P1810, DOI 10.1109/JPROC.2008.2004315
   Kryder MH, 2005, J MAGN MAGN MATER, V287, P449, DOI 10.1016/j.jmmm.2004.10.075
   McCallum AT, 2011, APPL PHYS LETT, V98, DOI 10.1063/1.3599573
   Nam NH, 2012, J NANOMATER, DOI 10.1155/2012/801240
   Richter HJ, 2007, J PHYS D APPL PHYS, V40, pR149, DOI 10.1088/0022-3727/40/9/R01
   Ross C, 2001, ANN REV MATER RES, V31, P203, DOI 10.1146/annurev.matsci.31.1.203
   Shan ZS, 2002, IEEE T MAGN, V38, P2907, DOI 10.1109/TMAG.2002.803226
   Suess D, 2009, J MAGN MAGN MATER, V321, P545, DOI 10.1016/j.jmmm.2008.06.041
   Tipcharoen W, 2013, ADV MATER RES-SWITZ, V802, P189, DOI 10.4028/www.scientific.net/AMR.802.189
   Tsai J.-L., 2013, J NANOMATER, V2013
   Victora RH, 2005, IEEE T MAGN, V41, P537, DOI 10.1109/TMAG.2004.838075
   Wang F, 2011, MATER CHEM PHYS, V126, P843, DOI 10.1016/j.matchemphys.2010.12.031
   Wang H, 2011, J APPL PHYS, V109, DOI 10.1063/1.3562453
   Wang Y., 2011, THESIS CARNEGIE MELL
   WANG Y, 2013, CHINESE PHYS B, V22
   Zeng H, 2002, NATURE, V420, P395, DOI 10.1038/nature01208
   Zhang J, 2012, J APPL PHYS, V111, DOI 10.1063/1.3702876
   Zhu JG, 2008, IEEE T MAGN, V44, P125, DOI 10.1109/TMAG.2007.911031
   Zou YY, 2003, APPL PHYS LETT, V82, P2473, DOI 10.1063/1.1565503
NR 25
TC 1
Z9 1
U1 3
U2 20
PU HINDAWI PUBLISHING CORPORATION
PI NEW YORK
PA 410 PARK AVENUE, 15TH FLOOR, #287 PMB, NEW YORK, NY 10022 USA
SN 1687-8434
EI 1687-8442
J9 ADV MATER SCI ENG
JI Adv. Mater. Sci. Eng.
PY 2015
AR 504628
DI 10.1155/2015/504628
PG 5
WC Materials Science, Multidisciplinary
SC Materials Science
GA CC1SK
UT WOS:000350123600001
ER

PT J
AU Ohnuki, S
   Kato, T
   Takano, Y
   Ashizawa, Y
   Nakagawa, K
AF Ohnuki, Shinichiro
   Kato, Tsukasa
   Takano, Yuta
   Ashizawa, Yoshito
   Nakagawa, Katsuji
TI Design and numerical verification of plasmonic cross antennas to
   generate localized circularly polarized light for all-optical magnetic
   recording
SO RADIO SCIENCE
LA English
DT Article
DE all-optical magnetic recording; ultrafast magnetic recording;
   high-density magnetic recording; plasmonic antennas; localized
   circularly polarized light
AB All-optical magnetic recording with localized circularly polarized light is studied for realizing ultrafast and high-density magnetic recording. We design plasmonic cross antennas with bit-patterned media and evaluate the Stokes parameters. Using our proposed method, the magnetic recording speed is about 100,000 times faster than that for conventional methods and the recording density becomes over 2Tbit/inch(2).
C1 [Ohnuki, Shinichiro; Kato, Tsukasa; Takano, Yuta; Ashizawa, Yoshito; Nakagawa, Katsuji] Nihon Univ, Coll Sci & Technol, Tokyo 101, Japan.
RP Ohnuki, S (reprint author), Nihon Univ, Coll Sci & Technol, Tokyo 101, Japan.
EM ohnuki.shinichiro@nihon-u.ac.jp
FU MEXT;  [26420321]
FX This work was party supported by Grant-in-Aid for Scientific Research
   (C) (26420321) and a MEXT-Supported Program for the Strategic Research
   Foundation at Private Universities, 2013-2017. No data was used in the
   research for this manuscript.
CR Argyropoulos C, 2011, RADIO SCI, V46, DOI 10.1029/2010RS004613
   Biagioni P, 2009, PHYS REV LETT, V102, DOI 10.1103/PhysRevLett.102.256801
   Gengs J., 2012, RADIO SCI, V47, DOI [10.1029/2011RS004898, DOI 10.1029/2011RS004898]
   Nakagawa K, 2011, J APPL PHYS, V109, DOI 10.1063/1.3556924
   Ohnuki S, 2013, URSI INT SYM ELECT, P269
   Rakic AD, 1998, APPL OPTICS, V37, P5271, DOI 10.1364/AO.37.005271
   Stanciu CD, 2007, PHYS REV LETT, V99, DOI 10.1103/PhysRevLett.99.047601
   Stumpf M, 2014, RADIO SCI, V49, P689, DOI 10.1002/2014RS005437
   Yamaguchis T., 2007, OPT EXPRESS, V15, P11
NR 9
TC 6
Z9 6
U1 0
U2 8
PU AMER GEOPHYSICAL UNION
PI WASHINGTON
PA 2000 FLORIDA AVE NW, WASHINGTON, DC 20009 USA
SN 0048-6604
EI 1944-799X
J9 RADIO SCI
JI Radio Sci.
PD JAN
PY 2015
VL 50
IS 1
BP 29
EP 40
DI 10.1002/2014RS005563
PG 12
WC Astronomy & Astrophysics; Geochemistry & Geophysics; Meteorology &
   Atmospheric Sciences; Remote Sensing; Telecommunications
SC Astronomy & Astrophysics; Geochemistry & Geophysics; Meteorology &
   Atmospheric Sciences; Remote Sensing; Telecommunications
GA CB8PA
UT WOS:000349891700003
ER

PT J
AU Mellado, C
   Humanes, ML
AF Mellado, Claudia
   Luisa Humanes, Maria
TI The Use of Objective and Analytical Reporting as a Method of
   Professional Work: A Cross-Longitudinal Study of Chilean Political
   Coverage
SO INTERNATIONAL JOURNAL OF PRESS-POLITICS
LA English
DT Article
DE objectivity; analytical reporting; reporting style; political news;
   cross-longitudinal analysis
ID NEWS; JOURNALISM; INSTITUTIONALISM; MEDIA; SOUND; BITE
AB Based on a cross-longitudinal content analysis of 3,624 political news stories published by Chilean national newspapers between 1990 and 2010, this study analyzes the changes and patterns in the reporting styles of the political press by examining the value of objective and analytical reporting used by professional journalists. The study presents empirical evidence on how journalists justify truth claims in political news and how journalistic performance has evolved in a post-dictatorial regime setting. The results show that objective reporting is more common than analytical reporting for both the popular and the elite press. However, although the Chilean traditional press assume objectivity as a criterion of good journalism, they reinterpret its meaning in practice. Specifically, the findings show that the use of analytical reporting has significantly increased in political coverage. The absence of formal separation between facts and opinions in the Chilean case confirms the global tendency toward more partisan journalism, especially in journalistic contexts closer to the polarized pluralist model. The differences in the use of objective and analytical reporting between the popular and the elite press do not show a clear pattern.
C1 [Mellado, Claudia] PUCV, Sch Journalism, Valparaiso, Chile.
   [Luisa Humanes, Maria] Rey Juan Carlos Univ, Dept Commun 2, Madrid, Spain.
RP Mellado, C (reprint author), PUCV, Sch Journalism, Campus Curauma, Valparaiso, Chile.
EM claudia.mellado@ucv.cl
CR Wu Amery, 2007, PRACTICAL ASSESSMENT, V12, P1
   Benson R, 2006, POLIT COMMUN, V23, P187, DOI 10.1080/10584600600629802
   Bill Kovach, 2007, ELEMENTS JOURNALISM
   Brants K, 1998, EUR J COMMUN, V13, P315, DOI 10.1177/0267323198013003002
   Bresnahan R, 2003, LAT AM PERSPECT, V30, P39, DOI 10.1177/0095399703256257
   Bucy EP, 2007, J COMMUN, V57, P652, DOI 10.1111/j.1460-2466.2007.00362.x
   Morten Skovsgaard, 2012, JOURNALISM, V14, P22
   Claudia Mellado, 2014, JOURNALISM STUDIES
   Claudia Mellado, 2012, INT COMMUNICATION GA, V74, P60
   Silvia Pellegrini, 2006, PALABRA CLAVE, V9, P11
   Schiller Dan, 1979, J COMMUN, V29, P46
   Daniel Hallin, 1985, CRITICAL THEORY PUBL, P121
   Daniel Hallin, 2004, COMP MEDIA SYSTEMS 3
   David Mindich, 1998, JUST FACTS OBJECTIVI
   De Albuquerque Alfonso, 2012, COMP MEDIA SYSTEMS W, P72
   Deuze M, 2005, MEDIA CULT SOC, V27, P861, DOI 10.1177/0163443705057674
   Donsbach W, 1993, GAZETTE, V51, P53
   Elizabeth Fox, 2002, LATIN POLITICS GLOBA
   Esser F, 2008, INT J PRESS/POLIT, V13, P401, DOI 10.1177/1940161208323691
   Esser F, 2013, JOURNALISM, V14, P989, DOI 10.1177/1464884913482551
   Fico F, 2006, JOURNALISM MASS COMM, V83, P43
   Gaye Tuchman, 1972, AM J SOCIOL, V77, P660
   Gianpietro Mazzoleni, 2010, COMMUNICACION POLITI
   Guillermo Sunkel, 2001, NUEVA SOC, V175, P143
   Kaplan RL, 2006, POLIT COMMUN, V23, P173, DOI 10.1080/10584600600629737
   Brian McNair, 2000, JOURNALISM DEMOCRACY
   Mellado C, 2012, JOURNALISM, V13, P985, DOI 10.1177/1464884912442294
   Michael Schudson, 1978, DISCOVERING NEWS SOC
   Mireya Marquez, 2012, CUADERNOS INFORM, V30, P97
   Munoz-Torres JR, 2012, JOURNALISM STUD, V13, P566, DOI 10.1080/1461670X.2012.662401
   Navia P, 2010, LAT AM RES REV, V45, P298
   Schudson M., 2001, JOURNALISM, V2, P149, DOI [10.1177/146488490100200201, DOI 10.1177/146488490100200201]
   Silvio Waisbord, 2006, MASS MEDIA POLITICAL, P64
   Silvio Waisbord, 2000, WATCHDOG JOURNALISM
   Stephen Ward, 1999, PRAGMATIC NEWS OBJEC
   Theodore Glasser, 1983, OBJECTIVITY IDEOLOGY
   Thomas Patterson, 2000, DEMOCRACY MEDIA COMP, P241
   Umbricht Andrea Esser Frank, 2014, POL JOURN TRANS W EU, P195
   Valenzuela S, 2011, INT J PRESS/POLIT, V16, P357, DOI 10.1177/1940161210379636
   Walter Lippmann, 1922, PUBLIC OPINION
   Wolfgang Donsbach, 2004, COMP POLITICAL COMMU, P251
   ZELIZER B, 1993, CRIT STUD MASS COMM, V10, P219
NR 42
TC 0
Z9 0
U1 1
U2 4
PU SAGE PUBLICATIONS INC
PI THOUSAND OAKS
PA 2455 TELLER RD, THOUSAND OAKS, CA 91320 USA
SN 1940-1612
EI 1940-1620
J9 INT J PRESS/POLIT
JI Int. J. Press-Polit.
PD JAN
PY 2015
VL 20
IS 1
BP 67
EP 84
DI 10.1177/1940161214558125
PG 18
WC Communication; Political Science
SC Communication; Government & Law
GA AW4OX
UT WOS:000346261600004
ER

PT J
AU Oshima, D
   Tanimoto, M
   Kato, T
   Fujiwara, Y
   Nakamura, T
   Kotani, Y
   Tsunashima, S
   Iwata, S
AF Oshima, Daiki
   Tanimoto, Masahiro
   Kato, Takeshi
   Fujiwara, Yuji
   Nakamura, Tetsuya
   Kotani, Yoshinori
   Tsunashima, Shigeru
   Iwata, Satoshi
TI Modifications of Structure and Magnetic Properties of L1(0) MnAl and
   MnGa Films by Kr+ Ion Irradiation
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Bit-patterned media (BPM); ion irradiation; magnetic circular dichroism;
   MnAl; MnGa
ID RAY CIRCULAR-DICHROISM; PATTERNED MEDIA; ANISOTROPY; PHASE
AB L1(0) phase MnGa and MnAl films with (001) orientation were fabricated by magnetron sputtering. Both films were confirmed to exhibit high perpendicular magnetic anisotropies of 7-8 x 10(6) erg/cc and magnetizations of similar to 450 emu/cc. For the MnGa film, a very flat surface with an average roughness of 0.2 nm was obtained, whereas for the MnAl film, the island growth was confirmed. The X-ray magnetic circular dichroism spectra of these films revealed a significant difference in spectral shape between the perpendicular and inplane magnetized cases. The multiplet peaks appeared in the spectra taken by applying the field normal to the film plane, while such peaks were not clearly seen in the inplane magnetized spectra, possibly owing to the large magnetic anisotropy observed in MnGa and MnAl films. On the other hand, we confirmed a small <L-z>/2<S-z>(<= 0.04) and no systematic change of <L-z>/2<S-z> between the perpendicular and inplane magnetized cases. Finally, 30 keV Kr+ ion irradiation into the films was carried out to modify the magnetic properties of MnGa and MnAl films. In both films, the ion irradiation with a quite low dose of 1x10(14) ions/cm(2) was confirmed to change the magnetism from ferromagnetic to paramagnetic because of the phase change from L1(0) ordered phase to disordered phase. With the significant variation of the magnetism by a low dose of ion irradiation, MnGa and MnAl are considered to be candidates for planar bit-patterned media fabricated by ion irradiation.
C1 [Oshima, Daiki; Tanimoto, Masahiro; Kato, Takeshi] Nagoya Univ, Dept Quantum Engn, Nagoya, Aichi 4648603, Japan.
   [Fujiwara, Yuji] Mie Univ, Dept Engn Phys, Tsu, Mie 5148507, Japan.
   [Nakamura, Tetsuya; Kotani, Yoshinori] Japan Synchrotron Radiat Res Inst SPring 8, Sayo 6795198, Japan.
   [Tsunashima, Shigeru] Nagoya Ind Sci Res Inst, Dept Res, Nagoya, Aichi 4640819, Japan.
   [Iwata, Satoshi] Nagoya Univ, EcoTopia Sci Inst, Nagoya, Aichi 4648603, Japan.
RP Oshima, D (reprint author), Nagoya Univ, Dept Quantum Engn, Nagoya, Aichi 4648603, Japan.
EM oshima@nuee.nagoya-u.ac.jp
RI Kato, Takeshi/I-2654-2013
FU Ministry of Education, Culture, Sports, Science, and Technology;
   Ministry of Internal Affairs and Communications through Strategic
   Information and Communication R&D Promotion Programme; Japan Science and
   Technology Agency; Tatematsu Foundation
FX This work was supported in part by the Ministry of Education, Culture,
   Sports, Science, and Technology under Grants-in-Aid for Scientific
   Research; in part by the Ministry of Internal Affairs and Communications
   through Strategic Information and Communication R&D Promotion Programme;
   and in part by the Japan Science and Technology Agency and the Tatematsu
   Foundation under Adaptable and Seamless Technology transfer Program
   through targetdriven R&D. The synchrotron radiation experiments were
   performed at the BL25SU of SPring-8 with the approval of the Japan
   Synchrotron Radiation Research Institute under Proposal 2012B1759.
CR BITHER TA, 1965, J APPL PHYS, V36, P1501, DOI 10.1063/1.1714349
   BRUNO P, 1989, PHYS REV B, V39, P865, DOI 10.1103/PhysRevB.39.865
   CARR WJ, 1958, PHYS REV, V109, P1971, DOI 10.1103/PhysRev.109.1971
   CARRA P, 1993, PHYS REV LETT, V70, P694, DOI 10.1103/PhysRevLett.70.694
   Chappert C, 1998, SCIENCE, V280, P1919, DOI 10.1126/science.280.5371.1919
   Cho J, 1999, J APPL PHYS, V86, P3149, DOI 10.1063/1.371181
   Cui YS, 2011, J APPL PHYS, V110, DOI 10.1063/1.3663435
   Ferre J, 1999, J MAGN MAGN MATER, V198-99, P191, DOI 10.1016/S0304-8853(98)01084-1
   Hinoue T, 2010, IEEE T MAGN, V46, P1584, DOI 10.1109/TMAG.2010.2043416
   Hosoda M, 2012, J APPL PHYS, V111, DOI 10.1063/1.3676428
   Hyndman R, 2001, J APPL PHYS, V90, P3843, DOI 10.1063/1.1401803
   Kato T, 2004, J MAGN MAGN MATER, V272, P778, DOI [10.1016/j.jmmm.2003.12.382, 10.1016/j.jmmm.m2003.12.382]
   Kato T., 2009, J APPL PHYS, V106
   Kato T., 2009, J APPL PHYS, V105
   Kikitsu A, 2007, IEEE T MAGN, V43, P3685, DOI 10.1109/TMAG.2007.902970
   KOCH AJJ, 1960, J APPL PHYS, V31, pS75, DOI 10.1063/1.1984610
   KONO H, 1958, J PHYS SOC JPN, V13, P1444
   Kota Y, 2012, J PHYS SOC JPN, V81, DOI 10.1143/JPSJ.81.084705
   KRISHNAN KM, 1992, APPL PHYS LETT, V61, P2365, DOI 10.1063/1.108245
   Mizukami S, 2012, PHYS REV B, V85, DOI 10.1103/PhysRevB.85.014416
   Okamoto S, 2002, PHYS REV B, V66, DOI 10.1103/PhysRevB.66.024413
   Oshima D, 2013, IEEE T MAGN, V49, P3608, DOI 10.1109/TMAG.2013.2249501
   Oshima D, 2012, J MAGN MAGN MATER, V324, P1617, DOI 10.1016/j.jmmm.2011.12.019
   Park JH, 2010, J APPL PHYS, V107, DOI 10.1063/1.3337640
   Sato K, 2010, J APPL PHYS, V107, DOI 10.1063/1.3431529
   Suharyadi E, 2006, IEEE T MAGN, V42, P2972, DOI 10.1109/TMAG.2006.880076
   Suharyadi E, 2005, IEEE T MAGN, V41, P3595, DOI 10.1109/TMAG.2005.854735
   Teramura Y, 1996, J PHYS SOC JPN, V65, P1053, DOI 10.1143/JPSJ.65.1053
   Terris BD, 1999, APPL PHYS LETT, V75, P403, DOI 10.1063/1.124389
   THOLE BT, 1992, PHYS REV LETT, V68, P1943, DOI 10.1103/PhysRevLett.68.1943
NR 30
TC 1
Z9 1
U1 2
U2 23
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD DEC
PY 2014
VL 50
IS 12
AR 3203407
DI 10.1109/TMAG.2014.2332975
PG 7
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA CB2GQ
UT WOS:000349445500005
ER

PT J
AU Meilikhov, EZ
   Farzetdinova, RM
AF Meilikhov, E. Z.
   Farzetdinova, R. M.
TI Maximum Magnetic Recording Density and Switching Field Distribution
SO PHYSICS OF THE SOLID STATE
LA English
DT Article
AB An analytical calculation of the parameters of magnetic recording on a square lattice of magnetic granules of the patterned medium has been carried out. The maximum density of the longitudinal and perpendicular recording, which is limited by the thermal instability of the magnetic state and by the magnetic dipole interaction of magnetic granules (bits), has been calculated. The switching field distribution function with the parameters determined by the magnetic dipole interaction of granules and their geometry has been determined for perpendicular recording on rod-shaped granules.
C1 [Meilikhov, E. Z.; Farzetdinova, R. M.] Natl Res Ctr, Kurchatov Inst, Moscow 123098, Russia.
RP Meilikhov, EZ (reprint author), Natl Res Ctr, Kurchatov Inst, Pl Akad Kurchatova 1, Moscow 123098, Russia.
EM meilikhov@yandex.ru
FU Russian Foundation for Basic Research [12-02-00550-a]
FX This study was supported by the Russian Foundation for Basic Research
   (project no. 12-02-00550-a).
CR Costa M. D., 2001, PHYS STATUS SOLIDI A, V189, P923
   Eibagi N, 2012, IEEE MAGN LETT, V3, DOI 10.1109/LMAG.2012.2211864
   Haginoya C, 1999, J APPL PHYS, V85, P8327, DOI 10.1063/1.370678
   Hellwig O, 2007, APPL PHYS LETT, V90, DOI 10.1063/1.2730744
   Litvinov D, 2004, PERPENDICULAR MAGNET
   Meilikhov EZ, 2004, J EXP THEOR PHYS+, V98, P1198, DOI 10.1134/1.1777632
   Meilikhov EZ, 2004, J MAGN MAGN MATER, V268, P237, DOI 10.1016/S0304-8853(03)00506-7
   Neel L., 1949, ANN GEOPHYS, V5, P99
   Ross C, 2001, ANN REV MATER RES, V31, P203, DOI 10.1146/annurev.matsci.31.1.203
   Wang T, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2928202
NR 10
TC 0
Z9 0
U1 1
U2 4
PU MAIK NAUKA/INTERPERIODICA/SPRINGER
PI NEW YORK
PA 233 SPRING ST, NEW YORK, NY 10013-1578 USA
SN 1063-7834
EI 1090-6460
J9 PHYS SOLID STATE+
JI Phys. Solid State
PD DEC
PY 2014
VL 56
IS 12
BP 2408
EP 2417
DI 10.1134/S1063783414120233
PG 10
WC Physics, Condensed Matter
SC Physics
GA AX4TH
UT WOS:000346923600008
ER

PT J
AU Liao, JW
   Atxitia, U
   Evans, RFL
   Chantrell, RW
   Lai, CH
AF Liao, Jung-Wei
   Atxitia, Unai
   Evans, Richard F. L.
   Chantrell, Roy W.
   Lai, Chih-Huang
TI Atomistic modeling of magnetization reversal modes in L1(0) FePt
   nanodots with magnetically soft edges
SO PHYSICAL REVIEW B
LA English
DT Article
ID TEMPERATURE-DEPENDENCE; PATTERNED MEDIA; ANISOTROPY; LIMITS
AB Nanopatterned FePt nanodots often exhibit low coercivity and a broad switching field distribution, which could arise due to edge damage during the patterning process causing a reduction in the L1(0) ordering required for a high magnetocrystalline anisotropy. Using an atomistic spin model, we study the magnetization reversal behavior of L1(0) FePt nanodots with soft magnetic edges. We show that reversal is initiated by nucleation for the whole range of edge widths studied. For narrow soft edges the individual nucleation events dominate reversal; for wider edges, multiple nucleation at the edge creates a circular domain wall at the interface which precedes complete reversal. Our simulations compare well with available analytical theories. The increased edge width further reduces and saturates the required nucleation field. The nucleation field and the activation volume manipulate the thermally induced switching field distribution. By control of the properties of dot edges using proper patterning methods, it should be possible to realize exchange spring bit-patterned media without additional soft layers.
C1 [Liao, Jung-Wei; Lai, Chih-Huang] Natl Tsing Hua Univ, Dept Mat Sci & Engn, Hsinchu 30013, Taiwan.
   [Liao, Jung-Wei; Atxitia, Unai; Evans, Richard F. L.; Chantrell, Roy W.] Univ York, Dept Phys, York YO10 5DD, N Yorkshire, England.
   [Atxitia, Unai] Univ Basque Country, UPV EHU, Dept Fis Mat, ES-20018 San Sebastian, Spain.
RP Liao, JW (reprint author), Natl Tsing Hua Univ, Dept Mat Sci & Engn, Hsinchu 30013, Taiwan.
EM richard.evans@york.ac.uk; chlai@mx.nthu.edu.tw
RI Atxitia, Unai/A-8870-2010; Evans, Richard/F-4230-2010
OI Atxitia, Unai/0000-0002-2871-5644; Evans, Richard/0000-0002-2378-8203
FU Ministry of Science and Technology [MOST 101-2917-I-007-016]; Basque
   Country Government under "Programa Posdoctoral de perfeccionamiento de
   doctores del DEUI del Gobierno Vasco"; Advanced Storage Technology
   Consortium (ASTC); EU [281043 FEMTOSPIN]
FX The authors would like to thank H.-H. Lin for insightful suggestions.
   Fruitful discussions with O. Hovorka, J. Wu, W. Fan, P. Chureemart, and
   S. Ruta are also acknowledged. J.-W. also highly appreciates the
   assistance from J. Barker and T. Ostler on solving computational issues.
   This work has been supported by the Ministry of Science and Technology
   under Grant No. MOST 101-2917-I-007-016. U.A. gratefully acknowledges
   support from Basque Country Government under "Programa Posdoctoral de
   perfeccionamiento de doctores del DEUI del Gobierno Vasco." The
   financial support of the Advanced Storage Technology Consortium (ASTC)
   and EU Seventh Framework Programme under Grant Agreement No. 281043
   FEMTOSPIN is gratefully acknowledged.
CR Adam JP, 2012, PHYS REV B, V85, DOI 10.1103/PhysRevB.85.214417
   Asselin P, 2010, PHYS REV B, V82, DOI 10.1103/PhysRevB.82.054415
   Atxitia U, 2010, PHYS REV B, V82, DOI 10.1103/PhysRevB.82.134440
   Barker J, 2010, APPL PHYS LETT, V97, DOI 10.1063/1.3515928
   Boerner ED, 2005, IEEE T MAGN, V41, P936, DOI 10.1109/TMAG.2004.842128
   Breth L, 2012, J APPL PHYS, V112, DOI 10.1063/1.4737413
   BROWN WF, 1963, PHYS REV, V130, P1677, DOI 10.1103/PhysRev.130.1677
   CALLEN HB, 1966, J PHYS CHEM SOLIDS, V27, P1271, DOI 10.1016/0022-3697(66)90012-6
   Chappert C, 1998, SCIENCE, V280, P1919, DOI 10.1126/science.280.5371.1919
   Dobin AY, 2006, APPL PHYS LETT, V89, DOI 10.1063/1.2335590
   Engelen JBC, 2010, NANOTECHNOLOGY, V21, DOI 10.1088/0957-4484/21/3/035703
   Evans RFL, 2014, J PHYS-CONDENS MAT, V26, DOI 10.1088/0953-8984/26/10/103202
   Garcia-Sanchez F, 2005, APPL PHYS LETT, V87, DOI 10.1063/1.2051789
   GAUNT P, 1986, J APPL PHYS, V59, P4129, DOI 10.1063/1.336671
   GOTO E, 1965, J APPL PHYS, V36, P2951, DOI 10.1063/1.1714613
   Guslienko KY, 2004, PHYS REV B, V70, DOI 10.1103/PhysRevB.70.104405
   HEIDER F, 1988, GEOPHYS RES LETT, V15, P184, DOI 10.1029/GL015i002p00184
   Hellwig O, 2007, APPL PHYS LETT, V90, DOI 10.1063/1.2730744
   Hovorka O, 2012, APPL PHYS LETT, V101, DOI 10.1063/1.4765085
   Kikitsu A, 2013, IEEE T MAGN, V49, P693, DOI 10.1109/TMAG.2012.2226566
   Kronmuller H, 2002, PHYSICA B, V319, P122, DOI 10.1016/S0921-4526(02)01113-4
   Langevin P, 1905, ANN CHIM PHYS, V5, P70
   Lau JW, 2011, PHYS REV B, V84, DOI 10.1103/PhysRevB.84.214427
   Lee J, 2011, APPL PHYS LETT, V99, DOI 10.1063/1.3623752
   McCallum AT, 2012, APPL PHYS LETT, V101, DOI 10.1063/1.4748162
   McDaniel TW, 2005, J PHYS-CONDENS MAT, V17, pR315, DOI 10.1088/0953-8984/17/7/R01
   Mryasov ON, 2005, EUROPHYS LETT, V69, P805, DOI 10.1209/epl/i2004-10404-2
   Nowak U, 2001, ANN REV COMP PHYS, V9, P105
   Okamoto S, 2002, PHYS REV B, V66, DOI 10.1103/PhysRevB.66.024413
   Richards HL, 1997, PHYS REV B, V55, P11521, DOI 10.1103/PhysRevB.55.11521
   Richter HJ, 2006, J APPL PHYS, V99, DOI 10.1063/1.2167635
   Rottmayer RE, 2006, IEEE T MAGN, V42, P2417, DOI 10.1109/TMAG.2006.879572
   Shaw JM, 2008, PHYS REV B, V78, DOI 10.1103/PhysRevB.78.024414
   Suess D, 2006, APPL PHYS LETT, V89, DOI 10.1063/1.2347894
   Suess D, 2009, J MAGN MAGN MATER, V321, P545, DOI 10.1016/j.jmmm.2008.06.041
   Sun SH, 2000, SCIENCE, V287, P1989, DOI 10.1126/science.287.5460.1989
   Thomson T, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.257204
   Tudosa I, 2012, APPL PHYS LETT, V100, DOI 10.1063/1.3692574
   Vokoun D, 2010, J PHYS D APPL PHYS, V43, DOI 10.1088/0022-3727/43/27/275001
   Wang JP, 2005, APPL PHYS LETT, V86, P42504, DOI 10.1063/1.1896431
   Weller D, 1999, IEEE T MAGN, V35, P4423, DOI 10.1109/20.809134
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
   Yan ZJ, 2012, J MAGN MAGN MATER, V324, P3737, DOI 10.1016/j.jmmm.2012.06.006
NR 43
TC 7
Z9 7
U1 3
U2 20
PU AMER PHYSICAL SOC
PI COLLEGE PK
PA ONE PHYSICS ELLIPSE, COLLEGE PK, MD 20740-3844 USA
SN 1098-0121
EI 1550-235X
J9 PHYS REV B
JI Phys. Rev. B
PD NOV 13
PY 2014
VL 90
IS 17
AR 174415
DI 10.1103/PhysRevB.90.174415
PG 8
WC Physics, Condensed Matter
SC Physics
GA CA2WI
UT WOS:000348765800004
ER

PT J
AU Hasegawa, T
   Kondo, Y
   Uebayashi, K
   Arakawa, A
   Ishio, S
AF Hasegawa, Takashi
   Kondo, Yuji
   Uebayashi, Kazuhiko
   Arakawa, Akira
   Ishio, Shunji
TI Nanoscale Composition Control Applied on L1(0) FePtRh Film for Dot
   Patterning Using Magnetic Phase Change
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT IEEE International Magnetics Conference (Intermag)
CY MAY 04-08, 2014
CL Dresden, GERMANY
SP IEEE
DE Atomic diffusion; bit-patterned media (BPM); FePt; ordered alloy
ID ION IRRADIATION; NANOPARTICLES; DEPENDENCE; TRANSITION; ARRAYS; MEDIA;
   FE
AB A planar dot pattern was fabricated using the flat-patterning method involving nanoscale composition control. A small percentage of Fe and Pt atoms was locally diffused into an L1(0) FePtRh film by annealing, resulting in ferromagnetic dots with a diameter of 50 nm and a nonmagnetic spacing with a width of 100 nm. Nanoscale composition profiles around the dots were analyzed by an energy dispersive X-ray detector attached to a transmission electron microscope. Only the area in which the composition crossed the ferromagnetic-nonmagnetic threshold underwent a magnetic phase change. Magnetic force microscopy revealed ferromagnetic dots with a single-domain structure in the nonmagnetic matrix.
C1 [Hasegawa, Takashi; Arakawa, Akira; Ishio, Shunji] Akita Univ, Dept Mat Sci & Engn, Akita 0108502, Japan.
   [Kondo, Yuji] Akita Ind Technol Ctr, Akita 0101623, Japan.
   [Uebayashi, Kazuhiko] Akita Natl Coll Technol, Inst Nat Sci, Akita 0118511, Japan.
RP Hasegawa, T (reprint author), Akita Univ, Dept Mat Sci & Engn, Akita 0108502, Japan.
EM takashi@gipc.akita-u.ac.jp
OI Hasegawa, Takashi/0000-0002-8178-4980
FU Industrial Technology Research Grant Program through the New Energy and
   Industrial Technology Development Organization of Japan [11B07008d]
FX This work was supported by the Industrial Technology Research Grant
   Program in 2011 under Grant 11B07008d through the New Energy and
   Industrial Technology Development Organization of Japan.
CR Bublat T, 2011, NANOTECHNOLOGY, V22, DOI 10.1088/0957-4484/22/31/315301
   Gaur N., 2013, SCI REP, V3, P1907
   Hasegawa T, 2006, J APPL PHYS, V99, DOI 10.1063/1.2177382
   Hasegawa T, 2012, J APPL PHYS, V111, DOI 10.1063/1.3673421
   Hasegawa T, 2009, J APPL PHYS, V106, DOI 10.1063/1.3261839
   Hasegawa T., 2012, J MAGN SOC JPN, V36
   Hasegawa T., 2011, J APPL PHYS, V109
   Hasegawa T, 2008, ACTA MATER, V56, P1564, DOI 10.1016/j.actamat.2007.12.008
   Hasegawa T, 2013, IEEE T MAGN, V49, P3604, DOI 10.1109/TMAG.2013.2245305
   Ishio S, 2012, J MAGN MAGN MATER, V324, P295, DOI 10.1016/j.jmmm.2010.12.014
   Kaiser T, 2008, J APPL PHYS, V103, DOI 10.1063/1.2884347
   Kato T, 2009, J APPL PHYS, V105, DOI 10.1063/1.3072024
   Miyazaki T, 2005, PHYS REV B, V72, DOI 10.1103/PhysRevB.72.144419
   Muller M, 2007, ACTA MATER, V55, P6617, DOI 10.1016/j.actamat.2007.08.030
   Muller M, 2007, PHYS REV B, V76, DOI 10.1103/PhysRevB.76.155412
   Narisawa T, 2011, J APPL PHYS, V109, DOI 10.1063/1.3544407
   Ouchi T, 2008, J MAGN MAGN MATER, V320, P3104, DOI 10.1016/j.jmmm.2008.08.022
   Pei WL, 2011, ACTA MATER, V59, P4818, DOI 10.1016/j.actamat.2011.04.024
   SHARROCK MP, 1994, J APPL PHYS, V76, P6413, DOI 10.1063/1.358282
   Takahashi YK, 2004, J APPL PHYS, V95, P2690, DOI 10.1063/1.1643187
   Terris BD, 1999, APPL PHYS LETT, V75, P403, DOI 10.1063/1.124389
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Thomson T, 2004, J APPL PHYS, V96, P1197, DOI 10.1063/1.1759393
   Uebayashi K, 2010, J APPL PHYS, V107, DOI 10.1063/1.3369973
   Yamada H, 2006, J ALLOY COMPD, V415, P31, DOI 10.1016/j.jallcom.2005.07.046
   Yamane H, 2010, J APPL PHYS, V108, DOI 10.1063/1.3514081
   Yan Z. J., 2011, J PHYS D, V44
NR 27
TC 1
Z9 1
U1 0
U2 2
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD NOV
PY 2014
VL 50
IS 11
AR 2302004
DI 10.1109/TMAG.2014.2317416
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA CB2NZ
UT WOS:000349465900092
ER

PT J
AU Honda, N
   Yamakawa, K
AF Honda, Naoki
   Yamakawa, Kiyoshi
TI High-Areal Density Recording Simulation of Three-Layered ECC
   Bit-Patterned Media With a Shielded Planar Head
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT IEEE International Magnetics Conference (Intermag)
CY MAY 04-08, 2014
CL Dresden, GERMANY
SP IEEE
DE Anisotropy compensation; applied field angle dependence; multilayered
   exchange coupled composite; recording simulation; switching field
AB Magnetic parameters of the previously proposed three-layer exchange coupled composite (ECC) dot were modified to compensate the additional perpendicular anisotropy from the shape and the stacking of the layers. The modification in the magnetic parameters resulted in a minimum switching field and applied field angle dependence of the field. Recording simulation using a multistepped shielded planar head field on the bit-patterned media with modified three-layer ECC dots suggested possibility of a high-areal density recording above 4 T dot/in(2) with no energy assist scheme. It was also concluded that magnetic parameter compensation for additional shape and stacking anisotropy is indispensable for ECC dots.
C1 [Honda, Naoki] Tohoku Inst Technol, Sendai, Miyagi 9828577, Japan.
   [Yamakawa, Kiyoshi] Akita Ind Technol Ctr, Akita 0101623, Japan.
RP Honda, N (reprint author), Tohoku Inst Technol, Sendai, Miyagi 9828577, Japan.
EM n_honda@tohtech.ac.jp
FU Storage Research Consortium, Tokyo, Japan
FX This work was supported by the Storage Research Consortium, Tokyo,
   Japan.
CR Bertero G., 2010, TMRC, P1
   Honda N., 2014, J JPN SOC POWDER POW, V61, pS346
   Honda N., 2013, J MAGN SOC JPN, V37, P126
   Victora RH, 2005, IEEE T MAGN, V41, P537, DOI 10.1109/TMAG.2004.838075
   Yamakawa K., 2009, J APPL PHYS, V105
NR 5
TC 1
Z9 1
U1 0
U2 2
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD NOV
PY 2014
VL 50
IS 11
AR 3002504
DI 10.1109/TMAG.2014.2326924
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA CB2NZ
UT WOS:000349465900182
ER

PT J
AU Hwang, E
   Azevedo, N
   Rabbitt, C
   Hall, K
   Park, J
   Mathew, G
   Tedja, S
   Rauschmayer, R
   Wilson, B
AF Hwang, Euiseok
   Azevedo, Nilton
   Rabbitt, Chad
   Hall, Ken
   Park, Jongseung
   Mathew, George
   Tedja, Suharli
   Rauschmayer, Richard
   Wilson, Bruce
TI Performance Evaluation of Array-Reader-Based Magnetic Recording with a
   Drive-Tap Measurement Platform
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT IEEE International Magnetics Conference (Intermag)
CY MAY 04-08, 2014
CL Dresden, GERMANY
SP IEEE
DE 2-D equalizer; 2-D magnetic recording (TDMR); array-reader;
   array-reader-based magnetic recording (ARMR); hard disk drives (HDD);
   magnetic recording
ID BIT-PATTERNED MEDIA
AB Array-reader-based magnetic recording (ARMR) is one of the promising candidates to achieve areal density beyond 1 Tb/in(2) in magnetic hard disk drives. Joint signal processing of multiple readback streams from the array-reader enables reliable data retrieval under high linear densities and large track squeezes, compared with the single-reader system. In this paper, we present the development of an ARMR evaluation platform employing a single-reader-based drive-tap to expedite performance evaluation under realistic drive environments. The drive-tap interface of the platform can control track squeeze and linear bit density conditions, and optimal bit-aspect ratio-based areal density capability (ADC) can be assessed with this platform. The resulting measurements show that, for the head-media used in this paper, the ARMR ADC gain over single-reader is around 6.7% with shingled magnetic recording at outer diameter (OD) and around 4.9% with perpendicular magnetic recording at OD.
C1 [Hwang, Euiseok; Azevedo, Nilton; Hall, Ken; Mathew, George; Tedja, Suharli; Wilson, Bruce] Avago Technol, San Jose, CA 95131 USA.
   [Rabbitt, Chad; Rauschmayer, Richard] Avago Technol, Longmont, CO 80501 USA.
   [Park, Jongseung] Avago Technol, Allentown, PA 18109 USA.
RP Hwang, E (reprint author), Avago Technol, San Jose, CA 95131 USA.
EM euiseok.hwang@avagotech.com
CR Albrecht TR, 2013, IEEE T MAGN, V49, P773, DOI 10.1109/TMAG.2012.2227303
   Chan KS, 2009, IEEE T MAGN, V45, P3837, DOI 10.1109/TMAG.2009.2024001
   Elidrissi MR, 2011, IEEE T MAGN, V47, P3685, DOI 10.1109/TMAG.2011.2156770
   Greaves S, 2009, IEEE T MAGN, V45, P3823, DOI 10.1109/TMAG.2009.2021663
   Hwang E., 2010, P IEEE ICC, P1
   Kavcic A, 2010, IEEE T MAGN, V46, P812, DOI 10.1109/TMAG.2009.2035636
   Kryder MH, 2008, P IEEE, V96, P1810, DOI 10.1109/JPROC.2008.2004315
   Mathew G, 2014, IEEE T MAGN, V50, DOI 10.1109/TMAG.2013.2283221
   Richter HJ, 2007, J PHYS D APPL PHYS, V40, pR149, DOI 10.1088/0022-3727/40/9/R01
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Wood R, 2009, IEEE T MAGN, V45, P917, DOI 10.1109/TMAG.2008.2010676
   Wu AQ, 2013, IEEE T MAGN, V49, P779, DOI 10.1109/TMAG.2012.2219513
NR 12
TC 1
Z9 1
U1 0
U2 0
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD NOV
PY 2014
VL 50
IS 11
AR 3002704
DI 10.1109/TMAG.2014.2320735
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA CB2NZ
UT WOS:000349465900184
ER

PT J
AU Kong, LJ
   Jiang, YX
   Han, GJ
   Lau, FCM
   Guan, YL
AF Kong, Lingjun
   Jiang, Yunxiang
   Han, Guojun
   Lau, Francis C. M.
   Guan, Yong Liang
TI Improved Min-Sum Decoding for 2-D Intersymbol Interference Channels
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT IEEE International Magnetics Conference (Intermag)
CY MAY 04-08, 2014
CL Dresden, GERMANY
SP IEEE
DE 2-D intersymbol interference (ISI) channels; density evolution (DE);
   low-density parity-check (LDPC) codes; min-sum algorithm (MSA)
ID PARTIAL-RESPONSE CHANNELS; PARITY-CHECK CODES; MEDIA; EQUALIZATION
AB In this paper, 2-D normalized min-sum (NMS) algorithm and offset min-sum (OMS) algorithm are proposed for efficient decoding of low-density parity-check (LDPC) codes in 2-D intersymbol interference (ISI) ultra-high density magnetic recording channels, such as bit-patterned magnetic recording and 2-D magnetic recording, where a reduced-complexity 2-D detector based on the iterative row-column soft detection feedback with Gaussian approximation detector is employed instead of the full 2-D Bahl-Cocke-Jelinek-Raviv (BCJR) detector. The normalization and offset factors of the 2-D NMS and 2-D-OMS, are optimized based on the extended density evolution for LDPC coded 2-D ISI channel, respectively. Simulation results show the performance loss caused by the reduced-complexity LDPC decoder can be almost fully recovered by the proposed approaches, while retaining the benefit of low complexity in decoder compared with the belief propagation (BP) decoding. Furthermore, both the NMS and OMS exhibit a lower error floor than that of BP decoding in high signal-to-noise ratio region.
C1 [Kong, Lingjun] Nanjing Univ Posts & Telecommun, Sch Comp Sci & Technol, Nanjing 210003, Peoples R China.
   [Kong, Lingjun; Jiang, Yunxiang; Lau, Francis C. M.] Hong Kong Polytech Univ, Dept Elect & Informat Engn, Hong Kong, Hong Kong, Peoples R China.
   [Han, Guojun] Guangdong Univ Technol, Sch Informat Engn, Guangzhou 510006, Guangdong, Peoples R China.
   [Guan, Yong Liang] Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore.
RP Kong, LJ (reprint author), Nanjing Univ Posts & Telecommun, Sch Comp Sci & Technol, Nanjing 210003, Peoples R China.
EM ljkong@njupt.edu.cn
RI Guan, Yong/A-5090-2011
OI Guan, Yong/0000-0002-9757-630X
FU Research Grants Council, Hong Kong [PolyU 519011]; National Natural
   Science Foundation of China [61372095, 61172076]
FX This work was supported in part by the Research Grants Council, Hong
   Kong, under Project PolyU 519011, and in part by the National Natural
   Science Foundation of China under Grant 61372095 and Grant 61172076.
CR BAHL LR, 1974, IEEE T INFORM THEORY, V20, P284, DOI 10.1109/TIT.1974.1055186
   Cheng TK, 2007, IEEE SIGNAL PROC LET, V14, P433, DOI 10.1109/LSP.2006.891329
   Karakulak S, 2010, IEEE T MAGN, V46, P3639, DOI 10.1109/TMAG.2010.2049116
   Kong LJ, 2013, IEEE T MAGN, V49, P2823, DOI 10.1109/TMAG.2013.2248351
   Kurkoski BM, 2008, IEICE T FUND ELECTR, VE91A, P2696, DOI 10.1093/ietfec/e91-a.10.2696
   Marrow M, 2003, 2003 IEEE INFORMATION THEORY WORKSHOP, PROCEEDINGS, P131, DOI 10.1109/ITW.2003.1216712
   Ng Y, 2009, IEEE T MAGN, V45, P3535, DOI 10.1109/TMAG.2009.2024427
   Tan W, 2004, IEEE T COMMUN, V52, P1253, DOI 10.1109/TCOMM.2004.833029
   Varnica N, 2003, IEEE COMMUN LETT, V7, P168, DOI 10.1109/LCOMM.2003.810000
   Wood R, 2009, IEEE T MAGN, V45, P917, DOI 10.1109/TMAG.2008.2010676
   Yao J, 2012, IEEE T COMMUN, V60, P3548, DOI 10.1109/TCOMM.2012.091112.110433
   Zhang JT, 2006, IEEE COMMUN LETT, V10, P180, DOI [10.1109/LCOMM.2006.1603377, 10.1109/LCOMM.2006.03005]
   Zheng JP, 2013, IEEE T MAGN, V49, P4768, DOI 10.1109/TMAG.2013.2242333
NR 13
TC 0
Z9 0
U1 0
U2 5
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD NOV
PY 2014
VL 50
IS 11
AR 3101304
DI 10.1109/TMAG.2014.2317749
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA CB2NZ
UT WOS:000349465900187
ER

PT J
AU Kovintavewat, P
   Arrayangkool, A
   Warisarn, C
AF Kovintavewat, Piya
   Arrayangkool, Auttasith
   Warisarn, Chanon
TI A Rate-8/9 2-D Modulation Code for Bit-Patterned Media Recording
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT IEEE International Magnetics Conference (Intermag)
CY MAY 04-08, 2014
CL Dresden, GERMANY
SP IEEE
DE 2-D interference; bit-patterned media recording (BPMR); modulation code;
   position jitter
ID SCHEME
AB The 2-D interference consisting of intersymbol and intertrack interferences is a major impairment in bit-patterned media recording (BPMR), especially at high-areal density (AD). One solution to mitigate the effect of 2-D interference is to apply a 2-D coding scheme on an input data sequence before recording so as to avoid some data patterns that easily cause an error at the data detection process. Nonetheless, this method usually requires many redundant bits, thus lowering a code rate. This paper proposes a rate-8/9 modulation code for a multitrack multihead BPMR system to eliminate the data patterns that lead to severe 2-D interference. Simulation results indicate that the system with the proposed code is superior to that without coding, especially when the AD is high and/or the position jitter is large. Specifically, for the system without position jitter at bit-error rate of 10(-5), the proposed system can provide 1.8 dB gain over the system without coding at the AD of 2.5 Tb/in(2).
C1 [Kovintavewat, Piya] Nakhon Pathom Rajabhat Univ, Data Storage Technol Res Ctr, Nakhon Pathom 73000, Thailand.
   [Arrayangkool, Auttasith; Warisarn, Chanon] King Mongkuts Inst Technol Ladkrabang, Coll Data Storage Innovat, Bangkok 10520, Thailand.
RP Kovintavewat, P (reprint author), Nakhon Pathom Rajabhat Univ, Data Storage Technol Res Ctr, Nakhon Pathom 73000, Thailand.
EM piya@npru.ac.th
FU College of Data Storage Innovation, King Mongkut's Institute of
   Technology Ladkrabang Research Fund; Nakhon Pathom Rajabhat University,
   Nakhon Pathom, Thailand
FX This work was supported in part by the College of Data Storage
   Innovation, King Mongkut's Institute of Technology Ladkrabang Research
   Fund, and in part by Nakhon Pathom Rajabhat University, Nakhon Pathom,
   Thailand.
CR Arrayangkool A., 2013, P ECTI CON MAY, P1
   Arrayangkool A, 2013, IEICE T ELECTRON, VE96C, P1490, DOI 10.1587/transele.E96.C.1490
   Deza M. M., 2009, ENCY DISTANCES
   Groenland JPJ, 2007, IEEE T MAGN, V43, P2307, DOI 10.1109/TMAG.2007.893137
   Karakulak S, 2010, IEEE T MAGN, V46, P3639, DOI 10.1109/TMAG.2010.2049116
   Kim J, 2010, JPN J APPL PHYS, V49, DOI 10.1143/JJAP.49.08KB04
   Kurihara Y, 2008, J MAGN MAGN MATER, V320, P3140, DOI 10.1016/j.jmmm.2008.08.026
   Nabavi S., 2008, THESIS CARNEGIE MELL
   Nabavi S, 2009, IEEE T MAGN, V45, P3523, DOI 10.1109/TMAG.2009.2022493
   Shao XY, 2011, IEEE T MAGN, V47, P2559, DOI 10.1109/TMAG.2011.2157668
NR 10
TC 4
Z9 4
U1 1
U2 7
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD NOV
PY 2014
VL 50
IS 11
AR 3101204
DI 10.1109/TMAG.2014.2316203
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA CB2NZ
UT WOS:000349465900186
ER

PT J
AU Sopon, T
   Supnithi, P
   Vichienchom, K
AF Sopon, Thanomsak
   Supnithi, Pornchai
   Vichienchom, Kasin
TI Improved 2-D Graph-Based Detectors for 2-D Interference Channels
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT IEEE International Magnetics Conference (Intermag)
CY MAY 04-08, 2014
CL Dresden, GERMANY
SP IEEE
DE 2-D interference channels; graph-based detector; intertrack interference
   (ITI)
ID BIT-PATTERNED MEDIA; PERFORMANCE
AB The 2-D interference channels, which consist of intersymbol interference as well as intertrack interference (ITI), appear in high-density recording channels. A graph-based detector has received much attention since it is a real 2-D detector, which can recover data from multiple tracks or each 2-D page simultaneously. In this paper, we propose two approaches to improve the performances of graph-based detectors. For the first method (M1), which processes data on a 2-D page, the system equalizes 2-D interference channel into two 1-D targets, horizontal and vertical directions followed by two corresponding graph detectors. The second method (M2) is similar to the first one, but the 2-D channel is equalized into two 2-D targets with and without cornered ITIs, respectively, in order to better handle the effects of cornered ITIs. Compared with the full-graph detector, the method M1 offers reduced-complexity due the fewer number of edges from the factor nodes. The simulation results on the 3 x 3 channel matrix with 2% cornered ITI show that the proposed methods achieve the gains of about 1.0 and 1.7 dB, respectively, at the BER of 10(-5) over the full graph detector. As the cornered ITI levels increase, the method M2 gives the larger gains over the others. When the media noise is accounted for, the method M2 still gives the best performances. Finally, the mutual information of the three graph detectors for the 2-D channels is computed and compared.
C1 [Sopon, Thanomsak] King Mongkuts Inst Technol Ladkrabang, Coll Data Storage Innovat, Bangkok 10520, Thailand.
   [Supnithi, Pornchai; Vichienchom, Kasin] King Mongkuts Inst Technol Ladkrabang, Fac Engn, Bangkok 10520, Thailand.
RP Sopon, T (reprint author), King Mongkuts Inst Technol Ladkrabang, Coll Data Storage Innovat, Bangkok 10520, Thailand.
EM sthanomsak@gmail.com
RI Supnithi, Pornchai/G-4403-2015
FU College of Data Storage Innovation, King Mongkut's Institute of
   Technology Ladkrabang (KMITL); National Electronics and Computer
   Technology Center; National Science and Technology Development Agency
   Thailand [HDD-01-53-04D]; Thailand Research Fund; KMITL [RSA5680055]
FX This work was supported by College of Data Storage Innovation, King
   Mongkut's Institute of Technology Ladkrabang (KMITL) and National
   Electronics and Computer Technology Center, and National Science and
   Technology Development Agency Thailand, under Grant HDD-01-53-04D. It is
   additionally funded by Thailand Research Fund and KMITL under Grant
   RSA5680055.
CR Chang W, 2010, IEEE T MAGN, V46, P3899, DOI 10.1109/TMAG.2010.2056926
   Hagenauer J., 2004, P 12 EUR SIGN PROC C, P1541
   Hu J., EURASIP J A IN PRESS
   Kim J, 2011, IEEE T MAGN, V47, P594, DOI 10.1109/TMAG.2010.2100371
   Nabavi S, 2007, IEEE ICC, P6249, DOI 10.1109/ICC.2007.1035
   Nabavi S, 2010, IEEE J SEL AREA COMM, V28, P135, DOI 10.1109/JSAC.2010.100202
   Nabavi S, 2008, IEEE T MAGN, V44, P3789, DOI 10.1109/TMAG.2008.2002387
   Nutter PW, 2005, IEEE T MAGN, V41, P4327, DOI 10.1109/TMAG.2005.856586
   Sopon T, 2012, IEEE T MAGN, V48, P4618, DOI 10.1109/TMAG.2012.2204043
   Tosi S, 2004, GLOB TELECOMM CONF, P2445
   Wood R, 2009, IEEE T MAGN, V45, P917, DOI 10.1109/TMAG.2008.2010676
NR 11
TC 0
Z9 0
U1 0
U2 1
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD NOV
PY 2014
VL 50
IS 11
AR 3101704
DI 10.1109/TMAG.2014.2324281
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA CB2NZ
UT WOS:000349465900191
ER

PT J
AU Yu, GS
   Chen, JC
AF Yu, Guosheng
   Chen, Jincai
TI Skew Effect-Induced Track Erasure of Shingled Magnetic Recording System
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT IEEE International Magnetics Conference (Intermag)
CY MAY 04-08, 2014
CL Dresden, GERMANY
SP IEEE
DE Corner angle; shingled magnetic recording; skew effect; track erasure
ID FINITE-ELEMENT; TBIT/IN(2); TB/IN(2); WRITER; MEDIA
AB One of the feasible methods to achieve ultrahigh areal density of magnetic storage system is shingled recording with bit patterned media technology. The adjacent track erasure (ATE) may take place under the impact of the skew footprint, which is associated with the initial slider state, the skewed pole, and the writing corner angle. A sequence of shingled trapezoidal shaped writing heads is modeled to explore the skew effect versus the writing performance. The results show that larger corner angle and narrow skew range are recommended to enhance the writing field and avoid the ATE. The analysis also suggests that hot-spot disk data in the region where the skew angle ranges from -20 degrees to 0 degrees has the lowest possibility to be potentially disrupted.
C1 [Yu, Guosheng; Chen, Jincai] Huazhong Univ Sci & Technol, Sch Comp Sci & Technol, Wuhan Natl Lab Optoelect, Wuhan 430074, Peoples R China.
RP Chen, JC (reprint author), Huazhong Univ Sci & Technol, Sch Comp Sci & Technol, Wuhan Natl Lab Optoelect, Wuhan 430074, Peoples R China.
EM jcchen@hust.edu.cn
FU National Natural Science Foundation of China [61272068, 60773189,
   51001051]; Fundamental Research Funds for the Central Universities,
   Huazhong University of Science and Technology, Wuhan, China
   [2013ZZGH004]
FX This work was supported in part by the National Natural Science
   Foundation of China under Grant 61272068, Grant 60773189, and Grant
   51001051, and in part by the Fundamental Research Funds for the Central
   Universities, Huazhong University of Science and Technology, Wuhan,
   China, under Grant 2013ZZGH004.
CR Dong Y, 2011, IEEE T MAGN, V47, P2652, DOI 10.1109/TMAG.2011.2148112
   Farrow RFC, 1996, J APPL PHYS, V79, P5967, DOI 10.1063/1.362122
   Greaves S, 2009, IEEE T MAGN, V45, P3823, DOI 10.1109/TMAG.2009.2021663
   Greaves SJ, 2008, IEEE T MAGN, V44, P3430, DOI 10.1109/TMAG.2008.2002365
   Kanai Y, 2010, IEEE T MAGN, V46, P715, DOI 10.1109/TMAG.2009.2038354
   Krone P, 2010, APPL PHYS LETT, V97, DOI 10.1063/1.3481668
   Li ZH, 2003, J APPL PHYS, V93, P6456, DOI 10.1063/1.1557651
   Plumer ML, 2006, J APPL PHYS, V99, DOI 10.1063/1.2170046
   Takano K, 2005, IEEE T MAGN, V41, P696, DOI 10.1109/TMAG.2004.839062
   Torabi AF, 2006, IEEE T MAGN, V42, P2288, DOI 10.1109/TMAG.2006.878656
   Wang LS, 2012, IEEE T MAGN, V48, P3551, DOI 10.1109/TMAG.2012.2201141
   Wood R, 2009, IEEE T MAGN, V45, P917, DOI 10.1109/TMAG.2008.2010676
   Yuan ZM, 2009, IEEE T MAGN, V45, P5038, DOI 10.1109/TMAG.2009.2029599
NR 13
TC 1
Z9 1
U1 0
U2 3
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD NOV
PY 2014
VL 50
IS 11
AR 3001504
DI 10.1109/TMAG.2014.2327660
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA CB2NZ
UT WOS:000349465900172
ER

PT J
AU Xiao, SG
   Yang, XM
   Steiner, P
   Hsu, YZ
   Lee, K
   Wago, K
   Kuo, D
AF Xiao, Shuaigang
   Yang, Xiaomin
   Steiner, Philip
   Hsu, Yautzong
   Lee, Kim
   Wago, Koichi
   Kuo, David
TI Servo-Integrated Patterned Media by Hybrid Directed Self-Assembly
SO ACS NANO
LA English
DT Article
DE block copolymer; directed self-assembly; overlay; servo integration;
   spinstand; bit-patterned media
ID BLOCK-COPOLYMERS; ARRAYS; GRAPHOEPITAXY; LITHOGRAPHY
AB A hybrid directed self-assembly approach is developed to fabricate unprecedented servo-integrated bit-patterned media templates, by combining sphere-forming block copolymers with 5 teradot/in.(2) resolution capability, nanoimprint and optical lithography with overlay control. Nanoimprint generates prepatterns with different dimensions in the data field and servo field, respectively, and optical lithography controls the selective self-assembly process in either field. Two distinct directed self-assembly techniques, low-topography graphoepitaxy and high-topography graphoepitaxy, are elegantly integrated to create bit-patterned templates with flexible embedded servo information. Spinstand magnetic test at 1 teradot/in.(2) shows a low bit error rate of 10(-2.43), indicating fully functioning bit-patterned media and great potential of this approach for fabricating future ultra-high-density magnetic storage media.
C1 [Xiao, Shuaigang; Yang, Xiaomin; Steiner, Philip; Hsu, Yautzong; Lee, Kim; Wago, Koichi; Kuo, David] Seagate Technol, Media Res Ctr, Fremont, CA 94538 USA.
RP Xiao, SG (reprint author), Seagate Technol, Media Res Ctr, 47010 Kato Rd, Fremont, CA 94538 USA.
EM shuaigang.xiao@seagate.com
CR Albrecht TR, 2013, IEEE T MAGN, V49, P773, DOI 10.1109/TMAG.2012.2227303
   Ashar K. G., 1997, MAGNETIC DISK DRIVE
   Bita I, 2008, SCIENCE, V321, P939, DOI 10.1126/science.1159352
   Black CT, 2007, IBM J RES DEV, V51, P605
   Challener W. A., 2006, NAT PHOTONICS, V3, P220
   Cheng JY, 2008, ADV MATER, V20, P3155, DOI 10.1002/adma.200800826
   Cheng JY, 2004, NAT MATER, V3, P823, DOI 10.1038/nmat1211
   Cheng LS, 2011, ACS NANO, V5, P1102, DOI 10.1021/nn102754g
   Gu WY, 2013, ADV MATER, V25, P3677, DOI 10.1002/adma.201300899
   Herr DJC, 2011, J MATER RES, V26, P122, DOI 10.1557/jmr.2010.74
   Hong SW, 2011, ACS NANO, V5, P2855, DOI 10.1021/nn103401w
   Kim SO, 2003, NATURE, V424, P411, DOI 10.1038/nature01775
   Park S, 2009, SCIENCE, V323, P1030, DOI 10.1126/science.1168108
   Ross C, 2001, ANN REV MATER RES, V31, P203, DOI 10.1146/annurev.matsci.31.1.203
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Ruiz R, 2011, ACS NANO, V5, P79, DOI 10.1021/nn101561p
   Segalman RA, 2001, ADV MATER, V13, P1152, DOI 10.1002/1521-4095(200108)13:15<1152::AID-ADMA1152>3.0.CO;2-5
   Sundrani D, 2004, NANO LETT, V4, P273, DOI 10.1021/nl035005j
   Walavalkar SS, 2010, NANO LETT, V10, P4423, DOI 10.1021/nl102140k
   Wan L, 2012, J MICRO-NANOLITH MEM, V11, DOI 10.1117/1.JMM.11.3.031405
   Weller D, 1999, IEEE T MAGN, V35, P4423, DOI 10.1109/20.809134
   Wells S. M., 2013, ACS NANO, V6, P2948
   Xiao S., 2011, NANOTECHNOLOGY, V22
   Xiao SG, 2014, J POLYM SCI POL PHYS, V52, P361, DOI 10.1002/polb.23433
   Xiao SG, 2013, J MICRO-NANOLITH MEM, V12, DOI 10.1117/1.JMM.12.3.031110
   Xiao SG, 2009, ADV MATER, V21, P2516, DOI 10.1002/adma.200802087
   Yamamoto R, 2012, JPN J APPL PHYS, V51, DOI 10.1143/JJAP.51.046503
NR 27
TC 8
Z9 8
U1 3
U2 16
PU AMER CHEMICAL SOC
PI WASHINGTON
PA 1155 16TH ST, NW, WASHINGTON, DC 20036 USA
SN 1936-0851
EI 1936-086X
J9 ACS NANO
JI ACS Nano
PD NOV
PY 2014
VL 8
IS 11
BP 11854
EP 11859
DI 10.1021/nn505630t
PG 6
WC Chemistry, Multidisciplinary; Chemistry, Physical; Nanoscience &
   Nanotechnology; Materials Science, Multidisciplinary
SC Chemistry; Science & Technology - Other Topics; Materials Science
GA AU4BC
UT WOS:000345553000093
PM 25380228
ER

PT J
AU Varvaro, G
   Laureti, S
   Fiorani, D
AF Varvaro, G.
   Laureti, S.
   Fiorani, D.
TI L1(0) FePt-based thin films for future perpendicular magnetic recording
   media
SO JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
LA English
DT Article; Proceedings Paper
CT 2nd French-Brazilian Meeting on Nanoscience, Nanotechnology and
   Nanobiotechnoloy
CY DEC 10-14, 2012
CL Univ Brasilia, Int Ctr Condensed Matter Phys, Brasilia, BRAZIL
SP CAPES, COFECUB, CNPq, CNRS, Ambassade France Bresil, FAPDF, CESPE-UnB, ICCMP CIFMC, PPGIQ UnB, PPGIF UnB, FUP UnB Pos Gradacao Ciencia Materiais
HO Univ Brasilia, Int Ctr Condensed Matter Phys
DE Perpendicular recording media; FePt thin film; Exchange coupled
   composite media; Fe/L1(0)-FePt film; FePt graded film
ID BIT PATTERNED MEDIA; EXCHANGE-COUPLED COMPOSITE; ORDERED ALLOY; SPRING
   MEDIA; MULTILAYERS; TEMPERATURE; MICROSTRUCTURE; OPTIMIZATION;
   ANISOTROPY; THICKNESS
AB Current magnetic recording media using perpendicular CoCrPt-Oxide granular films are reaching their physical limit (approx 750 Gbit/in(2) density) due to thermal fluctuations that hinder a further reduction of grain size (< 6-7 nm) needed to scale down the bit size. L1(0)-FePt alloy is currently considered the most promising candidate for future recording media with areal densities above 1 Tbit/in(2) thanks to its high magneto-crystalline anisotropy (K=6-10 MJ/m(3)), which enables it to be thermally stable even at grain sizes down to 3 nm. However, its huge anisotropy implies an increase of the switching field, which cannot be afforded by current available write heads. To simultaneously address the writability and thermal stability requirements, exchange coupled composite media, combining two or multiphase hard and soft materials, where the hard phase provides thermal stability and the soft phase reduces the switching field, have been recently proposed. This paper briefly reviews the fundamental aspects as well as both experimental approaches and magnetic properties of L1(0) FePt-based single phase films and exchange coupled systems for future perpendicular magnetic recording media. (C) 2014 Published by Elsevier B.V.
C1 [Varvaro, G.; Laureti, S.; Fiorani, D.] CNR, ISM, I-00015 Rome, Italy.
RP Fiorani, D (reprint author), CNR, ISM, I-00015 Rome, Italy.
EM dino.fiorani@ism.cnr.it
OI Varvaro, Gaspare/0000-0001-7313-7268
CR Albrecht M, 2005, NAT MATER, V4, P203, DOI 10.1038/nmat1324
   Albrecht TR, 2013, IEEE T MAGN, V49, P773, DOI 10.1109/TMAG.2012.2227303
   Alexandrakis V, 2011, J APPL PHYS, V109, DOI 10.1063/1.3556773
   Asti G, 2006, PHYS REV B, V73, DOI 10.1103/PhysRevB.73.094406
   Ball D.K., 2014, NANOTECHNOLOGY, V25
   Barmak K, 2004, J APPL PHYS, V95, P7501, DOI 10.1063/1.1667856
   Bashir MA, 2009, IEEE T MAGN, V45, P3851, DOI 10.1109/TMAG.2009.2023621
   Casoli F, 2008, J APPL PHYS, V103, DOI 10.1063/1.2885339
   Casoli F, 2005, IEEE T MAGN, V41, P3223, DOI 10.1109/TMAG.2005.854778
   Casoli F, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2905294
   Cebollada A., 2002, MAGNETIC NANOSTRUCTU, P93
   Chen JS, 2006, J MAGN MAGN MATER, V303, P309, DOI 10.1016/j.jmmm.2006.01.106
   Chen SC, 2011, IEEE T MAGN, V47, P517, DOI 10.1109/TMAG.2011.2104355
   de Sousa N, 2010, PHYS REV B, V82, DOI 10.1103/PhysRevB.82.104433
   di Bona A, 2013, ACTA MATER, V61, P4840, DOI 10.1016/j.actamat.2013.04.064
   Dobin AY, 2006, APPL PHYS LETT, V89, DOI 10.1063/1.2335590
   Endo Y, 2003, J APPL PHYS, V94, P7222, DOI 10.1063/1.1622997
   Faustini M, 2012, CHEM MATER, V24, P1072, DOI 10.1021/cm2033492
   Fontana RE, 2012, IEEE T MAGN, V48, P1692, DOI 10.1109/TMAG.2011.2171675
   Goll D, 2008, J APPL PHYS, V104, DOI 10.1063/1.2999337
   Goll D., 2008, APPL PHYS LETT, V93
   Goll D, 2013, PHYS STATUS SOLIDI A, V210, P1261, DOI 10.1002/pssa.201329017
   Grange W, 2000, PHYS REV B, V62, P1157, DOI 10.1103/PhysRevB.62.1157
   Granz S. D., 2013, EUR PHYS J B, VB86, P30655
   Granz SD, 2012, J MAGN MAGN MATER, V324, P287, DOI 10.1016/j.jmmm.2010.12.001
   Guo HH, 2013, IEEE T MAGN, V49, P3683, DOI 10.1109/TMAG.2013.2242436
   Ho H, 2013, IEEE T MAGN, V49, P3663, DOI 10.1109/TMAG.2012.2236681
   Huang LS, 2012, J MAGN MAGN MATER, V324, P1242, DOI 10.1016/j.jmmm.2011.11.026
   Jiang CJ, 2010, J APPL PHYS, V107, DOI 10.1063/1.3437044
   Kai T, 2004, J APPL PHYS, V95, P609, DOI 10.1063/1.1635978
   Kawada Y, 2002, IEEE T MAGN, V38, P2045, DOI [10.1109/TMAG.2002.801829, 10.1009/TMAG.2002.801829]
   Kikitsu A, 2009, J MAGN MAGN MATER, V321, P526, DOI 10.1016/j.jmmm.2008.05.039
   Kronmuller H, 2011, PHYS STATUS SOLIDI B, V248, P2361, DOI 10.1002/pssb.201147205
   Kryder MH, 2008, P IEEE, V96, P1810, DOI 10.1109/JPROC.2008.2004315
   Kwon U, 2006, IEEE T MAGN, V42, P2330, DOI 10.1109/TMAG.2006.878697
   Laenens B, 2010, PHYS REV B, V82, DOI 10.1103/PhysRevB.82.104421
   Laureti S., J APPL CHRIST UNPUB
   Lee J, 2014, NANOTECHNOLOGY, V25, DOI 10.1088/0957-4484/25/4/045604
   Lee J, 2013, PHYS STATUS SOLIDI A, V210, P1305, DOI 10.1002/pssa.201228731
   Lee J, 2011, APPL PHYS LETT, V98, DOI 10.1063/1.3595307
   Maeda T, 2002, APPL PHYS LETT, V80, P2147, DOI 10.1063/1.1463213
   Maret M, 2012, PHYS REV B, V86, DOI 10.1103/PhysRevB.86.024204
   McDaniel TW, 2012, J APPL PHYS, V112, DOI 10.1063/1.4764336
   Parkin SSP, 2008, SCIENCE, V320, P190, DOI 10.1126/science.1145799
   Piramanayagam SN, 2009, J MAGN MAGN MATER, V321, P485, DOI 10.1016/j.jmmm.2008.05.007
   Piramanayagam S-N, 2011, DEV DATA STORAGE
   Platt CL, 2002, J APPL PHYS, V92, P6104, DOI 10.1063/1.1516870
   Reddy VR, 2006, J APPL PHYS, V99, DOI 10.1063/1.2200594
   Richter HJ, 2007, J PHYS D APPL PHYS, V40, pR149, DOI 10.1088/0022-3727/40/9/R01
   Richter HJ, 2006, MRS BULL, V31, P384, DOI 10.1557/mrs2006.98
   Schwickert MM, 2000, J APPL PHYS, V87, P6956, DOI 10.1063/1.372898
   SHARROCK MP, 1994, J APPL PHYS, V76, P6413, DOI 10.1063/1.358282
   Srinivasan K, 2008, J MAGN MAGN MATER, V320, P3041, DOI 10.1016/j.jmmm.2008.08.014
   Suess D, 2007, PHYS REV B, V75, DOI 10.1103/PhysRevB.75.174430
   Suess D, 2009, J MAGN MAGN MATER, V321, P545, DOI 10.1016/j.jmmm.2008.06.041
   Suess D, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2908052
   Suess D., 2006, APPL PHYS LETT, V89
   Suess D, 2007, J MAGN MAGN MATER, V308, P183, DOI 10.1016/j.jmmm.2006.05.021
   Suzuki T, 1999, J MAGN MAGN MATER, V193, P85, DOI 10.1016/S0304-8853(98)00407-7
   Tang D. D., 2010, MAGNETIC MEMORY FUND
   Tiziani F, 2011, MEMORY MASS STORAGE, P59, DOI 10.1007/978-3-642-14752-4_2
   Trichy GR, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2883933
   Tsai JL, 2010, J APPL PHYS, V107, DOI 10.1063/1.3446198
   Tsai JL, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3293444
   Ushiyama J, 2013, IEEE T MAGN, V49, P3612, DOI 10.1109/TMAG.2013.2242442
   Varaprasad B.S.D.Ch.S., 2013, J APPL PHYS, V113
   Varvaro G, 2013, MATER CHEM PHYS, V141, P790, DOI 10.1016/j.matchemphys.2013.06.005
   Varvaro G, 2012, NEW J PHYS, V14, DOI 10.1088/1367-2630/14/7/073008
   Wang F, 2011, J APPL PHYS, V109, DOI 10.1063/1.3556779
   Wang H, 2012, IEEE MAGN LETT, V3, DOI 10.1109/LMAG.2012.2188133
   Wang H, 2013, IEEE T MAGN, V49, P707, DOI 10.1109/TMAG.2012.2230155
   Weller D, 2000, IEEE T MAGN, V36, P10, DOI 10.1109/20.824418
   Yuan FT, 2012, J APPL PHYS, V111, DOI 10.1063/1.3679382
   Zha CL, 2010, APPL PHYS LETT, V97, DOI 10.1063/1.3505521
   Zhou TJ, 2013, J MAGN MAGN MATER, V331, P187, DOI 10.1016/j.jmmm.2012.11.044
   Zhu FQ, 2005, J APPL PHYS, V97, DOI 10.1063/1.1851926
   Zhu JG, 2008, IEEE T MAGN, V44, P125, DOI 10.1109/TMAG.2007.911031
   Zimanyi GT, 2008, J APPL PHYS, V103, DOI 10.1063/1.2835690
NR 78
TC 8
Z9 8
U1 2
U2 84
PU ELSEVIER SCIENCE BV
PI AMSTERDAM
PA PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
SN 0304-8853
EI 1873-4766
J9 J MAGN MAGN MATER
JI J. Magn. Magn. Mater.
PD NOV
PY 2014
VL 368
BP 415
EP 420
DI 10.1016/j.jmmm.2014.04.058
PG 6
WC Materials Science, Multidisciplinary; Physics, Condensed Matter
SC Materials Science; Physics
GA AM7LV
UT WOS:000340049600065
ER

PT J
AU Yang, XM
   Xiao, SG
   Hu, W
   Hwu, J
   van de Veerdonk, R
   Wago, K
   Lee, K
   Kuo, D
AF Yang, XiaoMin
   Xiao, Shuaigang
   Hu, Wei
   Hwu, Justin
   van de Veerdonk, Rene
   Wago, Koichi
   Lee, Kim
   Kuo, David
TI Integration of nanoimprint lithography with block copolymer directed
   self-assembly for fabrication of a sub-20 nm template for bit-patterned
   media
SO NANOTECHNOLOGY
LA English
DT Article
DE directed self-assembly; template fabrication; bit patterned media
ID DENSITY MULTIPLICATION
AB We propose a novel strategy to integrate the nanoimprint lithography (NIL) technique with directed self-assembly (DSA) of block copolymer (BCP) for providing a robust, high-yield, and low-defect-density path to sub-20 nm dense patterning. Through this new NIL-DSA method, UV nanoimprint resist is used as the DSA copolymer pre-pattern to expedite the DSA process. This method was successfully used to fabricate a 1.0 Td in-2 servo-integrated nanoimprint template for bit-patterned media (BPM) application. The fabricated template was used for UV-cure NIL on a 2.5-inch disk. The imprint resist patterns were further transferred into the underlying CoCrPt magnetic layer through a carbon hard mask using ion beam etching. The successful integration of the NIL technique with the DSA process provides us with a new route to BPM nanofabrication, which includes the following three major advantages: (1) a simpler and faster way to implement DSA for high-density BPM patterning; (2) a novel method for fabricating a high-quality dot pattern template through an iterative imprint-DSA-template procedure; and (3) an uncomplicated integration scheme for implementing non-periodic servo features with BCP patterns, thus accelerating the transition of moving the DSA technique from laboratory research to the BPM manufacturing environment.
C1 [Yang, XiaoMin; Xiao, Shuaigang; Hu, Wei; Hwu, Justin; van de Veerdonk, Rene; Wago, Koichi; Lee, Kim; Kuo, David] Seagate Technol, Media Res Ctr, Fremont, CA 94538 USA.
RP Yang, XM (reprint author), Seagate Technol, Media Res Ctr, 47010 Kato Rd, Fremont, CA 94538 USA.
EM xiaomin.yang@seagate.com
CR Bita I, 2008, SCIENCE, V321, P939, DOI 10.1126/science.1159352
   Cheng JY, 2008, ADV MATER, V20, P3155, DOI 10.1002/adma.200800826
   Kim SO, 2003, NATURE, V424, P411, DOI 10.1038/nature01775
   Li HW, 2004, NANO LETT, V4, P1633, DOI 10.1021/nl049209r
   C-C Liu, 2010, J VAC SCI TECHNOL B
   Park SM, 2011, ACS NANO, V5, P8523, DOI 10.1021/nn201391d
   Richter H J, 2006, APPL PHYS LETT
   Ross C, 2001, ANN REV MATER RES, V31, P203, DOI 10.1146/annurev.matsci.31.1.203
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Sanders DP, 2010, J PHOTOPOLYM SCI TEC, V23, P11, DOI 10.2494/photopolymer.23.11
   Schmid GM, 2009, J VAC SCI TECHNOL B, V27, P573, DOI 10.1116/1.3081981
   Stoykovich MP, 2005, SCIENCE, V308, P1442, DOI 10.1126/science.1111041
   Wan L, 2009, LANGMUIR, V25, P12408, DOI 10.1021/la901648y
   Xiao SG, 2009, ADV MATER, V21, P2516, DOI 10.1002/adma.200802087
   Yang XM, 2008, J VAC SCI TECHNOL B, V26, P2604, DOI 10.1116/1.2978487
   Yang XM, 2009, ACS NANO, V3, P1844, DOI 10.1021/nn900073r
   Yang XM, 2009, IEEE T MAGN, V45, P833, DOI 10.1109/TMAG.2008.2010647
   Yang XM, 2000, MACROMOLECULES, V33, P9575, DOI 10.1021/ma001326v
NR 18
TC 8
Z9 8
U1 3
U2 46
PU IOP PUBLISHING LTD
PI BRISTOL
PA TEMPLE CIRCUS, TEMPLE WAY, BRISTOL BS1 6BE, ENGLAND
SN 0957-4484
EI 1361-6528
J9 NANOTECHNOLOGY
JI Nanotechnology
PD OCT 3
PY 2014
VL 25
IS 39
AR 395301
DI 10.1088/0957-4484/25/39/395301
PG 11
WC Nanoscience & Nanotechnology; Materials Science, Multidisciplinary;
   Physics, Applied
SC Science & Technology - Other Topics; Materials Science; Physics
GA AQ0WP
UT WOS:000342503700003
PM 25189432
ER

PT J
AU Han, GJ
   Guan, YL
   Cai, K
   Chan, KS
   Kong, LJ
AF Han, Guojun
   Guan, Yong Liang
   Cai, Kui
   Chan, Kheong Sann
   Kong, Lingjun
TI Coding and Detection for Channels With Written-In Errors and
   Inter-Symbol Interference
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Bit-patterned media recording (BPMR); inter-symbol interference (ISI);
   low-density parity-check (LDPC); marker codes; written-in errors (WIEs)
ID CODE
AB Written-in errors (WIEs), which include written-in substitutions, insertions, and deletions, as well as 2-D inter-symbol interference (2-D-ISI), form one of the major challenges for the new emerging bit-patterned media recording technology. Coding and detection scheme with performance/complexity tradeoffs is expected to address such a challenge. In this paper, a new channel model with WIEs and ISI (WIE-ISI) is presented, and the embedded marker code scheme (EMCS) with Bahl-Cocke-Jelinek-Raviv (BCJR) detector is employed to perform channel detection. By investigating the effect of ISI on the WIE-ISI channel considering BCJR detector, a virtual written-in substitution probability is introduced and a new synchronization algorithm with written-in substitution detection (SA-WSD) is developed. The EMCS employing the proposed SA-WSD demonstrates better error correction performance than that of the original SA. Furthermore, the SA-WSD is found to be robust to small estimation errors in the written-in substitution probability.
C1 [Han, Guojun] Guangdong Univ Technol, Sch Informat Engn, Guangzhou 510006, Guangdong, Peoples R China.
   [Han, Guojun; Guan, Yong Liang; Kong, Lingjun] Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore.
   [Cai, Kui; Chan, Kheong Sann] Agcy Sci Technol & Res, Data Storage Inst, Singapore 117608, Singapore.
RP Han, GJ (reprint author), Guangdong Univ Technol, Sch Informat Engn, Guangzhou 510006, Guangdong, Peoples R China.
EM gjhan@gdut.edu.cn
RI Guan, Yong/A-5090-2011
OI Guan, Yong/0000-0002-9757-630X
FU National Natural Science Foundation of China [61172076]; Agency for
   Science, Technology, and Research, Singapore [SERC0921560129]
FX This work was supported in part by the National Natural Science
   Foundation of China under Grant 61172076; and in part by the Agency for
   Science, Technology, and Research, Singapore, under Grant
   SERC0921560129.
CR BAHL LR, 1974, IEEE T INFORM THEORY, V20, P284, DOI 10.1109/TIT.1974.1055186
   Cai K, 2010, IEEE GLOBE WORK, P1910, DOI 10.1109/GLOCOMW.2010.5700275
   Chang W, 2010, IEEE T MAGN, V46, P3899, DOI 10.1109/TMAG.2010.2056926
   Gallager R. G., 1961, SEQUENTIAL DECODING
   Han GJ, 2013, IEEE T MAGN, V49, P5215, DOI 10.1109/TMAG.2013.2262293
   Han GJ, 2013, IEEE T MAGN, V49, P2535, DOI 10.1109/TMAG.2013.2247581
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Risso A, 2009, IEEE T MAGN, V45, P3683, DOI 10.1109/TMAG.2009.2024897
   Wang F., 2012, P IEEE ICC, P3826
   Wang F, 2011, IEEE T COMMUN, V59, P1287, DOI 10.1109/TCOMM.2011.030411.100546
   Wu T., 2014, IEEE T MAGN, V50
NR 11
TC 1
Z9 1
U1 0
U2 14
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD OCT
PY 2014
VL 50
IS 10
AR 3101106
DI 10.1109/TMAG.2014.2328313
PG 6
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA AQ7YX
UT WOS:000343037900008
ER

PT J
AU Pfau, B
   Gunther, CM
   Guehrs, E
   Hauet, T
   Hennen, T
   Eisebitt, S
   Hellwig, O
AF Pfau, B.
   Guenther, C. M.
   Guehrs, E.
   Hauet, T.
   Hennen, T.
   Eisebitt, S.
   Hellwig, O.
TI Influence of stray fields on the switching-field distribution for
   bit-patterned media based on pre-patterned substrates
SO APPLIED PHYSICS LETTERS
LA English
DT Article
ID NANOSTRUCTURES; HOLOGRAPHY
AB Using a direct imaging method, we experimentally investigate the reversal of magnetic islands in a bit-patterned media sample based on a pre-patterned substrate. Due to systematic variation of the island distances in the media, we are able to study the influence of the dipolar interaction on the switching-field distribution of the island ensemble. The experimental findings are explained by an analytical magnetostatic model that allows us to quantify the different components of the demagnetizing field in the system and to distinguish intrinsic and dipolar broadening of the switching-field distribution. Besides the well-known dipolar broadening due to stray fields from neighboring islands, we find strong influence from the magnetized trench material on the island switching. (C) 2014 Author(s).
C1 [Pfau, B.; Eisebitt, S.] Lund Univ, Div Synchrotron Radiat Res, S-22100 Lund, Sweden.
   [Guenther, C. M.; Guehrs, E.; Eisebitt, S.] Tech Univ Berlin, Inst Opt & Atomare Phys, D-10623 Berlin, Germany.
   [Hauet, T.; Hennen, T.; Hellwig, O.] HGST, San Jose Res Ctr, San Jose, CA 95135 USA.
   [Eisebitt, S.] Helmholtz Zentrum Berlin Mat & Energie GmbH, D-12489 Berlin, Germany.
RP Pfau, B (reprint author), Lund Univ, Div Synchrotron Radiat Res, Box 118, S-22100 Lund, Sweden.
EM bastian.pfau@sljus.lu.se
RI Pfau, Bastian/B-4953-2014
OI Pfau, Bastian/0000-0001-9057-0346; Gunther, Christian
   Michael/0000-0002-3750-7556
CR Albrecht TR, 2013, IEEE T MAGN, V49, P773, DOI 10.1109/TMAG.2012.2227303
   Albrecht TR, 2009, NANOSCALE MAGNETIC MATERIALS AND APPLICATIONS, P237, DOI 10.1007/978-0-387-85600-1_9
   Eisebitt S, 2004, NATURE, V432, P885, DOI 10.1038/nature03139
   Greaves SJ, 2008, IEEE T MAGN, V44, P3430, DOI 10.1109/TMAG.2008.2002365
   Hauet T, 2014, PHYS REV B, V89, DOI 10.1103/PhysRevB.89.174421
   Hellwig O, 2006, J APPL PHYS, V99, DOI 10.1063/1.2165925
   Hellwig O, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3293301
   Hellwig O, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3271679
   Hellwig O, 2008, APPL PHYS LETT, V93, DOI 10.1063/1.3013857
   Hellwig O, 2007, APPL PHYS LETT, V90, DOI 10.1063/1.2730744
   Hellwig O, 2014, J APPL PHYS, V116, DOI 10.1063/1.4896667
   Hellwig O, 2013, SPRINGER TRAC MOD PH, V246, P189, DOI 10.1007/978-3-642-32042-2_6
   JOSEPH RI, 1965, J APPL PHYS, V36, P1579, DOI 10.1063/1.1703091
   Kalezhi J, 2009, IEEE T MAGN, V45, P3531, DOI 10.1109/TMAG.2009.2022407
   Krone P, 2009, J APPL PHYS, V106, DOI 10.1063/1.3260240
   Lau JW, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2822439
   Li W. M., 2011, J APPL PHYS, V109
   Mitsuzuka K, 2007, IEEE T MAGN, V43, P2160, DOI 10.1109/TMAG.2007.893129
   Pfau B, 2011, APPL PHYS LETT, V99, DOI 10.1063/1.3623488
   Pfau B, 2010, NEW J PHYS, V12, DOI 10.1088/1367-2630/12/9/095006
   Schlotter WF, 2007, OPT LETT, V32, P3110, DOI 10.1364/OL.32.003110
   Thiyagarajah N, 2012, APPL PHYS LETT, V101, DOI 10.1063/1.4758478
   Thomson T, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.257204
   Fullerton E. E., 2010, U.S. patent, Patent No. [7,732,071 B2, 7732071]
   Fullerton E. E., 2010, U.S. patent, Patent No. [7,670,696 B2, 7670696]
   Albrecht T. R., 2012, U.S. patent, Patent No. [8,130,468 B2, 8130468]
NR 26
TC 3
Z9 3
U1 2
U2 13
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0003-6951
EI 1077-3118
J9 APPL PHYS LETT
JI Appl. Phys. Lett.
PD SEP 29
PY 2014
VL 105
IS 13
AR 132407
DI 10.1063/1.4896982
PG 5
WC Physics, Applied
SC Physics
GA AQ7XA
UT WOS:000343031700041
ER

PT J
AU Hellwig, O
   Marinero, EE
   Kercher, D
   Hennen, T
   McCallum, A
   Dobisz, E
   Wu, TW
   Lille, J
   Hirano, T
   Ruiz, R
   Grobis, MK
   Weller, D
   Albrecht, TR
AF Hellwig, Olav
   Marinero, Ernesto E.
   Kercher, Dan
   Hennen, Tyler
   McCallum, Andrew
   Dobisz, Elizabeth
   Wu, Tsai-Wei
   Lille, Jeff
   Hirano, Toshiki
   Ruiz, Ricardo
   Grobis, Michael K.
   Weller, Dieter
   Albrecht, Thomas R.
TI Bit patterned media optimization at 1 Tdot/in(2) by post-annealing
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article
ID OXYGEN INCORPORATION; RECORDING MEDIA; MICROSTRUCTURE; PERFORMANCE;
   FILMS
AB We report on the fabrication of 1 Tdot/in(2) bit patterned media with high coercivity (H-C) and narrow intrinsic switching field distribution (iSFD) based on nanoimprint from a master pattern formed by e-beam guided block copolymer assembly onto a carbon hard mask and subsequent pattern transfer via etching into a thin CoCrPt perpendicular anisotropy recording layer. We demonstrate that an additional vacuum annealing step after pattern transfer into the CoCrPt layer and after Carbon hard mask removal not only yields recovery from undesired damage of the island edges, but actually transforms the islands into a magnetically more favorable compositional phase with higher H-C, lower iSFD/H-C, and three-fold increased thermal stability. Energy filtered transmission electron microscopy analysis reveals that the diffusion of Cr from the island cores to the periphery of the islands during post-annealing is responsible for the transformation of the magnetic bits into a more stable state. (C) 2014 AIP Publishing LLC.
C1 [Hellwig, Olav; Marinero, Ernesto E.; Kercher, Dan; Hennen, Tyler; McCallum, Andrew; Dobisz, Elizabeth; Wu, Tsai-Wei; Lille, Jeff; Hirano, Toshiki; Ruiz, Ricardo; Grobis, Michael K.; Weller, Dieter; Albrecht, Thomas R.] HGST Western Digital Co, San Jose Res Ctr, San Jose, CA 95135 USA.
RP Hellwig, O (reprint author), HGST Western Digital Co, San Jose Res Ctr, 3403 Yerba Buena Rd, San Jose, CA 95135 USA.
OI Ruiz, Ricardo/0000-0002-1698-4281
CR Albrecht TR, 2013, IEEE T MAGN, V49, P773, DOI 10.1109/TMAG.2012.2227303
   Albrecht TR, 2009, NANOSCALE MAGNETIC MATERIALS AND APPLICATIONS, P237, DOI 10.1007/978-0-387-85600-1_9
   Dobisz EA, 2012, J VAC SCI TECHNOL B, V30, DOI 10.1116/1.4757955
   Grobis M, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3304166
   Grobis MK, 2011, IEEE T MAGN, V47, P6, DOI 10.1109/TMAG.2010.2076798
   Hauet T, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3276911
   Hellwig O, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3293301
   Hellwig O, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3271679
   Hellwig O, 2008, APPL PHYS LETT, V93, DOI 10.1063/1.3013857
   Hellwig O, 2007, APPL PHYS LETT, V90, DOI 10.1063/1.2730744
   Hellwig O, 2013, SPRINGER TRAC MOD PH, V246, P189, DOI 10.1007/978-3-642-32042-2_6
   Inaba N, 2000, J APPL PHYS, V87, P6863, DOI 10.1063/1.372867
   Jung HS, 2007, IEEE T MAGN, V43, P615, DOI 10.1109/TMAG.2006.888201
   Jung HS, 2008, J APPL PHYS, V103, DOI 10.1063/1.2832508
   Moritz J, 2002, IEEE T MAGN, V38, P1731, DOI 10.1109/TMAG.2002.1017764
   Shaw JM, 2008, PHYS REV B, V78, DOI 10.1103/PhysRevB.78.024414
   SMITS JW, 1984, J APPL PHYS, V55, P2260, DOI 10.1063/1.333629
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Yamada Y, 1998, J APPL PHYS, V83, P6527, DOI 10.1063/1.367917
   Zheng M, 2004, IEEE T MAGN, V40, P2498, DOI 10.1109/TMAG.2004.832167
   Grobis M. K., 2013, U.S. patent application, Patent No. [2013/0270221 A1, 20130270221]
NR 21
TC 4
Z9 4
U1 3
U2 22
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0021-8979
EI 1089-7550
J9 J APPL PHYS
JI J. Appl. Phys.
PD SEP 28
PY 2014
VL 116
IS 12
AR 123913
DI 10.1063/1.4896667
PG 6
WC Physics, Applied
SC Physics
GA AQ5HZ
UT WOS:000342840000054
ER

PT J
AU Su, H
   Schwarm, SC
   Douglas, RL
   Montgomery, A
   Owen, AG
   Gupta, S
AF Su, Hao
   Schwarm, Samuel C.
   Douglas, Robert L.
   Montgomery, Angelique
   Owen, Allen G.
   Gupta, Subhadra
TI (111) Orientation preferred L1(0) FePtB patterned by block copolymer
   templating
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article
ID MAGNETIZATION REVERSAL; DATA-STORAGE; MEDIA
AB The (111) orientation preferred L1(0) FePtB has been obtained by post-deposition annealing sputtered FeB/Pt multilayers on thermally oxidized silicon substrates. Block copolymer templating was employed to pattern FeBPt film. A matrix study of etch time and etch angle showed that ion-milling at 75 degrees for 3 min yielded the highest coercivity. Reannealing after patterning process was found to improve the crystalline structure and coercivity significantly. These results suggested (111) orientation preferred L1(0) FePt patterned by block copolymer templating may be promising for tilted media and bit patterned media. (C) 2014 AIP Publishing LLC.
C1 [Su, Hao; Schwarm, Samuel C.; Douglas, Robert L.; Montgomery, Angelique; Owen, Allen G.; Gupta, Subhadra] Univ Alabama, Microfabricat Facil UA MFF, Tuscaloosa, AL 35487 USA.
   [Su, Hao; Schwarm, Samuel C.; Douglas, Robert L.; Montgomery, Angelique; Owen, Allen G.; Gupta, Subhadra] Univ Alabama, Ctr Mat Informat Technol MINT, Tuscaloosa, AL 35487 USA.
   [Su, Hao; Schwarm, Samuel C.; Douglas, Robert L.; Montgomery, Angelique; Gupta, Subhadra] Univ Alabama, Dept Met & Mat Engn, Tuscaloosa, AL 35487 USA.
   [Owen, Allen G.] Univ Alabama, Dept Elect & Comp Engn, Tuscaloosa, AL 35487 USA.
RP Gupta, S (reprint author), Univ Alabama, Microfabricat Facil UA MFF, Tuscaloosa, AL 35487 USA.
EM sgupta@eng.ua.edu
RI Su, Hao/G-3063-2017
OI Su, Hao/0000-0002-4416-1653
FU NSF ECCS [0901858]; Seagate Technology; UA Micro-Fabrication Facility
   (UA-MFF); UA Central Analytical Facility (CAF)
FX This work was partially supported by NSF ECCS 0901858 and Seagate
   Technology. The authors gratefully acknowledge the UA Micro-Fabrication
   Facility (UA-MFF) and the UA Central Analytical Facility (CAF) for
   facilities and support. The authors also thank B. D. Clark for his help
   on ion-milling samples and discussion.
CR Bublat T, 2011, NANOTECHNOLOGY, V22, DOI 10.1088/0957-4484/22/31/315301
   Cheng JY, 2008, ADV MATER, V20, P3155, DOI 10.1002/adma.200800826
   Goll D, 2013, PHYS STATUS SOLIDI A, V210, P1261, DOI 10.1002/pssa.201329017
   Griffiths RA, 2013, J PHYS D APPL PHYS, V46, DOI 10.1088/0022-3727/46/50/503001
   Hellwig O, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3293301
   Hellwig O, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3271679
   Ishio S, 2014, J MAGN MAGN MATER, V360, P205, DOI 10.1016/j.jmmm.2014.02.049
   Kaushik N, 2010, APPL PHYS LETT, V97, DOI 10.1063/1.3479054
   Klemmer TJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2198009
   Kryder MH, 2008, P IEEE, V96, P1810, DOI 10.1109/JPROC.2008.2004315
   Laughlin DE, 2005, SCRIPTA MATER, V53, P383, DOI 10.1016/j.scriptamat.2005.04.039
   Li X, 2009, J VAC SCI TECHNOL A, V27, P1062, DOI 10.1116/1.3116586
   McCallum AT, 2011, APPL PHYS LETT, V98, DOI 10.1063/1.3599573
   Ogata Y, 2010, J APPL PHYS, V107, DOI 10.1063/1.3337648
   Richter HJ, 2007, J PHYS D APPL PHYS, V40, pR149, DOI 10.1088/0022-3727/40/9/R01
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Richter HJ, 2012, J APPL PHYS, V111, DOI 10.1063/1.3681297
   Singh A, 2013, IEEE T MAGN, V49, P3799, DOI 10.1109/TMAG.2013.2241404
   Su H, 2014, J APPL PHYS, V115, DOI 10.1063/1.4863479
   Su H, 2013, J APPL PHYS, V113, DOI 10.1063/1.4807168
   Sun ZZ, 2012, J VAC SCI TECHNOL B, V30, DOI 10.1116/1.4706893
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Tiberto P, 2013, J APPL PHYS, V113, DOI 10.1063/1.4797626
   Wang JP, 2005, NAT MATER, V4, P191, DOI 10.1038/nmat1344
   Weller D, 2000, IEEE T MAGN, V36, P10, DOI 10.1109/20.824418
   Zha CL, 2009, APPL PHYS LETT, V94, DOI 10.1063/1.3123003
   Zheng YF, 2002, J APPL PHYS, V91, P8007, DOI 10.1063/1.1456416
   Zou YY, 2003, APPL PHYS LETT, V82, P2473, DOI 10.1063/1.1565503
NR 28
TC 0
Z9 0
U1 2
U2 5
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0021-8979
EI 1089-7550
J9 J APPL PHYS
JI J. Appl. Phys.
PD SEP 21
PY 2014
VL 116
IS 11
AR 113906
DI 10.1063/1.4895850
PG 4
WC Physics, Applied
SC Physics
GA AQ5HA
UT WOS:000342837000030
ER

PT J
AU Manuel, A
   Rao, JV
   John, K
   Aranjani, JM
AF Manuel, Atulya
   Rao, Josyula Venkata
   John, Koshy
   Aranjani, Jesil Mathew
TI Biofilm Production and Antibiotic Susceptibility of Planktonic and
   Biofilm Bacteria of Canine Dental Tartar Isolates
SO ACTA SCIENTIAE VETERINARIAE
LA English
DT Article
DE dental tartar; biofilm; crystal violet assay; minimum biofilm
   eradication concentration
ID STREPTOCOCCUS-MUTANS; SLIME PRODUCTION; PLATE TEST; DISEASES
AB Background: In nature, bacteria prefer to live as a community rather than planktonic cells. Biofilm is such a community of bacteria embedded in a coherent cluster of polysaccharides, proteins and nucleic acids. The biofilm formation in the dental cavity can result in the development of periodontal diseases. Biofilm in the oral cavity can affect the general health of the dog and the bacterial toxins can damage the visceral organs engaged in detoxification. It can also be detrimental to human health when transferred via animal bites. Aim of this study is to isolate the organisms from the dental tartars of dogs and to study their response to antibiotics in both planktonic and biofilm mode of life.
   Materials, Methods & Results: Organisms were isolated from fourteen canines with dental tartar using brain heart infusion agar medium. They were identified as per Bergy's Manual. Antibiogram of the isolates were done with the Kirby Bauer method using standard antibiotic discs. Initial screening of biofilm production was done using the congo red agar assay. Quantification of biofilms were done using a standard microtitre plate method using crystal violet staining. The minimum inhibitory concentration and minimum biofilm eradication concentration were compared to determine the change in the antimicrobial susceptibility pattern of dental tartar isolates when they go from the planktonic to the biofilm mode of growth. Minimum inhibitory concentrations (MIC) of four broad spectrum antibiotics on isolated strains were determined as per CLSI guidelines. Minimum biofilm eradication concentrations (MBEC) of the tested antibiotics were calculated for the isolates using a standard microtitre plate MBEC assay. Bacterial biofilm formation provides the bacteria inherent resistance to antibiotic chemotherapy and helps in the persistence of infection. The dental plaque is a dental biofilm which gets calcified and becomes dental tartar. In the present study, the isolated organisms were identified as Pseudomonas fragi (43%), Citrobacter koseri (14%), Streptococcus mutans (33%) and Malassezia pachydermatis (10%). The bacteria in biofilm mode of growth exhibited significantly higher antibiotic resistance compared to the planktonic state of the same organisms. Congo red assay revealed that all the P. fragi isolates, two C. koseri isolates and four S. mutans isolates are biofilm producers. The biofilm production was highest with P. fragi isolates as per the results of the crystal violet assay. A synergistic effect in biofilm production was found when the organisms in combination were allowed to produce biofilm. The isolates showed high sensitivity towards Chloramphenicol (90%), Ciprofloxacin (90%), Enrofloxacin (90%), Ceftriaxone (80%) and low sensitivity towards Gentamicin (66%), Cephotaxim (66%) and Sulphadiazine (50%).
   Discussion: The minimum biofilm eradication concentration of the isolates was found to be much higher compared to the MIC range of the planktonic bacteria. Conventional antibiotic therapy against bacterial infections are based on the sensitivity pattern of organisms towards the respective antibiotics. The results of the present study indicate the requirement of a higher concentration of antibiotics needed for eradication of bacterial biofilms. Antibiotics are not free from toxic side effects. Hence, agents promoting the biofilm eradication are a safer choice rather than increasing antibiotic concentration. More studies in this line are in progress.
C1 [Manuel, Atulya; Rao, Josyula Venkata; Aranjani, Jesil Mathew] Manipal Coll Pharmaceut Sci, Dept Pharmaceut Biotechnol, Udupi 576104, Karnataka, India.
   [John, Koshy] Coll Vet & Anim Sci, Dept Vet Microbiol, Wayanad, Kerala, India.
RP Aranjani, JM (reprint author), Manipal Coll Pharmaceut Sci, Dept Pharmaceut Biotechnol, Udupi 576104, Karnataka, India.
EM jesil.m@manipal.edu
FU INSPIRE Fellowship award (DST/INSPIRE Fellowship) of Department of
   Science and Technology, Government of India [IF110062]
FX The work is supported by the INSPIRE Fellowship award (DST/INSPIRE
   Fellowship/2010 No. IF110062) of Department of Science and Technology,
   Government of India.
CR Abrahamian FM, 2011, CLIN MICROBIOL REV, V24, P231, DOI 10.1128/CMR.00041-10
   Andrews JM, 2001, J ANTIMICROB CHEMOTH, V48, P5
   Arciola CR, 2002, BIOMATERIALS, V23, P4233, DOI 10.1016/S0142-9612(02)00171-0
   Auvil J. D., P CURR PERSP CAN FEL, P13
   BAUER AW, 1966, AM J CLIN PATHOL, V45, P493
   BOND R, 1995, J SMALL ANIM PRACT, V36, P147, DOI 10.1111/j.1748-5827.1995.tb02865.x
   Cassidy JP, 2002, VET PATHOL, V39, P393, DOI 10.1354/vp.39-3-393
   Ceri H, 1999, J CLIN MICROBIOL, V37, P1771
   Clinical and Laboratory Standards Institute, 2006, M7A7 CLIN LAB STAND
   Clutterbuck AL, 2007, VET MICROBIOL, V121, P1, DOI 10.1016/j.vetmic.2006.12.029
   DuPont GA, 1998, VET CLIN N AM-SMALL, V28, P1129
   FREEMAN DJ, 1989, J CLIN PATHOL, V42, P872, DOI 10.1136/jcp.42.8.872
   HAMADA S, 1980, MICROBIOL REV, V44, P331
   Holt J. G., 1994, BERGEYS MANUAL DETER, P527
   Holt JG, 1994, BERGEYS MANUAL DETER, P565
   Jefferson KK, 2004, FEMS MICROBIOL LETT, V236, P163, DOI 10.1016/j.femsle.2004.06.005
   Kolenbrander PE, 2000, ANNU REV MICROBIOL, V54, P413, DOI 10.1146/annurev.micro.54.1.413
   Lappin-Scott H. M., 2003, MICROBIAL BIOFILMS, P64
   Lappin-Scott H. M., 2003, MICROBIAL BIOFILMS, P282
   Li YH, 2001, J BACTERIOL, V183, P897, DOI 10.1128/JB.183.3.897-908.2001
   Li YH, 2002, J BACTERIOL, V184, P2699, DOI 10.1128/JB.184.10.2699-2708.2002
   Marsh PD, 2004, CARIES RES, V38, P204, DOI 10.1159/000077756
   Marsh PD, 2003, MICROBIOL-SGM, V149, P279, DOI 10.1099/mic.0.26082-0
   Riggio MP, 2011, VET MICROBIOL, V150, P394, DOI 10.1016/j.vetmic.2011.03.001
   Sashara K. C., 1993, J FOOD PROTECT, V56, P1022
   Stepanovic S, 2000, J MICROBIOL METH, V40, P175, DOI 10.1016/S0167-7012(00)00122-6
   Williams DW, 2011, SPRINGER SER BIOFILM, V6, P129, DOI 10.1007/978-3-642-21289-5_5
   Williams RC, 2008, J PERIODONTOL, V79, P1552, DOI 10.1902/jop.2008.080182
   Yoshida A, 2005, APPL ENVIRON MICROB, V71, P2372, DOI 10.1128/AEM.71.5.2372-2380.2005
NR 29
TC 0
Z9 0
U1 2
U2 8
PU UNIV FED RIO GRANDE DO SUL
PI PORTO ALEGRE RS
PA FAC VET, CAIXA POSTAL 15017, PORTO ALEGRE RS, 91501-570, BRAZIL
SN 1678-0345
EI 1679-9216
J9 ACTA SCI VET
JI Acta Sci. Vet.
PD AUG 25
PY 2014
VL 42
PG 6
WC Veterinary Sciences
SC Veterinary Sciences
GA AW6JJ
UT WOS:000346375500002
ER

PT J
AU Neumann, A
   Altwein, D
   Thonnissen, C
   Wieser, R
   Berger, A
   Meyer, A
   Vedmedenko, E
   Oepen, HP
AF Neumann, Alexander
   Altwein, David
   Thoennissen, Carsten
   Wieser, Robert
   Berger, Andreas
   Meyer, Andreas
   Vedmedenko, Elena
   Oepen, Hans Peter
TI Influence of long-range interactions on the switching behavior of
   particles in an array of ferromagnetic nanostructures
SO NEW JOURNAL OF PHYSICS
LA English
DT Article
DE magnetism; interaction; patterned media; magnetization dynamics;
   nanoparticle; nanodot
ID BIT PATTERNED MEDIA; PERPENDICULAR MAGNETIC-ANISOTROPY; SINGLE-DOMAIN
   PARTICLES; CO/PT MULTILAYERS; RECORDING MEDIA; CONE STATES; REVERSAL;
   FILMS
AB The interaction of Co/Pt nanodots is studied by means of the anomalous Hall-effect. On purpose the system of four dots is driven into a state of instability by applying a magnetic field perpendicular to the easy axis of magnetization. The dots become susceptible to thermal excitation and correlated switching is observed over large distances. The experimental finding is supported by theoretical simulations that reveal the importance of correlations and their influence at large length scales. This unexpected result sheds light on the general behavior of ensembles of systems with small energy barriers like superparamagnetic ensembles or switching of high density bit pattern media around the switching field.
C1 [Neumann, Alexander; Altwein, David; Thoennissen, Carsten; Wieser, Robert; Vedmedenko, Elena; Oepen, Hans Peter] Univ Hamburg, Inst Angew Phys, D-20355 Hamburg, Germany.
   [Meyer, Andreas] Univ Hamburg, Inst Phys Chem, D-20146 Hamburg, Germany.
   [Berger, Andreas] CIC nanoGUNE Consolider, E-20018 San Sebastian, Spain.
   [Oepen, Hans Peter] Ikerbasque, Basque Fdn Sci, E-48011 Bilbao, Spain.
RP Neumann, A (reprint author), Univ Hamburg, Inst Angew Phys, Jungiusstr 11, D-20355 Hamburg, Germany.
EM aneumann@physnet.uni-hamburg.de
RI Berger, Andreas/D-3706-2015; nanoGUNE, CIC/A-2623-2015
OI Berger, Andreas/0000-0001-5865-6609; 
FU DFG [SFB 668]; Basque Foundation of Science; Basque Government
   [IE11-304]; Spanish Ministry of Science and Education [MAT2012-36844]
FX Funding by the DFG via the Sonderforschungsbereich SFB 668 is gratefully
   acknowledged. HPO is thankful for excellent hospitality at CIC nanoGUNE
   during his research stay. He gratefully acknowledges financial support
   from the Basque Foundation of Science via an Ikerbasque visiting
   fellowship. Work at nanoGUNE also acknowledges funding from the Basque
   Government under contract IE11-304 and the Spanish Ministry of Science
   and Education under project no. MAT2012-36844.
CR Albrecht TR, 2013, IEEE T MAGN, V49, P773, DOI 10.1109/TMAG.2012.2227303
   Alexandrou M, 2010, J APPL PHYS, V108, DOI 10.1063/1.3475485
   Azad MRR, 2014, PHYS REV B, V90, DOI 10.1103/PhysRevB.90.014404
   Bardou N, 1996, J APPL PHYS, V79, P5848, DOI 10.1063/1.362145
   Brombacher C, 2012, NANOTECHNOLOGY, V23, DOI 10.1088/0957-4484/23/2/025301
   Budrikis Z, 2012, PHYS REV LETT, V109, DOI 10.1103/PhysRevLett.109.037203
   CARCIA PF, 1988, J APPL PHYS, V63, P5066, DOI 10.1063/1.340404
   Cornelissens YG, 2002, J APPL PHYS, V92, P2006, DOI 10.1063/1.1487909
   Farhan A, 2013, NAT PHYS, V9, P375, DOI [10.1038/nphys2613, 10.1038/NPHYS2613]
   Fromter R, 2008, PHYS REV LETT, V100, DOI 10.1103/PhysRevLett.100.207202
   Guslienko KY, 1999, APPL PHYS LETT, V75, P394, DOI 10.1063/1.124386
   Haginoya C, 1999, J APPL PHYS, V85, P8327, DOI 10.1063/1.370678
   Hauet T, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3276911
   Hellwig O, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3293301
   Hellwig O, 2007, APPL PHYS LETT, V90, DOI 10.1063/1.2730744
   Hurd C M, 1972, HALL EFFECT METALS A, DOI [10.1007/978-1-4757-0465-5, DOI 10.1007/978-1-4757-0465-5]
   Hwang M, 2000, IEEE T MAGN, V36, P3173, DOI 10.1109/20.908726
   Johnson MT, 1996, REP PROG PHYS, V59, P1409, DOI 10.1088/0034-4885/59/11/002
   Kapaklis V, 2012, NEW J PHYS, V14, DOI 10.1088/1367-2630/14/3/035009
   Kikitsu A, 2013, IEEE T MAGN, V49, P693, DOI 10.1109/TMAG.2012.2226566
   Kikitsu A, 2009, J MAGN MAGN MATER, V321, P526, DOI 10.1016/j.jmmm.2008.05.039
   Kisielewski M, 2003, J MAGN MAGN MATER, V260, P231, DOI 10.1016/S0304-8853(02)01333-1
   Kobs A, 2013, THESIS U HAMBURG
   Lee JW, 2002, PHYS REV B, V6617, P2409, DOI 10.1103/PhysRevB.66.172409
   LIN CJ, 1991, J MAGN MAGN MATER, V93, P194, DOI 10.1016/0304-8853(91)90329-9
   Louail L, 1997, J MAGN MAGN MATER, V167, pL189, DOI 10.1016/S0304-8853(96)00724-X
   Neumann A, 2013, NANO LETT, V13, P2199, DOI 10.1021/nl400728r
   Nisoli C, 2013, REV MOD PHYS, V85, P1473, DOI 10.1103/RevModPhys.85.1473
   Nisoli C, 2012, NEW J PHYS, V14, DOI 10.1088/1367-2630/14/3/035017
   Novosad V, 2002, PHYS REV B, V65, DOI 10.1103/PhysRevB.65.060402
   Pfau B, 2011, APPL PHYS LETT, V99, DOI 10.1063/1.3623488
   Plumer M, 2001, PHYS ULTRA HIGH DENS, DOI [10.1007/978-3-642-56657-8, DOI 10.1007/978-3-642-56657-8]
   Reichhardt CJO, 2012, NEW J PHYS, V14, DOI 10.1088/1367-2630/14/2/025006
   Ross C, 2001, ANN REV MATER RES, V31, P203, DOI 10.1146/annurev.matsci.31.1.203
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Seu KA, 2010, PHYS REV B, V82, DOI 10.1103/PhysRevB.82.012404
   Silva RC, 2012, NEW J PHYS, V14, DOI 10.1088/1367-2630/14/1/015008
   Stamps RL, 1997, J APPL PHYS, V81, P4751, DOI 10.1063/1.365452
   STEARNS MB, 1986, LANDOLT BORNSTEIN 3A, V19, P24
   Stillrich H, 2010, J MAGN MAGN MATER, V322, P1353, DOI 10.1016/j.jmmm.2009.09.039
   Stillrich H, 2009, J APPL PHYS, V105, DOI 10.1063/1.3070644
   Terris BD, 2007, MICROSYST TECHNOL, V13, P189, DOI 10.1007/s00542-006-0144-9
   Terris BD, 2009, J MAGN MAGN MATER, V321, P512, DOI 10.1016/j.jmmm.2008.05.046
   WEBB BC, 1988, IEEE T MAGN, V24, P3006, DOI 10.1109/20.92316
   Wellhofer M, 2005, J MAGN MAGN MATER, V292, P345, DOI 10.1016/j.jmmm.2004.11.150
   Wernsdorfer W, 1997, PHYS REV LETT, V78, P1791, DOI 10.1103/PhysRevLett.78.1791
NR 46
TC 6
Z9 6
U1 3
U2 31
PU IOP PUBLISHING LTD
PI BRISTOL
PA TEMPLE CIRCUS, TEMPLE WAY, BRISTOL BS1 6BE, ENGLAND
SN 1367-2630
J9 NEW J PHYS
JI New J. Phys.
PD AUG 5
PY 2014
VL 16
AR 083012
DI 10.1088/1367-2630/16/8/083012
PG 11
WC Physics, Multidisciplinary
SC Physics
GA AP2QD
UT WOS:000341917800003
ER

PT J
AU Talbot, JE
   Kalezhi, J
   Barton, C
   Heldt, G
   Miles, J
AF Talbot, Jennifer E.
   Kalezhi, Josephat
   Barton, Craig
   Heldt, Georg
   Miles, Jim
TI Write Errors in Bit-Patterned Media: The Importance of Parameter
   Distribution Tails
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Bit-patterned media (BPM); exchange coupled composite (ECC); magnetic
   recording; write window
ID TB/IN(2)
AB Bit-patterned media recording (BPMR) is a magnetic data storage solution where the medium is patterned into nanoscale islands, each representing one bit of data. Write errors can occur in BPMR, especially where islands have position, shape, or magnetic properties that are very different from the mean, i. e., those islands in the tails of any parameter probability density functions (PDFs). We have used a model of BPMR that incorporates variable shape parameter PDFs to study write errors. This shows that the precise shape of the tails of the distributions is critical in determining the error performance. We conclude that when characterizing samples of media for BPMR, it is not sufficient to assume a Gaussian distribution and determine the mean and standard deviation by fitting; the tails of parameter PDFs must be characterized precisely.
C1 [Talbot, Jennifer E.; Barton, Craig; Heldt, Georg; Miles, Jim] Univ Manchester, Sch Comp Sci, Manchester M13 9PL, Lancs, England.
   [Kalezhi, Josephat] Copperbelt Univ, Sch Math & Nat Sci, Dept Comp Sci, Kitwe 10101, Zambia.
   [Heldt, Georg] ETH, Dept Mat, Lab Mesoscop Syst, CH-8093 Zurich, Switzerland.
   [Heldt, Georg] Paul Scherrer Inst, Lab Micro & Nanotechnol, CH-5232 Villigen, Switzerland.
RP Talbot, JE (reprint author), Univ Manchester, Sch Comp Sci, Manchester M13 9PL, Lancs, England.
EM jennifer.talbot-2@postgrad.manchester.ac.uk
OI Barton, Craig/0000-0003-4366-5726
CR Kalezhi J, 2012, J APPL PHYS, V111, DOI 10.1063/1.3691947
   Kalezhi J, 2011, IEEE T MAGN, V47, P2540, DOI 10.1109/TMAG.2011.2157993
   Kalezhi J, 2010, IEEE T MAGN, V46, P3752, DOI 10.1109/TMAG.2010.2052626
   Piramanayagam SN, 2009, J MAGN MAGN MATER, V321, P485, DOI 10.1016/j.jmmm.2008.05.007
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Wang SM, 2013, IEEE T MAGN, V49, P3644, DOI 10.1109/TMAG.2012.2237545
NR 7
TC 1
Z9 1
U1 0
U2 2
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD AUG
PY 2014
VL 50
IS 8
AR 3301807
DI 10.1109/TMAG.2014.2308481
PN 2
PG 7
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA AQ7YM
UT WOS:000343036500003
ER

PT J
AU Gilbert, DA
   Liao, JW
   Wang, LW
   Lau, JW
   Klemmer, TJ
   Thiele, JU
   Lai, CH
   Liu, K
AF Gilbert, Dustin A.
   Liao, Jung-Wei
   Wang, Liang-Wei
   Lau, June W.
   Klemmer, Timothy J.
   Thiele, Jan-Ulrich
   Lai, Chih-Huang
   Liu, Kai
TI Probing the A1 to L1(0) transformation in FeCuPt using the first order
   reversal curve method
SO APL MATERIALS
LA English
DT Article
ID BIT-PATTERNED MEDIA; FEPT NANOPARTICLES; FILMS; GROWTH; ARRAYS
AB The A1-L1(0) phase transformation has been investigated in (001) FeCuPt thin films prepared by atomic-scale multilayer sputtering and rapid thermal annealing (RTA). Traditional x-ray diffraction is not always applicable in generating a true order parameter, due to non-ideal crystallinity of the A1 phase. Using the first-order reversal curve (FORC) method, the A1 and L1(0) phases are deconvoluted into two distinct features in the FORC distribution, whose relative intensities change with the RTA temperature. The L1(0) ordering takes place via a nucleation-and-growth mode. A magnetization-based phase fraction is extracted, providing a quantitative measure of the L1(0) phase homogeneity. (C) 2014 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution 3.0 Unported License.
C1 [Gilbert, Dustin A.; Liu, Kai] Univ Calif Davis, Dept Phys, Davis, CA 95616 USA.
   [Liao, Jung-Wei; Wang, Liang-Wei; Lai, Chih-Huang] Natl Tsing Hua Univ, Dept Mat Sci & Engn, Hsinchu, Taiwan.
   [Lau, June W.] Natl Inst Stand & Technol, Gaithersburg, MD 20899 USA.
   [Klemmer, Timothy J.; Thiele, Jan-Ulrich] Seagate Technol, Fremont, CA 94538 USA.
RP Gilbert, DA (reprint author), Univ Calif Davis, Dept Phys, Davis, CA 95616 USA.
RI Gilbert, Dustin/G-1683-2011; Liu, Kai/B-1163-2008
OI Gilbert, Dustin/0000-0003-3747-3883; Liu, Kai/0000-0001-9413-6782
FU NSF [DMR-1008791]; Hsinchu Science Park of Republic of China [101A16]
FX This work has been supported by the NSF (Grant No. DMR-1008791). Work at
   NTHU has been supported in part by the Hsinchu Science Park of Republic
   of China under Grant No. 101A16.
CR Barmak K, 2005, J APPL PHYS, V98, DOI 10.1063/1.1991968
   Berry DC, 2007, J APPL PHYS, V101, DOI 10.1063/1.2403835
   CEBOLLADA A, 1994, PHYS REV B, V50, P3419, DOI 10.1103/PhysRevB.50.3419
   Davies JE, 2004, PHYS REV B, V70, DOI 10.1103/PhysRevB.70.224434
   Davies JE, 2005, PHYS REV B, V72, DOI 10.1103/PhysRevB.72.134419
   Dong Q, 2012, ADV MATER, V24, P1034, DOI 10.1002/adma.201104171
   Dumas RK, 2007, APPL PHYS LETT, V91, DOI 10.1063/1.2807276
   Farrow RFC, 1996, APPL PHYS LETT, V69, P1166, DOI 10.1063/1.117383
   Gilbert DA, 2014, SCI REP-UK, V4, DOI 10.1038/srep04204
   Gilbert DA, 2013, APPL PHYS LETT, V102, DOI 10.1063/1.4799651
   Gutfleisch O, 2011, ADV MATER, V23, P821, DOI 10.1002/adma.201002180
   Hoydick DP, 1997, J APPL PHYS, V81, P5624, DOI 10.1063/1.364619
   Kou XM, 2011, ADV MATER, V23, P1393, DOI 10.1002/adma.201003749
   Liu Y, 2011, APPL PHYS LETT, V99, DOI 10.1063/1.3656038
   Mayergoyz I. D., 1991, MATH MODELS HYSTERES
   Mosendz O, 2012, J APPL PHYS, V111, DOI 10.1063/1.3680543
   Olamit J, 2007, APPL PHYS LETT, V90, DOI 10.1063/1.2431784
   Pike CR, 1999, J APPL PHYS, V85, P6660, DOI 10.1063/1.370176
   Richter HJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2209179
   Sun SH, 2006, ADV MATER, V18, P393, DOI 10.1002/adma.200501464
   Sun SH, 2000, SCIENCE, V287, P1989, DOI 10.1126/science.287.5460.1989
   TANAKA M, 1993, APPL PHYS LETT, V62, P1565, DOI 10.1063/1.108642
   Wang B, 2011, J APPL PHYS, V109, DOI 10.1063/1.3592980
   Wang LW, 2012, APPL PHYS LETT, V101, DOI 10.1063/1.4772072
   Wang LW, 2009, J APPL PHYS, V105, DOI 10.1063/1.3067848
   Wang XB, 2013, IEEE T MAGN, V49, P686, DOI 10.1109/TMAG.2012.2221689
   Weller D, 2000, IEEE T MAGN, V36, P10, DOI 10.1109/20.824418
   Weller D, 2013, PHYS STATUS SOLIDI A, V210, P1245, DOI 10.1002/pssa.201329106
   Wu AQ, 2013, IEEE T MAGN, V49, P779, DOI 10.1109/TMAG.2012.2219513
   Zeng H, 2002, NATURE, V420, P395, DOI 10.1038/nature01208
NR 30
TC 12
Z9 12
U1 2
U2 27
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 2166-532X
J9 APL MATER
JI APL Mater.
PD AUG
PY 2014
VL 2
IS 8
AR 086106
DI 10.1063/1.4894197
PG 7
WC Nanoscience & Nanotechnology; Materials Science, Multidisciplinary;
   Physics, Applied
SC Science & Technology - Other Topics; Materials Science; Physics
GA AQ1UM
UT WOS:000342567700024
ER

PT J
AU Juang, JY
   Wu, W
   Lin, KT
AF Juang, Jia-Yang
   Wu, Wei
   Lin, Kuan-Te
TI Tribological impact of touchdown detection on bit patterned media
   robustness
SO MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND
   PROCESSING SYSTEMS
LA English
DT Article
ID FLYING-HEIGHT CONTROL; HARD-DISK DRIVES; MAGNETIC HEAD; SLIDERS;
   PROTRUSION; DESIGNS
AB Touchdown detection by thermal-flying height control (TFC) has been implemented to calibrate flying height (FH) of magnetic sliders for all hard disk drives. For bit patterned media (BPM) to be successful as a revolutionary technology to further increase recording areal density, it must experience the touchdown process with similar robustness as conventional continuous media. Here we numerically study the tribological impact of TFC touchdown detection on the continuous media and unplanarized BPM by three-dimensional (3D) transient finite-element models with the frictional heating and thermal-elastic-plastic materials included. Our results demonstrate that the continuous media exhibits no plastic deformation due to the TFC touchdown with an over-push as large as 2 nm, whereas the plastic strain of the BPM may reach 3 % at higher sliding velocities, and it exists over a wide range of bulge radius and disk velocity. Such plastic deformation can lead to permanent media damage and data loss. Besides, the temperature rise of the BPM (similar to 27 K) is approximately 1.3 times of that of the continuous media (similar to 21 K), and may have to be considered when designing a robust head-disk interface for BPM. Although planarization may improve slider's flyability performance, our analysis shows that planarizing BPM with SiO2 deteriorates the tribological robustness of the media in particular at a high disk velocity probably due to the inhomogeneous composition and mismatch of material properties between the filling material and recording material. Hence extreme caution must be exercised when choosing a filling material.
C1 [Juang, Jia-Yang; Wu, Wei; Lin, Kuan-Te] Natl Taiwan Univ, Dept Mech Engn, Taipei 10617, Taiwan.
RP Juang, JY (reprint author), Natl Taiwan Univ, Dept Mech Engn, Taipei 10617, Taiwan.
EM jiayang@ntu.edu.tw
RI Juang, Jia-Yang/J-9534-2013
OI Juang, Jia-Yang/0000-0001-6801-3244
FU National Science Council of Taiwan [NSC 101-2221-E-002-151, NSC
   102-2221-E-002-178]
FX This work is supported in part by the National Science Council of Taiwan
   under Contract NSC 101-2221-E-002-151 and NSC 102-2221-E-002-178.
CR Crone R, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2164898
   Grobis M, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3304166
   Juang JY, 2007, J TRIBOL-T ASME, V129, P570, DOI 10.1115/1.2736456
   Juang JY, 2013, IEEE T MAGN, V49, P2477, DOI 10.1109/TMAG.2013.2249054
   Juang JY, 2011, IEEE T MAGN, V47, P3437, DOI 10.1109/TMAG.2011.2147773
   Juang JY, 2008, IEEE T MAGN, V44, P3679, DOI 10.1109/TMAG.2008.2002612
   Juang JY, 2006, IEEE T MAGN, V42, P241, DOI 10.1109/TMAG.2005.861739
   Juang JY, 2006, IEEE-ASME T MECH, V11, P256, DOI 10.1109/TMECH.2006.875563
   Juang JY, 2005, IEEE T MAGN, V41, P3052, DOI 10.1109/TMAG.2005.855255
   Lee KM, 2007, EXP MECH, V47, P107, DOI 10.1007/s11340-006-9393-x
   Li LP, 2011, MICROSYST TECHNOL, V17, P805, DOI 10.1007/s00542-010-1191-9
   Li LQ, 2012, MICROSYST TECHNOL, V18, P1567, DOI 10.1007/s00542-012-1593-y
   Mate CM, 2012, IEEE T MAGN, V48, P4448, DOI 10.1109/TMAG.2012.2205226
   Nunez EE, 2008, IEEE T MAGN, V44, P3667, DOI 10.1109/TMAG.2008.2002593
   Ono K, 2008, TRIBOL LETT, V31, P77, DOI 10.1007/s11249-008-9340-3
   Ovcharenko A, 2010, IEEE T MAGN, V46, P770, DOI 10.1109/TMAG.2009.2035092
   Su LZ, 2011, IEEE T MAGN, V47, P111, DOI 10.1109/TMAG.2010.2080666
   Yang Y, 2004, J APPL PHYS, V95, P6780, DOI 10.1063/1.1652426
NR 18
TC 1
Z9 1
U1 0
U2 4
PU SPRINGER
PI NEW YORK
PA 233 SPRING ST, NEW YORK, NY 10013 USA
SN 0946-7076
EI 1432-1858
J9 MICROSYST TECHNOL
JI Microsyst. Technol.
PD AUG
PY 2014
VL 20
IS 8-9
SI SI
BP 1745
EP 1751
DI 10.1007/s00542-014-2228-2
PG 7
WC Engineering, Electrical & Electronic; Nanoscience & Nanotechnology;
   Materials Science, Multidisciplinary; Physics, Applied
SC Engineering; Science & Technology - Other Topics; Materials Science;
   Physics
GA AM5DT
UT WOS:000339876900046
ER

PT J
AU Yang, XM
   Xiao, SG
   Hsu, YZ
   Wang, HY
   Hwu, J
   Steiner, P
   Wago, K
   Lee, K
   Kuo, D
AF Yang, XiaoMin
   Xiao, Shuaigang
   Hsu, Yautzong
   Wang, HongYing
   Hwu, Justin
   Steiner, Philip
   Wago, Koichi
   Lee, Kim
   Kuo, David
TI Fabrication of servo-integrated template for 1.5 Teradot/inch(2) bit
   patterned media with block copolymer directed assembly
SO JOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS
LA English
DT Article
DE directed self-assembly; block copolymer; imprint lithography; template
   fabrication; bit patterned media; magnetic recording
ID DENSITY MULTIPLICATION; LITHOGRAPHY
AB Directed self-assembly (DSA) of block copolymers (BCPs) proves to be a viable solution for the ultra-high density bit-patterned media (BPM) application. However, servo design integration is still extremely challenging since the servo layouts require more complex patterns than the simple arrays naturally achieved by the DSA process. We present an integration scheme to create BPM servo patterns by utilizing the BCP dot-array patterns. This proposed method is based on an imprint guided two-step DSA process, combined with conventional optical lithography to define two separate zones. Both the data zone and servo zone consist of selfassembled hexagonal dot arrays: a regular pattern in the data zone and an arbitrary pattern in the servo zone. This method was successfully used to fabricate a servo-integrated BPM template with an areal density of 1.5 Teradot/inch(2) (Td/in.(2)) (L-o = 22.3 nm). Using the fabricated quartz template, CoCrPt BPM media has been successfully patterned by nanoimprint lithography and subsequent ion-beam etching process on a 2.5 in. disk. Further, using patterned-in servo wedges on 1.5 Td/in.(2) patterned CoCrPt media, we are able to close the servo control loop for track-following on a spin-stand test. The standard deviation of repeatable run-out over the full revolution is calculated to be about 4% of the 38.6 nm track pitch. This method is currently being used to fabricate a template at a much higher density of 3.2 Td/in.(2) (L-o = 15.2 nm). (C) The Authors. Published by SPIE under a Creative Commons Attribution 3.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.
C1 [Yang, XiaoMin; Xiao, Shuaigang; Hsu, Yautzong; Wang, HongYing; Hwu, Justin; Steiner, Philip; Wago, Koichi; Lee, Kim; Kuo, David] Seagate Technol, Media Res Ctr, Fremont, CA 94538 USA.
RP Yang, XM (reprint author), Seagate Technol, Media Res Ctr, 47010 Kato Rd, Fremont, CA 94538 USA.
EM xiaomin.yang@seagate.com
CR Albrecht TR, 2013, IEEE T MAGN, V49, P773, DOI 10.1109/TMAG.2012.2227303
   Bita I, 2008, SCIENCE, V321, P939, DOI 10.1126/science.1159352
   Cheng JY, 2008, ADV MATER, V20, P3155, DOI 10.1002/adma.200800826
   Dobisz EA, 2008, P IEEE, V96, P1836, DOI 10.1109/JPROC.2008.2007600
   Kamata Y, 2011, IEEE T MAGN, V47, P51, DOI 10.1109/TMAG.2010.2077274
   Kihara N, 2012, J VAC SCI TECHNOL B, V30, DOI 10.1116/1.4763356
   Kim SO, 2003, NATURE, V424, P411, DOI 10.1038/nature01775
   Liu GL, 2011, J VAC SCI TECHNOL B, V29, DOI 10.1116/1.3650697
   Piramanayagam SN, 2007, J APPL PHYS, V102, DOI 10.1063/1.2750414
   Richter H. J., 2006, APPL PHYS LETT, V88
   Ross C, 2001, ANN REV MATER RES, V31, P203, DOI 10.1146/annurev.matsci.31.1.203
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Ruiz R, 2011, ACS NANO, V5, P79, DOI 10.1021/nn101561p
   Schmid GM, 2009, J VAC SCI TECHNOL B, V27, P573, DOI 10.1116/1.3081981
   Stoykovich MP, 2005, SCIENCE, V308, P1442, DOI 10.1126/science.1111041
   Wan L, 2012, J MICRO-NANOLITH MEM, V11, DOI 10.1117/1.JMM.11.3.031405
   Wan L, 2009, LANGMUIR, V25, P12408, DOI 10.1021/la901648y
   Xia S., 2009, ADV MATER, V21, P2516
   Xiao SG, 2014, J POLYM SCI POL PHYS, V52, P361, DOI 10.1002/polb.23433
   Xiao SG, 2013, J MICRO-NANOLITH MEM, V12, DOI 10.1117/1.JMM.12.3.031110
   Yamamoto R, 2012, JPN J APPL PHYS, V51, DOI 10.1143/JJAP.51.046503
   Yang X. M., 2013, J NANOMATER, V2013
   YANG XH, 2008, J WUHAN BOT RES, V26, P1
   Yang XM, 2009, ACS NANO, V3, P1844, DOI 10.1021/nn900073r
   Yang XM, 2000, MACROMOLECULES, V33, P9575, DOI 10.1021/ma001326v
   Yang X.-M., 2014, NANOTECHNOL IN PRESS
NR 26
TC 3
Z9 3
U1 2
U2 8
PU SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS
PI BELLINGHAM
PA 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98225 USA
SN 1932-5150
EI 1932-5134
J9 J MICRO-NANOLITH MEM
JI J. Micro-Nanolithogr. MEMS MOEMS
PD JUL-SEP
PY 2014
VL 13
IS 3
AR 031307
DI 10.1117/1.JMM.13.3.031307
PG 8
WC Engineering, Electrical & Electronic; Nanoscience & Nanotechnology;
   Materials Science, Multidisciplinary; Optics
SC Engineering; Science & Technology - Other Topics; Materials Science;
   Optics
GA AQ1MH
UT WOS:000342545000006
ER

PT J
AU Thiyagarajah, N
   Asbahi, M
   Wong, RTJ
   Low, KWM
   Yakovlev, NL
   Yang, JKW
   Ng, V
AF Thiyagarajah, Naganivetha
   Asbahi, Mohamed
   Wong, Rick T. J.
   Low, Kendrick W. M.
   Yakovlev, Nikolai L.
   Yang, Joel K. W.
   Vivian Ng
TI A facile approach for screening isolated nanomagnetic behavior for
   bit-patterned media
SO NANOTECHNOLOGY
LA English
DT Article
DE bit pattern media; exchange interaction; magneto-optical Kerr effect;
   magnetic force microscopy
ID RECORDING MEDIA
AB Bit-patterned media (BPM) fabricated by the direct deposition of magnetic material onto prepatterned arrays of nanopillars is a promising approach for increasing magnetic recording of areal density. One of the key challenges of this approach is to identify and control the magnetic interaction between the bits (on top of the nanopillars) and the trench material between the pillars. Using independent techniques, including magnetic force microscopy, the variable-angle magneto-optic Kerr effect, and remanence curves, we were able to determine the presence and relative intensities of exchange and dipolar interactions in Co-Pd multilayer-based BPM fabricated by direct deposition. We found that for pitches of 30 nm or less, there were negligible exchange interactions, and the bits were found to be magnetically isolated. As we move to higher densities, the absence of exchange interactions indicates that direct deposition is a promising approach to BPM fabrication.
C1 [Thiyagarajah, Naganivetha; Vivian Ng] Natl Univ Singapore, Dept Elect & Comp Engn, Singapore 117576, Singapore.
   [Asbahi, Mohamed; Yakovlev, Nikolai L.; Yang, Joel K. W.] ASTAR, Inst Mat Res & Engn, Singapore 117602, Singapore.
   [Wong, Rick T. J.] Hwa Chong Inst, Singapore 269734, Singapore.
   [Low, Kendrick W. M.] Natl Jr Coll, Singapore 288913, Singapore.
RP Thiyagarajah, N (reprint author), Natl Univ Singapore, Dept Elect & Comp Engn, 4 Engn Dr 3, Singapore 117576, Singapore.
EM elengv@nus.edu.sg
RI Thiyagarajah, Naganivetha/N-1613-2014; Yang, Joel K.W./L-7892-2016
OI Thiyagarajah, Naganivetha/0000-0003-2888-1412; Yang, Joel
   K.W./0000-0003-3301-1040
FU Agency for Science, Technology and Research (A*STAR) in Singapore
FX The authors thank Dr Ramam Akkipeddi for use of the electron-beam
   lithography in IMRE through the SERC Nano Fabrication Processing and
   Characterization (SnFPC) facility. This work was supported by the Agency
   for Science, Technology and Research (A*STAR) in Singapore.
CR Ajan A, 2010, IEEE T MAGN, V46, P2020, DOI 10.1109/TMAG.2010.2043647
   Chadwick SJF, 2007, J MAGN MAGN MATER, V316, P203, DOI 10.1016/j.jmmm.2007.02.076
   Feng C, 2012, J NANOSCI NANOTECHNO, V12, P1089, DOI 10.1166/jnn.2012.4276
   HARRELL JW, 1993, J APPL PHYS, V73, P6722, DOI 10.1063/1.352514
   Hellwig O, 2008, APPL PHYS LETT, V93, DOI 10.1063/1.3013857
   Hellwig O, 2007, APPL PHYS LETT, V90, DOI 10.1063/1.2730744
   HENKEL O, 1964, PHYS STATUS SOLIDI, V7, P919, DOI 10.1002/pssb.19640070320
   Kelly P. E., 1989, IEEE Transactions on Magnetics, V25, P3881, DOI 10.1109/20.42466
   Kondorsky E, 1940, J PHYS-USSR, V2, P161
   Huerta JMM, 2012, J APPL PHYS, V111, DOI 10.1063/1.4704397
   Pike CR, 1999, J APPL PHYS, V85, P6660, DOI 10.1063/1.370176
   Ross C, 2001, ANN REV MATER RES, V31, P203, DOI 10.1146/annurev.matsci.31.1.203
   STONER EC, 1948, PHILOS TR R SOC S-A, V240, P599, DOI 10.1098/rsta.1948.0007
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Thiyagarajah N, 2012, APPL PHYS LETT, V101, DOI 10.1063/1.4758478
   Thiyagarajah N, 2012, J APPL PHYS, V111, DOI 10.1063/1.4714547
   WOHLFARTH EP, 1958, J APPL PHYS, V29, P595, DOI 10.1063/1.1723232
   Yakovlev NL, 2011, J APPL PHYS, V110, DOI 10.1063/1.3665191
   Yang JKW, 2011, NANOTECHNOLOGY, V22, DOI 10.1088/0957-4484/22/38/385301
   Yasui N, 2008, J APPL PHYS, V103, DOI 10.1063/1.2837497
NR 20
TC 3
Z9 3
U1 2
U2 16
PU IOP PUBLISHING LTD
PI BRISTOL
PA TEMPLE CIRCUS, TEMPLE WAY, BRISTOL BS1 6BE, ENGLAND
SN 0957-4484
EI 1361-6528
J9 NANOTECHNOLOGY
JI Nanotechnology
PD JUN 6
PY 2014
VL 25
IS 22
AR 225203
DI 10.1088/0957-4484/25/22/225203
PG 6
WC Nanoscience & Nanotechnology; Materials Science, Multidisciplinary;
   Physics, Applied
SC Science & Technology - Other Topics; Materials Science; Physics
GA AI2ZT
UT WOS:000336728400004
PM 24806875
ER

PT J
AU Nguyen, TNA
   Fallahi, V
   Le, QT
   Chung, S
   Mohseni, SM
   Dumas, RK
   Miller, CW
   Akerman, J
AF Thi Ngoc Anh Nguyen
   Fallahi, Vahid
   Quang Tuan Le
   Chung, Sunjea
   Mohseni, Seyed Majid
   Dumas, Randy K.
   Miller, Casey W.
   Akerman, Johan
TI Investigation of the Tunability of the Spin Configuration Inside
   Exchange Coupled Springs of Hard/Soft Magnets
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT 1st International Symposium on Frontiers in Materials Science (IS FMS)
CY NOV 17-19, 2013
CL Hanoi, VIETNAM
SP Accelrys, Horiba, Zugo Photon, RedStars, Indochina Travels
DE Competing magnetic anisotropy; exchange spring; tilted anisotropy
   materials; tunable magnetization
ID FILMS; MULTILAYERS; TORQUE; ANISOTROPY; DENSITY
AB Magnetic multilayer (ML) structures comprising a perpendicular magnetic anisotropy (PMA) layer coupled to an in-plane magnetic anisotropy (IMA) layer are promising materials for zero/low field operating spin-torque oscillators and bit patterned recording media. The magnetization tilt angle can be easily tuned by varying the IMA layer thickness due to the competition between PMA and IMA layers. To explore the underlying magnetization reversal mechanism and to further understand the control of tilt angle and uniformity of the magnetization, the IMA (NiFe, Co, and CoFeB)/PMA (Co/Pd MLs) exchange spring systems are systematically studied. Experimental data obtained from magnetometry show good agreement with 1-D micromagnetic simulations, allowing us to design tunable exchange coupled spring as a function of IMA thickness.
C1 [Thi Ngoc Anh Nguyen; Quang Tuan Le; Chung, Sunjea; Mohseni, Seyed Majid; Akerman, Johan] KTH Royal Inst Technol, Sch Informat & Commun Technol, S-16440 Stockholm, Sweden.
   [Thi Ngoc Anh Nguyen] Vietnam Natl Univ, Lab Nanotechnol, Spintron Res Grp, Ho Chi Minh City, Ho Chi Minh, Vietnam.
   [Fallahi, Vahid] Univ Bonab, Dept Opt & Laser Engn, Bonab 5551761167, Iran.
   [Mohseni, Seyed Majid] Shahid Beheshti Univ, Dept Phys, Tehran 19839, Iran.
   [Dumas, Randy K.; Akerman, Johan] Univ Gothenburg, Dept Phys, S-41296 Gothenburg, Sweden.
   [Miller, Casey W.] Univ S Florida, Dept Phys, Tampa, FL 33620 USA.
RP Nguyen, TNA (reprint author), KTH Royal Inst Technol, Sch Informat & Commun Technol, S-16440 Stockholm, Sweden.
EM anhntn@kth.se
RI Dumas, Randy/E-3077-2010; Akerman, Johan/B-5726-2008
OI Dumas, Randy/0000-0001-5505-2172; Akerman, Johan/0000-0002-3513-6608
CR Akerman J, 2005, SCIENCE, V308, P508, DOI 10.1126/science.1110549
   Albrecht M, 2005, NAT MATER, V4, P203, DOI 10.1038/nmat1324
   Amiri PK, 2011, APPL PHYS LETT, V98, DOI 10.1063/1.3567780
   Asti G, 2006, PHYS REV B, V73, DOI 10.1103/PhysRevB.73.094406
   Barsukov I, 2012, PHYS REV B, V85, DOI 10.1103/PhysRevB.85.014420
   Berger L, 1996, PHYS REV B, V54, P9353, DOI 10.1103/PhysRevB.54.9353
   Bonetti S, 2013, TOP APPL PHYS, V125, P177, DOI 10.1007/978-3-642-30247-3_13
   Brandenburg J, 2009, PHYS REV B, V79, DOI 10.1103/PhysRevB.79.054429
   Chung S, 2013, J PHYS D APPL PHYS, V46, DOI 10.1088/0022-3727/46/12/125004
   Cui B, 2013, J PHYS-CONDENS MAT, V25, DOI 10.1088/0953-8984/25/10/106003
   Gan L, 2003, J APPL PHYS, V93, P8731, DOI 10.1063/1.1543873
   He PB, 2010, EUR PHYS J B, V73, P417, DOI 10.1140/epjb/e2010-00007-8
   Hoefer MA, 2012, PHYS REV B, V85, DOI 10.1103/PhysRevB.85.214433
   Hoefer MA, 2010, PHYS REV B, V82, DOI 10.1103/PhysRevB.82.054432
   Ingvarsson S, 2002, J MAGN MAGN MATER, V251, P202, DOI 10.1016/S0304-8853(02)00577-2
   Iskhakov RS, 2006, JETP LETT+, V83, P28, DOI 10.1134/S0021364006010073
   Jang SY, 2011, J APPL PHYS, V109, DOI 10.1063/1.3527968
   Kaka S, 2005, NATURE, V437, P389, DOI 10.1038/nature04035
   Kinane CJ, 2006, APPL PHYS LETT, V89, DOI 10.1063/1.2344935
   Kruglyak VV, 2010, J PHYS D APPL PHYS, V43, DOI 10.1088/0022-3727/43/26/260301
   Lee K, 2011, J APPL PHYS, V109, DOI 10.1063/1.3592986
   Leineweber T, 1997, J MAGN MAGN MATER, V176, P145, DOI 10.1016/S0304-8853(97)00601-X
   Madami M, 2011, NAT NANOTECHNOL, V6, P635, DOI [10.1038/nnano.2011.140, 10.1038/NNANO.2011.140]
   Mangin S, 2006, NAT MATER, V5, P210, DOI 10.1038/nmat1595
   Masugata Y, 2011, J PHYS CONF SER, V266, DOI 10.1088/1742-6596/266/1/012098
   Mohseni SM, 2013, SCIENCE, V339, P1295, DOI 10.1126/science.1230155
   Mohseni S. M., 2013, PHYS B IN PRESS
   Mohseni S. M., 2013, J APPL PHYS IN PRESS
   Nguyen TNA, 2012, J MAGN MAGN MATER, V324, P3929, DOI 10.1016/j.jmmm.2012.06.043
   Nguyen TNA, 2011, APPL PHYS LETT, V98, DOI 10.1063/1.3580612
   Oguz K, 2008, J APPL PHYS, V103, DOI 10.1063/1.2838851
   Phuoc NN, 2013, J APPL PHYS, V114, DOI 10.1063/1.4816622
   Raju M, 2013, J MAGN MAGN MATER, V332, P109, DOI 10.1016/j.jmmm.2012.12.022
   Ralph DC, 2008, J MAGN MAGN MATER, V320, P1190, DOI 10.1016/j.jmmm.2007.12.019
   Sato H, 2012, IEEE MAGN LETT, V3, DOI 10.1109/LMAG.2012.2190722
   Sbiaa R., 2009, J APPL PHYS, V105
   Skomski R, 2013, IEEE T MAGN, V49, P3229, DOI 10.1109/TMAG.2013.2247386
   Slonczewski JC, 1996, J MAGN MAGN MATER, V159, pL1, DOI 10.1016/0304-8853(96)00062-5
   Slonczewski JC, 1999, J MAGN MAGN MATER, V195, pL261, DOI 10.1016/S0304-8853(99)00043-8
   SMITH DO, 1960, J APPL PHYS, V31, P1755, DOI 10.1063/1.1735441
   Tacchi S, 2013, PHYS REV B, V87, DOI 10.1103/PhysRevB.87.144426
   Wang JP, 2005, NAT MATER, V4, P191, DOI 10.1038/nmat1344
   Wang JP, 2003, IEEE T MAGN, V39, P1930, DOI 10.1109/TMAG.2003.813775
   Xu Y, 2004, SECOND SEEHEIM CONFERENCE ON MAGNETISM, PROCEEDINGS, P3698, DOI 10.1002/pssc.200405537
   Zeng ZM, 2013, SCI REP-UK, V3, DOI 10.1038/srep01426
   Zha CL, 2010, IEEE MAGN LETT, V1, DOI 10.1109/LMAG.2009.2039774
   Zha CL, 2009, J APPL PHYS, V106, DOI 10.1063/1.3211964
   Zha CL, 2009, APPL PHYS LETT, V94, DOI 10.1063/1.3123003
   Zhang ZM, 2010, J PHYS D APPL PHYS, V43, DOI 10.1088/0022-3727/43/8/085002
   Zheng YF, 2002, J APPL PHYS, V91, P8007, DOI 10.1063/1.1456416
   Zhou Y., 2008, APPL PHYS LETT, V92
   Zhou Y, 2009, NEW J PHYS, V11, DOI 10.1088/1367-2630/11/10/103028
   Zhou Y, 2009, J APPL PHYS, V105, DOI 10.1063/1.3068429
NR 53
TC 5
Z9 5
U1 2
U2 19
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUN
PY 2014
VL 50
IS 6
AR 2004906
DI 10.1109/TMAG.2014.2299976
PN 1
PG 6
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA AQ7XO
UT WOS:000343033900005
ER

PT J
AU Zheng, N
   Venkataraman, KS
   Kavcic, A
   Zhang, T
AF Zheng, Ning
   Venkataraman, Kalyana Sundaram
   Kavcic, Aleksandar
   Zhang, Tong
TI A Study of Multitrack Joint 2-D Signal Detection Performance and
   Implementation Cost for Shingled Magnetic Recording
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE 2-D equalization; 2-D Viterbi detection; generalized partial response
   (GPR) target; interleaved pipelining; shingled magnetic recording
ID BIT-PATTERNED MEDIA; INTERFERENCE; DENSITY; TDMR; SOVA
AB Shingled magnetic recording is a promising option to sustain the historical areal density growth of hard disk drives while retaining conventional heads and media. Nevertheless, highly scaled shingled magnetic recording is subject to severe intertrack interference (ITI), fewer grains per channel bit and therefore lower signal-to-noise ratio (SNR). This naturally demands 2-D read channel signal processing, which has an inherently large spectrum of detection performance versus computational complexity tradeoff. By concurrently detecting multitrack readback signals from a read head array, joint 2-D signal detection can fully utilize the 2-D interference to maximize the detection performance at the penalty of the highest computational complexity. Multitrack joint 2-D detection has not been thoroughly studied from either the detection performance or silicon implementation perspective because of the justifiable concern on its practical feasibility. To fill this missing link, this paper presents a comprehensive study of multitrack joint 2-D signal detection performance and silicon implementation cost. We further present an interleaved pipelining strategy to reduce joint 2-D signal detector silicon consumption. By carrying out comprehensive simulations and application-specific integrated circuit (ASIC) design, this paper shows that multitrack joint 2-D signal detection is a practically attractive option with superior detection performance and affordable silicon cost, especially when considering projected CMOS technology scaling toward 16 nm and below.
C1 [Zheng, Ning; Zhang, Tong] Rensselaer Polytech Inst, Dept Elect & Comp Syst Engn, Troy, NY 12180 USA.
   [Venkataraman, Kalyana Sundaram] Cavium, San Jose, CA 95131 USA.
   [Kavcic, Aleksandar] Univ Hawaii, Dept Elect Engn, Honolulu, HI 96822 USA.
   [Kavcic, Aleksandar] Chinese Univ Hong Kong, Inst Network Coding, Hong Kong, Hong Kong, Peoples R China.
RP Zheng, N (reprint author), Rensselaer Polytech Inst, Dept Elect & Comp Syst Engn, Troy, NY 12180 USA.
EM ningzhengrpi@gmail.com
FU National Science Foundation [ECCS-1128148]; Advanced Storage Technology
   Consortium
FX This work was supported in part by the National Science Foundation under
   Grant ECCS-1128148 and in part by the Advanced Storage Technology
   Consortium.
CR BARBOSA LC, 1990, IEEE T MAGN, V26, P2163, DOI 10.1109/20.104655
   Chang W, 2010, IEEE T MAGN, V46, P3899, DOI 10.1109/TMAG.2010.2056926
   Elidrissi MR, 2011, IEEE T MAGN, V47, P3685, DOI 10.1109/TMAG.2011.2156770
   Fossorier MPC, 1998, IEEE COMMUN LETT, V2, P137, DOI 10.1109/4234.673659
   Hochwald BM, 2003, IEEE T COMMUN, V51, P389, DOI 10.1109/TCOMM.2003.809789
   Hwang E, 2010, IEEE T MAGN, V46, P1813, DOI 10.1109/TMAG.2010.2041531
   Karakulak S, 2010, IEEE T MAGN, V46, P3639, DOI 10.1109/TMAG.2010.2049116
   Khatami S. M., 2013, P ICNC, P535
   Kim K.A., 2012, P 17 OPT COMM C OECC, P1
   Kovintavewat P, 2002, IEEE T MAGN, V38, P2340, DOI 10.1109/TMAG.2002.801899
   Kurtas E., 1997, Proceeding. 1997 IEEE International Symposium on Information Theory (Cat. No.97CH36074), DOI 10.1109/ISIT.1997.613052
   Lim F, 2010, IEEE T MAGN, V46, P1548, DOI 10.1109/TMAG.2009.2038281
   Ling C, 1999, IEEE COMMUN LETT, V3, P335, DOI 10.1109/4234.809527
   Miura K, 2009, IEEE T MAGN, V45, P3722, DOI 10.1109/TMAG.2009.2023850
   Nabavi S, 2007, IEEE T MAGN, V43, P2274, DOI 10.1109/TMAG.2007.893479
   Pan L, 2011, IEEE T MAGN, V47, P1705, DOI 10.1109/TMAG.2011.2106506
   Paulraj AJ, 2004, P IEEE, V92, P198, DOI 10.1109/JPROC.2003.821915
   Soljanin E, 1998, IEEE T INFORM THEORY, V44, P2988, DOI 10.1109/18.737527
   Todd RM, 2012, IEEE T MAGN, V48, P4594, DOI 10.1109/TMAG.2012.2197855
   Tosi S, 2004, GLOB TELECOMM CONF, P2445
   VEA MP, 1994, SERVING HUMANITY THROUGH COMMUNICATIONS, VOLS 1-3, P1221, DOI 10.1109/ICC.1994.368908
   VOOIS PA, 1994, IEEE T MAGN, V30, P5100, DOI 10.1109/20.334301
   Wu YX, 2003, IEEE T MAGN, V39, P2115, DOI 10.1109/TMAG.2003.814291
   Yamashita M, 2012, IEEE T MAGN, V48, P4586, DOI 10.1109/TMAG.2012.2194988
NR 24
TC 5
Z9 5
U1 0
U2 2
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUN
PY 2014
VL 50
IS 6
AR 3100906
DI 10.1109/TMAG.2014.2300133
PN 2
PG 6
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA AQ7XT
UT WOS:000343034400003
ER

PT J
AU Liakakos, N
   Blon, T
   Achkar, C
   Vilar, V
   Cormary, B
   Tan, RP
   Benamara, O
   Chaboussant, G
   Ott, F
   Warot-Fonrose, B
   Snoeck, E
   Chaudret, B
   Soulantica, K
   Respaud, M
AF Liakakos, Nikolaos
   Blon, Thomas
   Achkar, Charbel
   Vilar, Virginie
   Cormary, Benoit
   Tan, Reasmey P.
   Benamara, Omar
   Chaboussant, Gregory
   Ott, Frederic
   Warot-Fonrose, Benedicte
   Snoeck, Etienne
   Chaudret, Bruno
   Soulantica, Katerina
   Respaud, Marc
TI Solution Epitaxial Growth of Cobalt Nanowires on Crystalline Substrates
   for Data Storage Densities beyond 1 Tbit/in(2)
SO NANO LETTERS
LA English
DT Article
DE Anisotropic nanoparticles; self-organization; cobalt nanowires;
   nanomagnet array; bit patterned media; epitaxial growth
ID BIT-PATTERNED MEDIA; MAGNETIC-PROPERTIES; NANOCRYSTAL SUPERLATTICES;
   INORGANIC NANOPARTICLES; NANOROD SUPERLATTICES; ARRAYS; PHASE;
   FABRICATION; TRANSITION; ANISOTROPY
AB The implementation of nano-objects in numerous emerging applications often demands their integration in macroscopic devices. Here we present the bottom-up epitaxial solution growth of high-density arrays of vertical 5 nm diameter single-crystalline metallic cobalt nanowires on wafer-scale crystalline metal surfaces. The nanowires form regular hexagonal arrays on unpatterned metallic films. These hybrid heterostructures present an important perpendicular magnetic anisotropy and pave the way to a high density magnetic recording device, with capacities above 10 Terabits/in(2). This method bypasses the need of assembling and orientating free colloidal nanocrystals on surfaces. Its generalization to other materials opens new perspectives toward many applications.
C1 [Liakakos, Nikolaos; Blon, Thomas; Achkar, Charbel; Vilar, Virginie; Cormary, Benoit; Tan, Reasmey P.; Benamara, Omar; Chaudret, Bruno; Soulantica, Katerina; Respaud, Marc] Univ Toulouse, UPS, LPCNO, INSA,CNRS,UMR5215, F-31077 Toulouse, France.
   [Liakakos, Nikolaos; Benamara, Omar; Warot-Fonrose, Benedicte; Snoeck, Etienne] CNRS, CEMES, F-31055 Toulouse, France.
   [Chaboussant, Gregory; Ott, Frederic] CEA Saclay, CEA CNRS UMR12, Lab Leon Brillouin, F-91191 Gif Sur Yvette, France.
RP Blon, T (reprint author), Univ Toulouse, UPS, LPCNO, INSA,CNRS,UMR5215, 135 Ave Rangueil, F-31077 Toulouse, France.
EM thomas.blon@insa-toulouse.fr; ksoulant@insa-toulouse.fr
RI OTT, Frederic/K-8621-2015; Warot-Fonrose, Benedicte/A-6131-2017
OI OTT, Frederic/0000-0003-1562-4644; Warot-Fonrose,
   Benedicte/0000-0001-9829-9431
FU European Commission [EU NMP4-LA-2010-246479, MET-NANO EFA 17/08]; Region
   Midi-Pyrenees [MET-NANO EFA 17/08]
FX The authors thank the ANR for the project BATMAG, the European
   Commission for the FP7 NAMDIATREAM project (EU NMP4-LA-2010-246479), the
   European Commission and the Region Midi-Pyrenees for the POCTEFA
   Interreg project (MET-NANO EFA 17/08), the European Commission, FEDER
   and the Region Midi-Pyrenees for NANOBAT I and II projects and the
   TEMSCAN service for the SEM. The authors thank Dominique Givord for
   fruitful discussions.
CR Albrecht TR, 2013, IEEE T MAGN, V49, P773, DOI 10.1109/TMAG.2012.2227303
   Alloyeau D, 2009, NAT MATER, V8, P940, DOI [10.1038/nmat2574, 10.1038/NMAT2574]
   Amatore C, 2008, CHEM-EUR J, V14, P8615, DOI 10.1002/chem.200801074
   Baker JL, 2010, NANO LETT, V10, P195, DOI [10.1021/nl903187v, 10.1021/nl903187V]
   Baranov D, 2010, NANO LETT, V10, P743, DOI 10.1021/nl903946n
   Bigioni TP, 2006, NAT MATER, V5, P265, DOI 10.1038/nmat1611
   Cho MH, 2012, NAT MATER, V11, P1038, DOI [10.1038/nmat3430, 10.1038/NMAT3430]
   Cushing BL, 2004, CHEM REV, V104, P3893, DOI 10.1021/cr030027b
   Darques M, 2004, J PHYS D APPL PHYS, V37, P1411, DOI 10.1088/0022-3727/37/10/001
   Dobson J, 2008, NAT NANOTECHNOL, V3, P139, DOI 10.1038/nnano.2008.39
   Dumestre F, 2004, SCIENCE, V303, P821, DOI 10.1126/science.1092641
   Dumestre F, 2003, ANGEW CHEM INT EDIT, V42, P5213, DOI 10.1002/anie.200352090
   Gao Y, 2011, SMALL, V7, P2133, DOI 10.1002/smll.201100474
   Gates BD, 2005, CHEM REV, V105, P1171, DOI 10.1021/cr030076o
   GRUTTER P, 1994, PHYS REV B, V49, P2021, DOI 10.1103/PhysRevB.49.2021
   Habas SE, 2007, NAT MATER, V6, P692, DOI 10.1038/nmat1957
   Jiang Z, 2010, NANO LETT, V10, P799, DOI 10.1021/nl9029048
   Lee EP, 2008, ACS NANO, V2, P2167, DOI 10.1021/nn800458p
   Legrand J, 2001, J PHYS CHEM B, V105, P5643, DOI 10.1021/jp0039159
   Liakakos N, 2012, J AM CHEM SOC, V134, P17922, DOI 10.1021/ja304487b
   Matejich S. A., 2011, ACS NANO, V5, P6081
   Maynadie J, 2009, ANGEW CHEM INT EDIT, V48, P1814, DOI 10.1002/anie.200804798
   MEIKLEJOHN WH, 1957, PHYS REV, V105, P904, DOI 10.1103/PhysRev.105.904
   Miles JJ, 2003, IEEE T MAGN, V39, P1876, DOI 10.1109/TMAG.2003.813785
   Narayanan S, 2004, PHYS REV LETT, V93, DOI 10.1103/PhysRevLett.93.135503
   Nie ZH, 2010, NAT NANOTECHNOL, V5, P15, DOI [10.1038/nnano.2009.453, 10.1038/NNANO.2009.453]
   Piramanayagam S. N., 2007, J APPL PHYS, V102
   Polleux J., 2011, ACS NANO, V8, P6355
   Poudyal N., 2013, J PHYS D, V46
   Richter HJ, 2007, J PHYS D APPL PHYS, V40, pR149, DOI 10.1088/0022-3727/40/9/R01
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Richter J., 2012, J APPL PHYS, V111
   Ryan KM, 2006, NANO LETT, V6, P1479, DOI 10.1021/nl060866o
   Schabes ME, 2008, J MAGN MAGN MATER, V320, P2880, DOI 10.1016/j.jmmm.2008.07.035
   Shevchenko EV, 2006, NATURE, V439, P55, DOI 10.1038/nature04414
   Shiroishi Y, 2009, IEEE T MAGN, V45, P3816, DOI 10.1109/TMAG.2009.2024879
   Skumryev V, 2003, NATURE, V423, P850, DOI 10.1038/nature01687
   Soulantica K., 2009, APPL PHYS LETT, V95
   STONER EC, 1948, PHILOS TR R SOC S-A, V240, P599, DOI 10.1098/rsta.1948.0007
   Sun SH, 2000, SCIENCE, V287, P1989, DOI 10.1126/science.287.5460.1989
   Tao AR, 2008, ACCOUNTS CHEM RES, V41, P1662, DOI 10.1021/ar8000525
   Thiele J, 1997, SURF SCI, V384, P120, DOI 10.1016/S0039-6028(97)00180-5
   Thurn-Albrecht T, 2000, SCIENCE, V290, P2126, DOI 10.1126/science.290.5499.2126
   Ursache A., 2005, J APPL PHYS, V97
   Vayssieres L, 2007, APPL PHYS A-MATER, V89, P1, DOI 10.1007/s00339-007-4039-0
   WAGNER RS, 1964, APPL PHYS LETT, V4, P89, DOI 10.1063/1.1753975
   Wetz F, 2007, MAT SCI ENG C-BIO S, V27, P1162, DOI 10.1016/j.msec.2006.09.010
   WHITNEY TM, 1993, SCIENCE, V261, P1316, DOI 10.1126/science.261.5126.1316
   Zeng H, 2002, PHYS REV B, V6513, P4426, DOI 10.1103/PhysRevB.65.134426
NR 49
TC 22
Z9 22
U1 8
U2 89
PU AMER CHEMICAL SOC
PI WASHINGTON
PA 1155 16TH ST, NW, WASHINGTON, DC 20036 USA
SN 1530-6984
EI 1530-6992
J9 NANO LETT
JI Nano Lett.
PD JUN
PY 2014
VL 14
IS 6
BP 3481
EP 3486
DI 10.1021/nl501018z
PG 6
WC Chemistry, Multidisciplinary; Chemistry, Physical; Nanoscience &
   Nanotechnology; Materials Science, Multidisciplinary; Physics, Applied;
   Physics, Condensed Matter
SC Chemistry; Science & Technology - Other Topics; Materials Science;
   Physics
GA AJ0JP
UT WOS:000337337100077
PM 24828234
ER

PT J
AU Ishio, S
   Takahashi, S
   Hasegawa, T
   Arakawa, A
   Sasaki, H
   Yan, Z
   Liu, X
   Kondo, Y
   Yamane, H
   Ariake, J
   Suzuki, M
   Kawamura, N
   Mizumaki, M
AF Ishio, S.
   Takahashi, S.
   Hasegawa, T.
   Arakawa, A.
   Sasaki, H.
   Yan, Z.
   Liu, X.
   Kondo, Y.
   Yamane, H.
   Ariake, J.
   Suzuki, M.
   Kawamura, N.
   Mizumaki, M.
TI Switching field distribution and magnetization reversal process of FePt
   dot patterns
SO JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
LA English
DT Article
DE Fe Pt; Dot pattern; Magnetization reversal; Switching field; Coercivity
ID FILMS; ANISOTROPY; NANOPARTICLES; DEPENDENCE; MEDIA
AB The fabrication of FePt nanodots with a high structural quality and the control of their switching fields are key issues in realizing high density bit pattern recording. We have prepared FePt dot patterns for dots with 15-300 nm diameters by electron beam lithography and re-annealing, and studied the relation between magnetization reversal process and structure of FePt nanodots. The switching field (H) of dot patterns re-annealed at 710 degrees C for 240 min showed a bimodal distribution, where a higher peak was found at 5-6 T, and a lower peak was found at similar to 2 T. It was revealed by cross-sectional TOM analysis that the structure of dots in the pattern can be classified into two groups. One group has a high degree of order with well-defined 100 11 crystalline growth, and the other group includes structurally-disturbed dots like [1 1 11 growth and twin crystals. This structural inhomogeneity causes the magnetic switching field distribution observed. (C) 2014 Elsevier By. All rights reserved.
C1 [Ishio, S.; Takahashi, S.; Hasegawa, T.; Arakawa, A.; Sasaki, H.] Akita Univ, Dept Mat Sci & Engn, Akita 0108502, Japan.
   [Yan, Z.; Liu, X.] Akita Univ, Venture Business Lab, Akita 0108502, Japan.
   [Kondo, Y.; Yamane, H.; Ariake, J.] Akita Prefectural Res & Dev Ctr, Akita 0101623, Japan.
   [Suzuki, M.; Kawamura, N.; Mizumaki, M.] Japan Synchrotron Radiat Res Inst, Sayo, Hyogo 6795198, Japan.
RP Ishio, S (reprint author), Akita Univ, Dept Mat Sci & Engn, Akita 0108502, Japan.
EM ishio@gipc.akita-u.ac.jp
RI Yan, Zhongjie/N-7141-2013
OI Yan, Zhongjie/0000-0002-0530-4834; Hasegawa, Takashi/0000-0002-8178-4980
FU Japan Science and Technology Agency (JST); Storage Research Consortium
   (SRC); Inter-university Cooperative Research Program of the Institute
   for Materials Research; Tohoku University [121K0012]; Ministry of
   Education, Culture, Sports, Science and Technology [2011131719/BL,
   BL39XU]
FX This research was supported in part by the Japan Science and Technology
   Agency (JST) under Collaborative Research Based on Industrial Demand
   "High Performance Magnets: Towards Innovative Development of Next
   Generation Magnets". This research was also supported by Storage
   Research Consortium (SRC), This work was performed under the
   Inter-university Cooperative Research Program of the Institute for
   Materials Research, Tohoku University (Proposal no. 121K0012). The
   synchrotron radiation experiments were performed at SPring-8 with the
   approval of the Japan Synchrotron Radiation Research Institute (JASRI)
   as a Nanotechnology Support Project of the Ministry of Education,
   Culture, Sports, Science and Technology. (Proposal no. 2011131719/BL no.
   BL39XU).
CR Bublat T, 2011, J APPL PHYS, V110, DOI 10.1063/1.3646550
   Bublat T, 2010, J APPL PHYS, V108, DOI 10.1063/1.3512906
   Farrow RFC, 1996, J APPL PHYS, V79, P5967, DOI 10.1063/1.362122
   Granz SD, 2012, J MAGN MAGN MATER, V324, P287, DOI 10.1016/j.jmmm.2010.12.001
   Ishio S, 2012, J MAGN MAGN MATER, V324, P295, DOI 10.1016/j.jmmm.2010.12.014
   IVANOV OA, 1973, FIZ MET METALLOVED+, V35, P92
   Kamata Y, 2011, IEEE T MAGN, V47, P51, DOI 10.1109/TMAG.2010.2077274
   Kawamura N, 2009, J SYNCHROTRON RADIAT, V16, P730, DOI 10.1107/S0909049509034700
   Kondo Y, 2008, J MAGN MAGN MATER, V320, P3157, DOI 10.1016/j.jmmm.2008.08.096
   Kondo Y., 2010, Magnetics Japan, V5
   Lee J, 2011, APPL PHYS LETT, V99, DOI 10.1063/1.3623752
   Li GQ, 2007, J MAGN MAGN MATER, V319, P73, DOI 10.1016/j.jmmm.2007.04.034
   Mosendz O., 2012, J APPL PHYS, V111
   Rong CB, 2010, J PHYS D APPL PHYS, V43, DOI 10.1088/0022-3727/43/49/495001
   Seki T, 2011, J PHYS D APPL PHYS, V44, DOI 10.1088/0022-3727/44/33/335001
   SHARROCK MP, 1994, J APPL PHYS, V76, P6413, DOI 10.1063/1.358282
   Shima T, 2002, APPL PHYS LETT, V81, P1050, DOI 10.1063/1.1498504
   Shimatsu T., 2011, J APPL PHYS, V109
   Takahashi YK, 2004, J APPL PHYS, V95, P2690, DOI 10.1063/1.1643187
   Takekuma I., 2012, J APPL PHYS, V111
   Thiele JU, 1998, J APPL PHYS, V84, P5686, DOI 10.1063/1.368831
   Thomson T, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.257204
   Wu YC, 2007, APPL PHYS LETT, V91, DOI 10.1063/1.2770652
   Yamane H, 2010, J APPL PHYS, V108, DOI 10.1063/1.3514081
   Yan ML, 2004, IEEE T MAGN, V40, P2470, DOI [10.1109/TMAG.2004.830181, 10.1109/tmag.2004.830181]
   Yan ZJ, 2012, J MAGN MAGN MATER, V324, P3737, DOI 10.1016/j.jmmm.2012.06.006
   Yan ZJ, 2011, J PHYS D APPL PHYS, V44, DOI 10.1088/0022-3727/44/18/185002
   Yang B, 2005, SCRIPTA MATER, V53, P417, DOI 10.1016/j.scriptamat.2005.04.038
   Zhang L, 2010, J MAGN MAGN MATER, V322, P2658, DOI 10.1016/j.jmmm.2010.04.003
NR 29
TC 5
Z9 5
U1 1
U2 39
PU ELSEVIER SCIENCE BV
PI AMSTERDAM
PA PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
SN 0304-8853
EI 1873-4766
J9 J MAGN MAGN MATER
JI J. Magn. Magn. Mater.
PD JUN
PY 2014
VL 360
BP 205
EP 210
DI 10.1016/j.jmmm.2014.02.049
PG 6
WC Materials Science, Multidisciplinary; Physics, Condensed Matter
SC Materials Science; Physics
GA AE2MP
UT WOS:000333807500037
ER

PT J
AU Hauet, T
   Piraux, L
   Srivastava, SK
   Antohe, VA
   Lacour, D
   Hehn, M
   Montaigne, F
   Schwenk, J
   Marioni, MA
   Hug, HJ
   Hovorka, O
   Berger, A
   Mangin, S
   Araujo, FA
AF Hauet, T.
   Piraux, L.
   Srivastava, S. K.
   Antohe, V. A.
   Lacour, D.
   Hehn, M.
   Montaigne, F.
   Schwenk, J.
   Marioni, M. A.
   Hug, H. J.
   Hovorka, O.
   Berger, A.
   Mangin, S.
   Araujo, F. Abreu
TI Reversal mechanism, switching field distribution, and dipolar
   frustrations in Co/Pt bit pattern media based on auto-assembled anodic
   alumina hexagonal nanobump arrays
SO PHYSICAL REVIEW B
LA English
DT Article
ID MAGNETIZATION REVERSAL; FILMS; MULTILAYERS; FABRICATION; PHASES
AB We fabricated a perpendicularly magnetized bit pattern media using a hexagonally close-packed auto-assembled anodic alumina template with 100 nm and 50 nm periods by depositing a Co/Pt multilayer to form an ordered array of ferromagnetic nanodots, so-called nanobumps. We used Hall resistance measurements and magnetic force microscopy to characterize the dot-by-dot magnetization reversal mechanism under applied field. The role of interdot exchange coupling and dipolar coupling are investigated. Then we focus on separating the various origins of switching field distribution (SFD) in this system, namely dipolar interactions, intrinsic anisotropy distribution, and template packing faults. Finally we discuss the influence of triangular dipolar frustrations on the energy stability of demagnetized and half-switched states based on an Ising model, including local exchange coupling. The impact of SFD and lattice defects lines between misoriented ordered domains on the magnetic configurations is studied in detail.
C1 [Hauet, T.; Lacour, D.; Hehn, M.; Montaigne, F.; Mangin, S.] Univ Lorraine, Inst Jean Lamour, F-54506 Vandoeuvre Les Nancy, France.
   [Hauet, T.; Lacour, D.; Hehn, M.; Montaigne, F.; Mangin, S.] Univ Lorraine, CNRS, F-54506 Vandoeuvre Les Nancy, France.
   [Piraux, L.; Srivastava, S. K.; Antohe, V. A.; Araujo, F. Abreu] Catholic Univ Louvain, Inst Condensed Matter & Nanosci, B-1348 Louvain, Belgium.
   [Srivastava, S. K.] Amity Univ, Amity Inst Nanotechnol, Noida 201303, India.
   [Schwenk, J.; Hug, H. J.] Empa Swiss Fed Labs Mat Sci & Technol, CH-8600 Dubendorf, Switzerland.
   [Hug, H. J.] Univ Basel, Inst Phys, CH-4056 Basel, Switzerland.
   [Hovorka, O.] Univ Southampton, Fac Engn & Environm, Southampton SO17 1BJ, Hants, England.
   [Berger, A.] CIC NanoGUNE Consolider, E-20018 San Sebastian, Spain.
RP Hauet, T (reprint author), Univ Lorraine, Inst Jean Lamour, F-54506 Vandoeuvre Les Nancy, France.
RI Berger, Andreas/D-3706-2015; ANTOHE, Vlad-Andrei/D-2158-2012; HEHN,
   Michel/N-1038-2015; nanoGUNE, CIC/A-2623-2015; Lacour,
   Daniel/J-2630-2015
OI Berger, Andreas/0000-0001-5865-6609; ANTOHE,
   Vlad-Andrei/0000-0003-2298-0719; HEHN, Michel/0000-0002-4240-5925;
   Mangin, stephane/0000-0001-6046-0437; Abreu Araujo,
   Flavio/0000-0001-7157-3197; Lacour, Daniel/0000-0002-5871-8870
FU Research Science Foundation of Belgium (FRS-FNRS)
FX The authors thank S. Petit for help with numerical simulations. F.A.A.
   acknowledges the Research Science Foundation of Belgium (FRS-FNRS) for
   financial support (FRIA grant).
CR Aign T, 1998, PHYS REV LETT, V81, P5656, DOI 10.1103/PhysRevLett.81.5656
   Albrecht M, 2005, NAT MATER, V4, P203, DOI 10.1038/nmat1324
   Albrecht TR, 2013, IEEE T MAGN, V49, P773, DOI 10.1109/TMAG.2012.2227303
   Berger A, 2006, J APPL PHYS, V99, DOI 10.1063/1.2164416
   Berger A, 2005, IEEE T MAGN, V41, P3178, DOI 10.1109/TMAG.2005.855285
   Berger A, 1996, J APPL PHYS, V79, P5619, DOI 10.1063/1.362261
   Chou SY, 1997, P IEEE, V85, P652, DOI 10.1109/5.573754
   Ding GQ, 2010, NANOSCALE RES LETT, V5, P1257, DOI 10.1007/s11671-010-9634-x
   Dittrich R, 2005, J APPL PHYS, V97, DOI 10.1063/1.1851931
   Dublenych YI, 2013, J PHYS-CONDENS MAT, V25, DOI 10.1088/0953-8984/25/40/406003
   Eibagi N, 2012, IEEE MAGN LETT, V3, DOI 10.1109/LMAG.2012.2211864
   Hauet T, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3276911
   Hellwig O, 2003, PHYSICA B, V336, P136, DOI 10.1016/S0921-4526(03)00282-5
   Hellwig O, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3293301
   Hellwig O, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3271679
   Hellwig O, 2007, APPL PHYS LETT, V90, DOI 10.1063/1.2730744
   Hellwig O, 2007, J MAGN MAGN MATER, V319, P13, DOI 10.1016/j.jmmm.2007.04.035
   HOUTAPPEL RMF, 1950, PHYSICA, V16, P425, DOI 10.1016/0031-8914(50)90130-3
   HOUTAPPEL RMF, 1950, PHYSICA, V16, P391, DOI 10.1016/0031-8914(50)90083-8
   Hovorka O, 2012, APPL PHYS LETT, V101, DOI 10.1063/1.4765085
   Hovorka O, 2010, J APPL PHYS, V108, DOI 10.1063/1.3517823
   Hovorka O, 2010, APPL PHYS LETT, V97, DOI 10.1063/1.3477956
   Hovorka O, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3263732
   Hovorka O, 2010, J MAGN MAGN MATER, V322, P459, DOI 10.1016/j.jmmm.2009.09.076
   Hubert A., 1998, MAGNETIC DOMAINS
   Kappenberger P, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3176937
   Kireev V. E., 2012, ARXIV12011747
   Kondorsky E, 1940, J PHYS-USSR, V2, P161
   Lau JW, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2822439
   Lau JW, 2011, PHYS REV B, V84, DOI 10.1103/PhysRevB.84.214427
   Luo F, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2841821
   Malescio G, 2003, NAT MATER, V2, P97, DOI 10.1038/nmat820
   Marioni MA, 2006, PHYS REV LETT, V97, DOI 10.1103/PhysRevLett.97.027201
   MASUDA H, 1995, SCIENCE, V268, P1466, DOI 10.1126/science.268.5216.1466
   Matsui Y, 2006, SMALL, V2, P522, DOI 10.1002/smll.200500440
   Mengotti E, 2009, J APPL PHYS, V105, DOI 10.1063/1.3133202
   Nielsch K, 2002, J MAGN MAGN MATER, V249, P234, DOI 10.1016/S0304-8853(02)00536-X
   Ozatay O, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3250924
   Ozatay O., 2010, COMPREHENSIVE NANOSC, V4, P561
   Pfau B, 2011, APPL PHYS LETT, V99, DOI 10.1063/1.3623488
   Pierce MS, 2007, PHYS REV B, V75, DOI 10.1103/PhysRevB.75.144406
   Pierce MS, 2013, PHYS REV B, V87, DOI 10.1103/PhysRevB.87.184428
   Piraux L, 2012, APPL PHYS LETT, V101, DOI 10.1063/1.4731640
   Rabin O, 2003, ADV FUNCT MATER, V13, P631, DOI 10.1002/adfm.200304394
   Ross CA, 1999, J VAC SCI TECHNOL B, V17, P3168, DOI 10.1116/1.590974
   Rougemaille N, 2011, PHYS REV LETT, V106, DOI 10.1103/PhysRevLett.106.057209
   SEUL M, 1995, SCIENCE, V267, P476, DOI 10.1126/science.267.5197.476
   SHARROCK MP, 1981, IEEE T MAGN, V17, P3020, DOI 10.1109/TMAG.1981.1061755
   Shaw JM, 2010, PHYS REV B, V82, DOI 10.1103/PhysRevB.82.144437
   Shaw JM, 2008, PHYS REV B, V78, DOI 10.1103/PhysRevB.78.024414
   Shokef Y, 2009, PHYS REV LETT, V102, DOI 10.1103/PhysRevLett.102.048303
   STONER EC, 1948, PHILOS TR R SOC S-A, V240, P599, DOI 10.1098/rsta.1948.0007
   Stoycheva AD, 2000, PHYS REV LETT, V84, P4657, DOI 10.1103/PhysRevLett.84.4657
   Tudosa I, 2012, APPL PHYS LETT, V100, DOI 10.1063/1.3692574
   Ulbrich TC, 2010, PHYS REV B, V81, DOI 10.1103/PhysRevB.81.054421
   Ulbrich TC, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.077202
   Wang RF, 2006, NATURE, V439, P303, DOI 10.1038/nature04447
   WANNIER GH, 1973, PHYS REV B, V7, P5017, DOI 10.1103/PhysRevB.7.5017
   WANNIER GH, 1950, PHYS REV, V79, P357, DOI 10.1103/PhysRev.79.357
   Yan LL, 2007, COLLOID SURFACE A, V296, P123, DOI 10.1016/j.colsurfa.2006.09.034
   Zhang S, 2012, PHYS REV LETT, V109, DOI 10.1103/PhysRevLett.109.087201
NR 61
TC 8
Z9 8
U1 7
U2 43
PU AMER PHYSICAL SOC
PI COLLEGE PK
PA ONE PHYSICS ELLIPSE, COLLEGE PK, MD 20740-3844 USA
SN 1098-0121
EI 1550-235X
J9 PHYS REV B
JI Phys. Rev. B
PD MAY 19
PY 2014
VL 89
IS 17
AR 174421
DI 10.1103/PhysRevB.89.174421
PG 13
WC Physics, Condensed Matter
SC Physics
GA AO4LD
UT WOS:000341308600003
ER

PT J
AU Arrayangkool, A
   Warisarn, C
   Kovintavewat, P
AF Arrayangkool, A.
   Warisarn, C.
   Kovintavewat, P.
TI A constructive inter-track interference coding scheme for bit-patterned
   media recording system
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article; Proceedings Paper
CT 58th Annual Conference on Magnetism and Magnetic Materials
CY NOV 04-08, 2013
CL Denver, CO
AB The inter-track interference (ITI) can severely degrade the system performance of bit-patterned media recording (BPMR). One way to alleviate the ITI effect is to encode an input data sequence before recording to avoid some data patterns that easily cause an error at the data detection process. This paper proposes a constructive ITI (CITI) coding scheme for a multi-track multi-head BPMR system to eliminate the data patterns that lead to severe ITI. Numerical results indicate that the system with CITI coding outperforms that without CITI coding, especially when an areal density (AD) is high and/or the position jitter is large. Specifically, for the system without position jitter at bit-error rate of 10(-4), the proposed scheme can provide about 3 dB gain at the AD of 2.5 Tb/in.(2) over the system without CITI coding. (C) 2014 AIP Publishing LLC.
C1 [Arrayangkool, A.; Warisarn, C.] King Mongkuts Inst Technol Ladkrabang, Coll Data Storage Innovat, Bangkok 10520, Thailand.
   [Kovintavewat, P.] Nakhon Pathom Rajabhat Univ, Data Storage Technol Res Ctr, Nakhon Pathom 73000, Thailand.
RP Kovintavewat, P (reprint author), Nakhon Pathom Rajabhat Univ, Data Storage Technol Res Ctr, Nakhon Pathom 73000, Thailand.
EM piya@npru.ac.th
FU College of Data Storage Innovation, King Mongkut's Institute of
   Technology Ladkrabang Research Fund; Nakhon Pathom Rajabhat University
FX This work was supported by College of Data Storage Innovation, King
   Mongkut's Institute of Technology Ladkrabang Research Fund, and partly
   by Nakhon Pathom Rajabhat University.
CR Arrayangkool A., 2013, P ECTI CON 2013, P126
   Deza M.M., 2009, ENCY DISTANCES, P94
   Groenland JPJ, 2007, IEEE T MAGN, V43, P2307, DOI 10.1109/TMAG.2007.893137
   Karakulak S, 2010, IEEE T MAGN, V46, P3639, DOI 10.1109/TMAG.2010.2049116
   Kim J, 2010, JPN J APPL PHYS, V49, DOI 10.1143/JJAP.49.08KB04
   NABAVI S, 2007, P IEEE INT C COMM IC, P6249
   Nabavi S, 2009, IEEE T MAGN, V45, P3523, DOI 10.1109/TMAG.2009.2022493
   Shao XY, 2011, IEEE T MAGN, V47, P2559, DOI 10.1109/TMAG.2011.2157668
NR 8
TC 4
Z9 4
U1 2
U2 6
PU AMER INST PHYSICS
PI MELVILLE
PA 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
SN 0021-8979
EI 1089-7550
J9 J APPL PHYS
JI J. Appl. Phys.
PD MAY 7
PY 2014
VL 115
IS 17
AR 17B703
DI 10.1063/1.4855955
PG 3
WC Physics, Applied
SC Physics
GA AG8BO
UT WOS:000335643700232
ER

PT J
AU Hara, A
   Muraoka, H
AF Hara, Akihiro
   Muraoka, Hiroaki
TI Jitter noise reduction by improving grain uniformity in granular media
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article; Proceedings Paper
CT 58th Annual Conference on Magnetism and Magnetic Materials
CY NOV 04-08, 2013
CL Denver, CO
ID BIT PATTERNED MEDIA
AB The relationship between jitter noise and the magnetic microstructure of recording media was investigated with Voronoi modeling. To maintain thermal stability, the average grain size was assumed to be constant. Two microstructural irregularities were investigated quantitatively: Grain size deviation and grain location deviation. By improving both grain uniformities, the jitter noise was significantly reduced. Even a slight improvement in the grain size and location deviations brings an effective reduction in jitter noise. Grain growth control during granular media fabrication will improve the jitter noise and, therefore, enable high areal density recording. (C) 2014 AIP Publishing LLC.
C1 [Hara, Akihiro; Muraoka, Hiroaki] Tohoku Univ, RIEC, Aoba Ku, Sendai, Miyagi 9808577, Japan.
RP Hara, A (reprint author), Tohoku Univ, RIEC, Aoba Ku, 2-1-1 Katahira, Sendai, Miyagi 9808577, Japan.
EM hara@riec.tohoku.ac.jp
FU MEXT; Japanese Government; Storage Research Consortium (SRC)
FX This work was partly supported by MEXT, Japanese Government, and Storage
   Research Consortium (SRC).
CR Bertram H. N., 1994, THEORY MAGNETIC RECO
   Hogg CR, 2010, IEEE T MAGN, V46, P2307, DOI 10.1109/TMAG.2010.2040145
   Kamata Y, 2011, IEEE T MAGN, V47, P51, DOI 10.1109/TMAG.2010.2077274
   Karlqvist O., 1954, T ROY I TECH STOCKHO, V86, P3
   Miura K, 2005, J MAGN MAGN MATER, V287, P133, DOI 10.1016/j.jmmm.2004.10.021
   Muraoka H, 2011, IEEE T MAGN, V47, P26, DOI 10.1109/TMAG.2010.2080354
   Valcu BF, 2010, IEEE T MAGN, V46, P2160, DOI 10.1109/TMAG.2010.2042794
NR 7
TC 1
Z9 1
U1 0
U2 0
PU AMER INST PHYSICS
PI MELVILLE
PA 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
SN 0021-8979
EI 1089-7550
J9 J APPL PHYS
JI J. Appl. Phys.
PD MAY 7
PY 2014
VL 115
IS 17
AR 17B730
DI 10.1063/1.4866396
PG 3
WC Physics, Applied
SC Physics
GA AG8BO
UT WOS:000335643700259
ER

PT J
AU Hasegawa, T
   Yamazaki, T
   Kondo, Y
   Ishio, S
AF Hasegawa, T.
   Yamazaki, T.
   Kondo, Y.
   Ishio, S.
TI Fabrication of dot pattern using magnetic phase change on Pt
   ion-implanted L1(0) FePtRh film with high magnetocrystalline anisotropy
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article; Proceedings Paper
CT 58th Annual Conference on Magnetism and Magnetic Materials
CY NOV 04-08, 2013
CL Denver, CO
ID IRRADIATION; MEDIA
AB Phase change from ferromagnetic to nonmagnetic phase by ion implantation was investigated for bit patterning. An antiferromagnetic L1(0) FePt0.64Rh0.36 film was implanted with Pt ions at 6.0 x 10(15) ions/cm(2) in order to control its magnetic properties. The film changed to a ferromagnetic one, with the (001) crystalline texture being normal to the film plane and a magnetocrystalline anisotropy of 2.3 x 10(7) erg/cm(3) in the perpendicular direction. Using this magnetic phase change, a planar dot pattern was fabricated. The average height between the dots and the spacing was 0.35 nm, and ferromagnetic dots 50 nm in diameter were observed. (C) 2014 AIP Publishing LLC.
C1 [Hasegawa, T.; Yamazaki, T.; Ishio, S.] Akita Univ, Dept Mat Sci & Engn, Akita 0108502, Japan.
   [Kondo, Y.] Akita Ind Technol Ctr AIT, Akita 0108502, Japan.
RP Hasegawa, T (reprint author), Akita Univ, Dept Mat Sci & Engn, 1-1 Tegata Gakuen Machi, Akita 0108502, Japan.
EM takashi@gipc.akita-u.ac.jp
OI Hasegawa, Takashi/0000-0002-8178-4980
FU Industrial Technology Research Grant Program from the New Energy and
   Industrial Technology Development Organization (NEDO), Japan [11B07008d]
FX This work was supported by the Industrial Technology Research Grant
   Program in 2011 (ID: 11B07008d) from the New Energy and Industrial
   Technology Development Organization (NEDO), Japan.
CR Abes M, 2006, MAT SCI ENG B-SOLID, V126, P207, DOI 10.1016/j.mseb.2005.09.030
   Bublat T, 2011, NANOTECHNOLOGY, V22, DOI 10.1088/0957-4484/22/31/315301
   Chappert C, 1998, SCIENCE, V280, P1919, DOI 10.1126/science.280.5371.1919
   Gaur N, 2013, SCI REP-UK, V3, DOI 10.1038/srep01907
   Hasegawa T, 2006, J APPL PHYS, V99, DOI 10.1063/1.2177382
   Hasegawa T, 2012, J APPL PHYS, V111, DOI 10.1063/1.3673421
   Hasegawa T, 2011, J APPL PHYS, V109, DOI 10.1063/1.3537947
   Hasegawa T, 2009, J APPL PHYS, V106, DOI 10.1063/1.3261839
   Hasegawa T, 2008, ACTA MATER, V56, P1564, DOI 10.1016/j.actamat.2007.12.008
   Hasegawa T, 2013, IEEE T MAGN, V49, P3604, DOI 10.1109/TMAG.2013.2245305
   Ishio S, 2012, J MAGN MAGN MATER, V324, P295, DOI 10.1016/j.jmmm.2010.12.014
   Kato T, 2009, J APPL PHYS, V105, DOI 10.1063/1.3072024
   Narisawa T, 2011, J APPL PHYS, V109, DOI 10.1063/1.3544407
   SHARROCK MP, 1994, J APPL PHYS, V76, P6413, DOI 10.1063/1.358282
   Terris BD, 1999, APPL PHYS LETT, V75, P403, DOI 10.1063/1.124389
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Yamane H, 2010, J APPL PHYS, V108, DOI 10.1063/1.3514081
   Yan ZJ, 2012, J MAGN MAGN MATER, V324, P3737, DOI 10.1016/j.jmmm.2012.06.006
NR 18
TC 2
Z9 3
U1 0
U2 7
PU AMER INST PHYSICS
PI MELVILLE
PA 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
SN 0021-8979
EI 1089-7550
J9 J APPL PHYS
JI J. Appl. Phys.
PD MAY 7
PY 2014
VL 115
IS 17
AR 17B721
DI 10.1063/1.4864744
PG 3
WC Physics, Applied
SC Physics
GA AG8BO
UT WOS:000335643700250
ER

PT J
AU Kita, E
   Suzuki, KZ
   Liu, Y
   Utsumi, Y
   Morishita, J
   Oshima, D
   Kato, T
   Niizeki, T
   Mibu, K
   Yanagihara, H
AF Kita, Eiji
   Suzuki, Kazuya Z.
   Liu, Yang
   Utsumi, Yuji
   Morishita, Jumpei
   Oshima, Daiki
   Kato, Takeshi
   Niizeki, Tomohiko
   Mibu, Ko
   Yanagihara, Hideto
TI Magnetization control for bit pattern formation of spinel ferromagnetic
   oxides by Kr ion implantation
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article; Proceedings Paper
CT 58th Annual Conference on Magnetism and Magnetic Materials
CY NOV 04-08, 2013
CL Denver, CO
ID MEDIA
AB As a first step toward the development of bit-patterned magnetic media made of oxides, we investigated the effectiveness of magnetism control by Kr implantation in a typical spinel ferromagnetic oxide, Fe3O4. We implanted Kr ions accelerated at 30 kV on 13-nm-thick Fe3O4 thin films at dosages of (1-40) x 10(14) ions/cm(2). Magnetization decreased with increase in ion dosages and disappeared when irradiation was greater than 2 x 10(15) ions/cm(2) of Kr ions. These dosages are more than ten times smaller than that used in the N-2 implantation for metallic and oxide ferromagnets. Both the temperature dependence of magnetization and the Mossbauer study suggest that the transition of Fe3O4 from ferromagnetic to paramagnetic took place sharply due to Kr ion irradiation, which produces two-phase separation-ferromagnetic and nonmagnetic with insufficient dosage of Kr ions. (C) 2014 AIP Publishing LLC.
C1 [Kita, Eiji; Suzuki, Kazuya Z.; Liu, Yang; Utsumi, Yuji; Morishita, Jumpei; Niizeki, Tomohiko; Yanagihara, Hideto] Univ Tsukuba, Inst Appl Phys, Tsukuba, Ibaraki 3058573, Japan.
   [Oshima, Daiki; Kato, Takeshi] Nagoya Univ, Dept Quantum Engn, Chikusa Ku, Nagoya, Aichi 4648603, Japan.
   [Mibu, Ko] Nagoya Inst Technol, Grad Sch Engn, Nagoya, Aichi 4668555, Japan.
RP Kita, E (reprint author), Univ Tsukuba, Inst Appl Phys, Tsukuba, Ibaraki 3058573, Japan.
EM kita@bk.tsukuba.ac.jp
RI Mibu, Ko/E-2277-2014; Kato, Takeshi/I-2654-2013; Suzuki,
   Kazuya/P-6171-2014
OI Mibu, Ko/0000-0002-6416-1028; 
FU Element Science and Technology Project, MEXT, Japan
FX The authors would like to express their thanks to Professor J. Inoue and
   Dr. A. Kikitsu for fruitful discussions. We would also like to thank Dr.
   Takahashi, Dr. Furubayashi, and Dr. Mitani at National Institute of
   Materials Science for help with the magnetization measurements. Kr ion
   irradiation was performed at Nagoya University with the support of
   Nanotechnology Platform. Mossbauer studies were performed at Tandem
   Accelerator Complex, University of Tsukuba. This work was supported by
   the Element Science and Technology Project, MEXT, Japan.
CR Fassbender J, 2008, J MAGN MAGN MATER, V320, P579, DOI 10.1016/j.jmmm.2007.07.032
   Hinoue T, 2011, J APPL PHYS, V109, DOI 10.1063/1.3556777
   Kato T, 2009, J APPL PHYS, V105, DOI 10.1063/1.3072024
   Kikitsu A, 2009, J MAGN MAGN MATER, V321, P526, DOI 10.1016/j.jmmm.2008.05.039
   Kim S, 2012, NAT NANOTECHNOL, V7, P567, DOI [10.1038/nnano.2012.125, 10.1038/NNANO.2012.125]
   Kita E, 2014, JPN J APPL PHYS, V53, DOI 10.7567/JJAP.53.020306
   Niizeki T, 2014, APPL PHYS LETT, V104, DOI 10.1063/1.4864102
   Niizeki T, 2013, APPL PHYS LETT, V103, DOI 10.1063/1.4824761
   Oshima D, 2013, IEEE T MAGN, V49, P3608, DOI 10.1109/TMAG.2013.2249501
   Sato K, 2010, J APPL PHYS, V107, DOI 10.1063/1.3431529
   Takahashi YK, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3318297
   Terris BD, 2009, J MAGN MAGN MATER, V321, P512, DOI 10.1016/j.jmmm.2008.05.046
   Yanagihara H, 2014, J PHYS D APPL PHYS, V47, DOI 10.1088/0022-3727/47/12/129501
   Yanagihara H, 2013, J PHYS D APPL PHYS, V46, DOI 10.1088/0022-3727/46/17/175004
   Yuasa S, 2007, J PHYS D APPL PHYS, V40, pR337, DOI 10.1088/0022-3727/40/21/R01
NR 15
TC 0
Z9 0
U1 0
U2 4
PU AMER INST PHYSICS
PI MELVILLE
PA 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
SN 0021-8979
EI 1089-7550
J9 J APPL PHYS
JI J. Appl. Phys.
PD MAY 7
PY 2014
VL 115
IS 17
AR 17B907
DI 10.1063/1.4868704
PG 3
WC Physics, Applied
SC Physics
GA AG8BO
UT WOS:000335643700290
ER

PT J
AU Kong, G
   Choi, S
AF Kong, Gyuyeol
   Choi, Sooyong
TI A new read channel architecture using a staggered pattern for bit
   patterned media recording
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article; Proceedings Paper
CT 58th Annual Conference on Magnetism and Magnetic Materials
CY NOV 04-08, 2013
CL Denver, CO
ID PERFORMANCE; SYSTEM
AB A new read channel architecture achieving diversity effects for bit patterned magnetic recording is proposed in this paper. In the proposed channel architecture, a new channel model generating several different channels for the desired symbols and the diversity achieving detection schemes are proposed to obtain performance gains with a simple structure. By using the proposed channel model, M different channels for the M desired symbols can be generated from the M reading operations and then M different channels can be exploited to obtain spatial diversity gains with the diversity achieving detection schemes. For the diversity achieving detection schemes, a single-track interference cancellation scheme is proposed based on ordered successive interference cancellation algorithm. To consider interference from the side-tracks, a multi-track interference cancellation (MTIC) scheme is also proposed. Simulation results show that the MTIC scheme with a simpler structure yields more than 1.5 dB gains over the conventional schemes when an areal density is 3 Tb/in(2). (C) 2014 AIP Publishing LLC.
C1 [Kong, Gyuyeol; Choi, Sooyong] Yonsei Univ, Sch Elect & Elect Engn, Seoul 120749, South Korea.
RP Kong, G (reprint author), Yonsei Univ, Sch Elect & Elect Engn, Sinchon Dong 134, Seoul 120749, South Korea.
EM gykong@yonsei.ac.kr; csyong@yonsei.ac.kr
CR Alamouti SM, 1998, IEEE J SEL AREA COMM, V16, P1451, DOI 10.1109/49.730453
   Artes H, 2003, IEEE T SIGNAL PROCES, V51, P2808, DOI 10.1109/TSP.2003.818210
   Chang W, 2010, IEEE T MAGN, V46, P3899, DOI 10.1109/TMAG.2010.2056926
   Damen MO, 2003, IEEE T INFORM THEORY, V49, P2389, DOI 10.1109/TIT.2003.817444
   Karakulak S, 2010, IEEE T MAGN, V46, P3639, DOI 10.1109/TMAG.2010.2049116
   Kim J, 2011, IEEE T MAGN, V47, P594, DOI 10.1109/TMAG.2010.2100371
   Kim N, 2008, IEEE T WIREL COMMUN, V7, P4474, DOI 10.1109/T-WC.2008.070785
   Nabavi S, 2008, IEEE T MAGN, V44, P3789, DOI 10.1109/TMAG.2008.2002387
   Ng Y, 2012, IEEE T MAGN, V48, P1976, DOI 10.1109/TMAG.2011.2181183
   Nutter PW, 2005, IEEE T MAGN, V41, P4327, DOI 10.1109/TMAG.2005.856586
   Wolniansky P. W., 1998, P URSI INT S SIGN SY, P295, DOI DOI 10.1109/ISSSE.1998.738086
   Xie ND, 2008, IEEE T MAGN, V44, P4784, DOI 10.1109/TMAG.2008.2004380
NR 12
TC 0
Z9 0
U1 0
U2 2
PU AMER INST PHYSICS
PI MELVILLE
PA 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
SN 0021-8979
EI 1089-7550
J9 J APPL PHYS
JI J. Appl. Phys.
PD MAY 7
PY 2014
VL 115
IS 17
AR 17B746
DI 10.1063/1.4867344
PG 3
WC Physics, Applied
SC Physics
GA AG8BO
UT WOS:000335643700275
ER

PT J
AU Kovacs, A
   Oezelt, H
   Bance, S
   Fischbacher, J
   Gusenbauer, M
   Reichel, F
   Exl, L
   Schrefl, T
   Schabes, ME
AF Kovacs, A.
   Oezelt, H.
   Bance, S.
   Fischbacher, J.
   Gusenbauer, M.
   Reichel, F.
   Exl, L.
   Schrefl, T.
   Schabes, M. E.
TI Numerical optimization of writer geometries for bit patterned magnetic
   recording
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article; Proceedings Paper
CT 58th Annual Conference on Magnetism and Magnetic Materials
CY NOV 04-08, 2013
CL Denver, CO
ID MEDIA
AB A fully-automated pole-tip shape optimization tool, involving write head geometry construction, meshing, micromagnetic simulation, and evaluation, is presented. Optimizations have been performed for three different writing schemes (centered, staggered, and shingled) for an underlying bit patterned media with an areal density of 2.12 Tdots/in.(2). Optimizations were performed for a single-phase media with 10nm thickness and a mag spacing of 8 nm. From the computed write field and its gradient and the minimum energy barrier during writing for islands on the adjacent track, the overall write error rate is computed. The overall write errors are 0.7, 0.08, and 2: 8 x 10(-5) for centered writing, staggered writing, and shingled writing. (C) 2014 AIP Publishing LLC.
C1 [Kovacs, A.; Oezelt, H.; Bance, S.; Fischbacher, J.; Gusenbauer, M.; Reichel, F.; Exl, L.; Schrefl, T.] St Poelten Univ Appl Sci, A-3100 St Polten, Austria.
   [Schabes, M. E.] HGST, San Jose, CA USA.
RP Kovacs, A (reprint author), St Poelten Univ Appl Sci, Matthias Corvinus Str 15, A-3100 St Polten, Austria.
EM alexander.kovacs@fhstp.ac.at
OI Exl, Lukas/0000-0002-5343-6938; Ozelt, Harald/0000-0002-3754-3565;
   Gusenbauer, Markus/0000-0002-3540-3964; Bance, Simon/0000-0002-4650-8366
FU ASTC IDEMA; Austrian Science Fund [I821-N16]
FX Work supported by ASTC IDEMA and the Austrian Science Fund (I821-N16).
CR Dean J, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2905292
   Dong Y, 2012, J APPL PHYS, V111, DOI 10.1063/1.3675152
   Fukuda H, 2012, IEEE T MAGN, V48, P3895, DOI 10.1109/TMAG.2012.2197813
   Muraoka Hiroaki, 2008, IEEE Transactions on Magnetics, V44, P3423, DOI 10.1109/TMAG.2008.2001654
   Muraoka H, 2011, IEEE T MAGN, V47, P26, DOI 10.1109/TMAG.2010.2080354
   Parasiliti F, 2012, IEEE T IND ELECTRON, V59, P2503, DOI 10.1109/TIE.2011.2171174
   Richter HJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2209179
   Schabes ME, 2008, J MAGN MAGN MATER, V320, P2880, DOI 10.1016/j.jmmm.2008.07.035
   Schrefl T, 2005, IEEE T MAGN, V41, P3064, DOI 10.1109/TMAG.2005.855227
   Wang LS, 2004, FINITE ELEM ANAL DES, V40, P879, DOI 10.1016/S0168-874X(03)00118-5
   Wood R, 2000, IEEE T MAGN, V36, P36, DOI 10.1109/20.824422
   Richter H., 2007, U. S. Patent, Patent No. [11/430,809, 11430809]
NR 12
TC 1
Z9 1
U1 1
U2 4
PU AMER INST PHYSICS
PI MELVILLE
PA 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
SN 0021-8979
EI 1089-7550
J9 J APPL PHYS
JI J. Appl. Phys.
PD MAY 7
PY 2014
VL 115
IS 17
AR 17B704
DI 10.1063/1.4859055
PG 3
WC Physics, Applied
SC Physics
GA AG8BO
UT WOS:000335643700233
ER

PT J
AU Tobing, LYM
   Tjahjana, L
   Zhang, DH
AF Tobing, Landobasa Y. M.
   Tjahjana, Liliana
   Zhang, Dao Hua
TI Sub-10-nm Size and Sub-40-nm Pitch Metal Dot Patterning for Low-Cost Bit
   Patterned Media Application
SO IEEE TRANSACTIONS ON NANOTECHNOLOGY
LA English
DT Article
DE Bit patterned media (BPM); electron beam lithography (EBL);
   nanofabrication; sonicated cold development; sub-15-nm metal dots
ID ELECTRON-BEAM LITHOGRAPHY; BLOCK-COPOLYMERS; FABRICATION;
   POLY(METHYLMETHACRYLATE); REGISTRATION; RESOLUTION; DENSITY; ARRAYS
AB This paper presents the capability of sonicated cold development process for sub-40-nm pitch metal dots patterning with potentially similar to 100 times shorter writing time, where lift-off pattern transfer of similar to 10-nm-sized metal dots at pitch as short as similar to 34 nm from 110-nm-thick positive-tone resist is demonstrated with good repeatability. Strategies to achieve sub-30-nm pitch are also discussed based on overlay nanofabrication approaches, which we believe could pave the way toward cost-effective 1 Tbit/in(2) bit-patterned-media patterning.
C1 [Tobing, Landobasa Y. M.; Tjahjana, Liliana] Nanyang Technol Univ, Dept Microelect, Singapore 639798, Singapore.
   [Zhang, Dao Hua] Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore.
RP Tobing, LYM (reprint author), Nanyang Technol Univ, Dept Microelect, Singapore 639798, Singapore.
EM ltobing@ntu.edu.sg; liliana_tjahjana@pmail.ntu.edu.sg;
   edhzhang@ntu.edu.sg
FU A*STAR, Singapore [0921540099, 1220703063]; National Research
   Foundation, Singapore [NRF-G-CRP 2007-01]
FX This work was supported in part by A*STAR, Singapore, under Grant
   0921540099 and Grant 1220703063, and previously in part by the National
   Research Foundation, Singapore (NRF-G-CRP 2007-01). L. Y. M. Tobing and
   L. Tjahjana contributed equally in this paper. The review of this paper
   was arranged by Associate Editor E. T. Yu.
CR Black CT, 2004, IEEE T NANOTECHNOL, V3, P412, DOI 10.1109/TNANO.2004.834160
   Carcenac F, 2000, MICROELECTRON ENG, V53, P163, DOI 10.1016/S0167-9317(00)00287-2
   Chao WL, 2008, P SOC PHOTO-OPT INS, V6883, P88309, DOI 10.1117/12.768878
   Chao W, 2009, OPT EXPRESS, V17, P17669, DOI 10.1364/OE.17.017669
   Cheng JY, 2008, ADV MATER, V20, P3155, DOI 10.1002/adma.200800826
   Cheng JY, 2006, ADV MATER, V18, P597, DOI 10.1002/adma.200501936
   Cheng JY, 2003, ADV MATER, V15, P1599, DOI 10.1002/adma.200305244
   Choi C, 2012, JOM-US, V64, P1165, DOI 10.1007/s11837-012-0440-z
   Cord B, 2007, J VAC SCI TECHNOL B, V25, P2013, DOI 10.1116/1.2799978
   Dai CA, 2006, J CRYST GROWTH, V288, P128, DOI 10.1016/j.jcrysgro.2005.12.055
   Kiravittaya S, 2009, REP PROG PHYS, V72, DOI 10.1088/0034-4885/72/4/046502
   Kundu S., 2012, SCI REP, V2, P1
   Linden S, 2004, SCIENCE, V306, P1351, DOI 10.1126/science.1105371
   Manfrinato VR, 2013, NANOTECHNOLOGY, V24, DOI 10.1088/0957-4484/24/12/125302
   Martin-Sanchez J, 2009, ACS NANO, V3, P1513, DOI 10.1021/nn9001566
   Mela P, 2007, SMALL, V3, P1368, DOI 10.1002/smll.200600338
   Mohammad M. A., 2011, NANOFABRICATION
   Ocola LE, 2006, J VAC SCI TECHNOL B, V24, P3061, DOI 10.1116/1.2366698
   Okada T, 2011, JPN J APPL PHYS, V50, DOI 10.1143/JJAP.50.126502
   Park S, 2009, SCIENCE, V323, P1030, DOI 10.1126/science.1168108
   Ross C, 2001, ANN REV MATER RES, V31, P203, DOI 10.1146/annurev.matsci.31.1.203
   Shin K, 2002, NANO LETT, V2, P933, DOI 10.1021/nl0256560
   Tjahjana L, 2010, NANOTECHNOLOGY, V21, DOI 10.1088/0957-4484/21/19/195305
   Tobing LYM, 2013, NANOTECHNOLOGY, V24, DOI 10.1088/0957-4484/24/7/075303
   Tobing LYM, 2012, J VAC SCI TECHNOL B, V30, DOI 10.1116/1.4739053
   Tobing L. Y. M., 2013, SCI REP, V3, P1
   Vazquez-Mena O, 2011, ACS NANO, V5, P844, DOI 10.1021/nn1019253
   Xiao SG, 2009, ADV MATER, V21, P2516, DOI 10.1002/adma.200802087
   Yan M, 2008, J VAC SCI TECHNOL B, V26, P2306, DOI 10.1116/1.3002562
   Yang JKW, 2011, NANOTECHNOLOGY, V22, DOI 10.1088/0957-4484/22/38/385301
   Yang X, 2007, J VAC SCI TECHNOL B, V25, P2202, DOI 10.1116/1.2798711
   Yang XM, 2009, ACS NANO, V3, P1844, DOI 10.1021/nn900073r
NR 32
TC 5
Z9 5
U1 5
U2 14
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 1536-125X
EI 1941-0085
J9 IEEE T NANOTECHNOL
JI IEEE Trans. Nanotechnol.
PD MAY
PY 2014
VL 13
IS 3
BP 496
EP 501
DI 10.1109/TNANO.2014.2307574
PG 6
WC Engineering, Electrical & Electronic; Nanoscience & Nanotechnology;
   Materials Science, Multidisciplinary; Physics, Applied
SC Engineering; Science & Technology - Other Topics; Materials Science;
   Physics
GA AH4IQ
UT WOS:000336091000015
ER

PT J
AU Kaushik, N
   Sharma, P
   Makino, A
   Tanaka, S
   Esashi, M
AF Kaushik, Neelam
   Sharma, Parmanand
   Makino, Akihiro
   Tanaka, Shuji
   Esashi, Masayoshi
TI Potential of Metallic Glass Thin Films as a Soft Magnetic Underlayer for
   L1(0) FePt-Based Recording Media
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT 21st Conference on Soft Magnetic Materials (SMM)
CY SEP 01-04, 2013
CL Budapest, HUNGARY
SP Hungarian Acad Sci, Wignet Ctr Phys, Inst Solid State Phys, IEEE Magnet Soc
DE Bit patterned media (BPM); inclined anisotropy media; L1(0) FePt;
   metallic glass thin film; soft magnetic underlayer (SMUL)
ID BIT-PATTERNED-MEDIA
AB We report on the use of metallic glass (FeHfNbYB) thin film as a soft magnetic underlayer for the fabrication of L1(0) FePt-based bit patterned recording media (BPM). Preferred oriented phase of L1(0) (111) FePt is obtained either by depositing it in situ on a heated soft magnetic metallic glass/SiO2/Si or at room temperature (FePt/metallic glass/SiO2/Si) followed by annealing at 400 degrees C-450 degrees C for 20 min. Fabrication of recoding bits of size similar to 2 mu m to 20 nm is demonstrated using electron beam lithography. Magnetic measurements on similar to 500 nm bit patterns show a narrow switching field (SF) distribution with SF of similar to 3 kOe. The ability to read/write this BPM is demonstrated with a commercial head in perpendicular geometry in a static tester. Results strongly suggest that the soft magnetic metallic glass thin films can solve the problem of writability in high anisotropy L1(0) FePt-based recording media.
C1 [Kaushik, Neelam; Esashi, Masayoshi] Tohoku Univ, WPI Adv Inst Mat Res, Sendai, Miyagi 9808577, Japan.
   [Sharma, Parmanand; Makino, Akihiro] Tohoku Univ, Inst Mat Res, Res & Dev Ctr Ultra High Efficiency Nanocrystalli, Sendai, Miyagi 9808577, Japan.
   [Tanaka, Shuji] Tohoku Univ, Grad Sch Engn, Sendai, Miyagi 9808579, Japan.
RP Kaushik, N (reprint author), Tohoku Univ, WPI Adv Inst Mat Res, Sendai, Miyagi 9808577, Japan.
EM neelam@mems.mech.tohoku.ac.jp
RI MAKINO, AKIHIRO/B-2549-2009; Sharma, Parmanand/C-1518-2011
CR Chang CH, 2002, IEEE T MAGN, V38, P1637, DOI 10.1109/TMAG.2002.1017748
   Goll D, 2013, PHYS STATUS SOLIDI A, V210, P1261, DOI 10.1002/pssa.201329017
   Honda N, 2011, PHYSCS PROC, V16, DOI 10.1016/j.phpro.2011.06.099
   Kaushik N., 2010, APPL PHYS LETT, V97
   Litvinov D, 2001, J MAGN MAGN MATER, V232, P84, DOI 10.1016/S0304-8853(01)00216-5
   Novak RL, 2004, J MAGN MAGN MATER, V272, P1557, DOI 10.1016/j.jmmm.2003.12.997
   Ouchi T, 2010, IEEE T MAGN, V46, P2224, DOI 10.1109/TMAG.2010.2040068
   Piramanayagam SN, 2013, IEEE T MAGN, V49, P758, DOI 10.1109/TMAG.2012.2226019
   Sharma P., 2007, NANOTECHNOLOGY, V18
   Sharma P., 2011, J APPL PHYS, V109
   Shima T, 2003, MATER TRANS, V44, P1508, DOI 10.2320/matertrans.44.1508
   Takenaka K, 2012, J MAGN MAGN MATER, V324, P1444, DOI 10.1016/j.jmmm.2011.12.009
   Wang Y., 2002, THESIS TOHOKU U SEND
   Wang Y., 2012, J PHYS CONDENS MATT, V24
   Zhang J., 2013, APPL PHYS LETT, V102
NR 15
TC 1
Z9 1
U1 0
U2 8
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD APR
PY 2014
VL 50
IS 4
AR 3201404
DI 10.1109/TMAG.2013.2285307
PN 1
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA AQ7XH
UT WOS:000343032900056
ER

PT J
AU Sharov, A
   Roth, RM
AF Sharov, Artyom
   Roth, Ron M.
TI Bounds and Constructions for Granular Media Coding
SO IEEE TRANSACTIONS ON INFORMATION THEORY
LA English
DT Article
DE Convex optimization; Gilbert-Varshamov bound; grain-correcting codes;
   granular media; lower bounds; magnetic recording; Markov chain; upper
   bounds
ID ERROR-CORRECTING CODES; BIT-PATTERNED MEDIA; CHANNELS; RATES
AB Bounds on the rates of grain-correcting codes are presented. The lower bounds are Gilbert-Varshamov-like ones, whereas the upper bounds improve on the previously known result by Mazumdar et al. Constructions of t-grain-correcting codes of length n for certain values of n and t are discussed. Finally, an infinite family of codes of rate approaching 1 that can detect an arbitrary number of grain errors is shown to exist.
C1 [Sharov, Artyom; Roth, Ron M.] Technion Israel Inst Technol, Dept Comp Sci, IL-32000 Haifa, Israel.
RP Sharov, A (reprint author), Technion Israel Inst Technol, Dept Comp Sci, IL-32000 Haifa, Israel.
EM sharov@cs.technion.ac.il; ronny@cs.technion.ac.il
FU Israel Science Foundation [1280/08, 1092/12]
FX This work was supported by the Israel Science Foundation under Grant
   1280/08 and Grant 1092/12. This paper was presented in part at the 2011
   IEEE International Symposium on Information Theory.
CR ABDELGHAFFAR KAS, 1991, IEEE T INFORM THEORY, V37, P789, DOI 10.1109/18.79948
   Cover T. M., 1991, ELEMENTS INFORM THEO
   CSISZAR I, 1987, IEEE T INFORM THEORY, V33, P788, DOI 10.1109/TIT.1987.1057385
   Feller W., 1968, INTRO PROBABILITY TH, VI
   Gantmacher F., 1960, MATRIX THEORY, V2
   Greaves S, 2010, IEEE T MAGN, V46, P1460, DOI 10.1109/TMAG.2010.2043221
   Iyengar AR, 2011, IEEE T MAGN, V47, P35, DOI 10.1109/TMAG.2010.2080667
   Jiang A., 2011, P IEEE INT S INF THE, P2333
   Kashyap N., 2013, P IEEE INT S INF THE, P1
   KIM WH, 1959, IRE T INFORM THEOR, V5, P62
   KOLESNIK VD, 1991, IEEE T INFORM THEORY, V37, P778, DOI 10.1109/18.79947
   KOLESNIK VD, 1994, IEEE T INFORM THEORY, V40, P1443, DOI 10.1109/18.333860
   KUZNETSOV AV, 1993, IEEE T INFORM THEORY, V39, P1444, DOI 10.1109/18.243467
   Luenberger D. G., 1973, INTRO LINEAR NONLINE
   MARCUS BH, 1992, IEEE T INFORM THEORY, V38, P1213, DOI 10.1109/18.144702
   Marcus B. H., 1998, HDB CODING THEORY
   Mazumdar A, 2011, IEEE T INFORM THEORY, V57, P7403, DOI 10.1109/TIT.2011.2158514
   Parry W., 1982, LECT NOTE SERIES, V67
   Rockafellar T., 1970, CONVEX ANAL
   SHAMAI S, 1991, IEEE T INFORM THEORY, V37, P863, DOI 10.1109/18.79953
   Tolhuizen LMGM, 1997, IEEE T INFORM THEORY, V43, P1605, DOI 10.1109/18.623158
   TSFASMAN MA, 1982, MATH NACHR, V109, P21, DOI 10.1002/mana.19821090103
   Wood R, 2009, IEEE T MAGN, V45, P917, DOI 10.1109/TMAG.2008.2010676
NR 23
TC 6
Z9 6
U1 0
U2 1
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9448
EI 1557-9654
J9 IEEE T INFORM THEORY
JI IEEE Trans. Inf. Theory
PD APR
PY 2014
VL 60
IS 4
BP 2010
EP 2027
DI 10.1109/TIT.2014.2301811
PG 18
WC Computer Science, Information Systems; Engineering, Electrical &
   Electronic
SC Computer Science; Engineering
GA AD2XG
UT WOS:000333099400002
ER

PT J
AU Ramazani, A
   Kashi, MA
   Montazer, AH
AF Ramazani, A.
   Kashi, M. Almasi
   Montazer, A. H.
TI Fabrication of single crystalline, uniaxial single domain Co nanowire
   arrays with high coercivity
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article
ID BIT-PATTERNED MEDIA; MAGNETIC-PROPERTIES; COBALT NANOWIRES; POROUS
   ALUMINA; ELECTRODEPOSITION; MICROSTRUCTURE; MICROSCOPY; DEPOSITION;
   ANISOTROPY; NANORODS
AB Whilst Co nanorods with high coercivity were synthesized during recent years, they did not achieve the same results as for Co nanowires embedded in solid templates. In the present work, Co nanowire arrays (NWAs) with high coercivity were successfully fabricated in porous aluminum oxide template under optimum conditions by using pulsed ac electrodeposition technique. Magnetic properties and crystalline characteristics of the nanowires were investigated by hysteresis loop measurements, first-order reversal curve (FORC) analysis, X-ray diffraction (XRD), and selected area electron diffraction (SAED) patterns. Hysteresis loop measurements showed high coercivity of about 4.8 kOe at room temperature together with optimum squareness of 1, resulting in an increase of the previous maximum coercivity for Co NWAs up to 45%. XRD and SAED patterns revealed a single crystalline texture along the [0002] direction, indicating the large magnetocrystalline anisotropy. On the other hand, FORC analysis confirmed a single domain structure for the Co NWAs. In addition, the reversal mechanism of the single crystalline, single domain Co NWAs was studied which resulted in the fixed easy axis with a coherent rotation. Accordingly, these nanowires might offer promising applications in high density bit patterned media and low power logic devices. (C) 2014 AIP Publishing LLC.
C1 [Ramazani, A.; Kashi, M. Almasi] Univ Kashan, Dept Phys, Kashan 8731751167, Iran.
   [Ramazani, A.; Kashi, M. Almasi; Montazer, A. H.] Univ Kashan, Inst Nanosci & Nanotechnol, Kashan 8731751167, Iran.
RP Ramazani, A (reprint author), Univ Kashan, Dept Phys, Kashan 8731751167, Iran.
EM rmzn@kashanu.ac.ir
RI Montazer, Amir Hassan/N-5850-2015
OI Montazer, Amir Hassan/0000-0003-0629-0259
FU University of Kashan [159023/17]
FX The authors thank University of Kashan for supporting this research
   under Grant No. 159023/17.
CR Alikhanzadeh-Arani S., 2012, CURR APPL PHYS, V13, P664
   Aryasomayajula A, 2007, THIN SOLID FILMS, V516, P397, DOI 10.1016/j.tsf.2007.07.002
   Augustine C, 2011, IEEE T NANOTECHNOL, V10, P778, DOI 10.1109/TNANO.2010.2079941
   Baik JM, 2008, J PHYS CHEM C, V112, P2252, DOI 10.1021/jp711621v
   Beron F, 2007, J APPL PHYS, V101, DOI 10.1063/1.2712172
   Cho JU, 2006, J MAGN MAGN MATER, V303, pE281, DOI 10.1016/j.jmmm.2006.01.082
   Ciuculescu D, 2009, CHEM MATER, V21, P3987, DOI 10.1021/cm901349y
   Darques M, 2005, APPL PHYS LETT, V86, DOI 10.1063/1.1866636
   Darques M, 2004, J PHYS D APPL PHYS, V37, P1411, DOI 10.1088/0022-3727/37/10/001
   Egli R., 2010, GEOCHEM GEOPHY GEOSY, V11, P1, DOI DOI 10.1029/2009GC002916
   Ghaffari M, 2013, J PHYS D APPL PHYS, V46, DOI 10.1088/0022-3727/46/29/295002
   Grobis MK, 2011, IEEE T MAGN, V47, P6, DOI 10.1109/TMAG.2010.2076798
   Han XH, 2009, J PHYS D APPL PHYS, V42, DOI 10.1088/0022-3727/42/9/095005
   Huang XH, 2008, J PHYS CHEM C, V112, P1468, DOI 10.1021/jp710106y
   Hwang M, 2000, J APPL PHYS, V87, P5108, DOI 10.1063/1.373264
   Imre A, 2006, SCIENCE, V311, P205, DOI 10.1126/science.1120506
   Kashi MA, 2007, J PHYS D APPL PHYS, V40, P4625, DOI 10.1088/0022-3727/40/15/040
   Kim C, 2007, APPL PHYS LETT, V91, DOI 10.1063/1.2802038
   Nielsch K, 2000, ADV MATER, V12, P582, DOI 10.1002/(SICI)1521-4095(200004)12:8<582::AID-ADMA582>3.0.CO;2-3
   Nielsch K, 2002, NANO LETT, V2, P677, DOI 10.1021/n1025537k
   Pan H, 2005, J PHYS CHEM B, V109, P3094, DOI 10.1021/jp0451997
   Proenca MP, 2013, NANOTECHNOLOGY, V24, DOI 10.1088/0957-4484/24/47/475703
   Ramazani A, 2007, J PHYS D APPL PHYS, V40, P5533, DOI 10.1088/0022-3727/40/18/003
   Ramazani A, 2012, J MAGN MAGN MATER, V324, P1826, DOI 10.1016/j.jmmm.2012.01.009
   Ren Y, 2011, J MATER SCI, V46, P7545, DOI 10.1007/s10853-011-5727-x
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Rittenberg DK, 2000, ADV MATER, V12, P126, DOI 10.1002/(SICI)1521-4095(200001)12:2<126::AID-ADMA126>3.0.CO;2-5
   Roy K, 2011, PHYS REV B, V83, DOI 10.1103/PhysRevB.83.224412
   Sellmyer DJ, 2001, J PHYS-CONDENS MAT, V13, pR433, DOI 10.1088/0953-8984/13/25/201
   Shaw JM, 2009, PHYS REV B, V79, DOI 10.1103/PhysRevB.79.184404
   Soulantica K, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3237157
   Soumare Y, 2008, J MATER CHEM, V18, P5696, DOI 10.1039/b810943e
   Soumare Y, 2009, ADV FUNCT MATER, V19, P1971, DOI 10.1002/adfm.200800822
   Sun L, 2005, IBM J RES DEV, V49, P79
   Viau G, 2009, PHYS STATUS SOLIDI A, V206, P663, DOI 10.1002/pssa.200881260
   Vidal F, 2012, PHYS REV LETT, V109, DOI 10.1103/PhysRevLett.109.117205
   Wang PP, 2008, J APPL PHYS, V104, DOI 10.1063/1.2975843
   WHITNEY TM, 1993, SCIENCE, V261, P1316, DOI 10.1126/science.261.5126.1316
   Zeng H, 2000, J APPL PHYS, V87, P4718, DOI 10.1063/1.373137
   Zhang XX, 2008, J CRYST GROWTH, V310, P3674, DOI 10.1016/j.jcrysgro.2008.05.016
NR 40
TC 10
Z9 10
U1 7
U2 67
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0021-8979
EI 1089-7550
J9 J APPL PHYS
JI J. Appl. Phys.
PD MAR 21
PY 2014
VL 115
IS 11
AR 113902
DI 10.1063/1.4868582
PG 7
WC Physics, Applied
SC Physics
GA AE3TM
UT WOS:000333900600028
ER

PT J
AU Zhang, H
   Hosaka, S
   Yin, Y
AF Zhang, Hui
   Hosaka, Sumio
   Yin, You
TI Ordering of self-assembled 5-nm-diameter poly(dimethylsiloxane) nanodots
   with sub-10nm pitch using ultra-narrow electron-beam-drawn guide lines
   and three-dimensional control
SO APPLIED PHYSICS LETTERS
LA English
DT Article
ID BIT-PATTERNED MEDIA; BLOCK-COPOLYMER PATTERNS; LITHOGRAPHY; RESOLUTION;
   BEHAVIOR; SYSTEMS; ARRAYS; DOT
AB We demonstrate the possibility of forming long-range ordered self-assembled arrays of 5-nm-diameter nanodots with pitch of 10 x 7.5 nm(2) using guide line templates and low molecular weight (MW) (4700-1200 g/mol) poly(styrene)-poly(dimethylsiloxane) (PS-PDMS) for application in ultrahigh density patterned magnetic recording media. We propose a three-dimensional control which involves control of the height of the guide lines, the thickness of the PS-PDMS films, and the gap between the guide lines in order to produce 5-nm-diameter, sub-10 nm pitched nanodots with long-range order along the guide lines. Adopting a 13-nm-thick PS-PDMS film and 14-nm-high resist guide lines, the 5-nm-diameter and 10 x 7.5 nm(2) -pitched self-assembled nanodots were ordered in 4-7 dot arrays with long-range order. The experimental results demonstrate that the method is suitable for the production of patterned media with magnetic recording densities of 8.6 Tbit/in.(2) using low MW PS-PDMS and slim guide lines. (C) 2014 AIP Publishing LLC.
C1 [Zhang, Hui] Gunma Univ, Human Resources Cultivat Ctr, Kiryu, Gunma 3768515, Japan.
   [Hosaka, Sumio; Yin, You] Gunma Univ, Fac Sci & Technol, Div Elect & Informat, Kiryu, Gunma 3768515, Japan.
RP Zhang, H (reprint author), Gunma Univ, Human Resources Cultivat Ctr, 1-5-1 Tenjin, Kiryu, Gunma 3768515, Japan.
EM t10802275@gunma-u.ac.jp
FU Ministry of Education, Culture, Sports, Science and Technology of Japan
   [24686042, 21710135, 24360003]; JST Sentan Grant [H24 sentan 181-25];
   JST A-step
FX This work was financially supported by Grant-in-Aid for Young Scientists
   and Grant-in-Aid for Scientific Research from the Ministry of Education,
   Culture, Sports, Science and Technology of Japan (Nos. 24686042,
   21710135, and 24360003), and JST Sentan Grant No. H24 sentan 181-25 and
   JST A-step.
CR bin Mohamad Z, 2008, NANOTECHNOLOGY, V19, DOI 10.1088/0957-4484/19/02/025301
   Bita I, 2008, SCIENCE, V321, P939, DOI 10.1126/science.1159352
   Chang JB, 2012, ACS NANO, V6, P2071, DOI 10.1021/nn203767s
   Hellwig O, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3293301
   Horvat A, 2004, J CHEM PHYS, V120, P1117, DOI 10.1063/1.1627325
   Hosaka S, 2008, MICROELECTRON ENG, V85, P774, DOI 10.1016/j.mee.2007.12.081
   Hosaka S, 2011, MICROELECTRON ENG, V88, P2571, DOI 10.1016/j.mee.2011.01.005
   Hosaka S, 2010, JPN J APPL PHYS, V49, DOI 10.1143/JJAP.49.046503
   Huda M, 2012, JPN J APPL PHYS, V51, DOI 10.1143/JJAP.51.06FF10
   Jeong JW, 2012, ADV MATER, V24, P3526, DOI 10.1002/adma.201200356
   Jung YS, 2010, NANO LETT, V10, P1000, DOI 10.1021/nl904141r
   Jung YS, 2009, ADV MATER, V21, P2540, DOI 10.1002/adma.200802855
   Kihara N, 2012, J VAC SCI TECHNOL B, V30, DOI 10.1116/1.4763356
   Kikitsu A, 2009, J MAGN MAGN MATER, V321, P526, DOI 10.1016/j.jmmm.2008.05.039
   Kim SO, 2003, NATURE, V424, P411, DOI 10.1038/nature01775
   Knoll A, 2002, PHYS REV LETT, V89, DOI 10.1103/PhysRevLett.89.035501
   Koga T, 2006, CHEM ENG SCI, V61, P2161, DOI 10.1016/j.ces.2004.11.069
   Koga T, 2005, EUR PHYS J E, V17, P381, DOI 10.1140/epje/i2003-10163-x
   Komori T, 2012, JPN J APPL PHYS, V51, DOI 10.1143/JJAP.51.06FB02
   Lazzari M, 2003, ADV MATER, V15, P1583, DOI 10.1002/adma.200300382
   LEIBLER L, 1980, MACROMOLECULES, V13, P1602, DOI 10.1021/ma60078a047
   Nam SW, 2009, J VAC SCI TECHNOL B, V27, P2635, DOI 10.1116/1.3245991
   OHTA T, 1986, MACROMOLECULES, V19, P2621, DOI 10.1021/ma00164a028
   Park WI, 2012, SMALL, V8, P3762, DOI 10.1002/smll.201201407
   Richter HJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2209179
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Sakurai M., 2002, TOSHIBA REV, V57, P52
   Semenov A. N., 1985, Soviet Physics - JETP, V61, P733
   Takenaka M, 2010, J POLYM SCI POL PHYS, V48, P2297, DOI 10.1002/polb.22115
   Wood R, 2009, J MAGN MAGN MATER, V321, P555, DOI 10.1016/j.jmmm.2008.07.027
   Yang X, 2007, J VAC SCI TECHNOL B, V25, P2202, DOI 10.1116/1.2798711
   Zhang H, 2013, JPN J APPL PHYS, V52, DOI 10.7567/JJAP.52.126504
NR 32
TC 0
Z9 0
U1 2
U2 25
PU AMER INST PHYSICS
PI MELVILLE
PA 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
SN 0003-6951
EI 1077-3118
J9 APPL PHYS LETT
JI Appl. Phys. Lett.
PD MAR 3
PY 2014
VL 104
IS 9
AR 093107
DI 10.1063/1.4867981
PG 4
WC Physics, Applied
SC Physics
GA AC7RL
UT WOS:000332729200088
ER

PT J
AU Asbahi, M
   Lim, KTP
   Wang, FK
   Lin, MY
   Chan, KS
   Wu, BL
   Ng, V
   Yang, JKW
AF Asbahi, Mohamed
   Lim, Kevin T. P.
   Wang, Fuke
   Lin, Maria Y.
   Chan, Kheong S.
   Wu, Baolei
   Ng, Vivian
   Yang, Joel K. W.
TI Determination of Position Jitter and Dot-Size Fluctuations in Patterned
   Arrays Fabricated by the Directed Self-Assembly of Gold Nanoparticles
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT 24th Magnetic Recording Conference (TMRC)
CY AUG 20-22, 2013
CL Tokyo Inst Technol, Ookayama Campus, Tokyo, JAPAN
SP Seagate Technol LLC, LSI Corp, Marvell Technol Grp Ltd, Western Digital Corp, HGST, Inc, Toshiba Corp, Guzik Tech Enterprises, Adv Storage Technol Consortium, Intevac, Inc, E Globaledge Corp, Engis Japan Corp, Fuji Elect Co, Ltd, Futek Furnace, Inc, Hakuto Co Ltd, Hitachi High Technologies Corp, Hitachi Informat & Telecommunicat Engn, Ltd, Hoya Corp, Konica Minolta, Inc, READ Co, Ltd, OHARA Inc, Showa Denko Elect K K, TDK Corp, Ube Mat Ind, Ltd, Veeco Instruments Consortium, Toei Sci Ind Co, Ltd, Carnegie Mellon Univ, Data Storage Syst Ctr, Stanford Univ, Ctr Magnet Nanotechnol, Univ Alabama, Ctr Mat Informat Technol, Univ California, Comp Mech Lab, Univ California, Ctr Magnet Recording Res, Univ Minnesota, Ctr Micromagnet & Informat Technologies, Asahi Glass Co, Ltd, Hitachi, Ltd, Magnet Soc Japan, NEOARK Corp, Storage Res Consortium
HO Tokyo Inst Technol, Ookayama Campus
DE Bit-patterned media (BPM); directed self-assembly (DSA); gold
   nanoparticles; jitter noise; magnetic recording; media noise
ID MEDIA; PERFORMANCE; DENSITY; NOISE; LITHOGRAPHY
AB The promise of magnetic bit-patterned media (BPM) in the hard disk drive industry hinges on its capability to extend the data storage density beyond that achievable by conventional continuous media. Its success, however, depends strongly on meeting the jitter and throughput requirements of BPM with a suitable fabrication process. In this paper, we report on the directed self-assembly of gold nanoparticles using a topographical template as an approach to fulfill the BPM fabrication requirements. The effects of position jitter and dot-size fluctuations are examined by performing image analysis on scanning electron microscopies of samples fabricated with areal densities of 4.4 Tdot/in(2). For comparison, we considered three different cases: electron-beam lithography-defined templates, monolayer films of self-assembled nanoparticles on an unpatterned substrate, and nanoparticles directed to assemble within a template. Our analysis provides evidence for the improvements in position jitter of the directed assembly of nanoparticles over those that were left to assemble without a template.
C1 [Asbahi, Mohamed; Lim, Kevin T. P.; Wang, Fuke; Yang, Joel K. W.] Agcy Sci Technol & Res, Inst Mat Res & Engn, Singapore 117602, Singapore.
   [Lin, Maria Y.; Chan, Kheong S.] Agcy Sci Technol & Res, Data Storage Inst, Singapore 117608, Singapore.
   [Wu, Baolei; Ng, Vivian] Natl Univ Singapore, Dept Elect & Comp Engn, Informat Storage Mat Lab, Singapore 117576, Singapore.
RP Yang, JKW (reprint author), Agcy Sci Technol & Res, Inst Mat Res & Engn, Singapore 117602, Singapore.
EM yangkwj@imre.a-star.edu.sg
RI Yang, Joel K.W./L-7892-2016
OI Yang, Joel K.W./0000-0003-3301-1040
CR Albrecht M, 2002, APPL PHYS LETT, V81, P2875, DOI 10.1063/1.1512946
   Asbahi M., 2010, J PHYS D, V43
   Asbahi M, 2012, LANGMUIR, V28, P16782, DOI 10.1021/la303287z
   Aziz MM, 2002, IEEE T MAGN, V38, P1964, DOI 10.1109/TMAG.2002.802787
   Bita I, 2008, SCIENCE, V321, P939, DOI 10.1126/science.1159352
   IWASAKI S, 1977, IEEE T MAGN, V13, P1272, DOI 10.1109/TMAG.1977.1059695
   Jones B. A., 2005, J APPL PHYS, V97
   Kamata Y, 2011, IEEE T MAGN, V47, P51, DOI 10.1109/TMAG.2010.2077274
   Kikitsu A, 2013, IEEE T MAGN, V49, P693, DOI 10.1109/TMAG.2012.2226566
   Kryder MH, 2008, P IEEE, V96, P1810, DOI 10.1109/JPROC.2008.2004315
   Lau CY, 2011, LANGMUIR, V27, P3355, DOI 10.1021/la104786z
   Lin MY, 2013, IEEE T MAGN, V49, P723, DOI 10.1109/TMAG.2012.2226708
   Maqableh MM, 2012, NANO LETT, V12, P4102, DOI 10.1021/nl301610z
   MIAN G, 1992, IEEE T MAGN, V28, P2733, DOI 10.1109/20.179612
   Miura K, 2008, J MAGN MAGN MATER, V320, P2904, DOI 10.1016/j.jmmm.2008.08.061
   Nabavi S, 2009, IEEE T MAGN, V45, P3523, DOI 10.1109/TMAG.2009.2022493
   Naito K., 2005, CHAOS, V15
   Nandakumar V, 2004, IEEE T MAGN, V40, P2314, DOI 10.1109/TMAG.2004.829822
   Nutter PW, 2005, IEEE T MAGN, V41, P3214, DOI 10.1109/TMAG.2005.854780
   Puntes VF, 2004, NAT MATER, V3, P263, DOI 10.1038/nmat1094
   Rasband W. S, 2016, IMAGEJ
   Sun SH, 2000, SCIENCE, V287, P1989, DOI 10.1126/science.287.5460.1989
   Weiss N, 2005, PHYS REV LETT, V95, DOI 10.1103/PhysRevLett.95.157204
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
   Yang J. K. W., 2011, NANOTECHNOLOGY, V22
   Yang JKW, 2007, J VAC SCI TECHNOL B, V25, P2025, DOI 10.1116/1.2801881
   Yang XM, 2009, ACS NANO, V3, P1844, DOI 10.1021/nn900073r
NR 27
TC 4
Z9 4
U1 0
U2 8
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD MAR
PY 2014
VL 50
IS 3
AR 3200405
DI 10.1109/TMAG.2013.2280018
PN 1
PG 5
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA AE1RM
UT WOS:000333747200010
ER

PT J
AU Kundu, S
   Gaur, N
   Piramanayagam, SN
   Maurer, SL
   Yang, H
   Bhatia, CS
AF Kundu, Shreya
   Gaur, Nikita
   Piramanayagam, S. N.
   Maurer, Siegfried L.
   Yang, Hyunsoo
   Bhatia, Charanjit Singh
TI Ion Implantation Challenges for Patterned Media at Areal Densities over
   5 Tbpsi
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT 24th Magnetic Recording Conference (TMRC)
CY AUG 20-22, 2013
CL Tokyo Inst Technol, Ookayama Campus, Tokyo, JAPAN
SP Seagate Technol LLC, LSI Corp, Marvell Technol Grp Ltd, Western Digital Corp, HGST, Inc, Toshiba Corp, Guzik Tech Enterprises, Adv Storage Technol Consortium, Intevac, Inc, E Globaledge Corp, Engis Japan Corp, Fuji Elect Co, Ltd, Futek Furnace, Inc, Hakuto Co Ltd, Hitachi High Technologies Corp, Hitachi Informat & Telecommunicat Engn, Ltd, Hoya Corp, Konica Minolta, Inc, READ Co, Ltd, OHARA Inc, Showa Denko Elect K K, TDK Corp, Ube Mat Ind, Ltd, Veeco Instruments Consortium, Toei Sci Ind Co, Ltd, Carnegie Mellon Univ, Data Storage Syst Ctr, Stanford Univ, Ctr Magnet Nanotechnol, Univ Alabama, Ctr Mat Informat Technol, Univ California, Comp Mech Lab, Univ California, Ctr Magnet Recording Res, Univ Minnesota, Ctr Micromagnet & Informat Technologies, Asahi Glass Co, Ltd, Hitachi, Ltd, Magnet Soc Japan, NEOARK Corp, Storage Res Consortium
HO Tokyo Inst Technol, Ookayama Campus
DE Bit patterned media (BPM); ion implantation; lateral straggle;
   perpendicular magnetic recording
ID DISCRETE-TRACK MEDIA; RECORDING MEDIA; MAGNETIC-PROPERTIES; FABRICATION;
   REVERSAL; IRRADIATION; FILMS; SERVO
AB Ion implantation of lighter (4He(+)) and heavier ion species (121Sb(+)) was studied to investigate their suitability in fabricating bit patterned media (BPM) for areal densities >= 5 Tbpsi. Conventional CoCrPt-SiO2 and the next generation high-anisotropy L1(0) FePt media were employed to understand the mass-dependent lateral straggle of the ions. First-order reversal curve measurement for CoCrPt-SiO2 media revealed an increase in exchange interaction in the implanted films with the increasing fluence. Interestingly, there was an order-disorder transformation of the phase for L1(0) FePt media upon implantation. Implantation using lighter ions resulted in a larger lateral straggle. This lateral movement of ions from the unmasked to masked regions during BPM fabrication will, furthermore, impede the process of bit isolation. In contrast, lateral straggle was reduced for heavier ions. However, this was achieved at the expense of the diffusion of host atoms displaced from their lattice positions which caused a reduction of anisotropy even in the unimplanted regions. Therefore, the requirement to strike a balance between the lateral straggle of the implanted species and the movement of host atoms to accomplish ultra-high densities in implantation-assisted-BPM recording is reported as a challenging problem.
C1 [Kundu, Shreya; Gaur, Nikita; Yang, Hyunsoo; Bhatia, Charanjit Singh] Natl Univ Singapore, Dept Elect & Comp Engn, Singapore 117576, Singapore.
   [Gaur, Nikita; Piramanayagam, S. N.] Agcy Sci Technol & Res, Data Storage Inst, Singapore 117608, Singapore.
   [Maurer, Siegfried L.] IBM Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA.
RP Piramanayagam, SN (reprint author), Agcy Sci Technol & Res, Data Storage Inst, Singapore 117608, Singapore.
EM prem_sn@dsi.a-star.edu.sg
RI Piramanayagam, SN/A-4192-2008; Yang, Hyunsoo/F-5149-2010
OI Piramanayagam, SN/0000-0002-3178-2960; Yang, Hyunsoo/0000-0003-0907-2898
CR Chappert C, 1998, SCIENCE, V280, P1919, DOI 10.1126/science.280.5371.1919
   Choi C, 2011, IEEE T MAGN, V47, P2532, DOI 10.1109/TMAG.2011.2158197
   Chong TC, 2011, J NANOSCI NANOTECHNO, V11, P2704, DOI 10.1166/jnn.2011.2738
   Gaur N., 2013, SCI REP, V3, P1
   Gaur N, 2012, IEEE T MAGN, V48, P2753, DOI 10.1109/TMAG.2012.2201457
   Gaur N, 2011, J PHYS D APPL PHYS, V44, DOI 10.1088/0022-3727/44/36/365001
   Hellwig O, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3293301
   Hinoue T., 2011, J APPL PHYS, V109
   Hinoue T, 2010, IEEE T MAGN, V46, P1584, DOI 10.1109/TMAG.2010.2043416
   Pike C, 1999, J APPL PHYS, V85, P6668, DOI 10.1063/1.370177
   Pike CR, 1999, J APPL PHYS, V85, P6660, DOI 10.1063/1.370176
   Piramanayagam SN, 2007, APPL PHYS LETT, V91, DOI 10.1063/1.2795329
   Piramanayagam SN, 2010, IEEE T MAGN, V46, P758, DOI 10.1109/TMAG.2009.2039018
   Piramanayagam SN, 2009, J MAGN MAGN MATER, V321, P485, DOI 10.1016/j.jmmm.2008.05.007
   Piramanayagam SN, 1999, J APPL PHYS, V85, P5898, DOI 10.1063/1.369907
   Sato K, 2010, J APPL PHYS, V107, DOI 10.1063/1.3431529
   Sbiaa R, 2010, J APPL PHYS, V107, DOI 10.1063/1.3427560
   Sbiaa R, 2009, J APPL PHYS, V105, DOI 10.1063/1.3093699
   Shi JZ, 2005, APPL PHYS LETT, V87, DOI 10.1063/1.2137447
   Tan EL, 2009, J VAC SCI TECHNOL B, V27, P2259, DOI 10.1116/1.3225597
   Tavakkoli A, 2011, J VAC SCI TECHNOL B, V29, DOI 10.1116/1.3532938
   Tavakkoli K. G., 2012, NANOSCI NANOTECHNOL, V4, P835
   Yang JKW, 2007, J VAC SCI TECHNOL B, V25, P2025, DOI 10.1116/1.2801881
   Yasumori J, 2009, IEEE T MAGN, V45, P3703, DOI 10.1109/TMAG.2009.2023853
   Ziegler JF, 1999, J APPL PHYS, V85, P1249, DOI 10.1063/1.369844
NR 25
TC 2
Z9 2
U1 1
U2 13
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD MAR
PY 2014
VL 50
IS 3
AR 3200206
DI 10.1109/TMAG.2013.2285938
PN 1
PG 6
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA AE1RM
UT WOS:000333747200008
ER

PT J
AU Yamamoto, R
   Kanamaru, M
   Sugawara, K
   Sasao, N
   Ootera, Y
   Okino, T
   Kihara, N
   Kamata, Y
   Kikitsu, A
AF Yamamoto, Ryousuke
   Kanamaru, Masahiro
   Sugawara, Katsuya
   Sasao, Norikatsu
   Ootera, Yasuaki
   Okino, Takeshi
   Kihara, Naoko
   Kamata, Yoshiyuki
   Kikitsu, Akira
TI Orientation and Position Control of Self-Assembled Polymer Pattern for
   Bit-Patterned Media
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT 24th Magnetic Recording Conference (TMRC)
CY AUG 20-22, 2013
CL Tokyo Inst Technol, Ookayama Campus, Tokyo, JAPAN
SP Seagate Technol LLC, LSI Corp, Marvell Technol Grp Ltd, Western Digital Corp, HGST, Inc, Toshiba Corp, Guzik Tech Enterprises, Adv Storage Technol Consortium, Intevac, Inc, E Globaledge Corp, Engis Japan Corp, Fuji Elect Co, Ltd, Futek Furnace, Inc, Hakuto Co Ltd, Hitachi High Technologies Corp, Hitachi Informat & Telecommunicat Engn, Ltd, Hoya Corp, Konica Minolta, Inc, READ Co, Ltd, OHARA Inc, Showa Denko Elect K K, TDK Corp, Ube Mat Ind, Ltd, Veeco Instruments Consortium, Toei Sci Ind Co, Ltd, Carnegie Mellon Univ, Data Storage Syst Ctr, Stanford Univ, Ctr Magnet Nanotechnol, Univ Alabama, Ctr Mat Informat Technol, Univ California, Comp Mech Lab, Univ California, Ctr Magnet Recording Res, Univ Minnesota, Ctr Micromagnet & Informat Technologies, Asahi Glass Co, Ltd, Hitachi, Ltd, Magnet Soc Japan, NEOARK Corp, Storage Res Consortium
HO Tokyo Inst Technol, Ookayama Campus
DE Bit-patterned media (BPM); block copolymer; directed self-assembly
   (DSA); hard disks; nanolithography
ID LITHOGRAPHY; TB/IN(2); DENSITY
AB Directed self-assembly (DSA) is expected to be a solution for the fabrication process of high-density bit-patterned media. A DSA pattern of polystyrene-b-polydimethylsiloxane diblock copolymer with 20 nm pitch was fabricated on a 2.5 in disk substrate using a postguide. Uniformity of the dot alignment as well as dot-pitch fluctuation and linearity of pseudodot tracks are estimated using image analyses of SEM photographs. Uniformity along the circumferential direction was confirmed. All the SEM images at eight different angles at r = 29.4 mm showed single domain. Pitch distribution and linearity error were estimated to be 14% and 7.8%, respectively. Uniformity along the radius direction was estimated with the moire method. The single-domain region is expected to be 5 mm in width. Margin of the postguide pitch for the single-domain formation is revealed to be more than 15% of the self-assembled dot pitch.
C1 [Yamamoto, Ryousuke; Kanamaru, Masahiro; Sugawara, Katsuya; Sasao, Norikatsu; Ootera, Yasuaki; Okino, Takeshi; Kihara, Naoko; Kamata, Yoshiyuki; Kikitsu, Akira] Toshiba Co Ltd, Corp Res & Dev Ctr, Kawasaki, Kanagawa 2128582, Japan.
RP Yamamoto, R (reprint author), Toshiba Co Ltd, Corp Res & Dev Ctr, Kawasaki, Kanagawa 2128582, Japan.
EM ryosuke1.yamamoto@toshiba.co.jp
CR Bita I, 2008, SCIENCE, V321, P939, DOI 10.1126/science.1159352
   Hosaka S, 2011, MICROELECTRON ENG, V88, P2571, DOI 10.1016/j.mee.2011.01.005
   Kamata Y, 2011, IEEE T MAGN, V47, P51, DOI 10.1109/TMAG.2010.2077274
   Kikitsu A, 2013, IEEE T MAGN, V49, P693, DOI 10.1109/TMAG.2012.2226566
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Shiroishi Y, 2009, IEEE T MAGN, V45, P3816, DOI 10.1109/TMAG.2009.2024879
   Wan L, 2012, J MICRO-NANOLITH MEM, V11, DOI 10.1117/1.JMM.11.3.031405
   Watanabe A., 2012, DIG INT C CS, VCS-11
   Yamamoto R., 2013, P SPIE, V8680
   Yang XM, 2009, ACS NANO, V3, P1844, DOI 10.1021/nn900073r
NR 11
TC 2
Z9 2
U1 2
U2 8
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD MAR
PY 2014
VL 50
IS 3
AR 3200304
DI 10.1109/TMAG.2013.2284474
PN 1
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA AE1RM
UT WOS:000333747200009
ER

PT J
AU Xiao, SG
   Yang, XM
   Hwu, JJ
   Lee, KY
   Kuo, D
AF Xiao, Shuaigang
   Yang, XiaoMin
   Hwu, Justin J.
   Lee, Kim Y.
   Kuo, David
TI A Facile Route to Regular and Nonregular Dot Arrays by Integrating
   Nanoimprint Lithography with Sphere-Forming Block Copolymer Directed
   Self-Assembly
SO JOURNAL OF POLYMER SCIENCE PART B-POLYMER PHYSICS
LA English
DT Article
DE bit-patterned media; block copolymers; directed self-assembly;
   nanoimprint; resists; self-assembly; topography
ID PATTERNED MEDIA; TEMPLATES; GRAPHOEPITAXY
AB Nanoimprint lithography is used to create large-area two-dimensional prepatterns with tunable topographic heights in a resist layer. The resist prepatterns are applied to direct the self-assembly of sphere-forming polystyrene-block-polydimethylsiloxane block copolymers so as to form sparse nonregular nanodot arrays with flexible pattern layouts from high-topography prepattern or dense regular nanodot arrays with a multiplicative pattern density from low-topography prepattern. By precisely controlling the topographic height in substrate prepatterns, the origin of directed self-assembly of block copolymer spheres using low-topography prepattern is found to be topographic contrast. High-fidelity pattern transfer from spherical block copolymer nanotemplates to functional materials indicates a promising route to ultrahigh density nanodevices. Bit-patterned media over 1 teradot/in on a 2.5-inch disk are fabricated, thus presenting future magnetic data storage media with great areal density growth potential. (c) 2013 Wiley Periodicals, Inc. J. Polym. Sci., Part B: Polym. Phys. 2014, 52, 361-367
C1 [Xiao, Shuaigang; Yang, XiaoMin; Hwu, Justin J.; Lee, Kim Y.; Kuo, David] Seagate Technol, Media Res Ctr, Fremont, CA 94538 USA.
RP Xiao, SG (reprint author), Seagate Technol, Media Res Ctr, 47010 Kato Rd, Fremont, CA 94538 USA.
EM shuaigang.xiao@seagate.com
CR Bang J, 2009, ADV MATER, V21, P4769, DOI 10.1002/adma.200803302
   BATES FS, 1990, ANNU REV PHYS CHEM, V41, P525, DOI 10.1146/annurev.pc.41.100190.002521
   Bita I, 2008, SCIENCE, V321, P939, DOI 10.1126/science.1159352
   Black CT, 2007, IBM J RES DEV, V51, P605
   Cheng JY, 2008, ADV MATER, V20, P3155, DOI 10.1002/adma.200800826
   Cheng JY, 2010, ACS NANO, V4, P4815, DOI 10.1021/nn100686v
   Fasolka MJ, 2001, ANN REV MATER RES, V31, P323, DOI 10.1146/annurev.matsci.31.1.323
   Herr D.J.C., 2006, FUTURE FAB INT, V20, P82
   Hong SW, 2011, ACS NANO, V5, P2855, DOI 10.1021/nn103401w
   Kim HC, 2010, CHEM REV, V110, P146, DOI 10.1021/cr900159v
   Kim SO, 2003, NATURE, V424, P411, DOI 10.1038/nature01775
   Li HW, 2004, NANO LETT, V4, P1633, DOI 10.1021/nl049209r
   Li MQ, 2006, MATER TODAY, V9, P30, DOI 10.1016/S1369-7021(06)71620-0
   Man XK, 2011, MACROMOLECULES, V44, P2206, DOI 10.1021/ma102292v
   Naito K, 2002, IEEE T MAGN, V38, P1949, DOI 10.1109/TMAG.2002.802847
   Park M, 1997, SCIENCE, V276, P1401, DOI 10.1126/science.276.5317.1401
   Richter H. J., 2006, APPL PHYS LETT, V88
   Ross CA, 2008, MRS BULL, V33, P838, DOI 10.1557/mrs2008.179
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Ryu DY, 2005, SCIENCE, V308, P236, DOI 10.1126/science.1106604
   Segalman RA, 2001, ADV MATER, V13, P1152, DOI 10.1002/1521-4095(200108)13:15<1152::AID-ADMA1152>3.0.CO;2-5
   Stoykovich MP, 2005, SCIENCE, V308, P1442, DOI 10.1126/science.1111041
   Sundrani D, 2004, NANO LETT, V4, P273, DOI 10.1021/nl035005j
   Tang CB, 2008, SCIENCE, V322, P429, DOI 10.1126/science.1162950
   Thurn-Albrecht T, 2000, SCIENCE, V290, P2126, DOI 10.1126/science.290.5499.2126
   Xiao S., 2013, J MICRONANOLITHOG ME, V12
   Xiao S., 2011, NANOTECHNOLOGY, V22
   Xiao SG, 2005, NANOTECHNOLOGY, V16, pS324, DOI 10.1088/0957-4484/16/7/003
   Xiao SG, 2009, ADV MATER, V21, P2516, DOI 10.1002/adma.200802087
   Yang JKW, 2010, NAT NANOTECHNOL, V5, P256, DOI [10.1038/nnano.2010.30, 10.1038/NNANO.2010.30]
NR 30
TC 8
Z9 8
U1 2
U2 41
PU WILEY-BLACKWELL
PI HOBOKEN
PA 111 RIVER ST, HOBOKEN 07030-5774, NJ USA
SN 0887-6266
EI 1099-0488
J9 J POLYM SCI POL PHYS
JI J. Polym. Sci. Pt. B-Polym. Phys.
PD MAR 1
PY 2014
VL 52
IS 5
BP 361
EP 367
DI 10.1002/polb.23433
PG 7
WC Polymer Science
SC Polymer Science
GA AA4SF
UT WOS:000331085700002
ER

PT J
AU Mathew, G
   Hwang, E
   Park, J
   Garfunkel, G
   Hu, D
AF Mathew, George
   Hwang, Euiseok
   Park, Jongseung
   Garfunkel, Glen
   Hu, David
TI Capacity Advantage of Array-Reader-Based Magnetic Recording (ARMR) for
   Next Generation Hard Disk Drives
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT 24th Magnetic Recording Conference (TMRC)
CY AUG 20-22, 2013
CL Tokyo Inst Technol, Ookayama Campus, Tokyo, JAPAN
SP Seagate Technol LLC, LSI Corp, Marvell Technol Grp Ltd, Western Digital Corp, HGST Inc, Toshiba Corp, Guzik Tech Enterprises, Adv Storage Technol Consortium, Intevac, Inc, E Globaledge Corp, Engis Japan Corp, Fuji Elect Co Ltd, Futek Furnace, Inc, Hakuto Co Ltd, Hitachi High Technologies Corp, Hitachi Informat & Telecommunicat Engn, Ltd, Hoya Corp, Konica Minolta, Inc, READ Co, Ltd, OHARA Inc, Showa Denko Elect K K, TDK Corp, Ube Mat Ind, Ltd, Veeco Instruments Consortium, Toei Sci Ind Co, Ltd, Carnegie Mellon Univ, Data Storage Syst Ctr, Stanford Univ, Ctr Magnet Nanotechnol, Univ Alabama, Ctr Mat Informat Technol, Univ California, Comp Mech Lab, Univ California, Ctr Magnet Recording Res, Univ Minnesota, Ctr Micromagnet & Informat Technologies, Asahi Glass Co, Ltd, Hitachi, Ltd, Magnet Soc Japan, NEOARK Corp, Storage Res Consortium
HO Tokyo Inst Technol, Ookayama Campus
DE 2-D equalizer; 2-D magnetic recording (TDMR); array-reader;
   array-reader-based magnetic recording (ARMR); hard disk drives (HDDs);
   magnetic recording
ID BIT-PATTERNED MEDIA; SQUARE INCH; FEASIBILITY; TB/IN(2)
AB This paper proposes an array-reader-based magnetic recording (ARMR) approach for enhancing recording capacity in hard disk drives (HDDs). The HDD industry is now at crossroads to choose a technology that will support continued increase in recording density, and the top contenders are bit patterned media recording (BPMR) and heat-assisted magnetic recording (HAMR) for near-term and 2-D magnetic recording for long-term. Deployment of BPMR and HAMR has been delayed due to the challenges in media and heads. We propose the ARMR approach as a viable technology that can deliver significant capacity by combining array-reader-based readback with modest changes in readback signal processing. Offtrack performance evaluation using waveforms captured at various squeeze levels show that ARMR offers about 30% enhancement in capacity for single-track detection with two or three read elements positioned at different cross-track positions in the track.
C1 [Mathew, George; Hwang, Euiseok] LSI Corp, San Jose, CA 95131 USA.
   [Park, Jongseung] LSI Corp, Allentown, PA 18109 USA.
   [Garfunkel, Glen; Hu, David] Headway Technol Inc, Milpitas, CA 95035 USA.
RP Mathew, G (reprint author), LSI Corp, San Jose, CA 95131 USA.
EM george.mathew@lsi.com
CR Albrecht TR, 2013, IEEE T MAGN, V49, P773, DOI 10.1109/TMAG.2012.2227303
   Greaves S, 2009, IEEE T MAGN, V45, P3823, DOI 10.1109/TMAG.2009.2021663
   Greaves SJ, 2008, IEEE T MAGN, V44, P3430, DOI 10.1109/TMAG.2008.2002365
   Hall D, 2012, IEEE T MAGN, V48, P1777, DOI 10.1109/TMAG.2011.2179528
   Haratsch EF, 2011, IEEE T MAGN, V47, P3698, DOI 10.1109/TMAG.2011.2159855
   Igarashi M, 2012, IEEE T MAGN, V48, P3284, DOI 10.1109/TMAG.2012.2200882
   Jin Z, 2008, IEEE T MAGN, V44, P3718, DOI 10.1109/TMAG.2008.2003044
   Kryder MH, 2008, P IEEE, V96, P1810, DOI 10.1109/JPROC.2008.2004315
   Marchon B., 2013, ADV TRIBOL, V2013
   McDaniel TW, 2005, J PHYS-CONDENS MAT, V17, pR315, DOI 10.1088/0953-8984/17/7/R01
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Sato Y, 2013, IEEE T MAGN, V49, P3632, DOI 10.1109/TMAG.2013.2239270
   Shiroishi Y, 2009, IEEE T MAGN, V45, P3816, DOI 10.1109/TMAG.2009.2024879
   Ushiyama J, 2013, IEEE T MAGN, V49, P3612, DOI 10.1109/TMAG.2013.2242442
   Victora RH, 2012, IEEE T MAGN, V48, P1697, DOI 10.1109/TMAG.2011.2173310
   Wang SM, 2013, IEEE T MAGN, V49, P3644, DOI 10.1109/TMAG.2012.2237545
   Wood R, 2000, IEEE T MAGN, V36, P36, DOI 10.1109/20.824422
   Wood R, 2009, IEEE T MAGN, V45, P917, DOI 10.1109/TMAG.2008.2010676
   Wu AQ, 2013, IEEE T MAGN, V49, P779, DOI 10.1109/TMAG.2012.2219513
   Zhu JG, 2008, IEEE T MAGN, V44, P125, DOI 10.1109/TMAG.2007.911031
NR 20
TC 37
Z9 37
U1 0
U2 0
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD MAR
PY 2014
VL 50
IS 3
DI 10.1109/TMAG.2013.2283221
PN 1
PG 7
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA AE1RM
UT WOS:000333747200027
ER

PT J
AU Petrie, JR
   Urazhdin, S
   Wieland, KA
   Fischer, GA
   Edelstein, AS
AF Petrie, J. R.
   Urazhdin, S.
   Wieland, K. A.
   Fischer, G. A.
   Edelstein, A. S.
TI Using a spin torque nano-oscillator to read memory based on the magnetic
   permeability
SO JOURNAL OF PHYSICS D-APPLIED PHYSICS
LA English
DT Article
DE spin torque nano-oscillator; magnetic permeability; memory
ID DRIVEN; MEDIA; NOISE
AB We present an archival memory utilizing a spin torque nano-oscillator (STNO) to read bits of data with different magnetic permeability. Basing a magnetic memory on this intrinsic property rather than remanent magnetization reduces the risk of data corruption. The permeability of the bits is read as changes in an applied probe field near the media. These changes in the probe field are measured by detecting microwave frequency shifts in STNOs. The probe field can be tuned over hundreds of Oe to optimize the reading of the media. Using a 400 Oe probe field, we have measured 2% frequency shifts in a STNO near micrometre-sized bits of (1) lithographically-patterned permalloy lines and (2) laser-crystallized Metglas lines. Data from either media was not corrupted by exposure to fields of 6400 Oe and temperatures of 523 K.
C1 [Petrie, J. R.; Wieland, K. A.; Fischer, G. A.; Edelstein, A. S.] US Army Res Lab, Adelphi, MD 20873 USA.
   [Urazhdin, S.] Emory Univ, Dept Phys, Atlanta, GA 30322 USA.
RP Petrie, JR (reprint author), US Army Res Lab, Adelphi, MD 20873 USA.
CR Argumedo AJ, 2008, IBM J RES DEV, V52, P513
   Braganca PM, 2010, NANOTECHNOLOGY, V21, DOI 10.1088/0957-4484/21/23/235202
   Cheng SF, 2004, J MAGN MAGN MATER, V282, P109, DOI 10.1016/j.jmmm.2004.04.027
   Cullity B.D., 2009, INTRO MAGNETIC MAT
   Demidov VE, 2011, PHYS REV LETT, V107, DOI 10.1103/PhysRevLett.107.107204
   Evans RFL, 2012, APPL PHYS LETT, V100, DOI 10.1063/1.3691196
   Jiang W, 2003, J APPL PHYS, V93, P6754, DOI 10.1063/1.1557716
   June W L, 2011, J PHYS D, V44
   Kim JV, 2008, PHYS REV LETT, V100, DOI 10.1103/PhysRevLett.100.017207
   Kiselev SI, 2003, NATURE, V425, P380, DOI 10.1038/nature01967
   Lenz J, 2006, IEEE SENS J, V6, P631, DOI 10.1109/JSEN.2006.874493
   Li LL, 2007, IEEE T MAGN, V43, P2373, DOI 10.1109/TMAG.2007.892585
   Lu Y, 1997, APPL PHYS LETT, V70, P2610, DOI 10.1063/1.118933
   LUBORSKY FE, 1975, IEEE T MAGN, V11, P1644, DOI 10.1109/TMAG.1975.1058974
   Mizushima K, 2011, J PHYS CONF SER, V266, DOI 10.1088/1742-6596/266/1/012060
   Ohring M., 2002, MAT SCI THIN FILMS D
   Ramanujan RV, 2006, J ALLOY COMPD, V425, P251, DOI 10.1016/j.jallcom.2005.10.096
   Shimizu O., 2012, J MAGN SOC JPN, V36, P1
   Silva TJ, 2008, J MAGN MAGN MATER, V320, P1260, DOI 10.1016/j.jmmm.2007.12.022
   Slonczewski JC, 1996, J MAGN MAGN MATER, V159, pL1, DOI 10.1016/0304-8853(96)00062-5
   Sorescu M, 2000, PHYS REV B, V61, P14338, DOI 10.1103/PhysRevB.61.14338
   Svec P, 2010, IEEE T MAGN, V46, P412, DOI 10.1109/TMAG.2009.2034332
   Tabor P, 2010, PHYS REV B, V82, DOI 10.1103/PhysRevB.82.020407
   Tarnopolsky GJ, 1997, J APPL PHYS, V81, P4837, DOI 10.1063/1.364847
   Urazhdin S, 2010, PHYS REV LETT, V105, DOI 10.1103/PhysRevLett.105.104101
   Wood R, 2009, IEEE T MAGN, V45, P917, DOI 10.1109/TMAG.2008.2010676
   Zeng ZM, 2013, NANOSCALE, V5, P2219, DOI 10.1039/c2nr33407k
   Zhimin Y, 2009, MAGN REC C APMRC 09
   Edelstein A S, 2008, Non-Erasable Magnetic Identification Media, Patent No. [US 20080102320, 20080102320]
NR 29
TC 7
Z9 7
U1 0
U2 19
PU IOP PUBLISHING LTD
PI BRISTOL
PA TEMPLE CIRCUS, TEMPLE WAY, BRISTOL BS1 6BE, ENGLAND
SN 0022-3727
EI 1361-6463
J9 J PHYS D APPL PHYS
JI J. Phys. D-Appl. Phys.
PD FEB 5
PY 2014
VL 47
IS 5
AR 055002
DI 10.1088/0022-3727/47/5/055002
PG 7
WC Physics, Applied
SC Physics
GA 289ZB
UT WOS:000329720200002
ER

PT J
AU Dong, QC
   Li, GJ
   Ho, CL
   Leung, CW
   Pong, PWT
   Manners, I
   Wong, WY
AF Dong, Qingchen
   Li, Guijun
   Ho, Cheuk-Lam
   Leung, Chi-Wah
   Pong, Philip Wing-Tat
   Manners, Ian
   Wong, Wai-Yeung
TI Facile Generation of L1(0)-FePt Nanodot Arrays from a Nanopatterned
   Metallopolymer Blend of Iron and Platinum Homopolymers
SO ADVANCED FUNCTIONAL MATERIALS
LA English
DT Article
DE metallopolymers; FePt nanoparticles; bit patterned media; nanoimprint
   lithography; magnetic data recording
ID BIT PATTERNED MEDIA; FEPT NANOPARTICLES; NANOIMPRINT LITHOGRAPHY;
   PRECURSOR; POLYMERS
AB Hard ferromagnetic (L1(0) phase) FePt alloy nanoparticles (NPs) with extremely high magnetocrystalline anisotropy are considered to be one of the most promising candidates for the next generation of ultrahigh-density data storage system. The question of how to generate ordered patterns of L1(0)-FePt NPs and how to transform the technology for practical applications represents a key current challenge. Here the direct synthesis of L1(0) phase FePt NPs by pyrolysis of Fe-containing and Pt-containing metallopolymer blend without post-annealing treatment is reported. Rapid single-step fabrication of large-area nanodot arrays (periodicity of 500 nm) of L1(0)-ordered FePt NPs can also be achieved by employing the metallopolymer blend, which possesses excellent solubility in most organic solvents and good solution processability, as the precursor through nanoimprint lithography (NIL). Magnetic force microscopy (MFM) imaging of the nanodot pattern indicates that the patterned L1(0) phase FePt NPs are capable of exhibiting decent magnetic response, which suggests a great potential to be utilized directly in the fabrication of bit patterned media (BPM) for the next generation of magnetic recording technology.
C1 [Dong, Qingchen] Minist Educ, Key Lab Interface Sci & Engn Adv Mat, Taiyuan 030024, Peoples R China.
   [Dong, Qingchen] Taiyuan Univ Technol, Res Ctr Adv Mat Sci & Technol, Taiyuan 030024, Peoples R China.
   [Dong, Qingchen; Ho, Cheuk-Lam; Wong, Wai-Yeung] Hong Kong Baptist Univ, Dept Chem, Inst Mol Funct Mat, Hong, Kong, Peoples R China.
   [Dong, Qingchen; Ho, Cheuk-Lam; Wong, Wai-Yeung] Hong Kong Baptist Univ, Inst Adv Mat, Hong, Kong, Peoples R China.
   [Ho, Cheuk-Lam; Wong, Wai-Yeung] HKBU Inst Res & Continuing Educ, Shenzhen 518057, Peoples R China.
   [Li, Guijun; Pong, Philip Wing-Tat] Univ Hong Kong, Dept Elect & Elect Engn, Hong Kong, Hong Kong, Peoples R China.
   [Leung, Chi-Wah] Hong Kong Polytech Univ, Dept Appl Phys, Hong Kong, Hong Kong, Peoples R China.
   [Manners, Ian] Univ Bristol, Sch Chem, Bristol BS8 1TS, Avon, England.
RP Dong, QC (reprint author), Minist Educ, Key Lab Interface Sci & Engn Adv Mat, Taiyuan 030024, Peoples R China.
EM dennis.leung@polyu.edu.hk; ppong@eee.hku.hk; ian.manners@bristol.ac.uk;
   rwywong@hkbu.edu.hk
RI Leung, Chi Wah (Dennis)/D-2085-2012; Li, Guijun/N-6865-2013
OI Leung, Chi Wah (Dennis)/0000-0003-0083-6273; Li,
   Guijun/0000-0001-6259-3209; Cheuk Lam, Ho/0000-0001-8596-0307;
   Wai-Yeung, Wong/0000-0002-9949-7525
FU National Natural Science Foundation of China [51373145, 61307030]; Hong
   Kong Research Grants Council [HKBU203312]; Hong Kong Baptist University
   [FRG2/11-12/156]; University Grants Committee Areas of Excellence Scheme
   [AoE/P-03/08]; University of Hong Kong; ITF Tier 3 [ITS/112/12]; RGC-GRF
   [HKU 704911P]; University Grants Committee of Hong Kong [AoE/P-04/08];
   Hong Kong Polytechnic University [A-PM21]; Royal Society (RS) [IE110647]
FX Q. Dong and G. Li contributed equally to this work. We acknowledge the
   financial support from the National Natural Science Foundation of China
   (Grant No. 51373145 and No. 61307030), Hong Kong Research Grants Council
   (HKBU203312) and a FRG grant from Hong Kong Baptist University
   (FRG2/11-12/156). This work was also supported by the University Grants
   Committee Areas of Excellence Scheme (AoE/P-03/08). Support from the
   Seed Funding Program for Basic Research and Small Project Funding
   Program from the University of Hong Kong, ITF Tier 3 funding
   (ITS/112/12), RGC-GRF grant (HKU 704911P), University Grants Committee
   of Hong Kong (Contract No. AoE/P-04/08), and the Hong Kong Polytechnic
   University (A-PM21) was also acknowledged. W.-Y.W. and I.M. also thank
   financial support from the Royal Society International Exchanges Scheme
   (RS reference number IE110647).
CR Capobianchi A, 2009, CHEM MATER, V21, P2007, DOI 10.1021/cm9003992
   Clendenning SB, 2004, ADV MATER, V16, P215, DOI 10.1002/adma.200305740
   Cullity B. D., 1972, INTRO MAGNETIC MAT
   Dong Q, 2012, ADV MATER, V24, P1034, DOI 10.1002/adma.201104171
   Frey NA, 2009, CHEM SOC REV, V38, P2532, DOI 10.1039/b815548h
   Gilroy JB, 2011, ANGEW CHEM INT EDIT, V50, P5851, DOI 10.1002/anie.201008184
   Guo LJ, 2007, ADV MATER, V19, P495, DOI 10.1002/adma.200600882
   Guo Q., 2004, ADV MATER, V15, P1337
   Liu K, 2008, ANGEW CHEM INT EDIT, V47, P1255, DOI 10.1002/anie.200703199
   Liu K, 2009, CHEM MATER, V21, P1781, DOI 10.1021/cm900164b
   Manners I., 2004, SYNTHETIC METAL CONT
   Nguyen HL, 2006, CHEM MATER, V18, P6414, DOI 10.1021/cm062127e
   Robinson I, 2009, CHEM MATER, V21, P3021, DOI 10.1021/cm9008442
   Ruotsalainen T, 2005, ADV MATER, V17, P1048, DOI 10.1002/adma.200401530
   Rutledge RD, 2006, J AM CHEM SOC, V128, P14210, DOI 10.1021/ja0633868
   Schubert US, 2002, ANGEW CHEM INT EDIT, V41, P2892, DOI 10.1002/1521-3773(20020816)41:16<2892::AID-ANIE2892>3.0.CO;2-6
   Schvartzman M, 2009, NANO LETT, V9, P3629, DOI 10.1021/nl9018512
   Sort J, 2006, ADV MATER, V18, P466, DOI 10.1002/adma.200501265
   STONER EC, 1948, PHILOS TR R SOC S-A, V240, P599, DOI 10.1098/rsta.1948.0007
   Sun S., 2000, SCIENCE, V27, P1989
   Sun SH, 2006, ADV MATER, V18, P393, DOI 10.1002/adma.200501464
   Thomson T, 2005, PHYS REV B, V72, DOI 10.1103/PhysRevB.72.064441
   Wang JP, 2008, P IEEE, V96, P1847, DOI 10.1109/JPROC.2008.2004318
   Weller D, 2000, ANNU REV MATER SCI, V30, P611, DOI 10.1146/annurev.matsci.30.1.611
   Wellons MS, 2007, CHEM MATER, V19, P2483, DOI 10.1021/cm062455e
   Whittell GR, 2011, NAT MATER, V10, P176, DOI 10.1038/nmat2966
   Williams KA, 2007, CHEM SOC REV, V36, P729, DOI 10.1039/b601574n
   Yang XM, 2009, IEEE T MAGN, V45, P833, DOI 10.1109/TMAG.2008.2010647
   Yano K, 2008, J APPL PHYS, V104, DOI 10.1063/1.2953078
NR 29
TC 25
Z9 25
U1 5
U2 79
PU WILEY-V C H VERLAG GMBH
PI WEINHEIM
PA BOSCHSTRASSE 12, D-69469 WEINHEIM, GERMANY
SN 1616-301X
EI 1616-3028
J9 ADV FUNCT MATER
JI Adv. Funct. Mater.
PD FEB
PY 2014
VL 24
IS 6
BP 857
EP 862
DI 10.1002/adfm.201301143
PG 6
WC Chemistry, Multidisciplinary; Chemistry, Physical; Nanoscience &
   Nanotechnology; Materials Science, Multidisciplinary; Physics, Applied;
   Physics, Condensed Matter
SC Chemistry; Science & Technology - Other Topics; Materials Science;
   Physics
GA AB7FB
UT WOS:000331953600018
ER

PT J
AU Inoue, M
   Kaneko, H
AF Inoue, Masato
   Kaneko, Haruhiko
TI Adaptive Marker Coding for Insertion/Deletion/Substitution Error
   Correction
SO IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND
   COMPUTER SCIENCES
LA English
DT Article
DE insertion/deletion error; marker code; LDPC code; forward-backward
   algorithm
ID PATTERNED MEDIA; SYNCHRONIZATION; CHANNELS; CODES
AB This paper proposes an adaptive marker coding (AMC) for correction of insertion/deletion/substitution errors. Unlike the conventional marker codings which select marker-bit values deterministically, the AMC adaptively reverses the first and last bits of each marker as well as bits surrounding the marker. Decoding is based on a forward-backward algorithm which takes into account the dependency of bit-values around the marker. Evaluation shows that, for a channel with insertion/deletion error probability 1.8 x 10(-2), the decoded BER of existing marker coding of rate 9/16 is 4.25 x 10(-3), while that of the proposed coding with the same code rate is 1.73 x 10(-3).
C1 [Inoue, Masato; Kaneko, Haruhiko] Tokyo Inst Technol, Grad Sch Informat Sci & Engn, Tokyo 1528552, Japan.
RP Inoue, M (reprint author), Tokyo Inst Technol, Grad Sch Informat Sci & Engn, Tokyo 1528552, Japan.
EM hkaneko@fuji.cs.titech.ac.jp
RI Kaneko, Haruhiko/B-9311-2015
OI Kaneko, Haruhiko/0000-0002-3023-7338
CR Davey MC, 2001, IEEE T INFORM THEORY, V47, P687, DOI 10.1109/18.910582
   Fujita H., 2004, P 2004 IEEE INT S IN, P275
   [Anonymous], 2009, 80211N IEEE
   Inoue M., 2012, P 2012 IEEE INT S IN, P513
   Inoue M, 2012, 2012 INTERNATIONAL SYMPOSIUM ON INFORMATION THEORY AND ITS APPLICATIONS (ISITA 2012), P221
   Kasai K, 2011, IEICE T FUND ELECTR, VE94A, P2161, DOI 10.1587/transfun.E94.A.2161
   Kobayashi M., 2010, P S INF THEOR ITS AP, P432
   Kudekar S, 2011, IEEE T INFORM THEORY, V57, P803, DOI 10.1109/TIT.2010.2095072
   Levenshtein V. I., 1966, SOV PHYS DOKL, V6, P707
   Matsubara N., 2008, IPSJ S SERIES, V2008, P893
   Naito K, 2002, IEEE T MAGN, V38, P1949, DOI 10.1109/TMAG.2002.802847
   SELLERS FF, 1962, IRE T INFORM THEOR, V8, P35, DOI 10.1109/TIT.1962.1057684
   Tang Y, 2009, IEEE T MAGN, V45, P822, DOI 10.1109/TMAG.2008.2010642
   Wang F, 2011, IEEE T COMMUN, V59, P1287, DOI 10.1109/TCOMM.2011.030411.100546
   Xu J, 2007, IEEE T INFORM THEORY, V53, P121, DOI 10.1109/TIT.2006.887082
NR 15
TC 1
Z9 1
U1 0
U2 2
PU IEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG
PI TOKYO
PA KIKAI-SHINKO-KAIKAN BLDG, 3-5-8, SHIBA-KOEN, MINATO-KU, TOKYO, 105-0011,
   JAPAN
SN 0916-8508
EI 1745-1337
J9 IEICE T FUND ELECTR
JI IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
PD FEB
PY 2014
VL E97A
IS 2
BP 642
EP 651
DI 10.1587/transfun.E97.A.642
PG 10
WC Computer Science, Hardware & Architecture; Computer Science, Information
   Systems; Engineering, Electrical & Electronic
SC Computer Science; Engineering
GA AA8KA
UT WOS:000331343200026
ER

PT J
AU Bates, CM
   Maher, MJ
   Janes, DW
   Ellison, CJ
   Willson, CG
AF Bates, Christopher M.
   Maher, Michael J.
   Janes, Dustin W.
   Ellison, Christopher J.
   Willson, C. Grant
TI Block Copolymer Lithography
SO MACROMOLECULES
LA English
DT Article
ID ABC-TRIBLOCK-COPOLYMERS; SURFACE-INDUCED ORIENTATION; ORDER-DISORDER
   TRANSITION; BIT PATTERNED MEDIA; DIBLOCK COPOLYMERS; THIN-FILMS;
   POLY(METHYL METHACRYLATE); IMPRINT LITHOGRAPHY; DENSITY MULTIPLICATION;
   TEMPERATURE-DEPENDENCE
AB This Perspective addresses the current state of block copolymer lithography and identifies key challenges and opportunities within the field. Significant strides in experimental and theoretical thin film research have nucleated the transition of block copolymers "from lab to fab", but outstanding questions remain about the optimal materials, processes, and analytical techniques for first-generation devices and beyond. Particular attention herein is focused on advances and issues related to thermal annealing. Block copolymers are poised to change the traditional lithographic resolution enhancement paradigm from "top-down" to "bottom-up".
C1 [Bates, Christopher M.; Maher, Michael J.; Willson, C. Grant] Univ Texas Austin, Dept Chem, Austin, TX 78712 USA.
   [Janes, Dustin W.; Ellison, Christopher J.; Willson, C. Grant] Univ Texas Austin, McKetta Dept Chem Engn, Austin, TX 78712 USA.
RP Willson, CG (reprint author), Univ Texas Austin, Dept Chem, Austin, TX 78712 USA.
EM willson@che.utexas.edu
FU Nissan Chemical Company; Rashid Engineering Regents Chair; Welch
   Foundation [F-1709]; IBM; National Science Foundation [1120823,
   DGE-1110007]
FX We thank Nissan Chemical Company, the Rashid Engineering Regents Chair,
   and the Welch Foundation (grant #F-1709) for partial financial support.
   M.J.M. thanks the IBM Ph.D. Fellowship Program for financial support.
   SEM was performed at the microscopy facility in the Institute for
   Cellular & Molecular Biology at UT-Austin. This material is based upon
   work supported by the National Science Foundation Scalable
   Nanomanufacturing Program under Grant No. 1120823 and upon work
   supported by the National Science Foundation Graduate Research
   Fellowship under Grant No. DGE-1110007. Any opinion, findings, and
   conclusions or recommendations expressed in this material are those of
   the authors and do not necessarily reflect the views of the National
   Science Foundation.
CR Albrecht TR, 2013, IEEE T MAGN, V49, P773, DOI 10.1109/TMAG.2012.2227303
   Bang J, 2007, ADV MATER, V19, P4552, DOI 10.1002/adma.200701866
   Bates CM, 2013, J POLYM SCI POL CHEM, V51, P290, DOI 10.1002/pola.26375
   Bates CM, 2012, SCIENCE, V338, P775, DOI 10.1126/science.1226046
   Bates CM, 2011, LANGMUIR, V27, P2000, DOI 10.1021/la1042958
   Bates FS, 2012, SCIENCE, V336, P434, DOI 10.1126/science.1215368
   BATES FS, 1990, ANNU REV PHYS CHEM, V41, P525, DOI 10.1146/annurev.pc.41.100190.002521
   Bencher C., 2011, P SPIE, V7970
   Bencher C, 2012, PROC SPIE, V8323, DOI 10.1117/12.917993
   Bita I, 2008, SCIENCE, V321, P939, DOI 10.1126/science.1159352
   Bosse AW, 2011, J VAC SCI TECHNOL B, V29, DOI 10.1116/1.3581107
   Bosse AW, 2010, MACROMOL THEOR SIMUL, V19, P399, DOI 10.1002/mats.201000018
   Brown RD, 2012, FARADAY DISCUSS, V157, P307, DOI 10.1039/c2fd20016c
   CALLAGHAN TA, 1993, MACROMOLECULES, V26, P2439, DOI 10.1021/ma00062a008
   Carlson A, 2012, ADV MATER, V24, P5284, DOI 10.1002/adma.201201386
   Carter KR, 2010, ACS NANO, V4, P595, DOI 10.1021/nn100049p
   Cheng JY, 2008, ADV MATER, V20, P3155, DOI 10.1002/adma.200800826
   Cheng JY, 2002, APPL PHYS LETT, V81, P3657, DOI 10.1063/1.1519356
   Cheng JY, 2001, ADV MATER, V13, P1174, DOI 10.1002/1521-4095(200108)13:15<1174::AID-ADMA1174>3.0.CO;2-Q
   Chou SY, 1997, MICROELECTRON ENG, V35, P237, DOI 10.1016/S0167-9317(96)00097-4
   CLARK DT, 1976, J POLYM SCI POL CHEM, V14, P543, DOI 10.1002/pol.1976.170140303
   Cochran EW, 2003, MACROMOLECULES, V36, P782, DOI 10.1021/ma020651a
   COULON G, 1989, MACROMOLECULES, V22, P2581, DOI 10.1021/ma00196a006
   Cushen JD, 2012, MACROMOLECULES, V45, P8722, DOI 10.1021/ma301238j
   Cushen JD, 2012, ACS NANO, V6, P3424, DOI 10.1021/nn300459r
   Dammel RR, 2011, J PHOTOPOLYM SCI TEC, V24, P33, DOI 10.2494/photopolymer.24.33
   Delgadillo PR, 2013, PROC SPIE, V8680, DOI 10.1117/12.2011674
   Doerk GS, 2013, ACS NANO, V7, P276, DOI 10.1021/nn303974j
   Edwards EW, 2006, J VAC SCI TECHNOL B, V24, P340, DOI 10.1116/1.2151226
   Gu X., 2013, PHILOS T R SOC A, V371
   Gu XD, 2012, ADV MATER, V24, P5688, DOI 10.1002/adma.201202361
   Hammond MR, 2005, MACROMOLECULES, V38, P6575, DOI 10.1021/ma050479l
   Han SH, 2012, ACS NANO, V6, P7966, DOI 10.1021/nn3025089
   Hardy CM, 2002, MACROMOLECULES, V35, P3189, DOI 10.1021/ma0115489
   HARTNEY MA, 1985, J VAC SCI TECHNOL B, V3, P1346, DOI 10.1116/1.582991
   Heimenz P. C., 2007, POLYM CHEM
   HELFAND E, 1976, MACROMOLECULES, V9, P879, DOI 10.1021/ma60054a001
   Herr DJC, 2011, J MATER RES, V26, P122, DOI 10.1557/jmr.2010.74
   Hillmyer MA, 2005, ADV POLYM SCI, V190, P137, DOI 10.1007/12_002
   Hillmyer MA, 2007, J POLYM SCI POL PHYS, V45, P3249, DOI 10.1002/polb.21323
   Hirai T, 2009, ADV MATER, V21, P4334, DOI 10.1002/adma.200900518
   Hua F, 2004, NANO LETT, V4, P2467, DOI 10.1021/nl048355u
   Huang E, 1998, MACROMOLECULES, V31, P7641, DOI 10.1021/ma980705+
   Hustad PD, 2009, MACROMOLECULES, V42, P3788, DOI 10.1021/ma9002819
   Janes DW, 2013, MACROMOLECULES, V46, P4510, DOI 10.1021/ma400065t
   Ji SX, 2012, ACS NANO, V6, P5440, DOI 10.1021/nn301306v
   Ji SX, 2010, ACS NANO, V4, P599, DOI 10.1021/nn901342j
   Jung H, 2013, ADV FUNCT MATER, V23, P1597, DOI 10.1002/adfm.201201352
   Jung YS, 2007, NANO LETT, V7, P2046, DOI 10.1021/nl070924l
   Jung YS, 2010, NANO LETT, V10, P3722, DOI 10.1021/nl1023518
   Keen I, 2012, LANGMUIR, V28, P15876, DOI 10.1021/la304141m
   Kennemur JG, 2012, MACROMOLECULES, V45, P7228, DOI 10.1021/ma301047y
   Khanna V, 2006, MACROMOLECULES, V39, P9346, DOI 10.1021/ma0609228
   Kim HC, 2010, CHEM REV, V110, P146, DOI 10.1021/cr900159v
   Kim S, 2012, ACS MACRO LETT, V1, P11, DOI 10.1021/mz2000169
   Kim SO, 2003, NATURE, V424, P411, DOI 10.1038/nature01775
   Lee S, 2013, AICHE J, V59, P3502, DOI 10.1002/aic.14023
   Li H, 2013, MACROMOLECULES, V46, P3737, DOI 10.1021/ma400533w
   Liu CC, 2013, MACROMOLECULES, V46, P1415, DOI 10.1021/ma302464n
   Luo M, 2013, MACROMOLECULES, V46, P7567, DOI 10.1021/ma401112y
   Lynd NA, 2005, MACROMOLECULES, V38, P8803, DOI 10.1021/ma051025r
   Mansky P, 1997, PHYS REV LETT, V79, P237, DOI 10.1103/PhysRevLett.79.237
   Mansky P, 1997, SCIENCE, V275, P1458, DOI 10.1126/science.275.5305.1458
   Matsen MW, 2010, MACROMOLECULES, V43, P1671, DOI 10.1021/ma902173w
   Matsen MW, 1999, J CHEM PHYS, V111, P7139, DOI 10.1063/1.480006
   Maurer WW, 1998, J CHEM PHYS, V108, P2989, DOI 10.1063/1.475704
   MAYES AM, 1989, J CHEM PHYS, V91, P7228, DOI 10.1063/1.457290
   Meuler A. J., 2009, J CHEM PHYS, V130
   Mishra V, 2013, MACROMOLECULES, V46, P977, DOI 10.1021/ma302111c
   Mishra V, 2012, ACS NANO, V6, P2629, DOI 10.1021/nn205120j
   Moore G., 1965, ELECTRONICS, V38
   Nagpal U, 2012, ACS MACRO LETT, V1, P418, DOI 10.1021/mz200245s
   Onses MS, 2013, NAT NANOTECHNOL, V8, P667, DOI [10.1038/nnano.2013.160, 10.1038/NNANO.2013.160]
   Onses MS, 2011, ADV FUNCT MATER, V21, P3074, DOI 10.1002/adfm.201100300
   Park M, 1997, SCIENCE, V276, P1401, DOI 10.1126/science.276.5317.1401
   Park S, 2008, ACS NANO, V2, P766, DOI 10.1021/nn7004415
   Park S, 2009, SCIENCE, V323, P1030, DOI 10.1126/science.1168108
   Peng Q, 2011, ACS NANO, V5, P4600, DOI 10.1021/nn2003234
   Perera GM, 2012, ACS MACRO LETT, V1, P1244, DOI 10.1021/mz300331k
   Peters RD, 2000, LANGMUIR, V16, P4625, DOI 10.1021/1a991500c
   Peters RD, 2000, J VAC SCI TECHNOL B, V18, P3530, DOI 10.1116/1.1313572
   Qin D, 2010, NAT PROTOC, V5, P491, DOI 10.1038/nprot.2009.234
   Rathsack B, 2012, PROC SPIE, V8323, DOI 10.1117/12.916311
   Ren Y, 2000, MACROMOLECULES, V33, P866, DOI 10.1021/ma9917085
   Resnick DJ, 2005, MATER TODAY, V8, P34, DOI 10.1016/S1369-7021(05)00700-5
   Rider DA, 2007, POLYM REV, V47, P165, DOI 10.1080/15583720701271302
   Rodwogin MD, 2010, ACS NANO, V4, P725, DOI 10.1021/nn901190a
   Ruiz R., 2012, J VAC SCI TECHNOL B, V30
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Ruiz R, 2011, ACS NANO, V5, P79, DOI 10.1021/nn101561p
   RUSSELL TP, 1993, MACROMOLECULES, V26, P5819, DOI 10.1021/ma00073a044
   RUSSELL TP, 1990, MACROMOLECULES, V23, P890, DOI 10.1021/ma00205a033
   RUSSELL TP, 1989, MACROMOLECULES, V22, P4600, DOI 10.1021/ma00202a036
   Ryu DY, 2005, SCIENCE, V308, P236, DOI 10.1126/science.1106604
   Sanders DP, 2010, CHEM REV, V110, P321, DOI 10.1021/cr900244n
   Scherble J, 1999, MACROMOLECULES, V32, P1859, DOI 10.1021/ma980547m
   Segalman RA, 2001, ADV MATER, V13, P1152, DOI 10.1002/1521-4095(200108)13:15<1152::AID-ADMA1152>3.0.CO;2-5
   Seshimo T, 2012, J PHOTOPOLYM SCI TEC, V25, P125, DOI 10.2494/photopolymer.25.125
   Sheehan MT, 2013, PROC SPIE, V8682, DOI 10.1117/12.2018255
   Shin K, 2002, NANO LETT, V2, P933, DOI 10.1021/nl0256560
   Sinturel C, 2013, MACROMOLECULES, V46, P5399, DOI 10.1021/ma400735a
   Somervell M, 2012, PROC SPIE, V8325, DOI 10.1117/12.916406
   Son J. G., 2012, ACS MACRO LETT, P1279
   Sreenivasan SV, 2008, MRS BULL, V33, P854, DOI 10.1557/mrs2008.181
   Sriprom W, 2009, MACROMOLECULES, V42, P3138, DOI 10.1021/ma9004428
   Stein GE, 2010, MACROMOLECULES, V43, P433, DOI 10.1021/ma901914b
   Stoykovich MP, 2005, SCIENCE, V308, P1442, DOI 10.1126/science.1111041
   Thode CJ, 2013, NANOTECHNOLOGY, V24, DOI 10.1088/0957-4484/24/15/155602
   Ting YH, 2008, J VAC SCI TECHNOL B, V26, P1684, DOI 10.1116/1.2966433
   VILESOV AD, 1994, MACROMOL CHEM PHYSIC, V195, P2317, DOI 10.1002/macp.1994.021950704
   Wan L, 2012, J MICRO-NANOLITH MEM, V11, DOI 10.1117/1.JMM.11.3.031405
   Welander AM, 2008, MACROMOLECULES, V41, P2759, DOI 10.1021/ma800056s
   Widin JM, 2013, MACROMOLECULES, V46, P4472, DOI 10.1021/ma4004538
   Widin JM, 2012, J AM CHEM SOC, V134, P3834, DOI 10.1021/ja210548e
   Xin-Yu B., 2011, EL DEV M IEDM, P771
   Yang XM, 2009, IEEE T MAGN, V45, P833, DOI 10.1109/TMAG.2008.2010647
   Yoshida H, 2013, J PHOTOPOLYM SCI TEC, V26, P55
   Zhao Y, 2008, MACROMOLECULES, V41, P9948, DOI 10.1021/ma8013004
   ZHENG W, 1995, MACROMOLECULES, V28, P7215, DOI 10.1021/ma00125a026
NR 119
TC 152
Z9 152
U1 17
U2 177
PU AMER CHEMICAL SOC
PI WASHINGTON
PA 1155 16TH ST, NW, WASHINGTON, DC 20036 USA
SN 0024-9297
EI 1520-5835
J9 MACROMOLECULES
JI Macromolecules
PD JAN 14
PY 2014
VL 47
IS 1
BP 2
EP 12
DI 10.1021/ma401762n
PG 11
WC Polymer Science
SC Polymer Science
GA 293VL
UT WOS:000330001700002
ER

PT J
AU Wang, L
   Yang, CH
   Gai, S
   Wen, J
AF Wang, Lei
   Yang, Ci-Hui
   Gai, Shan
   Wen, Jing
TI Current Status and Future Prospects of Conventional Recording
   Technologies for Mass Storage Applications
SO CURRENT NANOSCIENCE
LA English
DT Article
DE Areal density; magnetic hard disk; mass storage; memory; optical disc;
   tape
ID BIT-PATTERNED MEDIA; EXCHANGE-COUPLED COMPOSITE; ELECTRON-BEAM
   LITHOGRAPHY; HOLOGRAPHIC DATA-STORAGE; OPTICAL-DATA STORAGE; NEAR-FIELD
   TRANSDUCER; NANOIMPRINT LITHOGRAPHY; AREAL DENSITY; COVER-LAYER;
   PHOTOCHROMIC DIARYLETHENE
AB The global digital data has increased at an unprecedented rate during the last decade due to the digitization service of every industry as well as the rapid development of information technology. It is therefore timely to enhance the areal density of the mainstream storage devices in order to meet the current storage demand. In this paper, the development history of three major families of storage devices that consist of magnetic hard disk, magnetic tape, and optical disc has been reviewed associated with their respective strength and weakness when utilized for mass storage applications. Several emerging technologies that are likely to expand the areal density of the conventional recording forms beyond the physical limits are subsequently discussed in each case. The perspectives of these three devices used as next generation data storage memory are also compared with each other in terms of the areal density roadmap. According to the comparison, hard disk that is dominating the current mass storage market will still be the favorite candidate for next-generation storage device due to its ultra-high capacity and low cost, particularly with the help of several advanced technologies such as heat assisted magnetic recording and bit patterned media. In spite of much lower capacity than hard disk today, magnetic tape has exhibited an ample margin for booming the storage capacity, and its high stability and flexible removability render it a promising contender for data backup application. The prospect of optical disc seems to be somewhat pessimistic because of the rather slow progress on its capacity and the fairly high cost per GB. It is likely that optical disc will be superseded by the mass storage devices provided that no more innovative technologies than near-field recording and holographic storage emerge in the future. However, the potential merits of optical disc like long life time and portability may offer optical disc a new application that stores important data securely for long term such as official document and government legislation.
C1 [Wang, Lei; Yang, Ci-Hui; Gai, Shan; Wen, Jing] Nanchang Hangkong Univ, Sch Informat Engn, Nanchang 330063, Peoples R China.
RP Wang, L (reprint author), Nanchang Hangkong Univ, Sch Informat Engn, Nanchang 330063, Peoples R China.
EM LeiWang@nchu.edu.cn
FU National Natural Science Foundation of China [61201439, 61202319];
   Technical Funding Program of National Human Resource Ministry of China
FX The authors acknowledge the financial supports of the National Natural
   Science Foundation of China (grant No. 61201439, 61202319) and the
   Technical Funding Program of National Human Resource Ministry of China
   for returned oversea Chinese scholars.
CR Anderson K, 2004, OPT LETT, V29, P1402, DOI 10.1364/OL.29.001402
   Anderson K., 2006, P ODS2006 QUEB, P150
   Argumedo AJ, 2008, IBM J RES DEV, V52, P513
   Badalyan A, 2011, PROC SPIE, V7996, DOI 10.1117/12.887249
   Bandic ZZ, 2008, P IEEE, V96, P1749, DOI 10.1109/JPROC.2008.2004308
   Bliss W. G., 1981, IBM Technical Disclosure Bulletin, V23, P4633
   Borg HJ, 1999, J MAGN MAGN MATER, V193, P519, DOI 10.1016/S0304-8853(98)00485-5
   BROERS AN, 1988, IBM J RES DEV, V32, P502
   Bruls D.M., 2006, P SOC PHOTO-OPT INS, V6282
   Challener WA, 2009, NAT PHOTONICS, V3, P220, DOI 10.1038/NPHOTON.2009.26
   Chen YL, 2000, P SOC PHOTO-OPT INS, V4081, P60, DOI 10.1117/12.390522
   Cherubini G, 2011, IEEE T MAGN, V47, P137, DOI 10.1109/TMAG.2010.2076797
   Choi C, 2012, JOM-US, V64, P1165, DOI 10.1007/s11837-012-0440-z
   Chou SY, 1996, J VAC SCI TECHNOL B, V14, P4129, DOI 10.1116/1.588605
   CIDECIYAN RD, 1992, IEEE J SEL AREA COMM, V10, P38, DOI 10.1109/49.124468
   Cideciyan RD, 2001, IEEE T MAGN, V37, P714, DOI 10.1109/20.917606
   Coehoorn R, 1999, IEEE T MAGN, V35, P2586, DOI 10.1109/20.800898
   Coker JD, 1998, IEEE T MAGN, V34, P110, DOI 10.1109/20.663468
   Computerworld, RES DEV NAN 50TB TAP
   Cumpston BH, 1999, NATURE, V398, P51
   Dai Q, 2010, NANO LETT, V10, P3216, DOI 10.1021/nl1022749
   Dobisz EA, 2008, P IEEE, V96, P1836, DOI 10.1109/JPROC.2008.2007600
   Dosibz E.A., 2012, J VAC SCI TECHNOL B, V30
   Eickmans J, 1999, JPN J APPL PHYS 1, V38, P1835, DOI 10.1143/JJAP.38.1835
   Eleftheriou E., 2010, B IEEE COMPUTER SOC, P1
   Erben C., 2006, P ODS2006 MONTR CAN, P209
   Fontana RE, 2012, IEEE T MAGN, V48, P1692, DOI 10.1109/TMAG.2011.2171675
   Fontaine R., 2013, P INT C AC SPEECH SI, P1
   Friedrich B., 2010, INT J MATER RES, V101, P199
   Gleeson MR, 2010, OPTIK, V121, P2273, DOI 10.1016/j.ijleo.2009.09.012
   Greaves S, 2009, IEEE T MAGN, V45, P3823, DOI 10.1109/TMAG.2009.2021663
   Hagen R, 2001, ADV MATER, V13, P1805, DOI 10.1002/1521-4095(200112)13:23<1805::AID-ADMA1805>3.3.CO;2-M
   Hamada E, 1997, JPN J APPL PHYS 1, V36, P593, DOI 10.1143/JJAP.36.593
   Han GC, 2010, IEEE T MAGN, V46, P709, DOI 10.1109/TMAG.2009.2034866
   Harasawa T, 2010, IEEE T MAGN, V46, P1894, DOI 10.1109/TMAG.2010.2042286
   Hesselink L, 2004, P IEEE, V92, P1231, DOI 10.1109/JPROC.2004.831212
   Horimai H, 2007, IEEE T MAGN, V43, P943, DOI 10.1109/TMAG.2006.888528
   Hu H, 2006, OPT MATER, V28, P904, DOI 10.1016/j.optmat.2005.08.009
   IBM, ULTR 5 1 5TB DAT CAR
   Ichimura I, 2000, JPN J APPL PHYS 1, V39, P937, DOI 10.1143/JJAP.39.937
   Ichimura I, 1997, APPL OPTICS, V36, P4339, DOI 10.1364/AO.36.004339
   Igarashi M, 2012, IEEE T MAGN, V48, P3284, DOI 10.1109/TMAG.2012.2200882
   Inoue M., 2010, P SOC PHOTO-OPT INS, V7730
   INSIC, 2012 2022 INT MAGN T
   Internet Data Center, IDC DIG UN STUD EXTR
   Internet Data Center, DIG UN 2020 BIG DAT
   Ishimoto T, 2003, JPN J APPL PHYS 1, V42, P2719, DOI 10.1143/JJAP.42.2719
   IWASAKI S, 1977, IEEE T MAGN, V13, P1272, DOI 10.1109/TMAG.1977.1059695
   Iwasaki S, 2012, J MAGN MAGN MATER, V324, P244, DOI 10.1016/j.jmmm.2010.11.092
   Jiang B., 2006, P SOC PHOTO-OPT INS, V6150
   Jubert PO, 2009, IEEE T MAGN, V45, P3601, DOI 10.1109/TMAG.2009.2022410
   KAISER W, 1961, PHYS REV LETT, V7, P229, DOI 10.1103/PhysRevLett.7.229
   Kikitsu A, 2013, IEEE T MAGN, V49, P693, DOI 10.1109/TMAG.2012.2226566
   Kim J, 2003, JPN J APPL PHYS 1, V42, P1014, DOI 10.1143/JJAP.42.1014
   Kim JH, 2007, JPN J APPL PHYS 1, V46, P3993, DOI 10.1143/JJAP.46.3993
   Kim JH, 2012, J MOD OPTIC, V59, P943, DOI 10.1080/09500340.2012.683824
   Kim JG, 2010, JPN J APPL PHYS, V49, DOI 10.1143/JJAP.49.08KC06
   Kim JG, 2009, IEEE T MAGN, V45, P2244, DOI 10.1109/TMAG.2009.2016237
   Koide D, 2008, JPN J APPL PHYS, V47, P5822, DOI 10.1143/JJAP.47.5822
   Koide D, 2012, JPN J APPL PHYS, V51, DOI 10.1143/JJAP.51.08JA04
   Koo N., 2008, NANOTECHNOLOGY, V19
   Kryder MH, 2008, P IEEE, V96, P1810, DOI 10.1109/JPROC.2008.2004315
   Lan HB, 2013, J NANOSCI NANOTECHNO, V13, P3145, DOI 10.1166/jnn.2013.7437
   Lee ML, 2010, INTERMETALLICS, V18, P119, DOI 10.1016/j.intermet.2009.06.018
   Lee S.H., 2010, P ASME ISPS2010 SANT, P325
   Lemaire PC, 2000, P SOC PHOTO-OPT INS, V4087, P775, DOI 10.1117/12.406386
   Lin XM, 2006, J MAGN MAGN MATER, V305, P100, DOI 10.1016/j.jmmm.2005.11.042
   Liu J. P., 2009, NANOSCALE MAGNETIC M
   Liu K, 2002, APPL PHYS LETT, V80, P865, DOI 10.1063/1.1436275
   Lodder JC, 2004, J MAGN MAGN MATER, V272, P1692, DOI 10.1016/j.jmmm.2003.12.259
   Ma YS, 2012, IEEE T MAGN, V48, P1813, DOI 10.1109/TMAG.2011.2170962
   Machida K, 2001, J MAGN MAGN MATER, V235, P201, DOI 10.1016/S0304-8853(01)00338-9
   Makarav D., 2010, APPL PHYS LETT, V96
   Malloy M., 2011, J MICRO-NANOLITH MEM, V10
   Mao SN, 2006, IEEE T MAGN, V42, P97, DOI 10.1109/TMAG.2005.861788
   Martynov YV, 1999, JPN J APPL PHYS 1, V38, P1786, DOI 10.1143/JJAP.38.1786
   Matsumoto A, 2010, IEEE T MAGN, V46, P1208, DOI 10.1109/TMAG.2009.2039798
   Matsunuma S, 2012, J MAGN MAGN MATER, V324, P260, DOI 10.1016/j.jmmm.2010.12.030
   McDaniel T.W., 2012, J APPL PHYS, V112
   McGlaun S., BLU RAY DISC ASS UNV
   McLeod RR, 2005, APPL OPTICS, V44, P3197, DOI 10.1364/AO.44.003197
   Mikami H., 2010, P SOC PHOTO-OPT INS, V7730
   Mishima K, 2003, P SOC PHOTO-OPT INS, V5069, P90, DOI 10.1117/12.532524
   Moneck M.T., 2010, P SOC PHOTO-OPT INS, V7823
   Motohashi K, 2008, J MAGN MAGN MATER, V320, P3004, DOI 10.1016/j.jmmm.2008.08.010
   Nagata T, 2006, IEEE T MAGN, V42, P2312, DOI 10.1109/TMAG.2006.878675
   Nozaki Y, 2012, J APPL PHYS, V112, DOI 10.1063/1.4759169
   Ohkoshi S, 2010, NAT CHEM, V2, P539, DOI [10.1038/nchem.670, 10.1038/NCHEM.670]
   Ostroverkhov V, 2009, JPN J APPL PHYS, V48, DOI 10.1143/JJAP.48.03A035
   Overton G, 2012, LASER FOCUS WORLD, V48, P39
   Park KS, 2011, IEEE T MAGN, V47, P539, DOI 10.1109/TMAG.2010.2102343
   Parkin SSP, 2008, SCIENCE, V320, P190, DOI 10.1126/science.1145799
   Pease D., 2010, P IEEE 2010 INCL VIL, P1
   Przygodda F, 2009, OPT REV, V16, P583, DOI 10.1007/s10043-009-0115-3
   Pu SZ, 2006, MATER LETT, V60, P3553, DOI 10.1016/j.matlet.2006.03.050
   Richard H.D., 2006, MRS BULL, V31, P404
   Richard H.D., 2008, P IEEE, V96, P1775
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Satoshi O., 2012, APPL PHYS EXPRESS, V5
   Satou A, 2004, P SOC PHOTO-OPT INS, V5380, P576, DOI 10.1117/12.556793
   Seagate, SEAG IS 1 MAN BREAK
   Shi X.F., 2007, J APPL PHYS, V102
   Shimada K., 2009, P ODS2009 FLOR, P61
   Shiroishi Y, 2009, IEEE T MAGN, V45, P3816, DOI 10.1109/TMAG.2009.2024879
   Suess D, 2005, J MAGN MAGN MATER, V290, P551, DOI 10.1016/j.jmmm.2004.11.525
   Suess D., 2006, APPL PHYS LETT, V89
   Sun SH, 2000, SCIENCE, V287, P1989, DOI 10.1126/science.287.5460.1989
   Takagishi M, 2002, IEEE T MAGN, V38, P2277, DOI 10.1109/TMAG.2002.802804
   Takashima Y., 2010, P SOC PHOTO-OPT INS, V7786
   Tanaka T, 2013, IEEE T MAGN, V49, P562, DOI 10.1109/TMAG.2012.2211030
   Tang Y, 2009, IEEE T MAGN, V45, P822, DOI 10.1109/TMAG.2008.2010642
   Tang YS, 2008, IEEE T MAGN, V44, P3460, DOI 10.1109/TMAG.2008.2001616
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Thirion C, 2003, NAT MATER, V2, P524, DOI 10.1038/nmat946
   Ting LH, 2008, SYNTH REACT INORG M, V38, P284, DOI 10.1080/15533170802023460
   Tominaga J, 2000, JPN J APPL PHYS 1, V39, P957, DOI 10.1143/JJAP.39.957
   Tominaga J, 1998, APPL PHYS LETT, V73, P2078, DOI 10.1063/1.122383
   Tow C.C., 2011, J NANOSCI NANOTECHNO, V11, P2704
   Victora RH, 2008, P IEEE, V96, P1799, DOI 10.1109/JPROC.2008.2004314
   Victora RH, 2005, IEEE T MAGN, V41, P2828, DOI 10.1109/TMAG.2005.855263
   Walker E., 2008, P SOC PHOTO-OPT INS, V7053
   Wang H, 2013, IEEE T MAGN, V49, P707, DOI 10.1109/TMAG.2012.2230155
   Wang JP, 2008, P IEEE, V96, P1847, DOI 10.1109/JPROC.2008.2004318
   Wang JP, 2005, IEEE T MAGN, V41, P3181, DOI 10.1109/TMAG.2005.855278
   Wang XB, 2013, IEEE T MAGN, V49, P686, DOI 10.1109/TMAG.2012.2221689
   Wood R, 2000, IEEE T MAGN, V36, P36, DOI 10.1109/20.824422
   Wood R, 2009, IEEE T MAGN, V45, P917, DOI 10.1109/TMAG.2008.2010676
   Wu AQ, 2013, IEEE T MAGN, V49, P779, DOI 10.1109/TMAG.2012.2219513
   WU YH, 1995, APPL PHYS LETT, V66, P911, DOI 10.1063/1.113594
   Yabu H, 2013, J MATER CHEM C, V1, P1558, DOI 10.1039/c3tc00882g
   Yamamoto K, 1997, JPN J APPL PHYS 1, V36, P456, DOI 10.1143/JJAP.36.456
   Yamamoto R, 2012, JPN J APPL PHYS, V51, DOI 10.1143/JJAP.51.046503
   Yang J.K.W., 2011, NANOTECHNOLOGY, V22
   Yang XM, 2009, ACS NANO, V3, P1844, DOI 10.1021/nn900073r
   Zhou N, 2011, APPL OPTICS, V50, pG42, DOI 10.1364/AO.50.000G42
   Zhou WM, 2011, NANO-MICRO LETT, V3, P135, DOI 10.3786/nml.v3i2.p135-140
   Zhu JG, 2010, IEEE T MAGN, V46, P751, DOI 10.1109/TMAG.2009.2036588
   Rizzo N.D., 2002, U.S. Patent No, Patent No. 6351409
NR 138
TC 6
Z9 6
U1 3
U2 32
PU BENTHAM SCIENCE PUBL LTD
PI SHARJAH
PA EXECUTIVE STE Y-2, PO BOX 7917, SAIF ZONE, 1200 BR SHARJAH, U ARAB
   EMIRATES
SN 1573-4137
EI 1875-6786
J9 CURR NANOSCI
JI Curr. Nanosci.
PY 2014
VL 10
IS 5
BP 638
EP 659
PG 22
WC Biotechnology & Applied Microbiology; Nanoscience & Nanotechnology;
   Materials Science, Multidisciplinary
SC Biotechnology & Applied Microbiology; Science & Technology - Other
   Topics; Materials Science
GA AO5BZ
UT WOS:000341357800002
ER

PT J
AU Saito, H
   Goto, T
   Miyajima, K
   Munkhjargal, M
   Arakawa, T
   Mitsubayashi, K
AF Saito, Hirokazu
   Goto, Teruyoshi
   Miyajima, Kumiko
   Munkhjargal, Munkhbayar
   Arakawa, Takahiro
   Mitsubayashi, Kohji
TI Odourless Watermark (Digital Chemocode) System with Biochemical Sniff
   Scanner
SO SENSORS AND MATERIALS
LA English
DT Article
DE watermark; biosniffer; odourless; volatile chemical; enzyme
ID FLAVIN-CONTAINING MONOOXYGENASE; EXHALED HYDROGEN-PEROXIDE; BIO-SNIFFER;
   AMPEROMETRIC BIOSENSOR; IMAGE WATERMARKING; MONOAMINE-OXIDASE; BREATH
   CONDENSATE; METHYL MERCAPTAN; LACTATE OXIDASE; CARBON NANOTUBE
AB Many types of identification systems such as watermark, barcode, integrated circuit (IC) tag, and fingerprint systems have been developed and utilized. These identification systems recognize physical information of the identification medium for certification information. However, an identification system that detects the chemical characteristics of a subject is not yet practicable. In this study, an odourless and invisible watermark system was developed using biochemical gas sensors (biosniffers) for detecting encoded chemical information. Each biosniffer consisted of a Clark-type dissolved oxygen electrode and an enzyme-immobilized membrane. Each enzyme (catalase, lactate oxidase, or choline oxidase) was immobilized onto a dialysis membrane by photocrosslinking with polyvinyl alcohol containing stilbazolium groups. The calibration ranges of the biosniffers for hydrogen peroxide, lactic acid, and choline vapours were from 0.4 to 12.5, 0.01 to 10.0, and 1.0 to 1000 ppm and the correlation coefficients were 0.996, 0.975, and 0.956, respectively. Each biosniffer showed a linear response to the concentration of the substrate in the gas phase. These biosniffers were used for scanning 3 bits (eight patterns) of the digital chemocode made of hydrogen peroxide, lactic acid, and choline solutions on filter paper. The three types of biosniffer successfully recognized eight patterns of odourless chemical codes.
C1 [Saito, Hirokazu] Tokyo Natl Coll Technol, Dept Mech Engn, Hachioji, Tokyo 1930997, Japan.
   [Goto, Teruyoshi; Miyajima, Kumiko; Munkhjargal, Munkhbayar; Arakawa, Takahiro; Mitsubayashi, Kohji] Tokyo Med & Dent Univ, Inst Biomat & Bioengn, Dept Biomed Devices & Instrumentat, Chiyoda Ku, Tokyo 1010062, Japan.
RP Mitsubayashi, K (reprint author), Tokyo Med & Dent Univ, Inst Biomat & Bioengn, Dept Biomed Devices & Instrumentat, Chiyoda Ku, 2-3-10 Kanda Surugadai, Tokyo 1010062, Japan.
EM m.bdi@tmd.ac.jp
OI Arakawa, Takahiro/0000-0002-1555-1281
FU Japan Society for the Promotion of Science (JSPS); Ministry of
   Education, Culture, Sports, Science and Technology (MEXT) Special Funds
   for Education and Research "Advanced Research Program in Sensing
   Biology"
FX This study was partially supported by the Japan Society for the
   Promotion of Science (JSPS) Grants-in-Aid for Scientific Research and
   the Ministry of Education, Culture, Sports, Science and Technology
   (MEXT) Special Funds for Education and Research "Advanced Research
   Program in Sensing Biology".
CR Alexander F. R., 2002, SENSOR ACTUAT B-CHEM, V81, P359
   CONSOLO S, 1987, J NEUROCHEM, V48, P1459, DOI 10.1111/j.1471-4159.1987.tb05686.x
   Emelyanov A, 2001, CHEST, V120, P1136, DOI 10.1378/chest.120.4.1136
   Fu YG, 2008, COMPUT STAND INTER, V30, P115, DOI 10.1016/j.csi.2007.08.013
   Gan X, 2004, CHEMBIOCHEM, V5, P1686, DOI 10.1002/cbic.200400080
   Guerrieri A, 2006, BIOSENS BIOELECTRON, V21, P1710, DOI 10.1016/j.bios.2005.08.005
   Horvath I, 1998, AM J RESP CRIT CARE, V158, P1042
   Huang HL, 1996, ANAL CHEM, V68, P2062, DOI 10.1021/ac960143x
   ICHIMURA K, 1984, J POLYM SCI POL CHEM, V22, P2817, DOI 10.1002/pol.1984.170221108
   Kharitonov SA, 2002, BIOMARKERS, V7, P1, DOI 10.1080/13547500110104233
   Kudo K., 2008, MICROCHIM ACTA, V160, P3421
   Liu XJ, 2005, SENSOR ACTUAT B-CHEM, V106, P284, DOI 10.1016/j.snb.2004.08.010
   Marquette CA, 2003, SENSOR ACTUAT B-CHEM, V90, P112, DOI 10.1016/S0925-4005(03)00046-7
   Marquette CA, 2003, BIOSENS BIOELECTRON, V19, P433, DOI 10.1016/S0956-5663(03)00225-2
   Minamide T, 2005, ANALYST, V130, P1490, DOI 10.1039/b506748k
   Minamide T, 2005, SENSOR ACTUAT B-CHEM, V108, P639, DOI 10.1016/j.snb.2004.11.091
   Mitala JJ, 2006, ANAL CHIM ACTA, V556, P326, DOI 10.1016/j.aca.2005.09.053
   Mitsubayashi K, 2005, SENSOR ACTUAT B-CHEM, V108, P660, DOI 10.1016/j.snb.2004.11.093
   Mitsubayashi K, 2005, BIOSENS BIOELECTRON, V20, P1573, DOI 10.1016/j.bios.2004.08.007
   Mitsubayashi K, 2004, SENSOR ACTUAT B-CHEM, V103, P463, DOI 10.1016/j.snb.2004.05.006
   Mitsubayashi K, 2006, ANAL CHIM ACTA, V573, P75, DOI 10.1016/j.aca.2006.01.062
   Montuschi P, 2002, NAT REV DRUG DISCOV, V1, P238, DOI 10.1038/nrd751
   Montuschi P, 2002, TRENDS PHARMACOL SCI, V23, P232, DOI 10.1016/S0165-6147(02)02020-5
   O'Gorman L., 1998, INFORM SECURITY TECH, V3, P21, DOI 10.1016/S1363-4127(98)80015-0
   Occupational Safety and Health Administration (OSHA), ID126SG OSHA
   Otsuka K, 2006, INT J ENVIRON AN CH, V86, P1049, DOI 10.1080/03067310600847336
   Qi HY, 2008, SIGNAL PROCESS, V88, P174, DOI 10.1016/j.sigpro.2007.07.020
   Qu FL, 2005, ANAL BIOCHEM, V344, P108, DOI 10.1016/j.ab.2005.06.007
   Rosias PPR, 2004, PEDIATR ALLERGY IMMU, V15, P4, DOI 10.1046/j.0905-6157.2003.00091.x
   Saito H, 2007, SENSOR ACTUAT B-CHEM, V123, P877, DOI 10.1016/j.snb.2006.10.045
   Saito H, 2006, INT J ENVIRON AN CH, V86, P1057, DOI 10.1080/03067310600797515
   Schuvailo ON, 2005, BIOSENS BIOELECTRON, V21, P87, DOI 10.1016/j.bios.2004.09.017
   Song Z, 2006, SENSOR ACTUAT B-CHEM, V115, P626, DOI 10.1016/j.snb.2005.10.030
   Suman S, 2005, SENSOR ACTUAT B-CHEM, V107, P768, DOI 10.1016/j.snb.2004.12.016
   Taizo I, 1998, PDA J PHARM SCI TECH, V52, P13
   Toniolo R, 2001, J ELECTROANAL CHEM, V514, P123, DOI 10.1016/S0022-0728(01)00612-X
   Walsh LJ, 2000, AUST DENT J, V45, P257, DOI 10.1111/j.1834-7819.2000.tb00261.x
   Wang K, 2006, SENSOR ACTUAT B-CHEM, V114, P1052, DOI 10.1016/j.snb.2005.07.066
   Wang L, 2008, PATTERN RECOGN, V41, P920, DOI 10.1016/j.patcog.2007.07.012
   Watt Barbara E, 2004, Toxicol Rev, V23, P51, DOI 10.2165/00139709-200423010-00006
   Wu XQ, 2004, PATTERN RECOGN, V37, P1987, DOI 10.1016/j.patcog.2004.02.015
   Xiaoqiang C., 2007, BIOSENS BIOELECTRON, V22, P3288
   Xin Q, 1997, BRAIN RES, V776, P126, DOI 10.1016/S0006-8993(97)00996-7
   Xu Y, 2004, BIOSENS BIOELECTRON, V20, P533, DOI 10.1016/j.bios.2004.02.017
   Yang MH, 2005, ANAL CHIM ACTA, V530, P205, DOI 10.1016/j.aca.2004.09.010
   Zhou H, 2005, ANAL CHEM, V77, P6102, DOI 10.1021/ac050924a
NR 46
TC 0
Z9 0
U1 0
U2 4
PU MYU, SCIENTIFIC PUBLISHING DIVISION
PI TOKYO
PA 1-23-3-303 SENDAGI, TOKYO, 113-0022, JAPAN
SN 0914-4935
J9 SENSOR MATER
JI Sens. Mater.
PY 2014
VL 26
IS 3
BP 109
EP 119
PG 11
WC Instruments & Instrumentation; Materials Science, Multidisciplinary
SC Instruments & Instrumentation; Materials Science
GA AG3BM
UT WOS:000335290800002
ER

PT J
AU Huda, M
   Liu, J
   Bin Mohamad, Z
   Yin, Y
   Hosaka, S
AF Huda, Miftakhul
   Liu, Jing
   Bin Mohamad, Zulfakri
   Yin, You
   Hosaka, Sumio
TI Attempts to form the 10-nm-order pitch of self-assembled nanodots using
   PS-PDMS block copolymer
SO INTERNATIONAL JOURNAL OF NANOTECHNOLOGY
LA English
DT Article
DE nanolithography; self-assembly; block copolymer; nanodot; bit patterned
   media; magnetic storage
ID DIBLOCK COPOLYMER; FABRICATION; NANOLITHOGRAPHY; TEMPLATES
AB Block copolymer (BCP) self-assembly exhibits its ability to form various nanostructures with a size down to 3 nm, which is particularly attractive for emerging technologies such as bit patterned media (BPM). Poly(styrene-b-dimethyl siloxane) (PS-PDMS) has been acknowledged as the most promising block copolymer for self-assembly fabrication due to its possibility to form nanopattern with a fine pitch, high etching selectivity, and its characteristic of robustness for pattern transfer. Here, we attempt to form PS-PDMS self-assembled nanodot array with a 10-nm-order pitch in order to satisfy the demand of low cost technique to form ultrahigh density nanodot array for BPM, which is regarded as the next-generation magnetic recording media, and for quantum devices such as the third-generation quantum dot photovoltaic cell and future battery cell. In this study, self-assembled nanodot array on a large area with pitches of 11 nm (sigma = 2.08 nm) and 10 nm (sigma = 1.61 nm) was formed using PS-PDMS with molecular weights of 5600-1300 g/mol (minority block volume fraction f(PDMS) = 19.8%) and 4700-1200 g/mol (f(PDMS) = 21.4%), respectively. In experiments, it was shown that some critical parameters, such as the thickness of PS-PDMS film, the treatment of the substrate surface, and annealing condition, played crucial roles in forming 10-nm-order size of self-assembled nanodot array using PS-PDMS. The relationships between pitches of PS-PDMS nanodot array and the product of the total number of segments and the Flory-Huggins segmental interaction parameter (chi N) obtained by calculations and experiments will be discussed. Based on the position of PS-PDMS on mean-field phase diagram for BCP melts, the possibility to form nanodot array with a pitch of less than 10 nm is described. This study promises to open way toward the fabrication of more than 7.45 Tbit/in.(2) storage devices and the application of quantum devices.
C1 [Huda, Miftakhul; Liu, Jing] Gunma Univ, Grad Sch Engn, Kiryu, Gumma 3768515, Japan.
   [Bin Mohamad, Zulfakri] Gunma Univ, Adv Technol Res Ctr, Kiryu, Gumma 3768515, Japan.
   [Yin, You; Hosaka, Sumio] Gunma Univ, Div Elect & Informat, Kiryu, Gumma 3768515, Japan.
RP Huda, M (reprint author), Gunma Univ, Grad Sch Engn, 1-5-1 Tenjin Cho, Kiryu, Gumma 3768515, Japan.
EM t12802274@gunma-u.ac.jp; t11801376@gunma-u.ac.jp;
   zulfakri@atec.gunma-u.ac.jp; yinyou@gunma-u.ac.jp;
   hosaka@el.gunma-u.ac.jp
FU New Energy and Industrial Technology Development Organization (NEDO)
   under the development of nanobit technology for the ultrahigh density
   magnetic recording (Green IT) project; Ministry of Education, Culture,
   Sports, Science and Technology of Japan [24686042, 21710135, 24360003];
   JST Sentan Grant [H24sentan181-25];  [25-6425]
FX This work was supported by the New Energy and Industrial Technology
   Development Organization (NEDO) under the development of nanobit
   technology for the ultrahigh density magnetic recording (Green IT)
   project, Grant-in-Aid for Japan Society for the Promotion of Science
   (JSPS) Fellows (No. 25-6425), Grant-in-Aid for Young Scientists from the
   Ministry of Education, Culture, Sports, Science and Technology of Japan
   (Nos. 24686042, 21710135, 24360003), and JST Sentan Grant Number
   H24sentan181-25.
CR Aissou K, 2007, SURF SCI, V601, P2611, DOI 10.1016/j.susc.2006.12.017
   BATES FS, 1990, ANNU REV PHYS CHEM, V41, P525, DOI 10.1146/annurev.pc.41.100190.002521
   Chao CC, 2010, ACS NANO, V4, P2088, DOI 10.1021/nn901370g
   Cheng JY, 2002, APPL PHYS LETT, V81, P3657, DOI 10.1063/1.1519356
   Fata P.L., 2008, SUPERLATTICE MICROST, V44, P693
   Hieda H, 2006, J PHOTOPOLYM SCI TEC, V19, P425, DOI 10.2494/photopolymer.19.425
   Hirai T., 2009, ADV MATER, V21, P1
   Hosaka S, 2011, MICROELECTRON ENG, V88, P2571, DOI 10.1016/j.mee.2011.01.005
   Huda M, 2012, JPN J APPL PHYS, V51, DOI 10.1143/JJAP.51.06FF10
   Huda M, 2011, AIP CONF PROC, V1415, DOI 10.1063/1.3667225
   Huda M, 2011, JPN J APPL PHYS, V50, DOI 10.1143/JJAP.50.06GG06
   Huda M, 2011, KEY ENG MATER, V459, P120, DOI 10.4028/www.scientific.net/KEM.459.120
   Jung YS, 2007, NANO LETT, V7, P2046, DOI 10.1021/nl070924l
   Kim SJ, 2008, J VAC SCI TECHNOL B, V26, P189, DOI 10.1116/1.2830693
   Knoll A., 2002, PHYS REV LETT, V89
   Ross CA, 2008, J VAC SCI TECHNOL B, V26, P2489, DOI 10.1116/1.2981079
NR 16
TC 0
Z9 0
U1 3
U2 22
PU INDERSCIENCE ENTERPRISES LTD
PI GENEVA
PA WORLD TRADE CENTER BLDG, 29 ROUTE DE PRE-BOIS, CASE POSTALE 856, CH-1215
   GENEVA, SWITZERLAND
SN 1475-7435
EI 1741-8151
J9 INT J NANOTECHNOL
JI Int. J. Nanotechnol.
PY 2014
VL 11
IS 5-8
BP 425
EP 433
DI 10.1504/IJNT.2014.060561
PG 9
WC Nanoscience & Nanotechnology; Materials Science, Multidisciplinary
SC Science & Technology - Other Topics; Materials Science
GA AF6VD
UT WOS:000334851800006
ER

PT J
AU Wu, T
   Armand, MA
   Cruz, JR
AF Wu, Tong
   Armand, Marc A.
   Cruz, J. R.
TI Detection-Decoding on BPMR Channels With Written-In Error Correction and
   ITI Mitigation
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Bit-patterned media (BPM); channel detection; Davey-MacKay (DM)
   construction; inter-track interference; written-in errors
ID BIT-PATTERNED-MEDIA; INTERFERENCE MITIGATION; SYNCHRONIZATION ERRORS;
   STORAGE; CODES; MODEL
AB Written-in errors and inter-track interference (ITI) are recognized as key and unique performance-limiting factors in bit-patterned media recording (BPMR). Hence, in this paper, we consider data recovery on a BPMR channel model consisting of a write channel producing data-dependent written-in errors followed by a partial response read channel with the addition of ITI. The Davey-MacKay (DM) serial concatenated coding scheme is employed to handle the written-in errors while multi-track (MT) detection and 2D-equalization are used to mitigate the inter-symbol interference (ISI) and ITI. Three detection-inner-decoding schemes are proposed to work with an outer decoder to recover the data on the BPMR channel, namely the BCJR-binary-input-inner-decoder (BCJR-BIID) algorithm, the joint detection-inner-decoder (JDD) algorithm and the BCJR-soft-input-inner-decoder (BCJR-SIID) algorithm. Media configurations leading to areal densities of 2.64 Tb/in(2) and 4 Tb/in(2) with comparable ISI but significantly higher ITI in the latter case are considered. Computer simulations show that at low to moderate (resp., high) signal-to-noise ratios (SNRs), BCJR-SIID (resp., BCJR-BIID) provides good performance-complexity trade-offs. It is also shown that increasing the areal density from 2.64 Tb/in(2) to 4 Tb/in(2) while the written-in error rates remain fixed, does not significantly affect error performance on the BPMR channel. Rather, it is the burst errors preceding and following an insertion or deletion that has a significant impact on performance.
C1 [Wu, Tong; Armand, Marc A.] Natl Univ Singapore, Dept Elect & Comp Engn, Singapore 117576, Singapore.
   [Cruz, J. R.] Univ Oklahoma, Sch Elect & Comp Engn, Norman, OK 73019 USA.
RP Armand, MA (reprint author), Natl Univ Singapore, Dept Elect & Comp Engn, Singapore 117576, Singapore.
EM eleama@nus.edu.sg
FU Singapore National Research Foundation under CRP Award [NRF-CRP
   4-2008-06]
FX The authors would like to thank the anonymous reviewers for their
   insightful comments and suggestions which helped improve the quality of
   this paper. This work was supported by the Singapore National Research
   Foundation under CRP Award No. NRF-CRP 4-2008-06.
CR Briffa J., 2010, P IEEE INT C COMM CA, P1
   CAI K, 2010, IEEE GLOBECOM WORKSH, P1910
   Chang W, 2011, IEEE T MAGN, V47, P2551, DOI 10.1109/TMAG.2011.2151839
   Chang W, 2010, IEEE T MAGN, V46, P3899, DOI 10.1109/TMAG.2010.2056926
   Davey MC, 2001, IEEE T INFORM THEORY, V47, P687, DOI 10.1109/18.910582
   Hu J, 2007, IEEE T MAGN, V43, P3517, DOI 10.1109/TMAG.2007.898307
   Hu XY, 2005, IEEE T INFORM THEORY, V51, P386, DOI 10.1109/TIT.2004.839541
   Iyengar A. R., 2009, P 47 ANN ALL C COMM, P620
   Iyengar AR, 2011, IEEE T MAGN, V47, P35, DOI 10.1109/TMAG.2010.2080667
   Jiao X., 2012, J ETRI, V34, P637
   Jiao XP, 2012, IEEE COMMUN LETT, V16, P722, DOI 10.1109/LCOMM.2012.032612.112621
   [Anonymous], 2011, P IEEE INT S INF THE, DOI DOI 10.1109/ISIT.2011.6034232
   Karakulak S, 2008, IEEE T MAGN, V44, P193, DOI 10.1109/TMAG.2007.912837
   Mansour MF, 2010, IEEE J SEL AREA COMM, V28, P218, DOI 10.1109/JSAC.2010.100211
   Mercier H, 2010, IEEE COMMUN SURV TUT, V12, P87, DOI 10.1109/SURV.2010.020110.00079
   Moon J., 1995, IEEE T MAGN, V31, P1083
   Nabavi S., 2008, THESIS CARNEGIE MELL
   Nabavi S, 2007, IEEE ICC, P6249, DOI 10.1109/ICC.2007.1035
   Ng YB, 2010, IEEE T MAGN, V46, P2268, DOI 10.1109/TMAG.2010.2043926
   Nutter PW, 2005, IEEE T MAGN, V41, P4327, DOI 10.1109/TMAG.2005.856586
   Richardson TJ, 2001, IEEE T INFORM THEORY, V47, P599, DOI 10.1109/18.910577
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Shiroishi Y, 2009, IEEE T MAGN, V45, P3816, DOI 10.1109/TMAG.2009.2024879
   Wang F, 2011, IEEE T COMMUN, V59, P1287, DOI 10.1109/TCOMM.2011.030411.100546
   Wu T, 2011, 8 INT C INF COMM SIG, P1
   Wu T, 2013, IEEE T MAGN, V49, P3779, DOI 10.1109/TMAG.2013.2250262
   Wu T, 2013, IEEE T MAGN, V49, P489, DOI 10.1109/TMAG.2012.2208120
   Zhang SH, 2011, IEEE T MAGN, V47, P2555, DOI 10.1109/TMAG.2011.2155628
   Zhang SH, 2010, IEEE T MAGN, V46, P1363, DOI 10.1109/TMAG.2010.2040713
NR 29
TC 2
Z9 2
U1 0
U2 4
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JAN
PY 2014
VL 50
IS 1
AR 3000211
DI 10.1109/TMAG.2013.2281779
PN 2
PG 11
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA AC4BB
UT WOS:000332464500004
ER

PT J
AU Suharyadi, E
   Kato, T
   Iwata, S
AF Suharyadi, Edi
   Kato, Takeshi
   Iwata, Satoshi
TI Controlling the Magnetic Properties of Cr-Implanted Co/Pt Multilayer
   Films Using Ion Irradiation for Planar Patterned Media
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Atom implantation; Co/Pt multilayers; ion beam irradiation; planar bit
   patterned media
ID NANOSTRUCTURES
AB We have investigated the modification of the microstructure and magnetic properties of Co/Pt multilayer films with various layer structures using ion beam irradiation. Cr/[Co/Pt] multilayer films prepared by a magnetron sputtering deposition on a surface oxidized Si substrate were irradiated by 30 keV Kr+ ion beam with various ion doses from 1 x 10(14) to 5 x 10(15) ions/cm(2). The modifications of magnetic properties and microstructures due to Kr+ ion irradiation depended on Co/Pt layer structures. The as-prepared [Co(0.4 nm)/Pt(0.45 nm)](15) multilayer films were confirmed to exhibit the square shaped M-H loop and the perpendicular easy axis with a saturation magnetization of 620 emu/cc and coercivity of 1.1 kOe. After the irradiation with ion dose of 5 x 10(15) ions/cm(2), the easy axis changes from perpendicular to in-plane direction. The coercivity and saturation magnetization decrease down to 2% and 13% of its original values, respectively. The decrease of coercivity and saturation magnetization is due to the implantation of the Cr atom in the top most layers into Co/Pt multilayer films caused by Kr+ ion irradiation, as confirmed from Auger electron spectroscopy (AES) depth profiles.
C1 [Suharyadi, Edi] Gadjah Mada Univ, Dept Phys, Yogyakarta, Indonesia.
   [Kato, Takeshi; Iwata, Satoshi] Nagoya Univ, Dept Quantum Engn, Chikusa Ku, Nagoya, Aichi 4648601, Japan.
RP Suharyadi, E (reprint author), Gadjah Mada Univ, Dept Phys, Yogyakarta, Indonesia.
EM esuharyadi@ugm.ac.id
RI Kato, Takeshi/I-2654-2013
CR Blon T, 2007, NUCL INSTRUM METH B, V257, P374, DOI 10.1016/j.nimb.2007.01.264
   Chappert C, 1998, SCIENCE, V280, P1919, DOI 10.1126/science.280.5371.1919
   Cho J, 1999, J APPL PHYS, V86, P3149, DOI 10.1063/1.371181
   Davies JE, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3179553
   Ferre J, 1999, J MAGN MAGN MATER, V198-99, P191, DOI 10.1016/S0304-8853(98)01084-1
   Folks L, 2003, J PHYS D APPL PHYS, V36, P2601, DOI 10.1088/0022-3727/36/21/001
   Hinoue T, 2010, IEEE T MAGN, V46, P1584, DOI 10.1109/TMAG.2010.2043416
   Hyndman R, 2001, J APPL PHYS, V90, P3843, DOI 10.1063/1.1401803
   Kato T., 2009, J APPL PHYS, V105
   Kato T., 2009, J APPL PHYS, V106
   Kim S, 2012, NAT NANOTECHNOL, V7, P567, DOI [10.1038/nnano.2012.125, 10.1038/NNANO.2012.125]
   Suharyadi E, 2006, IEEE T MAGN, V42, P2972, DOI 10.1109/TMAG.2006.880076
   Suharyadi E, 2005, IEEE T MAGN, V41, P3595, DOI 10.1109/TMAG.2005.854735
   Terris BD, 1999, APPL PHYS LETT, V75, P403, DOI 10.1063/1.124389
   Urbaniak M, 2009, ACTA PHYS POL A, V115, P326
   Ziegler J. F., 1985, STOPPING RANGE IONS
NR 16
TC 0
Z9 0
U1 1
U2 14
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JAN
PY 2014
VL 50
IS 1
AR 3000104
DI 10.1109/TMAG.2013.2279272
PN 1
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 294EY
UT WOS:000330026800086
ER

PT J
AU Griffiths, RA
   Williams, A
   Oakland, C
   Roberts, J
   Vijayaraghavan, A
   Thomson, T
AF Griffiths, Rhys Alun
   Williams, Aled
   Oakland, Chloe
   Roberts, Jonathan
   Vijayaraghavan, Aravind
   Thomson, Thomas
TI Directed self-assembly of block copolymers for use in bit patterned
   media fabrication
SO JOURNAL OF PHYSICS D-APPLIED PHYSICS
LA English
DT Review
ID ELECTRON-BEAM LITHOGRAPHY; SEQUENTIAL INFILTRATION SYNTHESIS; FLASH
   IMPRINT LITHOGRAPHY; HARD-DISK DRIVES; DIBLOCK COPOLYMER; NANOIMPRINT
   LITHOGRAPHY; DENSITY MULTIPLICATION; POLY(METHYL METHACRYLATE);
   RESOLUTION LIMITS; RECORDING MEDIA
AB Reduction of the bit size in conventional magnetic recording media is becoming increasingly difficult due to the superparamagnetic limit. Bit patterned media (BPM) has been proposed as a replacement technology as it will enable hard disk areal densities to increase past 1 Tb in(-2). Block copolymer directed self-assembly (BCP DSA) is the leading candidate for forming BPM due to its ability to create uniform patterns over macroscopic areas. Here we review the latest research into two different BCP DSA techniques: graphoepitaxy and chemoepitaxy (or chemical prepatterning). In addition to assessing their potential for forming high density bit patterns, we also review current approaches using these techniques for forming servo patterns, which are required for hard disk drive (HDD) operation. Finally, we review the current state of UV nanoimprint lithography, which is the favoured technique for enabling mass production of BPM HDDs.
C1 [Griffiths, Rhys Alun; Vijayaraghavan, Aravind; Thomson, Thomas] Univ Manchester, Sch Comp Sci, Manchester M13 9PL, Lancs, England.
   [Griffiths, Rhys Alun; Williams, Aled; Oakland, Chloe; Roberts, Jonathan] Univ Manchester, Northwest Nanosci Doctoral Training Ctr NOWNano D, Manchester M13 9PL, Lancs, England.
RP Griffiths, RA (reprint author), Univ Manchester, Sch Comp Sci, Manchester M13 9PL, Lancs, England.
EM rhys.griffiths-2@postgrad.manchester.ac.uk
RI Vijayaraghavan, Aravind/E-1087-2011
OI Vijayaraghavan, Aravind/0000-0001-8289-2337; Williams,
   Aled/0000-0002-8757-0406; Thomson, Thomas/0000-0002-4110-1567
FU Engineering and Physical Science Research Council (EPSRC) North West
   Nanoscience Doctoral Training Centre (NOWNANO DTC) [EP/G017905/1]
FX The authors acknowledge the Engineering and Physical Science Research
   Council (EPSRC) North West Nanoscience Doctoral Training Centre (NOWNANO
   DTC) grant reference EP/G017905/1.
CR Albrecht TR, 2013, IEEE T MAGN, V49, P773, DOI 10.1109/TMAG.2012.2227303
   Albrecht TR, 2009, NANOSCALE MAGNETIC MATERIALS AND APPLICATIONS, P237, DOI 10.1007/978-0-387-85600-1_9
   Albrecht T R, 2013, SPIE ADV LITH C SAN
   Auzelyte V, 2009, J MICRO-NANOLITH MEM, V8, DOI 10.1117/1.3116559
   Bailey T, 2000, J VAC SCI TECHNOL B, V18, P3572, DOI 10.1116/1.1324618
   BATES FS, 1990, ANNU REV PHYS CHEM, V41, P525, DOI 10.1146/annurev.pc.41.100190.002521
   Berry BC, 2007, NANO LETT, V7, P2789, DOI 10.1021/nl071354s
   Biswas A, 2012, ADV COLLOID INTERFAC, V170, P2, DOI 10.1016/j.cis.2011.11.001
   Bita I, 2008, SCIENCE, V321, P939, DOI 10.1126/science.1159352
   Chang JB, 2012, ACS NANO, V6, P2071, DOI 10.1021/nn203767s
   CHANG THP, 1975, J VAC SCI TECHNOL, V12, P1271, DOI 10.1116/1.568515
   Cheng JY, 2008, ADV MATER, V20, P3155, DOI 10.1002/adma.200800826
   Cheng JY, 2006, ADV MATER, V18, P2505, DOI 10.1002/adma.200502651
   Cheng JY, 2001, ADV MATER, V13, P1174, DOI 10.1002/1521-4095(200108)13:15<1174::AID-ADMA1174>3.0.CO;2-Q
   Cheng JY, 2004, NAT MATER, V3, P823, DOI 10.1038/nmat1211
   Chevalier X, 2013, J MICRO-NANOLITH MEM, V12, DOI 10.1117/1.JMM.12.3.031102
   Chou SY, 1996, J VAC SCI TECHNOL B, V14, P4129, DOI 10.1116/1.588605
   Darling SB, 2007, PROG POLYM SCI, V32, P1152, DOI 10.1016/j.progpolymsci.2007.05.004
   Dauksher WJ, 2007, EMERGING LITHOGRAPHI, V6517
   Dauksher WJ, 2007, EMERGING LITHOGRAPHI, V6517
   De Rosa C, 2000, NATURE, V405, P433
   Dobisz EA, 2008, P IEEE, V96, P1836, DOI 10.1109/JPROC.2008.2007600
   Dusa M, 2007, OPTICAL MICROLITHO 1, V6520, pG5200
   Edwards EW, 2004, ADV MATER, V16, P1315, DOI 10.1002/adma.200400763
   Fontana RE, 2012, IEEE T MAGN, V48, P1692, DOI 10.1109/TMAG.2011.2171675
   Hadjichristidis N., 2002, BLOCK COPOLYMERS SYN
   HADZIIOANNOU G, 1979, COLLOID POLYM SCI, V257, P136, DOI 10.1007/BF01638138
   Han Y, 2009, IEEE T MAGN, V45, P5352, DOI 10.1109/TMAG.2009.2025035
   Hellwig O, 2007, APPL PHYS LETT, V90, DOI 10.1063/1.2730744
   Hong SW, 2011, ACS NANO, V5, P2855, DOI 10.1021/nn103401w
   Hu G, 2004, J APPL PHYS, V95, P7013, DOI 10.1063/1.1669343
   Hughes EC, 2003, J APPL PHYS, V93, P7002, DOI 10.1063/1.1557937
   Jung W Y, 2007, OPTICAL MICROLITHO 1, V6520, pC5201
   Jung YS, 2008, NANO LETT, V8, P2975, DOI 10.1021/nl802011w
   Kamata Y, 2007, JPN J APPL PHYS 1, V46, P999, DOI 10.1143/JJAP.46.999
   Kamata Y, 2011, IEEE T MAGN, V47, P51, DOI 10.1109/TMAG.2010.2077274
   Kanda K, 2013, IEEE J SOLID-ST CIRC, V48, P1590
   Kihara N, 2008, EMERGING LITHOGRAPHI, V6921
   Kihara N, 2012, J VAC SCI TECHNOL B, V30
   Kikitsu A, 2013, IEEE T MAGN, V49, P693, DOI 10.1109/TMAG.2012.2226566
   Kim SO, 2003, NATURE, V424, P411, DOI 10.1038/nature01775
   Kryder MH, 2008, P IEEE, V96, P1810, DOI 10.1109/JPROC.2008.2004315
   Li WH, 2011, J CHEM PHYS, V134, DOI 10.1063/1.3572266
   Lille J, 2012, IEEE T MAGN, V48, P2757, DOI 10.1109/TMAG.2012.2192916
   Lille J, 2011, PROC SPIE, V8166, DOI 10.1117/12.898785
   Lin XD, 2000, J APPL PHYS, V87, P5117, DOI 10.1063/1.373267
   Liu G. L., 2011, J VAC SCI TECHNOL B, V29
   Lodge TP, 2003, MACROMOL CHEM PHYSIC, V204, P265, DOI 10.1002/macp.200290073
   Long BK, 2007, J MATER CHEM, V17, P3575, DOI 10.1039/b705388f
   Malloy M, 2010, ALTERNATIVE LITHOGRA, V7637
   Malloy M, 2011, J MICRO-NANOLITH MEM, V10, DOI 10.1117/1.3642641
   Manfrinato VR, 2013, NANO LETT, V13, P1555, DOI 10.1021/nl304715p
   McDaniel TW, 2012, J APPL PHYS, V112, DOI 10.1063/1.4764336
   McDaniel TW, 2005, J PHYS-CONDENS MAT, V17, pR315, DOI 10.1088/0953-8984/17/7/R01
   Morkved TL, 1996, SCIENCE, V273, P931, DOI 10.1126/science.273.5277.931
   Moser A, 2002, J PHYS D APPL PHYS, V35, pR157, DOI 10.1088/0022-3727/35/19/201
   Moser A, 2007, APPL PHYS LETT, V91, DOI 10.1063/1.2799174
   Naito K, 2002, IEEE T MAGN, V38, P1949, DOI 10.1109/TMAG.2002.802847
   Nardin C, 2000, LANGMUIR, V16, P1035, DOI 10.1021/la990951u
   Ni YZ, 1996, J AM CHEM SOC, V118, P4102, DOI 10.1021/ja953805t
   Ootera Y, 2011, ALTERNATIVE LITHOGRA, V7970
   Park S, 2009, SCIENCE, V323, P1030, DOI 10.1126/science.1168108
   Patel K C, 2012, ALTERNATIVE LITHOGRA, V8323
   Peng Q, 2011, ACS NANO, V5, P4600, DOI 10.1021/nn2003234
   Peng Q, 2010, ADV MATER, V22, P5129, DOI 10.1002/adma.201002465
   Piramanayagam SN, 2007, J APPL PHYS, V102, DOI 10.1063/1.2750414
   Piramanayagam SN, 2009, J MAGN MAGN MATER, V321, P485, DOI 10.1016/j.jmmm.2008.05.007
   Pochan DJ, 2004, SCIENCE, V306, P94, DOI 10.1126/science.1102866
   Richter HJ, 2007, J PHYS D APPL PHYS, V40, pR149, DOI 10.1088/0022-3727/40/9/R01
   Richter HJ, 2012, J APPL PHYS, V111, DOI 10.1063/1.3681297
   Richter HJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2209179
   Ross C, 2001, ANN REV MATER RES, V31, P203, DOI 10.1146/annurev.matsci.31.1.203
   Ross CA, 2008, MRS BULL, V33, P838, DOI 10.1557/mrs2008.179
   Ross CA, 2007, MICROLITHOGR WORLD, V16, P4
   Ruiz R., 2012, J VAC SCI TECHNOL B, V30
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Ruiz R, 2011, ACS NANO, V5, P79, DOI 10.1021/nn101561p
   RUSSELL TP, 1990, MACROMOLECULES, V23, P890, DOI 10.1021/ma00205a033
   Sarkar SS, 2010, MICROELECTRON ENG, V87, P854, DOI 10.1016/j.mee.2009.12.053
   Schabes ME, 2008, J MAGN MAGN MATER, V320, P2880, DOI 10.1016/j.jmmm.2008.07.035
   Schift H, 2008, J VAC SCI TECHNOL B, V26, P458, DOI 10.1116/1.2890972
   Schmid G, 2009, SPIE P, V7488
   Schmid GM, 2009, J VAC SCI TECHNOL B, V27, P573, DOI 10.1116/1.3081981
   Segalman RA, 2001, ADV MATER, V13, P1152, DOI 10.1002/1521-4095(200108)13:15<1152::AID-ADMA1152>3.0.CO;2-5
   Selinidis K S, 2011, ALTERNATIVE LITHOGRA, V7970
   Shaw JM, 2007, J APPL PHYS, V101, DOI 10.1063/1.2431399
   Shiroishi Y, 2009, IEEE T MAGN, V45, P3816, DOI 10.1109/TMAG.2009.2024879
   Singh L, 2011, J MICRO-NANOLITH MEM, V10, DOI 10.1117/1.3625635
   Singh S, 2010, PHOTOMASK TECHNOLOGY, V7823
   Singhal S, 2012, METROLOGY INSPECTI 1, V8324
   Solak HH, 2007, J VAC SCI TECHNOL B, V25, P2123, DOI 10.1116/1.2799974
   Tada Y, 2009, POLYMER, V50, P4250, DOI 10.1016/j.polymer.2009.06.039
   Tada Y, 2008, MACROMOLECULES, V41, P9267, DOI 10.1021/ma801542y
   Tang QY, 2010, SOFT MATTER, V6, P4460, DOI 10.1039/c0sm00238k
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Thomson T, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.257204
   Thurn-Albrecht T, 2000, ADV MATER, V12, P787, DOI 10.1002/(SICI)1521-4095(200006)12:11<787::AID-ADMA787>3.0.CO;2-1
   Ting YH, 2008, J VAC SCI TECHNOL B, V26, P1684, DOI 10.1116/1.2966433
   Tseng YC, 2012, ADV MATER, V24, P2608, DOI 10.1002/adma.201104871
   Tseng YC, 2011, J PHYS CHEM C, V115, P17725, DOI 10.1021/jp205532e
   Tseng YC, 2011, J MATER CHEM, V21, P11722, DOI 10.1039/c1jm12461g
   Tseng YC, 2010, POLYMERS-BASEL, V2, P470, DOI 10.3390/polym2040470
   Vieu C, 2000, APPL SURF SCI, V164, P111, DOI 10.1016/S0169-4332(00)00352-4
   Wagner C, 2010, NAT PHOTONICS, V4, P24
   Wan L, 2012, J MICRO-NANOLITH MEM, V11, DOI 10.1117/1.JMM.11.3.031405
   Wan L, 2009, LANGMUIR, V25, P12408, DOI 10.1021/la901648y
   Wang H, 2013, IEEE T MAGN, V49, P707, DOI 10.1109/TMAG.2012.2230155
   Wang XB, 2013, IEEE T MAGN, V49, P686, DOI 10.1109/TMAG.2012.2221689
   Weller D, 1999, IEEE T MAGN, V35, P4423, DOI 10.1109/20.809134
   Whitesides GM, 2002, SCIENCE, V295, P2418, DOI 10.1126/science.1070821
   Wood R, 2000, IEEE T MAGN, V36, P36, DOI 10.1109/20.824422
   Xiao SG, 2005, NANOTECHNOLOGY, V16, pS324, DOI 10.1088/0957-4484/16/7/003
   Xiao SG, 2013, J MICRO-NANOLITH MEM, V12, DOI 10.1117/1.JMM.12.3.031110
   Xiao SAG, 2011, NANOTECHNOLOGY, V22, DOI 10.1088/0957-4484/22/30/305302
   Xiao SG, 2009, ADV MATER, V21, P2516, DOI 10.1002/adma.200802087
   Yamamoto R, 2012, JPN J APPL PHYS, V51, DOI 10.1143/JJAP.51.046503
   Yang X, 2007, J VAC SCI TECHNOL B, V25, P2202, DOI 10.1116/1.2798711
   Yang XM, 2008, J VAC SCI TECHNOL B, V26, P2604, DOI 10.1116/1.2978487
   Yang XM, 2009, ACS NANO, V3, P1844, DOI 10.1021/nn900073r
   Yang XM, 2009, IEEE T MAGN, V45, P833, DOI 10.1109/TMAG.2008.2010647
   Ye Z. M., 2011, ALTERNATIVE LITHOGRA, V7970
   Ye Z M, 2012, ALTERNATIVE LITHOGRA, V8323
   Zhao DY, 1998, J AM CHEM SOC, V120, P6024, DOI 10.1021/ja974025i
   Poulsen V, 1899, Danish Patent, Patent No. 2653
NR 124
TC 20
Z9 20
U1 5
U2 80
PU IOP PUBLISHING LTD
PI BRISTOL
PA TEMPLE CIRCUS, TEMPLE WAY, BRISTOL BS1 6BE, ENGLAND
SN 0022-3727
EI 1361-6463
J9 J PHYS D APPL PHYS
JI J. Phys. D-Appl. Phys.
PD DEC 18
PY 2013
VL 46
IS 50
AR 503001
DI 10.1088/0022-3727/46/50/503001
PG 29
WC Physics, Applied
SC Physics
GA AA5MN
UT WOS:000331143600001
ER

PT J
AU Nandi, S
   Johnson, NF
   Cohn, JL
AF Nandi, Shubhendu
   Johnson, Neil F.
   Cohn, Joshua L.
TI PERSISTENT PATTERNS IN MICROTUBULE DIPOLE LATTICES
SO ADVANCES IN COMPLEX SYSTEMS
LA English
DT Article
DE Microtubule; dipole lattice; Monte Carlo simulation; Ising model;
   frustration; information storage
ID GEOMETRICAL FRUSTRATION; MODEL; BEHAVIOR; SIMULATIONS; RESOLUTION;
   AUTOMATA; FIELDS; ICE
AB Microtubules (MTs) are cytoskeletal protein polymers orchestrating a host of important cellular functions including, but not limited to, cell support, cell division, cell motility and cell transport. We construct a toy-model of the MT lattice composed of classical vector Ising spins (dipole moments) representing the tubulin molecules, the building block of MTs. Nearest-neighbor (NN) and next-nearest-neighbor (NNN) interactions are considered within an anisotropic dielectric medium. As a consequence of the helical topology, certain spin orientations render the lattice frustrated with NN ferroelectric and NNN antiferroelectric bonds. Mapping the problem to a 2D Ising model and employing Monte Carlo methods we find that frozen clusters of spins exist at human physiological temperatures. This suggests a novel biological mechanism for storing information in living organisms, whereby the classical tubulin spin states become information bits and information gets stored in MTs in a way that is robust to thermal fluctuations.
C1 [Nandi, Shubhendu; Johnson, Neil F.; Cohn, Joshua L.] Univ Miami, Dept Phys, Coral Gables, FL 33124 USA.
RP Nandi, S (reprint author), Univ Miami, Dept Phys, Coral Gables, FL 33124 USA.
EM nandi@physics.miami.edu
CR ATEMA J, 1973, J THEOR BIOL, V38, P181, DOI 10.1016/0022-5193(73)90233-6
   Balents L, 2010, NATURE, V464, P199, DOI 10.1038/nature08917
   Castelnovo C, 2008, NATURE, V451, P42, DOI 10.1038/nature06433
   Craddock T. J. A., 2012, PLOS COMPUT BIOL, V8
   Gagliardi LJ, 2002, PHYS REV E, V66, DOI 10.1103/PhysRevE.66.011901
   Golomb S, 1994, POLYOMINOES PUZZLES
   Hagemann IS, 2000, PHYS REV B, V62, pR771, DOI 10.1103/PhysRevB.62.R771
   Hameroff S, 1996, MATH COMPUT SIMULAT, V40, P453, DOI 10.1016/0378-4754(96)80476-9
   Harris M, 1999, NATURE, V399, P311, DOI 10.1038/20562
   Hatami-Marbini H, 2011, STUD MECHANOBIOL TIS, V4, P3, DOI 10.1007/8415_2010_35
   Havelka D, 2011, J THEOR BIOL, V286, P31, DOI 10.1016/j.jtbi.2011.07.007
   Hemberger J, 2005, NATURE, V434, P364, DOI 10.1038/nature03348
   Kim T, 2007, NANO LETT, V7, P211, DOI 10.1021/nl061474k
   LEE DH, 1984, PHYS REV LETT, V52, P433, DOI 10.1103/PhysRevLett.52.433
   Lee SH, 2002, NATURE, V418, P856, DOI 10.1038/nature00964
   Li HL, 2002, STRUCTURE, V10, P1317, DOI 10.1016/S0969-2126(02)00827-4
   McIntosh JR, 2009, J MOL BIOL, V394, P177, DOI 10.1016/j.jmb.2009.09.033
   Mershin A, 2004, BIOSYSTEMS, V77, P73, DOI 10.1016/j.biosystems.2004.04.003
   METROPOLIS N, 1953, J CHEM PHYS, V21, P1087, DOI 10.1063/1.1699114
   Moessner R, 2006, PHYS TODAY, V59, P24, DOI 10.1063/1.2186278
   Nicholov R, 1997, FEBS LETT, V405, P73, DOI 10.1016/S0014-5793(97)00159-2
   Nogales E, 1999, CELL, V96, P79, DOI 10.1016/S0092-8674(00)80961-7
   Papanikolaou S, 2007, PHYS REV B, V75, DOI 10.1103/PhysRevB.75.094406
   Ramalho RR, 2007, MAT SCI ENG C-BIO S, V27, P1207, DOI 10.1016/j.msec.2006.09.045
   RASMUSSEN S, 1990, PHYSICA D, V42, P428, DOI 10.1016/0167-2789(90)90093-5
   Sahu S, 2013, BIOSENS BIOELECTRON, V47, P141, DOI 10.1016/j.bios.2013.02.050
   Sahu S, 2013, APPL PHYS LETT, V102, DOI 10.1063/1.4793995
   SETHNA JP, 1983, PHYS REV LETT, V51, P2198, DOI 10.1103/PhysRevLett.51.2198
   Sherrington C. S., 1964, MAN HIS NATURE
   SMITH SA, 1984, PHYSICA D, V10, P168, DOI 10.1016/0167-2789(84)90259-8
   Tuszynski JA, 2005, MATH COMPUT MODEL, V41, P1055, DOI 10.1016/j.mcm.2005.05.002
   TUSZYNSKI JA, 1995, J THEOR BIOL, V174, P371, DOI 10.1006/jtbi.1995.0105
   VILLAINGUILLOT S, 1995, PHYS REV B, V52, P6712, DOI 10.1103/PhysRevB.52.6712
   WARNER FD, 1974, J CELL SCI, V15, P495
   WEN XG, 1990, PHYS REV B, V41, P9377, DOI 10.1103/PhysRevB.41.9377
NR 35
TC 0
Z9 0
U1 1
U2 8
PU WORLD SCIENTIFIC PUBL CO PTE LTD
PI SINGAPORE
PA 5 TOH TUCK LINK, SINGAPORE 596224, SINGAPORE
SN 0219-5259
EI 1793-6802
J9 ADV COMPLEX SYST
JI Adv. Complex Syst.
PD DEC
PY 2013
VL 16
IS 8
AR 1350033
DI 10.1142/S0219525913500331
PG 15
WC Mathematics, Interdisciplinary Applications; Multidisciplinary Sciences
SC Mathematics; Science & Technology - Other Topics
GA AF3HI
UT WOS:000334602100003
ER

PT J
AU Zhang, H
   Komori, T
   Zhang, YL
   Yin, Y
   Hosaka, S
AF Zhang, Hui
   Komori, Takuya
   Zhang, Yulong
   Yin, You
   Hosaka, Sumio
TI Simulation of Fine Resist Profile Formation by Electron Beam Drawing and
   Development with Solubility Rate Based on Energy Deposition Distribution
SO JAPANESE JOURNAL OF APPLIED PHYSICS
LA English
DT Article
ID BIT-PATTERNED MEDIA; HYDROGEN SILSESQUIOXANE; HIGH-RESOLUTION; DOT
   ARRAYS; LITHOGRAPHY; STORAGE; PITCH
AB We proposed a model for calculating the resist profile in electron beam drawing. The model predicts the solubility rate on the basis of the energy deposition distribution (EDD) for the development of latent patterns in the resist. By unifying the exposure dose D (via experiments) and EDDs (via calculations), we roughly determined solubility rates for three-dimensional EDDs, and established the proposed model. The development simulation was achieved by the sequential calculation method for solubility rates based on EDD which was calculated by Monte Carlo simulation. By determining a suitable EDD region to achieve good patterning, we obtained a sharp nanodot pattern of the resist. This simulation results are in good agreement with the experimental results obtained using a combination of 2.3 wt% tetramethylammonium hydroxide (TMAH) and 4 wt % NaCl as the developer. The model was demonstrated to be useful for predicting resist profiles with different experimental solubility rates of developers. (C) 2013 The Japan Society of Applied Physics
C1 [Zhang, Hui; Komori, Takuya; Zhang, Yulong; Yin, You; Hosaka, Sumio] Gunma Univ, Grad Sch Engn, Kiryu, Gunma 3768515, Japan.
RP Zhang, H (reprint author), Gunma Univ, Grad Sch Engn, Kiryu, Gunma 3768515, Japan.
EM t10802275@gunma-u.ac.jp
FU Ministry of Education, Culture, Sports, Science and Technology of Japan
   [24656435]
FX This work was financially supported by a Grant-in-Aid for Challenging
   Exploratory Research (No. 24656435) from the Ministry of Education,
   Culture, Sports, Science and Technology of Japan.
CR bin Mohamad Z, 2008, NANOTECHNOLOGY, V19, DOI 10.1088/0957-4484/19/02/025301
   Dai Q, 2011, MICROELECTRON ENG, V88, P902, DOI 10.1016/j.mee.2010.12.012
   Harry KJ, 2011, J VAC SCI TECHNOL B, V29, DOI 10.1116/1.3644339
   Hosaka S, 2006, MICROELECTRON ENG, V83, P792, DOI 10.1016/j.mee.2006.01.005
   Hosaka S, 2007, MICROELECTRON ENG, V84, P802, DOI 10.1016/j.mee.2007.01.119
   Hosaka S, 2006, APPL PHYS LETT, V89, DOI 10.1063/1.2400102
   Hosaka S, 2010, JPN J APPL PHYS, V49, DOI 10.1143/JJAP.49.046503
   Hosaka S, 2008, APPL PHYS EXPRESS, V1, DOI 10.1143/APEX.1.027003
   Jun YS, 2010, ENVIRON SCI TECHNOL, V44, P8182, DOI 10.1021/es101491e
   Kamata Y, 2011, IEEE T MAGN, V47, P51, DOI 10.1109/TMAG.2010.2077274
   Koleva E, 2005, VACUUM, V77, P361, DOI 10.1016/j.vacuum.2004.11.001
   Komori T, 2012, JPN J APPL PHYS, V51, DOI 10.1143/JJAP.51.06FB02
   Lohau J, 2001, IEEE T MAGN, V37, P1652, DOI 10.1109/20.950928
   Ma SQ, 2011, NANOSCALE RES LETT, V6, DOI 10.1186/1556-276X-6-446
   MURATA K, 1971, JPN J APPL PHYS, V10, P678, DOI 10.1143/JJAP.10.678
   Namatsu H, 1998, MICROELECTRON ENG, V42, P331, DOI 10.1016/S0167-9317(98)00076-8
   Okada T, 2011, J VAC SCI TECHNOL B, V29, DOI 10.1116/1.3569892
   Olynick DL, 2010, J VAC SCI TECHNOL B, V28, P581, DOI 10.1116/1.3425632
   Raptis I, 2001, VACUUM, V62, P263, DOI 10.1016/S0042-207X(00)00448-6
   Singh MS, 2010, ADV SCI LETT, V3, P57, DOI 10.1166/asl.2010.1084
   Strobel S, 2011, NANOTECHNOLOGY, V22, DOI 10.1088/0957-4484/22/37/375301
   Tang XG, 2007, MICROELECTRON ENG, V84, P1100, DOI 10.1016/j.mee.2007.01.147
   Vutova K, 2009, J VAC SCI TECHNOL B, V27, P52, DOI [10.1116/1.3043467], 10.1116/1.3043467]
   Vutova K, 2010, MICROELECTRON ENG, V87, P1108, DOI 10.1016/j.mee.2009.11.045
   Vutova K, 2009, MICROELECTRON ENG, V86, P714, DOI 10.1016/j.mee.2008.11.010
   Wang H, 2011, J APPL PHYS, V109
   Yang JKW, 2007, J VAC SCI TECHNOL B, V25, P2025, DOI 10.1116/1.2801881
   Yang JKW, 2009, J VAC SCI TECHNOL B, V27, P2622, DOI 10.1116/1.3253652
   Yang X, 2007, J VAC SCI TECHNOL B, V25, P2202, DOI 10.1116/1.2798711
   Zhang H., 2011, KEY ENG MAT, V497, P127
NR 30
TC 1
Z9 1
U1 0
U2 5
PU IOP PUBLISHING LTD
PI BRISTOL
PA TEMPLE CIRCUS, TEMPLE WAY, BRISTOL BS1 6BE, ENGLAND
SN 0021-4922
EI 1347-4065
J9 JPN J APPL PHYS
JI Jpn. J. Appl. Phys.
PD DEC
PY 2013
VL 52
IS 12
AR 126504
DI 10.7567/JJAP.52.126504
PG 5
WC Physics, Applied
SC Physics
GA AA9QI
UT WOS:000331427600038
ER

PT J
AU Honda, N
   Honda, A
AF Honda, Naoki
   Honda, Akito
TI Deposition of Inclined Magnetic Anisotropy Film by Oblique Incidence
   Collimated Sputtering
SO IEICE TRANSACTIONS ON ELECTRONICS
LA English
DT Article
DE inclined anisotropy; oblique incidence collimated sputtering; patterned
   media; magnetic properties
ID BIT-PATTERNED MEDIA; RECORDING SIMULATION; TB/IN(2); DESIGN
AB Deposition of inclined anisotropy film for bit-patterned media was studied using an oblique incidence collimated sputtering. Pt underlayer increased the inclination angle of magnetic layer more than 5 degrees on a Ta seed layer. Further increase of the angle was obtained by annealing Pt/Ru underlayer resulting an inclination angle of 9.4 degrees for a Co-Cr-15.5 film on the underlayer. The magnetic properties of the Co-Cr-15.5 film with an inclined orientation was estimated comparing measured hysteresis loops with simulated ones, which indicated to have inclined magnetic anisotropy with an anisotropy field of about 4.5 kOe and a deflection angle of the anisotropy about the same as that of the crystalline orientation.
C1 [Honda, Naoki; Honda, Akito] Tohoku Inst Technol, Sendai, Miyagi 9828577, Japan.
RP Honda, N (reprint author), Tohoku Inst Technol, Sendai, Miyagi 9828577, Japan.
EM n_honda@tohtech.ac.jp
FU Green IT Project of NEDO
FX The authors would like to thank Dr. J. Ariake of Akita Industrial
   Technology Center for his help with Kerr loop measurement. They also
   express their thanks to Professor H. Uchida of Tohoku Institute of
   Technology for his guidance in VSM measurement. This work was supported
   in part by the Green IT Project of NEDO.
CR Greaves SJ, 2008, IEEE T MAGN, V44, P3430, DOI 10.1109/TMAG.2008.2002365
   Grobis MK, 2011, IEEE T MAGN, V47, P6, DOI 10.1109/TMAG.2010.2076798
   Honda N, 2008, J MAGN MAGN MATER, V320, P2195, DOI 10.1016/j.jmmm.2008.03.048
   Honda N, 2007, IEICE T ELECTRON, VE90C, P1594, DOI 10.1093/ietele/e90-c.8.1594
   Honda N, 2007, IEEE T MAGN, V43, P2142, DOI 10.1109/TMAG.2007.893139
   Honda N, 2011, IEEE T MAGN, V47, P2544, DOI 10.1109/TMAG.2011.2157904
   Honda N, 2008, IEEE T MAGN, V44, P3438, DOI 10.1109/TMAG.2008.2002528
   Kamata Y, 2011, IEEE T MAGN, V47, P51, DOI 10.1109/TMAG.2010.2077274
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Schabes ME, 2008, J MAGN MAGN MATER, V320, P2880, DOI 10.1016/j.jmmm.2008.07.035
   Terris BD, 2005, IEEE T MAGN, V41, P2822, DOI 10.1109/TMAG.2005.855264
NR 11
TC 0
Z9 0
U1 2
U2 6
PU IEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG
PI TOKYO
PA KIKAI-SHINKO-KAIKAN BLDG, 3-5-8, SHIBA-KOEN, MINATO-KU, TOKYO, 105-0011,
   JAPAN
SN 0916-8524
EI 1745-1353
J9 IEICE T ELECTRON
JI IEICE Trans. Electron.
PD DEC
PY 2013
VL E96C
IS 12
BP 1469
EP 1473
DI 10.1587/transele.E96.C.1469
PG 5
WC Engineering, Electrical & Electronic
SC Engineering
GA 280DI
UT WOS:000329008500004
ER

PT J
AU Arrayangkool, A
   Warisarn, C
   Kovintavewat, P
AF Arrayangkool, Autthasith
   Warisarn, Chanon
   Kovintavewat, Piya
TI A Recorded-Bit Patterning Scheme with Accumulated Weight Decision for
   Bit-Patterned Media Recording
SO IEICE TRANSACTIONS ON ELECTRONICS
LA English
DT Article
DE bit-patterned media recording; position jitter noise; recording-bit
   patterning; two-dimensional equalization
AB To achieve high recording density in a bit-patterned media recording system, the spacing between data bit islands in both the along-track and the across-track directions must be decreased, thus leading to the increase of two-dimensional (2D) interference. One way to reduce the 2D interference is to apply a 2D coding scheme on a data sequence before recording; however, this method usually requires many redundant bits, thus lowering a code rate. Therefore, we propose a novel 2D coding scheme referred to as a recorded-bit patterning (RBP) scheme to mitigate the 2D interference, which requires no redundant bits at the expense of using more buffer memory. Specifically, an input data sequence is first split into three tracks in which will then be rotated to find the best 3-track data pattern based on a look-up table before recording, such that the shifted data tracks yield the least effect of 2D interference in the readback signal. Numerical results indicate that the proposed RBP scheme provides a significant performance improvement if compared to a conventional system (without 2D coding), especially when the recording density is high and/or the position jitter noise is large.
C1 [Arrayangkool, Autthasith; Warisarn, Chanon] King Mongkuts Inst Technol Ladkrabang, Coll Data Storage Innovat D STAR, Bangkok 10520, Thailand.
   [Kovintavewat, Piya] Nakhon Pathom Rajabhat Univ, Data Storage Technol Res Ctr, Nakhon Pathom 73000, Thailand.
RP Kovintavewat, P (reprint author), Nakhon Pathom Rajabhat Univ, Data Storage Technol Res Ctr, Nakhon Pathom 73000, Thailand.
EM piya@npru.ac.th
FU College of Data Storage Innovation (D*STAR); King Mongkut's Institute of
   Technology Ladkrabang Research Fund, Thailand
FX This work was supported by College of Data Storage Innovation (D*STAR)
   and King Mongkut's Institute of Technology Ladkrabang Research Fund,
   Thailand.
CR Chang W, 2010, IEEE T MAGN, V46, P3899, DOI 10.1109/TMAG.2010.2056926
   Groenland JPJ, 2007, IEEE T MAGN, V43, P2307, DOI 10.1109/TMAG.2007.893137
   Koonkarnkhai S, 2012, PROCEDIA ENGINEER, V32, P323, DOI 10.1016/j.proeng.2012.01.1274
   Kurihara Y, 2008, J MAGN MAGN MATER, V320, P3140, DOI 10.1016/j.jmmm.2008.08.026
   MOON JY, 1995, IEEE T MAGN, V31, P1083, DOI 10.1109/20.364789
   Moser A, 2002, J PHYS D APPL PHYS, V35, pR157, DOI 10.1088/0022-3727/35/19/201
   Nabavi S., 2008, THESIS CARNEGIE MELL
   Shao XY, 2011, IEEE T MAGN, V47, P2559, DOI 10.1109/TMAG.2011.2157668
NR 8
TC 7
Z9 7
U1 1
U2 8
PU IEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG
PI TOKYO
PA KIKAI-SHINKO-KAIKAN BLDG, 3-5-8, SHIBA-KOEN, MINATO-KU, TOKYO, 105-0011,
   JAPAN
SN 0916-8524
EI 1745-1353
J9 IEICE T ELECTRON
JI IEICE Trans. Electron.
PD DEC
PY 2013
VL E96C
IS 12
BP 1490
EP 1496
DI 10.1587/transele.E96.C.1490
PG 7
WC Engineering, Electrical & Electronic
SC Engineering
GA 280DI
UT WOS:000329008500008
ER

PT J
AU Nakamura, Y
   Okamoto, Y
   Osawa, H
   Aoi, H
   Muraoka, H
AF Nakamura, Yasuaki
   Okamoto, Yoshihiro
   Osawa, Hisashi
   Aoi, Hajime
   Muraoka, Hiroaki
TI Performance Evaluation of Non-binary LDPC Coding and Iterative Decoding
   System for BPM R/W Channel with Write-Errors
SO IEICE TRANSACTIONS ON ELECTRONICS
LA English
DT Article
DE bit-patterned medium; write-error; non-binary low-density parity-check
   (LDPC) code; iterative decoding
ID PARITY-CHECK CODES; MEDIA
AB Bit-patterned medium (BPM) is one of the promising approaches for ultra-high density magnetic recording systems. However, BPM requires precise write synchronization, and exhibits write-errors due to insufficient write field gradient, medium switching field distribution (SFD), demagnetization field from adjacent islands, and island position variation. In this paper, an iterative decoding system using a non-binary low-density parity-check (LDPC) code is considered for a BPM R/W channel with write-errors at an areal recording density of 2 Tbit/inch(2) including the coding rate loss. The performance of the iterative decoding system using the non-binary LDPC code over the Galois field GF(2(8)) is evaluated by computer simulation, and it is compared with the conventional iterative decoding system using a binary LDPC code. The results show that the non-binary LDPC system has a larger write margin than the binary LDPC system.
C1 [Nakamura, Yasuaki; Okamoto, Yoshihiro; Osawa, Hisashi] Ehime Univ, Grad Sch Sci & Engn, Matsuyama, Ehime 7908577, Japan.
   [Aoi, Hajime; Muraoka, Hiroaki] Tohoku Univ, Res Inst Elect Commun, Sendai, Miyagi 9808577, Japan.
RP Nakamura, Y (reprint author), Ehime Univ, Grad Sch Sci & Engn, Matsuyama, Ehime 7908577, Japan.
EM nakamura@rec.ee.ehime-u.ac.jp
FU Storage Research Consortium (SRC), Japan; Japan Society for the
   Promotion of Science (JSPS) [21360188, 2360457]
FX The authors would like to thank Associate Prof. S. Greaves of Tohoku
   University, Assistant Prof. K. Miura of Tohoku University, and Prof. Y.
   Kanai of Niigata Institute of Technology for their helpful discussions.
   The authors also would like to thank Prof. J.R. Cruz of the University
   of Oklahoma, USA, for his helpful advice. This work was supported in
   part by the Storage Research Consortium (SRC), Japan, under
   Grants-in-Aid and in part by the Japan Society for the Promotion of
   Science (JSPS) under Gants-in-Aid for Scientific Research (B) 21360188
   and (C) 2360457.
CR Albrecht M, 2003, IEEE T MAGN, V39, P2323, DOI 10.1109/TMAG.2003.816285
   Davey MC, 1998, IEEE COMMUN LETT, V2, P165, DOI 10.1109/4234.681360
   GALLAGER RG, 1962, IRE T INFORM THEOR, V8, P21, DOI 10.1109/TIT.1962.1057683
   KOCH W, 1990, GLOBECOM 90 - IEEE GLOBAL TELECOMMUNICATIONS CONFERENCE & EXHIBITION, VOLS 1-3, P1679, DOI 10.1109/GLOCOM.1990.116774
   Kretzmer K.R., 1966, IEEE T COMMUN TECHNO, V14, P67
   Muraoka H., 2009, IEEE T MAGN, V44, P3423
   Nakamura Y, 2011, PHYSCS PROC, V16, DOI 10.1016/j.phpro.2011.06.113
   Nakamura Y, 2011, IEEE T MAGN, V47, P3566, DOI 10.1109/TMAG.2011.2147766
   Nakamura Y, 2009, IEEE T MAGN, V45, P3753, DOI 10.1109/TMAG.2009.2022331
   Sawaguchi H., 1998, P GLOBECOM 98 SYDN N, P2694
   Suzuki Y, 2005, J APPL PHYS, V97, DOI 10.1063/1.1853695
   TANNER RM, 1981, IEEE T INFORM THEORY, V27, P533, DOI 10.1109/TIT.1981.1056404
   VITERBI AJ, 1967, IEEE T INFORM THEORY, V13, P260, DOI 10.1109/TIT.1967.1054010
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
   Wymeersch H., 2004, IEEE INT C COMM JUN, V2, P772, DOI DOI 10.1109/ICC.2004.1312606
NR 15
TC 0
Z9 0
U1 0
U2 0
PU IEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG
PI TOKYO
PA KIKAI-SHINKO-KAIKAN BLDG, 3-5-8, SHIBA-KOEN, MINATO-KU, TOKYO, 105-0011,
   JAPAN
SN 0916-8524
EI 1745-1353
J9 IEICE T ELECTRON
JI IEICE Trans. Electron.
PD DEC
PY 2013
VL E96C
IS 12
BP 1497
EP 1503
DI 10.1587/transele.E96.C.1497
PG 7
WC Engineering, Electrical & Electronic
SC Engineering
GA 280DI
UT WOS:000329008500009
ER

PT J
AU Biagi, M
   Borogovac, T
   Little, TDC
AF Biagi, Mauro
   Borogovac, Tarik
   Little, Thomas D. C.
TI Adaptive Receiver for Indoor Visible Light Communications
SO JOURNAL OF LIGHTWAVE TECHNOLOGY
LA English
DT Article
DE Adaptive equalizers; lighting; optical modulation; RAKE receivers
ID OPTICAL-INTENSITY CHANNELS; WIRELESS; MODULATION; CAPACITY
AB Visible light communications seeks to leverage an unused medium for indoor wireless communications. A major goal is to deliver very high data-rates through LED luminaires to all places where we use lighting. However, the characteristics of LEDs and the nature of indoor lighting conspire to distort the signals. Illumination powers LEDs have low signaling bandwidth and exhibit severe frequency distortion. Their wide dispersion patterns, required for light and signal coverage, also add multipath distortion. Intermittent shadowing results in a wide range of channel characteristics. In this paper we address these challenges with an adaptive receiver. Namely, training is used to identify channel impairments, and our proposed receiver applies specific countermeasures including threshold detection, RAKE reception and adaptive channel equalization. Analysis and simulation demonstrate that our design mitigates distortion problems yielding a performance improvement of 40% to 100% with respect to the current literature in achievable bit-rate depending on the propagation scenario.
C1 [Biagi, Mauro] Univ Roma La Sapienza, Dept Informat Elect & Telecommun DIET Engn, I-00184 Rome, Italy.
   [Borogovac, Tarik; Little, Thomas D. C.] Boston Univ, Dept Elect & Comp Engn, Boston, MA 02215 USA.
RP Biagi, M (reprint author), Univ Roma La Sapienza, Dept Informat Elect & Telecommun DIET Engn, I-00184 Rome, Italy.
EM mauro.biagi@uniroma1.it; tarikb@bu.edu; tdcl@bu.edu
OI Biagi, Mauro/0000-0003-4830-2641
FU National Science Foundation [EEC-0812056]
FX Manuscript received April 30, 2013; revised September 23, 2013; accepted
   October 14, 2013. Date of publication October 23, 2013; date of current
   version November 6, 2013. This work was supported primarily by the
   Engineering Research Centers Program of the National Science Foundation
   under Grant NSF Cooperative Agreement EEC-0812056.
CR Barry J. R., 1994, WIRELESS INFRARED CO
   Beczkowski S., 2010, P IEEE EN CONV C EXP, P731, DOI DOI 10.1109/ECCE.2010.5617930
   Biagi M., 2008, P INT S WIR COMM SYS, P508
   Borogovac T, 2010, IEEE GLOBE WORK, P1077, DOI 10.1109/GLOCOMW.2010.5700100
   Carruthers JB, 2003, IEE P-OPTOELECTRON, V150, P473, DOI 10.1049/ip-opt:20030527
   Carruthers JB, 1996, IEEE J SEL AREA COMM, V14, P538, DOI 10.1109/49.490239
   Grubor J, 2008, J LIGHTWAVE TECHNOL, V26, P3883, DOI 10.1109/JLT.2008.928525
   Hranilovic S, 2004, IEEE T INFORM THEORY, V50, P784, DOI 10.1109/TIT.2004.826649
   Visible Light Communication Task Group, 2010, 802157 IEEE
   Kahn JM, 1997, P IEEE, V85, P265, DOI 10.1109/5.554222
   Kavehrad M, 2010, IEEE COMMUN MAG, V48, P66, DOI 10.1109/MCOM.2010.5673074
   Lapidoth A, 2009, IEEE T INFORM THEORY, V55, P4449, DOI 10.1109/TIT.2009.2027522
   Minh HL, 2009, IEEE PHOTONIC TECH L, V21, P1063
   O'Brien D, 2008, P SOC PHOTO-OPT INS, V7091, DOI 10.1117/12.799503
   Proakis J. G., 2008, DIGITAL COMMUNICATIO
   Rahaim M. B., 2010, P 5 ACM INT WORKSH W, P9, DOI 10.1145/1860079.1860082
   Rajagopal S, 2012, IEEE COMMUN MAG, V50, P72, DOI 10.1109/MCOM.2012.6163585
   Ramirez-Iniguez R., 2008, OPTICAL WIRELESS COM
   Scaglione A, 1998, CONF REC ASILOMAR C, P1134, DOI 10.1109/ACSSC.1998.751438
   Schubert E. F., 2006, LIGHT EMITTING DIODE
   Szczot F., 2006, P SOC PHOTO-OPT INS, V6159, P24
   Vucic J, 2010, J LIGHTWAVE TECHNOL, V28, P3512, DOI 10.1109/JLT.2010.2089602
   Zeng L., 2008, P IEEE ICCSC, P678
   Zeng LB, 2008, CSNDSP 08: PROCEEDINGS OF THE SIXTH INTERNATIONAL SYMPOSIUM ON COMMUNICATION SYSTEMS, NETWORKS AND DIGITAL SIGNAL PROCESSING, P170, DOI 10.1109/CSNDSP.2008.4610760
NR 24
TC 24
Z9 25
U1 1
U2 26
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0733-8724
EI 1558-2213
J9 J LIGHTWAVE TECHNOL
JI J. Lightwave Technol.
PD DEC 1
PY 2013
VL 31
IS 23
BP 3676
EP 3686
DI 10.1109/JLT.2013.2287051
PG 11
WC Engineering, Electrical & Electronic; Optics; Telecommunications
SC Engineering; Optics; Telecommunications
GA 252CX
UT WOS:000326983400008
ER

PT J
AU Oczak, M
   Ismayilova, G
   Costa, A
   Viazzi, S
   Sonoda, LT
   Fels, M
   Bahr, C
   Hartung, J
   Guarino, M
   Berckmans, D
   Vranken, E
AF Oczak, Maciej
   Ismayilova, Gunel
   Costa, Annamaria
   Viazzi, Stefano
   Sonoda, Lilia Thays
   Fels, Michaela
   Bahr, Claudia
   Hartung, Joerg
   Guarino, Marcella
   Berckmans, Daniel
   Vranken, Erik
TI Analysis of aggressive behaviours of pigs by automatic video recordings
SO COMPUTERS AND ELECTRONICS IN AGRICULTURE
LA English
DT Article
DE Pigs; Aggression; Behaviour; Phases
ID HOUSED DRY SOWS; SOCIAL-INTERACTION PATTERNS; INDIVIDUAL AGGRESSIVENESS;
   UNACQUAINTED PIGS; GROWING PIGS; ENRICHMENT; PERFORMANCE; PARAMETERS;
   ETHOGRAM; GROWTH
AB Aggression among pigs in today's production systems results in negative impact on health and. welfare of animals as well as on productivity of the systems. Precision Livestock Farming technology might potentially offer a possibility to monitor and reduce the level of aggression and hence its negative impact. This paper reports about the initial part of a larger study investigating the possibilities of applying continuous automatic monitoring of aggressive behaviour among pigs. It investigates how behavioural patterns in pig's aggressive behaviour can be identified and utilized in order to predict severe forms of aggression (biting) expressed in later phases of aggressive interactions.
   An experiment was carried out at a commercial farm on a group of 11 male pigs weighing on average 23 kg and kept in a pen of 4 m x 2.5 m. During the first 3 days after mixing in total 8 h of video recording were registered with a top view camera for later analysis of animal behaviour. As a result of labelling of the video recordings, 157 aggressive interactions were identified with 12 behaviour types expressed for 860 times within the interactions. The identified interactions were divided into interactions that led to biting and those that did not lead to biting behaviour. The interactions that led to biting behaviour accounted for 36.3% (57) of all aggressive interactions while interactions that did not lead to biting behaviour were 63.7% (100) of the interactions. The average duration of initiating (nosing) phase of aggressive interactions (3.32 s) lasted longer (P < 0.05) in interactions that led to biting behaviour than in interactions that did not lead to biting behaviour (1.94 s). The next phase of aggressive interactions - medium phase - similarly to initiating phase, lasted on average longer (18.21 s) (P< 0.01) in interactions that led to biting behaviour than in interactions that did not lead to biting behaviour (16.15 s). With the differences found between interactions that led and did not lead to biting behaviour it seems to be possible to discriminate between both types of interactions in an early phase of aggression. The differences found might serve as early signs in a management support system that aims to prevent severe forms of aggressive behaviour (biting) among pigs. (C) 2013 Elsevier B.V. All rights reserved.
C1 [Oczak, Maciej; Vranken, Erik] Fancom Res, NL-5981 NK Panningen, Netherlands.
   [Oczak, Maciej; Viazzi, Stefano; Bahr, Claudia; Berckmans, Daniel; Vranken, Erik] Katholieke Univ Leuven, M3 BIORES Measure Model Manage Bioresponses, B-3001 Louvain, Belgium.
   [Ismayilova, Gunel; Costa, Annamaria; Guarino, Marcella] Univ Milan, Fac Vet Med, Dept Hlth Anim Sci & Food Safety, I-20133 Milan, Italy.
   [Sonoda, Lilia Thays; Fels, Michaela; Hartung, Joerg] Univ Vet Med Hannover, Inst Anim Hyg Anim Welf & Farm Anim Behav, D-30559 Hannover, Germany.
RP Oczak, M (reprint author), Fancom Res, Ind Terrein 34, NL-5981 NK Panningen, Netherlands.
EM moczak@fancom.com
OI Costa, Annamaria/0000-0003-1038-6886; Guarino,
   Marcella/0000-0003-4131-0016
FU EU Commission; Marie Curie Initial Training
FX This research is a part of the BioBusiness Project and made possible by
   the support of the EU Commission and Marie Curie Initial Training.
CR Andersen IL, 1999, APPL ANIM BEHAV SCI, V65, P91, DOI 10.1016/S0168-1591(99)00058-1
   Arey DS, 1998, LIVEST PROD SCI, V56, P61, DOI 10.1016/S0301-6226(98)00144-4
   AREY DS, 1995, APPL ANIM BEHAV SCI, V45, P23, DOI 10.1016/0168-1591(95)00600-W
   BARNETT JL, 1993, APPL ANIM BEHAV SCI, V36, P135, DOI 10.1016/0168-1591(93)90005-A
   Berckmans D, 2008, COMPUT ELECTRON AGR, V62, P1, DOI 10.1016/j.compag.2007.09.002
   Bloemen H, 1997, EQUINE VET J S, V23, P16
   Bolhuis JE, 2005, ANIM BEHAV, V69, P1085, DOI 10.1016/j.anbehav.2004.09.013
   De Wet L, 2003, BRIT POULTRY SCI, V44, P524, DOI 10.1080/00071660310001616192
   Durrell J, 1997, ANIM WELFARE, V6, P297
   Erhard HW, 1997, APPL ANIM BEHAV SCI, V54, P137, DOI 10.1016/S0168-1591(97)00068-3
   Ewbank R., 1969, FARM BUILD PROGR, V18, P14
   Fraser A.F., 1998, FARM ANIMAL BEHAV WE
   Fraser D., 1974, J AGR SCI, V82, P14
   Frost AR, 1997, COMPUT ELECTRON AGR, V17, P139, DOI 10.1016/S0168-1699(96)01301-4
   Gonyou HW, 2006, J ANIM SCI, V84, P229
   Hafez E., 1975, BEHAV DOMESTIC ANIMA
   Jensen MB, 2010, APPL ANIM BEHAV SCI, V123, P87, DOI 10.1016/j.applanim.2010.01.002
   JENSEN P, 1982, APPL ANIM ETHOL, V9, P47, DOI 10.1016/0304-3762(82)90165-1
   JENSEN P, 1994, APPL ANIM BEHAV SCI, V41, P37, DOI 10.1016/0168-1591(94)90050-7
   Jensen P, 1998, APPL ANIM BEHAV SCI, V58, P49, DOI 10.1016/S0168-1591(97)00097-X
   JENSEN P, 1984, APPL ANIM BEHAV SCI, V12, P93, DOI 10.1016/0168-1591(84)90099-6
   JENSEN P, 1980, APPL ANIM ETHOL, V6, P341, DOI 10.1016/0304-3762(80)90134-0
   Keeling L.J., 2001, SOCIAL BEHAV FARM AN, P147
   Marchant-Forde J.N., 2010, P 21 IPVS C VANC CAN, P18
   McBRIDE G., 1964, ANIM PROD, V6, P129
   MCGLONE JJ, 1985, J ANIM SCI, V61, P559
   MCGLONE JJ, 1985, J ANIM SCI, V60, P20
   McGlone J.J., 1981, J ANIM SCI, V51, P447
   Melotti L, 2011, APPL ANIM BEHAV SCI, V133, P144, DOI 10.1016/j.applanim.2011.05.018
   Meunier-Salaun MC, 2001, ANIM FEED SCI TECH, V90, P53, DOI 10.1016/S0377-8401(01)00196-1
   MOUNT NC, 1993, APPL ANIM BEHAV SCI, V36, P377, DOI 10.1016/0168-1591(93)90134-B
   O'Connell NE, 2005, LIVEST PROD SCI, V97, P107, DOI 10.1016/j.livprodsci.2005.03.005
   Oldigs B., 1992, P 23 INT C APPL ETH, V351, P109
   RUSHEN J, 1987, AGGRESSIVE BEHAV, V13, P329, DOI 10.1002/1098-2337(1987)13:6<329::AID-AB2480130602>3.0.CO;2-3
   SCHAEFER AL, 1990, APPL ANIM BEHAV SCI, V27, P41, DOI 10.1016/0168-1591(90)90006-Y
   STOOKEY JM, 1994, J ANIM SCI, V72, P2804
   TAN SSL, 1990, APPL ANIM BEHAV SCI, V26, P157, DOI 10.1016/0168-1591(90)90095-U
   Turner SP, 2006, APPL ANIM BEHAV SCI, V96, P245, DOI 10.1016/j.applanim.2005.06.009
   WALKER N, 1995, IRISH J AGR FOOD RES, V34, P57
   WARAN NK, 1993, ANIM PROD, V56, P115
   Wathes CM, 2008, COMPUT ELECTRON AGR, V64, P2, DOI 10.1016/j.compag.2008.05.005
NR 41
TC 6
Z9 8
U1 10
U2 52
PU ELSEVIER SCI LTD
PI OXFORD
PA THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD OX5 1GB, OXON, ENGLAND
SN 0168-1699
EI 1872-7107
J9 COMPUT ELECTRON AGR
JI Comput. Electron. Agric.
PD NOV
PY 2013
VL 99
BP 209
EP 217
DI 10.1016/j.compag.2013.09.015
PG 9
WC Agriculture, Multidisciplinary; Computer Science, Interdisciplinary
   Applications
SC Agriculture; Computer Science
GA 264ZO
UT WOS:000327919700026
ER

PT J
AU Soltys, J
   Gazi, S
   Fedor, J
   Tobik, J
   Precner, M
   Cambel, V
AF Soltys, J.
   Gazi, S.
   Fedor, J.
   Tobik, J.
   Precner, M.
   Cambel, V.
TI Magnetic nanostructures for non-volatile memories
SO MICROELECTRONIC ENGINEERING
LA English
DT Article
DE Bit patterned media; Fabrication of magnetic nanostructures; Electron
   beam lithography; Domain structure; Micromagnetism; Vortex chirality
ID FABRICATION; SINGLE; MEDIA
AB In this work we present two fabrication approaches for patterning submicron Pacman-like (PL) magnetic nanoelements, the additive and subtractive process. Within the first process, PL structures are revealed using a standard lift-off technique. The second one is based on argon ion milling through titanium mask patterns. In the PL magnet the missing sector itself represents a dipole, which together with the external field, controls the chirality of the nucleated vortex. In order to determine the chirality of the vortex ground state, an array of PL nanomagnets of the diameter 200 nm prepared by the subtractive process, is mapped by the magnetic force microscopy. The experimental results are in good agreement with the results achieved by the micromagnetic simulations. (C) 2013 Elsevier B.V. All rights reserved.
C1 [Soltys, J.; Gazi, S.; Fedor, J.; Tobik, J.; Precner, M.; Cambel, V.] Slovak Acad Sci, Inst Elect Engn, SK-84104 Bratislava, Slovakia.
RP Soltys, J (reprint author), Slovak Acad Sci, Inst Elect Engn, Dubravska Cesta 9, SK-84104 Bratislava, Slovakia.
EM jan.soltys@savba.sk
FU Slovak Grant Agency APVV [APVV-0036-11 (0.2)]; VEGA project [2/0037/12
   (0.2)]; Research & Development Operational Program; ERDF, "HD Video",
   ITMS [26240220041 (0.4)]; ERDF, "CENTE II", ITMS [26240120019 (0.2)]
FX This work has been supported by Slovak Grant Agency APVV, project
   APVV-0036-11 (0.2), by VEGA project 2/0037/12 (0.2), and by the Research
   & Development Operational Program funded by the ERDF, "HD Video", ITMS
   code 26240220041 (0.4) and "CENTE II", ITMS code 26240120019 (0.2).
CR Cambel V, 2011, PHYS REV B, V84, DOI 10.1103/PhysRevB.84.014424
   Demidov VE, 2011, APPL PHYS LETT, V99, DOI 10.1063/1.3609011
   Donahue M, 1999, 6376 NISTIR
   Ferre R, 1997, PHYS REV B, V56, P14066, DOI 10.1103/PhysRevB.56.14066
   Fischer P, 2011, PHYS REV B, V83, DOI 10.1103/PhysRevB.83.212402
   Jaafar M, 2010, PHYS REV B, V81, DOI 10.1103/PhysRevB.81.054439
   KRAUSS PR, 1994, J VAC SCI TECHNOL B, V12, P3639, DOI 10.1116/1.587630
   Lau JW, 2011, J PHYS D APPL PHYS, V44, DOI 10.1088/0022-3727/44/30/303001
   New R.M.H., 1994, J VAC SCI TECHNOL B, V12, P3639
   Ross C, 2001, ANN REV MATER RES, V31, P203, DOI 10.1146/annurev.matsci.31.1.203
   Ross CA, 2002, PHYS REV B, V65, DOI 10.1103/PhysRevB.65.144417
   Sbiaa R, 2007, RECENT PAT NANOTECH, V1, P29, DOI 10.2174/187221007779814754
   Schneider M, 2002, J APPL PHYS, V92, P1466, DOI 10.1063/1.1490623
   Shaw JM, 2008, PHYS REV B, V78, DOI 10.1103/PhysRevB.78.024414
   Tobik J, 2012, PHYS REV B, V86, DOI 10.1103/PhysRevB.86.134433
   Vavassori P, 2004, PHYS REV B, V69, DOI 10.1103/PhysRevB.69.214404
NR 16
TC 2
Z9 2
U1 1
U2 12
PU ELSEVIER SCIENCE BV
PI AMSTERDAM
PA PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
SN 0167-9317
EI 1521-3757
J9 MICROELECTRON ENG
JI Microelectron. Eng.
PD OCT
PY 2013
VL 110
BP 474
EP 478
DI 10.1016/j.mee.2013.04.031
PG 5
WC Engineering, Electrical & Electronic; Nanoscience & Nanotechnology;
   Optics; Physics, Applied
SC Engineering; Science & Technology - Other Topics; Optics; Physics
GA 239DU
UT WOS:000326003600096
ER

PT J
AU Wang, Y
   Victora, RH
AF Wang, Yao
   Victora, R. H.
TI Reader Design for Bit Patterned Media Recording at 10 Tb/in(2) Density
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Bit-patterned media recording (BPMR); ECC media; island jitter;
   magnetoresistive head
AB A reader design for reading back at very high density is proposed for bit patterned media recording (BPMR). The idea is a rotated sense head, so that the shields are aligned down-track, combined with oversampled signal processing to regain the lost down-track resolution. Simulation results show that the proposed reader has more than 20 dB gain compared with a normally oriented head array for reading back at 10 Tbit/in(2). The tradeoff between oversampling and increased target length is examined. Island jitters are found to be non-Gaussian distributed. The performance of the new design is investigated for various bit patterns, island jitter and head noise.
C1 [Wang, Yao; Victora, R. H.] Univ Minnesota, Ctr Micromagnet & Informat Technol, Elect & Comp Engn Dept, Minneapolis, MN 55455 USA.
RP Victora, RH (reprint author), Univ Minnesota, Ctr Micromagnet & Informat Technol, Elect & Comp Engn Dept, Minneapolis, MN 55455 USA.
EM vic-tora@umn.edu
FU National Science Foundation [ECCS-0925366]
FX The authors would like to thank M. Erden for useful discussion. This
   work was supported by National Science Foundation Contract No.
   ECCS-0925366.
CR Bertram H. N., 1994, THEORY MAGNETIC RECO, P112, DOI DOI 10.1017/CB09780511623066
   Cai K, 2010, IEEE GLOBE WORK, P1910, DOI 10.1109/GLOCOMW.2010.5700275
   Karakulak S., 2006, IEEE T MAGN, V46, P3639
   MOON JY, 1995, IEEE T MAGN, V31, P1083, DOI 10.1109/20.364789
   Nabavi S, 2007, IEEE ICC, P6249, DOI 10.1109/ICC.2007.1035
   Nabavi S, 2007, IEEE T MAGN, V43, P2274, DOI 10.1109/TMAG.2007.893479
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Smith N, 2001, APPL PHYS LETT, V78, P1448, DOI 10.1063/1.1352694
   Victora RH, 2012, IEEE T MAGN, V48, P1697, DOI 10.1109/TMAG.2011.2173310
   Wang SM, 2013, IEEE T MAGN, V49, P3644, DOI 10.1109/TMAG.2012.2237545
   Wang Y, 2012, IEEE MAGN LETT, V3, DOI 10.1109/LMAG.2012.2226935
   Wood RW, 2002, IEEE T MAGN, V38, P1711, DOI 10.1109/TMAG.2002.1017761
   Xu S, 2012, IEEE T MAGN, V48, P3891, DOI 10.1109/TMAG.2012.2198799
NR 13
TC 8
Z9 8
U1 0
U2 12
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD OCT
PY 2013
VL 49
IS 10
BP 5208
EP 5214
DI 10.1109/TMAG.2013.2260349
PG 7
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 224YU
UT WOS:000324930200005
ER

PT J
AU Han, GJ
   Guan, YL
   Cai, K
   Chan, KS
AF Han, Guojun
   Guan, Yong Liang
   Cai, Kui
   Chan, Kheong Sann
TI Asymmetric Iterative Multi-Track Detection for 2-D Non-Binary LDPC-Coded
   Magnetic Recording
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Bit-patterned media recording (BPMR); inter-track interference (ITI);
   multi-track detection; non-binary low-density parity-check (NB-LDPC)
   codes
ID PATTERNED MEDIA STORAGE; PARITY-CHECK CODES; INTERFERENCE MITIGATION
AB Inter-track interference (ITI) is a major source of signal impairment in the next-generation magnetic recording systems. The single-track read channel model, combined with anti-ITI signal detection schemes, is a popular way to recover single-track data from a readback signal corrupted by the ITI. On the other hand, the multi-track read channel model can be used to simultaneously recover multi-track data from a readback signal. However, the performance of multi-track detection is severely degraded by the weak signals from the sidetracks and the indistinguishable symbols. To improve this performance, in this paper we propose a two-dimensional coding in conjunction with an asymmetric iterative multi-track detection (A-IMD) scheme, which uses joint channel detection and decoding of two parallel six-symbol-based detectors concatenated with two parallel non-binary low-density parity-check (NB-LDPC) decoder over GF(4), to iteratively recover four-track data from two readback signals. Simulation results demonstrate that the performance of the multi-track detection can indeed be greatly improved by using the proposed A-IMD scheme.
C1 [Han, Guojun; Guan, Yong Liang] Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore.
   [Han, Guojun] Guangdong Univ Technol, Sch Informat Engn, Guangzhou 510006, Guangdong, Peoples R China.
   [Cai, Kui; Chan, Kheong Sann] ASTAR, Data Storage Inst, Singapore 117608, Singapore.
RP Han, GJ (reprint author), Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore.
EM gjhan@ntu.edu.sg
RI han, guojun/H-5968-2012; Guan, Yong/A-5090-2011
OI Guan, Yong/0000-0002-9757-630X
FU Agency for Science, Technology and Research (A*STAR) Singapore
   [SERC0921560129]; National Natural Science Foundation of China
   [61172076]
FX This work was supported by the Agency for Science, Technology and
   Research (A*STAR) Singapore under Grant SERC0921560129 and by the
   National Natural Science Foundation of China under Grant 61172076.
CR BAHL LR, 1974, IEEE T INFORM THEORY, V20, P284, DOI 10.1109/TIT.1974.1055186
   Barnault L., 2003, Proceedings 2003 IEEE Information Theory Workshop (Cat. No.03EX674), P70, DOI 10.1109/ITW.2003.1216697
   Chang W, 2010, IEEE T MAGN, V46, P3899, DOI 10.1109/TMAG.2010.2056926
   Davey MC, 1998, IEEE COMMUN LETT, V2, P165, DOI 10.1109/4234.681360
   Fujii M., 2010, P INT S COMM INF TEC, P1062
   Fujii M, 2012, IEICE T ELECTRON, VE95C, P163, DOI 10.1587/transele.E95.C.163
   GALLAGER RG, 1962, IRE T INFORM THEOR, V8, P21, DOI 10.1109/TIT.1962.1057683
   Karakulak S, 2008, IEEE T MAGN, V44, P193, DOI 10.1109/TMAG.2007.912837
   Liu XC, 2009, IEEE T MAGN, V45, P3745, DOI 10.1109/TMAG.2009.2022333
   MacKay DJC, 1999, IEEE T INFORM THEORY, V45, P399, DOI 10.1109/18.748992
   MacKay DJC, 1997, ELECTRON LETT, V33, P457, DOI 10.1049/el:19970362
   Myint LMM, 2009, IEEE T MAGN, V45, P3691, DOI 10.1109/TMAG.2009.2022638
   Shiroishi Y, 2009, IEEE T MAGN, V45, P3816, DOI 10.1109/TMAG.2009.2024879
   Tan WJ, 2005, J MAGN MAGN MATER, V287, P397, DOI 10.1016/j.jmmm.2004.10.066
   Voicila A, 2010, IEEE T COMMUN, V58, P1365, DOI 10.1109/TCOMM.2010.05.070096
NR 15
TC 8
Z9 8
U1 0
U2 7
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD OCT
PY 2013
VL 49
IS 10
BP 5215
EP 5221
DI 10.1109/TMAG.2013.2262293
PG 7
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 224YU
UT WOS:000324930200006
ER

PT J
AU Kaganovskiy, L
   Lau, JW
   Khizroev, S
   Litvinov, D
AF Kaganovskiy, Leon
   Lau, June W.
   Khizroev, Sakhrat
   Litvinov, Dmitri
TI Influence of a low anisotropy grain on magnetization reversal in
   polycrystalline bit-patterned media
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article
AB We compute the switching field in a disk-shaped polycrystalline exchange-coupled bit (similar material to those found in bit-patterned media (BPM)) with micromagnetics, by varying physical parameters of a test grain. It was found that the size and the anisotropy of the test grain have substantial effects on the switching field, while its location has only minor influence. Scaling of the bit and the test grain dimensions result in similar switching properties. Switching field was reduced when the number of the low anisotropy test grains increased. Additionally, it was established that the intergranular exchange coupling needs to be at least 10% of the intragrain exchange for the bit to behave as one exchange-coupled entity. This investigation provides some insights for optimizing the material microstructure for the BPM application. (C) 2013 AIP Publishing LLC.
C1 [Kaganovskiy, Leon] Touro Coll, Dept Math, New York, NY 11230 USA.
   [Lau, June W.] NIST, Mat Sci & Engn Div, Gaithersburg, MD 20899 USA.
   [Khizroev, Sakhrat] Florida Int Univ, Miami, FL 33174 USA.
   [Litvinov, Dmitri] Univ Houston, Houston, TX 77204 USA.
   [Litvinov, Dmitri] Univ Houston, Ctr Integrated Bio & Nano Syst, Houston, TX 77204 USA.
RP Kaganovskiy, L (reprint author), Touro Coll, Dept Math, New York, NY 11230 USA.
EM leonkag@gmail.com; june.lau@nist.gov; khizroev@fiu.edu; litvinov@uh.edu
FU NSF [ECCS-0926027, CMMI-0927786, ECCS-0702752]
FX This research was supported in part by NSF Grants ECCS-0926027,
   CMMI-0927786, and ECCS-0702752, and with the resources of the Center for
   Integrated Bio and Nanosystems. The authors would like to thank Dr.
   Dieter Weller of Hitachi GST for fruitful discussions.
CR Albrecht M, 2002, J APPL PHYS, V91, P6845, DOI 10.1063/1.1447174
   Chunsheng E, 2006, J APPL PHYS, V99, DOI 10.1063/1.2200879
   Chunsheng E., 2008, J APPL PHYS, V103
   Donahue M. J., 1999, TECHNICAL REPORT
   Guo VW, 2011, J APPL PHYS, V109, DOI 10.1063/1.3558986
   Kaganovskiy L, 2012, J APPL PHYS, V111, DOI 10.1063/1.3679563
   Lau JW, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2822439
   Litvinov D, 2008, IEEE T NANOTECHNOL, V7, P463, DOI 10.1109/TNANO.2008.920183
   Ranjbar M., 2011, APPL PHYS LETT, V99
   Shaw JM, 2007, J APPL PHYS, V101, DOI 10.1063/1.2431399
   Shaw JM, 2010, PHYS REV B, V82, DOI 10.1103/PhysRevB.82.144437
   Spargo AW, 2002, J APPL PHYS, V91, P6923, DOI 10.1063/1.1452191
   Thomson T, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.257204
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
NR 14
TC 1
Z9 1
U1 0
U2 11
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0021-8979
EI 1089-7550
J9 J APPL PHYS
JI J. Appl. Phys.
PD SEP 28
PY 2013
VL 114
IS 12
AR 123909
DI 10.1063/1.4822315
PG 5
WC Physics, Applied
SC Physics
GA 231CR
UT WOS:000325391100036
ER

PT J
AU Jungreuthmayer, C
   Beurton-Aimar, M
   Zanghellini, J
AF Jungreuthmayer, Christian
   Beurton-Aimar, Marie
   Zanghellini, Jurgen
TI Fast Computation of Minimal Cut Sets in Metabolic Networks with a Berge
   Algorithm That Utilizes Binary Bit Pattern Trees
SO IEEE-ACM TRANSACTIONS ON COMPUTATIONAL BIOLOGY AND BIOINFORMATICS
LA English
DT Article
DE Elementary mode analysis; minimal cut sets; gene knockout; bit pattern;
   tree code
ID ELEMENTARY FLUX MODES; BIOCHEMICAL NETWORKS; PATHWAY ANALYSIS;
   STRATEGIES; CELL
AB Minimal cut sets are a valuable tool for analyzing metabolic networks and for identifying optimal gene intervention strategies by eliminating unwanted metabolic functions and keeping desired functionality. Minimal cut sets rely on the concept of elementary flux modes, which are sets of indivisible metabolic pathways under steady-state condition. However, the computation of minimal cut sets is nontrivial, as even medium-sized metabolic networks with just 100 reactions easily have several hundred million elementary flux modes. We developed a minimal cut set tool that implements the well-known Berge algorithm and utilizes a novel approach to significantly reduce the program runtime by using binary bit pattern trees. By using the introduced tree approach, the size of metabolic models that can be analyzed and optimized by minimal cut sets is pushed to new and considerably higher limits.
C1 [Jungreuthmayer, Christian; Zanghellini, Jurgen] Univ Nat Resources & Life Sci, Dept Biotechnol, Vienna, Austria.
   [Jungreuthmayer, Christian; Zanghellini, Jurgen] Austrian Ctr Ind Biotechnol, Metab Modeling Grp, A-1190 Vienna, Austria.
   [Beurton-Aimar, Marie] Univ Bordeaux, Lab Bordelais Rech Informat LABRI, F-33400 Talence, France.
RP Jungreuthmayer, C (reprint author), Univ Nat Resources & Life Sci, Dept Biotechnol, Vienna, Austria.
EM christian.jungreuthmayer@acib.at
RI Zanghellini, Jurgen/A-4635-2017
OI Zanghellini, Jurgen/0000-0002-1964-2455
FU Federal Ministry of Economy, Family and Youth (bmwfj); Federal Ministry
   of Traffic, Innovation and Technology (bmvit); Styrian Business
   Promotion Agency SFG; Standortagentur Tirol; ZIT-Technology Agency of
   the City of Vienna through the COMET-Funding Program
FX This work was supported by the Federal Ministry of Economy, Family and
   Youth (bmwfj), the Federal Ministry of Traffic, Innovation and
   Technology (bmvit), the Styrian Business Promotion Agency SFG, the
   Standortagentur Tirol, and ZIT-Technology Agency of the City of Vienna
   through the COMET-Funding Program managed by the Austrian Research
   Promotion Agency FFG.
CR Ballerstein K., 2011, BIOINFORMATICS, V28, P381
   Berge C., 1989, HYPERGRAPHS COMBINAT, V45
   Beurton-Aimar M, 2011, BMC SYST BIOL, V5, DOI 10.1186/1752-0509-5-95
   Eiter T, 2008, DISCRETE APPL MATH, V156, P2035, DOI 10.1016/j.dam.2007.04.017
   Hadicke O, 2011, METAB ENG, V13, P204, DOI 10.1016/j.ymben.2010.12.004
   Hagen M, 2009, DISCRETE APPL MATH, V157, P1460, DOI 10.1016/j.dam.2008.10.004
   Haus UU, 2008, J COMPUT BIOL, V15, P259, DOI 10.1089/cmb.2007.0229
   Jevremovic D, 2011, PARALLEL COMPUT, V37, P261, DOI 10.1016/j.parco.2011.04.002
   Jungreuthmayer C., 2012, UTILIZING GENE REGUL
   Jungreuthmayer C., 2013, BMC BIOINFO IN PRESS
   Jungreuthmayer C., 2012, REGULATORY ELEMENTAR
   Jungreuthmayer C, 2013, BIOSYSTEMS, V113, P37, DOI 10.1016/j.biosystems.2013.04.002
   Jungreuthmayer C, 2012, BMC SYST BIOL, V6, DOI 10.1186/1752-0509-6-103
   Klamt S, 2006, BIOSYSTEMS, V83, P233, DOI 10.1016/j.biosystems.2005.04.009
   Klamt S, 2004, BIOINFORMATICS, V20, P226, DOI 10.1093/bioinformatics/btg395
   Klamt S, 2002, MOL BIOL REP, V29, P233, DOI 10.1023/A:1020390132244
   Murakami K., 2013, P M ALG ENG EXP ALEN, P1
   Pritchard P, 1999, J ALGORITHM, V33, P187, DOI 10.1006/jagm.1999.1032
   Schuster S, 2000, NAT BIOTECHNOL, V18, P326, DOI 10.1038/73786
   Schuster S, 1999, TRENDS BIOTECHNOL, V17, P53, DOI 10.1016/S0167-7799(98)01290-6
   Shen H, 1996, INT J COMPUT MATH, V61, P195, DOI 10.1080/00207169608804512
   Terzer M, 2008, BIOINFORMATICS, V24, P2229, DOI 10.1093/bioinformatics/btn401
   Trinh CT, 2008, APPL ENVIRON MICROB, V74, P3634, DOI 10.1128/AEM.02708-07
   Trinh CT, 2006, METAB ENG, V8, P628, DOI 10.1016/j.ymben.2006.07.006
NR 24
TC 4
Z9 4
U1 0
U2 1
PU IEEE COMPUTER SOC
PI LOS ALAMITOS
PA 10662 LOS VAQUEROS CIRCLE, PO BOX 3014, LOS ALAMITOS, CA 90720-1314 USA
SN 1545-5963
EI 1557-9964
J9 IEEE ACM T COMPUT BI
JI IEEE-ACM Trans. Comput. Biol. Bioinform.
PD SEP-OCT
PY 2013
VL 10
IS 5
BP 1329
EP 1333
DI 10.1109/TCBB.2013.116
PG 5
WC Biochemical Research Methods; Computer Science, Interdisciplinary
   Applications; Mathematics, Interdisciplinary Applications; Statistics &
   Probability
SC Biochemistry & Molecular Biology; Computer Science; Mathematics
GA AB0DG
UT WOS:000331461400024
PM 24062540
ER

PT J
AU Katayama, R
AF Katayama, Ryuichi
TI Proposal for Angular Momentum Multiplexing in Microholographic Recording
SO JAPANESE JOURNAL OF APPLIED PHYSICS
LA English
DT Article
ID GAUSSIAN LASER MODES; PHASE SINGULARITIES; DATA-STORAGE; PARTICLES;
   ROTATION; BEAMS; PATTERNS; LIGHT
AB A novel multiplexing technology in microholographic recording using beams that have an orbital angular momentum has been proposed. The multiplexing is carried out by changing the order of the phase singularity (m) of beams for recording and readout in multiple states. In the recording operation, multiple microholograms are formed at the same position of the recording medium by changing the value of m. In the readout operation, each of the multiple microholograms is selectively reproduced by changing the value of m. Microholograms with m not equal 0 have a spiral shape, and the handednesses, multiplicities, and pitches of the spiral differ from each other depending on the value of m. A readout signal simulation has demonstrated that the multiplexing of at least five bits is feasible. It is expected that a terabyte-order recording capacity will be achieved in microholographic recording by combining this technology with three-dimensional recording technology. (c) 2013 The Japan Society of Applied Physics
C1 Fukuoka Inst Technol, Dept Informat Elect, Fac Engn, Fukuoka 8110295, Japan.
RP Katayama, R (reprint author), Fukuoka Inst Technol, Dept Informat Elect, Fac Engn, Fukuoka 8110295, Japan.
EM r-katayama@fit.ac.jp
CR ALLEN L, 1992, PHYS REV A, V45, P8185, DOI 10.1103/PhysRevA.45.8185
   BEIJERSBERGEN MW, 1993, OPT COMMUN, V96, P123, DOI 10.1016/0030-4018(93)90535-D
   BEIJERSBERGEN MW, 1994, OPT COMMUN, V112, P321, DOI 10.1016/0030-4018(94)90638-6
   Boden E. P., 2011, ISOM ODS
   Dubois M, 2006, JPN J APPL PHYS 1, V45, P1239, DOI 10.1143/JJAP.45.1239
   Eichler HJ, 1998, IEEE J SEL TOP QUANT, V4, P840, DOI 10.1109/2944.735770
   HE H, 1995, PHYS REV LETT, V75, P826, DOI 10.1103/PhysRevLett.75.826
   HECKENBERG NR, 1992, OPT LETT, V17, P221, DOI 10.1364/OL.17.000221
   HECKENBERG NR, 1992, OPT QUANT ELECTRON, V24, pS951, DOI 10.1007/BF01588597
   Horigome T, 2008, JPN J APPL PHYS, V47, P5881, DOI 10.1143/JJAP.47.5881
   Katayama R, 2012, JPN J APPL PHYS, V51, DOI 10.1143/JJAP.51.08JD04
   Katayama R, 2010, P SOC PHOTO-OPT INS, V7730, DOI 10.1117/12.859220
   Katayama R, 2010, JPN J APPL PHYS, V49, DOI 10.1143/JJAP.49.08KF02
   Katayama R, 2009, JPN J APPL PHYS, V48, DOI 10.1143/JJAP.48.03A056
   KOGELNIK H, 1969, AT&T TECH J, V48, P2909
   KOGELNIK H, 1966, APPL OPTICS, V5, P1550, DOI 10.1364/AO.5.001550
   Kowalski B. A., 2008, ISOM ODS
   Lafong A, 2006, OPT EXPRESS, V14, P3065, DOI 10.1364/OE.14.003065
   Iekys, 1995, OPT COMMUN, V119, P433
   MacDonald MP, 2002, OPT COMMUN, V201, P21, DOI 10.1016/S0030-4018(01)01652-2
   McLeod RR, 2005, APPL OPTICS, V44, P3197, DOI 10.1364/AO.44.003197
   McLeod R. R., 2011, ISOM ODS
   Mikami H, 2012, JPN J APPL PHYS, V51, DOI 10.1143/JJAP.51.08JD01
   Mikami H, 2010, PROC SPIE, V7730, DOI 10.1117/12.866058
   O'Neil AT, 2002, PHYS REV LETT, V88, DOI 10.1103/PhysRevLett.88.053601
   Orlic S., 2009, ODS
   Ostroverkhov V, 2009, JPN J APPL PHYS, V48, DOI 10.1143/JJAP.48.03A035
   Padgett M, 1996, AM J PHYS, V64, P77, DOI 10.1119/1.18283
   PADGETT MJ, 1995, OPT COMMUN, V121, P36, DOI 10.1016/0030-4018(95)00455-H
   Paterson L, 2001, SCIENCE, V292, P912, DOI 10.1126/science.1058591
   Saito K., 2007, P SOC PHOTO-OPT INS, V6282
   Shimura T, 2006, OPT LETT, V31, P1208, DOI 10.1364/OL.31.001208
   TAMM C, 1990, J OPT SOC AM B, V7, P1034, DOI 10.1364/JOSAB.7.001034
   Tao SH, 2005, OPT EXPRESS, V13, P7726, DOI 10.1364/OPEX.13.007726
NR 34
TC 4
Z9 5
U1 0
U2 4
PU IOP PUBLISHING LTD
PI BRISTOL
PA TEMPLE CIRCUS, TEMPLE WAY, BRISTOL BS1 6BE, ENGLAND
SN 0021-4922
EI 1347-4065
J9 JPN J APPL PHYS
JI Jpn. J. Appl. Phys.
PD SEP
PY 2013
VL 52
IS 9
SI SI
AR UNSP 09LD11
DI 10.7567/JJAP.52.09LD11
PN 3
PG 6
WC Physics, Applied
SC Physics
GA 224MG
UT WOS:000324890000024
ER

PT J
AU Li, LP
   Bogy, DB
AF Li, Liping
   Bogy, David B.
TI Air bearing dynamic stability on bit patterned media disks
SO MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND
   PROCESSING SYSTEMS
LA English
DT Article; Proceedings Paper
CT ASME-ISPS/JSME-IIP Joint International Conference on Micromechatronics
   for Information and Precision Equipment
CY JUN 18-20, 2012
CL Santa Clara, CA
ID SLIDERS
AB Bit Patterned media (BPM) recording is one of the potential technologies to be used in future disk drives in order to increase the areal density to 5 Tbit/in(2). But one of the main obstacles for BPM is to achieve dynamic stability of the air bearing slider at the head-disk interface (HDI). In this paper we first use a direct simulation method to check the accuracy of our previously developed Homogenization Reynolds equation solution. After confirming the accuracy it is then implemented to study the slider's flying attitude on BPM disks. Then we investigate the system's parameters using a system identification method by simultaneously solving the equations of motion of the slider and the Homogenization Reynolds equation. We observe that the first pitch mode frequency of the air bearing increases with increase of pattern groove area ratio and pattern height. And the stiffness decreases when the pattern groove area ratio or pattern height increases. We conclude that a partially planarized BPM is preferred in order to maintain the dynamic stability of the HDI.
C1 [Li, Liping; Bogy, David B.] Univ Calif Berkeley, Dept Mech Engn, Comp Mech Lab, Berkeley, CA 94720 USA.
RP Li, LP (reprint author), Univ Calif Berkeley, Dept Mech Engn, Comp Mech Lab, Berkeley, CA 94720 USA.
EM mellxaa@gmail.com
CR FUKUI S, 1990, J TRIBOL-T ASME, V112, P78, DOI 10.1115/1.2920234
   Fukui S., 1988, ASME, V110, P253
   Gupta V, 2007, THESIS U CALIFORNIA
   Hanchi J, 2011, IEEE T MAGN, V47, P46, DOI 10.1109/TMAG.2010.2071857
   Hu Y., 1996, THESIS U CALIFORNIA
   Knigge BE, 2008, IEEE T MAGN, V44, P3656, DOI 10.1109/TMAG.2008.2002613
   Li H, 2009, TRIBOL LETT, V33, P199, DOI 10.1007/s11249-009-9409-7
   Li JH, 2011, TRIBOL LETT, V42, P233, DOI 10.1007/s11249-011-9767-9
   Li L, 2011, IEEE INT MAGN C APR
   Li LP, 2011, MICROSYST TECHNOL, V17, P805, DOI 10.1007/s00542-010-1191-9
   Myo KS, 2011, IEEE T MAGN, V47, P2660, DOI 10.1109/TMAG.2011.2159965
   Zeng QH, 1997, IEEE T MAGN, V33, P3124, DOI 10.1109/20.617865
   Zeng QH, 1999, J TRIBOL-T ASME, V121, P341, DOI 10.1115/1.2833943
NR 13
TC 3
Z9 3
U1 0
U2 8
PU SPRINGER
PI NEW YORK
PA 233 SPRING ST, NEW YORK, NY 10013 USA
SN 0946-7076
EI 1432-1858
J9 MICROSYST TECHNOL
JI Microsyst. Technol.
PD SEP
PY 2013
VL 19
IS 9-10
SI SI
BP 1401
EP 1406
DI 10.1007/s00542-013-1826-8
PG 6
WC Engineering, Electrical & Electronic; Nanoscience & Nanotechnology;
   Materials Science, Multidisciplinary; Physics, Applied
SC Engineering; Science & Technology - Other Topics; Materials Science;
   Physics
GA 208HD
UT WOS:000323667600018
ER

PT J
AU Fukui, S
   Oono, A
   Matsuoka, H
AF Fukui, Shigehisa
   Oono, Atsusi
   Matsuoka, Hiroshige
TI Dynamic flying characteristics of an air bearing slider over a disk with
   grooves and distribution of material properties
SO MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND
   PROCESSING SYSTEMS
LA English
DT Article; Proceedings Paper
CT ASME-ISPS/JSME-IIP Joint International Conference on Micromechatronics
   for Information and Precision Equipment
CY JUN 18-20, 2012
CL Santa Clara, CA
ID DISCRETE TRACK; HEAD SLIDERS; MEDIA
AB Bit-patterned media (BPM) consisting of land parts for read/writing and grooves, which are almost filled with non-magnetic materials to prevent magnetic interference between recording bits, are considered to be promising media for achieving ultrahigh density recording. A flying head slider flying over a BPM disk suffers from variations in both the spacing and van der Waals (vdW) attractive forces, which induce slider vibrations and spacing fluctuations. In the present study, we considered that BPM disks not only have a groove depth distribution, but that they also have a distribution of material properties (e.g., refractive index), which gives rise to a distribution in the vdW force. In the dynamic responses of sliders with small groove depths and a small variation in the refractive index, spacing fluctuations are found to be a superposition of fluctuations due to slider behaviors (1) over a disk with transverse grooves in a uniform material with a uniform refractive index (Case 1) and (2) over a flat disk with a refractive index distribution (Case 2). When the effects of Cases 1 and 2 cancel each other, the spacing fluctuations for the two cases cancel each other, reducing the total spacing fluctuation.
C1 [Fukui, Shigehisa; Oono, Atsusi; Matsuoka, Hiroshige] Tottori Univ, Dept Mech & Aerosp Engn, Tottori 6808552, Japan.
RP Fukui, S (reprint author), Tottori Univ, Dept Mech & Aerosp Engn, 4-101 Minami, Tottori 6808552, Japan.
EM fukui@damp.tottori-u.ac.jp
CR FUKUI S, 1990, JSME INT J III-VIB C, V33, P76
   FUKUI S, 1990, J TRIBOL-T ASME, V112, P78, DOI 10.1115/1.2920234
   Fukui S, 1988, T ASME, V110, P253
   Fukui S, 2012, MICROSYST TECHNOL, V18, P1633, DOI 10.1007/s00542-012-1601-2
   Fukui S, 2008, IEEE T MAGN, V44, P3671, DOI 10.1109/TMAG.2008.2002526
   Israelachvili J., 1992, INTERMOLECULAR SURFA
   Knigge BE, 2008, IEEE T MAGN, V44, P3656, DOI 10.1109/TMAG.2008.2002613
   Li LP, 2011, MICROSYST TECHNOL, V17, P805, DOI 10.1007/s00542-010-1191-9
   Matsuoka H, 2005, MICROSYST TECHNOL, V11, P824, DOI 10.1007/s00542-005-0541-5
   Murthy AN, 2010, TRIBOL LETT, V38, P47, DOI 10.1007/s11249-009-9570-z
   Wachenschwanz D, 2005, IEEE T MAGN, V41, P670, DOI 10.1109/TMAG.2004.838049
NR 11
TC 2
Z9 2
U1 1
U2 5
PU SPRINGER
PI NEW YORK
PA 233 SPRING ST, NEW YORK, NY 10013 USA
SN 0946-7076
EI 1432-1858
J9 MICROSYST TECHNOL
JI Microsyst. Technol.
PD SEP
PY 2013
VL 19
IS 9-10
SI SI
BP 1685
EP 1690
DI 10.1007/s00542-013-1879-8
PG 6
WC Engineering, Electrical & Electronic; Nanoscience & Nanotechnology;
   Materials Science, Multidisciplinary; Physics, Applied
SC Engineering; Science & Technology - Other Topics; Materials Science;
   Physics
GA 208HD
UT WOS:000323667600052
ER

PT J
AU Li, HJ
   Wei, D
   Piramanayagam, SN
AF Li, Hongjia
   Wei, Dan
   Piramanayagam, S. N.
TI Optimization of perpendicular magnetic anisotropy tips for high
   resolution magnetic force microscopy by micromagnetic simulations
SO APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
LA English
DT Article
ID SPATIAL-RESOLUTION; PATTERNED MEDIA; MFM
AB Magnetic Force Microscopy (MFM) tip coated with perpendicular magnetic anisotropy film (PMA tip) is one of the choices for high resolution imaging at low scan height (SH), since it has negligible tip-sample interaction related to its stable magnetic state, sharp, and small tip stray field. In this work, detailed micromagnetic studies are carried out to understand the effect of geometrical and magnetic parameters including the cone angle theta of the PMA tip, intergrain exchange constant , saturation magnetization M (s) and uniaxial crystalline anisotropy constant K (1) of the tip coating on the MFM tip resolution. To evaluate the resolution performance of the optimized PMA tip, MFM images of high-density granular recording media and patterned media are simulated. We find that, for the PMA tip and its coating, a cone angle in a range of 36.9(a similar to) to 53.1(a similar to), a saturation M (s) of 700 emu/cm(3), a large uniaxial crystalline anisotropy constant K (1) (> 4.9x10(6) erg/cm(3)) and a high intergrain exchange constant of (0.3-1.0)x10(-6) erg/cm are optimized conditions for high resolution imaging. The optimized PMA tip has an excellent performance on imaging of high-density thin film media (bit size of 8x16 nm(2)) at low SH of 2-8 nm and bit pattern media with a pitch of 50 nm, edge-edge spacing of 5-15 nm at SH of 8-15 nm.
C1 [Li, Hongjia; Wei, Dan] Tsinghua Univ, Dept Mat Sci & Engn, Adv Mat Lab, Beijing 100084, Peoples R China.
   [Piramanayagam, S. N.] ASTAR, Data Storage Inst, Singapore 117608, Singapore.
RP Wei, D (reprint author), Tsinghua Univ, Dept Mat Sci & Engn, Adv Mat Lab, Beijing 100084, Peoples R China.
EM weidan@mail.tsinghua.edu.cn
RI Piramanayagam, SN/A-4192-2008
OI Piramanayagam, SN/0000-0002-3178-2960
FU NSFC [51071088]
FX The authors are thankful for the support of NSFC 51071088.
CR Amos N., 2009, J APPL PHYS, V105
   Chen IC, 2008, NANOTECHNOLOGY, V19, DOI 10.1088/0957-4484/19/7/075501
   FISCHER PB, 1993, J VAC SCI TECHNOL B, V11, P2570, DOI 10.1116/1.586626
   Gao L, 2004, IEEE T MAGN, V40, P2194, DOI 10.1109/TMAG.2004.829173
   GRUTTER P, 1990, APPL PHYS LETT, V57, P1820
   Huang HS, 2007, SCRIPTA MATER, V56, P365, DOI 10.1016/j.scriptamat.2006.11.014
   IWASAKI S, 1978, IEEE T MAGN, V14, P849, DOI 10.1109/TMAG.1978.1059928
   Koblischka MR, 2004, J MAGN MAGN MATER, V272, P2138, DOI 10.1016/j.jmmm.2004.01.030
   Kuramochi H, 2005, NANOTECHNOLOGY, V16, P24, DOI [10.1088/0957-4484/16/1/006, 10.1080/0957-4484/16/1/006]
   Lau JW, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2822439
   Lee N, 2004, NANOTECHNOLOGY, V15, P901, DOI 10.1088/0957-4484/15/8/005
   Li Hongjia, 2012, J APPL PHYS, V111
   Li HJ, 2010, IEEE T MAGN, V46, P2570, DOI 10.1109/TMAG.2010.2044510
   MARTIN Y, 1987, APPL PHYS LETT, V50, P1455, DOI 10.1063/1.97800
   Ohtake M, 2012, J APPL PHYS, V111
   Piramanayagam S.N., 2011, J APPL PHYS, V109
   Porthun S, 1998, J MAGN MAGN MATER, V182, P238, DOI 10.1016/S0304-8853(97)01010-X
   Rettner CT, 2002, IEEE T MAGN, V38, P1725, DOI 10.1109/TMAG.2002.1017763
   Saito H, 2005, IEEE T MAGN, V41, P4394, DOI 10.1109/TMAG.2005.859891
   Saito H, 2003, IEEE T MAGN, V39, P3447, DOI 10.1109/TMAG.2003.816178
   SCHONENBERGER C, 1990, Z PHYS B CON MAT, V80, P373, DOI 10.1007/BF01323519
   Skidmore GD, 1997, APPL PHYS LETT, V71, P3293, DOI 10.1063/1.120316
   Wei D, 2009, IEEE T MAGN, V45, P3035, DOI 10.1109/TMAG.2009.2017260
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
NR 24
TC 1
Z9 1
U1 1
U2 29
PU SPRINGER
PI NEW YORK
PA 233 SPRING ST, NEW YORK, NY 10013 USA
SN 0947-8396
J9 APPL PHYS A-MATER
JI Appl. Phys. A-Mater. Sci. Process.
PD SEP
PY 2013
VL 112
IS 4
BP 985
EP 991
DI 10.1007/s00339-012-7459-4
PG 7
WC Materials Science, Multidisciplinary; Physics, Applied
SC Materials Science; Physics
GA 194ZH
UT WOS:000322670700024
ER

PT J
AU Watson, CS
   Hollar, C
   Anderson, K
   Knowlton, WB
   Mullner, P
AF Watson, Chad S.
   Hollar, Courtney
   Anderson, Kimball
   Knowlton, William B.
   Muellner, Peter
TI Magnetomechanical Four-State Memory
SO ADVANCED FUNCTIONAL MATERIALS
LA English
DT Article
DE magnetic shape memory alloys; magnetic memory; nanomechanical properties
ID MN-GA MARTENSITE; MAGNETIC FORCE MICROSCOPY; CELLULAR-AUTOMATA;
   SINGLE-CRYSTALS; DATA-STORAGE; THIN-FILMS; STRESS; STRAIN; PHASE
AB With current non-volatile memory technology approaching intrinsic storage density limits, new data storage technologies are under development. Probe-based storage systems provide alternatives to conventional mass storage technologies. Ni-Mn-Ga, a ferromagnetic shape memory alloy (FSMA), is proposed as a medium for multi-bit storage using scanning probe microscopy (SPM) techniques. Local modifications of the magnetic stray field were achieved using nanoindentation. Magnetic poles collect within the indentation, which is leveraged to control the magnetic stray field for the patterning of magnetic information. Four magnetic-based memory states are possible due to magnetic field or stress-induced twin rearrangement along two crystal orientations, each with two possible magnetic orientations.
C1 [Watson, Chad S.; Hollar, Courtney; Anderson, Kimball; Knowlton, William B.; Muellner, Peter] Boise State Univ, Dept Mat Sci & Engn, Boise, ID 83725 USA.
   [Hollar, Courtney; Anderson, Kimball] Boise State Univ, Dept Mech & Biomed Engn, Boise, ID 83725 USA.
   [Knowlton, William B.] Boise State Univ, Dept Elect & Comp Engn, Boise, ID 83725 USA.
RP Watson, CS (reprint author), Boise State Univ, Dept Mat Sci & Engn, Boise, ID 83725 USA.
EM chadwatson1@boisestate.edu
FU National Science Foundation [CMMI-1068069]; DARPA [N66001-01-C-80345]
FX The authors thank Andrew Morrison for technical assistance. Financial
   support through the National Science Foundation under Grant No.
   CMMI-1068069 and DARPA Contract No. N66001-01-C-80345 is gratefully
   acknowledged.
CR Aaltio I., 2012, J ALLOYS CO IN PRESS
   Ahn CH, 1997, SCIENCE, V276, P1100, DOI 10.1126/science.276.5315.1100
   Belova LM, 2012, REV SCI INSTRUM, V83, DOI 10.1063/1.4752225
   Betz C. E., 1967, PRINCIPLES MAGNETIC
   Bitter F, 1931, PHYS REV, V38, P1903, DOI 10.1103/PhysRev.38.1903
   Cowburn RP, 2000, SCIENCE, V287, P1466, DOI 10.1126/science.287.5457.1466
   Faran E, 2012, APPL PHYS LETT, V100, DOI 10.1063/1.3702459
   Ganor Y, 2008, APPL PHYS LETT, V93, DOI 10.1063/1.2961023
   Gidon S, 2004, APPL PHYS LETT, V85, P6392, DOI 10.1063/1.1834718
   Heczko O, 2005, J MAGN MAGN MATER, V290, P787, DOI 10.1016/j.jmmm.2004.11.397
   Howe JM, 2009, PROG MATER SCI, V54, P792, DOI 10.1016/j.pmatsci.2009.04.001
   Hubert A., 1998, MAGNETIC DOMAINS ANA
   Imre A, 2006, SCIENCE, V311, P205, DOI 10.1126/science.1120506
   Jakob AM, 2012, NEW J PHYS, V14, DOI 10.1088/1367-2630/14/3/033029
   Lau JW, 2011, J PHYS D APPL PHYS, V44, DOI 10.1088/0022-3727/44/30/303001
   Li G, 2005, SCRIPTA MATER, V53, P829, DOI [10.1016/j.scriptamat.2005.06.005, 10.1016/j.scritpamat.2005.06.005]
   Liu C, 2008, APPL SURF SCI, V254, P2861, DOI 10.1016/j.apsusc.2007.10.031
   LOHNDORF M, 1995, APPL PHYS A-MATER, V61, P93, DOI 10.1007/BF01538218
   Marioni MA, 2003, APPL PHYS LETT, V83, P3966, DOI 10.1063/1.1626021
   Martin JI, 2003, J MAGN MAGN MATER, V256, P449, DOI 10.1016/S0304-8853(02)00898-3
   Mullner P, 2008, MAT SCI ENG A-STRUCT, V481, P66, DOI 10.1016/j.msea.2006.12.215
   Mullner P, 2003, SCRIPTA MATER, V49, P129, DOI 10.1016/S1359-6462(03)00219-7
   Ohtake M, 2012, J APPL PHYS, V111
   Pramanick A, 2011, SCRIPTA MATER, V65, P540, DOI 10.1016/j.scriptamat.2011.06.022
   Scheerbaum N, 2010, ACTA MATER, V58, P4629, DOI 10.1016/j.actamat.2010.04.030
   Shaw GA, 2005, ADV MATER, V17, P1123, DOI 10.1002/adma.200400942
   Sozinov A, 2002, APPL PHYS LETT, V80, P1746, DOI 10.1063/1.1458075
   Straka L, 2006, SCRIPTA MATER, V54, P1549, DOI [10.1016/j.scriptamat.2006.01.028, 10.1016/j.scriptamat.2005.01.028]
   Straka L, 2005, J MAGN MAGN MATER, V290, P829, DOI 10.1016/j.jmmm.2004.11.375
   Straka L, 2012, SCRIPTA MATER, V67, P25, DOI 10.1016/j.scriptamat.2012.03.012
   Straka L, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3373608
   Tebble R. S., 1969, MAGNETIC DOMAINS
   Uchic MD, 2004, SCIENCE, V305, P986, DOI 10.1126/science.1098993
   Ullakko K, 1996, APPL PHYS LETT, V69, P1966, DOI 10.1063/1.117637
   Vettiger P, 2002, IEEE T NANOTECHNOL, V1, P39, DOI 10.1109/TNANO.2002.1005425
   WADAS A, 1990, J APPL PHYS, V68, P4767, DOI 10.1063/1.346131
   Wang RF, 2006, NATURE, V439, P303, DOI 10.1038/nature04447
   Wiesmann D, 2009, NANO LETT, V9, P3171, DOI 10.1021/nl9013666
   WILLIAMS HJ, 1949, PHYS REV, V75, P155, DOI 10.1103/PhysRev.75.155
NR 39
TC 10
Z9 10
U1 2
U2 26
PU WILEY-V C H VERLAG GMBH
PI WEINHEIM
PA BOSCHSTRASSE 12, D-69469 WEINHEIM, GERMANY
SN 1616-301X
EI 1616-3028
J9 ADV FUNCT MATER
JI Adv. Funct. Mater.
PD AUG 26
PY 2013
VL 23
IS 32
BP 3995
EP 4001
DI 10.1002/adfm.201203015
PG 7
WC Chemistry, Multidisciplinary; Chemistry, Physical; Nanoscience &
   Nanotechnology; Materials Science, Multidisciplinary; Physics, Applied;
   Physics, Condensed Matter
SC Chemistry; Science & Technology - Other Topics; Materials Science;
   Physics
GA 258XI
UT WOS:000327491600007
ER

PT J
AU Zheng, Z
   Chang, L
   Nekrashevich, I
   Ruchhoeft, P
   Khizroev, S
   Litvinov, D
AF Zheng, Zhen
   Chang, Long
   Nekrashevich, Ivan
   Ruchhoeft, Paul
   Khizroev, Sakhrat
   Litvinov, Dmitri
TI Fabrication of Dense Non-Circular Nanomagnetic Device Arrays Using
   Self-Limiting Low-Energy Glow-Discharge Processing
SO PLOS ONE
LA English
DT Article
ID PROXIMITY EFFECT CORRECTION; ELECTRON-BEAM LITHOGRAPHY; BLOCK-COPOLYMER;
   ION
AB We describe a low-energy glow-discharge process using reactive ion etching system that enables non-circular device patterns, such as squares or hexagons, to be formed from a precursor array of uniform circular openings in polymethyl methacrylate, PMMA, defined by electron beam lithography. This technique is of a particular interest for bit-patterned magnetic recording medium fabrication, where close packed square magnetic bits may improve its recording performance. The process and results of generating close packed square patterns by self-limiting low-energy glow-discharge are investigated. Dense magnetic arrays formed by electrochemical deposition of nickel over self-limiting formed molds are demonstrated.
C1 [Zheng, Zhen; Chang, Long; Nekrashevich, Ivan; Ruchhoeft, Paul; Litvinov, Dmitri] Univ Houston, Houston, TX 77004 USA.
   [Zheng, Zhen; Chang, Long; Nekrashevich, Ivan; Ruchhoeft, Paul; Litvinov, Dmitri] Univ Houston, Ctr Integrated Bio & Nano Syst, Houston, TX USA.
   [Khizroev, Sakhrat] Florida Int Univ, Miami, FL 33199 USA.
RP Litvinov, D (reprint author), Univ Houston, Houston, TX 77004 USA.
EM Litvinov@uh.edu
FU National Science Foundation [ECCS-0926027, CMMI-0927786, CBET-0933140]
FX This material is based upon work supported in part by the following
   National Science Foundation grants: ECCS-0926027, CMMI-0927786, and
   CBET-0933140. The funders had no role in study design, data collection
   and analysis, decision to publish, or preparation of the manuscript.
CR Ahn DU, 2008, SOFT MATTER, V4, P1454, DOI 10.1039/b801515e
   Bruce RL, 2009, J VAC SCI TECHNOL B, V27, P1142, DOI 10.1116/1.3136864
   CHANG THP, 1975, J VAC SCI TECHNOL, V12, P1271, DOI 10.1116/1.568515
   Dobisz EA, 2008, P IEEE, V96, P1836, DOI 10.1109/JPROC.2008.2007600
   Koval Y, 2004, J VAC SCI TECHNOL B, V22, P843, DOI 10.1116/1.1689306
   Liu CH, 2010, MODEL BASED PROXIMIT, P7637
   Nagano S, 2006, LANGMUIR, V22, P5233, DOI 10.1021/la060350k
   Nishihara H, 2011, CHEM MATER, V23, P3144, DOI 10.1021/cm103388y
   Osawa M, 2001, J VAC SCI TECHNOL B, V19, P2483, DOI 10.1116/1.1410090
   OWEN G, 1983, J APPL PHYS, V54, P3573, DOI 10.1063/1.332426
   Owen G, 1993, PROXIMITY EFFECT COR, P114
   Parekh VA, 2007, NANO LETT, V7, P3246, DOI 10.1021/nl071793r
   Shiroishi Y, 2009, IEEE T MAGN, V45, P3816, DOI 10.1109/TMAG.2009.2024879
   Tehrani S, 2000, IEEE T MAGN, V36, P2752, DOI 10.1109/20.908581
   Weller D, 1999, IEEE T MAGN, V35, P4423, DOI 10.1109/20.809134
   Zhou ZF, 2008, MATER LETT, V62, P3419, DOI 10.1016/j.matlet.2008.02.071
NR 16
TC 0
Z9 0
U1 2
U2 3
PU PUBLIC LIBRARY SCIENCE
PI SAN FRANCISCO
PA 1160 BATTERY STREET, STE 100, SAN FRANCISCO, CA 94111 USA
SN 1932-6203
J9 PLOS ONE
JI PLoS One
PD AUG 14
PY 2013
VL 8
IS 8
AR e73083
DI 10.1371/journal.pone.0073083
PG 6
WC Multidisciplinary Sciences
SC Science & Technology - Other Topics
GA 202MQ
UT WOS:000323221500145
PM 23967340
ER

PT J
AU Johnston-Peck, AC
   Cullen, DA
   Tracy, JB
AF Johnston-Peck, Aaron C.
   Cullen, David A.
   Tracy, Joseph B.
TI Composition-Mediated Order-Disorder Transformation in FePt Nanoparticles
SO PARTICLE & PARTICLE SYSTEMS CHARACTERIZATION
LA English
DT Article
DE electron microscopy; intermetallic phases; iron; magnetic materials;
   platinum
ID BIT-PATTERNED MEDIA; OXYGEN REDUCTION; CDSE NANOCRYSTALS; IRON-PLATINUM;
   PHASE; SUPERLATTICES; MECHANISM; COBALT; ALLOYS
C1 [Johnston-Peck, Aaron C.; Tracy, Joseph B.] N Carolina State Univ, Dept Mat Sci & Engn, Raleigh, NC 27695 USA.
   [Cullen, David A.] Oak Ridge Natl Lab, Div Mat Sci & Technol, Oak Ridge, TN 37831 USA.
RP Johnston-Peck, AC (reprint author), N Carolina State Univ, Dept Mat Sci & Engn, Box 7907, Raleigh, NC 27695 USA.
EM jbtracy@ncsu.edu
RI Cullen, David/A-2918-2015
OI Cullen, David/0000-0002-2593-7866
FU GAANN fellowship; National Science Foundation [CHE-0943975]; Oak Ridge
   National Laboratory's SHaRE User Facility; Scientific User Facilities
   Division, Office of Basic Energy Sciences, U.S. Department of Energy
FX The authors thank Giovanna Scarel and Gregory N. Parsons (NCSU) for
   providing assistance with atomic layer deposition. A.C.J.-P.
   acknowledges support from a GAANN fellowship. This research was
   supported by the National Science Foundation (CHE-0943975) and Oak Ridge
   National Laboratory's SHaRE User Facility, which is sponsored by the
   Scientific User Facilities Division, Office of Basic Energy Sciences,
   U.S. Department of Energy.
CR Aas CJ, 2011, APPL PHYS LETT, V99, DOI 10.1063/1.3644478
   Barmak K, 2005, J APPL PHYS, V98, DOI 10.1063/1.1991968
   Barthel J, 2010, ULTRAMICROSCOPY, V111, P27, DOI 10.1016/j.ultramic.2010.09.007
   Beck W, 2011, J PHYS CHEM C, V115, P10475, DOI 10.1021/jp201830m
   Biskupek J, 2012, ULTRAMICROSCOPY, V116, P1, DOI 10.1016/j.ultramic.2012.03.008
   Bondi JF, 2010, CHEM MATER, V22, P3988, DOI 10.1021/cm100705c
   BOURDILLON AJ, 1981, PHILOS MAG A, V44, P1335
   Cozzoli PD, 2005, CHEM MATER, V17, P1296, DOI 10.1021/cm047874v
   Deng ZT, 2005, J PHYS CHEM B, V109, P16671, DOI 10.1021/jp052484x
   Dinega DP, 1999, ANGEW CHEM INT EDIT, V38, P1788, DOI 10.1002/(SICI)1521-3773(19990614)38:12<1788::AID-ANIE1788>3.0.CO;2-2
   Ercius P, 2012, MICROSC MICROANAL, V18, P676, DOI 10.1017/S1431927612001225
   Greeley J, 2009, NAT CHEM, V1, P552, DOI [10.1038/nchem.367, 10.1038/NCHEM.367]
   Gutfleisch O, 2005, ADV ENG MATER, V7, P208, DOI 10.1002/adem.200400183
   HALL CR, 1966, PROC R SOC LON SER-A, V295, P140, DOI 10.1098/rspa.1966.0231
   Han LY, 2009, NANOTECHNOLOGY, V20, DOI 10.1088/0957-4484/20/28/285706
   HASHIMOTO H, 1962, PROC R SOC LON SER-A, V269, P80, DOI 10.1098/rspa.1962.0164
   Johnston-Peck AC, 2012, J APPL PHYS, V111, DOI 10.1063/1.3676419
   Johnston-Peck AC, 2011, NANOSCALE, V3, P4142, DOI 10.1039/c1nr10567a
   Kalezhi J, 2010, IEEE T MAGN, V46, P3752, DOI 10.1109/TMAG.2010.2052626
   Kim J, 2010, J AM CHEM SOC, V132, P4996, DOI 10.1021/ja1009629
   Knauer A, 2011, CHEM ENG J, V166, P1164, DOI 10.1016/j.cej.2010.12.028
   Koch C. T., 2002, THESIS ARIZONA STATE
   Kohler JM, 2008, CHEM ENG SCI, V63, P5048, DOI 10.1016/j.ces.2007.11.038
   Kong JZ, 2011, J MATER CHEM, V21, P5046, DOI 10.1039/c0jm03268a
   Kota Y, 2012, J APPL PHYS, V111, DOI 10.1063/1.3671436
   Krone P, 2009, J APPL PHYS, V106, DOI 10.1063/1.3260240
   Mohamed MB, 2005, J PHYS CHEM B, V109, P10533, DOI 10.1021/jp051123e
   Muller M., 2005, PHYS REV B, V72
   Nellist PD, 2000, ADV IMAG ELECT PHYS, V113, P147, DOI 10.1016/S1076-5670(00)80013-0
   Okamoto H, 2004, J PHASE EQUILIB DIFF, V25, P395, DOI 10.1361/15477030420241
   Paulus UA, 2002, J PHYS CHEM B, V106, P4181, DOI 10.1021/jp013442l
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Rong CB, 2007, J APPL PHYS, V101
   Ross C, 2001, ANN REV MATER RES, V31, P203, DOI 10.1146/annurev.matsci.31.1.203
   Saita S, 2005, CHEM MATER, V17, P3705, DOI 10.1021/cm050568c
   Shi YJ, 2010, IEEE T MAGN, V46, P1755, DOI 10.1109/TMAG.2010.2041047
   Sines IT, 2010, ANGEW CHEM INT EDIT, V49, P4638, DOI 10.1002/anie.201001213
   Song HM, 2006, CHEM COMMUN, P1292, DOI 10.1039/b516831g
   Srivastava C., 2008, J APPL PHYS, V104
   Srivastava C, 2007, J APPL PHYS, V102, DOI 10.1063/1.2816227
   Stadelmann P. A., 1999, JEMS ELECT MICROSCOP
   Sun SH, 2006, ADV MATER, V18, P393, DOI 10.1002/adma.200501464
   Sun SH, 2000, SCIENCE, V287, P1989, DOI 10.1126/science.287.5460.1989
   Sun SH, 1999, J APPL PHYS, V85, P4325, DOI 10.1063/1.370357
   Sun YG, 2012, NAT COMMUN, V3, DOI 10.1038/ncomms1963
   Torres KL, 2009, ULTRAMICROSCOPY, V109, P606, DOI 10.1016/j.ultramic.2008.10.029
   Vasquez Y, 2008, J AM CHEM SOC, V130, P11866, DOI 10.1021/ja804858u
   Vlaic P, 2010, J OPTOELECTRON ADV M, V12, P1114
   Wang DL, 2013, NAT MATER, V12, P81, DOI [10.1038/nmat3458, 10.1038/NMAT3458]
   Weller D, 1999, IEEE T MAGN, V35, P4423, DOI 10.1109/20.809134
   Yang B, 2006, ACTA MATER, V54, P4201, DOI 10.1016/j.actamat.2006.05.013
NR 51
TC 2
Z9 2
U1 1
U2 18
PU WILEY-V C H VERLAG GMBH
PI WEINHEIM
PA POSTFACH 101161, 69451 WEINHEIM, GERMANY
SN 0934-0866
EI 1521-4117
J9 PART PART SYST CHAR
JI Part. Part. Syst. Charact.
PD AUG
PY 2013
VL 30
IS 8
BP 678
EP 682
DI 10.1002/ppsc.201300028
PG 5
WC Chemistry, Physical; Nanoscience & Nanotechnology; Materials Science,
   Multidisciplinary
SC Chemistry; Science & Technology - Other Topics; Materials Science
GA 255OT
UT WOS:000327250400008
ER

PT J
AU Kurihara, M
   Satake, M
   Nishida, T
   Tsuchiya, Y
   Tada, Y
   Yoshida, H
   Negishi, N
AF Kurihara, Masaru
   Satake, Makoto
   Nishida, Tetsuya
   Tsuchiya, Yuko
   Tada, Yasuhiko
   Yoshida, Hiroshi
   Negishi, Nobuyuki
TI Silicon Mold Etching with Hard Mask Stack Using Spherical Structure of
   Block Copolymer for Bit-Patterned Media with 2.8 Tbit/in.(2)
SO JAPANESE JOURNAL OF APPLIED PHYSICS
LA English
DT Article
ID DENSITY MULTIPLICATION; FABRICATION; LITHOGRAPHY; FILMS
AB We investigated a silicon mold fabrication that uses a hard mask stack by using poly(methyl methacrylate)-block-poly(methacrylate polyhedral oligomeric silsesquioxane) (PMMA-b-PMAPOSS) as the block copolymer (BCP) to assemble nano-patterns for a nano-imprint lithography process during bit-patterned media manufacturing. We developed a dry development process comprised of a single step by taking both the selectivity and anisotropy into consideration, which enables us to create hole patterns by using an array of PMMA spheres embedded in a PMAPOSS matrix. The availability of this process was evaluated from the experimental results that showed that hole patterns at several areal densities were successfully obtained by adjusting the process time under a fixed etching condition. The capability of the pattern transfer to a hard mask from the hole patterns of residual PMAPOSS could be improved by changing the hard mask material from SiO2 to amorphous carbon based on the results from an X-ray photoelectron spectroscopy (XPS) surface analysis. Silicon molds with areal densities of up to 2.8 Tbit/in.(2) were successfully fabricated by using an optimized process condition and the hard mask stack. (C) 2013 The Japan Society of Applied Physics
C1 [Kurihara, Masaru; Satake, Makoto; Nishida, Tetsuya; Tsuchiya, Yuko; Negishi, Nobuyuki] Hitachi Ltd, Cent Res Lab, Kokubunji, Tokyo 1858601, Japan.
   [Tada, Yasuhiko; Yoshida, Hiroshi] Hitachi Ltd, Hitachi Res Lab, Hitachi, Ibaraki 3191292, Japan.
RP Kurihara, M (reprint author), Hitachi Ltd, Cent Res Lab, Kokubunji, Tokyo 1858601, Japan.
CR Austin MD, 2004, APPL PHYS LETT, V84, P5299, DOI 10.1063/1.1766071
   Bencher C, 2011, PROC SPIE, V7970, DOI 10.1117/12.881293
   [Anonymous], 2012, P INT S DRY PROC, pA
   Cheng JY, 2008, ADV MATER, V20, P3155, DOI 10.1002/adma.200800826
   Hamley IW, 2004, DEV BLOCK COPOLYMER
   Hirai T, 2008, MACROMOLECULES, V41, P4558, DOI 10.1021/ma800872v
   Mori M., 1999, P DRY PROC S, P115
   Joubert O, 1997, J ELECTROCHEM SOC, V144, P1854, DOI 10.1149/1.1837690
   Kamata Y, 2011, IEEE T MAGN, V47, P51, DOI 10.1109/TMAG.2010.2077274
   [Anonymous], HITACHI REV, V49, P211
   Kihara N, 2012, J VAC SCI TECHNOL B, V30, DOI 10.1116/1.4763356
   Kim SO, 2003, NATURE, V424, P411, DOI 10.1038/nature01775
   LU PL, 1994, IEEE T MAGN, V30, P4230, DOI 10.1109/20.334044
   Mori M., 2000, SOL STAT DEV MAT SSD, P192
   Negishi N, 2005, J VAC SCI TECHNOL B, V23, P217, DOI 10.1116/1.1849218
   Park C, 2003, POLYMER, V44, P6725, DOI 10.1016/j.polymer.2003.08.011
   Park S, 2009, SCIENCE, V323, P1030, DOI 10.1126/science.1168108
   Ross CA, 1999, J VAC SCI TECHNOL B, V17, P3168, DOI 10.1116/1.590974
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Segalman RA, 2001, ADV MATER, V13, P1152, DOI 10.1002/1521-4095(200108)13:15<1152::AID-ADMA1152>3.0.CO;2-5
   STOYKOVICH 7P, 2007, ACS NANO, V1, P168
   Tada Y, 2012, MACROMOLECULES, V45, P292, DOI 10.1021/ma201822a
   Tada Y, 2009, POLYMER, V50, P4250, DOI 10.1016/j.polymer.2009.06.039
   Tada Y, 2008, MACROMOLECULES, V41, P9267, DOI 10.1021/ma801542y
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
   Yamamoto R, 2012, JPN J APPL PHYS, V51, DOI 10.1143/JJAP.51.046503
   Yoshida H, 2011, J PHOTOPOLYM SCI TEC, V24, P577, DOI 10.2494/photopolymer.24.577
NR 27
TC 1
Z9 1
U1 4
U2 25
PU IOP PUBLISHING LTD
PI BRISTOL
PA TEMPLE CIRCUS, TEMPLE WAY, BRISTOL BS1 6BE, ENGLAND
SN 0021-4922
EI 1347-4065
J9 JPN J APPL PHYS
JI Jpn. J. Appl. Phys.
PD AUG
PY 2013
VL 52
IS 8
AR UNSP 086201
DI 10.7567/JJAP.52.086201
PN 1
PG 6
WC Physics, Applied
SC Physics
GA 191ZU
UT WOS:000322454500024
ER

PT J
AU Gu, WY
   Xu, J
   Kim, JK
   Hong, SW
   Wei, XY
   Yang, XM
   Lee, KY
   Kuo, DS
   Xiao, SG
   Russell, TP
AF Gu, Weiyin
   Xu, Ji
   Kim, Jung-Keun
   Hong, Sung Woo
   Wei, Xinyu
   Yang, Xiaomin
   Lee, Kim Y.
   Kuo, David S.
   Xiao, Shuaigang
   Russell, Thomas P.
TI Solvent-Assisted Directed Self-Assembly of Spherical Microdomain Block
   Copolymers to High Areal Density Arrays
SO ADVANCED MATERIALS
LA English
DT Article
DE block copolymers; directed self-assembly; solvent annealing; nanodots;
   bit-patterned media
ID THIN-FILMS; TEMPERATURE-DEPENDENCE; TRANSITION BEHAVIOR; DIBLOCK
   COPOLYMER; FACETED SURFACES; SOFT MATERIALS; BOTTOM-UP; LITHOGRAPHY;
   ORIENTATION; PATTERNS
C1 [Gu, Weiyin; Xu, Ji; Kim, Jung-Keun; Hong, Sung Woo; Wei, Xinyu; Russell, Thomas P.] Univ Massachusetts, Dept Polymer Sci & Engn, Amherst, MA 01003 USA.
   [Yang, Xiaomin; Lee, Kim Y.; Kuo, David S.; Xiao, Shuaigang] Seagate Technol, Fremont, CA 94538 USA.
RP Xiao, SG (reprint author), Seagate Technol, LLD 47010 Kato Rd, Fremont, CA 94538 USA.
EM shuaigang.xiao@seagate.com; russell@mail.pse.umass.edu
FU Department of Energy Office of Basic Energy Science [DE-FG02-96ER45612];
   Office of Science, Office of Basic Energy Sciences, of the U. S.
   Department of Energy [DE-AC02-05CH11231]
FX This work was supported by Department of Energy Office of Basic Energy
   Science under contract DE-FG02-96ER45612. The authors acknowledge the
   use of the Advanced Light Source, Berkeley National Laboratory, which is
   supported by the Office of Science, Office of Basic Energy Sciences, of
   the U. S. Department of Energy under Contract No. DE-AC02-05CH11231. We
   also acknowledge the assistance of A. Hexemer with the grazing incidence
   X-ray scattering measurements.
CR Angelescu DE, 2004, ADV MATER, V16, P1736, DOI 10.1002/adma.200400643
   Bates FS, 1999, PHYS TODAY, V52, P32, DOI 10.1063/1.882522
   Berry BC, 2007, NANO LETT, V7, P2789, DOI 10.1021/nl071354s
   Bita I, 2008, SCIENCE, V321, P939, DOI 10.1126/science.1159352
   Cavicchi KA, 2007, MACROMOLECULES, V40, P1181, DOI 10.1021/ma061163w
   Cheng JY, 2006, ADV MATER, V18, P2505, DOI 10.1002/adma.200502651
   Chou SY, 1996, J VAC SCI TECHNOL B, V14, P4129, DOI 10.1116/1.588605
   Geissler M, 2004, ADV MATER, V16, P1249, DOI 10.1002/adma.200400835
   Gu WY, 2012, ACS NANO, V6, P10250, DOI 10.1021/nn304049w
   Hamley I. W., 1998, PHYS BLOCK COPOLYMER
   Hammond MR, 2005, MACROMOLECULES, V38, P6575, DOI 10.1021/ma050479l
   HASHIMOTO T, 1980, MACROMOLECULES, V13, P1237, DOI 10.1021/ma60077a040
   Hawker CJ, 2005, MRS BULL, V30, P952, DOI 10.1557/mrs2005.249
   Hong SW, 2012, ADV MATER, V24, P4278, DOI 10.1002/adma.201201279
   Hong SW, 2012, P NATL ACAD SCI USA, V109, P1402, DOI 10.1073/pnas.1115803109
   Hong SW, 2011, ACS NANO, V5, P2855, DOI 10.1021/nn103401w
   Jeong JW, 2011, NANO LETT, V11, P4095, DOI 10.1021/nl2016224
   Jung YS, 2007, NANO LETT, V7, P2046, DOI 10.1021/nl070924l
   Kawata H., 1989, Microelectronic Engineering, V9, P31, DOI 10.1016/0167-9317(89)90008-7
   Kihara N, 2012, J VAC SCI TECHNOL B, V30
   Kim B, 2011, SOFT MATTER, V7, P443, DOI 10.1039/c0sm00422g
   Kim B, 2009, MACROMOLECULES, V42, P7919, DOI 10.1021/ma9013498
   Kim G, 1998, MACROMOLECULES, V31, P2569, DOI 10.1021/ma971349i
   Kim SH, 2004, ADV MATER, V16, P226, DOI 10.1002/adma.200304906
   Lecommandoux S, 2004, MACROMOLECULES, V37, P1843, DOI 10.1021/ma035627r
   Lee H, 2010, MACROMOLECULES, V43, P9892, DOI 10.1021/ma101743u
   Lee JH, 2012, NAT COMMUN, V3, DOI 10.1038/ncomms2166
   Lin Y, 2005, NATURE, V434, P55, DOI 10.1038/nature03310
   Majewski PW, 2012, J POLYM SCI POL PHYS, V50, P2, DOI 10.1002/polb.22382
   Mansky P, 1997, SCIENCE, V275, P1458, DOI 10.1126/science.275.5305.1458
   Park S, 2009, MACROMOLECULES, V42, P1278, DOI 10.1021/ma802480s
   Park S, 2009, SCIENCE, V323, P1030, DOI 10.1126/science.1168108
   Rontana R. E., 2002, IEEE T MAGN, V38, P95
   Ross CA, 2008, J VAC SCI TECHNOL B, V26, P2489, DOI 10.1116/1.2981079
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   RUSSELL TP, 1990, MACROMOLECULES, V23, P890, DOI 10.1021/ma00205a033
   Ryu DY, 2005, SCIENCE, V308, P236, DOI 10.1126/science.1106604
   Schmidt K, 2008, NAT MATER, V7, P142, DOI 10.1038/nmat2068
   Son JG, 2012, ACS MACRO LETT, V1, P1279, DOI 10.1021/mz300475g
   Son JG, 2011, NANO LETT, V11, P5079, DOI 10.1021/nl203445h
   Son JG, 2011, ADV MATER, V23, P634, DOI 10.1002/adma.201002999
   Stoykovich MP, 2006, MATER TODAY, V9, P20, DOI 10.1016/S1369-7021(06)71619-4
   Watt F., 2004, INT J NANOSCI, V4, P269, DOI 10.1142/S0219581X05003139
   Xiao SAG, 2011, NANOTECHNOLOGY, V22, DOI 10.1088/0957-4484/22/30/305302
   Xiao SG, 2009, ADV MATER, V21, P2516, DOI 10.1002/adma.200802087
   Xu J, 2011, ADV MATER, V23, P5755, DOI 10.1002/adma.201102964
   Xu J, 2010, ADV MATER, V22, P2268, DOI 10.1002/adma.200903640
   Xu T, 2003, ADV FUNCT MATER, V13, P698, DOI 10.1002/adfm.200304374
   Yang JH, 2011, APPL SURF SCI, V257, P4928, DOI 10.1016/j.apsusc.2010.12.151
   Yang JKW, 2010, NAT NANOTECHNOL, V5, P256, DOI [10.1038/nnano.2010.30, 10.1038/NNANO.2010.30]
   Zhu L, 2001, POLYMER, V42, P5829, DOI 10.1016/S0032-3861(00)00902-2
NR 51
TC 13
Z9 13
U1 8
U2 89
PU WILEY-V C H VERLAG GMBH
PI WEINHEIM
PA BOSCHSTRASSE 12, D-69469 WEINHEIM, GERMANY
SN 0935-9648
EI 1521-4095
J9 ADV MATER
JI Adv. Mater.
PD JUL 19
PY 2013
VL 25
IS 27
BP 3677
EP 3682
DI 10.1002/adma.201300899
PG 6
WC Chemistry, Multidisciplinary; Chemistry, Physical; Nanoscience &
   Nanotechnology; Materials Science, Multidisciplinary; Physics, Applied;
   Physics, Condensed Matter
SC Chemistry; Science & Technology - Other Topics; Materials Science;
   Physics
GA 261VH
UT WOS:000327692200009
PM 23666897
ER

PT J
AU Weller, D
   Mosendz, O
   Parker, G
   Pisana, S
   Santos, TS
AF Weller, Dieter
   Mosendz, Oleksandr
   Parker, Gregory
   Pisana, Simone
   Santos, Tiffany S.
TI L1(0) FePtX-Y media for heat-assisted magnetic recording
SO PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE
LA English
DT Article
DE grain size; granular alloys; heat assisted magnetic recording; L1(0)
   FePt; texture
ID BIT-PATTERNED MEDIA; DISORDER-ORDER TRANSFORMATION; EXCHANGE SPRING
   MEDIA; GRANULAR THIN-FILMS; SM-CO FILMS; EPITAXIAL-GROWTH; PERPENDICULAR
   MEDIA; HIGH COERCIVITY; GRAIN-SIZE; PERMANENT-MAGNETS
AB Highly chemically ordered L1(0) FePtX-Y nano-granular films with high perpendicular magnetic anisotropy are key media approaches for future heat-assisted magnetic recording (HAMR). They are sputtered at elevated temperature on glass disks coated with adhesion, heat sink, and texturing layers. Adding X=Ag reduces the required deposition temperature and X=Cu lowers the Curie temperature. Current seed layers are NiTa for adhesion and heat sink and well-oriented MgO (002) layers for highly textured FePtX(002) grains surrounded by Y=carbon and/or other segregants. Magnetic anisotropies larger than 4.5x10(7)ergcm(-3) and coercivities beyond 5Tesla have been achieved. The combination of thermal conductivity and Curie temperature determines the required laser power during recording. Key goals are to optimize media, heads, head-disk-spacing, and read-back channels to extend the areal density to 1.5-5Tbin(-2).
   [GRAPHICS]
   Head and media in heat-assisted magnetic recording(1). LD, laser diode; TFC, thermal fluctuation control; NFT, near field transducer. (1)Lidu Huang et al., HAMR Thermal Modeling Including Media Hot Spot, APMRC 2012. (C) 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
C1 [Weller, Dieter; Mosendz, Oleksandr; Parker, Gregory; Pisana, Simone; Santos, Tiffany S.] HGST, San Jose, CA 95135 USA.
RP Weller, D (reprint author), HGST, 3403 Yerba Buena Rd, San Jose, CA 95135 USA.
EM dieter.weller@hgst.com
RI Pisana, Simone/E-1788-2011
OI Pisana, Simone/0000-0002-9291-6061
CR Albrecht TR, 2013, IEEE T MAGN, V49, P773, DOI 10.1109/TMAG.2012.2227303
   Alexandrakis V., 2011, J APPL PHYS, V109
   Bai J, 2003, J MAGN MAGN MATER, V257, P132, DOI 10.1016/S0304-8853(02)01166-6
   Berry DC, 2007, J APPL PHYS, V101, DOI 10.1063/1.2403835
   Bertram H. N., 1994, THEORY MAGNETIC RECO
   Brombacher C, 2011, J PHYS D APPL PHYS, V44, DOI 10.1088/0022-3727/44/35/355001
   Bublat T, 2010, J APPL PHYS, V108, DOI 10.1063/1.3512906
   Chen JS, 2006, J MAGN MAGN MATER, V303, P309, DOI 10.1016/j.jmmm.2006.01.106
   Chen J. S., 2009, J APPL PHYS, V105
   Chen M, 2006, J AM CHEM SOC, V128, P7132, DOI 10.1021/ja061704x
   Chen SC, 2002, MAT SCI ENG B-SOLID, V88, P91, DOI 10.1016/S0921-5107(01)00915-1
   Chen SC, 2001, J MAGN MAGN MATER, V236, P151, DOI 10.1016/S0304-8853(01)00280-3
   Christodoulides JA, 2001, IEEE T MAGN, V37, P1292, DOI 10.1109/20.950821
   CROAT JJ, 1984, APPL PHYS LETT, V44, P148, DOI 10.1063/1.94584
   Ding YF, 2008, APPL PHYS LETT, V93, DOI 10.1063/1.2953173
   Ding YF, 2005, APPL PHYS A-MATER, V81, P1485, DOI 10.1007/s00339-005-3262-9
   Doerner M, 2001, IEEE T MAGN, V37, P1052, DOI 10.1109/20.917191
   Dong K. F., 2012, J APPL PHYS, V111
   Evans RFL, 2012, PHYS REV B, V85, DOI 10.1103/PhysRevB.85.014433
   Farle M., 2012, COMMUNICATION
   Fullerton EE, 1997, APPL PHYS LETT, V71, P1579, DOI 10.1063/1.119970
   Fullerton EE, 1996, APPL PHYS LETT, V69, P2438, DOI 10.1063/1.117663
   GARANIN DA, 1991, PHYSICA A, V172, P470, DOI 10.1016/0378-4371(91)90395-S
   Garanin DA, 1997, PHYS REV B, V55, P3050, DOI 10.1103/PhysRevB.55.3050
   Gilbert DA, 2013, APPL PHYS LETT, V102, DOI 10.1063/1.4799651
   Goll D, 2008, J APPL PHYS, V104, DOI 10.1063/1.2999337
   Goll D, 2009, APPL PHYS LETT, V94, DOI 10.1063/1.3078286
   Granz SD, 2012, J MAGN MAGN MATER, V324, P287, DOI 10.1016/j.jmmm.2010.12.001
   Guo HH, 2012, APPL PHYS LETT, V100, DOI 10.1063/1.3700865
   Guslienko KY, 2004, PHYS REV B, V70, DOI 10.1103/PhysRevB.70.104405
   HERBST JF, 1984, PHYS REV B, V29, P4176, DOI 10.1103/PhysRevB.29.4176
   Hirotsune A, 2010, IEEE T MAGN, V46, P1569, DOI 10.1109/TMAG.2009.2039118
   Hovorka O, 2012, APPL PHYS LETT, V101, DOI 10.1063/1.4740075
   Hsu YN, 2000, IEEE T MAGN, V36, P2945, DOI 10.1109/20.908636
   Ikeda Y, 2012, IEEE T MAGN, V48, P3185, DOI 10.1109/TMAG.2012.2196267
   Ivanov O. A., 1973, PHYS MET METALLOGR, V35, P81
   Ju GP, 2006, J APPL PHYS, V99, DOI 10.1063/1.2189025
   KLEMMER T, 1995, SCRIPTA METALL MATER, V33, P1793, DOI 10.1016/0956-716X(95)00413-P
   Klemmer TJ, 2003, J MAGN MAGN MATER, V266, P79, DOI 10.1016/S0304-8853(03)00458-X
   Kronmueller H, 2008, PHYSICA B, V403, P237, DOI 10.1016/j.physb.2007.08.018
   KRONMULLER H, 1988, J MAGN MAGN MATER, V74, P291, DOI 10.1016/0304-8853(88)90202-8
   KRONMULLER H, 1987, PHYS STATUS SOLIDI B, V144, P385, DOI 10.1002/pssb.2221440134
   Kronmuller H, 2003, MICROMAGNETISM MICRO
   Kuo CM, 2000, J MAGN MAGN MATER, V209, P100, DOI 10.1016/S0304-8853(99)00655-1
   KUSSMANN A, 1950, Z METALLKD, V41, P470
   Lairson M., 1993, APPL PHYS LETT, V63, P1438
   Lee J, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3257364
   Lee YM, 2007, J MAGN MAGN MATER, V310, pE918, DOI 10.1016/j.jmmm.2006.10.1136
   Li H., 2013, IEEE T MAGN, V49, P7
   Li HH, 2011, J APPL PHYS, V110, DOI 10.1063/1.3624910
   Li JS, 1999, J APPL PHYS, V85, P4286, DOI 10.1063/1.370345
   Li N, 1999, J MAGN MAGN MATER, V205, P1, DOI 10.1016/S0304-8853(99)00489-8
   Lim B., 2008, J APPL PHYS, V103
   Lim B., 2009, J APPL PHYS, V105
   Liu X., 2011, J APPL PHYS, V109
   Lu HM, 2008, J APPL PHYS, V103, DOI 10.1063/1.2946724
   Luo CP, 2000, APPL PHYS LETT, V77, P2225, DOI 10.1063/1.1314289
   Lyberatos A, 2004, J APPL PHYS, V95, P1949, DOI 10.1063/1.1639948
   Lyberatos A, 2012, J APPL PHYS, V112, DOI 10.1063/1.4768260
   Lyubina J., 2011, HDB MAGNETIC MAT
   Ma B, 2011, J APPL PHYS, V109, DOI 10.1063/1.3569845
   Maeda T, 2002, IEEE T MAGN, V38, P2796, DOI 10.1109/TMAG.2002.803105
   Makarov D, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3309417
   Marchon B., 2013, ADV TRIBOL, DOI DOI 10.1155/2013/521086
   Mosendz O., 2012, J APPL PHYS, V111
   Moser A, 2002, J PHYS D APPL PHYS, V35, pR157, DOI 10.1088/0022-3727/35/19/201
   Moser A, 2001, IEEE T MAGN, V37, P1872, DOI 10.1109/20.950994
   Mryasov ON, 2005, EUROPHYS LETT, V69, P805, DOI 10.1209/epl/i2004-10404-2
   Murayama N, 2008, J MAGN MAGN MATER, V320, P3057, DOI 10.1016/j.jmmm.2008.08.053
   Nemoto H, 2008, J MAGN MAGN MATER, V320, P3144, DOI 10.1016/j.jmmm.2008.08.044
   [Anonymous], 2012, TDK CLAIMS HDD AREAL
   Ohtake M., 2009, J APPL PHYS, V105
   Peng Yingguo, 2006, J APPL PHYS, V99
   Ping DH, 2001, J APPL PHYS, V90, P4708, DOI 10.1063/1.1405831
   Pisana S, 2013, J APPL PHYS, V113, DOI 10.1063/1.4788820
   Platt CL, 2002, J APPL PHYS, V92, P6104, DOI 10.1063/1.1516870
   Rausch T, 2013, IEEE T MAGN, V49, P730, DOI 10.1109/TMAG.2012.2218228
   Richter HJ, 2009, J MAGN MAGN MATER, V321, P467, DOI 10.1016/j.jmmm.2008.04.161
   Richter HJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2209179
   Rong CB, 2006, ADV MATER, V18, P2984, DOI 10.1002/adma.200601904
   Rottmayer RE, 2006, IEEE T MAGN, V42, P2417, DOI 10.1109/TMAG.2006.879572
   Sato T, 2011, J MAGN MAGN MATER, V323, P163, DOI 10.1016/j.jmmm.2010.08.056
   Sayama J, 2011, J APPL PHYS, V110, DOI 10.1063/1.3608123
   Seki TO, 2008, J APPL PHYS, V103, DOI 10.1063/1.2828032
   Shao Y, 2003, J APPL PHYS, V93, P8152, DOI 10.1063/1.1540160
   Shen WK, 2005, J APPL PHYS, V97, DOI 10.1063/1.1847312
   Shima T, 2004, APPL PHYS LETT, V85, P2571, DOI 10.1063/1.1794863
   Shima T, 2002, APPL PHYS LETT, V81, P1050, DOI 10.1063/1.1498504
   Shimatsu T, 1999, IEEE T MAGN, V35, P2697, DOI 10.1109/20.800956
   Sokalski VM, 2010, IEEE T MAGN, V46, P2260, DOI 10.1109/TMAG.2010.2040814
   Sonobe Y, 2001, J MAGN MAGN MATER, V235, P424, DOI 10.1016/S0304-8853(01)00401-2
   Stipe BC, 2010, NAT PHOTONICS, V4, P484, DOI 10.1038/nphoton.2010.90
   STRNAT K, 1967, J APPL PHYS, V38, P1001, DOI 10.1063/1.1709459
   Suess D, 2005, J MAGN MAGN MATER, V290, P551, DOI 10.1016/j.jmmm.2004.11.525
   Suess D, 2009, J MAGN MAGN MATER, V321, P545, DOI 10.1016/j.jmmm.2008.06.041
   Suess D, 2009, IEEE T MAGN, V45, P88, DOI 10.1109/TMAG.2008.2002859
   Suess D, 2005, APPL PHYS LETT, V87, DOI 10.1063/1.1951053
   Suess D, 2007, J MAGN MAGN MATER, V308, P183, DOI 10.1016/j.jmmm.2006.05.021
   Sun AC, 2008, J MAGN MAGN MATER, V320, P3071, DOI 10.1016/j.jmmm.2008.08.032
   Sun AC, 2005, J APPL PHYS, V98, P76109, DOI 10.1063/1.2073967
   Sun HY, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2195781
   Sun S., 2001, PHYS HIGH DENSITY MA
   Sun SH, 2006, ADV MATER, V18, P393, DOI 10.1002/adma.200501464
   Sun SH, 2001, IEEE T MAGN, V37, P1239, DOI 10.1109/20.950807
   Sun SH, 2000, SCIENCE, V287, P1989, DOI 10.1126/science.287.5460.1989
   TAGAWA I, 1991, IEEE T MAGN, V27, P4975, DOI 10.1109/20.278712
   Takahashi YK, 2006, J APPL PHYS, V100, DOI 10.1063/1.2266247
   Takei S, 2004, J MAGN MAGN MATER, V272, P1703, DOI 10.1016/j.jmmm.2004.01.052
   Tamai I, 2008, IEEE T MAGN, V44, P3492, DOI 10.1109/TMAG.2008.2002380
   Thiele JU, 2003, APPL PHYS LETT, V82, P2859, DOI 10.1063/1.1571232
   Thiele JU, 2002, J APPL PHYS, V91, P6595, DOI 10.1063/1.1470254
   Tsai JL, 2010, J APPL PHYS, V107, DOI 10.1063/1.3446198
   Varaprasad BSDCS, 2013, IEEE T MAGN, V49, P718, DOI 10.1109/TMAG.2012.2218227
   Victora RH, 2013, IEEE T MAGN, V49, P751, DOI 10.1109/TMAG.2012.2219300
   Victora RH, 2008, P IEEE, V96, P1799, DOI 10.1109/JPROC.2008.2004314
   Wang B, 2011, J APPL PHYS, V109, DOI 10.1063/1.3592980
   Wang RM, 2008, PHYS REV LETT, V100, DOI 10.1103/PhysRevLett.100.017205
   Wang X., 2012, ASTC ROADMAP REQUIRE
   Wang XB, 2013, IEEE T MAGN, V49, P686, DOI 10.1109/TMAG.2012.2221689
   Weller D, 1999, IEEE T MAGN, V35, P4423, DOI 10.1109/20.809134
   Weller D, 2001, IEEE T MAGN, V37, P2185, DOI 10.1109/20.951119
   Weller D, 2000, IEEE T MAGN, V36, P10, DOI 10.1109/20.824418
   Weller D., 2012, HAMR MEDIA IN PRESS
   Weller D., 2007, ADV MAGNETIC NANOSTR
   Wicht S., IN PRESS
   Wiedwald U., 2010, J NANOTECHNOL, V1, P24
   Willoughby SD, 2004, J APPL PHYS, V95, P6586, DOI 10.1063/1.1669126
   Wood R, 2009, J MAGN MAGN MATER, V321, P555, DOI 10.1016/j.jmmm.2008.07.027
   Wood R, 2009, IEEE T MAGN, V45, P917, DOI 10.1109/TMAG.2008.2010676
   Wu AQ, 2013, IEEE T MAGN, V49, P779, DOI 10.1109/TMAG.2012.2219513
   Xu L, 2012, PHYSICA E, V45, P72, DOI 10.1016/j.physe.2012.07.010
   Xu YF, 2002, APPL PHYS LETT, V80, P3325, DOI 10.1063/1.1476706
   Yan ML, 2005, J APPL PHYS, V97, DOI 10.1063/1.1855271
   Yan M L, 2006, J APPL PHYS, V99
   Yang E., 2011, J APPL PHYS, V109
   Yang E, 2012, IEEE T MAGN, V48, P7, DOI 10.1109/TMAG.2011.2164547
   Yang E, 2011, IEEE T MAGN, V47, P4077, DOI 10.1109/TMAG.2011.2147776
   Yang E, 2008, J APPL PHYS, V104, DOI 10.1063/1.2956691
   Yang X, 2007, J VAC SCI TECHNOL B, V25, P2202, DOI 10.1116/1.2798711
   Yu M, 1999, APPL PHYS LETT, V75, P3992, DOI 10.1063/1.125516
   Yuan FT, 2012, J APPL PHYS, V111, P5
   Zhang L., 2011, J APPL PHYS, V109
   Zhang L, 2010, J MAGN MAGN MATER, V322, P2658, DOI 10.1016/j.jmmm.2010.04.003
   Zhang ZG, 2004, IEEE T MAGN, V40, P2455, DOI 10.1109/TMAG.2004.830218
   Zhou H, 1999, J APPL PHYS, V85, P4982, DOI 10.1063/1.370065
   Zhu J. G., 2012, J APPL PHYS, V111
   Zhu JG, 2013, IEEE T MAGN, V49, P765, DOI 10.1109/TMAG.2012.2231855
   Zhu JG, 2010, IEEE T MAGN, V46, P751, DOI 10.1109/TMAG.2009.2036588
   Ikeda Y., 2002, US Pat., Patent No. [6468670, 7616412]
   Ikeda Y., 2002, U. S. patent, Patent No. [6,468,670, 6468670]
NR 150
TC 74
Z9 74
U1 7
U2 65
PU WILEY-V C H VERLAG GMBH
PI WEINHEIM
PA BOSCHSTRASSE 12, D-69469 WEINHEIM, GERMANY
SN 1862-6300
EI 1862-6319
J9 PHYS STATUS SOLIDI A
JI Phys. Status Solidi A-Appl. Mat.
PD JUL
PY 2013
VL 210
IS 7
BP 1245
EP 1260
DI 10.1002/pssa.201329106
PG 16
WC Materials Science, Multidisciplinary; Physics, Applied; Physics,
   Condensed Matter
SC Materials Science; Physics
GA 261YD
UT WOS:000327699800002
ER

PT J
AU Goll, D
   Bublat, T
AF Goll, Dagmar
   Bublat, Thomas
TI Large-area hard magnetic L1(0)-FePt and composite L1(0)-FePt based
   nanopatterns
SO PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE
LA English
DT Article
DE bit-patterned magnetic recording; exchange-coupled composites; FePt;
   nanoimprinting; nanopattern
ID FEPT THIN-FILMS; BIT-PATTERNED MEDIA; PERPENDICULAR MAGNETIZATION;
   EXCHANGE; LITHOGRAPHY; FABRICATION; PARTICLES; ELEMENTS; STORAGE; DESIGN
AB Bit-patterned media with a regular arrangement of extremely hard magnetic nanodots is a very promising concept for next generation ultrahigh density magnetic recording to realize storage densities of 1Tbitsin(-2) and far beyond. To enable writeability with conventional writing heads the switching process may be thermally, microwave or domain-wall assisted. This paper concentrates on the fabrication and characterization of large-area hard magnetic L1(0)-FePt and composite L1(0)-FePt based granular and bit-patterned media. Within the framework of micromagnetism the magnetic reversal mechanism of different types of nanodots is analyzed from the temperature dependence and angular dependence of the switching field.
   [GRAPHICS]
   (C) 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
C1 [Goll, Dagmar] Aalen Univ, Mat Res Inst, D-73430 Aalen, Germany.
   [Bublat, Thomas] Max Planck Inst Intelligent Syst, D-70569 Stuttgart, Germany.
RP Goll, D (reprint author), Aalen Univ, Mat Res Inst, Beethovenstr 1, D-73430 Aalen, Germany.
EM dagmar.goll@htw-aalen.de
CR Albrecht M, 2005, NAT MATER, V4, P203, DOI 10.1038/nmat1324
   Alex M, 2001, IEEE T MAGN, V37, P1244, DOI 10.1109/20.950808
   Alexandrakis V., 2011, J APPL PHYS, V109
   Bandic ZZ, 2008, MRS BULL, V33, P831, DOI 10.1557/mrs2008.178
   Bertram HN, 2007, IEEE T MAGN, V43, P2145, DOI 10.1109/TMAG.2007.892852
   BINASCH G, 1989, PHYS REV B, V39, P4828, DOI 10.1103/PhysRevB.39.4828
   Breitling A, 2009, PHYS STATUS SOLIDI-R, V3, P130, DOI 10.1002/pssr.200903074
   Breitling A., 2009, THESIS U STUTTGART
   Breitling A, 2008, J MAGN MAGN MATER, V320, P1449, DOI 10.1016/j.jmmm.2007.12.003
   Bublat T, 2011, J APPL PHYS, V110, DOI 10.1063/1.3646550
   Bublat T, 2011, NANOTECHNOLOGY, V22, DOI 10.1088/0957-4484/22/31/315301
   Bublat T, 2010, J APPL PHYS, V108, DOI 10.1063/1.3512906
   BUBLAT T, 2012, THESIS U STUTTGART
   Casoli F, 2005, IEEE T MAGN, V41, P3877, DOI 10.1109/TMAG.2005.854954
   Casoli F, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2905294
   CEBOLLADA A, 1994, PHYS REV B, V50, P3419, DOI 10.1103/PhysRevB.50.3419
   Chen JS, 2010, J PHYS D APPL PHYS, V43, DOI 10.1088/0022-3727/43/18/185001
   Choi Y, 2007, PHYS REV B, V75, DOI 10.1103/PhysRevB.75.104432
   Chou SY, 1997, J VAC SCI TECHNOL B, V15, P2897, DOI 10.1116/1.589752
   Colak L, 2009, NANOTECHNOLOGY, V20, DOI 10.1088/0957-4484/20/48/485602
   Dobin AY, 2006, APPL PHYS LETT, V89, DOI 10.1063/1.2335590
   Dong Q, 2012, ADV MATER, V24, P1034, DOI 10.1002/adma.201104171
   Farrow RFC, 1996, J APPL PHYS, V79, P5967, DOI 10.1063/1.362122
   Ghidini M, 2007, J MAGN MAGN MATER, V316, P159, DOI 10.1016/j.jmmm.2007.02.040
   Giannopoulos G, 2013, J MAGN MAGN MATER, V325, P75, DOI 10.1016/j.jmmm.2012.08.003
   Goll D, 2000, NATURWISSENSCHAFTEN, V87, P423, DOI 10.1007/s001140050755
   Goll D, 2008, PHYSICA B, V403, P1854, DOI 10.1016/j.physb.2007.10.336
   Goll D, 2007, APPL PHYS LETT, V90, DOI 10.1063/1.2731519
   Goll D, 2006, J IRON STEEL RES INT, V13, P97, DOI 10.1016/S1006-706X(08)60166-1
   Goll D, 2008, APPL PHYS LETT, V93, DOI 10.1063/1.3001589
   Goll D, 2008, J APPL PHYS, V104, DOI 10.1063/1.2999337
   Goll D, 2009, APPL PHYS LETT, V94, DOI 10.1063/1.3078286
   Goll D, 2009, INT J MATER RES, V100, P652, DOI 10.3139/146.110091
   Goll D, 2008, IEEE T MAGN, V44, P3472, DOI 10.1109/TMAG.2008.2002589
   Goncharov A, 2007, APPL PHYS LETT, V91, DOI 10.1063/1.2804609
   Hai NH, 2003, J MAGN MAGN MATER, V257, pL139
   Heinonen O, 2008, J MAGN MAGN MATER, V320, P2885, DOI 10.1016/j.jmmm.2008.07.041
   [Anonymous], 1999, PCPDFWIN V 2 02
   Kaiser T, 2008, J APPL PHYS, V103, DOI 10.1063/1.2884347
   Kazakova O, 2003, IEEE T MAGN, V39, P2747, DOI 10.1109/TMAG.2003.815587
   Kondorsky E, 1940, J PHYS-USSR, V2, P161
   Kronmueller H, 2008, PHYSICA B, V403, P237, DOI 10.1016/j.physb.2007.08.018
   Kronmuller H, 2011, PHYS STATUS SOLIDI B, V248, P2361, DOI 10.1002/pssb.201147205
   Kronmuller H, 2009, INT J MATER RES, V100, P640, DOI 10.3139/146.110092
   KRONMULLER H, 1987, PHYS STATUS SOLIDI B, V144, P385, DOI 10.1002/pssb.2221440134
   KRONMULLER H, 1987, J MAGN MAGN MATER, V69, P149, DOI 10.1016/0304-8853(87)90111-9
   KUSSMANN A, 1950, ANN PHYS-BERLIN, V7, P173
   Madelung O., 1995, NUMERIC DATA FUNCTIO, V5
   Lee J, 2011, APPL PHYS LETT, V98, DOI 10.1063/1.3595307
   Litvinov D, 2008, IEEE T NANOTECHNOL, V7, P463, DOI 10.1109/TNANO.2008.920183
   Livshitz B, 2007, APPL PHYS LETT, V91, DOI 10.1063/1.2801362
   Lomakin V, 2008, IEEE T MAGN, V44, P3454, DOI 10.1109/TMAG.2008.2001615
   Lomakin V, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2831732
   Ludwig A, 2006, APPL SURF SCI, V252, P2518, DOI 10.1016/j.apsusc.2005.04.058
   McCallum AT, 2012, APPL PHYS LETT, V101, DOI 10.1063/1.4748162
   McCallum AT, 2011, APPL PHYS LETT, V98, DOI 10.1063/1.3599573
   McFadyen IR, 2006, MRS BULL, V31, P379, DOI 10.1557/mrs2006.97
   Misuzuka K., 2008, J APPL PHYS, V103
   Moser A, 2002, J PHYS D APPL PHYS, V35, pR157, DOI 10.1088/0022-3727/35/19/201
   Okamoto S, 2002, PHYS REV B, V66, DOI 10.1103/PhysRevB.66.024413
   Rao KS, 2010, PHYSICA B, V405, P3205, DOI 10.1016/j.physb.2010.02.007
   Richter HJ, 2007, J PHYS D APPL PHYS, V40, pR149, DOI 10.1088/0022-3727/40/9/R01
   Richter HJ, 2006, MRS BULL, V31, P384, DOI 10.1557/mrs2006.98
   Richter H. J., 2011, J APPL PHYS, V109
   Ross C, 2001, ANN REV MATER RES, V31, P203, DOI 10.1146/annurev.matsci.31.1.203
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Seigler MA, 2008, IEEE T MAGN, V44, P119, DOI 10.1109/TMAG.2007.911029
   Seki T, 2006, J APPL PHYS, V100, DOI 10.1063/1.2335391
   Shima T, 2004, APPL PHYS LETT, V85, P2571, DOI 10.1063/1.1794863
   Shima T, 2002, APPL PHYS LETT, V81, P1050, DOI 10.1063/1.1498504
   Skomski R., 2008, J APPL PHYS, V103
   Suess D, 2006, APPL PHYS LETT, V89, DOI 10.1063/1.2347894
   Suess D, 2007, J MAGN MAGN MATER, V308, P183, DOI 10.1016/j.jmmm.2006.05.021
   Sun SH, 2000, SCIENCE, V287, P1989, DOI 10.1126/science.287.5460.1989
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Tsai JL, 2010, J APPL PHYS, V107, DOI 10.1063/1.3446198
   Victora RH, 2005, IEEE T MAGN, V41, P537, DOI 10.1109/TMAG.2004.838075
   Wang D., 2009, J APPL PHYS, V105
   Wang H., 2012, J APPL PHYS, V111
   Wang H, 2011, J APPL PHYS, V109
   Wang H, 2012, IEEE MAGN LETT, V3, DOI 10.1109/LMAG.2012.2188133
   Wang JP, 2007, IEEE T MAGN, V43, P682, DOI 10.1109/TMAG.2006.888233
   Weisheit M, 2004, J APPL PHYS, V95, P7489, DOI 10.1063/1.1667456
   Yuan FT, 2012, J APPL PHYS, V111, P5
   Zhang J, 2012, J APPL PHYS, V111, DOI 10.1063/1.3702876
   Zhu JG, 2008, IEEE T MAGN, V44, P125, DOI 10.1109/TMAG.2007.911031
NR 86
TC 14
Z9 15
U1 1
U2 25
PU WILEY-V C H VERLAG GMBH
PI WEINHEIM
PA BOSCHSTRASSE 12, D-69469 WEINHEIM, GERMANY
SN 1862-6300
EI 1862-6319
J9 PHYS STATUS SOLIDI A
JI Phys. Status Solidi A-Appl. Mat.
PD JUL
PY 2013
VL 210
IS 7
BP 1261
EP 1271
DI 10.1002/pssa.201329017
PG 11
WC Materials Science, Multidisciplinary; Physics, Applied; Physics,
   Condensed Matter
SC Materials Science; Physics
GA 261YD
UT WOS:000327699800003
ER

PT J
AU Xiao, SG
   Yang, XM
   Lee, KY
   Hwu, JJ
   Wago, K
   Kuo, D
AF Xiao, Shuaigang
   Yang, XiaoMin
   Lee, Kim Y.
   Hwu, Justin J.
   Wago, Koichi
   Kuo, David
TI Directed self-assembly for high-density bit-patterned media fabrication
   using spherical block copolymers
SO JOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS
LA English
DT Article
DE directed self-assembly; block copolymer; bit-patterned media; servo;
   skew; PS-b-PDMS; sphere
ID ARRAYS; GRAPHOEPITAXY; LITHOGRAPHY; TEMPLATES
AB Bit-patterned media (BPM) fabrication sets a high bar for nanopatterning especially in the aspects of lithography resolution and pattern transfer. Directed self-assembly (DSA) of spherical block copolymers (BCPs) provides promising pattern resolution extendibility and pattern layout flexibility as long as proper pre-pattern designs are provided. Polystyrene-block-polydimethylsiloxane in the form of monolayered spheres is used as a vehicle to form either globally densely packed nanodot arrays in the data zone or locally densely packed nanodot arrays in the servo zone on a BPM template. Skew compatibility of spherical BCPs is also discussed. The BCP dot template is then applied as the scaffold for pattern transfer into quartz to make a nanoimprint mold and further into magnetic storage media. Distributions of both dot sizes and dot spacings are closely monitored after DSA pattern formation and pattern transfer. (C) The Authors. Published by SPIE under a Creative Commons Attribution 3.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.
C1 [Xiao, Shuaigang; Yang, XiaoMin; Lee, Kim Y.; Hwu, Justin J.; Wago, Koichi; Kuo, David] Seagate Technol, Media Res Ctr, Fremont, CA 94538 USA.
RP Xiao, SG (reprint author), Seagate Technol, Media Res Ctr, 47010 Kato Rd, Fremont, CA 94538 USA.
EM shuaigang.xiao@seagate.com
CR Bang J, 2009, ADV MATER, V21, P4769, DOI 10.1002/adma.200803302
   Bita I, 2008, SCIENCE, V321, P939, DOI 10.1126/science.1159352
   Challener WA, 2009, NAT PHOTONICS, V3, P220, DOI 10.1038/NPHOTON.2009.26
   Cheng JY, 2008, ADV MATER, V20, P3155, DOI 10.1002/adma.200800826
   Cheng JY, 2004, NAT MATER, V3, P823, DOI 10.1038/nmat1211
   Delgadillo PAR, 2012, J MICRO-NANOLITH MEM, V11, DOI 10.1117/1.JMM.11.3.031302
   Gronheid R, 2012, J MICRO-NANOLITH MEM, V11, DOI 10.1117/1.JMM.11.3.031303
   Herr D.J.C., 2006, FUTURE FAB INT, V20, P82
   Kamata Y, 2011, IEEE T MAGN, V47, P51, DOI 10.1109/TMAG.2010.2077274
   Kim SO, 2003, NATURE, V424, P411, DOI 10.1038/nature01775
   Park M, 1997, SCIENCE, V276, P1401, DOI 10.1126/science.276.5317.1401
   Park S, 2009, SCIENCE, V323, P1030, DOI 10.1126/science.1168108
   Richter H. J., 2006, APPL PHYS LETT, V88
   Ross C, 2001, ANN REV MATER RES, V31, P203, DOI 10.1146/annurev.matsci.31.1.203
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Segalman RA, 2001, ADV MATER, V13, P1152, DOI 10.1002/1521-4095(200108)13:15<1152::AID-ADMA1152>3.0.CO;2-5
   Tang CB, 2008, SCIENCE, V322, P429, DOI 10.1126/science.1162950
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Xiao S., 2011, NANOTECHNOLOGY, V22
   Xiao SG, 2005, NANOTECHNOLOGY, V16, pS324, DOI 10.1088/0957-4484/16/7/003
   Xiao SG, 2009, ADV MATER, V21, P2516, DOI 10.1002/adma.200802087
NR 21
TC 9
Z9 9
U1 1
U2 21
PU SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS
PI BELLINGHAM
PA 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98225 USA
SN 1932-5150
J9 J MICRO-NANOLITH MEM
JI J. Micro-Nanolithogr. MEMS MOEMS
PD JUL-SEP
PY 2013
VL 12
IS 3
AR 031110
DI 10.1117/1.JMM.12.3.031110
PG 7
WC Engineering, Electrical & Electronic; Nanoscience & Nanotechnology;
   Materials Science, Multidisciplinary; Optics
SC Engineering; Science & Technology - Other Topics; Materials Science;
   Optics
GA 224BT
UT WOS:000324857000010
ER

PT J
AU Honda, A
   Honda, N
   Ariake, J
AF Honda, Akito
   Honda, Naoki
   Ariake, Jun
TI Deposition of Inclined Co-Pt Film With Inclined Anisotropy
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT 12th Joint MMM-Intermag Conference
CY JAN 14-18, 2013
CL Chicago, IL
SP AIP Publishing, IEEE Magnet Soc
DE Co-Pt film; hysteresis loop measurement; inclined anisotropy axis;
   oblique incidence collimated sputtering
ID BIT-PATTERNED MEDIA; RECORDING SIMULATION; TB/IN(2); DESIGN
AB Deposition of inclined anisotropy film for bit-patterned media was studied using oblique incidence collimated sputtering. Co-Pt films with a thickness of 10 nm deposited on an annealed Pt/Ru under layer exhibited an inclination angle of the anisotropy axis of around 10 degrees from the film normal corresponding to that of crystalline orientation. The anisotropy field and the inclination angle were estimated by comparing measured hysteresis loops with simulated loops. The estimated anisotropy field of the film, mu H-0(k), was around 1.2 T which indicated an expected anisotropy energy density of 6 x 10(5) J/m(3). It was indicated that oblique incidence collimated sputtering is useful to fabricate inclined anisotropy recording media with high anisotropy.
C1 [Honda, Akito; Honda, Naoki] Tohoku Inst Technol, Grad Sch Engn, Sendai, Miyagi 9828577, Japan.
   [Ariake, Jun] Akita Ind Technol Ctr, Akita 0101623, Japan.
RP Honda, N (reprint author), Tohoku Inst Technol, Grad Sch Engn, Sendai, Miyagi 9828577, Japan.
EM n_honda@tohtech.ac.jp
FU Green IT Project of NEDO
FX The authors wish to thank Prof. H. Uchida of Tohoku Institute of
   Technology for his help in the VSM measurement. This work was supported
   in part by the Green IT Project of NEDO.
CR Greaves SJ, 2008, IEEE T MAGN, V44, P3430, DOI 10.1109/TMAG.2008.2002365
   Grobis MK, 2011, IEEE T MAGN, V47, P6, DOI 10.1109/TMAG.2010.2076798
   Honda A., 2012, ICAUMS 2012 NAR, P418
   Honda N, 2008, J MAGN MAGN MATER, V320, P2195, DOI 10.1016/j.jmmm.2008.03.048
   Honda N, 2007, IEICE T ELECTRON, VE90C, P1594, DOI 10.1093/ietele/e90-c.8.1594
   Honda N, 2007, IEEE T MAGN, V43, P2142, DOI 10.1109/TMAG.2007.893139
   Honda N, 2011, IEEE T MAGN, V47, P2544, DOI 10.1109/TMAG.2011.2157904
   Honda N, 2008, IEEE T MAGN, V44, P3438, DOI 10.1109/TMAG.2008.2002528
   Kamata Y, 2011, IEEE T MAGN, V47, P51, DOI 10.1109/TMAG.2010.2077274
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Saito S., 2011, J APPL PHYS, V109
   Schabes ME, 2008, J MAGN MAGN MATER, V320, P2880, DOI 10.1016/j.jmmm.2008.07.035
   Shimatsu T, 2004, IEEE T MAGN, V40, P2483, DOI [10.1109/TMAG.2004.832448, 10.1109/tmag.2004.832448]
   Shimatsu T., 2006, J APPL PHYS, V99
   Terris BD, 2005, IEEE T MAGN, V41, P2822, DOI 10.1109/TMAG.2005.855264
NR 15
TC 1
Z9 1
U1 0
U2 9
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUL
PY 2013
VL 49
IS 7
BP 3600
EP 3603
DI 10.1109/TMAG.2013.2239964
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 192KM
UT WOS:000322483200134
ER

PT J
AU Hasegawa, T
   Kondo, Y
   Yamane, H
   Nagamachi, S
   Ishio, S
AF Hasegawa, Takashi
   Kondo, Yuji
   Yamane, Haruki
   Nagamachi, Shinji
   Ishio, Shunji
TI Ferromagnetic-Paramagnetic Patterning of FePtRh Films by Fe Ion
   Implantation
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT 12th Joint MMM-Intermag Conference
CY JAN 14-18, 2013
CL Chicago, IL
SP AIP Publishing, IEEE Magnet Soc
DE Bit-patterned media; FePtRh; ion implantation; perpendicular magnetic
   recording
ID MAGNETIC-PROPERTIES; IRRADIATION
AB The crystalline and magnetic properties of 6.12 nm thick Fe-x(Pt0.68Rh0.32)(100-x) films with 50.0 <= x <= 64.3 and a potential bit-patterning process that utilizes the FM-PM transition caused by Fe ion implantation were investigated. At room temperature, for 50.0 <= x <= 55.9 the films were ferromagnetic (FM), with an L1(0) phase, whereas for 57.9 <= x <= 64.3 the films were paramagnetic (PM), with an A1 phase. This composition dependent FM-PM transition forms the basis of a bit-patterning process in which, at first, micro-fabricated resist masks were prepared on the (ferromagnetic) Fe-50(Pt0.68Rh0.32)(50) film. Implantation of Fe ions at a dose of 9 x 10(5) ions/cm(2) then results in an increase of x in the implanted areas, from 50.0 to 58.3. After annealing, 300 nm FM dots were observed by magnetic force microscopy, which confirmed that only the implanted areas had changed from FM to PM and that the dot areas had remained in the FM phase with the L1(0) structure.
C1 [Hasegawa, Takashi; Ishio, Shunji] Akita Univ, Dept Mat Sci & Engn, Akita 0108502, Japan.
   [Kondo, Yuji; Yamane, Haruki] Akita Ind Technol Ctr AIT, Akita 0101623, Japan.
   [Nagamachi, Shinji] Nagamachi Sci Lab Co Ltd, Nagamachi, Hyogo 6610976, Japan.
RP Hasegawa, T (reprint author), Akita Univ, Dept Mat Sci & Engn, Akita 0108502, Japan.
EM takashi@gipc.akita-u.ac.jp
OI Hasegawa, Takashi/0000-0002-8178-4980
FU Industrial Technology Research Grant Program from the New Energy and
   Industrial Technology Development Organization (NEDO), Japan [11B07008d]
FX This work was supported by the Industrial Technology Research Grant
   Program in 2011 (ID: 11B07008d) from the New Energy and Industrial
   Technology Development Organization (NEDO), Japan.
CR Abes M, 2006, MAT SCI ENG B-SOLID, V126, P207, DOI 10.1016/j.mseb.2005.09.030
   Chappert C, 1998, SCIENCE, V280, P1919, DOI 10.1126/science.280.5371.1919
   Hasegawa T, 2006, J APPL PHYS, V99, DOI 10.1063/1.2177382
   Hasegawa T, 2012, J APPL PHYS, V111, DOI 10.1063/1.3673421
   Hasegawa T, 2009, J APPL PHYS, V106, DOI 10.1063/1.3261839
   Hasegawa T., 2011, J APPL PHYS, V109
   Hasegawa T, 2008, ACTA MATER, V56, P1564, DOI 10.1016/j.actamat.2007.12.008
   Ishio S, 2012, J MAGN MAGN MATER, V324, P295, DOI 10.1016/j.jmmm.2010.12.014
   IVANOV OA, 1973, FIZ MET METALLOVED+, V35, P92
   Kato T, 2009, J APPL PHYS, V105, DOI 10.1063/1.3072024
   Kusinski GJ, 2003, SCRIPTA MATER, V48, P949, DOI 10.1016/S1359-6462(02)00607-3
   SUMIYAMA K, 1978, J PHYS F MET PHYS, V8, P1281, DOI 10.1088/0305-4608/8/6/026
   Terris BD, 1999, APPL PHYS LETT, V75, P403, DOI 10.1063/1.124389
NR 13
TC 3
Z9 3
U1 0
U2 9
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUL
PY 2013
VL 49
IS 7
BP 3604
EP 3607
DI 10.1109/TMAG.2013.2245305
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 192KM
UT WOS:000322483200135
ER

PT J
AU Oshima, D
   Kato, T
   Iwata, S
   Tsunashima, S
AF Oshima, D.
   Kato, T.
   Iwata, S.
   Tsunashima, S.
TI Control of Magnetic Properties of MnGa films by Kr+ Ion Irradiation for
   Application to Bit Patterned Media
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT 12th Joint MMM-Intermag Conference
CY JAN 14-18, 2013
CL Chicago, IL
SP AIP Publishing, IEEE Magnet Soc
DE Ion irradiation; MnGa; phase change; planar bit patterned media
ID ANISOTROPY
AB (001) oriented L1(0) phase MnGa films were grown on Cr (20 nm)/MgO(001) substrate, and Kr+ ion irradiation on the MnGa films was carried out to control their magnetic properties. Highly ordered MnGa films were obtained at a relatively low temperature of 400 degrees C, and the film exhibited the saturation magnetization M-s of 450 emu/cc and uniaxial anisotropy K-u of similar to 7 x 10(6) erg/cc before the irradiation. The M-s and K-u gradually decreased with the ion dose and became zero at the dose of 1 x 10(14) ions/cm. While coercivity H-c of the MnGa showed a slight increase up to the dose of 1 x 10(13) ions/cm(2) and decreased abruptly with further increase of the ion dose. Ion beam patterned MnGa film with pitch sizes down to 80 nm was fabricated by the ion irradiation through the micro-fabricated resist masks. Magnetically patterned but topologically flat MnGa film was successfully fabricated, which suggests the practical application of the MnGa films to high-density planer bit patterned media.
C1 [Oshima, D.; Kato, T.; Iwata, S.] Nagoya Univ, Dept Quantum Engn, Nagoya, Aichi 4648603, Japan.
   [Tsunashima, S.] Nagoya Ind Sci Res Inst, Dept Res, Nagoya, Aichi 4640819, Japan.
RP Kato, T (reprint author), Nagoya Univ, Dept Quantum Engn, Nagoya, Aichi 4648603, Japan.
EM takeshik@nuee.nagoya-u.ac.jp
RI Kato, Takeshi/I-2654-2013
FU Ministry of Education, Culture, Sports, Science and Technology; A-STEP
   from the Japan Science and Technology Agency; Tatematsu Foundation
FX The authors would like to thank Mr. M. Kumazawa of Nagoya University for
   assistance in the experiments. The authors are grateful for the
   financial support from the following grants: Grand-in-Aids for
   Scientific Research from the Ministry of Education, Culture, Sports,
   Science and Technology, A-STEP from the Japan Science and Technology
   Agency and The Tatematsu Foundation.
CR CARR WJ, 1958, PHYS REV, V109, P1971, DOI 10.1103/PhysRev.109.1971
   Chappert C, 1998, SCIENCE, V280, P1919, DOI 10.1126/science.280.5371.1919
   Ferre J, 1999, J MAGN MAGN MATER, V198-99, P191, DOI 10.1016/S0304-8853(98)01084-1
   Hyndman R, 2001, J APPL PHYS, V90, P3843, DOI 10.1063/1.1401803
   Kato T, 2009, J APPL PHYS, V106, DOI 10.1063/1.3212967
   Kato T, 2009, J APPL PHYS, V105, DOI 10.1063/1.3072024
   Kikitsu A, 2007, IEEE T MAGN, V43, P3685, DOI 10.1109/TMAG.2007.902970
   KRISHNAN KM, 1992, APPL PHYS LETT, V61, P2365, DOI 10.1063/1.108245
   Mizukami S, 2012, PHYS REV B, V85, DOI 10.1103/PhysRevB.85.014416
   Okamoto S, 2002, PHYS REV B, V66, DOI 10.1103/PhysRevB.66.024413
   Oshima D, 2012, J MAGN MAGN MATER, V324, P1617, DOI 10.1016/j.jmmm.2011.12.019
   Suharyadi E, 2006, IEEE T MAGN, V42, P2972, DOI 10.1109/TMAG.2006.880076
   Suharyadi E, 2005, IEEE T MAGN, V41, P3595, DOI 10.1109/TMAG.2005.854735
   Terris BD, 1999, APPL PHYS LETT, V75, P403, DOI 10.1063/1.124389
NR 14
TC 10
Z9 10
U1 1
U2 13
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUL
PY 2013
VL 49
IS 7
BP 3608
EP 3611
DI 10.1109/TMAG.2013.2249501
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 192KM
UT WOS:000322483200136
ER

PT J
AU Ushiyama, J
   Akagi, F
   Ando, A
   Miyamoto, H
AF Ushiyama, Junko
   Akagi, Fumiko
   Ando, Ayano
   Miyamoto, Harukazu
TI 8-Tb/in(2)-Class Bit-Patterned Medium for Thermally Assisted Magnetic
   Recording
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT 12th Joint MMM-Intermag Conference
CY JAN 14-18, 2013
CL Chicago, IL
SP AIP Publishing, IEEE Magnet Soc
DE Bit patterned media; hard disks; thermal conductivity; thermally
   assisted (heat-assisted) magnetic recording
ID TB/IN(2)
AB Three-dimensional optical/thermal spot profiles obtained by thermally assisted magnetic recording (TAMR) on bit-patterned media (BPM) with dot densities of 6 to 15 Tb/in(2) were numerically analyzed. Introduction of a spacing layer with higher thermal conductivity than that of the recording dots leads to narrow temperature distribution (i.e., steep temperature profile) in the dots. A temperature profile with FWHM of less than 5 nm was obtained on a patterned dot array under areal densities of 6 to 15 Tb/in(2). In addition, introduction of a thermal-control layer beneath the recording layer decreased vertical temperature difference within a recording bit while keeping a narrow temperature distribution. Feasibility of 8-Tb/in(2)-class TAMR on a BPM was verified by LLG simulation with a triangular antenna-type near-field optical element.
C1 [Ushiyama, Junko; Akagi, Fumiko; Ando, Ayano; Miyamoto, Harukazu] Hitachi Ltd, Cent Res Lab, Kokubunji, Tokyo 1858601, Japan.
RP Ushiyama, J (reprint author), Hitachi Ltd, Cent Res Lab, Kokubunji, Tokyo 1858601, Japan.
EM junko.ushiyama.td@hitachi.com
CR Akagi F., 2010, 34 ANN C MAGN JAP, V4aA-9, P9
   Akagi F, 2012, J MAGN MAGN MATER, V324, P309, DOI 10.1016/j.jmmm.2010.11.082
   Greaves SJ, 2008, IEEE T MAGN, V44, P3430, DOI 10.1109/TMAG.2008.2002365
   Honda N, 2011, IEEE T MAGN, V47, P11, DOI 10.1109/TMAG.2010.2078802
   Kamata Y, 2011, IEEE T MAGN, V47, P51, DOI 10.1109/TMAG.2010.2077274
   Matsumoto T, 2012, OPT EXPRESS, V20, P18946, DOI 10.1364/OE.20.018946
   Muraoka H, 2011, IEEE T MAGN, V47, P26, DOI 10.1109/TMAG.2010.2080354
   Nakagawa K, 2007, J APPL PHYS, V101, DOI 10.1063/1.2712306
   Sendur K, 2009, APPL PHYS LETT, V94, DOI 10.1063/1.3073049
NR 9
TC 2
Z9 2
U1 0
U2 9
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUL
PY 2013
VL 49
IS 7
BP 3612
EP 3615
DI 10.1109/TMAG.2013.2242442
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 192KM
UT WOS:000322483200137
ER

PT J
AU Lin, MY
   Elidrissi, MR
   Chan, KS
   Eason, K
   Wang, HT
   Yang, JKW
   Asbahi, M
   Thiyagarajah, N
   Ng, V
   Guan, YL
AF Lin, Maria Yu
   Elidrissi, Moulay Rachid
   Chan, Kheong Sann
   Eason, Kwaku
   Wang, Hongtao
   Yang, Joel K. W.
   Asbahi, Mohamed
   Thiyagarajah, Naganivetha
   Ng, Vivian
   Guan, Yong Liang
TI Optimization of Bit-Patterned Media Recording (BPMR) System via
   Tolerance Design
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT 12th Joint MMM-Intermag Conference
CY JAN 14-18, 2013
CL Chicago, IL
SP AIP Publishing, IEEE Magnet Soc
DE Bit-patterned media (BPM); hard disk drives (HDDs); magnetic recording;
   optimization; signal processing
AB Bit-patterned media recording (BPMR) is a promising approach to push back the onset of the superparamagnetic limit faced by conventional granular media recording (CGMR). Previous work in this area has characterized the position jitter and size jitter from fabricated media at recording densities ranging from 0.6 Tera dots per square inch (Tdpsi) to 2.9 Tdpsi, and the characterizations were used to predict expected densities from the BPMR system.
   In this work, we investigate the impact of a few critical parameters towards the final performance of the BPMR system in terms of the written-in-error (WIE) rate.
C1 [Lin, Maria Yu; Elidrissi, Moulay Rachid; Chan, Kheong Sann; Eason, Kwaku; Wang, Hongtao] ASTAR, DSI, Singapore 117608, Singapore.
   [Yang, Joel K. W.; Asbahi, Mohamed] ASTAR, IMRE, Singapore 117602, Singapore.
   [Thiyagarajah, Naganivetha; Ng, Vivian] Natl Univ Singapore, Dept Elect & Comp Engn, Singapore 117576, Singapore.
   [Guan, Yong Liang] Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore.
RP Lin, MY (reprint author), ASTAR, DSI, Singapore 117608, Singapore.
EM LIN_Yu@dsi.a-star.edu.sg
RI Thiyagarajah, Naganivetha/N-1613-2014; Yang, Joel K.W./L-7892-2016;
   Guan, Yong/A-5090-2011
OI Thiyagarajah, Naganivetha/0000-0003-2888-1412; Yang, Joel
   K.W./0000-0003-3301-1040; Guan, Yong/0000-0002-9757-630X
CR Dong Y, 2011, IEEE T MAGN, V47, P2652, DOI 10.1109/TMAG.2011.2148112
   Hu J, 2007, IEEE T MAGN, V43, P3517, DOI 10.1109/TMAG.2007.898307
   Lin M., IEEE T MAGN IN PRESS
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Robert S., 1997, TOLERANCE DESIGN ELE
   Yang JKW, 2011, NANOTECHNOLOGY, V22, DOI 10.1088/0957-4484/22/38/385301
NR 6
TC 0
Z9 0
U1 0
U2 7
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUL
PY 2013
VL 49
IS 7
BP 3624
EP 3627
DI 10.1109/TMAG.2013.2243705
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 192KM
UT WOS:000322483200140
ER

PT J
AU Wang, SM
   Wang, Y
   Victora, RH
AF Wang, Sumei
   Wang, Yao
   Victora, R. H.
TI Shingled Magnetic Recording on Bit Patterned Media at 10 Tb/in(2)
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT 12th Joint MMM-Intermag Conference
CY JAN 14-18, 2013
CL Chicago, IL
SP AIP Publishing, IEEE Magnet Soc
DE Bit patterned media (BPM); shingled magnetic recording
AB In this work, we have combined shingled magnetic recording and bit patterned media (BPM) to achieve an areal density of 10 Tb/in(2). In our design, the gradient of the write field along the cross track direction is as high as 700 Oe/nm. Composite BPM are utilized and the ratio of thermal stability to switching field is optimized accordingly. Assuming 5% switching field distribution, 5% timing error, 5% jitter error and 5% track misregistration, the write field is 7.8 kOe and the BER is 8.0 x 10(-4) for 10 Tb/in(2) with 5.4 nm x 5.4 nm dots; the write field is 7.9 kOe and the BER is 1.0 x 10(-3) for 9.6 Tb/in(2) with 4.4 nm x 4.4 nm dots.
C1 [Wang, Sumei; Wang, Yao; Victora, R. H.] Univ Minnesota, Dept Elect & Comp Engn, Ctr Micromagnet & Informat Technol, Minneapolis, MN 55455 USA.
RP Wang, SM (reprint author), Univ Minnesota, Dept Elect & Comp Engn, Ctr Micromagnet & Informat Technol, Minneapolis, MN 55455 USA.
EM wang3936@umn.edu
FU IDEMA/ASTC
FX The authors would like to thank T. R. Albrecht and M. Schabes for
   valuable discussion. This work was supported by IDEMA/ASTC.
CR Dong Y, 2012, J APPL PHYS, V111, DOI 10.1063/1.3675152
   Dong Y, 2011, IEEE T MAGN, V47, P2652, DOI 10.1109/TMAG.2011.2148112
   Greaves S., J MAGN MAGN MAT, V324, p[314, 201]
   Greaves S, 2010, IEEE T MAGN, V46, P1460, DOI 10.1109/TMAG.2010.2043221
   Hernandez S, 2007, APPL PHYS LETT, V90, DOI 10.1063/1.2716860
   Kanai Y, 2010, IEEE T MAGN, V46, P715, DOI 10.1109/TMAG.2009.2038354
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Shen X, 2008, IEEE T MAGN, V44, P163, DOI 10.1109/TMAG.2007.912839
   Shen X, 2007, IEEE T MAGN, V43, P676, DOI 10.1109/TMAG.2006.888231
   Suess D, 2007, PHYS REV B, V75, DOI 10.1103/PhysRevB.75.174430
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Xu S., 2012, P INT
   Kasiraj P., 2005, U.S. Patent, Patent No. [2005/0069298 A1, 20050069298]
NR 13
TC 11
Z9 11
U1 0
U2 24
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUL
PY 2013
VL 49
IS 7
BP 3644
EP 3647
DI 10.1109/TMAG.2012.2237545
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 192KM
UT WOS:000322483200145
ER

PT J
AU Khatami, SM
   Vasic, B
AF Khatami, Seyed Mehrdad
   Vasic, Bane
TI Generalized Belief Propagation Detector for TDMR Microcell Model
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT 12th Joint MMM-Intermag Conference
CY JAN 14-18, 2013
CL Chicago, IL
SP AIP Publishing, IEEE Magnet Soc
DE Data dependent noise; generalized belief propagation (GBP); intersymbol
   interference (ISI); two dimensional magnetic recording (TDMR); 2-D
   microcell model
ID PATTERNED MEDIA; INTERFERENCE
AB Signal processing in TDMR encounters several challenges such as read channel modeling and detection in the presence of severe two-dimensional intersymbol interference (2-D ISI). The contribution of this paper is twofold. 1) In this paper, we introduce a novel 2-D read channel model which we call the 2-D Microcell model. In this model, we use generalized 2-D microtracks called microcells to captures the properties of irregular grain boundaries of the medium in a relatively simple yet accurate manner. The data dependent noise (DDN) distributions are analytically derived for this model. The derivation of the DDN distributions makes the 2-D Microcell suitable for detector design purposes. 2) We propose a new framework for designing truly two-dimensional detectors for the Microcell model based on near-optimal generalized belief propagation (GBP). The GBP algorithm is purposefully applied for detection in this model in order to handle the data dependent media noise which is caused by irregular bit transitions in both dimensions. Results are provided to show that the incorporation of the DDN distributions into the GBP detection helps improving the detection performance.
C1 [Khatami, Seyed Mehrdad; Vasic, Bane] Univ Arizona, ECE Dept, Tucson, AZ 85721 USA.
RP Khatami, SM (reprint author), Univ Arizona, ECE Dept, Tucson, AZ 85721 USA.
EM khatami@email.arizona.edu
FU IDEMA ASTC; NSF [CCF-0963726]
FX This work was supported by IDEMA ASTC and partially by the NSF under
   Grant CCF-0963726. The authors would like to thank A. R. Krishnan and S.
   S. Garani for their helpful suggestions.
CR Chan KS, 2009, IEEE T MAGN, V45, P3837, DOI 10.1109/TMAG.2009.2024001
   Chang W, 2010, IEEE T MAGN, V46, P3899, DOI 10.1109/TMAG.2010.2056926
   Karakulak S, 2010, IEEE T MAGN, V46, P3639, DOI 10.1109/TMAG.2010.2049116
   Kavcic A, 2010, IEEE T MAGN, V46, P812, DOI 10.1109/TMAG.2009.2035636
   Kim J, 2011, IEEE T MAGN, V47, P594, DOI 10.1109/TMAG.2010.2100371
   Krishnan AR, 2009, IEEE T MAGN, V45, P3830, DOI 10.1109/TMAG.2009.2023233
   Marrow M., 2003, IEEE INF THEOR WORKS, P131
   Modlin CS, 1998, IEEE T MAGN, V34, P63, DOI 10.1109/20.663445
   Shental O, 2008, IEEE T INFORM THEORY, V54, P1500, DOI 10.1109/TIT.2008.917638
   Wood R, 2009, IEEE T MAGN, V45, P917, DOI 10.1109/TMAG.2008.2010676
   Wu YX, 2003, IEEE T MAGN, V39, P2115, DOI 10.1109/TMAG.2003.814291
   Yedidia JS, 2005, IEEE T INFORM THEORY, V51, P2282, DOI 10.1109/TIT.2005.850085
NR 12
TC 10
Z9 10
U1 0
U2 4
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUL
PY 2013
VL 49
IS 7
BP 3699
EP 3702
DI 10.1109/TMAG.2013.2244063
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 192KM
UT WOS:000322483200159
ER

PT J
AU Kurihashi, Y
   Shimizu, O
   Murata, Y
   Asai, M
   Noguchi, H
AF Kurihashi, Yuichi
   Shimizu, Osamu
   Murata, Yuto
   Asai, Masahiko
   Noguchi, Hitoshi
TI Effect of Thermal Conditions on Bit Error Rate for Barium-Ferrite
   Particulate Media
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT 12th Joint MMM-Intermag Conference
CY JAN 14-18, 2013
CL Chicago, IL
SP AIP Publishing, IEEE Magnet Soc
DE Barium ferrite particle; magnetic recording; magnetic tape recording;
   thermal stability
ID NOISE
AB In this study, the thermal stability of user data written on perpendicularly oriented barium-ferrite media was evaluated in terms of the bit error rate. To determine whether recorded data can be read back after long-term preservation, we recorded a pseudorandom data pattern on barium-ferrite media at a linear density of 500 kbpi and baked the media at 65 degrees C for an extended period. After baking, the recorded data were read back using a 0.45-mu m-wide giant magnetoresistive read head. The bit error rate was calculated using the GPR4ML-AR model. It was found that the bit error rate was stable even after one year at 65 degrees C. This result indicates that perpendicularly oriented barium-ferrite media has high thermal stability.
C1 [Kurihashi, Yuichi; Shimizu, Osamu; Murata, Yuto; Asai, Masahiko; Noguchi, Hitoshi] FUJIFILM Corp, Recording Media Res Labs, Odawara, Kanagawa 2500001, Japan.
RP Kurihashi, Y (reprint author), FUJIFILM Corp, Recording Media Res Labs, Odawara, Kanagawa 2500001, Japan.
EM yuuichi_kurihashi@fujifilm.co.jp
CR Cherubini G, 2011, IEEE T MAGN, V47, P137, DOI 10.1109/TMAG.2010.2076797
   Kavcic A, 2000, IEEE T INFORM THEORY, V46, P291, DOI 10.1109/18.817531
   Moon J, 2001, IEEE J SEL AREA COMM, V19, P730, DOI 10.1109/49.920181
   Moser A, 1999, IEEE T MAGN, V35, P2808, DOI 10.1109/20.800990
   SCHNEIDER RC, 1988, IEEE T MAGN, V24, P2533, DOI 10.1109/20.92165
   Shimizu O., 2013, 12 JOINT MMM INT C J
   Shimizu O., 2012, J MAGN SOC JPN, V36, P1
NR 7
TC 5
Z9 5
U1 0
U2 6
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUL
PY 2013
VL 49
IS 7
BP 3760
EP 3762
DI 10.1109/TMAG.2013.2243119
PG 3
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 192KM
UT WOS:000322483200175
ER

PT J
AU Wu, T
   Armand, MA
AF Wu, Tong
   Armand, Marc A.
TI Joint and Separate Detection-Decoding on BPMR Channels
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT 12th Joint MMM-Intermag Conference
CY JAN 14-18, 2013
CL Chicago, IL
SP AIP Publishing, IEEE Magnet Soc
DE Bit-patterned media (BPM); channel detection; Davey-MacKay (DM)
   construction; written-in errors
ID BIT-PATTERNED MEDIA
AB The presence of written-in errors is recognized as a challenging issue that limits the performance of bit-patterned media recording (BPMR). In this paper, we consider the Davey-MacKay coding scheme for a BPMR channel model which consists of a write channel producing dependent insertion, deletion, and substitution errors and a single-track equalized read channel with a GPR target. Three detection-decoding algorithms are proposed to work with an outer LDPC decoder to recover data encoded by the DM coding scheme on the BPMR channel. These include the Bahl-Cocke-Jelinek-Raviv binary input inner decoder (BCJR-BIID) algorithm, the joint detection-decoding algorithm and the separate detection-decoding (SDD) algorithm. Computer simulations show that at low to moderate (resp. high) signal-to-noise ratios, SDD (resp. BCJR-BIID) provides good performance-complexity trade-offs.
C1 [Wu, Tong; Armand, Marc A.] Natl Univ Singapore, Dept Elect & Comp Engn, Commun & Networks Lab, Singapore 117576, Singapore.
RP Armand, MA (reprint author), Natl Univ Singapore, Dept Elect & Comp Engn, Commun & Networks Lab, Singapore 117576, Singapore.
EM eleama@nus.edu.sg
FU Singapore National Research Foundation under CRP [NRF-CRP 4-2008-06]
FX This work is supported by the Singapore National Research Foundation
   under CRP Award NRF-CRP 4-2008-06.
CR BAHL LR, 1974, IEEE T INFORM THEORY, V20, P284, DOI 10.1109/TIT.1974.1055186
   Chang W, 2010, IEEE T MAGN, V46, P3899, DOI 10.1109/TMAG.2010.2056926
   Davey MC, 2001, IEEE T INFORM THEORY, V47, P687, DOI 10.1109/18.910582
   Iyengar AR, 2011, IEEE T MAGN, V47, P35, DOI 10.1109/TMAG.2010.2080667
   Jiao XP, 2011, 2011 IEEE INTERNATIONAL SYMPOSIUM ON INFORMATION THEORY PROCEEDINGS (ISIT), P742, DOI 10.1109/ISIT.2011.6034232
   MOON JY, 1995, IEEE T MAGN, V31, P1083, DOI 10.1109/20.364789
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Wu T, 2013, IEEE T MAGN, V49, P489, DOI 10.1109/TMAG.2012.2208120
NR 8
TC 2
Z9 3
U1 0
U2 3
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUL
PY 2013
VL 49
IS 7
BP 3779
EP 3782
DI 10.1109/TMAG.2013.2250262
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 192KM
UT WOS:000322483200180
ER

PT J
AU Tanabe, H
   Das, S
   Ohno, J
AF Tanabe, Hiroyasu
   Das, Sarbanoo
   Ohno, Jun
TI Detection and Analysis of the Shortest Bit Missing at High Data Rate
   Recording
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT 12th Joint MMM-Intermag Conference
CY JAN 14-18, 2013
CL Chicago, IL
SP AIP Publishing, IEEE Magnet Soc
DE Bit missing; high data rate; magnetic recording; write current rise time
AB Fast response in magnetic recording systems is a continuous demand as the data rate is increasing more rapidly than ever before. Recently, we observed the phenomena that several of the shortest bits are missing in random data patterns from patterns recorded on the magnetic media. This phenomenon is assumed to be caused by the shortest bits not being recorded properly because the write field rise time and transition energy are insufficient. To easily observe this phenomenon in experiments on our spinstand, we developed a method that is based on a comparison of different data patterns. In this paper, we analyze the shortest bits missing by using a spinstand and discuss the mechanism of these bits and a testing algorithm in order to contribute to designing a recording system for high data rate performance.
C1 [Tanabe, Hiroyasu; Das, Sarbanoo; Ohno, Jun] HGST Japan Ltd, Fujisawa, Kanagawa 2520811, Japan.
RP Tanabe, H (reprint author), HGST Japan Ltd, Fujisawa, Kanagawa 2520811, Japan.
EM hiroyasu.tanabe@hgst.com
CR Klaassen KB, 1998, IEEE T MAGN, V34, P1822, DOI 10.1109/20.706718
   Klaassen K. B., 1996, IEEE T MAGN, V32
   Klaassen K. B., 1995, IEEE T MAGN, V31
   Takano K, 2004, IEEE T MAGN, V40, P257, DOI 10.1109/TMAG.2003.821184
   Xing X., 2007, IEEE T MAGN, V43
   Xing XZ, 2007, IEEE T MAGN, V43, P2181, DOI 10.1109/TMAG.2007.894340
NR 6
TC 0
Z9 0
U1 0
U2 1
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUL
PY 2013
VL 49
IS 7
BP 3787
EP 3790
DI 10.1109/TMAG.2013.2248348
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 192KM
UT WOS:000322483200182
ER

PT J
AU Aday, S
   Farrell, H
   Freelon, D
   Lynch, M
   Sides, J
   Dewar, M
AF Aday, Sean
   Farrell, Henry
   Freelon, Deen
   Lynch, Marc
   Sides, John
   Dewar, Michael
TI Watching From Afar: Media Consumption Patterns Around the Arab Spring
SO AMERICAN BEHAVIORAL SCIENTIST
LA English
DT Article
DE social movements; twitter; Arab Spring
ID SOCIAL MEDIA; EGYPTIAN REVOLUTION; INFORMATION FLOWS; POLITICS;
   COMMUNICATION; INTERNET; AGENDA; BLOGS; PARTICIPATION; DELIBERATION
AB Uses of new media in the context of the Arab Spring have attracted scholarly attention from a wide array of disciplines. Amid the anecdotes and speculation, most of the available empirical research in this area has examined how new media have enabled participants and spectators to produce and circulate protest-related content. In contrast, the current study investigates patterns of consumption of Arab Spring-related content using a unique data set constructed by combining archived Twitter content with metadata drawn from the URL shortening service Bit.ly. This data set allows us to explore two critical research questions: First, were links posted to Twitter (among other platforms) followed primarily by individuals inside the affected country, within the broader Middle East and North Africa (MENA) region or by those outside the region and country? And second, who attracted more attention online: protesters and other nonelite citizens or traditional news organizations? Our findings suggest that the vast majority of attention to Arab Spring content came from outside of the MENA region and, furthermore, that mass media, rather than citizen media, overwhelmingly held the world's attention during the protests. We thus conclude that Twitter was broadly useful as an information channel for non-MENA onlookers but less so for protesters on the ground.
C1 [Aday, Sean; Farrell, Henry; Lynch, Marc; Sides, John] George Washington Univ, Washington, DC USA.
   [Freelon, Deen] American Univ, Washington, DC 20016 USA.
   [Dewar, Michael] Bitly, New York, NY USA.
RP Freelon, D (reprint author), American Univ, Sch Commun, 4400 Massachusetts Ave NW, Washington, DC 20016 USA.
EM freelon@american.edu
OI Freelon, Deen/0000-0001-5055-0316
CR Adamic L. A., 2005, P 3 INT WORKSH LINK, P36, DOI DOI 10.1145/1134271.1134277
   Batty D., 2011, GUARDIAN
   Benkler Y., 2006, WEALTH NETWORKS SOCI
   Bruns A., 2005, GATEWATCHING COLLABO
   Bruns Axel, 2003, MEDIA INT AUST, V107, P31
   Campbell SW, 2011, J COMMUN, V61, P1005, DOI 10.1111/j.1460-2466.2011.01601.x
   CASTELLS M, 2007, INT J COMMUNICATION, V0001
   Castells M., 2009, COMMUNICATION POWER
   Cottle S, 2011, JOURNALISM, V12, P647, DOI 10.1177/1464884911410017
   Della Porta D., 2005, J PUBLIC POLICY, V25, P165, DOI DOI 10.1017/S0143814X05000255
   Earl Jennifer, 2011, DIGITALLY ENABLED SO
   Earl J, 2010, MOBILIZATION, V15, P425
   Eltantawy N, 2011, INT J COMMUN-US, V5, P1207
   Farrell H, 2008, PUBLIC CHOICE, V134, P15, DOI 10.1007/s11127-007-9198-1
   Farrell H, 2012, ANNU REV POLIT SCI, V15, P35, DOI 10.1146/annurev-polisci-030810-110815
   Freelon D, 2011, MENA PROTESTS TWITTE
   Freelon DG, 2010, NEW MEDIA SOC, V12, P1172, DOI 10.1177/1461444809357927
   Hardy BW, 2005, J COMMUN, V55, P71, DOI 10.1093/joc/55.1.71
   Hassanpour N., 2011, ANN M AM POL SCI ASS
   Hermida A., 2010, JOURNALISM PRACTICE, V4, P297, DOI DOI 10.1080/17512781003640703
   Hindman M, 2010, MYTH DIGITAL DEMOCRA
   Hirzalla F, 2011, INFORM SOC, V27, P1, DOI 10.1080/01972243.2011.534360
   Howard P. N., 2011, OPENING CLOSED REGIM
   Internet World Stats, 2011, AFR INT US FAC POP S
   [Anonymous], 2011, REC EV EG
   Iskander E., 2011, INT J COMMUNICATION, V5, P13
   Keck M. E., 1998, ACTIVISTS BORDERS AD
   Kenix LJ, 2009, J COMPUT-MEDIAT COMM, V14, P790, DOI 10.1111/j.1083-6101.2009.01471.x
   Khondker HH, 2011, GLOBALIZATIONS, V8, P675, DOI 10.1080/14747731.2011.621287
   Lawrence E, 2010, PERSPECT POLIT, V8, P141, DOI 10.1017/S1537592709992714
   Leccese M, 2009, JOURNALISM MASS COMM, V86, P578
   Lotan G, 2011, INT J COMMUN-US, V5, P1375
   Lynch M, 2012, ARAB UPRISINGS UNFIN
   Lynch M, 2011, PERSPECT POLIT, V9, P301, DOI 10.1017/S1537592711000910
   McAdam Doug, 2001, DYNAMICS CONTENTION
   Meraz S, 2009, J COMPUT-MEDIAT COMM, V14, P682, DOI 10.1111/j.1083-6101.2009.01458.x
   Newsom VA, 2011, INT J COMMUN-US, V5, P1303
   Parfeni L., 2010, BIT LY DOMINATES TOP
   Price V., 2002, IT SOC, V1, P303, DOI DOI 10.1080/10584600390211172
   Rinke EM, 2011, INT J COMMUN-US, V5, P1273
   Robertson S., 2009, P 10 ANN INT C DIG G, P6
   Russell A, 2011, INT J COMMUN-US, V5, P1238
   Travers Scott D., 2007, BLOGGING CITIZENSHIP, P39
   Shirky C, 2003, POWER LAWS WEBLOGS I
   Shoemaker PJ, 1996, MEDIATING MESSAGE
   Tremayne M, 2006, J COMPUT-MEDIAT COMM, V12, P290, DOI 10.1111/j.1083-6101.2006.00326.x
   Van Niekerk B, 2011, INT J COMMUN-US, V5, P1406
   Wall M., 2005, JOURNALISM, V6, P153, DOI DOI 10.1177/1464884905051006
   Wall M, 2011, INT J COMMUN-US, V5, P1333
   Wilken R., 2011, MOB COMMUN INT, P127
   Williams BA, 2004, AM BEHAV SCI, V47, P1208, DOI 10.1177/0002764203262344
   Wilson C, 2011, INT J COMMUN-US, V5, P1248
   Wright S, 2012, NEW MEDIA SOC, V14, P244, DOI 10.1177/1461444811410679
   Wu S., 2011, P 20 INT C WORLD WID, P705, DOI DOI 10.1145/1963405.1963504]
   Zhou X., 2011, PEACE, V27
NR 55
TC 7
Z9 7
U1 12
U2 70
PU SAGE PUBLICATIONS INC
PI THOUSAND OAKS
PA 2455 TELLER RD, THOUSAND OAKS, CA 91320 USA
SN 0002-7642
EI 1552-3381
J9 AM BEHAV SCI
JI Am. Behav. Sci.
PD JUL
PY 2013
VL 57
IS 7
SI SI
BP 899
EP 919
DI 10.1177/0002764213479373
PG 21
WC Psychology, Clinical; Social Sciences, Interdisciplinary
SC Psychology; Social Sciences - Other Topics
GA 166SL
UT WOS:000320577600004
ER

PT J
AU Perego, M
   Andreozzi, A
   Vellei, A
   Ferrarese Lupi, F
   Seguini, G
AF Perego, M.
   Andreozzi, A.
   Vellei, A.
   Ferrarese Lupi, F.
   Seguini, G.
TI Collective behavior of block copolymer thin films within periodic
   topographical structures
SO NANOTECHNOLOGY
LA English
DT Article
ID BIT-PATTERNED MEDIA; AREAL DENSITY; LITHOGRAPHY; ELECTRONICS;
   GRAPHOEPITAXY; REGISTRATION; FABRICATION; TEMPLATES; CYLINDERS;
   ALIGNMENT
AB We perform a systematic study of the effect of adjacent nanostructures on the confinement of block copolymers (BCP) within pre-patterned trenches in 100 nm thick SiO2 films. Asymmetric PS-b-PMMA BCP with a styrene fraction of 0.71, M-n = 67100 are used. When deposited in the form of thin film, these BCP naturally self-organize upon annealing and form a PS matrix with hexagonally packed PMMA cylinders perpendicularly oriented with respect to the substrate. An accurate study of the confinement of this BCP thin film within isolated trenches is performed as a function of their width (80-260 nm). In this specific configuration the confinement of the BCP thin film within the pre-patterned structures has only been partially achieved. The effect of adjacent trenches on the arrangement of the BCP thin film is investigated using parallel trenches periodically distributed on the surface. The effective confinement of the BCP film is strongly modified by the periodicity of the pre-patterned structures.
C1 [Perego, M.; Andreozzi, A.; Vellei, A.; Ferrarese Lupi, F.; Seguini, G.] IMM CNR, Lab MDM, I-20864 Agrate Brianza, MB, Italy.
RP Perego, M (reprint author), IMM CNR, Lab MDM, Via C Olivetti 2, I-20864 Agrate Brianza, MB, Italy.
EM michele.perego@mdm.imm.cnr.it
RI Ferrarese Lupi, Federico/H-5062-2013; Seguini, Gabriele/O-1956-2015;
   Perego, Michele/C-7895-2009
OI Ferrarese Lupi, Federico/0000-0002-1055-8839; Seguini,
   Gabriele/0000-0002-7729-6212; Perego, Michele/0000-0001-7431-1969
FU ERANET PLUS 'NanoSci-E+' consortium through the NANO-BLOCK project
   ('NANO-device fabrication using Block copolymer based technology')
FX This research activity was financially supported by the ERANET PLUS
   'NanoSci-E+' consortium through the NANO-BLOCK project ('NANO-device
   fabrication using Block copolymer based technology'). The authors would
   like to acknowledge M Morgano for his collaboration in the acquisition
   of some of the SEM images and for fruitful discussions.
CR Andreozzi A, 2011, NANOTECHNOLOGY, V22, DOI 10.1088/0957-4484/22/18/185304
   Black CT, 2007, ACS NANO, V1, P147, DOI 10.1021/nn7002663
   Black CT, 2004, IEEE T NANOTECHNOL, V3, P412, DOI 10.1109/TNANO.2004.834160
   Cheng JY, 2006, ADV MATER, V18, P2505, DOI 10.1002/adma.200502651
   Cheng JY, 2006, ADV MATER, V18, P597, DOI 10.1002/adma.200501936
   Cheng JY, 2003, ADV MATER, V15, P1599, DOI 10.1002/adma.200305244
   Cheng JY, 2004, NAT MATER, V3, P823, DOI 10.1038/nmat1211
   Darling SB, 2007, PROG POLYM SCI, V32, P1152, DOI 10.1016/j.progpolymsci.2007.05.004
   Fontana SM, 2010, THIN SOLID FILMS, V518, P2783, DOI 10.1016/j.tsf.2009.10.161
   Ham S, 2008, MACROMOLECULES, V41, P6431, DOI 10.1021/ma8007338
   Kim HC, 2010, CHEM REV, V110, P146, DOI 10.1021/cr900159v
   Mansky P, 1997, SCIENCE, V275, P458
   Park SM, 2007, ADV MATER, V19, P607, DOI 10.1002/adma.200601421
   Pease RF, 2008, P IEEE, V96, P248, DOI 10.1109/JPROC.2007.911853
   Saavedra HM, 2010, REP PROG PHYS, V73, DOI 10.1088/0034-4885/73/3/036501
   Smayling M C, P SPIE, V7274
   Stoykovich MP, 2007, ACS NANO, V1, P168, DOI 10.1021/nn700164p
   Sundrani D, 2004, LANGMUIR, V20, P5091, DOI 10.1021/la036123p
   Sundrani D, 2004, NANO LETT, V4, P273, DOI 10.1021/nl035005j
   Wang YH, 2009, ACS NANO, V3, P1049, DOI 10.1021/nn900448g
   Welander AM, 2008, MACROMOLECULES, V41, P2759, DOI 10.1021/ma800056s
   Welander AM, 2008, J VAC SCI TECHNOL B, V26, P2484, DOI 10.1116/1.2987963
   Xiao SG, 2005, NANOTECHNOLOGY, V16, pS324, DOI 10.1088/0957-4484/16/7/003
   Xiao SG, 2007, J VAC SCI TECHNOL B, V25, P1953, DOI 10.1116/1.2801860
   Xu J, 2011, ADV MATER, V23, P5755, DOI 10.1002/adma.201102964
   Yang XM, 2009, ACS NANO, V3, P1844, DOI 10.1021/nn900073r
   Zucchi IA, 2010, NANOTECHNOLOGY, V21, DOI 10.1088/0957-4484/21/18/185304
NR 27
TC 11
Z9 11
U1 1
U2 44
PU IOP PUBLISHING LTD
PI BRISTOL
PA TEMPLE CIRCUS, TEMPLE WAY, BRISTOL BS1 6BE, ENGLAND
SN 0957-4484
EI 1361-6528
J9 NANOTECHNOLOGY
JI Nanotechnology
PD JUN 21
PY 2013
VL 24
IS 24
AR 245301
DI 10.1088/0957-4484/24/24/245301
PG 8
WC Nanoscience & Nanotechnology; Materials Science, Multidisciplinary;
   Physics, Applied
SC Science & Technology - Other Topics; Materials Science; Physics
GA 150IR
UT WOS:000319384300005
PM 23680847
ER

PT J
AU Zong, BY
   Goh, JY
   Guo, ZB
   Luo, P
   Cwang, C
   Qiu, JJ
   Ho, P
   Chen, YJ
   Zhang, MS
   Han, GC
AF Zong, B. Y.
   Goh, J. Y.
   Guo, Z. B.
   Luo, P.
   Cwang, C.
   Qiu, J. J.
   Ho, P.
   Chen, Y. J.
   Zhang, M. S.
   Han, G. C.
TI Fabrication of ultrahigh density metal-cell-metal crossbar memory
   devices with only two cycles of lithography and dry-etch procedures
SO NANOTECHNOLOGY
LA English
DT Article
ID NANOIMPRINT LITHOGRAPHY; PATTERNED MEDIA; ELECTRON-BEAM; CIRCUITS
AB A novel approach to the fabrication of metal-cell-metal trilayer memory devices was demonstrated by using only two cycles of lithography and dry-etch procedures. The fabricated ultrahigh density crossbar devices can be scaled down to <= 70 nm in half-pitch without alignment issues. Depending on the different dry-etch mechanisms in transferring high and low density nanopatterns, suitable dry-etch angles and methods are studied for the transfer of high density nanopatterns. Some novel process methods have also been developed to eliminate the sidewall and other conversion obstacles for obtaining high density of uniform metallic nanopatterns. With these methods, ultrahigh density trilayer crossbar devices (similar to 2 x 10(10) bit cm 2-kilobit electronic memory), which are composed of built-in practical magnetoresistive nanocells, have been achieved. This scalable process that we have developed provides the relevant industries with a cheap means to commercially fabricate three-dimensional high density metal-cell-metal nanodevices.
C1 [Zong, B. Y.] Natl Univ Singapore, Temasek Labs, Singapore 117411, Singapore.
   [Zong, B. Y.; Goh, J. Y.; Guo, Z. B.; Luo, P.; Cwang, C.; Qiu, J. J.; Ho, P.; Chen, Y. J.; Zhang, M. S.; Han, G. C.] ASTAR, Data Storage Inst, Singapore 117608, Singapore.
   [Goh, J. Y.] Natl Jr Coll, Singapore 288913, Singapore.
   [Guo, Z. B.] KAUST, Core Labs, Thuwal 239556900, Saudi Arabia.
RP Zong, BY (reprint author), Natl Univ Singapore, Temasek Labs, 09-02,5A Engn Dr 1, Singapore 117411, Singapore.
EM tslzb@nus.edu.sg
RI Guo, Zaibing/B-5984-2014
OI Ho, Pin/0000-0002-2399-0823; Zong, BaoYu/0000-0003-2025-1395
CR Bencher Christopher, 2009, P SPIE
   Bhushan B., 2007, SPRINGER HDB NANOTEC
   Cui Z., 2008, NANOFABRICATION PRIN
   FISCHER PB, 1993, J VAC SCI TECHNOL B, V11, P2524, DOI 10.1116/1.586659
   The Future Fab Team, 2013, INT TECHN ROADM SEM
   Green JE, 2007, NATURE, V445, P414, DOI 10.1038/nature05462
   Hughes G, 2009, P SOC PHOTO-OPT INS, V7488, P1
   Hughes GF, 1999, IEEE T MAGN, V35, P2310, DOI 10.1109/20.800809
   [Anonymous], INT MAGN TAP STOR TE
   Kulkarni GU, 2010, NANOSCALE, V2, P2035, DOI 10.1039/c0nr00088d
   Li NH, 2006, NANO LETT, V6, P2626, DOI 10.1021/nl0603395
   Lipomi DJ, 2009, ACS NANO, V3, P3315, DOI 10.1021/nn901002q
   Mack C, 2008, MICROLITHOGR WORLD
   Madou M.J., 2002, FUNDAMENTALS MICROFA
   Maluf N, 2004, INTRO MICROELECTROME
   Melosh NA, 2003, SCIENCE, V300, P112, DOI 10.1126/science.1081940
   Moneck MT, 2007, IEEE T MAGN, V43, P2127, DOI 10.1109/TMAG.2007.893706
   Rai-Choudhury P., 1997, HDB MICROLITHOGRAPHY, V1
   Saifullah MSM, 2005, ADV MATER, V17, P1757, DOI 10.1002/adma.200500484
   Schmid GM, 2009, J VAC SCI TECHNOL B, V27, P573, DOI 10.1116/1.3081981
   Stewart M E, 2007, J NANOENG NANOSYST, V220, P81
   Stuart C, 2010, SMALL, V6, P1663, DOI 10.1002/smll.201000514
   Wu W, 2005, APPL PHYS A-MATER, V80, P1173, DOI 10.1007/s00339-004-3176-y
   Zant P. V., 2004, MICROCHIP FABRICATIO
   Zheng YK, 2007, J NANOSCI NANOTECHNO, V7, P117, DOI 10.1166/jnn.2007.010
   Zong B Y, 2013, J MICROMECH MICROENG, V23, P1
   Zong B.Y., 2009, ADV FUNCT MATER, V19, P1
NR 27
TC 3
Z9 3
U1 0
U2 17
PU IOP PUBLISHING LTD
PI BRISTOL
PA TEMPLE CIRCUS, TEMPLE WAY, BRISTOL BS1 6BE, ENGLAND
SN 0957-4484
J9 NANOTECHNOLOGY
JI Nanotechnology
PD JUN 21
PY 2013
VL 24
IS 24
AR 245303
DI 10.1088/0957-4484/24/24/245303
PG 9
WC Nanoscience & Nanotechnology; Materials Science, Multidisciplinary;
   Physics, Applied
SC Science & Technology - Other Topics; Materials Science; Physics
GA 150IR
UT WOS:000319384300007
PM 23690027
ER

PT J
AU Wang, Y
   Wang, R
   Xie, HL
   Bai, JM
   Wei, FL
AF Wang Ying
   Wang Rui
   Xie Hai-Long
   Bai Jian-Min
   Wei Fu-Lin
TI Micromagnetic simulation with three models of FeCo/L1(0) FePt
   exchange-coupled particles for bit-patterned media
SO CHINESE PHYSICS B
LA English
DT Article
DE exchange-coupled composite; bit patterned; micromagnetic
ID MAGNETIC-PROPERTIES; COMPOSITE MEDIA
AB Compositing soft and hard materials is a promising method to decrease the coercivity of L1(0) FePt, which is considered to be a suitable material for bit-patterned media. This paper reports the simulation of three models of FeCo/L1(0) FePt exchange-coupled composite particles for bit patterned media by the OOMMF micromagnetic simulation software: the enclosed model, the side-enclosed model, and the top-covered model. All of them have the same volumes of the soft and hard parts but different shapes. Simulation results show that the switching fields for the three models can be reduced to about 10 kOe (1 Oe = 79.5775 A/m) and the factor gain can be improved to 1.4 when the interface exchange coefficient has a proper value. Compared to the other models, the enclosed model has a wider range of interface exchange coefficient values, in which a low switching field and high gain can be obtained. The dependence of the switching fields on the angle of the applied field shows that none of the three models are easily affected by the stray field of a magnetic head.
C1 [Wang Ying; Wang Rui; Xie Hai-Long; Bai Jian-Min; Wei Fu-Lin] Lanzhou Univ, Key Lab Magnetism & Magnet Mat, Minist Educ, Lanzhou 730000, Peoples R China.
RP Wang, Y (reprint author), Lanzhou Univ, Key Lab Magnetism & Magnet Mat, Minist Educ, Lanzhou 730000, Peoples R China.
EM yingw@lzu.edu.cn
OI Wang, Ying/0000-0003-4431-1807
FU National Natural Science Foundation of China [61003041, 51171086,
   61272076]; Fundamental Research Funds for the Central Universities
   [lzujbky-2010-81]
FX Project supported by the National Natural Science Foundation of China
   (Grant Nos. 61003041, 51171086, and 61272076) and the Fundamental
   Research Funds for the Central Universities (Grant No. lzujbky-2010-81).
CR Batra S, 2004, IEEE T MAGN, V40, P319, DOI 10.1109/TMAG.2003.821163
   Duan CY, 2009, CHINESE PHYS B, V18, P2565, DOI 10.1088/1674-1056/18/6/074
   Farrow RFC, 1996, J APPL PHYS, V79, P5967, DOI 10.1063/1.362122
   Gao YH, 2011, CHINESE PHYS B, V20, DOI 10.1088/1674-1056/20/10/107502
   Goh CK, 2009, J APPL PHYS, V105, DOI 10.1063/1.3109243
   Kapoor M, 2006, J APPL PHYS, V99
   Krone P, 2010, APPL PHYS LETT, V97, DOI 10.1063/1.3481668
   Todorovic M, 1999, APPL PHYS LETT, V74, P2516, DOI 10.1063/1.123885
   Victora RH, 2005, IEEE T MAGN, V41, P537, DOI 10.1109/TMAG.2004.838075
   Wang JP, 2005, IEEE T MAGN, V41, P3181, DOI 10.1109/TMAG.2005.855278
   Wang JP, 2005, APPL PHYS LETT, V86, P42504, DOI 10.1063/1.1896431
   Weller D, 1999, IEEE T MAGN, V35, P4423, DOI 10.1109/20.809134
   Yin JH, 2008, CHINESE PHYS B, V17, P3907, DOI 10.1088/1674-1056/17/10/058
   Zhang LR, 2012, CHINESE PHYS B, V21, DOI 10.1088/1674-1056/21/3/037502
NR 14
TC 6
Z9 6
U1 2
U2 38
PU IOP PUBLISHING LTD
PI BRISTOL
PA TEMPLE CIRCUS, TEMPLE WAY, BRISTOL BS1 6BE, ENGLAND
SN 1674-1056
J9 CHINESE PHYS B
JI Chin. Phys. B
PD JUN
PY 2013
VL 22
IS 6
AR 068506
DI 10.1088/1674-1056/22/6/068506
PG 4
WC Physics, Multidisciplinary
SC Physics
GA 179WE
UT WOS:000321552000105
ER

PT J
AU Lai, CF
   Chao, HC
   Lai, YX
   Wan, JF
AF Lai, Chin-Feng
   Chao, Han-Chieh
   Lai, Ying-Xun
   Wan, Jiafu
TI CLOUD-ASSISTED REAL-TIME TRANSRATING FOR HTTP LIVE STREAMING
SO IEEE WIRELESS COMMUNICATIONS
LA English
DT Article
AB With the increasing trend for hand-held devices, such as the intelligent mobile phone and tablet PC, users have an increasing demand for network media streaming service. However, in the course of streaming media, the unstable network bandwidth often causes frozen play or delay to degrade user experience. A cloud-assisted real-time transcoding mechanism is proposed in this paper, which contains HTTP live streaming protocol, a coding mode transition state machine, and three bandwidth evaluations of error patterns. In the proposed mechanism, the variance in current network is able to be observed according to the bandwidth evaluation results; if different transcoding strategies are used in different modes, the appropriate media segment bit rate is able to be calculated, which is transcoded into the segment to meet the current bandwidth conditions, it makes the users can obtain appropriate media quality automatically through the HTTP redirection technique. Using cloud computing the user will take different transrating media clips into different transrators according to the users' needs, using this technology to increase the transrating efficiency to achieve real-time transrating. Finally, the peak signal-to-noise ratio (PSNR) and bandwidth utilization rate are analyzed as the reference index of improvement in media quality. According to the experimental results, the PSNR can be increased by about 2.8 dB in general network behavior, and the bandwidth utilization rate can be maintained above 80 percent during streaming.
C1 [Lai, Chin-Feng; Chao, Han-Chieh] Natl Ilan Univ, Inst Comp Sci & Informat Engn, Ilan, Taiwan.
   [Chao, Han-Chieh] Natl Ilan Univ, Dept Elect Engn, Ilan, Taiwan.
   [Lai, Ying-Xun] Natl Cheng Kung Univ, Tainan 70101, Taiwan.
   [Wan, Jiafu] S China Univ Technol, Coll Comp Sci & Engn, Guangzhou, Guangdong, Peoples R China.
RP Lai, CF (reprint author), Natl Ilan Univ, Inst Comp Sci & Informat Engn, Ilan, Taiwan.
EM cinfon@gmail.com; hcc@niu.edu.tw; eetaddy@gmail.com; jiafu_wan@ieee.org
RI Wan, Jiafu/I-3059-2016
OI Wan, Jiafu/0000-0001-9188-4179
FU National Science Council and Science Park Administration of the Republic
   of China, Taiwan [NSC 101-2628-E-197-001-MY3, 101-2221-E-197-008MY3,
   101-2219-E-197-004]
FX The authors would like to thank the National Science Council and Science
   Park Administration of the Republic of China, Taiwan for supporting this
   research under Contract NSC 101-2628-E-197-001-MY3,
   101-2221-E-197-008MY3 and 101-2219-E-197-004.
CR Begen AC, 2011, IEEE INTERNET COMPUT, V15, P54, DOI 10.1109/MIC.2010.155
   Chang SY, 2012, COMPUT COMMUN, V35, P1798, DOI 10.1016/j.comcom.2012.06.001
   Frossard P, 2008, P IEEE, V96, P39, DOI 10.1109/JPROC.2007.909876
   Goel A., 2008, ACM T MULTIM COMPUT, V4, P1, DOI DOI 10.1145/1386109.1386113
   Guo J, 2006, IEEE T PARALL DISTR, V17, P1321, DOI 10.1109/TPDS.2006.159
   Lai Chin-Feng, 2010, IEEE COMSOC MMTC E L, V5, P39
   Lee H. S., 2006, P ICACT 2006 ADV COM, V3, P1833
   Ma KJ, 2011, IEEE COMMUN MAG, V49, P166, DOI 10.1109/MCOM.2011.5741161
   Mahmood A, 2008, 2008 INTERNATIONAL CONFERENCE ON EMERGING TECHNOLOGIES, PROCEEDINGS, P187, DOI 10.1109/ICET.2008.4777498
   Medagama M., 2009, P 2009 INT C ICIIS D, P62
   Schulzrinne H., 2003, 3550 RFC
   SWAMINATHAN V., 2011, P IEEE 13 INT WKSP M, P1
   TANG Q, 2008, P IEEE INT S WIR PER, P464
   Wu SY, 2011, IEEE T PARALL DISTR, V22, P439, DOI 10.1109/TPDS.2010.81
   Wu W., 2009, P 17 ACM INT C MULT, P481, DOI DOI 10.1145/1631272.1631338
NR 15
TC 22
Z9 22
U1 0
U2 10
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 1536-1284
J9 IEEE WIREL COMMUN
JI IEEE Wirel. Commun.
PD JUN
PY 2013
VL 20
IS 3
BP 62
EP 70
PG 9
WC Computer Science, Hardware & Architecture; Computer Science, Information
   Systems; Engineering, Electrical & Electronic; Telecommunications
SC Computer Science; Engineering; Telecommunications
GA 176BT
UT WOS:000321278800010
ER

PT J
AU Juang, JY
   Lin, KT
AF Juang, Jia-Yang
   Lin, Kuan-Te
TI Touchdown of Flying Recording Head Sliders on Continuous and Patterned
   Media
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT ASIA-PACIFIC MAGNETIC RECORDING CONFERENCE (APMRC)
CY OCT 31-NOV 02, 2012
CL undefined, SINGAPORE
DE Head-disk interface (HDI); magnetic recording; patterned media; thermal
   flying-height control (TFC); touchdown
ID HEIGHT CONTROL; DISK INTERFACE; MAGNETIC HEAD; PROTRUSION; SIMULATION;
   DYNAMICS; DENSITY; DESIGNS
AB We conduct three-dimensional transient finite-element analysis to study the contact behavior during touchdown detection by a thermal flying-height control (TFC) recording head on continuous and patterned elastic-plastic layered media. The heat generated during touchdown and the plastic strain of the media are calculated in the model. We investigated key factors such as the radius of curvature of the TFC protrusion, media compositions, bit-patterned media (BPM), and the effect of planarization. Our analysis shows that when subjected to the same TFC over-push, BPM is much more likely to result in plastic deformation than the continuous media. The temperature distribution of planarized BPM with SiO2 as filling material exhibits a complex and distinctive pattern different from the one without planarization. More importantly, the maximum plastic strain of the planarized BPM is 50% larger than the one without planarization, which means that filling with SiO2 deteriorates the media's robustness to the touchdown probably due to the mismatch of thermal properties between SiO2 and recording material. This suggests the filling material must be carefully chosen to avoid the excessive plastic strain.
C1 [Juang, Jia-Yang; Lin, Kuan-Te] Natl Taiwan Univ, Dept Mech Engn, Taipei 10617, Taiwan.
RP Juang, JY (reprint author), Natl Taiwan Univ, Dept Mech Engn, Taipei 10617, Taiwan.
EM jiayang@ntu.edu.tw
RI Juang, Jia-Yang/J-9534-2013
OI Juang, Jia-Yang/0000-0001-6801-3244
FU National Science Council of Taiwan [NSC 101-2221-E-002-151]
FX This work was supported in part by the National Science Council of
   Taiwan under Contract NSC 101-2221-E-002-151. The authors would like to
   thank Dr. A. Ovcharenko for helpful discussions on the finite-element
   model.
CR Hallquist J. O., 2006, LS DYNA THEORETICAL
   Juang JY, 2007, J TRIBOL-T ASME, V129, P570, DOI 10.1115/1.2736456
   Juang JY, 2011, IEEE T MAGN, V47, P3437, DOI 10.1109/TMAG.2011.2147773
   Juang JY, 2008, IEEE T MAGN, V44, P3679, DOI 10.1109/TMAG.2008.2002612
   Juang JY, 2006, IEEE T MAGN, V42, P241, DOI 10.1109/TMAG.2005.861739
   Knigge B, 2006, IEEE T MAGN, V42, P2510, DOI 10.1109/TMAG.2006.880473
   Li N, 2012, IEEE T MAGN, V48, P2385, DOI 10.1109/TMAG.2012.2190615
   Liu B, 2009, IEEE T MAGN, V45, P899, DOI 10.1109/TMAG.2008.2010671
   Liu N, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3268468
   Nunez EE, 2008, IEEE T MAGN, V44, P3667, DOI 10.1109/TMAG.2008.2002593
   Ovcharenko A, 2010, IEEE T MAGN, V46, P770, DOI 10.1109/TMAG.2009.2035092
   Shimizu Y, 2011, IEEE T MAGN, V47, P3426, DOI 10.1109/TMAG.2011.2144961
   Shimizu Y, 2011, MICROSYST TECHNOL, V17, P897, DOI 10.1007/s00542-011-1261-7
   Shiramatsu T, 2006, IEEE T MAGN, V42, P2513, DOI 10.1109/TMAG.2006.880564
   Su LZ, 2011, IEEE T MAGN, V47, P111, DOI 10.1109/TMAG.2010.2080666
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Weller D, 1999, IEEE T MAGN, V35, P4423, DOI 10.1109/20.809134
   Zeng QH, 2011, IEEE T MAGN, V47, P3433, DOI 10.1109/TMAG.2011.2158601
   Zheng JL, 2010, TRIBOL LETT, V40, P295, DOI 10.1007/s11249-010-9661-x
NR 19
TC 1
Z9 1
U1 0
U2 9
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUN
PY 2013
VL 49
IS 6
BP 2477
EP 2482
DI 10.1109/TMAG.2013.2249054
PN 1
PG 6
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 158NB
UT WOS:000319977400011
ER

PT J
AU Han, GJ
   Guan, YL
   Cai, K
   Chan, KS
   Kong, L
AF Han, Guojun
   Guan, Yong Liang
   Cai, Kui
   Chan, Kheong Sann
   Kong, Lingjun
TI Embedded Marker Code for Channels Corrupted by Insertions, Deletions,
   and AWGN
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT ASIA-PACIFIC MAGNETIC RECORDING CONFERENCE (APMRC)
CY OCT 31-NOV 02, 2012
CL undefined, SINGAPORE
DE Bit-patterned media recording (BPMR); insertion/deletion; low-density
   parity-check (LDPC) codes; marker code; synchronization errors
ID BIT-PATTERNED MEDIA; SYNCHRONIZATION; ERRORS
AB In this paper, we present a new error-correction scheme, referred to as embedded marker code scheme (EMCS), for channels corrupted by insertions, deletions and additive white Gaussian noise (AWGN). The EMCS uses the pinning bits, which have the potential to lower the error floors of the outer low-density parity-check (LDPC) codes, for both resynchronization and improving error-correction performance. Furthermore, the soft-input synchronization for the inner decoder and the joint iterative decoding between the inner decoder and the outer decoder is employed to further improve the overall performance of the new scheme. Simulations show that the proposed EMCS reduces the code rate loss as compared with the conventional marker code scheme and achieves a better tradeoff between the error performance and the decoding complexity. Therefore, the new scheme can reduce code rate loss and improve storage efficiency when it is used in bit-patterned media recording (BPMR) systems.
C1 [Han, Guojun; Guan, Yong Liang; Kong, Lingjun] Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore.
   [Han, Guojun] Guangdong Univ Technol, Sch Informat Engn, Guangzhou 510006, Guangdong, Peoples R China.
   [Cai, Kui; Chan, Kheong Sann] ASTAR, Data Storage Inst, Singapore 117608, Singapore.
RP Han, GJ (reprint author), Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore.
EM gjhan@ntu.edu.sg
RI han, guojun/H-5968-2012; Guan, Yong/A-5090-2011
OI Guan, Yong/0000-0002-9757-630X
FU Agency for Science, Technology and Research (A*STAR) Singapore
   [SERC0921560129]; National Natural Science Foundation of China
   [61172076]
FX This work was supported by the Agency for Science, Technology and
   Research (A*STAR) Singapore under Grant SERC0921560129 and by the
   National Natural Science Foundation of China under Grant 61172076.
CR Cai K, 2010, IEEE GLOBE WORK, P1910, DOI 10.1109/GLOCOMW.2010.5700275
   Davey MC, 2001, IEEE T INFORM THEORY, V47, P687, DOI 10.1109/18.910582
   GALLAGER RG, 1962, IRE T INFORM THEOR, V8, P21, DOI 10.1109/TIT.1962.1057683
   Han Y, 2010, IEEE J SEL AREA COMM, V28, P252, DOI 10.1109/JSAC.2010.100214
   Licks V, 2005, IEEE MULTIMEDIA, V12, P68, DOI 10.1109/MMUL.2005.46
   Mercier H, 2010, IEEE COMMUN SURV TUT, V12, P87, DOI 10.1109/SURV.2010.020110.00079
   Ng YB, 2010, IEEE T MAGN, V46, P2268, DOI 10.1109/TMAG.2010.2043926
   Ratzer EA, 2005, ANN TELECOMMUN, V60, P29
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   SELLERS FF, 1962, IRE T INFORM THEOR, V8, P35, DOI 10.1109/TIT.1962.1057684
   Wang F, 2011, IEEE T COMMUN, V59, P1287, DOI 10.1109/TCOMM.2011.030411.100546
NR 11
TC 2
Z9 2
U1 0
U2 5
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUN
PY 2013
VL 49
IS 6
BP 2535
EP 2538
DI 10.1109/TMAG.2013.2247581
PN 1
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 158NB
UT WOS:000319977400022
ER

PT J
AU Koo, K
   Kim, SY
   Jeong, JJ
   Kim, SW
AF Koo, Keunhwi
   Kim, Soo-Yong
   Jeong, Jae Jin
   Kim, Sang Woo
TI Two-Dimensional Soft Output Viterbi Algorithm With Dual Equalizers for
   Bit-Patterned Media
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT ASIA-PACIFIC MAGNETIC RECORDING CONFERENCE (APMRC)
CY OCT 31-NOV 02, 2012
CL undefined, SINGAPORE
DE Bit-patterned media; equalizer; intersymbol interference; intertrack
   interference; partial responsemaximumlikelihood; readback signal; soft
   output Viterbi algorithm
AB This study proposes a two-dimensional (2D) detection method using partial response maximum likelihood (PRML) for bit-patterned media (BPM) storage. Because the readback signals are deteriorated by 2D channel effect, that is, intersymbol interference along the track direction and intertrack interference across the track direction, it is necessary to use "2D" PRML in order to improve the bit error rate (BER) performance. The 2D PRML in the proposed method is based on the 2D soft output Viterbi algorithm (SOVA), which is composed of two one-dimensional SOVAs. In addition, we propose a 2D SOVA for a 2D partial response (PR) target using dual equalizers: one estimates the correlated signal (output data of the PR target), used as the main information with encoding rule, and the other estimates the binary signal (binary data recorded on BPM), used as extrinsic information on the other direction's neighboring bits. The simulation results show that the proposed method improves the BER performance at a low computational complexity.
C1 [Koo, Keunhwi; Kim, Soo-Yong; Jeong, Jae Jin; Kim, Sang Woo] Pohang Univ Sci & Technol, Dept Elect Engn, Pohang 790784, Gyeongbuk, South Korea.
   [Kim, Soo-Yong] Samsung Elect Co Ltd, Semicond Div, Emerging SOC Grp, Yongin 446711, Gyeonggi, South Korea.
   [Kim, Sang Woo] Pohang Univ Sci & Technol, Dept Creat IT Excellence Engn, Pohang 790784, Gyeongbuk, South Korea.
   [Kim, Sang Woo] Pohang Univ Sci & Technol, Future IT Innovat Lab, Pohang 790784, Gyeongbuk, South Korea.
RP Kim, SW (reprint author), Pohang Univ Sci & Technol, Dept Elect Engn, Pohang 790784, Gyeongbuk, South Korea.
EM swkim@postech.ac.kr
FU Ministry of Knowledge Economy (MKE), Korea [C1515-1121-0003]
FX This research was supported by the Ministry of Knowledge Economy (MKE),
   Korea, under the IT Consilience Creative Program supervised by the
   National IT Industry Promotion Agency (NIPA) (C1515-1121-0003).
CR Kim J., 2011, J APPL PHYS, V109
   Kim JB, 2010, JPN J APPL PHYS, V49, DOI 10.1143/JJAP.49.042102
   Kim J, 2011, IEEE T MAGN, V47, P594, DOI 10.1109/TMAG.2010.2100371
   Kim JW, 2009, JPN J APPL PHYS, V48, DOI 10.1143/JJAP.48.06FD14
   Koo K, 2012, JPN J APPL PHYS, V51, DOI 10.1143/JJAP.51.08JB03
   Lee K., 2009, SUBBAND ADAPTIVE FIL, P1
   Myint L., 2009, IEEE T MAGN, V45, P2274
   Nabavi S, 2007, IEEE T MAGN, V43, P2274, DOI 10.1109/TMAG.2007.893479
   Ng Y, 2009, IEEE T MAGN, V45, P3535, DOI 10.1109/TMAG.2009.2024427
   Nutter PW, 2005, IEEE T MAGN, V41, P3214, DOI 10.1109/TMAG.2005.854780
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
NR 11
TC 1
Z9 1
U1 0
U2 5
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUN
PY 2013
VL 49
IS 6
BP 2555
EP 2558
DI 10.1109/TMAG.2013.2251614
PN 1
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 158NB
UT WOS:000319977400026
ER

PT J
AU Zhang, SH
   Cai, K
   Qin, ZL
AF Zhang, Songhua
   Cai, Kui
   Qin, Zhiliang
TI A Position-Dependent Binary Symmetric Channel Model for BPMR Write
   Errors
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT ASIA-PACIFIC MAGNETIC RECORDING CONFERENCE (APMRC)
CY OCT 31-NOV 02, 2012
CL undefined, SINGAPORE
DE Binary-symmetric-channel; bit-patterned-media; channel models; write
   errors
ID BIT-PATTERNED-MEDIA
AB Write errors in bit-patterned-media-recording are a unique problem that may require nonconventional coding and signal processing techniques. Development of such advanced algorithms requires a simple yet accurate channel model to start with. In this paper, we analyze the various sources of write error in BPMR based hard drives and conduct write error characterization. The system parameters are either measured from current hard drives or set with realistic assumptions. A position dependent write error model is proposed based on these analyses which lead to a modified binary symmetric channel model for BPMR.
C1 [Zhang, Songhua; Cai, Kui; Qin, Zhiliang] ASTAR, Data Storage Inst, Singapore 117608, Singapore.
RP Zhang, SH (reprint author), ASTAR, Data Storage Inst, Singapore 117608, Singapore.
EM zhang_songhua@dsi.a-star.edu.sg
CR Cai K., 2010, P PMRC SEND JAP, V18aE-7
   Hu J, 2007, IEEE T MAGN, V43, P3517, DOI 10.1109/TMAG.2007.898307
   Lin M., 2012, J APPL PHYS, V111
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Zhang SH, 2010, IEEE T MAGN, V46, P1363, DOI 10.1109/TMAG.2010.2040713
NR 5
TC 1
Z9 1
U1 0
U2 1
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUN
PY 2013
VL 49
IS 6
BP 2582
EP 2585
DI 10.1109/TMAG.2013.2250265
PN 1
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 158NB
UT WOS:000319977400032
ER

PT J
AU Moon, W
   Im, S
AF Moon, Woosik
   Im, Sungbin
TI Performance of the Contraction Mapping-Based Iterative Two-Dimensional
   Equalizer for Bit-Patterned Media
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT ASIA-PACIFIC MAGNETIC RECORDING CONFERENCE (APMRC)
CY OCT 31-NOV 02, 2012
CL undefined, SINGAPORE
DE Bit-patterned media (BPM); contraction mapping; two-dimensional (2-D)
   equalizer
AB Bit-patterned media (BPM) storage is one of the promising technologies to overcome the limitations of the conventional magnetic recording. However, a high-density BPM storage has intertrack interference, intersymbol interference and noise, which severely degrade the system performance. In this paper, we present a simple iterative two-dimensional (2-D) equalizer based on the contraction mapping theorem to mitigate these adverse effects. In the simulation, we demonstrate the bit separation characteristics of the one-dimensional (1-D) and proposed 2-D equalizers and evaluate the bit-error-rate (BER) performance of the proposed equalizer comparing with the conventional equalizers. According to the simulation results, the proposed equalizer is a promising candidate with maintaining proper complexity for a high-density BPM storage.
C1 [Moon, Woosik; Im, Sungbin] Soongsil Univ, Sch Elect Engn, Seoul, South Korea.
RP Im, S (reprint author), Soongsil Univ, Sch Elect Engn, Seoul, South Korea.
EM sbi@ssu.ac.kr
FU National Research Foundation of Korea (NRF); Korea government (MEST)
   [2011-0012417]
FX This work was supported by the National Research Foundation of Korea
   (NRF) grant funded by the Korea government (MEST) (No. 2011-0012417).
CR HOLTZMAN JM, 1970, NONLINEAR SYSTEM THE
   Huang L, 2005, IEEE T CONSUM ELECTR, V51, P123, DOI 10.1109/TCE.2005.1405709
   Kim JW, 2009, JPN J APPL PHYS, V48, DOI 10.1143/JJAP.48.06FD14
   Kudekar S, 2011, 2011 IEEE INTERNATIONAL SYMPOSIUM ON INFORMATION THEORY PROCEEDINGS (ISIT), P2999, DOI 10.1109/ISIT.2011.6034129
   LU PL, 1994, IEEE T MAGN, V30, P4230, DOI 10.1109/20.334044
   MacKay DJC, 1997, ELECTRON LETT, V33, P457, DOI 10.1049/el:19970362
   Nabavi S, 2010, IEEE J SEL AREA COMM, V28, P135, DOI 10.1109/JSAC.2010.100202
   Nabavi S, 2008, IEEE T MAGN, V44, P3789, DOI 10.1109/TMAG.2008.2002387
   Naylor A. W., 1982, LINEAR OPERATOR THEO
   Nutter PW, 2005, IEEE T MAGN, V41, P3214, DOI 10.1109/TMAG.2005.854780
   Nutter PW, 2004, IEEE T MAGN, V40, P3551, DOI 10.1109/TMAG.2004.835697
   Wang S. X., 1999, MAGNETIC INFORM STOR
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
   Yamashita M, 2011, IEEE T MAGN, V47, P3558, DOI 10.1109/TMAG.2011.2157808
NR 14
TC 0
Z9 0
U1 0
U2 3
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUN
PY 2013
VL 49
IS 6
BP 2620
EP 2623
DI 10.1109/TMAG.2013.2253450
PN 1
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 158NB
UT WOS:000319977400040
ER

PT J
AU Koo, K
   Kim, SY
   Jeong, JJ
   Kim, SW
AF Koo, Keunhwi
   Kim, Soo-Yong
   Jeong, Jae Jin
   Kim, Sang Woo
TI Two-Dimensional Partial Response Maximum Likelihood at Rear for
   Bit-Patterned Media
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT ASIA-PACIFIC MAGNETIC RECORDING CONFERENCE (APMRC)
CY OCT 31-NOV 02, 2012
CL undefined, SINGAPORE
DE Bit-patterned media; equalizer; least mean square; partial response
   maximum likelihood; recursive least square; soft output Viterbi
   algorithm; two-dimensional interference
ID VITERBI ALGORITHM; STORAGE
AB Bit-patterned media (BPM) storage can have ultrahigh capacity, whereas the readback signal for the BPM storage is deteriorated by intersymbol interference in both the along-and across-track directions. As a detection method considering the two-dimensional (2D) interference, we propose a new structure of 2D partial response maximum likelihood (PRML) method based on a 2D partial response (PR) target and a 2D soft output Viterbi algorithm (SOVA) composed of two one-dimensional SOVAs. For the purpose of improving the bit error rate (BER) performance and reducing the computational complexity, the proposed method applies a 2D equalizer estimating the binary data recorded on the BPM instead of the output data of the 2D PR target. For this reason, the 2D PRML is located behind the 2D equalizer. Consequently, the proposed method has a superior BER performance as well as a low computational complexity. In addition, we carry out comparison of the BER performance in the 2D PRML according to the use of the least mean square and recursive least square algorithms in the 2D equalizer.
C1 [Koo, Keunhwi; Kim, Soo-Yong; Jeong, Jae Jin; Kim, Sang Woo] Pohang Univ Sci & Technol, Dept Elect Engn, Pohang 790784, Gyeongbuk, South Korea.
   [Kim, Soo-Yong] Samsung Elect Co Ltd, Emerging SOC Grp, Semicond Div, Yongin 446711, Gyeonggi, South Korea.
   [Kim, Sang Woo] Pohang Univ Sci & Technol, Dept Creat IT Excellence Engn, Pohang 790784, Gyeongbuk, South Korea.
   [Kim, Sang Woo] Pohang Univ Sci & Technol, Future IT Innovat Lab, Pohang 790784, Gyeongbuk, South Korea.
RP Kim, SW (reprint author), Pohang Univ Sci & Technol, Dept Elect Engn, Pohang 790784, Gyeongbuk, South Korea.
EM swkim@postech.edu
FU Ministry of Knowledge Economy (MKE), Korea, under the IT Consilience
   Creative Program [C1515-1121-0003]
FX This work was supported by the Ministry of Knowledge Economy (MKE),
   Korea, under the IT Consilience Creative Program supervised by the
   National IT Industry Promotion Agency (NIPA) (C1515-1121-0003).
CR Karakulak S, 2008, IEEE T MAGN, V44, P193, DOI 10.1109/TMAG.2007.912837
   Keskinoz M, 2008, IEEE T MAGN, V44, P533, DOI 10.1109/TMAG.2007.914966
   Kim J., 2011, J APPL PHYS, V109
   Kim JB, 2010, JPN J APPL PHYS, V49, DOI 10.1143/JJAP.49.042102
   Kim J, 2011, IEEE T MAGN, V47, P594, DOI 10.1109/TMAG.2010.2100371
   Kim JW, 2009, JPN J APPL PHYS, V48, DOI 10.1143/JJAP.48.06FD14
   Koo K., 2012, P APMRC 2012 OCT, pBQ
   Koo K, 2012, JPN J APPL PHYS, V51, DOI 10.1143/JJAP.51.08JB03
   Lee K., 2009, SUBBAND ADAPTIVE FIL, P1
   Myint L., 2009, IEEE T MAGN, V45, P2274
   Nabavi S, 2007, IEEE ICC, P6249, DOI 10.1109/ICC.2007.1035
   Nabavi S, 2007, IEEE T MAGN, V43, P2274, DOI 10.1109/TMAG.2007.893479
   Ng Y, 2009, IEEE T MAGN, V45, P3535, DOI 10.1109/TMAG.2009.2024427
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
NR 14
TC 1
Z9 1
U1 0
U2 1
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUN
PY 2013
VL 49
IS 6
BP 2744
EP 2747
DI 10.1109/TMAG.2013.2251615
PN 1
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 158NB
UT WOS:000319977400063
ER

PT J
AU Futamoto, M
   Hagami, T
   Ishihara, S
   Soneta, K
   Ohtake, M
AF Futamoto, Masaaki
   Hagami, Tatsuya
   Ishihara, Shinji
   Soneta, Kazuki
   Ohtake, Mitsuru
TI Improvement of Magnetic Force Microscope Resolution and Application to
   High-Density Recording Media
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT ASIA-PACIFIC MAGNETIC RECORDING CONFERENCE (APMRC)
CY OCT 31-NOV 02, 2012
CL undefined, SINGAPORE
DE Magnetic force microscope; magnetic material coating; spatial
   resolution; switching field; tip preparation
ID TIPS; PROBE
AB Magnetic force microscope (MFM) tips are prepared by coating magnetic materials on nonmagnetic Si tips with 4 nm radius. The effects of magnetic material and coating thickness on the MFM resolution and the switching field are investigated. MFM resolutions better than 8 nm have been confirmed with tips coated with soft magnetic or hard magnetic materials with optimized thicknesses. The switching field varies in a wide range 0.1-3.0 kOe depending on the coating material and the coating thickness (10-80 nm). High-resolution MFM tips are applied to the observations of magnetization structures of perpendicular and bit-patterned media samples. Magnetization structures of less than 20 nm in scale are clearly observed.
C1 [Futamoto, Masaaki; Hagami, Tatsuya; Ishihara, Shinji; Soneta, Kazuki; Ohtake, Mitsuru] Chuo Univ, Fac Sci & Engn, Bunkyo Ku, Tokyo 1128551, Japan.
RP Futamoto, M (reprint author), Chuo Univ, Fac Sci & Engn, Bunkyo Ku, Tokyo 1128551, Japan.
EM futamoto@elect.chuo-u.ac.jp
FU METI; JSPS, Japan [22560302]
FX A part of this work was supported by METI and the Grant-in-Aid for
   Scientific Research (22560302) from JSPS, Japan. The authors would like
   to thank Ms. Noriko Saidoh of RIMCOF for SEM observation.
CR Abelmann L, 1998, J MAGN MAGN MATER, V190, P135, DOI 10.1016/S0304-8853(98)00281-9
   Amos N, 2009, J APPL PHYS, V105, DOI 10.1063/1.3068625
   Deng ZF, 2004, APPL PHYS LETT, V85, P6263, DOI 10.1063/1.1842374
   Folks L, 2000, APPL PHYS LETT, V76, P909, DOI 10.1063/1.125626
   Folks L, 1998, J MAGN MAGN MATER, V190, P28, DOI 10.1016/S0304-8853(98)00272-8
   Gao L, 2004, IEEE T MAGN, V40, P2194, DOI 10.1109/TMAG.2004.829173
   Han G, 2007, JPN J APPL PHYS 1, V46, P4403, DOI 10.1143/JJAP.46.4403
   Ishihara S., 2013, J MAGN SOC JPN, V37, P255
   Jumpertz R, 1997, MICROELECTRON ENG, V35, P325, DOI 10.1016/S0167-9317(96)00133-5
   Koblischka MR, 2003, ULTRAMICROSCOPY, V97, P103, DOI 10.1016/S0304-3991(03)00034-2
   Kuramochi H, 2005, JPN J APPL PHYS 1, V44, P2077, DOI 10.1143/JJAP.44.2077
   Litvinov D, 2002, APPL PHYS LETT, V81, P1878, DOI 10.1063/1.1506008
   Liu ZY, 2002, J APPL PHYS, V91, P8843, DOI 10.1063/1.1456056
   Nagano K., 2011, J PHYS C SER, V303
   Nagano K., 2012, J MAGN SOC JPN, V36, P109
   Nishiyama N, 2011, J ALLOY COMPD, V509, pS145, DOI 10.1016/j.jallcom.2010.12.020
   Ohtake M, 2012, J APPL PHYS, V111
   Phillips GN, 2002, APPL PHYS LETT, V81, P865, DOI 10.1063/1.1497434
   Porthun S, 1998, J MAGN MAGN MATER, V182, P238, DOI 10.1016/S0304-8853(97)01010-X
   Porthun S, 1998, APPL PHYS A-MATER, V66, pS1185, DOI 10.1007/s003390051323
   Saito H, 2005, IEEE T MAGN, V41, P4394, DOI 10.1109/TMAG.2005.859891
   Suzuki D., 2012, J MAGN SOC JPN, V36, P336
   Takenaka K, 2012, J MAGN MAGN MATER, V324, P1444, DOI 10.1016/j.jmmm.2011.12.009
   Yabuhara O, 2011, THIN SOLID FILMS, V519, P8359, DOI 10.1016/j.tsf.2011.03.082
   Yoshida N, 2002, JPN J APPL PHYS 1, V41, P5013, DOI 10.1143/JJAP.41.5013
   Yuan JF, 2008, J MAGN MAGN MATER, V320, P736, DOI 10.1016/j.jmmm.2007.08.023
NR 26
TC 3
Z9 3
U1 1
U2 26
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUN
PY 2013
VL 49
IS 6
BP 2748
EP 2754
DI 10.1109/TMAG.2013.2251868
PN 1
PG 7
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 158NB
UT WOS:000319977400064
ER

PT J
AU Kong, LJ
   Guan, YL
   Zheng, JP
   Han, GJ
   Cai, K
   Chan, KS
AF Kong, Lingjun
   Guan, Yong Liang
   Zheng, Jianping
   Han, Guojun
   Cai, Kui
   Chan, Kheong-Sann
TI EXIT-Chart-Based LDPC Code Design for 2D ISI Channels
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT ASIA-PACIFIC MAGNETIC RECORDING CONFERENCE (APMRC)
CY OCT 31-NOV 02, 2012
CL undefined, SINGAPORE
DE Extrinsic information transfer (EXIT) chart; low-density parity-check
   (LDPC) codes; symmetric information rate (SIR); two-dimensional (2D)
   intersymbol interference (ISI) channels
ID PARTIAL-RESPONSE CHANNELS; PARITY-CHECK CODES; MEDIA; EQUALIZATION
AB In this paper, optimization of low-density parity-check (LDPC) codes to approach the symmetric information rate (SIR) of two-dimensional (2-D) intersymbol interference (ISI) channels is proposed for high-density magnetic recording, such as bit-patterned magnetic recording (BPMR) and 2-D magnetic recording (TDMR). The code design makes use of the modified Extrinsic Information Transfer (EXIT) chart, where the optimal variable node degree is searched by selecting the best check node degree to fit the check node decoder (CND) EXIT curve to the EXIT curve of the variable node decoder (VND) curve combined with 2-D detector. Simulation results show that LDPC codes with code length 10(4) bits optimized for a 2-D ISI channel corresponding to 4 Tb/in(2) recording density can achieve bit error rate 10(-5) at signal-to-noise ratio 0.33 dB away from the SIR. To our knowledge, this is the first capacity-approaching LDPC code successfully optimized for a 2-D ISI channel.
C1 [Kong, Lingjun; Guan, Yong Liang; Han, Guojun] Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore.
   [Zheng, Jianping] Xidian Univ, State Key Lab Integrated Serv Networks, Xian 710071, Peoples R China.
   [Cai, Kui; Chan, Kheong-Sann] ASTAR, DSI, Singapore 117608, Singapore.
RP Kong, L (reprint author), Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore.
EM ljkong@ntu.edu.sg
RI han, guojun/H-5968-2012; Guan, Yong/A-5090-2011
OI Guan, Yong/0000-0002-9757-630X
FU AstarSTAR Singapore [SERC0921560129]; NSFC [61201140]
FX This work was supported by A star STAR Singapore under Grant
   SERC0921560129. The work of J. Zheng was supported by the NSFC under
   Grant 61201140.
CR BAHL LR, 1974, IEEE T INFORM THEORY, V20, P284, DOI 10.1109/TIT.1974.1055186
   Karakulak S, 2010, IEEE T MAGN, V46, P3639, DOI 10.1109/TMAG.2010.2049116
   Kavcic A, 2003, IEEE T INFORM THEORY, V49, P1636, DOI 10.1109/TIT.2003.813563
   Luby MG, 2001, IEEE T INFORM THEORY, V47, P585, DOI 10.1109/18.910576
   Ng Y, 2009, IEEE T MAGN, V45, P3535, DOI 10.1109/TMAG.2009.2024427
   Shental O, 2008, IEEE T INFORM THEORY, V54, P1500, DOI 10.1109/TIT.2008.917638
   Song HW, 2003, IEEE T MAGN, V39, P2552, DOI 10.1109/TMAG.2003.816475
   ten Brink S, 2004, IEEE T COMMUN, V52, P670, DOI 10.1109/TCOMM.2004.826370
   Thangaraj A, 2002, IEEE T MAGN, V38, P2307, DOI 10.1109/TMAG.2002.801875
   Varnica N, 2003, IEEE COMMUN LETT, V7, P168, DOI 10.1109/LCOMM.2003.810000
   Wood R, 2009, IEEE T MAGN, V45, P917, DOI 10.1109/TMAG.2008.2010676
   Zhang S. H., 2008, P INT 2008 MAY, P1516
NR 12
TC 16
Z9 16
U1 0
U2 9
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUN
PY 2013
VL 49
IS 6
BP 2823
EP 2826
DI 10.1109/TMAG.2013.2248351
PN 1
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 158NB
UT WOS:000319977400077
ER

PT J
AU Lee, B
   Hong, JM
   Amos, N
   Dumer, I
   Litvinov, D
   Khizroev, S
AF Lee, Beomseop
   Hong, Jeongmin
   Amos, Nissim
   Dumer, Ilya
   Litvinov, Dmitri
   Khizroev, Sakhrat
TI Sub-10-nm-resolution electron-beam lithography toward very-high-density
   multilevel 3D nano-magnetic information devices
SO JOURNAL OF NANOPARTICLE RESEARCH
LA English
DT Article
DE Optimal lithography; Bit-patterned-media; Electron-beam lithography;
   Magnetoelectronic devices
ID BIT-PATTERNED MEDIA; RECORDING MEDIA; FABRICATION; STORAGE; LIMITS
AB We report a study on the optimization of ultra-high-resolution electron-beam lithography for nanoscale patterning with two separate lift-off processes using positive and negative resists; the optimized method is suitable for the emerging area of nano-magnetoelectronics. If used together, these high-aspect-ratio processes can achieve information cells with a diameter of 9 nm, a square pitch of 26 nm, and an etch depth of at least 50 nm, as required for recording densities greater than 3 Tbit/in(2), provided that 3D integration includes between 2 and 8 independent magnetic bits. Such effective patterning can be used to further develop magnetic bits packed for ultra-high-density disk recording and the emerging field of magnetic tunneling junctions for logic and memory applications.
C1 [Lee, Beomseop; Amos, Nissim; Dumer, Ilya; Khizroev, Sakhrat] Univ Calif Riverside, Riverside, CA 92521 USA.
   [Hong, Jeongmin] Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA.
   [Litvinov, Dmitri] Univ Houston, Houston, TX 77204 USA.
   [Khizroev, Sakhrat] Florida Int Univ, Miami, FL 33174 USA.
RP Hong, JM (reprint author), Univ Calif Berkeley, Dept Elect Engn & Comp Sci, 550 Sutardja Dai Hall, Berkeley, CA 94720 USA.
EM hong@eecs.berkeley.edu
FU National Science Foundation (NSF) [005084-002]; DARPA/Defense
   Microelectronics Activity (DMEA) [H94003-09-2-0904]
FX This material is based on research co-sponsored by the National Science
   Foundation (NSF) under contract 005084-002 and DARPA/Defense
   Microelectronics Activity (DMEA) under agreement number
   H94003-09-2-0904.
CR Allwood DA, 2005, SCIENCE, V309, P1688, DOI 10.1126/science.1108813
   Amos N, 2012, PLOS ONE, V7, DOI 10.1371/journal.pone.0040134
   Amos N, 2010, IEEE MAGN LETT, V1, DOI 10.1109/LMAG.2010.2050679
   Chow SY, 1996, SCIENCE, V272, P85
   Grigorescu AE, 2009, NANOTECHNOLOGY, V20, DOI 10.1088/0957-4484/20/29/292001
   Hamann HF, 2004, APPL PHYS LETT, V84, P810, DOI 10.1063/1.1644924
   Hong JM, 2011, SMALL, V7, P1175, DOI 10.1002/smll.201002244
   Ikkawi R, 2007, APPL PHYS LETT, V91, DOI 10.1063/1.2799239
   Khizroev SK, 1998, IEEE T MAGN, V34, P2030, DOI 10.1109/20.706782
   Kikitsu A, 2009, J MAGN MAGN MATER, V321, P526, DOI 10.1016/j.jmmm.2008.05.039
   Kryder MH, 2005, J MAGN MAGN MATER, V287, P449, DOI 10.1016/j.jmmm.2004.10.075
   Litvinov D, 2008, IEEE T NANOTECHNOL, V7, P463, DOI 10.1109/TNANO.2008.920183
   Moritz J, 2011, J APPL PHYS, V109, DOI 10.1063/1.3572259
   Nagahara K, 2003, JPN J APPL PHYS 2, V42, pL499, DOI 10.1143/JJAP.42.L499
   Parekh V, 2007, P 7 IEEE NANO, P632
   Peng QZ, 1997, J APPL PHYS, V81, P4384, DOI 10.1063/1.364832
   Richter HJ, 2009, J MAGN MAGN MATER, V321, P467, DOI 10.1016/j.jmmm.2008.04.161
   Ross C, 2001, ANN REV MATER RES, V31, P203, DOI 10.1146/annurev.matsci.31.1.203
   Ross CA, 1999, J VAC SCI TECHNOL B, V17, P3168, DOI 10.1116/1.590974
   Rottmayer RE, 2006, IEEE T MAGN, V42, P2417, DOI 10.1109/TMAG.2006.879572
   Safonov VL, 2001, IEEE T MAGN, V37, P1550, DOI 10.1109/20.950897
   Terris BD, 2007, MICROSYST TECHNOL, V13, P189, DOI 10.1007/s00542-006-0144-9
   White RL, 2000, J MAGN MAGN MATER, V209, P1, DOI 10.1016/S0304-8853(99)00632-0
   Wood R, 2009, J MAGN MAGN MATER, V321, P555, DOI 10.1016/j.jmmm.2008.07.027
   Yang JKW, 2011, NANOTECHNOLOGY, V22, DOI 10.1088/0957-4484/22/38/385301
   Yang JKW, 2009, J VAC SCI TECHNOL B, V27, P2622, DOI 10.1116/1.3253652
   Yang X, 2007, J VAC SCI TECHNOL B, V25, P2202, DOI 10.1116/1.2798711
   Zhu JG, 2008, IEEE T MAGN, V44, P125, DOI 10.1109/TMAG.2007.911031
NR 28
TC 5
Z9 5
U1 3
U2 37
PU SPRINGER
PI DORDRECHT
PA VAN GODEWIJCKSTRAAT 30, 3311 GZ DORDRECHT, NETHERLANDS
SN 1388-0764
J9 J NANOPART RES
JI J. Nanopart. Res.
PD JUN
PY 2013
VL 15
IS 6
AR 1665
DI 10.1007/s11051-013-1665-7
PG 8
WC Chemistry, Multidisciplinary; Nanoscience & Nanotechnology; Materials
   Science, Multidisciplinary
SC Chemistry; Science & Technology - Other Topics; Materials Science
GA 152FM
UT WOS:000319516400008
ER

PT J
AU Gaur, N
   Kundu, S
   Piramanayagam, SN
   Maurer, SL
   Tan, HK
   Wong, SK
   Steen, SE
   Yang, H
   Bhatia, CS
AF Gaur, N.
   Kundu, S.
   Piramanayagam, S. N.
   Maurer, S. L.
   Tan, H. K.
   Wong, S. K.
   Steen, S. E.
   Yang, H.
   Bhatia, C. S.
TI Lateral displacement induced disorder in L1(0)-FePt nanostructures by
   ion-implantation
SO SCIENTIFIC REPORTS
LA English
DT Article
ID THIN-FILMS; RECORDING MEDIA; MAGNETIC MEDIA; IRRADIATION; ANISOTROPY
AB Ion implantation is a promising technique for fabricating high density bit patterned media (BPM) as it may eliminate the requirement of disk planarization. However, there has not been any notable study on the impact of implantation on BPM fabrication of FePt, particularly at nano-scale, where the lateral straggle of implanted ions may become comparable to the feature size. In this work, implantation of antimony ions in patterned and unpatterned L1(0)-FePt thin films has been investigated. Unpatterned films implanted with high fluence of antimony exhibited reduced out-of-plane coercivity and change of magnetic anisotropy from perpendicular direction to film-plane. Interestingly, for samples implanted through patterned masks, the perpendicular anisotropy in the unimplanted region was also lost. This noteworthy observation can be attributed to the displacement of Fe and Pt atoms from the implantation sites to the unimplanted areas, thereby causing a phase disorder transformation from L1(0) to A1 FePt.
C1 [Gaur, N.; Kundu, S.; Yang, H.; Bhatia, C. S.] Natl Univ Singapore, Dept Elect & Comp Engn, Singapore 117576, Singapore.
   [Gaur, N.; Piramanayagam, S. N.; Tan, H. K.; Wong, S. K.] ASTAR, Data Storage Inst, Singapore 117608, Singapore.
   [Maurer, S. L.; Steen, S. E.] IBM Corp, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA.
RP Bhatia, CS (reprint author), Natl Univ Singapore, Dept Elect & Comp Engn, Singapore 117576, Singapore.
EM elebcs@nus.edu.sg
RI Piramanayagam, SN/A-4192-2008; Yang, Hyunsoo/F-5149-2010
OI Piramanayagam, SN/0000-0002-3178-2960; Yang, Hyunsoo/0000-0003-0907-2898
FU Singapore NRF under CRP Award [NRF-CRP 4-2008-06]
FX This work is partially supported by Singapore NRF under CRP Award No.
   NRF-CRP 4-2008-06. The work has been done under the NUS and IBM joint
   study agreement #W0853529. The authors thank A.W.C. Poh and M. Ranjbar
   for their assistance.
CR Aoyama T, 2005, J MAGN MAGN MATER, V287, P209, DOI 10.1016/j.jmmm.2004.10.033
   Barmak K, 2004, J APPL PHYS, V95, P7501, DOI 10.1063/1.1667856
   Chappert C, 1998, SCIENCE, V280, P1919, DOI 10.1126/science.280.5371.1919
   Chong TC, 2011, J NANOSCI NANOTECHNO, V11, P2704, DOI 10.1166/jnn.2011.2738
   COFFEY KR, 1995, IEEE T MAGN, V31, P2737, DOI 10.1109/20.490108
   Ferre J, 1999, J MAGN MAGN MATER, V198-99, P191, DOI 10.1016/S0304-8853(98)01084-1
   Gaur N., 2011, J APPL PHYS, V110
   Gaur N., 2011, J PHYS D, V44
   Gaur N, 2012, IEEE T MAGN, V48, P2753, DOI 10.1109/TMAG.2012.2201457
   Hellwig O., 2010, APPL PHYS LETT, V96
   Hinoue T., 2012, J APPL PHYS, V111
   Hinoue T., 2011, J APPL PHYS, V109
   Klemmer TJ, 2003, J MAGN MAGN MATER, V266, P79, DOI 10.1016/S0304-8853(03)00458-X
   Kurth F, 2010, PHYS REV B, V82, DOI 10.1103/PhysRevB.82.184404
   McCord J., 2009, J PHYS D, V42
   Pandey K. K. M., 2008, J APPL PHYS, V104
   Piramanayagam S. N., 2010, IEEE T MAGN, V46, P759
   Poh A. W. C., 2010, J VAC SCI TECHNOL B, V28, P806
   Rettner CT, 2002, APPL PHYS LETT, V80, P279, DOI 10.1063/1.1432108
   Revelsona D., 2002, J APPL PHYS, V91, P8082
   Sato K., 2010, J APPL PHYS, V107
   Sbiaa R, 2009, IEEE T MAGN, V45, P828, DOI 10.1109/TMAG.2008.2010644
   Sbiaa R., 2009, J APPL PHYS, V105
   Shibata K, 2003, MATER TRANS, V44, P1542, DOI 10.2320/matertrans.44.1542
   Tan EL, 2009, J VAC SCI TECHNOL B, V27, P2259, DOI 10.1116/1.3225597
   Terris BD, 2000, J APPL PHYS, V87, P7004, DOI 10.1063/1.372912
   Thiele JU, 1998, J APPL PHYS, V84, P5686, DOI 10.1063/1.368831
   VELU EMT, 1991, J APPL PHYS, V69, P5175, DOI 10.1063/1.348118
   Weller D, 2000, IEEE T MAGN, V36, P10, DOI 10.1109/20.824418
NR 29
TC 7
Z9 7
U1 0
U2 41
PU NATURE PUBLISHING GROUP
PI LONDON
PA MACMILLAN BUILDING, 4 CRINAN ST, LONDON N1 9XW, ENGLAND
SN 2045-2322
J9 SCI REP-UK
JI Sci Rep
PD MAY 28
PY 2013
VL 3
AR 1907
DI 10.1038/srep01907
PG 7
WC Multidisciplinary Sciences
SC Science & Technology - Other Topics
GA 151YR
UT WOS:000319496800001
PM 23712784
ER

PT J
AU Neumann, A
   Thonnissen, C
   Frauen, A
   Hesse, S
   Meyer, A
   Oepen, HP
AF Neumann, Alexander
   Thonnissen, Carsten
   Frauen, Axel
   Hesse, Simon
   Meyer, Andreas
   Oepen, Hans Peter
TI Probing the Magnetic Behavior of Single Nanodots
SO NANO LETTERS
LA English
DT Article
DE Magnetic nanostructure; magnetic nanoparticles; magnetic reversal; bit
   patterned media; anomalous Hall-Effect; nanosphere lithography
ID MEDIA
AB In this paper, a method is presented that has the sensitivity to measure magnetization behavior of single nanostructures. It is demonstrated that the technique gives the ability to separate different signals of single nanodots from a small ensemble of structures. Our method is based on the anomalous Hall-Effect and allows for resolving signals from spherical nanoparticles with diameter down to 3.5 nm. The method gives access to magnetic properties of particles in a wide thermal and dynamical range. The potential of the technique is demonstrated utilizing particles that are created from Co films sandwiched by Pt layers.
C1 [Neumann, Alexander; Thonnissen, Carsten; Frauen, Axel; Hesse, Simon; Oepen, Hans Peter] Univ Hamburg, Inst Angew Phys, D-20355 Hamburg, Germany.
   [Meyer, Andreas] Univ Hamburg, Inst Phys Chem, D-20146 Hamburg, Germany.
RP Neumann, A (reprint author), Univ Hamburg, Inst Angew Phys, Jungiusstr 11, D-20355 Hamburg, Germany.
EM aneumann@physnet.uni-hamburg.de
FU DFG [SFB668]; Free and Hanseatic City of Hamburg via
   Landesexzellenzinitative "Nanospintronics"
FX We thank A. Kobs and R. Froemter for numerous helpful discussions. We
   are grateful to A. Kobs for critical reading of the manuscript.
   Financial support by the DFG via SFB668 and the Free and Hanseatic City
   of Hamburg via Landesexzellenzinitative "Nanospintronics" is gratefully
   Acknowledged
CR Alexandrou M, 2010, J APPL PHYS, V108, DOI 10.1063/1.3475485
   Bean C.P., 1959, Journal of Applied Physics, V30, p120S, DOI 10.1063/1.2185850
   Breth L, 2012, J APPL PHYS, V112, DOI 10.1063/1.4737413
   Cornelissens YG, 2002, J APPL PHYS, V92, P2006, DOI 10.1063/1.1487909
   Engelen JBC, 2010, NANOTECHNOLOGY, V21, DOI 10.1088/0957-4484/21/3/035703
   Fromsdorf A, 2007, SMALL, V3, P880, DOI 10.1002/smll.200600706
   Hellwig O, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3293301
   Hopster H., 2005, MAGNETIC MICROSCOPY
   Hurd CM, 1972, HALL EFFECT METALS A
   Kikitsu A, 2009, J MAGN MAGN MATER, V321, P526, DOI 10.1016/j.jmmm.2008.05.039
   Kikuchi N, 2003, APPL PHYS LETT, V82, P4313, DOI 10.1063/1.1580994
   KIKUCHI N, 2005, J APPL PHYS, V97
   Kronmuller H., 2007, HDB MAGNETISM ADV MA, V3
   Neel L., 1949, ANN GEOPHYS, V5, P99
   Neumann A., 2012, OPEN SURF SCI J, V4, P55
   Ross C, 2001, ANN REV MATER RES, V31, P203, DOI 10.1146/annurev.matsci.31.1.203
   Shimatsu T., 2012, J APPL PHYS, V111
   Stillrich H, 2008, ADV FUNCT MATER, V18, P76, DOI 10.1002/adfm.200700444
   WEBB BC, 1988, IEEE T MAGN, V24, P3006, DOI 10.1109/20.92316
   Wernsdorfer W, 1995, J APPL PHYS, V78, P7192, DOI 10.1063/1.360429
   Wernsdorfer W, 2009, SUPERCOND SCI TECH, V22, DOI 10.1088/0953-2048/22/6/064013
NR 21
TC 10
Z9 10
U1 0
U2 35
PU AMER CHEMICAL SOC
PI WASHINGTON
PA 1155 16TH ST, NW, WASHINGTON, DC 20036 USA
SN 1530-6984
J9 NANO LETT
JI Nano Lett.
PD MAY
PY 2013
VL 13
IS 5
BP 2199
EP 2203
DI 10.1021/nl400728r
PG 5
WC Chemistry, Multidisciplinary; Chemistry, Physical; Nanoscience &
   Nanotechnology; Materials Science, Multidisciplinary; Physics, Applied;
   Physics, Condensed Matter
SC Chemistry; Science & Technology - Other Topics; Materials Science;
   Physics
GA 143TZ
UT WOS:000318892400052
PM 23557292
ER

PT J
AU Jiao, XP
   Mu, JJ
   Sun, R
AF Jiao, Xiaopeng
   Mu, Jianjun
   Sun, Rong
TI Iterative Decoding for the Davey-MacKay Construction over IDS-AWGN
   Channel
SO IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND
   COMPUTER SCIENCES
LA English
DT Article
DE Davey-MacKay (DM) construction; deletion errors; low-density
   parity-check codes; insertion errors; turbo equalization
ID BIT-PATTERNED MEDIA; CODES; INSERTIONS; DELETIONS; SYNCHRONIZATION;
   ERRORS
AB Turbo equalization is an iterative equalization and decoding technique that can achieve impressive performance gains for communication systems. In this letter, we investigate the turbo equalization method for the decoding of the Davey-MacKay (DM) construction over the IDS-AWGN channels, which indicates a cascaded insertion, deletion, substitution (IDS) channel and an additive white Gaussian noise (AWGN) channel. The inner decoder for the DM construction can be seen as an maximum a-posteriori (MAP) detector. it receives the beliefs generated by the outer LDPC decoder when turbo equalization is used. Two decoding schemes with different kinds of inner decoders, namely hard-input inner decoder and soft-input inner decoder, are investigated. Simulation results show that significant performance gains are obtained for both decoders with respect to the insertion/deletion probability at different SNR values.
C1 [Jiao, Xiaopeng; Mu, Jianjun] Xidian Univ, Sch Comp Sci & Technol, Xian 710071, Peoples R China.
   [Sun, Rong] Xidian Univ, State Key Lab Integrated Serv Networks, Xian 710071, Peoples R China.
RP Jiao, XP (reprint author), Xidian Univ, Sch Comp Sci & Technol, Xian 710071, Peoples R China.
EM jiaozi1216@126.com
FU National Nature Science Foundation of China [61001132, 61271004,
   61001131]; Fundamental Research Funds for the Central Universities
FX This research is supported by the National Nature Science Foundation of
   China (Grant Nos. 61001132, 61271004 and 61001131) and the Fundamental
   Research Funds for the Central Universities.
CR BAHL LR, 1974, IEEE T INFORM THEORY, V20, P284, DOI 10.1109/TIT.1974.1055186
   Briffa J., 2010, P IEEE INT C COMM CA, P1
   Coumou DJ, 2008, IEEE T INF FOREN SEC, V3, P153, DOI 10.1109/TIFS.2008.920728
   Davey MC, 2001, IEEE T INFORM THEORY, V47, P687, DOI 10.1109/18.910582
   Diggavi S, 2006, IEEE T INFORM THEORY, V52, P1226, DOI 10.1109/TIT.2005.864445
   Hu J, 2007, IEEE T MAGN, V43, P3517, DOI 10.1109/TMAG.2007.898307
   Hu J, 2010, IEEE T COMMUN, V58, P1102, DOI 10.1109/TCOMM.2010.04.080683
   Iyengar AR, 2009, ANN ALLERTON CONF, P620, DOI 10.1109/ALLERTON.2009.5394916
   Jiao X., 2011, P IEEE INT S INF THE, P747
   Jiao XP, 2012, IEEE COMMUN LETT, V16, P722, DOI 10.1109/LCOMM.2012.032612.112621
   Koetter R, 2004, IEEE SIGNAL PROC MAG, V21, P67, DOI 10.1109/MSP.2004.1267050
   Ng YB, 2010, IEEE T MAGN, V46, P2268, DOI 10.1109/TMAG.2010.2043926
   Ratzer EA, 2005, ANN TELECOMMUN, V60, P29
   Schulman LJ, 1999, IEEE T INFORM THEORY, V45, P2552, DOI 10.1109/18.796406
   Wang F, 2011, IEEE T COMMUN, V59, P1287, DOI 10.1109/TCOMM.2011.030411.100546
   Wymeersch H., 2004, P IEEE INT C COMM, V2, P772
NR 16
TC 0
Z9 0
U1 0
U2 5
PU IEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG
PI TOKYO
PA KIKAI-SHINKO-KAIKAN BLDG, 3-5-8, SHIBA-KOEN, MINATO-KU, TOKYO, 105-0011,
   JAPAN
SN 0916-8508
EI 1745-1337
J9 IEICE T FUND ELECTR
JI IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
PD MAY
PY 2013
VL E96A
IS 5
BP 1006
EP 1009
DI 10.1587/transfun.E96.A.1006
PG 4
WC Computer Science, Hardware & Architecture; Computer Science, Information
   Systems; Engineering, Electrical & Electronic
SC Computer Science; Engineering
GA 146IU
UT WOS:000319085600024
ER

PT J
AU Saharan, L
   Morrison, C
   Ikeda, Y
   Takano, K
   Miles, JJ
   Thomson, T
   Schrefl, T
   Hrkac, G
AF Saharan, L.
   Morrison, C.
   Ikeda, Y.
   Takano, K.
   Miles, J. J.
   Thomson, T.
   Schrefl, T.
   Hrkac, G.
TI Grain boundaries in granular materials-A fundamental limit for thermal
   stability
SO APPLIED PHYSICS LETTERS
LA English
DT Article
AB We show that thermal-stability and the associated switching field in well segregated, nanoscale granular materials is explained by grain boundary and interface effects. Grain boundaries pose a fundamental limit on scaling rooted in their chemical and morphological structure, while exchange interactions across interfaces cause the switching to deviate from the expected coherent Stoner-Wohlfarth behaviour. Measurements and simulations of CoCrPt-systems show a clear shift in applied field angle behaviour, arising from exchange-coupling between magnetic-phases, while the quantitative switching field can only be explained by a transition layer surrounding the grains. These results are potentially significant for Heat-Assisted-Magnetic Recording and Bit-Patterned-Media Recording. (C) 2013 AIP Publishing LLC.
C1 [Saharan, L.; Hrkac, G.] Univ Sheffield, Dept Mat Engn, Sheffield S1 3JD, S Yorkshire, England.
   [Morrison, C.; Miles, J. J.; Thomson, T.] Univ Manchester, Sch Comp Sci, Manchester M13 9PL, Lancs, England.
   [Ikeda, Y.; Takano, K.] HGST, San Jose Res Ctr, San Jose, CA 95135 USA.
   [Schrefl, T.] St Polten Univ Appl Sci, A-3100 St Polten, Austria.
   [Hrkac, G.] Univ Exeter, Coll Engn Math & Phys Sci, Exeter EX4 4QJ, Devon, England.
RP Saharan, L (reprint author), Univ Sheffield, Dept Mat Engn, Sheffield S1 3JD, S Yorkshire, England.
OI Morrison, Christopher/0000-0002-2709-9982; Hrkac,
   Gino/0000-0001-7284-135X; Thomson, Thomas/0000-0002-4110-1567
FU EPSRC [EP/G032440/1, EP/G032300/1]; WWTF [MA09-029]; Royal Society
FX We would like to thank the EPSRC for financial support under Grants No.
   EP/G032440/1, EP/G032300/1, the WWTF Project MA09-029 and the Royal
   Society.
CR Dittrich R, 2005, IEEE T MAGN, V41, P3592, DOI 10.1109/TMAG.2005.854736
   Dittrich R., 2002, J MAGN MAGN MATER, V250, P12, DOI 10.1016/S0304-8853(02)00388-8
   Hrkac G, 2010, APPL PHYS LETT, V97, DOI 10.1063/1.3519906
   Kondorsky E, 1940, J PHYS-USSR, V2, P161
   KRONMULLER H, 1978, J MAGN MAGN MATER, V7, P341, DOI 10.1016/0304-8853(78)90217-2
   Lister S J, 2009, Journal of Applied Physics, V106, DOI 10.1063/1.3213381
   Matsuura M, 2009, J APPL PHYS, V105
   Morrison C, 2011, APPL PHYS LETT, V99, DOI 10.1063/1.3644469
   Saharan L, 2011, J APPL PHYS, V110, DOI 10.1063/1.3662919
   Schrefl T, 2003, TOP APPL PHYS, V87, P1
   Schrefl T., 2007, HDB MAGNETISM ADV MA, V2, P765
   Shinba Y, 2005, J APPL PHYS, V97, DOI 10.1063/1.1851017
   STONER EC, 1948, PHILOS TR R SOC S-A, V240, P599, DOI 10.1098/rsta.1948.0007
   Suess D, 2011, PHYS REV B, V84, DOI 10.1103/PhysRevB.84.224421
   Thomson T., 2008, J APPL PHYS, V103
   Victora RH, 2005, IEEE T MAGN, V41, P2828, DOI 10.1109/TMAG.2005.855263
NR 16
TC 5
Z9 5
U1 1
U2 29
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0003-6951
J9 APPL PHYS LETT
JI Appl. Phys. Lett.
PD APR 8
PY 2013
VL 102
IS 14
AR 142402
DI 10.1063/1.4801316
PG 4
WC Physics, Applied
SC Physics
GA 135DZ
UT WOS:000318268800048
ER

PT J
AU de Oliveira, GN
   Oliveira, ME
   dos Santos, PAM
AF de Oliveira, G. N.
   Oliveira, M. E.
   dos Santos, P. A. M.
TI Photorefractive holographic moire-like patterns for secure numerical
   code generation
SO OPTICS LETTERS
LA English
DT Article
AB In this Letter, low-frequency photorefractive holographic moire fringe patterns are proposed as secure numerical code generators that could be useful for storage or data transmission. These dynamic moire patterns are holographically obtained by the superposition of two or more sinusoidal gratings with slightly different pitches. The Bi12TiO20 photorefractive crystal sample is used as holographic medium. An optical numerical base was defined with patterns representing the 0, 1 and -1 digits as bits. Then, the complete set of these optical bits is combined to form bytes, where a numerical sequence is represented. The results show that the proposed numerical code is simple, robust and extremely secure, then could be used efficiently as standard numerical identification in robotic vision or eventually in storage or transmission of secure numerical data. (C) 2013 Optical Society of America
C1 [de Oliveira, G. N.] Univ Fed Fluminense, Dept Engn Mecan, Lab Mecan Teor & Aplicada, BR-24210240 Niteroi, RJ, Brazil.
   [Oliveira, M. E.; dos Santos, P. A. M.] Univ Fed Fluminense, Inst Fis, Lab Opt Naolinear & Aplicada, BR-24210346 Niteroi, RJ, Brazil.
RP dos Santos, PAM (reprint author), Univ Fed Fluminense, Inst Fis, Lab Opt Naolinear & Aplicada, Av Gal Milton Tavares Souza S-N, BR-24210346 Niteroi, RJ, Brazil.
EM pams@if.uff.br
FU Conselho Nacional de Pesquisa (CNPq); Cordenadoria de Aperfeicoamento de
   Pessoal de Nivel Superior (CAPES); Fundacao Carlos Chagas Filho de Apoio
   a Pesquisa do Estado do Rio de Janeiro (FAPERJ)
FX We thank Dr. I. Costa for the help in text spelling and grammar
   corrections. We also thank the Brazilian financial support agencies
   Conselho Nacional de Pesquisa (CNPq), Cordenadoria de Aperfeicoamento de
   Pessoal de Nivel Superior (CAPES), and Fundacao Carlos Chagas Filho de
   Apoio a Pesquisa do Estado do Rio de Janeiro (FAPERJ).
CR Aggarwal AK, 2006, OPT LASER TECHNOL, V38, P117, DOI 10.1016/j.optlastec.2004.10.010
   dos Santos PAM, 2002, OPT COMMUN, V212, P211, DOI 10.1016/S0030-4018(02)02017-5
   de Oliveira G. N., 2005, OPT ENG, V44, P12
   Woods R. E., 2004, DIGITAL IMAGE PROCES, P14
   Kaura SK, 2006, J OPT A-PURE APPL OP, V8, P67, DOI 10.1088/1464-4258/8/1/010
   KUKHTAREV NV, 1979, FERROELECTRICS, V22, P949
   LIU S, 1995, APPL OPTICS, V34, P4700, DOI 10.1364/AO.34.004700
   Munoz-Rodriguez JA, 2004, OPT COMMUN, V236, P295, DOI 10.1016/j.optcom.2004.03.089
   Seo DH, 2003, OPT LETT, V28, P304, DOI 10.1364/OL.28.000304
   Yeh P., 1993, INTRO PHOTOREFRACTIV
   Chen J., 1997, APPL OPTICS, V36, P8096
NR 11
TC 1
Z9 1
U1 0
U2 6
PU OPTICAL SOC AMER
PI WASHINGTON
PA 2010 MASSACHUSETTS AVE NW, WASHINGTON, DC 20036 USA
SN 0146-9592
J9 OPT LETT
JI Opt. Lett.
PD MAR 15
PY 2013
VL 38
IS 6
BP 1004
EP 1006
PG 3
WC Optics
SC Optics
GA 111SK
UT WOS:000316540800066
PM 23503288
ER

PT J
AU Archontas, I
   Salapatas, A
   Misiakos, K
AF Archontas, I.
   Salapatas, A.
   Misiakos, K.
TI Molecular film growth monitoring via reflection microscopy on
   periodically patterned substrates
SO OPTICS EXPRESS
LA English
DT Article
ID SENSITIVITY; SYSTEM
AB An optical method is presented for in the situ monitoring of biomolecular films via reflection microscopy on patterned substrates. The method is based on measuring the reflection coefficient of a composite consisting of a substrate, a patterned optical layer, the thin film to be monitored and the cover medium. The optical layer is patterned so that an array of squares is surrounded by the bare substrate. The reflectance difference between the optical layer squares and the bare substrate is the observable, whose fractional changes reveal the thickness of the film through a simple analytical expression. The periodic image is recorded by a digital microscope, and through Fourier transform techniques, the normalized differential reflectance of the patterned optical composite is calculated as the contrast factor of two dimensional bit map. The method is demonstrated by measuring a protein binding assay inside a microfluidic module placed under a microscope. (C)2013 Optical Society of America
C1 [Archontas, I.; Salapatas, A.; Misiakos, K.] NCSR Demokritos, Inst Adv Mat Physicochem Proc Nanotechnol & Micro, Athens 15310, Greece.
RP Archontas, I (reprint author), NCSR Demokritos, Inst Adv Mat Physicochem Proc Nanotechnol & Micro, Athens 15310, Greece.
EM misiakos@imel.demokritos.gr
CR BRECHT A, 1993, BIOSENS BIOELECTRON, V8, P387, DOI 10.1016/0956-5663(93)80078-4
   Busse S, 2002, BIOSENS BIOELECTRON, V17, P704, DOI 10.1016/S0956-5663(02)00027-1
   Guo XW, 2012, J BIOPHOTONICS, V5, P483, DOI 10.1002/jbio.201200015
   Heavens O. S., 1991, OPTICAL PROPERTIES T
   Herranz S, 2010, ANAL BIOANAL CHEM, V398, P2625, DOI 10.1007/s00216-010-3856-8
   Ihalainen P, 2004, SENSOR ACTUAT B-CHEM, V102, P207, DOI 10.1016/j.snb.2004.04.023
   Luchansky MS, 2010, ANAL CHEM, V82, P1975, DOI 10.1021/ac902725q
   Turner APF, 2000, SCIENCE, V290, P1315, DOI 10.1126/science.290.5495.1315
   Wang JY, 2012, J APPL PHYS, V112, DOI 10.1063/1.4754469
   Zavali M, 2006, MICRO NANO LETT, V1, P94, DOI 10.1049/mnl:20065019
   Zavali M., 2006, THESIS U IOANNINA GR
   Zhu XD, 2007, APPL OPTICS, V46, P1890, DOI 10.1364/AO.46.001890
NR 12
TC 0
Z9 0
U1 0
U2 7
PU OPTICAL SOC AMER
PI WASHINGTON
PA 2010 MASSACHUSETTS AVE NW, WASHINGTON, DC 20036 USA
SN 1094-4087
J9 OPT EXPRESS
JI Opt. Express
PD FEB 25
PY 2013
VL 21
IS 4
BP 4215
EP 4227
DI 10.1364/OE.21.004215
PG 13
WC Optics
SC Optics
GA 104KU
UT WOS:000315992600028
PM 23481955
ER

PT J
AU Liao, JW
   Huang, KF
   Wang, LW
   Tsai, WC
   Wen, WC
   Chiang, CC
   Lin, HJ
   Chang, FH
   Lai, CH
AF Liao, Jung-Wei
   Huang, Kuo-Feng
   Wang, Liang-Wei
   Tsai, Wu-Chang
   Wen, Wei-Chih
   Chiang, Chao-Chien
   Lin, Hong-Ji
   Chang, Fan-Hsiu
   Lai, Chih-Huang
TI Highly (001)-oriented thin continuous L1(0) FePt film by introducing an
   FeOx cap layer
SO APPLIED PHYSICS LETTERS
LA English
DT Article
ID PATTERNED MEDIA; DENSITY; OXIDE
AB We demonstrate a thin and continuous L1(0) FePt film with a well-aligned (001) texture directly grown on Si parallel to SiO2 substrates by introducing an FeOx cap layer. The agglomeration of capped FePt films is greatly suppressed by inhibiting the surface diffusion. This, in turn, yields a continuous and smooth film, which significantly promotes the (001) out-of-plane orientation and perpendicular anisotropy. The reduction of Fe oxides occurs during annealing, which not only promotes interdiffusion of Fe and Pt for L1(0) ordering but also removes the cap layer simultaneously. Therefore, additional etching for the cap layer is not required for further fabricating bit patterned media. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4793189]
C1 [Liao, Jung-Wei; Huang, Kuo-Feng; Wang, Liang-Wei; Tsai, Wu-Chang; Wen, Wei-Chih; Chiang, Chao-Chien; Lai, Chih-Huang] Natl Tsing Hua Univ, Dept Mat Sci & Engn, Hsinchu 30013, Taiwan.
   [Lin, Hong-Ji; Chang, Fan-Hsiu] Natl Synchrotron Radiat Res Ctr, Hsinchu 30076, Taiwan.
RP Liao, JW (reprint author), Natl Tsing Hua Univ, Dept Mat Sci & Engn, Hsinchu 30013, Taiwan.
EM chlai@mx.nthu.edu.tw
FU National Science Council of Republic of China [101A16, NSC
   99-2923-E-007-003-MY2]; Seagate Technology
FX This work has been supported by the National Science Council of Republic
   of China under Grant Nos. 101A16 and NSC 99-2923-E-007-003-MY2 and was
   partially supported by Seagate Technology.
CR Barmak K, 2005, J APPL PHYS, V97, DOI 10.1063/1.1832743
   Bublat T, 2011, NANOTECHNOLOGY, V22, DOI 10.1088/0957-4484/22/31/315301
   Casoli F, 2008, J APPL PHYS, V103, DOI 10.1063/1.2885339
   Casoli F, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2905294
   Chappert C, 1998, SCIENCE, V280, P1919, DOI 10.1126/science.280.5371.1919
   Delalande M, 2012, J PHYS CHEM C, V116, P6866, DOI 10.1021/jp300037r
   Figueroa SJA, 2011, J PHYS CHEM C, V115, P5500, DOI 10.1021/jp111591p
   Galinski H, 2010, PHYS REV B, V82, DOI 10.1103/PhysRevB.82.235415
   Goll D, 2008, APPL PHYS LETT, V93, DOI 10.1063/1.3001589
   Goll D, 2009, APPL PHYS LETT, V94, DOI 10.1063/1.3078286
   Gu XD, 2012, ADV MATER, V24, P5505, DOI 10.1002/adma.201201278
   HERRING C, 1950, J APPL PHYS, V21, P437, DOI 10.1063/1.1699681
   Hsiao SN, 2012, APPL PHYS LETT, V100, DOI 10.1063/1.4730963
   Kim JS, 2006, J APPL PHYS, V99, DOI 10.1063/1.2176088
   Kirsch PD, 2001, J APPL PHYS, V90, P4256, DOI 10.1063/1.1403675
   Lomakin V, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2831732
   Lubarda MV, 2011, APPL PHYS LETT, V98, DOI 10.1063/1.3532839
   McCallum AT, 2012, APPL PHYS LETT, V101, DOI 10.1063/1.4748162
   McCallum AT, 2011, APPL PHYS LETT, V98, DOI 10.1063/1.3599573
   Nabarro F. R. N., 1948, C STRENGTH SOL PHYS, P75
   Ovanov O. A., 1973, PHYS MET METALLOGR, V35, P81
   Perumal A, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2830708
   Richter HJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2209179
   Saxena R, 2005, PHYS REV B, V72, DOI 10.1103/PhysRevB.72.115425
   Shima T, 2004, APPL PHYS LETT, V85, P2571, DOI 10.1063/1.1794863
   Shimatsu T., 2011, J APPL PHYS, V109
   SROLOVITZ DJ, 1986, J APPL PHYS, V60, P255, DOI 10.1063/1.337691
   Takahashi R, 2010, APPL PHYS LETT, V97, DOI 10.1063/1.3481364
   Takahashi YK, 2001, JPN J APPL PHYS 2, V40, pL1367, DOI 10.1143/JJAP.40.L1367
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Wang H, 2011, J APPL PHYS, V109, DOI 10.1063/1.3562453
   Wang LW, 2012, APPL PHYS LETT, V101, DOI 10.1063/1.4772072
   Weller D, 1999, IEEE T MAGN, V35, P4423, DOI 10.1109/20.809134
   Wen WC, 2012, ACTA MATER, V60, P7258, DOI 10.1016/j.actamat.2012.09.045
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
   Wu YC, 2008, J APPL PHYS, V103, DOI 10.1063/1.2835442
   Wu YC, 2008, APPL PHYS LETT, V93, DOI 10.1063/1.3049601
   Yang CY, 2003, J ELECTROCHEM SOC, V150, pG826, DOI 10.1149/1.1627350
NR 38
TC 9
Z9 9
U1 1
U2 53
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0003-6951
J9 APPL PHYS LETT
JI Appl. Phys. Lett.
PD FEB 11
PY 2013
VL 102
IS 6
AR 062420
DI 10.1063/1.4793189
PG 5
WC Physics, Applied
SC Physics
GA 091MH
UT WOS:000315053300061
ER

PT J
AU Fal, TJ
   Mercer, JI
   Leblanc, MD
   Whitehead, JP
   Plumer, ML
   van Ek, J
AF Fal, T. J.
   Mercer, J. I.
   Leblanc, M. D.
   Whitehead, J. P.
   Plumer, M. L.
   van Ek, J.
TI Kinetic Monte Carlo approach to modeling thermal decay in perpendicular
   recording media
SO PHYSICAL REVIEW B
LA English
DT Article
ID LONG-TIME SCALES; MAGNETIC VISCOSITY; MICROMAGNETIC PREDICTIONS;
   CHEMICAL-REACTIONS; PARTICLE; SIMULATION; REVERSAL; FLUCTUATIONS;
   STABILITY; FIELD
AB A procedure is developed to study the evolution of high anisotropy magnetic recording media due to thermally activated grain reversal. It is assumed that the system is composed of single domain grains that evolves by passing through a sequence of relatively long-lived metastable states punctuated by abrupt reversals of individual grains. Solutions to the rate equations describing the sequence of metastable states are calculated using kinetic Monte Carlo. Transition rates are formulated from the Arrhenius-Neel expression in terms of the material parameters, temperature, and applied field. Results obtained from this method are shown to be in good agreement with those calculated from finite-temperature micromagnetics. The method is applied to study the rate dependence of finite-temperature MH loops and the thermal degradation of a recorded bit pattern in perpendicular recording media. A significant advantage of the procedure is its ability to extend simulations over time intervals many orders of magnitude greater than is feasible using standard finite-temperature micromagnetics with relatively modest computational effort. DOI: 10.1103/PhysRevB.87.064405
C1 [Fal, T. J.; Leblanc, M. D.; Whitehead, J. P.; Plumer, M. L.] Mem Univ Newfoundland, Dept Phys & Phys Oceanog, St John, NF A1B 3X7, Canada.
   [Mercer, J. I.] Mem Univ Newfoundland, Dept Comp Sci, St John, NF A1B 3X7, Canada.
   [van Ek, J.] Western Digital Corp, San Jose, CA 94588 USA.
RP Fal, TJ (reprint author), Mem Univ Newfoundland, Dept Phys & Phys Oceanog, St John, NF A1B 3X7, Canada.
FU Western Digital Corporation; Natural Science and Engineering Research
   Council (NSERC) of Canada; Canada Foundation for Innovation (CFI);
   Atlantic Computational Excellence network (ACEnet)
FX This work was supported by Western Digital Corporation, the Natural
   Science and Engineering Research Council (NSERC) of Canada, the Canada
   Foundation for Innovation (CFI), and the Atlantic Computational
   Excellence network (ACEnet).
CR Breth L, 2012, J APPL PHYS, V112, DOI 10.1063/1.4737413
   BROWN WF, 1963, PHYS REV, V130, P1677, DOI 10.1103/PhysRev.130.1677
   CHANTRELL RW, 1986, J PHYS F MET PHYS, V16, pL145, DOI 10.1088/0305-4608/16/7/006
   Charap SH, 1997, IEEE T MAGN, V33, P978, DOI 10.1109/20.560142
   Chotia A, 2008, NEW J PHYS, V10, DOI 10.1088/1367-2630/10/4/045031
   Crew DC, 1996, J PHYS D APPL PHYS, V29, P2313, DOI 10.1088/0022-3727/29/9/013
   Dittrich R, 2002, J MAGN MAGN MATER, V250, pL12
   Fellow H. N. Bertram, 2001, IEEE T MAG, V37, P1521
   Feng XB, 2004, J APPL PHYS, V95, P7043, DOI 10.1063/1.1667808
   Fiedler G, 2012, J APPL PHYS, V111, DOI 10.1063/1.4712033
   Franz T, 2010, J CHEM PHYS, V132, DOI 10.1063/1.3415501
   GILLESPIE DT, 1976, J COMPUT PHYS, V22, P403, DOI 10.1016/0021-9991(76)90041-3
   Gillespie D. T., 1977, CHEMISTRY, V81, P2340
   JANSEN APJ, 1995, COMPUT PHYS COMMUN, V86, P1, DOI 10.1016/0010-4655(94)00155-U
   KANAI Y, 1991, IEEE T MAGN, V27, P4972, DOI 10.1109/20.278711
   LU PL, 1994, J APPL PHYS, V75, P5768, DOI 10.1063/1.355609
   Martin-Bragado I, 2006, NUCL INSTRUM METH B, V253, P63, DOI 10.1016/j.nimb.2006.10.035
   McDaniel TW, 2012, J APPL PHYS, V112, DOI 10.1063/1.4733311
   Mercer JI, 2011, APPL PHYS LETT, V98, DOI 10.1063/1.3589968
   Moser A, 1999, IEEE T MAGN, V35, P2808, DOI 10.1109/20.800990
   Opplestrup T, 2006, PHYS REV LETT, V97, DOI 10.1103/PhysRevLett.97.230602
   Ostler TA, 2012, NAT COMMUN, V3, DOI 10.1038/ncomms1666
   Plumer M., 2001, PHYS ULTRAHIGH DENSI
   Plumer ML, 2012, J APPL PHYS, V111, DOI 10.1063/1.4729328
   Plumer M. L., 2011, PHYS CAN, V67, P25
   Rai V, 2006, PHYS REV E, V74, DOI 10.1103/PhysRevE.74.046707
   Richter HJ, 2007, J PHYS D APPL PHYS, V40, pR149, DOI 10.1088/0022-3727/40/9/R01
   Richter HJ, 2012, J APPL PHYS, V111, DOI 10.1063/1.3681297
   Safonov VL, 1999, J MAGN MAGN MATER, V195, P523, DOI 10.1016/S0304-8853(99)00143-2
   SHARROCK MP, 1981, IEEE T MAGN, V17, P3020, DOI 10.1109/TMAG.1981.1061755
   Shiroishi Y, 2009, IEEE T MAGN, V45, P3816, DOI 10.1109/TMAG.2009.2024879
   STONER EC, 1948, PHILOS TR R SOC S-A, V240, P599, DOI 10.1098/rsta.1948.0007
   Suess D, 2009, J MAGN MAGN MATER, V321, P545, DOI 10.1016/j.jmmm.2008.06.041
   Tamion A, 2012, PHYS REV B, V85, DOI 10.1103/PhysRevB.85.134430
   Uesaka Y, 1997, J MAGN MAGN MATER, V174, P203, DOI 10.1016/S0304-8853(97)00202-3
   Wang XB, 2002, J APPL PHYS, V92, P4560, DOI 10.1063/1.1509107
   Wernsdorfer E., 1997, PHYS REV LETT, V78, P1791
   Wood R, 2009, IEEE T MAGN, V45, P100, DOI 10.1109/TMAG.2008.2006286
   Xue JH, 2000, APPL PHYS LETT, V77, P3432, DOI 10.1063/1.1331094
   Xue JH, 2001, J APPL PHYS, V89, P6985, DOI 10.1063/1.1355330
   Zhang Y, 1998, IEEE T MAGN, V34, P3786, DOI 10.1109/20.718543
NR 41
TC 10
Z9 11
U1 1
U2 19
PU AMER PHYSICAL SOC
PI COLLEGE PK
PA ONE PHYSICS ELLIPSE, COLLEGE PK, MD 20740-3844 USA
SN 1098-0121
J9 PHYS REV B
JI Phys. Rev. B
PD FEB 6
PY 2013
VL 87
IS 6
AR 064405
DI 10.1103/PhysRevB.87.064405
PG 10
WC Physics, Condensed Matter
SC Physics
GA 086KH
UT WOS:000314682000001
ER

PT J
AU Michel, J
   Korcyl, G
   Maier, L
   Traxler, M
AF Michel, J.
   Korcyl, G.
   Maier, L.
   Traxler, M.
TI In-beam experience with a highly granular DAQ and control network:
   TrbNet
SO JOURNAL OF INSTRUMENTATION
LA English
DT Article; Proceedings Paper
CT Topical Workshop on Electronics for Particle Physics
CY SEP 17-21, 2012
CL Oxford, ENGLAND
SP US Dept Energy, U S Natl Sci Fdn, U K Sci & Technol Facilities Council
DE Trigger concepts and systems (hardware and software); Optical detector
   readout concepts; Control and monitor systems online; Detector control
   systems (detector and experiment monitoring and slow-control systems,
   architecture, hardware, algorithms, databases)
AB Virtually all Data Acquisition Systems (DAQ) for nuclear and particle physics experiments use a large number of Field Programmable Gate Arrays (FPGAs) for data transport and more complex tasks as pattern recognition and data reduction. All these FPGAs in a large system have to share a common state like a trigger number or an epoch counter to keep the system synchronized for a consistent event/epoch building. Additionally, the collected data has to be transported with high bandwidth, optionally via the ubiquitous Ethernet protocol. Furthermore, the FPGAs' internal states and configuration memories have to be accessed for control and monitoring purposes.
   Another requirement for a modern DAQ-network is the fault-tolerance for intermittent data errors in the form of automatic retransmission of faulty data. As FPGAs suffer from Single Event Effects when exposed to ionizing particles, the system has to deal with failing FPGAs. The TrbNet protocol was developed taking all these requirements into account. Three virtual channels are merged on one physical medium: The trigger/epoch information is transported with the highest priority. The data channel is second in the priority order, while the control channel is the last. Combined with a small frame size of 80 bit this guarantees a low latency data transport: A system with 100 front-ends can be built with a one-way latency of 2.2 us.
   The TrbNet-protocol was implemented in each of the 550 FPGAs of the HADES upgrade project and has been successfully used during the Au+Au campaign in April 2012. With 2 . 10(6)/s Au-ions and 3% interaction ratio the accepted trigger rate is 10 kHz while data is written to storage with 150 MBytes/s. Errors are reliably mitigated via the implemented retransmission of packets and auto-shut-down of individual links. TrbNet was also used for full monitoring of the FEE status. The network stack is written in VHDL and was successfully deployed on various Lattice and Xilinx devices. The TrbNet is also used in other experiments, like systems for detector and electronics development for PANDA and CBM at FAIR. As a platform for such set-ups, e.g. for high-channel time measurement with 15 ps resolution, a generic FPGA platform (TRB3) has been developed.
C1 [Michel, J.] Goethe Univ Frankfurt, Inst Nucl Phys, D-60438 Frankfurt, Germany.
   [Korcyl, G.] Jagiellonian Univ Cracow, Smoluchowski Inst Phys, PL-30059 Krakow, Poland.
   [Maier, L.] Tech Univ Munich, Dept Phys, D-85748 Garching, Germany.
   [Traxler, M.] GSI Helmholtz Ctr Heavy Ion Res, D-64291 Darmstadt, Germany.
RP Michel, J (reprint author), Goethe Univ Frankfurt, Inst Nucl Phys, D-60438 Frankfurt, Germany.
EM j.michel@gsi.de
CR Agakishiev G., 2009, EUR PHYS J A, V41, P243
   Michel J., 2011, P TOP WORKSH EL PART
   Michel J, 2011, IEEE T NUCL SCI, V58, P1745, DOI 10.1109/TNS.2011.2141150
   Ugur C., 2012, P TOP WORKSH EL PART
NR 4
TC 0
Z9 0
U1 0
U2 9
PU IOP PUBLISHING LTD
PI BRISTOL
PA TEMPLE CIRCUS, TEMPLE WAY, BRISTOL BS1 6BE, ENGLAND
SN 1748-0221
J9 J INSTRUM
JI J. Instrum.
PD FEB
PY 2013
VL 8
AR C02034
DI 10.1088/1748-0221/8/02/C02034
PG 9
WC Instruments & Instrumentation
SC Instruments & Instrumentation
GA 100CJ
UT WOS:000315672700034
ER

PT J
AU Kikitsu, A
   Maeda, T
   Hieda, H
   Yamamoto, R
   Kihara, N
   Kamata, Y
AF Kikitsu, Akira
   Maeda, Tomoyuki
   Hieda, Hiroyuki
   Yamamoto, Ryosuke
   Kihara, Naoko
   Kamata, Yoshiyuki
TI 5 Tdots/in(2) Bit Patterned Media Fabricated by a Directed Self-Assembly
   Mask
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT 23rd Magnetic Recording Conference
CY AUG 20-22, 2012
CL San Jose, CA
DE Bit patterned media; diblock copolymer; directed self-assembling; FePt;
   switching field
ID BLOCK-COPOLYMER PATTERNS; DENSITY; MORPHOLOGY; STORAGE; FILMS
AB FePt bit patterned media (BPM) was fabricated with a self-assembled polymer mask with a feature size of 12 nm pitch (equivalent to 5 Tdots/in(2)). A 3.5 nm FePt film with high c-axis crystal orientation was prepared for the magnetic recording layer. A solvent vapor annealing process was applied for obtaining uniform directed self-assembling of polystyrene (PS)-polydimethylsiloxane (PDMS) di-block copolymer pattern. Pattern transfer from a polymer mask to FePt layer was achieved by employing a carbon hard mask. In spite of excellent magnetic characteristics of FePt layer, the fabricated FePt BPM showed small coercivity (H-c) of 6 kOe and large switching field distribution (SFD) of 21%. These results are due to the etching damage of FePt dots. Disordering of FePt L1(0) phase by the etching damage reduced magnetic anisotropy energy (K-u). The damaged portion became a nucleus of the magnetization reversal and reduced. H-c. Distribution of the damaged volume and the extent of the K-u reduction contributed to large SFD. This model is supported by the experimental data of magnetic field angle dependence of switching field. The result suggests the domain wall motion type of magnetization reversal mode, where the domain wall is created at the interface between the damaged portion and the internal high-K-u region.
C1 [Kikitsu, Akira; Maeda, Tomoyuki; Hieda, Hiroyuki; Yamamoto, Ryosuke; Kihara, Naoko; Kamata, Yoshiyuki] Toshiba Co Ltd, R&D Ctr, Storage Mat & Devices Lab, Kawasaki, Kanagawa 2128582, Japan.
RP Kikitsu, A (reprint author), Toshiba Co Ltd, R&D Ctr, Storage Mat & Devices Lab, Kawasaki, Kanagawa 2128582, Japan.
EM akira.kikitsu@toshiba.co.jp
FU New Energy and Industrial Technology Development Organization (NEDO)
FX A part of this work was funded by the New Energy and Industrial
   Technology Development Organization (NEDO) under the "Development of
   nanobit technology for ultra-high density magnetic recording (Green IT)"
   project.
CR CHOU SY, 1994, J APPL PHYS, V76, P6673, DOI 10.1063/1.358164
   Hieda H, 2006, J PHOTOPOLYM SCI TEC, V19, P425, DOI 10.2494/photopolymer.19.425
   Hu G, 2005, IEEE T MAGN, V41, P3589, DOI 10.1109/TMAG.2005.854733
   Jung YS, 2007, NANO LETT, V7, P2046, DOI 10.1021/nl070924l
   Jung YS, 2009, ADV MATER, V21, P2540, DOI 10.1002/adma.200802855
   Kamata Y, 2011, IEEE T MAGN, V47, P51, DOI 10.1109/TMAG.2010.2077274
   Kikitsu A., 2010, 55 MMM C, VCF-01, P185
   Kikitsu A, 2009, J MAGN MAGN MATER, V321, P526, DOI 10.1016/j.jmmm.2008.05.039
   Kim G, 1998, MACROMOLECULES, V31, P2569, DOI 10.1021/ma971349i
   Maeda T, 2005, IEEE T MAGN, V41, P3331, DOI 10.1109/TMAG.2005.855203
   Maeda T., 2012, INT C, VCS-13
   MANSKY P, 1995, J MATER SCI, V30, P1987, DOI 10.1007/BF00353023
   Mitsuzuka K, 2007, IEEE T MAGN, V43, P2160, DOI 10.1109/TMAG.2007.893129
   OHTA T, 1986, MACROMOLECULES, V19, P2621, DOI 10.1021/ma00164a028
   Okino T., 2012, P SOC PHOTO-OPT INS, V8323
   Sasao N., INFLUENCE SOLV UNPUB
   Segalman RA, 2003, MACROMOLECULES, V36, P3272, DOI 10.1021/ma021367m
   Shiroishi Y, 2009, IEEE T MAGN, V45, P3816, DOI 10.1109/TMAG.2009.2024879
   Son JG, 2011, NANO LETT, V11, P5079, DOI 10.1021/nl203445h
   Son JG, 2011, ADV MATER, V23, P634, DOI 10.1002/adma.201002999
   TAGAWA I, 1991, IEEE T MAGN, V27, P4975, DOI 10.1109/20.278712
   Tavakkoli KGA, 2012, ADV MATER, V24, P4249, DOI 10.1002/adma.201104895
   Victora RH, 2005, IEEE T MAGN, V41, P537, DOI 10.1109/TMAG.2004.838075
   Wang Q, 2010, APPL SURF SCI, V256, P5843, DOI 10.1016/j.apsusc.2010.03.057
   Watanabe A., 2012, INT C, VCS-11
   Weller D, 2000, IEEE T MAGN, V36, P10, DOI 10.1109/20.824418
   Xiao SG, 2009, ADV MATER, V21, P2516, DOI 10.1002/adma.200802087
NR 27
TC 17
Z9 17
U1 2
U2 54
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD FEB
PY 2013
VL 49
IS 2
BP 693
EP 698
DI 10.1109/TMAG.2012.2226566
PN 1
PG 6
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 079HU
UT WOS:000314162000007
ER

PT J
AU Wang, H
   Zhao, HB
   Rahman, T
   Isowaki, Y
   Kamata, Y
   Maeda, T
   Hieda, H
   Kikitsu, A
   Wang, JP
AF Wang, Hao
   Zhao, Haibao
   Rahman, Tofizur
   Isowaki, Yousuke
   Kamata, Yoshiyuki
   Maeda, Tomoyuki
   Hieda, Hiroyuki
   Kikitsu, Akira
   Wang, Jian-Ping
TI Fabrication and Characterization of FePt Exchange Coupled Composite and
   Graded Bit Patterned Media
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT 23rd Magnetic Recording Conference
CY AUG 20-22, 2012
CL San Jose, CA
DE Bit patterned media; block copolymer lithograph; etching damage;
   exchange coupled composite media; FePt media; FePt thin films; graded
   media; switching field distribution
AB Three methods to fabricate continuous FePt films with graded magnetic anisotropy for bit patterned media (BPM) were evaluated. Continuous FePt films with surface roughness of less than 0.3 nm were achieved in continuous FePt hard magnetic films, FePt/Fe exchange coupled composite (ECC) films and FePt/Fe based graded films. Depositing an Fe-rich film on FePt at high temperature was found to form large grains and cause the film surface very rough for BPM fabrication. Depositing Fe on FePt at room temperature and then annealing it to create graded anisotropy through the layer interdiffusion process was demonstrated to fabricate FePt/Fe based graded BPM. The continuous FePt films with hard layer only, ECC structure and graded magnetic anisotropy were patterned using a di-block copolymer self-assemble hard mask method with 25 nm dot size over 2-inch substrate. The switching field distribution (SFD) broadening and degradation of FePt BPM was studied. The reduction of SFD was achieved using a postannealing process. It was confirmed that the patterned graded BPM sample has smaller switching field and larger thermal energy barrier than the ECC sample.
C1 [Wang, Hao; Zhao, Haibao; Rahman, Tofizur; Wang, Jian-Ping] Univ Minnesota, MINT Ctr, Minneapolis, MN 55455 USA.
   [Wang, Hao; Zhao, Haibao; Rahman, Tofizur; Wang, Jian-Ping] Univ Minnesota, Dept Elect & Comp Engn, Minneapolis, MN 55455 USA.
   [Isowaki, Yousuke; Kamata, Yoshiyuki; Maeda, Tomoyuki; Hieda, Hiroyuki; Kikitsu, Akira] Toshiba Cent Lab, Kawasaki, Kanagawa 2128582, Japan.
RP Wang, JP (reprint author), Univ Minnesota, MINT Ctr, Minneapolis, MN 55455 USA.
EM jpwang@umn.edu
FU WDC; INSIC EHDR program; NSF [DMR-0819885]
FX Parts of this work were carried out in the Characterization Facility,
   University of Minnesota, a member of the NSF-funded Materials Research
   Facilities Network (www.mrfn.org) via the NSF MRSEC program under award
   number DMR-0819885. HW, HBZ and JPW also thank the partial support from
   WDC and INSIC EHDR program. The authors thank Mr. P. Quarterman and
   Prof. X. Cheng for useful discussion.
CR Bublat T, 2011, J APPL PHYS, V110, DOI 10.1063/1.3646550
   Bublat T, 2011, NANOTECHNOLOGY, V22, DOI 10.1088/0957-4484/22/31/315301
   Chen JS, 2003, J APPL PHYS, V93, P1661, DOI 10.1063/1.1531817
   Dannenberg A, 2009, PHYS REV B, V80, DOI 10.1103/PhysRevB.80.245438
   Davies JE, 2011, J APPL PHYS, V109, DOI 10.1063/1.3554256
   Goll D, 2008, J APPL PHYS, V104, DOI 10.1063/1.2999337
   Kim C, 2007, APPL PHYS LETT, V91, DOI 10.1063/1.2802038
   Krone P, 2010, APPL PHYS LETT, V97, DOI 10.1063/1.3481668
   Lu ZH, 2007, IEEE T MAGN, V43, P2941, DOI 10.1109/TMAG.2007.893630
   Ma B, 2011, J APPL PHYS, V109, DOI 10.1063/1.3569845
   McCallum AT, 2011, APPL PHYS LETT, V98, DOI 10.1063/1.3599573
   Naito K, 2002, IEEE T MAGN, V38, P1949, DOI 10.1109/TMAG.2002.802847
   Okamoto S, 2002, PHYS REV B, V66, DOI 10.1103/PhysRevB.66.024413
   Sharma P, 2011, J APPL PHYS, V109, DOI 10.1063/1.3561803
   Shimatsu T, 2011, J APPL PHYS, V109, DOI 10.1063/1.3556697
   Suess D, 2006, APPL PHYS LETT, V89, DOI 10.1063/1.2347894
   TAGAWA I, 1991, IEEE T MAGN, V27, P4975, DOI 10.1109/20.278712
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Victora RH, 2005, IEEE T MAGN, V41, P2828, DOI 10.1109/TMAG.2005.855263
   Wang H, 2011, J APPL PHYS, V109, DOI 10.1063/1.3562453
   Wang JP, 2007, IEEE T MAGN, V43, P682, DOI 10.1109/TMAG.2006.888233
   Wang JP, 2005, IEEE T MAGN, V41, P3181, DOI 10.1109/TMAG.2005.855278
   Weller D, 2000, IEEE T MAGN, V36, P10, DOI 10.1109/20.824418
   Yu A., 2006, DOMAIN WALL ASSISTED, V89
NR 24
TC 13
Z9 13
U1 4
U2 55
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD FEB
PY 2013
VL 49
IS 2
BP 707
EP 712
DI 10.1109/TMAG.2012.2230155
PN 1
PG 6
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 079HU
UT WOS:000314162000010
ER

PT J
AU Lin, MY
   Elidrissi, MR
   Chan, KS
   Eason, K
   Chua, M
   Asbahi, M
   Yang, JKW
   Thiyagarajah, N
   Ng, V
AF Lin, Maria Yu
   Elidrissi, Moulay Rachid
   Chan, Kheong Sann
   Eason, Kwaku
   Chua, Melissa
   Asbahi, Mohamed
   Yang, Joel K. W.
   Thiyagarajah, Naganivetha
   Ng, Vivian
TI Channel Characterization and Performance Evaluation of Bit-Patterned
   Media
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT 23rd Magnetic Recording Conference
CY AUG 20-22, 2012
CL San Jose, CA
DE Bit-patterned media (BPM); grain flipping probability (GFP) model; hard
   disk drives (HDDs); jitter characterization; magnetic recording;
   micromagnetic simulations; signal processing
AB Bit-patterned media (BPM) is a promising approach to push back the onset of the superparamagnetic limit faced by conventional continuous granular media. Today, BPM islands can be fabricated at densities higher than can be characterized by existing methods and full bit-patterned media recording (BPMR) is still a long way off. In this work, we rely on simulations to predict how such islands would perform in a real recording scenario. The grain flipping probability (GFP) model is trained via micromagnetic simulations and reproduces the magnetic profiles used to generate readback signals for channel simulations. The geometrical parameters to the micromagnetic simulations, such as the island size variations and island position jitter are characterized from measurements of islands fabricated via e-beam at various channel densities.
C1 [Lin, Maria Yu; Elidrissi, Moulay Rachid; Chan, Kheong Sann; Eason, Kwaku; Chua, Melissa] ASTAR, DSI, Singapore 117608, Singapore.
   [Asbahi, Mohamed; Yang, Joel K. W.] ASTAR, IMRE, Singapore 117602, Singapore.
   [Thiyagarajah, Naganivetha; Ng, Vivian] Natl Univ Singapore, Dept Elect & Comp Engn, Singapore 117576, Singapore.
RP Lin, MY (reprint author), ASTAR, DSI, Singapore 117608, Singapore.
EM lin_yu@dsi.a-star.edu.sg
RI Thiyagarajah, Naganivetha/N-1613-2014; Yang, Joel K.W./L-7892-2016
OI Thiyagarajah, Naganivetha/0000-0003-2888-1412; Yang, Joel
   K.W./0000-0003-3301-1040
CR BAHL LR, 1974, IEEE T INFORM THEORY, V20, P284, DOI 10.1109/TIT.1974.1055186
   Chan KS, 2012, J MAGN MAGN MATER, V324, P336, DOI 10.1016/j.jmmm.2010.12.022
   Chua M, 2012, IEEE T MAGN, V48, P1826, DOI 10.1109/TMAG.2011.2169654
   Dong Y, 2011, IEEE T MAGN, V47, P2652, DOI 10.1109/TMAG.2011.2148112
   Elidrissi MR, 2011, IEEE T MAGN, V47, P3685, DOI 10.1109/TMAG.2011.2156770
   Hu J, 2007, IEEE T MAGN, V43, P3517, DOI 10.1109/TMAG.2007.898307
   Radford N., LDPC SOFTWARE
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Yang JKW, 2011, NANOTECHNOLOGY, V22, DOI 10.1088/0957-4484/22/38/385301
   Zhang SH, 2010, IEEE T MAGN, V46, P1363, DOI 10.1109/TMAG.2010.2040713
NR 10
TC 2
Z9 2
U1 0
U2 9
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD FEB
PY 2013
VL 49
IS 2
BP 723
EP 729
DI 10.1109/TMAG.2012.2226708
PN 1
PG 7
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 079HU
UT WOS:000314162000013
ER

PT J
AU Albrecht, TR
   Bedau, D
   Dobisz, E
   Gao, H
   Grobis, M
   Hellwig, O
   Kercher, D
   Lille, J
   Marinero, E
   Patel, K
   Ruiz, R
   Schabes, ME
   Wan, L
   Weller, D
   Wu, TW
AF Albrecht, Thomas R.
   Bedau, Daniel
   Dobisz, Elizabeth
   Gao, He
   Grobis, Michael
   Hellwig, Olav
   Kercher, Dan
   Lille, Jeffrey
   Marinero, Ernesto
   Patel, Kanaiyalal
   Ruiz, Ricardo
   Schabes, Manfred E.
   Wan, Lei
   Weller, Dieter
   Wu, Tsai-Wei
TI Bit Patterned Media at 1 Tdot/in(2) and Beyond
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT 23rd Magnetic Recording Conference
CY AUG 20-22, 2012
CL San Jose, CA
DE Bit error rate; media SNR; nanoimprint; patterned media; self-assembly
ID IMPRINT LITHOGRAPHY; MAGNETIC-STRUCTURES; DENSITY; FABRICATION; TESTER;
   SERVO
AB Bit patterned media (BPM) provide an alternative to conventional granular thin film recording media, circumventing the challenges of managing grain size and its associated noise and thermal stability issues in granular media. A viable fabrication strategy involves creation of a master pattern by rotary-stage e-beam lithography and directed self-assembly of block copolymers, followed by pattern replication via UV-cure nanoimprint lithography and pattern transfer to amagnetic thin film by ion beam etching. These steps have been demonstrated for 150 Gdot/cm(2) (1 Tdot/in(2)) hcp patterns, achieving a dot placement tolerance of 1.2 nm 1 sigma and a defect rate of <10(-3) Media samples fabricated in this manner from continuous CoCrPt alloy films have achieved a 1 sigma switching field distribution of 4% of H-c A 2T medium SNR of nearly 14 dB and a write bit error rate of 2 x 10(-3) have been shown using a static tester with a conventional product read/write head. Modeling and experiment suggest that higher recording density can be achieved using BPM with a bit aspect ratio (BAR) >1. A master pattern generation generation strategy for BAR> 1 with rectangular islands is shown using intersecting lines generated by directed self-assembly of lamellar block copolymers in combination with spacer-defined line doubling.
C1 [Albrecht, Thomas R.; Bedau, Daniel; Dobisz, Elizabeth; Gao, He; Grobis, Michael; Hellwig, Olav; Kercher, Dan; Lille, Jeffrey; Marinero, Ernesto; Patel, Kanaiyalal; Ruiz, Ricardo; Schabes, Manfred E.; Wan, Lei; Weller, Dieter; Wu, Tsai-Wei] HGST, San Jose Res Ctr, San Jose, CA 95135 USA.
RP Albrecht, TR (reprint author), HGST, San Jose Res Ctr, San Jose, CA 95135 USA.
EM thomas.albrecht@hgst.com
OI Ruiz, Ricardo/0000-0002-1698-4281
CR Albrecht M, 2002, APPL PHYS LETT, V81, P2875, DOI 10.1063/1.1512946
   Albrecht TR, 2009, NANOSCALE MAGNETIC MATERIALS AND APPLICATIONS, P237, DOI 10.1007/978-0-387-85600-1_9
   Asbahi M, 2010, J PHYS D APPL PHYS, V43, DOI 10.1088/0022-3727/43/38/385003
   Bencher C., 2007, NANOCHIP TECHNOL J, V2, P8
   Berger A, 2005, IEEE T MAGN, V41, P3178, DOI 10.1109/TMAG.2005.855285
   Black CT, 2007, IBM J RES DEV, V51, P605
   Chou SY, 1996, J APPL PHYS, V79, P6101, DOI 10.1063/1.362440
   Dobisz EA, 2012, J VAC SCI TECHNOL B, V30, DOI 10.1116/1.4757955
   Grobis M, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3304166
   Hauet T, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3276911
   Hellwig O, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3293301
   Hellwig O, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3271679
   Hellwig O, 2007, APPL PHYS LETT, V90, DOI 10.1063/1.2730744
   Kamata Y, 2011, IEEE T MAGN, V47, P51, DOI 10.1109/TMAG.2010.2077274
   Leong SH, 2011, IEEE T MAGN, V47, P1981, DOI 10.1109/TMAG.2011.2125783
   Lille J, 2012, IEEE T MAGN, V48, P2757, DOI 10.1109/TMAG.2012.2192916
   Liu GL, 2011, J VAC SCI TECHNOL B, V29, DOI 10.1116/1.3650697
   Miller M, 2005, P SOC PHOTO-OPT INS, V5751, P994, DOI 10.1117/12.607340
   Moser A, 1999, J APPL PHYS, V85, P5018, DOI 10.1063/1.370077
   New RMH, 1996, J MAGN MAGN MATER, V155, P140, DOI 10.1016/0304-8853(95)00723-7
   Park S, 2009, SCIENCE, V323, P1030, DOI 10.1126/science.1168108
   Patel K. C., 2012, P SPIE ALTERNATIVE L, V8323
   Richter HJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2209179
   Ross CA, 2008, MRS BULL, V33, P838, DOI 10.1557/mrs2008.179
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Ruiz R, 2011, ACS NANO, V5, P79, DOI 10.1021/nn101561p
   Schabes ME, 2008, J MAGN MAGN MATER, V320, P2880, DOI 10.1016/j.jmmm.2008.07.035
   Schabes M. E., 2012, SYST LEV PERSP BIT P
   Schmid GM, 2009, J VAC SCI TECHNOL B, V27, P573, DOI 10.1116/1.3081981
   Segalman RA, 2005, MAT SCI ENG R, V48, P191, DOI 10.1016/j.mser.2004.12.003
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Wan L, 2012, J MICRO-NANOLITH MEM, V11, DOI 10.1117/1.JMM.11.3.031405
   Wang H, 2011, J APPL PHYS, V109, DOI 10.1063/1.3562453
   Yamamoto R, 2012, JPN J APPL PHYS, V51, DOI 10.1143/JJAP.51.046503
   Yang XM, 2008, J VAC SCI TECHNOL B, V26, P2604, DOI 10.1116/1.2978487
   Yang XM, 2009, ACS NANO, V3, P1844, DOI 10.1021/nn900073r
   Yang XM, 2009, IEEE T MAGN, V45, P833, DOI 10.1109/TMAG.2008.2010647
NR 37
TC 47
Z9 48
U1 7
U2 77
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD FEB
PY 2013
VL 49
IS 2
BP 773
EP 778
DI 10.1109/TMAG.2012.2227303
PN 1
PG 6
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 079HU
UT WOS:000314162000021
ER

PT J
AU Liu, XC
   Cai, JL
   Wu, LB
AF Liu, Xingcheng
   Cai, Jinlong
   Wu, Longbo
TI Improved Decoding Algorithm of Serial Belief Propagation With a Stop
   Updating Criterion for LDPC Codes and Applications in Patterned Media
   Storage
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Extrinsic information transfer (EXIT) charts; low-density parity-check
   (LDPC) codes; patterned media; stopping criterion; transition-jitter
   noise (TJN)
ID PARITY CHECK CODES; CHANNEL; PERFORMANCE; CONVERGENCE; SCHEDULES; NOISE;
   MODEL
AB In high density patterned media storage system, the "multiple islands per read head" model is taken into account for inter-track interference (ITI) in bit-patterned media (BPM). It has been proposed that low-density parity-check (LDPC) codes could improve the symbol error rate (SER) performance significantly when only considering AWGN noise alone over the storage channel. LDPC decoding algorithm could be applied in LDPC joint decoder of patterned media storage system. In this paper, we proposed a decoding algorithm of serial belief propagation (SBP) with a stop updating criterion for LDPC decoder. Simulation results show that the proposed decoding algorithm could reduce the times of generating and propagating the message in decoding with negligible error rate performance loss over AWGN channels when appropriately choosing the parameter that determines which variable node has been converged. By taking advantage of extrinsic information transfer (EXIT) charts, it is demonstrated that the proposed decoding algorithm could maintain superior SER performance and convergence rate compared with the traditional SBP decoding algorithm. To further explore the performance of the proposed decoding algorithm in "multiple islands per read head" model, we performed a large number of simulations over this channel model with different distribution percentages between the AWGN and the island position jitter noise. Simulation results show that the LDPC codes could improve the SER performance when considering jitter noise while the proposed decoding algorithm behaves excellently over the patterned media storage channel and over the AWGN channel.
C1 [Liu, Xingcheng] Sun Yat Sen Univ, Sch Informat Sci & Technol, Guangzhou 510006, Guangdong, Peoples R China.
   Southeast Univ, Natl Mobile Commun Res Lab, Nanjing 210096, Jiangsu, Peoples R China.
   Sun Yat Sen Univ, Minist Educ, Key Lab Machine Intelligence & Sensor Networks, Guangzhou 510006, Guangdong, Peoples R China.
RP Liu, XC (reprint author), Sun Yat Sen Univ, Sch Informat Sci & Technol, Guangzhou 510006, Guangdong, Peoples R China.
EM isslxc@mail.sysu.edu.cn
FU National Natural Science Foundation of China [60970041, 61173018];
   National Mobile Communications Research Laboratory, Southeast University
   [2011D09]; Science and Technology Plan Project of Guangzhou City of
   China [2012J4300032]
FX The authors would like to thank the anonymous reviewers for their
   constructive opinions in improving this paper. This work was supported
   by the National Natural Science Foundation of China (Grants 60970041 and
   61173018), the open research fund of National Mobile Communications
   Research Laboratory, Southeast University (Grant 2011D09), and the
   Science and Technology Plan Project of Guangzhou City of China
   (2012J4300032).
CR Bakshi V. U., 2008, AUTOMATIC CONTROL SY, P39
   Bennatan A, 2006, IEEE T INFORM THEORY, V52, P549, DOI 10.1109/TIT.2005.862080
   Brink S. T., 1999, ELECTRON LETT, V35, P806
   Brink S. T., 2004, IEEE T COMMUN, V52, P670
   Casado AIV, 2007, IEEE ICC, P932, DOI 10.1109/ICC.2007.158
   Chen X., 2008, P 11 IEEE SING INT C, P1312
   Cheng MK, 2002, GLOB TELECOMM CONF, P1026
   Davey MC, 1998, IEEE COMMUN LETT, V2, P165, DOI 10.1109/4234.681360
   Dong H. K., 2006, IEEE COMMUN LETT, V10, P183, DOI 10.1109/LCOMM.2006.1603378
   Goldberger J, 2008, IEEE T INFORM THEORY, V54, P1316, DOI 10.1109/TIT.2007.915702
   Han GJ, 2010, IEEE COMMUN LETT, V14, P1053, DOI 10.1109/LCOMM.2010.100410.100998
   Han GJ, 2009, IEEE COMMUN LETT, V13, P950, DOI 10.1109/LCOMM.2009.12.091555
   Hocevar D., 2004, P IEEE WORKSH SIGN P, P107
   Hu XY, 2005, IEEE T INFORM THEORY, V51, P386, DOI 10.1109/TIT.2004.839541
   Karakulak S, 2008, IEEE T MAGN, V44, P193, DOI 10.1109/TMAG.2007.912837
   Levin D, 2007, IEEE COMMUN LETT, V11, P70, DOI 10.1109/LCOMM.2007.061454
   Li J, 2006, IEEE COMMUN LETT, V10, P667, DOI 10.1109/LCOMM.2006.06595
   Liu XC, 2009, IEEE T MAGN, V45, P3745, DOI 10.1109/TMAG.2009.2022333
   Liu XC, 2009, IEEE T MAGN, V45, P3699, DOI 10.1109/TMAG.2009.2023422
   MacKay DJC, 1996, ELECTRON LETT, V32, P1645, DOI 10.1049/el:19961141
   Nutter PW, 2008, IEEE T MAGN, V44, P3797, DOI 10.1109/TMAG.2008.2002516
   Okamoto Y, 2002, IEEE T MAGN, V38, P2349, DOI 10.1109/TMAG.2002.801902
   Phakphisut W, 2011, IEEE T MAGN, V47, P3562, DOI 10.1109/TMAG.2011.2155049
   Saga H., 2011, IEEE T MAGN, V47, P3745
   Sharon E, 2007, IEEE T INFORM THEORY, V53, P4076, DOI 10.1109/TIT.2007.907507
   Yao J, 2010, IEEE T MAGN, V46, P4108, DOI 10.1109/TMAG.2010.2077307
   Zhang JT, 2005, IEEE T COMMUN, V53, P209, DOI 10.1109/TCOMM.2004.841982
NR 27
TC 2
Z9 2
U1 1
U2 10
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD FEB
PY 2013
VL 49
IS 2
BP 829
EP 836
DI 10.1109/TMAG.2012.2208468
PN 2
PG 8
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 079IA
UT WOS:000314162600010
ER

PT J
AU Yang, XM
   Xiao, SG
   Hsu, Y
   Feldbaum, M
   Lee, K
   Kuo, D
AF Yang, XiaoMin
   Xiao, Shuaigang
   Hsu, Yautzong
   Feldbaum, Michael
   Lee, Kim
   Kuo, David
TI Directed Self-Assembly of Block Copolymer for Bit Patterned Media with
   Areal Density of 1.5 Teradot/Inch(2) and Beyond
SO JOURNAL OF NANOMATERIALS
LA English
DT Article
ID ELECTRON-BEAM LITHOGRAPHY; THIN-FILMS; MULTIPLICATION; CHALLENGES
AB Directed self-assembly (DSA) of block copolymer (BCP) holds great promise for many applications in nanolithography, including the next generation magnetic recording. In this work, directed self-assembly of block copolymer technique has been combined with rotary stage electron beam mastering to fabricate a circular full track nanoimprint template for bit patterned media (BPM) fabrication. In order to meet specific requirements in pattern structure and format between the data and the servo zone in a servo-integrated template, three types of lithographically defined prepatterns, (1) two-dimensional chemical pre-pattern, (2) two-dimensional low-topographic pre-pattern, and (3) one-dimensional high-topographic pre-pattern, have been explored for DSA process with two types of commercially available BCP thin film materials: cylinder-forming poly(styrene-b-methyl methacrylate) (PS-b-PMMA) and sphere-forming poly(styrene-b-dimethylsiloxane) (PS-b-PDMS). All guided BCP patterns exhibit highly ordered hexagonal close-packed (hcp) structures with high pattern quality. Using these BCP patterns, two polarities of dots-array templates (hole-tone and pillar-tone) with integrated servo patterns have been fabricated on a fused silica substrate at a density greater than 1.0 Td/in(2). Furthermore, the fabricated master template has been used for UV-cure nanoimprint lithography process development on 2.5 inch disk size media. Good pattern uniformity in imprint resist has been achieved over an entire 2.4 mm wide band area. The imprint resist patterns have been further transferred into underlying CoCrPt media by ion beametching. Evidently, for the first time, the patterned CoCrPt alloy dots (hcp pattern) have successfully been demonstrated at a high density of 1.5 Td/in(2) (pitch = 22.3 nm) for a guided media (H-c congruent to 7kOe) and 3.2 Td/in(2) (pitch = 15.2 nm) for an unguided media (H-c congruent to 5kOe).
C1 [Yang, XiaoMin; Xiao, Shuaigang; Hsu, Yautzong; Feldbaum, Michael; Lee, Kim; Kuo, David] Seagate Technol, Media Res Ctr, Fremont, CA 94538 USA.
RP Yang, XM (reprint author), Seagate Technol, Media Res Ctr, 47010 Kato Rd, Fremont, CA 94538 USA.
EM xiaomin.yang@seagate.com
OI Yang, XiaoMin/0000-0003-4091-6972
CR Cheng JY, 2008, ADV MATER, V20, P3155, DOI 10.1002/adma.200800826
   Cheng JY, 2006, ADV MATER, V18, P2505, DOI 10.1002/adma.200502651
   Kim SO, 2003, NATURE, V424, P411, DOI 10.1038/nature01775
   Peters RD, 2000, J VAC SCI TECHNOL B, V18, P3530, DOI 10.1116/1.1313572
   Richter H. J., 2006, APPL PHYS LETT, V88
   Ross C, 2001, ANN REV MATER RES, V31, P203, DOI 10.1146/annurev.matsci.31.1.203
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Schmid GM, 2009, J VAC SCI TECHNOL B, V27, P573, DOI 10.1116/1.3081981
   Segalman RA, 2005, MAT SCI ENG R, V48, P191, DOI 10.1016/j.mser.2004.12.003
   Service RF, 2006, SCIENCE, V314, P1868, DOI 10.1126/science.314.5807.1868
   Stoykovich MP, 2006, MATER TODAY, V9, P20, DOI 10.1016/S1369-7021(06)71619-4
   Stoykovich MP, 2005, SCIENCE, V308, P1442, DOI 10.1126/science.1111041
   Tada Y, 2008, MACROMOLECULES, V41, P9267, DOI 10.1021/ma801542y
   Wan L, 2009, LANGMUIR, V25, P12408, DOI 10.1021/la901648y
   Xiao SG, 2013, J MICRO-NANOLITH MEM, V12, DOI 10.1117/1.JMM.12.3.031110
   Xiao SG, 2009, ADV MATER, V21, P2516, DOI 10.1002/adma.200802087
   Yang JKW, 2007, J VAC SCI TECHNOL B, V25, P2025, DOI 10.1116/1.2801881
   Yang X, 2007, J VAC SCI TECHNOL B, V25, P2202, DOI 10.1116/1.2798711
   Yang XM, 2008, J VAC SCI TECHNOL B, V26, P2604, DOI 10.1116/1.2978487
   Yang XM, 2009, ACS NANO, V3, P1844, DOI 10.1021/nn900073r
   Yang XM, 2009, IEEE T MAGN, V45, P833, DOI 10.1109/TMAG.2008.2010647
NR 21
TC 1
Z9 1
U1 4
U2 31
PU HINDAWI PUBLISHING CORPORATION
PI NEW YORK
PA 410 PARK AVENUE, 15TH FLOOR, #287 PMB, NEW YORK, NY 10022 USA
SN 1687-4110
EI 1687-4129
J9 J NANOMATER
JI J. Nanomater.
PY 2013
AR 615896
DI 10.1155/2013/615896
PG 17
WC Nanoscience & Nanotechnology; Materials Science, Multidisciplinary
SC Science & Technology - Other Topics; Materials Science
GA 290AB
UT WOS:000329722900001
ER

PT J
AU Yasukawa, Y
   Liu, XX
   Morisako, A
AF Yasukawa, Yukiko
   Liu, Xiaoxi
   Morisako, Akimitsu
TI Self-assembled ferrite nanodots on multifunctional Au nanoparticles
SO GOLD BULLETIN
LA English
DT Article
DE Sputtering; Self-assembly; Au nanoparticles; Hexaferrite; Magnetic
   nanodots
ID BIT PATTERNED MEDIA; MAGNETIC-PROPERTIES; FABRICATION; FILMS;
   LITHOGRAPHY; PERFORMANCE
AB The fabrication of magnetic oxide nanodots was studied without the use of conventional lithographic techniques and patterning masks. Self-assembled Au nanoparticles with an average size of approximately 17 nm were formed via simple sputtering and used as the underlayer for the magnetic oxide film. Subsequently, hexagonal ferrite, SrFe12O19, was sputtered on the Au nanoparticles, resulting in an SrFe12O19/Au sample. Self-assembled SrFe12O19 nanodots were obtained with an average size of 40-50 nm. The morphology of the Au nanoparticle underlayer acted as a template for the SrFe12O19 film, such that the self-assembled SrFe12O19 nanodots were formed. In addition, the fabrication of the SrFe12O19 film on the Au nanoparticles induced the down-sizing of the magnetic domain structures of SrFe12O19 to the nanoscale. Importantly, although the nanodots showed nanometric magnetic domains, a sufficient magnetization magnitude in the SrFe12O19 nanodots was revealed. Furthermore, the SrFe12O19 nanodot fabrication area was similar to 8.5 cm(2), thereby the current technique can be applied to the development of future functional magnetic nanodots.
C1 [Yasukawa, Yukiko; Liu, Xiaoxi; Morisako, Akimitsu] Shinshu Univ, Fac Engn, Dept Comp Sci & Engn, Nagano 3808553, Japan.
RP Yasukawa, Y (reprint author), Shinshu Univ, Fac Engn, Dept Comp Sci & Engn, 4-17-1 Wakasato, Nagano 3808553, Japan.
EM yasukawa@shinshu-u.ac.jp
RI Liu, Xiaoxi/P-6470-2014
FU Japan Society for the Promotion of Science (JSPS) [23760280]
FX This work was financially supported by a Grant-in-Aid for Young
   Scientists (B) No. 23760280 from the Japan Society for the Promotion of
   Science (JSPS).
CR ACHARYA BR, 1994, APPL PHYS LETT, V64, P1579, DOI 10.1063/1.111845
   Adam JP, 2010, NANOTECHNOLOGY, V21, DOI 10.1088/0957-4484/21/44/445302
   Albrecht M, 2012, OPEN SURF SCI J, V4, P42
   Anirudhan TS, 2012, J MATER CHEM, V22, P12888, DOI 10.1039/c2jm31794j
   Asghar G, 2012, KEY ENG MATER, V510-511, P330, DOI 10.4028/www.scientific.net/KEM.510-511.330
   Chappert C, 1998, SCIENCE, V280, P1919, DOI 10.1126/science.280.5371.1919
   Chikazumi S, 2006, HDB MAGNETIC MAT
   Dong Q, 2012, ADV MATER, V24, P1034, DOI 10.1002/adma.201104171
   Grobis MK, 2011, IEEE T MAGN, V47, P6, DOI 10.1109/TMAG.2010.2076798
   Hellwig O, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3293301
   Kaewrawang A., 2010, Journal of the Magnetics Society of Japan, V34, DOI 10.3379/msjmag.1003R040
   Kaewrawang A, 2010, J MAGN MAGN MATER, V322, P2043, DOI 10.1016/j.jmmm.2010.01.031
   Kaewrawang A, 2010, J ALLOY COMPD, V492, P44, DOI 10.1016/j.jallcom.2009.11.174
   Kaewrawang A, 2008, IEEE T MAGN, V44, P2899, DOI 10.1109/TMAG.2008.2002584
   LAMBERT SE, 1991, J APPL PHYS, V69, P4724, DOI 10.1063/1.348260
   Mink JE, 2012, NANO LETT, V12, P791, DOI 10.1021/nl203801h
   Perigo EA, 2012, NANOTECHNOLOGY, V23, DOI 10.1088/0957-4484/23/17/175704
   Rettner CT, 2001, IEEE T MAGN, V37, P1649, DOI 10.1109/20.950927
   Schmid GM, 2009, J VAC SCI TECHNOL B, V27, P573, DOI 10.1116/1.3081981
   Sohn JS, 2009, NANOTECHNOLOGY, V20, DOI 10.1088/0957-4484/20/2/025302
   Suharyadi E, 2011, J APPL PHYS, V109
   Yang JKW, 2011, NANOTECHNOLOGY, V22, DOI 10.1088/0957-4484/22/38/385301
   YANG XH, 2008, J WUHAN BOT RES, V26, P1
   Yoshida S, 1990, THIN FILMS
   Zhou QG, 2011, J APPL PHYS, V109, DOI 10.1063/1.3561362
NR 25
TC 2
Z9 2
U1 0
U2 14
PU SPRINGER HEIDELBERG
PI HEIDELBERG
PA TIERGARTENSTRASSE 17, D-69121 HEIDELBERG, GERMANY
SN 0017-1557
J9 GOLD BULL
JI Gold Bull.
PY 2013
VL 46
IS 3
BP 153
EP 159
DI 10.1007/s13404-013-0092-y
PG 7
WC Chemistry, Inorganic & Nuclear; Chemistry, Physical; Materials Science,
   Multidisciplinary
SC Chemistry; Materials Science
GA 221CQ
UT WOS:000324635400004
ER

PT J
AU Limwongse, T
   Thainoi, S
   Panyakeow, S
   Kanjanachuchai, S
AF Limwongse, Teeravat
   Thainoi, Supachok
   Panyakeow, Somsak
   Kanjanachuchai, Songphol
TI InGaAs Quantum Dots on Cross-Hatch Patterns as a Host for Diluted
   Magnetic Semiconductor Medium
SO JOURNAL OF NANOMATERIALS
LA English
DT Article
ID ROOM-TEMPERATURE; GROWTH
AB Storage density on magnetic medium is increasing at an exponential rate. The magnetic region that stores one bit of information is correspondingly decreasing in size and will ultimately reach quantum dimensions. Magnetic quantum dots (QDs) can be grown using semiconductor as a host and magnetic constituents added to give them magnetic properties. Our results show how molecular beam epitaxy and, particularly, lattice-mismatched heteroepitaxy can be used to form laterally aligned, high-density semiconducting host in a single growth run without any use of lithography or etching. Representative results of how semiconductor QD hosts arrange themselves on various stripes and cross-hatch patterns are reported.
C1 [Limwongse, Teeravat; Thainoi, Supachok; Panyakeow, Somsak; Kanjanachuchai, Songphol] Chulalongkorn Univ, Dept Elect Engn, Fac Engn, Nanotec Ctr Excellence,Semicond Device Res Lab, Bangkok 10330, Thailand.
RP Kanjanachuchai, S (reprint author), Chulalongkorn Univ, Dept Elect Engn, Fac Engn, Nanotec Ctr Excellence,Semicond Device Res Lab, Bangkok 10330, Thailand.
EM songphol.k@chula.ac.th
RI Kanjanachuchai, Songphol/C-1558-2012
OI Kanjanachuchai, Songphol/0000-0003-4622-4176
FU I/UCRC in HDD Component, the Faculty of Engineering, Khon Kaen
   University [CPN RD 01-18-53]; NSTDA via Nectec and Nanotec; Thailand
   Research Fund [DPG5380002, RSA5580015]; Higher Education Research
   Promotion and National Research University Project of Thailand, Office
   of the Higher Education Commission [EN1180A-56]
FX Pornchai Changmoang is acknowledged for maintaining the MBE system. This
   work is partially funded by I/UCRC in HDD Component, the Faculty of
   Engineering, Khon Kaen University (CPN R&D 01-18-53); NSTDA via Nectec
   and Nanotec; Thailand Research Fund (DPG5380002, RSA5580015); and the
   Higher Education Research Promotion and National Research University
   Project of Thailand, Office of the Higher Education Commission
   (EN1180A-56).
CR Bennett SP, 2008, J APPL PHYS, V104, DOI 10.1063/1.2955450
   Cao G., 2004, NANOSTRUCTURES NANOM
   Chambers S.A., 2008, NEW J PHYS, V10, DOI 10.1088/1367-2630/10/5/055004
   GRUNDMANN M, 1995, PHYS REV B, V52, P11969, DOI 10.1103/PhysRevB.52.11969
   Harrison P, 2005, QUANTUM WELLS, WIRES AND DOTS: THEORETICAL AND COMPUTATIONAL PHYSICS OF SEMICONDUCTOR NANOSTRUCTURES, 2ND EDITION, P1, DOI 10.1002/0470010827
   [Anonymous], 2011, PERP MAGN REC TECHN
   Jain M., 1992, DILUTED MAGNETIC SEM
   Jungwirth T, 2005, PHYS REV B, V72, DOI 10.1103/PhysRevB.72.165204
   Kanjanachuchai S, 2009, MICROELECTRON ENG, V86, P844, DOI 10.1016/j.mee.2009.01.020
   Kanjanachuchai S, 2011, J NANOSCI NANOTECHNO, V11, P10787, DOI 10.1166/jnn.2011.3976
   Kasap SO, 2002, PRINCIPLE ELECT MAT
   LEGOUES FK, 1990, PHYS REV B, V42, P11690, DOI 10.1103/PhysRevB.42.11690
   Limwongse T, 2009, PHYS STATUS SOLIDI C, V6, P806, DOI 10.1002/pssc.200880620
   Mirin R, 1996, ELECTRON LETT, V32, P1732, DOI 10.1049/el:19961147
   Stranski IN, 1937, SITZUNGSBERICHTE 2B, V146, P797
   Thet CC, 2007, MICROELECTRON ENG, V84, P1562, DOI 10.1016/j.mee.2007.01.118
   Thet CC, 2008, SEMICOND SCI TECH, V23, DOI 10.1088/0268-1242/23/5/055007
   Welser JJ, 1997, IEEE ELECTR DEVICE L, V18, P278, DOI 10.1109/55.585357
   Zhuang L, 1998, APPL PHYS LETT, V72, P1205, DOI 10.1063/1.121014
   Chang L. L., US patent, Patent No. 5296048
NR 20
TC 0
Z9 0
U1 0
U2 5
PU HINDAWI PUBLISHING CORP
PI NEW YORK
PA 315 MADISON AVE 3RD FLR, STE 3070, NEW YORK, NY 10017 USA
SN 1687-4110
EI 1687-4129
J9 J NANOMATER
JI J. Nanomater.
PY 2013
AR 791782
DI 10.1155/2013/791782
PG 5
WC Nanoscience & Nanotechnology; Materials Science, Multidisciplinary
SC Science & Technology - Other Topics; Materials Science
GA 181KK
UT WOS:000321666300001
ER

PT J
AU Razaghi, M
   Nosratpour, A
   Das, NK
AF Razaghi, M.
   Nosratpour, A.
   Das, N. K.
TI Demonstration and optimisation of an ultrafast all-optical AND logic
   gate using four-wave mixing in a semiconductor optical amplifier
SO QUANTUM ELECTRONICS
LA English
DT Article
DE optical logic gate; semiconductor optical amplifier; four wave mixing;
   nonlinear effects; finite-difference beam-propagation method; pattern
   effect; bit rate
ID MODULATION; BEAM; SOA
AB We have proposed an all-optical AND logic gate based on four-wave mixing (FWM) in a semiconductor optical amplifier (SOA) integrated with an optical filter. In the scheme proposed, the preferred logical function can be performed without using a continuous-wave (cw) signal. The modified nonlinear Schrodinger equation (MNLSE) is used for the modelling wave propagation in a SOA. The MNLSE takes into account all nonlinear effects relevant to pico- and sub-picosecond pulse durations and is solved by the finite-difference beam-propagation method (FD-BPM). Based on the simulation results, the optimal output signal with a 40-fJ energy can be obtained at a bit rate of 50 Gb s(-1). In the simulations, besides the nonlinearities included in the model, the pattern effect of the signals propagating in the SOA medium and the effect of the input signal bit rate are extensively investigated to optimise the system performance.
C1 [Nosratpour, A.] Islamic Azad Univ, Dept Elect Engn, Sanandaj Branch, Sanandaj, Iran.
   [Das, N. K.] Curtin Univ Technol, Dept Elect & Comp Engn, Perth, WA 6845, Australia.
EM m.razaghi@uok.ac.ir
CR Das NK, 2000, IEEE J QUANTUM ELECT, V36, P1184, DOI 10.1109/3.880659
   Dong H, 2006, OPT COMMUN, V265, P79, DOI 10.1016/j.optcom.2006.02.045
   Han LY, 2008, CHINESE PHYS LETT, V25, P3901, DOI 10.1088/0256-307X/25/11/018
   Hong MY, 1996, IEEE J SEL TOP QUANT, V2, P523, DOI 10.1109/2944.571753
   Hosseini SR, 2012, OPT LASER TECHNOL, V44, P528, DOI 10.1016/j.optlastec.2011.08.016
   Ibrahim TA, 2003, IEEE PHOTONIC TECH L, V15, P1422, DOI 10.1109/LPT.2003.818049
   Kim S. H, 2006, P 6 INT C NUM SIM OP, p[91, 92]
   Kumar S, 2006, OPT EXPRESS, V14, P5092, DOI 10.1364/OE.14.005092
   Li PL, 2006, OPT EXPRESS, V14, P11839, DOI 10.1364/OE.14.011839
   Li Z, 2005, ELECTRON LETT, V41, P1397, DOI 10.1049/el:20053385
   Razaghi M, 2009, OPT QUANT ELECTRON, V41, P513, DOI 10.1007/s11082-009-9352-8
   Razaghi M, 2009, J LIGHTWAVE TECHNOL, V27, P3162, DOI 10.1109/JLT.2008.2008823
   Xu J, 2007, P SOC PHOTO-OPT INS, V6782, P78209, DOI 10.1117/12.745556
   Xu J, 2010, IEEE J QUANTUM ELECT, V46, P87, DOI 10.1109/JQE.2009.2027341
   Ye L., 2010, P 15 OPT COMM C OECC, p[195, 194]
   Zhang XL, 2004, OPT EXPRESS, V12, P361, DOI 10.1364/OPEX.12.000361
NR 16
TC 0
Z9 0
U1 0
U2 6
PU TURPION LTD
PI BRISTOL
PA C/O TURPION LTD, IOP PUBLISHING, TEMPLE CIRCUS, TEMPLE WAY, BRISTOL BS1
   6HG, ENGLAND
SN 1063-7818
EI 1468-4799
J9 QUANTUM ELECTRON+
JI Quantum Electron.
PY 2013
VL 43
IS 2
BP 184
EP 187
DI 10.1070/QE2013v043n02ABEH014855
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 104NR
UT WOS:000316001500019
ER

PT J
AU Shi, YJ
   Nutter, PW
   Miles, JJ
AF Shi, Yuanjing
   Nutter, Paul W.
   Miles, Jim J.
TI Performance Evaluation of Bit Patterned Media Channels with Island Size
   Variations
SO IEEE TRANSACTIONS ON COMMUNICATIONS
LA English
DT Article
DE Bit-error-rate; Viterbi algorithm; bit patterned media; error event
ID RECORDING MEDIA; STORAGE; INTERFERENCE
AB Bit Patterned Media (BPM) are a possible technology for use in future hard disk drives where a single nanoscale island is used to store each bit of information. However, the imperfect island fabrication process results in unavoidable variations in the geometry of the islands, which introduces deterministic changes in the replay signal and leads to errors in the conventional Maximum Likelihood (ML) detector. If the detector can be extended to include estimates of island size, then detector decisions can be improved and error rates reduced. A read channel is proposed that reduces the impact of island size variations by modifying the detector trellis to include two extra branches per state transition to improve the data error rate at the output of the detector. An analytical model of the modified read channel is developed that is capable of rapidly estimating the bit-error-rate (BER) performance so that the modified read channel trellis parameters can be optimized to maximize the BER improvement offered by the proposed detector. In order to verify the performance of the analytical model its output is compared with that produced from a numerical model, which takes full account of multi-bit inter-symbol interference.
C1 [Shi, Yuanjing; Nutter, Paul W.; Miles, Jim J.] Univ Manchester, Sch Comp Sci, Manchester M13 9PL, Lancs, England.
RP Shi, YJ (reprint author), Univ Manchester, Sch Comp Sci, Manchester M13 9PL, Lancs, England.
EM p.nutter@manchester.ac.uk
FU EPSRC [EP/E017657/1]; Information Storage Industry Consortium (INSIC)
   EHDR Program
FX This work was supported by EPSRC (PhD), EPSRC under Grant No.
   EP/E017657/1 and by the Information Storage Industry Consortium (INSIC)
   EHDR Program.
CR Albrecht M, 2002, J APPL PHYS, V91, P6845, DOI 10.1063/1.1447174
   Altekar SA, 1999, IEEE T INFORM THEORY, V45, P241, DOI 10.1109/18.746796
   Caroselli J., P 1998 GLOB TEL C
   Chou SY, 1997, P IEEE, V85, P652, DOI 10.1109/5.573754
   Cideciyan R. D., P 2001 IEEE INT C CO
   FORNEY GD, 1972, IEEE T INFORM THEORY, V18, P363, DOI 10.1109/TIT.1972.1054829
   Kikitsu A, 2009, J MAGN MAGN MATER, V321, P526, DOI 10.1016/j.jmmm.2008.05.039
   Kryder MH, 2005, J MAGN MAGN MATER, V287, P449, DOI 10.1016/j.jmmm.2004.10.075
   Luderman L. C., 2003, RANDOM PROCESSES FIL
   MOON JY, 1995, IEEE T MAGN, V31, P1083, DOI 10.1109/20.364789
   Nabavi S, 2007, IEEE T MAGN, V43, P2274, DOI 10.1109/TMAG.2007.893479
   Nabavi S, 2010, IEEE J SEL AREA COMM, V28, P135, DOI 10.1109/JSAC.2010.100202
   Nabavi S, 2008, IEEE T MAGN, V44, P3789, DOI 10.1109/TMAG.2008.2002387
   Nutter PW, 2008, IEEE T MAGN, V44, P3797, DOI 10.1109/TMAG.2008.2002516
   Nutter PW, 2005, IEEE T MAGN, V41, P3214, DOI 10.1109/TMAG.2005.854780
   Nutter PW, 2005, IEEE T MAGN, V41, P4327, DOI 10.1109/TMAG.2005.856586
   Nutter PW, 2004, IEEE T MAGN, V40, P3551, DOI 10.1109/TMAG.2004.835697
   Richter HJ, 2007, J PHYS D APPL PHYS, V40, pR149, DOI 10.1088/0022-3727/40/9/R01
   Richter H. J., P 2006 IEEE INT MAGN
   Ross C, 2001, ANN REV MATER RES, V31, P203, DOI 10.1146/annurev.matsci.31.1.203
   Runsheng H., P 1999 GLOB TEL C
   Sawaguchi H, 2001, J MAGN MAGN MATER, V235, P265, DOI 10.1016/S0304-8853(01)00357-2
   Seungjune J., P 2007 GLOB TEL C
   Shi YJ, 2010, IEEE T MAGN, V46, P1755, DOI 10.1109/TMAG.2010.2041047
   Shiroishi Y, 2009, IEEE T MAGN, V45, P3816, DOI 10.1109/TMAG.2009.2024879
   Terris BD, 2009, J MAGN MAGN MATER, V321, P512, DOI 10.1016/j.jmmm.2008.05.046
   Thomson T., 2007, NATO SCI PEACE SEC B, P237
   Wang S. X., 1998, MAGNETIC INFORM STOR
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
   White RL, 2000, J MAGN MAGN MATER, V209, P1, DOI 10.1016/S0304-8853(99)00632-0
   Wood R, 2000, IEEE T MAGN, V36, P36, DOI 10.1109/20.824422
   Wood R. W., P 2006 IEEE INT MAGN
NR 32
TC 0
Z9 0
U1 2
U2 5
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0090-6778
J9 IEEE T COMMUN
JI IEEE Trans. Commun.
PD JAN
PY 2013
VL 61
IS 1
BP 228
EP 236
DI 10.1109/TCOMM.2012.101812.120193
PG 9
WC Engineering, Electrical & Electronic; Telecommunications
SC Engineering; Telecommunications
GA 090IZ
UT WOS:000314974000023
ER

PT J
AU Li, HJ
   Wei, D
   Piramanayagam, SN
AF Li, Hongjia
   Wei, Dan
   Piramanayagam, S. N.
TI Micromagnetic study of effect of tip-coating microstructure on the
   resolution of magnetic force microscopy
SO APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
LA English
DT Article
ID MEDIA
AB The properties of a magnetic force microscopy (MFM) tip are very important for high-resolution magnetic imaging. In this work, micromagnetic models of tips are set up to study the effect of tip-coating microstructure, especially the randomness of anisotropy on tip edge and tip end, on the resolution of MFM. The effective coating height and the resolution potential of tips with various microstructures and magnetic properties have been characterized by investigating the obtained signals from high-density continuous granular thin film disk media with a bit size of 8x16 nm(2) and bit-patterned media with a pattern period p of 50 nm. The magnetic moment distribution at the tip end should be perpendicular to the sample to realize a 'magnetically sharp' tip, which explains further the improved resolution in the recent experimental reports. Tips with well-controlled grain structure and magnetic anisotropy of coating materials can be applied to both high-density thin film disk media and bit-patterned media.
C1 [Li, Hongjia; Wei, Dan] Tsinghua Univ, Dept Mat Sci & Engn, Adv Mat Lab, Beijing 100084, Peoples R China.
   [Piramanayagam, S. N.] ASTAR, Data Storage Inst, Singapore 117608, Singapore.
RP Wei, D (reprint author), Tsinghua Univ, Dept Mat Sci & Engn, Adv Mat Lab, Beijing 100084, Peoples R China.
EM weidan@mail.tsinghua.edu.cn
RI Piramanayagam, SN/A-4192-2008
OI Piramanayagam, SN/0000-0002-3178-2960
FU NSFC [51071088]
FX The authors are thankful for the support of NSFC 51071088.
CR Amos N, 2008, APPL PHYS LETT, V93, DOI 10.1063/1.3036533
   Amos N, 2009, J APPL PHYS, V105, DOI 10.1063/1.3068625
   Candocia FM, 2004, NANOTECHNOLOGY, V15, pS575, DOI 10.1088/0957-4484/15/10/014
   FISCHER PB, 1993, J VAC SCI TECHNOL B, V11, P2570, DOI 10.1116/1.586626
   Gao L, 2004, IEEE T MAGN, V40, P2194, DOI 10.1109/TMAG.2004.829173
   GRUTTER P, 1990, APPL PHYS LETT, V57, P1820
   Huang HS, 2007, SCRIPTA MATER, V56, P365, DOI 10.1016/j.scriptamat.2006.11.014
   Kuramochi H, 2005, NANOTECHNOLOGY, V16, P24, DOI [10.1088/0957-4484/16/1/006, 10.1080/0957-4484/16/1/006]
   Li HJ, 2012, J APPL PHYS, V111, DOI 10.1063/1.3671785
   MARTIN Y, 1987, APPL PHYS LETT, V50, P1455, DOI 10.1063/1.97800
   Ohtake M, 2012, J APPL PHYS, V111, DOI 10.1063/1.3678298
   Piramanayagam SN, 2007, J APPL PHYS, V102, DOI 10.1063/1.2750414
   Piramanayagam SN, 2011, J APPL PHYS, V109, DOI 10.1063/1.3551733
   Porthun S, 1998, J MAGN MAGN MATER, V182, P238, DOI 10.1016/S0304-8853(97)01010-X
   Rettner CT, 2002, IEEE T MAGN, V38, P1725, DOI 10.1109/TMAG.2002.1017763
   SCHONENBERGER C, 1990, Z PHYS B CON MAT, V80, P373, DOI 10.1007/BF01323519
   Wei D, 2009, IEEE T MAGN, V45, P3035, DOI 10.1109/TMAG.2009.2017260
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
   WRIGHT CD, 1995, APPL PHYS LETT, V67, P433, DOI 10.1063/1.114623
   Yang JKW, 2011, NANOTECHNOLOGY, V22, DOI 10.1088/0957-4484/22/38/385301
NR 20
TC 1
Z9 1
U1 0
U2 30
PU SPRINGER
PI NEW YORK
PA 233 SPRING ST, NEW YORK, NY 10013 USA
SN 0947-8396
J9 APPL PHYS A-MATER
JI Appl. Phys. A-Mater. Sci. Process.
PD JAN
PY 2013
VL 110
IS 1
BP 217
EP 225
DI 10.1007/s00339-012-7117-x
PG 9
WC Materials Science, Multidisciplinary; Physics, Applied
SC Materials Science; Physics
GA 064HX
UT WOS:000313065900032
ER

PT J
AU Xu, S
   Liu, J
   Chen, JC
   Liu, B
AF Xu, Shu
   Liu, Jie
   Chen, Jincai
   Liu, Bo
TI Patterned Bit Cell Arrangement and Broadening of Switching Field
   Distribution Caused by Magneto-Static Interactions
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Bit cell arrangement; manufacturing induced deviations; patterned media;
   switching field distribution
ID TB/IN(2); MEDIA
AB Patterned media technology is a promising approach for future high density magnetic data storage. The bit-to-bit spacing becomes smaller as recording density increases. As a result, the magneto-static field from the surrounding bits becomes stronger, and contributes more to the broadening of the switching field distribution (SFD) of targeted bit. This paper reports the investigations between possible bit-cell arrangements and SFD broadening caused by the magneto-static field. The possible bit-cell arrangements are categorized into three groups-square arrangement, isosceles triangular arrangement, and equilateral triangular arrangement. The influences of manufacturing induced deviations, including bit-cell position offset and bit-cell size variation, over the are also simulated. The results suggested that isosceles triangular arrangement can reduce the SFD broadening, without increasing the requirement on track positioning accuracy.
C1 [Xu, Shu; Liu, Jie; Chen, Jincai] Huazhong Univ Sci & Technol, Wuhan Natl Lab Optoelect, Wuhan 430074, Peoples R China.
   [Liu, Bo] Data Storage Inst, Singapore 117608, Singapore.
RP Xu, S (reprint author), Huazhong Univ Sci & Technol, Wuhan Natl Lab Optoelect, Wuhan 430074, Peoples R China.
EM xushuchina@gmail.com
FU National Natural Science Foundation of China [61272068]
FX This work was supported by the National Natural Science Foundation of
   China under Grant 61272068.
CR Chen YJ, 2012, J MAGN MAGN MATER, V324, P264, DOI 10.1016/j.jmmm.2010.11.094
   Chen Y.J., 2008, APPL PHYS LETT, V93
   Dong Y, 2011, IEEE T MAGN, V47, P2652, DOI 10.1109/TMAG.2011.2148112
   Greaves SJ, 2008, IEEE T MAGN, V44, P3430, DOI 10.1109/TMAG.2008.2002365
   Greaves S. J., 2011, J APPL PHYS, V109
   Guarisco D., 2011, INT C
   Richter H.J., 2006, APPL PHYS LETT, V88
   Shiroishi Y, 2009, IEEE T MAGN, V45, P3816, DOI 10.1109/TMAG.2009.2024879
   Terris BD, 2009, J MAGN MAGN MATER, V321, P512, DOI 10.1016/j.jmmm.2008.05.046
   Yuan ZM, 2009, IEEE T MAGN, V45, P5038, DOI 10.1109/TMAG.2009.2029599
NR 10
TC 0
Z9 0
U1 0
U2 11
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JAN
PY 2013
VL 49
IS 1
BP 478
EP 482
DI 10.1109/TMAG.2012.2207733
PN 3
PG 5
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 061FD
UT WOS:000312832700002
ER

PT J
AU Wu, T
   Armand, MA
AF Wu, Tong
   Armand, Marc A.
TI The Davey-MacKay Coding Scheme for Channels With Dependent Insertion,
   Deletion, and Substitution Errors
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Bit-patterned media (BPM); Davey-MacKay (DM) construction; low-density
   parity-check (LDPC) codes; synchronization error; write channel
ID BIT-PATTERNED-MEDIA; CODES
AB In this paper, we propose a new channel model which introduces dependent insertion, deletion, and substitution (DIDS) errors. This channel model mimics the write channel found in bit-patterned media recording (BPMR) systems. It consists of a ternary Markov state channel and a two-state binary symmetric channel (BSC). The ternaryMarkov state channel produces data-dependent and paired insertion-deletion errors while the two-state BSC produces random substitution errors, as well as burst-like substitution errors in the vicinity of insertions and deletions. In addition, we modify the inner decoder of the Davey-MacKay (DM) coding scheme for the proposed channel model. For the case where there are no burst-like substitution errors, computer simulations show that our modified inner decoder (which takes into account the dependencies between synchronization errors) yields superior frame error rate (FER) performance compared to that when the symbol-level inner decoder by Briffa et al. (which ignores the dependencies between synchronization errors) is used. As the (computational) complexity of our inner decoder increases with the length of the burst-like substitution errors, we further propose a reduced-complexity variant of our inner decoder to handle these errors. Computer simulations show that under iterative decoding, FERs below can be achieved with the reduced-complexity variant and a code of rate 0.71, when the insertion/deletion rates are low and the burst-like error lengths before and after a synchronization error are short.
C1 [Wu, Tong; Armand, Marc A.] Natl Univ Singapore, Dept Elect & Comp Engn, Singapore 117576, Singapore.
RP Armand, MA (reprint author), Natl Univ Singapore, Dept Elect & Comp Engn, Singapore 117576, Singapore.
EM eleama@nus.edu.sg
FU Singapore National Research Foundation under CRP [NRF-CRP4-2008-06]
FX The authors would like to thank the anonymous reviewers for their
   insightful comments and suggestions which helped improve the quality of
   this paper. This work was supported by the Singapore National Research
   Foundation under CRP Award NRF-CRP4-2008-06.
CR Briffa J., 2010, P IEEE INT C COMM CA, P1
   Davey MC, 2001, IEEE T INFORM THEORY, V47, P687, DOI 10.1109/18.910582
   Iyengar AR, 2011, IEEE T MAGN, V47, P35, DOI 10.1109/TMAG.2010.2080667
   Jiao X., 2011, P IEEE INT S INF THE, P747
   Mercier H, 2010, IEEE COMMUN SURV TUT, V12, P87, DOI 10.1109/SURV.2010.020110.00079
   Ng YB, 2010, IEEE T MAGN, V46, P2268, DOI 10.1109/TMAG.2010.2043926
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Zhang SH, 2011, IEEE T MAGN, V47, P2555, DOI 10.1109/TMAG.2011.2155628
   Zhang SH, 2010, IEEE T MAGN, V46, P1363, DOI 10.1109/TMAG.2010.2040713
NR 9
TC 8
Z9 8
U1 0
U2 1
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JAN
PY 2013
VL 49
IS 1
BP 489
EP 495
DI 10.1109/TMAG.2012.2208120
PN 3
PG 7
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 061FD
UT WOS:000312832700004
ER

PT J
AU Akagi, F
   Ushiyama, J
   Miyamoto, H
   Mita, S
AF Akagi, Fumiko
   Ushiyama, Junko
   Miyamoto, Harukazu
   Mita, Seiichi
TI Read-head Conditions for Obtaining Areal Recording Density of 5.8
   Tbit/in.(2) on a Bit-Patterned Medium
SO JAPANESE JOURNAL OF APPLIED PHYSICS
LA English
DT Article
ID FIELD; DESIGN
AB The optimum magneto-resistive read-head (MR head) conditions, namely, read track width (TWR) and shield gap (G(s)), with a bit-patterned medium (BPM) for areal recording density of 5.8 Tbit/in.(2) were determined by analytical calculation. Signal-to-noise ratio at a linear recording density of 1124 kfci (SNR1124kfci) and crosstalk were calculated in consideration of head noise, and optimum TWR and G(s) were obtained from the calculation results. The effect of intertrack interference cancellation (ITIC) was investigated by using a signal-processing simulator. The investigation shows that intertrack interference cancellation decreases bit error rate. Moreover, to obtain bit error rate of 10(-3) and SNR1124kfci of 14 dB, TWR can be increased to about two times track pitch for G(s) of 15 nm. For obtaining SNR1124kfci of 14 dB, TWR should be 15 nm at sigma/D-ave of 5% or TWR should be 11 nm at sigma/D-ave of 10%. These results demonstrate that ITIC effectively decreases bit error rate and thus contributes to attaining areal recording density of 5.8 Tbit/in.(2). (C) 2013 The Japan Society of Applied Physics
C1 [Akagi, Fumiko; Ushiyama, Junko; Miyamoto, Harukazu] Hitachi Ltd, Cent Res Lab, Kokubunji, Tokyo 1858601, Japan.
   [Mita, Seiichi] Toyota Technol Inst, Nagoya, Aichi 4688511, Japan.
RP Akagi, F (reprint author), Hitachi Ltd, Cent Res Lab, Kokubunji, Tokyo 1858601, Japan.
CR Akagi F, 2004, JPN J APPL PHYS 1, V43, P7483, DOI 10.1143/JJAP.43.7483
   Akagi F, 2009, Journal of the Magnetics Society of Japan, V33, P38, DOI 10.3379/msjmag.090R1A8071
   Akagi F, 2007, J APPL PHYS, V101, DOI 10.1063/1.2710546
   Akagi F, 2012, J MAGN MAGN MATER, V324, P309, DOI 10.1016/j.jmmm.2010.11.082
   Akimoto H, 2005, J APPL PHYS, V97, DOI 10.1063/1.1851881
   Greaves SJ, 2012, J APPL PHYS, V111, DOI 10.1063/1.3677679
   Honda N, 2011, IEEE T MAGN, V47, P11, DOI 10.1109/TMAG.2010.2078802
   Ibusuki T., 2011, J MAGN SOC JPN, V35, P43, DOI 10.3379/msjmag.1102R004
   Igarashi M, 2010, IEEE T MAGN, V46, P2507, DOI 10.1109/TMAG.2010.2045644
   Kikitsu A, 2007, IEEE T MAGN, V43, P3685, DOI 10.1109/TMAG.2007.902970
   Kryder MH, 2005, J MAGN MAGN MATER, V287, P449, DOI 10.1016/j.jmmm.2004.10.075
   Masuko J, 2009, Journal of the Magnetics Society of Japan, V33, DOI 10.3379/msjmag.0901RA8018
   Matsumoto T, 2004, J APPL PHYS, V95, P3901, DOI 10.1063/1.1669052
   Matsumoto T, 2012, OPT EXPRESS, V20, P18946, DOI 10.1364/OE.20.018946
   Mita S., 2009, MR200942 IEICE, P35
   Mita S, 2011, IEEE T MAGN, V47, P3316, DOI 10.1109/TMAG.2011.2153834
   Nozaki Y, 2009, APPL PHYS EXPRESS, V2, DOI 10.1143/APEX.2.033002
   Richter HJ, 2009, J MAGN MAGN MATER, V321, P467, DOI 10.1016/j.jmmm.2008.04.161
   Saga H, 1999, JPN J APPL PHYS 1, V38, P1839, DOI 10.1143/JJAP.38.1839
   Seigler MA, 2008, IEEE T MAGN, V44, P119, DOI 10.1109/TMAG.2007.911029
   Suzuki Y, 2001, IEEE T MAGN, V37, P1337, DOI 10.1109/20.950834
   Suzuki Y, 1998, IEEE T MAGN, V34, P1513, DOI 10.1109/20.706600
   Terris BD, 2009, J MAGN MAGN MATER, V321, P512, DOI 10.1016/j.jmmm.2008.05.046
   Thirion C, 2003, NAT MATER, V2, P524, DOI 10.1038/nmat946
   Wang XB, 2003, J APPL PHYS, V93, P7005, DOI 10.1063/1.1540139
   Wang XB, 2009, APPL PHYS LETT, V94, DOI 10.1063/1.3141455
   White RL, 2000, J MAGN MAGN MATER, V209, P1, DOI 10.1016/S0304-8853(99)00632-0
   Yang XM, 2009, IEEE T MAGN, V45, P833, DOI 10.1109/TMAG.2008.2010647
   Zhang SH, 2010, IEEE T MAGN, V46, P1363, DOI 10.1109/TMAG.2010.2040713
   Zhu JG, 2008, IEEE T MAGN, V44, P125, DOI 10.1109/TMAG.2007.911031
NR 30
TC 0
Z9 0
U1 1
U2 14
PU JAPAN SOC APPLIED PHYSICS
PI TOKYO
PA KUDAN-KITA BUILDING 5TH FLOOR, 1-12-3 KUDAN-KITA, CHIYODA-KU, TOKYO,
   102-0073, JAPAN
SN 0021-4922
J9 JPN J APPL PHYS
JI Jpn. J. Appl. Phys.
PD JAN
PY 2013
VL 52
IS 1
AR 013002
DI 10.7567/JJAP.52.013002
PN 1
PG 6
WC Physics, Applied
SC Physics
GA 059UR
UT WOS:000312731500022
ER

PT J
AU Dobrota, CI
   Stancu, A
AF Dobrota, Costin-Ionut
   Stancu, Alexandru
TI PKP simulation of size effect on interaction field distribution in
   highly ordered ferromagnetic nanowire arrays
SO PHYSICA B-CONDENSED MATTER
LA English
DT Article
DE Magnetic nanowires; FORC diagram method; Local interaction mean field
ID 1ST-ORDER REVERSAL CURVES; PREISACH MODEL; NI NANOWIRES; MAGNETIC
   CHARACTERIZATION; HENKEL PLOTS; HYSTERESIS; DIAGRAMS; SYSTEMS; STOP;
   PLAY
AB Perpendicular structured nanowire arrays interaction field distributions (IFDs), as revealed from first-order reversal curves (FORC) diagrams, are related to the presence of the demagnetizing field in the system. Despite the similarity between the geometric properties of bit patterned media and mentioned nanowire arrays, FORC diagrams of these two types of systems are not similar essentially due to the different number of magnetic entities influencing the switch of an individual element. We show that one Preisach-Krasnosel'skii-Pokrovskii (PKP) symmetrical hysteron can be representative of an ideal infinite nanowire array when the field is applied along the wires. Starting from this observation, we present a very simple model based on PKP symmetrical hysterons that can be applied to real finite ferromagnetic nanowire arrays, and is able to describe a wide class of experimentally observed FORC distributions, revealing features due to size effects. We also present IFDs modeled for different geometric characteristics such as array size, interwire distance, and nanowire dimensions, and an identification procedure for the proposed model. (C) 2012 Elsevier B.V. All rights reserved.
C1 [Dobrota, Costin-Ionut; Stancu, Alexandru] Alexandru Ioan Cuza Univ, Fac Phys, Iasi 700506, Romania.
RP Stancu, A (reprint author), Alexandru Ioan Cuza Univ, Fac Phys, Iasi 700506, Romania.
EM alstancu@uaic.ro
RI Stancu, Alexandru/B-4905-2008
OI Stancu, Alexandru/0000-0001-7564-5880
FU European Social Fund in Romania [POSDRU/88/1.5/S/47646]; Romanian
   CNCS-UEFISCDI Project IDEI-EXOTIC [185/25.10.2011]
FX This work was partially supported by the European Social Fund in
   Romania, under the responsibility of the Managing Authority for the
   Sectorial Operational Program for Human Resources Development 2007-2013
   (Grant POSDRU/88/1.5/S/47646). The authors also acknowledge the support
   given by Romanian CNCS-UEFISCDI Project IDEI-EXOTIC no. 185/25.10.2011.
CR BASSO V, 1994, J APPL PHYS, V75, P5677, DOI 10.1063/1.355635
   Beron F, 2006, IEEE T MAGN, V42, P3060, DOI 10.1109/TMAG.2006.880147
   Beron F, 2008, IEEE T MAGN, V44, P2745, DOI 10.1109/TMAG.2008.2002000
   Bobbio S, 1997, IEEE T MAGN, V33, P4417, DOI 10.1109/20.649875
   Bodale I, 2011, IEEE T MAGN, V47, P192, DOI 10.1109/TMAG.2010.2083679
   BROKATE M, 1989, IEEE T MAGN, V25, P2922, DOI 10.1109/20.34325
   Clime L, 2006, J MAGN MAGN MATER, V297, P60, DOI 10.1016/j.jmmm.2005.02.060
   DELLATORRE E, 1965, J APPL PHYS, V36, P518
   Dumitru I, 2005, IEEE T MAGN, V41, P3361, DOI 10.1109/TMAG.2005.854707
   Iyer RV, 2009, IEEE CONTR SYST MAG, V29, P83, DOI 10.1109/MCS.2008.930924
   Krasnosel'skii M A, 1989, SYSTEMS HYSTERESIS
   Lavin R, 2008, IEEE T MAGN, V44, P2808, DOI 10.1109/TMAG.2008.2001814
   Matsuo T, 2005, IEEE T MAGN, V41, P1548, DOI 10.1109/TMAG.2005.845055
   MAYERGOYZ ID, 1986, IEEE T MAGN, V22, P603, DOI 10.1109/TMAG.1986.1064347
   Mayergoyz ID, 2003, MATH MODELS HYSTERES
   McGary PD, 2006, J APPL PHYS, V99, DOI 10.1063/1.2167332
   Mielke A, 2012, PHYSICA B, V407, P1330, DOI 10.1016/j.physb.2011.10.013
   Nielsch K, 2001, APPL PHYS LETT, V79, P1360, DOI 10.1063/1.1399006
   Peixoto TRF, 2008, J MAGN MAGN MATER, V320, pE279, DOI 10.1016/j.jmmm.2008.02.060
   Pike CR, 2005, PHYS REV B, V71, DOI 10.1103/PhysRevB.71.134407
   Pike CR, 1999, J APPL PHYS, V85, P6660, DOI 10.1063/1.370176
   Preisach F, 1935, Z PHYS, V94, P277, DOI 10.1007/BF01349418
   Rani VS, 2009, IEEE T MAGN, V45, P2475, DOI 10.1109/TMAG.2009.2018657
   Rotaru A, 2011, PHYS REV B, V84, DOI 10.1103/PhysRevB.84.134431
   Sellmyer DJ, 2001, J PHYS-CONDENS MAT, V13, pR433, DOI 10.1088/0953-8984/13/25/201
   Spinu L, 2004, IEEE T MAGN, V40, P2116, DOI [10.1109/TMAG.2004.829810, 10.1109/tmag.2004.829810]
   Stancu A, 2006, PHYSICA B, V372, P72, DOI 10.1016/j.physb.2005.10.022
   Stancu A, 2000, J APPL PHYS, V87, P8645, DOI 10.1063/1.373591
   Stancu A, 2003, J APPL PHYS, V93, P6620, DOI 10.1063/1.1557656
   Strijkers GJ, 1999, J APPL PHYS, V86, P5141, DOI 10.1063/1.371490
   Tanasa R, 2004, PHYSICA B, V343, P314, DOI 10.1016/j.physb.2003.08.062
   VAJDA F, 1994, J APPL PHYS, V75, P5689, DOI 10.1063/1.355638
   Vazquez M, 2004, J APPL PHYS, V95, P6642, DOI 10.1063/1.1687539
   Vazquez M, 2004, PHYSICA B, V343, P395, DOI 10.1016/j.physb.2003.08.076
   Visintin Augusto, 1994, DIFFERENTIAL MODELS
   Ye B, 2007, J MAGN MAGN MATER, V316, pE56, DOI 10.1016/j.jmmm.2007.02.026
NR 36
TC 5
Z9 5
U1 1
U2 27
PU ELSEVIER SCIENCE BV
PI AMSTERDAM
PA PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
SN 0921-4526
J9 PHYSICA B
JI Physica B
PD DEC 15
PY 2012
VL 407
IS 24
BP 4676
EP 4685
DI 10.1016/j.physb.2012.08.041
PG 10
WC Physics, Condensed Matter
SC Physics
GA 036LG
UT WOS:000311026800013
ER

PT J
AU McDaniel, TW
AF McDaniel, Terry W.
TI Areal density limitation in bit-patterned, heat-assisted magnetic
   recording using FePtX media
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article
ID QUANTUM; LIMITS
AB The future evolution of magnetic recording data storage toward its ultimate limit is expected to involve a combination of energy-assisted recording on bit-patterned media, according to recent publications. In this work, we assess the effectiveness of single magnetic grain reversal under heat-assisted recording conditions by analyzing macrospin magnetization dynamics with the Landau-Lifshitz-Bloch equation. The simulations reported pertain to FePtX recording media and recording system parameters constrained by expected practical limitations. The approach adopted is assessment of the patterned media writing error rate as a function of applied bias field and areal density (AD), taking account of the relevant physics of the heat-assisted recording process. Additionally, we require that long-term thermal stability of recorded information be maintained, and that sufficient thermal and effective writing field gradients to support AD targets are available. For the long-time analysis, an Arrhenius-Neel model of single grain switching probability is helpful. In this context, an investigation of achievable areal density with respect to tradeoffs in writing error rate at practical applied fields and thermal conditions is provided. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4764336]
C1 Model Phys, Volcano, CA 95689 USA.
RP McDaniel, TW (reprint author), Model Phys, Volcano, CA 95689 USA.
CR Bertram HN, 2000, IEEE T MAGN, V36, P2447, DOI 10.1109/20.908462
   Chubykalo-Fesenko O, 2006, PHYS REV B, V74, DOI 10.1103/PhysRevB.74.094436
   Duan HG, 2012, NANO LETT, V12, P1683, DOI 10.1021/nl3001309
   Garanin DA, 2004, PHYS REV B, V70, DOI 10.1103/PhysRevB.70.212409
   de Abajo FJG, 2012, NATURE, V483, P417, DOI 10.1038/483417a
   Kazantseva N, 2008, PHYS REV B, V77, DOI 10.1103/PhysRevB.77.184428
   Kryder MH, 2008, P IEEE, V96, P1810, DOI 10.1109/JPROC.2008.2004315
   McDaniel TW, 2012, J APPL PHYS, V112, DOI 10.1063/1.4733311
   McDaniel TW, 2005, J PHYS-CONDENS MAT, V17, pR315, DOI 10.1088/0953-8984/17/7/R01
   Myrasov O. N., 2005, EPL-EUROPHYS LETT, V69, P805
   Richter HJ, 2012, J APPL PHYS, V111, DOI 10.1063/1.3681297
   Scholl JA, 2012, NATURE, V483, P421, DOI 10.1038/nature10904
   Seigler MA, 2008, IEEE T MAGN, V44, P119, DOI 10.1109/TMAG.2007.911029
   Sendur K, 2009, APPL PHYS LETT, V94, DOI 10.1063/1.3073049
   Terris BD, 2007, MICROSYST TECHNOL, V13, P189, DOI 10.1007/s00542-006-0144-9
   Thiele JU, 2002, J APPL PHYS, V91, P6595, DOI 10.1063/1.1470254
   Weller D, 1999, IEEE T MAGN, V35, P4423, DOI 10.1109/20.809134
NR 17
TC 9
Z9 9
U1 0
U2 22
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0021-8979
J9 J APPL PHYS
JI J. Appl. Phys.
PD NOV 1
PY 2012
VL 112
IS 9
AR 093920
DI 10.1063/1.4764336
PG 10
WC Physics, Applied
SC Physics
GA 049FS
UT WOS:000311968400084
ER

PT J
AU Wang, F
   Duman, TM
AF Wang, Feng
   Duman, Tolga M.
TI Multi-Input Multi-Output Deletion Channel
SO IEEE COMMUNICATIONS LETTERS
LA English
DT Article
DE MIMO; deletion channel; marker codes; LDPC codes
ID BIT-PATTERNED MEDIA
AB We describe a new channel model suitable in certain applications, namely the multi-input multi-output (MIMO) deletion channel. This channel models the scenarios where multiple transmitters and receivers suffering from synchronization errors are employed. We then consider a coding scheme over such channels based on a serial concatenation of a low-density parity check (LDPC) code, a marker code and a layered space-time code. We design two detectors operating at the bit level which jointly achieve synchronization for the deletion channel (with the help of the marker code) and detection for the MIMO channel. Utilizing the proposed detector together with an LDPC code with powerful error-correction capabilities, we demonstrate that reliable transmission over a MIMO deletion channel is feasible.
C1 [Wang, Feng] Arizona State Univ, Sch Elect Comp & Energy Engn, Tempe, AZ 85287 USA.
   [Duman, Tolga M.] Bilkent Univ, Dept Elect & Elect Engn, TR-06800 Ankara, Turkey.
RP Wang, F (reprint author), Arizona State Univ, Sch Elect Comp & Energy Engn, Tempe, AZ 85287 USA.
EM duman@ee.bilkent.edu.tr
RI Duman, Tolga/F-4113-2015
OI Duman, Tolga/0000-0002-5187-8660
FU National Science Foundation [NSF-TF 0830611]
FX This work was funded by the National Science Foundation, under contract
   NSF-TF 0830611.
CR Akyildiz IF, 2002, COMPUT NETW, V38, P393, DOI 10.1016/S1389-1286(01)00302-4
   Davey MC, 2001, IEEE T INFORM THEORY, V47, P687, DOI 10.1109/18.910582
   Duman T. M., 2007, CODING MIMO COMMUNIA
   Fertonani D, 2011, IEEE T COMMUN, V59, P2, DOI 10.1109/TCOMM.2010.110310.090039
   Fertonani D, 2010, IEEE T INFORM THEORY, V56, P2753, DOI 10.1109/TIT.2010.2046210
   Gallager R. G., 1961, SEQUENTIAL DECODING
   Iyengar AR, 2011, IEEE T MAGN, V47, P35, DOI 10.1109/TMAG.2010.2080667
   Kschischang FR, 2001, IEEE T INFORM THEORY, V47, P498, DOI 10.1109/18.910572
   Mitzenmacher M., 2009, PROBABILITY SURVEYS, P1
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Wang F, 2011, IEEE T COMMUN, V59, P1287, DOI 10.1109/TCOMM.2011.030411.100546
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
NR 12
TC 0
Z9 0
U1 0
U2 2
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 1089-7798
J9 IEEE COMMUN LETT
JI IEEE Commun. Lett.
PD NOV
PY 2012
VL 16
IS 11
BP 1729
EP 1732
DI 10.1109/LCOMM.2012.092112.121290
PG 4
WC Telecommunications
SC Telecommunications
GA 047OX
UT WOS:000311851400003
ER

PT J
AU Dobisz, EA
   Kercher, D
   Grobis, M
   Hellwig, O
   Marinero, EE
   Weller, D
   Albrecht, TR
AF Dobisz, Elizabeth A.
   Kercher, Dan
   Grobis, Michael
   Hellwig, Olav
   Marinero, Ernesto E.
   Weller, Dieter
   Albrecht, Thomas R.
TI Fabrication of 1 Teradot/in.(2) CoCrPt bit patterned media and recording
   performance with a conventional read/write head
SO JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
LA English
DT Article
ID HYDROGEN SILSESQUIOXANE; CHALLENGES; LITHOGRAPHY
AB Teradot/in.(2) (Td/in.(2)) CoCrPt alloy bit patterned media (BPM) disks were patterned by direct write e-beam lithography, and the recording performance was measured with a commercial recording head. Recording analysis showed a minimum error rate of 2 x 10(-3), which was limited by the fraction of BPM patterning defects Continuous magnetic media disks were coated with a 20nm thick carbon hard mask film by PECVD followed by a 8.5 nm thick hydrogen silsesquioxane (HSQ) resist by spin coating. A series of 1 Td/in.(2) dot patterns were e-beam written in the HSQ, and the patterns were etched into the carbon hard mask by reactive ion etching. The underlying magnetic media was physically etched with 200 eV Ar. The carbon hard mask maximum thickness was limited by erosion of the HSQ dots during the carbon hardmask etch and shadowing of the mask during the magnetic media etch. The minimum carbon thickness and the maximum CoCrPt thickness were determined by erosion of the hardmask pillars during etching of the CoCrPt magnetic media. The optimal carbon hard mask thickness was determined to be similar to 20 nm (for our PECVD carbon). The optimal CoCrPt magnetic media thickness was 6nm, as determined by etch selectivity and magnetic properties. A Silvaco Monte Carlo 3D model simulation was used to describe the magnetic media etching process. Additional patterning steps formed physical support, surrounding the patterns, for the recording head that scanned in contact with the patterned magnetic media. Analysis of top down SEM micrographs of BPM patterns showed defect rates as low as 3 x 10(-4) and a 1-sigma dot placement tolerance of 0.9 nm. Magnetic coercivity and switching field distribution width were measured from polar magneto-optic micro Kerr effect hysteresis loops (with a spot size of 20-50 mu m). Patterning process conditions that produced a higher fraction of eroded or merged magnetic islands reduced the BPM coercivity and increased the relative width of the switching field distribution. Magnetic recording was performed with a commercial recording head of magnetic write width 90 nm in a shingled writing method. The recording error rate minimum varied with the fraction of defects in a similar manner as the magnetic switching field distribution width. A higher fraction of defects resulted in increased recording error probability due to data erasure by stray magnetic fields from the head. (C) 2012 American Vacuum Society. [http://dx.doi.org/10.1116/1.4757955]
C1 [Dobisz, Elizabeth A.; Kercher, Dan; Grobis, Michael; Hellwig, Olav; Marinero, Ernesto E.; Weller, Dieter; Albrecht, Thomas R.] A Western Digital Co, HGST, San Jose, CA 95135 USA.
RP Dobisz, EA (reprint author), A Western Digital Co, HGST, 3403 Yerba Buena Rd, San Jose, CA 95135 USA.
EM elizabeth.dobisz@hgst.com
CR Chao WL, 2009, J VAC SCI TECHNOL B, V27, P2606, DOI 10.1116/1.3242694
   Dobisz EA, 2008, P IEEE, V96, P1836, DOI 10.1109/JPROC.2008.2007600
   Grobis M, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3304166
   Grobis MK, 2011, IEEE T MAGN, V47, P6, DOI 10.1109/TMAG.2010.2076798
   Hu G, 2005, IEEE T MAGN, V41, P3589, DOI 10.1109/TMAG.2005.854733
   Kalezhi J, 2012, J APPL PHYS, V111, DOI 10.1063/1.3691947
   Katine J., 2011, 55 INT C EL ION PHOT
   Moser A, 1999, J APPL PHYS, V85, P5018, DOI 10.1063/1.370077
   Nam SW, 2009, J VAC SCI TECHNOL B, V27, P2635, DOI 10.1116/1.3245991
   Stipe BC, 2010, NAT PHOTONICS, V4, P484, DOI 10.1038/nphoton.2010.90
   STONER EC, 1948, PHILOS TR R SOC S-A, V240, P599, DOI 10.1098/rsta.1948.0007
   Weller D, 1999, IEEE T MAGN, V35, P4423, DOI 10.1109/20.809134
   Wood R, 2009, IEEE T MAGN, V45, P917, DOI 10.1109/TMAG.2008.2010676
   Yang X, 2007, J VAC SCI TECHNOL B, V25, P2202, DOI 10.1116/1.2798711
   Yang XM, 2008, J VAC SCI TECHNOL B, V26, P2604, DOI 10.1116/1.2978487
NR 15
TC 5
Z9 5
U1 2
U2 24
PU A V S AMER INST PHYSICS
PI MELVILLE
PA STE 1 NO 1, 2 HUNTINGTON QUADRANGLE, MELVILLE, NY 11747-4502 USA
SN 1071-1023
J9 J VAC SCI TECHNOL B
JI J. Vac. Sci. Technol. B
PD NOV
PY 2012
VL 30
IS 6
AR 06FH01
DI 10.1116/1.4757955
PG 8
WC Engineering, Electrical & Electronic; Nanoscience & Nanotechnology;
   Physics, Applied
SC Engineering; Science & Technology - Other Topics; Physics
GA 045AV
UT WOS:000311667300072
ER

PT J
AU Fukuda, Y
   Saotome, Y
   Nishiyama, N
   Takenaka, K
   Saidoh, N
   Makabe, E
   Inoue, A
AF Fukuda, Yasuyuki
   Saotome, Yasunori
   Nishiyama, Nobuyuki
   Takenaka, Kana
   Saidoh, Noriko
   Makabe, Eiichi
   Inoue, Akihisa
TI Fabrication of nanodot array mold with 2 Tdot/in.(2) for nanoimprint
   using metallic glass
SO JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
LA English
DT Article
ID BIT-PATTERNED-MEDIA; ALLOY THIN-FILM; DENSITY; LITHOGRAPHY; CHALLENGES;
   DEPOSITION; IMPRINT; STORAGE; DOT
AB Here, the authors fabricated a mold consisting of nanodot arrays with an 18-nm pitch and performed nanoimprinting of metallic glass for developing bitpatterned media (BPM) with an areal recording density of 2 Tbit/in.(2). Specifically, they investigated the feasibility of SiO2/Si mold fabrication by metal mask patterning with focused ion beam assisted chemical vapor deposition (FIB-CVD) and reactive ion etching (RIE). SiO2 was etched with a mixed gas of CHF3 and O-2, resulting in successful fabrication of convex nanodot arrays with an 18-nm pitch. The authors attempted nanoimprinting of Pd-based metallic glass with the fabricated SiO2 mold and clearly confirmed the replication of the fine nanohole pattern. These results suggest that the proposed FIB-CVD and RIE process is a promising method for fabricating ultrafine nanodot arrays and that metallic glasses are excellent nanoimprintable materials for mass-produced nanodevices such as BPM with ultrahigh recording density. (C) 2012 American Vacuum Society. [http://dx.doi.org/10.1116/1.4761472]
C1 [Fukuda, Yasuyuki; Makabe, Eiichi] BMG Co Ltd, Sendai, Miyagi 9830036, Japan.
   [Fukuda, Yasuyuki] Tohoku Univ, Grad Sch Engn, Dept Mat Proc, Sendai, Miyagi 9808577, Japan.
   [Saotome, Yasunori] Tohoku Univ, Inst Mat Res, Kansai Ctr, Himeji, Hyogo 6712280, Japan.
   [Nishiyama, Nobuyuki; Takenaka, Kana; Saidoh, Noriko] RIMCOF Tohoku Univ Lab, Mat Proc Technol Ctr, Sendai, Miyagi 9808577, Japan.
RP Fukuda, Y (reprint author), BMG Co Ltd, Sendai, Miyagi 9830036, Japan.
EM y_fukuda@imr.tohoku.ac.jp
RI Saotome, Yasunori/B-3267-2010; Nishiyama, Nobuyuki/C-8228-2015; Inoue,
   Akihisa/E-5271-2015
OI Saotome, Yasunori/0000-0002-6110-5573; 
FU Minister of Economy, Trade and Industry (METI)
FX This work was supported by the Minister of Economy, Trade and Industry
   (METI) under the "Technological Development of Innovate Components Based
   on Enhanced Functionality Metallic Glass Project."
CR BUFFAT P, 1976, PHYS REV A, V13, P2287, DOI 10.1103/PhysRevA.13.2287
   Chen P, 2009, NANOTECHNOLOGY, V20, DOI 10.1088/0957-4484/20/1/015302
   Chen P, 2008, JPN J APPL PHYS, V47, P5123, DOI 10.1143/JJAP.47.5123
   CHOU SY, 1994, J APPL PHYS, V76, P6673, DOI 10.1063/1.358164
   CHOU SY, 1995, APPL PHYS LETT, V67, P3114, DOI 10.1063/1.114851
   Fukuda Y, 2012, JPN J APPL PHYS, V51, DOI 10.1143/JJAP.51.086702
   Fukuda Y, 2011, MATER TRANS, V52, P239, DOI 10.2320/matertrans.M2010241
   Hosaka S, 2008, MICROELECTRON ENG, V85, P774, DOI 10.1016/j.mee.2007.12.081
   Hosaka S, 2010, JPN J APPL PHYS, V49, DOI 10.1143/JJAP.49.046503
   Inoue A, 2000, ACTA MATER, V48, P279, DOI 10.1016/S1359-6454(99)00300-6
   Kumar G, 2009, NATURE, V457, P868, DOI 10.1038/nature07718
   Lin CH, 2010, APPL PHYS A-MATER, V98, P855, DOI 10.1007/s00339-010-5552-0
   Lodder JC, 2004, J MAGN MAGN MATER, V272, P1692, DOI 10.1016/j.jmmm.2003.12.259
   Matsui S, 2000, J VAC SCI TECHNOL B, V18, P3181, DOI 10.1116/1.1319689
   Naito K, 2002, IEEE T MAGN, V38, P1949, DOI 10.1109/TMAG.2002.802847
   Nishiyama N, 2011, J ALLOY COMPD, V509, pS145, DOI 10.1016/j.jallcom.2010.12.020
   Nishiyama N, 2010, INTERMETALLICS, V18, P1983, DOI 10.1016/j.intermet.2010.02.027
   Richter HJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2209179
   Saidoh N, 2012, INTERMETALLICS, V30, P48, DOI 10.1016/j.intermet.2012.03.041
   Saotome Y, 2007, J ALLOY COMPD, V434, P97, DOI 10.1016/j.jallcom.2006.08.126
   Saotome Y, 2002, INTERMETALLICS, V10, P1241, DOI 10.1016/S0966-9795(02)00135-8
   Sbiaa R, 2007, RECENT PAT NANOTECH, V1, P29, DOI 10.2174/187221007779814754
   Solak HH, 2007, J VAC SCI TECHNOL B, V25, P2123, DOI 10.1116/1.2799974
   Takenaka K, 2012, J MAGN MAGN MATER, V324, P1444, DOI 10.1016/j.jmmm.2011.12.009
   Takenaka K, 2010, INTERMETALLICS, V18, P1969, DOI 10.1016/j.intermet.2010.02.045
   Wu W, 1998, J VAC SCI TECHNOL B, V16, P3825, DOI 10.1116/1.590417
   Yamamoto R, 2012, JPN J APPL PHYS, V51, DOI 10.1143/JJAP.51.046503
   Yang JKW, 2011, NANOTECHNOLOGY, V22, DOI 10.1088/0957-4484/22/38/385301
   Yang X, 2007, J VAC SCI TECHNOL B, V25, P2202, DOI 10.1116/1.2798711
NR 29
TC 5
Z9 5
U1 4
U2 42
PU A V S AMER INST PHYSICS
PI MELVILLE
PA STE 1 NO 1, 2 HUNTINGTON QUADRANGLE, MELVILLE, NY 11747-4502 USA
SN 1071-1023
J9 J VAC SCI TECHNOL B
JI J. Vac. Sci. Technol. B
PD NOV
PY 2012
VL 30
IS 6
AR 061602
DI 10.1116/1.4761472
PG 7
WC Engineering, Electrical & Electronic; Nanoscience & Nanotechnology;
   Physics, Applied
SC Engineering; Science & Technology - Other Topics; Physics
GA 045AV
UT WOS:000311667300093
ER

PT J
AU Kihara, N
   Yamamoto, R
   Sasao, N
   Shimada, T
   Yuzawa, A
   Okino, T
   Ootera, Y
   Kamata, Y
   Kikitsu, A
AF Kihara, Naoko
   Yamamoto, Ryousuke
   Sasao, Norikatsu
   Shimada, Takuya
   Yuzawa, Akiko
   Okino, Takeshi
   Ootera, Yasuaki
   Kamata, Yoshiyuki
   Kikitsu, Akira
TI Fabrication of 5 Tdot/in.(2) bit patterned media with servo pattern
   using directed self-assembly
SO JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
LA English
DT Article
ID BLOCK-COPOLYMERS; PHASE-BEHAVIOR; DIBLOCK COPOLYMERS; POLYMERS;
   TB/IN(2); SOLVENTS; BLENDS
AB The fabrication of an etching template for 5 Td/in.(2) bit patterned media using a self-organization material, namely, poly(styrene)-poly(dimethylsiloxane) (PS-PDMS), was investigated. The molecular weight of the PS-PDMS for forming the areal density of 5 Td/in.(2) dot pattern was estimated from the polymerization index related to the Flory-Huggins interaction parameter. Annealing was carried out to obtain a fine-order dot pattern. PS-PDMS films were subjected to thermal treatment or solvent annealing. The ordering of the dot array in these films was evaluated by using Voronoi diagrams. The results indicate that the film annealed in N-methylpyrrolidone (NMP) vapor showed finer ordering than did the thermally treated film. This seemed to be attributable to the high solubility parameter of NMP. The soaking of NMP into the PS phase slightly shifted the phase separation energy of the polymer matrix. The lattice spacing of the obtained hexagonal pattern was 11 nm. By using low-molecular-weight PS-PDMS with solvent annealing, a dot-array template for 5 Td/in.(2) bit patterned media was formed. (C) 2012 American Vacuum Society. [http://dx.doi.org/10.1116/1.4763356]
C1 [Kihara, Naoko; Yamamoto, Ryousuke; Sasao, Norikatsu; Shimada, Takuya; Yuzawa, Akiko; Okino, Takeshi; Ootera, Yasuaki; Kamata, Yoshiyuki; Kikitsu, Akira] Toshiba Co Ltd, Corp Res & Dev Ctr, Storage Mat & Devices Lab, Kawasaki, Kanagawa 2125852, Japan.
RP Kihara, N (reprint author), Toshiba Co Ltd, Corp Res & Dev Ctr, Storage Mat & Devices Lab, Kawasaki, Kanagawa 2125852, Japan.
EM naoko.kihara@toshiba.co.jp
FU New Energy and Industrial Technology Development Organization (NEDO)
   under the "Development of nanobit technology for ultra-high density
   magnetic recording (Green IT)" project
FX A part of this work was funded by the New Energy and Industrial
   Technology Development Organization (NEDO) under the "Development of
   nanobit technology for ultra-high density magnetic recording (Green IT)"
   project.
CR BATES FS, 1990, ANNU REV PHYS CHEM, V41, P525, DOI 10.1146/annurev.pc.41.100190.002521
   Black CT, 2004, IEEE ELECTR DEVICE L, V25, P622, DOI 10.1109/LED.2004.834637
   Brandrup J., 1999, POLYM HDB
   CASE FH, 1994, TRENDS POLYM SCI, V2, P259
   CHU JH, 1995, POLYMER, V36, P1569, DOI 10.1016/0032-3861(95)99001-B
   Hildebrand J. H., 1949, SOLUBILITY NONELECTR, P346
   Kamata Y, 2011, IEEE T MAGN, V47, P51, DOI 10.1109/TMAG.2010.2077274
   Lai CJ, 2002, MACROMOLECULES, V35, P841, DOI 10.1021/ma011696z
   LEIBLER L, 1980, MACROMOLECULES, V13, P1602, DOI 10.1021/ma60078a047
   Lodge TP, 2002, MACROMOLECULES, V35, P4707, DOI 10.1021/ma0200975
   Lodge TP, 2003, MACROMOLECULES, V36, P816, DOI 10.1021/ma0209601
   Mansky P, 1996, APPL PHYS LETT, V68, P2586, DOI 10.1063/1.116192
   Naito K, 2002, IEEE T MAGN, V38, P1949, DOI 10.1109/TMAG.2002.802847
   NOSE T, 1995, POLYMER, V36, P2243, DOI 10.1016/0032-3861(95)95303-I
   OHTA T, 1986, MACROMOLECULES, V19, P2621, DOI 10.1021/ma00164a028
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Ross CA, 2008, J VAC SCI TECHNOL B, V26, P2489, DOI 10.1116/1.2981079
   Son JG, 2011, ADV MATER, V23, P634, DOI 10.1002/adma.201002999
   Stoykovich MP, 2005, SCIENCE, V308, P1442, DOI 10.1126/science.1111041
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Wang Q, 2010, APPL SURF SCI, V256, P5843, DOI 10.1016/j.apsusc.2010.03.057
NR 21
TC 8
Z9 8
U1 2
U2 30
PU A V S AMER INST PHYSICS
PI MELVILLE
PA STE 1 NO 1, 2 HUNTINGTON QUADRANGLE, MELVILLE, NY 11747-4502 USA
SN 1071-1023
J9 J VAC SCI TECHNOL B
JI J. Vac. Sci. Technol. B
PD NOV
PY 2012
VL 30
IS 6
AR 06FH02
DI 10.1116/1.4763356
PG 5
WC Engineering, Electrical & Electronic; Nanoscience & Nanotechnology;
   Physics, Applied
SC Engineering; Science & Technology - Other Topics; Physics
GA 045AV
UT WOS:000311667300073
ER

PT J
AU Lille, J
   Ruiz, R
   Wan, L
   Gao, H
   Dhanda, A
   Zeltzer, G
   Arnoldussen, T
   Patel, K
   Tang, Y
   Kercher, D
   Albrecht, TR
AF Lille, J.
   Ruiz, R.
   Wan, L.
   Gao, H.
   Dhanda, A.
   Zeltzer, G.
   Arnoldussen, T.
   Patel, K.
   Tang, Y.
   Kercher, D.
   Albrecht, T. R.
TI Integration of Servo and High Bit Aspect Ratio Data Patterns on
   Nanoimprint Templates for Patterned Media
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT International Magnetics Conference (INTERMAG)
CY MAY 07-11, 2012
CL Vancouver, CANADA
SP IEEE, Magnet Soc
DE Nanoimprint lithography; patterned media; self-assembly; servo; template
ID TRACK-FOLLOWING SERVO; LITHOGRAPHY
AB Magnetic recording bit patterned media (BPM) stands as a promising technology to deliver thermally stable magnetic storage at densities beyond 1 Tb-in(2). High throughput BPM fabrication will be enabled by nanoimprint lithography which relies on a high-quality master template to be able to meet pattern fidelity and low defectivity specifications. Master template fabrication for BPM can be done by e-beam lithography alone or by e-beam directed self-assembly of block copolymers. Incorporating servo features in the fabrication of master templates brings numerous nanofabrication challenges that vary depending on which method is used. Here we demonstrate the fabrication of conventional servo features at 200 Gd-in(2) using e-beam lithography and we explore some nonconventional servo geometries that are compatible with self-assembly for BPM beyond 1 Td/in(2).
C1 [Lille, J.; Ruiz, R.; Wan, L.; Gao, H.; Dhanda, A.; Zeltzer, G.; Arnoldussen, T.; Patel, K.; Tang, Y.; Kercher, D.; Albrecht, T. R.] Hitachi San Jose Res Ctr, San Jose, CA 95135 USA.
RP Lille, J (reprint author), Hitachi San Jose Res Ctr, San Jose, CA 95135 USA.
EM jeffrey.lille@hitachigst.com
RI Zeltzer, Gabriel/L-1475-2016
OI Zeltzer, Gabriel/0000-0001-7573-4170; Ruiz, Ricardo/0000-0002-1698-4281
CR Barrett RC, 1998, IEEE T MAGN, V34, P1872, DOI 10.1109/20.706730
   Che XD, 2007, IEEE T MAGN, V43, P4106, DOI 10.1109/TMAG.2007.908279
   Cheng JY, 2008, P SOC PHOTO-OPT INS, V6921, P92127, DOI 10.1117/12.773247
   Edwards EW, 2004, ADV MATER, V16, P1315, DOI 10.1002/adma.200400763
   Hadjichristidis N., 2003, BLOCK COPOLYMER MORP
   Han Y, 2009, IEEE T MAGN, V45, P5352, DOI 10.1109/TMAG.2009.2025035
   Lille J., 2011, SPIE P PHOTOMASK TEC, V8166
   Liu G., 2011, VAC SCI TECH B, V29
   Ruiz R., 2012, SPIE LITH C SAN JOS
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Stoykovich MP, 2006, MATER TODAY, V9, P20, DOI 10.1016/S1369-7021(06)71619-4
   [Anonymous], US. Patent, Patent No. [8,000,048, 8000048]
NR 12
TC 8
Z9 8
U1 1
U2 18
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD NOV
PY 2012
VL 48
IS 11
BP 2757
EP 2760
DI 10.1109/TMAG.2012.2192916
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 025MV
UT WOS:000310194400007
ER

PT J
AU Igarashi, M
   Watanabe, K
   Hirayama, Y
   Shiroishi, Y
AF Igarashi, M.
   Watanabe, K.
   Hirayama, Y.
   Shiroishi, Y.
TI Feasibility of Bit Patterned Magnetic Recording With Microwave
   Assistance Over 5 Tbitps
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT International Magnetics Conference (INTERMAG)
CY MAY 07-11, 2012
CL Vancouver, CANADA
SP IEEE, Magnet Soc
DE Bit-patterned media (BPM); micromagnetic simulation; microwave assisted
   magnetic recording (MAMR); planar magnetic anisotropy material; spin
   torque oscillator (STO)
ID SPIN-TORQUE OSCILLATOR; ANISOTROPY
AB Microwave assisted magnetic recording (MAMR) on bit-patterned media (BPM) with areal recording density over 5 Tbit/in(2) was investigated using micromagnetic simulation and an analytical method. It was found that a planar magnetic anisotropy material is indispensable for a narrow spin torque oscillator to obtain in-plane oscillation with the required frequency. It was also found that the MAMR on BPM with an areal recording density of 6.2 Tbit/in(2) can be obtained by superimposing the write magnetic field gradient from main pole and the effective assist field gradient from field generation layer. These head and media requirements are likely to be achieved by improving the present technology.
C1 [Igarashi, M.; Watanabe, K.; Hirayama, Y.] Hitachi Ltd, Cent Res Lab, Odawara, Kanagawa 2568510, Japan.
RP Igarashi, M (reprint author), Hitachi Ltd, Cent Res Lab, Odawara, Kanagawa 2568510, Japan.
EM masukazu.igarashi.qu@hitachi.com
CR Haginoya C, 1999, J APPL PHYS, V85, P8327, DOI 10.1063/1.370678
   Honda N, 2011, IEEE T MAGN, V47, P11, DOI 10.1109/TMAG.2010.2078802
   Igarashi M, 2010, IEEE T MAGN, V46, P2507, DOI 10.1109/TMAG.2010.2045644
   Igarashi M., 2009, J APPL PHYS, V105
   Igarashi M, 2010, IEEE T MAGN, V46, P3738, DOI 10.1109/TMAG.2010.2053040
   Matsubara M, 2011, J APPL PHYS, V109, DOI 10.1063/1.3559539
   Nozaki Y, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3213559
   Okamoto S, 2008, APPL PHYS LETT, V93, DOI 10.1063/1.2977474
   Okamoto S., 2010, J APPL PHYS, V107
   Okamoto S., 2009, J MAGN SOC JPN, V33, P451
   Wang YM, 2009, J APPL PHYS, V105, DOI 10.1063/1.3067839
   Yoshida K, 2010, IEEE T MAGN, V46, P2466, DOI 10.1109/TMAG.2010.2043071
   Zhu JG, 2008, IEEE T MAGN, V44, P125, DOI 10.1109/TMAG.2007.911031
   Zhu JG, 2010, IEEE T MAGN, V46, P751, DOI 10.1109/TMAG.2009.2036588
NR 14
TC 9
Z9 9
U1 0
U2 16
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD NOV
PY 2012
VL 48
IS 11
BP 3284
EP 3287
DI 10.1109/TMAG.2012.2200882
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 025MV
UT WOS:000310194400141
ER

PT J
AU Choi, C
   Noh, K
   Choi, D
   Khamwannah, J
   Liu, CH
   Hong, D
   Chen, LH
   Jin, SH
AF Choi, Chulmin
   Noh, Kunbae
   Choi, Duyoung
   Khamwannah, Jirapon
   Liu, Chin-Hung
   Hong, Daehoon
   Chen, Li-han
   Jin, Sungho
TI Geometrically Planar Ion-Implant Patterned Magnetic Recording Media
   Using Block Copolymer Aided Gold Nanoisland Masks
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT International Magnetics Conference (INTERMAG)
CY MAY 07-11, 2012
CL Vancouver, CANADA
SP IEEE, Magnet Soc
DE Bit patterned media; nano-island
ID ELECTRON-BEAM LITHOGRAPHY; DENSITY; STORAGE; NANOPARTICLES; FABRICATION;
   GBIT/IN(2); ARRAYS; DISK
AB We have developed patterned media via ion implantation using Au nano mask approach for local control of coercivity of magnetically hard [Co/Pd](n) multilayer film. Au nano-islands produced through a di-block copolymer templated technique is used as the mask for ion implantation. The sputter deposited [Co 0.3 nm/Pd 0.8 nm](8)/Pd 3 nm/Ta 3 nm multilayer film having vertical magnetic anisotropy is coated with a diblock copolymer layer, two phase decomposed into vertically pored nanostructure, then chemically processed to nucleate gold nanoislands corresponding to the diblock copolymer nanostructures. Subsequent nitrogen (N) ion implantation, using these Au islands as implantation-blocking masks, allows a patterned penetration of implanted ions into unmasked portion of the [Co/Pd](n) multilayer film, thus creating invisible but magnetically isolated bit island geometry while maintaining the overall flat configuration of the patterned media.
C1 [Choi, Chulmin; Noh, Kunbae; Choi, Duyoung; Khamwannah, Jirapon; Liu, Chin-Hung; Hong, Daehoon; Chen, Li-han; Jin, Sungho] Univ Calif San Diego, Ctr Magnet Recording Res, La Jolla, CA 92093 USA.
RP Jin, SH (reprint author), Univ Calif San Diego, Ctr Magnet Recording Res, La Jolla, CA 92093 USA.
EM jin@ucsd.edu
RI Liu, Chin-Hung/M-1882-2013
CR Choi C, 2011, IEEE T MAGN, V47, P2532, DOI 10.1109/TMAG.2011.2158197
   Choi C, 2011, MICROSYST TECHNOL, V17, P395, DOI 10.1007/s00542-011-1222-1
   CHOU SY, 1994, J APPL PHYS, V76, P6673, DOI 10.1063/1.358164
   CHOU SY, 1994, J VAC SCI TECHNOL B, V12, P3695, DOI 10.1116/1.587642
   Hattori K, 2004, IEEE T MAGN, V40, P2510, DOI 10.1109/TMAG.2004.832244
   Hellwig O, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3293301
   Joannopoulos JD, 1997, NATURE, V386, P143, DOI 10.1038/386143a0
   Kenji S., 2010, J APPL PHYS, V107
   Klein DL, 1997, NATURE, V389, P699
   Krauss PR, 1997, APPL PHYS LETT, V71, P3174, DOI 10.1063/1.120280
   LEBOITE MG, 1988, J MATER RES, V3, P1089, DOI 10.1557/JMR.1988.1089
   Liu XG, 2002, ADV MATER, V14, P231, DOI 10.1002/1521-4095(20020205)14:3<231::AID-ADMA231>3.0.CO;2-R
   Luttge R, 2009, J PHYS D APPL PHYS, V42, DOI 10.1088/0022-3727/42/12/123001
   Naito K, 2002, IEEE T MAGN, V38, P1949, DOI 10.1109/TMAG.2002.802847
   Park HJ, 2009, ACS NANO, V3, P2601, DOI 10.1021/nn900701p
   Rahman MT, 2007, APPL PHYS LETT, V91, DOI 10.1063/1.2790788
   ROSS CA, 2000, ANN REV MATER RES, V31, P203
   Simon U, 1998, ADV MATER, V10, P1487, DOI 10.1002/(SICI)1521-4095(199812)10:17<1487::AID-ADMA1487>3.0.CO;2-W
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
   Yang X, 2007, J VAC SCI TECHNOL B, V25, P2202, DOI 10.1116/1.2798711
   Yun SH, 2006, CHEM MATER, V18, P5646, DOI 10.1021/cm0618953
NR 22
TC 2
Z9 2
U1 2
U2 14
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD NOV
PY 2012
VL 48
IS 11
BP 3402
EP 3405
DI 10.1109/TMAG.2012.2204867
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 025MV
UT WOS:000310194400171
ER

PT J
AU Xu, Q
   Kato, T
   Iwata, S
   Tsunashima, S
AF Xu, Q.
   Kato, T.
   Iwata, S.
   Tsunashima, S.
TI Bit Patterned Structure Fabricated by Kr+ Ion Irradiation onto MnBiCu
   Films
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT International Magnetics Conference (INTERMAG)
CY MAY 07-11, 2012
CL Vancouver, CANADA
SP IEEE, Magnet Soc
DE Bit patterned media (BPM); ion irradiation; MnBiCu thin film;
   perpendicular magnetic anisotropy; switching field distribution (SFD)
ID MAGNETIC-PROPERTIES; ALLOY-FILMS; THIN-FILMS; MEDIA
AB Mn54Bi24Cu21 (15 nm) films with a perpendicular anisotropy were prepared by annealing the sputtered MnCu/Bi multilayer at a temperature of 350 degrees C. The MnBiCu film had a rather flat surface of R-a = 1.1 nm, and uniform maze domain was observed before the ion irradiation. The magnetization and coercivity of the MnBiCu film were confirmed to disappear after a low Kr+ ion dose of 5 x 10(13) ions/cm(2). Bit patterned media (BPM) using the MnBiCu (15 nm) films were fabricated by 30 kV Kr+ ion irradiation through electron beam lithography-made resist masks. The surface of the ion-irradiation BPM was almost identical to that of the as-annealed film. The magnetization processes of the bit patterned media were investigated by magnetic force microscope observations after application of the magnetic field. The patterned MnBiCu bits with a size ranging from 500 x 500 nm to 300 x 300 nm have a multidomain state and their magnetization reversals undergo nucleations of the reversed domain and wall propagation. By decreasing the bit size of the patterned MnBiCu, the average switching field H-sf of the bits was increased. This means that the exchange coupling between the patterned bits and the bit edge damage were negligibly small, and shows the possibility of high density ion irradiated planar bit patterned media.
C1 [Xu, Q.; Kato, T.; Iwata, S.] Nagoya Univ, Dept Quantum Engn, Chikusa Ku, Nagoya, Aichi 4648603, Japan.
   [Tsunashima, S.] NISRI, Dept Res, Chikusa Ku, Nagoya, Aichi 4640819, Japan.
RP Kato, T (reprint author), Nagoya Univ, Dept Quantum Engn, Chikusa Ku, Furo Cho, Nagoya, Aichi 4648603, Japan.
EM takeshik@nuee.nagoya-u.ac.jp
RI Kato, Takeshi/I-2654-2013
CR Chappert C, 1998, SCIENCE, V280, P1919, DOI 10.1126/science.280.5371.1919
   CHEN D, 1968, J APPL PHYS, V39, P3916, DOI 10.1063/1.1656875
   Cho J, 1999, J APPL PHYS, V86, P3149, DOI 10.1063/1.371181
   Kato T, 2004, J MAGN MAGN MATER, V272, P778, DOI [10.1016/j.jmmm.2003.12.382, 10.1016/j.jmmm.m2003.12.382]
   Kato T, 2009, J APPL PHYS, V106, DOI 10.1063/1.3212967
   Kato T, 2009, J APPL PHYS, V105, DOI 10.1063/1.3072024
   Kato T, 2010, IEEE T MAGN, V46, P1671, DOI 10.1109/TMAG.2010.2044559
   KATSUI A, 1976, J APPL PHYS, V47, P3609, DOI 10.1063/1.323166
   Kikitsu A, 2007, IEEE T MAGN, V43, P3685, DOI 10.1109/TMAG.2007.902970
   Oshima D, 2012, J MAGN MAGN MATER, V324, P1617, DOI 10.1016/j.jmmm.2011.12.019
   Suharyadi E, 2006, IEEE T MAGN, V42, P2972, DOI 10.1109/TMAG.2006.880076
   Suharyadi E, 2005, IEEE T MAGN, V41, P3595, DOI 10.1109/TMAG.2005.854735
   SUITS JC, 1974, PHYS REV B, V10, P120, DOI 10.1103/PhysRevB.10.120
   Terris B. D., 2008, J MAGN MAGN MATER, V321, P512
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
   Xu QQ, 2012, J APPL PHYS, V111, DOI 10.1063/1.3675981
NR 16
TC 0
Z9 0
U1 0
U2 5
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD NOV
PY 2012
VL 48
IS 11
BP 3406
EP 3409
DI 10.1109/TMAG.2012.2198052
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 025MV
UT WOS:000310194400172
ER

PT J
AU Saga, H
   Shirahata, K
   Terashima, R
   Shimatsu, T
   Aoi, H
   Muraoka, H
AF Saga, Hideki
   Shirahata, Kazuki
   Terashima, Ryo
   Shimatsu, Takehito
   Aoi, Hajime
   Muraoka, Hiroaki
TI Write Margin Measurement of Bit Patterned Media With 20 nm Dots
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT International Magnetics Conference (INTERMAG)
CY MAY 07-11, 2012
CL Vancouver, CANADA
SP IEEE, Magnet Soc
DE Bit-patterned media (BPM); hard/soft-stacked; static tester; synchronous
   recording; write margin; write window
ID DENSITY
AB Bit-patterned media (BPM) with 20 nm diameter dots and a 72 nm dot period were fabricated from hard/soft-stacked base media with a [Co/Pt]-super-lattice hard layer and a Co soft layer. The write margin of synchronous recording was evaluated using a static tester. All recorded dots were in single domain state, as expected from previous experiments. The write margin was about 50 nm, and there was a total margin loss almost corresponding to the dot diameter. According to an analysis of margin loss factors based on the slope recording model, the margin loss factors for compensating effect of multidomain dots decreased drastically. Therefore it was confirmed that the slope recording model well illustrated the recording process of small dots in single-domain states. The margin loss factor due to the dot position jitter was 17.7 nm(p-p) and became the dominant loss factor. The loss factor attributable to the switching field distribution also increased rapidly to 11.3 nm(p-p) and was the second largest loss factor. To secure a sufficient write margin for a robust recording system, suppression of these degradation factors in the BPM fabrication process is required.
C1 [Saga, Hideki] Hitachi Ltd, Cent Res Lab, Kokubunji, Tokyo 1858601, Japan.
   [Saga, Hideki; Shirahata, Kazuki; Terashima, Ryo; Shimatsu, Takehito; Aoi, Hajime; Muraoka, Hiroaki] Tohoku Univ, Elect Commun Res Inst, Sendai, Miyagi 9808577, Japan.
RP Saga, H (reprint author), Hitachi Ltd, Cent Res Lab, Kokubunji, Tokyo 1858601, Japan.
EM hideki.saga.vv@hitachi.com
CR Albrecht M, 2002, APPL PHYS LETT, V80, P3409, DOI 10.1063/1.1476062
   Albrecht M, 2002, APPL PHYS LETT, V81, P2875, DOI 10.1063/1.1512946
   CHOU SY, 1994, J APPL PHYS, V76, P6673, DOI 10.1063/1.358164
   Kitakami O, 2009, Journal of Physics: Conference Series, V165, DOI 10.1088/1742-6596/165/1/012029
   Mitsuzuka K., 2009, J APPL PHYS, V105
   Muraoka Hiroaki, 2008, IEEE Transactions on Magnetics, V44, P3423, DOI 10.1109/TMAG.2008.2001654
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Saga H, 2011, IEEE T MAGN, V47, P2528, DOI 10.1109/TMAG.2011.2157478
   Saga H, 2011, J APPL PHYS, V109, DOI 10.1063/1.3554201
   Terris BD, 2005, IEEE T MAGN, V41, P2822, DOI 10.1109/TMAG.2005.855264
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
   Yamamoto SY, 1996, APPL PHYS LETT, V69, P3263, DOI 10.1063/1.118030
NR 12
TC 0
Z9 0
U1 1
U2 5
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD NOV
PY 2012
VL 48
IS 11
BP 3723
EP 3726
DI 10.1109/TMAG.2012.2198796
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 025MV
UT WOS:000310194400254
ER

PT J
AU Mate, CM
   Ruiz, OJ
   Wang, RH
   Feliss, B
   Bian, XP
   Wang, SL
AF Mate, C. Mathew
   Ruiz, Oscar J.
   Wang, Run-Han
   Feliss, Bert
   Bian, Xiaoping
   Wang, Shi-Ling
TI Tribological Challenges of Flying Recording Heads Over Unplanarized
   Patterned Media
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT International Magnetics Conference (INTERMAG)
CY MAY 07-11, 2012
CL Vancouver, CANADA
SP IEEE, Magnet Soc
DE Head-disk interface; patterned media; tribology
ID DISK INTERFACES; SLIDER; SIMULATION
AB Here we evaluate some of the problems likely to be encountered for flying magnetic recording heads over unplanarized patterned media. We demonstrate: (i) current air bearing codes developed for flying heads over smooth disks can be extended to patterned surfaces; (ii) the method for detecting contact at the head-disk interfaces within disk drives will likely need to be more sensitive for unplanarized patterned media; and (iii) the disk lubricant is more likely to be picked up on a head slider surface when flying over patterned surfaces. While our experiments and simulations were carried for discrete track media (DTM), we also discuss the implications for future bit patterned media (BPM) technology programs and possible solutions to these tribological problems.
C1 [Mate, C. Mathew; Wang, Run-Han; Feliss, Bert] HGST, San Jose Res Ctr, San Jose, CA 95135 USA.
   [Ruiz, Oscar J.; Bian, Xiaoping; Wang, Shi-Ling] HGST, San Jose, CA 95119 USA.
RP Mate, CM (reprint author), HGST, San Jose Res Ctr, San Jose, CA 95135 USA.
EM mathew.mate@hgst.com
CR Choi C, 2011, MICROSYST TECHNOL, V17, P395, DOI 10.1007/s00542-011-1222-1
   Duwensee M, 2006, IEEE T MAGN, V42, P2489, DOI 10.1109/TMAG.2006.878617
   Grobis M, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3304166
   Hanchi J, 2011, IEEE T MAGN, V47, P46, DOI 10.1109/TMAG.2010.2071857
   Knigge BE, 2004, IEEE T MAGN, V40, P3165, DOI 10.1109/TMAG.2004.828955
   Kryder MH, 2008, P IEEE, V96, P1810, DOI 10.1109/JPROC.2008.2004315
   Li JH, 2011, TRIBOL LETT, V42, P233, DOI 10.1007/s11249-011-9767-9
   Li LP, 2011, MICROSYST TECHNOL, V17, P805, DOI 10.1007/s00542-010-1191-9
   MAKINO T, 1993, J TRIBOL-T ASME, V115, P185, DOI 10.1115/1.2920974
   Marchon B, 2009, J APPL PHYS, V105, DOI 10.1063/1.3104764
   Mate CM, 2006, PHYS REV LETT, V97, DOI 10.1103/PhysRevLett.97.216104
   Mate CM, 2010, TRIBOL LETT, V37, P581, DOI 10.1007/s11249-009-9555-y
   Mate CM, 2004, IEEE T MAGN, V40, P3156, DOI 10.1109/TMAG.2004.830460
   Murthy AN, 2010, TRIBOL LETT, V38, P47, DOI 10.1007/s11249-009-9570-z
   Myo KS, 2011, IEEE T MAGN, V47, P2660, DOI 10.1109/TMAG.2011.2159965
   Shimizu Y, 2011, IEEE T MAGN, V47, P3426, DOI 10.1109/TMAG.2011.2144961
   Shiramatsu T, 2006, IEEE T MAGN, V42, P2513, DOI 10.1109/TMAG.2006.880564
   Soeno Y, 2003, IEEE T MAGN, V39, P1967, DOI 10.1109/TMAG.2003.813753
   Stipe BC, 2010, NAT PHOTONICS, V4, P484, DOI 10.1038/nphoton.2010.90
   Toyoda N, 2010, IEEE T MAGN, V46, P1599, DOI 10.1109/TMAG.2010.2048748
NR 20
TC 4
Z9 4
U1 0
U2 5
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD NOV
PY 2012
VL 48
IS 11
BP 4448
EP 4451
DI 10.1109/TMAG.2012.2205226
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 025MV
UT WOS:000310194400441
ER

PT J
AU Alink, L
   Groenland, JPJ
   de Vries, J
   Abelmann, L
AF Alink, Laurens
   Groenland, J. P. J.
   de Vries, Jeroen
   Abelmann, Leon
TI Determination of Bit Patterned Media Noise Based on Island Perimeter
   Fluctuations
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT International Magnetics Conference (INTERMAG)
CY MAY 07-11, 2012
CL Vancouver, CANADA
SP IEEE, Magnet Soc
DE Channel modeling; laser interference lithography; magnetic bit patterned
   media; media noise
AB We measured the fluctuation in shape of magnetic islands in bit patterned media fabricated by laser interference lithography. This fluctuation can be accurately described by a model based on a Fourier series expansion of the perimeter of the islands. The model can be easily linked to amplitude and jitter noise. We show that the amplitude and jitter noise are in principle correlated, and the jitter noise increases with increasing island area. The correlation is small for media prepared by laser interference lithography, but expected to gain importance for high density bit patterned media.
C1 [Alink, Laurens; Groenland, J. P. J.; de Vries, Jeroen; Abelmann, Leon] Univ Twente, MESA Res Inst, NL-7500 AE Enschede, Netherlands.
RP Alink, L (reprint author), Univ Twente, MESA Res Inst, POB 217, NL-7500 AE Enschede, Netherlands.
EM l.alink@utwente.nl
CR Aziz MM, 2002, IEEE T MAGN, V38, P1964, DOI 10.1109/TMAG.2002.802787
   Haast MAM, 1998, IEEE T MAGN, V34, P1006, DOI 10.1109/20.706339
   Haykin Simon, 1989, INTRO ANALOG DIGITAL
   Luttge R, 2007, J VAC SCI TECHNOL B, V25, P2476, DOI 10.1116/1.2800328
   Nabavi S, 2009, IEEE T MAGN, V45, P3523, DOI 10.1109/TMAG.2009.2022493
   Nair SK, 1998, IEEE T MAGN, V34, P1916, DOI 10.1109/20.706742
   Ntokas IT, 2007, IEEE T MAGN, V43, P3925, DOI 10.1109/TMAG.2007.903349
   Nutter PW, 2008, IEEE T MAGN, V44, P3797, DOI 10.1109/TMAG.2008.2002516
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
NR 9
TC 0
Z9 0
U1 1
U2 4
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD NOV
PY 2012
VL 48
IS 11
BP 4574
EP 4577
DI 10.1109/TMAG.2012.2201138
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 025MV
UT WOS:000310194400473
ER

PT J
AU Wang, Y
   Frohman, S
   Victora, RH
AF Wang, Yao
   Frohman, Sean
   Victora, R. H.
TI Ideas for Detection in Two-Dimensional Magnetic Recording Systems
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT International Magnetics Conference (INTERMAG)
CY MAY 07-11, 2012
CL Vancouver, CANADA
SP IEEE, Magnet Soc
DE ECC media; read head array; two-dimensional equalization;
   two-dimensional magnetic recording (TDMR)
ID BIT-PATTERNED MEDIA
AB In two-dimensional magnetic recording, detection for a perfect writer and perfect reader based on an iterative threshold technique are compared to detection employing single threshold and adaptive threshold techniques. The simulation indicates that the algorithm can reach a BER of 9.3% compared to 11.2% and 10.5% for the latter cases when the bit size is 8 by 8 nm with a grain of 8.7 nm diameter. This increases data capacity by 11% to 6.6 TBits/inch(2). Additionally, detection with an array of three conventional heads has been studied: the simulation shows that for bits with dimension of 12 x 12 nm, grains of 8.7 nm diameter and reader width of 18 nm, the BER drops from 11.3% for a single conventional head to 5.4% for the head array with a two-dimensional generalized partial response equalizer at the optimum offset of 10 nm. The density is increased by 42%, reaching 4.0 Tbits/Inch(2).
C1 [Wang, Yao; Frohman, Sean; Victora, R. H.] Univ Minnesota, Dept Elect & Comp Engn, Ctr Micromagnet & Informat Technol, Minneapolis, MN 55455 USA.
RP Victora, RH (reprint author), Univ Minnesota, Dept Elect & Comp Engn, Ctr Micromagnet & Informat Technol, Minneapolis, MN 55455 USA.
EM victo004@umn.edu
CR Bertram H. N., 1994, THEORY MAGNETIC RECO, P112, DOI DOI 10.1017/CB09780511623066
   Chan KS, 2010, IEEE T MAGN, V46, P804, DOI 10.1109/TMAG.2009.2035635
   Demirkan I, 2009, IEEE T INFORM THEORY, V55, P1146, DOI 10.1109/TIT.2008.2011514
   Elidrissi MR, 2011, IEEE T MAGN, V47, P3685, DOI 10.1109/TMAG.2011.2156770
   Hwang E, 2010, IEEE T MAGN, V46, P1813, DOI 10.1109/TMAG.2010.2041531
   Karakulak S, 2010, IEEE T MAGN, V46, P3639, DOI 10.1109/TMAG.2010.2049116
   Krishnan AR, 2009, IEEE T MAGN, V45, P3830, DOI 10.1109/TMAG.2009.2023233
   Nabavi S, 2007, IEEE ICC, P6249, DOI 10.1109/ICC.2007.1035
   Nabavi S, 2008, IEEE T MAGN, V44, P3789, DOI 10.1109/TMAG.2008.2002387
   SHANNON CE, 1948, AT&T TECH J, V27, P379
   Victora R. H., 2012, IEEE T MAGN
   Wood R, 2009, IEEE T MAGN, V45, P917, DOI 10.1109/TMAG.2008.2010676
NR 12
TC 4
Z9 4
U1 0
U2 7
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD NOV
PY 2012
VL 48
IS 11
BP 4582
EP 4585
DI 10.1109/TMAG.2012.2202886
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 025MV
UT WOS:000310194400475
ER

PT J
AU Myint, LMM
   Supnithi, P
AF Myint, Lin Min Min
   Supnithi, Pornchai
TI Off-Track Detection Based on the Readback Signals in Magnetic Recording
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT International Magnetics Conference (INTERMAG)
CY MAY 07-11, 2012
CL Vancouver, CANADA
SP IEEE, Magnet Soc
DE Bit patterned media (BPM); target-shaping equalizer; track
   mis-registration (TMR); 2-D Interference
ID PATTERNED MEDIA; MISREGISTRATION; EQUALIZATION
AB Off-track condition in magnetic recording systems degrades the system performance. It is typically detected and adjusted by the servo control loop. In this work, we propose an off-track detection based on the readback signals and improve the bit error performance using an asymmetric target depending on the detected off-track direction. Specifically, we investigate the effects of off-track events on the target-shaping equalizer coefficients when the generalized partial-response target (GPR) is fixed. For a 3 x 3 channel matrix of bit patterned media recording (BPMR) system, the asymmetric targets offer the gain of about 1 to 2 dB at BER = 10(-4) for the TMR level of 20% to 25%.
C1 [Supnithi, Pornchai] King Mongkuts Inst Technol Ladkrabang, Fac Engn, Bangkok 10520, Thailand.
   [Myint, Lin Min Min] Shinawatra Univ, Sch Informat Technol, Samkok 12160, Pathum Thani, Thailand.
RP Supnithi, P (reprint author), King Mongkuts Inst Technol Ladkrabang, Fac Engn, Bangkok 10520, Thailand.
EM ksupornc@kmitl.ac.th
RI Supnithi, Pornchai/G-4403-2015
OI MYINT, LIN/0000-0002-8492-8337
CR Chang YB, 2002, IEEE T MAGN, V38, P1441, DOI 10.1109/20.996050
   He LN, 1998, IEEE T MAGN, V34, P2348, DOI 10.1109/20.703877
   Karakulak S, 2010, IEEE T MAGN, V46, P3639, DOI 10.1109/TMAG.2010.2049116
   Keskinoz M, 2008, IEEE T MAGN, V44, P533, DOI 10.1109/TMAG.2007.914966
   MOON JY, 1995, IEEE T MAGN, V31, P1083, DOI 10.1109/20.364789
   Nabavi S., 2008, P IEEE INT C COMM MA, P1061
   Nabavi S, 2009, IEEE T MAGN, V45, P3523, DOI 10.1109/TMAG.2009.2022493
   Nutter PW, 2005, IEEE T MAGN, V41, P3214, DOI 10.1109/TMAG.2005.854780
   Roh BG, 2002, IEEE T MAGN, V38, P1830, DOI 10.1109/TMAG.2002.1017779
NR 9
TC 3
Z9 3
U1 1
U2 6
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD NOV
PY 2012
VL 48
IS 11
BP 4590
EP 4593
DI 10.1109/TMAG.2012.2204963
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 025MV
UT WOS:000310194400477
ER

PT J
AU Nakamura, Y
   Bandai, Y
   Okamoto, Y
   Osawa, H
   Aoi, H
   Muraoka, H
AF Nakamura, Yasuaki
   Bandai, Yasuhisa
   Okamoto, Yoshihiro
   Osawa, Hisashi
   Aoi, Hajime
   Muraoka, Hiroaki
TI Turbo Equalization Effect for Nonbinary LDPC Code in BPM R/W Channel
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT International Magnetics Conference (INTERMAG)
CY MAY 07-11, 2012
CL Vancouver, CANADA
SP IEEE, Magnet Soc
DE Bit-patterned media (BPM); nonbinary low-density parity-check (LDPC)
   code; turbo equalization
ID PARITY-CHECK CODES; MEDIA
AB It is expected for the nonbinary low-density parity-check (LDPC) coding and iterative decoding system to introduce the turbo equalization in order to enhance the error correction ability in the bit-patterned medium (BPM) R/W channel. In this paper, we investigate the effect of the turbo equalization on the bit-error rate (BER) performance of nonbinary LDPC coding and iterative decoding system over Galois filed GF(2(8)) in BPMR/W channel with write-error at an areal recording density of 2 Tbit/inch(2) considering the coding rate loss. The performance of turbo equalization using the nonbinary LDPC coding and iterative decoding system is evaluated by computer simulation, and it is compared to that without turbo equalization. The results show that the nonbinary LDPC and iterative decoding system with the turbo equalization has the larger write-margin compared to that without turbo equalization.
C1 [Nakamura, Yasuaki; Bandai, Yasuhisa; Okamoto, Yoshihiro; Osawa, Hisashi] Ehime Univ, Grad Sch Sci & Engn, Matsuyama, Ehime 7908577, Japan.
   [Aoi, Hajime; Muraoka, Hiroaki] Tohoku Univ, Elect Commun Res Inst, Sendai, Miyagi 9808577, Japan.
RP Nakamura, Y (reprint author), Ehime Univ, Grad Sch Sci & Engn, Matsuyama, Ehime 7908577, Japan.
EM nakamura@rec.ee.ehime-u.ac.jp
CR Albrecht M, 2003, IEEE T MAGN, V39, P2323, DOI 10.1109/TMAG.2003.816285
   Davey MC, 1998, IEEE COMMUN LETT, V2, P165, DOI 10.1109/4234.681360
   GALLAGER RG, 1962, IRE T INFORM THEOR, V8, P21, DOI 10.1109/TIT.1962.1057683
   Jeon S, 2010, IEEE T MAGN, V46, P2248, DOI 10.1109/TMAG.2010.2043068
   KOCH W, 1990, GLOBECOM 90 - IEEE GLOBAL TELECOMMUNICATIONS CONFERENCE & EXHIBITION, VOLS 1-3, P1679, DOI 10.1109/GLOCOM.1990.116774
   Kretzmer K.R., 1966, IEEE T COMMUN TECHNO, V14, P67
   Muraoka H., 2009, IEEE T MAGN, V44, P3423
   Nakamura Y., 2010, PMRC 2010 SEND JAP, p18aE
   Nakamura Y, 2011, IEEE T MAGN, V47, P3566, DOI 10.1109/TMAG.2011.2147766
   Nakamura Y, 2009, IEEE T MAGN, V45, P3753, DOI 10.1109/TMAG.2009.2022331
   Sawaguchi H., 1998, P GLOBECOM 98 SYDN N, P2694
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
   Wymeersch H., 2004, P IEEE INT C COMM PA, P772
NR 13
TC 4
Z9 4
U1 0
U2 7
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD NOV
PY 2012
VL 48
IS 11
BP 4602
EP 4605
DI 10.1109/TMAG.2012.2194989
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 025MV
UT WOS:000310194400480
ER

PT J
AU Supnithi, P
   Wiriya, W
   Phakphisut, W
   Puttarak, N
AF Supnithi, Pornchai
   Wiriya, Warangrat
   Phakphisut, Watid
   Puttarak, Nattakan
TI LDPC Decoder Using Pattern-Dependent Modified LLR for the Bit Patterned
   Media Storage With Written-In Errors
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT International Magnetics Conference (INTERMAG)
CY MAY 07-11, 2012
CL Vancouver, CANADA
SP IEEE, Magnet Soc
DE Bit patterned media recording; log-likelihood ratio; low-density
   parity-check codes; written-in errors
ID TB/IN(2); SYSTEM
AB The written-in errors in bit patterned media recording (BPMR) system cause the erroneous bits during the writing process leading to the performance degradation. In this work, we propose the pattern-dependent modified log-likelihood ratio (LLR) usage in low-density parity check (LDPC) decoder to reduce the written-in errors and also improve the write margin. Unlike the existing works, LLR computed based on the input data patterns is used at the LDPC decoder for the cascaded written-in error channel (WEC) with the additive white Gaussian noise (AWGN) channel. The proposed LDPC decoder outperforms the one with conventional LLR in terms of both the write margin, when the SNR is fixed at 5.5 dB, and the performance of LDPC decoder. The SNR gain is about 0.2 dB at the BER of 10(-6).
C1 [Supnithi, Pornchai; Wiriya, Warangrat; Phakphisut, Watid; Puttarak, Nattakan] King Mongkuts Inst Technol Ladkrabang, Fac Engn, Bangkok 10520, Thailand.
RP Supnithi, P (reprint author), King Mongkuts Inst Technol Ladkrabang, Fac Engn, Bangkok 10520, Thailand.
EM ksupornc@kmitl.ac.th
RI Supnithi, Pornchai/G-4403-2015
CR Hu XY, 2005, IEEE T INFORM THEORY, V51, P386, DOI 10.1109/TIT.2004.839541
   Iyengar AR, 2009, ANN ALLERTON CONF, P620, DOI 10.1109/ALLERTON.2009.5394916
   Kurtas EM, 2006, IEEE T MAGN, V42, P200, DOI 10.1109/TMAG.2005.861751
   Muraoka Hiroaki, 2008, IEEE Transactions on Magnetics, V44, P3423, DOI 10.1109/TMAG.2008.2001654
   Muraoka H, 2011, IEEE T MAGN, V47, P26, DOI 10.1109/TMAG.2010.2080354
   Nakamura Y, 2011, IEEE T MAGN, V47, P3566, DOI 10.1109/TMAG.2011.2147766
   Nakamura Y, 2009, IEEE T MAGN, V45, P3753, DOI 10.1109/TMAG.2009.2022331
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Xu BX, 2009, IEEE T MAGN, V45, P2292, DOI 10.1109/TMAG.2009.2016466
NR 9
TC 0
Z9 0
U1 1
U2 2
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD NOV
PY 2012
VL 48
IS 11
BP 4606
EP 4609
DI 10.1109/TMAG.2012.2194991
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 025MV
UT WOS:000310194400481
ER

PT J
AU Sopon, T
   Myint, LMM
   Supnithi, P
   Vichienchom, K
AF Sopon, Thanomsak
   Myint, Lin Min Min
   Supnithi, Pornchai
   Vichienchom, Kasin
TI Modified Graph-Based Detection Methods for Two-Dimensional Interference
   Channels
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT International Magnetics Conference (INTERMAG)
CY MAY 07-11, 2012
CL Vancouver, CANADA
SP IEEE, Magnet Soc
DE Cycles; layered belief propagation; 2-D graph-based detector; 2-D
   interference channels
ID BIT-PATTERNED MEDIA; PERFORMANCE
AB Two-dimensional (2-D) interference channels with inter-symbol interference (ISI) and inter-track interference (ITI) exist in the magnetic recording systems at high areal density. A number of 2-D detection methods have recently been proposed for the multi-track processing of the 2-D channels. Graph-based detector with the belief propagation algorithm appears as an alternative method, but at a degraded performance and high complexity level. In this work, we propose two methods to modify the graph-based (GB) detector. One applies a serial scheduling to the GB detector, while the other modifies the GB detection by ignoring some connections during one direction of the reliability updates in the factor graph leading to the reduction of short cycles. The simulation results show that the proposed GB detectors give better bit error rate performances than the other GB detectors.
C1 [Sopon, Thanomsak; Supnithi, Pornchai; Vichienchom, Kasin] King Mongkuts Inst Technol Ladkrabang, Coll Data Storage Innovat, Bangkok 10520, Thailand.
   [Myint, Lin Min Min] Shinawatra Univ, Sch Informat Technol, Samkok 12160, Pathum Thani, Thailand.
   [Supnithi, Pornchai; Vichienchom, Kasin] King Mongkuts Inst Technol Ladkrabang, Fac Engn, Bangkok 10520, Thailand.
RP Supnithi, P (reprint author), King Mongkuts Inst Technol Ladkrabang, Coll Data Storage Innovat, Bangkok 10520, Thailand.
EM ksupornc@kmitl.ac.th
RI Supnithi, Pornchai/G-4403-2015
OI MYINT, LIN/0000-0002-8492-8337
CR Burkhard H., 1989, P COMPEURO 89 VLSI C, P43
   Chang W, 2010, IEEE T MAGN, V46, P3899, DOI 10.1109/TMAG.2010.2056926
   Hocevar D.E., 2004, IEEE WORKSH SIGN PRO, P107, DOI 10.1109/SIPS.2004.1363033
   Hu J, 2008, EURASIP J ADV SIG PR, DOI 10.1155/2008/738281
   Kfir H, 2003, PHYSICA A, V330, P259, DOI 10.1016/j.physa.2003.08.015
   Myint L. M. M., 2010, JOINT MMM INTERMAG C
   Nabavi S, 2007, IEEE ICC, P6249, DOI 10.1109/ICC.2007.1035
   Nabavi S, 2010, IEEE J SEL AREA COMM, V28, P135, DOI 10.1109/JSAC.2010.100202
   Nabavi S, 2009, IEEE T MAGN, V45, P3523, DOI 10.1109/TMAG.2009.2022493
   Nutter PW, 2005, IEEE T MAGN, V41, P4327, DOI 10.1109/TMAG.2005.856586
NR 10
TC 2
Z9 2
U1 1
U2 5
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD NOV
PY 2012
VL 48
IS 11
BP 4618
EP 4621
DI 10.1109/TMAG.2012.2204043
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 025MV
UT WOS:000310194400484
ER

PT J
AU Saidoh, N
   Takenaka, K
   Nishiyama, N
   Ishimaru, M
   Inoue, A
AF Saidoh, Noriko
   Takenaka, Kana
   Nishiyama, Nobuyuki
   Ishimaru, Manabu
   Inoue, Akihisa
TI Surface and cross sectional nano-structure of prototype BPM prepared
   using imprinted glassy alloy thin film
SO INTERMETALLICS
LA English
DT Article
DE Composite; Surface properties; Thin films; Magnetic applications
ID THERMAL-STABILITY; INFORMATION
AB In order to clarify detailed surface morphologies and cross sectional nano-structures of novel prototype bit-patterned-medias using nano-imprinted glassy alloy thin films, observations using scanning and transmission electron microscopes were carried out. By employing a focused ion beam milling with an extra low energy, the delicate and fragile structures of samples were successfully maintained and protected during sample preparations. The sequential observations of the preparation process reveal that Co/Pd multilayer is embedded into the imprinted glassy alloy thin film nano hole array with a hole diameter of 30 nm, and the embedded Co/Pd multilayer as acting magnetic recording dots is isolated each other. Using the obtained results, technological and productive feasibility of the prototype BPM as a next generation HDD with a data density above 2 Tbit/inch(2) is also discussed. (C) 2012 Elsevier Ltd. All rights reserved.
C1 [Saidoh, Noriko; Takenaka, Kana; Nishiyama, Nobuyuki] RIMCOF Tohoku Univ Lab, Mat Proc Technol Ctr, Sendai, Miyagi 9808577, Japan.
   [Ishimaru, Manabu] Osaka Univ, Inst Sci & Ind Res, Ibaraki 5670047, Japan.
   [Inoue, Akihisa] Tohoku Univ, Sendai, Miyagi 9808577, Japan.
RP Saidoh, N (reprint author), RIMCOF Tohoku Univ Lab, Mat Proc Technol Ctr, Sendai, Miyagi 9808577, Japan.
EM rimcofsn@imr.tohoku.ac.jp
RI Nishiyama, Nobuyuki/C-8228-2015; Inoue, Akihisa/E-5271-2015
FU "New Energy and Industrial Technology Development Organization (NEDO)";
   "Ministry of Economy, Trade and Industry" (METI) under "Technological
   Development of Innovative Components Based on Enhanced Functionality
   Metallic Glass" project
FX Funding by "New Energy and Industrial Technology Development
   Organization (NEDO)" and "Ministry of Economy, Trade and Industry"
   (METI) under "Technological Development of Innovative Components Based
   on Enhanced Functionality Metallic Glass" project is gratefully
   acknowledged.
CR Charap SH, 1997, IEEE T MAGN, V33, P978, DOI 10.1109/20.560142
   CHOU SY, 1995, APPL PHYS LETT, V67, P3114, DOI 10.1063/1.114851
   Koike K, 2001, APPL PHYS LETT, V78, P784, DOI 10.1063/1.1345804
   Maesaka A, 2002, IEEE T MAGN, V38, P2676, DOI 10.1109/TMAG.2002.801983
   Masuda H, 2006, JPN J APPL PHYS 2, V45, pL406, DOI 10.1143/JJAP.45.L406
   Nishiyama N, 2010, INTERMETALLICS, V18, P1983, DOI 10.1016/j.intermet.2010.02.027
   Nishiyama N, 2011, J ALLOY COMPD, V509, P145
   Takenaka K, 2010, INTERMETALLICS, V18, P1969, DOI 10.1016/j.intermet.2010.02.045
   Zeng H, 2000, J APPL PHYS, V87, P4718, DOI 10.1063/1.373137
NR 9
TC 1
Z9 2
U1 0
U2 14
PU ELSEVIER SCI LTD
PI OXFORD
PA THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD OX5 1GB, OXON, ENGLAND
SN 0966-9795
EI 1879-0216
J9 INTERMETALLICS
JI Intermetallics
PD NOV
PY 2012
VL 30
SI SI
BP 48
EP 50
DI 10.1016/j.intermet.2012.03.041
PG 3
WC Chemistry, Physical; Materials Science, Multidisciplinary; Metallurgy &
   Metallurgical Engineering
SC Chemistry; Materials Science; Metallurgy & Metallurgical Engineering
GA 006VL
UT WOS:000308847400008
ER

PT J
AU Takenaka, K
   Saidoh, N
   Nishiyama, N
   Ishimaru, M
   Inoue, A
AF Takenaka, Kana
   Saidoh, Noriko
   Nishiyama, Nobuyuki
   Ishimaru, Manabu
   Inoue, Akihisa
TI Novel soft-magnetic underlayer of a bit-patterned media using CoFe-based
   amorphous alloy thin film
SO INTERMETALLICS
LA English
DT Article
DE Composites; Magnetic properties; Thin films; Magnetic applications
ID ABILITY
AB With the aim of applying to a soft-magnetic underlayer of the new type of bit-patterned media using nano-patterned glassy alloy thin film, (CoFe)-B-Si-Nb alloy thin films were deposited on a Si substrate by a DC magnetron sputtering method. The deposited thin films with the compositions of Co75Fe5B15Si2Nb1 and Co75Fe5B14Si5Nb1 were confirmed as a fully amorphous structure. The obtained Co75Fe5B15Si2Nb1 amorphous alloy thin film containing lower metalloid content exhibits extremely smooth surface and good soft-magnetic properties such as high saturation flux density of 1.2 T, in-plane low coercivity of 36 A/m, nearly zero-magnetostriction of 4 x 10(-7) and high real part of permeability of 870 at 291 MHz, suggesting that the film is appropriate for the soft-magnetic underlayer. Moreover, a prototype bit-patterned media was prepared by utilizing the obtained thin film as a soft-magnetic underlayer. As a result of static tester measurements with a commercial perpendicular magnetic head, accurate information reading and writing on the prototype bit-patterned media were confirmed. It is therefore said that the Co75Fe5B15Si2Nb1 amorphous alloy thin film is a candidate material for the soft-magnetic underlayer of the new type of bit-patterned media. (C) 2012 Elsevier Ltd. All rights reserved.
C1 [Takenaka, Kana; Saidoh, Noriko; Nishiyama, Nobuyuki] Mat Proc Technol Ctr, RIMCOF Tohoku Univ Lab, Sendai, Miyagi 9808577, Japan.
   [Ishimaru, Manabu] Osaka Univ, Inst Sci & Ind Res, Ibaraki 5670047, Japan.
   [Inoue, Akihisa] Tohoku Univ, Sendai, Miyagi 9808577, Japan.
RP Takenaka, K (reprint author), Mat Proc Technol Ctr, RIMCOF Tohoku Univ Lab, Sendai, Miyagi 9808577, Japan.
EM rimcoftk@imr.tohoku.ac.jp
RI Nishiyama, Nobuyuki/C-8228-2015; Inoue, Akihisa/E-5271-2015
FU New Energy and Industrial Technology Development Organization (NEDO);
   "Ministry of Economy, Trade and Industry (METI)" under "Technological
   Development of Innovative Components Based on Enhanced Functionality
   Metallic Glass" project
FX Funding by "New Energy and Industrial Technology Development
   Organization (NEDO)" and "Ministry of Economy, Trade and Industry
   (METI)" under "Technological Development of Innovative Components Based
   on Enhanced Functionality Metallic Glass" project is also gratefully
   acknowledged.
CR Amiya K, 2005, J APPL PHYS, V97, DOI 10.1063/1.1859211
   Amiya K, 2007, J APPL PHYS, V101, DOI 10.1063/1.2718353
   FUJIMORI H, 1976, SCI REP RES TOHOKU A, V26, P36
   FUJIMORI H, 1976, JPN J APPL PHYS, V15, P705, DOI 10.1143/JJAP.15.705
   Liao JS, 2008, PHYS STATUS SOLIDI A, V205, P2943, DOI 10.1002/pssa.200824316
   Nishiyama N, 2010, INTERMETALLICS, V18, P1983, DOI 10.1016/j.intermet.2010.02.027
   Takenaka K, 2010, INTERMETALLICS, V18, P1969, DOI 10.1016/j.intermet.2010.02.045
   Nakatani I, 1991, Japan patent, Patent No. 1888363
NR 8
TC 0
Z9 0
U1 0
U2 17
PU ELSEVIER SCI LTD
PI OXFORD
PA THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD OX5 1GB, OXON, ENGLAND
SN 0966-9795
J9 INTERMETALLICS
JI Intermetallics
PD NOV
PY 2012
VL 30
SI SI
BP 100
EP 103
DI 10.1016/j.intermet.2012.03.025
PG 4
WC Chemistry, Physical; Materials Science, Multidisciplinary; Metallurgy &
   Metallurgical Engineering
SC Chemistry; Materials Science; Metallurgy & Metallurgical Engineering
GA 006VL
UT WOS:000308847400018
ER

PT J
AU Thiyagarajah, N
   Duan, HG
   Song, DLY
   Asbahi, M
   Leong, SH
   Yang, JKW
   Ng, V
AF Thiyagarajah, Naganivetha
   Duan, Huigao
   Song, Debra L. Y.
   Asbahi, Mohamed
   Leong, Siang Huei
   Yang, Joel K. W.
   Ng, Vivian
TI Effect of inter-bit material on the performance of directly deposited
   bit patterned media
SO APPLIED PHYSICS LETTERS
LA English
DT Article
AB We evaluated the effects of inter-bit material on the switching performance of bit patterned media (BPM) fabricated by direct deposition of magnetic material onto pre-patterned substrates. We performed a controlled experiment to vary the sidewall thickness and symmetry in bits with nominally identical size and pitch. Thick, asymmetric sidewalls resulted in significant broadening of the switching field distribution to 14%-20% compared to 10%-11% for bits with thin, symmetric sidewalls. These differences were attributed to changes in the intrinsic properties and dipolar interactions as supported by micromagnetic simulations. Our results highlight the importance of controlling inter-bit material to achieve high-density BPM. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4758478]
C1 [Thiyagarajah, Naganivetha; Ng, Vivian] Natl Univ Singapore, Dept Elect & Comp Engn, Informat Storage Mat Lab, Singapore 117576, Singapore.
   [Duan, Huigao; Song, Debra L. Y.; Asbahi, Mohamed; Yang, Joel K. W.] ASTAR, Inst Mat Res & Engn, Singapore 117602, Singapore.
   [Leong, Siang Huei] ASTAR, Data Storage Inst, Singapore 117608, Singapore.
RP Ng, V (reprint author), Natl Univ Singapore, Dept Elect & Comp Engn, Informat Storage Mat Lab, Singapore 117576, Singapore.
EM elengv@nus.edu.sg
RI Thiyagarajah, Naganivetha/N-1613-2014; Duan, Huigao/P-6964-2014; Yang,
   Joel K.W./L-7892-2016
OI Thiyagarajah, Naganivetha/0000-0003-2888-1412; Yang, Joel
   K.W./0000-0003-3301-1040
FU Agency for Science, Technology and Research (A*STAR) in Singapore
FX The authors would like to thank Dr. Ramam Akkipeddi for the use of the
   electron-beam lithography and dual-beam FIB in IMRE through the SERC
   nano Fabrication Processing and Characterization (SnFPC) facility. This
   work was funded by the Agency for Science, Technology and Research
   (A*STAR) in Singapore.
CR Belle BD, 2008, IEEE T MAGN, V44, P3468, DOI 10.1109/TMAG.2008.2001791
   Hellwig O, 2008, APPL PHYS LETT, V93, DOI 10.1063/1.3013857
   Hosaka S, 2006, APPL PHYS LETT, V89, DOI 10.1063/1.2400102
   Kamata Y, 2011, IEEE T MAGN, V47, P51, DOI 10.1109/TMAG.2010.2077274
   Krone P, 2009, J APPL PHYS, V106, DOI 10.1063/1.3260240
   Li WM, 2012, J MAGN MAGN MATER, V324, P1575, DOI 10.1016/j.jmmm.2011.12.006
   Liu Y, 2007, MATER CHARACT, V58, P666, DOI 10.1016/j.matchar.2006.07.016
   Richter HJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2209179
   Ross C, 2001, ANN REV MATER RES, V31, P203, DOI 10.1146/annurev.matsci.31.1.203
   Scholz W, 2003, COMP MATER SCI, V28, P366, DOI 10.1016/S0927-0256(03)00119-8
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Thiyagarajah N, 2012, J APPL PHYS, V111, DOI 10.1063/1.4714547
   Thomson T, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.257204
   Yang JKW, 2007, J VAC SCI TECHNOL B, V25, P2025, DOI 10.1116/1.2801881
   Yang JKW, 2011, NANOTECHNOLOGY, V22, DOI 10.1088/0957-4484/22/38/385301
NR 15
TC 3
Z9 3
U1 2
U2 13
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0003-6951
J9 APPL PHYS LETT
JI Appl. Phys. Lett.
PD OCT 8
PY 2012
VL 101
IS 15
AR 152403
DI 10.1063/1.4758478
PG 5
WC Physics, Applied
SC Physics
GA 026TQ
UT WOS:000310304900048
ER

PT J
AU Choi, C
   Noh, K
   Kuru, C
   Chen, LH
   Seong, TY
   Jin, SH
AF Choi, Chulmin
   Noh, Kunbae
   Kuru, Cihan
   Chen, Li-Han
   Seong, Tae-Yeon
   Jin, Sungho
TI Fabrication of Patterned Magnetic Nanomaterials for Data Storage Media
SO JOM
LA English
DT Article
ID ELECTRON-BEAM LITHOGRAPHY; ALUMINUM-OXIDE TEMPLATES; BLOCK-COPOLYMERS;
   NANOIMPRINT LITHOGRAPHY; THIN-FILMS; DENSITY; ARRAYS; DOMAIN;
   GBIT/IN(2); RESOLUTION
AB Patterned media (PM) for magnetic information storage have received increased attention in recent years as the primary candidate for 1 Terabit/in(2) or higher recording density for computer hard disk drives. A PM consists of a periodic array of well-defined magnetic islands, each of which can store one bit of data. In the simplest scheme, the structures could be magnetic pillars and dots with a single easy axis of magnetization. The direction of detected magnetization by the read/write head is interpreted as a binary signal 1 or 0. Some of the main technical issues in the PM include the difficulty in fabricating small nanoisland arrays in a periodic fashion over large areas, reliability/reproducibility of magnetic bit characteristics, as well as wear and head fly-ability issues associated with the media surface roughness, and processing cost. This article deals with a recent investigation of various fabrication approaches, nanostructural features, and magnetic properties for the bit PM.
C1 [Choi, Chulmin; Noh, Kunbae; Kuru, Cihan; Jin, Sungho] Univ Calif San Diego, Dept Mat Sci & Engn, La Jolla, CA 92093 USA.
   [Choi, Chulmin; Chen, Li-Han; Jin, Sungho] Univ Calif San Diego, Dept Mech & Aerosp Engn, La Jolla, CA 92093 USA.
   [Seong, Tae-Yeon] Korea Univ, Dept Mat Sci & Engn, Seoul, South Korea.
RP Choi, C (reprint author), Univ Calif San Diego, Dept Mat Sci & Engn, La Jolla, CA 92093 USA.
EM jin@ucsd.edu
FU NSF-Nanomanufacturing Division (CMMI) [0856674]; CMRR (Center for
   Magnetic Recording Research) at University of California-San Diego;
   National Research Foundation (NRF) Grant through World Class University
   Program [R33-2008-000-10025-0]; CNMT Grant Frontier RD Program; National
   Program for Tera-Level Nanodevices
FX The authors wish to acknowledge the financial support of this work by
   NSF-Nanomanufacturing Division (CMMI #0856674), CMRR (Center for
   Magnetic Recording Research) at University of California-San Diego,
   National Research Foundation (NRF) Grant through World Class University
   Program (R33-2008-000-10025-0), CNMT Grant Frontier R&D Program, and the
   National Program for Tera-Level Nanodevices.
CR BATES FS, 1991, SCIENCE, V251, P898, DOI 10.1126/science.251.4996.898
   Bertram HN, 2000, IEEE T MAGN, V36, P4, DOI 10.1109/20.824417
   Bita I, 2008, SCIENCE, V321, P939, DOI 10.1126/science.1159352
   BROWN WF, 1963, PHYS REV, V130, P1677, DOI 10.1103/PhysRev.130.1677
   Chang THP, 1996, J VAC SCI TECHNOL B, V14, P3774, DOI 10.1116/1.588666
   Charap SH, 1997, IEEE T MAGN, V33, P978, DOI 10.1109/20.560142
   Choi C, 2007, IEEE T MAGN, V43, P2121, DOI 10.1109/TMAG.2007.892640
   Choi C, 2011, MICROSYST TECHNOL, V17, P395, DOI 10.1007/s00542-011-1222-1
   CHOU SY, 1994, J APPL PHYS, V76, P6673, DOI 10.1063/1.358164
   Chou SY, 1996, SCIENCE, V272, P85, DOI 10.1126/science.272.5258.85
   CHOU SY, 1994, J VAC SCI TECHNOL B, V12, P3695, DOI 10.1116/1.587642
   COFFEY KR, 1995, IEEE T MAGN, V31, P2737, DOI 10.1109/20.490108
   Falco C M, 2000, J VAC SCI TECHNOL B, V18, P3419
   Fredrickson GH, 1996, ANNU REV MATER SCI, V26, P501, DOI 10.1146/annurev.ms.26.080196.002441
   Gapin AI, 2007, IEEE T MAGN, V43, P2151, DOI 10.1109/TMAG.2007.893121
   Garcia JM, 1999, J APPL PHYS, V85, P5480, DOI 10.1063/1.369868
   Grigorescu AE, 2009, NANOTECHNOLOGY, V20, DOI 10.1088/0957-4484/20/29/292001
   Guo LJ, 2007, ADV MATER, V19, P495, DOI 10.1002/adma.200600882
   Hellwig O, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3293301
   Hu WC, 2004, J VAC SCI TECHNOL B, V22, P1711, DOI 10.1116/1.1763897
   Jeong S, 2001, IEEE T MAGN, V37, P1309, DOI 10.1109/20.950826
   Joannopoulos JD, 1997, NATURE, V386, P143, DOI 10.1038/386143a0
   Kenji S., 2010, J APPL PHYS, V107
   Klein DL, 1997, NATURE, V389, P699
   Krauss PR, 1997, APPL PHYS LETT, V71, P3174, DOI 10.1063/1.120280
   Liu K, 2002, APPL PHYS LETT, V80, P865, DOI 10.1063/1.1436275
   Liu XG, 2002, ADV MATER, V14, P231, DOI 10.1002/1521-4095(20020205)14:3<231::AID-ADMA231>3.0.CO;2-R
   Luttge R, 2009, J PHYS D APPL PHYS, V42, DOI 10.1088/0022-3727/42/12/123001
   Metzger RM, 2000, IEEE T MAGN, V36, P30, DOI 10.1109/20.824421
   Naito K, 2002, IEEE T MAGN, V38, P1949, DOI 10.1109/TMAG.2002.802847
   Noh K, 2011, NANO, V6, P541, DOI 10.1142/S1793292011002883
   Park S, 2009, SCIENCE, V323, P1030, DOI 10.1126/science.1168108
   PFEIFFER HC, 1988, IBM J RES DEV, V32, P494
   Piramanayagam SN, 2007, J APPL PHYS, V102, DOI 10.1063/1.2750414
   Rahman MT, 2007, APPL PHYS LETT, V91, DOI 10.1063/1.2790788
   ROSS CA, 2000, ANN REV MATER RES, V31, P203
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Simon U, 1998, ADV MATER, V10, P1487, DOI 10.1002/(SICI)1521-4095(199812)10:17<1487::AID-ADMA1487>3.0.CO;2-W
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   THOMAS EL, 1994, PHILOS T R SOC A, V348, P149, DOI 10.1098/rsta.1994.0086
   Todorovic M, 1999, APPL PHYS LETT, V74, P2516, DOI 10.1063/1.123885
   Tseng AA, 2003, IEEE T ELECTRON PACK, V26, P141, DOI 10.1109/TEPM.2003.817714
   Weller D, 2000, IEEE T MAGN, V36, P10, DOI 10.1109/20.824418
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
   Xiao SG, 2009, ADV MATER, V21, P2516, DOI 10.1002/adma.200802087
   Yang JKW, 2010, NAT NANOTECHNOL, V5, P256, DOI [10.1038/nnano.2010.30, 10.1038/NNANO.2010.30]
   Yang X, 2007, J VAC SCI TECHNOL B, V25, P2202, DOI 10.1116/1.2798711
   Zangari G, 1997, IEEE T MAGN, V33, P3010, DOI 10.1109/20.617827
NR 48
TC 5
Z9 5
U1 1
U2 31
PU SPRINGER
PI NEW YORK
PA 233 SPRING ST, NEW YORK, NY 10013 USA
SN 1047-4838
J9 JOM-US
JI JOM
PD OCT
PY 2012
VL 64
IS 10
BP 1165
EP 1173
DI 10.1007/s11837-012-0440-z
PG 9
WC Materials Science, Multidisciplinary; Metallurgy & Metallurgical
   Engineering; Mineralogy; Mining & Mineral Processing
SC Materials Science; Metallurgy & Metallurgical Engineering; Mineralogy;
   Mining & Mineral Processing
GA 021BG
UT WOS:000309859700008
ER

PT J
AU Tournerie, N
   Engelhardt, AP
   Maroun, F
   Allongue, P
AF Tournerie, N.
   Engelhardt, A. P.
   Maroun, F.
   Allongue, P.
TI Influence of the surface chemistry on the electric-field control of the
   magnetization of ultrathin films
SO PHYSICAL REVIEW B
LA English
DT Article
ID BIT-PATTERNED MEDIA; ATOMIC LAYERS; MANIPULATION; ANISOTROPY; MAGNETISM;
   DESIGN
AB In this paper we investigate the voltage dependence of magnetization anisotropy on electrodeposited Co/Au(111) ultrathin films using in situ real-time polar magneto-optical Kerr effect. A systematic voltage and thickness-dependent study is conducted, demonstrating that the magnetoelectric effects arise from an electric field-induced change in the surface anisotropy. The effect is linear, reversible, and can be as large as 50%. We also show that its amplitude depends on the surface chemistry of the Co films. Another kind of magnetoelectric is also reported and discussed that allows a reversible and complete spin reorientation transition in a 5.6-monolayer-thick layer covered with carbon monoxide.
C1 [Tournerie, N.; Engelhardt, A. P.; Maroun, F.; Allongue, P.] Ecole Polytech, CNRS, F-91128 Palaiseau, France.
RP Maroun, F (reprint author), Ecole Polytech, CNRS, F-91128 Palaiseau, France.
EM nicolas.tournerie@ecam-rennes.fr; andreas.engelhardt@uni-kassel.de;
   fouad.maroun@polytechnique.fr
CR Allongue P, 2004, SURF SCI, V557, P41, DOI 10.1016/j.susc.2004.03.016
   Allongue P, 2009, SURF SCI, V603, P1831, DOI 10.1016/j.susc.2008.11.040
   Bard A. J., 2001, ELECTROCHEMICAL METH
   Bauer U, 2012, APPL PHYS LETT, V100, DOI 10.1063/1.4712620
   Bauer U, 2012, NANO LETT, V12, P1437, DOI 10.1021/nl204114t
   Bernas H, 1999, NUCL INSTRUM METH B, V148, P872, DOI 10.1016/S0168-583X(98)00851-9
   Bockris J. O. M., 1980, COMPREHENSIVE TREATI, V2
   Cagnon L, 2001, PHYS REV B, V63, DOI 10.1103/PhysRevB.63.104419
   Chappert C, 2007, NAT MATER, V6, P813, DOI 10.1038/nmat2024
   Chiba D, 2008, NATURE, V455, P515, DOI 10.1038/nature07318
   Chiba D, 2011, NAT MATER, V10, P853, DOI [10.1038/nmat3130, 10.1038/NMAT3130]
   Chiba D, 2003, SCIENCE, V301, P943, DOI 10.1126/science.1086608
   Duan CG, 2008, PHYS REV LETT, V101, DOI 10.1103/PhysRevLett.101.137201
   Grobis MK, 2011, IEEE T MAGN, V47, P6, DOI 10.1109/TMAG.2010.2076798
   Hafner JH, 2001, J PHYS CHEM B, V105, P743, DOI 10.1021/jp003498o
   Johnson MT, 1996, REP PROG PHYS, V59, P1409, DOI 10.1088/0034-4885/59/11/002
   Kawaguchi M, 2012, APPL PHYS EXPRESS, V5, DOI 10.1143/APEX.5.063007
   Lee J, 2011, APPL PHYS LETT, V99, DOI 10.1063/1.3623752
   Litvinov D, 2008, IEEE T NANOTECHNOL, V7, P463, DOI 10.1109/TNANO.2008.920183
   Maruyama T, 2009, NAT NANOTECHNOL, V4, P158, DOI [10.1038/nnano.2008.406, 10.1038/NNANO.2008.406]
   Matsumura D, 2006, PHYS REV B, V73, DOI 10.1103/PhysRevB.73.174423
   Nakamura K, 2010, PHYS REV B, V81, DOI 10.1103/PhysRevB.81.220409
   Nakamura K, 2009, PHYS REV LETT, V102, DOI 10.1103/PhysRevLett.102.187201
   Prod'homme P, 2008, APPL PHYS LETT, V93, DOI 10.1063/1.3006064
   Richter HJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2209179
   Rodary G, 2007, PHYS REV B, V75, DOI 10.1103/PhysRevB.75.184415
   Sander D, 2004, PHYS REV LETT, V93, DOI 10.1103/PhysRevLett.93.247203
   Schindler W, 1997, PHYS REV B, V55, pR1989
   Shimamura K, 2012, APPL PHYS LETT, V100, DOI 10.1063/1.3695160
   Shiota Y, 2012, NAT MATER, V11, P39, DOI [10.1038/nmat3172, 10.1038/NMAT3172]
   Shiota Y, 2009, APPL PHYS EXPRESS, V2, DOI 10.1143/APEX.2.063001
   Subkow S, 2011, PHYS REV B, V84, DOI 10.1103/PhysRevB.84.054443
   Weisheit M, 2007, SCIENCE, V315, P349, DOI 10.1126/science.1136629
   Zhernenkov M, 2010, PHYS REV B, V82, DOI 10.1103/PhysRevB.82.024420
NR 34
TC 15
Z9 15
U1 0
U2 48
PU AMER PHYSICAL SOC
PI COLLEGE PK
PA ONE PHYSICS ELLIPSE, COLLEGE PK, MD 20740-3844 USA
SN 1098-0121
J9 PHYS REV B
JI Phys. Rev. B
PD SEP 28
PY 2012
VL 86
IS 10
AR 104434
DI 10.1103/PhysRevB.86.104434
PG 5
WC Physics, Condensed Matter
SC Physics
GA 012WR
UT WOS:000309267900004
ER

PT J
AU Li, LQ
   Song, WP
   Zhang, CH
   Ovcharenko, A
   Zhang, GY
   Talke, FE
AF Li, Longqiu
   Song, Wenping
   Zhang, Chunhui
   Ovcharenko, Andrey
   Zhang, Guangyu
   Talke, Frank E.
TI Investigation of thermo-mechanical contact between slider and bit
   patterned media
SO MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND
   PROCESSING SYSTEMS
LA English
DT Article; Proceedings Paper
CT 21st Annual ASME Conference on Information Storage and Processing
   Systems (ISPS)
CY JUN 13-14, 2011
CL Santa Clara Univ, Santa Clara, CA
SP ASME ISPS Div
HO Santa Clara Univ
ID FINITE-ELEMENT-ANALYSIS; DYNAMIC LOAD/UNLOAD; DISK CONTACTS; LAYERED
   MEDIA; SIMULATION; IMPACT; INTERFACE; ERASURE; SYSTEMS; SURFACE
AB Contact between a slider and bit patterned media (BPM) is investigated using finite element analysis. The effect of contact conditions and material properties at the interface between slider and disk on plastic deformation and temperature is studied. In addition, the planarization of bit pattern media on temperature and plastic deformation is investigated for different filler materials. It is found that filler material results in reduction of plastic deformation and temperature.
C1 [Li, Longqiu; Song, Wenping; Zhang, Chunhui; Zhang, Guangyu] Harbin Inst Technol, Harbin 150001, Peoples R China.
   [Song, Wenping; Ovcharenko, Andrey; Talke, Frank E.] Univ Calif San Diego, Ctr Magnet Recording Res, San Diego, CA 92103 USA.
RP Li, LQ (reprint author), Harbin Inst Technol, Harbin 150001, Peoples R China.
EM longqiuli@gmail.com
RI Li, Longqiu/P-2064-2015
CR Blok H., 1937, P GENERAL DISCUSSION, V2, P222
   Gong ZQ, 2004, J TRIBOL-T ASME, V126, P9, DOI 10.1115/1.1609487
   Johnson K. L., 1985, CONTACT MECH
   Kral ER, 1997, J TRIBOL-T ASME, V119, P332, DOI 10.1115/1.2833223
   Lee SC, 2009, ASME, V131, P1
   Li H, 2010, J ADV MECH DES SYST, V4, P42, DOI 10.1299/jamdsm.4.42
   Li H, 2009, IEEE T MAGN, V45, P4984, DOI 10.1109/TMAG.2009.2029412
   Liew T, 2000, TRIBOL INT, V33, P611, DOI 10.1016/S0301-679X(00)00077-3
   Liu B, 2003, IEEE T MAGN, V39, P743, DOI 10.1109/TMAG.2003.809007
   Liu B, 2000, IEICE T ELECTRON, VE83C, P1539
   Nunez EE, 2008, IEEE T MAGN, V44, P3667, DOI 10.1109/TMAG.2008.2002593
   Ovcharenko A, 2011, J TRIBOL-T ASME, V133, DOI 10.1115/1.4003996
   Ovcharenko A, 2011, MICROSYST TECHNOL, V17, P743, DOI 10.1007/s00542-010-1217-3
   Ovcharenko A, 2010, IEEE T MAGN, V46, P3760, DOI 10.1109/TMAG.2010.2051159
   Ovcharenko A, 2010, IEEE T MAGN, V46, P770, DOI 10.1109/TMAG.2009.2035092
   Shen SN, 2009, IEEE T MAGN, V45, P5002, DOI 10.1109/TMAG.2009.2029419
   Suk M, 1998, J TRIBOL-T ASME, V120, P332, DOI 10.1115/1.2834431
   TIAN XF, 1994, J TRIBOL-T ASME, V116, P167, DOI 10.1115/1.2927035
   Whang SH, 1998, ACTA MATER, V46, P6485, DOI 10.1016/S1359-6454(98)00311-5
   Xu BX, 2009, IEEE T MAGN, V45, P2292, DOI 10.1109/TMAG.2009.2016466
   Ye N, 2003, J TRIBOL-T ASME, V125, P52, DOI 10.1115/1.1497360
   Young Y, 2010, THESIS U CALIFORNIA
   Yu N, 2008, MICROSYST TECHNOL, V14, P215, DOI 10.1007/s00542-007-0415-0
NR 23
TC 4
Z9 4
U1 1
U2 7
PU SPRINGER
PI NEW YORK
PA 233 SPRING ST, NEW YORK, NY 10013 USA
SN 0946-7076
J9 MICROSYST TECHNOL
JI Microsyst. Technol.
PD SEP
PY 2012
VL 18
IS 9-10
SI SI
BP 1567
EP 1574
DI 10.1007/s00542-012-1593-y
PG 8
WC Engineering, Electrical & Electronic; Nanoscience & Nanotechnology;
   Materials Science, Multidisciplinary; Physics, Applied
SC Engineering; Science & Technology - Other Topics; Materials Science;
   Physics
GA 995HM
UT WOS:000307998800041
ER

PT J
AU Fukui, S
   Sato, A
   Matsuoka, H
AF Fukui, Shigehisa
   Sato, Atsusi
   Matsuoka, Hiroshige
TI Static and dynamic flying characteristics of a slider on bit-patterned
   media (dynamic responses based on frequency domain analysis)
SO MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND
   PROCESSING SYSTEMS
LA English
DT Article; Proceedings Paper
CT 21st Annual ASME Conference on Information Storage and Processing
   Systems (ISPS)
CY JUN 13-14, 2011
CL Santa Clara Univ, Santa Clara, CA
SP ASME ISPS Div
HO Santa Clara Univ
ID DISCRETE-TRACK MEDIA; HEAD SLIDERS; SIMULATION; INTERFACE
AB Recording media with grooves, such as discrete track media (DTM) and bit-patterned media (BPM), are considered to be promising media for achieving ultrahigh recording densities. It is thus important to analyze the static and dynamic characteristics of flying head sliders on DTM and BPM using the molecular gas film lubrication equation and the van der Waals (vdW) equation. In this study, we consider BPM with rectangular bits. We express the disk recess as a Fourier series and determine the quasi-static and time-dependent components. We also develop a perturbation method for small groove depths for calculating static slider attitudes and dynamic responses in the frequency domain. The numerical results predict that the grooves will significantly reduce the quasi-static flying height h (0). They also predict that for a small groove depth h (groove), flying height decrease Delta h (0) almost agree with the value of uniform disk recess obtained by a Fourier series expansion, which also agrees with empirical results. Dynamic slider characteristics obtained by the frequency domain analysis is useful for sliders suffering from excitations of several tens of kHz such as sliders flying at transition between data zone and servo zone, although the dynamic spacing fluctuation by realistic BPM media is negligible.
C1 [Fukui, Shigehisa; Sato, Atsusi; Matsuoka, Hiroshige] Tottori Univ, Dept Mech & Aerosp Engn, Tottori 6808552, Japan.
RP Fukui, S (reprint author), Tottori Univ, Dept Mech & Aerosp Engn, 4-101 Minami, Tottori 6808552, Japan.
EM fukui@damp.tottori-u.ac.jp
CR Duwensee M, 2007, MICROSYST TECHNOL, V13, P1023, DOI 10.1007/s00542-006-0314-9
   Duwensee M, 2009, J TRIBOL-T ASME, V131, DOI 10.1115/1.2991166
   Fukui S, 2005, MICROSYST TECHNOL, V11, P812, DOI 10.1007/s00542-005-0539-z
   FUKUI S, 1990, JSME INT J III-VIB C, V33, P76
   FUKUI S, 1990, J TRIBOL-T ASME, V112, P78, DOI 10.1115/1.2920234
   Fukui S, 1988, T ASME, V110, P253
   Fukui S, 2008, IEEE T MAGN, V44, P3671, DOI 10.1109/TMAG.2008.2002526
   Israelachvili J., 1992, INTERMOLECULAR SURFA
   Knigge BE, 2008, IEEE T MAGN, V44, P3656, DOI 10.1109/TMAG.2008.2002613
   Li H, 2010, J ADV MECH DES SYST, V4, P49, DOI 10.1299/jamdsm.4.49
   Li H, 2009, IEEE T MAGN, V45, P4984, DOI 10.1109/TMAG.2009.2029412
   Li H, 2009, TRIBOL LETT, V33, P199, DOI 10.1007/s11249-009-9409-7
   Li JH, 2007, J TRIBOL-T ASME, V129, P712, DOI 10.1115/1.2768069
   Li LP, 2011, MICROSYST TECHNOL, V17, P805, DOI 10.1007/s00542-010-1191-9
   Matsuoka H, 2005, MICROSYST TECHNOL, V11, P824, DOI 10.1007/s00542-005-0541-5
   Murthy AN, 2010, TRIBOL LETT, V38, P47, DOI 10.1007/s11249-009-9570-z
   Myo KS, 2011, IEEE T MAGN, V47, P2660, DOI 10.1109/TMAG.2011.2159965
   ONO K, 1975, J LUBRIC TECH-T ASME, V97, P250
   Tagawa N, 2003, MICROSYST TECHNOL, V9, P362, DOI 10.1007/S00542-002-0285-4
   Tagawa N, 2002, J TRIBOL-T ASME, V124, P568, DOI 10.1115/1.1456084
   Wachenschwanz D, 2005, IEEE T MAGN, V41, P670, DOI 10.1109/TMAG.2004.838049
NR 21
TC 1
Z9 1
U1 0
U2 1
PU SPRINGER
PI NEW YORK
PA 233 SPRING ST, NEW YORK, NY 10013 USA
SN 0946-7076
EI 1432-1858
J9 MICROSYST TECHNOL
JI Microsyst. Technol.
PD SEP
PY 2012
VL 18
IS 9-10
SI SI
BP 1633
EP 1643
DI 10.1007/s00542-012-1601-2
PG 11
WC Engineering, Electrical & Electronic; Nanoscience & Nanotechnology;
   Materials Science, Multidisciplinary; Physics, Applied
SC Engineering; Science & Technology - Other Topics; Materials Science;
   Physics
GA 995HM
UT WOS:000307998800049
ER

PT J
AU McCallum, AT
   Kercher, D
   Lille, J
   Weller, D
   Hellwig, O
AF McCallum, A. T.
   Kercher, D.
   Lille, J.
   Weller, D.
   Hellwig, O.
TI Prevention of dewetting during annealing of FePt films for bit patterned
   media applications
SO APPLIED PHYSICS LETTERS
LA English
DT Article
AB We investigated different fabrication methods for (002) textured high anisotropy L1(0)-FePt thin continuous films. While depositing at elevated temperature or post-annealing yields discontinuous or very rough films unsuitable for bit patterned media (BPM) fabrication, post-annealing with an additional SiO2 cap layer results in smooth continuous L1(0)-FePt thin films that can be used for patterning. The SiO2 layer can be removed after annealing without significantly damaging the FePt, thus allowing additional deposition of lower anisotropy layers for forming exchange coupled composite or other layered BPM structures. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4748162]
C1 [McCallum, A. T.; Kercher, D.; Lille, J.; Weller, D.; Hellwig, O.] Western Digital Co, HGST, San Jose Res Ctr, San Jose, CA 95135 USA.
RP McCallum, AT (reprint author), Western Digital Co, HGST, San Jose Res Ctr, 3403 Yerba Buena Rd, San Jose, CA 95135 USA.
CR Brombacher C, 2012, NANOTECHNOLOGY, V23, DOI 10.1088/0957-4484/23/2/025301
   Bublat T, 2011, J APPL PHYS, V110, DOI 10.1063/1.3646550
   Feng LW, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3428777
   Hamrle J, 2002, PHYS REV B, V66, DOI 10.1103/PhysRevB.66.224423
   Hauet T, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3270535
   Hellwig O, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3271679
   Kikuchi N, 2003, APPL PHYS LETT, V82, P4313, DOI 10.1063/1.1580994
   Kim C, 2007, APPL PHYS LETT, V91, DOI 10.1063/1.2802038
   Kurth F, 2010, PHYS REV B, V82, DOI 10.1103/PhysRevB.82.184404
   Liu Y, 2011, APPL PHYS LETT, V99, DOI 10.1063/1.3656038
   McCallum AT, 2011, APPL PHYS LETT, V98, DOI 10.1063/1.3599573
   Mei JK, 2011, J APPL PHYS, V109, DOI 10.1063/1.3564950
   Mosendz O, 2012, J APPL PHYS, V111, DOI 10.1063/1.3680543
   PARKIN SSP, 1991, PHYS REV LETT, V67, P3598, DOI 10.1103/PhysRevLett.67.3598
   Richter HJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2209179
   Shimatsu T, 2011, J APPL PHYS, V109, DOI 10.1063/1.3556697
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Tobari K, 2011, JPN J APPL PHYS, V50, DOI 10.1143/JJAP.50.073001
   Tsuji Y, 2011, J VAC SCI TECHNOL B, V29, DOI 10.1116/1.3575155
   Victora RH, 2005, IEEE T MAGN, V41, P537, DOI 10.1109/TMAG.2004.838075
   Wang H, 2012, J APPL PHYS, V111, DOI 10.1063/1.3677793
   Weller D, 1999, IEEE T MAGN, V35, P4423, DOI 10.1109/20.809134
   Yang E, 2008, J APPL PHYS, V104, DOI 10.1063/1.2956691
   Zhang L, 2010, J MAGN MAGN MATER, V322, P2658, DOI 10.1016/j.jmmm.2010.04.003
NR 24
TC 11
Z9 11
U1 2
U2 27
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0003-6951
J9 APPL PHYS LETT
JI Appl. Phys. Lett.
PD AUG 27
PY 2012
VL 101
IS 9
AR 092402
DI 10.1063/1.4748162
PG 4
WC Physics, Applied
SC Physics
GA 000SI
UT WOS:000308408100040
ER

PT J
AU Francisco, NC
   Rodrigues, NMM
   da Silva, EAB
   de Carvalho, MB
   de Faria, SMM
AF Francisco, Nelson C.
   Rodrigues, Nuno M. M.
   da Silva, Eduardo A. B.
   de Carvalho, Murilo Bresciani
   de Faria, Sergio M. M.
TI Efficient Recurrent Pattern Matching Video Coding
SO IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS FOR VIDEO TECHNOLOGY
LA English
DT Article
DE Dictionary-based coding; recurrent pattern matching; vector
   quantization; video coding
ID VECTOR QUANTIZATION; SIGNAL COMPRESSION; IMAGE; DISTORTION; STANDARD
AB In this paper, we propose a pattern-matching-based algorithm for video compression. This algorithm, named multidimensional multiscale parser (MMP)-Video, is based on the H.264/AVC video encoder, but uses a pattern-matching paradigm instead of the state-of-the-art transform-quantization-entropy encoding approach. The proposed method adopts the use of multiscale recurrent patterns to compress both spatial and temporal prediction residues, totally replacing the use of transforms and quantization. Experimental results show that the coding performance of MMP-Video is better than the one of H.264/AVC high profile, especially for medium to high bit-rates. The gains range up to 0.7 dB, showing that, in spite of its larger computational complexity, the use of multiscale recurrent pattern matching paradigm deserves being investigated as an alternative for video compression.
C1 [Francisco, Nelson C.; Rodrigues, Nuno M. M.; de Faria, Sergio M. M.] Inst Telecomunicacoes, P-2411901 Leiria, Portugal.
   [Francisco, Nelson C.; Rodrigues, Nuno M. M.; de Faria, Sergio M. M.] Inst Politecn Leiria, Escola Super Tecnol & Gestao, Dept Elect Engn, P-2411901 Leiria, Portugal.
   [da Silva, Eduardo A. B.] Univ Fed Rio de Janeiro, Program Elect Engn, COPPE, BR-21945970 Rio De Janeiro, Brazil.
   [da Silva, Eduardo A. B.] Univ Fed Rio de Janeiro, Dept Elect, BR-21945970 Rio De Janeiro, Brazil.
   [de Carvalho, Murilo Bresciani] Univ Fed Fluminense, Dept Telecommun Engn, BR-24210240 Niteroi, RJ, Brazil.
RP Francisco, NC (reprint author), Inst Telecomunicacoes, P-2411901 Leiria, Portugal.
EM ncarreira@lps.ufrj.br; nuno.rodrigues@co.it.pt; eduardo@lps.ufrj.br;
   murilo@telecom.uff.br; sergio.faria@co.it.pt
RI Faria, Sergio/C-5245-2011
OI Faria, Sergio/0000-0002-0993-9124; M. M. Rodrigues,
   Nuno/0000-0001-9536-1017
FU Fundacao para a Ciencia e Tecnologia, Portugal [SFRH/BD/45460/2008];
   Project COMUVI [PTDC/EEA-TEL/099387/2008]
FX Manuscript received November 26, 2010; revised May 17, 2011 and December
   14, 2011; accepted December 19, 2011. Date of publication May 1, 2012;
   date of current version July 31, 2012. This work was supported by
   Fundacao para a Ciencia e Tecnologia, Portugal, under Grant
   SFRH/BD/45460/2008 and Project COMUVI (PTDC/EEA-TEL/099387/2008). This
   paper was recommended by Associate Editor E. Magli.
CR Alzina M, 2002, IEEE T IMAGE PROCESS, V11, P318, DOI 10.1109/83.988964
   Bjontegaard G., 2001, VCEGM33
   Caetano R., 2002, P ICIP JUN, V3, P677
   CHANG RF, 1992, IEE PROC-I, V139, P9
   de Carvalho MB, 2002, SIGNAL PROCESS, V82, P1559, DOI 10.1016/S0165-1684(02)00302-X
   de Carvalho M. B., 1994, P IEEE INT S INF THE, P415
   Duarte MHV, 2005, IEEE T CIRC SYST VID, V15, P1434, DOI 10.1109/TCSVT.2005.856926
   Filho E. B. L., 2008, IEEE T IMAGE PROCESS, V17, P512
   Filho EBL, 2009, IEEE T BIO-MED ENG, V56, P896, DOI 10.1109/TBME.2008.2005939
   Flierl M, 2003, IEEE T CIRC SYST VID, V13, P587, DOI 10.1109/TCSVT.2003.814963
   Francisco N. C., 2011, P INT C COMP TOOL AP, P1
   FRANCISCO NC, 2008, IEEE IMAGE PROC, P141
   Francisco NC, 2010, IEEE T IMAGE PROCESS, V19, P2712, DOI 10.1109/TIP.2010.2049181
   Gersho A., 1991, VECTOR QUANTIZATION
   Graziosi DB, 2009, 2009 16TH IEEE INTERNATIONAL CONFERENCE ON IMAGE PROCESSING, VOLS 1-6, P2813, DOI 10.1109/ICIP.2009.5414219
   Graziosi D. B., 2009, P C TEL MAY, P1
   Gu MH, 2009, 2009 SECOND INTERNATIONAL SYMPOSIUM ON KNOWLEDGE ACQUISITION AND MODELING: KAM 2009, VOL 2, P45, DOI 10.1109/KAM.2009.32
   Li Xin, 2006, EURASIP J APPL SIG P, V2006, P126
   Lucas LFR, 2010, IEEE IMAGE PROC, P1329, DOI 10.1109/ICIP.2010.5653834
   Neff R, 2002, IEEE T CIRC SYST VID, V12, P13, DOI 10.1109/76.981842
   Neff R, 2002, IEEE T CIRC SYST VID, V12, P27, DOI 10.1109/76.981843
   Ortega A, 1998, IEEE SIGNAL PROC MAG, V15, P23, DOI 10.1109/79.733495
   Rodrigues NMM, 2008, IEEE T IMAGE PROCESS, V17, P1640, DOI 10.1109/TIP.2008.2001392
   Rodrigues NMM, 2006, IEEE IMAGE PROC, P1353
   Suhring K., 2009, H 264 AVC REFERENCE
   Wagner M, 1999, IEEE DATA COMPR CONF, P556, DOI 10.1109/DCC.1999.785713
   Wagner M., 2000, P EUSIPCO SEP, P1
   Wiegand T, 2003, IEEE T CIRC SYST VID, V13, P560, DOI 10.1109/TCSVT.2003.815165
   WITTEN IH, 1987, COMMUN ACM, V30, P520, DOI 10.1145/214762.214771
   ZIV J, 1977, IEEE T INFORM THEORY, V23, P337, DOI 10.1109/TIT.1977.1055714
   ZIV J, 1978, IEEE T INFORM THEORY, V24, P530, DOI 10.1109/TIT.1978.1055934
NR 31
TC 3
Z9 3
U1 0
U2 6
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 1051-8215
EI 1558-2205
J9 IEEE T CIRC SYST VID
JI IEEE Trans. Circuits Syst. Video Technol.
PD AUG
PY 2012
VL 22
IS 8
BP 1161
EP 1173
DI 10.1109/TCSVT.2012.2197079
PG 13
WC Engineering, Electrical & Electronic
SC Engineering
GA 001CN
UT WOS:000308437500005
ER

PT J
AU Fukuda, Y
   Saotome, Y
   Nishiyama, N
   Saidoh, N
   Makabe, E
   Inoue, A
AF Fukuda, Yasuyuki
   Saotome, Yasunori
   Nishiyama, Nobuyuki
   Saidoh, Noriko
   Makabe, Eiichi
   Inoue, Akihisa
TI Fabrication of Molds with 25-nm Dot-Pitch Pattern by Focused Ion Beam
   and Reactive Ion Etching for Nanoimprint Using Metallic Glass
SO JAPANESE JOURNAL OF APPLIED PHYSICS
LA English
DT Article
ID LITHOGRAPHY; TECHNOLOGY; DEPOSITION; DENSITY; MEDIA; ARRAY
AB Here we attempted to fabricate molds (dies) of nanodot arrays with a 25-nm pitch and to nanoimprint metallic glass for developing bit-patterned media with an ultrahigh recording density of 1 Tbit/in (2). The mold-fabricating process consisted of mask patterning by focused ion beam assisted chemical vapor deposition (FIB-CVD) and reactive ion etching (RIE). We investigated the feasibility of a Pt-deposited metal etching mask on SiO2 on Si and diamond like carbon (DLC) on Al2O3 substrates, and achieved isolated convex nanodot arrays with a 25-nm pitch and an aspect ratio of 1.8 by RIE with O-2 plasma on a DLC/Al2O3 substrate. Subsequently, we nanoimprinted Pt-based metallic glass by using the fabricated molds and successfully replicated fine concave nanohole arrays. The results suggest that the FIB-CVD/RIE process is a promising technique for fabricating ultrafine nanopatterned molds, and metallic glasses are ideal nanoimprintable materials for mass producing nanodevices such as bit-patterned media. (c) 2012 The Japan Society of Applied Physics
C1 [Fukuda, Yasuyuki; Makabe, Eiichi] BMG Co Ltd, Sendai, Miyagi 9830036, Japan.
   [Fukuda, Yasuyuki] Tohoku Univ, Grad Sch Engn, Sendai, Miyagi 9808577, Japan.
   [Saotome, Yasunori] Tohoku Univ, Kansai Ctr, Inst Mat Res, Himeji, Hyogo 6712280, Japan.
   [Nishiyama, Nobuyuki; Saidoh, Noriko] Mat Proc Technol Ctr, RIMCOF Tohoku Univ Lab, Sendai, Miyagi 9808577, Japan.
RP Fukuda, Y (reprint author), BMG Co Ltd, Sendai, Miyagi 9830036, Japan.
EM y_fukuda@imr.tohoku.ac.jp
RI Saotome, Yasunori/B-3267-2010; Nishiyama, Nobuyuki/C-8228-2015; Inoue,
   Akihisa/E-5271-2015
OI Saotome, Yasunori/0000-0002-6110-5573; 
FU Technological Development of Innovate Components Based on Enhanced
   Functionality Metallic Glass Project of the Ministry of Economy, Trade
   and Industry (METI)
FX A part of this work was supported by the Technological Development of
   Innovate Components Based on Enhanced Functionality Metallic Glass
   Project of the Ministry of Economy, Trade and Industry (METI).
CR BERRY IL, 1983, J VAC SCI TECHNOL B, V1, P1059, DOI 10.1116/1.582676
   Chekurov N, 2009, NANOTECHNOLOGY, V20, DOI 10.1088/0957-4484/20/6/065307
   Chen P, 2008, JPN J APPL PHYS, V47, P5123, DOI 10.1143/JJAP.47.5123
   CHOU SY, 1994, J APPL PHYS, V76, P6673, DOI 10.1063/1.358164
   Chou SY, 1996, J VAC SCI TECHNOL B, V14, P4129, DOI 10.1116/1.588605
   Fukuda Y, 2011, MATER TRANS, V52, P239, DOI 10.2320/matertrans.M2010241
   Hosaka S, 2008, MICROELECTRON ENG, V85, P774, DOI 10.1016/j.mee.2007.12.081
   Inoue A, 2000, ACTA MATER, V48, P279, DOI 10.1016/S1359-6454(99)00300-6
   Kato H, 2006, SCRIPTA MATER, V54, P2023, DOI 10.1016/j.scriptamat.2006.03.025
   Komatsu Y, 1999, DIAM RELAT MATER, V8, P2018, DOI 10.1016/S0925-9635(99)00138-7
   Kumar G, 2009, NATURE, V457, P868, DOI 10.1038/nature07718
   Matsui S, 2000, J VAC SCI TECHNOL B, V18, P3181, DOI 10.1116/1.1319689
   Naito K, 2002, IEEE T MAGN, V38, P1949, DOI 10.1109/TMAG.2002.802847
   Nakamatsu K, 2006, JPN J APPL PHYS 2, V45, pL954, DOI 10.1143/JJAP.45.L954
   Nishiyama N, 2010, INTERMETALLICS, V18, P1983, DOI 10.1016/j.intermet.2010.02.027
   Notargiacomo A, 2011, MICROELECTRON ENG, V88, P2710, DOI 10.1016/j.mee.2011.02.053
   Reyntjens S, 2001, J MICROMECH MICROENG, V11, P287, DOI 10.1088/0960-1317/11/4/301
   Saotome Y, 2007, J ALLOY COMPD, V434, P97, DOI 10.1016/j.jallcom.2006.08.126
   Saotome Y, 2002, INTERMETALLICS, V10, P1241, DOI 10.1016/S0966-9795(02)00135-8
   Saotome Y, 2007, MATER SCI FORUM, V539-543, P2088
   Sbiaa R, 2007, RECENT PAT NANOTECH, V1, P29, DOI 10.2174/187221007779814754
   Solak HH, 2007, J VAC SCI TECHNOL B, V25, P2123, DOI 10.1116/1.2799974
   Wi JS, 2008, SMALL, V4, P2118, DOI 10.1002/smll.200800625
   Ziegler JF, 2004, NUCL INSTRUM METH B, V219, P1027, DOI 10.1016/j.nimb.2004.01.208
NR 24
TC 2
Z9 2
U1 0
U2 39
PU JAPAN SOC APPLIED PHYSICS
PI TOKYO
PA KUDAN-KITA BUILDING 5TH FLOOR, 1-12-3 KUDAN-KITA, CHIYODA-KU, TOKYO,
   102-0073, JAPAN
SN 0021-4922
J9 JPN J APPL PHYS
JI Jpn. J. Appl. Phys.
PD AUG
PY 2012
VL 51
IS 8
AR 086702
DI 10.1143/JJAP.51.086702
PN 1
PG 5
WC Physics, Applied
SC Physics
GA 995FG
UT WOS:000307992700052
ER

PT J
AU Maqableh, MM
   Huang, XB
   Sung, SY
   Reddy, KSM
   Norby, G
   Victora, RH
   Stadler, BJH
AF Maqableh, Mazin M.
   Huang, Xiaobo
   Sung, Sang-Yeob
   Reddy, K. Sai Madhukar
   Norby, Gregory
   Victora, R. H.
   Stadler, Bethanie J. H.
TI Low-Resistivity 10 nm Diameter Magnetic Sensors
SO NANO LETTERS
LA English
DT Article
DE Single nanowire resistivity; magnetic sensors; read sensors; magnetic
   recording; high density hard drives; CPP GMR
ID BIT-PATTERNED MEDIA; ELECTRON-BEAM LITHOGRAPHY; GIANT MAGNETORESISTANCE;
   BLOCK-COPOLYMERS; MULTILAYERED NANOWIRES; TEMPLATE SYNTHESIS; RECORDING
   MEDIA; SPIN-VALVES; FABRICATION; NANOPARTICLES
AB Resistivities of 5.4 mu Omega.cm were measured in 10-nm-diameter metallic wires. Low resistance is important for interconnections of the future to prevent heating, electromigration, high power consumption, and long RC time constants. To demonstrate application of these wires, Co/Cu/Co magnetic sensors were synthesized with 20-30 Omega and 19% magnetoresistance. Compared to conventional lithographically produced magnetic tunnel junction sensors, these structures offer facile fabrication and over 2 orders of magnitude lower resistances due to smooth sidewalls from in situ templated chemical growth.
C1 [Maqableh, Mazin M.; Huang, Xiaobo; Sung, Sang-Yeob; Reddy, K. Sai Madhukar; Norby, Gregory; Victora, R. H.; Stadler, Bethanie J. H.] Univ Minnesota, Dept Elect & Comp Engn, Minneapolis, MN 55455 USA.
RP Stadler, BJH (reprint author), Univ Minnesota, Dept Elect & Comp Engn, Minneapolis, MN 55455 USA.
EM stadler@umn.edu
OI Reddy, Kotha Sai Madhukar/0000-0003-2385-7827
FU NSF [ECS-0621868]; GOALI program; MRSEC Program of the National Science
   Foundation (NSF) [DMR-0819885]; NSF through the NNIN program
FX We gratefully acknowledge original support from NSF ECS-0621868 and the
   GOALI program. We give special thanks to Tao Qu for dipole field
   calculations and Seagate Technologies, Ed Murdock and Haesok Cho for
   useful discussions. This work was supported primarily by the MRSEC
   Program of the National Science Foundation (NSF) under Award Number
   DMR-0819885. The work originated under NSF ECS0621868 and the GOALI
   program. We give special thanks to Tao Qu for dipole field calculations.
   Parts of this work were carried out in the University of Minnesota
   Nanofabrication Center and Characterization Facility which receive
   partial support from NSF through the NNIN program.
CR BLONDEL A, 1994, APPL PHYS LETT, V65, P3019, DOI 10.1063/1.112495
   Briseno AL, 2007, NANO LETT, V7, P668, DOI 10.1021/nl0627036
   Chawla JS, 2011, PHYS REV B, V84, DOI 10.1103/PhysRevB.84.235423
   Chen X, 2008, APPL PHYS LETT, V93, DOI 10.1063/1.3006050
   Cheng JY, 2004, NAT MATER, V3, P823, DOI 10.1038/nmat1211
   Childress JR, 2008, IEEE T MAGN, V44, P90, DOI 10.1109/TMAG.2007.911019
   Choi C, 2010, ELECTRON MATER LETT, V6, P113, DOI 10.3365/eml.2010.09.113
   Choi DS, 2010, CURR APPL PHYS, V10, P1037, DOI 10.1016/j.cap.2009.12.036
   Choi Y, 2009, JPN J APPL PHYS, V48, DOI 10.1143/JJAP.48.120214
   Durkan C, 2000, PHYS REV B, V61, P14215, DOI 10.1103/PhysRevB.61.14215
   Fan DL, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2891091
   Frank S, 1998, SCIENCE, V280, P1744, DOI 10.1126/science.280.5370.1744
   Friedman RS, 2005, NATURE, V434, P1085, DOI 10.1038/4341085a
   Fuchs K, 1938, P CAMB PHILOS SOC, V34, P100
   Fukuzawa H, 2004, IEEE T MAGN, V40, P2236, DOI 10.1109/TMAG.2004.829185
   Furubayashi T, 2008, APPL PHYS LETT, V93, DOI 10.1063/1.2990647
   Galanakis I., 2008, J APPL PHYS, V104
   Graham RL, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3292022
   Hernandez S, 2011, J APPL PHYS, V109, DOI 10.1063/1.3562924
   Hu YJ, 2008, NANO LETT, V8, P925, DOI 10.1021/nl073407b
   Huang XB, 2009, J APPL PHYS, V105, DOI 10.1063/1.3075990
   Jones BA, 2005, J APPL PHYS, V97, DOI 10.1063/1.1852452
   Kamata Y, 2011, IEEE T MAGN, V47, P51, DOI 10.1109/TMAG.2010.2077274
   Kappenberger P, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3176937
   Karim S, 2008, PHYSICA E, V40, P3173, DOI 10.1016/j.physe.2008.05.011
   Kim SO, 2003, NATURE, V424, P411, DOI 10.1038/nature01775
   Kim TH, 2010, NANO LETT, V10, P3096, DOI 10.1021/nl101734h
   Kitano H, 2007, LANGMUIR, V23, P6404, DOI 10.1021/la0637014
   Kitaoka Y, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3202418
   Kryder M.H., 2008, P IEEE
   Lee W, 2006, NAT MATER, V5, P741, DOI 10.1038/nmat1717
   Li MQ, 2006, MATER TODAY, V9, P30, DOI 10.1016/S1369-7021(06)71620-0
   Li XY, 2010, NATURE, V464, P877, DOI 10.1038/nature08929
   LIU K, 1995, PHYS REV B, V51, P7381, DOI 10.1103/PhysRevB.51.7381
   Lu L, 2004, SCIENCE, V304, P422, DOI 10.1126/science.1092905
   Maqableh M.M., 2012, IEEE T MAGN, V48, P1
   MASUDA H, 1995, SCIENCE, V268, P1466, DOI 10.1126/science.268.5216.1466
   Naito K, 2002, IEEE T MAGN, V38, P1949, DOI 10.1109/TMAG.2002.802847
   Naito K, 2005, CHAOS, V15, P47507
   Nakamoto K, 2008, IEEE T MAGN, V44, P95, DOI 10.1109/TMAG.2007.911022
   Nakatani TM, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3432070
   Ohgai T, 2003, J PHYS D APPL PHYS, V36, P3109, DOI 10.1088/0022-3727/36/24/003
   Ohgai T, 2003, NANOTECHNOLOGY, V14, P978, DOI 10.1088/0957-4484/14/9/308
   Peng J, 2006, LANGMUIR, V22, P3955
   Peng XL, 2009, J MAGN MAGN MATER, V321, P1889, DOI 10.1016/j.jmmm.2008.12.008
   PIRAUX L, 1994, APPL PHYS LETT, V65, P2484, DOI 10.1063/1.112672
   Piraux L, 2007, NANO LETT, V7, P2563, DOI 10.1021/nl070263s
   Puntes VF, 2004, NAT MATER, V3, P263, DOI 10.1038/nmat1094
   Ramana B., 2004, JPN J APPL PHYS, V43, P7381
   Ross CA, 2008, MRS BULL, V33, P838, DOI 10.1557/mrs2008.179
   Service RF, 2006, SCIENCE, V314, P1868, DOI 10.1126/science.314.5807.1868
   Smith N, 2006, IEEE T MAGN, V42, P114, DOI 10.1109/TMAG.2005.861783
   SONDHEIMER EH, 1952, ADV PHYS, V1, P1, DOI 10.1080/00018735200101151
   Steinhogl W, 2002, PHYS REV B, V66, DOI 10.1103/PhysRevB.66.075414
   Stoykovich MP, 2006, MATER TODAY, V9, P20, DOI 10.1016/S1369-7021(06)71619-4
   Sun SH, 2000, SCIENCE, V287, P1989, DOI 10.1126/science.287.5460.1989
   Tan LW, 2006, J MATER RES, V21, P2870, DOI 10.1557/JMR.2006.0348
   TAYLOR RC, 1982, SOLID STATE COMMUN, V41, P503, DOI 10.1016/0038-1098(82)90535-X
   Terris BD, 2009, J MAGN MAGN MATER, V321, P512, DOI 10.1016/j.jmmm.2008.05.046
   Verdes C, 2006, J MAGN MAGN MATER, V304, P27, DOI 10.1016/j.jmmm.2006.01.123
   Wang JP, 2008, P IEEE, V96, P1847, DOI 10.1109/JPROC.2008.2004318
   Weiss N, 2005, PHYS REV LETT, V95, DOI 10.1103/PhysRevLett.95.157204
   Wood R, 2009, IEEE T MAGN, V45, P917, DOI 10.1109/TMAG.2008.2010676
   Wu Y, 2004, NATURE, V430, P61, DOI 10.1038/nature02674
   Xiang C, 2008, NANO LETT, V8, P3017, DOI 10.1021/nl8021175
   Xiang CX, 2008, ACS NANO, V2, P1939, DOI 10.1021/nn800394k
   Yan H, 2011, NATURE, V470, P240, DOI 10.1038/nature09749
   Yang PD, 2010, NANO LETT, V10, P1529, DOI 10.1021/nl100665r
   Yang X, 2007, J VAC SCI TECHNOL B, V25, P2202, DOI 10.1116/1.2798711
   Yang XM, 2009, ACS NANO, V3, P1844, DOI 10.1021/nn900073r
   Yang XM, 2009, IEEE T MAGN, V45, P833, DOI 10.1109/TMAG.2008.2010647
   Zhang W., 2007, J APPL PHYS, V101, P06370
   Zhu JG, 2008, IEEE T MAGN, V44, P125, DOI 10.1109/TMAG.2007.911031
   Zou J, 2006, APPL PHYS LETT, V89, DOI 10.1063/1.2337560
NR 74
TC 26
Z9 26
U1 2
U2 67
PU AMER CHEMICAL SOC
PI WASHINGTON
PA 1155 16TH ST, NW, WASHINGTON, DC 20036 USA
SN 1530-6984
EI 1530-6992
J9 NANO LETT
JI Nano Lett.
PD AUG
PY 2012
VL 12
IS 8
BP 4102
EP 4109
DI 10.1021/nl301610z
PG 8
WC Chemistry, Multidisciplinary; Chemistry, Physical; Nanoscience &
   Nanotechnology; Materials Science, Multidisciplinary; Physics, Applied;
   Physics, Condensed Matter
SC Chemistry; Science & Technology - Other Topics; Materials Science;
   Physics
GA 984SD
UT WOS:000307211000038
PM 22783942
ER

PT J
AU Descovich, KA
   Lisle, AT
   Johnston, S
   Phillips, CJC
AF Descovich, Kristin A.
   Lisle, Allan T.
   Johnston, Stephen
   Phillips, Clive J. C.
TI Space allowance and the behaviour of captive southern hairy-nosed
   wombats (Lasiorhinus latifrons)
SO APPLIED ANIMAL BEHAVIOUR SCIENCE
LA English
DT Article
DE Wombat; Captivity; Enclosure; Space allowance
ID BURROW-USE; ACTIVITY PATTERNS; VOMBATUS-URSINUS; RANGING BEHAVIOR;
   ENCLOSURE SIZE; HEART-RATE; AGGRESSION; STRESS; ZOO; RESPONSES
AB Captive southern hairy-nosed wombats (Lasiorhinus latifrons) often display indicators of sub-standard welfare, including aggression and stereotypical pacing. To determine if space availability influences the welfare of wombats, the behaviour of three groups of L. latifrons (n = 3) was studied in three different sized enclosures: small (S) (75.5 m(2); the minimum space requirement for three wombats in Queensland, Australia), medium (M) (151 m(2), twice the minimum space) and large (L) (224 m(2), three times the minimum space) in a Latin square design. Compared to wombats in larger enclosures, those in the small enclosure were observed to display more biting (S: 1.96; M: 0.42; L: 0.28, SED +/- 0.56 counts/day, P=0.01), retreat from conspecifics (S: 15.0; M: 9.9; L: 7.1 SED +/- 2.66 counts/day, P=0.03), and visual scanning (S: 52.8; M: 33.9; L: 28.8, SED +/- 4.62 counts/day, P < 0.001); they also spent more time fenceline digging, which may represent attempts to escape (S: 0.78; M: 0.16; L: 0.24, SED +/- 10.07 min/m/day, P < 0.0001). Those in the largest enclosure showed less self-directed grooming behaviour than those in the two smaller enclosures (S: 23.80; M: 24.08; L: 14.42, SED +/- 3.22 counts/day, P = 0.02). It is concluded that small enclosure size had a negative impact on the behaviour of wombat, and as a consequence, current minimum space requirements for wombats in captivity should be reassessed. (C) 2012 Elsevier B.V. All rights reserved.
C1 [Descovich, Kristin A.; Johnston, Stephen; Phillips, Clive J. C.] Univ Queensland, Sch Vet Sci, Ctr Anim Welf & Eth, Gatton, Qld 4343, Australia.
   [Descovich, Kristin A.; Lisle, Allan T.; Johnston, Stephen] Univ Queensland, Sch Agr & Food Sci, Gatton, Qld 4343, Australia.
RP Descovich, KA (reprint author), Univ Queensland, Sch Vet Sci, Ctr Anim Welf & Eth, Gatton, Qld 4343, Australia.
EM k.descovich1@uq.edu.au
FU Wombat Foundation
FX Funding for this experiment was provided by the Wombat Foundation. The
   funding source played no role in conducting this experiment or preparing
   the manuscript for publication. Additionally, the Wombat Foundation was
   not involved in the study design, or the collection, analysis and
   interpretation of data, or in the decision to submit the paper for
   publication.
CR ARAZPA, 2007, COD PRACT AUSTR REG
   Brummer SP, 2010, APPL ANIM BEHAV SCI, V125, P171, DOI 10.1016/j.applanim.2010.04.012
   Carder G, 2008, APPL ANIM BEHAV SCI, V115, P211, DOI 10.1016/j.applanim.2008.06.001
   Daniel JR, 2008, INT J PRIMATOL, V29, P1219, DOI 10.1007/s10764-008-9300-7
   Day T., 2007, USDA NATL WILDLIFE R
   Dennis L, 2008, GUIDE CARE BARE NOSE, P1
   Descovich K.A., EFFECT GROUP S UNPUB
   Descovich KA, 2012, APPL ANIM BEHAV SCI, V138, P110, DOI 10.1016/j.applanim.2012.01.017
   DeVries TJ, 2004, J DAIRY SCI, V87, P1432
   Eriksson P, 2010, ZOO BIOL, V29, P732, DOI 10.1002/zoo.20323
   Evans MC, 2008, WILDLIFE RES, V35, P455, DOI 10.1071/WR07067
   Finlayson GR, 2005, J ZOOL, V265, P189, DOI 10.1017/S095283690400620X
   HOGAN ES, 1988, APPL ANIM BEHAV SCI, V21, P147, DOI 10.1016/0168-1591(88)90105-0
   Hogan L. A., 2009, AUST MAMMAL, V31, P123, DOI [10.1071/AM09023, DOI 10.1071/AM09023]
   Hogan LA, 2007, APPL ANIM BEHAV SCI, V105, P180, DOI 10.1016/j.applanim.2006.06.006
   Hogan LA, 2011, APPL ANIM BEHAV SCI, V134, P217, DOI 10.1016/j.applanim.2011.07.010
   Hogan LA, 2011, AUST J ZOOL, V59, P35, DOI 10.1071/ZO11006
   Hogan LA, 2010, APPL ANIM BEHAV SCI, V126, P85, DOI 10.1016/j.applanim.2010.05.009
   Honess PE, 2006, NEUROSCI BIOBEHAV R, V30, P390, DOI 10.1016/j.neubiorev.2005.04.003
   Horsup A., 2004, RECOVERY PLAN NO HAI
   Li CW, 2007, GEN COMP ENDOCR, V151, P202, DOI 10.1016/j.ygcen.2007.01.014
   Marchant JN, 1997, APPL ANIM BEHAV SCI, V55, P67, DOI 10.1016/S0168-1591(97)00022-1
   Mason GJ, 2010, TRENDS ECOL EVOL, V25, P713, DOI 10.1016/j.tree.2010.08.011
   Mason GJ, 2010, ZOO BIOL, V29, P237, DOI 10.1002/zoo.20256
   McBride S, 2009, J EQUINE VET SCI, V29, P10, DOI 10.1016/j.jevs.2008.11.008
   Metrione L.C, 2011, RELATIONSHIPS SOCIAL
   Miller A., 2010, ZOO BIOL, V29, P1
   Morgan KN, 2007, APPL ANIM BEHAV SCI, V102, P262, DOI 10.1016/j.applanim.2006.05.032
   Muller DWH, 2010, EUR J WILDLIFE RES, V56, P205, DOI 10.1007/s10344-009-0342-8
   NSW Department of Primary Industries, 2006, STAND EXH AUSTR MAMM
   Peng JJ, 2007, APPL ANIM BEHAV SCI, V104, P151, DOI 10.1016/j.applanim.2006.04.029
   Reade LS, 1996, APPL ANIM BEHAV SCI, V47, P109, DOI 10.1016/0168-1591(95)01014-9
   Shimmin GA, 2002, J ZOOL, V258, P469, DOI 10.1017/S0952836902001620
   Treby D, 2005, HUSBANDRY MANUAL SO
   Triggs B., 2009, WOMBATS
   van Zeeland YRA, 2009, APPL ANIM BEHAV SCI, V121, P75, DOI 10.1016/j.applanim.2009.09.006
   Walker FM, 2007, MOL ECOL, V16, P199, DOI 10.1111/j.1365-294X.2006.03131.x
   Walker FM, 2006, J MAMMAL, V87, P690, DOI 10.1644/05-MAMM-A-287R2.1
   Watters JV, 2009, ZOO BIOL, V28, P501, DOI 10.1002/zoo.20287
   WELLS RT, 1978, AUST WILDLIFE RES, V5, P299
NR 40
TC 3
Z9 3
U1 4
U2 62
PU ELSEVIER SCIENCE BV
PI AMSTERDAM
PA PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
SN 0168-1591
J9 APPL ANIM BEHAV SCI
JI Appl. Anim. Behav. Sci.
PD AUG
PY 2012
VL 140
IS 1-2
BP 92
EP 98
DI 10.1016/j.applanim.2012.05.009
PG 7
WC Agriculture, Dairy & Animal Science; Behavioral Sciences; Veterinary
   Sciences
SC Agriculture; Behavioral Sciences; Veterinary Sciences
GA 983SW
UT WOS:000307140000010
ER

PT J
AU Wu, KS
   Tan, HY
   Liu, YH
   Zhang, J
   Zhang, Q
   Ni, LM
AF Wu, Kaishun
   Tan, Haoyu
   Liu, Yunhuai
   Zhang, Jin
   Zhang, Qian
   Ni, Lionel M.
TI Side Channel: Bits over Interference
SO IEEE TRANSACTIONS ON MOBILE COMPUTING
LA English
DT Article
DE Wireless network; interference; coordination
AB Interference is a critical issue in wireless communications. In a typical multiple-user environment, different users may severely interfere with each other. Coordination among users therefore is an indispensable part for interference management in wireless networks. It is known that coordination among multiple nodes is a costly operation taking a significant amount of valuable communication resource. In this paper, we have an interesting observation that by generating intended patterns, some simultaneous transmissions, i.e., "interference," can be successfully decoded without degrading the effective throughput in original transmission. As such, an extra and "free" coordination channel can be built. Based on this idea, we propose a DC-MAC to leverage this "free" channel for efficient medium access in a multiple-user wireless network. We theoretically analyze the capacity of this channel under different environments with various modulation schemes. USRP2-based implementation experiments show that compared with the widely adopted CSMA, DC-MAC can improve the channel utilization efficiency by up to 250 percent.
C1 [Wu, Kaishun] Sun Yat Sen Univ, Sch Phys & Engn, Natl Engn Res Ctr Digital Life, Guangzhou 510275, Guangdong, Peoples R China.
   [Wu, Kaishun] Hong Kong Univ Sci & Technol, Fok Ying Tung Grad Sch, Hong Kong, Hong Kong, Peoples R China.
   [Tan, Haoyu; Zhang, Jin; Zhang, Qian; Ni, Lionel M.] Hong Kong Univ Sci & Technol, Dept Comp Sci & Engn, Kowloon, Hong Kong, Peoples R China.
   [Liu, Yunhuai] Chinese Acad Sci, Shenzhen Inst Adv Technol, Beijing 100864, Peoples R China.
RP Wu, KS (reprint author), Sun Yat Sen Univ, Sch Phys & Engn, Natl Engn Res Ctr Digital Life, Guangzhou 510275, Guangdong, Peoples R China.
EM kwinson@ust.hk; hytan@cse.ust.hk; yunhuai@siat.ac.cn; jinzh@cse.ust.hk;
   qianzh@cse.ust.hk; ni@cse.ust.hk
RI Wu, Kaishun /K-8825-2012
FU Hong Kong RGC [HKUST617710, HKUST617811]; China NSFC [60933011,
   60933012]; NSFC-Guangdong Joint Fund of China [U0735001, U0835004,
   U0935004]; Science and Technology Planning Project of Guangdong
   Province, China [2009A080207002]
FX This research was supported in part by the 2012 Guangzhou Pearl River
   New Star Technology Training Project, Hong Kong RGC Grants HKUST617710
   and HKUST617811, China NSFC Grants 60933011 and 60933012, NSFC-Guangdong
   Joint Fund of China under grant No. U0735001, U0835004, and U0935004,
   and the Science and Technology Planning Project of Guangdong Province,
   China, under Grant No. 2009A080207002.
CR Akella A., 2005, P ACM MOBICOM
   Bao L., 2001, P ACM MOBICOM
   Blossom E., 2012, GNU SOFTWARE DEFINED
   Brodsky M.Z., 2009, P ACM SIGCOMM
   Cadambe VR, 2008, IEEE T INFORM THEORY, V54, P3425, DOI 10.1109/TIT.2008.926344
   Chachulski S., 2007, P ACM SIGCOMM
   Ettus M., 2008, UNIVERSAL SOFTWARE R
   Gollakota S., 2009, P ACM SIGCOMM
   Grant AJ, 2001, IEEE T INFORM THEORY, V47, P873, DOI 10.1109/18.915637
   Gummadi R., 2008, P ACM WORKSH HOT TOP
   Halperin Daniel, 2008, P ACM MOBICOM
   Han B., 2010, P USENIX C NETW SYST
   IEEE, 2006, 8021542006 IEEE
   [Anonymous], 2007, 802112007 IEEE
   Jamieson K., 2007, P ACM SIGCOMM
   Katti S., 2007, P ACM SIGCOMM
   Katti S., 2006, P ACM SIGCOMM
   Li, 2008, P ACM MOBICOM
   Moscribroda T., 2008, P INT C NETW PROT IC
   Murty R., 2008, P USENIX S NETW SYST
   Nychis G., 2009, P USENIX S NETW SYST
   PICKHOLTZ RL, 1991, IEEE T VEH TECHNOL, V40, P313, DOI 10.1109/25.289412
   Qiu L., 2007, P ACM MOBICOM
   Ramachandran K., 2006, P IEEE INFOCOM
   Salehi M., 2007, DIGITAL COMMUNICATIO
   Schmid T., 2005, GNU RADIO 802 15 4 E
   Tan K., 2010, P ACM SIGCOMM
   Tse D., 2005, FUNDAMENTALS WIRELES
   Woo A., 2001, P ACM MOBICOM
   Wu K., 2010, P IEEE INT C COMM IC
   Wu KS, 2012, IEEE T MOBILE COMPUT, V11, P543, DOI 10.1109/TMC.2011.44
   Wu Kaishun, 2010, P IEEE INFOCOM
   Zhou G, 2006, P IEEE INFOCOM
   Zuniga M., 2004, P IEEE ANN C SENS AD
NR 34
TC 18
Z9 18
U1 0
U2 7
PU IEEE COMPUTER SOC
PI LOS ALAMITOS
PA 10662 LOS VAQUEROS CIRCLE, PO BOX 3014, LOS ALAMITOS, CA 90720-1314 USA
SN 1536-1233
J9 IEEE T MOBILE COMPUT
JI IEEE. Trans. Mob. Comput.
PD AUG
PY 2012
VL 11
IS 8
BP 1317
EP 1330
DI 10.1109/TMC.2011.158
PG 14
WC Computer Science, Information Systems; Telecommunications
SC Computer Science; Telecommunications
GA 964OO
UT WOS:000305705800006
ER

PT J
AU Chang, LV
   Nasruallah, A
   Ruchhoeft, P
   Khizroev, S
   Litvinov, D
AF Chang, L. V.
   Nasruallah, A.
   Ruchhoeft, P.
   Khizroev, S.
   Litvinov, D.
TI Graded bit patterned magnetic arrays fabricated via angled low-energy He
   ion irradiation
SO NANOTECHNOLOGY
LA English
DT Article
ID MEDIA
AB A bit patterned magnetic array based on Co/Pd magnetic multilayers with a binary perpendicular magnetic anisotropy distribution was fabricated. The binary anisotropy distribution was attained through angled helium ion irradiation of a bit edge using hydrogen silsesquioxane (HSQ) resist as an ion stopping layer to protect the rest of the bit. The viability of this technique was explored numerically and evaluated through magnetic measurements of the prepared bit patterned magnetic array. The resulting graded bit patterned magnetic array showed a 35% reduction in coercivity and a 9% narrowing of the standard deviation of the switching field.
C1 [Chang, L. V.; Nasruallah, A.; Ruchhoeft, P.; Litvinov, D.] Univ Houston, Houston, TX 77584 USA.
   [Khizroev, S.] Florida Int Univ, Miami, FL 33174 USA.
RP Chang, LV (reprint author), Univ Houston, Houston, TX 77584 USA.
EM lchang5@uh.edu
FU NSF [ECCS-0926027, CMMI-0927786]; Texas ARP [003652-0016-2007]
FX This work is supported by NSF grants ECCS-0926027, CMMI-0927786 and
   Texas ARP Grant 003652-0016-2007.
CR Ajan A, 2010, IEEE T MAGN, V46, P2020, DOI 10.1109/TMAG.2010.2043647
   Choi C, 2011, IEEE T MAGN, V47, P2532, DOI 10.1109/TMAG.2011.2158197
   Chunsheng E, 2006, J APPL PHYS, V99, P6
   Devolder T, 1999, APPL PHYS LETT, V74, P3383, DOI 10.1063/1.123352
   Fassbender J, 2004, J PHYS D APPL PHYS, V37, pR179, DOI 10.1088/0022-3727/37/16/R01
   Hellwig O, 2009, APPL PHYS LETT, P95
   Lau JW, 2008, APPL PHYS LETT, V92, P3
   McCallum AT, 2011, APPL PHYS LETT, V98, DOI 10.1063/1.3599573
   Nasrullah A., 2011, THESIS U HOUSTON
   Parekh V, 2007, J APPL PHYS, P101
   Sato K, 2010, J APPL PHYS, V107
   Shaw JM, 2008, PHYS REV B, V78
   Shen WK, 2006, J APPL PHYS, V100, DOI 10.1063/1.2374931
   Suess D, 2009, J MAGN MAGN MATER, V321, P545, DOI 10.1016/j.jmmm.2008.06.041
   Victora RH, 2005, IEEE T MAGN, V41, P537, DOI 10.1109/TMAG.2004.838075
NR 15
TC 2
Z9 2
U1 1
U2 5
PU IOP PUBLISHING LTD
PI BRISTOL
PA TEMPLE CIRCUS, TEMPLE WAY, BRISTOL BS1 6BE, ENGLAND
SN 0957-4484
J9 NANOTECHNOLOGY
JI Nanotechnology
PD JUL 11
PY 2012
VL 23
IS 27
AR 275705
DI 10.1088/0957-4484/23/27/275705
PG 4
WC Nanoscience & Nanotechnology; Materials Science, Multidisciplinary;
   Physics, Applied
SC Science & Technology - Other Topics; Materials Science; Physics
GA 965XW
UT WOS:000305802000022
PM 22710657
ER

PT J
AU Amos, N
   Butler, J
   Lee, B
   Shachar, MH
   Hu, B
   Tian, Y
   Hong, JM
   Garcia, D
   Ikkawi, RM
   Haddon, RC
   Litvinov, D
   Khizroev, S
AF Amos, Nissim
   Butler, John
   Lee, Beomseop
   Shachar, Meir H.
   Hu, Bing
   Tian, Yuan
   Hong, Jeongmin
   Garcia, Davil
   Ikkawi, Rabee M.
   Haddon, Robert C.
   Litvinov, Dmitri
   Khizroev, Sakhrat
TI Multilevel-3D Bit Patterned Magnetic Media with 8 Signal Levels Per
   Nanocolumn
SO PLOS ONE
LA English
DT Article
ID FILMS
AB This letter presents an experimental study that shows that a 3rd physical dimension may be used to further increase information packing density in magnetic storage devices. We demonstrate the feasibility of at least quadrupling the magnetic states of magnetic-based data storage devices by recording and reading information from nanopillars with three magnetically-decoupled layers. Magneto-optical Kerr effect microscopy and magnetic force microscopy analysis show that both continuous (thin film) and patterned triple-stack magnetic media can generate eight magnetically-stable states. This is in comparison to only two states in conventional magnetic recording. Our work further reveals that ferromagnetic interaction between magnetic layers can be reduced by combining Co/Pt and Co/Pd multilayers media. Finally, we are showing for the first time an MFM image of multilevel-3D bit patterned media with 8 discrete signal levels.
C1 [Amos, Nissim; Butler, John; Lee, Beomseop; Shachar, Meir H.; Tian, Yuan; Ikkawi, Rabee M.; Khizroev, Sakhrat] Univ Calif Riverside, Dept Elect Engn, Riverside, CA 92521 USA.
   [Hu, Bing] Univ Calif Riverside, Dept Comp Sci & Engn, Riverside, CA 92521 USA.
   [Hong, Jeongmin; Khizroev, Sakhrat] Florida Int Univ, Dept Elect Engn, Miami, FL 33199 USA.
   [Garcia, Davil] Univ Calif Riverside, Dept Mat Sci & Engn, Riverside, CA 92521 USA.
   [Haddon, Robert C.] Univ Calif Riverside, Ctr Nanoscale Sci & Engn, Riverside, CA 92521 USA.
   [Litvinov, Dmitri] Univ Houston, Ctr Nanomagnet Syst, Houston, TX USA.
RP Amos, N (reprint author), Univ Calif Riverside, Dept Elect Engn, Riverside, CA 92521 USA.
EM Nissim.Amos@ee.ucr.edu
RI Haddon, Robert/A-2528-2008; Hu, Bing/M-3186-2014
OI Haddon, Robert/0000-0002-7903-5139; Hu, Bing/0000-0003-1284-6153
FU National Science Foundation (NSF) [005084-002, 0824019]; DARPA/Defense
   Microelectronics Activity (DMEA) [H94003-09-2-0904]
FX This work was supported by the National Science Foundation (NSF) under
   contracts 005084-002 and 0824019 and DARPA/Defense Microelectronics
   Activity (DMEA) under agreement number H94003-09-2-0904. The funders had
   no role in study design, data collection and analysis, decision to
   publish, or preparation of the manuscript.
CR Albrecht M, 2005, J APPL PHYS, V97, DOI 10.1063/1.1904705
   Baltz V, 2007, EUR PHYS J-APPL PHYS, V39, P33, DOI 10.1051/epjap:2007107
   Baltz V, 2005, J MAGN MAGN MATER, V290, P1286, DOI 10.1016/j.jmmm.2004.11.449
   Bing H, 2011, J APPL PHYS, V109
   Bruce DT, 2009, J MAGN MAG MAT, V321, P512
   Cui SQ, 2009, PROCEEDINGS OF THE 2009 PACIFIC-ASIA CONFERENCE ON CIRCUITS, COMMUNICATIONS AND SYSTEM, P536, DOI 10.1109/PACCS.2009.76
   Dieter W, 2000, ANNU REV MATER SCI, V30, P611
   Gerardo AB, 2003, IEEE T MAG, V39, P651
   Richard MB, 2002, IEEE T MAG, V38, P260
   Hua H, 2006, OPTICAL MAT, V28, P904
   Jubert PO, 2010, IEEE T MAGN, V46, P4059, DOI 10.1109/TMAG.2010.2083678
   Michael AS, 2008, IEEE T MAG, V44, P119
   Michael KG, 2011, IEEE T MAG, V47, P6
   Nils JG, 2009, J APPL PHYS, V105
   Piramanayagam SN, 2007, J APPL PHYS, V102, DOI 10.1063/1.2750414
   Sakhrat K, 2006, J APPL PHYS, V100
   Shah P, 2007, IEEE T MAGN, V43, P2280, DOI 10.1109/TMAG.2007.894010
   Shaojing L, 2009, J APPL PHYS, V105
   Speetzen N, 2005, J MAGN MAGN MATER, V287, P181, DOI 10.1016/j.jmmm.2004.10.030
   Tetsunori K, 2008, J APPL PHYS, V103
   William AC, 2009, NATURE PHOTONICS, V3, P220
   Winkler G, 2009, APPL PHYS LETT, V94, DOI 10.1063/1.3152293
   Yuan ZM, 2001, J MAGN MAGN MATER, V235, P481, DOI 10.1016/S0304-8853(01)00412-7
   Zhang L, 2010, J MAGN MAGN MATER, V322, P2658, DOI 10.1016/j.jmmm.2010.04.003
   Alexander YD, 2010, US Patent, Patent No. 7974031
   Albrecht M., 2005, U. S. Patent, Patent No. [6 865 044, 6865044]
   Mehmet FE, 2011, US Patent, Patent No. 7982994
NR 27
TC 12
Z9 12
U1 1
U2 18
PU PUBLIC LIBRARY SCIENCE
PI SAN FRANCISCO
PA 1160 BATTERY STREET, STE 100, SAN FRANCISCO, CA 94111 USA
SN 1932-6203
J9 PLOS ONE
JI PLoS One
PD JUL 10
PY 2012
VL 7
IS 7
AR e40134
DI 10.1371/journal.pone.0040134
PG 8
WC Multidisciplinary Sciences
SC Science & Technology - Other Topics
GA 973JD
UT WOS:000306355500026
PM 22808105
ER

PT J
AU Sakamoto, M
   Ruta, M
AF Sakamoto, Manabu
   Ruta, Marcello
TI Convergence and Divergence in the Evolution of Cat Skulls: Temporal and
   Spatial Patterns of Morphological Diversity
SO PLOS ONE
LA English
DT Article
ID LATE-MIOCENE; GEOMETRIC MORPHOMETRICS; THEROPOD DINOSAURS; BITING
   PERFORMANCE; CARNIVORA FELIDAE; SIZE; PHYLOGENY; SHAPE; RADIATION;
   MAMMALIA
AB Background: Studies of biological shape evolution are greatly enhanced when framed in a phylogenetic perspective. Inclusion of fossils amplifies the scope of macroevolutionary research, offers a deep-time perspective on tempo and mode of radiations, and elucidates life-trait changes. We explore the evolution of skull shape in felids (cats) through morphometric analyses of linear variables, phylogenetic comparative methods, and a new cladistic study of saber-toothed cats.
   Methodology/Principal Findings: A new phylogenetic analysis supports the monophyly of saber-toothed cats (Machairodontinae) exclusive of Felinae and some basal felids, but does not support the monophyly of various saber-toothed tribes and genera. We quantified skull shape variation in 34 extant and 18 extinct species using size-adjusted linear variables. These distinguish taxonomic group membership with high accuracy. Patterns of morphospace occupation are consistent with previous analyses, for example, in showing a size gradient along the primary axis of shape variation and a separation between large and small-medium cats. By combining the new phylogeny with a molecular tree of extant Felinae, we built a chronophylomorphospace (a phylogeny superimposed onto a two-dimensional morphospace through time). The evolutionary history of cats was characterized by two major episodes of morphological divergence, one marking the separation between saber-toothed and modern cats, the other marking the split between large and small-medium cats.
   Conclusions/Significance: Ancestors of large cats in the `Panthera' lineage tend to occupy, at a much later stage, morphospace regions previously occupied by saber-toothed cats. The latter radiated out into new morphospace regions peripheral to those of extant large cats. The separation between large and small-medium cats was marked by considerable morphologically divergent trajectories early in feline evolution. A chronophylomorphospace has wider applications in reconstructing temporal transitions across two-dimensional trait spaces, can be used in ecophenotypical and functional diversity studies, and may reveal novel patterns of morphospace occupation.
C1 [Sakamoto, Manabu; Ruta, Marcello] Univ Bristol, Sch Earth Sci, Bristol, Avon, England.
RP Sakamoto, M (reprint author), Univ Bristol, Sch Earth Sci, Bristol, Avon, England.
EM m.sakamoto@bristol.ac.uk
RI Sakamoto, Manabu/F-6690-2010
OI Sakamoto, Manabu/0000-0001-6447-406X; Ruta, Marcello/0000-0002-6151-0704
FU BBSRC [BB/H007954/1]
FX This work was supported by BBSRC (http://www.bbsrc.ac.uk/) grant
   BB/H007954/1. The funders had no role in study design, data collection
   and analysis, decision to publish, or preparation of the manuscript.
CR Adler D., 2011, RGL 3D VISUALIZATION
   Barnett R, 2005, CURR BIOL, V15, pR589, DOI 10.1016/j.cub.2005.07.052
   Barnett R, 2009, MOL ECOL, V18, P1668, DOI 10.1111/j.1365-294X.2009.04134.x
   Blomberg SP, 2003, EVOLUTION, V57, P717, DOI 10.1111/j.0014-3820.2003.tb00285.x
   Bookstein F. L., 1985, MORPHOMETRICS EVOLUT
   Brusatte SL, 2012, J EVOLUTION BIOL, V25, P365, DOI 10.1111/j.1420-9101.2011.02427.x
   Brusatte SL, 2008, SCIENCE, V321, P1485, DOI 10.1126/science.1161833
   Burger J, 2004, MOL PHYLOGENET EVOL, V30, P841, DOI 10.1016/j.ympev.2003.07.020
   Christiansen P, 2008, PLOS ONE, V3, DOI 10.1371/journal.pone.0002807
   Christiansen P, 2008, CLADISTICS, V24, P977, DOI 10.1111/j.1096-0031.2008.00226.x
   Clabaut C, 2007, EVOLUTION, V61, P560, DOI 10.1111/j.1558-5646.2007.00045.x
   Deng T, 2006, GEODIVERSITAS, V28, P499
   Diniz JAF, 1998, EVOLUTION, V52, P1247, DOI 10.2307/2411294
   FELSENSTEIN J, 1985, AM NAT, V125, P1, DOI 10.1086/284325
   Geraads D, 2004, NEUES JAHRB GEOL P-M, P95
   Goloboff PA, 2008, CLADISTICS, V24, P774, DOI 10.1111/j.1096-0031.2008.00217.x
   Hammer O, 2001, PALAEONTOL ELECTRON, V4, P9, DOI DOI 10.1016/J.BCP.2008.05.025
   Harvey P. H., 1991, COMP METHOD EVOLUTIO
   Johnson WE, 2006, SCIENCE, V311, P73, DOI 10.1126/science.1122277
   Jungers WL, 1995, YEARB PHYS ANTHROPOL, V38, P137
   Kembel SW, 2010, BIOINFORMATICS, V26, P1463, DOI 10.1093/bioinformatics/btq166
   Leidy J., 1872, P ACAD NAT SCI PHILA, V24, P38
   Liu L., 2008, VERTEBRAT PALASIATIC, V46, P124
   MADDISON WP, 1991, SYST ZOOL, V40, P304, DOI 10.2307/2992324
   Meachen-Samuels J, 2009, BIOL J LINN SOC, V96, P784, DOI 10.1111/j.1095-8312.2008.01169.x
   MOSIMANN JE, 1970, J AM STAT ASSOC, V65, P930, DOI 10.2307/2284599
   Paradis E, 2004, BIOINFORMATICS, V20, P289, DOI 10.1093/bioinformatics/btg412
   R Core Development Team, 2011, R LANG ENV STAT COMP
   Revell LJ, 2009, EVOLUTION, V63, P3258, DOI 10.1111/j.1558-5646.2009.00804.x
   Rohlf FJ, 2006, EVOLUTION, V60, P1509, DOI 10.1111/j.0014-3820.2006.tb01229.x
   Rohlf F. James, 2002, VVolume 64, P175
   Rothwell T, 2003, AM MUS NOVIT, P1, DOI 10.1206/0003-0082(2003)403<0001:PSONAP>2.0.CO;2
   Roussiakis SJ, 2006, GEOBIOS-LYON, V39, P563, DOI 10.1016/j.geobios.2005.04.002
   Sakamoto M, 2010, J EVOLUTION BIOL, V23, P463, DOI 10.1111/j.1420-9101.2009.01922.x
   Sakamoto M, 2010, P ROY SOC B-BIOL SCI, V277, P3327, DOI 10.1098/rspb.2010.0794
   Salesa MJ, 2012, J SYST PALAEONTOL, V10, P87, DOI 10.1080/14772019.2011.566584
   Salesa MJ, 2010, PALAEONTOLOGY, V53, P1369, DOI 10.1111/j.1475-4983.2010.01013.x
   Schluter D, 1997, EVOLUTION, V51, P1699, DOI 10.2307/2410994
   Schmitz L, 2011, SCIENCE, V332, P705, DOI 10.1126/science.1200043
   SEYMOUR K, 1993, MORPHOLOGICAL CHANGE IN QUATERNARY MAMMALS OF NORTH AMERICA, P343, DOI 10.1017/CBO9780511565052.014
   Sicuro FL, 2011, BIOL J LINN SOC, V103, P176, DOI 10.1111/j.1095-8312.2011.01636.x
   Sicuro FL, 2011, ZOOL J LINN SOC-LOND, V161, P414, DOI 10.1111/j.1096-3642.2010.00636.x
   Sidlauskas B, 2008, EVOLUTION, V62, P3135, DOI 10.1111/j.1558-5646.2008.00519.x
   Slater GJ, 2009, J EVOLUTION BIOL, V22, P2278, DOI 10.1111/j.1420-9101.2009.01845.x
   Slater GJ, 2008, PALEOBIOLOGY, V34, P403, DOI 10.1666/07061.1
   Sookias RB, 2012, P ROY SOC B-BIOL SCI, V279, P2180, DOI 10.1098/rspb.2011.2441
   Stayton CT, 2006, PALAEONTOLOGY, V49, P307, DOI 10.1111/j.1475-4983.2006.00523.x
   Stone JR, 2003, ACTA ZOOL-STOCKHOLM, V84, P63, DOI 10.1046/j.1463-6395.2003.00131.x
   Sunquist ME, 2002, WILD CATS WORLD
   Swofford D.L., 2002, PAUP PHYLOGENETIC AN
   Turner A, 1997, BIG CATS THEIR FOSSI
   WERDELIN L, 1981, ANN ZOOL FENN, V18, P37
   WERDELIN L, 1983, BIOL J LINN SOC, V19, P375, DOI 10.1111/j.1095-8312.1983.tb00793.x
   Werdelin L, 2001, ZOOL J LINN SOC-LOND, V132, P147, DOI 10.1111/j.1096-3642.2001.tb02465.x
   Werdelin L., 1996, CARNIVORE BEHAV ECOL, V2, P582
   Werdelin Lars, 2010, P59
   Wozencraft W. C., 2005, MAMMAL SPECIES WORLD, P532
NR 57
TC 14
Z9 15
U1 6
U2 98
PU PUBLIC LIBRARY SCIENCE
PI SAN FRANCISCO
PA 1160 BATTERY STREET, STE 100, SAN FRANCISCO, CA 94111 USA
SN 1932-6203
J9 PLOS ONE
JI PLoS One
PD JUL 6
PY 2012
VL 7
IS 7
AR e39752
DI 10.1371/journal.pone.0039752
PG 13
WC Multidisciplinary Sciences
SC Science & Technology - Other Topics
GA 974UB
UT WOS:000306461800017
PM 22792186
ER

PT J
AU Wan, L
   Ruiz, R
   Gao, H
   Patel, KC
   Lille, J
   Zeltzer, G
   Dobisz, EA
   Bogdanov, A
   Nealey, PF
   Albrecht, TR
AF Wan, Lei
   Ruiz, Ricardo
   Gao, He
   Patel, Kanaiyalal C.
   Lille, Jeffrey
   Zeltzer, Gabriel
   Dobisz, Elizabeth A.
   Bogdanov, Alexei
   Nealey, Paul F.
   Albrecht, Thomas R.
TI Fabrication of templates with rectangular bits on circular tracks by
   combining block copolymer directed self-assembly and nanoimprint
   lithography
SO JOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS
LA English
DT Article
DE block copolymer lithography; bit-patterned media; rotary e-beam
   lithography; nanoimprint template fabrication; PS-b-PMMA; lamellae
ID DEVICE-ORIENTED STRUCTURES; PATTERNED MEDIA; DENSITY MULTIPLICATION;
   IMPRINT LITHOGRAPHY; RESOLUTION; BLENDS
AB A block copolymer-directed self-assembly was combined with nanoimprint lithography to generate templates with rectangular patterns through an original double imprint process. A rotary e-beam tool was used to separately expose circumferential and radial line/space chemical contrast patterns with periodicities commensurate to the natural period of two lamellae-forming poly(styrene-b-methyl methacrylate) (PS-b-PMMA) block copolymers. Line patterns are formed by directed self-assembly of PS-b-PMMA on chemical patterns on two separate submaster templates, one with circumferential lines to define concentric tracks, and a second template on which the block copolymer is used to form radial lines at constant angular pitch. The patterns are subsequently transferred to their underlying Si substrates to form submaster templates. Using two sequential nanoimprinting steps, the radial and circumferential submaster line patterns were combined into a final quartz master template with rectangular bits on circular tracks. (C) 2012 Society of Photo-Optical Instrumentation Engineers (SPIE). [DOI: 10.1117/1.JMM.11.3.031405]
C1 [Wan, Lei; Ruiz, Ricardo; Gao, He; Patel, Kanaiyalal C.; Lille, Jeffrey; Zeltzer, Gabriel; Dobisz, Elizabeth A.; Bogdanov, Alexei; Albrecht, Thomas R.] HGST, San Jose Res Ctr, San Jose, CA 95135 USA.
   [Wan, Lei; Nealey, Paul F.] Univ Wisconsin, Dept Chem & Biol Engn, Madison, WI 53706 USA.
RP Wan, L (reprint author), HGST, San Jose Res Ctr, 3403 Yerba Buena Rd, San Jose, CA 95135 USA.
EM lei.wan@hgst.com
RI Zeltzer, Gabriel/L-1475-2016
OI Zeltzer, Gabriel/0000-0001-7573-4170
CR BATES FS, 1990, ANNU REV PHYS CHEM, V41, P525, DOI 10.1146/annurev.pc.41.100190.002521
   Chen Y, 2003, NANOTECHNOLOGY, V14, P462, DOI 10.1088/0957-4484/14/4/311
   Chou SY, 1996, SCIENCE, V272, P85, DOI 10.1126/science.272.5258.85
   Colburn M, 1999, P SOC PHOTO-OPT INS, V3676, P379, DOI 10.1117/12.351155
   Dobisz EA, 2008, P IEEE, V96, P1836, DOI 10.1109/JPROC.2008.2007600
   Edwards EW, 2004, ADV MATER, V16, P1315, DOI 10.1002/adma.200400763
   Ji SX, 2011, ADV MATER, V23, P3692, DOI 10.1002/adma.201101813
   Jung GY, 2004, NANO LETT, V4, P1225, DOI [10.1021/nl049487q, 10.1021/nl0494887q]
   Kwon S, 2005, NANO LETT, V5, P2557, DOI 10.1021/nl051932+
   Liu CC, 2011, MACROMOLECULES, V44, P1876, DOI 10.1021/ma102856t
   Liu GL, 2010, ADV FUNCT MATER, V20, P1251, DOI 10.1002/adfm.200902229
   Patel KC, 2012, PROC SPIE, V8323, DOI 10.1117/12.916589
   Ross CA, 2008, MRS BULL, V33, P838, DOI 10.1557/mrs2008.179
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Ruiz R, 2011, ACS NANO, V5, P79, DOI 10.1021/nn101561p
   Schabes ME, 2008, J MAGN MAGN MATER, V320, P2880, DOI 10.1016/j.jmmm.2008.07.035
   Stoykovich MP, 2005, SCIENCE, V308, P1442, DOI 10.1126/science.1111041
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Thurn-Albrecht T, 2000, ADV MATER, V12, P787, DOI 10.1002/(SICI)1521-4095(200006)12:11<787::AID-ADMA787>3.0.CO;2-1
   Xiao SG, 2009, ADV MATER, V21, P2516, DOI 10.1002/adma.200802087
   Yang XM, 2009, ACS NANO, V3, P1844, DOI 10.1021/nn900073r
NR 21
TC 27
Z9 27
U1 1
U2 54
PU SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS
PI BELLINGHAM
PA 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98225 USA
SN 1932-5150
J9 J MICRO-NANOLITH MEM
JI J. Micro-Nanolithogr. MEMS MOEMS
PD JUL-SEP
PY 2012
VL 11
IS 3
AR 031405
DI 10.1117/1.JMM.11.3.031405
PG 5
WC Engineering, Electrical & Electronic; Nanoscience & Nanotechnology;
   Materials Science, Multidisciplinary; Optics
SC Engineering; Science & Technology - Other Topics; Materials Science;
   Optics
GA 000OD
UT WOS:000308394800012
ER

PT J
AU Komori, T
   Zhang, H
   Akahane, T
   Mohamad, Z
   Yin, Y
   Hosaka, S
AF Komori, Takuya
   Zhang, Hui
   Akahane, Takashi
   Mohamad, Zulfakri
   Yin, You
   Hosaka, Sumio
TI Electron Beam Lithography of 15 x 15 nm(2) Pitched Nanodot Arrays with a
   Size of Less than 10 nm Using High Development Contrast Salty Developer
SO JAPANESE JOURNAL OF APPLIED PHYSICS
LA English
DT Article
ID BIT-PATTERNED MEDIA; NANOIMPRINT-LITHOGRAPHY; HYDROGEN SILSESQUIOXANE;
   TB/IN(2) STORAGE; DOT ARRAYS; FINE PIT; FABRICATION; CHALLENGES; RESIST
AB We investigated the effects of developer and hydrogen silsesquioxane (HSQ) resist thickness in the formation of dot arrays with a pitch of < 18 x 18 nm(2) by using 30-keV electron beam (EB) lithography for bit patterned media (BPM). Optimum resist thickness and developer were investigated for the formation of fine dot arrays. We found that a 12-nm-thick HSQ resist was suitable to form fine dot patterns and the addition of NaCl into tetramethylammonium hydroxide (TMAH) could improve the development contrast (gamma-value) of HSQ (the highest is 9.7). By using the 12-nm-thick HSQ resist film and 2.3 wt% TMAH/4 wt% NaCl developer, we successfully fabricated very fine resist dot arrays with a dot size of < 10 nm and a pitch of 15 x 15 nm(2), which corresponds to a storage density of about 3 Tbit/in.(2) in BPM. (C) 2012 The Japan Society of Applied Physics
C1 [Komori, Takuya; Zhang, Hui; Akahane, Takashi; Mohamad, Zulfakri; Yin, You; Hosaka, Sumio] Gunma Univ, Grad Sch Engn, Kiryu, Gumma 3768515, Japan.
RP Komori, T (reprint author), Gunma Univ, Grad Sch Engn, Kiryu, Gumma 3768515, Japan.
EM t11801314@gunma-u.ac.jp
RI Yin, You/D-9440-2012; Mohamad, Zulfakri/E-3886-2015
CR Akahane T, 2011, JPN J APPL PHYS, V50, DOI 10.1143/JJAP.50.06GG04
   Akahane T, 2011, KEY ENG MATER, V459, P124, DOI 10.4028/www.scientific.net/KEM.459.124
   CHANG THP, 1975, J VAC SCI TECHNOL, V12, P1271, DOI 10.1116/1.568515
   CHOU SY, 1995, APPL PHYS LETT, V67, P3114, DOI 10.1063/1.114851
   Farrell RA, 2010, J COLLOID INTERF SCI, V349, P449, DOI 10.1016/j.jcis.2010.04.041
   Haffner M, 2007, MICROELECTRON ENG, V84, P937, DOI 10.1016/j.mee.2007.01.020
   Hosaka S, 2006, MICROELECTRON ENG, V83, P792, DOI 10.1016/j.mee.2006.01.005
   Hosaka S, 2001, MICROELECTRON ENG, V57-8, P223, DOI 10.1016/S0167-9317(01)00480-4
   Hosaka S, 2008, MICROELECTRON ENG, V85, P774, DOI 10.1016/j.mee.2007.12.081
   Hosaka S, 2007, MICROELECTRON ENG, V84, P802, DOI 10.1016/j.mee.2007.01.119
   Hosaka S, 2011, MICROELECTRON ENG, V88, P2571, DOI 10.1016/j.mee.2011.01.005
   Hosaka S, 2010, JPN J APPL PHYS, V49, DOI 10.1143/JJAP.49.046503
   Hosaka S, 2008, APPL PHYS EXPRESS, V1, DOI 10.1143/APEX.1.027003
   Huda M, 2011, JPN J APPL PHYS, V50, DOI 10.1143/JJAP.50.06GG06
   Huda M, 2011, KEY ENG MATER, V459, P120, DOI 10.4028/www.scientific.net/KEM.459.120
   Kamata Y, 2007, JPN J APPL PHYS 1, V46, P999, DOI 10.1143/JJAP.46.999
   Kamata Y, 2011, IEEE T MAGN, V47, P51, DOI 10.1109/TMAG.2010.2077274
   Kang Y, 2010, JPN J APPL PHYS, V49, DOI 10.1143/JJAP.49.06GL13
   Kim J, 2009, J VAC SCI TECHNOL B, V27, P2628, DOI 10.1116/1.3250261
   Lohau J, 2001, IEEE T MAGN, V37, P1652, DOI 10.1109/20.950928
   NIGHTINGALE ER, 1959, J PHYS CHEM-US, V63, P1381, DOI 10.1021/j150579a011
   Okada T, 2011, JPN J APPL PHYS, V50, DOI 10.1143/JJAP.50.126502
   Sidorkin V, 2009, MICROELECTRON ENG, V86, P749, DOI 10.1016/j.mee.2008.12.071
   Tamura T, 2011, KEY ENG MATER, V459, P116, DOI 10.4028/www.scientific.net/KEM.459.116
   Taniguchi J, 2000, JPN J APPL PHYS 1, V39, P7070, DOI 10.1143/JJAP.39.7070
   Wang H, 2011, J APPL PHYS, V109, DOI 10.1063/1.3562453
   Wi JS, 2008, SMALL, V4, P2118, DOI 10.1002/smll.200800625
   Yang JKW, 2007, J VAC SCI TECHNOL B, V25, P2025, DOI 10.1116/1.2801881
   Yang JKW, 2009, J VAC SCI TECHNOL B, V27, P2622, DOI 10.1116/1.3253652
   Yang X, 2007, J VAC SCI TECHNOL B, V25, P2202, DOI 10.1116/1.2798711
   Yang XM, 2008, J VAC SCI TECHNOL B, V26, P2604, DOI 10.1116/1.2978487
   Zhang H, 2012, KEY ENG MATER, V497, P127, DOI 10.4028/www.scientific.net/KEM.497.127
NR 32
TC 13
Z9 13
U1 0
U2 11
PU IOP PUBLISHING LTD
PI BRISTOL
PA TEMPLE CIRCUS, TEMPLE WAY, BRISTOL BS1 6BE, ENGLAND
SN 0021-4922
EI 1347-4065
J9 JPN J APPL PHYS
JI Jpn. J. Appl. Phys.
PD JUN
PY 2012
VL 51
IS 6
SI SI
AR 06FB02
DI 10.1143/JJAP.51.06FB02
PN 2
PG 4
WC Physics, Applied
SC Physics
GA 971FS
UT WOS:000306189800003
ER

PT J
AU Ji, SX
   Nagpal, U
   Liu, GL
   Delcambre, SP
   Muller, M
   de Pablo, JJ
   Nealey, PF
AF Ji, Shengxiang
   Nagpal, Umang
   Liu, Guoliang
   Delcambre, Sean P.
   Mueller, Marcus
   de Pablo, Juan J.
   Nealey, Paul F.
TI Directed Assembly of Non-equilibrium ABA Triblock Copolymer Morphologies
   on Nanopatterned Substrates
SO ACS NANO
LA English
DT Article
DE triblock copolymer; block copolymer lithography; directed assembly; thin
   film; simulation
ID DEVICE-ORIENTED STRUCTURES; ORDER-DISORDER TRANSITION; BIT-PATTERNED
   MEDIA; BLOCK-COPOLYMER; THIN-FILMS; DENSITY MULTIPLICATION;
   MICROPHASE-SEPARATION; HOMOPOLYMER BLENDS; MULTIBLOCK COPOLYMERS;
   GENERALIZED-APPROACH
AB The majority of past work on directed assembly of block copolymers on chemically nanopatterned surfaces (or chemical patterns) has focused on AB diblock copolymers, and the resulting morphologies have generally corresponded to equilibrium states. Here we report a study on directed assembly of ABA triblock copolymers. Directed assembly of thin films of symmetric poly(methyl methacrylate-b-styrene-b-methyl methacrylate) (PMMA-b-PS-b-PMMA) triblock copolymers is shown to be capable of achieving a high degree of perfection, registration, and accuracy on striped patterns having periods, L-s,L- commensurate with the bulk period of the copolymer, L-o. When L-s is incommensurate with L-o, the triblock copolymer domains can reach dimensions up to 55% larger or 13% smaller than L-o. The range over which triblock copolymers tolerate departures from a commensurate L-s is significantly larger than that accessible with the corresponding diblock copolymer material on analogous directed assembly systems. The assembly kinetics of the triblock copolymer is approximately 3 orders of magnitude slower than observed in the diblock system. Theoretically informed simulations are used to interpret our experimental observations; a thermodynamic analysis reveals that triblocks can form highly ordered, non-equilibrium metastable structures that do not arise in the diblock.
C1 [Ji, Shengxiang] Chinese Acad Sci, Changchun Inst Appl Chem, Key Lab Polymer Ecomat, Changchun 130022, Peoples R China.
   [Nagpal, Umang; Liu, Guoliang; Delcambre, Sean P.; de Pablo, Juan J.; Nealey, Paul F.] Univ Wisconsin, Dept Chem & Biol Engn, Madison, WI 53706 USA.
   [Mueller, Marcus] Univ Gottingen, Inst Theoret Phys, D-37073 Gottingen, Germany.
RP Ji, SX (reprint author), Chinese Acad Sci, Changchun Inst Appl Chem, Key Lab Polymer Ecomat, 5625 Renmin St, Changchun 130022, Peoples R China.
EM sji@ciac.jl.cn
RI Muller, Marcus/B-9898-2009; Ji, Shengxiang/G-7308-2012; Ji,
   Shengxiang/A-7567-2015; Liu, Guoliang/A-9493-2011
OI Muller, Marcus/0000-0002-7472-973X; Ji, Shengxiang/0000-0003-0336-0530;
   Liu, Guoliang/0000-0002-6778-0625
FU UW-NSF Nanoscale Science and Engineering Center (NSEC) [DMR 0832760];
   Semiconductor Research Corporation; Changchun Institute of Applied
   Chemistry, Chinese Academy of Sciences; National Natural Science
   Foundation of China [51173181]; Volkswagen foundation
FX We thank the funding from UW-NSF Nanoscale Science and Engineering
   Center (NSEC) (DMR 0832760) and the Semiconductor Research Corporation.
   SJ. thanks the startup support from Changchun Institute of Applied
   Chemistry, Chinese Academy of Sciences, and the funding from National
   Natural Science Foundation of China (No. 51173181). M. M. acknowledges
   financial support by the Volkswagen foundation.
CR Albrecht TR, 2009, NANOSCALE MAGNETIC MATERIALS AND APPLICATIONS, P237, DOI 10.1007/978-0-387-85600-1_9
   Bates CM, 2011, LANGMUIR, V27, P2000, DOI 10.1021/la1042958
   Bita I, 2008, SCIENCE, V321, P939, DOI 10.1126/science.1159352
   Black CT, 2007, IBM J RES DEV, V51, P605
   Cheng JY, 2008, ADV MATER, V20, P3155, DOI 10.1002/adma.200800826
   Daoulas KC, 2008, LANGMUIR, V24, P1284, DOI 10.1021/la702482z
   Daoulas KC, 2006, J CHEM PHYS, V125, DOI 10.1063/1.2364506
   Daoulas KC, 2006, J POLYM SCI POL PHYS, V44, P2589, DOI 10.1002/polb.20904
   DEJEU WH, 1993, J PHYS II, V3, P139
   Detcheverry FA, 2010, MACROMOLECULES, V43, P3446, DOI 10.1021/ma902332h
   Detcheverry FA, 2009, SOFT MATTER, V5, P4858, DOI 10.1039/b911646j
   Detcheverry FA, 2009, PHYS REV LETT, V102, DOI 10.1103/PhysRevLett.102.197801
   Edwards EW, 2007, MACROMOLECULES, V40, P90, DOI 10.1021/ma0607564
   Edwards EW, 2005, J POLYM SCI POL PHYS, V43, P3444, DOI 10.1002/polb.20643
   Edwards EW, 2004, ADV MATER, V16, P1315, DOI 10.1002/adma.200400763
   GEHLSEN MD, 1992, MACROMOLECULES, V25, P939, DOI 10.1021/ma00028a066
   Han E, 2008, MACROMOLECULES, V41, P9090, DOI 10.1021/ma8018393
   HELFAND E, 1976, MACROMOLECULES, V9, P879, DOI 10.1021/ma60054a001
   Hellwig O, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3293301
   In I, 2006, LANGMUIR, V22, P7855, DOI 10.1021/la060748g
   Ji SX, 2008, ADV MATER, V20, P3054, DOI 10.1002/adma.200800048
   Ji SX, 2011, ADV MATER, V23, P3692, DOI 10.1002/adma.201101813
   Ji SX, 2011, MACROMOLECULES, V44, P4291, DOI 10.1021/ma2005734
   Ji SX, 2010, MACROMOLECULES, V43, P6919, DOI 10.1021/ma1007946
   Ji SX, 2010, ACS NANO, V4, P599, DOI 10.1021/nn901342j
   Ji S, 2008, MACROMOLECULES, V41, P9098, DOI 10.1021/ma801861h
   Kang H, 2008, PHYS REV LETT, V100, DOI 10.1103/PhysRevLett.100.148303
   Kang H, 2008, J VAC SCI TECHNOL B, V26, P2495, DOI 10.1116/1.3013336
   Kim SO, 2003, NATURE, V424, P411, DOI 10.1038/nature01775
   LEIBLER L, 1980, MACROMOLECULES, V13, P1602, DOI 10.1021/ma60078a047
   Lipowsky R, 1998, PHYSICA A, V249, P536, DOI 10.1016/S0378-4371(97)00513-X
   Liu CC, 2011, MACROMOLECULES, V44, P1876, DOI 10.1021/ma102856t
   Liu GL, 2010, ADV FUNCT MATER, V20, P1251, DOI 10.1002/adfm.200902229
   Mai SM, 2000, MACROMOLECULES, V33, P5124, DOI 10.1021/ma000154z
   Mansky P, 1997, SCIENCE, V275, P1458, DOI 10.1126/science.275.5305.1458
   MATSEN MW, 1995, J CHEM PHYS, V102, P3884, DOI 10.1063/1.468548
   MATSEN MW, 1994, MACROMOLECULES, V27, P187, DOI 10.1021/ma00079a027
   Matsen MW, 1999, J CHEM PHYS, V111, P7139, DOI 10.1063/1.480006
   MAYES AM, 1989, J CHEM PHYS, V91, P7228, DOI 10.1063/1.457290
   MILNER ST, 1994, MACROMOLECULES, V27, P2333, DOI 10.1021/ma00086a057
   Muller M, 2008, J CHEM PHYS, V128, DOI 10.1063/1.2818565
   Muller M, 2009, PHYS CHEM CHEM PHYS, V11, P2087, DOI 10.1039/b818111j
   Park SM, 2007, LANGMUIR, V23, P9037, DOI 10.1021/la7010327
   Pike DQ, 2009, J CHEM PHYS, V131, DOI 10.1063/1.3187936
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Ruiz R, 2011, ACS NANO, V5, P79, DOI 10.1021/nn101561p
   Ryu DY, 2005, SCIENCE, V308, P236, DOI 10.1126/science.1106604
   Soga KG, 1996, MACROMOLECULES, V29, P1998, DOI 10.1021/ma951102q
   Stoykovich MP, 2007, ACS NANO, V1, P168, DOI 10.1021/nn700164p
   Stoykovich MP, 2006, PHYS REV LETT, V97, DOI 10.1103/PhysRevLett.97.147802
   Stoykovich MP, 2005, SCIENCE, V308, P1442, DOI 10.1126/science.1111041
   Tada Y, 2009, POLYMER, V50, P4250, DOI 10.1016/j.polymer.2009.06.039
   Thompson RB, 2004, J CHEM PHYS, V120, P3990, DOI 10.1063/1.1643899
   WATANABE H, 1995, MACROMOLECULES, V28, P5006, DOI 10.1021/ma00118a032
   Welander AM, 2008, MACROMOLECULES, V41, P2759, DOI 10.1021/ma800056s
   Wu LF, 2004, MACROMOLECULES, V37, P3360, DOI 10.1021/ma035583m
   Xiao SG, 2009, ADV MATER, V21, P2516, DOI 10.1002/adma.200802087
   Yang XM, 2009, ACS NANO, V3, P1844, DOI 10.1021/nn900073r
   Yang XM, 2009, IEEE T MAGN, V45, P833, DOI 10.1109/TMAG.2008.2010647
NR 59
TC 26
Z9 26
U1 10
U2 157
PU AMER CHEMICAL SOC
PI WASHINGTON
PA 1155 16TH ST, NW, WASHINGTON, DC 20036 USA
SN 1936-0851
J9 ACS NANO
JI ACS Nano
PD JUN
PY 2012
VL 6
IS 6
BP 5440
EP 5448
DI 10.1021/nn301306v
PG 9
WC Chemistry, Multidisciplinary; Chemistry, Physical; Nanoscience &
   Nanotechnology; Materials Science, Multidisciplinary
SC Chemistry; Science & Technology - Other Topics; Materials Science
GA 963YQ
UT WOS:000305661300097
PM 22559146
ER

PT J
AU Ng, Y
   Cai, K
   Kumar, BVKV
   Chong, TC
   Zhang, S
   Chen, BJ
AF Ng, Yibin
   Cai, Kui
   Kumar, B. V. K. Vijaya
   Chong, Tow Chong
   Zhang, S.
   Chen, B. J.
TI Channel Modeling and Equalizer Design for Staggered Islands
   Bit-Patterned Media Recording
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Bit-patterned media recording; equalization; inter-track interference;
   media noise; partial response maximum likelihood (PRML)
ID INTERTRACK INTERFERENCE; PERFORMANCE; NOISE; STORAGE
AB In this paper, we first present a recording physics based analytical channel model for bit-patterned media recording (BPMR) systems with staggered islands configuration. We further propose an analytical approach to jointly design the equalizer with partial response (PR) target for BPMR systems, by using the minimum mean-squared error (MMSE) criterion with monic constraint, taking into account inter-track interference (ITI) and media noise. Simulation results show that the proposed approach performs better than the system designed without considering ITI and media noise. We further investigate the performance of staggered array against regular array islands with bit-aspect ratios (BAR) of 1 and 2, and with different amount of media noise, inter-symbol interference (ISI), and ITI. We found that staggered array islands with BAR of 2 offer better bit error rate (BER) performance and better tolerance to media noise.
C1 [Ng, Yibin; Cai, Kui; Zhang, S.; Chen, B. J.] ASTAR, Data Storage Inst, Singapore 117608, Singapore.
   [Ng, Yibin; Kumar, B. V. K. Vijaya] Carnegie Mellon Univ, DSSC, Pittsburgh, PA 15213 USA.
   [Chong, Tow Chong] Singapore Univ Technol & Design, Singapore 138682, Singapore.
RP Ng, Y (reprint author), ASTAR, Data Storage Inst, Singapore 117608, Singapore.
EM yibinn@andrew.cmu.edu
CR Karakulak S, 2010, IEEE T MAGN, V46, P3639, DOI 10.1109/TMAG.2010.2049116
   Karakulak S, 2010, IEEE T MAGN, V46, P819, DOI 10.1109/TMAG.2009.2037724
   Keskinoz M, 2008, IEEE T MAGN, V44, P533, DOI 10.1109/TMAG.2007.914966
   MOON JY, 1995, IEEE T MAGN, V31, P1083, DOI 10.1109/20.364789
   Nabavi S, 2007, IEEE ICC, P6249, DOI 10.1109/ICC.2007.1035
   Nabavi S, 2007, IEEE T MAGN, V43, P2274, DOI 10.1109/TMAG.2007.893479
   Nabavi S, 2008, IEEE T MAGN, V44, P3789, DOI 10.1109/TMAG.2008.2002387
   Ng Y, 2009, IEEE T MAGN, V45, P3535, DOI 10.1109/TMAG.2009.2024427
   Ntokas IT, 2007, IEEE T MAGN, V43, P3925, DOI 10.1109/TMAG.2007.903349
   Nutter PW, 2008, IEEE T MAGN, V44, P3797, DOI 10.1109/TMAG.2008.2002516
   Nutter PW, 2005, IEEE T MAGN, V41, P3214, DOI 10.1109/TMAG.2005.854780
   Nutter PW, 2005, IEEE T MAGN, V41, P4327, DOI 10.1109/TMAG.2005.856586
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Roh BG, 2002, IEEE T MAGN, V38, P1830, DOI 10.1109/TMAG.2002.1017779
   Tan WJ, 2005, IEEE T MAGN, V41, P730, DOI 10.1109/TMAG.2004.839064
NR 15
TC 4
Z9 4
U1 0
U2 4
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUN
PY 2012
VL 48
IS 6
BP 1976
EP 1983
DI 10.1109/TMAG.2011.2181183
PG 8
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 948ZV
UT WOS:000304544900003
ER

PT J
AU Wood, R
   Salo, M
   Dang, HL
AF Wood, Roger
   Salo, Michael
   Dang, Helen
TI Characterization of Readback Signal, Distortion, and Noise and
   Estimation of Error Rates Based on Spectral Measurements Only
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Channel characterization; magnetic recording; noise; nonlinear
   distortion; PRBS spectrum; signal
ID CHANNEL CHARACTERIZATION; PSEUDORANDOM SEQUENCES; NONLINEAR DISTORTION;
   RECORDING CHANNEL; TRANSITION SHIFT; MEDIA
AB Measurements of a signal's spectral content using narrow-band filters and heterodyne techniques are still widely used for component testing for magnetic recording. Most of these measurements use simple square-wave patterns. In contrast, maximal-length pseudo-random bit sequences (PRBS) are in many ways ideal patterns for characterizing magnetic recording channels. Almost all the important characteristics of a recording channel can be obtained from measurements of the PRBS spectrum and the associated noise spectrum, without reference to the actual readback waveforms. These include estimates of the signal amplitude, resolution, nonlinear distortion, transition noise, signal-to-noise ratio, and error rates.
C1 [Wood, Roger; Salo, Michael; Dang, Helen] Hitachi Global Storage Technol, San Jose, CA 95119 USA.
RP Wood, R (reprint author), Hitachi Global Storage Technol, San Jose, CA 95119 USA.
EM roger.wood@hgst.com
CR Amoldussen T. C., 1998, IEEE T MAGN, V34, P1851
   Bertram HN, 2008, IEEE T MAGN, V44, P2414, DOI 10.1109/TMAG.2008.2002315
   BERTRAM HN, 1992, IEEE T MAGN, V28, P2701, DOI 10.1109/20.179602
   BIGLIERI E, 1994, IEEE T MAGN, V30, P5079, DOI 10.1109/20.334299
   Bristow-Johnson R., LITTLE MLS TUTORIAL
   CHE XD, 1995, IEEE T MAGN, V31, P3021, DOI 10.1109/20.490257
   CHE XDC, 1994, IEEE T MAGN, V30, P4239, DOI 10.1109/20.334047
   Cideciyan RD, 2001, IEEE T MAGN, V37, P714, DOI 10.1109/20.917606
   COLEMAN CH, 1985, J I ELECTRON RAD ENG, V55, P229
   Eppler WR, 2006, IEEE T MAGN, V42, P176, DOI 10.1109/TMAG.2005.861765
   FORNEY GD, 1973, P IEEE, V61, P268, DOI 10.1109/PROC.1973.9030
   Golomb S. W., 1967, SHIFT REGISTER SEQUE
   HERMANN R, 1990, IEEE T MAGN, V26, P2125, DOI 10.1109/20.104642
   Lim F, 2010, IEEE T MAGN, V46, P1548, DOI 10.1109/TMAG.2009.2038281
   LIN Y, 1989, IEEE T MAGN, V25, P4084, DOI 10.1109/20.42530
   LIN Y, 1995, IEE P-COMMUN, V142, P135, DOI 10.1049/ip-com:19951842
   Muraoka H, 1996, IEEE T MAGN, V32, P3926, DOI 10.1109/20.539219
   Mutagi RN, 1996, ELECTRON COMMUN ENG, V8, P79, DOI 10.1049/ecej:19960205
   NEWBY P, 1986, IEEE T MAGN, V22, P1203, DOI 10.1109/TMAG.1986.1064566
   PALMER D, 1987, IEEE T MAGN, V23, P2377, DOI 10.1109/TMAG.1987.1065310
   PALMER D, 1995, IEEE T MAGN, V31, P1071, DOI 10.1109/TMAG.1995.5680698
   SARWATE DV, 1980, P IEEE, V68, P593, DOI 10.1109/PROC.1980.11697
   Shigematsu H, 2001, J MAGN MAGN MATER, V235, P435, DOI 10.1016/S0304-8853(01)00403-6
   TAKANO H, 1995, IEEE T MAGN, V31, P2651, DOI 10.1109/20.490082
   Tamopolsky G., 1997, J APPL PHYS, V81, P4837
   Torabi AF, 1997, IEEE T MAGN, V33, P2716, DOI 10.1109/20.617455
   WOOD R, 1984, IEEE T MAGN, V20, P698, DOI 10.1109/TMAG.1984.1063460
   WOOD RW, 1979, IEEE T MAGN, V15, P935, DOI 10.1109/TMAG.1979.1060300
   YEH NH, 1992, IEEE T MAGN, V28, P2707, DOI 10.1109/20.179603
   Yeh NH, 1999, IEEE T MAGN, V35, P776, DOI 10.1109/20.750644
   Yeh NH, 1997, IEEE T MAGN, V33, P2962, DOI 10.1109/20.617811
   Zhu WZ, 2004, IEEE T MAGN, V40, P2610, DOI 10.1109/TMAG.2004.829311
NR 32
TC 0
Z9 0
U1 0
U2 4
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUN
PY 2012
VL 48
IS 6
BP 2073
EP 2079
DI 10.1109/TMAG.2011.2182200
PG 7
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 948ZV
UT WOS:000304544900014
ER

PT J
AU Thiyagarajah, N
   Huang, TL
   Chen, YJ
   Duan, HG
   Song, DLY
   Leong, SH
   Yang, JKW
   Ng, V
AF Thiyagarajah, Naganivetha
   Huang, Tianli
   Chen, Yunjie
   Duan, Huigao
   Song, Debra L. Y.
   Leong, Siang Huei
   Yang, Joel K. W.
   Ng, Vivian
TI Comparison of bit-patterned media fabricated by methods of direct
   deposition and ion-milling of cobalt/palladium multilayers
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article
ID MAGNETIC RECORDING MEDIA; CHALLENGES
AB In the fabrication of bit-patterned media (BPM), two processes are commonly used, i.e., the pattern transfer by ion-milling into an underlying film of magnetic material, and the direct deposition of the magnetic material onto a pre-patterned substrate. We experimentally compared the switching performance of the BPM based on Co/Pd multilayers fabricated using these methods in terms of their switching field distribution (SFD) and physical characteristics of the bits. Our results show that both methods resulted in a narrow (similar to 15%) SFD at low areal recording densities of similar to 0.15 Tdot/in(2). However, at higher densities of up to 0.6 Tdot/in(2), the SFD of the ion-milled samples detrimentally broadened to similar to 30% while the BPM from the direct-deposition method maintained its narrow SFD up to a high bit density of 0.6 Tdot/in(2). Our results suggest that in Co/Pd multilayer systems, the direct-deposition method, which produces more uniform bit sizes and profiles especially at high bit densities, is a more promising approach to achieving high-density BPM. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4714547]
C1 [Duan, Huigao; Song, Debra L. Y.; Yang, Joel K. W.] ASTAR, Inst Mat Res & Engn, Singapore 117602, Singapore.
   [Thiyagarajah, Naganivetha; Ng, Vivian] Natl Univ Singapore, Dept Elect & Comp Engn, Informat Storage Mat Lab, Singapore 117576, Singapore.
   [Huang, Tianli; Chen, Yunjie; Leong, Siang Huei] ASTAR, Data Storage Inst, Singapore 117608, Singapore.
RP Yang, JKW (reprint author), ASTAR, Inst Mat Res & Engn, 3 Res Link, Singapore 117602, Singapore.
EM yangkwj@imre.a-star.edu.sg; elengv@nus.edu.sg
RI Thiyagarajah, Naganivetha/N-1613-2014; Duan, Huigao/P-6964-2014; Yang,
   Joel K.W./L-7892-2016
OI Thiyagarajah, Naganivetha/0000-0003-2888-1412; Yang, Joel
   K.W./0000-0003-3301-1040
CR AUCIELLO O, 1981, J VAC SCI TECHNOL, V19, P841, DOI 10.1116/1.571224
   Belle BD, 2008, IEEE T MAGN, V44, P3468, DOI 10.1109/TMAG.2008.2001791
   Berger A, 2005, IEEE T MAGN, V41, P3178, DOI 10.1109/TMAG.2005.855285
   CARCIA PF, 1985, APPL PHYS LETT, V47, P178, DOI 10.1063/1.96254
   DUCOMMUN JP, 1974, J MATER SCI, V9, P725, DOI 10.1007/BF00761792
   Hellwig O, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3271679
   Hellwig O, 2007, APPL PHYS LETT, V90, DOI 10.1063/1.2730744
   Iaksghmi S., 2007, J VAC SCI TECHNOL, V25, P2025
   Kalezhi J, 2009, IEEE T MAGN, V45, P3531, DOI 10.1109/TMAG.2009.2022407
   Kamata Y, 2011, IEEE T MAGN, V47, P51, DOI 10.1109/TMAG.2010.2077274
   Krone P, 2009, J APPL PHYS, V106, DOI 10.1063/1.3260240
   Li SJ, 2009, J APPL PHYS, V105, DOI 10.1063/1.3074781
   McMorran BJ, 2010, J APPL PHYS, V107, DOI 10.1063/1.3358218
   Peng XL, 2009, VACUUM, V83, P1007, DOI 10.1016/j.vacuum.2008.12.003
   Ranjbar M, 2011, APPL PHYS LETT, V99, DOI 10.1063/1.3645634
   Richter HJ, 2009, J MAGN MAGN MATER, V321, P467, DOI 10.1016/j.jmmm.2008.04.161
   Ross C, 2001, ANN REV MATER RES, V31, P203, DOI 10.1146/annurev.matsci.31.1.203
   Sbiaa R, 2007, RECENT PAT NANOTECH, V1, P29, DOI 10.2174/187221007779814754
   TAGAWA I, 1991, IEEE T MAGN, V27, P4975, DOI 10.1109/20.278712
   Terris BD, 2009, J MAGN MAGN MATER, V321, P512, DOI 10.1016/j.jmmm.2008.05.046
   Ulbrich TC, 2010, PHYS REV B, V81, DOI 10.1103/PhysRevB.81.054421
   Walsh ME, 2000, J VAC SCI TECHNOL B, V18, P3539, DOI 10.1116/1.1324639
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
   Yang J. K. W., 2011, NANOTECHNOLOGY, V22
NR 24
TC 5
Z9 5
U1 2
U2 17
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0021-8979
J9 J APPL PHYS
JI J. Appl. Phys.
PD MAY 15
PY 2012
VL 111
IS 10
AR 103906
DI 10.1063/1.4714547
PG 5
WC Physics, Applied
SC Physics
GA 960BT
UT WOS:000305363700097
ER

PT J
AU Sun, ZZ
   Li, DW
   Natarajarathinam, A
   Su, H
   Gupta, S
AF Sun, Zhenzhong
   Li, Dawen
   Natarajarathinam, Anusha
   Su, Hao
   Gupta, Subhadra
TI Large area patterning of single magnetic domains with assistance of ion
   irradiation in ion milling
SO JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
LA English
DT Article
ID MEDIA; PROJECTION; DEPENDENCE
AB This study demonstrates a pronounced ion irradiation effect in ion milling of magnetic thin films. In fabrication of bit-patterned media, the ion irradiation could facilitate bit island isolation before complete removal of magnetic materials by ion milling. Combined with block copolymer lithography, sub-20 nm CoPt dots with uniaxial perpendicular anisotropy, resembling Stoner-Wohlfarth-like single domains, were achieved. X-ray diffraction demonstrates that the degradation of the magnetic film by ion irradiation is related to crystal structure damage. (C) 2012 American Vacuum Society. [http://dx.doi.org/10.1116/1.4706893]
C1 [Sun, Zhenzhong; Li, Dawen; Natarajarathinam, Anusha] Univ Alabama, Ctr Mat Informat Technol MINT, Dept Elect & Comp Engn, Tuscaloosa, AL 35487 USA.
   [Su, Hao; Gupta, Subhadra] Univ Alabama, Ctr Mat Informat Technol MINT, Dept Met & Mat Engn, Tuscaloosa, AL 35487 USA.
RP Sun, ZZ (reprint author), Univ Alabama, Ctr Mat Informat Technol MINT, Dept Elect & Comp Engn, Tuscaloosa, AL 35487 USA.
EM dawenl@eng.ua.edu
RI Gupta, Subhadra/G-8618-2013; Su, Hao/G-3063-2017
OI Su, Hao/0000-0002-4416-1653
FU NSF [0901858]
FX This work was supported by NSF Grant No. 0901858. The authors would like
   to thank Dipanjan Mazumdar for help in SQUID measurement. Special thanks
   to Gary Mankey, Tim Mewes, Zhihong Lu, Pieter Visscher, J. W. Harrel,
   and Shishou Kang for valuable discussions.
CR Chang GS, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2180867
   Chappert C, 1998, SCIENCE, V280, P1919, DOI 10.1126/science.280.5371.1919
   Charap SH, 1997, IEEE T MAGN, V33, P978, DOI 10.1109/20.560142
   Cheng JY, 2006, ADV MATER, V18, P597, DOI 10.1002/adma.200501936
   Cheng JY, 2004, NAT MATER, V3, P823, DOI 10.1038/nmat1211
   Devolder T, 1999, APPL PHYS LETT, V74, P3383, DOI 10.1063/1.123352
   Devolder T, 2001, PHYS REV B, V64, DOI 10.1103/PhysRevB.64.064415
   Dietzel A, 2003, ADV MATER, V15, P1152, DOI 10.1002/adma.200304943
   Dietzel A, 2002, IEEE T MAGN, V38, P1952, DOI 10.1109/TMAG.2002.802846
   Fassbender J, 2004, J PHYS D APPL PHYS, V37, pR179, DOI 10.1088/0022-3727/37/16/R01
   GIBSON GA, 1991, J APPL PHYS, V69, P5880, DOI 10.1063/1.347855
   Lin XD, 2000, IEEE T MAGN, V36, P2999, DOI 10.1109/20.908655
   Loeschner H, 2001, J VAC SCI TECHNOL B, V19, P2520, DOI 10.1116/1.1421562
   Moser A, 2002, J PHYS D APPL PHYS, V35, pR157, DOI 10.1088/0022-3727/35/19/201
   Saito Y, 2006, J APPL PHYS, V99, DOI 10.1063/1.2172183
   SHARROCK MP, 1994, J APPL PHYS, V76, P6413, DOI 10.1063/1.358282
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Weller D, 1999, IEEE T MAGN, V35, P4423, DOI 10.1109/20.809134
   Yang FJ, 2008, J PHYS D APPL PHYS, V41, DOI 10.1088/0022-3727/41/23/235003
   Yu M, 1999, APPL PHYS LETT, V75, P3992, DOI 10.1063/1.125516
   Zhu JG, 2000, IEEE T MAGN, V36, P23, DOI 10.1109/20.824420
NR 21
TC 3
Z9 3
U1 1
U2 5
PU A V S AMER INST PHYSICS
PI MELVILLE
PA STE 1 NO 1, 2 HUNTINGTON QUADRANGLE, MELVILLE, NY 11747-4502 USA
SN 1071-1023
J9 J VAC SCI TECHNOL B
JI J. Vac. Sci. Technol. B
PD MAY-JUN
PY 2012
VL 30
IS 3
AR 031803
DI 10.1116/1.4706893
PG 6
WC Engineering, Electrical & Electronic; Nanoscience & Nanotechnology;
   Physics, Applied
SC Engineering; Science & Technology - Other Topics; Physics
GA 955SU
UT WOS:000305042000033
ER

PT J
AU Zeng, DG
   Lee, KI
   Chung, KW
   Bae, S
AF Zeng, Ding Gui
   Lee, Kyoung-il
   Chung, Kyung-Won
   Bae, Seongtae
TI Effects of media stray field on electromigration characteristics in
   current-perpendicular-to-plane giant magnetoresistance spin-valve read
   sensors
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article
ID RELIABILITY; FABRICATION; CONDUCTION; HEADS
AB Effects of magnetic stray field retrieved from both longitudinal and perpendicular magnetic recording media (denoted by "media stray field") on electromigration (EM) characteristics of current-perpendicular-to-plane (CPP) giant magnetoresistance spin-valve (GMR SV) read sensors have been numerically studied to explore the electrical and magnetic stability of the read sensor under real operation. The mean-time-to-failure (MTTF) of the CPP GMR SV read sensors was found to have a strong dependence on the physical parameters of the recording media and recorded information status, such as the pulse width of media stray field, the bit length, and the head moving velocity. According to the numerical calculation results, it was confirmed that in the longitudinal media, the shorter the stray field pulse width (i.e., the sharper the media transition) allows for the longer MTTF of the CPP GMR SV read sensors; while in the perpendicular media, the sharper the media transition gives rise to a shorter MTTF. Interestingly, it was also revealed that the MTTF could be improved by reducing the bit length as well as increasing the head velocity in both longitudinal and perpendicular media. Furthermore, the bit distribution patterns, especially the number of consecutive '0' bits strongly affected the MTTF of GMR SV read sensors. The strong dependences of MTTF on the media stray field during CPP GMR SV sensor operation are thought to be mainly attributed to the thermal cycling (temperature rise and fall) caused by the resistance change due to GMR effects. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4712059]
C1 [Zeng, Ding Gui; Bae, Seongtae] Natl Univ Singapore, Biomagnet Lab BML, Dept Elect & Comp Engn, Singapore 117576, Singapore.
   [Lee, Kyoung-il; Chung, Kyung-Won] Nuri Vista Co Ltd, Nanobio Res Ctr, Inchon 405846, South Korea.
RP Bae, S (reprint author), Natl Univ Singapore, Biomagnet Lab BML, Dept Elect & Comp Engn, Singapore 117576, Singapore.
EM elebst@nus.edu.sg
FU Nuri Vista Co. Ltd. from South Korea [R-263-000-543-597]
FX This work was supported by Nuri Vista Co. Ltd. from South Korea Grant
   No. R-263-000-543-597.
CR Bae S, 2001, APPL PHYS LETT, V79, P3657, DOI 10.1063/1.1421644
   Beck J. V., 1992, HEAT CONDUCTION USIN
   Binasch G., 1989, PHYS REV B, V39, P4282
   BURGESS AN, 1987, J APPL PHYS, V61, P74, DOI 10.1063/1.338803
   Carey MJ, 2008, APPL PHYS LETT, V93, DOI 10.1063/1.2978328
   Clement JJ, 1997, J APPL PHYS, V82, P5991, DOI 10.1063/1.366464
   Fullerton EE, 2000, APPL PHYS LETT, V77, P3806, DOI 10.1063/1.1329868
   Jiang J, 2010, J MAGN MAGN MATER, V322, P1834, DOI 10.1016/j.jmmm.2009.12.036
   Li ZH, 1999, IEEE T ELECTRON DEV, V46, P70, DOI 10.1109/16.737443
   Maiz J., 1989, P 27 INT REL PHYS S, P220
   MCGAHAN WA, 1992, J APPL PHYS, V72, P1362, DOI 10.1063/1.351747
   Pang SI, 2002, APPL PHYS LETT, V80, P616, DOI 10.1063/1.1436281
   Piramanayagam SN, 2006, APPL PHYS LETT, V89, DOI 10.1063/1.2362643
   Ruigrok JJM, 2000, J APPL PHYS, V87, P5398, DOI 10.1063/1.373356
   Sbiaa R, 2007, J APPL PHYS, V101, DOI 10.1063/1.2720094
   Sbiaa R, 2007, RECENT PAT NANOTECH, V1, P29, DOI 10.2174/187221007779814754
   Shingubara S, 1999, MATER RES SOC SYMP P, V563, P145
   Sun JJ, 2001, J APPL PHYS, V89, P6653, DOI 10.1063/1.1359217
   TSANG C, 1994, IEEE T MAGN, V30, P3801, DOI 10.1109/20.333909
   Ventura J, 2005, PHYS REV B, V72, DOI 10.1103/PhysRevB.72.094432
   Williams E. M., 2001, DESIGN ANAL MAGNETOR
   Yang Y, 2004, J APPL PHYS, V95, P6780, DOI 10.1063/1.1652426
   Yoon Y, 2010, MICROSYST TECHNOL, V16, P273, DOI 10.1007/s00542-009-0855-9
   You CY, 2009, J MAGN MAGN MATER, V321, P3589, DOI 10.1016/j.jmmm.2009.06.076
   Zeng DG, 2010, J APPL PHYS, V108, DOI 10.1063/1.3463380
   Zeng DG, 2009, J APPL PHYS, V106, DOI 10.1063/1.3260250
NR 26
TC 1
Z9 1
U1 0
U2 9
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0021-8979
J9 J APPL PHYS
JI J. Appl. Phys.
PD MAY 1
PY 2012
VL 111
IS 9
AR 093921
DI 10.1063/1.4712059
PG 10
WC Physics, Applied
SC Physics
GA 943GY
UT WOS:000304109900100
ER

PT J
AU Fontana, RE
   Hetzler, SR
   Decad, G
AF Fontana, Robert E., Jr.
   Hetzler, Steven R.
   Decad, Gary
TI Technology Roadmap Comparisons for TAPE, HDD, and NAND Flash:
   Implications for Data Storage Applications
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT 22nd Magnetic Recording Conference (TMRC)
CY AUG 29-29, 2011
CL Minneapolis, MN
SP IEEE
DE Areal density; hard disk drive magnetic recording; NAND flash; tape
   based magnetic recording
AB This paper describes the roadmap goals for tape based magnetic recording (TAPE) and uses these goals as counterpoints for the roadmap strategies for hard disk drive (HDD) and NAND flash. Technology comparisons described in this paper will show that presently volumetric efficiencies for TAPE, HDD, and NAND are similar, that lithographic requirements for TAPE are less challenging than those for NAND and HDD, and that mechanical challenges (moving media and transducer to media separation) for TAPE and HDD are potential limiters for roadmap progress and are non-existent for NAND. One result of the technology comparison discussion will be that the potential for sustained annual areal density increase rates, i.e. extendibility, for TAPE, is significantly greater than that for NAND and HDD due to the present TAPE bit cell area being a factor of 200-300 larger than the NAND and HDD bit cell area. More critically, the roadmap landscape for TAPE is limited by neither thin film processing (i.e., nanoscale dimensions) nor bit cell thermal stability. In contrast, NAND volumetric density faces limitations in extending critical feature processing, now at 25 nm, and HDD volumetric density faces challenges in transitioning either to patterned media with critical feature processing well below 15 nm or to heat assisted magnetic recording (HAMR) with the introduction of laser components to the data write process.
C1 [Fontana, Robert E., Jr.; Decad, Gary] IBM Corp, Almaden Res Ctr, Syst Technol Grp, San Jose, CA 95120 USA.
   [Hetzler, Steven R.] IBM Corp, Almaden Res Ctr, Div Res, San Jose, CA 95120 USA.
RP Fontana, RE (reprint author), IBM Corp, Almaden Res Ctr, Syst Technol Grp, 650 Harry Rd, San Jose, CA 95120 USA.
EM rfontan@us.ibm.com
CR Fontana R., 2006, J APPL PHYS 3, V99
   Fontana RE, 2008, IEEE T MAGN, V44, P3617, DOI 10.1109/TMAG.2008.2002532
   Re M., 2009, INF STOR IND CONS S
NR 3
TC 25
Z9 25
U1 1
U2 33
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD MAY
PY 2012
VL 48
IS 5
BP 1692
EP 1696
DI 10.1109/TMAG.2011.2171675
PN 1
PG 5
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 932YZ
UT WOS:000303327700002
ER

PT J
AU Chua, M
   Elidrissi, MR
   Eason, K
   Zhang, SH
   Qin, ZL
   Chai, KS
   Tan, KP
   Cai, K
   Chan, KS
   Goh, WL
   Dong, Y
   Victora, RH
AF Chua, M.
   Elidrissi, M. R.
   Eason, K.
   Zhang, S. H.
   Qin, Z. L.
   Chai, K. S.
   Tan, K. P.
   Cai, K.
   Chan, K. S.
   Goh, W. L.
   Dong, Y.
   Victora, R. H.
TI Comparing Analytical, Micromagnetic and Statistical Channel Models at 4
   Tcbpsi Patterned Media Recording
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT 22nd Magnetic Recording Conference (TMRC)
CY AUG 29-29, 2011
CL Minneapolis, MN
SP IEEE
DE Codes; error correction; error correction coding; error detection
   coding; signal processing
AB Bit patterned media recording (BPMR) is a candidate technology proposed to extend the areal density growth capability of magnetic recording systems. In conventional granular magnetic recording (CGMR), bits of information are recorded onto a number of randomly distributed magnetic grains. The difficulty for the granular media approach is that due to the randomness of the grains, a certain minimum number of grains are required in order to maintain the media signal to noise ratio (SNR). This requires smaller grains as the bits are shrunk and we end up with either unstable, or unwriteable grains as per the well-known media-trilemma. In BPMR, instead of random positions, the "grains" are ordered into a well-defined lattice of magnetic islands. Because of this ordering, the media SNR is no longer determined by the number of grains per bit as in CGMR, but is defined by the geometrical and magnetic distributions of the fabrication process of the media. Analytical models exist for BPMR, that flip grains in the media based on the switching field distribution (SFD) and the knowledge of the applied head field. On the other side, a statistical model for CGMR has been proposed that measures probabilities of grains flipping based on micromagnetic simulations, named the grain flipping probability (GFP) model. In this work, we adapt the GFP model for BPMR and perform a comparison between densities predicted via the analytical and GFP models, by processing the signals from these models with the appropriate detectors and LDPC (low density parity check) decoders.
C1 [Chua, M.; Elidrissi, M. R.; Eason, K.; Zhang, S. H.; Qin, Z. L.; Chai, K. S.; Tan, K. P.; Cai, K.; Chan, K. S.] ASTAR, Data Storage Inst, Singapore 117608, Singapore.
   [Goh, W. L.] Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 637457, Singapore.
   [Dong, Y.; Victora, R. H.] Univ Minnesota, Ctr Micromagnet & Informat Technol, Dept Elect & Comp Engn, Minneapolis, MN USA.
RP Chua, M (reprint author), ASTAR, Data Storage Inst, Singapore 117608, Singapore.
EM wjchua06@gmail.com
CR BAHL LR, 1974, IEEE T INFORM THEORY, V20, P284, DOI 10.1109/TIT.1974.1055186
   Chan KS, 2012, J MAGN MAGN MATER, V324, P336, DOI 10.1016/j.jmmm.2010.12.022
   Dong Y., 2011, IEEE T MAGN IN PRESS
   Elidrissi M. R., IEEE T MAGN IN PRESS
   Hu J, 2007, IEEE T MAGN, V43, P3517, DOI 10.1109/TMAG.2007.898307
   Radford N., LDPC SOFTWARE
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Zhang SH, 2010, IEEE T MAGN, V46, P1363, DOI 10.1109/TMAG.2010.2040713
NR 8
TC 1
Z9 1
U1 1
U2 5
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD MAY
PY 2012
VL 48
IS 5
BP 1826
EP 1832
DI 10.1109/TMAG.2011.2169654
PN 1
PG 7
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 932YZ
UT WOS:000303327700023
ER

PT J
AU Dong, Y
   Wang, Y
   Victora, RH
AF Dong, Yan
   Wang, Yao
   Victora, R. H.
TI Micromagnetic specifications for recording self-assembled bit-patterned
   media
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article; Proceedings Paper
CT 56th Annual Conference on Magnetism and Magnetic Materials
CY OCT 30-30, 2011
CL Scottsdale, AZ
ID 1 TB/IN(2); LITHOGRAPHY; DENSITY
AB A design including exchange coupled composite (ECC) bits in hexagonal arrays and a multi-pole write head is proposed to meet the requirement of 9.7 x 10(-4) bit error rate, 4 nm magnetic fly height, 5% switching field distribution, 5% synchronization error, and 5% jitter error to achieve 2.9 Tbits/in.(2) bit-patterned recording. Our head design writes two staggered tracks in a single pass and has maximum perpendicular field gradients of 580 Oe/nm along the down-track direction and 476 Oe/nm along the cross-track direction. (C) 2012 American Institute of Physics. [doi:10.1063/1.3675152]
C1 [Dong, Yan; Wang, Yao; Victora, R. H.] Univ Minnesota, Elect & Comp Engn Dept, MINT Ctr, Minneapolis, MN 55455 USA.
RP Wang, Y (reprint author), Univ Minnesota, Elect & Comp Engn Dept, MINT Ctr, Minneapolis, MN 55455 USA.
EM wang2071@umn.edu
FU IDEMA/ASTC
FX The author would like to thank Manfred Schabes for valuable discussion.
   This work was supported by IDEMA/ASTC.
CR Dong Y, 2011, IEEE T MAGN, V47, P2652, DOI 10.1109/TMAG.2011.2148112
   Hernandez S, 2007, APPL PHYS LETT, V90, DOI 10.1063/1.2716860
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Shen X, 2008, IEEE T MAGN, V44, P163, DOI 10.1109/TMAG.2007.912839
   Suess D, 2007, PHYS REV B, V75, DOI 10.1103/PhysRevB.75.174430
   Suess D, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2908052
   Yang X, 2007, J VAC SCI TECHNOL B, V25, P2202, DOI 10.1116/1.2798711
NR 8
TC 6
Z9 6
U1 0
U2 8
PU AMER INST PHYSICS
PI MELVILLE
PA 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
SN 0021-8979
EI 1089-7550
J9 J APPL PHYS
JI J. Appl. Phys.
PD APR 1
PY 2012
VL 111
IS 7
AR 07B904
DI 10.1063/1.3675152
PG 3
WC Physics, Applied
SC Physics
GA 932HX
UT WOS:000303282400280
ER

PT J
AU Kondo, Y
   Nakamura, Y
   Yamakawa, K
   Ishio, S
   Ariake, J
AF Kondo, Y.
   Nakamura, Y.
   Yamakawa, K.
   Ishio, S.
   Ariake, J.
TI Development of microscopic magnetometer with reflective objective using
   magneto-optical Kerr effect
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article; Proceedings Paper
CT 56th Annual Conference on Magnetism and Magnetic Materials
CY OCT 30-30, 2011
CL Scottsdale, AZ
ID MEDIA
AB A microscopic magnetometer using magneto-optical Kerr effect (MOKE) was developed to characterize the magnetic properties of hard magnetic nano-structures such as a bit-patterned medium and a magnetoresistive random access memory. Our new type magnetometer has a unique feature that adopts the reflective objective instead of the generally used refractive lens to reduce the unnecessary rotation of polarization axis of the light by the lens with Verdet constant in a magnetic field. A Schwarzschild-type objective consisting of two spherical mirrors was applied as the reflective objective in our magnetometer. The objective was designed specifically for our magnetometer. An actual focusing spot diameter at the sample surface was estimated to be 4.7 mu m by the knife-edge measurement. Furthermore, a magnetization curve was measured by MOKE for the Co80Pt20 thin-film line with a width of 75 mu m, and demonstrated that our magnetometer can reduce the unnecessary rotation of polarization axis compared with the one measured by the magnetometer with a refractive lens. (C) 2012 American Institute of Physics. [doi:10.1063/1.3675176]
C1 [Kondo, Y.; Yamakawa, K.; Ariake, J.] Akita Ind Technol Ctr AIT, Akita, Japan.
   [Nakamura, Y.; Ishio, S.] Akita Univ, Dept Mat Sci & Engn, Akita 010, Japan.
RP Kondo, Y (reprint author), Akita Ind Technol Ctr AIT, 4-21 Sanuki Araya, Akita, Japan.
EM kondo@rdc.pref.akita.jp
FU Japan Science and Technology Agency (JST) [02-042]
FX This work is partly supported by Research for Promoting Technological
   Seeds (02-042) from the Japan Science and Technology Agency (JST).
CR Akahane K., 2004, J MAGN SOC JPN, V28, P112
   Ariake J, 2005, J MAGN MAGN MATER, V287, P229, DOI 10.1016/j.jmmm.2004.10.037
   Barman A, 2008, REV SCI INSTRUM, V79, DOI 10.1063/1.3053353
   ERDOS P, 1959, J OPT SOC AM, V49, P877, DOI 10.1364/JOSA.49.000877
   Nakayama M, 2008, J APPL PHYS, V103, DOI 10.1063/1.2838335
   Suzuki T, 2003, MATER TRANS, V44, P1535, DOI 10.2320/matertrans.44.1535
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
NR 7
TC 0
Z9 0
U1 2
U2 12
PU AMER INST PHYSICS
PI MELVILLE
PA 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
SN 0021-8979
EI 1089-7550
J9 J APPL PHYS
JI J. Appl. Phys.
PD APR 1
PY 2012
VL 111
IS 7
AR 07E324
DI 10.1063/1.3675176
PG 3
WC Physics, Applied
SC Physics
GA 932HX
UT WOS:000303282401287
ER

PT J
AU Kong, G
   Choi, S
AF Kong, Gyuyeol
   Choi, Sooyong
TI Simplified multi-track detection schemes using a priori information for
   bit patterned media recording
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article; Proceedings Paper
CT 56th Annual Conference on Magnetism and Magnetic Materials
CY OCT 30-30, 2011
CL Scottsdale, AZ
ID INTERTRACK INTERFERENCE
AB Simplified multi-track detection schemes using a priori information for bit patterned magnetic recording (BPMR) are proposed in this paper. The proposed detection schemes adopt the simplified trellis diagram, use a priori information, and detect the main-track data in the along- and cross-track directions. The simplified trellis diagram, which has 4 states and 8 branches, can be obtained by setting the corner entries of the generalized partial response (GPR) target to zero and replacing the four parallel branches with a single branch. However, these simplified techniques seriously suffer from performance degradation in high density BPMR channels. To overcome the performance degradation, a priori information is used to give higher reliability to the branch metric. In addition, to fully use the characteristics of channel detection with a two-dimensional (2D) GPR target, the proposed schemes estimate a priori information and detect the main-track data in the along- and cross-track directions by using a 2D equalizer with a 2D GPR target. The bit error rate performances of the proposed schemes are compared with the previous detection schemes when areal density is 3 Tb/in(2). Simulation results show that the proposed schemes with simpler structures have more than 2 dB gains compared with the other detection schemes. (C) 2012 American Institute of Physics. [doi:10.1063/1.3679462]
C1 [Kong, Gyuyeol; Choi, Sooyong] Yonsei Univ, Sch Elect & Elect Engn, Seoul 120749, South Korea.
RP Kong, G (reprint author), Yonsei Univ, Sch Elect & Elect Engn, Sinchon Dong 134, Seoul 120749, South Korea.
EM gykong@yonsei.ac.kr; csyong@yonsei.ac.kr
CR BAHL LR, 1974, IEEE T INFORM THEORY, V20, P284, DOI 10.1109/TIT.1974.1055186
   Chang W, 2010, IEEE T MAGN, V46, P3899, DOI 10.1109/TMAG.2010.2056926
   Karakulak S, 2010, IEEE T MAGN, V46, P3639, DOI 10.1109/TMAG.2010.2049116
   Kim J, 2011, IEEE T MAGN, V47, P594, DOI 10.1109/TMAG.2010.2100371
   NABAVI S, 2007, P IEEE INT C COMM IC, P6249
   Nabavi S, 2007, IEEE T MAGN, V43, P2274, DOI 10.1109/TMAG.2007.893479
   Tan WJ, 2005, IEEE T MAGN, V41, P730, DOI 10.1109/TMAG.2004.839064
NR 7
TC 0
Z9 0
U1 0
U2 2
PU AMER INST PHYSICS
PI MELVILLE
PA 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
SN 0021-8979
EI 1089-7550
J9 J APPL PHYS
JI J. Appl. Phys.
PD APR 1
PY 2012
VL 111
IS 7
AR 07B920
DI 10.1063/1.3679462
PG 3
WC Physics, Applied
SC Physics
GA 932HX
UT WOS:000303282400296
ER

PT J
AU Li, WM
   Huang, XL
   Shi, JZ
   Chen, YJ
   Huang, TL
   Ding, J
AF Li, W. M.
   Huang, X. L.
   Shi, J. Z.
   Chen, Y. J.
   Huang, T. L.
   Ding, J.
TI Angular dependence and temperature effect on switching field
   distribution of Co/Pd based bit patterned media
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article; Proceedings Paper
CT 56th Annual Conference on Magnetism and Magnetic Materials
CY OCT 30-30, 2011
CL Scottsdale, AZ
AB The motivation for this work is rooted in the reversal process that occurs in perpendicularly magnetic Co/Pd multilayered based bit-patterned media. In our work, temperature effect and angle dependence of critical fields (H-cr) and switching field distribution (SFD) are studied by both experiment and simulation. From our observation, when temperature increases from 77 to 300 K, the critical field of patterned area decreases from 13 to 11 kOe. Absolute SFD decreases from 2.6 to 2.2 kOe as thermal energy assists islands reversal. The relative SFD (SFD/H-cr) keeps constant with temperature. Although critical fields and absolute SFD vary with angles, relative SFD is independent of the field angle. The interactions between islands broaden relative SFD from 12% to 20% after considering dipolar interactions. The relative SFD by simulation agrees well with our experimental observation. (C) 2012 American Institute of Physics. [doi:10.1063/1.3678456]
C1 [Li, W. M.; Huang, X. L.; Ding, J.] Natl Univ Singapore, Dept Mat Sci & Engn, Singapore 119260, Singapore.
   [Li, W. M.; Shi, J. Z.; Chen, Y. J.; Huang, T. L.] ASTAR, Data Storage Inst, Singapore 117608, Singapore.
RP Li, WM (reprint author), Natl Univ Singapore, Dept Mat Sci & Engn, Singapore 119260, Singapore.
RI Li, Weimin/J-8818-2012; Ding, Jun/C-5172-2011
CR Bublat T, 2011, NANOTECHNOLOGY, V22, DOI 10.1088/0957-4484/22/31/315301
   Hauet T, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3276911
   Hellwig O, 2007, APPL PHYS LETT, V90, DOI 10.1063/1.2730744
   Krone P, 2010, J APPL PHYS, V108, DOI 10.1063/1.3457037
   Krone P, 2009, J APPL PHYS, V106, DOI 10.1063/1.3260240
   Li WM, 2011, J APPL PHYS, V109, DOI 10.1063/1.3563069
   Okamoto S, 2008, J MAGN MAGN MATER, V320, P2874, DOI 10.1016/j.jmmm.2008.07.034
   Shaw JM, 2010, PHYS REV B, V82, DOI 10.1103/PhysRevB.82.144437
   Shaw JM, 2008, PHYS REV B, V78, DOI 10.1103/PhysRevB.78.024414
   Wi JS, 2010, J MAGN MAGN MATER, V322, P2585, DOI 10.1016/j.jmmm.2010.03.025
NR 10
TC 1
Z9 1
U1 0
U2 9
PU AMER INST PHYSICS
PI MELVILLE
PA 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
SN 0021-8979
EI 1089-7550
J9 J APPL PHYS
JI J. Appl. Phys.
PD APR 1
PY 2012
VL 111
IS 7
AR 07B917
DI 10.1063/1.3678456
PG 3
WC Physics, Applied
SC Physics
GA 932HX
UT WOS:000303282400293
ER

PT J
AU Lin, MY
   Chan, KS
   Chua, M
   Zhang, SH
   Kui, C
   Elidrissi, MR
AF Lin, Maria Yu
   Chan, Kheong Sann
   Chua, Melissa
   Zhang, Songhua
   Kui, Cai
   Elidrissi, Moulay Rachid
TI Modeling for write synchronization in bit patterned media recording
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article; Proceedings Paper
CT 56th Annual Conference on Magnetism and Magnetic Materials
CY OCT 30-30, 2011
CL Scottsdale, AZ
AB Bit patterned media recording (BPMR) is a contender for next generation technology after conventional granular magnetic recording (CGMR) can no longer sustain the continued areal density growth. BPMR has several technological hurdles that need to be overcome, among them is solving the problem of write synchronization. With CGMR, grains are randomly distributed and occur almost all over the media. In contrast, BPMR has grains patterned into a regular lattice on the media with an approximate 50% duty cycle. Hence only about a quarter of the area is filled with magnetic material. During writing, the clock must be synchronized to the islands or the written in error rate becomes unacceptably large and the system fails. Maintaining synchronization during writing is a challenge as the system is not able to read and write simultaneously. Hence reading must occur periodically between the writing frequently enough to re-synchronize the writing clock to the islands. In this work, we study the requirements on the lengths of the synchronization and data sectors in a BPMR system using an advanced model for BPMR, and taking into consideration different spindle motor speed variations, which is the main cause of the mis-synchronization. (C) 2012 American Institute of Physics. [doi:10.1063/1.3679022]
C1 [Lin, Maria Yu; Chan, Kheong Sann; Chua, Melissa; Zhang, Songhua; Kui, Cai; Elidrissi, Moulay Rachid] ASTAR, Data Storage Inst DSI, Singapore 117608, Singapore.
RP Lin, MY (reprint author), ASTAR, Data Storage Inst DSI, Singapore 117608, Singapore.
EM lin_yu@dsi.a-star.edu.sg
CR Chua M., IEEE T MAGN IN PRESS
   Gallager R. G., 1963, LOW DENSITY PARITY C
   Lin MY, 2001, IEEE T MAGN, V37, P1953, DOI 10.1109/20.951019
   Richter HJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2209179
   Zhang SH, 2011, IEEE T MAGN, V47, P2555, DOI 10.1109/TMAG.2011.2155628
   Zhang SH, 2010, IEEE T MAGN, V46, P1363, DOI 10.1109/TMAG.2010.2040713
NR 6
TC 0
Z9 0
U1 1
U2 1
PU AMER INST PHYSICS
PI MELVILLE
PA 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
SN 0021-8979
EI 1089-7550
J9 J APPL PHYS
JI J. Appl. Phys.
PD APR 1
PY 2012
VL 111
IS 7
AR 07B918
DI 10.1063/1.3679022
PG 3
WC Physics, Applied
SC Physics
GA 932HX
UT WOS:000303282400294
ER

PT J
AU Myint, LMM
   Supnithi, P
AF Myint, L. M. M.
   Supnithi, P.
TI Unequal error correction strategy for magnetic recording systems with
   multi-track processing
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article; Proceedings Paper
CT 56th Annual Conference on Magnetism and Magnetic Materials
CY OCT 30-30, 2011
CL Scottsdale, AZ
ID INTERFERENCE MITIGATION; PATTERNED MEDIA
AB In multi-track detection, the simultaneous recovery of user data of all tracks is obtained from multi-head or single-head reader with buffer. Due to incomplete inter-track interference (ITI) information of the outer tracks, unequal error rates exist among tracks. For a system with three-track processing, the center track exhibits a better performance than the others. In this work, we propose the unequal error protection (UEP) schemes to improve the overall system performance of a 2-D interference bit-patterned recording system with multi-track detection. The performances of the proposed schemes are investigated for the BPM channels with and without the media noise. Based on the simulation results, the proposed schemes offer the gain of about 0.2-0.3 dB over the equal error protection (EEP) scheme at a bit error rate of 10(-4). (C) 2012 American Institute of Physics. [doi:10.1063/1.3679762]
C1 [Supnithi, P.] King Mongkuts Inst Technol Ladkrabang, Fac Engn, Bangkok 10520, Thailand.
   [Supnithi, P.] King Mongkuts Inst Technol Ladkrabang, Coll Data Storage Innovat D STAR, Bangkok 10520, Thailand.
   [Myint, L. M. M.] Shinawatra Univ, Sch Informat Technol, Samkok 12160, Pathum Thani, Thailand.
RP Supnithi, P (reprint author), King Mongkuts Inst Technol Ladkrabang, Fac Engn, Bangkok 10520, Thailand.
EM ksupornc@kmitl.ac.th
RI Supnithi, Pornchai/G-4403-2015
OI MYINT, LIN/0000-0002-8492-8337
FU National Science and Technology Development Agency (NSTDA), Thailand
FX This work is supported in part by National Science and Technology
   Development Agency (NSTDA), Thailand.
CR Burkhardt H., 1989, P IEEE COMPEURO 89 C, P4348
   Chang W, 2010, IEEE T MAGN, V46, P3899, DOI 10.1109/TMAG.2010.2056926
   Hu XY, 2005, IEEE T INFORM THEORY, V51, P386, DOI 10.1109/TIT.2004.839541
   Kurkoski BM, 2008, IEICE T FUND ELECTR, VE91A, P2696, DOI 10.1093/ietfec/e91-a.10.2696
   Myint LMM, 2009, IEEE T MAGN, V45, P3691, DOI 10.1109/TMAG.2009.2022638
   Nabavi S, 2009, IEEE T MAGN, V45, P3523, DOI 10.1109/TMAG.2009.2022493
NR 6
TC 0
Z9 0
U1 1
U2 3
PU AMER INST PHYSICS
PI MELVILLE
PA 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
SN 0021-8979
EI 1089-7550
J9 J APPL PHYS
JI J. Appl. Phys.
PD APR 1
PY 2012
VL 111
IS 7
AR 07B922
DI 10.1063/1.3679762
PG 3
WC Physics, Applied
SC Physics
GA 932HX
UT WOS:000303282400298
ER

PT J
AU Ranjbar, M
   Piramanayagam, SN
   Sbiaa, R
   Chong, TC
AF Ranjbar, M.
   Piramanayagam, S. N.
   Sbiaa, R.
   Chong, T. C.
TI Magnetic properties of antidots in conventional and spin-reoriented
   antiferromagnetically coupled layers
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article; Proceedings Paper
CT 56th Annual Conference on Magnetism and Magnetic Materials
CY OCT 30-30, 2011
CL Scottsdale, AZ
ID RECORDING MEDIA; FABRICATION; METALS
AB Antiferromagnetically coupled (AFC) patterned media technology is one approach to reduce dipolar interactions and thus minimize the switching field distribution (SFD) in bit-patterned media. Achieving anti-parallel alignment of magnetic moments at remanence requires a large exchange coupling field (H-ex), especially in patterned nanostructures, which exhibit a large enhancement in coercivity after patterning. In our work, we observed a very high H-ex of more than 15 kOe in Co thin film antiferromagnetically coupled to (Co/Pd) multilayers with a high perpendicular magnetic anisotropy (PMA). In contrast, an H-ex of only 380 Oe was measured in the case of (Co/Pd) multilayers of the type [Co (0.4 nm)/Pd (0.8 nm)](3) antiferromagnetically coupled with (Co/Pd) multilayers with a high PMA. The effect of H-ex on SFD of patterned structures was investigated, and it was found that SFD can be reduced in AFC patterned films with a high H-ex. (C) 2012 American Institute of Physics. [doi:10.1063/1.3679602]
C1 [Ranjbar, M.; Piramanayagam, S. N.; Sbiaa, R.; Chong, T. C.] ASTAR, Data Storage Inst, Singapore 117608, Singapore.
   [Ranjbar, M.; Chong, T. C.] Natl Univ Singapore, Elect & Comp Engn Dept, Singapore 117576, Singapore.
RP Piramanayagam, SN (reprint author), ASTAR, Data Storage Inst, Singapore 117608, Singapore.
EM Prem_SN@dsi.a-star.edu.sg
RI Piramanayagam, SN/A-4192-2008; Sbiaa, Rachid/I-8038-2013
OI Piramanayagam, SN/0000-0002-3178-2960; 
FU A*STAR (SINGA)
FX M.R. would like to express gratitude for support from the A*STAR (SINGA)
   Graduate Scholarship program.
CR Garcia F, 2003, J APPL PHYS, V93, P8397, DOI 10.1063/1.1558096
   GONG W, 1991, J APPL PHYS, V69, P5119, DOI 10.1063/1.348144
   Hellwig O, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3293301
   Li L, 2010, J APPL PHYS, V108, DOI 10.1063/1.3490134
   Lubarda MV, 2011, APPL PHYS LETT, V98, DOI 10.1063/1.3532839
   Moser A, 2007, APPL PHYS LETT, V91, DOI 10.1063/1.2799174
   Parekh V, 2006, NANOTECHNOLOGY, V17, P2079, DOI 10.1088/0957-4484/17/9/001
   PARKIN SSP, 1991, PHYS REV LETT, V67, P3598, DOI 10.1103/PhysRevLett.67.3598
   Piramanayagam SN, 2007, J APPL PHYS, V102, DOI 10.1063/1.2750414
   Piramanayagam SN, 2009, J APPL PHYS, V105, DOI 10.1063/1.3075565
   Ranjbar M, 2011, J APPL PHYS, V110, DOI 10.1063/1.3658843
   Ranjbar M, 2011, J PHYS D APPL PHYS, V44, DOI 10.1088/0022-3727/44/26/265005
   Ranjbar M, 2010, IEEE T MAGN, V46, P1787, DOI 10.1109/TMAG.2010.2043226
   Richter HJ, 2009, J MAGN MAGN MATER, V321, P467, DOI 10.1016/j.jmmm.2008.04.161
   Ross C, 2001, ANN REV MATER RES, V31, P203, DOI 10.1146/annurev.matsci.31.1.203
   Sbiaa R, 2010, J APPL PHYS, V107, DOI 10.1063/1.3427560
   Sbiaa R, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3273856
   Sbiaa R, 2009, J APPL PHYS, V105, DOI 10.1063/1.3093699
   Shaw JM, 2007, J APPL PHYS, V101, DOI 10.1063/1.2431399
   Shaw JM, 2008, PHYS REV B, V78, DOI 10.1103/PhysRevB.78.024414
   Tan EL, 2009, J VAC SCI TECHNOL B, V27, P2259, DOI 10.1116/1.3225597
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
NR 22
TC 2
Z9 2
U1 0
U2 4
PU AMER INST PHYSICS
PI MELVILLE
PA 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
SN 0021-8979
EI 1089-7550
J9 J APPL PHYS
JI J. Appl. Phys.
PD APR 1
PY 2012
VL 111
IS 7
AR 07B921
DI 10.1063/1.3679602
PG 3
WC Physics, Applied
SC Physics
GA 932HX
UT WOS:000303282400297
ER

PT J
AU Wang, H
   Li, WM
   Rahman, MT
   Zhao, HB
   Ding, J
   Chen, YJ
   Wang, JP
AF Wang, Hao
   Li, Weimin
   Rahman, M. Tofizur
   Zhao, Haibao
   Ding, Jun
   Chen, Yunjie
   Wang, Jian-Ping
TI Characterization of L1(0)-FePt/Fe based exchange coupled composite bit
   pattern media
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article; Proceedings Paper
CT 56th Annual Conference on Magnetism and Magnetic Materials
CY OCT 30-30, 2011
CL Scottsdale, AZ
ID LITHOGRAPHY; FABRICATION
AB L1(0)-FePt exchange coupled composite (ECC) bit patterned media has been considered as a potential candidate to achieve high thermal stability and writability for future high density magnetic recording. In this paper, FePt based ECC bit patterned structures with 31 nm bit size and 37 nm pitch size were fabricated using di-block copolymer lithography on 3 inch wafer. Remanant states were tracked using magnetic force microscopy (MFM). DC demagnetization (DCD) curves were plotted by counting the reversed bits in the MFM images. Magnetic domains in which the magnetizations of the neighboring bits were aligned to the same direction were observed in the MFM patterns. Thermal decay measurement was performed for the samples to obtain the thermal stability and gain factor. The thermal barrier was found around 210 k(B)T with a gain factor up to 1.57 for the bit patterned structure FePt(4 nm)/Fe(4 nm). (C) 2012 American Institute of Physics. [doi:10.1063/1.3677793]
C1 [Wang, Hao; Rahman, M. Tofizur; Zhao, Haibao; Wang, Jian-Ping] Univ Minnesota, Dept Elect & Comp Engn, MINT Ctr, Minneapolis, MN 55455 USA.
   [Li, Weimin; Ding, Jun] Natl Univ Singapore, Dept Mat Sci & Engn, Singapore 117548, Singapore.
   [Li, Weimin; Chen, Yunjie] ASTAR, Data Storage Inst, Singapore, Singapore.
RP Wang, JP (reprint author), Univ Minnesota, Dept Elect & Comp Engn, MINT Ctr, Minneapolis, MN 55455 USA.
EM jpwang@umn.edu
RI Li, Weimin/J-8818-2012; Ding, Jun/C-5172-2011
FU INSIC EHDR; WDC; NSF via the NSF MRSEC [DMR-0819885]
FX The authors are grateful for the support by Dr. Y. Isowaki, Dr. Y.
   Kamata, and Dr. A. Kikitsu from Toshiba Corporation for the di-block
   copolymer patterning processing. The work was partially supported by
   INSIC EHDR program and WDC. Parts of this work were carried out in the
   Characterization Facility, University of Minnesota, a member of the
   NSF-funded Materials Research Facilities Network (www.mrfn.org) via the
   NSF MRSEC program under Award No. DMR-0819885.
CR Bertram HN, 2007, IEEE T MAGN, V43, P2145, DOI 10.1109/TMAG.2007.892852
   Chou SY, 1996, J VAC SCI TECHNOL B, V14, P4129, DOI 10.1116/1.588605
   Hieda H, 2006, J PHOTOPOLYM SCI TEC, V19, P425, DOI 10.2494/photopolymer.19.425
   Kamata Y, 2011, IEEE T MAGN, V47, P51, DOI 10.1109/TMAG.2010.2077274
   Li WM, 2011, J APPL PHYS, V109, DOI 10.1063/1.3563069
   Lu ZH, 2007, IEEE T MAGN, V43, P2941, DOI 10.1109/TMAG.2007.893630
   Rahman MT, 2009, J APPL PHYS, V105, DOI 10.1063/1.3072444
   Ross CA, 2008, MRS BULL, V33, P838, DOI 10.1557/mrs2008.179
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Suess D, 2007, PHYS REV B, V75, DOI 10.1103/PhysRevB.75.174430
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Victora RH, 2005, IEEE T MAGN, V41, P2828, DOI 10.1109/TMAG.2005.855263
   Wang H, 2011, J APPL PHYS, V109, DOI 10.1063/1.3562453
   Wang JP, 2005, IEEE T MAGN, V41, P3181, DOI 10.1109/TMAG.2005.855278
   Weller D, 2000, IEEE T MAGN, V36, P10, DOI 10.1109/20.824418
   Xu YF, 2002, APPL PHYS LETT, V80, P3325, DOI 10.1063/1.1476706
   Yang X, 2007, J VAC SCI TECHNOL B, V25, P2202, DOI 10.1116/1.2798711
NR 17
TC 7
Z9 7
U1 1
U2 24
PU AMER INST PHYSICS
PI MELVILLE
PA 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
SN 0021-8979
EI 1089-7550
J9 J APPL PHYS
JI J. Appl. Phys.
PD APR 1
PY 2012
VL 111
IS 7
AR 07B914
DI 10.1063/1.3677793
PG 3
WC Physics, Applied
SC Physics
GA 932HX
UT WOS:000303282400290
ER

PT J
AU Xu, QQ
   Kanbara, R
   Kato, T
   Iwata, S
   Tsunashima, S
AF Xu, Qianqian
   Kanbara, Ryutarou
   Kato, Takeshi
   Iwata, Satoshi
   Tsunashima, Shigeru
TI Control of magnetic properties of MnBi and MnBiCu thin films by Kr+ ion
   irradiation
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article; Proceedings Paper
CT 56th Annual Conference on Magnetism and Magnetic Materials
CY OCT 30-30, 2011
CL Scottsdale, AZ
ID PATTERNED MEDIA; KERR ROTATION; ALLOY-FILMS
AB Mn52Bi48 (15 nm) and Mn54Bi24Cu21 (15 nm) thin films were prepared by the magnetron sputtering and vacuum annealing at 350 degrees C, and the variations of their structures and magnetic properties with 30 keV Kr+ ion irradiation were studied. The MnBi and MnBiCu films exhibited saturation magnetizations M-s of 180 emu/cc and 210 emu/cc, the coercivities H-c of 10 kOe and 3.4 kOe, respectively. The Ms and Hc of the MnBi abruptly vanished by the irradiation of ion dose at 3 x 10(14) ions/cm(2), while those of the MnBiCu film gradually decreased with increasing the ion dose and became zero at 5 x 10(13) ions/cm(2). The different trend on the ion irradiation between MnBi and MnBiCu films is understood by the surface structure of the film, i.e., the MnBi has convex islands on its surface, which protect the underneath NiAs-type MnBi from the irradiation, while the MnBiCu has rather flat surface, and its crystal structure was uniformly modified by the irradiation. From the surface flatness and the uniformity of the MnBiCu film, as well as the low annealing temperature of 350 degrees C, it was concluded that the MnBiCu film is one of the attractive materials for high-density ion irradiation bit patterned media. (C) 2012 American Institute of Physics. [doi:10.1063/1.3675981]
C1 [Xu, Qianqian; Kanbara, Ryutarou; Kato, Takeshi; Iwata, Satoshi] Nagoya Univ, Dept Quantum Engn, Chikusa Ku, Nagoya, Aichi 4648603, Japan.
   [Tsunashima, Shigeru] Nagoya Ind Sci Res Inst, Dept Res, Chikusa Ku, Nagoya, Aichi 4600819, Japan.
RP Xu, QQ (reprint author), Nagoya Univ, Dept Quantum Engn, Chikusa Ku, Furo Cho, Nagoya, Aichi 4648603, Japan.
EM xqq_jp@hotmail.com
RI Kato, Takeshi/I-2654-2013
FU Ministry of Education, Culture, Sports, Science and Technology of Japan
FX The authors would like to thank Mr. M. Kumazawa for assistance with
   experiments. This work is partly supported by Grants-in-Aid for
   Scientific Research from the Ministry of Education, Culture, Sports,
   Science and Technology of Japan.
CR Chappert C, 1998, SCIENCE, V280, P1919, DOI 10.1126/science.280.5371.1919
   CHEN D, 1968, J APPL PHYS, V39, P3916, DOI 10.1063/1.1656875
   Cho J, 1999, J APPL PHYS, V86, P3149, DOI 10.1063/1.371181
   DI GQ, 1994, JPN J APPL PHYS 2, V33, pL783, DOI 10.1143/JJAP.33.L783
   Kato T, 2004, J MAGN MAGN MATER, V272, P778, DOI [10.1016/j.jmmm.2003.12.382, 10.1016/j.jmmm.m2003.12.382]
   Kato T, 2009, J APPL PHYS, V106, DOI 10.1063/1.3212967
   Kato T, 2009, J APPL PHYS, V105, DOI 10.1063/1.3072024
   Kato T, 2010, IEEE T MAGN, V46, P1671, DOI 10.1109/TMAG.2010.2044559
   KATSUI A, 1976, J APPL PHYS, V47, P3609, DOI 10.1063/1.323166
   Kikitsu A, 2007, IEEE T MAGN, V43, P3685, DOI 10.1109/TMAG.2007.902970
   Niizeki N, 1968, Z KRISTALLOGR, V127, P173
   Suharyadi E, 2006, IEEE T MAGN, V42, P2972, DOI 10.1109/TMAG.2006.880076
   Suharyadi E, 2005, IEEE T MAGN, V41, P3595, DOI 10.1109/TMAG.2005.854735
   SUITS JC, 1974, PHYS REV B, V10, P120, DOI 10.1103/PhysRevB.10.120
   Terris BD, 2009, J MAGN MAGN MATER, V321, P512, DOI 10.1016/j.jmmm.2008.05.046
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
NR 16
TC 2
Z9 2
U1 5
U2 29
PU AMER INST PHYSICS
PI MELVILLE
PA 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
SN 0021-8979
EI 1089-7550
J9 J APPL PHYS
JI J. Appl. Phys.
PD APR 1
PY 2012
VL 111
IS 7
AR 07B906
DI 10.1063/1.3675981
PG 3
WC Physics, Applied
SC Physics
GA 932HX
UT WOS:000303282400282
ER

PT J
AU Rehman, HU
   Evans, BL
AF Rehman, Hamood-Ur
   Evans, Brian L.
TI Alleviating Dirty-Window Effect in Medium Frame-Rate Binary Video
   Halftones
SO IEEE TRANSACTIONS ON IMAGE PROCESSING
LA English
DT Article
DE Dirty-window effect (DWE); temporal artifacts; video halftoning
ID QUALITY ASSESSMENT; ERROR DIFFUSION; MODEL; VISIBILITY; TEXTURES;
   PATTERNS; SEARCH; IMAGES
AB A video display device having a lower number of bits per pixel than that required by the video to be displayed quantizes the video prior to its display. Halftoning can perform this quantization while attempting to reduce the visibility of certain quantization artifacts. Quantization artifacts are, nevertheless, not eliminated. A temporal artifact known as dirty-window effect (DWE) can be commonly observed in medium frame-rate binary video halftones. In this paper, we propose video halftone enhancement algorithms to reduce DWE. We assess the performance of the proposed algorithms by presenting objective measures for DWE in the original and the improved halftone videos. The expected contributions of this paper include three medium frame-rate binary video halftone enhancement algorithms that do the following: 1) reduce DWE under a spatial quality constraint; 2) reduce DWE under a spatial quality constraint with reduced complexity; and 3) reduce DWE under spatial and temporal quality constraints.
C1 [Rehman, Hamood-Ur; Evans, Brian L.] Univ Texas Austin, Dept Elect & Comp Engn, Austin, TX 78712 USA.
RP Rehman, HU (reprint author), Univ Texas Austin, Dept Elect & Comp Engn, Austin, TX 78712 USA.
EM bevans@ece.utexas.edu
CR Agar AU, 2005, IEEE T IMAGE PROCESS, V14, P1945, DOI 10.1109/TIP.2005.859380
   ANALOUI M, 1992, P SOC PHOTO-OPT INS, V1666, P96, DOI 10.1117/12.135959
   Axelson P.E., 2003, THESIS LINKOPING U N
   CAMPBELL FW, 1969, J PHYSIOL-LONDON, V204, P283
   Chang TC, 2006, IEEE T IMAGE PROCESS, V15, P1285, DOI 10.1109/TIP.2005.864162
   Cittadini F, 2007, P SOC PHOTO-OPT INS, V6493, pD4931, DOI 10.1117/12.704195
   Daly S. J., 1987, SUBROUTINE GENERATIO
   Hong-qing Fang, 2005, P IEEE WORKSH MULT S, P1
   Floyd R., 1976, P SID INT S, P36
   Gotsman C., 1993, Visual Computer, V9, P255, DOI 10.1007/BF01908448
   Hild H., 1989, State-of-the-Art in Computer Animation. Proceedings of Computer Animation '89, P181
   HILGENBERG DP, 1994, P SOC PHOTO-OPT INS, V2179, P207, DOI 10.1117/12.172672
   Hocevar S, 2008, LECT NOTES COMPUT SC, V5099, P38, DOI 10.1007/978-3-540-69905-7_5
   Hsu C., 2007, P IEEE INT C MULT EX, P1938
   Kim SH, 2002, IEEE T IMAGE PROCESS, V11, P258, DOI 10.1109/83.988959
   Kite TD, 2000, IEEE T IMAGE PROCESS, V9, P909, DOI 10.1109/83.841536
   Kolpatzik B. W., 1992, Journal of Electronic Imaging, V1, P277, DOI 10.1117/12.60027
   Lau DL, 2003, IEEE SIGNAL PROC MAG, V20, P28, DOI 10.1109/MSP.2003.1215229
   Lau D.L., 2008, MODERN DIGITAL HALFT
   Lieberman DJ, 2000, IEEE T IMAGE PROCESS, V9, P1950, DOI 10.1109/83.877215
   Lieberman DJ, 1997, INTERNATIONAL CONFERENCE ON IMAGE PROCESSING - PROCEEDINGS, VOL I, P775, DOI 10.1109/ICIP.1997.648077
   LIN Q, 1993, P SOC PHOTO-OPT INS, V1913, P378, DOI 10.1117/12.152712
   MANNOS JL, 1974, IEEE T INFORM THEORY, V20, P525, DOI 10.1109/TIT.1974.1055250
   Mitsa T., 1993, P IEEE INT C AC SPEE, P301
   Mulligan J. B., 1993, P SID INT S SEATTL W, P155
   NASANEN R, 1984, IEEE T SYST MAN CYB, V14, P920
   Neuhoff DL, 1997, J OPT SOC AM A, V14, P1707, DOI 10.1364/JOSAA.14.001707
   Nilsson F, 1999, J OPT SOC AM A, V16, P2151, DOI 10.1364/JOSAA.16.002151
   Pappas TN, 2003, IEEE SIGNAL PROC MAG, V20, P14, DOI 10.1109/MSP.2003.1215228
   Pappas TN, 1999, IEEE T IMAGE PROCESS, V8, P1102, DOI 10.1109/83.777090
   Pedersen M., 2009, P SPIE IMAGE QUALITY, V7242
   Rehman H., 2010, EURASIP J IMAGE  OCT, V2010, P1, DOI 10.1007/978-3-8274-2313-9_1
   Rehman H., 2010, THESIS U TEXAS AUSTI
   Rehman H., VIDEO HALFTONING DEM
   Rehman Hamood-Ur, 2010, Proceedings 2010 IEEE Southwest Symposium on Image Analysis & Interpretation (SSIAI), DOI 10.1109/SSIAI.2010.5483886
   SULLIVAN J, 1991, IEEE T SYST MAN CYB, V21, P33, DOI 10.1109/21.101134
   SULLIVAN J, 1993, J OPT SOC AM A, V10, P1714, DOI 10.1364/JOSAA.10.001714
   Sun ZH, 2006, IEEE T IMAGE PROCESS, V15, P678, DOI 10.1109/TIP.2005.863023
   ULICHNEY R, 1993, P SOC PHOTO-OPT INS, V1913, P332, DOI 10.1117/12.152707
   Ulichney R, 1987, DIGITAL HALFTONING
   Wan XX, 2007, P SOC PHOTO-OPT INS, V6494, pU4940, DOI 10.1117/12.704354
   Wang Z, 2004, IEEE T IMAGE PROCESS, V13, P600, DOI 10.1109/TIP.2003.819861
NR 42
TC 2
Z9 2
U1 0
U2 4
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 1057-7149
EI 1941-0042
J9 IEEE T IMAGE PROCESS
JI IEEE Trans. Image Process.
PD APR
PY 2012
VL 21
IS 4
BP 2022
EP 2034
DI 10.1109/TIP.2011.2177991
PG 13
WC Computer Science, Artificial Intelligence; Engineering, Electrical &
   Electronic
SC Computer Science; Engineering
GA 917MP
UT WOS:000302181800047
ER

PT J
AU Yamamoto, R
   Yuzawa, A
   Shimada, T
   Ootera, Y
   Kamata, Y
   Kihara, N
   Kikitsu, A
AF Yamamoto, Ryousuke
   Yuzawa, Akiko
   Shimada, Takuya
   Ootera, Yasuaki
   Kamata, Yoshiyuki
   Kihara, Naoko
   Kikitsu, Akira
TI Nanoimprint Mold for 2.5 Tbit/in.(2) Directed Self-Assembly Bit
   Patterned Media with Phase Servo Pattern
SO JAPANESE JOURNAL OF APPLIED PHYSICS
LA English
DT Article
ID BLOCK-COPOLYMER; LITHOGRAPHY; GRAPHOEPITAXY
AB We demonstrate the mold fabrication and replication process for the production of 0.8 and 2.5 Tbit/in.(2) directed self-assembly bit patterned media (DSA-BPM). These devices are fabricated with 33 and 17 nm dot pitch patterns using the microphase segregation structure of polystyrenepoly(dimethylsiloxane) as an etching mask template. The self-assembled dot arrays are simultaneously ordered on both the circular tracks for the data area and the arbitrary marks for the servo area by DSA using groove guides. We fabricated the Si mold with dot pillars of 19.3 nm height for the 2.5 Tbit/in.(2) DSA-BPM from the poly(dimethylsiloxane) dot mask. We also demonstrated the nickel mold replication of the 0.8 Tbit/in.(2) DSA-BPM by electroforming from the Si mold. (C) 2012 The Japan Society of Applied Physics
C1 [Yamamoto, Ryousuke; Yuzawa, Akiko; Shimada, Takuya; Ootera, Yasuaki; Kamata, Yoshiyuki; Kihara, Naoko; Kikitsu, Akira] Toshiba Co Ltd, Corp R&D Ctr, Kawasaki, Kanagawa 2128582, Japan.
RP Yamamoto, R (reprint author), Toshiba Co Ltd, Corp R&D Ctr, Kawasaki, Kanagawa 2128582, Japan.
FU New Energy and Industrial Technology Development Organization (NEDO)
FX A part of this work was funded by the New Energy and Industrial
   Technology Development Organization (NEDO) under the "Development of
   nanobit technology for ultra-high density magnetic recording (Green
   IT)'' project.
CR Akahane T, 2011, JPN J APPL PHYS, V50, DOI 10.1143/JJAP.50.06GG04
   Asakawa K, 2002, JPN J APPL PHYS 1, V41, P6112, DOI 10.1143/JJAP.41.6112
   Bang J, 2009, ADV MATER, V21, P4769, DOI 10.1002/adma.200803302
   Bita I, 2008, SCIENCE, V321, P939, DOI 10.1126/science.1159352
   Black CT, 2007, IBM J RES DEV, V51, P605
   Bosworth JK, 2010, J PHOTOPOLYM SCI TEC, V23, P145, DOI 10.2494/photopolymer.23.145
   Hoga M, 2011, MICROELECTRON ENG, V88, P1975, DOI 10.1016/j.mee.2010.12.122
   Huda M, 2011, JPN J APPL PHYS, V50, DOI 10.1143/JJAP.50.06GG06
   Jung YS, 2007, NANO LETT, V7, P2046, DOI 10.1021/nl070924l
   Kamata Y, 2007, JPN J APPL PHYS 1, V46, P999, DOI 10.1143/JJAP.46.999
   Kamata Y, 2011, IEEE T MAGN, V47, P51, DOI 10.1109/TMAG.2010.2077274
   Kikitsu A, 2009, J MAGN MAGN MATER, V321, P526, DOI 10.1016/j.jmmm.2008.05.039
   Kim HC, 2008, J VAC SCI TECHNOL A, V26, P1369, DOI 10.1116/1.3000056
   Lee N, 2008, JPN J APPL PHYS, V47, P1803, DOI [10.1143/JJAP.47.1803, 10.1143/JJAP.47.18031]
   Lille J, 2011, PROC SPIE, V8166, DOI 10.1117/12.898785
   Lodder JC, 2004, J MAGN MAGN MATER, V272, P1692, DOI 10.1016/j.jmmm.2003.12.259
   Naito K, 2002, IEEE T MAGN, V38, P1949, DOI 10.1109/TMAG.2002.802847
   Nakada Y, 2006, JPN J APPL PHYS 2, V45, pL1241, DOI 10.1143/JJAP.45.L1241
   Ootera Y, 2011, PROC SPIE, V7970, DOI 10.1117/12.878936
   Park S, 2009, SCIENCE, V323, P1030, DOI 10.1126/science.1168108
   Rockford L, 1999, PHYS REV LETT, V82, P2602, DOI 10.1103/PhysRevLett.82.2602
   Ross C, 2001, ANN REV MATER RES, V31, P203, DOI 10.1146/annurev.matsci.31.1.203
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Segalman RA, 2005, MAT SCI ENG R, V48, P191, DOI 10.1016/j.mser.2004.12.003
   Segalman RA, 2001, ADV MATER, V13, P1152, DOI 10.1002/1521-4095(200108)13:15<1152::AID-ADMA1152>3.0.CO;2-5
   Shiroishi Y, 2009, IEEE T MAGN, V45, P3816, DOI 10.1109/TMAG.2009.2024879
   Son JG, 2011, ADV MATER, V23, P634, DOI 10.1002/adma.201002999
   Watanabe R, 2009, JPN J APPL PHYS, V48, DOI 10.1143/JJAP.48.06FE08
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
   Xiao B. S., 2009, ADV MATER, V21, P2516
   Yang XM, 2008, J VAC SCI TECHNOL B, V26, P2604, DOI 10.1116/1.2978487
   Yang XM, 2009, IEEE T MAGN, V45, P833, DOI 10.1109/TMAG.2008.2010647
   Ye ZM, 2011, PROC SPIE, V7970, DOI 10.1117/12.879932
   Yoshida H, 2011, J PHOTOPOLYM SCI TEC, V24, P577, DOI 10.2494/photopolymer.24.577
   Yu HF, 2006, J AM CHEM SOC, V128, P11010, DOI 10.1021/ja064148f
NR 35
TC 12
Z9 12
U1 1
U2 15
PU IOP PUBLISHING LTD
PI BRISTOL
PA TEMPLE CIRCUS, TEMPLE WAY, BRISTOL BS1 6BE, ENGLAND
SN 0021-4922
EI 1347-4065
J9 JPN J APPL PHYS
JI Jpn. J. Appl. Phys.
PD APR
PY 2012
VL 51
IS 4
AR 046503
DI 10.1143/JJAP.51.046503
PN 1
PG 6
WC Physics, Applied
SC Physics
GA 920NU
UT WOS:000302413100069
ER

PT J
AU Wu, KS
   Tan, HY
   Ngan, HL
   Liu, YH
   Ni, LM
AF Wu, Kaishun
   Tan, Haoyu
   Ngan, Hoi-Lun
   Liu, Yunhuai
   Ni, Lionel M.
TI Chip Error Pattern Analysis in IEEE 802.15.4
SO IEEE TRANSACTIONS ON MOBILE COMPUTING
LA English
DT Article
DE IEEE 802.15.4; physical layer (PHY); pseudonoise (PN) codes; chip error
   patterns; measurement study
AB IEEE 802.15.4 standard specifies physical layer (PHY) and medium access control (MAC) sublayer protocols for low-rate and low-power communication applications. In this protocol, every 4-bit symbol is encoded into a sequence of 32 chips that are actually transmitted over the air. The 32 chips as a whole is also called a pseudonoise code (PN-Code). Due to complex channel conditions such as attenuation and interference, the transmitted PN-Code will often be received with some PN-Code chips corrupted. In this paper, we conduct a systematic analysis on these errors occurring at chip level. We find that there are notable error patterns corresponding to different cases. We then show that recognizing these patterns enables us to identify the channel condition in great details. We believe that understanding what happened to the transmission in our way can potentially bring benefit to channel coding, routing, and error correction protocol design. Finally, we propose Simple Rule, a simple yet effective method based on the chip error patterns to infer the link condition with an accuracy of over 96 percent in our evaluations.
C1 [Wu, Kaishun] Sun Yat Sen Univ, Sch Phys & Engn, Guangzhou 510275, Guangdong, Peoples R China.
   [Wu, Kaishun] Hong Kong Univ Sci & Technol, Fok Ying Tung Grad Sch, Kowloon, Hong Kong, Peoples R China.
   [Tan, Haoyu; Ngan, Hoi-Lun; Liu, Yunhuai; Ni, Lionel M.] Hong Kong Univ Sci & Technol, Dept Comp Sci & Engn, Kowloon, Hong Kong, Peoples R China.
RP Wu, KS (reprint author), Sun Yat Sen Univ, Sch Phys & Engn, Guangzhou 510275, Guangdong, Peoples R China.
EM kwinson@ust.hk; hytan@cse.ust.hk; cpeglun@cse.ust.hk;
   yunhuai@cse.ust.hk; ni@cse.ust.hk
RI Wu, Kaishun /K-8825-2012
FU Pearl River New Star Technology Training Project; Hong Kong RGC
   [HKUST617710]; China NSFC [60933011, 60933012]; Science and Technology
   Planning Project of Guangdong Province, China [2009A080207002]
FX This research was supported in part by the Pearl River New Star
   Technology Training Project, Hong Kong RGC Grant HKUST617710, China NSFC
   Grants 60933011 and 60933012, and the Science and Technology Planning
   Project of Guangdong Province, China, under Grant No. 2009A080207002.
CR Aguayo D., 2004, P ACM SIGCOMM
   Blossom E., 2011, GNU SOFTWARE DEFINED
   Cerpa A., 2005, P 4 INT S INF PROC S
   Chipcon, 2005, CC2420 DATASHEET
   Eckhardt D., 1996, P ACM SIGCOMM
   Ettus Research LLC, 2008, UN SOFTW RAD PER USR
   Gummadi R., 2007, P ACM SIGCOMM
   Han B., 2009, P IEEE INFOCOM
   IEEE, 2006, 8021542006 IEEE
   Jamieson K., 2007, P ACM SIGCOMM
   Katti H.B. Sachin, 2008, P SIGCOMM
   Muhammad U.I., 2009, P IEEE INFOCOM
   Muhammad U.I., 2008, P IEEE INFOCOM
   Rappaport TS., 2002, WIRELESS COMMUNICATI
   Rayanchu S., 2008, P IEEE INFOCOM
   Reis C., 2006, P ACM SIGCOMM
   Schmid T., 2005, GNU RADIO 802 15 4 E
   So H.-S. W., 2003, PACKET LOSS BEHAV WI
   Spirient, 2006, SR5500 WIR CHANN EM
   Srinivasan K., 2006, P 4 INT C EMB NETW S
   Willig A, 2002, IEEE T IND ELECTRON, V49, P1265, DOI 10.1109/TIE.2002.804974
   Woo A., 2001, P ACM MOBICOM
   Wu KS, 2010, MOBICOM 10 & MOBIHOC 10: PROCEEDINGS OF THE 16TH ANNUAL INTERNATIONAL CONFERENCE ON MOBILE COMPUTING AND NETWORKING AND THE 11TH ACM INTERNATIONAL SYMPOSIUM ON MOBILE AD HOC NETWORKING AND COMPUTING, P13
   Wu Kaishun, 2010, P IEEE INFOCOM
   Zhang J., 2008, P IEEE INFOCOM
   Zhao J., 2003, P ACM 1 INT C EMB NE
   Zhou G., 2005, P IEEE INFOCOM
   Zuniga M., 2004, P IEEE 1 INT C SENS
   [Anonymous], 2011, PCM ZIGBEE DATASHEET
NR 29
TC 26
Z9 29
U1 0
U2 4
PU IEEE COMPUTER SOC
PI LOS ALAMITOS
PA 10662 LOS VAQUEROS CIRCLE, PO BOX 3014, LOS ALAMITOS, CA 90720-1314 USA
SN 1536-1233
EI 1558-0660
J9 IEEE T MOBILE COMPUT
JI IEEE. Trans. Mob. Comput.
PD APR
PY 2012
VL 11
IS 4
BP 543
EP 552
DI 10.1109/TMC.2011.44
PG 10
WC Computer Science, Information Systems; Telecommunications
SC Computer Science; Telecommunications
GA 896NE
UT WOS:000300573200002
ER

PT J
AU Uesaka, Y
   Endo, H
   Suzuki, Y
   Nakatani, Y
   Hayashi, N
   Fukushima, H
AF Uesaka, Y.
   Endo, H.
   Suzuki, Y.
   Nakatani, Y.
   Hayashi, N.
   Fukushima, H.
TI Switching of a particle in inhomogeneous applied field
SO JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
LA English
DT Article
DE Switching; Inhomogeneous applied field; Particle; Micromagnetics
   simulation
ID ELONGATED GAMMA-FE2O3 PARTICLES; HEXAGONAL PLATELET PARTICLE;
   MAGNETIZATION REVERSAL; COMPUTER-SIMULATION; PATTERNED MEDIA; MECHANISM
AB We investigated switching field and its mechanism of a particle in inhomogeneous applied field using micromagnetics simulation and the following results were obtained. 1) The average switching field (ASF) is almost the same as the switching field in a uniform applied field when the gradient of the inhomogeneous field (FG) is small (< 0.6 kOe/nm) at any angle (xi) between the applied field and easy direction. The ASF decreases in small xi (< 60 degrees) and increases in large xi (> 60 degrees) with increasing the FG and/or with increasing zero applied field region when the FG is not small (> 0.6 kOe/nm). 2) The average switching field can also be determined from normalized particle size d/root A/K-u. Here, A is the exchange stiffness constant, K-u is the uniaxial anisotropy constant and d is the particle size. 3) Large FG is not necessarily important in a write head for BPM as long as the head field changes within one bit particle in the medium. (C) 2011 Elsevier B.V. All rights reserved.
C1 [Uesaka, Y.; Endo, H.; Suzuki, Y.] Nihon Univ, Coll Engn, Fukushima 9638642, Japan.
   [Nakatani, Y.] Univ Electrocommun, Chofu, Tokyo 182, Japan.
RP Uesaka, Y (reprint author), 606 Koyo Cho, Fukushima 9620401, Japan.
EM uesakay@hb.tp1.jp
CR CHANG T, 1993, IEEE T MAGN, V29, P3619, DOI 10.1109/20.281248
   d'Aquino M, 2005, J MAGN MAGN MATER, V290, P506, DOI 10.1016/j.jmmm.2004.11.513
   Fukushima H, 2005, J MAGN MAGN MATER, V290, P526, DOI 10.1016/j.jmmm.2004.11.518
   Fukushima H, 1998, IEEE T MAGN, V34, P193, DOI 10.1109/20.650225
   Greaves S, 2006, IEEE T MAGN, V42, P2408, DOI 10.1109/TMAG.2006.878665
   HE L, 1994, IEEE T MAGN, V30, P4086, DOI 10.1109/20.333997
   Ikeda Y, 2010, IEEE T MAGN, V46, P1622, DOI 10.1109/TMAG.2010.2041193
   NAKATANI Y, 1989, JPN J APPL PHYS 1, V28, P2485, DOI 10.1143/JJAP.28.2485
   NAKATANI Y, 1990, J APPL PHYS, V67, P5143, DOI 10.1063/1.344643
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   SCHABES ME, 1989, IEEE T MAGN, V25, P3662, DOI 10.1109/20.42396
   SCHABES ME, 1988, J APPL PHYS, V64, P1347, DOI 10.1063/1.341858
   SCHABES ME, 1990, J APPL PHYS, V67, P5149, DOI 10.1063/1.344645
   SCHABES ME, 1988, J APPL PHYS, V64, P5832, DOI 10.1063/1.342222
   Uesaka Y, 1995, JPN J APPL PHYS 1, V34, P6056, DOI 10.1143/JJAP.34.6056
   UESAKA Y, 1990, J APPL PHYS, V67, P5146, DOI 10.1063/1.344644
   UESAKA Y, 1991, J APPL PHYS, V69, P4847, DOI 10.1063/1.348251
   UESAKA Y, 1991, JPN J APPL PHYS 1, V30, P2489, DOI 10.1143/JJAP.30.2489
   UESAKA Y, 1993, JPN J APPL PHYS 1, V32, P1101, DOI 10.1143/JJAP.32.1101
   Uesaka Y., UNPUB
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
NR 21
TC 0
Z9 0
U1 0
U2 1
PU ELSEVIER SCIENCE BV
PI AMSTERDAM
PA PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
SN 0304-8853
J9 J MAGN MAGN MATER
JI J. Magn. Magn. Mater.
PD APR
PY 2012
VL 324
IS 7
BP 1272
EP 1276
DI 10.1016/j.jmmm.2011.07.061
PG 5
WC Materials Science, Multidisciplinary; Physics, Condensed Matter
SC Materials Science; Physics
GA 875DH
UT WOS:000299010100002
ER

PT J
AU Takenaka, K
   Saidoh, N
   Nishiyama, N
   Ishimaru, M
   Futamoto, M
   Inoue, A
AF Takenaka, Kana
   Saidoh, Noriko
   Nishiyama, Nobuyuki
   Ishimaru, Manabu
   Futamoto, Masaaki
   Inoue, Akihisa
TI Read/write characteristics of a new type of bit-patterned-media using
   nano-patterned glassy alloy
SO JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
LA English
DT Article
DE Patterned-media; Multilayered film; Read/write characteristic; Glassy
   alloy; Thermal nano-imprinting
ID THERMAL-STABILITY; THIN-FILM; DIAMETER; IMPRINT; DENSITY
AB The paper reports a feasibility study of new type bit-patterned-media using a nano-patterned glassy alloy template for ultra-high density hard disk applications. The prototype bit-patterned-media was prepared using a nano-hole array pattern fabricated on a Pd-based glassy alloy thin film and a Co/Pd multilayered film filled in the nano-holes. The prepared prototype bit-patterned-media had a smooth surface and isolated Co/Pd multilayer magnetic dots, where the average dot diameter, the average dot pitch and the average dot height were 30, 60 and 19 nm, respectively. MFM (magnetic force microscope) observation revealed that each dot was magnetized in a perpendicular direction and the magnetization could reverse when an opposite magnetic field was applied. Static read/write tester measurements showed that repeated writing and reading on isolated magnetic dots were possible in combination with conventional magnetic heads and high-accuracy positioning technologies. The present study indicates that the new type of bit-patterned-media composed of nano-hole arrays fabricated on glassy alloy film template and Co/Pd multilayer magnetic dots are promising for applications to next generation ultra-high density hard disk drives. (C) 2011 Elsevier B.V. All rights reserved.
C1 [Takenaka, Kana; Saidoh, Noriko; Nishiyama, Nobuyuki] RIMCOF Tohoku Univ Lab, Mat Proc Technol Ctr, Sendai, Miyagi 9808577, Japan.
   [Ishimaru, Manabu] Osaka Univ, Inst Sci & Ind Res, Ibaraki 5670047, Japan.
   [Futamoto, Masaaki] Chuo Univ, Fac Sci & Engn, Kasuga, Fukuoka 1128551, Japan.
   [Inoue, Akihisa] Tohoku Univ, Sendai, Miyagi 9808577, Japan.
RP Takenaka, K (reprint author), RIMCOF Tohoku Univ Lab, Mat Proc Technol Ctr, Sendai, Miyagi 9808577, Japan.
EM rimcoftk@imr.tohoku.ac.jp
RI Nishiyama, Nobuyuki/C-8228-2015; Inoue, Akihisa/E-5271-2015
FU New Energy and Industrial Technology Development Organization (NEDO);
   Ministry of Economy, Trade and Industry (METI)
FX Funding by "New Energy and Industrial Technology Development
   Organization (NEDO)" and "Ministry of Economy, Trade and Industry
   (METI)" under "Technological Development of Innovative Components based
   on Enhanced Functionality Metallic Glass" project is also gratefully
   acknowledged.
CR CARCIA PF, 1985, APPL PHYS LETT, V47, P178, DOI 10.1063/1.96254
   Charap SH, 1997, IEEE T MAGN, V33, P978, DOI 10.1109/20.560142
   CHOU SY, 1994, J APPL PHYS, V76, P6673, DOI 10.1063/1.358164
   CHOU SY, 1995, APPL PHYS LETT, V67, P3114, DOI 10.1063/1.114851
   IWASAKI S, 1977, IEEE T MAGN, V13, P1272, DOI 10.1109/TMAG.1977.1059695
   Masuda H, 2006, JPN J APPL PHYS 2, V45, pL406, DOI 10.1143/JJAP.45.L406
   Nishiyama N, 2011, J ALLOY COMPD, V509, pS145, DOI 10.1016/j.jallcom.2010.12.020
   Saotome Y, 2002, INTERMETALLICS, V10, P1241, DOI 10.1016/S0966-9795(02)00135-8
   Takenaka K, 2011, NANOTECHNOLOGY, V22, DOI 10.1088/0957-4484/22/10/105302
   Takenaka K, 2010, INTERMETALLICS, V18, P1969, DOI 10.1016/j.intermet.2010.02.045
   Zeng H, 2000, J APPL PHYS, V87, P4718, DOI 10.1063/1.373137
NR 11
TC 6
Z9 6
U1 0
U2 13
PU ELSEVIER SCIENCE BV
PI AMSTERDAM
PA PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
SN 0304-8853
EI 1873-4766
J9 J MAGN MAGN MATER
JI J. Magn. Magn. Mater.
PD APR
PY 2012
VL 324
IS 7
BP 1444
EP 1448
DI 10.1016/j.jmmm.2011.12.009
PG 5
WC Materials Science, Multidisciplinary; Physics, Condensed Matter
SC Materials Science; Physics
GA 875DH
UT WOS:000299010100032
ER

PT J
AU Li, WM
   Yang, Y
   Chen, YJ
   Huang, TL
   Shi, JZ
   Ding, J
AF Li, W. M.
   Yang, Y.
   Chen, Y. J.
   Huang, T. L.
   Shi, J. Z.
   Ding, J.
TI Study of magnetization reversal of Co/Pd bit-patterned media by
   micro-magnetic simulation
SO JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
LA English
DT Article
DE Bit-patterned media; Switching field distribution (SFD); Dipolar
   interactions; Magnetization reversal
ID FIELD
AB Bit-patterned media based on a single-bit-per-island may be a promising candidate for perpendicular magnetic recording at the Tb/in(2) level because they could provide a lower noise and higher density. The understanding of magnetization reversal processes in such patterned media is important. In this work, the range of single domain island size based on Co/Pd bit-patterned media was determined. Demagnetization effect, dipolar interactions and switching field distribution (SFD) for bit-patterned media were quantitatively studied by the simulation based on Landau-Lifshitz-Gilbert equation. The total hysteresis loops and SFD were comparable with the experiment ones. The SFD increased from 2 sigma=1.2 kOe (as the calculated intrinsic SFD) to the experimental value of 1.9 kOe due to dipolar interactions which is in a good agreement with the experimental results (2.0 kOe). Optimized patterned structure with a minimized SFD and maximized data storage densities was found to have an island size of 10 nm and islands separation of 20 nm. The calculated ratio of SFD/H-c (H-c: the coercivity) is 9.2%, which is below the threshold of 10% for 1 Tb/in(2) pattern media. (C) 2011 Elsevier B.V. All rights reserved.
C1 [Li, W. M.; Yang, Y.; Ding, J.] Natl Univ Singapore, Dept Mat Sci & Engn, Singapore 119260, Singapore.
   [Li, W. M.; Chen, Y. J.; Huang, T. L.; Shi, J. Z.] ASTAR, Data Storage Inst, Singapore 117608, Singapore.
RP Ding, J (reprint author), Natl Univ Singapore, Dept Mat Sci & Engn, Singapore 119260, Singapore.
EM msedingj@nus.edu.sg
RI Li, Weimin/J-8818-2012; Ding, Jun/C-5172-2011
CR AHARONI A, 1962, REV MOD PHYS, V34, P227, DOI 10.1103/RevModPhys.34.227
   Berger A, 2005, IEEE T MAGN, V41, P3178, DOI 10.1109/TMAG.2005.855285
   BROWN WF, 1945, REV MOD PHYS, V17, P15, DOI 10.1103/RevModPhys.17.15
   Chen YJ, 2012, J MAGN MAGN MATER, V324, P264, DOI 10.1016/j.jmmm.2010.11.094
   Chen YJ, 2009, J APPL PHYS, V105, DOI 10.1063/1.3070637
   Chou SY, 1997, P IEEE, V85, P652, DOI 10.1109/5.573754
   Degawa N, 2008, J MAGN MAGN MATER, V320, P3092, DOI 10.1016/j.jmmm.2008.08.097
   Hellwig O, 2007, APPL PHYS LETT, V90, DOI 10.1063/1.2730744
   Krone P, 2009, J APPL PHYS, V106, DOI 10.1063/1.3260240
   KRONMULLER H, 1987, J MAGN MAGN MATER, V69, P149, DOI 10.1016/0304-8853(87)90111-9
   Li WM, 2011, J APPL PHYS, V109, DOI 10.1063/1.3563069
   New RMH, 1996, J MAGN MAGN MATER, V155, P140, DOI 10.1016/0304-8853(95)00723-7
   Piramanayagam SN, 2009, J MAGN MAGN MATER, V321, P485, DOI 10.1016/j.jmmm.2008.05.007
   Rachid S., 2009, J APPL PHYS, V106
   Sbiaa R, 2009, J APPL PHYS, V106, DOI 10.1063/1.3173546
   Scholz W, 2004, J APPL PHYS, V95, P6807, DOI 10.1063/1.1689612
   Shaw JM, 2008, PHYS REV B, V78, DOI 10.1103/PhysRevB.78.024414
   Shi J, 1998, IEEE T MAGN, V34, P997, DOI 10.1109/20.706336
   Sindhu S, 2002, J MAGN MAGN MATER, V238, P246, DOI 10.1016/S0304-8853(01)00919-2
   Speliotis DE, 1999, J MAGN MAGN MATER, V193, P29, DOI 10.1016/S0304-8853(98)00399-0
   TAGAWA I, 1991, IEEE T MAGN, V27, P4975, DOI 10.1109/20.278712
   Weller D, 2000, IEEE T MAGN, V36, P10, DOI 10.1109/20.824418
   Zheng YF, 1997, J APPL PHYS, V81, P5471, DOI 10.1063/1.364629
NR 23
TC 7
Z9 7
U1 2
U2 12
PU ELSEVIER SCIENCE BV
PI AMSTERDAM
PA PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
SN 0304-8853
J9 J MAGN MAGN MATER
JI J. Magn. Magn. Mater.
PD APR
PY 2012
VL 324
IS 8
BP 1575
EP 1580
DI 10.1016/j.jmmm.2011.12.006
PG 6
WC Materials Science, Multidisciplinary; Physics, Condensed Matter
SC Materials Science; Physics
GA 876NN
UT WOS:000299114400019
ER

PT J
AU Oshima, D
   Suharyadi, E
   Kato, T
   Iwata, S
AF Oshima, Daiki
   Suharyadi, Edi
   Kato, Takeshi
   Iwata, Satoshi
TI Observation of ferri-nonmagnetic boundary in CrPt3 line-and-space
   patterned media using a dark-field transmission electron microscope
SO JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
LA English
DT Article
DE Bit patterned media; Ion irradiation; CrPt3; Phase change; Transmission
   electron microscopy
ID MAGNETIC-PROPERTIES; ION IRRADIATION; ALLOY-FILMS
AB Ion beam patterned CrPt3 films were prepared by Kr+ ion irradiation at a dose of 2 x 10(14) ions/cm(2) onto L1(2)-ordered CrPt3 whose surface was partially masked by electron beam patterned resists. Cross-sectional observation using transmission electron microscopy was carried out to study the patterning boundary of the CrPt3 film. Dark-field imaging showed a distinct contrast between non-irradiated (L1(2) phase) and irradiated (A1 phase) regions. The transition width between the two phases was estimated to be about 5 nm, which agreed well with the value simulated by a transport ion in matter (TRIM) code simulation. (C) 2011 Elsevier B.V. All rights reserved.
C1 [Oshima, Daiki; Suharyadi, Edi; Kato, Takeshi; Iwata, Satoshi] Nagoya Univ, Dept Quantum Engn, Chikusa Ku, Nagoya, Aichi 4648603, Japan.
   [Suharyadi, Edi] JSPS, Chiyoda Ku, Tokyo 1028471, Japan.
RP Kato, T (reprint author), Nagoya Univ, Dept Quantum Engn, Chikusa Ku, Furo Cho, Nagoya, Aichi 4648603, Japan.
EM takeshik@nuee.nagoya-u.ac.jp
RI Kato, Takeshi/I-2654-2013
CR Chappert C, 1998, SCIENCE, V280, P1919, DOI 10.1126/science.280.5371.1919
   Ferre J, 1999, J MAGN MAGN MATER, V198-99, P191, DOI 10.1016/S0304-8853(98)01084-1
   Hyndman R, 2001, J APPL PHYS, V90, P3843, DOI 10.1063/1.1401803
   Kato T, 2004, J MAGN MAGN MATER, V272, P778, DOI [10.1016/j.jmmm.2003.12.382, 10.1016/j.jmmm.m2003.12.382]
   Kato T, 2009, J APPL PHYS, V106, DOI 10.1063/1.3212967
   Kato T, 2009, J APPL PHYS, V105, DOI 10.1063/1.3072024
   Kato T, 2010, IEEE T MAGN, V46, P1671, DOI 10.1109/TMAG.2010.2044559
   Kikitsu A, 2007, IEEE T MAGN, V43, P3685, DOI 10.1109/TMAG.2007.902970
   Suharyadi E, 2006, IEEE T MAGN, V42, P2972, DOI 10.1109/TMAG.2006.880076
   Suharyadi E, 2005, IEEE T MAGN, V41, P3595, DOI 10.1109/TMAG.2005.854735
   Terris BD, 1999, APPL PHYS LETT, V75, P403, DOI 10.1063/1.124389
   Ziegler J. F., 1985, STOPPING RANGE IONS
NR 12
TC 4
Z9 4
U1 2
U2 4
PU ELSEVIER SCIENCE BV
PI AMSTERDAM
PA PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
SN 0304-8853
J9 J MAGN MAGN MATER
JI J. Magn. Magn. Mater.
PD APR
PY 2012
VL 324
IS 8
BP 1617
EP 1621
DI 10.1016/j.jmmm.2011.12.019
PG 5
WC Materials Science, Multidisciplinary; Physics, Condensed Matter
SC Materials Science; Physics
GA 876NN
UT WOS:000299114400027
ER

PT J
AU Tudosa, I
   Lubarda, MV
   Chan, KT
   Escobar, MA
   Lomakin, V
   Fullerton, EE
AF Tudosa, I.
   Lubarda, Marko V.
   Chan, K. T.
   Escobar, M. A.
   Lomakin, Vitaliy
   Fullerton, E. E.
TI Thermal stability of patterned Co/Pd nanodot arrays
SO APPLIED PHYSICS LETTERS
LA English
DT Article
ID MAGNETIC TUNNEL-JUNCTION; MEDIA; MRAM; BIT
AB We have studied the magnetic reversal and thermal stability of [Co(0.3 nm)/Pd(0.7 nm)](N) multilayers patterned into 35-nm-diameter nanodot arrays. The short-time coercive fields are relatively constant with N while the room-temperature thermal stability parameter increases nearly linearly with N. However the magnetic switching volume extracted from the thermal stability is significantly less than the physical volume of the samples. The experimental results are in quantitative agreement with micromagnetic modeling, which indicates that reversal and thermal stability is controlled by nucleation and propagation of edge domains. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.3692574]
C1 [Tudosa, I.; Lubarda, Marko V.; Chan, K. T.; Escobar, M. A.; Lomakin, Vitaliy; Fullerton, E. E.] Univ Calif San Diego, Ctr Magnet Recording Res, La Jolla, CA 92093 USA.
RP Fullerton, EE (reprint author), Univ Calif San Diego, Ctr Magnet Recording Res, La Jolla, CA 92093 USA.
EM efullerton@ucsd.edu
RI Fullerton, Eric/H-8445-2013; Escobar, Marco A./A-7055-2010
OI Fullerton, Eric/0000-0002-4725-9509; Escobar, Marco
   A./0000-0002-7151-1997
FU INSIC through the EDHR
FX We would like to acknowledge financial support from INSIC through the
   EDHR program and collaborations with Toshiba Research on the patterning
   of the samples.
CR Bedau D, 2010, APPL PHYS LETT, V97, DOI 10.1063/1.3532960
   Chang R, 2011, J APPL PHYS, V110, DOI 10.1063/1.3617237
   Cucchiara J, 2009, APPL PHYS LETT, V94, DOI 10.1063/1.3089569
   Dery, 2007, NATURE, V447, P573
   Dittrich R, 2002, J MAGN MAGN MATER, V250, pL12
   Engel BN, 2005, IEEE T MAGN, V41, P132, DOI 10.1109/TMAG.2004.840847
   Gallagher WJ, 2006, IBM J RES DEV, V50, P5
   Hall DA, 2010, BIOSENS BIOELECTRON, V25, P2051, DOI 10.1016/j.bios.2010.01.038
   Hellwig O, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3271679
   Hellwig O, 2007, APPL PHYS LETT, V90, DOI 10.1063/1.2730744
   Ikeda S, 2010, NAT MATER, V9, P721, DOI [10.1038/nmat2804, 10.1038/NMAT2804]
   Kamata Y, 2004, J APPL PHYS, V95, P6705, DOI 10.1063/1.1669347
   Kikitsu A, 2007, IEEE T MAGN, V43, P3685, DOI 10.1109/TMAG.2007.902970
   Krone P, 2009, J APPL PHYS, V106, DOI 10.1063/1.3260240
   Mangin S, 2009, APPL PHYS LETT, V94, DOI 10.1063/1.3058680
   Martin JI, 2003, J MAGN MAGN MATER, V256, P449, DOI 10.1016/S0304-8853(02)00898-3
   Moser A, 2002, J PHYS D APPL PHYS, V35, pR157, DOI 10.1088/0022-3727/35/19/201
   Ravelosona D, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.186604
   Richter HJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2209179
   Shaw JM, 2009, PHYS REV B, V80, DOI 10.1103/PhysRevB.80.184419
   Shaw JM, 2008, PHYS REV B, V78, DOI 10.1103/PhysRevB.78.024414
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Thomson T, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.257204
   Watson SM, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2936836
NR 24
TC 14
Z9 14
U1 1
U2 18
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0003-6951
J9 APPL PHYS LETT
JI Appl. Phys. Lett.
PD MAR 5
PY 2012
VL 100
IS 10
AR 102401
DI 10.1063/1.3692574
PG 4
WC Physics, Applied
SC Physics
GA 910QL
UT WOS:000301655500044
ER

PT J
AU Kalezhi, J
   Greaves, SJ
   Kanai, Y
   Schabes, ME
   Grobis, M
   Miles, JJ
AF Kalezhi, Josephat
   Greaves, Simon J.
   Kanai, Yasushi
   Schabes, Manfred E.
   Grobis, Michael
   Miles, Jim J.
TI A statistical model of write-errors in bit patterned media
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article
ID COMPOSITE MEDIA; ENERGY BARRIER; DEPENDENCE; SHAPE
AB In bit patterned media (BPM), a magnetic data storage medium is patterned into nanoscale magnetic islands each representing one binary digit (bit). The recording performance of BPM depends upon the variability of island position, geometry, and magnetic characteristics. To understand the impact of the distributions of these parameters on the performance of BPM a detailed statistical model of write-errors has been developed. The islands can either be single layer or two-layer exchange coupled composite (ECC) structures. The modeling of ECC islands was made possible by the development of a 2-spin model to calculate switching field, coercivity, and energy barrier as a function of applied field which enables medium design to be optimized for a non-uniform write head field. The statistical model predicts coercivities and error rates in good agreement with a micromagnetic model but at significantly lower implementation and computational cost and shows good agreement with experimental data from drag-test experiments at 500 Gbit/in(2). The model enables the position tolerance of the write head to be determined from the magnetic characteristics of the write head and the storage medium and it is therefore a valuable system design tool. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.3691947]
C1 [Kalezhi, Josephat; Miles, Jim J.] Univ Manchester, Sch Comp Sci, Manchester M13 9PL, Lancs, England.
   [Kalezhi, Josephat] Copperbelt Univ, Sch Math & Nat Sci, Dept Comp Sci, Kitwe 10101, Zambia.
   [Greaves, Simon J.] Tohoku Univ, RIEC, Sendai, Miyagi 9808577, Japan.
   [Kanai, Yasushi] Niigata Inst Technol, Dept Informat & Elect Engn, Kashiwazaki 9451195, Japan.
   [Schabes, Manfred E.; Grobis, Michael] Hitachi GST, Hitachi San Jose Res Ctr, San Jose, CA 95135 USA.
RP Kalezhi, J (reprint author), Univ Manchester, Sch Comp Sci, Manchester M13 9PL, Lancs, England.
FU EPSRC [EP/E017657/1]; Information Storage Industry Consortium (INSIC)
   EHDR
FX This work was supported by EPSRC (PhD+), EPSRC under Grant No.
   EP/E017657/1 and by the Information Storage Industry Consortium (INSIC)
   EHDR Program.
CR Beleggia M, 2004, J MAGN MAGN MATER, V278, P270, DOI 10.1016/j.jmmm.2003.12.1314
   BROWN WF, 1979, IEEE T MAGN, V15, P1196, DOI 10.1109/TMAG.1979.1060329
   Fidler J, 2006, PHYSICA B, V372, P312, DOI 10.1016/j.physb.2005.10.074
   Greaves SJ, 2011, J APPL PHYS, V109, DOI 10.1063/1.3536666
   Grobis M, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3304166
   Hughes GF, 1999, IEEE T MAGN, V35, P2310, DOI 10.1109/20.800809
   Hughes GF, 2000, IEEE T MAGN, V36, P521, DOI 10.1109/20.825831
   Kalezhi J, 2011, IEEE T MAGN, V47, P2540, DOI 10.1109/TMAG.2011.2157993
   Kalezhi J, 2011, J APPL PHYS, V109, DOI 10.1063/1.3562869
   Kalezhi J, 2010, IEEE T MAGN, V46, P3752, DOI 10.1109/TMAG.2010.2052626
   Kalezhi J, 2009, IEEE T MAGN, V45, P3531, DOI 10.1109/TMAG.2009.2022407
   Livshitz B, 2009, J APPL PHYS, V105, DOI 10.1063/1.3072442
   Muraoka Hiroaki, 2008, IEEE Transactions on Magnetics, V44, P3423, DOI 10.1109/TMAG.2008.2001654
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Saga H, 2011, J APPL PHYS, V109, DOI 10.1063/1.3554201
   Schabes ME, 2008, J MAGN MAGN MATER, V320, P2880, DOI 10.1016/j.jmmm.2008.07.035
   Scholz W, 2003, COMP MATER SCI, V28, P366, DOI 10.1016/S0927-0256(03)00119-8
   Shen X, 2007, IEEE T MAGN, V43, P676, DOI 10.1109/TMAG.2006.888231
   Victora RH, 2005, IEEE T MAGN, V41, P537, DOI 10.1109/TMAG.2004.838075
   Wood R, 2009, IEEE T MAGN, V45, P100, DOI 10.1109/TMAG.2008.2006286
NR 20
TC 7
Z9 7
U1 1
U2 7
PU AMER INST PHYSICS
PI MELVILLE
PA 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
SN 0021-8979
EI 1089-7550
J9 J APPL PHYS
JI J. Appl. Phys.
PD MAR 1
PY 2012
VL 111
IS 5
AR 053926
DI 10.1063/1.3691947
PG 9
WC Physics, Applied
SC Physics
GA 911OW
UT WOS:000301729200094
ER

PT J
AU Paluncic, F
   Abdel-Ghaffar, KAS
   Ferreira, HC
   Clarke, WA
AF Paluncic, Filip
   Abdel-Ghaffar, Khaled A. S.
   Ferreira, Hendrik C.
   Clarke, Willem A.
TI A Multiple Insertion/Deletion Correcting Code for Run-Length Limited
   Sequences
SO IEEE TRANSACTIONS ON INFORMATION THEORY
LA English
DT Article
DE Helberg code; insertion/deletion error; magnetic recording media;
   run-length limited sequence
ID BIT-PATTERNED MEDIA; CHANNELS; CONSTRUCTIONS; ERRORS
AB A code construction is proposed to add a multiple insertion/deletion error correcting capability to a run-length limited sequence. The codewords of this code are themselves run-length limited. The insertion/deletion correcting capability is achieved by requiring several weighted sums of run-lengths in the codewords to satisfy certain congruences modulo primes. The construction is similar to the number-theoretic code proposed by Dolecek and Anantharam, which can correct multiple repetition errors or, equivalently, multiple insertions of zeros. It is shown that if the codewords in this code are run-length limited, then the code is capable of correcting both insertions and deletions of zeros and ones. An algorithm is proposed for decoding over a multiple insertion/deletion channel. Following the work of Dolecek and Anantharam, a systematic encoding method is also proposed for the codes. Furthermore, it is shown that the proposed construction has a higher rate asymptotically than the Helberg code, which is unconstrained in terms of run-lengths, even though our construction has the additional run-length constraints. The need for run-length limited codes that can correct insertion/deletion errors is motivated by bit-patterned media for magnetic recording.
C1 [Paluncic, Filip; Ferreira, Hendrik C.; Clarke, Willem A.] Univ Johannesburg, Dept Elect & Elect Engn Sci, ZA-2006 Auckland Pk, South Africa.
   [Abdel-Ghaffar, Khaled A. S.] Univ Calif Davis, Dept Elect & Comp Engn, Davis, CA 95616 USA.
RP Paluncic, F (reprint author), Univ Johannesburg, Dept Elect & Elect Engn Sci, ZA-2006 Auckland Pk, South Africa.
EM fpaluncic@uj.ac.za; ghaffar@ece.ucdavis.edu; hcferreira@uj.ac.za;
   willemc@uj.ac.za
CR Abdel-Ghaffar K. A. S., IEEE T INF THE UNPUB
   BERLEKAMP ER, 1970, MATH COMPUT, V24, P713, DOI 10.2307/2004849
   Blaum M., 1994, P 1994 IEEE INT C CO, V3, P1800
   BOURS PAH, 1994, IEEE T INFORM THEORY, V40, P1841, DOI 10.1109/18.340459
   Cheng L., 2010, P IEEE INT S INF THE, P1218
   DELSARTE P, 1981, INFORM CONTROL, V48, P193, DOI 10.1016/S0019-9958(81)90645-8
   Dolecek L, 2010, SIAM J DISCRETE MATH, V23, P2120, DOI 10.1137/080730093
   Ferreira HC, 2009, IEEE T INFORM THEORY, V55, P3494, DOI 10.1109/TIT.2009.2023682
   Hardy G.H., 1979, INTRO THEORY NUMBERS
   Helberg ASJ, 2002, IEEE T INFORM THEORY, V48, P305, DOI 10.1109/18.971760
   Hu J, 2010, IEEE T COMMUN, V58, P1102, DOI 10.1109/TCOMM.2010.04.080683
   Immink K. A. S., 2004, CODES MASS DATA STOR
   Iyengar AR, 2010, IEEE INT SYMP INFO, P958, DOI 10.1109/ISIT.2010.5513433
   Levenshtein V. I., 1966, SOV PHYS DOKL, V6, P707
   Ng YB, 2010, IEEE T MAGN, V46, P2268, DOI 10.1109/TMAG.2010.2043926
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Roth R., 2006, INTRO CODING THEORY
   ROTH RM, 1994, IEEE T INFORM THEORY, V40, P1083, DOI 10.1109/18.335966
   Tang Y., 2009, IEEE T MAGN, V42, P822
   VARSHAMOV RR, 1965, AUTOMAT REM CONTR+, V26, P286
   VARSHAMOV RR, 1973, IEEE T INFORM THEORY, V19, P92, DOI 10.1109/TIT.1973.1054954
   Von Zur Gathen J., 2003, MODERN COMPUTER ALGE
   ZEHAVI E, 1988, IEEE T INFORM THEORY, V34, P45, DOI 10.1109/18.2600
NR 23
TC 3
Z9 3
U1 0
U2 0
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9448
EI 1557-9654
J9 IEEE T INFORM THEORY
JI IEEE Trans. Inf. Theory
PD MAR
PY 2012
VL 58
IS 3
BP 1809
EP 1824
DI 10.1109/TIT.2011.2172725
PG 16
WC Computer Science, Information Systems; Engineering, Electrical &
   Electronic
SC Computer Science; Engineering
GA 899VY
UT WOS:000300845900033
ER

PT J
AU Piramanayagam, SN
   Ranjbar, M
   Sbiaa, R
   Tavakkoli, A
   Chong, TC
AF Piramanayagam, S. N.
   Ranjbar, M.
   Sbiaa, R.
   Tavakkoli K G, A.
   Chong, T. C.
TI Characterization of high-density bit-patterned media using ultra-high
   resolution magnetic force microscopy
SO PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS
LA English
DT Article
DE bit-patterned media; magnetic force microscopy; nanostructures;
   perpendicular magnetic anisotropy
ID RECORDING MEDIA; STORAGE
AB Bit-patterned media at one terabit-per-square-inch (Tb/in2) recording density require a feature size of about 12 nm. The fabrication and characterization of such magnetic nanostructures is still a challenge. In this Letter, we show that magnetic dots can be resolved at 10 nm spacing using magnetic force microscopy (MFM) tips coated with a magnetic film possessing a perpendicular magnetic anisotropy (PMA). Compared to MFM tips with no special magnetic anisotropy, MFM tips with PMA can resolve the bits clearly, because of a smaller magnetic interaction volume, enabling a simple technique for characterizing fine magnetic nanostructures. (C) 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)
C1 [Piramanayagam, S. N.; Ranjbar, M.; Sbiaa, R.; Tavakkoli K G, A.; Chong, T. C.] ASTAR, Data Storage Inst, Singapore 117608, Singapore.
   [Ranjbar, M.; Chong, T. C.] Natl Univ Singapore, Elect & Comp Engn Dept, Singapore 117576, Singapore.
   [Tavakkoli K G, A.] NUS Grad Sch Integrat Sci & Engn NGS, Singapore 117456, Singapore.
RP Piramanayagam, SN (reprint author), ASTAR, Data Storage Inst, Singapore 117608, Singapore.
EM Prem_SN@dsi.a-star.edu.sg
RI Piramanayagam, SN/A-4192-2008; Sbiaa, Rachid/I-8038-2013
OI Piramanayagam, SN/0000-0002-3178-2960; 
FU A*STAR (Agency for Science, Technology and Research) SINGA
FX M. Ranjbar acknowledges an A*STAR (Agency for Science, Technology and
   Research) SINGA scholarship. A. Tavakkoli acknowledges NGS (NUS Graduate
   School for Integrative Sciences and Engineering).
CR Amos N, 2008, APPL PHYS LETT, V93, DOI 10.1063/1.3036533
   Catherine C.B., 2003, J PHYS D, V36, pR198, DOI 10.1088/0022-3727/36/13/203
   Dreyer M., 2000, IEEE T MAGN, V6, P2975
   Gao L, 2004, IEEE T MAGN, V40, P2194, DOI 10.1109/TMAG.2004.829173
   Hartmann U, 1999, ANNU REV MATER SCI, V29, P53, DOI 10.1146/annurev.matsci.29.1.53
   Litvinov D, 2002, APPL PHYS LETT, V81, P1878, DOI 10.1063/1.1506008
   MARTIN Y, 1987, APPL PHYS LETT, V50, P1455, DOI 10.1063/1.97800
   Meng H, 2011, J APPL PHYS, V110, DOI 10.1063/1.3611426
   Piramanayagam SN, 2011, J APPL PHYS, V109, DOI 10.1063/1.3551733
   Piramanayagam SN, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2175463
   Richter HJ, 2007, J PHYS D APPL PHYS, V40, pR149, DOI 10.1088/0022-3727/40/9/R01
   RUGAR D, 1990, J APPL PHYS, V68, P1169, DOI 10.1063/1.346713
   SAENZ JJ, 1987, J APPL PHYS, V62, P4293
   Sbiaa R, 2007, RECENT PAT NANOTECH, V1, P29, DOI 10.2174/187221007779814754
   Tavakkoli K, 2011, J VAC SCI TECHNOL B, VB 29
   Terris BD, 2007, MICROSYST TECHNOL, V13, P189, DOI 10.1007/s00542-006-0144-9
   Wu YH, 2003, APPL PHYS LETT, V82, P1748, DOI 10.1063/1.1560863
NR 17
TC 4
Z9 4
U1 0
U2 11
PU WILEY-V C H VERLAG GMBH
PI WEINHEIM
PA BOSCHSTRASSE 12, D-69469 WEINHEIM, GERMANY
SN 1862-6254
J9 PHYS STATUS SOLIDI-R
JI Phys. Status Solidi-Rapid Res. Lett.
PD MAR
PY 2012
VL 6
IS 3
BP 141
EP 143
DI 10.1002/pssr.201105537
PG 3
WC Materials Science, Multidisciplinary; Physics, Applied; Physics,
   Condensed Matter
SC Materials Science; Physics
GA 898UV
UT WOS:000300768700021
ER

PT J
AU Wang, YC
   Sharma, P
   Makino, A
AF Wang, Yaocen
   Sharma, Parmanand
   Makino, Akihiro
TI Magnetization reversal in a preferred oriented (111) L1(0) FePt grown on
   a soft magnetic metallic glass for tilted magnetic recording
SO JOURNAL OF PHYSICS-CONDENSED MATTER
LA English
DT Article
ID HIGH AREAL DENSITY; PERPENDICULAR MEDIA; L1(0)-ORDERED FEPT; SWITCHING
   FIELD; COMPOSITE MEDIA; THIN-FILM
AB L1(0) FePt is an important material for the fabrication of high density perpendicular recording media, but the ultrahigh coercivity of L1(0) FePt restricts its use. Tilting of the magnetic easy axis and the introduction of a soft magnetic underlayer can solve this problem. However, high temperature processing and the requirement of epitaxial growth conditions for obtaining an L1(0) FePt phase are the main hurdles to be overcome. Here, we introduce a bilayered magnetic structure ((111) L1(0) FePt/glassy Fe71Nb4Hf3Y2B20/SiO2/Si) in which the magnetic easy axis of L1(0) FePt is tilted by similar to 36 degrees from the film plane and epitaxial growth conditions are not required. The soft magnetic underlayer not only promotes the growth of L1(0) FePt with the preferred orientation but also provides an easy cost-effective micro/nanopatterning of recording bits. A detailed magnetic characterization of the bilayered structure in which the thickness of (111) L1(0) FePt with the soft magnetic Fe71Nb4Hf3Y2B20 glassy underlayer varied from 5 to 60 nm is carried out in an effort to understand the magnetization switching mechanism. The magnetization switching behavior is almost the same for bilayered structures in which FePt layer thickness is >10 nm (greater than the domain wall thickness of FePt). For FePt film similar to 10 nm thick, magnetization reversal takes place in a very narrow field range. Magnetization reversal first takes place in the soft magnetic underlayer. On further increase in the reverse magnetic field, the domain wall in the soft magnetic layer compresses at the interface of the hard and soft layers. Once the domain wall energy becomes sufficiently large to overcome the nucleation energy of the domain wall in L1(0) FePt, the magnetization of the whole bilayer is reversed. This process takes place quickly because the domain walls in the hard layer do not need to move, and the formation of a narrower domain wall may not be favorable energetically. Our results showed that the present bilayered structure is very promising for the fabrication of tilted bit-patterned magnetic recording media.
C1 [Wang, Yaocen; Sharma, Parmanand; Makino, Akihiro] Tohoku Univ, Inst Mat Res, Sendai, Miyagi 9808577, Japan.
RP Wang, YC (reprint author), Tohoku Univ, Inst Mat Res, Sendai, Miyagi 9808577, Japan.
EM sharmap@imr.tohoku.ac.jp
RI Sharma, Parmanand/C-1518-2011; MAKINO, AKIHIRO/B-2549-2009; Wang,
   Yaocen/A-8186-2015
OI Wang, Yaocen/0000-0002-9773-737X
FU Ministry of Economy, Trade and Industry (METI); JSPS; GCOE at Tohoku
   University
FX This work was supported by the Ministry of Economy, Trade and Industry
   (METI), a 'Grant-in-Aid for Young Scientist A/B' from JSPS, and the GCOE
   program at Tohoku University. The authors thank Ms K Takenaka for help
   with nanoimprinting experiments and Dr N Nishiyama for allowing us to
   use the nanoimprinting machine.
CR Albrecht M, 2005, NAT MATER, V4, P203, DOI 10.1038/nmat1324
   Alexandrakis V, 2011, J APPL PHYS, V109, DOI 10.1063/1.3556773
   Berger A, 2006, J APPL PHYS, V99, DOI 10.1063/1.2164416
   Berger A, 2005, IEEE T MAGN, V41, P3178, DOI 10.1109/TMAG.2005.855285
   Bublat T, 2010, J APPL PHYS, V108, DOI 10.1063/1.3512906
   Carbucicchio M, 2010, J MAGN MAGN MATER, V322, P1307, DOI 10.1016/j.jmmm.2009.04.028
   Casoli F, 2009, APPL PHYS LETT, V92
   Chen YJ, 2010, IEEE T MAGN, V46, P1990, DOI 10.1109/TMAG.2010.2043064
   Cumpson SR, 1996, J MAGN MAGN MATER, V154, P382, DOI 10.1016/0304-8853(95)00647-8
   Dannenberg A, 2009, PHYS REV B, V80, DOI 10.1103/PhysRevB.80.245438
   Deakin T, 2009, IEEE T MAGN, V45, P856, DOI 10.1109/TMAG.2008.2010654
   Dobin AY, 2006, APPL PHYS LETT, V89, DOI 10.1063/1.2335590
   Emura M, 2000, J APPL PHYS, V87, P1387, DOI 10.1063/1.372025
   Gao KZ, 2002, IEEE T MAGN, V38, P3675, DOI 10.1109/TMAG.2002.804801
   Goll D, 2009, APPL PHYS LETT, V94, DOI 10.1063/1.3078286
   Guan LJ, 2003, J APPL PHYS, V93, P7735, DOI 10.1063/1.1557969
   Guo VW, 2009, IEEE T MAGN, V45, P2686, DOI 10.1109/TMAG.2009.2018640
   Hellwig O, 2007, APPL PHYS LETT, V90, DOI 10.1063/1.2730744
   Hinzke D, 2008, PHYS REV B, V77, DOI 10.1103/PhysRevB.77.094407
   Honda N, 2011, INTERMAG, pAU
   HOSHI Y, 1988, IEEE T MAGN, V24, P3015, DOI 10.1109/20.92319
   Iwasaki SI, 2009, P JPN ACAD B-PHYS, V85, P37, DOI 10.2183/pjab/85.37
   Kaushik N, 2010, APPL PHYS LETT, V97, DOI 10.1063/1.3479054
   Klemmer TJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2198009
   Kohda M, 2008, JPN J APPL PHYS, V47, P3269, DOI 10.1143/JJAP.47.3269
   Krone P, 2010, J APPL PHYS, V108, DOI 10.1063/1.3457037
   Laenens B, 2010, PHYS REV B, V82, DOI 10.1103/PhysRevB.82.104421
   Long ZL, 2009, MATER SCI ENG B-ADV, V164, P1, DOI 10.1016/j.mseb.2009.04.010
   Ma B, 2011, J APPL PHYS, V109, DOI 10.1063/1.3569845
   Makarov D, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3309417
   Pellicelli R, 2008, PHYS REV B, V78, DOI 10.1103/PhysRevB.78.184434
   RICHTER HJ, 1993, IEEE T MAGN, V29, P2258, DOI 10.1109/20.231630
   Sharma P, 2002, APPL PHYS LETT, V80, P553, DOI 10.1063/1.1445480
   Sharma P, 2007, NANOTECHNOLOGY, V18, DOI 10.1088/0957-4484/18/3/035302
   Sharma P, 2006, J APPL PHYS, V100, DOI 10.1063/1.2359142
   Sharma P, 2011, J APPL PHYS, V109, DOI 10.1063/1.3561803
   Shima T, 2006, J APPL PHYS, V99, DOI 10.1063/1.2169878
   Shima T, 2002, APPL PHYS LETT, V81, P1050, DOI 10.1063/1.1498504
   Suess D, 2009, J MAGN MAGN MATER, V321, P545, DOI 10.1016/j.jmmm.2008.06.041
   Sun AC, 2009, IEEE T MAGN, V45, P2709, DOI 10.1109/TMAG.2009.2018649
   Suzuki T, 2003, IEEE T MAGN, V39, P691, DOI 10.1109/TMAG.2003.808995
   Tsai JL, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3293444
   Victora RH, 2005, IEEE T MAGN, V41, P537, DOI 10.1109/TMAG.2004.838075
   Wang F, 2011, MATER CHEM PHYS, V126, P843, DOI 10.1016/j.matchemphys.2010.12.031
   Wang H, 2011, J APPL PHYS, V109, DOI 10.1063/1.3562453
   Wang JP, 2003, IEEE T MAGN, V39, P1930, DOI 10.1109/TMAG.2003.813775
   Weller D, 2000, IEEE T MAGN, V36, P10, DOI 10.1109/20.824418
   Zha CL, 2009, APPL PHYS LETT, V94, DOI 10.1063/1.3123003
   Zheng YF, 2002, J APPL PHYS, V91, P8007, DOI 10.1063/1.1456416
   Zou YY, 2003, APPL PHYS LETT, V82, P2473, DOI 10.1063/1.1565503
NR 50
TC 11
Z9 11
U1 1
U2 24
PU IOP PUBLISHING LTD
PI BRISTOL
PA TEMPLE CIRCUS, TEMPLE WAY, BRISTOL BS1 6BE, ENGLAND
SN 0953-8984
J9 J PHYS-CONDENS MAT
JI J. Phys.-Condes. Matter
PD FEB 22
PY 2012
VL 24
IS 7
AR 076004
DI 10.1088/0953-8984/24/7/076004
PG 10
WC Physics, Condensed Matter
SC Physics
GA 893XH
UT WOS:000300390500021
PM 22293096
ER

PT J
AU Dong, Q
   Li, GJ
   Ho, CL
   Faisal, M
   Leung, CW
   Pong, PWT
   Liu, K
   Tang, BZ
   Manners, I
   Wong, WY
AF Dong, Qingchen
   Li, Guijun
   Ho, Cheuk-Lam
   Faisal, Mahtab
   Leung, Chi-Wah
   Pong, Philip Wing-Tat
   Liu, Kun
   Tang, Ben-Zhong
   Manners, Ian
   Wong, Wai-Yeung
TI A Polyferroplatinyne Precursor for the Rapid Fabrication of
   L10-FePt-type Bit Patterned Media by Nanoimprint Lithography
SO ADVANCED MATERIALS
LA English
DT Article
DE metallopolymers; FePt nanoparticles; bit patterned media; nanoimprint
   lithography; magnetic data recording
ID FERROMAGNETIC FEPT NANOPARTICLES; MAGNETIC NANOPARTICLES; ARRAYS; PITCH;
   FUTURE
C1 [Li, Guijun; Pong, Philip Wing-Tat] Univ Hong Kong, Dept Elect & Elect Engn, Hong Kong, Hong Kong, Peoples R China.
   [Dong, Qingchen; Ho, Cheuk-Lam; Wong, Wai-Yeung] Hong Kong Baptist Univ, Dept Chem, Inst Mol Funct Mat, Hong Kong, Hong Kong, Peoples R China.
   [Faisal, Mahtab; Tang, Ben-Zhong] Hong Kong Univ Sci & Technol, Dept Chem, Hong Kong, Hong Kong, Peoples R China.
   [Leung, Chi-Wah] Hong Kong Polytech Univ, Dept Appl Phys, Hong Kong, Hong Kong, Peoples R China.
   [Liu, Kun] Univ Toronto, Dept Chem, Toronto, ON M5S 3H6, Canada.
   [Manners, Ian] Univ Bristol, Sch Chem, Bristol BS8 1TS, Avon, England.
RP Pong, PWT (reprint author), Univ Hong Kong, Dept Elect & Elect Engn, Pokfulam Rd, Hong Kong, Hong Kong, Peoples R China.
EM ppong@eee.hku.hk; Ian.Manners@bristol.ac.uk; rwywong@hkbu.edu.hk
RI Leung, Chi Wah (Dennis)/D-2085-2012; Liu, Kun/H-9600-2013; Li,
   Guijun/N-6865-2013; Paquette, Joseph/O-4271-2015
OI Leung, Chi Wah (Dennis)/0000-0003-0083-6273; Manners,
   Ian/0000-0002-3794-967X; Li, Guijun/0000-0001-6259-3209; Paquette,
   Joseph/0000-0001-6023-5125; Cheuk Lam, Ho/0000-0001-8596-0307;
   Wai-Yeung, Wong/0000-0002-9949-7525
FU Hong Kong Research Grants Council [HKBU202508, HKUST2/CRF/10];
   University Grants Committee [AoE/P-03/08]; Hong Kong Baptist University
   of Hong Kong SAR [FRG2/09-10/091]
FX Q.C. Dong and G. J. Li contributed equally to this work. We acknowledge
   the financial support from the Hong Kong Research Grants Council
   (HKBU202508 and HKUST2/CRF/10), Areas of Excellence Scheme from the
   University Grants Committee (AoE/P-03/08) and a FRG grant from Hong Kong
   Baptist University of Hong Kong SAR (FRG2/09-10/091).
CR Austin MD, 2004, APPL PHYS LETT, V84, P5299, DOI 10.1063/1.1766071
   Austin MD, 2005, NANOTECHNOLOGY, V16, P1058, DOI 10.1088/0957-4484/16/8/010
   Bublat T, 2011, NANOTECHNOLOGY, V22, DOI 10.1088/0957-4484/22/31/315301
   Capobianchi A, 2009, CHEM MATER, V21, P2007, DOI 10.1021/cm9003992
   Catchpole KR, 2008, OPT EXPRESS, V16, P21793, DOI 10.1364/OE.16.021793
   Clendenning SB, 2004, ADV MATER, V16, P215, DOI 10.1002/adma.200305740
   CRANGLE J, 1962, PHILOS MAG, V7, P207, DOI 10.1080/14786436208211855
   Englert BC, 2005, CHEM-EUR J, V11, P995, DOI 10.1002/chem.200400921
   Frey NA, 2009, CHEM SOC REV, V38, P2532, DOI 10.1039/b815548h
   Guo LJ, 2007, ADV MATER, V19, P495, DOI 10.1002/adma.200600882
   Guo Q., 2004, ADV MATER, V15, P1337
   Hosaka S, 2008, MICROELECTRON ENG, V85, P774, DOI 10.1016/j.mee.2007.12.081
   Huang YH, 2011, MICROELECTRON ENG, V88, P849, DOI 10.1016/j.mee.2010.08.006
   Jim CKW, 2011, CHEM-ASIAN J, V6, P2753, DOI 10.1002/asia.201100286
   Jim KL, 2010, MICROELECTRON ENG, V87, P959, DOI 10.1016/j.mee.2009.11.141
   Kim JM, 2009, ADV MATER, V21, P906, DOI 10.1002/adma.200801620
   Liu K, 2008, ANGEW CHEM INT EDIT, V47, P1255, DOI 10.1002/anie.200703199
   Liu K, 2009, CHEM MATER, V21, P1781, DOI 10.1021/cm900164b
   McPhillips J, 2011, J PHYS CHEM C, V115, P15234, DOI 10.1021/jp203216k
   Moser A, 2002, J PHYS D APPL PHYS, V35, pR157, DOI 10.1088/0022-3727/35/19/201
   Muechlberger M., 2011, MICROELECTRON ENG, V88, P2070
   Nguyen HL, 2006, CHEM MATER, V18, P6414, DOI 10.1021/cm062127e
   Richter H. J., 2006, APPL PHYS LETT, V88, P222512
   Ruotsalainen T, 2005, ADV MATER, V17, P1048, DOI 10.1002/adma.200401530
   Srinivasan K., 2010, J APPL PHYS, V107, P033901
   Suda M, 2009, ANGEW CHEM INT EDIT, V48, P1754, DOI 10.1002/anie.200804894
   Sun S., 2000, SCIENCE, V27, P1989
   Sun SH, 2006, ADV MATER, V18, P393, DOI 10.1002/adma.200501464
   Thomson T, 2005, PHYS REV B, V72, DOI 10.1103/PhysRevB.72.064441
   Wang JP, 2008, P IEEE, V96, P1847, DOI 10.1109/JPROC.2008.2004318
   Weller D, 1999, IEEE T MAGN, V35, P4423, DOI 10.1109/20.809134
   Wellons MS, 2007, CHEM MATER, V19, P2483, DOI 10.1021/cm062455e
   Whittell GR, 2011, NAT MATER, V10, P176, DOI 10.1038/nmat2966
   Wong WY, 2007, DALTON T, P4495, DOI 10.1039/b711478h
   Xia W. X., 2009, J APPL PHYS, p[105, 013926]
NR 35
TC 68
Z9 69
U1 10
U2 82
PU WILEY-BLACKWELL
PI MALDEN
PA COMMERCE PLACE, 350 MAIN ST, MALDEN 02148, MA USA
SN 0935-9648
J9 ADV MATER
JI Adv. Mater.
PD FEB 21
PY 2012
VL 24
IS 8
BP 1034
EP 1040
DI 10.1002/adma.201104171
PG 7
WC Chemistry, Multidisciplinary; Chemistry, Physical; Nanoscience &
   Nanotechnology; Materials Science, Multidisciplinary; Physics, Applied;
   Physics, Condensed Matter
SC Chemistry; Science & Technology - Other Topics; Materials Science;
   Physics
GA 894ST
UT WOS:000300447900003
PM 22290721
ER

PT J
AU Kaganovskiy, L
   Khizroev, S
   Litvinov, D
AF Kaganovskiy, Leon
   Khizroev, Sakhrat
   Litvinov, Dmitri
TI Influence of low anisotropy inclusions on magnetization reversal in
   bit-patterned arrays
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article
ID THERMAL-STABILITY; MEDIA
AB Switching field variations due to low anisotropy inclusions in disk-shaped magnetic nanostructures with vertical magnetic anisotropy for applications in perpendicular recording bit-patterned medium are analyzed micromagnetically. The influence of various material parameters and geometry on switching field is analyzed. It is found that the size of the low anisotropy inclusion strongly affects the switching field. However, the dependence significantly weakens when inclusions' size becomes comparable to the exchange lengths, also known as domain wall thickness. The location of the inclusion within a bit has only a weak influence on the switching field. Scaling of the bit and the inclusion dimensions result in a system with very similar switching properties. The observed deviations from scalability are attributed to the presence of a non-scalable parameter of micromagnetic models, namely, the domain wall thickness, also known as exchange length. The switching field strongly depends on the bit diameter when the inclusion represents a significant fraction of the bit size-wise. The number of the inclusions in a bit has a relatively weak influence on the switching field, as one inclusion always dominates the magnetization reversal process. (C) 2012 American Institute of Physics. [doi: 10.1063/1.3679563]
C1 [Kaganovskiy, Leon] Touro Coll, Dept Math, New York, NY 11230 USA.
   [Khizroev, Sakhrat] Florida Int Univ, Miami, FL 33174 USA.
   [Litvinov, Dmitri] Univ Houston, Ctr Integrated Bio & Nano Syst, Houston, TX 77204 USA.
RP Kaganovskiy, L (reprint author), Touro Coll, Dept Math, New York, NY 11230 USA.
EM leonkag@gmail.com; khizroev@fiu.edu; litvinov@uh.edu
FU NSF [ECCS-0926027, CMMI-0927786, ECCS-0702752]; Center for Integrated
   Bio and Nanosystems
FX This research is supported in part by NSF Grants ECCS-0926027,
   CMMI-0927786, and ECCS-0702752, and with the resources of the Center for
   Integrated Bio and Nanosystems. The authors would like to thank Dr.
   Dieter Weller of Hitachi GST for fruitful discussions.
CR Albrecht M, 2002, J APPL PHYS, V91, P6845, DOI 10.1063/1.1447174
   Bertram HN, 2000, IEEE T MAGN, V36, P4, DOI 10.1109/20.824417
   Charap SH, 1997, IEEE T MAGN, V33, P978, DOI 10.1109/20.560142
   Donahue M. J., 2003, OBJECT ORIENTED MICR
   Dova P, 1999, J APPL PHYS, V85, P2775, DOI 10.1063/1.369593
   ENGEL BN, 1991, PHYS REV LETT, V67, P1910, DOI 10.1103/PhysRevLett.67.1910
   Fullerton EE, 1998, PHYS REV B, V58, P12193, DOI 10.1103/PhysRevB.58.12193
   Guo VW, 2011, J APPL PHYS, V109, DOI 10.1063/1.3558986
   Hubert R., 2008, MAGNETIC DOMAINS ANA
   Lau JW, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2822439
   Litvinov D, 2008, IEEE T NANOTECHNOL, V7, P463, DOI 10.1109/TNANO.2008.920183
   Pfau B, 2011, APPL PHYS LETT, V99, DOI 10.1063/1.3623488
   Ranjbar M, 2011, APPL PHYS LETT, V99, DOI 10.1063/1.3645634
   Rantschler J., 2008, J APPL PHYS, V103
   Shaw JM, 2007, J APPL PHYS, V101, DOI 10.1063/1.2431399
   Shaw JM, 2010, PHYS REV B, V82, DOI 10.1103/PhysRevB.82.144437
   Svedberg E., 2006, J APPL PHYS, V99
   Thomson T, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.257204
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
NR 19
TC 3
Z9 3
U1 0
U2 3
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0021-8979
J9 J APPL PHYS
JI J. Appl. Phys.
PD FEB 1
PY 2012
VL 111
IS 3
AR 033924
DI 10.1063/1.3679563
PG 5
WC Physics, Applied
SC Physics
GA 902HS
UT WOS:000301029800080
ER

PT J
AU Richter, HJ
   Lyberatos, A
   Nowak, U
   Evans, RFL
   Chantrell, RW
AF Richter, H. J.
   Lyberatos, A.
   Nowak, U.
   Evans, R. F. L.
   Chantrell, R. W.
TI The thermodynamic limits of magnetic recording
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article
ID PATTERNED MEDIA
AB Thermal stability of the recorded information is generally thought to set the limit of the maximum possible density in magnetic recording. It is shown that basic thermodynamics always cause the probability of success of the write process to be less than 100%. This leads to a thermally induced error rate, which eventually limits the maximum possible density beyond that given by the traditional thermal stability limit. While the thermally induced error rate is negligible for recording of simple single domain particles, it rapidly increases in the presence of a write assist, in particular if the write assist is accomplished by an increased recording temperature. For the ultimate recording system that combines thermally assisted writing with a recording scheme that uses one grain per bit, the upper bound for the maximum achievable density is 20 Tbit/inch(2) for a bit error rate target of 10(-2). (C) 2012 American Institute of Physics. [doi:10.1063/1.3681297]
C1 [Richter, H. J.] Hitachi Global Storage Technol, Res, San Jose, CA 95135 USA.
   [Lyberatos, A.] Univ Crete, GR-71003 Iraklion, Greece.
   [Nowak, U.] Univ Konstanz, D-78457 Constance, Germany.
   [Evans, R. F. L.; Chantrell, R. W.] Univ York, Dept Phys, York YO10 5DD, N Yorkshire, England.
RP Richter, HJ (reprint author), Hitachi Global Storage Technol, Res, 3403 Yerba Buena Rd, San Jose, CA 95135 USA.
EM hans.richter@hitachigst.com
RI Evans, Richard/F-4230-2010; Chantrell, Roy/J-9898-2015
OI Evans, Richard/0000-0002-2378-8203; Chantrell, Roy/0000-0001-5410-5615
CR BEAN CP, 1955, J APPL PHYS, V26, P1381, DOI 10.1063/1.1721912
   Chubykalo-Fesenko O, 2006, PHYS REV B, V74, DOI 10.1103/PhysRevB.74.094436
   Dobin AY, 2006, APPL PHYS LETT, V89, DOI 10.1063/1.2335590
   Hinzke D, 2008, PHYS REV B, V77, DOI 10.1103/PhysRevB.77.094407
   Hughes G., 2001, PHYS ULTRAHIGH DENSI
   Kryder MH, 2008, P IEEE, V96, P1810, DOI 10.1109/JPROC.2008.2004315
   Lu ZH, 2007, IEEE T MAGN, V43, P2941, DOI 10.1109/TMAG.2007.893630
   Lyberatos A, 2003, J APPL PHYS, V94, P1119, DOI 10.1063/1.1585118
   Morrish A. H., 2001, PHYS PRINCIPLES MAGN
   Mryasov ON, 2005, EUROPHYS LETT, V69, P805, DOI 10.1209/epl/i2004-10404-2
   Okamoto S, 2002, PHYS REV B, V66, DOI 10.1103/PhysRevB.66.024413
   Richter HJ, 2007, J PHYS D APPL PHYS, V40, pR149, DOI 10.1088/0022-3727/40/9/R01
   Richter HJ, 2006, J APPL PHYS, V99, DOI 10.1063/1.2167635
   Richter HJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2209179
   Richter HJ, 1999, IEEE T MAGN, V35, P2790, DOI 10.1109/20.800987
   Ruigrok JJM, 2000, J APPL PHYS, V87, P5398, DOI 10.1063/1.373356
   Sendur K, 2009, APPL PHYS LETT, V94, DOI 10.1063/1.3073049
   Shima T., 2004, APPL PHYS LETT, V85, P1381
   Stipe BC, 2010, NAT PHOTONICS, V4, P484, DOI 10.1038/nphoton.2010.90
   STONER EC, 1948, PHILOS TR R SOC S-A, V240, P599, DOI 10.1098/rsta.1948.0007
   Suess D, 2006, APPL PHYS LETT, V89, DOI 10.1063/1.2347894
   Suess D, 2005, APPL PHYS LETT, V87, DOI 10.1063/1.1951053
   Thiele JU, 2002, J APPL PHYS, V91, P6595, DOI 10.1063/1.1470254
   Victora RH, 2005, IEEE T MAGN, V41, P537, DOI 10.1109/TMAG.2004.838075
   Weller D, 2006, ADVANCED MAGNETIC NANOSTRUCTURES, P295, DOI 10.1007/0-387-23316-4_11
   Weller D, 1999, IEEE T MAGN, V35, P4423, DOI 10.1109/20.809134
   West F.G., 1961, Journal of Applied Physics, V32, p249S, DOI 10.1063/1.2000423
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
NR 28
TC 27
Z9 27
U1 0
U2 19
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0021-8979
J9 J APPL PHYS
JI J. Appl. Phys.
PD FEB 1
PY 2012
VL 111
IS 3
AR 033909
DI 10.1063/1.3681297
PG 9
WC Physics, Applied
SC Physics
GA 902HS
UT WOS:000301029800065
ER

PT J
AU Chen, YJ
   Huang, TL
   Shi, JZ
   Deng, J
   Ding, J
   Li, WM
   Leong, SH
   Zong, BY
   Ko, HYY
   Hu, SB
   Zhao, JM
AF Chen, Y. J.
   Huang, T. L.
   Shi, J. Z.
   Deng, J.
   Ding, J.
   Li, W. M.
   Leong, S. H.
   Zong, B. Y.
   Ko, Hnin Yu Yu
   Hu, S. B.
   Zhao, J. M.
TI Individual bit island reversal and switching field distribution in
   perpendicular magnetic bit patterned media
SO JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
LA English
DT Article; Proceedings Paper
CT 9th Perpendicular Magnetic Recording Conference (PMRC)
CY MAY 17-19, 2010
CL Sendai, JAPAN
DE Switching field distribution; Bit patterned media; Magnetic force
   microscopy; Magnetic recording
ID FOCUSED ION-BEAM; RECORDING PERFORMANCE
AB The switching of single bit magnetic islands in bit patterned media (BPM) for two cases with 10 times difference in coercivity, as well as the switching field distribution (SFD) of the islands, has been studied using magnetic force microscopy (MFM) measurements. The intrinsic SFD is measured to be similar to 9-11% of the remanence coercivity (H(cr)), which contributes only similar to 20-50% of the total SFD broadening (similar to 23-41% of H(cr)). High resolution MFM observations clearly showed the influence of surrounding islands on the switching behaviour and switching fields of individual bit islands, resulting in significant contributions in SFD broadening due to non-intrinsic dipolar interactions. It was further observed that single magnetic islands could be switched within a very narrow switching field range as small as 4 Oe, which indicates very sharp and uniform switching for each individual island of BPM. (C) 2010 Elsevier B.V. All rights reserved.
C1 [Chen, Y. J.; Huang, T. L.; Shi, J. Z.; Leong, S. H.; Zong, B. Y.; Ko, Hnin Yu Yu; Hu, S. B.; Zhao, J. M.] ASTAR, Data Storage Inst, Singapore 117608, Singapore.
   [Deng, J.] ASTAR, IMRE, Singapore 117602, Singapore.
   [Ding, J.; Li, W. M.] Natl Univ Singapore, Dept Mat Sci & Engn, Singapore 117574, Singapore.
RP Chen, YJ (reprint author), ASTAR, Data Storage Inst, Singapore 117608, Singapore.
EM CHEN_Yunjie@dsi.a-star.edu.sg
RI Zong, Bao-Yu/E-6910-2012; Li, Weimin/J-8818-2012; Ding, Jun/C-5172-2011
OI Zong, BaoYu/0000-0003-2025-1395
CR Berger A, 2005, IEEE T MAGN, V41, P3178, DOI 10.1109/TMAG.2005.855285
   Chen YJ, 2008, APPL PHYS LETT, V93, DOI 10.1063/1.2978326
   Chen YJ, 2009, J APPL PHYS, V105, DOI 10.1063/1.3070637
   Chen YJ, 2005, IEEE T MAGN, V41, P2195, DOI 10.1109/TMAG.2005.847627
   CHEN YJ, 2010, IEEE T MAGN, V46
   Hellwig O, 2007, APPL PHYS LETT, V90, DOI 10.1063/1.2730744
   Pang BSH, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2169851
   Rettner CT, 2002, IEEE T MAGN, V38, P1725, DOI 10.1109/TMAG.2002.1017763
   Richter HJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2209179
   Ross C, 2001, ANN REV MATER RES, V31, P203, DOI 10.1146/annurev.matsci.31.1.203
   TAGAWA I, 1991, IEEE T MAGN, V27, P4975, DOI 10.1109/20.278712
   Thomson T, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.257204
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
NR 13
TC 9
Z9 10
U1 1
U2 10
PU ELSEVIER SCIENCE BV
PI AMSTERDAM
PA PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
SN 0304-8853
J9 J MAGN MAGN MATER
JI J. Magn. Magn. Mater.
PD FEB
PY 2012
VL 324
IS 3
BP 264
EP 268
DI 10.1016/j.jmmm.2010.11.094
PG 5
WC Materials Science, Multidisciplinary; Physics, Condensed Matter
SC Materials Science; Physics
GA 841CT
UT WOS:000296490800006
ER

PT J
AU Bashir, MA
   Schrefl, T
   Dean, J
   Goncharov, A
   Hrkac, G
   Allwood, DA
   Suess, D
AF Bashir, M. A.
   Schrefl, T.
   Dean, J.
   Goncharov, A.
   Hrkac, G.
   Allwood, D. A.
   Suess, D.
TI Head and bit patterned media optimization at areal densities of 2.5
   Tbit/in(2) and beyond
SO JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
LA English
DT Article; Proceedings Paper
CT 9th Perpendicular Magnetic Recording Conference (PMRC)
CY MAY 17-19, 2010
CL Sendai, JAPAN
DE Head optimization; Bit patterned media; Bit error rate; Adjacent track
   erasure
ID COUPLED COMPOSITE MEDIA; POLE-TYPE HEAD; TOPOLOGY OPTIMIZATION; DAMPING
   CONSTANT; WRITE HEADS; RISE-TIME; DESIGN; FIELD; TB/IN(2); MAGNETIZATION
AB Global optimization of writing head is performed using micromagnetics and surrogate optimization. The shape of the pole tip is optimized for bit patterned, exchange spring recording media. The media characteristics define the effective write field and the threshold values for the head field that acts at islands in the adjacent track. Once the required head field characteristics are defined, the pole tip geometry is optimized in order to achieve a high gradient of the effective write field while keeping the write field at the adjacent track below a given value. We computed the write error rate and the adjacent track erasure for different maximum anisotropy in the multilayer, graded media. The results show a linear trade off between the error rate and the number of passes before erasure. For optimal head media combinations we found a bit error rate of 10(-6) with 10(8) pass lines before erasure at 2.5 Tbit/in(2). Crown Copyright (C) 2010 Published by Elsevier B.V. All rights reserved.
C1 [Bashir, M. A.; Schrefl, T.; Dean, J.; Goncharov, A.; Hrkac, G.; Allwood, D. A.] Univ Sheffield, Dept Mat Sci & Engn, Sheffield S1 3JD, S Yorkshire, England.
   [Schrefl, T.] St Poelten Univ Appl Sci, St Polten, Austria.
   [Suess, D.] Vienna Univ Technol, Inst Solid State Phys, A-1060 Vienna, Austria.
RP Bashir, MA (reprint author), Univ Sheffield, Dept Mat Sci & Engn, Sheffield S1 3JD, S Yorkshire, England.
EM m.bashir@sheffield.ac.uk
RI Suess, Dieter/H-7475-2012
OI Suess, Dieter/0000-0001-5453-9974; Dean, Julian/0000-0001-7234-1822;
   Hrkac, Gino/0000-0001-7284-135X
CR Bai DZ, 2010, IEEE T MAGN, V46, P722, DOI 10.1109/TMAG.2009.2034753
   Bai DZ, 2003, J APPL PHYS, V93, P6540, DOI 10.1063/1.1557935
   Bashir MA, 2009, IEEE T MAGN, V45, P3851, DOI 10.1109/TMAG.2009.2023621
   Bashir MA, 2008, IEEE T MAGN, V44, P3519, DOI 10.1109/TMAG.2008.2002601
   Dean J, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2905292
   DENNIS HP, 2003, P AMSE TURB EXP 2003
   Dittrich R., 2002, J MAGN MAGN MATER, V250, P12, DOI 10.1016/S0304-8853(02)00388-8
   Ertl O, 2005, J MAGN MAGN MATER, V290, P518, DOI 10.1016/j.jmmm.2004.11.516
   Feng XB, 2001, J APPL PHYS, V89, P6988, DOI 10.1063/1.1355328
   Fujita N, 2008, J MAGN MAGN MATER, V320, P3019, DOI 10.1016/j.jmmm.2008.08.012
   Gao KZ, 2009, J MAGN MAGN MATER, V321, P495, DOI 10.1016/j.jmmm.2008.05.025
   *GID, PERS PRE POST PROC
   Goncharov A, 2007, APPL PHYS LETT, V91, DOI 10.1063/1.2804609
   Greaves SJ, 2008, IEEE T MAGN, V44, P3430, DOI 10.1109/TMAG.2008.2002365
   Hahn D, 2010, IEEE T MAGN, V46, P1866, DOI 10.1109/TMAG.2009.2039922
   IWASAKI SI, 2010, PMRC
   Kanai Y, 2010, IEEE T MAGN, V46, P715, DOI 10.1109/TMAG.2009.2038354
   Kanai Y, 2009, J MAGN MAGN MATER, V321, P518, DOI 10.1016/j.jmmm.2008.05.006
   Kanai Y, 2008, IEEE T MAGN, V44, P3609, DOI 10.1109/TMAG.2008.2002409
   Khizroev S, 2004, J APPL PHYS, V95, P4521, DOI 10.1063/1.1695092
   Kryder MH, 2005, J MAGN MAGN MATER, V287, P449, DOI 10.1016/j.jmmm.2004.10.075
   Muraoka Hiroaki, 2008, IEEE Transactions on Magnetics, V44, P3423, DOI 10.1109/TMAG.2008.2001654
   Okamoto Y, 2006, IEEE T MAGN, V42, P1087, DOI 10.1109/TMAG.2006.871422
   Okamoto Y, 2005, IEEE T MAGN, V41, P1788, DOI 10.1109/TMAG.2005.845985
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Richter HJ, 1999, IEEE T MAGN, V35, P2790, DOI 10.1109/20.800987
   Rottmayer RE, 2006, IEEE T MAGN, V42, P2417, DOI 10.1109/TMAG.2006.879572
   Scholz W, 2005, IEEE T MAGN, V41, P702, DOI 10.1109/TMAG.2004.839071
   Scholz W, 2003, COMP MATER SCI, V28, P366, DOI 10.1016/S0927-0256(03)00119-8
   Scholz W, 2008, J APPL PHYS, V103, DOI 10.1063/1.2838332
   SCHREFL T, 2009, TMRC B, V3
   SCHREFL T, 2008, APPL COMP C IST TURK, P430
   SCHREFL T, 2007, HDB MAGNETISM ADV MA, P794
   Shen X, 2007, IEEE T MAGN, V43, P2172, DOI 10.1109/TMAG.2007.893132
   Suess D, 2005, J MAGN MAGN MATER, V290, P551, DOI 10.1016/j.jmmm.2004.11.525
   Suess D, 2007, PHYS REV B, V75, DOI 10.1103/PhysRevB.75.174430
   Suess D, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2908052
   Suess D, 2005, APPL PHYS LETT, V87, DOI 10.1063/1.1951053
   Thirion C, 2003, NAT MATER, V2, P524, DOI 10.1038/nmat946
   Victora RH, 2005, IEEE T MAGN, V41, P537, DOI 10.1109/TMAG.2004.838075
   Wang JP, 2005, IEEE T MAGN, V41, P3181, DOI 10.1109/TMAG.2005.855278
   Winkler G, 2009, APPL PHYS LETT, V94, DOI 10.1063/1.3152293
   Wood R, 2009, IEEE T MAGN, V45, P917, DOI 10.1109/TMAG.2008.2010676
   Zhu JG, 2008, IEEE T MAGN, V44, P125, DOI 10.1109/TMAG.2007.911031
NR 44
TC 4
Z9 4
U1 0
U2 11
PU ELSEVIER SCIENCE BV
PI AMSTERDAM
PA PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
SN 0304-8853
J9 J MAGN MAGN MATER
JI J. Magn. Magn. Mater.
PD FEB
PY 2012
VL 324
IS 3
BP 269
EP 275
DI 10.1016/j.jmmm.2010.11.081
PG 7
WC Materials Science, Multidisciplinary; Physics, Condensed Matter
SC Materials Science; Physics
GA 841CT
UT WOS:000296490800007
ER

PT J
AU Zhang, KM
   Wei, D
AF Zhang, Kaiming
   Wei, Dan
TI Micromagnetic studies for bit patterned media above 2 Tbit/in.(2)
SO JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
LA English
DT Article; Proceedings Paper
CT 9th Perpendicular Magnetic Recording Conference (PMRC)
CY MAY 17-19, 2010
CL Sendai, JAPAN
DE Bit patterned medium; Micromagnetic; Ion irradiation; Magnetic property;
   Phase diagram; Write-in
ID IRRADIATION; ANISOTROPY
AB Bit patterned media (BPM) recording is a candidate for extremely high density magnetic recording. A micromagnetic model is built up to analyze the phase diagram of the correct-write-in condition in BPM above 2 Tb/in.(2) fabricated by lithography or ion irradiation methods. The target of the study is to acquire the relationship between the recording performance and the magnetic properties of the media. The medium includes the polycrystalline grains and grain boundary. In BPM fabricated by lithography with FCT structure, two phase diagrams of the correct-write-in condition are found for the anisotropy angular distribution Delta theta, the ratio of tetragonal anisotropy K-22 to uniaxial anisotropy K-1 and the uniaxial anisotropy distribution Delta K-1. In BPM fabricated by ion irradiation methods, two phase diagrams of the correct-write-in condition are analyzed for the ratio of saturation magnetization M'(s)/M-s, anisotropy field H'(k)/H-k and the exchange field H'(ex)/H-ex in the ion irradiated region and the bit islands. (C) 2010 Elsevier B.V. All rights reserved.
C1 [Zhang, Kaiming; Wei, Dan] Tsinghua Univ, Adv Mat Lab, Dept Mat Sci & Engn, Beijing 100084, Peoples R China.
RP Wei, D (reprint author), Tsinghua Univ, Adv Mat Lab, Dept Mat Sci & Engn, Beijing 100084, Peoples R China.
EM weidan@tsinghua.edu.cn
CR Chappert C, 1998, SCIENCE, V280, P1919, DOI 10.1126/science.280.5371.1919
   Degawa N, 2008, IEEE T MAGN, V44, P3434, DOI 10.1109/TMAG.2008.2002407
   Honda N, 2008, IEEE T MAGN, V44, P3438, DOI 10.1109/TMAG.2008.2002528
   Hyndman R, 2001, J APPL PHYS, V90, P3843, DOI 10.1063/1.1401803
   Li ZH, 2007, J APPL PHYS, V102, DOI 10.1063/1.2811849
   Parekh V, 2007, J APPL PHYS, V101, DOI 10.1063/1.2719018
   Richter HJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2209179
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Wei D, 1997, IEEE T MAGN, V33, P4381, DOI 10.1109/20.620450
NR 9
TC 2
Z9 2
U1 0
U2 9
PU ELSEVIER SCIENCE BV
PI AMSTERDAM
PA PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
SN 0304-8853
J9 J MAGN MAGN MATER
JI J. Magn. Magn. Mater.
PD FEB
PY 2012
VL 324
IS 3
BP 276
EP 281
DI 10.1016/j.jmmm.2010.12.013
PG 6
WC Materials Science, Multidisciplinary; Physics, Condensed Matter
SC Materials Science; Physics
GA 841CT
UT WOS:000296490800008
ER

PT J
AU Hachisu, T
   Sato, W
   Ishizuka, S
   Sugiyama, A
   Mizuno, J
   Osaka, T
AF Hachisu, Takuma
   Sato, Wataru
   Ishizuka, Shugo
   Sugiyama, Atsushi
   Mizuno, Jun
   Osaka, Tetsuya
TI Injection of synthesized FePt nanoparticles in hole-patterns for bit
   patterned media
SO JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
LA English
DT Article; Proceedings Paper
CT 9th Perpendicular Magnetic Recording Conference (PMRC)
CY MAY 17-19, 2010
CL Sendai, JAPAN
DE Bit patterned media; Synthesized FePt nanoparticle; Chemical bonding;
   Geometrical structure
ID SUPERLATTICES; NANOCUBES; SIZE
AB FePt nanoparticles of uniform sizes, compositions, and crystal structures can be obtained by chemical synthesis. Additionally, the nanoparticles can be well dispersed by the adsorption of a surfactant on the nanoparticle surface. Previously, the immobilization of FePt nanoparticles on a thermal oxide Si substrate was carried out by chemical synthesis, utilizing the Pt-S bonding between the -SH functional group in (3-mercaptopropyl)trimethoxysilane, MPTMS and Pt in FePt nanoparticles. However, controlling FePt nanoparticle arrays by this synthesis method was very difficult. In the present study, we attempted to control the distortion of the arrangement of FePt nanoparticles using an MPTMS layer modified with a silane coupling reaction and a geometrical structure prepared by ultraviolet nanoimprint lithography (UV-NIL). In this study, the hole-patterns used for the geometrical structure on Si(1 0 0) were 200 nm wide, 40 nm deep, and had a 500 nm pitch. The 5.6 nm FePt nanoparticles were used to coat the hole-patterns by using a picoliter pipette. An XHR-SEM image clearly revealed that the FePt nanoparticles were successfully arranged as a single layer with an average pitch of 10.0 nm by PL-S bonding in the hole-patterns on Si(1 0 0). (C) 2010 Elsevier B.V. All rights reserved.
C1 [Hachisu, Takuma; Sato, Wataru; Ishizuka, Shugo; Sugiyama, Atsushi; Mizuno, Jun; Osaka, Tetsuya] Waseda Univ, Fac Nanosci & Nanoengn, Grad Sch Adv Sci & Engn, Shinjuku Ku, Tokyo 1698555, Japan.
   [Hachisu, Takuma; Osaka, Tetsuya] Waseda Univ, Waseda Res Inst Sci & Engn, Shinjuku Ku, Tokyo 1698555, Japan.
RP Osaka, T (reprint author), Waseda Univ, Dept Appl Chem, Sch Adv Sci & Engn, Shinjuku Ku, Bldg 55S,Room 601,3-4-1 Okubo, Tokyo 1698555, Japan.
EM osakatets@waseda.jp
CR Bodnarchuk MI, 2010, ACS NANO, V4, P423, DOI 10.1021/nn901284f
   Chen M, 2004, J AM CHEM SOC, V126, P8394, DOI 10.1021/ja047648m
   Chen M, 2006, J AM CHEM SOC, V128, P7132, DOI 10.1021/ja061704x
   Hachisu T., 2009, ECS T, V16, P199
   Hachisu T, 2008, CHEM LETT, V37, P840, DOI 10.1246/cl.2008.840
   Hachisu T, 2010, J ELECTROCHEM SOC, V157, pD514, DOI 10.1149/1.3465631
   Jeyadevan B, 2006, IEEE T MAGN, V42, P3030, DOI 10.1109/TMAG.2006.880149
   Kang SS, 2005, APPL PHYS LETT, V86, P62503, DOI 10.1063/1.1856698
   Momose S, 2005, JPN J APPL PHYS 1, V44, P1147, DOI 10.1143/JJAP.44.1147
   Sun SH, 2006, ADV MATER, V18, P393, DOI 10.1002/adma.200501464
   Sun SH, 2000, SCIENCE, V287, P1989, DOI 10.1126/science.287.5460.1989
   Wellons MS, 2007, CHEM MATER, V19, P2483, DOI 10.1021/cm062455e
NR 12
TC 6
Z9 6
U1 3
U2 18
PU ELSEVIER SCIENCE BV
PI AMSTERDAM
PA PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
SN 0304-8853
J9 J MAGN MAGN MATER
JI J. Magn. Magn. Mater.
PD FEB
PY 2012
VL 324
IS 3
BP 303
EP 308
DI 10.1016/j.jmmm.2010.12.023
PG 6
WC Materials Science, Multidisciplinary; Physics, Condensed Matter
SC Materials Science; Physics
GA 841CT
UT WOS:000296490800012
ER

PT J
AU Akagi, F
   Mukoh, M
   Mochizuki, M
   Ushiyama, J
   Matsumoto, T
   Miyamoto, H
AF Akagi, Fumiko
   Mukoh, Masaki
   Mochizuki, Masafumi
   Ushiyama, Junko
   Matsumoto, Takuya
   Miyamoto, Harukazu
TI Thermally assisted magnetic recording with bit-patterned media to
   achieve areal recording density beyond 5 Tb/in(2)
SO JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
LA English
DT Article; Proceedings Paper
CT 9th Perpendicular Magnetic Recording Conference (PMRC)
CY MAY 17-19, 2010
CL Sendai, JAPAN
DE Thermally assisted magnetic recording; Bit-patterned medium; Effective
   head-field margin; Temperature margin; Down-track shift margin; 5
   Tb/in(2)
AB Thermally assisted magnetic recording (TAR) with bit-patterned media was investigated by micromagnetic simulation. The media were assumed to be FePt layers. The effective head-field margin as well as the increase in temperature margin and down-track shift margin was investigated. Conditions of the head and medium that lead to a recording density beyond 5 Tb/in(2) were proposed. (C) 2010 Elsevier B.V. All rights reserved.
C1 [Akagi, Fumiko; Mukoh, Masaki; Ushiyama, Junko; Matsumoto, Takuya; Miyamoto, Harukazu] Hitachi CRL, Kokubunji, Tokyo 1850086, Japan.
   [Mochizuki, Masafumi] Hitachi GST Japan, Fujisawa, Kanagawa 2528588, Japan.
RP Akagi, F (reprint author), Hitachi CRL, 1-280 Higashi Koigakubo, Kokubunji, Tokyo 1850086, Japan.
EM fumiko.akagi.dd@hitachi.com
CR AKAGI F, 2007, J APPL PHYS, V107
   CHIKAZUMI S, 1998, PHYS FERROMAGNETISM, V1, P124
   MATSUMOTO T, 2010, P 9 MMM INT BB 02 WA
   Matsumoto T, 2008, APPL PHYS LETT, V93, DOI 10.1063/1.2960344
   Miyazaki T, 2005, PHYS REV B, V72, DOI 10.1103/PhysRevB.72.144419
   Saga H, 1999, JPN J APPL PHYS 1, V38, P1839, DOI 10.1143/JJAP.38.1839
   SEIGLER MA, 2007, P TUA1 OPT DAT STOR
   STIPE BC, 2010, P 9 MMM INT WASH DC
   Takahashi Y., 2005, MAGN SOC JPN, V29, P72
   Tanahashi K, 2009, IEEE T MAGN, V45, P799, DOI 10.1109/TMAG.2008.2010634
   Thiele JU, 2002, J APPL PHYS, V91, P6595, DOI 10.1063/1.1470254
   Weller D, 1999, IEEE T MAGN, V35, P4423, DOI 10.1109/20.809134
NR 12
TC 13
Z9 13
U1 0
U2 10
PU ELSEVIER SCIENCE BV
PI AMSTERDAM
PA PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
SN 0304-8853
J9 J MAGN MAGN MATER
JI J. Magn. Magn. Mater.
PD FEB
PY 2012
VL 324
IS 3
BP 309
EP 313
DI 10.1016/j.jmmm.2010.11.082
PG 5
WC Materials Science, Multidisciplinary; Physics, Condensed Matter
SC Materials Science; Physics
GA 841CT
UT WOS:000296490800013
ER

PT J
AU Greaves, SJ
   Muraoka, H
   Kanai, Y
AF Greaves, S. J.
   Muraoka, H.
   Kanai, Y.
TI The potential of bit patterned media in shingled recording
SO JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
LA English
DT Article; Proceedings Paper
CT 9th Perpendicular Magnetic Recording Conference (PMRC)
CY MAY 17-19, 2010
CL Sendai, JAPAN
DE Shingled recording; Composite media; Bit patterned media
AB Shingled recording on continuous and bit patterned media (BPM) is compared. From a recording viewpoint, continuous media have the advantage due to the lack of a need to synchronise writing with dot position. For BPM the write windows at 4 Tbit/in(2) are only a couple of nm across, requiring extremely tight manufacturing tolerances. In readback, BPM have the higher SNR over a wide range of areal densities due to the absence of transition noise and erase bands. Significant increases in areal density could be achieved using BPM, provided dot uniformity could be maintained. (C) 2010 Elsevier B.V. All rights reserved.
C1 [Greaves, S. J.; Muraoka, H.] Tohoku Coll Pharmaceut Sci, RIEC, Aoba Ku, Sendai, Miyagi 9808577, Japan.
   [Kanai, Y.] Niigata Inst Technol, IEE, Kashiwazaki 9451195, Japan.
RP Greaves, SJ (reprint author), Tohoku Coll Pharmaceut Sci, RIEC, Aoba Ku, Katahira 2-1-1, Sendai, Miyagi 9808577, Japan.
EM simon@riec.tohoku.ac.jp
CR Cross R. W., 2010, PMRC 2010 SEND JAP
   Greaves SJ, 2008, J MAGN MAGN MATER, V320, P2889, DOI 10.1016/j.jmmm.2008.08.094
   Greaves S, 2010, IEEE T MAGN, V46, P1460, DOI 10.1109/TMAG.2010.2043221
   Greaves S, 2009, IEEE T MAGN, V45, P3823, DOI 10.1109/TMAG.2009.2021663
   Inaba Y, 2005, IEEE T MAGN, V41, P3136, DOI 10.1109/TMAG.2005.854848
   Kanai Y, 2010, IEEE T MAGN, V46, P715, DOI 10.1109/TMAG.2009.2038354
   Victora RH, 2005, IEEE T MAGN, V41, P537, DOI 10.1109/TMAG.2004.838075
   Wood R., 2009, IEEE T MAGN, V44, P917
NR 8
TC 0
Z9 0
U1 1
U2 1
PU ELSEVIER SCIENCE BV
PI AMSTERDAM
PA PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
SN 0304-8853
J9 J MAGN MAGN MATER
JI J. Magn. Magn. Mater.
PD FEB
PY 2012
VL 324
IS 3
BP 314
EP 320
DI 10.1016/j.jmmm.2010.12.017
PG 7
WC Materials Science, Multidisciplinary; Physics, Condensed Matter
SC Materials Science; Physics
GA 841CT
UT WOS:000296490800014
ER

PT J
AU Brombacher, C
   Grobis, M
   Lee, J
   Fidler, J
   Eriksson, T
   Werner, T
   Hellwig, O
   Albrecht, M
AF Brombacher, C.
   Grobis, M.
   Lee, J.
   Fidler, J.
   Eriksson, T.
   Werner, T.
   Hellwig, O.
   Albrecht, M.
TI L1(0) FePtCu bit patterned media
SO NANOTECHNOLOGY
LA English
DT Article
ID RECORDING MEDIA; MAGNETIC DOMAIN; FILMS
AB Chemically ordered 5 nm-thick L1(0) FePtCu films with strong perpendicular magnetic anisotropy were post-patterned by nanoimprint lithography into a dot array over a 3 mm-wide circumferential band on a 3 inch Si wafer. The dots with a diameter of 30 nm and a center-to-center pitch of 60 nm appear as single domain and reveal an enhanced switching field as compared to the continuous film. We demonstrate successful recording on a single track using shingled writing with a conventional hard disk drive write/read head.
C1 [Brombacher, C.; Albrecht, M.] Tech Univ Chemnitz, Inst Phys, D-09107 Chemnitz, Germany.
   [Grobis, M.; Hellwig, O.] Hitachi Global Storage Technol, San Jose Res Ctr, San Jose, CA 95135 USA.
   [Lee, J.; Fidler, J.] Vienna Univ Technol, Inst Solid State Phys, A-1040 Vienna, Austria.
   [Eriksson, T.] Obducat Technol AB, SE-20125 Malmo, Sweden.
   [Werner, T.] Fraunhofer Inst Elect Nano Syst, D-09126 Chemnitz, Germany.
RP Brombacher, C (reprint author), Tech Univ Chemnitz, Inst Phys, D-09107 Chemnitz, Germany.
EM manfred.albrecht@physik.tu-chemnitz.de
CR Albrecht M, 2002, APPL PHYS LETT, V81, P2875, DOI 10.1063/1.1512946
   Bublat T, 2011, NANOTECHNOLOGY, V22, DOI 10.1088/0957-4484/22/31/315301
   Chou SY, 1996, SCIENCE, V272, P85, DOI 10.1126/science.272.5258.85
   Eriksson T, 2011, MICROELECTRON ENG, V88, P293, DOI 10.1016/j.mee.2010.11.024
   Greaves S, 2009, IEEE T MAGN, V45, P3823, DOI 10.1109/TMAG.2009.2021663
   Grobis M, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3304166
   Hamann HF, 2004, APPL PHYS LETT, V84, P810, DOI 10.1063/1.1644924
   Hellwig O, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3293301
   KAI K, 2004, J APPL PHYS, V95, P609
   Kazakova O, 2003, IEEE T MAGN, V39, P2747, DOI 10.1109/TMAG.2003.815587
   Kim C, 2007, APPL PHYS LETT, V91, DOI 10.1063/1.2802038
   Kim H, 2011, NANOSCALE RES LETT, V6, DOI 10.1007/s11671-010-9755-2
   Kondorsky E, 1940, J PHYS-USSR, V2, P161
   Kurth F, 2010, PHYS REV B, V82, DOI 10.1103/PhysRevB.82.184404
   Lee J, 2011, APPL PHYS LETT, V99, DOI 10.1063/1.3623752
   Li BH, 2006, J PHYS D APPL PHYS, V39, P1018, DOI 10.1088/0022-3727/39/6/004
   Maeda T, 2002, APPL PHYS LETT, V80, P2147, DOI 10.1063/1.1463213
   Makarov D, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3309417
   McCallum AT, 2011, APPL PHYS LETT, V98, DOI 10.1063/1.3599573
   Moser A, 2000, IEEE T MAGN, V36, P2137, DOI 10.1109/20.908333
   NEW RMH, 1994, J VAC SCI TECHNOL B, V12, P3196, DOI 10.1116/1.587499
   Piramanayagam SN, 2009, J MAGN MAGN MATER, V321, P485, DOI 10.1016/j.jmmm.2008.05.007
   Seki T, 2006, J APPL PHYS, V100, DOI 10.1063/1.2335391
   Stipe BC, 2010, NAT PHOTONICS, V4, P484, DOI 10.1038/nphoton.2010.90
   STONER EC, 1948, PHILOS TR R SOC S-A, V240, P599, DOI 10.1098/rsta.1948.0007
   Terris BD, 2009, J MAGN MAGN MATER, V321, P512, DOI 10.1016/j.jmmm.2008.05.046
   Thiele JU, 1998, J APPL PHYS, V84, P5686, DOI 10.1063/1.368831
   Todorovic M, 1999, APPL PHYS LETT, V74, P2516, DOI 10.1063/1.123885
   Ulbrich TC, 2008, J APPL PHYS, V104, DOI 10.1063/1.3003064
   Victora RH, 2008, P IEEE, V96, P1799, DOI 10.1109/JPROC.2008.2004314
   Wang D, 2008, J PHYS D APPL PHYS, V41, DOI 10.1088/0022-3727/41/19/195008
   Weller D, 2000, IEEE T MAGN, V36, P10, DOI 10.1109/20.824418
   Yan ML, 2006, J APPL PHYS, V99, DOI 10.1063/1.2164428
   Zha CL, 2010, APPL PHYS LETT, V97, DOI 10.1063/1.3505521
NR 34
TC 14
Z9 14
U1 0
U2 10
PU IOP PUBLISHING LTD
PI BRISTOL
PA TEMPLE CIRCUS, TEMPLE WAY, BRISTOL BS1 6BE, ENGLAND
SN 0957-4484
J9 NANOTECHNOLOGY
JI Nanotechnology
PD JAN 20
PY 2012
VL 23
IS 2
AR 025301
DI 10.1088/0957-4484/23/2/025301
PG 4
WC Nanoscience & Nanotechnology; Materials Science, Multidisciplinary;
   Physics, Applied
SC Science & Technology - Other Topics; Materials Science; Physics
GA 866UB
UT WOS:000298409000002
PM 22166619
ER

PT J
AU Kang, HM
   Craig, GSW
   Han, E
   Gopalan, P
   Nealey, PF
AF Kang, Huiman
   Craig, Gordon S. W.
   Han, Eungnak
   Gopalan, Padma
   Nealey, Paul F.
TI Degree of Perfection and Pattern Uniformity in the Directed Assembly of
   Cylinder-Forming Block Copolymer on Chemically Patterned Surfaces
SO MACROMOLECULES
LA English
DT Article
ID DEVICE-ORIENTED STRUCTURES; PS-B-PMMA; DENSITY MULTIPLICATION;
   INTERFACIAL INTERACTIONS; THIN-FILMS; BOTTOM-UP; LITHOGRAPHY;
   ORIENTATION; DOMAINS; ARRAYS
AB Thin films of cylinder-forming polystyrene-b-poly(methyl methacrylate) block copolymer (PS-b-PMMA) were self-assembled on two sets of surfaces homogeneously covered with random copolymer brush composed of PS and PMMA (P(S-r-MMA)), having styrene fractions, F-SV, ranging from 0.57 to 1.0: one set that had been exposed to the lithographic materials and processes without having been patterned and one set that had not. The resulting self-assembled morphologies revealed that the lithographic process shifted the nonpreferential composition of the P(S-r-MMA) brush from F-St similar to 0.70 to F-St similar to 0.79. PS-b-PMMA films were then directed to assemble with density multiplication on chemical patterns made from P(S-r-MMA), in which the surface chemistry of the background region of the pattern after lithography ranged from weakly PMMA-preferential (WMP, F-St, = 0.70) to nonpreferential (NP, F-St, = 0.79) to weakly PS-preferential (WSP, F-St = 1.00). The extent of density multiplication ranged from 1:1 to 16:1. The assemblies were analyzed in terms of defect quantity and cylinder diameter uniformity, as observed by top-down scanning electron microscopy (SEM). In general, many fewer defects were observed for the assemblies on the WSP chemical pattern than on the WMP chemical pattern. The best assemblies occurred on the NP chemical patterns, with no defects apparent in the SEM images of assemblies with up to 4:1 density multiplication and with spot size variation sufficiently low for bit patterned media applications. As the extent of density multiplication was increased (6:1, 9:1, and 16:1), the defect density monotonically increased.
C1 [Kang, Huiman; Craig, Gordon S. W.; Nealey, Paul F.] Univ Wisconsin, Dept Chem & Biol Engn, Madison, WI 53706 USA.
   [Han, Eungnak; Gopalan, Padma] Univ Wisconsin, Dept Mat Sci & Engn, Madison, WI 53706 USA.
RP Nealey, PF (reprint author), Univ Wisconsin, Dept Chem & Biol Engn, 1415 Engn Dr, Madison, WI 53706 USA.
EM nealey@engr.wisc.edu
FU Semiconductor Research Corporation [2008-OJ-1674.002]; NSF UW Nanoscale
   Science and Engineering Center [DMR-0425880]
FX This work was supported by the Semiconductor Research Corporation
   (2008-OJ-1674.002) and the NSF UW Nanoscale Science and Engineering
   Center (DMR-0425880).
CR Bosworth JK, 2008, ACS NANO, V2, P1396, DOI 10.1021/nn8001505
   Cheng JY, 2008, ADV MATER, V20, P3155, DOI 10.1002/adma.200800826
   Cheng JY, 2010, ACS NANO, V4, P4815, DOI 10.1021/nn100686v
   Cheng JY, 2006, ADV MATER, V18, P2505, DOI 10.1002/adma.200502651
   Craig GSW, 2007, J VAC SCI TECHNOL B, V25, P1969, DOI 10.1116/1.2801888
   Detcheverry FA, 2010, MACROMOLECULES, V43, P3446, DOI 10.1021/ma902332h
   Edwards EW, 2004, ADV MATER, V16, P1315, DOI 10.1002/adma.200400763
   Han E, 2008, MACROMOLECULES, V41, P9090, DOI 10.1021/ma8018393
   Han E, 2009, MACROMOLECULES, V42, P4896, DOI 10.1021/ma9002903
   Hawker CJ, 2005, MRS BULL, V30, P952, DOI 10.1557/mrs2005.249
   Kang H. M., 2010, J VAC SCI TECHNOL B, V28, pC6B24
   Kim SO, 2007, ADV MATER, V19, P3271, DOI 10.1002/adma.200700957
   Liu CC, 2011, MACROMOLECULES, V44, P1876, DOI 10.1021/ma102856t
   Liu CC, 2010, J POLYM SCI POL PHYS, V48, P2589, DOI 10.1002/polb.22114
   Liu GL, 2010, ADV FUNCT MATER, V20, P1251, DOI 10.1002/adfm.200902229
   Mansky P, 1997, SCIENCE, V275, P1458, DOI 10.1126/science.275.5305.1458
   NEALEY PF, 2005, IEEE IEDM, P356, DOI 10.1109/IEDM.2005.1609349
   Park M, 1997, SCIENCE, V276, P1401, DOI 10.1126/science.276.5317.1401
   Park SM, 2007, MACROMOLECULES, V40, P5084, DOI 10.1021/ma0702344
   Park SH, 2010, SOFT MATTER, V6, P120, DOI 10.1039/b913853f
   Park S, 2009, SCIENCE, V323, P1030, DOI 10.1126/science.1168108
   Richter HJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2209179
   Ross CA, 2008, MRS BULL, V33, P838, DOI 10.1557/mrs2008.179
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Ryu DY, 2009, MACROMOLECULES, V42, P4902, DOI 10.1021/ma900110w
   Stoykovich MP, 2007, ACS NANO, V1, P168, DOI 10.1021/nn700164p
   Stoykovich MP, 2006, MATER TODAY, V9, P20, DOI 10.1016/S1369-7021(06)71619-4
   Stoykovich MP, 2010, MACROMOLECULES, V43, P2334, DOI 10.1021/ma902494v
   Stoykovich MP, 2005, SCIENCE, V308, P1442, DOI 10.1126/science.1111041
   Tada Y, 2009, POLYMER, V50, P4250, DOI 10.1016/j.polymer.2009.06.039
   Tada Y, 2008, MACROMOLECULES, V41, P9267, DOI 10.1021/ma801542y
   Wilmes GM, 2006, MACROMOLECULES, V39, P2435, DOI 10.1021/ma0526443
   Yang XM, 2009, ACS NANO, V3, P1844, DOI 10.1021/nn900073r
NR 33
TC 7
Z9 7
U1 3
U2 33
PU AMER CHEMICAL SOC
PI WASHINGTON
PA 1155 16TH ST, NW, WASHINGTON, DC 20036 USA
SN 0024-9297
J9 MACROMOLECULES
JI Macromolecules
PD JAN 10
PY 2012
VL 45
IS 1
BP 159
EP 164
DI 10.1021/ma202249n
PG 6
WC Polymer Science
SC Polymer Science
GA 873TD
UT WOS:000298905000019
ER

PT J
AU Alnawayseh, SEA
   Loskot, P
AF Alnawayseh, Saif E. A.
   Loskot, Pavel
TI Ordered statistics-based list decoding techniques for linear binary
   block codes
SO EURASIP JOURNAL ON WIRELESS COMMUNICATIONS AND NETWORKING
LA English
DT Article
DE Decoding; Fading; Linear code; Performance evaluation
ID ALGORITHM; CHANNELS
AB The ordered statistics-based list decoding techniques for linear binary block codes of small to medium block length are investigated. The construction of a list of the test error patterns is considered. The original ordered-statistics decoding (OSD) is generalized by assuming segmentation of the most reliable independent positions (MRIPs) of the received bits. The segmentation is shown to overcome several drawbacks of the original OSD. The complexity of the ordered statistics-based decoding is further reduced by assuming a partial ordering of the received bits in order to avoid the complex Gauss elimination. The probability of the test error patterns in the decoding list is derived. The bit error rate performance and the decoding complexity trade-off of the proposed decoding algorithms is studied by computer simulations. Numerical examples show that, in some cases, the proposed decoding schemes are superior to the original OSD in terms of both the bit error rate performance as well as the decoding complexity.
C1 [Alnawayseh, Saif E. A.] Mutah Univ, Dept Elect Engn, Mutah 61710, Jordan.
   [Loskot, Pavel] Swansea Univ, Coll Engn, Swansea SA2 8PP, W Glam, Wales.
RP Loskot, P (reprint author), Swansea Univ, Coll Engn, Singleton Pk, Swansea SA2 8PP, W Glam, Wales.
EM p.loskot@swan.ac.uk
CR Alnawayseh S, 2009, P WCSP NOV, P1
   Benedetto S., 1999, PRINCIPLES DIGITAL T
   Chen N, 2008, EURASIP J WIREL COMM, DOI 10.1155/2008/843634
   DORSCH BG, 1974, IEEE T INFORM THEORY, V20, P391, DOI 10.1109/TIT.1974.1055217
   El-Khamy M, 2009, IEEE T COMMUN, V57, P2940, DOI 10.1109/TCOMM.2009.10.080402
   FOSSORIER MPC, 1995, IEEE T INFORM THEORY, V41, P1379, DOI 10.1109/18.412683
   Fossorier MPC, 1996, IEEE T INFORM THEORY, V42, P738, DOI 10.1109/18.490541
   Fossorier MPC, 2002, IEEE T INFORM THEORY, V48, P3101, DOI 10.1109/TIT.2002.805089
   Gazelle J D, 1997, IEEE T INFORM THEORY, V43, P239
   Howard Sheryl L, 2006, EURASIP J WIREL COMM, V2006, P1
   Hu TH, 2011, EURASIP J WIREL COMM, DOI 10.1155/2011/212136
   Jin WY, 2007, IEEE T INFORM THEORY, V53, P105, DOI 10.1109/TIT.2006.887510
   Kabat A, 2007, GLOB TELECOMM CONF, P1467
   Lin S., 1983, ERROR CONTROL CODING
   Papoulis A., 2002, PROBABILITY RANDOM V
   Ser J, 2011, EURASIP J WIREL COMM, V2011
   Valembois A, 2004, IEEE T INFORM THEORY, V50, P796, DOI [10.1109/TIT.2004.826644, 10.1109/TIT.826644]
   Valembois A, 1999, IEEE T INFORM THEORY, V45, P2333
   Vikalo H, 2006, IEEE T SIGNAL PROCES, V54, P3330, DOI 10.1109/TSP.2006.877675
   Yagi H, 2005, THESIS WASEDA U
   Yagi H, 2006, IEICE T FUND ELECTR, VE89A, P2676, DOI 10.1093/ietfec/c89-a.10.2676
NR 21
TC 1
Z9 1
U1 0
U2 1
PU SPRINGER INTERNATIONAL PUBLISHING AG
PI CHAM
PA GEWERBESTRASSE 11, CHAM, CH-6330, SWITZERLAND
SN 1687-1499
J9 EURASIP J WIREL COMM
JI EURASIP J. Wirel. Commun. Netw.
PY 2012
AR 314
DI 10.1186/1687-1499-2012-314
PG 12
WC Engineering, Electrical & Electronic; Telecommunications
SC Engineering; Telecommunications
GA 189NU
UT WOS:000322274700002
ER

PT J
AU Sasao, N
   Yamamoto, R
   Kihara, N
   Shimada, T
   Yuzawa, A
   Okino, T
   Ootera, Y
   Kawamonzen, Y
   Hieda, H
   Maeda, T
   Kamata, Y
   Kikitsu, A
AF Sasao, Norikatsu
   Yamamoto, Ryousuke
   Kihara, Naoko
   Shimada, Takuya
   Yuzawa, Akiko
   Okino, Takeshi
   Ootera, Yasuaki
   Kawamonzen, Yoshiaki
   Hieda, Hiroyuki
   Maeda, Tomoyuki
   Kamata, Yoshiyuki
   Kikitsu, Akira
TI Influence of Solvent Vapor Atmospheres to the Self-assembly of
   Poly(styrene-b-dimethylsiloxane)
SO JOURNAL OF PHOTOPOLYMER SCIENCE AND TECHNOLOGY
LA English
DT Article
DE Block copolymer; Poly(styrene-b-dimethylsiloxane); solvent-annealing;
   morphology; self-assembly; bit-patterned-media; solubility parameters
ID BIT-PATTERNED MEDIA; BLOCK-COPOLYMER; LITHOGRAPHY;
   POLY(DIMETHYLSILOXANE); NANOSTRUCTURES; ORIENTATION; TB/IN(2)
AB Self-assembly process of poly(styrene-b-dimethylsiloxane) (PS-b-PDMS) was investigated by using the solvent-annealing with acetone, hexane and dimethylforamide (DMF) vapor. Solvent-annealing with hexane vapor yielded a mixture of cylindrical and spherical microdomains. Acetone and DMF vapors yielded well-oriented arrays of PDMS sphere dots with 17 nm in pitch. Voronoi analysis was applied to these self-assembled patterns and revealed that the quality of the ordering of acetone and DMF were 92% and 99%, respectively. DMF was a superior solvent for self-assembly of PS-b-PDMS for the application to the bit-patterned magnetic recording media (BPM). Self-assembled dot pattern with 12 nm-pitch, which is equivalent to 5 Tb/in(2), is also demonstrated with N-methylpyrrolidone solvent vapor annealing. One of the important factors to align the PDMS sphere dots of the PS-b-PDMS by solvent-annealing is the miscibility of the solvent to the majority polymer.
C1 [Sasao, Norikatsu; Yamamoto, Ryousuke; Kihara, Naoko; Shimada, Takuya; Yuzawa, Akiko; Okino, Takeshi; Ootera, Yasuaki; Kawamonzen, Yoshiaki; Hieda, Hiroyuki; Maeda, Tomoyuki; Kamata, Yoshiyuki; Kikitsu, Akira] Toshiba Co Ltd, Corp Res & Dev Ctr, Saiwai Ku, Kawasaki, Kanagawa 2128582, Japan.
RP Sasao, N (reprint author), Toshiba Co Ltd, Corp Res & Dev Ctr, Saiwai Ku, 1 Komukai Toshiba Cho, Kawasaki, Kanagawa 2128582, Japan.
FU New Energy and Industrial Technology Development Organization (NEDO)
FX A part of this work was funded by the New Energy and Industrial
   Technology Development Organization (NEDO).
CR Asakawa K, 2002, J PHOTOPOLYM SCI TEC, V15, P465, DOI 10.2494/photopolymer.15.465
   CHU JH, 1995, POLYMER, V36, P1569, DOI 10.1016/0032-3861(95)99001-B
   Hellwig O, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3293301
   Jeong JW, 2011, NANO LETT, V11, P4095, DOI 10.1021/nl2016224
   Jung YS, 2008, NANO LETT, V8, P3776, DOI 10.1021/nl802099k
   Jung YS, 2007, NANO LETT, V7, P2046, DOI 10.1021/nl070924l
   Jung YS, 2010, NANO LETT, V10, P1000, DOI 10.1021/nl904141r
   Jung Y. S., 2009, SMALL, V14, P1654
   Kamata Y, 2011, IEEE T MAGN, V47, P51, DOI 10.1109/TMAG.2010.2077274
   Kitano H, 2007, LANGMUIR, V23, P6404, DOI 10.1021/la0637014
   NOSE T, 1995, POLYMER, V36, P2243, DOI 10.1016/0032-3861(95)95303-I
   Okino T., 2012, P SOC PHOTO-OPT INS, V8323
   Paik MY, 2010, MACROMOLECULES, V43, P4253, DOI 10.1021/ma902646t
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Rodwogin MD, 2010, ACS NANO, V4, P725, DOI 10.1021/nn901190a
   Son JG, 2011, NANO LETT, V11, P5079, DOI 10.1021/nl203445h
   Son JG, 2011, ADV MATER, V23, P634, DOI 10.1002/adma.201002999
   Wang Q, 2010, APPL SURF SCI, V256, P5843, DOI 10.1016/j.apsusc.2010.03.057
   Xiao S., 2009, ADV MATER, V21, P1
   Yang XM, 2008, J VAC SCI TECHNOL B, V26, P2604, DOI 10.1116/1.2978487
   Yang XM, 2009, ACS NANO, V3, P1844, DOI 10.1021/nn900073r
   Yun SH, 2006, CHEM MATER, V18, P5646, DOI 10.1021/cm0618953
NR 22
TC 6
Z9 6
U1 4
U2 19
PU TECHNICAL ASSOC PHOTOPOLYMERS,JAPAN
PI CHIBA
PA CHIBA UNIV, FACULTY ENGINEERING, YAYOICHO, CHIBA, 263-8522, JAPAN
SN 0914-9244
J9 J PHOTOPOLYM SCI TEC
JI J. Photopolym Sci. Technol.
PY 2012
VL 25
IS 1
BP 27
EP 32
PG 6
WC Polymer Science
SC Polymer Science
GA 990BA
UT WOS:000307604800008
ER

PT J
AU Domene, F
   Pinero, G
   Botella, C
   Gonzalez, A
AF Domene, Fernando
   Pinero, Gema
   Botella, Carmen
   Gonzalez, Alberto
TI A limited feedback scheme based on spatially correlated channels for
   coordinated multipoint systems
SO EURASIP JOURNAL ON WIRELESS COMMUNICATIONS AND NETWORKING
LA English
DT Article
ID MIMO-OFDM DOWNLINK; MULTIUSER COMMUNICATION; INTERPOLATION;
   MULTIANTENNA; QUANTIZATION; PERFORMANCE; STRATEGIES; NETWORKS
AB High spectral efficiency can be achieved in the downlink of multi-antenna coordinated multi-point systems provided that the multiuser interference is appropriately managed at the transmitter side. For this sake, downlink channel information needs to be sent back by the users, thus reducing the rate available at the uplink channel. The amount and type of feedback information required has been extensively studied and many limited feedback schemes have been proposed lately. A common pattern to all of them is that achieving low rates of feedback information is possible at the cost of increasing complexity at the user side and, sometimes, assuming that some statistics of the channel are known. In this article, we propose a simple and versatile limited feedback scheme that exploits the spatial correlation at each multi-antenna base station (BS) without requiring any previous statistical information of the channel and without adding significant computational complexity. It is based on the separate quantization of the channel impulse response modulus and phase and it shows better mean square error performance than the standard scheme based on quantization of real and imaginary parts. In order to evaluate the performance of the downlink regarding multiuser interference management, different precoding techniques at the BSs, such as zero-forcing (ZF), Tomlinson-Harashima precoding (THP) and lattice reduction Tomlinson- Harashima precoding (LRTHP), have been evaluated. Simulations results show that LRTHP and THP present a higher robustness than ZF precoding against channel quantization errors but at the cost of a higher complexity at the BS. Regarding sum-capacity and bit error rate performances, our versatile scheme achieves better results than the standard one in the medium and high SNR regime, that is, in the region where quantization errors are dominant against noise, for the same feedback cost measured in bits per user.
C1 [Domene, Fernando; Pinero, Gema; Gonzalez, Alberto] Univ Politecn Valencia, Inst Telecommun & Multimedia Applicat ITEAM, E-46071 Valencia, Spain.
   [Botella, Carmen] Univ Valencia, IRTIC, Valencia, Spain.
RP Domene, F (reprint author), Univ Politecn Valencia, Inst Telecommun & Multimedia Applicat ITEAM, E-46071 Valencia, Spain.
EM ferdool@iteam.upv.es; gpinyero@dcom.upv.es; Carmen.Botella@uv.es;
   agonzal@dcom.upv.es
RI Gonzalez, Alberto/D-3099-2015; Pinero, Gema/F-2209-2010; Botella,
   Carmen/K-9426-2016
OI Gonzalez, Alberto/0000-0002-6984-3212; Pinero, Gema/0000-0002-8719-8106;
   Botella, Carmen/0000-0002-9296-5576
FU Spanish Ministry of Science and Innovation through CICYT
   [TEC2009-13741]; Regional Government Generalitat Valenciana
   [PROMETEO/2009/013]; Universitat Politecnica de Valencia through its
   PAID-FPI program; Spanish MEC [CONSOLIDER-INGENIO 2010 CSD2008-00010];
   COSIMA [TEC2010-19545-C04-01]
FX The authors would like to thank the anonymous reviewers for their
   valuable comments and suggestions, which have greatly helped to improve
   the quality of this work. This work has been supported by the Spanish
   Ministry of Science and Innovation through CICYT Grant TEC2009-13741,
   Regional Government Generalitat Valenciana through Grant
   PROMETEO/2009/013, and by Universitat Politecnica de Valencia through
   its PAID-FPI program. C. Botella's work is supported by the Spanish MEC
   Grants CONSOLIDER-INGENIO 2010 CSD2008-00010 "COMON-SENS" and COSIMA
   TEC2010-19545-C04-01. The authors are within VLC/campus "Sustainable
   Communications and Computing (COCOS)" cluster.
CR [Anonymous], 2011, 25996V1000 3GPP
   [Anonymous], 2010, 36814 3GPP TR
   [Anonymous], 2009, 36211 TS 3GPP
   [Anonymous], 2010, 36211 3GPP TS
   [Anonymous], 2010, 36201 3GPP TS
   Ancora A, 2007, INT CONF ACOUST SPEE, P293
   Baum DS, 2005, IEEE VTS VEH TECHNOL, P3132
   Bjornson E, 2010, IEEE T SIGNAL PROCES, V58, P4298, DOI 10.1109/TSP.2010.2049996
   Caire G, 2003, IEEE T INFORM THEORY, V49, P1691, DOI [10.1109/TIT.2003.813523, DOI 10.1109/TIT.2003.813523]
   Castros PM, 2008, P 19 IEEE INT S PERS, P1
   Cheng Y, 2010, IEEE T WIREL COMMUN, V9, P3093, DOI 10.1109/TWC.2010.082110.091189
   Choi J, 2005, IEEE T SIGNAL PROCES, V53, P4125, DOI 10.1109/TSP.2005.857019
   Conte E, 2010, EURASIP J WIREL COMM, V2010, P1
   COSTA MHM, 1983, IEEE T INFORM THEORY, V29, P439, DOI 10.1109/TIT.1983.1056659
   Domene F, 2010, P 7 IEEE INT S WIR C, P56
   Doukopoulos XG, 2007, IEEE VTS VEH TECHNOL, P1861, DOI 10.1109/VETECS.2007.386
   Gan YH, 2009, IEEE T SIGNAL PROCES, V57, P2701, DOI 10.1109/TSP.2009.2016267
   Gesbert D, 2007, IEEE SIGNAL PROC MAG, V24, P36, DOI 10.1109/MSP.2007.904815
   Gesbert D, 2010, IEEE J SEL AREA COMM, V28, P1380, DOI 10.1109/JSAC.2010.101202
   Goldsmith A, 2003, IEFE J SELECTED AREA, V21, P684, DOI [10.1109/JSAC.2003.810294, DOI 10.1109/JSAC.2003.810294]
   Irmer R, 2011, IEEE COMMUN MAG, V49, P102, DOI 10.1109/MCOM.2011.5706317
   Kavitha S K, 2011, EURASIP J WIREL COMM, P1
   Kim J. H., 2008, EURASIP J ADV SIG PR, P1, DOI 10.1007/978-0-387-30162-4_375
   Koivisto T., 2010, P IEEE VTC, P1
   LENSTRA AK, 1982, MATH ANN, V261, P515, DOI 10.1007/BF01457454
   Love DJ, 2008, IEEE J SEL AREA COMM, V26, P1341, DOI 10.1109/JSAC.2008.081002
   MAX J, 1960, IRE T INFORM THEOR, V6, P7, DOI 10.1109/TIT.1960.1057548
   Minn H, 2006, IEEE T WIREL COMMUN, V5, P1158, DOI 10.1109/TWC.2006.05024
   Papadogiannis A, 2008, IEEE ICC, P4033, DOI 10.1109/ICC.2008.757
   Pedersen KI, 2011, IEEE COMMUN MAG, V49, P89, DOI 10.1109/MCOM.2011.5783991
   Peel CB, 2005, IEEE T COMMUN, V53, P195, DOI 10.1109/TCOMM.2004.840638
   Pinero G, 2004, P IEEE PIMRC 2004 SE, V2, P974
   Roger S, 2010, P 7 IEEE INT S WIR C, P295
   Roger S, 2010, IEEE COMMUN LETT, V14, P220, DOI 10.1109/LCOMM.2010.03.092235
   Sesia S., 2009, LTE UMTS LONG TERM E
   Shirani-Mehr H, 2009, IEEE T COMMUN, V57, P2713, DOI 10.1109/TCOMM.2009.09.080162
   Fang Shu, 2009, EURASIP J WIREL COMM, V2009
   Stuber GL, 2004, P IEEE, V92, P271, DOI 10.1109/JPROC.2003.821912
   Sullivan GJ, 1996, IEEE T INFORM THEORY, V42, P1365, DOI 10.1109/18.532878
   Thomas TA, 2010, P 72 IEEE VEH TECHN, P1
   Trivellato M, 2009, IEEE T COMMUN, V57, P2645, DOI 10.1109/TCOMM.2009.09.080098
   Wang CX, 2007, EURASIP J WIREL COMM, V2007, P1
   Windpassinger C, 2004, IEEE T WIREL COMMUN, V3, P1305, DOI [10.1109/TWC.2004.830852, 10.1109/twc.2004.830852]
   Windpassinger C., 2004, THESIS U ERLANGEN NU
   Xu DF, 2009, SIGNAL IMAGE VIDEO P, V3, P47, DOI 10.1007/s11760-008-0058-3
   Zhang R, 2010, IEEE J SEL AREA COMM, V28, P1435, DOI 10.1109/JSAC.2010.101205
NR 46
TC 2
Z9 2
U1 0
U2 1
PU SPRINGER INTERNATIONAL PUBLISHING AG
PI CHAM
PA GEWERBESTRASSE 11, CHAM, CH-6330, SWITZERLAND
SN 1687-1499
J9 EURASIP J WIREL COMM
JI EURASIP J. Wirel. Commun. Netw.
PY 2012
DI 10.1186/1687-1499-2012-176
PG 15
WC Engineering, Electrical & Electronic; Telecommunications
SC Engineering; Telecommunications
GA 985GB
UT WOS:000307250300001
ER

PT J
AU Boadas, J
   Matos, M
   Bonoli, S
   Borges, A
   Vasquez-Suarez, A
   Serrano, L
   Quijada, N
   Villalba, R
   Perez, Y
   Chadee-Burgos, R
   De Sousa, L
AF Boadas, Jesus
   Matos, Mercedes
   Bonoli, Stefano
   Borges, Adolfo
   Vasquez-Suarez, Aleikar
   Serrano, Lenina
   Quijada, Nelson
   Villalba, Rafael
   Perez, Ysmael
   Chadee-Burgos, Rosa
   De Sousa, Leonardo
TI Eco-epidemiological profile of snakebite accidents in Monagas state,
   Venezuela (2002-2006)
SO BOLETIN DE MALARIOLOGIA Y SALUD AMBIENTAL
LA Spanish
DT Article
DE snakebite; epidemiology; Serpentes; Viperidae
ID LATIN-AMERICA; GLOBAL BURDEN; VENOM; ENVENOMATION; MANAGEMENT;
   APPRAISAL; TRENDS
AB The accidents caused by venomous animals are a global problem, especially in subtropical and tropical regions of the world. In Venezuela, they are endemic in several regions including the northeast. In order to expand and update the ecoepidemiological profile of snake bites in Monagas state, their behavior was assessed in each municipality for 5 years (2002 - 2006). There were 339 ophidian accidents (on average 68 per year). The bites occurred more frequently in young adult male farmers, while working in the field and during daytime. The incidence followed a bimodal seasonal pattern with predominance in high and low rainfall periods. Bothropic envenoming (28.6%) were the most frequent followed by Crotalic ones (14.5%), with a 2:1 ratio. 87.9% received specific serum therapy. The annual average incidence in the state was 11.30 cases per 100,000 inhabitants. Punceres (46.29), Acosta (20.91) and Bolivar (19.52) were the municipalities with the highest impact. Monagas state showed an endemicity map with municipalities having (1) very high endemicity, (2) high endemicity, (3) medium endemicity, (4) low endemicity and (5) very low endemicity. In the studied period there were no deaths from this cause in the state. The findings suggest the importance of snake accidents in Monagas, especially in the northern half of the state.
C1 [Boadas, Jesus] Hosp Dr Leopoldo Manrique Terrero, Serv Toxicol, Caracas, Venezuela.
   [Matos, Mercedes; Bonoli, Stefano; Borges, Adolfo; Vasquez-Suarez, Aleikar; Serrano, Lenina; Quijada, Nelson; Villalba, Rafael; Perez, Ysmael; Chadee-Burgos, Rosa; De Sousa, Leonardo] Univ Oriente, Escuela Ciencias Salud, Grp Invest Toxinol Aplicada & Anim Venenosos, Nucleo Anzoategui, Barcelona, Venezuela.
   [Borges, Adolfo] Cent Univ Venezuela, Fac Med, Inst Med Expt, Lab Biol Mol Toxinas & Receptores, Caracas, Venezuela.
   [Serrano, Lenina] Serv Autonomo Inst Altos Estudios Dr Arnoldo Gaba, Maracay, Venezuela.
RP De Sousa, L (reprint author), Univ Oriente, Escuela Ciencias Salud, Grp Invest Toxinol Aplicada & Anim Venenosos, Nucleo Anzoategui, Barcelona, Venezuela.
EM leonardodesousa@yahoo.com
CR Acevedo-Ortega P., 1961, REV VENEZ MSAS, V26, P923
   Aguilar I, 2001, BBA-PROTEIN STRUCT M, V1548, P57, DOI 10.1016/S0167-4838(01)00217-5
   Aguilar I, 2007, TOXICON, V50, P214, DOI 10.1016/j.toxicon.2007.03.012
   Aguilar M., 2006, ARCH VENEZ MED TROP, V4, P22
   Araujo C., 1997, MEDULA, V6, P21
   Benitez JA, 2007, WILD ENVIRON MED, V18, P209, DOI 10.1580/06-WEME-BR-076R.1
   Bochner R., 2008, COLLECTION RENCONTRE, V6, P119
   Bochner Rosany, 2004, Cad. Saúde Pública, V20, P976, DOI 10.1590/S0102-311X2004000400012
   Bochner Rosany, 2002, Cad. Saúde Pública, V18, P735, DOI 10.1590/S0102-311X2002000300017
   Bochner Rosany, 2003, Cad. Saúde Pública, V19, P07, DOI 10.1590/S0102-311X2003000100002
   Borges A., 2009, ENFORQUES TEMATICAS, P137
   Borges A., 2006, REV FAC FARMACIA CAR, V1, P15
   Borges Adolfo, 1996, Acta Biologica Venezuelica, V16, P65
   Borges A, 2010, WILD ENVIRON MED, V21, P282, DOI 10.1016/j.wem.2010.06.008
   Calvete JJ, 2009, J PROTEOMICS, V72, P227, DOI 10.1016/j.jprot.2009.01.005
   Caraballo A, 2004, RFM, V27, P25
   Chippaux JP, 2008, ACTA TROP, V107, P71, DOI 10.1016/j.actatropica.2008.05.021
   Chippaux J P, 2008, Med Trop (Mars), V68, P215
   Chippaux JP, 2010, J VENOM ANIM TOXINS, V16, P188, DOI 10.1590/S1678-91992010000200001
   Chippaux JP, 2008, PLOS MED, V5, P1538, DOI 10.1371/journal.pmed.0050221
   Chippaux JP, 1998, B WORLD HEALTH ORGAN, V76, P515
   Chippaux JP, 2008, MED TROP, V68, P334
   De Sousa Leonardo, 2005, Invest Clin, V46, P241
   De Sousa L., 2009, INFORM TECNICO PRIME
   Fernandez P, 2008, TOXICON, V52, P530, DOI 10.1016/j.toxicon.2008.06.018
   Fiszon Judith Tiomny, 2008, Rev. bras. epidemiol., V11, P114
   Gonzalez C., 2002, CUAD ESC SALUD PRIBL, V69, P3
   Guerrero E., 2010, ANALISIS CLINICO EPI
   Gutierrez JM, 2002, REV BIOL TROP, V50, P377
   Gutierrez JM, 2006, PLOS MED, V3, P727, DOI 10.1371/journal.pmed.0030150
   Hernandez M., 2006, ARCH VENEZ MED TROP, V4, P15
   Kasturiratne A, 2008, PLOS MED, V5, P1591, DOI 10.1371/journal.pmed.0050218
   Kiriakos D., 2000, SERPIENTES VENENOSAS
   Kiriakos D., 1993, EMPONZONAMIENTO OFIF
   Kiriakos D, 2008, REV SOC BRAS MED TRO, V41, P202, DOI 10.1590/S0037-86822008000200015
   Lopez-Johnston JC, 2007, J THROMB THROMBOLYS, V24, P275, DOI 10.1007/s11239-007-0040-x
   Machado-Allison A., 1997, ANIMALES VENENOSOS P
   Gutierrez JM, 2007, CURR PHARM DESIGN, V13, P2935, DOI 10.2174/138161207782023784
   Gutierrez JM, 2011, B MALARIOL SALUD AMB, V51, P1
   MARNR (Ministerio del Ambiente y de los Recursos Naturales Renovables), 1996, ATL EST MON
   Matos M., 2010, TRABAJO GRADO MAESTR
   Mota J., 1999, MED INTERNA CARACAS, V15, P83
   Natera M., 2005, VENEZUELA HERPETOTRO, V2, P43
   Navarrete L.F., 2009, BIOL VENENOS CONSERV, P11
   Navarro J., 2004, REV FAC MED-CARACAS, V27, P106
   Otero R, 1992, IATREIA, V5, P96
   Otero R., 2000, PLANTAS UTILIZADAS C, P31
   OTERO-PATIÑO RAFAEL, 2007, Iatreia, V20, P244
   Pifano F., 1961, ARCH VENEZ MED TROP, V4, P1
   Pulido L., 1996, REV SOC MED QUIRUR H, V27, P69
   Rodriguez Acosta A, 2000, Rev Cubana Med Trop, V52, P90
   Rodriguez-Acosta A, 2010, TOXICON, V56, P926, DOI 10.1016/j.toxicon.2010.06.015
   Rodriguez-Acosta A., 1995, QUE HACER FRENTE ACC
   SINAN (Sistema de Informacao de Agravos de Notificacao), 2011, AC AN PEC NOT REG SI
   Sousa L. de, 2000, Journal of Venomous Animals and Toxins including Tropical Diseases, V6, P127, DOI 10.1590/S0104-79302000000200002
   Spirandeli Cruz E. F., 1995, Revista da Sociedade Brasileira de Medicina Tropical, V28, P123
   Valderrama R, 2010, BIOMEDICA, V30, P5
   Yoshida-Kanashiro Erika, 2003, Rev Cubana Med Trop, V55, P38
NR 58
TC 1
Z9 2
U1 0
U2 2
PU INST ALTOS ESTUDIOS, DR ARNOLDO GABOLDON
PI MARACAY
PA APARTADO POSTAL 2442, MARACAY, ZP 2101, VENEZUELA
SN 1690-4648
J9 B MALARIOL SALUD AMB
JI Bol. Malar. Salud. Ambient.
PD JAN-JUL
PY 2012
VL 52
IS 1
BP 107
EP 120
PG 14
WC Infectious Diseases; Parasitology
SC Infectious Diseases; Parasitology
GA 268HH
UT WOS:000328160500010
ER

PT J
AU Eibagi, N
   Kan, JJ
   Spada, FE
   Fullerton, EE
AF Eibagi, Nasim
   Kan, Jimmy J.
   Spada, Frederick E.
   Fullerton, Eric E.
TI Role of Dipolar Interactions on the Thermal Stability of High-Density
   Bit-Patterned Media
SO IEEE MAGNETICS LETTERS
LA English
DT Article
DE Information storage; bit-patterned media; composite structures; dipolar
   interactions; energy barrier
AB We have characterized the magnetic reversal and thermal stability of bit-patterned media with a composite structure of [Co (0.25 nm)/Pd (0.7 nm)](5)/Fe(X)/[Pd (0.7 nm)/Co (0.25 nm)](5), where X = 1, 1.5, and 2 nm. For 25 nm diameter islands separated by 35 nm, the average thermal stability of the islands is confirmed by analyzing the time-dependent coercive fields. However, by further analyzing the time-dependent hysteresis loop shape, we find a broad distribution of the effective energy barriers. We quantitatively show that this energy barrier distribution arises primarily from the dipolar interactions in these densely packed arrays and not from intrinsic distributions.
C1 [Eibagi, Nasim; Kan, Jimmy J.; Spada, Frederick E.; Fullerton, Eric E.] Univ Calif San Diego, Ctr Magnet Recording Res, San Diego, CA 92093 USA.
   [Eibagi, Nasim; Fullerton, Eric E.] Univ Calif San Diego, Elect & Comp Engn Dept, San Diego, CA 92093 USA.
   [Kan, Jimmy J.; Fullerton, Eric E.] Univ Calif San Diego, Mat Sci & Engn Dept, San Diego, CA 92093 USA.
RP Eibagi, N (reprint author), Univ Calif San Diego, Ctr Magnet Recording Res, San Diego, CA 92093 USA.
EM neibagi@gmail.com
RI Fullerton, Eric/H-8445-2013
OI Fullerton, Eric/0000-0002-4725-9509
FU Center for Magnetic Recording Research; DOE-BES [DE-SC0003678]
FX We would like to acknowledge financial support of the sponsors of the
   Center for Magnetic Recording Research. N. Eibagi and E. E. Fullerton
   were partially supported by DOE-BES Award DE-SC0003678. We gratefully
   acknowledge collaborations with the Toshiba R&D Center on this research.
CR Berger A, 2005, IEEE T MAGN, V41, P3178, DOI 10.1109/TMAG.2005.855285
   Bertram HN, 2007, IEEE T MAGN, V43, P2145, DOI 10.1109/TMAG.2007.892852
   DEWITTE AM, 1993, J MAGN MAGN MATER, V120, P184, DOI 10.1016/0304-8853(93)91316-Y
   Engel BN, 2005, IEEE T MAGN, V41, P132, DOI 10.1109/TMAG.2004.840847
   Gallagher WJ, 2006, IBM J RES DEV, V50, P5
   Hellwig O, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3293301
   Hellwig O, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3271679
   Hellwig O, 2007, APPL PHYS LETT, V90, DOI 10.1063/1.2730744
   Kikitsu A, 2007, IEEE T MAGN, V43, P3685, DOI 10.1109/TMAG.2007.902970
   Lubarda MV, 2011, IEEE T MAGN, V47, P18, DOI 10.1109/TMAG.2010.2089610
   Lubarda MV, 2011, APPL PHYS LETT, V98, DOI 10.1063/1.3532839
   Moser A, 2002, J PHYS D APPL PHYS, V35, pR157, DOI 10.1088/0022-3727/35/19/201
   Ranjbar M, 2010, IEEE T MAGN, V46, P1787, DOI 10.1109/TMAG.2010.2043226
   TAGAWA I, 1991, IEEE T MAGN, V27, P4975, DOI 10.1109/20.278712
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Tudosa I, 2012, APPL PHYS LETT, V100, DOI 10.1063/1.3692574
   Wang H, 2011, J APPL PHYS, V109, DOI 10.1063/1.3562453
NR 17
TC 5
Z9 5
U1 1
U2 7
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 1949-307X
J9 IEEE MAGN LETT
JI IEEE Magn. Lett.
PY 2012
VL 3
AR 4500204
DI 10.1109/LMAG.2012.2211864
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA V31VF
UT WOS:000208910400017
ER

PT J
AU Wang, Y
   Erden, MF
   Victora, RH
AF Wang, Yao
   Erden, M. F.
   Victora, R. H.
TI Novel System Design for Readback at 10 Terabits per Square Inch User
   Areal Density
SO IEEE MAGNETICS LETTERS
LA English
DT Article
DE Information storage; two-dimensional (2-D) magnetic recording (TDMR);
   exchange-coupled composite (ECC) media; magnetoresistive head;
   pattern-dependent noise prediction detection (PDNPD)
AB A novel system design for sensing very high density magnetic recording data, such as that envisioned for two-dimensional magnetic recording, is proposed. The key idea is a rotated sense head, so that the shields are aligned down-track, combined with oversampled signal processing to regain the lost down-track resolution. Based on a random Voronoi grain model, simulation indicates that for bits with dimension of 8 nm x 6 nm, 5.5 nm grains, and a reader with 4 nm x 18 nm x 18 nm free layer and 11 nm shield-shield spacing, the bit error rate can drop from 20.9% for a normally positioned head array to 4.2% for a single-rotated single head with sampling period of 2 nm, a minimum mean squared error equalizer, and pattern-dependent noise prediction detector. The user density computed using the Shannon capacity limit is greatly increased to 10.1 Tb/in(2).
C1 [Wang, Yao; Victora, R. H.] Univ Minnesota, Ctr Micromagnet & Informat Technol, Dept Elect & Comp Engn, Minneapolis, MN 55455 USA.
   [Erden, M. F.] Seagate Technol, Shakopee, MN 55379 USA.
RP Victora, RH (reprint author), Univ Minnesota, Ctr Micromagnet & Informat Technol, Dept Elect & Comp Engn, Minneapolis, MN 55455 USA.
EM victora@umn.edu
FU National Science Foundation [ECCS-0925366]
FX This work was supported by the National Science Foundation under
   Contract ECCS-0925366.
CR Bertram H. N., 1994, THEORY MAGNETIC RECO, P112, DOI DOI 10.1017/CB09780511623066
   Caroselli J, 1997, IEEE T MAGN, V33, P2779, DOI 10.1109/20.617728
   Chan KS, 2010, IEEE T MAGN, V46, P804, DOI 10.1109/TMAG.2009.2035635
   Dong Y, 2012, J APPL PHYS, V111, DOI 10.1063/1.3675152
   Hwang E, 2010, IEEE T MAGN, V46, P1813, DOI 10.1109/TMAG.2010.2041531
   Krishnan A. R., 2009, P IEEE GLOB TEL C HO, P1, DOI DOI 10.1109/GL0C0M.2009.5425930
   MOON JY, 1995, IEEE T MAGN, V31, P1083, DOI 10.1109/20.364789
   Nabavi S, 2007, IEEE ICC, P6249, DOI 10.1109/ICC.2007.1035
   SHANNON CE, 1948, AT&T TECH J, V27, P623
   Smith N, 2001, APPL PHYS LETT, V78, P1448, DOI 10.1063/1.1352694
   Victora RH, 2012, IEEE T MAGN, V48, P1697, DOI 10.1109/TMAG.2011.2173310
   Wang Y, 2012, IEEE T MAGN, V48, P4582, DOI 10.1109/TMAG.2012.2202886
   Wood R, 2009, IEEE T MAGN, V45, P917, DOI 10.1109/TMAG.2008.2010676
   Wood RW, 2002, IEEE T MAGN, V38, P1711, DOI 10.1109/TMAG.2002.1017761
NR 14
TC 22
Z9 22
U1 2
U2 4
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 1949-307X
J9 IEEE MAGN LETT
JI IEEE Magn. Lett.
PY 2012
VL 3
AR 4500304
DI 10.1109/LMAG.2012.2226935
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA V31VF
UT WOS:000208910400018
ER

PT J
AU Ortiz, ME
   Endy, D
AF Ortiz, Monica E.
   Endy, Drew
TI Engineered cell-cell communication via DNA messaging
SO JOURNAL OF BIOLOGICAL ENGINEERING
LA English
DT Article
DE Synthetic biology; Amorphous computing; Cell-cell signaling; Programmed
   pattern formation; Communication theory
AB Background: Evolution has selected for organisms that benefit from genetically encoded cell-cell communication. Engineers have begun to repurpose elements of natural communication systems to realize programmed pattern formation and coordinate other population-level behaviors. However, existing engineered systems rely on system-specific small molecules to send molecular messages among cells. Thus, the information transmission capacity of current engineered biological communication systems is physically limited by specific biomolecules that are capable of sending only a single message, typically "regulate transcription."
   Results: We have engineered a cell-cell communication platform using bacteriophage M13 gene products to autonomously package and deliver heterologous DNA messages of varying lengths and encoded functions. We demonstrate the decoupling of messages from a common communication channel via the autonomous transmission of various arbitrary genetic messages. Further, we increase the range of engineered DNA messaging across semisolid media by linking message transmission or receipt to active cellular chemotaxis.
   Conclusions: We demonstrate decoupling of a communication channel from message transmission within engineered biological systems via the autonomous targeted transduction of user-specified heterologous DNA messages. We also demonstrate that bacteriophage M13 particle production and message transduction occurs among chemotactic bacteria. We use chemotaxis to improve the range of DNA messaging, increasing both transmission distance and communication bit rates relative to existing small molecule-based communication systems. We postulate that integration of different engineered cell-cell communication platforms will allow for more complex spatial programming of dynamic cellular consortia.
C1 [Ortiz, Monica E.; Endy, Drew] Stanford Univ, Dept Bioengn, Stanford, CA 94305 USA.
RP Endy, D (reprint author), Stanford Univ, Dept Bioengn, Y2E2 Room 269B,473 Via Ortega, Stanford, CA 94305 USA.
EM endy@stanford.edu
OI Endy, Drew/0000-0001-6952-8098
FU NSF Synthetic Biological Engineering Research Center; Stanford
   University; Stanford Graduate Fellowship
FX We thank M. Russel, J. Parkinson, A. Lam, F. St-Pierre, J. Bonnet,
   members of the Endy and Smolke labs, E. Cosgrove, S. Schneider, and the
   Stanford Shared FACS Facility. Support was provided by the NSF Synthetic
   Biological Engineering Research Center and Stanford University. MEO is a
   recipient of the Stanford Graduate Fellowship.
CR Abelson H., 1999, 1665 MIT ART INT LAB
   Balagadde F.K., 2008, MOL SYST BIOL, V4, P1
   Baluska F., 2007, CELL CELL CHANNELS
   Basu S, 2005, NATURE, V434, P1130, DOI 10.1038/nature03461
   Basu S, 2004, P NATL ACAD SCI USA, V101, P6355, DOI 10.1073/pnas.0307571101
   Beal J, 2010, SPAT COMP WORKSH
   Becerril B, 1999, BIOCHEM BIOPH RES CO, V255, P386, DOI 10.1006/bbrc.1999.0177
   BUCHANANWOLLASTON V, 1987, NATURE, V328, P172, DOI 10.1038/328172a0
   CAMPBELL AM, 1992, J BACTERIOL, V174, P7495
   Canton B, 2008, NAT BIOTECHNOL, V26, P787, DOI 10.1038/nbt1413
   Chai YR, 2004, MOL MICROBIOL, V51, P765, DOI 10.1046/j.1365-2958.2003.03857.x
   Collins CH, 2006, NAT BIOTECHNOL, V24, P708, DOI 10.1038/nbt1209
   Collins CH, 2005, MOL MICROBIOL, V55, P712, DOI 10.1111/j.1365-2958.2004.04437.x
   Coore D., 1999, THESIS MIT
   Danino T, 2010, NATURE, V463, P326, DOI 10.1038/nature08753
   DOTTO GP, 1981, P NATL ACAD SCI-BIOL, V78, P5421, DOI 10.1073/pnas.78.9.5421
   DUBENDORFF JW, 1991, J MOL BIOL, V219, P61, DOI 10.1016/0022-2836(91)90857-3
   Ford RM, 2007, ADV WATER RESOUR, V30, P1608, DOI 10.1016/j.advwatres.2006.05.019
   Frost LS, 1998, MICROBIOL-UK, V144, P2579
   GARCIA LR, 1995, J BACTERIOL, V177, P4066
   GEIDER K, 1985, GENE, V33, P341, DOI 10.1016/0378-1119(85)90242-2
   Gorti VA, 2008, LANGMUIR, V24, P2947, DOI 10.1021/la703224b
   GRAY KM, 1994, J BACTERIOL, V176, P3076
   Messing J, 1993, METHOD MOL BIOL, V23, P9
   HERSHEY AD, 1952, J GEN PHYSIOL, V36, P39, DOI 10.1085/jgp.36.1.39
   Hu J, 2010, BIOTECHNOL PROGR, V26, P1213, DOI 10.1002/btpr.447
   Kaiser D, 2003, NAT REV MICROBIOL, V1, P45, DOI 10.1038/nrmicro733
   Knight T, 2002, IDEMPOTENT VECTOR DE
   Lamalice L, 2007, CIRC RES, V100, P782, DOI 10.1161/01.RES.0000259593.07661.1e
   Larocca D, 1999, FASEB J, V13, P727
   Larocca D, 2001, MOL THER, V3, P476, DOI 10.1006/mthe.2001.0284
   LENNOX ES, 1955, VIROLOGY, V1, P190, DOI 10.1016/0042-6822(55)90016-7
   Lin A, 2011, PLOS ONE, V6, DOI 10.1371/journal.pone.0019991
   Lu TK, 2009, P NATL ACAD SCI USA, V106, P4629, DOI 10.1073/pnas.0800442106
   Martin L, 2009, PLOS ONE, V4, DOI 10.1371/journal.pone.0007569
   MARVIN DA, 1969, BACTERIOL REV, V33, P172
   McClary JA, 1989, BIOTECHNIQUES, V7, P82
   MESSING J, 1981, NUCLEIC ACIDS RES, V9, P309, DOI 10.1093/nar/9.2.309
   Miller MB, 2001, ANNU REV MICROBIOL, V55, P165, DOI 10.1146/annurev.micro.55.1.165
   Nagpal R., 2002, P 1 INT JOINT C AUT
   Ochman H, 2000, NATURE, V405, P299, DOI 10.1038/35012500
   PARKINSON JS, 1976, J BACTERIOL, V126, P758
   Perry R.H., 1973, CHEM ENG HDB
   PICCIRILLI JA, 1990, NATURE, V343, P33, DOI 10.1038/343033a0
   Poul MA, 1999, J MOL BIOL, V288, P203, DOI 10.1006/jmbi.1999.2678
   RUSSEL M, 1988, J BACTERIOL, V170, P5312
   RUSSEL M, 1995, TRENDS MICROBIOL, V3, P223, DOI 10.1016/S0966-842X(00)88929-5
   Sambrook J, 2001, MOL CLONING LAB MANU
   SHANNON CE, 1948, AT&T TECH J, V27, P623
   Shetty Reshma P, 2008, J Biol Eng, V2, P5, DOI 10.1186/1754-1611-2-5
   SLATER S, 1993, J BACTERIOL, V175, P4260
   Stewart PS, 2003, J BACTERIOL, V185, P1485, DOI 10.1128/JB.185.5.1485-1491.2003
   Stragier P, 1996, ANNU REV GENET, V30, P297, DOI 10.1146/annurev.genet.30.1.297
   Tabor JJ, 2009, CELL, V137, P1272, DOI 10.1016/j.cell.2009.04.048
   Tasmir A, 2011, NATURE, V469, P212
   Weiss R., 2001, LECT NOTES COMPUTER, V2054, P1
   You LC, 2004, NATURE, V428, P868, DOI 10.1038/nature02491
   ZAGURSKY RJ, 1984, GENE, V27, P183, DOI 10.1016/0378-1119(84)90139-2
NR 58
TC 25
Z9 26
U1 0
U2 12
PU BIOMED CENTRAL LTD
PI LONDON
PA 236 GRAYS INN RD, FLOOR 6, LONDON WC1X 8HL, ENGLAND
SN 1754-1611
J9 J BIOL ENG
JI J. Biol. Eng.
PY 2012
VL 6
IS 1
AR 16
DI 10.1186/1754-1611-6-16
PG 11
WC Biochemical Research Methods; Biotechnology & Applied Microbiology
SC Biochemistry & Molecular Biology; Biotechnology & Applied Microbiology
GA V31TG
UT WOS:000208905300016
PM 22958599
ER

PT J
AU Xu, J
   Hong, SW
   Gu, WY
   Lee, KY
   Kuo, DS
   Xiao, SG
   Russell, TP
AF Xu, Ji
   Hong, Sung Woo
   Gu, Weiyin
   Lee, Kim Y.
   Kuo, David S.
   Xiao, Shuaigang
   Russell, Thomas P.
TI Fabrication of Silicon Oxide Nanodots with an Areal Density Beyond 1
   Teradots Inch-2
SO ADVANCED MATERIALS
LA English
DT Article
DE directed self-assembly; block copolymers; solvent annealing; chemical
   pattern; bit-pattern media
ID BLOCK-COPOLYMER LITHOGRAPHY; DIBLOCK COPOLYMER; THIN-FILMS; TRIBLOCK
   COPOLYMERS; CHEMICAL-PATTERNS; TEMPLATES; GRAPHOEPITAXY; ARRAYS; MEDIA;
   NANOSTRUCTURES
AB The combination of solvent annealing, surface reconstruction, and a tone-reversal etching procedure provides an attractive approach to utilize block copolymer (BCP) lithography to fabricate highly ordered and densely packed silicon oxide nano-dots on a surface. The obtained silicon oxide nano-dots feature an areal density of 1.3 teradots inch(-2).
C1 [Lee, Kim Y.; Kuo, David S.; Xiao, Shuaigang] Seagate Technol LLD, Fremont, CA 94538 USA.
   [Xu, Ji; Hong, Sung Woo; Gu, Weiyin; Russell, Thomas P.] Univ Massachusetts, Dept Polymer Sci & Engn, Amherst, MA 01003 USA.
RP Xiao, SG (reprint author), Seagate Technol LLD, 47010 Kato Rd, Fremont, CA 94538 USA.
EM shuaigang.xiao@seagate.com; russell@mail.pse.umass.edu
FU U.S. Department of Energy (DOE), Office of Basic Energy Sciences; NSF
FX This work was supported by the U.S. Department of Energy (DOE), Office
   of Basic Energy Sciences (TPR, SWH, JX) and NSF supported Materials
   Research Science and Engineering Center (WG).
CR Angelescu DE, 2004, ADV MATER, V16, P1736, DOI 10.1002/adma.200400643
   BATES FS, 1990, ANNU REV PHYS CHEM, V41, P525, DOI 10.1146/annurev.pc.41.100190.002521
   Bita I, 2008, SCIENCE, V321, P939, DOI 10.1126/science.1159352
   Bodycomb J, 1999, MACROMOLECULES, V32, P2075, DOI 10.1021/ma981538g
   Brandrup J., 1999, POLYM HDB
   Chau R. S., 2006, TECHNOLOGY INTEL MAG
   Cheng JY, 2008, ADV MATER, V20, P3155, DOI 10.1002/adma.200800826
   Cheng JY, 2002, APPL PHYS LETT, V81, P3657, DOI 10.1063/1.1519356
   Epps TH, 2002, CHEM MATER, V14, P1706, DOI 10.1021/cm010971t
   Kim G, 1998, MACROMOLECULES, V31, P2569, DOI 10.1021/ma971349i
   Kim SH, 2006, MACROMOLECULES, V39, P8473, DOI 10.1021/ma061170k
   Kim SH, 2004, ADV MATER, V16, P226, DOI 10.1002/adma.200304906
   Kim SO, 2003, NATURE, V424, P411, DOI 10.1038/nature01775
   Kimura M, 2003, LANGMUIR, V19, P9910, DOI 10.1021/la0351360
   Ludwigs S, 2003, NAT MATER, V2, P744, DOI 10.1038/nmat997
   Mansky P, 1997, SCIENCE, V275, P1458, DOI 10.1126/science.275.5305.1458
   Moore G.E., 1965, ELECTRONICS, P38
   Park S, 2008, ACS NANO, V2, P766, DOI 10.1021/nn7004415
   Park S, 2009, MACROMOLECULES, V42, P1278, DOI 10.1021/ma802480s
   Park S, 2009, SCIENCE, V323, P1030, DOI 10.1126/science.1168108
   Rockford L, 1999, PHYS REV LETT, V82, P2602, DOI 10.1103/PhysRevLett.82.2602
   Ross CA, 2008, MRS BULL, V33, P838, DOI 10.1557/mrs2008.179
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Ruiz R, 2007, ADV MATER, V19, P2157, DOI 10.1002/adma.200602470
   Ruzette AVG, 2001, J ELECTROCHEM SOC, V148, pA537, DOI 10.1149/1.1368097
   Segalman RA, 2001, ADV MATER, V13, P1152, DOI 10.1002/1521-4095(200108)13:15<1152::AID-ADMA1152>3.0.CO;2-5
   Sundrani D, 2004, NANO LETT, V4, P273, DOI 10.1021/nl035005j
   Tang CB, 2005, J AM CHEM SOC, V127, P6918, DOI 10.1021/ja0508929
   Thurn-Albrecht T, 2000, MACROMOLECULES, V33, P3250, DOI 10.1021/ma991896z
   Xiao SG, 2005, NANOTECHNOLOGY, V16, pS324, DOI 10.1088/0957-4484/16/7/003
   Xiao SG, 2009, ADV MATER, V21, P2516, DOI 10.1002/adma.200802087
   Xu J, 2011, SOFT MATTER, V7, P3915, DOI 10.1039/c0sm01066a
   Xu J, 2010, ADV MATER, V22, P2268, DOI 10.1002/adma.200903640
   Xu T, 2003, ADV FUNCT MATER, V13, P698, DOI 10.1002/adfm.200304374
   Yang XM, 2004, J VAC SCI TECHNOL B, V22, P3331, DOI 10.1116/1.18151301
   Yang XM, 2000, MACROMOLECULES, V33, P9575, DOI 10.1021/ma001326v
   Zhu L, 2001, POLYMER, V42, P5829, DOI 10.1016/S0032-3861(00)00902-2
NR 37
TC 24
Z9 24
U1 4
U2 38
PU WILEY-BLACKWELL
PI MALDEN
PA COMMERCE PLACE, 350 MAIN ST, MALDEN 02148, MA USA
SN 0935-9648
J9 ADV MATER
JI Adv. Mater.
PD DEC 22
PY 2011
VL 23
IS 48
BP 5755
EP +
DI 10.1002/adma.201102964
PG 8
WC Chemistry, Multidisciplinary; Chemistry, Physical; Nanoscience &
   Nanotechnology; Materials Science, Multidisciplinary; Physics, Applied;
   Physics, Condensed Matter
SC Chemistry; Science & Technology - Other Topics; Materials Science;
   Physics
GA 862IL
UT WOS:000298084100004
PM 22116790
ER

PT J
AU Bosworth, JK
   Dobisz, EA
   Hellwig, O
   Ruiz, R
AF Bosworth, Joan K.
   Dobisz, Elizabeth A.
   Hellwig, Olav
   Ruiz, Ricardo
TI Impact of Out-of-Plane Translational Order in Block Copolymer
   Lithography
SO MACROMOLECULES
LA English
DT Article
ID BIT-PATTERNED MEDIA; DENSITY MULTIPLICATION; TERNARY BLENDS; THIN-FILMS;
   DIMENSIONS; ROUGHNESS; DOMAINS; SHAPES
AB In block copolymer lithography, subtle distortions in the self-assembled domains, such as tilting or bending, have a strong impact on the quality of the lithographic features upon pattern transfer. We compared the feature size distribution observed at the top-surface of block copolymer thin films with the size distribution that the self-assembled structures project at the substrate interface, i.e., the lithographic image. We performed the comparison for films of perpendicularly oriented cylindrical block copolymer domains with various degrees of lateral order. We found that the size distribution of the projected image does not mimic the well-known Gaussian distribution observed at the top surface. Instead, the lithographic features display a skewed distribution with a long tail toward smaller feature dimensions, a shift of the median and a reduced number of transferred features. The distortions are more pronounced for films with shorter correlation lengths. We propose a simplified model that explains the observed shifts in the size distribution of the projected image by considering the tilting that cylinders undergo in the vicinity of dislocations. The presence of defects disrupting the in-plane orientational order riot only impacts the size distribution of the self-assembled features, but also induces nearby cylinder tilting and some general loss of out-of-plane translational order which, upon pattern transfer, is responsible for the observed distortions on the feature size distribution,
C1 [Bosworth, Joan K.; Dobisz, Elizabeth A.; Hellwig, Olav; Ruiz, Ricardo] Hitachi Global Storage Technol, San Jose Res Ctr, San Jose, CA 95135 USA.
RP Ruiz, R (reprint author), Hitachi Global Storage Technol, San Jose Res Ctr, 3403 Yerba Buena Rd, San Jose, CA 95135 USA.
EM ricardo.ruiz@hitachigst.com
OI Ruiz, Ricardo/0000-0002-1698-4281
CR ALBRECHT T, 2009, NANOSCALE MAGNETIC M
   BATES FS, 1990, ANNU REV PHYS CHEM, V41, P525, DOI 10.1146/annurev.pc.41.100190.002521
   Black CT, 2007, IBM J RES DEV, V51, P605
   Cheng JY, 2008, ADV MATER, V20, P3155, DOI 10.1002/adma.200800826
   Cheng JY, 2010, ACS NANO, V4, P4815, DOI 10.1021/nn100686v
   Detcheverry FA, 2010, MACROMOLECULES, V43, P3446, DOI 10.1021/ma902332h
   Edwards EW, 2007, MACROMOLECULES, V40, P90, DOI 10.1021/ma0607564
   Guarini KW, 2002, ADV MATER, V14, P1290, DOI 10.1002/1521-4095(20020916)14:18<1290::AID-ADMA1290>3.0.CO;2-N
   Hammond MR, 2003, MACROMOLECULES, V36, P8712, DOI 10.1021/ma026001o
   Harrison C, 2004, EUROPHYS LETT, V67, P800, DOI 10.1209/epl/i2004-10126-5
   Harrison C, 2002, PHYS REV E, V66, DOI 10.1103/PhysRevE.66.011706
   Hellwig O, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3293301
   HO CS, 1983, IEEE T PATTERN ANAL, V5, P593
   *INTRS, LITH
   Ji SX, 2011, MACROMOLECULES, V44, P4291, DOI 10.1021/ma2005734
   Kleman M., 2003, SOFT MATTER PHYS INT
   LIU CC, 2010, J VAC SCI TECHNOL B, V34
   Liu G, 2010, J VAC SCI TECHNOL B, V28
   Nagpal U, 2011, ACS NANO, V5, P5673, DOI 10.1021/nn201335v
   Ruiz R, 2008, PHYS REV B, V77, DOI 10.1103/PhysRevB.77.054204
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Segalman RA, 2005, MAT SCI ENG R, V48, P191, DOI 10.1016/j.mser.2004.12.003
   Segalman RA, 2003, PHYS REV LETT, V91, DOI 10.1103/PhysRevLett.91.196101
   Segalman RA, 2003, MACROMOLECULES, V36, P3272, DOI 10.1021/ma021367m
   Stipe BC, 2010, NAT PHOTONICS, V4, P484, DOI 10.1038/nphoton.2010.90
   Stoykovich MP, 2010, MACROMOLECULES, V43, P2334, DOI 10.1021/ma902494v
   Stuen KO, 2009, MACROMOLECULES, V42, P5139, DOI 10.1021/ma900520v
   Tada Y, 2009, POLYMER, V50, P4250, DOI 10.1016/j.polymer.2009.06.039
   Welander AM, 2008, MACROMOLECULES, V41, P2759, DOI 10.1021/ma800056s
   Welander AM, 2008, J VAC SCI TECHNOL B, V26, P2484, DOI 10.1116/1.2987963
   Xiao SG, 2007, J VAC SCI TECHNOL B, V25, P1953, DOI 10.1116/1.2801860
   Yang XM, 2009, ACS NANO, V3, P1844, DOI 10.1021/nn900073r
NR 32
TC 11
Z9 11
U1 4
U2 22
PU AMER CHEMICAL SOC
PI WASHINGTON
PA 1155 16TH ST, NW, WASHINGTON, DC 20036 USA
SN 0024-9297
J9 MACROMOLECULES
JI Macromolecules
PD DEC 13
PY 2011
VL 44
IS 23
BP 9196
EP 9204
DI 10.1021/ma201967a
PG 9
WC Polymer Science
SC Polymer Science
GA 855ZG
UT WOS:000297604200016
ER

PT J
AU Stayton, CT
AF Stayton, Charles Tristan
TI Terrestrial feeding in aquatic turtles: environment-dependent feeding
   behavior modulation and the evolution of terrestrial feeding in Emydidae
SO JOURNAL OF EXPERIMENTAL BIOLOGY
LA English
DT Article
DE behavioral plasticity; suction feeding; environmental transition
ID PREY CAPTURE; PRINCIPAL COMPONENTS; KINEMATICS; METAMORPHOSIS; LONG;
   PALEOECOLOGY; PLEURODIRA; CRYPTODIRE; PHYLOGENY; TELEOSTEI
AB Evolutionary transitions between aquatic and terrestrial environments are common in vertebrate evolution. These transitions require major changes in most physiological functions, including feeding. Emydid turtles are ancestrally aquatic, with most species naturally feeding only in water, but some terrestrial species can modulate their feeding behavior appropriately for both media. In addition, many aquatic species can be induced to feed terrestrially. A comparison of feeding in both aquatic and terrestrial environments presents an excellent opportunity to investigate the evolution of terrestrial feeding from aquatic feeding, as well as a system within which to develop methods for studying major evolutionary transitions between environments. Individuals from eight species of emydid turtles (six aquatic, two terrestrial) were filmed while feeding underwater and on land. Bite kinematics were analyzed to determine whether aquatic turtles modulated their feeding behavior in a consistent and appropriate manner between environments. Aquatic turtles showed consistent changes between environments, taking longer bites and using more extensive motions of the jaw and hyoid when feeding on land. However, these motions differ from those shown by species that naturally feed in both environments and mostly do not seem to be appropriate for terrestrial feeding. For example, more extensive motions of the hyoid are only effective during underwater suction feeding. Emydids evolving to feed on land probably would have needed to evolve or learn to overcome many, but not all, aspects of the intrinsic emydid response to terrestrial feeding. Studies that investigate major evolutionary transitions must determine what responses to the new environment are shown by naive individuals in order to fully understand the evolutionary patterns and processes associated with these transitions.
C1 Bucknell Univ, Lewisburg, PA 17837 USA.
RP Stayton, CT (reprint author), Bucknell Univ, Lewisburg, PA 17837 USA.
EM tstayton@bucknell.edu
CR AERTS P, 1990, J ZOOL, V220, P653
   Alfaro ME, 2002, FUNCT ECOL, V16, P204, DOI 10.1046/j.1365-2435.2002.00620.x
   Blomberg SP, 2003, EVOLUTION, V57, P717, DOI 10.1111/j.0014-3820.2003.tb00285.x
   Bona P, 2005, J VERTEBR PALEONTOL, V25, P569, DOI 10.1671/0272-4634(2005)025[0569:PAPIOY]2.0.CO;2
   Bonin F, 2006, TURTLES WORLD
   BRAMBLE DM, 1973, AM ZOOL, V13, P1342
   Carroll RL, 1988, VERTEBRATE PALEONTOL
   Deban SM, 2002, ZOOL J LINN SOC-LOND, V134, P375, DOI 10.1046/j.1096-3642.2002.00004.x
   Denny M. W., 1993, AIR WATER BIOL PHYS
   Ernst CH, 1989, TURTLES WORLD
   GAFFNEY ES, 1991, CLADISTICS, V7, P313, DOI 10.1111/j.1096-0031.1991.tb00041.x
   GAFFNEY ES, 1987, SCIENCE, V237, P289, DOI 10.1126/science.237.4812.289
   GARLAND T, 1993, SYST BIOL, V42, P265, DOI 10.2307/2992464
   GIBBONS JW, 1987, BIOSCIENCE, V37, P262, DOI 10.2307/1310589
   GIBBONS JW, 1982, J ANIM ECOL, V51, P523, DOI 10.2307/3981
   Harvey P. H., 1991, COMP METHOD EVOLUTIO
   Hunt G, 2007, EVOLUTION, V61, P1560, DOI 10.1111/j.1558-5646.2007.00129.x
   JACKSON DA, 1993, ECOLOGY, V74, P2204, DOI 10.2307/1939574
   Joyce WG, 2004, P ROY SOC B-BIOL SCI, V271, P1, DOI 10.1098/rspb.2003.2523
   Lauder G.V., 1994, Advances in Comparative and Environmental Physiology, V18, P163
   LAUDER GV, 1992, J EXP BIOL, V164, P55
   Lemell P, 2002, J EXP BIOL, V205, P1495
   Natchev N, 2010, ZOOMORPHOLOGY, V129, P111, DOI 10.1007/s00435-010-0104-x
   Natchev N, 2009, ZOOLOGY, V112, P113, DOI 10.1016/j.zool.2008.05.002
   Rasband W., 1997, IMAGEJ
   REILLY SM, 1990, EVOLUTION, V44, P1542, DOI 10.2307/2409336
   Reilly SM, 1996, J EXP BIOL, V199, P1219
   Revell LJ, 2009, EVOLUTION, V63, P3258, DOI 10.1111/j.1558-5646.2009.00804.x
   ROHLF FJ, 2004, TPSDIG32 VER 1 40
   Scheyer TM, 2007, P R SOC B, V274, P1885, DOI 10.1098/rspb.2007.0499
   Schluter D, 1996, EVOLUTION, V50, P1766, DOI 10.2307/2410734
   Shaffer HB, 1997, SYST BIOL, V46, P235, DOI 10.2307/2413622
   SHAFFER HB, 1988, J ZOOL, V216, P437
   Sokal R. R., 1994, BIOMETRY
   SPONDER DL, 1981, J ZOOL, V193, P517
   Stephens PR, 2003, BIOL J LINN SOC, V79, P577, DOI 10.1046/j.1095-8312.2003.00211.x
   Summers AP, 1998, J EXP ZOOL, V281, P280, DOI 10.1002/(SICI)1097-010X(19980701)281:4<280::AID-JEZ4>3.0.CO;2-K
   Van Wassenbergh S, 2006, NATURE, V440, P881, DOI 10.1038/440881a
   Van Wassenbergh S, 2011, ZOOLOGY, V114, P46, DOI 10.1016/j.zool.2010.10.001
   VanDamme J, 1997, J MORPHOL, V233, P113, DOI 10.1002/(SICI)1097-4687(199708)233:2<113::AID-JMOR3>3.0.CO;2-7
   Vermeij GJ, 2000, BIOL J LINN SOC, V70, P541
   Vogel S., 1983, LIFE MOVING FLUIDS
   Wainwright P. C., 1994, ECOLOGICAL MORPHOLOG
   WEINS JJ, 2009, BIOL J LINN SOC, V99, P445
   West-Eberhard M. J., 2003, DEV PLASTICITY EVOLU
NR 45
TC 9
Z9 10
U1 2
U2 8
PU COMPANY OF BIOLOGISTS LTD
PI CAMBRIDGE
PA BIDDER BUILDING CAMBRIDGE COMMERCIAL PARK COWLEY RD, CAMBRIDGE CB4 4DL,
   CAMBS, ENGLAND
SN 0022-0949
J9 J EXP BIOL
JI J. Exp. Biol.
PD DEC
PY 2011
VL 214
IS 24
BP 4083
EP 4091
DI 10.1242/jeb.060574
PG 9
WC Biology
SC Life Sciences & Biomedicine - Other Topics
GA 856ZU
UT WOS:000297684200008
PM 22116751
ER

PT J
AU Liu, GL
   Nealey, PF
   Ruiz, R
   Dobisz, E
   Patel, KC
   Albrecht, TR
AF Liu, Guoliang
   Nealey, Paul F.
   Ruiz, Ricardo
   Dobisz, Elizabeth
   Patel, Kanaiyalal C.
   Albrecht, Thomas R.
TI Fabrication of chevron patterns for patterned media with block copolymer
   directed assembly
SO JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
LA English
DT Article
ID HOMOPOLYMER TERNARY BLENDS; DEVICE-ORIENTED STRUCTURES; DENSITY
   MULTIPLICATION; THIN-FILMS; LITHOGRAPHY; MECHANISMS; ROUGHNESS; FIELD
AB Advances in block copolymer directed assembly have highlighted the potential of block copolymer lithography to define patterned templates for magnetic recording bit patterned media (BPM). The naturally periodic features found in block copolymer films display superior size uniformity at ultrahigh densities, making them ideal lithographic masks to define the highly periodic data bits in the data sector of hard disk drives. In addition to the data bits, BPM architecture requires additional features to encode servo information. Because of the nature of the information stored in servo sectors, the geometry and shape of servo features differ from those in the data sectors, potentially compromising their compatibility with the features that can be naturally formed by block copolymers. The authors investigated the compatibility of a block copolymer directed assembly with the formation of complex chevron structures for sector header servo patterns within the framework of a BPM design that uses rectangular bits as the storage units. In order to ensure proper registration between the data tracks and the chevron patterns, the authors propose a design that employs lamellae-forming block copolymers assembled on chemical patterns with density multiplication into sets of lines that define both the data tracks and the servo features simultaneously. Due to the high free energy penalty associated with bending the lamellar domains, the block copolymer formed defective structures at the apex of the chevrons, as well as in the junction areas between chevrons and periodic horizontal lines. Adding stripes to the design of the chemical patterns near these complex areas prevented defects from propagating into the periodic line areas. In addition, the predictable defective structure offered flexibility for subsequent signal processing such as track identification and head position correction. (C) 2011 American Vacuum Society. [DOI: 10.1116/1.3650697]
C1 [Liu, Guoliang; Nealey, Paul F.] Univ Wisconsin, Dept Chem & Biol Engn, Madison, WI 53706 USA.
   [Ruiz, Ricardo; Dobisz, Elizabeth; Patel, Kanaiyalal C.; Albrecht, Thomas R.] Hitachi Global Storage Technol, San Jose Res Ctr, San Jose, CA 95135 USA.
RP Liu, GL (reprint author), Univ Wisconsin, Dept Chem & Biol Engn, Madison, WI 53706 USA.
EM nealey@engr.wisc.edu; Ricardo.Ruiz@hitachigst.com
RI Liu, Guoliang/A-9493-2011
OI Liu, Guoliang/0000-0002-6778-0625; Ruiz, Ricardo/0000-0002-1698-4281
CR AMUNDSON K, 1994, MACROMOLECULES, V27, P6559, DOI 10.1021/ma00100a047
   BATES FS, 1990, ANNU REV PHYS CHEM, V41, P525, DOI 10.1146/annurev.pc.41.100190.002521
   Bates FS, 1999, PHYS TODAY, V52, P32, DOI 10.1063/1.882522
   Black CT, 2007, IBM J RES DEV, V51, P605
   Cheng JY, 2008, ADV MATER, V20, P3155, DOI 10.1002/adma.200800826
   Daoulas KC, 2008, LANGMUIR, V24, P1284, DOI 10.1021/la702482z
   Detcheverry FA, 2010, MACROMOLECULES, V43, P3446, DOI 10.1021/ma902332h
   Edwards EW, 2007, MACROMOLECULES, V40, P90, DOI 10.1021/ma0607564
   Hahm J, 2001, J CHEM PHYS, V114, P4730, DOI 10.1063/1.1342239
   Harrison C, 2000, SCIENCE, V290, P1558, DOI 10.1126/science.290.5496.1558
   Harrison C, 2002, PHYS REV E, V66, DOI 10.1103/PhysRevE.66.011706
   Hellwig O, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3293301
   Kim SO, 2003, NATURE, V424, P411, DOI 10.1038/nature01775
   Lim YB, 2009, ANGEW CHEM INT EDIT, V48, P3394, DOI 10.1002/anie.200805687
   Liu GL, 2010, J VAC SCI TECHNOL B, V28, pC6B13, DOI 10.1116/1.3518918
   Liu GL, 2010, J PHOTOPOLYM SCI TEC, V23, P149, DOI 10.2494/photopolymer.23.149
   Liu GL, 2010, ADV FUNCT MATER, V20, P1251, DOI 10.1002/adfm.200902229
   Liu GL, 2009, J VAC SCI TECHNOL B, V27, P3038, DOI 10.1116/1.3253607
   Liu GL, 2009, MACROMOLECULES, V42, P3063, DOI 10.1021/ma802773h
   Park C, 2003, POLYMER, V44, P6725, DOI 10.1016/j.polymer.2003.08.011
   Park S, 2009, SCIENCE, V323, P1030, DOI 10.1126/science.1168108
   Ross CA, 2008, MRS BULL, V33, P838, DOI 10.1557/mrs2008.179
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Ruiz R, 2011, ACS NANO, V5, P79, DOI 10.1021/nn101561p
   Stipe BC, 2010, NAT PHOTONICS, V4, P484, DOI 10.1038/nphoton.2010.90
   Stoykovich MP, 2007, ACS NANO, V1, P168, DOI 10.1021/nn700164p
   Stoykovich MP, 2006, MATER TODAY, V9, P20, DOI 10.1016/S1369-7021(06)71619-4
   Stoykovich MP, 2010, MACROMOLECULES, V43, P2334, DOI 10.1021/ma902494v
   Stoykovich MP, 2005, SCIENCE, V308, P1442, DOI 10.1126/science.1111041
   Stuen KO, 2009, MACROMOLECULES, V42, P5139, DOI 10.1021/ma900520v
   Tada Y, 2009, POLYMER, V50, P4250, DOI 10.1016/j.polymer.2009.06.039
NR 31
TC 7
Z9 7
U1 1
U2 20
PU A V S AMER INST PHYSICS
PI MELVILLE
PA STE 1 NO 1, 2 HUNTINGTON QUADRANGLE, MELVILLE, NY 11747-4502 USA
SN 1071-1023
J9 J VAC SCI TECHNOL B
JI J. Vac. Sci. Technol. B
PD NOV
PY 2011
VL 29
IS 6
AR 06F204
DI 10.1116/1.3650697
PG 7
WC Engineering, Electrical & Electronic; Nanoscience & Nanotechnology;
   Physics, Applied
SC Engineering; Science & Technology - Other Topics; Physics
GA 868QO
UT WOS:000298538800004
ER

PT J
AU Ouchi, T
   Shimano, N
   Homma, T
AF Ouchi, Takanari
   Shimano, Naofumi
   Homma, Takayuki
TI CoNiP electroless deposition process for fabricating ferromagnetic
   nanodot arrays
SO ELECTROCHIMICA ACTA
LA English
DT Article; Proceedings Paper
CT 8th International Symposium on Electrochemical Micro and Nanosystem
   Technologies (EMNT)
CY SEP 21-24, 2010
CL Cannes Mandelieu, FRANCE
DE Electroless deposition; Nanodot arrays; Nanoimprint lithography; CoNiP
   alloy
ID BIT-PATTERNED MEDIA
AB An electroless deposition process for fabricating CoNiP nanodot arrays (less than 50 nm in height) with high magnetic coercivities was investigated. To fabricate such nanostructures, we improved the crystallinity of the CoNiP deposits in the initial deposition stage by applying an fcc-Cu(1 1 1) underlayer with low lattice mismatch to hcp-Co(0 0 0 2), and an autocatalytic electroless deposition process at the Cu surface was carried out by using dual reducing agents, H(2)PO(2)(-) and N(2)H(4). CoNiP films demonstrated high perpendicular magnetic coercivities in the initial deposition stage since the highly crystalline hcp(0 0 0 2) CoNiP layers were grown parallel to the Cu underlayers. Nanopatterned substrates were formed by UV-nanoimprint lithography. CoNiP was electroless deposited on the nanopatterned substrates. As a result. CoNiP was deposited selectively from the bottom of the nanopores with few defects in a large area. Perpendicular coercivities higher than 3000 Oe were obtained for nanodots even with heights of 50 nm. Thus, an electroless deposition process that can be used to form nanostructures with high crystallinities in the initial stage without any anomalous deposition was demonstrated. (C) 2011 Elsevier Ltd. All rights reserved.
C1 [Ouchi, Takanari; Shimano, Naofumi; Homma, Takayuki] Waseda Univ, Dept Appl Chem, Shinjuku Ku, Tokyo 1698555, Japan.
RP Homma, T (reprint author), Waseda Univ, Dept Appl Chem, Shinjuku Ku, 3-4-1 Okubo, Tokyo 1698555, Japan.
EM t.homma@waseda.jp
CR Gao L, 2004, IEEE T MAGN, V40, P2194, DOI 10.1109/TMAG.2004.829173
   Graham DL, 2004, TRENDS BIOTECHNOL, V22, P455, DOI 10.1016/j.tibtech.2004.06.006
   HOMMA T, 1995, SCRIPTA METALL MATER, V33, P1569, DOI 10.1016/0956-716X(95)00414-Q
   Homma T, 1997, J MAGN MAGN MATER, V173, P314, DOI 10.1016/S0304-8853(97)00200-X
   Kawaji J, 2005, J MAGN MAGN MATER, V287, P245, DOI 10.1016/j.jmmm.2004.10.040
   Iacovangelo C.D., 1991, J ELECTROCHEM SOC, V138, P976
   Myung NV, 2003, J MAGN MAGN MATER, V265, P189, DOI 10.1016/S0304-8853(03)00264-6
   OHNO I, 1991, MAT SCI ENG A-STRUCT, V146, P33, DOI 10.1016/0921-5093(91)90266-P
   OUCHI T, 2010, ELECTROCHEM SOC T, V25, P125
   Ouchi T, 2008, J MAGN MAGN MATER, V320, P3104, DOI 10.1016/j.jmmm.2008.08.022
   Ouchi T, 2010, ELECTROCHIM ACTA, V55, P8081, DOI 10.1016/j.electacta.2010.02.073
   Ouchi T, 2010, IEEE T MAGN, V46, P2224, DOI 10.1109/TMAG.2010.2040068
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   SAITO Y, 2007, J JPN I ELECT PACKAG, V10, P62
   Tang XT, 2007, J MAGN MAGN MATER, V309, P188, DOI 10.1016/j.jmmm.2006.06.032
   Yokoshima T, 2010, J ELECTROCHEM SOC, V157, pD65, DOI 10.1149/1.3254174
NR 16
TC 9
Z9 11
U1 4
U2 22
PU PERGAMON-ELSEVIER SCIENCE LTD
PI OXFORD
PA THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD OX5 1GB, ENGLAND
SN 0013-4686
J9 ELECTROCHIM ACTA
JI Electrochim. Acta
PD NOV 1
PY 2011
VL 56
IS 26
SI SI
BP 9575
EP 9580
DI 10.1016/j.electacta.2011.04.085
PG 6
WC Electrochemistry
SC Electrochemistry
GA 854KL
UT WOS:000297493300008
ER

PT J
AU Krone, P
   Makarov, D
   Cattoni, A
   Faini, G
   Haghiri-Gosnet, AM
   Knittel, I
   Hartmann, U
   Schrefl, T
   Albrecht, M
AF Krone, P.
   Makarov, D.
   Cattoni, A.
   Faini, G.
   Haghiri-Gosnet, A. -M.
   Knittel, I.
   Hartmann, U.
   Schrefl, T.
   Albrecht, M.
TI Investigation of the magnetization reversal of a magnetic dot array of
   Co/Pt multilayers
SO JOURNAL OF NANOPARTICLE RESEARCH
LA English
DT Article; Proceedings Paper
CT 10th International Conference on Nanostructured Materials (NANO)
CY SEP 13-17, 2010
CL Rome, ITALY
SP Int Comm Nanostruct Mat
DE Bit patterned media; Micromagnetism; Recording media; Magnetization
   reversal; Nanolayers
ID RECORDING MEDIA; ANISOTROPY; NUCLEATION; PARTICLES; FIELD
AB The magnetization reversal behavior of a dot array consisting of Co/Pt multilayers with perpendicular magnetic anisotropy was investigated. The size of the dots was varied from 200 nm down to 40 nm, while keeping the filling factor constant at about 0.16. The structural properties were determined by scanning electron microscopy, whereas the magnetic investigation was performed using SQUID and MFM techniques. It was observed that the dot size has a severe impact on the magnetization reversal mechanism where only the smallest dots with a size of 40 nm are found to be in a magnetic single-domain state. Moreover, the patterning process leads to a degradation of the multilayer, leading to a reduction of the switching field and an increase of the switching field distribution with decreasing dot size. In addition, micromagnetic simulations were performed to understand the magnetization reversal mechanism in more detail.
C1 [Krone, P.; Makarov, D.; Albrecht, M.] Tech Univ Chemnitz, Inst Phys, D-09107 Chemnitz, Germany.
   [Cattoni, A.; Faini, G.; Haghiri-Gosnet, A. -M.] CNRS, Lab Photon & Nanostruct, F-91460 Marcoussis, France.
   [Knittel, I.; Hartmann, U.] Univ Saarland, Inst Expt Phys, D-66123 Saarbrucken, Germany.
   [Schrefl, T.] St Polten Univ Appl Sci, A-3100 St Polten, Austria.
RP Krone, P (reprint author), Tech Univ Chemnitz, Inst Phys, D-09107 Chemnitz, Germany.
EM philipp.krone@physik.tu-chemnitz.de
RI Makarov, Denys/G-1025-2011; Faini, Giancarlo/B-2392-2015
CR Adeyeye AO, 2008, J PHYS D APPL PHYS, V41, DOI 10.1088/0022-3727/41/15/153001
   Aharoni A, 1997, J APPL PHYS, V82, P1281, DOI 10.1063/1.365899
   FREI EH, 1957, PHYS REV, V106, P446, DOI 10.1103/PhysRev.106.446
   ISHII Y, 1991, J APPL PHYS, V70, P3765, DOI 10.1063/1.349231
   Krone P, 2010, J MAGN MAGN MATER, V322, P3771, DOI 10.1016/j.jmmm.2010.07.041
   Krone P, 2009, J APPL PHYS, V106, DOI 10.1063/1.3260240
   Makarov D, 2008, J APPL PHYS, V103, DOI 10.1063/1.2894587
   Piramanayagam SN, 2009, J MAGN MAGN MATER, V321, P485, DOI 10.1016/j.jmmm.2008.05.007
   Rave W, 1998, J MAGN MAGN MATER, V190, P332, DOI 10.1016/S0304-8853(98)00328-X
   Rettner CT, 2002, IEEE T MAGN, V38, P1725, DOI 10.1109/TMAG.2002.1017763
   SCHABES ME, 1988, J APPL PHYS, V64, P1347, DOI 10.1063/1.341858
   Schrefl T, 2005, IEEE T MAGN, V41, P3064, DOI 10.1109/TMAG.2005.855227
   Skomski R, 2003, J PHYS-CONDENS MAT, V15, pR841, DOI 10.1088/0953-8984/15/20/202
   STONER EC, 1948, T R SOC LONDON A, V240, P599
   Terris BD, 2009, J MAGN MAGN MATER, V321, P512, DOI 10.1016/j.jmmm.2008.05.046
   WELLER D, 1992, APPL PHYS LETT, V61, P2726, DOI 10.1063/1.108074
NR 16
TC 2
Z9 2
U1 1
U2 17
PU SPRINGER
PI DORDRECHT
PA VAN GODEWIJCKSTRAAT 30, 3311 GZ DORDRECHT, NETHERLANDS
SN 1388-0764
J9 J NANOPART RES
JI J. Nanopart. Res.
PD NOV
PY 2011
VL 13
IS 11
SI SI
BP 5587
EP 5593
DI 10.1007/s11051-010-0123-z
PG 7
WC Chemistry, Multidisciplinary; Nanoscience & Nanotechnology; Materials
   Science, Multidisciplinary
SC Chemistry; Science & Technology - Other Topics; Materials Science
GA 852IQ
UT WOS:000297351600002
ER

PT J
AU Mazumdar, A
   Barg, A
   Kashyap, N
AF Mazumdar, Arya
   Barg, Alexander
   Kashyap, Navin
TI Coding for High-Density Recording on a 1-D Granular Magnetic Medium
SO IEEE TRANSACTIONS ON INFORMATION THEORY
LA English
DT Article
ID PATTERNED MEDIA
AB In terabit-density magnetic recording, several bits of data can be replaced by the values of their neighbors in the storage medium. As a result, errors in the medium are dependent on each other and also on the data written. We consider a simple 1-D combinatorial model of this medium. In our model, we assume a setting where binary data is sequentially written on the medium and a bit can erroneously change to the immediately preceding value. We derive several properties of codes that correct this type of errors, focusing on bounds on their cardinality. We also define a probabilistic finite-state channel model of the storage medium, and derive lower and upper estimates of its capacity. A lower bound is derived by evaluating the symmetric capacity of the channel, i.e., the maximum transmission rate under the assumption of the uniform input distribution of the channel. An upper bound is found by showing that the original channel is a stochastic degradation of another, related channel model whose capacity we can compute explicitly.
C1 [Mazumdar, Arya; Barg, Alexander] Univ Maryland, Dept Elect & Comp Engn, College Pk, MD 20742 USA.
   [Mazumdar, Arya; Barg, Alexander] Univ Maryland, Syst Res Inst, College Pk, MD 20742 USA.
   [Barg, Alexander] Russian Acad Sci, Inst Problems Informat Transmiss, Moscow, Russia.
   [Kashyap, Navin] Indian Inst Sci, Dept Elect Commun Engn, Bangalore 560012, Karnataka, India.
RP Mazumdar, A (reprint author), MIT, Elect Res Lab, Cambridge, MA 02139 USA.
EM arya@umd.edu; abarg@umd.edu; nkashyap@ece.iisc.ernet.in
FU NSF [CCF0830699, CCF0916919]; NSERC, Canada; Indian Institute of
   Science, Bangalore
FX Manuscript received December 07, 2010; revised April 25, 2011; accepted
   May 24, 2011. Date of current version November 11, 2011. A. Mazumdar and
   A. Barg were supported by NSF Grants CCF0830699 and CCF0916919. N.
   Kashyap was supported in part by a Discovery Grant from NSERC, Canada,
   and performed this work while on sabbatical from Queen's University,
   Kingston, ON, Canada, at the University of Maryland, College Park, and
   the Indian Institute of Science, Bangalore. This paper was presented in
   part at the 2010 IEEE International Symposium on Information Theory and
   in part at the 48th Annual Allerton Conference on Communication,
   Control, and Computing, Monticello, IL, September 29-October 1, 2010.
CR BASSALYGO LA, 1989, P 4 SOV SWED WORKSH, P95
   Cover TM, 2006, ELEMENTS INFORM THEO
   Gallager R., 1968, INFORM THEORY RELIAB
   Iyengar AR, 2011, IEEE T MAGN, V47, P35, DOI 10.1109/TMAG.2010.2080667
   Krishnan AR, 2009, IEEE T MAGN, V45, P3679, DOI 10.1109/TMAG.2009.2023244
   Roth R., 2006, INTRO CODING THEORY
   van Lint J.H., 1992, COURSE COMBINATORICS
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
   Wood R, 2009, IEEE T MAGN, V45, P917, DOI 10.1109/TMAG.2008.2010676
NR 9
TC 20
Z9 20
U1 0
U2 0
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9448
J9 IEEE T INFORM THEORY
JI IEEE Trans. Inf. Theory
PD NOV
PY 2011
VL 57
IS 11
BP 7403
EP 7417
DI 10.1109/TIT.2011.2158514
PG 15
WC Computer Science, Information Systems; Engineering, Electrical &
   Electronic
SC Computer Science; Engineering
GA 848IV
UT WOS:000297046100013
ER

PT J
AU Ranjbar, M
   Piramanayagam, SN
   Wong, SK
   Sbiaa, R
   Song, W
   Tan, HK
   Gonzaga, L
   Chong, TC
AF Ranjbar, M.
   Piramanayagam, S. N.
   Wong, S. K.
   Sbiaa, R.
   Song, W.
   Tan, H. K.
   Gonzaga, L.
   Chong, T. C.
TI Origin of anomalously high exchange field in antiferromagnetically
   coupled magnetic structures: Spin reorientation versus interface
   anisotropy
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article
ID PERPENDICULAR RECORDING MEDIA; STORAGE; MULTILAYERS; METALS; PLANAR;
   LAYERS
AB Magnetization reorientation from in-plane to perpendicular direction, observed in Co thin film coupled antiferromagnetically to high perpendicular magnetic anisotropy (Co/Pd) multilayers, is studied systematically for Co thickness ranging from 0 to 2.4 nm. The sample with 0.75 nm thick Co showed an exchange coupling field (H-ex) exceeding 15 kOe at room temperature and 17.2 kOe at 5K. With an increase of Co thickness, H-ex decreased as expected and beyond certain thickness, magnetization reorientation was not observed. Indeed, three regions were observed in the thickness dependence of magnetization of the thin layer; one in which the thin layer (in the thickness range up to 0.8 nm) had a perpendicular magnetic anisotropy due to interface effects and antiferromagnetic coupling, another in which the thin layer (0.9-1.2 nm) magnetization had no interface or crystallographic anisotropy but was reoriented in the perpendicular direction due to antiferromagnetic coupling, and the third (above 1.2 nm) in which the magnetization was in-plane. In addition, Hall effect measurements were carried out to observe the anomalous and planar Hall voltages and to quantify the perpendicular and in-plane components of magnetization. The sample with thicker Co layer (2.4 nm) showed an in-plane component of magnetization, whereas the sample with 0.75 nm Co showed no in-plane component. The high value of H-ex observed in 0.75 nm Co samples can have important implications in spintronics and bit patterned media. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3658843]
C1 [Ranjbar, M.; Piramanayagam, S. N.; Wong, S. K.; Sbiaa, R.; Song, W.; Tan, H. K.; Gonzaga, L.; Chong, T. C.] ASTAR, Data Storage Inst, Singapore 117608, Singapore.
   [Ranjbar, M.; Chong, T. C.] Natl Univ Singapore, Elect & Comp Engn Dept, Singapore 117576, Singapore.
RP Sbiaa, R (reprint author), ASTAR, Data Storage Inst, Singapore 117608, Singapore.
EM Rachid_SBIAA@dsi.a-star.edu.sg
RI Piramanayagam, SN/A-4192-2008; Sbiaa, Rachid/I-8038-2013
OI Piramanayagam, SN/0000-0002-3178-2960; 
FU A*STAR
FX M.R. would like to express gratitude for support from the A*STAR (SINGA)
   Graduate Scholarship program.
CR Das S, 2003, J APPL PHYS, V93, P6772, DOI 10.1063/1.1557817
   Girt E, 2003, IEEE T MAGN, V39, P2306, DOI 10.1109/TMAG.2003.816280
   GONG W, 1991, J APPL PHYS, V69, P5119, DOI 10.1063/1.348144
   Hirotsune A, 2010, IEEE T MAGN, V46, P1569, DOI 10.1109/TMAG.2009.2039118
   Hurd C., 1972, HALL COEFFICIENT MET
   Ichimura M, 2009, J APPL PHYS, V105, DOI 10.1063/1.3070627
   Kikuchi N, 2003, APPL PHYS LETT, V82, P4313, DOI 10.1063/1.1580994
   Kryder MH, 2008, P IEEE, V96, P1810, DOI 10.1109/JPROC.2008.2004315
   Kumar S, 2005, IEEE T MAGN, V41, P1200, DOI 10.1109/TMAG.2004.843310
   Le Gall H, 1998, J ALLOY COMPD, V275, P677, DOI 10.1016/S0925-8388(98)00417-4
   Li L, 2010, J APPL PHYS, V108, DOI 10.1063/1.3490134
   Lubarda MV, 2011, APPL PHYS LETT, V98, DOI 10.1063/1.3532839
   Nakagawa S, 1999, J APPL PHYS, V85, P4592, DOI 10.1063/1.370418
   Nakagawa S, 2002, J APPL PHYS, V91, P8354, DOI 10.1063/1.1456418
   Pang SI, 2002, APPL PHYS LETT, V80, P616, DOI 10.1063/1.1436281
   PARKIN SSP, 1991, PHYS REV LETT, V67, P3598, DOI 10.1103/PhysRevLett.67.3598
   PARKIN SSP, 1990, PHYS REV LETT, V64, P2304, DOI 10.1103/PhysRevLett.64.2304
   Piramanayagam SN, 2009, J APPL PHYS, V105, DOI 10.1063/1.3075565
   Piramanayagam SN, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2175463
   Piramanayagam SN, 2001, IEEE T MAGN, V37, P1438, DOI 10.1109/20.950864
   Ranjbar M, 2010, IEEE T MAGN, V46, P1787, DOI 10.1109/TMAG.2010.2043226
   Ross C, 2001, ANN REV MATER RES, V31, P203, DOI 10.1146/annurev.matsci.31.1.203
   Sbiaa R, 2011, J APPL PHYS, V109, DOI 10.1063/1.3540361
   SBIAA R, 1995, IEEE T MAGN, V31, P3274, DOI 10.1109/20.490347
   Sbiaa R, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3273856
   Shaw JM, 2007, J APPL PHYS, V101, DOI 10.1063/1.2431399
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Thiele JU, 2003, APPL PHYS LETT, V82, P2859, DOI 10.1063/1.1571232
   Thomson T, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.257204
   Wang XB, 2010, APPL PHYS LETT, V97, DOI 10.1063/1.3486167
   Weller D, 2001, J APPL PHYS, V89, P7525, DOI 10.1063/1.1363602
   Wong SK, 2010, IEEE T MAGN, V46, P2409, DOI 10.1109/TMAG.2009.2039202
NR 32
TC 2
Z9 2
U1 0
U2 8
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0021-8979
J9 J APPL PHYS
JI J. Appl. Phys.
PD NOV 1
PY 2011
VL 110
IS 9
AR 093915
DI 10.1063/1.3658843
PG 7
WC Physics, Applied
SC Physics
GA 848OY
UT WOS:000297062100077
ER

PT J
AU Ranjbar, M
   Piramanayagam, SN
   Wong, SK
   Sbiaa, R
   Chong, TC
AF Ranjbar, M.
   Piramanayagam, S. N.
   Wong, S. K.
   Sbiaa, R.
   Chong, T. C.
TI Anomalous Hall effect measurements on capped bit-patterned media
SO APPLIED PHYSICS LETTERS
LA English
DT Article
DE coercive force; copper; Hall effect; magnetic thin films; palladium;
   tantalum
ID MAGNETIC RECORDING MEDIA; THERMAL-STABILITY; MULTILAYERS; EXCHANGE;
   REVERSAL
AB The role of a small exchange coupling between isolated single-domain magnetic dots through a thin continuous film-in a system called capped bit-patterned media (CBPM)-has been studied experimentally using anomalous Hall effect measurements. The exchange coupling, provided by the thin continuous layer, was effective in reducing the switching field distribution (SFD) and coercivity under optimized conditions. SFD increases and coercivity decreases for very high values of exchange coupling due to the formation of multi-domains. Besides reducing SFD, the CBPM also exhibit potential writability advantage at higher densities, indicating their potential application as bit-patterned media. (C) 2011 American Institute of Physics. [doi:10.1063/1.3645634]
C1 [Ranjbar, M.; Piramanayagam, S. N.; Wong, S. K.; Sbiaa, R.; Chong, T. C.] Agcy Sci Technol & Res, Data Storage Inst, Singapore 117608, Singapore.
   [Ranjbar, M.; Chong, T. C.] Natl Univ Singapore, Elect & Comp Engn Dept, Singapore 117576, Singapore.
RP Piramanayagam, SN (reprint author), Agcy Sci Technol & Res, Data Storage Inst, Singapore 117608, Singapore.
EM prem_SN@dsi.a-star.edu.sg
RI Piramanayagam, SN/A-4192-2008; Sbiaa, Rachid/I-8038-2013
OI Piramanayagam, SN/0000-0002-3178-2960; 
FU A*STAR (SINGA)
FX M. Ranjbar would like to express gratitude for support from the A*STAR
   (SINGA) graduate scholarship program.
CR Das S, 2003, J APPL PHYS, V93, P6772, DOI 10.1063/1.1557817
   Hellwig O, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3293301
   Honda N, 2002, IEEE T MAGN, V38, P1615, DOI 10.1109/TMAG.2002.1017744
   Lau JW, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2822439
   Li SJ, 2009, J APPL PHYS, V105, DOI 10.1063/1.3074781
   Lubarda MV, 2011, IEEE T MAGN, V47, P18, DOI 10.1109/TMAG.2010.2089610
   Lubarda MV, 2011, APPL PHYS LETT, V98, DOI 10.1063/1.3532839
   Moser A, 2007, APPL PHYS LETT, V91, DOI 10.1063/1.2799174
   Nakagawa H, 2002, J APPL PHYS, V91, P8016, DOI 10.1063/1.1454980
   Nutter PW, 2005, IEEE T MAGN, V41, P3214, DOI 10.1109/TMAG.2005.854780
   Piramanayagam SN, 2007, J APPL PHYS, V102, DOI 10.1063/1.2750414
   Piramanayagam SN, 2009, J APPL PHYS, V105, DOI 10.1063/1.3075565
   Piramanayagam SN, 2009, J MAGN MAGN MATER, V321, P485, DOI 10.1016/j.jmmm.2008.05.007
   Piramanayagam SN, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2175463
   Ramamurthy B, 2005, IEEE T MAGN, V41, P3145, DOI 10.1109/TMAG.2005.854843
   Ranjbar M, 2010, IEEE T MAGN, V46, P1787, DOI 10.1109/TMAG.2010.2043226
   Richter HJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2209179
   Ross C, 2001, ANN REV MATER RES, V31, P203, DOI 10.1146/annurev.matsci.31.1.203
   Sbiaa R, 2010, J APPL PHYS, V107, DOI 10.1063/1.3427560
   Sbiaa R, 2009, J APPL PHYS, V105, DOI 10.1063/1.3093699
   SHARROCK MP, 1994, J APPL PHYS, V76, P6413, DOI 10.1063/1.358282
   Shaw JM, 2007, J APPL PHYS, V101, DOI 10.1063/1.2431399
   Sonobe Y, 2001, IEEE T MAGN, V37, P1667, DOI 10.1109/20.950932
   Tavakkoli A, 2011, J VAC SCI TECHNOL B, V29, DOI 10.1116/1.3532938
   Terris BD, 2005, IEEE T MAGN, V41, P2822, DOI 10.1109/TMAG.2005.855264
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Thiele JU, 2003, APPL PHYS LETT, V82, P2859, DOI 10.1063/1.1571232
   Thomson T, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.257204
   Weller D, 2001, J APPL PHYS, V89, P7525, DOI 10.1063/1.1363602
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
   Wong SK, 2010, IEEE T MAGN, V46, P2409, DOI 10.1109/TMAG.2009.2039202
NR 31
TC 7
Z9 7
U1 0
U2 6
PU AMER INST PHYSICS
PI MELVILLE
PA 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
SN 0003-6951
EI 1077-3118
J9 APPL PHYS LETT
JI Appl. Phys. Lett.
PD OCT 3
PY 2011
VL 99
IS 14
AR 142503
DI 10.1063/1.3645634
PG 3
WC Physics, Applied
SC Physics
GA 829ZE
UT WOS:000295625100053
ER

PT J
AU Saga, H
   Shirahata, K
   Mitsuzuka, K
   Shimatsu, T
   Aoi, H
   Muraoka, H
AF Saga, Hideki
   Shirahata, Kazuki
   Mitsuzuka, Kaname
   Shimatsu, Takehito
   Aoi, Hajime
   Muraoka, Hiroaki
TI Impact of Multidomain Dots on Write Margin in Bit Patterned Media
   Recording
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT Conference on International Magnetics (INTERMAG)
CY APR 25-29, 2011
CL Taipei, TAIWAN
SP IEEE Magnet Soc Educ Comm
DE Bit-patterned media (BPM); multidomain (MD) state; write error; write
   margin; write window
ID DENSITY
AB Bit-patterned media (BPM) samples were fabricated from hard/soft-stacked [exchange-coupled composite (ECC)] base media with a [Co/Pt]-super-lattice hard layer and a Co soft layer. The write margin of synchronous recording was evaluated using a static tester. The write margin of 50 nm dots with a 120 nm period was confirmed to be 65 nm and a large margin loss almost corresponding to the dot diameter was due to the occurrence of multidomain (MD) dots. Behavior analysis of the average MD dot formation rates within the transition regions beside the write window revealed that recording dots with diameters 30 nm, or smaller, are required to eliminate MD dots. A close association between the MD dot formation rate and the write error rate was confirmed. Therefore, a reduction of the large margin loss arising from the MD dots and a resultant improvement in the write error rate is expected when the recording dots become smaller than 30 nm.
C1 [Saga, Hideki] Hitachi Ltd, Cent Res Lab, Odawara, Kanagawa 2568510, Japan.
   [Saga, Hideki; Shirahata, Kazuki; Mitsuzuka, Kaname; Shimatsu, Takehito; Aoi, Hajime; Muraoka, Hiroaki] Tohoku Univ, Elect Commun Res Inst, Sendai, Miyagi 9808577, Japan.
RP Saga, H (reprint author), Hitachi Ltd, Cent Res Lab, Odawara, Kanagawa 2568510, Japan.
EM hideki.saga.vv@hitachi.com
CR Albrecht M, 2002, APPL PHYS LETT, V80, P3409, DOI 10.1063/1.1476062
   Albrecht M, 2002, APPL PHYS LETT, V81, P2875, DOI 10.1063/1.1512946
   AOI H, 2009, MR200939 IEICE, P13
   CHOU SY, 1994, J APPL PHYS, V76, P6673, DOI 10.1063/1.358164
   Kalezhi J, 2010, IEEE T MAGN, V46, P3752, DOI 10.1109/TMAG.2010.2052626
   Kitakami O, 2009, Journal of Physics: Conference Series, V165, DOI 10.1088/1742-6596/165/1/012029
   Mitsuzuka K, 2009, J APPL PHYS, V105, DOI 10.1063/1.3072014
   Muraoka Hiroaki, 2008, IEEE Transactions on Magnetics, V44, P3423, DOI 10.1109/TMAG.2008.2001654
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Saga H, 2011, J APPL PHYS, V109, DOI 10.1063/1.3554201
   Terris BD, 2005, IEEE T MAGN, V41, P2822, DOI 10.1109/TMAG.2005.855264
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
   Yamamoto SY, 1996, APPL PHYS LETT, V69, P3263, DOI 10.1063/1.118030
NR 13
TC 1
Z9 1
U1 1
U2 2
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD OCT
PY 2011
VL 47
IS 10
BP 2528
EP 2531
DI 10.1109/TMAG.2011.2157478
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 840DJ
UT WOS:000296418200050
ER

PT J
AU Choi, C
   Noh, K
   Oh, Y
   Kuru, C
   Hong, D
   Chen, LH
   Liou, SH
   Seong, TY
   Jin, S
AF Choi, Chulmin
   Noh, Kunbae
   Oh, Young
   Kuru, Cihan
   Hong, Daehoon
   Chen, Li-Han
   Liou, Sy-Hwang
   Seong, Tae-Yeon
   Jin, Sungho
TI Fabrication and Magnetic Properties of Nonmagnetic Ion Implanted
   Magnetic Recording Films for Bit-Patterned Media
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT Conference on International Magnetics (INTERMAG)
CY APR 25-29, 2011
CL Taipei, TAIWAN
SP IEEE Magnet Soc Educ Comm
DE Ion implantation; nanolithography; perpendicular magnetic recording
ID DENSITIES
AB We have investigated the magnetic M-H loop characteristics of CoCrPt-SiO(2) perpendicular recording media as influenced by nonmagnetic ion implantations. We have also developed patterned media via ion implantation using a convenient polymer nanomask approach for local control of coercivity of magnetically hard [Co/Pd](n) multilayer film with a [Co 0.3 nm\Pd 0.8 nm](8)/Pd 3 nm/Ta 3 nm layer structure. The CoCrPt-SiO2 magnetic layer having perpendicular magnetic anisotropy is sputter deposited on a flat substrate. The [Co/Pd](n) multilayer film with vertical magnetic anisotropy is deposited and the regions corresponding to the magnetic recording bit islands are coated with polymer islands using a nanoimprinting technique. Subsequent ion implantation allows patterned penetration of implanted ions into the [Co/Pd](n) multilayer film, thus creating magnetically isolated bit island geometry while maintaining the overall flat geometry of the patterned media.
C1 [Choi, Chulmin; Noh, Kunbae; Oh, Young; Kuru, Cihan; Chen, Li-Han; Jin, Sungho] Univ Calif San Diego, Ctr Magnet Recording Res, La Jolla, CA 92093 USA.
   [Hong, Daehoon] Western Digital Corp, San Jose, CA 95138 USA.
   [Liou, Sy-Hwang] Univ Nebraska, Dept Phys & Astron, Lincoln, NE 68588 USA.
   [Seong, Tae-Yeon] Korea Univ, Dept Mat Sci & Engn, Seoul 136701, South Korea.
RP Jin, S (reprint author), Univ Calif San Diego, Ctr Magnet Recording Res, La Jolla, CA 92093 USA.
EM jin@ucsd.edu
CR Ajan A, 2010, IEEE T MAGN, V46, P2020, DOI 10.1109/TMAG.2010.2043647
   Chappert C, 1998, SCIENCE, V280, P1919, DOI 10.1126/science.280.5371.1919
   Charap SH, 1997, IEEE T MAGN, V33, P978, DOI 10.1109/20.560142
   CHOI C, 2011, MICROSYST T IN PRESS
   Choi C, 2007, IEEE T MAGN, V43, P2121, DOI 10.1109/TMAG.2007.892640
   Kikuchi H, 2005, IEEE T MAGN, V41, P3226, DOI 10.1109/TMAG.2005.854776
   Ouchi T, 2008, J MAGN MAGN MATER, V320, P3104, DOI 10.1016/j.jmmm.2008.08.022
   Park J, 2009, NANOTECHNOLOGY, V20, DOI 10.1088/0957-4484/20/1/015303
   Pease RF, 2008, P IEEE, V96, P248, DOI 10.1109/JPROC.2007.911853
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Thomson T, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.257204
   Weller D, 1999, IEEE T MAGN, V35, P4423, DOI 10.1109/20.809134
NR 13
TC 5
Z9 5
U1 0
U2 10
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD OCT
PY 2011
VL 47
IS 10
BP 2532
EP 2535
DI 10.1109/TMAG.2011.2158197
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 840DJ
UT WOS:000296418200051
ER

PT J
AU Choi, C
   Noh, K
   Oh, Y
   Kuru, C
   Hong, D
   Villwock, D
   Chen, LH
   Jin, S
AF Choi, Chulmin
   Noh, Kunbae
   Oh, Young
   Kuru, Cihan
   Hong, Daehoon
   Villwock, Diana
   Chen, Li-Han
   Jin, Sungho
TI Diameter-Reduced Islands for Nanofabrication Toward Bit Patterned
   Magnetic Media
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT Conference on International Magnetics (INTERMAG)
CY APR 25-29, 2011
CL Taipei, TAIWAN
SP IEEE Magnet Soc Educ Comm
ID RECORDING MEDIA; STORAGE
AB Thin films deposited on a flat substrate, if the adhesion is not strong, can be made to ball up and form discrete islands upon heating to elevated temperatures due to the surface energy difference. We have applied this useful process to electron beam lithography (EBL) and nano-imprinting lithography (NIL). By combining the ball-up processes of Ni thin film with e-beam lithography followed by reactive ion etching, Si nano islands and vertical nanopillars as small as 10 nm in diameter have been realized. There is a strong correlation between the initial thickness of Ni mask layer and final Ni island diameter obtained after ball-up. The smallest island diameter is obtained using similar to 5-nm initial Ni layer thickness. Below 3-nm initial layer thickness, the intended ball-up reaction does not occur. With more than similar to 15-nm initial metal film thickness, the Ni layer is broken up into nonspherical and highly irregular structures. [Co/Pd](n) multilayer magnetic thin films deposited on prepatterned substrate by nano imprinting lithography with versus without island ball-up process have been investigated for bit patterned media studies. The coercivity of magnetic islands can be enhanced by island diameter reduction using the ball up process.
C1 [Choi, Chulmin; Noh, Kunbae; Oh, Young; Kuru, Cihan; Villwock, Diana; Chen, Li-Han; Jin, Sungho] Univ Calif San Diego, Ctr Magnet Recording Res, La Jolla, CA 92093 USA.
   [Hong, Daehoon] Western Digital Corp, San Jose, CA 95138 USA.
RP Jin, S (reprint author), Univ Calif San Diego, Ctr Magnet Recording Res, La Jolla, CA 92093 USA.
EM jin@ucsd.edu
CR Ariga K, 2008, SCI TECHNOL ADV MAT, V9, DOI 10.1088/1468-6996/9/1/014109
   Choi C, 2010, ELECTRON MATER LETT, V6, P113, DOI 10.3365/eml.2010.09.113
   Guo LJ, 2004, J PHYS D APPL PHYS, V37, pR123, DOI 10.1088/0022-3727/37/11/R01
   Kitade Y, 2004, IEEE T MAGN, V40, P2516, DOI 10.1109/TMAG.2004.830165
   Lin GP, 2010, THIN SOLID FILMS, V518, P2167, DOI 10.1016/j.tsf.2009.10.111
   Ross C, 2001, ANN REV MATER RES, V31, P203, DOI 10.1146/annurev.matsci.31.1.203
   Ross CA, 1999, J VAC SCI TECHNOL B, V17, P3168, DOI 10.1116/1.590974
   Shaw JM, 2007, J APPL PHYS, V101, DOI 10.1063/1.2431399
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Thomson T, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.257204
   Weller D, 1999, IEEE T MAGN, V35, P4423, DOI 10.1109/20.809134
NR 11
TC 0
Z9 0
U1 0
U2 2
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD OCT
PY 2011
VL 47
IS 10
BP 2536
EP 2539
DI 10.1109/TMAG.2011.2151254
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 840DJ
UT WOS:000296418200052
ER

PT J
AU Kalezhi, J
   Miles, JJ
AF Kalezhi, Josephat
   Miles, Jim J.
TI An Energy Barrier Model for Write Errors in Exchange-Spring Patterned
   Media
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT Conference on International Magnetics (INTERMAG)
CY APR 25-29, 2011
CL Taipei, TAIWAN
SP IEEE Magnet Soc Educ Comm
DE Adjacent track erasure (ATE); bit-patterned media (BPM); energy barrier;
   exchange-coupled composite (ECC); exchange-coupled composite media;
   exchange-spring media
ID COMPOSITE MEDIA; TB/IN(2)
AB Bit-patterned media (BPM), in which the medium is patterned into nanometer-sized magnetic islands and each island stores one bit, offers the potential for improved thermal stability. In order to study the write-error rates of systems using BPM, a model that calculates the energy barrier of a single island in exchange-spring or exchange-coupled composite (ECC) BPM, has been developed. The model has been shown to agree well with micromagnetic simulations. A study of energy barriers showed that ECC islands can be designed to retain a greater energy barrier in the presence of an applied field than single layer islands. This indicates that such ECC islands will be less prone to thermally activated adjacent track erasure (ATE) than single layer islands.
C1 [Kalezhi, Josephat; Miles, Jim J.] Univ Manchester, Sch Comp Sci, Manchester M13 9PL, Lancs, England.
   [Kalezhi, Josephat] Copperbelt Univ, Sch Math & Nat Sci, Dept Comp Sci, Kitwe 10101, Zambia.
RP Kalezhi, J (reprint author), Univ Manchester, Sch Comp Sci, Manchester M13 9PL, Lancs, England.
EM kalezhij@cs.man.ac.uk
CR Bertram HN, 2007, IEEE T MAGN, V43, P2145, DOI 10.1109/TMAG.2007.892852
   Fidler J, 2006, PHYSICA B, V372, P312, DOI 10.1016/j.physb.2005.10.074
   Greaves SJ, 2008, IEEE T MAGN, V44, P3430, DOI 10.1109/TMAG.2008.2002365
   GREAVES SJ, 2010, INSIC M MAY
   KALEZHI J, J APPL PHYS IN PRESS
   Kalezhi J, 2010, IEEE T MAGN, V46, P3752, DOI 10.1109/TMAG.2010.2052626
   LIVSHITZ B, 2009, J APPL PHYS, V105
   Livshitz B, 2009, IEEE T MAGN, V45, P3519, DOI 10.1109/TMAG.2009.2022501
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Schabes ME, 2008, J MAGN MAGN MATER, V320, P2880, DOI 10.1016/j.jmmm.2008.07.035
   Victora RH, 2005, IEEE T MAGN, V41, P537, DOI 10.1109/TMAG.2004.838075
NR 11
TC 4
Z9 4
U1 0
U2 6
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD OCT
PY 2011
VL 47
IS 10
BP 2540
EP 2543
DI 10.1109/TMAG.2011.2157993
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 840DJ
UT WOS:000296418200053
ER

PT J
AU Honda, N
   Honda, A
AF Honda, Naoki
   Honda, Akito
TI Deposition of Inclined Orientation Film Using Collimated Sputtering
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT Conference on International Magnetics (INTERMAG)
CY APR 25-29, 2011
CL Taipei, TAIWAN
SP IEEE Magnet Soc Educ Comm
DE Bit patterned media; collimated sputtering; inclined anisotropy; oblique
   incidence
ID BIT-PATTERNED MEDIA; RECORDING SIMULATION; 1 TB/IN(2); ANISOTROPY;
   DENSITIES
AB Aiming at realization of inclined anisotropy film for high density bit patterned media, collimated sputtering was investigated for stacked films. Using an appropriate collimator diameter with oblique incidence at 60 degrees, deflection angle of as large as 8 degrees was obtained for Co-Cr films deposited on a Ta/Pt/Ru underlayer. The angle may be increased and even a relatively small angle of around 10 degrees is expected to increase the write shift margins of BPM. Collimated sputtering was confirmed to be useful to deposit inclined orientation films.
C1 [Honda, Naoki; Honda, Akito] Tohoku Inst Technol, Fac Engn, Dept Elect & Intelligent Syst, Taihaku Ku, Sendai, Miyagi 9828577, Japan.
RP Honda, N (reprint author), Tohoku Inst Technol, Fac Engn, Dept Elect & Intelligent Syst, Taihaku Ku, Sendai, Miyagi 9828577, Japan.
EM n_honda@tohtech.ac.jp
CR Gao KZ, 2002, IEEE T MAGN, V38, P3675, DOI 10.1109/TMAG.2002.804801
   Greaves SJ, 2008, IEEE T MAGN, V44, P3430, DOI 10.1109/TMAG.2008.2002365
   Honda N, 2008, J MAGN MAGN MATER, V320, P2195, DOI 10.1016/j.jmmm.2008.03.048
   Honda N, 2007, IEICE T ELECTRON, VE90C, P1594, DOI 10.1093/ietele/e90-c.8.1594
   Honda N, 2007, IEEE T MAGN, V43, P2142, DOI 10.1109/TMAG.2007.893139
   Honda N, 2010, IEEE T MAGN, V46, P1806, DOI 10.1109/TMAG.2009.2039857
   Honda N, 2008, IEEE T MAGN, V44, P3438, DOI 10.1109/TMAG.2008.2002528
   Ishida T, 2000, IEEE T MAGN, V36, P183, DOI 10.1109/20.824446
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Rodriguez-Navarro A, 1998, J VAC SCI TECHNOL A, V16, P1244, DOI 10.1116/1.581267
   Schabes ME, 2008, J MAGN MAGN MATER, V320, P2880, DOI 10.1016/j.jmmm.2008.07.035
   Terris BD, 2005, IEEE T MAGN, V41, P2822, DOI 10.1109/TMAG.2005.855264
   Zheng YF, 2002, J APPL PHYS, V91, P8007, DOI 10.1063/1.1456416
NR 13
TC 3
Z9 3
U1 2
U2 6
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD OCT
PY 2011
VL 47
IS 10
BP 2544
EP 2547
DI 10.1109/TMAG.2011.2157904
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 840DJ
UT WOS:000296418200054
ER

PT J
AU Chang, L
   Veerdonk, RV
   Khizroev, S
   Litvinov, D
AF Chang, Long
   Veerdonk, Rene Vande
   Khizroev, Sakhrat
   Litvinov, Dmitri
TI Scanning Magnetoresistance Microscopy Analysis of Bit Patterned Media
   Playback
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT Conference on International Magnetics (INTERMAG)
CY APR 25-29, 2011
CL Taipei, TAIWAN
SP IEEE Magnet Soc Educ Comm
DE Magnetic recording; metrology; patterned media
ID NOISE
AB A scanning magnetoresistance microscope (SMRM) was used to enable recording experiments on bit patterned media prototypes not yet suitable for spin-stand evaluation. The SMRM generates a 2D playback response of the media by "dragging" a recording head across the sample using a piezoelectric nanopositioner. A large-scale parameter optimization technique is applied to extract relevant parameters such as pulse amplitude, pulse width, and pulse position from the 2D playback response. The parameters were analyzed to learn that the pulse response of our recording head cannot be accurately modeled as a Gaussian function. The error in the optimized parameters is dominated by intertrack interference and to a lesser extent measurement resolution and thermal drift.
C1 [Chang, Long; Litvinov, Dmitri] Univ Houston, Houston, TX 77584 USA.
   [Veerdonk, Rene Vande] Seagate Technol LLC, Fremont, CA 94538 USA.
   [Khizroev, Sakhrat] Florida Int Univ, Miami, FL 33174 USA.
RP Chang, L (reprint author), Univ Houston, Houston, TX 77584 USA.
EM reinchang@sbcglobal.net
CR Nabavi S, 2009, IEEE T MAGN, V45, P3523, DOI 10.1109/TMAG.2009.2022493
   Nutter PW, 2005, IEEE T MAGN, V41, P3214, DOI 10.1109/TMAG.2005.854780
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Shewchuk J. R., 1994, INTRO CONJUGATE GRAD
   Svedberg EB, 2002, J APPL PHYS, V91, P5365, DOI 10.1063/1.1459602
   WANG SX, 1999, MAGNETIC INFORM STOR, pCH6
   Yamamoto SY, 1996, APPL PHYS LETT, V69, P3263, DOI 10.1063/1.118030
   Hough P., 1962, US Patent, Patent No. [3069654, 3.069.654]
NR 8
TC 2
Z9 2
U1 0
U2 5
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD OCT
PY 2011
VL 47
IS 10
BP 2548
EP 2550
DI 10.1109/TMAG.2011.2153836
PG 3
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 840DJ
UT WOS:000296418200055
ER

PT J
AU Chang, W
   Cruz, JR
AF Chang, Wu
   Cruz, J. R.
TI Intertrack Interference Mitigation on Staggered Bit-Patterned Media
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT Conference on International Magnetics (INTERMAG)
CY APR 25-29, 2011
CL Taipei, TAIWAN
SP IEEE Magnet Soc Educ Comm
DE Bit-patterned magnetic recording (BPMR); hexagonal array; intertrack
   interference; multitrack detection; staggered media
AB One of the possible island distributions being considered for bit-patterned magnetic recording is a hexagonal array, leading to what is called staggered bit-patterned media. In this paper, we investigate the equalization techniques and bit error rate (BER) performance for two different recording methods on staggered media-namely, one array per track or single-track staggered media and two arrays per track or double-track staggered media. With single-track equalization, recording a track on two arrays may reduce intertrack interference (ITI) and outperform the single array per track recording. However, a new multitrack detection technique proposed recently can substantially mitigate ITI and dramatically change the BER performance of the two recording methods. Our investigation shows that by using this technique, the single-track staggered media can have better BER performance than double-track staggered media, even at very high areal densities.
C1 [Chang, Wu; Cruz, J. R.] Univ Oklahoma, Norman, OK 73019 USA.
   [Chang, Wu] LSI Corp, Read Channel Architecture, Milpitas, CA 95035 USA.
RP Cruz, JR (reprint author), Univ Oklahoma, Norman, OK 73019 USA.
EM jcruz@ou.edu
CR Chang W, 2010, IEEE T MAGN, V46, P3899, DOI 10.1109/TMAG.2010.2056926
   MIN DK, 2008, P IEEE SENS LECC IT, P1064
   MOON JY, 1995, IEEE T MAGN, V31, P1083, DOI 10.1109/20.364789
   Nabavi S., 2008, THESIS CARNEGIE MELL
   NABAVI S, 2007, P IEEE INT C COMM IC, P6249
   Nakamura Y, 2009, IEEE T MAGN, V45, P3753, DOI 10.1109/TMAG.2009.2022331
   Tan WJ, 2005, IEEE T MAGN, V41, P730, DOI 10.1109/TMAG.2004.839064
NR 7
TC 3
Z9 3
U1 0
U2 1
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD OCT
PY 2011
VL 47
IS 10
BP 2551
EP 2554
DI 10.1109/TMAG.2011.2151839
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 840DJ
UT WOS:000296418200056
ER

PT J
AU Zhang, SH
   Cai, K
   Lin-Yu, M
   Zhang, JL
   Qin, ZL
   Teo, KK
   Wong, WE
   Ong, ET
AF Zhang, Songhua
   Cai, Kui
   Lin-Yu, Maria
   Zhang, Jingliang
   Qin, Zhiliang
   Teo, Kim Keng
   Wong, Wai Ee
   Ong, Eng Teo
TI Timing and Written-In Errors Characterization for Bit Patterned Media
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT Conference on International Magnetics (INTERMAG)
CY APR 25-29, 2011
CL Taipei, TAIWAN
SP IEEE Magnet Soc Educ Comm
DE Bit-patterned-media; magnetic recording; timing recovery; written-in
   error
AB Synchronous writing in BPMR has been recognized as a crucial yet challenging issue. It has been shown that position jitter and switching field distribution can lead to spatially uncorrelated random write failures. On top of that, the spindle speed variation and other mechanical vibration may lead to accumulative phase drift during writing which causes long streams of insertion/deletion write failures. However no experiments have been conducted to quantitatively testify the later concept, nor provide precise written-in error characteristics when both phenomena are present in BPMR systems. This gap of understanding is filled by this work through spinstand and hard disk measurements and analysis. It is shown that timing inaccuracy not only introduces insertion/deletion write failures but also given rise to substantial increase of substitution (random) write errors. It also reveals that instead of the commonly accused spindle motor speed variation, timing error in BPMR based HDD may well be the result of estimation error due to limited or improperly configured timing preambles.
C1 [Zhang, Songhua; Cai, Kui; Lin-Yu, Maria; Zhang, Jingliang; Qin, Zhiliang; Teo, Kim Keng; Wong, Wai Ee; Ong, Eng Teo] ASTAR, Data Storage Inst, Singapore 138632, Singapore.
RP Zhang, SH (reprint author), ASTAR, Data Storage Inst, Singapore 138632, Singapore.
EM zhang_songhua@dsi.a-star.edu.sg
CR CAI K, IEEE GLOBELCOM 2010, P1910
   Ng YB, 2010, IEEE T MAGN, V46, P2268, DOI 10.1109/TMAG.2010.2043926
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Tang Y, 2009, IEEE T MAGN, V45, P822, DOI 10.1109/TMAG.2008.2010642
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
   Zhang SH, 2010, IEEE T MAGN, V46, P1363, DOI 10.1109/TMAG.2010.2040713
NR 6
TC 5
Z9 5
U1 0
U2 2
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD OCT
PY 2011
VL 47
IS 10
BP 2555
EP 2558
DI 10.1109/TMAG.2011.2155628
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 840DJ
UT WOS:000296418200057
ER

PT J
AU Shao, XY
   Alink, L
   Groenland, JPJ
   Abelmann, L
   Slump, CH
AF Shao, Xiaoying
   Alink, Laurens
   Groenland, J. P. J.
   Abelmann, Leon
   Slump, Cornelis H.
TI A Simple Two-Dimensional Coding Scheme for Bit Patterned Media
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT Conference on International Magnetics (INTERMAG)
CY APR 25-29, 2011
CL Taipei, TAIWAN
SP IEEE Magnet Soc Educ Comm
DE BER; bit-patterned media; bit-position; jitter factor; magnetism; probe
   storage; 2D coding; 2D-ISI
ID STORAGE
AB This paper presents a simple code to combat the two-dimensional inter-symbol interference (2D-ISI) effect that is present in data storage on magnetic bit patterned media. Whether the ISI effect is constructive or destructive depends on the surrounding bits. Therefore, we propose a simple 2D coding scheme to mitigate the ISI effect. With this 2D coding scheme in square patterned media, every 2-by-3 array has one redundant bit which has the opposite or same value of one of its adjacent bits. Compared to the 2D coding scheme in [1] under the condition of the same areal density, the proposed 2D coding scheme increases the allowable bit-position jitter in square patterned media by 1% at a BER of 10(-4); while it allows the effective storage capacity to be increased by around 5.5%.
C1 [Shao, Xiaoying; Slump, Cornelis H.] Univ Twente, Signals & Syst Grp, NL-7500 AE Enschede, Netherlands.
   [Alink, Laurens; Groenland, J. P. J.; Abelmann, Leon] Univ Twente, MESA Inst Nanotechnol, NL-7500 AE Enschede, Netherlands.
RP Shao, XY (reprint author), Univ Twente, Signals & Syst Grp, POB 217, NL-7500 AE Enschede, Netherlands.
EM x.shao@utwente.nl
RI Abelmann, Leon /H-8948-2012
OI Abelmann, Leon /0000-0002-9733-1230
CR Abelmann L, 2005, NANOSCI TECHNOL, P253
   Aziz MM, 2002, IEEE T MAGN, V38, P1964, DOI 10.1109/TMAG.2002.802787
   Burkhardt H., 2002, COMPEURO 89 VLSI COM, P1
   Groenland JPJ, 2007, IEEE T MAGN, V43, P2307, DOI 10.1109/TMAG.2007.893137
   Keskinoz M, 2008, IEEE T MAGN, V44, P533, DOI 10.1109/TMAG.2007.914966
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Thomson T., 2007, NATO SCI PEACE SEC B, P237
   White R., 2002, IEEE T MAGN, V33, P990
   Wood R, 2009, IEEE T MAGN, V45, P917, DOI 10.1109/TMAG.2008.2010676
   Wu ZN, 2001, IEEE J SEL AREA COMM, V19, P699, DOI 10.1109/49.920178
NR 10
TC 8
Z9 8
U1 0
U2 2
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD OCT
PY 2011
VL 47
IS 10
BP 2559
EP 2562
DI 10.1109/TMAG.2011.2157668
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 840DJ
UT WOS:000296418200058
ER

PT J
AU Dong, Y
   Victora, RH
AF Dong, Yan
   Victora, R. H.
TI Micromagnetic Specification for Bit Patterned Recording at 4 Tbit/in(2)
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT Conference on International Magnetics (INTERMAG)
CY APR 25-29, 2011
CL Taipei, TAIWAN
SP IEEE Magnet Soc Educ Comm
DE Bit error rate; bit patterned media; exchange coupled composite (ECC)
   media; micromagnetic simulation
ID 1 TB/IN(2); MEDIA; DENSITY
AB Micromagnetic specifications including 2.3:1 BAR bit patterned ECC media, trailing shield, and side shields are proposed to meet the requirement of 3 x 10(-4) bit error rate, 4 nm fly height, 5% switching field distribution, 5% timing, and 5% jitter errors for 4 Tbit/in(2) bit patterned recording. Demagnetizing field distribution is examined by studying the shielding effect of the side shields on the stray field from the neighboring dots. It is shown that, as the fly height is increased to 5 nm, head field and field gradient degradation will require a larger BAR (2.7:1) and a larger bit error rate to achieve the same areal density.
C1 [Dong, Yan; Victora, R. H.] Univ Minnesota, Dept Elect & Comp Engn, Ctr Micromagnet & Informat Technol, Minneapolis, MN 55455 USA.
RP Victora, RH (reprint author), Univ Minnesota, Dept Elect & Comp Engn, Ctr Micromagnet & Informat Technol, Minneapolis, MN 55455 USA.
EM victora@ece.umn.edu
CR Albrecht M, 2002, APPL PHYS LETT, V80, P3409, DOI 10.1063/1.1476062
   Nutter PW, 2005, IEEE T MAGN, V41, P4327, DOI 10.1109/TMAG.2005.856586
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Shen X, 2008, IEEE T MAGN, V44, P163, DOI 10.1109/TMAG.2007.912839
   Shen X, 2007, IEEE T MAGN, V43, P676, DOI 10.1109/TMAG.2006.888231
NR 5
TC 14
Z9 14
U1 0
U2 5
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD OCT
PY 2011
VL 47
IS 10
BP 2652
EP 2655
DI 10.1109/TMAG.2011.2148112
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 840DJ
UT WOS:000296418200083
ER

PT J
AU Moneck, MT
   Okada, T
   Fujimori, J
   Kasuya, T
   Katsumura, M
   Iida, T
   Kuriyama, K
   Lin, WC
   Sokalski, V
   Powell, SP
   Bain, JA
   Zhu, JG
AF Moneck, Matthew T.
   Okada, Takeru
   Fujimori, Jiro
   Kasuya, Takayuki
   Katsumura, Masahiro
   Iida, Tetsuya
   Kuriyama, Kazumi
   Lin, Wen-Chin
   Sokalski, Vincent
   Powell, Stephen P.
   Bain, James A.
   Zhu, Jian-Gang
TI Fabrication and Recording of Bit Patterned Media Prepared by Rotary
   Stage Electron Beam Lithography
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT Conference on International Magnetics (INTERMAG)
CY APR 25-29, 2011
CL Taipei, TAIWAN
SP IEEE Magnet Soc Educ Comm
DE Bit patterned media; patterned servo; electron beam lithography; ion
   milling
ID CHALLENGES; TRACK
AB Bit patterned media (BPM) is a promising technology for hard disk drive recording at ultra-high areal densities of 1 Tbit/in(2) and beyond. However, for BPM to be commercially viable, nanoscale bit patterns must be fabricated at low cost on a large scale and with low defect densities. The most likely route to realizing such criteria is through the use of high throughput nanoimprint lithography followed by direct etching of the recording media, where the bit pattern template is generated by highly accurate electron beam mastering tools. In this work, we experimentally demonstrate the merits of rotary stage electron beam mastering and the subsequent effects of direct pattern transfer on BPM and servo arrays patterned into 2.5 '' commercially available CoCrPt perpendicular recording media (PRM) at a density of 366 Gbit/in(2). The 42 nm pitch staggered bit patterns and corresponding servo arrays were lithographically generated by a Pioneer Corporation EBR-401 rotary stage electron beam mastering system and subsequently transferred into the media using a series of reactive ion etching and ion milling processes with C/SiNx mask structures and a novel Al protection layer. The fabricated media was recorded and read back with a commercial recording head to verify pattern fidelity.
C1 [Moneck, Matthew T.; Lin, Wen-Chin; Powell, Stephen P.; Bain, James A.; Zhu, Jian-Gang] Carnegie Mellon Univ, Dept Elect & Comp Engn, Pittsburgh, PA 15213 USA.
   [Okada, Takeru; Fujimori, Jiro; Kasuya, Takayuki; Katsumura, Masahiro; Iida, Tetsuya; Kuriyama, Kazumi] Pioneer Corp, Tokorozawa, Saitama 3591167, Japan.
   [Sokalski, Vincent; Bain, James A.; Zhu, Jian-Gang] Carnegie Mellon Univ, Dept Mat Sci & Engn, Pittsburgh, PA 15213 USA.
RP Moneck, MT (reprint author), Carnegie Mellon Univ, Dept Elect & Comp Engn, Pittsburgh, PA 15213 USA.
EM mmoneck@andrew.cmu.edu
RI Sokalski, Vincent/F-5419-2015
OI Sokalski, Vincent/0000-0003-4780-7867; Bain, James/0000-0002-5355-5048
CR Che XD, 2007, IEEE T MAGN, V43, P4106, DOI 10.1109/TMAG.2007.908279
   Dobisz EA, 2008, P IEEE, V96, P1836, DOI 10.1109/JPROC.2008.2007600
   Kitahara H, 2010, JPN J APPL PHYS, V49, DOI 10.1143/JJAP.49.06GE02
   MILEHAM JR, 1995, APPL PHYS LETT, V67, P1119, DOI 10.1063/1.114980
   Moneck MT, 2007, IEEE T MAGN, V43, P2127, DOI 10.1109/TMAG.2007.893706
   Richter HJ, 2009, J MAGN MAGN MATER, V321, P467, DOI 10.1016/j.jmmm.2008.04.161
   Terris BD, 2009, J MAGN MAGN MATER, V321, P512, DOI 10.1016/j.jmmm.2008.05.046
   Yang X, 2007, J VAC SCI TECHNOL B, V25, P2202, DOI 10.1116/1.2798711
   Yang XM, 2008, J VAC SCI TECHNOL B, V26, P2604, DOI 10.1116/1.2978487
   Zhou YC, 2005, J APPL PHYS, V97, pN903, DOI 10.1063/1.1853893
NR 10
TC 2
Z9 2
U1 0
U2 3
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD OCT
PY 2011
VL 47
IS 10
BP 2656
EP 2659
DI 10.1109/TMAG.2011.2157671
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 840DJ
UT WOS:000296418200084
ER

PT J
AU Myo, KS
   Zhou, WD
   Yu, SK
   Hua, W
AF Myo, Kyaw Sett
   Zhou, Weidong
   Yu, Shengkai
   Hua, Wei
TI Direct Monte Carlo Simulations of Air Bearing Characteristics on
   Patterned Media
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT Conference on International Magnetics (INTERMAG)
CY APR 25-29, 2011
CL Taipei, TAIWAN
SP IEEE Magnet Soc Educ Comm
DE Air bearing; direct simulation Monte Carlo (DSMC); head-disk interface;
   magnetic recording; patterned media
ID DISCRETE-TRACK; SLIDER
AB In patterned media recordings such as discrete track and bit-patterned media (BPM) recordings, the presence of pattern structures on the media surface causes the slider air bearing problems more complicated to be analyzed and studied. Using the 3-D direct simulation Monte Carlo (DSMC) method, the plain slider surface and bit/discrete track-patterned disk surface are designed for case studies in this paper. This paper reports the local bearing pressure variations acted on the slider surface due to the air bearing effects of pattern structures on the disk surface using the DSMC method. From the results obtained under the steady-state condition, it is observed that the bearing pressure profiles will be smoother and the bearing forces will approach to a stable value when the pattern pitch values are smaller than 0.4 mu m. This critical pitch value is close to 0.3 mu m that we reported previously based on modified Reynolds equations. We also investigate the effects of the pattern depth and total recess area ratio on the air bearing characteristics in BPM recording. Furthermore, in order to understand the effect of bit-pattern movements, we simulate the motion of bit-pattern structures by using four typical moving bit-pattern layouts. As of the outcomes, we can conclude that this effect could be negligible if the bit size is in several tens of nanometer scale.
C1 [Myo, Kyaw Sett; Zhou, Weidong; Yu, Shengkai; Hua, Wei] ASTAR, Data Storage Inst, Singapore 117608, Singapore.
RP Myo, KS (reprint author), ASTAR, Data Storage Inst, Singapore 117608, Singapore.
EM myo_kyaw_sett@dsi.a-star.edu.sg
CR BERTRAM N, 2000, IEEE T MAGN, V36, P4
   Bird G., 1994, MOL GAS DYNAMICS DIR
   Duwensee M, 2009, J TRIBOL-T ASME, V131, DOI 10.1115/1.2991166
   HUA W, IEEE T MAGN IN PRESS
   Huang WD, 1997, PHYS FLUIDS, V9, P1764, DOI 10.1063/1.869293
   Knigge BE, 2008, IEEE T MAGN, V44, P3656, DOI 10.1109/TMAG.2008.2002613
   Li H, 2009, TRIBOL LETT, V33, P199, DOI 10.1007/s11249-009-9409-7
   Li JH, 2007, J TRIBOL-T ASME, V129, P712, DOI 10.1115/1.2768069
   Murthy AN, 2010, TRIBOL LETT, V38, P47, DOI 10.1007/s11249-009-9570-z
   Zhou WD, 2010, PHYS REV E, V81, DOI 10.1103/PhysRevE.81.011204
NR 10
TC 9
Z9 9
U1 0
U2 8
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD OCT
PY 2011
VL 47
IS 10
BP 2660
EP 2663
DI 10.1109/TMAG.2011.2159965
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 840DJ
UT WOS:000296418200085
ER

PT J
AU Mita, S
   Van, VT
   Haga, F
AF Mita, Seiichi
   Van, Vo Tam
   Haga, Fumiya
TI Reduction of Bit Errors Due to Intertrack Interference Using LLRs of
   Neighboring Tracks
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT Conference on International Magnetics (INTERMAG)
CY APR 25-29, 2011
CL Taipei, TAIWAN
SP IEEE Magnet Soc Educ Comm
DE Bit patterned media; intertrack interference (ITI); LDPC codes;
   multiple-input and multiple-output (MIMO); partial response; shingled
   write recording
AB Suppressing intertrack interference (ITI) and intersymbol interference (ISI) is crucial for achieving high-density magnetic recording beyond 10 Tera bits/inch(2). We propose a novel iterative method for reducing errors caused by ITI and ISI involving the adaptive estimation of ITI and the log likelihood ratios obtained from signals of neighboring tracks. This method is useful for decoding signals recorded by bit-patterned media and conventional media. Moreover, the method is extended to decode signals from the Voronoi-based discrete grain model for shingled write recording (SWR), accounting for four neighboring bits. Bit errors due to both neighboring track shifts of approximately 20% can be canceled for BPM and SWR.
C1 [Mita, Seiichi; Van, Vo Tam; Haga, Fumiya] Toyota Technol Inst, Tempa Ku, Nagoya, Aichi 4688511, Japan.
RP Mita, S (reprint author), Toyota Technol Inst, Tempa Ku, Nagoya, Aichi 4688511, Japan.
EM smita@toyota-ti.ac.jp
CR Chan KS, 2009, IEEE T MAGN, V45, P3837, DOI 10.1109/TMAG.2009.2024001
   FUJII M, 2010, MR201044, P15
   Krishnan AR, 2009, IEEE T MAGN, V45, P3830, DOI 10.1109/TMAG.2009.2023233
   Krishnan AR, 2009, IEEE T MAGN, V45, P3679, DOI 10.1109/TMAG.2009.2023244
   Mita S., 2009, MR200942 IEICE, P35
   Ozaki K., 2010, PMRC2010 SEND JAP MA, P158
   Wood R, 2009, IEEE T MAGN, V45, P917, DOI 10.1109/TMAG.2008.2010676
NR 7
TC 4
Z9 4
U1 0
U2 1
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD OCT
PY 2011
VL 47
IS 10
BP 3316
EP 3319
DI 10.1109/TMAG.2011.2153834
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 840DJ
UT WOS:000296418200258
ER

PT J
AU Phakphisut, W
   Supnithi, P
   Sopon, T
   Myint, LMM
AF Phakphisut, Watid
   Supnithi, Pornchai
   Sopon, Thanomsak
   Myint, Lin M. M.
TI Serial Belief Propagation for The High-Rate LDPC Decoders and
   Performances in The Bit Patterned Media Systems With Media Noise
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT Conference on International Magnetics (INTERMAG)
CY APR 25-29, 2011
CL Taipei, TAIWAN
SP IEEE Magnet Soc Educ Comm
DE Low-density parity-check codes; belief propagation; layered belief
   propagation; bit patterned media
ID CODES
AB In this work, we propose to use the serial belief propagation or serial scheduling in the 2-D bit patterned media (BPM) system with media noise. The serial scheduling methods are applied to the random LDPC codes and quasi-cyclic LDPC (QC-LDPC) codes of high code rates. Both are constructed from the progress-edge growth (PEG) algorithm. We compare the performance of the LDPC codes using the serial belief propagation and the conventional belief propagation (BP) decoding. The simulation results show that the serial scheduling provides a faster convergence speed and a better bit error rate performance than the conventional BP in an AWGN channel. The serial belief propagation is also shown to offer the performance gains over the BP decoding for the BPM system with various media noise levels.
C1 [Phakphisut, Watid; Supnithi, Pornchai] King Mongkuts Inst Technol, Fac Engn, Telecommun Engn Dept, Bangkok 10520, Thailand.
   [Supnithi, Pornchai; Sopon, Thanomsak] King Mongkuts Inst Technol, Coll Data Storage Innovat, Bangkok 10520, Thailand.
   [Myint, Lin M. M.] Shinawatra Univ, Sch Technol, Pathum Thani 12160, Thailand.
RP Supnithi, P (reprint author), King Mongkuts Inst Technol, Fac Engn, Telecommun Engn Dept, Bangkok 10520, Thailand.
EM ksupornc@kmitl.ac.th
RI Supnithi, Pornchai/G-4403-2015
CR Chang W, 2010, IEEE T MAGN, V46, P3899, DOI 10.1109/TMAG.2010.2056926
   Chen L, 2004, IEEE T COMMUN, V52, P1038, DOI 10.1109/TCOMM.2004.831353
   Guilloud F, 2007, IEEE T COMMUN, V55, P2084, DOI 10.1109/TCOMM.2007.908517
   Hocevar D., 2004, P IEEE WORKSH SIGN P, P107
   Hu XY, 2005, IEEE T INFORM THEORY, V51, P386, DOI 10.1109/TIT.2004.839541
   Juntan Z., 2002, P 36 AS C SIGN SYST, P8
   Kfir H, 2003, PHYSICA A, V330, P259, DOI 10.1016/j.physa.2003.08.015
   Kim J, 2011, IEEE T MAGN, V47, P594, DOI 10.1109/TMAG.2010.2100371
   Liu XC, 2009, IEEE T MAGN, V45, P3699, DOI 10.1109/TMAG.2009.2023422
   MacKay DJC, 1996, ELECTRON LETT, V32, P1645, DOI 10.1049/el:19961141
   Mansour MM, 2003, IEEE T VLSI SYST, V11, P976, DOI 10.1109/TVLSI.2003.817545
   NABAVI S, 2007, P IEEE INT C COMM IC, P6249
   Nabavi S, 2009, IEEE T MAGN, V45, P3523, DOI 10.1109/TMAG.2009.2022493
   Nabavi S, 2008, IEEE T MAGN, V44, P3789, DOI 10.1109/TMAG.2008.2002387
   TANNER RM, 1981, IEEE T INFORM THEORY, V27, P533, DOI 10.1109/TIT.1981.1056404
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
   Yeo E., 2001, P IEEE GLOB TEL C 20, V5, P3019
   Zongwang L., 2004, P 38 AS C SIGN SYST, P1990
NR 18
TC 3
Z9 3
U1 2
U2 5
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD OCT
PY 2011
VL 47
IS 10
BP 3562
EP 3565
DI 10.1109/TMAG.2011.2155049
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 840DJ
UT WOS:000296418200322
ER

PT J
AU Nakamura, Y
   Bandai, Y
   Okamoto, Y
   Osawa, H
   Aoi, H
   Muraoka, H
AF Nakamura, Yasuaki
   Bandai, Yasuhisa
   Okamoto, Yoshihiro
   Osawa, Hisashi
   Aoi, Hajime
   Muraoka, Hiroaki
TI A Study on Nonbinary LDPC Coding and Iterative Decoding System in BPM
   R/W Channel
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT Conference on International Magnetics (INTERMAG)
CY APR 25-29, 2011
CL Taipei, TAIWAN
SP IEEE Magnet Soc Educ Comm
DE Bit-patterned media (BPM); iterative decoding; nonbinary low-density
   parity-check (LDPC) code
AB In this paper, the iterative decoding system using the nonbinary low-density parity-check (LDPC) code is studied in the magnetic recording system using a bit-patterned media (BPM) R/W channel affected by the write head field gradient, the media switching field distribution (SFD), the demagnetization field from adjacent dots, and the dot position deviation in an areal recording density of 2 Tb/in(2). The performance of iterative decoding system using the nonbinary LDPC code over Galois field of GF(2(8)) is evaluated by the computer simulation, and it is compared with the conventional iterative decoding system using the binary LDPC code. The results show that the nonbinary LDPC system provides better performance compared with the binary LDPC system.
C1 [Nakamura, Yasuaki; Bandai, Yasuhisa; Okamoto, Yoshihiro] Ehime Univ, Grad Sch Sci & Engn, Matsuyama, Ehime 7908577, Japan.
   [Osawa, Hisashi] Ehime Univ, Inst Collaborat Relat, Matsuyama, Ehime 7908577, Japan.
   [Aoi, Hajime; Muraoka, Hiroaki] Tohoku Univ, Elect Commun Res Inst, Sendai, Miyagi 9808577, Japan.
RP Nakamura, Y (reprint author), Ehime Univ, Grad Sch Sci & Engn, Matsuyama, Ehime 7908577, Japan.
EM nakamura@rec.ee.ehime-u.ac
CR Davey MC, 1998, IEEE COMMUN LETT, V2, P165, DOI 10.1109/4234.681360
   Kretzmer K.R., 1966, IEEE T COMMUN TECHNO, V14, P67
   Muraoka H., 2009, IEEE T MAGN, V44, P3423
   NAKAMURA Y, 2010, 9 PERP MAGN REC C SE, P168
   Nakamura Y, 2007, IEEE T MAGN, V43, P2277, DOI 10.1109/TMAG.2007.893421
   Sawaguchi H., 1998, P GLOBECOM 98 SYDN N, P2694
   SUZUKI Y, 2005, J APPL PHYS, V97, P3
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
   Wymeersch H., 2004, P IEEE INT C COMM PA, P772
NR 9
TC 6
Z9 6
U1 0
U2 3
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD OCT
PY 2011
VL 47
IS 10
BP 3566
EP 3569
DI 10.1109/TMAG.2011.2147766
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 840DJ
UT WOS:000296418200323
ER

PT J
AU Murakoshi, T
   Komine, T
   Sugita, R
AF Murakoshi, Takuji
   Komine, Takashi
   Sugita, Ryuji
TI Magnetization Distribution of Tb/in(2) Class Hard Disks Recorded With
   Bit Printing and Edge Printing
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT Conference on International Magnetics (INTERMAG)
CY APR 25-29, 2011
CL Taipei, TAIWAN
SP IEEE Magnet Soc Educ Comm
DE Bit printing; edge printing; L/S and checkerboard patterns; printing
   performance; Tb/in(2) class hard disks (HDs)
ID MEDIA; PATTERNS
AB In this paper, printing characteristics for the bit printing and the edge printing were compared by micromagnetic simulation. As a result, servo signal can be clearly recorded using both printing methods, and printing field dependence of printing performance for each method is considerably different. The transition of bit-printed magnetization is almost straight for any pattern, while that of edge-printed magnetization has several ridges. On the other hand, the edge printing is robust for the change in the printing field, compared with the bit printing.
C1 [Murakoshi, Takuji; Komine, Takashi; Sugita, Ryuji] Ibaraki Univ, Dept Media & Telecommun Engn, Ibaraki 3168511, Japan.
RP Komine, T (reprint author), Ibaraki Univ, Dept Media & Telecommun Engn, Ibaraki 3168511, Japan.
EM komine@mx.ibaraki.ac.jp
OI Komine, Takashi/0000-0001-9149-5288
CR Baker BR, 2002, J APPL PHYS, V91, P8691, DOI 10.1063/1.1457448
   BANDICC ZZ, 2003, APPL PHYS LETT, V82, P1
   Inaba Y, 2006, J APPL PHYS, V99, DOI 10.1063/1.2177068
   Komine T, 2008, IEEE T MAGN, V44, P3416, DOI 10.1109/TMAG.2008.2002367
   Saito A, 2002, J APPL PHYS, V91, P8688, DOI 10.1063/1.1456050
   Sheeda N, 2009, IEEE T MAGN, V45, P3676, DOI 10.1109/TMAG.2009.2022950
   Sugita R, 2002, J APPL PHYS, V91, P8694, DOI 10.1063/1.1453356
   Suzuki H, 2004, IEEE T MAGN, V40, P2528, DOI 10.1109/TMAG.2004.832364
   Victora RH, 2005, IEEE T MAGN, V41, P2828, DOI 10.1109/TMAG.2005.855263
NR 9
TC 0
Z9 0
U1 0
U2 2
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD OCT
PY 2011
VL 47
IS 10
BP 3574
EP 3577
DI 10.1109/TMAG.2011.2157314
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 840DJ
UT WOS:000296418200325
ER

PT J
AU Choe, G
   Park, J
AF Choe, Gunn
   Park, Jihoon
TI Recording Performance Analysis of Perpendicular Magnetic Recording Media
   With Anisotropy Graded Oxide and Cap Layers
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT Conference on International Magnetics (INTERMAG)
CY APR 25-29, 2011
CL Taipei, TAIWAN
SP IEEE Magnet Soc Educ Comm
DE Anisotropy grading; exchange coupled granular media; magnetic reversal
   behavior; perpendicular magnetic recording
ID WRITEABILITY
AB We have experimentally and analytically studied the writeability and recording characteristics of perpendicular magnetic recording media in which the anisotropy (K(u)) of the granular oxides and the magnetization (M(s)) and lateral exchange coupling (A(ex)) of the cap layer were varied. The analytical results are obtained with a 9-spin model, which consists of 3 grains with 3 layers each, representing dual oxide media with a capping layer. The 9-spin model estimates bit error rate (BER) using an error-pattern-correcting code (EPCC) based iterative channel model. The experimental results qualitatively agree well with the analytical results of the 9-spin model. High K(u) gradient oxides and high M(s) cap layer improve writeability and BER, whereas high A(ex) in the cap layer degrades switching field distribution and off-track capability. Media switching field and switching field distribution strongly depend on spatial distribution of the external field. Both experimental and analytical results indicate that an appropriate design of K(u) graded media with an optimum cap layer can effectively reduce jitter and switching field distribution for given head fields, resulting in higher recording density.
C1 [Choe, Gunn] Hitachi Global Storage Technol Inc, Media Dev, San Jose, CA 95119 USA.
   [Park, Jihoon] Hitachi Global Storage Technol Inc, Adv Recording Syst, San Jose, CA 95119 USA.
RP Choe, G (reprint author), Hitachi Global Storage Technol Inc, Media Dev, San Jose, CA 95119 USA.
EM gunn.choe@hitachigst.com
CR Choe G, 2011, IEEE T MAGN, V47, P55, DOI 10.1109/TMAG.2010.2074190
   Choe G, 2010, IEEE T MAGN, V46, P1802, DOI 10.1109/TMAG.2009.2038928
   Choe G, 2009, IEEE T MAGN, V45, P2694, DOI 10.1109/TMAG.2009.2018644
   LENGSFIELD B, 2011, P INTERMAG2011 TAIW
   Park J, 2009, IEEE T INFORM THEORY, V55, P1747, DOI 10.1109/TIT.2009.2013019
   Sonobe Y, 2002, IEEE T MAGN, V38, P2006, DOI 10.1109/TMAG.2002.801810
   Suess D, 2006, APPL PHYS LETT, V89, DOI 10.1063/1.2347894
   Suess D, 2005, APPL PHYS LETT, V87, DOI 10.1063/1.1951053
   Victora RH, 2005, IEEE T MAGN, V41, P537, DOI 10.1109/TMAG.2004.838075
NR 9
TC 2
Z9 2
U1 2
U2 5
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD OCT
PY 2011
VL 47
IS 10
BP 4058
EP 4061
DI 10.1109/TMAG.2011.2157467
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 840DJ
UT WOS:000296418200446
ER

PT J
AU Adamatzky, A
   Holley, J
   Bull, L
   Costello, BD
AF Adamatzky, Andrew
   Holley, Julian
   Bull, Larry
   Costello, Ben De Lacy
TI On computing in fine-grained compartmentalised Belousov-Zhabotinsky
   medium
SO CHAOS SOLITONS & FRACTALS
LA English
DT Article
ID BINARY COLLISIONS; CHEMICAL-REACTION; WAVE-FRAGMENTS; PROPAGATION;
   OPERATIONS; PATTERNS; PULSES; MOTION; MODEL
AB We introduce results of computer experiments on information processing in a hexagonal array of vesicles filled with Belousov-Zhabotinsky (BZ) solution in a sub-excitable mode. We represent values of Boolean variables by excitation wave-fragments and implement basic logical gates by colliding the wave-fragments. We show that a vesicle filled with BZ mixture can implement a range of basic logical functions. We cascade BZ-vesicle logical gates into arithmetic circuits implementing addition of two one-bit binary numbers. We envisage that our theoretical results will be applied in chemical laboratory designs of massive-parallel computers based on fine-grained compartmentalisation of excitable chemical systems. (C) 2011 Elsevier Ltd. All rights reserved.
C1 [Adamatzky, Andrew; Holley, Julian; Bull, Larry; Costello, Ben De Lacy] Univ W England, Bristol BS16 1QY, Avon, England.
RP Adamatzky, A (reprint author), Univ W England, Bristol BS16 1QY, Avon, England.
EM andrew.adamatzky@uwe.ac.uk
FU European project under 7th FWP (Seventh Framework Programme) [248992,
   ICT-2009.8.3]
FX The work is part of the European project 248992 funded under 7th FWP
   (Seventh Framework Programme) FET Proactive 3: Bio-Chemistry-Based
   Information Technology CHEM-IT (ICT-2009.8.3). We thank the project
   coordinator Peter Dittrich and project partners Jerzy Gorecki and
   Klaus-Peter Zauner for their inspirations and useful discussions.
CR Adamatzky A, 2004, CHAOS SOLITON FRACT, V21, P1259, DOI 10.1016/j.chaos.2003.12.068
   ADAMATZKY A, J COMPUTATI IN PRESS
   Adamatzky A., 2002, COLLISION BASED COMP
   Adamatzky A., 2005, REACTION DIFFUSION C
   Adamatzky A., 2010, ARXIV10052301V1NLINP
   Adamatzky A, 2007, CHAOS SOLITON FRACT, V34, P307, DOI 10.1016/j.chaos.2006.03.095
   Beato V, 2003, P SOC PHOTO-OPT INS, V5114, P353, DOI 10.1117/12.490183
   Costello BD, 2009, PHYS REV E, V79, DOI 10.1103/PhysRevE.79.026114
   Epstein IR, 2005, CHAOS, V15, DOI 10.1063/1.2102447
   FIELD RJ, 1974, J CHEM PHYS, V60, P1877, DOI 10.1063/1.1681288
   FREDKIN E, 1982, INT J THEOR PHYS, V21, P219, DOI 10.1007/BF01857727
   Gorecka J, 2003, PHYS REV E, V67, DOI 10.1103/PhysRevE.67.067203
   Gorecka J, 2006, J CHEM PHYS, V124, DOI 10.1063/1.2170076
   Gorecki J, 2003, J PHYS CHEM A, V107, P1664, DOI 10.1021/jp021041f
   Gorecki J, 2005, PHYS REV E, V72, DOI 10.1103/PhysRevE.72.046201
   GORECKI J, 2009, NAT COMPUT, V8, P473, DOI DOI 10.1007/s11047-009-9119-y
   Gorecki J., 2006, INT J UNCONV COMPUT, V2, P321
   Kitahata H, 2006, PROG THEOR PHYS SUPP, P220
   Kitahata H, 2002, J CHEM PHYS, V116, P5666, DOI 10.1063/1.1456023
   Motoike IN, 2003, CHAOS SOLITON FRACT, V17, P455, DOI 10.1016/S0960-0779(02)00388-0
   *NEUNEU, 2010, ART WET NEUR NETW CO
   Sakurai T, 2002, SCIENCE, V296, P2009, DOI 10.1126/science.1071265
   Sielewiesiuk J, 2001, J PHYS CHEM A, V105, P8189, DOI 10.1021/jp011072v
   SZYMANSKI J, INT UNCONVE IN PRESS
   Toth R., 2009, J NANOTECH MOL COMPU, V1, P1
   Toth R, 2009, CHAOS SOLITON FRACT, V41, P1605, DOI 10.1016/j.chaos.2008.07.001
   Yoshikawa K, 2009, INT J UNCONV COMPUT, V5, P3
   Yoshikawa K, 2009, INT J UNCONV COMPUT, V5, P53
NR 28
TC 9
Z9 9
U1 0
U2 5
PU PERGAMON-ELSEVIER SCIENCE LTD
PI OXFORD
PA THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD OX5 1GB, ENGLAND
SN 0960-0779
J9 CHAOS SOLITON FRACT
JI Chaos Solitons Fractals
PD OCT
PY 2011
VL 44
IS 10
BP 779
EP 790
DI 10.1016/j.chaos.2011.03.010
PG 12
WC Mathematics, Interdisciplinary Applications; Physics, Multidisciplinary;
   Physics, Mathematical
SC Mathematics; Physics
GA 840AF
UT WOS:000296409900001
ER

PT J
AU Liu, B
   Gao, J
   Tao, W
   Dou, GQ
AF Liu, Bing
   Gao, Jun
   Tao, Wei
   Dou, Gaoqi
TI Weighted symbol-flipping decoding algorithm for nonbinary LDPC codes
   with flipping patterns
SO JOURNAL OF SYSTEMS ENGINEERING AND ELECTRONICS
LA English
DT Article
DE nonbinary; low-density parity-check (LDPC) codes; quasi-cyclic;
   symbol-flipping (SF) decoding
ID PARITY-CHECK CODES; SHANNON LIMIT; CONSTRUCTION; FIELDS
AB A novel low-complexity weighted symbol-flipping algorithm with flipping patterns to decode nonbinary low-density parity-check codes is proposed. The proposed decoding procedure updates the hard-decision received symbol vector iteratively in search of a valid codeword in the symbol vector space. Only one symbol is flipped in each iteration, and symbol flipping function, which is employed as the symbol flipping metric, combines the number of failed checks and the reliabilities of the received bits and calculated symbols. A scheme to avoid infinite loops and select one symbol to flip in high order Galois field search is also proposed. The design of flipping pattern's order and depth, which is dependent of the computational requirement and error performance, is also proposed and exemplified. Simulation results show that the algorithm achieves an appealing tradeoff between performance and computational requirement over relatively low Galois field for short to medium code length.
C1 [Liu, Bing] Marine Commun Technol Inst, Beijing 100841, Peoples R China.
   [Liu, Bing; Gao, Jun; Tao, Wei; Dou, Gaoqi] Naval Univ Engn, Elect Coll Engn, Wuhan 430033, Peoples R China.
   [Tao, Wei] China Marine Dev & Res Ctr, Beijing 100161, Peoples R China.
RP Liu, B (reprint author), Marine Commun Technol Inst, Beijing 100841, Peoples R China.
EM liubing5275093@hotmail.com; gaojunnj@163.com; alantao0451@yahoo.com.cn;
   gqdou0917@163.com
CR Barnault L., 2003, Proceedings 2003 IEEE Information Theory Workshop (Cat. No.03EX674), P70, DOI 10.1109/ITW.2003.1216697
   Chen C, 2010, IEEE COMMUN LETT, V14, P239, DOI 10.1109/LCOMM.2010.03.092296
   Chung SY, 2001, IEEE COMMUN LETT, V5, P58, DOI 10.1109/4234.905935
   Davey MC, 1998, IEEE COMMUN LETT, V2, P165, DOI 10.1109/4234.681360
   Declercq D, 2007, IEEE T COMMUN, V55, P633, DOI 10.1109/TCOMM.2007.894088
   GALLAGER RG, 1962, IRE T INFORM THEOR, V8, P21, DOI 10.1109/TIT.1962.1057683
   Huang Q, 2009, IEEE T COMMUN, V57, P3597, DOI 10.1109/TCOMM.2009.12.080493
   Kang JY, 2010, IEEE T COMMUN, V58, P1383, DOI 10.1109/TCOMM.2010.05.090211
   LIU B, 2010, P 2 INT C NETW SEC W, P223
   Liu ZY, 2005, IEEE T COMMUN, V53, P415, DOI 10.1109/TCOMM.2005.843413
   MacKay DJC, 1996, ELECTRON LETT, V32, P1645, DOI 10.1049/el:19961141
   MASSEY JL, 1969, IEEE T INFORM THEORY, V15, P122, DOI 10.1109/TIT.1969.1054260
   Ngatched TMN, 2009, IEEE T COMMUN, V57, P302, DOI 10.1109/TCOMM.2009.02.060352
   Song HX, 2003, IEEE T MAGN, V39, P1081, DOI 10.1109/TMAG.2003.808600
   Song SM, 2009, IEEE T COMMUN, V57, P84, DOI 10.1109/TCOMM.2009.0901.060129
   Voicila A, 2010, IEEE T COMMUN, V58, P1365, DOI 10.1109/TCOMM.2010.05.070096
   Wu XF, 2009, IEEE T COMMUN, V57, P2177, DOI 10.1109/TCOMM.2009.08.070257
   Wymeersch H., 2004, IEEE INT C COMM JUN, P772
   Zeng LQ, 2008, IEEE T COMMUN, V56, P545, DOI 10.1109/TCOMM.2008.060024
NR 19
TC 5
Z9 5
U1 1
U2 7
PU SYSTEMS ENGINEERING & ELECTRONICS, EDITORIAL DEPT
PI BEIJING
PA PO BOX 142-32, BEIJING, 100854, PEOPLES R CHINA
SN 1004-4132
J9 J SYST ENG ELECTRON
JI J. Syst. Eng. Electron.
PD OCT
PY 2011
VL 22
IS 5
BP 848
EP 855
DI 10.3969/j.issn.1004-4132.2011.05.018
PG 8
WC Automation & Control Systems; Engineering, Electrical & Electronic;
   Operations Research & Management Science
SC Automation & Control Systems; Engineering; Operations Research &
   Management Science
GA 838IW
UT WOS:000296282600018
ER

PT J
AU Kurt, H
   Rode, K
   Venkatesan, M
   Stamenov, P
   Coey, JMD
AF Kurt, H.
   Rode, K.
   Venkatesan, M.
   Stamenov, P.
   Coey, J. M. D.
TI Mn3-xGa (0 <= x <= 1): Multifunctional thin film materials for
   spintronics and magnetic recording
SO PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS
LA English
DT Article
DE exchange bias; Heusler alloys; magnetic anisotropy; spin-polarized
   transport; spin transfer torque
ID PERPENDICULAR-ANISOTROPY; HEUSLER COMPOUNDS; TUNNEL-JUNCTION; ALLOYS;
   MEDIA; BEHAVIOR; MN3GA
AB Tetragonal Mn3-xGa (0 <= x <= 1) epitaxial films possess exceptional magnetic and electronic properties. Stoichiometric Mn3Ga crystallizes in the D0(22) structure (abstract figure) and is a collinear ferrimagnet with an easy c-axis. It exhibits a unique combination of low magnetization, high uniaxial anisotropy, high Curie temperature and high spin polarization, which suit the requirements for spin torque memories down to 10 nm in size. Mn2Ga, on the other hand, exhibits much higher magnetization, high perpendicular anisotropy and high Curie temperature but a lower spin polarization, which make it a potential candidate for high density bit-patterned recording with areal densities up to 10 Tb inch(-2) (similar to 15 kb mu m(-2)) and 10-year thermal stability. The flexibility of the D0(22) structure allows a variety of magnetic materials to be synthesized with varying x to suit specific magnetic applications. Hexagonal D0(19)-Mn3Ga films are antiferromagnetic, which could be useful for exchange bias.
   [GRAPHICS]
   .
   (C) 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
C1 [Kurt, H.] Trinity Coll Dublin, Sch Phys, Dublin 2, Ireland.
   Trinity Coll Dublin, CRANN, Dublin 2, Ireland.
RP Kurt, H (reprint author), Trinity Coll Dublin, Sch Phys, Dublin 2, Ireland.
EM kurth@tcd.ie
RI Rode, Karsten/G-5914-2014; Kurt, Huseyin/F-1427-2015
OI Rode, Karsten/0000-0003-2685-6547; Kurt, Huseyin/0000-0003-0710-9466
FU SFI as part of the MANSE [2005/IN/1850]; Irish Government
FX We thank Dr. Nadjib Baadji for helpful discussions. This work was
   supported by SFI as part of the MANSE project 2005/IN/1850, and was
   conducted under the framework of the INSPIRE programme, funded by the
   Irish Government's Programme for Research in Third Level Institutions,
   Cycle 4, National Development Plan 2007-2013.
CR Balke B, 2007, APPL PHYS LETT, V90, DOI 10.1063/1.2722206
   Chadov S, 2010, NAT MATER, V9, P541, DOI [10.1038/nmat2770, 10.1038/NMAT2770]
   Challener WA, 2009, NAT PHOTONICS, V3, P220, DOI 10.1038/NPHOTON.2009.26
   CUI G, 1993, MATER RES SOC S P, V310, P345, DOI 10.1557/PROC-310-345
   Galanakis I, 2006, J PHYS D APPL PHYS, V39, P765, DOI 10.1088/0022-3727/39/5/S01
   Galanakis I, 2002, PHYS REV B, V66, DOI 10.1103/PhysRevB.66.174429
   Ikeda S, 2010, NAT MATER, V9, P721, DOI [10.1038/nmat2804, 10.1038/NMAT2804]
   Johnson MT, 1996, REP PROG PHYS, V59, P1409, DOI 10.1088/0034-4885/59/11/002
   Katine JA, 2008, J MAGN MAGN MATER, V320, P1217, DOI 10.1016/j.jmmm.2007.12.013
   KREN E, 1970, SOLID STATE COMMUN, V8, P1653, DOI 10.1016/0038-1098(70)90484-9
   KUBLER J, 1983, PHYS REV B, V28, P1745, DOI 10.1103/PhysRevB.28.1745
   Kurt H, 2011, PHYS REV B, V83, DOI 10.1103/PhysRevB.83.020405
   Lin H, 2010, NAT MATER, V9, P546, DOI [10.1038/nmat2771, 10.1038/NMAT2771]
   Mangin S, 2006, NAT MATER, V5, P210, DOI 10.1038/nmat1595
   Niida H, 1996, J APPL PHYS, V79, P5946, DOI 10.1063/1.362115
   NIIDA H, 1983, J PHYS SOC JPN, V52, P1512, DOI 10.1143/JPSJ.52.1512
   O'Connor D, 2010, NAT NANOTECHNOL, V5, P482, DOI 10.1038/nnano.2010.137
   Stipe BC, 2010, NAT PHOTONICS, V4, P484, DOI 10.1038/nphoton.2010.90
   Suess D, 2005, J MAGN MAGN MATER, V290, P551, DOI 10.1016/j.jmmm.2004.11.525
   TERRY WM, 2005, J PHYS CONDENS MATT, V17, pR315
   Thiele JU, 2003, APPL PHYS LETT, V82, P2859, DOI 10.1063/1.1571232
   Tomeno I, 1999, J APPL PHYS, V86, P3853, DOI 10.1063/1.371298
   Victora RH, 2005, IEEE T MAGN, V41, P537, DOI 10.1109/TMAG.2004.838075
   Weller D, 2000, IEEE T MAGN, V36, P10, DOI 10.1109/20.824418
   Winterlik J, 2008, PHYS REV B, V77, DOI 10.1103/PhysRevB.77.054406
   Wood R, 2000, IEEE T MAGN, V36, P36, DOI 10.1109/20.824422
   Wu F, 2009, APPL PHYS LETT, V94, DOI 10.1063/1.3108085
   Wurmehl S, 2006, J PHYS-CONDENS MAT, V18, P6171, DOI 10.1088/0953-8984/18/27/001
   YAMADA N, 1990, J PHYS SOC JPN, V59, P273, DOI 10.1143/JPSJ.59.273
   Yoshikawa M, 2008, IEEE T MAGN, V44, P2573, DOI 10.1109/TMAG.2008.2003059
NR 30
TC 69
Z9 69
U1 10
U2 82
PU WILEY-V C H VERLAG GMBH
PI WEINHEIM
PA BOSCHSTRASSE 12, D-69469 WEINHEIM, GERMANY
SN 0370-1972
J9 PHYS STATUS SOLIDI B
JI Phys. Status Solidi B-Basic Solid State Phys.
PD OCT
PY 2011
VL 248
IS 10
BP 2338
EP 2344
DI 10.1002/pssb.201147122
PG 7
WC Physics, Condensed Matter
SC Physics
GA 834OX
UT WOS:000295972900017
ER

PT J
AU Lopich, A
   Dudek, P
AF Lopich, Alexey
   Dudek, Piotr
TI A SIMD Cellular Processor Array Vision Chip With Asynchronous Processing
   Capabilities
SO IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS
LA English
DT Article
DE Asynchronous image processing; cellular processor array; smart sensor;
   vision chip
ID MASSIVELY-PARALLEL PROCESSOR; IMAGE-PROCESSOR; SENSOR; IMPLEMENTATION;
   ARCHITECTURE; DESIGN; VLSI
AB This paper describes an architecture and implementation of a digital vision chip that features mixed asynchronous/synchronous processing techniques. The vision chip is based on a massively parallel cellular array of processing elements, which incorporate a photo-sensor with an ADC and digital processing circuit, consisting of 64 bits of local memory, ALU, flag register and communication units. The architecture has two modes of operation: synchronous SIMD mode for low-level image processing based on local pixel data, and continuous-time mode for global operations. Additionally, the periphery circuits enable asynchronous address extraction, fixed pattern addressing and flexible, random access data I/O. A 19 22 proof-of-concept array has been manufactured in 0.35 mu m CMOS technology. The chip delivers 15.6 GOPS for binary and 1 GOPS for grayscale operations dissipating 26.4 mW, while operating at 2.5 V and 75 MHz clock. Experimental measurements indicate that the presented concept favorably compares with other digital and analog vision chips. The results of low- and medium-level image processing on the chip are presented.
C1 [Lopich, Alexey; Dudek, Piotr] Univ Manchester, Sch Elect & Elect Engn, Manchester M60 1QD, Lancs, England.
RP Lopich, A (reprint author), Univ Manchester, Sch Elect & Elect Engn, Manchester M60 1QD, Lancs, England.
EM a.lopich@manchester.ac.uk
CR Abbo AA, 2008, IEEE J SOLID-ST CIRC, V43, P192, DOI 10.1109/JSSC.2007.909328
   Aizawa K, 1999, IEICE T INF SYST, VE82D, P580
   BATCHER KE, 1980, IEEE T COMPUT, V29, P836
   Cheng CC, 2009, IEEE J SOLID-ST CIRC, V44, P127, DOI 10.1109/JSSC.2008.2007158
   Dudek P, 2005, IEEE T CIRCUITS-I, V52, P13, DOI 10.1109/TCSI.2004.840093
   Dudek P, 2003, PROCEEDINGS OF THE 2003 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL III, P782
   DUDEK P, 2009, P EUR C CIRC THEOR D, P193
   Dudek P, 2004, P CNNA BUD JUL, P123
   DUFF MJB, 1977, COMPUT J, V20, P68, DOI 10.1093/comjnl/20.1.68
   Eklund JE, 1996, IEEE T VLSI SYST, V4, P322, DOI 10.1109/92.532033
   Foldesy P., 2007, P IEEE INT S CIRC SY, P1177
   Galilee B, 2007, IEEE T PARALL DISTR, V18, P44, DOI 10.1109/TPDS.2007.253280
   Habibi M., 2009, IET CIRCUITS DEVICES, V4, P67
   Kitchen A, 2005, IEEE T ELECTRON DEV, V52, P2591, DOI 10.1109/TED.2005.859698
   Komuro T, 2003, IEEE T ELECTRON DEV, V50, P191, DOI 10.1109/TED.2002.807255
   Komuro T, 2009, IEEE MICRO, V29, P58, DOI 10.1109/MM.2009.89
   KYO S, 2003, ISSCC, P48
   Linan G., 2004, IEEE J SOLID-ST CIRC, V39, P1044
   Lindgren L, 2005, IEEE J SOLID-ST CIRC, V40, P1350, DOI 10.1109/JSSC.2005.848029
   Lopich A., 2010, INT J CIRCU IN PRESS
   Lopich A., 2007, P IEEE INT WORKSH CO, P16
   Lopich A, 2008, IEEE INT SYMP CIRC S, P1592, DOI 10.1109/ISCAS.2008.4541737
   Lopich A, 2006, PROCEEDINGS OF THE FOURTH IASTED INTERNATIONAL CONFERENCE ON CIRCUITS, SIGNALS, AND SYSTEMS, P296
   Miao W, 2008, IEEE J SOLID-ST CIRC, V43, P1470, DOI 10.1109/JSSC.2008.923621
   Moini A., 1999, VISION CHIPS SEEING
   Nadrag P., 2006, DISTRIBUTED SMART CA
   Noda H, 2007, IEEE J SOLID-ST CIRC, V42, P183, DOI 10.1109/JSSC.2006.886545
   Paillet F., 1999, P 12 ANN IEEE INT AS, P304
   Poikonen J., 2009, P IEEE INT S CIRC SY, P1927
   Takahashi N, 2009, IEEE T CIRCUITS-I, V56, P2384, DOI 10.1109/TCSI.2009.2015598
   [Anonymous], 2007, TMS320C64551000 TEX
   Zaghloul KA, 2004, IEEE T BIO-MED ENG, V51, P657, DOI 10.1109/TBME.2003.821039
NR 32
TC 33
Z9 33
U1 0
U2 9
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 1549-8328
EI 1558-0806
J9 IEEE T CIRCUITS-I
JI IEEE Trans. Circuits Syst. I-Regul. Pap.
PD OCT
PY 2011
VL 58
IS 10
BP 2420
EP 2431
DI 10.1109/TCSI.2011.2131370
PG 12
WC Engineering, Electrical & Electronic
SC Engineering
GA 827SD
UT WOS:000295447400013
ER

PT J
AU Li, GJ
   Leung, CW
   Lei, ZQ
   Lin, KW
   Lai, PT
   Pong, PWT
AF Li, G. J.
   Leung, C. W.
   Lei, Z. Q.
   Lin, K. W.
   Lai, P. T.
   Pong, Philip W. T.
TI Patterning of FePt for magnetic recording
SO THIN SOLID FILMS
LA English
DT Article; Proceedings Paper
CT 1st International Conference of the Asian-Union-of-Magnetics-Societies
   (AUMS)
CY DEC 05-08, 2010
CL Korean Magnet Soc, Jeju Isl, SOUTH KOREA
SP Asian Union Magnet Soc
HO Korean Magnet Soc
DE FePt; Fct phase; Thermal patterning; Self-assembly; Lithography
ID IRON-OXIDE; THIN-FILMS; NANOPARTICLES; LITHOGRAPHY; FABRICATION; MEDIA;
   PHASE; NM; DIFFRACTION; RESOLUTION
AB Higher areal density for magnetic recording is needed to provide larger storage capacities on harddisk drives. However, as the recording bit size of traditional magnetic recording materials (such as Co/Cr) approaches 10 nm. the magnetic direction of each recording bit would become unstable at room temperature due to thermal fluctuation. To solve this problem, efforts have been made using two methods: one method is to replace the disk media with new materials possessing higher magnetic anisotropy which would lead to better thermal stability: and the second one is to employ different configurations for the recording layer. FePt with patterned media configuration is a combination of these two methods. In this paper we review some novel and interesting methods of patterning FePt for magnetic recording, including thermal patteming, self-assembly patterning, and lithography patterning. (C) 2011 Elsevier B.V. All rights reserved.
C1 [Li, G. J.; Lei, Z. Q.; Lai, P. T.; Pong, Philip W. T.] Univ Hong Kong, Dept Elect & Elect Engn, Hong Kong, Hong Kong, Peoples R China.
   [Leung, C. W.] Hong Kong Polytech Univ, Dept Appl Phys, Hong Kong, Hong Kong, Peoples R China.
   [Lin, K. W.] Natl Chung Hsing Univ, Dept Mat Sci & Engn, Taichung, Taiwan.
RP Pong, PWT (reprint author), Univ Hong Kong, Dept Elect & Elect Engn, Hong Kong, Hong Kong, Peoples R China.
EM ppong@eee.hku.hk
RI Leung, Chi Wah (Dennis)/D-2085-2012; Li, Guijun/N-6865-2013
OI Leung, Chi Wah (Dennis)/0000-0003-0083-6273; Li,
   Guijun/0000-0001-6259-3209
CR Albertini F, 2008, J APPL PHYS, V104, DOI [10.1063/1.2975217, 10.1063/1.2975247]
   Bao JC, 2003, ADV MATER, V15, P1832, DOI 10.1002/adma.200305315
   Breitling A, 2009, PHYS STATUS SOLIDI-R, V3, P130, DOI 10.1002/pssr.200903074
   Breitling A, 2008, J MAGN MAGN MATER, V320, P1449, DOI 10.1016/j.jmmm.2007.12.003
   Buschbeck J, 2006, J APPL PHYS, V100, DOI 10.1063/1.2397294
   Chang CH, 2009, NANOTECHNOLOGY, V20, DOI 10.1088/0957-4484/20/49/495301
   Chen M, 2003, J MAGN MAGN MATER, V266, P8, DOI 10.1016/S0304-8853(03)00449-9
   Darling SB, 2005, ADV MATER, V17, P2446, DOI 10.1002/adma.200500960
   Endo A, 2004, IEEE J SEL TOP QUANT, V10, P1298, DOI 10.1109/JSTQE.2004.837715
   Fu YH, 2006, JPN J APPL PHYS 1, V45, P7224, DOI 10.1143/JJAP.45.7224
   Guo QJ, 2004, ADV MATER, V16, P1337, DOI 10.1002/adma.200400596
   HALILOV SV, 1993, SOLID STATE COMMUN, V88, P749, DOI 10.1016/0038-1098(93)90869-O
   Hamann HF, 2003, NANO LETT, V3, P1643, DOI 10.1021/nl034706d
   He YJ, 2005, MATER RES BULL, V40, P629, DOI 10.1016/j.materresbull.2005.01.007
   Kantor Z, 2004, THIN SOLID FILMS, V453, P350, DOI 10.1016/j.tsf.2003.11.101
   Kao TS, 2008, J MICROSC-OXFORD, V229, P561, DOI 10.1111/j.1365-2818.2008.01944.x
   Kim SW, 2002, J AM CHEM SOC, V124, P7642, DOI 10.1021/ja026032z
   Li DR, 2006, J APPL PHYS, V99, DOI 10.1063/1.2166597
   Lin GP, 2010, THIN SOLID FILMS, V518, P2167, DOI 10.1016/j.tsf.2009.10.111
   Liu C, 2005, CHEM MATER, V17, P620, DOI 10.1021/cm0403457
   Liu K, 2008, ANGEW CHEM INT EDIT, V47, P1255, DOI 10.1002/anie.200703199
   Lu LY, 2009, J PHYS CHEM C, V113, P19867, DOI 10.1021/jp9076245
   Lu MH, 2004, J APPL PHYS, V95, P6735, DOI 10.1063/1.1652412
   Mason DR, 2010, OPT LETT, V35, P2007, DOI 10.1364/OL.35.002007
   Momose S, 2007, JPN J APPL PHYS 2, V46, pL1105, DOI 10.1143/JJAP.46.L1105
   Murukeshan VM, 2009, OPT LETT, V34, P845, DOI 10.1364/OL.34.000845
   Patel RN, 2009, ACS APPL MATER INTER, V1, P1339, DOI 10.1021/am900237d
   Qiu LJ, 2007, IEEE T MAGN, V43, P2157, DOI 10.1109/TMAG.2007.893135
   Ramsay E, 2005, OPT LETT, V30, P26, DOI 10.1364/OL.30.000026
   Rong CB, 2008, J APPL PHYS, V103, DOI 10.1063/1.2832506
   Saita S, 2004, J PHYS-CONDENS MAT, V16, P6385, DOI 10.1088/0953-8984/16/36/005
   Seki T, 2006, J APPL PHYS, V100, DOI 10.1063/1.2335391
   Shick AB, 2003, PHYS REV B, V67, DOI 10.1103/PhysRevB.67.172407
   Spada FE, 2003, J APPL PHYS, V94, P5123, DOI 10.1063/1.1606522
   Stappert S, 2003, J CRYST GROWTH, V252, P440, DOI 10.1016/S0022-0248(03)00935-7
   Sun SH, 2006, ADV MATER, V18, P393, DOI 10.1002/adma.200501464
   Sun SH, 2000, SCIENCE, V287, P1989, DOI 10.1126/science.287.5460.1989
   Tanase J.-G. Z. M., 2007, METALL MATER TRANS A, V4, P798
   Tang YJ, 2006, J APPL PHYS, V99, DOI 10.1063/1.2166599
   Vedantam TS, 2003, J APPL PHYS, V93, P7184, DOI 10.1063/1.1558233
   Verdes C., 2005, APPL PHYS LETT, V86
   Weekes SM, 2004, LANGMUIR, V20, P11208, DOI 10.1021/la048695v
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
   Wu PW, 2005, NANOTECHNOLOGY, V16, P1693, DOI 10.1088/0957-4484/16/9/047
   Yang XF, 2009, OPT EXPRESS, V17, P21560, DOI 10.1364/OE.17.021560
   Yano K, 2008, J APPL PHYS, V104, DOI 10.1063/1.2953078
   Yao B, 2006, J APPL PHYS, V99, DOI 10.1063/1.2170064
   Yildirim O, 2010, INT J MOL SCI, V11, P1162, DOI 10.3390/iijms11031162
   Zeng H, 2003, J MAGN MAGN MATER, V266, P227, DOI 10.1016/S0304-8853(03)00482-7
   Zhong H, 2008, NANOTECHNOLOGY, V19, DOI 10.1088/0957-4484/19/9/095703
NR 50
TC 15
Z9 15
U1 1
U2 25
PU ELSEVIER SCIENCE SA
PI LAUSANNE
PA PO BOX 564, 1001 LAUSANNE, SWITZERLAND
SN 0040-6090
J9 THIN SOLID FILMS
JI Thin Solid Films
PD SEP 30
PY 2011
VL 519
IS 23
SI SI
BP 8307
EP 8311
DI 10.1016/j.tsf.2011.03.088
PG 5
WC Materials Science, Multidisciplinary; Materials Science, Coatings &
   Films; Physics, Applied; Physics, Condensed Matter
SC Materials Science; Physics
GA 830NH
UT WOS:000295663200028
ER

PT J
AU Yang, JKW
   Chen, YJ
   Huang, TL
   Duan, HG
   Thiyagarajah, N
   Hui, HK
   Leong, SH
   Ng, V
AF Yang, Joel K. W.
   Chen, Yunjie
   Huang, Tianli
   Duan, Huigao
   Thiyagarajah, Naganivetha
   Hui, Hui Kim
   Leong, Siang Huei
   Ng, Vivian
TI Fabrication and characterization of bit-patterned media beyond 1.5
   Tbit/in(2)
SO NANOTECHNOLOGY
LA English
DT Article
ID MAGNETIC RECORDING MEDIA; NANOIMPRINT LITHOGRAPHY; HYDROGEN
   SILSESQUIOXANE; BLOCK-COPOLYMERS; CHALLENGES; STORAGE; SCALE
AB We fabricated bit-patterned media (BPM) at densities as high as 3.3 Tbit/in(2) using a process consisting of high-resolution electron-beam lithography followed directly by magnetic film deposition. By avoiding pattern transfer processes such as etching and liftoff that inherently reduce pattern fidelity, the resolution of the final pattern was kept close to that of the lithographic step. Magnetic force microscopy (MFM) showed magnetic isolation of the patterned bits at 1.9 Tbit/in(2), which was close to the resolution limit of the MFM. The method presented will enable studies on magnetic bits packed at ultra-high densities, and can be combined with other scalable patterning methods such as templated self-assembly and nanoimprint lithography for high-volume manufacturing.
C1 [Yang, Joel K. W.; Duan, Huigao; Hui, Hui Kim] ASTAR, Inst Mat Res & Engn, Singapore 117602, Singapore.
   [Chen, Yunjie; Huang, Tianli; Leong, Siang Huei] ASTAR, Data Storage Inst, Singapore 117608, Singapore.
   [Thiyagarajah, Naganivetha; Ng, Vivian] Natl Univ Singapore, Dept Elect & Comp Engn, Singapore, Singapore.
RP Yang, JKW (reprint author), ASTAR, Inst Mat Res & Engn, 3 Res Link, Singapore 117602, Singapore.
EM yangkwj@imre.a-star.edu.sg
RI Thiyagarajah, Naganivetha/N-1613-2014; Duan, Huigao/P-6964-2014; Yang,
   Joel K.W./L-7892-2016
OI Thiyagarajah, Naganivetha/0000-0003-2888-1412; Yang, Joel
   K.W./0000-0003-3301-1040
FU Agency for Science, Technology and Research (A*STAR) in Singapore
FX The authors would like to thank Dr Ramam Akkipeddi for the use of the
   electron-beam lithography and dual-beam FIB in IMRE through the SERC
   nano Fabrication Processing and Characterization (SnFPC) facility. This
   work was supported by the Agency for Science, Technology and Research
   (A*STAR) in Singapore.
CR Amos N, 2008, APPL PHYS LETT, V93, DOI 10.1063/1.3036533
   Austin MD, 2004, APPL PHYS LETT, V84, P5299, DOI 10.1063/1.1766071
   Bigioni TP, 2006, NAT MATER, V5, P265, DOI 10.1038/nmat1611
   Bita I, 2008, SCIENCE, V321, P939, DOI 10.1126/science.1159352
   Chen YJ, 2012, J MAGN MAGN MATER, V324, P264, DOI 10.1016/j.jmmm.2010.11.094
   Chen YJ, 2008, APPL PHYS LETT, V93, DOI 10.1063/1.2978326
   Chen YJ, 2010, IEEE T MAGN, V46, P1990, DOI 10.1109/TMAG.2010.2043064
   Choi C, 2011, MICROSYST TECHNOL, V17, P395, DOI 10.1007/s00542-011-1222-1
   Duan HG, 2010, NANO LETT, V10, P3710, DOI 10.1021/nl102259s
   Hosaka S, 2006, APPL PHYS LETT, V89, DOI 10.1063/1.2400102
   Kikitsu A, 2009, J MAGN MAGN MATER, V321, P526, DOI 10.1016/j.jmmm.2008.05.039
   Kryder MH, 2005, J MAGN MAGN MATER, V287, P449, DOI 10.1016/j.jmmm.2004.10.075
   Lu W, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3378977
   Moneck MT, 2010, PROC SPIE, V7823, DOI 10.1117/12.875542
   Morecroft D, 2009, J VAC SCI TECHNOL B, V27, P2837, DOI 10.1116/1.3264670
   Park S, 2009, SCIENCE, V323, P1030, DOI 10.1126/science.1168108
   Richter HJ, 2009, J MAGN MAGN MATER, V321, P467, DOI 10.1016/j.jmmm.2008.04.161
   Ross C, 2001, ANN REV MATER RES, V31, P203, DOI 10.1146/annurev.matsci.31.1.203
   Ross CA, 1999, J VAC SCI TECHNOL B, V17, P3168, DOI 10.1116/1.590974
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Stipe BC, 2010, NAT PHOTONICS, V4, P484, DOI 10.1038/nphoton.2010.90
   Terris BD, 2007, MICROSYST TECHNOL, V13, P189, DOI 10.1007/s00542-006-0144-9
   Terris BD, 2009, J MAGN MAGN MATER, V321, P512, DOI 10.1016/j.jmmm.2008.05.046
   van Dorp WF, 2005, NANO LETT, V5, P1303, DOI 10.1021/nl050522i
   White RL, 2000, J MAGN MAGN MATER, V209, P1, DOI 10.1016/S0304-8853(99)00632-0
   Wood R, 2009, J MAGN MAGN MATER, V321, P555, DOI 10.1016/j.jmmm.2008.07.027
   Xiao SG, 2009, ADV MATER, V21, P2516, DOI 10.1002/adma.200802087
   Yang JKW, 2007, J VAC SCI TECHNOL B, V25, P2025, DOI 10.1116/1.2801881
   Yang JKW, 2009, J VAC SCI TECHNOL B, V27, P2622, DOI 10.1116/1.3253652
   Yang X, 2007, J VAC SCI TECHNOL B, V25, P2202, DOI 10.1116/1.2798711
   Yang XM, 2008, J VAC SCI TECHNOL B, V26, P2604, DOI 10.1116/1.2978487
NR 31
TC 37
Z9 37
U1 7
U2 43
PU IOP PUBLISHING LTD
PI BRISTOL
PA TEMPLE CIRCUS, TEMPLE WAY, BRISTOL BS1 6BE, ENGLAND
SN 0957-4484
J9 NANOTECHNOLOGY
JI Nanotechnology
PD SEP 23
PY 2011
VL 22
IS 38
AR 385301
DI 10.1088/0957-4484/22/38/385301
PG 6
WC Nanoscience & Nanotechnology; Materials Science, Multidisciplinary;
   Physics, Applied
SC Science & Technology - Other Topics; Materials Science; Physics
GA 818AX
UT WOS:000294722400002
PM 21865632
ER

PT J
AU Lee, J
   Brombacher, C
   Fidler, J
   Dymerska, B
   Suess, D
   Albrecht, M
AF Lee, Jehyun
   Brombacher, Christoph
   Fidler, Josef
   Dymerska, Barbara
   Suess, Dieter
   Albrecht, Manfred
TI Contribution of the easy axis orientation, anisotropy distribution and
   dot size on the switching field distribution of bit patterned media
SO APPLIED PHYSICS LETTERS
LA English
DT Article
AB A magnetic nanostructure array was fabricated by post-patterning of a L1(0) ordered 5-nm-thick FePtCu film revealing a rather broad switching field distribution (SFD). The individual contributions to the SFD of the dot array were investigated by micromagnetic simulations. Based on transmission electron microscopy results, the dots show a truncated cone shape which was directly used for the finite element model. The influence of single parameters, i.e., easy axis distribution, magnetic anisotropy, and dot size, on the SFD was estimated quantitatively and compared. Furthermore, the influence of damage induced during the nanofabrication process was analyzed and correlated with experimental results. (C) 2011 American Institute of Physics. [doi:10.1063/1.3623752]
C1 [Lee, Jehyun; Fidler, Josef; Dymerska, Barbara; Suess, Dieter] Vienna Univ Technol, Inst Solid State Phys, A-1040 Vienna, Austria.
   [Brombacher, Christoph; Albrecht, Manfred] Tech Univ Chemnitz, Inst Phys, D-09107 Chemnitz, Germany.
RP Lee, J (reprint author), Vienna Univ Technol, Inst Solid State Phys, Wiener Hauptstr 8-10, A-1040 Vienna, Austria.
EM jehyun.lee@tuwien.ac.at
RI Suess, Dieter/H-7475-2012
OI Suess, Dieter/0000-0001-5453-9974
FU European Commission [FP7-ITC-2007-2-224001]
FX The financial support from the European Commission via the TERAMAGSTOR
   project (No. FP7-ITC-2007-2-224001) is kindly acknowledged. All electron
   microscopy investigations were carried out using facilities at the
   USTEM, Vienna University of Technology, Austria.
CR Adam JP, 2010, NANOTECHNOLOGY, V21, DOI 10.1088/0957-4484/21/44/445302
   BASHIR MA, 2002, J MAGN MAGN IN PRESS
   BROMBACHER C, 2010, L10 FEPTCU BIT UNPUB
   Hellwig O, 2007, APPL PHYS LETT, V90, DOI 10.1063/1.2730744
   Kalezhi J, 2009, IEEE T MAGN, V45, P3531, DOI 10.1109/TMAG.2009.2022407
   Kikitsu A, 2007, IEEE T MAGN, V43, P3685, DOI 10.1109/TMAG.2007.902970
   Krone P, 2010, APPL PHYS LETT, V97, DOI 10.1063/1.3481668
   Lee J, 2007, J MAGN MAGN MATER, V319, P5, DOI 10.1016/j.jmmm.2007.04.019
   NEW RMH, 1994, J VAC SCI TECHNOL B, V12, P3196, DOI 10.1116/1.587499
   Piramanayagam SN, 2009, J MAGN MAGN MATER, V321, P485, DOI 10.1016/j.jmmm.2008.05.007
   Schrefl T, 1996, J MAGN MAGN MATER, V157, P331, DOI 10.1016/0304-8853(95)01189-7
   Thomson T, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.257204
   Yamakawa K, 2010, IEEE T MAGN, V46, P730, DOI 10.1109/TMAG.2009.2036587
   Yan M L, 2006, J APPL PHYS, V99
   Yang X, 2007, J VAC SCI TECHNOL B, V25, P2202, DOI 10.1116/1.2798711
NR 15
TC 14
Z9 14
U1 0
U2 10
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0003-6951
J9 APPL PHYS LETT
JI Appl. Phys. Lett.
PD AUG 8
PY 2011
VL 99
IS 6
AR 062505
DI 10.1063/1.3623752
PG 3
WC Physics, Applied
SC Physics
GA 806ZQ
UT WOS:000293857700043
ER

PT J
AU Pfau, B
   Gunther, CM
   Guehrs, E
   Hauet, T
   Yang, H
   Vinh, L
   Xu, X
   Yaney, D
   Rick, R
   Eisebitt, S
   Hellwig, O
AF Pfau, B.
   Guenther, C. M.
   Guehrs, E.
   Hauet, T.
   Yang, H.
   Vinh, L.
   Xu, X.
   Yaney, D.
   Rick, R.
   Eisebitt, S.
   Hellwig, O.
TI Origin of magnetic switching field distribution in bit patterned media
   based on pre-patterned substrates
SO APPLIED PHYSICS LETTERS
LA English
DT Article
ID NANOSTRUCTURES; ANISOTROPY
AB Using a combination of synchrotron radiation based magnetic imaging and high-resolution transmission electron microscopy we reveal systematic correlations between the magnetic switching field and the internal nanoscale structure of individual islands in bit patterned media fabricated by Co/Pd-multilayer deposition onto pre-patterned substrates. We find that misaligned grains at the island periphery are a common feature independent of the island switching field, while irregular island shapes and misaligned grains specifically extending into the center of an island are systematically correlated with a reduced island reversal field. (C) 2011 American Institute of Physics. [doi:10.1063/1.3623488]
C1 [Pfau, B.; Guenther, C. M.; Guehrs, E.; Eisebitt, S.] Tech Univ Berlin, Inst Opt & Atomare Phys, D-10623 Berlin, Germany.
   [Pfau, B.; Guenther, C. M.; Eisebitt, S.] Helmholtz Zentrum Berlin Mat & Energie GmbH, D-12489 Berlin, Germany.
   [Hauet, T.; Yang, H.; Vinh, L.; Xu, X.; Yaney, D.; Hellwig, O.] Hitachi Global Storage Technol, San Jose Res Ctr, San Jose, CA 95135 USA.
   [Rick, R.] SLAC, Stanford Synchrotron Radiat Lab, Menlo Pk, CA 94025 USA.
RP Pfau, B (reprint author), Tech Univ Berlin, Inst Opt & Atomare Phys, Hardenbergstr 36, D-10623 Berlin, Germany.
EM Olav.Hellwig@hitachigst.com
RI Pfau, Bastian/B-4953-2014
OI Pfau, Bastian/0000-0001-9057-0346; Gunther, Christian
   Michael/0000-0002-3750-7556
CR ALBRECHT T, 2009, NANOSCALE MAGNETIC M
   Berger A, 2006, J APPL PHYS, V99, DOI 10.1063/1.2164416
   Dittrich R, 2005, J APPL PHYS, V97, DOI 10.1063/1.1851931
   Eisebitt S, 2004, NATURE, V432, P885, DOI 10.1038/nature03139
   ENGEL BN, 1991, PHYS REV LETT, V67, P1910, DOI 10.1103/PhysRevLett.67.1910
   Hauet T, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3276911
   Hellwig O, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3271679
   Hellwig O, 2007, APPL PHYS LETT, V90, DOI 10.1063/1.2730744
   Hu G, 2005, IEEE T MAGN, V41, P3589, DOI 10.1109/TMAG.2005.854733
   Lau JW, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2822439
   Shaw JM, 2010, PHYS REV B, V82, DOI 10.1103/PhysRevB.82.144437
   Thomson T, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.257204
NR 12
TC 28
Z9 28
U1 0
U2 12
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0003-6951
EI 1077-3118
J9 APPL PHYS LETT
JI Appl. Phys. Lett.
PD AUG 8
PY 2011
VL 99
IS 6
AR 062502
DI 10.1063/1.3623488
PG 3
WC Physics, Applied
SC Physics
GA 806ZQ
UT WOS:000293857700040
ER

PT J
AU Ma, SQ
   Con, C
   Yavuz, M
   Cui, B
AF Ma, Siqi
   Con, Celal
   Yavuz, Mustafa
   Cui, Bo
TI Polystyrene negative resist for high-resolution electron beam
   lithography
SO NANOSCALE RESEARCH LETTERS
LA English
DT Article
ID BIT-PATTERNED MEDIA; HYDROGEN SILSESQUIOXANE; NANOIMPRINT LITHOGRAPHY;
   ARRAYS
AB We studied the exposure behavior of low molecular weight polystyrene as a negative tone electron beam lithography (EBL) resist, with the goal of finding the ultimate achievable resolution. It demonstrated fairly well-defined patterning of a 20-nm period line array and a 15-nm period dot array, which are the densest patterns ever achieved using organic EBL resists. Such dense patterns can be achieved both at 20 and 5 keV beam energies using different developers. In addition to its ultra-high resolution capability, polystyrene is a simple and low-cost resist with easy process control and practically unlimited shelf life. It is also considerably more resistant to dry etching than PMMA. With a low sensitivity, it would find applications where negative resist is desired and throughput is not a major concern.
C1 [Ma, Siqi; Con, Celal; Yavuz, Mustafa; Cui, Bo] Univ Waterloo, Waterloo Inst Nanotechnol WIN, Waterloo, ON N2L 3G1, Canada.
RP Cui, B (reprint author), Univ Waterloo, Waterloo Inst Nanotechnol WIN, 200 Univ Ave W, Waterloo, ON N2L 3G1, Canada.
EM bcui@uwaterloo.ca
CR Austin MD, 2005, NANOTECHNOLOGY, V16, P1058, DOI 10.1088/0957-4484/16/8/010
   Bilenberg B, 2006, J VAC SCI TECHNOL B, V24, P1776, DOI 10.1116/1.2210002
   Choi S, 2009, MICROELECTRON ENG, V86, P521, DOI 10.1016/j.mee.2008.12.055
   Clark N, 2006, J VAC SCI TECHNOL B, V24, P3073, DOI 10.1116/1.2366697
   Cord B, 2009, J VAC SCI TECHNOL B, V27, P2616, DOI 10.1116/1.3253603
   Ebbesen TW, 1998, NATURE, V391, P667, DOI 10.1038/35570
   Grigorescu AE, 2009, NANOTECHNOLOGY, V20, DOI 10.1088/0957-4484/20/29/292001
   Haffner M, 2007, J VAC SCI TECHNOL B, V25, P2045, DOI 10.1116/1.2794324
   Hajiaboli AR, 2009, PHYS STATUS SOLIDI A, V206, P976, DOI 10.1002/pssa.200881294
   Hosaka S, 2006, MICROELECTRON ENG, V83, P792, DOI 10.1016/j.mee.2006.01.005
   KU HY, 1969, J ELECTROCHEM SOC, V116, P980, DOI 10.1149/1.2412194
   Mohamad Z., 2008, NANOTECHNOLOGY, V19
   Ocola LE, 2006, J VAC SCI TECHNOL B, V24, P3061, DOI 10.1116/1.2366698
   Reinspach J, 2009, J VAC SCI TECHNOL B, V27, P2593, DOI 10.1116/1.3237140
   Schift H, 2008, J VAC SCI TECHNOL B, V26, P458, DOI 10.1116/1.2890972
   Sidorkin V, 2008, MICROELECTRON ENG, V85, P805, DOI 10.1016/j.mee.2008.01.024
   Tseng AA, 2004, J MICROMECH MICROENG, V14, pR15, DOI [10.1088/0960-1317/14/4/R01, 10.1088/0960-1317/14/4/RO1]
   Vila-Comamala J, 2010, NANOTECHNOLOGY, V21, DOI 10.1088/0957-4484/21/28/285305
   Word MJ, 2003, J VAC SCI TECHNOL B, V21, pL12, DOI 10.1116/1.1629711
   Yang JKW, 2007, J VAC SCI TECHNOL B, V25, P2025, DOI 10.1116/1.2801881
   Yang JKW, 2009, J VAC SCI TECHNOL B, V27, P2622, DOI 10.1116/1.3253652
   Yang X, 2007, J VAC SCI TECHNOL B, V25, P2202, DOI 10.1116/1.2798711
   Yang XM, 2009, IEEE T MAGN, V45, P833, DOI 10.1109/TMAG.2008.2010647
NR 23
TC 22
Z9 22
U1 1
U2 15
PU SPRINGER
PI NEW YORK
PA 233 SPRING ST, NEW YORK, NY 10013 USA
SN 1556-276X
J9 NANOSCALE RES LETT
JI Nanoscale Res. Lett.
PD JUL 12
PY 2011
VL 6
AR 446
DI 10.1186/1556-276X-6-446
PG 6
WC Nanoscience & Nanotechnology; Materials Science, Multidisciplinary;
   Physics, Applied
SC Science & Technology - Other Topics; Materials Science; Physics
GA 796CQ
UT WOS:000293028200001
PM 21749679
ER

PT J
AU Ranjbar, M
   Tavakkoli, A
   Piramanayagam, SN
   Tan, KP
   Sbiaa, R
   Wong, SK
   Chong, TC
AF Ranjbar, M.
   Tavakkoli K. G., A.
   Piramanayagam, S. N.
   Tan, K. P.
   Sbiaa, R.
   Wong, S. K.
   Chong, T. C.
TI Magnetostatic interaction effects in switching field distribution of
   conventional and staggered bit-patterned media
SO JOURNAL OF PHYSICS D-APPLIED PHYSICS
LA English
DT Article
ID FABRICATION; CHALLENGES; ARRAY
AB Effect of magnetostatic interaction on the switching field distribution (SFD) of nanodots with a diameter of 30 nm was investigated in square (conventional) and hexagonal (staggered) lattice configurations. The objective of the study is to achieve different kinds of magnetostatic interaction in experimental samples and to understand their influence on SFD. It was observed that the SFD was wider in the staggered lattice. Micromagnetic simulation was carried out and a fit of experimental results to the simulation was made to understand the observed trends. In addition, magnetic layers with an antiferromagnetic coupling configuration were also studied in the two geometries. The SFD of antiferromagnetically coupled dots was further reduced, highlighting the effect of magnetostatic interaction.
C1 [Ranjbar, M.; Tavakkoli K. G., A.; Piramanayagam, S. N.; Chong, T. C.] ASTAR, Data Storage Inst, Singapore 117608, Singapore.
   [Ranjbar, M.; Chong, T. C.] Natl Univ Singapore, Elect & Comp Engn Dept, Singapore 117576, Singapore.
   [Tavakkoli K. G., A.] NUS Grad Sch Integrat Sci & Engn NGS, Singapore 117456, Singapore.
RP Ranjbar, M (reprint author), ASTAR, Data Storage Inst, Singapore 117608, Singapore.
EM Prem_SN@dsi.a-star.edu.sg
RI Piramanayagam, SN/A-4192-2008; Sbiaa, Rachid/I-8038-2013
OI Piramanayagam, SN/0000-0002-3178-2960; 
FU A*STAR (SINGA); NGS (NUS Graduate School for Integrative Sciences and
   Engineering)
FX The authors thank Mr Y S Kay for his help in preparing samples and M R
   would like to express gratitude for support from the A*STAR (SINGA)
   Graduate Scholarship program. A Tavakkoli K G would like to acknowledge
   NGS (NUS Graduate School for Integrative Sciences and Engineering).
CR Chen YJ, 2009, J APPL PHYS, V105, DOI 10.1063/1.3070637
   El-Hilo M, 2010, J MAGN MAGN MATER, V322, P1279, DOI 10.1016/j.jmmm.2009.06.036
   Fullerton EE, 2000, APPL PHYS LETT, V77, P3806, DOI 10.1063/1.1329868
   Hellwig O, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3293301
   Hellwig O, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3271679
   Kitade Y, 2004, IEEE T MAGN, V40, P2516, DOI 10.1109/TMAG.2004.830165
   Krone P, 2009, J APPL PHYS, V106, DOI 10.1063/1.3260240
   Parekh V, 2006, NANOTECHNOLOGY, V17, P2079, DOI 10.1088/0957-4484/17/9/001
   Piramanayagam SN, 2007, J APPL PHYS, V102, DOI 10.1063/1.2750414
   Piramanayagam SN, 2009, J APPL PHYS, V105, DOI 10.1063/1.3075565
   Ranjbar M, 2010, IEEE T MAGN, V46, P1787, DOI 10.1109/TMAG.2010.2043226
   Sbiaa R, 2009, IEEE T MAGN, V45, P828, DOI 10.1109/TMAG.2008.2010644
   Sbiaa R, 2009, J APPL PHYS, V105, DOI 10.1063/1.3093699
   Sbiaa R, 2007, RECENT PAT NANOTECH, V1, P29, DOI 10.2174/187221007779814754
   Shaw JM, 2007, J APPL PHYS, V101, DOI 10.1063/1.2431399
   Tavakkoli K, 2011, J VAC SCI TECHNOL B, VB 29
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Weller D, 2001, J APPL PHYS, V89, P7525, DOI 10.1063/1.1363602
   Zhang LF, 2005, PHYS LETT A, V338, P373, DOI 10.1016/j.physleta.2005.02.060
   Richter H., 2007, U.S. Patent, Patent No. [20070258 161 A1, 20070258161]
NR 20
TC 11
Z9 11
U1 0
U2 5
PU IOP PUBLISHING LTD
PI BRISTOL
PA DIRAC HOUSE, TEMPLE BACK, BRISTOL BS1 6BE, ENGLAND
SN 0022-3727
J9 J PHYS D APPL PHYS
JI J. Phys. D-Appl. Phys.
PD JUL 6
PY 2011
VL 44
IS 26
AR 265005
DI 10.1088/0022-3727/44/26/265005
PG 5
WC Physics, Applied
SC Physics
GA 778EU
UT WOS:000291685100007
ER

PT J
AU Wright, CD
   Wang, L
   Shah, P
   Aziz, MM
   Varesi, E
   Bez, R
   Moroni, M
   Cazzaniga, F
AF Wright, C. David
   Wang, Lei
   Shah, Purav
   Aziz, Mustafa M.
   Varesi, Enrico
   Bez, Roberto
   Moroni, Maurizio
   Cazzaniga, Francesco
TI The Design of Rewritable Ultrahigh Density Scanning-Probe Phase-Change
   Memories
SO IEEE TRANSACTIONS ON NANOTECHNOLOGY
LA English
DT Article
DE GeSbTe; phase-change materials; phase-change RAM; phase-change memories;
   scanning-probe memories
ID DIAMOND-LIKE-CARBON; AMORPHOUS TE ALLOYS; DATA-STORAGE; CHANGE MEDIA;
   GE2SB2TE5 FILMS; THIN-FILMS; CRYSTALLIZATION; MICROSCOPES; SIMULATION;
   STABILITY
AB A systematic design of practicable media suitable for rewritable, ultrahigh density (>1Tbit/sq.in.), high data rate (>1Mbit/s/tip) scanning-probe phase-change memories is presented. The basic design requirements were met by a Si/TiN/Ge2Sb2Te5 (GST)/diamond-like carbon structure, with properly tailored electrical and thermal conductivities. Various alternatives for providing rewritability were investigated. In the first case, amorphous marks were written into a crystalline starting phase and subsequently erased by recrystallization, as in other already established phase-change memory technologies. Results imply that this approach is also appropriate for probe-based memories. However, experimentally, the successful writing of amorphous bits using scanning electrical probes has not been widely reported. In light of this, a second approach has been studied, that of writing crystalline bits in an amorphous starting matrix, with subsequent erasure by reamorphization. With conventional phase-change materials, such as continuous films of GST, this approach invariably leads to the formation of a crystalline "halo" surrounding the erased (reamorphized) region, with severe adverse consequences on the achievable density. Suppression of the "halo" was achieved using patterned media or slow-growth phase-change media, with the latter seemingly more viable.
C1 [Wright, C. David; Wang, Lei; Shah, Purav; Aziz, Mustafa M.] Univ Exeter, Exeter EX4 4QJ, Devon, England.
   [Varesi, Enrico; Bez, Roberto; Moroni, Maurizio; Cazzaniga, Francesco] Numonyx, I-20041 Agrate Brianza, Italy.
RP Wright, CD (reprint author), Univ Exeter, Exeter EX4 4QJ, Devon, England.
EM david.wright@exeter.ac.uk; lei.wang@exeter.ac.uk; p.shah@exeter.ac.uk;
   M.M.Aziz@exeter.ac.uk; enrico.varesi@numonyx.com;
   roberto.bez@numonyx.com; maurizio.moroni@numonyx.com;
   francesco.cazzaniga@numonyx.com
FU European Commission [2005-IST-5-34719]
FX This work supported by the European Commission under the FP6 Project
   'ProTeM' 2005-IST-5-34719. The review of this paper was arranged by
   Associate Editor R. Lake.
CR Aziz MM, 2006, J APPL PHYS, V99, DOI 10.1063/1.2165408
   [Anonymous], 2009, APPL PHYS LETT
   Battaglia JL, 2010, J APPL PHYS, V107, DOI 10.1063/1.3284084
   Bhaskaran H., 2009, REV SCI INSTRUM, V80
   Bhaskaran H, 2009, NANOTECHNOLOGY, V20, DOI 10.1088/0957-4484/20/10/105701
   Bhaskaran H, 2009, IEEE T NANOTECHNOL, V8, P128, DOI 10.1109/TNANO.2008.2005199
   Bichet O, 2004, J APPL PHYS, V95, P2360, DOI 10.1063/1.1644899
   Chen IR, 2009, IEEE T ELECTRON DEV, V56, P1523, DOI 10.1109/TED.2009.2021364
   [Anonymous], 2008, THESIS U CAMBRIDGE C
   Damon Y, 2006, JPN J APPL PHYS 2, V45, pL1304, DOI 10.1143/JJAP.45.L1304
   [Anonymous], 2009, P INT EL DEV M IEDM
   [Anonymous], 2009, P EUR PHAS CHANG OV
   Fan ZH, 2003, JPN J APPL PHYS 1, V42, P800, DOI 10.1143/JJAP.42.800
   Ferrari AC, 1999, J APPL PHYS, V85, P7191, DOI 10.1063/1.370531
   Gidon S, 2004, APPL PHYS LETT, V85, P6392, DOI 10.1063/1.1834718
   Giraud V, 2005, J APPL PHYS, V98, DOI 10.1063/1.1944910
   Gotoh T, 2004, JPN J APPL PHYS 2, V43, pL818, DOI 10.1143/JJAP.43.L818
   Hudgens SJ, 2008, J NON-CRYST SOLIDS, V354, P2748, DOI [10.1016/j.jnoncrysol.2007.09.111, 10.1016/j.jnoncryso1.2007.09.111]
   Kalb J, 2004, APPL PHYS LETT, V84, P5240, DOI 10.1063/1.1764591
   Kalb J, 2003, J APPL PHYS, V93, P2389, DOI 10.1063/1.1540227
   Kalish R, 1999, APPL PHYS LETT, V74, P2936, DOI 10.1063/1.123971
   Kim BM, 2009, APPL PHYS LETT, V94, DOI 10.1063/1.3081020
   Kim D.-H., 2007, J APPL PHYS, V101
   [Anonymous], 2007, APPL PHYS LETT
   [Anonymous], 2009, THESIS U EXETER EXET
   Li YM, 2008, J COMPUT ELECTRON, V7, P138, DOI 10.1007/s10825-008-0192-8
   [Anonymous], 2008, INT C MICR HEAT TRAN
   Meinders ER, 2002, J APPL PHYS, V91, P9794, DOI 10.1063/1.1479461
   Peng CB, 1997, J APPL PHYS, V82, P4183, DOI 10.1063/1.366220
   Peng XL, 2001, SURF COAT TECH, V138, P23, DOI 10.1016/S0257-8972(00)01139-7
   Pozidis H, 2004, IEEE T MAGN, V40, P2531, DOI 10.1109/TMAG.2004.830470
   Redaelli A, 2008, J APPL PHYS, V103, DOI 10.1063/1.2931951
   Reifenberg JP, 2007, APPL PHYS LETT, V91, DOI 10.1063/1.2784169
   Robertson J, 2002, MAT SCI ENG R, V37, P129, DOI 10.1016/S0927-796X(02)00005-0
   Satoh H, 2006, J APPL PHYS, V99, DOI 10.1063/1.2163010
   Senkader S, 2004, J APPL PHYS, V95, P504, DOI 10.1063/1.1633984
   Shamsa M., 2006, APPL PHYS LETT, V89
   Shiroishi Y, 2009, IEEE T MAGN, V45, P3816, DOI 10.1109/TMAG.2009.2024879
   [Anonymous], 2008, J APPL PHYS
   Sugawara K, 2004, JPN J APPL PHYS 2, V43, pL676, DOI 10.1143/JJAP.43.L676
   Tanaka K, 2008, JPN J APPL PHYS, V47, P3311, DOI 10.1143/JJAP.47.3311
   Terao M, 2009, JPN J APPL PHYS, V48, DOI 10.1143/JJAP.48.080001
   Vettiger P, 2002, IEEE T NANOTECHNOL, V1, P39, DOI 10.1109/TNANO.2002.1005425
   Wang DY, 1999, SURF COAT TECH, V120, P138, DOI 10.1016/S0257-8972(99)00350-3
   Wright CD, 2007, APPL PHYS LETT, V90, DOI 10.1063/1.2475606
   Wright CD, 2006, IEEE T NANOTECHNOL, V5, P50, DOI 10.1109/TNANO.2005.861400
   [Anonymous], 2008, P EUR PHAS CHANG OV
NR 47
TC 22
Z9 22
U1 0
U2 17
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 1536-125X
EI 1941-0085
J9 IEEE T NANOTECHNOL
JI IEEE Trans. Nanotechnol.
PD JUL
PY 2011
VL 10
IS 4
BP 900
EP 912
DI 10.1109/TNANO.2010.2089638
PG 13
WC Engineering, Electrical & Electronic; Nanoscience & Nanotechnology;
   Materials Science, Multidisciplinary; Physics, Applied
SC Engineering; Science & Technology - Other Topics; Materials Science;
   Physics
GA 795HX
UT WOS:000292966400037
ER

PT J
AU Noh, JS
   Kim, H
   Chun, DW
   Jeong, WY
   Lee, W
AF Noh, Jin-Seo
   Kim, Hyunsu
   Chun, Dong Won
   Jeong, Won Yong
   Lee, Wooyoung
TI Hyperfine FePt patterned media for terabit data storage
SO CURRENT APPLIED PHYSICS
LA English
DT Article; Proceedings Paper
CT International Conference on Electronic Materials and Nanotechnology for
   Green Environment (ENGE)
CY 2010
CL Jeju, SOUTH KOREA
DE FePt patterned media; CrV seed layer; Deposition-last process;
   Perpendicular anisotropy; Magnetic storage
ID MAGNETIC RECORDING MEDIA; FILMS; NANOPARTICLES; IRRADIATION
AB FePt patterned media were fabricated with varying pattern size, employing a deposition-last process and a CrV seed layer. The FePt patterns of sizes down to 30 nm showed a well-developed FCT structure characteristic of L1(0) phase. Due to the chemical and structural ordering, even 30 nm-sized FePt patterns exhibited a high ratio (3.4) of out-of-plane coercivity to in-plane coercivity and almost the same remanent magnetization as the saturation magnetization, indicating that a high perpendicular anisotropy is retained in the tiny patterns. The array of 30 nm patterns corresponds to a bit density of 1.8 Tbit/in(2), demonstrating that terabit-density magnetic storage can be fabricated using the deposition-last process. (C) 2011 Elsevier B.V. All rights reserved.
C1 [Noh, Jin-Seo; Kim, Hyunsu; Lee, Wooyoung] Yonsei Univ, Dept Mat Sci & Engn, Seoul 120749, South Korea.
   [Chun, Dong Won; Jeong, Won Yong] Korea Inst Sci & Technol, Seoul 136761, South Korea.
RP Lee, W (reprint author), Yonsei Univ, Dept Mat Sci & Engn, Seoul 120749, South Korea.
EM wooyoung@yonsei.ac.kr
CR Acharya BR, 2003, J MAGN MAGN MATER, V260, P261, DOI 10.1016/S0304-8853(02)00284-6
   ADEYEYE AO, 2008, J PHYS D, V41
   Breitling A, 2008, J MAGN MAGN MATER, V320, P1449, DOI 10.1016/j.jmmm.2007.12.003
   Choi C, 2010, ELECTRON MATER LETT, V6, P113, DOI 10.3365/eml.2010.09.113
   Hai NH, 2003, J MAGN MAGN MATER, V257, pL139
   Hasegawa T, 2008, ACTA MATER, V56, P1564, DOI 10.1016/j.actamat.2007.12.008
   Hong MH, 1998, J APPL PHYS, V84, P4403, DOI 10.1063/1.368662
   Jaafar M, 2007, PHYS STATUS SOLIDI A, V204, P1724, DOI 10.1002/pssa.200675342
   Jung CS, 2009, ELECTRON MATER LETT, V5, P91, DOI 10.3365/eml.2009.06.091
   KIM H, 2011, NANOSCALE RES LETT, V6, P131
   Labaye Y, 2002, J APPL PHYS, V91, P8715, DOI 10.1063/1.1456419
   Li F, 2008, ELECTRON MATER LETT, V4, P135
   Ma JS, 2007, ELECTRON MATER LETT, V3, P87
   Moser A, 2002, J PHYS D APPL PHYS, V35, pR157, DOI 10.1088/0022-3727/35/19/201
   Qiu LJ, 2007, IEEE T MAGN, V43, P2157, DOI 10.1109/TMAG.2007.893135
   Richter HJ, 2007, J PHYS D APPL PHYS, V40, pR149, DOI 10.1088/0022-3727/40/9/R01
   Richter HJ, 1999, IEEE T MAGN, V35, P2790, DOI 10.1109/20.800987
   Ross C, 2001, ANN REV MATER RES, V31, P203, DOI 10.1146/annurev.matsci.31.1.203
   Sun SH, 2000, SCIENCE, V287, P1989, DOI 10.1126/science.287.5460.1989
   Terris BD, 2000, J APPL PHYS, V87, P7004, DOI 10.1063/1.372912
   Yuan ZM, 2009, IEEE T MAGN, V45, P5038, DOI 10.1109/TMAG.2009.2029599
   ZHONG H, 2008, NANOTECHNOLOGY, V19
NR 22
TC 4
Z9 4
U1 0
U2 7
PU ELSEVIER SCIENCE BV
PI AMSTERDAM
PA PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
SN 1567-1739
J9 CURR APPL PHYS
JI Curr. Appl. Phys.
PD JUL
PY 2011
VL 11
IS 4
SU S
BP S33
EP S35
DI 10.1016/j.cap.2011.07.006
PG 3
WC Materials Science, Multidisciplinary; Physics, Applied
SC Materials Science; Physics
GA 844CW
UT WOS:000296726300010
ER

PT J
AU Nagpal, U
   Kang, HM
   Craig, GSW
   Nealey, PF
   de Pablo, JJ
AF Nagpal, Umang
   Kang, Huiman
   Craig, Gordon S. W.
   Nealey, Paul F.
   de Pablo, Juan J.
TI Pattern Dimensions and Feature Shapes of Ternary Blends of Block
   Copolymer and Low Molecular Weight Homopolymers Directed To Assemble on
   Chemically Nanopatterned Surfaces
SO ACS NANO
LA English
DT Article
DE block copolymer; ternary blend; thin film; chemical pattern; density
   multiplication; commensurability; bit patterned media; blends
ID DIBLOCK COPOLYMER; THIN-FILMS; DENSITY MULTIPLICATION; ARRAYS;
   GRAPHOEPITAXY; LITHOGRAPHY; TEMPLATES; SIMULATIONS; FABRICATION;
   MORPHOLOGY
AB Ternary blends of cylinder-forming polystyrene-block-poly(methyl methacrylate) (PS-b-PMMA) and low molecular weight PS and PMMA were directed to assemble on chemically patterned surfaces with hexagonal symmetry. The chemical patterns consisted of strongly PMMA preferential spots, patterned by electron-beam lithography, in a matrix of PS. The spot-to-spot spacing of the chemical patterns (L(s)) was varied between 0.9L(0) and 1.1L(0), where L(0) is the cylinder-to-cylinder spacing of the pure block copolymer in bulk. The homopolymer volume fraction of the blends (4) was varied between 0 and 0.3. In addition, chemical patterns were formed with selected spots missing from, the perfect. hexagonal array, such that the interpolation of domains between patterned spots could be examined on patterns where the polymer/pattern feature density ranged from 1:1 to 4:1. The assemblies were analyzed with top-down SEM, from which orientational order parameter (OP(o)) values were determined. The SEM analysis was complemented by Monte Carlo simulations, which offered insights into the shapes of the assembled cylindrical domains. It was found that, in comparison to pure block copolymer, adding homopolymer increased the range of L(s) values over which assemblies with high OP(o) values could be achieved for 1:1 assemblies. However, the corresponding simulations showed that in the 1:1 assemblies the shape of the cylinders was more uniform for pure block copolymer than for blends. In the case of the 4:1 assemblies, the range of L, values over which assemblies with high OP(o) values could be achieved was the same for all values of phi(H) tested, but the domains of the pure block copolymer had a more uniform shape. Overall, the results provided insights into the blend composition to be used to meet technological requirements for directed assembly with density multiplication.
C1 [Nagpal, Umang; Kang, Huiman; Craig, Gordon S. W.; Nealey, Paul F.; de Pablo, Juan J.] Univ Wisconsin, Dept Chem & Biol Engn, Madison, WI 53706 USA.
RP Nealey, PF (reprint author), Univ Wisconsin, Dept Chem & Biol Engn, 1415 Engn Dr, Madison, WI 53706 USA.
EM nealey@engr.wisc.edu
FU Semiconductor Research Corporation (SRC); National Science Foundation
   through the Nanoscale Science and Engineering Center [DMR-0425880]; NSF
   [DMR-0537588]
FX This work was supported by the Semiconductor Research Corporation (SRC)
   and the National Science Foundation through the Nanoscale Science and
   Engineering Center (DMR-0425880). This work was based upon research
   conducted at the Synchrotron Radiation Center, University of Wisconsin
   Madison, which is supported by the NSF under Award DMR-0537588.
CR Bita I, 2008, SCIENCE, V321, P939, DOI 10.1126/science.1159352
   BLACK C, 2010, IBM J RES DEV, V51, P605
   Black CT, 2006, J VAC SCI TECHNOL B, V24, P3188, DOI 10.1116/1.2366700
   Black CT, 2007, NAT NANOTECHNOL, V2, P464, DOI 10.1038/nnano.2007.244
   Cheng JY, 2002, APPL PHYS LETT, V81, P3657, DOI 10.1063/1.1519356
   Cheng JY, 2001, ADV MATER, V13, P1174, DOI 10.1002/1521-4095(200108)13:15<1174::AID-ADMA1174>3.0.CO;2-Q
   DAI KH, 1992, MACROMOLECULES, V25, P220, DOI 10.1021/ma00027a037
   Daoulas KC, 2006, J CHEM PHYS, V125, DOI 10.1063/1.2364506
   Daoulas KC, 2006, SOFT MATTER, V2, P573, DOI 10.1039/b602610a
   Detcheverry FA, 2008, MACROMOLECULES, V41, P4989, DOI 10.1021/ma702514v
   Detcheverry FA, 2010, MACROMOLECULES, V43, P3446, DOI 10.1021/ma902332h
   Detcheverry FA, 2009, SOFT MATTER, V5, P4858, DOI 10.1039/b911646j
   Dobisz EA, 2008, P IEEE, V96, P1836, DOI 10.1109/JPROC.2008.2007600
   Edwards EW, 2004, ADV MATER, V16, P1315, DOI 10.1002/adma.200400763
   Han E, 2008, MACROMOLECULES, V41, P9090, DOI 10.1021/ma8018393
   KANG HM, 2006, J VAC SCI TECHNOL B, V28
   Kang HM, 2010, J PHOTOPOLYM SCI TEC, V23, P297, DOI 10.2494/photopolymer.23.297
   Kim SH, 2004, ADV MATER, V16, P226, DOI 10.1002/adma.200304906
   Kim SO, 2003, NATURE, V424, P411, DOI 10.1038/nature01775
   Komura S, 2002, J CHEM PHYS, V117, P9903, DOI 10.1063/1.1517038
   Liu CC, 2010, J POLYM SCI POL PHYS, V48, P2589, DOI 10.1002/polb.22114
   MATSEN MW, 1995, MACROMOLECULES, V28, P5765, DOI 10.1021/ma00121a011
   Park M, 1997, SCIENCE, V276, P1401, DOI 10.1126/science.276.5317.1401
   Park SM, 2007, ADV MATER, V19, P607, DOI 10.1002/adma.200601421
   Park SM, 2008, MACROMOLECULES, V41, P9118, DOI 10.1021/ma8009917
   Rockford L, 1999, PHYS REV LETT, V82, P2602, DOI 10.1103/PhysRevLett.82.2602
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Ruiz R, 2007, ADV MATER, V19, P2157, DOI 10.1002/adma.200602470
   Ruiz R, 2011, ACS NANO, V5, P79, DOI 10.1021/nn101561p
   Segalman RA, 2001, ADV MATER, V13, P1152, DOI 10.1002/1521-4095(200108)13:15<1152::AID-ADMA1152>3.0.CO;2-5
   Stoykovich MP, 2005, SCIENCE, V308, P1442, DOI 10.1126/science.1111041
   Stuen KO, 2009, MACROMOLECULES, V42, P5139, DOI 10.1021/ma900520v
   Thurn-Albrecht T, 2000, SCIENCE, V290, P2126, DOI 10.1126/science.290.5499.2126
   Wang Q, 2003, MACROMOLECULES, V36, P1731, DOI 10.1021/ma020996t
   WINEY KI, 1991, MACROMOLECULES, V24, P6182, DOI 10.1021/ma00023a020
   Xiao SG, 2005, NANOTECHNOLOGY, V16, pS324, DOI 10.1088/0957-4484/16/7/003
   Xiao SG, 2009, ADV MATER, V21, P2516, DOI 10.1002/adma.200802087
NR 37
TC 23
Z9 24
U1 4
U2 42
PU AMER CHEMICAL SOC
PI WASHINGTON
PA 1155 16TH ST, NW, WASHINGTON, DC 20036 USA
SN 1936-0851
J9 ACS NANO
JI ACS Nano
PD JUL
PY 2011
VL 5
IS 7
BP 5673
EP 5682
DI 10.1021/nn201335v
PG 10
WC Chemistry, Multidisciplinary; Chemistry, Physical; Nanoscience &
   Nanotechnology; Materials Science, Multidisciplinary
SC Chemistry; Science & Technology - Other Topics; Materials Science
GA 796ES
UT WOS:000293035200045
PM 21661763
ER

PT J
AU Leong, SH
   Lim, MJB
   Santoso, B
   Ong, CL
   Yuan, ZM
   Chen, YJ
   Huang, TL
   Hu, SB
AF Leong, S. H.
   Lim, M. J. B.
   Santoso, B.
   Ong, C. L.
   Yuan, Z. -M.
   Chen, Y. J.
   Huang, T. L.
   Hu, S. B.
TI Patterned Media and Energy Assisted Recording Study by Drag Tester
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT Asia Pacific Magnetic Recording Conference 2010 (APMRC 2010)
CY NOV 10-12, 2010
CL Singapore, SINGAPORE
DE Energy assisted recording media; patterned media; static drag tester;
   write synchronization
AB A static drag tester was developed for characterization and read/write of patterned and continuous magnetic disk media. To enable write synchronization for patterned media application, a scheme for write synchronization was designed and implemented. The results for synchronized writing of patterned bits using a read-while-write approach are presented and they indicate that read-while-write is a viable approach for flexible written-in error tests at drag tester level. Besides application for pattern media, a method suitable for study of energy assisted media by drag tester was also explored. The results show that the required switching field reduced as the temperature of the recording medium was increased. The drag tester is thus shown to be a flexible and valuable platform for the study of future magnetic recording media.
C1 [Leong, S. H.; Lim, M. J. B.; Santoso, B.; Ong, C. L.; Yuan, Z. -M.; Chen, Y. J.; Huang, T. L.; Hu, S. B.] ASTAR, Data Storage Inst, Singapore 117608, Singapore.
RP Leong, SH (reprint author), ASTAR, Data Storage Inst, Singapore 117608, Singapore.
EM leong_siang_huei@dsi.a-star.edu.sg
CR CHOU SY, 1995, APPL PHYS LETT, V67, P3114, DOI 10.1063/1.114851
   Hu J, 2007, IEEE T MAGN, V43, P3517, DOI 10.1109/TMAG.2007.898307
   Jang EY, 2003, J APPL PHYS, V93, P6453, DOI 10.1063/1.1557345
   Klaassen KB, 2002, IEEE T MAGN, V38, P61, DOI 10.1109/TMAG.2002.988912
   Kryder MH, 2008, P IEEE, V96, P1810, DOI 10.1109/JPROC.2008.2004315
   Lim MS, 2005, TRIBOL INT, V38, P554, DOI 10.1016/j.triboint.2005.01.006
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Ruigrok JJM, 2000, J APPL PHYS, V87, P5398, DOI 10.1063/1.373356
   Tang Y, 2009, IEEE T MAGN, V45, P822, DOI 10.1109/TMAG.2008.2010642
   Zankovych S, 2001, NANOTECHNOLOGY, V12, P91, DOI 10.1088/0957-4484/12/2/303
   ZHANG QD, 2008, INT J PROD DEV, V5, P390, DOI 10.1504/IJPD.2008.017472
   Zhu JG, 2008, IEEE T MAGN, V44, P125, DOI 10.1109/TMAG.2007.911031
NR 12
TC 3
Z9 3
U1 0
U2 3
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUL
PY 2011
VL 47
IS 7
BP 1981
EP 1987
DI 10.1109/TMAG.2011.2125783
PG 7
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 783RO
UT WOS:000292101900036
ER

PT J
AU Park, KS
   Kim, KH
   Park, YP
   Park, NC
AF Park, Kyoung-Su
   Kim, Ki-Hoon
   Park, Young-Pil
   Park, No-Cheol
TI Investigation of the Dynamic Characteristics of Light Delivery for
   Thermal Assisted Magnetic Recording
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT Asia Pacific Magnetic Recording Conference 2010 (APMRC 2010)
CY NOV 10-12, 2010
CL Singapore, SINGAPORE
DE Head pole tip protrusion; laser diode (LD); light delivery; load/unload;
   optical fiber; thermal assisted magnetic recording (TAMR);
   touchdown/take off
ID BIT-PATTERNED MEDIA; LITHOGRAPHY; PERFORMANCE; SLIDERS
AB Several new technologies have recently been proposed for high areal density greater than 5 Tb/in(2) as next generation storage devices. Among these technologies is thermal assisted magnetic recording (TAMR). However, there are several dynamic and realistic problems associated with the current method of TAMR light delivery that must be resolved. In this paper, we investigate and discuss the dynamic characteristics for two kinds of light delivery systems using experimental and simulated results. We concluded that the optical fiber TAMR light delivery system had higher vertical and pitch stiffness. This could result in higher flying height modulation (FHM) on the disk surface and reduced TD-TO performance. Furthermore, since the optical fiber TAMR light delivery system has a lower positive pitch angle during unloading process, as soon as the air bearing disappears after the limiter is engaged, the contact possibility between the slider and the disk increases in unloading process. In addition, for the mounted laser diode (LD) TAMR light delivery system, we constructed a thermal-structural coupling finite element (FE) model of the entire TAMR system and simulated the thermal distribution and structural expansion according to temperature distribution. The results showed that the thermal problem was caused by heat produced by the LD, which can affect the head disk interface (HDI) problem in high areal density.
C1 [Park, Kyoung-Su; Kim, Ki-Hoon; Park, Young-Pil; Park, No-Cheol] Yonsei Univ, Dept Mech Engn, Seoul 120749, South Korea.
RP Park, NC (reprint author), Yonsei Univ, Dept Mech Engn, Seoul 120749, South Korea.
EM pnch@yonsei.ac.kr
CR Challener WA, 2009, NAT PHOTONICS, V3, P220, DOI 10.1038/NPHOTON.2009.26
   HIRATA M, 2008, P TMRC08 SING
   KIM KH, 2010, P ISPS10 SANT CLAR C
   Lee Y, 2009, IEEE T MAGN, V45, P4937, DOI 10.1109/TMAG.2009.2029399
   Lim DS, 2009, IEEE T MAGN, V45, P3844, DOI 10.1109/TMAG.2009.2022180
   Liu B, 2008, IEEE T MAGN, V44, P145, DOI 10.1109/TMAG.2007.911036
   MATSUMOTO T, 2009, P MORIS09 HYOG
   Park KS, 2005, IEEE T MAGN, V41, P819, DOI 10.1109/TMAG.2004.840352
   PARK YP, 2010, P APDSC10 HUAL, P36
   Xiao SG, 2009, ADV MATER, V21, P2516, DOI 10.1002/adma.200802087
   XU B, 2010, P ISOM10 HUAL, P36
   Yang X, 2007, J VAC SCI TECHNOL B, V25, P2202, DOI 10.1116/1.2798711
   Yang XM, 2009, IEEE T MAGN, V45, P833, DOI 10.1109/TMAG.2008.2010647
   Zheng H, 2010, IEEE T MAGN, V46, P2376, DOI 10.1109/TMAG.2009.2039702
   Zhu H, 2007, J TRIBOL-T ASME, V129, P689, DOI 10.1115/1.2736731
NR 15
TC 5
Z9 5
U1 0
U2 3
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUL
PY 2011
VL 47
IS 7
BP 1992
EP 1998
DI 10.1109/TMAG.2011.2134077
PG 7
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 783RO
UT WOS:000292101900038
ER

PT J
AU Arroyuelo, D
   Navarro, G
AF Arroyuelo, Diego
   Navarro, Gonzalo
TI Space-efficient construction of Lempel-Ziv compressed text indexes
SO INFORMATION AND COMPUTATION
LA English
DT Article
DE Full-text indexing; Compressed data structures; Text databases;
   Lempel-Ziv compression
ID SUFFIX ARRAYS; SUCCINCT REPRESENTATIONS; IN-PLACE; TREES; ALGORITHM;
   TIME; RANK
AB A compressed full-text self-index is a data structure that replaces a text and in addition gives indexed access to it, while taking space proportional to the compressed text size. This is very important nowadays, since one can accommodate the index of very large texts entirely in main memory, avoiding the slower access to secondary storage. In particular, the LZ-index [G. Navarro, Indexing text using the Ziv-Lempel trie, Journal of Discrete Algorithms (JDA) 2 (1) (2004) 87-114] stands out for its good performance at extracting text passages and locating pattern occurrences. Given a text T[1..u] over an alphabet of size a. the Li-index requires 4 vertical bar LZ vertical bar(1 + 0(1)) bits of space, where vertical bar LZ vertical bar is the size of the LZ78-compression of T. This can be bounded by vertical bar LZ vertical bar = uH(k)(T)+o(u log sigma), where H-k(T) is the k-th order empirical entropy of T, for any k = o(log sigma u). The LZ-index is built in O(u loga) time, yet requiring 0(u log u) bits of main memory in the worst case. In practice, the LZ-index occupies 1.0-1.5 times the text size (and replaces the text), but its construction requires around 5 times the text size. This limits its applicability to medium-sized texts. In this paper we present a space-efficient algorithm to construct the 12-index in O(u(log sigma + log log u)) time and requiring 4 vertical bar LZ vertical bar(1 + o(1)) bits of main memory, that is, asymptotically the same space of the final index. We also adapt our algorithm to construct more recent reduced versions of the 12-index, which occupy from 1 to 3 times vertical bar LZ vertical bar(1 + 0(1)) bits, and show that these can also be built using asymptotically the same space of the final index. Finally, we study an alternative model in which we are given only a limited amount of main memory to carry out the indexing process (less than that required by the final index), and must use the disk for the rest. We show how to build all the 12-index variants in o(u(log sigma + log log u)) time, and within vertical bar LZ vertical bar(1 + o(1)) bits of main memory, that is, asymptotically just the space to hold the LZ78-compressed text. Our experimental results show that our method is efficient in practice, needing an amount of memory close to that of the final index, and being competitive with the best construction times of other compressed indexes. (C) 2011 Elsevier Inc. All rights reserved.
C1 [Navarro, Gonzalo] Univ Chile, Dept Comp Sci, Santiago, Chile.
   [Arroyuelo, Diego] Yahoo Res Latin Amer, Santiago, Chile.
RP Navarro, G (reprint author), Univ Chile, Dept Comp Sci, Blanco Encalada 2120, Santiago, Chile.
EM darroyue@dcc.uchile.cl; gnavarro@dcc.uchile.cl
RI Navarro, Gonzalo/J-3731-2016
FU CONICYT, Chile; Fondecyt [1-080019]; Millennium Institute for Cell
   Dynamics and Biotechnology (ICDB), Mideplan, Chile [ICM P05-001-F]
FX Funded by the CONICYT PhD Fellowship Program, Chile. Part of this work
   was done while the author was in the Department of Computer Science,
   Univesity of Chile, and later visiting the David Cheriton School of
   Computer Science, University of Waterloo.; Funded by the Fondecyt Grant
   1-080019 and by the Millennium Institute for Cell Dynamics and
   Biotechnology (ICDB), Grant ICM P05-001-F, Mideplan, Chile.
CR Apostolico A., 1985, NATO ISI SERIES, P85
   Arroyuelo D, 2005, LECT NOTES COMPUT SC, V3827, P1143
   Arroyuelo D., 2010, P 11 WORKSH ALG ENG, P84
   ARROYUELO D, 2011, ALGORITHMIC IN PRESS, DOI DOI 10.1007/S00453-010-9443-8
   ARROYUELO D, 2010, ACM J EXPT ALGORITHM, V15
   ARROYUELO D, 2006, LNCS, V4009, P319
   Arroyuelo D, 2008, LECT NOTES COMPUT SC, V5029, P277, DOI 10.1007/978-3-540-69068-9_26
   Benoit D, 2005, ALGORITHMICA, V43, P275, DOI 10.1007/s00453-004-1146-6
   Brodnik A, 1999, LECT NOTES COMPUT SC, V1663, P37
   Burrows M., 1994, 124 DIG EQ CORP
   Chan H., 2007, ACM T ALGORITHMS, V3, P21, DOI 10.1145/1240233.1240244
   CHAZELLE B, 1988, SIAM J COMPUT, V17, P427, DOI 10.1137/0217026
   Clark DR, 1996, PROCEEDINGS OF THE SEVENTH ANNUAL ACM-SIAM SYMPOSIUM ON DISCRETE ALGORITHMS, P383
   Cormen T., 2001, INTRO ALGORITHMS
   Dementiev R, 2008, ACM J EXPT ALGORITHM, V12
   Ferragina P, 2005, J ACM, V52, P552, DOI 10.1145/1082036.1082039
   FERRAGINA P, 2010, P 8 LAT AM S THEOR I, P697
   Ferragina P., 2009, ACM J EXPT ALGORITHM, V13
   Ferragina P, 2007, ACM T ALGORITHMS, V3, P20, DOI 10.1145/1240233.1240243
   FICH FE, 1995, SIAM J COMPUT, V24, P266, DOI 10.1137/S0097539792238649
   Franceschini G, 2007, LECT NOTES COMPUT SC, V4596, P533
   Geary RF, 2006, THEOR COMPUT SCI, V368, P231, DOI 10.1016/j.tcs.2006.09.014
   Gonzalez R., 2008, THEORETICAL COMPUTER, V410, P4414
   GONZALEZ R, 2005, P 4 WORKSH EXP EFF A, V4, P27
   GRASSI R, 2003, ANN ACM SIAM S DISCR, P841
   Grossi R, 2005, SIAM J COMPUT, V35, P378, DOI 10.1137/S0097539702402354
   He M, 2010, LECT NOTES COMPUT SC, V6393, P334, DOI 10.1007/978-3-642-16321-0_35
   Hon WK, 2007, ALGORITHMICA, V48, P23, DOI 10.1007/s00453-006-1228-8
   Hon WK, 2009, SIAM J COMPUT, V38, P2162, DOI 10.1137/070685373
   Hon WK, 2003, LECT NOTES COMPUT SC, V2906, P240
   HON WK, 2004, THESIS U HONG KONG
   JANSSON J, 2007, 27 INT C FDN SOFTW T, P424
   Jansson J, 2007, PROCEEDINGS OF THE EIGHTEENTH ANNUAL ACM-SIAM SYMPOSIUM ON DISCRETE ALGORITHMS, P575
   Karkkainen J., 1996, Proceedings of the Third South American Workshop on String Processing. WSP 1996, P141
   Karkkainen J, 2007, THEOR COMPUT SCI, V387, P249, DOI 10.1016/j.tcs.2007.07.018
   Kim DK, 2005, LECT NOTES COMPUT SC, V3503, P315
   Kosaraju R., 1999, SIAM J COMPUT, V29, P893
   Kurtz S, 1999, SOFTWARE PRACT EXPER, V29, P1149, DOI 10.1002/(SICI)1097-024X(199911)29:13<1149::AID-SPE274>3.0.CO;2-O
   Larsson J., 2007, THEORETICAL COMPUTER, V387, P258
   Makinen V, 2008, ACM T ALGORITHMS, V4, DOI 10.1145/1367064.1367072
   Makinen V., 2005, Nordic Journal of Computing, V12, P40
   Makinen V, 2003, FUND INFORM, V56, P191
   Makinen V, 2007, THEOR COMPUT SCI, V387, P332, DOI 10.1016/j.tcs.2007.07.013
   Makinen V, 2010, J COMPUT BIOL, V17, P281, DOI 10.1089/cmb.2009.0169
   MANBER U, 1993, SIAM J COMPUT, V22, P935, DOI 10.1137/0222058
   Manzini G, 2004, ALGORITHMICA, V40, P33, DOI 10.1007/s00453-004-1094-1
   Manzini G, 2001, J ACM, V48, P407, DOI 10.1145/382780.382782
   MORRISON DR, 1968, J ACM, V15, P514, DOI 10.1145/321479.321481
   Munro I., 2001, J ALGORITHMS, V39, P205
   Munro JI, 2003, LECT NOTES COMPUT SC, V2719, P345
   Munro J. I., 2001, SIAM J COMPUT, V31, P762, DOI 10.1137/S0097539799364092
   Munro J.I., 1996, FDN SOFTWARE TECHNOL, V1180, P37
   Na JC, 2007, THEOR COMPUT SCI, V385, P127, DOI 10.1016/j.tcs.2007.05.030
   Navarro G., 2004, Journal of Discrete Algorithms, V2, P87, DOI 10.1016/S1570-8667(03)00066-2
   Navarro G, 2000, INFORM RETRIEVAL, V3, P49, DOI 10.1023/A:1009934302807
   Navarro G., 2009, ACM J EXPT ALGORITHM, V13
   NAVARRO G, 2010, ARXIV09050768V4
   Navarro G, 2007, ACM COMPUT SURV, V39, DOI 10.1145/1216370.1216372
   Okanohara D, 2007, SIAM PROC S, P60
   Patrascu M, 2008, ANN IEEE SYMP FOUND, P305, DOI 10.1109/FOCS.2008.83
   Raman R, 2003, LECT NOTES COMPUT SC, V2719, P357
   Raman R, 2002, SIAM PROC S, P233
   RUSSO L, 2007, INFORM RETRIEVAL, V5, P501
   Sadakane K, 2001, Genome Inform, V12, P175
   Sadakane K, 2003, J ALGORITHMS, V48, P294, DOI 10.1016/S0196-6774(03)00087-7
   Sadakane K, 2006, PROCEEDINGS OF THE SEVENTHEENTH ANNUAL ACM-SIAM SYMPOSIUM ON DISCRETE ALGORITHMS, P1230, DOI 10.1145/1109557.1109693
   Sadakane K, 2010, PROC APPL MATH, V135, P134
   Siren J, 2009, LECT NOTES COMPUT SC, V5721, P63, DOI 10.1007/978-3-642-03784-9_7
   Vitter J. S., 2008, ALGORITHMS DATA STRU
   Weiner P., 1973, P 14 IEEE S SWITCH A, P1, DOI DOI 10.1109/SWAT.1973.13
   Witten I., 1999, MANAGING GIGABYTES
   ZIV J, 1977, IEEE T INFORM THEORY, V23, P337, DOI 10.1109/TIT.1977.1055714
   ZIV J, 1978, IEEE T INFORM THEORY, V24, P530, DOI 10.1109/TIT.1978.1055934
NR 73
TC 5
Z9 6
U1 0
U2 3
PU ACADEMIC PRESS INC ELSEVIER SCIENCE
PI SAN DIEGO
PA 525 B ST, STE 1900, SAN DIEGO, CA 92101-4495 USA
SN 0890-5401
J9 INFORM COMPUT
JI Inf. Comput.
PD JUL
PY 2011
VL 209
IS 7
BP 1070
EP 1102
DI 10.1016/j.ic.2011.03.001
PG 33
WC Computer Science, Theory & Methods; Mathematics, Applied
SC Computer Science; Mathematics
GA 776AW
UT WOS:000291507900006
ER

PT J
AU McCallum, AT
   Krone, P
   Springer, F
   Brombacher, C
   Albrecht, M
   Dobisz, E
   Grobis, M
   Weller, D
   Hellwig, O
AF McCallum, A. T.
   Krone, P.
   Springer, F.
   Brombacher, C.
   Albrecht, M.
   Dobisz, E.
   Grobis, M.
   Weller, D.
   Hellwig, O.
TI L1(0) FePt based exchange coupled composite bit patterned films
SO APPLIED PHYSICS LETTERS
LA English
DT Article
ID MEDIA
AB We demonstrate a 2.5-fold coercivity reduction in FePt based exchange coupled composite bit patterned media (ECC-BPM) by coupling a lower anisotropy Co/Pd-Co/Ni-multilayer system to the top of a high anisotropy FePt L1(0) film. Furthermore the tight switching field distribution (SFD) of the lower anisotropy system reduces the SFD of the ECC-BPM composite system compared to a single layer FePt film. The relative amount of switching field and SFD reduction in these ECC-BPM arrays agree with corresponding micromagnetic simulations. (C) 2011 American Institute of Physics. [doi:10.1063/1.3599573]
C1 [McCallum, A. T.; Dobisz, E.; Grobis, M.; Weller, D.; Hellwig, O.] Hitachi Global Storage Technol, San Jose Res Ctr, San Jose, CA 95135 USA.
   [Krone, P.; Springer, F.; Brombacher, C.; Albrecht, M.] Tech Univ Chemnitz, Inst Phys, D-09107 Chemnitz, Germany.
RP McCallum, AT (reprint author), Hitachi Global Storage Technol, San Jose Res Ctr, 3403 Yerba Buena Rd, San Jose, CA 95135 USA.
EM olav.hellwig@hitachigst.com
CR Alexandrakis V, 2011, J APPL PHYS, V109, DOI 10.1063/1.3556773
   CARCIA PF, 1985, APPL PHYS LETT, V47, P178, DOI 10.1063/1.96254
   Chen JS, 2003, J APPL PHYS, V93, P1661, DOI 10.1063/1.1531817
   Hamrle J, 2002, PHYS REV B, V66, DOI 10.1103/PhysRevB.66.224423
   Hauet T, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3270535
   Hellwig O, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3271679
   Kim C, 2007, APPL PHYS LETT, V91, DOI 10.1063/1.2802038
   Krone P, 2010, APPL PHYS LETT, V97, DOI 10.1063/1.3481668
   Kurth F, 2010, PHYS REV B, V82, DOI 10.1103/PhysRevB.82.184404
   Richter HJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2209179
   Schrefl T, 2005, IEEE T MAGN, V41, P3064, DOI 10.1109/TMAG.2005.855227
   SHIMATSU T, 2011, J APPL PHYS, V109, P51907
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Victora RH, 2005, IEEE T MAGN, V41, P537, DOI 10.1109/TMAG.2004.838075
   Weller D, 1999, IEEE T MAGN, V35, P4423, DOI 10.1109/20.809134
   Weller D, 2000, IEEE T MAGN, V36, P10, DOI 10.1109/20.824418
NR 16
TC 40
Z9 40
U1 3
U2 31
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0003-6951
J9 APPL PHYS LETT
JI Appl. Phys. Lett.
PD JUN 13
PY 2011
VL 98
IS 24
AR 242503
DI 10.1063/1.3599573
PG 3
WC Physics, Applied
SC Physics
GA 779SZ
UT WOS:000291803600053
ER

PT J
AU Akahane, T
   Huda, M
   Tamura, T
   Yin, Y
   Hosaka, S
AF Akahane, Takashi
   Huda, Miftakhul
   Tamura, Takuro
   Yin, You
   Hosaka, Sumio
TI Orientation-Controlled and Long-Range-Ordered Self-Assembled Nanodot
   Array for Ultrahigh-Density Bit-Patterned Media
SO JAPANESE JOURNAL OF APPLIED PHYSICS
LA English
DT Article; Proceedings Paper
CT 23rd International Microprocesses and Nanotechnology Conference (MNC
   2010)
CY NOV 09-12, 2010
CL Fukuoka, JAPAN
SP Japan Soc Appl Phys
ID ELECTRON-BEAM LITHOGRAPHY; BLOCK-COPOLYMERS; RESIST
AB In this study, we investigated the control of the orientation and ordering of self-assembled nanodots from a block copolymer (BCP) with the help of a guide pattern created by electron beam (EB) drawing. The guide pattern consisted of a post lattice and guide lines. The former is used to enable self-assembled nanodots from the BCP to be regularly arranged, while the latter is used to control the orientation of the nanodot arrays. It was demonstrated that the combined guide pattern was effective for controlling the BCP dot array to achieve long-range ordering and controlled orientation. (C) 2011 The Japan Society of Applied Physics
C1 [Akahane, Takashi; Huda, Miftakhul; Tamura, Takuro; Yin, You; Hosaka, Sumio] Gunma Univ, Grad Sch Engn, Gunma 3768515, Japan.
RP Akahane, T (reprint author), Gunma Univ, Grad Sch Engn, Gunma 3768515, Japan.
RI Yin, You/D-9440-2012
OI Yin, You/0000-0003-3514-5712
FU New Energy and Industrial Technology Development Organization (NEDO)
FX This work was funded by the New Energy and Industrial Technology
   Development Organization (NEDO) under the Development of Nanobit
   Technology for Ultrahigh Density Magnetic Recording (Green IT) project.
CR Akahane T, 2011, KEY ENG MATER, V459, P124, DOI 10.4028/www.scientific.net/KEM.459.124
   Bita I, 2008, SCIENCE, V321, P939, DOI 10.1126/science.1159352
   CHANG THP, 1975, J VAC SCI TECHNOL, V12, P1271, DOI 10.1116/1.568515
   Fujita J, 1996, APPL PHYS LETT, V68, P1297, DOI 10.1063/1.115958
   Hosaka S, 2006, APPL PHYS LETT, V89, DOI 10.1063/1.2400102
   Hosaka S, 2008, APPL PHYS EXPRESS, V1, DOI 10.1143/APEX.1.027003
   Huda M, 2011, KEY ENG MATER, V459, P120, DOI 10.4028/www.scientific.net/KEM.459.120
   Ishida M, 2003, JPN J APPL PHYS 1, V42, P3913, DOI 10.1143/JJAP.42.3913
   Kamata Y., 2003, Journal of the Magnetics Society of Japan, V27, DOI 10.3379/jmsjmag.27.191
   Kamata Y, 2004, J APPL PHYS, V95, P6705, DOI 10.1063/1.1669347
   Kihara N, 2008, P SOC PHOTO-OPT INS, V6921, P92126, DOI 10.1117/12.771630
   Rittner C. T., 2001, IEEE T MAGN, V37, P1649
   Ross CA, 2008, J VAC SCI TECHNOL B, V26, P2489, DOI 10.1116/1.2981079
NR 13
TC 6
Z9 6
U1 1
U2 1
PU JAPAN SOC APPLIED PHYSICS
PI TOKYO
PA KUDAN-KITA BUILDING 5TH FLOOR, 1-12-3 KUDAN-KITA, CHIYODA-KU, TOKYO,
   102-0073, JAPAN
SN 0021-4922
J9 JPN J APPL PHYS
JI Jpn. J. Appl. Phys.
PD JUN
PY 2011
VL 50
IS 6
SI SI
AR 06GG04
DI 10.1143/JJAP.50.06GG04
PN 2
PG 4
WC Physics, Applied
SC Physics
GA 778ZW
UT WOS:000291748900057
ER

PT J
AU Wolf, C
   Kurrat, M
   Lindmayer, M
   Gentsch, D
AF Wolf, Christian
   Kurrat, Michael
   Lindmayer, Manfred
   Gentsch, Dietmar
TI Arcing Behavior on Different TMF Contacts at High-Current Interrupting
   Operations
SO IEEE TRANSACTIONS ON PLASMA SCIENCE
LA English
DT Article; Proceedings Paper
CT 24th International Symposium on Discharges and Electrical Insulation in
   Vacuum ISDEIV
CY AUG 30-SEP 03, 2010
CL Braunschweig, GERMANY
SP IEEE, DEIS, Tech Univ Braunschweig
DE High-speed videos; transverse magnetic field (TMF); vacuum arc modes;
   vacuum interrupter
ID CURRENT VACUUM ARCS; MOTION; MODES; DRIVEN; RMF
AB Vacuum circuit breakers are widely used in the medium-voltage area. The majority of the installed vacuum tubes are equipped with electrodes using the transverse-magnetic-field design forcing the electric arc on a circular motion to avoid severe local overheating. A vacuum test switch was used to investigate the arc movement behavior between spiral-and cup-shaped electrodes at high-current interrupting operations. The switch was equipped with viewing ports allowing an observation from two rectangular views. Mounted sample contacts were made of CuCr 75/25 in different diameters. A digital 8-bit high-speed camera was used to record the arcing process with frame rates of 33 000 frames per second. Behavior patterns were investigated and compared with the arc voltage and the instantaneous current. Parameters such as the arc velocity and the current density on the contacts could be determined by means of the recordings. A static simulation model delivered Lorentz forces for a comparison between both designs. The experiments were conducted with short circuit currents from 20 to 60 kA (root mean square) with a frequency of 50 Hz.
C1 [Wolf, Christian; Kurrat, Michael; Lindmayer, Manfred] Tech Univ Carolo Wilhelmina Braunschweig, Inst High Voltage Technol & Elect Power Syst, D-38106 Braunschweig, Germany.
   [Gentsch, Dietmar] ABB AG, Calor Emag Medium Voltage Prod, D-40472 Ratingen, Germany.
RP Wolf, C (reprint author), Tech Univ Carolo Wilhelmina Braunschweig, Inst High Voltage Technol & Elect Power Syst, D-38106 Braunschweig, Germany.
CR DULLNI E, 1989, IEEE T PLASMA SCI, V17, P875, DOI 10.1109/27.41226
   Dullni E, 2003, IEEE T PLASMA SCI, V31, P902, DOI 10.1109/TPS.2003.818445
   Gentsch D, 2005, IEEE T PLASMA SCI, V33, P1605, DOI 10.1109/TPS.2005.856514
   Haas W, 1999, IEEE T PLASMA SCI, V27, P954, DOI 10.1109/27.782266
   HUHSE P, 1986, IEEE T PLASMA SCI, V14, P460, DOI 10.1109/TPS.1986.4316574
   Kimura T, 2000, P INT SYMP DISCH EL, V19, P443, DOI 10.1109/DEIV.2000.879022
   Miller HC, 1997, IEEE T DIELECT EL IN, V4, P382, DOI 10.1109/94.625352
   PAULUS I, 1988, IEEE T PLASMA SCI, V16, P342, DOI 10.1109/27.3840
   SCHULMAN MB, 1993, IEEE T PLASMA SCI, V21, P484, DOI 10.1109/27.249631
   Teichmann J, 1999, IEEE T PLASMA SCI, V27, P1021, DOI 10.1109/27.782274
   Wolf C., 2009, P IEEE HOLM C EL CON, P270
   Zalucki Z, 1999, IEEE T PLASMA SCI, V27, P991, DOI 10.1109/27.782271
   LAKE AA, 1965, Patent No. 997384
   Schneider H. N., 1960, US Patent, Patent No. [2,949,520, 2949520]
NR 14
TC 12
Z9 12
U1 1
U2 9
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0093-3813
J9 IEEE T PLASMA SCI
JI IEEE Trans. Plasma Sci.
PD JUN
PY 2011
VL 39
IS 6
BP 1284
EP 1290
DI 10.1109/TPS.2011.2135379
PN 1
PG 7
WC Physics, Fluids & Plasmas
SC Physics
GA 776PS
UT WOS:000291549900004
ER

PT J
AU Nishiyama, N
   Takenaka, K
   Saidoh, N
   Futamoto, M
   Saotome, Y
   Inoue, A
AF Nishiyama, N.
   Takenaka, K.
   Saidoh, N.
   Futamoto, M.
   Saotome, Y.
   Inoue, Akihisa
TI Glassy alloy composites for bit-patterned-media
SO JOURNAL OF ALLOYS AND COMPOUNDS
LA English
DT Article; Proceedings Paper
CT 17th International Symposium on Metastable, Amorphous and Nanostructured
   Materials (ISMANAM 2010)
CY JUL 04-09, 2010
CL Zurich, SWITZERLAND
DE Thin film; Glassy alloy composites; Magnetic recording media; Thermal
   nano-imprinting; Magnetic switching
ID SUPERCOOLED LIQUID; THERMAL-STABILITY; AMORPHOUS ALLOY; THIN-FILM;
   INFORMATION; IMPRINT; ABILITY
AB With the aim of developing a novel perpendicular bit-patterned-media, combined process of thermal imprinting of glassy alloy thin film and embedding Co/Pd multilayer was developed. Nano hole array with a hole diameter of 30nm was successfully formed onto Pd-based glassy alloy thin film by thermal imprinting. Co/Pd multilayer was overlaid on a textured Pd-based glassy alloy thin film. After finishing by sputter etching, prototype bit-patterned-media was prepared. Switching behavior examined under magnetic field of +/- 10 kOe reveals that the isolated magnetic dots began to switch at 10 kOe. These results suggest that the prototype composite has a strong possibility for the realization of next generation bit-patterned-media with high data density. (C) 2011 Elsevier B. V. All rights reserved.
C1 [Nishiyama, N.; Takenaka, K.; Saidoh, N.] Mat Proc Technol Ctr, RIMCOF Tohoku Univ Lab, Sendai, Miyagi 9808577, Japan.
   [Futamoto, M.] Chuo Univ, Fac Sci & Engn, Tokyo 1128511, Japan.
   [Saotome, Y.] Tohoku Univ, Inst Mat Res, Osaka Ctr, Sakai, Osaka 5998531, Japan.
   [Inoue, Akihisa] Tohoku Univ, Inst Mat Res, Sendai, Miyagi 9808577, Japan.
RP Nishiyama, N (reprint author), Mat Proc Technol Ctr, RIMCOF Tohoku Univ Lab, Sendai, Miyagi 9808577, Japan.
EM rimcofnn@imr.tohoku.ac.jp
RI Saotome, Yasunori/B-3267-2010; Nishiyama, Nobuyuki/C-8228-2015; Inoue,
   Akihisa/E-5271-2015
OI Saotome, Yasunori/0000-0002-6110-5573; 
CR Bai J, 2004, J APPL PHYS, V96, P1133, DOI 10.1063/1.1762714
   CARCIA PF, 1985, APPL PHYS LETT, V47, P178, DOI 10.1063/1.96254
   Charap SH, 1997, IEEE T MAGN, V33, P978, DOI 10.1109/20.560142
   CHOU SY, 1995, APPL PHYS LETT, V67, P3114, DOI 10.1063/1.114851
   Inoue A, 2000, ACTA MATER, V48, P279, DOI 10.1016/S1359-6454(99)00300-6
   Nishiyama N, 2010, INTERMETALLICS, V18, P1983, DOI 10.1016/j.intermet.2010.02.027
   Nishiyama N, 2002, APPL PHYS LETT, V80, P568, DOI 10.1063/1.1445475
   Nishiyama N, 2007, J NON-CRYST SOLIDS, V353, P3615, DOI 10.1016/j.jnoncrysol.2007.05.170
   Saotome Y, 2001, SCRIPTA MATER, V44, P1541, DOI 10.1016/S1359-6462(01)00837-5
   Saotome Y, 2001, MAT SCI ENG A-STRUCT, V304, P716, DOI 10.1016/S0921-5093(00)01593-8
   Takenaka K, 2010, INTERMETALLICS, V18, P1969, DOI 10.1016/j.intermet.2010.02.045
NR 11
TC 8
Z9 8
U1 0
U2 10
PU ELSEVIER SCIENCE SA
PI LAUSANNE
PA PO BOX 564, 1001 LAUSANNE, SWITZERLAND
SN 0925-8388
J9 J ALLOY COMPD
JI J. Alloy. Compd.
PD JUN
PY 2011
VL 509
SU 1
BP S145
EP S147
DI 10.1016/j.jallcom.2010.12.020
PG 3
WC Chemistry, Physical; Materials Science, Multidisciplinary; Metallurgy &
   Metallurgical Engineering
SC Chemistry; Materials Science; Metallurgy & Metallurgical Engineering
GA 775MG
UT WOS:000291463000033
ER

PT J
AU Li, LP
   Bogy, DB
AF Li, Liping
   Bogy, David B.
TI Dynamics of air bearing sliders flying on partially planarized bit
   patterned media in hard disk drives
SO MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND
   PROCESSING SYSTEMS
LA English
DT Article; Proceedings Paper
CT 20th ASME Annual Conference on Information Storage and Processing
   Systems (ISPS)
CY JUN 14-15, 2010
CL Santa Clara Univ, Santa Clara, CA
HO Santa Clara Univ
ID MODIFIED REYNOLDS-EQUATION; HOMOGENIZATION; LUBRICATION; FLOW;
   ROUGHNESS; SURFACE
AB promising techniques for future disk drives in order to increase the areal density above 1 Tbit/in(2). However, the BPM can change the topography of the disk surface and thus have an effect on the flying characteristics of the air bearing sliders. So achieving a stable flying attitude at the hard disk interface (HDI) becomes one of the main considerations for BPM. In this paper, we apply three methods (complete homogenization, Taylor expansion homogenization and averaging) to solve this BPM problem and finally choose the Taylor expansion homogenization method to investigate the slider's flying attitude on partially planarized patterned media as well as at transitions over different pattern types such as might occur at boundaries between data and servo sections.
C1 [Li, Liping; Bogy, David B.] Univ Calif Berkeley, Dept Mech Engn, Comp Mech Lab, Berkeley, CA 94720 USA.
RP Li, LP (reprint author), Univ Calif Berkeley, Dept Mech Engn, Comp Mech Lab, Berkeley, CA 94720 USA.
EM llping@berkeley.edu
CR BRANDIC ZZ, 2006, SOLID STATE TECHNOL, V49, pS7
   Buscaglia G, 2000, NUMER MATH, V85, P49, DOI 10.1007/s002110000131
   Buscaglia G, 2002, ASYMPTOTIC ANAL, V32, P131
   FUKUI S, 1988, J TRIBOL-T ASME, V110, P253
   FUKUI S, 1990, J TRIBOL-T ASME, V112, P78, DOI 10.1115/1.2920234
   Gupta V, 2007, THESIS U CALIFORNIA
   *INF STOR IND CONS, 2009, EHDR PROGR
   Jai M, 2002, J TRIBOL-T ASME, V124, P327, DOI 10.1115/1.1402131
   JAI M, 1995, ESAIM-MATH MODEL NUM, V29, P199
   Knigge BE, 2008, IEEE T MAGN, V44, P3656, DOI 10.1109/TMAG.2008.2002613
   Li H, 2009, TRIBOL LETT, V33, P199, DOI 10.1007/s11249-009-9409-7
   MITSUYA Y, 1995, J TRIBOL-T ASME, V117, P430, DOI 10.1115/1.2831271
   MITSUYA Y, 1984, B JSME, V27, P2036
   Murthy AN, 2010, TRIBOL LETT, V38, P47, DOI 10.1007/s11249-009-9570-z
NR 14
TC 13
Z9 13
U1 0
U2 4
PU SPRINGER
PI NEW YORK
PA 233 SPRING ST, NEW YORK, NY 10013 USA
SN 0946-7076
J9 MICROSYST TECHNOL
JI Microsyst. Technol.
PD JUN
PY 2011
VL 17
IS 5-7
BP 805
EP 812
DI 10.1007/s00542-010-1191-9
PG 8
WC Engineering, Electrical & Electronic; Nanoscience & Nanotechnology;
   Materials Science, Multidisciplinary; Physics, Applied
SC Engineering; Science & Technology - Other Topics; Materials Science;
   Physics
GA 766SD
UT WOS:000290805900010
ER

PT J
AU Boettcher, U
   Lacey, CA
   Li, H
   Amemiya, K
   de Callafon, RA
   Talke, FE
AF Boettcher, Uwe
   Lacey, Christopher A.
   Li, Hui
   Amemiya, Kensuke
   de Callafon, Raymond A.
   Talke, Frank E.
TI Analytical read back signal modeling in magnetic recording
SO MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND
   PROCESSING SYSTEMS
LA English
DT Article; Proceedings Paper
CT 20th ASME Annual Conference on Information Storage and Processing
   Systems (ISPS)
CY JUN 14-15, 2010
CL Santa Clara Univ, Santa Clara, CA
HO Santa Clara Univ
ID PERPENDICULAR MEDIUM; HEAD FIELDS; MEDIA; DESIGN
AB An analytical model for the read back signal is derived for perpendicular and longitudinal magnetic recording. The model captures the contribution of a single bit rather than the contribution of a bit transition which makes it applicable to patterned media as well as continuous media. It is based on the law of Biot-Savart and separates the contribution of the magnetic media from the head sensitivity function.
C1 [Boettcher, Uwe; de Callafon, Raymond A.; Talke, Frank E.] Univ Calif San Diego, Ctr Magnet Recording Res, La Jolla, CA 92093 USA.
   [Lacey, Christopher A.] Microphysics Inc, San Jose, CA 95134 USA.
   [Li, Hui; Amemiya, Kensuke] Hitachi Asia Ltd, Storage Mech Lab, Singapore 049318, Singapore.
RP Boettcher, U (reprint author), Univ Calif San Diego, Ctr Magnet Recording Res, 9500 Gilman Dr 0401, La Jolla, CA 92093 USA.
EM uwe@ucsd.edu; chrislacey@microphysics.com; hli@has.hitachi.com.sg;
   kamemiya@has.hitachi.com.sg; callafon@ucsd.edu; ftalke@ucsd.edu
CR BERTRAM N, 1994, THEORY MAGNETIC RECO, P40
   Boettcher U, 2011, MICROSYST TECHNOL, V17, P937, DOI 10.1007/s00542-010-1193-7
   CHAI KS, 2006, AS PAC MAGN REC C 29, P1, DOI 10.1109/APMRC.2006.365937
   Hughes GF, 1999, IEEE T MAGN, V35, P2310, DOI 10.1109/20.800809
   Litvinov D, 2004, PERPENDICULAR MAGNET
   MALLINSON JC, 1984, IEEE T MAGN, V20, P721, DOI 10.1109/TMAG.1984.1063385
   Radhakrishnan R, 2007, IEEE T MAGN, V43, P2298, DOI 10.1109/TMAG.2007.892334
   Richter HJ, 1999, J PHYS D APPL PHYS, V32, pR147, DOI 10.1088/0022-3727/32/21/201
   Roscamp TA, 2002, J APPL PHYS, V91, P8366, DOI 10.1063/1.1452281
   Shute HA, 2006, IEEE T MAGN, V42, P1611, DOI 10.1109/TMAG.2005.861829
   SMITH N, 1993, IEEE T MAGN, V29, P2279, DOI 10.1109/20.231633
   SPALDIN NA, 2003, MAGNETIC MAT FUNDAME, P8
   Suzuki Y, 2003, IEEE T MAGN, V39, P2633, DOI 10.1109/TMAG.2003.815534
   Suzuki Y, 2001, IEEE T MAGN, V37, P1337, DOI 10.1109/20.950834
   SUZUKI Y, 2006, IEEE INT MAGN C 2006, P798, DOI 10.1109/INTMAG.2006.376522
   Takahashi S, 2003, J APPL PHYS, V93, P6546, DOI 10.1063/1.1561793
   Valcu B, 2002, IEEE T MAGN, V38, P2081, DOI 10.1109/TMAG.2002.801838
   Wachenschwanz D, 2005, IEEE T MAGN, V41, P670, DOI 10.1109/TMAG.2004.838049
   Wilton DT, 2004, IEEE T MAGN, V40, P148, DOI 10.1109/TMAG.2003.821132
   Wood RW, 2008, IEEE T MAGN, V44, P1874, DOI 10.1109/TMAG.2008.920525
   YUAN SW, 1994, IEEE T MAGN, V30, P1267, DOI 10.1109/20.297764
   Yuan SW, 1996, IEEE T MAGN, V32, P3334, DOI 10.1109/TMAG.1996.508399
NR 22
TC 0
Z9 0
U1 0
U2 3
PU SPRINGER
PI NEW YORK
PA 233 SPRING ST, NEW YORK, NY 10013 USA
SN 0946-7076
J9 MICROSYST TECHNOL
JI Microsyst. Technol.
PD JUN
PY 2011
VL 17
IS 5-7
BP 997
EP 1002
DI 10.1007/s00542-011-1245-7
PG 6
WC Engineering, Electrical & Electronic; Nanoscience & Nanotechnology;
   Materials Science, Multidisciplinary; Physics, Applied
SC Engineering; Science & Technology - Other Topics; Materials Science;
   Physics
GA 766SD
UT WOS:000290805900034
ER

PT J
AU Kim, DH
   Kim, YK
   Hong, S
   Kim, Y
   Baik, S
AF Kim, Dae Hong
   Kim, Yong Kwan
   Hong, Seungbum
   Kim, Yunseok
   Baik, Sunggi
TI Nanoscale bit formation in highly (111)-oriented ferroelectric thin
   films deposited on glass substrates for high-density storage media
SO NANOTECHNOLOGY
LA English
DT Article
ID ATOMIC-FORCE MICROSCOPY; ADHESION LAYERS; PBTIO3; PT(001)/MGO(001);
   POLARIZATION; TECHNOLOGY; ELECTRODES; DEPENDENCE; MEMORIES; SCALE
AB PbTiO3 ( PTO) ferroelectric films on Pt(111) bottom electrode layers covering Ta/glass were prepared using pulsed laser deposition. X-ray diffraction patterns revealed that the PTO films were preferentially (111)-oriented. The films were highly crystalline and had a smooth surface with root mean square (RMS) roughness of 1.5 nm. Ferroelectric properties of the PTO films were characterized using piezoresponse force microscopy (PFM). PFM techniques achieved ferroelectric polarization bits with a minimum width of 22 nm, which corresponds to a potential recording density of 1.3 Tbit/in(2) in ferroelectric storage devices.
C1 [Kim, Dae Hong; Baik, Sunggi] Pohang Univ Sci & Technol POSTECH, Dept Mat Sci & Engn, Pohang 790784, South Korea.
   [Kim, Yong Kwan] Samsung Elect Co Ltd, Semicond R&D Ctr, Hwasung 445701, South Korea.
   [Hong, Seungbum] Argonne Natl Lab, Div Mat Sci, Argonne, IL 60439 USA.
   [Kim, Yunseok] Korea Adv Inst Sci & Technol, Dept Mat Sci & Engn, Taejon 305701, South Korea.
RP Kim, DH (reprint author), Pohang Univ Sci & Technol POSTECH, Dept Mat Sci & Engn, Pohang 790784, South Korea.
EM sgbaik@postech.ac.kr
RI Hong, Seungbum/B-7708-2009
OI Hong, Seungbum/0000-0002-2667-1983
FU Samsung Electronics; US DOE Office of Science Laboratory
   [DE-AC02-06CH11357]
FX The authors gratefully acknowledge the financial support of Samsung
   Electronics. The submitted manuscript has been in part created by
   UChicago Argonne, LLC, Operator of Argonne National Laboratory
   ('Argonne'). Argonne, a US DOE Office of Science Laboratory, operated
   under contract No. DE-AC02-06CH11357.
CR Auciello O, 1998, PHYS TODAY, V51, P22, DOI 10.1063/1.882324
   Bertram HN, 1998, IEEE T MAGN, V34, P1845, DOI 10.1109/20.706722
   Bornand V, 2000, J APPL PHYS, V87, P3965, DOI 10.1063/1.372442
   Charap SH, 1997, IEEE T MAGN, V33, P978, DOI 10.1109/20.560142
   Chikazumi S., 1997, PHYS FERROMAGNETISM
   Cho Y, 2006, NANOTECHNOLOGY, V17, pS137, DOI 10.1088/0957-4484/17/7/S06
   Fong DD, 2004, SCIENCE, V304, P1650, DOI 10.1126/science.1098252
   Forrester MG, 2009, NANOTECHNOLOGY, V20, DOI 10.1088/0957-4484/20/22/225501
   Fox GR, 2001, J VAC SCI TECHNOL B, V19, P1967, DOI 10.1116/1.1406149
   Greaves S, 2007, IEEE T MAGN, V43, P2118, DOI 10.1109/TMAG.2007.893125
   Hong S, 2001, J APPL PHYS, V89, P1377, DOI 10.1063/1.1331654
   Hong SE, 2007, BIOPHYS J, p646A
   Kalinin SV, 2007, JPN J APPL PHYS 1, V46, P5674, DOI 10.1143/JJAP.46.5674
   Kim YK, 2004, APPL PHYS LETT, V84, P5085, DOI 10.1063/1.1759776
   Kim YK, 2004, J APPL PHYS, V95, P236, DOI 10.1063/1.1631731
   Kim Y, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3290247
   Kittel C., 2005, INTRO SOLID STATE PH
   Kryder MH, 2005, J MAGN MAGN MATER, V287, P449, DOI 10.1016/j.jmmm.2004.10.075
   Lee HN, 2000, J APPL PHYS, V88, P6658, DOI 10.1063/1.1321776
   Lee HN, 2002, APPL PHYS LETT, V80, P1040, DOI 10.1063/1.1447321
   Lee HN, 2007, PHYS REV LETT, V98, DOI 10.1103/PhysRevLett.98.217602
   Leu CC, 2002, J APPL PHYS, V92, P1511, DOI 10.1063/1.1492015
   Leu CC, 2001, APPL PHYS LETT, V79, P3833, DOI 10.1063/1.1423405
   Liang CS, 2005, APPL PHYS LETT, V87, P22906, DOI 10.1063/1.1996850
   Maeder T, 1998, JPN J APPL PHYS 1, V37, P2007, DOI 10.1143/JJAP.37.2007
   Maeder T, 1999, THIN SOLID FILMS, V345, P300, DOI 10.1016/S0040-6090(98)01420-5
   Matsuura K, 2003, APPL PHYS LETT, V83, P2650, DOI 10.1063/1.1609252
   Muralt P, 1998, J APPL PHYS, V83, P3835, DOI 10.1063/1.366614
   Park H, 2004, APPL PHYS LETT, V84, P1734, DOI 10.1063/1.1667266
   Park MY, 2009, APPL PHYS LETT, V94, DOI 10.1063/1.3081120
   Paruch P, 2001, APPL PHYS LETT, V79, P530, DOI 10.1063/1.1388024
   Ramesh R, 2002, SCIENCE, V296, P1975, DOI 10.1126/science.1072855
   Richter HJ, 1999, IEEE T MAGN, V35, P2790, DOI 10.1109/20.800987
   Saito A, 2007, HITACHI REV, V56, P2
   SCOTT JF, 1989, SCIENCE, V246, P1400, DOI 10.1126/science.246.4936.1400
   Scott J. F., 2000, FERROELECTRIC MEMORI
   Shin H, 2002, ULTRAMICROSCOPY, V91, P103, DOI 10.1016/S0304-3991(02)00088-8
   SUK M, 1990, IEEE T MAGN, V26, P2493, DOI 10.1109/20.104774
   Tybell T, 2002, PHYS REV LETT, V89, DOI 10.1103/PhysRevLett.89.097601
   Vakis AI, 2009, IEEE T MAGN, V45, P4966, DOI 10.1109/TMAG.2009.2029410
   Woo J, 2001, J VAC SCI TECHNOL B, V19, P818, DOI 10.1116/1.1364697
   Zheludev I. S., 1971, PHYS CRYSTALLINE DIE
   Zohni O, 2008, THIN SOLID FILMS, V516, P6052, DOI 10.1016/j.tsf.2007.10.130
   Hong S B, 2008, US Patent Application, Patent No. 851028
NR 44
TC 6
Z9 6
U1 1
U2 15
PU IOP PUBLISHING LTD
PI BRISTOL
PA TEMPLE CIRCUS, TEMPLE WAY, BRISTOL BS1 6BE, ENGLAND
SN 0957-4484
EI 1361-6528
J9 NANOTECHNOLOGY
JI Nanotechnology
PD MAY 17
PY 2011
VL 22
IS 24
AR 245705
DI 10.1088/0957-4484/22/24/245705
PG 6
WC Nanoscience & Nanotechnology; Materials Science, Multidisciplinary;
   Physics, Applied
SC Science & Technology - Other Topics; Materials Science; Physics
GA 759AZ
UT WOS:000290213500035
PM 21508503
ER

PT J
AU Rotarescu, C
   Petrila, I
   Stancu, A
AF Rotarescu, Cristian
   Petrila, Iulian
   Stancu, Alexandru
TI Cluster analysis of an Ising-Preisach interacting particle system
SO PHYSICA B-CONDENSED MATTER
LA English
DT Article
DE Ising model; Preisach model; Magnetic relaxation; Dipolar interactions
ID MONTE-CARLO; FIELD; MODEL; DYNAMICS
AB The paper deals with the analysis of clusters' size in diverse magnetization states of a system of ferromagnetic particles organized in a perfect 2D array with all the anisotropy axes perpendicular to the plane (perpendicular medium) following the evolution of the clusters in correlation with various parameters like applied field or interaction strength. We present numerical simulations for a two-level Ising-type model each magnetic entity being characterized by a Stoner-Wohlfarth nonlinear energy barrier and a rectangular hysteresis loop (Ising-Preisach hysteron). In the simulations we took into account, the long-range inter-particle magnetostatic interactions in an attempt to mimic as accurately as possible with a still simple model, materials like Bit-Patterned media that are now considered as good candidates for the magnetic memories of the future. (C) 2011 Elsevier B.V. All rights reserved.
C1 [Stancu, Alexandru] Alexandru Ioan Cuza Univ, Dept Phys, Iasi 700506, Romania.
   Alexandru Ioan Cuza Univ, CARPATH, Iasi 700506, Romania.
RP Stancu, A (reprint author), Alexandru Ioan Cuza Univ, Dept Phys, Blvd Carol 1,11, Iasi 700506, Romania.
EM alstancu@uaic.ro
RI Stancu, Alexandru/B-4905-2008; Petrila, Iulian/D-8405-2011
OI Stancu, Alexandru/0000-0001-7564-5880; Petrila,
   Iulian/0000-0003-1219-8184
FU IDEI FASTSWITCH
FX The authors acknowledge the financial support received from IDEI
   FASTSWITCH 1994-CNCSIS Romania Grant.
CR Aktas S, 2010, PHYSICA B, V405, P678, DOI 10.1016/j.physb.2009.09.085
   Bertotti G., 1998, HYSTERESIS MAGNETISM
   Binder K., 1997, MONTE CARLO SIMULATI
   Blundell SJ, 2009, PHYSICA B, V404, P581, DOI 10.1016/j.physb.2008.11.126
   CHANTRELL RW, 1994, J APPL PHYS, V76, P6407, DOI 10.1063/1.358281
   Cullity B.D., 2009, INTRO MAGNETIC MAT
   Della Torre E, 2008, PHYSICA B, V403, P271, DOI 10.1016/j.physb.2007.08.026
   Enachescu C, 2010, J MAGN MAGN MATER, V322, P1368, DOI 10.1016/j.jmmm.2009.07.062
   Enomoto M, 2009, PHYSICA B, V404, P642, DOI 10.1016/j.physb.2008.11.117
   Hovorka O, 2005, J MAGN MAGN MATER, V290, P449, DOI 10.1016/j.jmmm.2004.11.505
   Ising E, 1925, Z PHYS, V31, P253, DOI 10.1007/BF02980577
   JANKE W, 1994, PHYS REV B, V49, P9644, DOI 10.1103/PhysRevB.49.9644
   Jiang LQ, 2010, PHYSICA B, V405, P420, DOI 10.1016/j.physb.2009.08.300
   KASTELEYN PW, 1969, J PHYS SOC JPN, VS 26, P11
   METROPOLIS N, 1953, J CHEM PHYS, V21, P1087, DOI 10.1063/1.1699114
   MITCHLER P, 1998, IEEE T MAGN, V34, P4
   NEEL L, 1950, J PHYS-PARIS, V11, P49, DOI 10.1051/jphysrad:0195000110204900
   Preisach F, 1935, Z PHYS, V94, P277, DOI 10.1007/BF01349418
   Rizzi LG, 2010, PHYSICA B, V405, P1571, DOI 10.1016/j.physb.2009.12.041
   STONER EC, 1948, PHILOS TR R SOC S-A, V240, P599, DOI 10.1098/rsta.1948.0007
   SWENDSEN RH, 1987, PHYS REV LETT, V58, P86, DOI 10.1103/PhysRevLett.58.86
   SWENDSEN RH, 1992, MONTE CARLO METHOD C
   Tanasa R, 2004, PHYSICA B, V343, P314, DOI 10.1016/j.physb.2003.08.062
   TOMITA Y, 2001, PHYS REV LETT, V86, P4
   WANG JS, 1990, PHYSICA A, V167, P565, DOI 10.1016/0378-4371(90)90275-W
   WOLFF U, 1988, PHYS REV LETT, V60, P1461, DOI 10.1103/PhysRevLett.60.1461
   WOLFF U, 1989, PHYS REV LETT, V62, P361, DOI 10.1103/PhysRevLett.62.361
NR 27
TC 3
Z9 3
U1 0
U2 20
PU ELSEVIER SCIENCE BV
PI AMSTERDAM
PA PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
SN 0921-4526
EI 1873-2135
J9 PHYSICA B
JI Physica B
PD MAY 15
PY 2011
VL 406
IS 11
BP 2177
EP 2181
DI 10.1016/j.physb.2011.03.026
PG 5
WC Physics, Condensed Matter
SC Physics
GA 768QL
UT WOS:000290951200021
ER

PT J
AU Krone, P
   Makarov, D
   Schrefl, T
   Albrecht, M
AF Krone, P.
   Makarov, D.
   Schrefl, T.
   Albrecht, M.
TI Correlation of magnetic anisotropy distributions in layered exchange
   coupled composite bit patterned media
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article
ID SPRING MEDIA; HEAD
AB A micromagnetic study of the magnetization reversal in bit patterned media (BPM) with each bit consisting of an exchange coupled composite stack with two strongly exchange coupled layers is presented. In this investigation, the influence of correlation between the values of the distributions of the magnetic anisotropy values of the individual layers on the magnetization reversal behavior of the individual layers in the stack is examined. It is shown that a partial correlation can narrow the switching field distribution of the bit array while the switching field remains unaffected, which is vital for the applicability of the BPM concept in magnetic data storage. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3583653]
C1 [Krone, P.; Makarov, D.; Albrecht, M.] Tech Univ Chemnitz, Inst Phys, D-09107 Chemnitz, Germany.
   [Schrefl, T.] St Polten Univ Appl Sci, A-3100 St Polten, Austria.
RP Krone, P (reprint author), Tech Univ Chemnitz, Inst Phys, D-09107 Chemnitz, Germany.
EM philipp.krone@physik.tu-chemnitz.de
RI Makarov, Denys/G-1025-2011
CR Albrecht M, 2002, APPL PHYS LETT, V81, P2875, DOI 10.1063/1.1512946
   Batra S, 2004, IEEE T MAGN, V40, P319, DOI 10.1109/TMAG.2003.821163
   Breitling A, 2009, PHYS STATUS SOLIDI-R, V3, P130, DOI 10.1002/pssr.200903074
   Farrow RFC, 1996, J APPL PHYS, V79, P5967, DOI 10.1063/1.362122
   Grobis M, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3304166
   Hauet T, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3276911
   Hellwig O, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3293301
   Hellwig O, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3271679
   Krone P, 2010, APPL PHYS LETT, V97, DOI 10.1063/1.3481668
   Makarov D, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3309417
   Schrefl T, 2005, IEEE T MAGN, V41, P3064, DOI 10.1109/TMAG.2005.855227
   Suess D, 2006, APPL PHYS LETT, V89, DOI 10.1063/1.2347894
   Suess D, 2009, J MAGN MAGN MATER, V321, P545, DOI 10.1016/j.jmmm.2008.06.041
   Suess D, 2005, APPL PHYS LETT, V87, DOI 10.1063/1.1951053
   Suess D, 2007, J MAGN MAGN MATER, V308, P183, DOI 10.1016/j.jmmm.2006.05.021
   Terris BD, 2009, J MAGN MAGN MATER, V321, P512, DOI 10.1016/j.jmmm.2008.05.046
   Victora RH, 2005, IEEE T MAGN, V41, P537, DOI 10.1109/TMAG.2004.838075
NR 17
TC 4
Z9 4
U1 0
U2 8
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0021-8979
J9 J APPL PHYS
JI J. Appl. Phys.
PD MAY 15
PY 2011
VL 109
IS 10
AR 103901
DI 10.1063/1.3583653
PG 4
WC Physics, Applied
SC Physics
GA 783WU
UT WOS:000292115900090
ER

PT J
AU Guo, VW
   Lee, HS
   Zhu, JG
AF Guo, Vickie W.
   Lee, Hwan-Soo
   Zhu, Jian-Gang
TI Influences of film microstructure and defects on magnetization reversal
   in bit patterned Co/Pt multilayer thin film media
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article
ID ANISOTROPY
AB Quasisingle crystalline and polycrystalline Co/Pt multilayered films were prepared via sputtering technique. The polycrystalline Co/Pt multilayers exhibited an appreciable number of planar defects such as twin boundaries and stacking faults whereas few defects were present for the quasisingle crystalline films. The polycrystalline films had smoother surface, and as patterned into arrays of small islands, a smaller critical size for single domain was unexpectedly observed. The corresponding magnetic domain images revealed that nucleation interestingly occurred at any locations of a patterned element, which was attributed to the observed defects. Moreover, micromagnetic modeling was utilized to further quantitatively study influences of an anisotropically soft region (which can represent existing defects) in the patterned element on nucleation field in terms of exchange coupling strength. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3558986]
C1 [Guo, Vickie W.; Zhu, Jian-Gang] Carnegie Mellon Univ, Dept Elect & Comp Engn, Ctr Data Storage Syst, Pittsburgh, PA 15213 USA.
   [Lee, Hwan-Soo] Samsung Electromech, Adv Mat & Device Lab, Suwon 443743, Gyunggi Do, South Korea.
RP Guo, VW (reprint author), Carnegie Mellon Univ, Dept Elect & Comp Engn, Ctr Data Storage Syst, Pittsburgh, PA 15213 USA.
EM vickie.guo@gmail.com; jisoo725@naver.com
FU Data Storage Systems Center of Carnegie Mellon University
FX This work was supported by the Data Storage Systems Center of Carnegie
   Mellon University. The authors would like to thank Drs. Yueling Qin and
   Anup Roy for their help on the TEM work.
CR CHAPPERT C, 1988, J APPL PHYS, V64, P5736, DOI 10.1063/1.342243
   Dobisz EA, 2008, P IEEE, V96, P1836, DOI 10.1109/JPROC.2008.2007600
   Guo VW, 2009, IEEE T MAGN, V45, P2686, DOI 10.1109/TMAG.2009.2018640
   Kalezhi J, 2009, IEEE T MAGN, V45, P3531, DOI 10.1109/TMAG.2009.2022407
   Kitade Y, 2004, IEEE T MAGN, V40, P2516, DOI 10.1109/TMAG.2004.830165
   KITTEL C, 1949, REV MOD PHYS, V21, P541, DOI 10.1103/RevModPhys.21.541
   Lau JW, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2822439
   Moneck MT, 2007, IEEE T MAGN, V43, P2127, DOI 10.1109/TMAG.2007.893706
   Richter HJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2209179
   Rozatian ASH, 2003, J MAGN MAGN MATER, V256, P365, DOI 10.1016/S0304-8853(02)00891-0
   Sbiaa R, 2009, J APPL PHYS, V106, DOI 10.1063/1.3173546
   Shaw JM, 2007, J APPL PHYS, V101, DOI 10.1063/1.2431399
   STONER EC, 1948, PHILOS TR R SOC S-A, V240, P599, DOI 10.1098/rsta.1948.0007
   Terris BD, 2005, IEEE T MAGN, V41, P2822, DOI 10.1109/TMAG.2005.855264
   Thomson T, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.257204
   Weller D, 2001, J APPL PHYS, V89, P7525, DOI 10.1063/1.1363602
   Zhu J.-G., 1989, THESIS U CALIFORNIA
NR 17
TC 7
Z9 7
U1 1
U2 11
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0021-8979
J9 J APPL PHYS
JI J. Appl. Phys.
PD MAY 1
PY 2011
VL 109
IS 9
AR 093908
DI 10.1063/1.3558986
PG 5
WC Physics, Applied
SC Physics
GA 763VT
UT WOS:000290588500077
ER

PT J
AU Bhatnagar, A
   Khandelwal, M
   Rao, KUM
AF Bhatnagar, A.
   Khandelwal, Manoj
   Rao, K. U. M.
TI Laboratory Investigations for the Role of Flushing Media in Diamond
   Drilling of Marble
SO ROCK MECHANICS AND ROCK ENGINEERING
LA English
DT Article
DE Marble; Rotary diamond drilling; Cutting; Flushing media; Polyethylene
   oxide; Rate of penetration; Torque
ID WEAR; ROCKS; SAWS
AB Marble is used as a natural stone for decorative purposes from ages. Marble is a crystalline rock, composed predominantly of calcite, dolomite or serpentine. The presence of impurities imparts decorative pattern and colors. The diamond-based operations are extensively used in the mining and processing of marble. Marble is mined out in the form of blocks of cuboids shape and has to undergo extensive processing to make it suitable for the end users. The processing operation includes slabbing, sizing, polishing, etc. Diamond drilling is also commonly used for the exploration of different mineral deposits throughout the world. In this paper an attempt has been made to enhance the performance of diamond drilling on marble rocks by adding polyethylene-oxide (PEO) in the flushing water. The effect of PEO added with the drilling water was studied by varying different machine parameters and flushing media concentration in the laboratory. The responses were rate of penetration and torque at bit-rock interface. Different physico-mechanical properties of marble were also determined. It was found that flushing water added with PEO can substantially enhance the penetration rates and reduce the torque developed at the bit-rock interface as compared to plain flushing water.
C1 [Bhatnagar, A.; Khandelwal, Manoj] Maharana Pratap Univ Agr & Technol, Dept Min Engn, Coll Technol & Engn, Udaipur 313001, India.
   [Rao, K. U. M.] Indian Inst Technol, Dept Min Engn, Kharagpur 721302, W Bengal, India.
RP Khandelwal, M (reprint author), Maharana Pratap Univ Agr & Technol, Dept Min Engn, Coll Technol & Engn, Udaipur 313001, India.
EM mkhandelwal1@gmail.com
RI Khandelwal, Manoj/B-8219-2009
OI Khandelwal, Manoj/0000-0003-0368-3188
CR BHATNAGAR A, 1996, THESIS IIT KHARAGPUR
   Bhatnagar A., 2010, MINING SCI TECHNOL, V20, P400
   Chugh C.P., 1992, HIGH TECHNOLOGY DRIL
   Clark G. B., 1987, PRINCIPLES ROCK FRAG
   ENGELMANN WH, 1987, 9103 RI US BUR MIN, P18
   Ersoy A, 2005, WEAR, V258, P1422, DOI 10.1016/j.wear.2004.09.060
   Ersoy A, 2004, DIAM RELAT MATER, V13, P22, DOI 10.1016/j.diamond.2003.08.016
   FRANKLIN JA, 1972, INT SOC ROCK MECH
   John LP, 1994, THESIS IIT KHARAGPUR
   JOHN LP, 1997, INDIAN J ENG MATER S, V4, P63
   KROSCHWITZ JI, 1985, ENCY POLYM SCI ENG, V5, P120
   MILLER D, 1991, WEAR, V141, P311, DOI 10.1016/0043-1648(91)90276-Z
   MILLER D, 1990, INT J ROCK MECH MIN, V27, P363, DOI 10.1016/0148-9062(90)92711-M
   PAHLMAN JE, 1989, 9227 RIUSBM
   PAONE J, 1963, 6324 USBM
   Paone J, 1966, 6776 RIUSBM
   Rao K.U.M., 2002, GEOTECH GEOL ENG, V20, P1, DOI 10.1023/A:1013864423562
   Rao KUM, 1993, THESIS IIT KHARAGPUR
   Rao KUM, 1994, INT J SURF MINING RE, V8, P146
   Rao K.U.M., 1998, PRINCIPLES ROCK DRIL
   REBINDER PA, 1948, HARDNESS REDUCERS RO
   ROWLANDS D, 1975, THESIS U MELBOURNE
   TIAN XF, 1994, WEAR, V177, P81
   WATSON PJ, 1989, ICUSBM9229, P2
   WATSON PJ, 1991, 9370 RIUSBM
   WESTWOOD ARC, 1974, AIME, V256, P106
NR 26
TC 3
Z9 3
U1 0
U2 4
PU SPRINGER WIEN
PI WIEN
PA SACHSENPLATZ 4-6, PO BOX 89, A-1201 WIEN, AUSTRIA
SN 0723-2632
J9 ROCK MECH ROCK ENG
JI Rock Mech. Rock Eng.
PD MAY
PY 2011
VL 44
IS 3
BP 349
EP 356
DI 10.1007/s00603-011-0144-7
PG 8
WC Engineering, Geological; Geosciences, Multidisciplinary
SC Engineering; Geology
GA 758MC
UT WOS:000290167900009
ER

PT J
AU Hauet, T
   Hellwig, O
   Park, SH
   Beigne, C
   Dobisz, E
   Terris, BD
   Ravelosona, D
AF Hauet, T.
   Hellwig, O.
   Park, S. -H.
   Beigne, C.
   Dobisz, E.
   Terris, B. D.
   Ravelosona, D.
TI Influence of ion irradiation on switching field and switching field
   distribution in arrays of Co/Pd-based bit pattern media
SO APPLIED PHYSICS LETTERS
LA English
DT Article
ID MAGNETIC-ANISOTROPY
AB We have used ion irradiation to tune switching field and switching field distribution (SFD) in polycrystalline Co/Pd multilayer-based bit pattern media. Light He(+) ion irradiation strongly decreases perpendicular magnetic anisotropy amplitude due to Co/Pd interface intermixing, while the granular structure, i.e., the crystalline anisotropy, remains unchanged. In dot arrays, the anisotropy reduction leads to a decrease in coercivity (H(C)) but also to a strong broadening of the normalized SFD/H(C) (in percentage), since the relative impact of misaligned grains is enhanced. Our experiment thus confirms the major role of misorientated grains in SFD of nanodevice arrays. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3581896]
C1 [Hauet, T.; Hellwig, O.; Dobisz, E.; Terris, B. D.] SJRC, Hitachi Global Storage Technol, San Jose, CA 95135 USA.
   [Hauet, T.] Nancy Univ, CNRS, Inst Jean Lamour, UMR 7198, F-54506 Vandoeuvre Les Nancy, France.
   [Park, S. -H.; Ravelosona, D.] Univ Paris 11, CNRS, Inst Elect Fondamentale, UMR 8622, F-91405 Orsay, France.
   [Beigne, C.] CEA Grenoble, DRFMC SP2M, F-38054 Grenoble, France.
RP Hauet, T (reprint author), SJRC, Hitachi Global Storage Technol, San Jose, CA 95135 USA.
EM thomas.hauet@lpm.u-nancy.fr
RI ravelosona, dafine/A-5066-2016
OI ravelosona, dafine/0000-0002-4072-1457
CR Chappert C, 1998, SCIENCE, V280, P1919, DOI 10.1126/science.280.5371.1919
   Devolder T, 2000, PHYS REV B, V62, P5794, DOI 10.1103/PhysRevB.62.5794
   ENGEL BN, 1991, PHYS REV LETT, V67, P1910, DOI 10.1103/PhysRevLett.67.1910
   Fassbender J, 2004, J PHYS D APPL PHYS, V37, pR179, DOI 10.1088/0022-3727/37/16/R01
   Hauet T, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3276911
   Hellwig O, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3271679
   Lau JW, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2822439
   Mangin S, 2006, NAT MATER, V5, P210, DOI 10.1038/nmat1595
   Mangin S, 2009, APPL PHYS LETT, V94, DOI 10.1063/1.3058680
   Ozatay O, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3250924
   Parekh V, 2007, J APPL PHYS, V101, DOI 10.1063/1.2719018
   Shaw JM, 2007, J APPL PHYS, V101, DOI 10.1063/1.2431399
   Shaw JM, 2009, PHYS REV B, V80, DOI 10.1103/PhysRevB.80.184419
   Thomson T, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.257204
NR 14
TC 13
Z9 13
U1 1
U2 10
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0003-6951
J9 APPL PHYS LETT
JI Appl. Phys. Lett.
PD APR 25
PY 2011
VL 98
IS 17
AR 172506
DI 10.1063/1.3581896
PG 3
WC Physics, Applied
SC Physics
GA 756WS
UT WOS:000290046100039
ER

PT J
AU Moritz, J
   Vinai, G
   Auffret, S
   Dieny, B
AF Moritz, J.
   Vinai, G.
   Auffret, S.
   Dieny, B.
TI Two-bit-per-dot patterned media combining in-plane and
   perpendicular-to-plane magnetized thin films
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article
ID RECORDING MEDIA
AB We demonstrate the possibility of doubling the areal density of information in magnetic patterned media by stacking decoupled in-plane and perpendicular-to-plane magnetized layers. Each dot can be set in four magnetostatically equivalent configurations, yielding a storage capability of two-bits per dot. Magnetic force microscopy analyses show that the magnetic signal from the out-of-plane magnetized layer is dominant right above the dots, whereas, the signal from the in-plane magnetized layers is largest above the spacing between dots. This results in an optimal use of the storage space and in an increase of the areal density with weak loss in readout signal-to-noise ratio. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3572259]
C1 [Moritz, J.; Vinai, G.; Auffret, S.; Dieny, B.] UJF, SPINTEC, CNRS, CEA INAC,G INP,UMR, F-38054 Grenoble, France.
RP Moritz, J (reprint author), UJF, SPINTEC, CNRS, CEA INAC,G INP,UMR, 17 Rue Martyrs, F-38054 Grenoble, France.
EM jerome.moritz@cea.fr
OI Vinai, Giovanni/0000-0003-4882-663X
CR Albrecht M, 2005, J APPL PHYS, V97, DOI 10.1063/1.1904705
   Baltz V, 2009, APPL PHYS LETT, V94, DOI 10.1063/1.3078523
   Garcia JM, 2001, APPL PHYS LETT, V79, P656, DOI 10.1063/1.1389512
   Grobis M, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3304166
   Khizroev S, 2006, J APPL PHYS, V100, DOI 10.1063/1.2338129
   Khizroev SK, 1998, IEEE T MAGN, V34, P2030, DOI 10.1109/20.706782
   Landis S, 1999, APPL PHYS LETT, V75, P2473, DOI 10.1063/1.125052
   Li SJ, 2009, J APPL PHYS, V105, DOI 10.1063/1.3076140
   Lohau J, 2001, APPL PHYS LETT, V78, P990, DOI 10.1063/1.1347390
   Moritz J, 2005, APPL PHYS LETT, V86, DOI 10.1063/1.1861973
   Moritz J, 2004, APPL PHYS LETT, V84, P1519, DOI 10.1063/1.1644341
   Rhodes P., 1954, Proceedings of the Leeds Philosophical and Literary Society, V6, P191
   Rottmayer RE, 2006, IEEE T MAGN, V42, P2417, DOI 10.1109/TMAG.2006.879572
   Terris BD, 2009, J MAGN MAGN MATER, V321, P512, DOI 10.1016/j.jmmm.2008.05.046
   Zhu J.-G., 2008, IEEE T MAGN, V44, P25
NR 15
TC 12
Z9 12
U1 0
U2 2
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0021-8979
J9 J APPL PHYS
JI J. Appl. Phys.
PD APR 15
PY 2011
VL 109
IS 8
AR 083902
DI 10.1063/1.3572259
PG 4
WC Physics, Applied
SC Physics
GA 756XB
UT WOS:000290047000094
ER

PT J
AU Kalezhi, J
   Miles, JJ
AF Kalezhi, Josephat
   Miles, Jim J.
TI Analysis of write-head synchronization and adjacent track erasure in bit
   patterned media using a statistical model
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article
AB An analysis of the performance of a bit patterned media data storage system composed of nanoscale islands with variations in position and magnetic properties has been carried out. The statistical model of write errors includes adjacent track erasure and error rates are computed according to the down-track synchronization of the write head switching position and cross-track head position variations. Two-dimensional maps of bit error rates reveal that distributions of position and anisotropy have a severe impact on the performance of the system. Results show that head field cross-track gradients needs to be tightly controlled to minimize the effects of adjacent track erasure. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3562869]
C1 [Kalezhi, Josephat] Univ Manchester, Sch Comp Sci, Manchester M13 9PL, Lancs, England.
   [Kalezhi, Josephat; Miles, Jim J.] Copperbelt Univ, Sch Technol, Dept Comp Sci, Kitwe 10101, Zambia.
RP Kalezhi, J (reprint author), Univ Manchester, Sch Comp Sci, Oxford Rd, Manchester M13 9PL, Lancs, England.
EM kalezhij@cs.man.ac.uk
CR BROWN WF, 1963, PHYS REV, V130, P1677, DOI 10.1103/PhysRev.130.1677
   JINBO Y, 2010, COMMUNICATION
   Kalezhi J, 2010, IEEE T MAGN, V46, P3752, DOI 10.1109/TMAG.2010.2052626
   Livshitz B, 2009, IEEE T MAGN, V45, P3519, DOI 10.1109/TMAG.2009.2022501
   Livshitz B, 2009, J APPL PHYS, V105, DOI 10.1063/1.3072442
   Moser A, 2007, APPL PHYS LETT, V91, DOI 10.1063/1.2799174
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Schabes ME, 2008, J MAGN MAGN MATER, V320, P2880, DOI 10.1016/j.jmmm.2008.07.035
NR 8
TC 1
Z9 1
U1 0
U2 2
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0021-8979
J9 J APPL PHYS
JI J. Appl. Phys.
PD APR 1
PY 2011
VL 109
IS 7
AR 07B755
DI 10.1063/1.3562869
PG 3
WC Physics, Applied
SC Physics
GA 755QV
UT WOS:000289952100022
ER

PT J
AU Kim, J
   Lee, J
AF Kim, Jinyoung
   Lee, Jaejin
TI Two-dimensional soft output Viterbi algorithm with noise filter for
   patterned media storage
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article
ID PERFORMANCE
AB We introduce a two-dimensional (2D) soft output Viterbi algorithm (SOVA) using two 1D SOVAs, which apply two noise filters corresponding to horizontal and vertical directions, respectively, for patterned media storage. Patterned media storage has 2D intersymbol interference (ISI), which includes ISI from neighboring symbols and intertrack interference from adjacent tracks, since there is a small space between adjacent tracks and neighborhood symbols. Noise filter replaces colored noise with white noise. As a result, the noise filter can reduce the noise power, so that performance can be improved. As shown in the simulation results, when there is no off-track, the 2D SOVA using a noise filter is approximately 0.4 dB better than not using a noise filter at a 10(-6) bit error rate; when there is 20% off-track, it has about a 1 dB gain. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3559540]
C1 [Kim, Jinyoung; Lee, Jaejin] Soongsil Univ, Sch Elect Engn, Seoul 156743, South Korea.
RP Lee, J (reprint author), Soongsil Univ, Sch Elect Engn, Seoul 156743, South Korea.
EM kijiyou@ssu.ac.kr; zlee@ssu.ac.kr
FU Korean government (MEST) [2010-0014344]
FX This work was supported by the National Research Foundation of Korea
   (NRF) grant funded by the Korean government (MEST; Grant No.
   2010-0014344).
CR Coker JD, 1998, IEEE T MAGN, V34, P110, DOI 10.1109/20.663468
   HAGENAUER J, 1989, IEEE GLOBECOM, P1680, DOI 10.1109/GLOCOM.1989.64230
   Kim JH, 2009, JPN J APPL PHYS, V48, DOI 10.1143/JJAP.48.101404
   LU PL, 1994, IEEE T MAGN, V30, P4230, DOI 10.1109/20.334044
   NABAVI S, 2007, P IEEE INT C COMM IC, P6249
   Nabavi S, 2007, IEEE T MAGN, V43, P2274, DOI 10.1109/TMAG.2007.893479
   Nutter PW, 2005, IEEE T MAGN, V41, P3214, DOI 10.1109/TMAG.2005.854780
   Nutter PW, 2005, IEEE T MAGN, V41, P4327, DOI 10.1109/TMAG.2005.856586
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
   Zhu JG, 2000, IEEE T MAGN, V36, P23, DOI 10.1109/20.824420
   Taguchi M., 1999, U.S. Patent, Patent No. 5986987
NR 11
TC 1
Z9 1
U1 0
U2 0
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0021-8979
J9 J APPL PHYS
JI J. Appl. Phys.
PD APR 1
PY 2011
VL 109
IS 7
AR 07B742
DI 10.1063/1.3559540
PG 3
WC Physics, Applied
SC Physics
GA 755QV
UT WOS:000289952100009
ER

PT J
AU Li, WM
   Chen, YJ
   Huang, TL
   Xue, JM
   Ding, J
AF Li, W. M.
   Chen, Y. J.
   Huang, T. L.
   Xue, J. M.
   Ding, J.
TI Calculation of individual bit island switching field distribution in
   perpendicular magnetic bit patterned media
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article
ID MULTILAYERS; MICROSTRUCTURE
AB Bit patterned media (BPM) is a promising candidate to achieve ultrahigh recording density in magnetic data storage. One of the critical issues for BPM in high-density recording is that the switching field distribution (SFD) needs to be narrow enough to secure exact addressability of individual predefined bits without overwriting adjacent bits. In our work, we observed magnetic reversal of individual islands through magnetic force microscopy and calculated the demagnetization and SFD using the obtained intrinsic SFD to verify if dipole-dipole interactions contribute to the SFD broadening. In simulation, we used the formula in the calculation of critical magnetic field for the reversal of individual islands: H(c) = H(c),(int) Sigma M(s)V(bit)/r(3), where H(c) is the critical field, H(c,int) is the initial critical field without dipole-dipole interactions, and Sigma represents the dipole-dipole interactions from neighboring islands. H(c,int) was generated from the obtained initial SFD (2 sigma = 1.2 kOe), dipole-dipole interactions cause a significant SFD broadening. The width of 2 sigma = 1.7 kOe after the calculation with the consideration of the dipole-dipole distribution is in a relatively good agreement with our experimental data (2 sigma = 2.0 kOe). The calculated demagnetization loop also agrees well with our experimental result. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3563069]
C1 [Li, W. M.; Xue, J. M.; Ding, J.] Natl Univ Singapore, Dept Mat Sci & Engn, Singapore 119260, Singapore.
   [Li, W. M.; Chen, Y. J.; Huang, T. L.] ASTAR, Data Storage Inst, Singapore 117608, Singapore.
RP Li, WM (reprint author), Natl Univ Singapore, Dept Mat Sci & Engn, Singapore 119260, Singapore.
EM msedingj@nus.edu.sg
RI Ding, Jun/C-5172-2011; Li, Weimin/J-8818-2012
CR Bereto G. A., 1994, J MAGN MAGN MATER, V134, P173
   CARCIA PF, 1990, APPL PHYS LETT, V56, P2345, DOI 10.1063/1.102912
   CARCIA PF, 1993, J MAGN MAGN MATER, V121, P452, DOI 10.1016/0304-8853(93)91245-3
   Chen YJ, 2010, IEEE T MAGN, V46, P1990, DOI 10.1109/TMAG.2010.2043064
   Gunther CM, 2010, PHYS REV B, V81, DOI 10.1103/PhysRevB.81.064411
   Hellwig O, 2007, APPL PHYS LETT, V90, DOI 10.1063/1.2730744
   Krone P, 2009, J APPL PHYS, V106, DOI 10.1063/1.3260240
   Onoue T, 2002, J APPL PHYS, V92, P4545, DOI 10.1063/1.1506420
   Sbiaa R, 2009, J APPL PHYS, V106, DOI 10.1063/1.3173546
   Shaw JM, 2009, PHYS REV B, V80, DOI 10.1103/PhysRevB.80.184419
   Shaw JM, 2008, PHYS REV B, V78, DOI 10.1103/PhysRevB.78.024414
   TAGAWA I, 1991, IEEE T MAGN, V27, P6
   Thomson T, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.257204
   Usherwood TW, 1996, J MAGN MAGN MATER, V162, P383, DOI 10.1016/S0304-8853(96)00379-4
NR 14
TC 9
Z9 9
U1 0
U2 8
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0021-8979
J9 J APPL PHYS
JI J. Appl. Phys.
PD APR 1
PY 2011
VL 109
IS 7
AR 07B758
DI 10.1063/1.3563069
PG 3
WC Physics, Applied
SC Physics
GA 755QV
UT WOS:000289952100025
ER

PT J
AU Sharma, P
   Kaushik, N
   Makino, A
   Esashi, M
   Inoue, A
AF Sharma, Parmanand
   Kaushik, Neelam
   Makino, Akihiro
   Esashi, Masayoshi
   Inoue, Akihisa
TI L1(0) FePt(111)/glassy CoFeTaB bilayered structure for patterned media
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article
ID MAGNETIC RECORDING MEDIA
AB We report on the use of CoFeTaB metallic glass thin film as a soft magnetic underlayer which promotes the growth of L1(0) FePt along the preferred (111) crystallographic direction. The preferred oriented phase of L1(0) FePt is obtained by either in situ deposition upon a heated CoFeTaB/SiO2/Si or at room temperature (FePt/CoFeTaB/SiO2/Si) followed by annealing at 400-450 degrees C for 15 min. The latter process is shown to be advantageous in terms of the fabrication of patterned media. Pattern sizes ranging from 25-100 nm made from L1(0) FePt (111)/glassy CoFeTaB were fabricated by photo/electron beam lithography. The structural and magnetic characterizations strongly suggest the applicability of the present bilayered structure in the fabrication of high density bit-patterned magnetic recording media. (C) 2011 American Institute of Physics. [doi:10.1063/1.3561803]
C1 [Sharma, Parmanand; Makino, Akihiro] Tohoku Univ, Inst Mat Res, Sendai, Miyagi 9808577, Japan.
   [Kaushik, Neelam; Esashi, Masayoshi] Tohoku Univ, Adv Inst Mat Res AIMR, World Premier Initiat WPI Ctr, Sendai, Miyagi 9808577, Japan.
RP Sharma, P (reprint author), Tohoku Univ, Inst Mat Res, Sendai, Miyagi 9808577, Japan.
EM sharmap@imr.tohoku.ac.jp
RI Sharma, Parmanand/C-1518-2011; Esashi, Masayoshi/A-4849-2010; MAKINO,
   AKIHIRO/B-2549-2009; Inoue, Akihisa/E-5271-2015
FU JSPS; RIMCOF, NEDO Japan
FX This work is partly supported by "Grant-in-Aid for Young Scientist A/B"
   from JSPS, and from RIMCOF, NEDO Japan.
CR Albrecht M, 2005, NAT MATER, V4, P203, DOI 10.1038/nmat1324
   Chappert C, 1998, SCIENCE, V280, P1919, DOI 10.1126/science.280.5371.1919
   Chen YJ, 2010, IEEE T MAGN, V46, P1990, DOI 10.1109/TMAG.2010.2043064
   Gao KZ, 2002, IEEE T MAGN, V38, P3675, DOI 10.1109/TMAG.2002.804801
   Guo VW, 2009, IEEE T MAGN, V45, P2686, DOI 10.1109/TMAG.2009.2018640
   Hellwig O, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3271679
   Kaushik N, 2010, APPL PHYS LETT, V97, DOI 10.1063/1.3479054
   Krone P, 2010, APPL PHYS LETT, V97, DOI 10.1063/1.3481668
   Krone P, 2010, J APPL PHYS, V108, DOI 10.1063/1.3457037
   Miles JJ, 2007, IEEE T MAGN, V43, P955, DOI 10.1109/TMAG.2006.888354
   Ouchi T, 2010, IEEE T MAGN, V46, P2224, DOI 10.1109/TMAG.2010.2040068
   Qin GW, 2009, INT MATER REV, V54, P157, DOI 10.1179/174328009X411172
   Sharma P, 2007, NANOTECHNOLOGY, V18, DOI 10.1088/0957-4484/18/3/035302
   Sharma P, 2006, J APPL PHYS, V100, DOI 10.1063/1.2359142
   Shima T, 2002, APPL PHYS LETT, V81, P1050, DOI 10.1063/1.1498504
   Wang JP, 2005, IEEE T MAGN, V41, P3181, DOI 10.1109/TMAG.2005.855278
   Weller D, 2000, ANNU REV MATER SCI, V30, P611, DOI 10.1146/annurev.matsci.30.1.611
   Zha CL, 2009, APPL PHYS LETT, V94, DOI 10.1063/1.3123003
NR 18
TC 4
Z9 4
U1 0
U2 7
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0021-8979
J9 J APPL PHYS
JI J. Appl. Phys.
PD APR 1
PY 2011
VL 109
IS 7
AR 07B908
DI 10.1063/1.3561803
PG 3
WC Physics, Applied
SC Physics
GA 755QV
UT WOS:000289952100050
ER

PT J
AU Springer, F
   Hellwig, O
   Dobisz, E
   Albrecht, M
   Grobis, M
AF Springer, F.
   Hellwig, O.
   Dobisz, E.
   Albrecht, M.
   Grobis, M.
TI Probing the time-dependent switching probability of individual patterned
   magnetic islands
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article
ID COERCIVITY MEASUREMENTS; MEDIA; PARTICLE
AB We show switching probability measurements of individual bits of a bit patterned media in the highly inhomogeneous write field of a recording head. The behavior of the switching probability as a function of the applied field pulse width t deviates from a simple Arrhenius-Neel model for the magnetization reversal. The data agree well with an extended model that assumes a normal distribution of energy barriers. We compare the extracted energy barrier distribution to the switching field distribution in a uniform perpendicular magnetic field measured at long time scales. (C) 2011 American Institute of Physics. [doi:10.1063/1.3540574]
C1 [Springer, F.] Univ Konstanz, Dept Phys, D-78457 Constance, Germany.
   [Springer, F.; Hellwig, O.; Dobisz, E.; Grobis, M.] Hitachi Global Storage Technol, San Jose Res Ctr, San Jose, CA 95135 USA.
   [Springer, F.; Albrecht, M.] Tech Univ Chemnitz, Inst Phys, D-09107 Chemnitz, Germany.
RP Springer, F (reprint author), Univ Konstanz, Dept Phys, D-78457 Constance, Germany.
EM felix.springer@uni-konstanz.de
CR Albrecht M, 2002, J APPL PHYS, V91, P6845, DOI 10.1063/1.1447174
   Albrecht TR, 2009, NANOSCALE MAGNETIC MATERIALS AND APPLICATIONS, P237, DOI 10.1007/978-0-387-85600-1_9
   Bean C.P., 1959, Journal of Applied Physics, V30, p120S, DOI 10.1063/1.2185850
   BROWN WF, 1963, PHYS REV, V130, P1677, DOI 10.1103/PhysRev.130.1677
   Coffey WT, 1998, PHYS REV LETT, V80, P5655, DOI 10.1103/PhysRevLett.80.5655
   Grobis M, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3304166
   Hauet T, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3276911
   Moser A, 1999, J APPL PHYS, V85, P5018, DOI 10.1063/1.370077
   MURILLO R, 2006, MICROSYST TECHNOL, V13, P177, DOI 10.1007/s00542-006-0143-x
   Richter HJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2209179
   Schabes ME, 2008, J MAGN MAGN MATER, V320, P2880, DOI 10.1016/j.jmmm.2008.07.035
   SHARROCK MP, 1981, IEEE T MAGN, V17, P3020, DOI 10.1109/TMAG.1981.1061755
   Suess D, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2908052
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Thomson T, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.257204
NR 15
TC 0
Z9 0
U1 0
U2 3
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0021-8979
J9 J APPL PHYS
JI J. Appl. Phys.
PD APR 1
PY 2011
VL 109
IS 7
AR 07B905
DI 10.1063/1.3540574
PG 3
WC Physics, Applied
SC Physics
GA 755QV
UT WOS:000289952100047
ER

PT J
AU Suharyadi, E
   Oshima, D
   Kato, T
   Iwata, S
AF Suharyadi, E.
   Oshima, D.
   Kato, T.
   Iwata, S.
TI Switching field distribution of planar-patterned CrPt3 nanodots
   fabricated by ion irradiation
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article
ID MAGNETIC-PROPERTIES; FILMS; NANOSTRUCTURES; MEDIA
AB Planar-patterned CrPt3 ordered L1(2) nanodots with various bit sizes (D) from 220 to 55 nm were fabricated by the local irradiation of 30 keV of Kr+ ions not by conventional physical etching. Patterned nanodots with bit size <= 65 nm show either dark or bright contrast, suggesting that they have single domain structure. Switching field distribution of nanodots was studied by taking magnetic force microcopy images, in the progress of the magnetization reversal. As-prepared CrPt3 film exhibited perpendicular hysteresis loop with the coercivity of 5.5 kOe. Compared with the as-prepared film, the average switching field (H-sf) of the CrPt3 nanodots increased as 6.5, 8.5, and 9.2 kOe while the switching field distribution (Delta H-sf) decreased as 6.8, 3.6, and 2.8 kOe, for the patterned nanodots with bit sizes of 220, 150, 65 nm, respectively. We found that the small Delta H-sf/H-sf is possible in the high density planar bit patterned media fabricated by ion irradiation. (C) 2011 American Institute of Physics. [doi:10.1063/1.3565492]
C1 [Suharyadi, E.; Oshima, D.; Kato, T.; Iwata, S.] Nagoya Univ, Dept Quantum Engn, Chikusa Ku, Aichi 4648603, Japan.
   [Suharyadi, E.] Japan Soc Promot Sci, Tokyo 1028471, Japan.
RP Kato, T (reprint author), Nagoya Univ, Dept Quantum Engn, Chikusa Ku, Furo Cho, Aichi 4648603, Japan.
EM takeshik@nuee.nagoya-u.ac.jp
RI Kato, Takeshi/I-2654-2013
FU Japan Society for the Promotion of Science (JSPS)
FX This work is partly supported by a Grant-in-Aid from Japan Society for
   the Promotion of Science (JSPS).
CR Chappert C, 1998, SCIENCE, V280, P1919, DOI 10.1126/science.280.5371.1919
   Cho J, 1999, J APPL PHYS, V86, P3149, DOI 10.1063/1.371181
   FERRE J, 1999, J MAGN MAGN MATER, V199, P191
   Hellwig O, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3293301
   Hellwig O, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3271679
   HU G, 2005, J APPL PHYS, V10
   Hyndman R, 2001, J APPL PHYS, V90, P3843, DOI 10.1063/1.1401803
   Kato T, 2009, J APPL PHYS, V106, DOI 10.1063/1.3212967
   Kato T, 2009, J APPL PHYS, V105, DOI 10.1063/1.3072024
   Kato T, 2010, IEEE T MAGN, V46, P1671, DOI 10.1109/TMAG.2010.2044559
   Schabes ME, 2008, J MAGN MAGN MATER, V320, P2880, DOI 10.1016/j.jmmm.2008.07.035
   Suharyadi E, 2006, IEEE T MAGN, V42, P2972, DOI 10.1109/TMAG.2006.880076
   Suharyadi E, 2005, IEEE T MAGN, V41, P3595, DOI 10.1109/TMAG.2005.854735
   Terris BD, 1999, APPL PHYS LETT, V75, P403, DOI 10.1063/1.124389
   Thomson T, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.257204
NR 15
TC 2
Z9 2
U1 0
U2 2
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0021-8979
J9 J APPL PHYS
JI J. Appl. Phys.
PD APR 1
PY 2011
VL 109
IS 7
AR 07B771
DI 10.1063/1.3565492
PG 3
WC Physics, Applied
SC Physics
GA 755QV
UT WOS:000289952100038
ER

PT J
AU Wang, H
   Rahman, MT
   Zhao, HB
   Isowaki, Y
   Kamata, Y
   Kikitsu, A
   Wang, JP
AF Wang, Hao
   Rahman, M. Tofizur
   Zhao, Haibao
   Isowaki, Yosuke
   Kamata, Yoshiyuki
   Kikitsu, Akira
   Wang, Jian-Ping
TI Fabrication of FePt type exchange coupled composite bit patterned media
   by block copolymer lithography
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article
AB We fabricated exchange coupled composite (ECC) L1(0) ordered, (001) oriented FePt (5nm)/Fe (5 nm) bit patterned media over a large area by diblock copolymer lithography. We formed the dot arrays of the copolymer directly on the magnetic film and used them as the etching mask. The average size of the ECC FePt/Fe pillars was about 32 nm, with a center to center distance of about 35 nm and a size distribution of about 8%. The perpendicular coercivity (H-c) of the ECC FePt/Fe patterned structures was about 4.3 kOe. Both the coercivity and the saturation field of the ECC FePt/Fe patterned structure were reduced by about 50% due to the exchange coupling between FePt and Fe in the FePt/Fe patterned structure compared to the FePt patterned structure with similar dot size and distribution. The thermal stability and gain factor of the FePt/Fe ECC structure were about 260 k(B)T and 1.35, respectively. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3562453]
C1 [Wang, Hao; Rahman, M. Tofizur; Zhao, Haibao; Wang, Jian-Ping] Univ Minnesota, Dept Elect & Comp Engn, MINT Ctr, Minneapolis, MN 55455 USA.
   [Isowaki, Yosuke; Kamata, Yoshiyuki; Kikitsu, Akira] Toshiba Co Ltd, Kawasaki, Kanagawa 210, Japan.
RP Wang, JP (reprint author), Univ Minnesota, Dept Elect & Comp Engn, MINT Ctr, Minneapolis, MN 55455 USA.
EM jpwang@umn.edu
FU INSIC; NSF [DMR-0819885]; NSF Nano Fabrication Center (NFC) at the
   University of Minnesota; NSF through NNIN
FX This work is partially supported by the INSIC extremely high areal
   density recording (EHDR) program, Western Digital, the NSF MRSEC program
   under Award Number DMR-0819885, and the NSF Nano Fabrication Center
   (NFC) at the University of Minnesota. Parts of this work were carried
   out in the University of Minnesota I. T. Characterization Facility,
   which receives partial support from the NSF through the NNIN program.
CR Batra S, 2004, IEEE T MAGN, V40, P319, DOI 10.1109/TMAG.2003.821163
   Breitling A, 2009, PHYS STATUS SOLIDI-R, V3, P130, DOI 10.1002/pssr.200903074
   Casoli F, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2905294
   Chou SY, 1996, J VAC SCI TECHNOL B, V14, P4129, DOI 10.1116/1.588605
   Goll D, 2008, PHYSICA B, V403, P1854, DOI 10.1016/j.physb.2007.10.336
   Goll D, 2009, APPL PHYS LETT, V94, DOI 10.1063/1.3078286
   Hellwig O, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3293301
   Hieda H, 2006, J PHOTOPOLYM SCI TEC, V19, P425, DOI 10.2494/photopolymer.19.425
   Kamata Y, 2004, J APPL PHYS, V95, P6705, DOI 10.1063/1.1669347
   Ma B, 2010, IEEE T MAGN, V46, P2345, DOI 10.1109/TMAG.2009.2039858
   Naito K, 2002, IEEE T MAGN, V38, P1949, DOI 10.1109/TMAG.2002.802847
   Rahman MT, 2009, J APPL PHYS, V105, DOI 10.1063/1.3072444
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Skomski R, 2008, J APPL PHYS, V103, DOI 10.1063/1.2835094
   Suess D, 2005, APPL PHYS LETT, V87, DOI 10.1063/1.1951053
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Victora RH, 2005, IEEE T MAGN, V41, P2828, DOI 10.1109/TMAG.2005.855263
   Wang JP, 2005, IEEE T MAGN, V41, P3181, DOI 10.1109/TMAG.2005.855278
   Weller D, 1999, IEEE T MAGN, V35, P4423, DOI 10.1109/20.809134
   Weller D, 2000, IEEE T MAGN, V36, P10, DOI 10.1109/20.824418
   Xu YF, 2002, APPL PHYS LETT, V80, P3325, DOI 10.1063/1.1476706
   Yang X, 2007, J VAC SCI TECHNOL B, V25, P2202, DOI 10.1116/1.2798711
NR 22
TC 19
Z9 19
U1 1
U2 12
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0021-8979
J9 J APPL PHYS
JI J. Appl. Phys.
PD APR 1
PY 2011
VL 109
IS 7
AR 07B754
DI 10.1063/1.3562453
PG 3
WC Physics, Applied
SC Physics
GA 755QV
UT WOS:000289952100021
ER

PT J
AU Greaves, SJ
   Muraoka, H
   Kanai, Y
AF Greaves, Simon John
   Muraoka, Hiroaki
   Kanai, Yasushi
TI The feasibility of bit-patterned recording at 4 Tb/in.(2) without
   heat-assist
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article; Proceedings Paper
CT 55th Annual Conference on Magnetism and Magnetic Materials
CY NOV, 2010
CL Atlanta, GA
ID MEDIA
AB Magnetic recording on bit patterned media with dot densities of 4 Tbit/in.(2) was simulated. Head field distributions of shielded, single pole write heads with various main pole widths were used for recording. Write windows, showing the range of head positions which resulted in error-free recording and no adjacent track erasure, were calculated. The bit aspect ratio (BAR) and magnetic spacing between the write head and the medium were varied and the system with the lowest write error rate was found to be a 1:1 BAR, shingled recording system. For single-track recording a 2:1 BAR and a magnetic spacing of 3.5 nm gave the lowest write-error rate. (C) 2011 American Institute of Physics. [doi:10.1063/1.3536666]
C1 [Greaves, Simon John; Muraoka, Hiroaki] Tohoku Univ, RIEC, Aoba Ku, Sendai, Miyagi 9808577, Japan.
   [Kanai, Yasushi] Niigata Inst Technol, IEE, Kashiwazaki 9451195, Japan.
RP Greaves, SJ (reprint author), Tohoku Univ, RIEC, Aoba Ku, Katahira 2-1-1, Sendai, Miyagi 9808577, Japan.
EM simon@riec.tohoku.ac.jp
CR GREAVES SJ, 2009, IEEE T MAGN, V41, P3823
   Kryder MH, 2008, P IEEE, V96, P1810, DOI 10.1109/JPROC.2008.2004315
   LAMBERT SE, 1991, J APPL PHYS, V69, P4724, DOI 10.1063/1.348260
   Victora RH, 2005, IEEE T MAGN, V41, P537, DOI 10.1109/TMAG.2004.838075
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
   Wood R., 2009, IEEE T MAGN, V44, P917
NR 6
TC 1
Z9 1
U1 0
U2 2
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0021-8979
J9 J APPL PHYS
JI J. Appl. Phys.
PD APR 1
PY 2011
VL 109
IS 7
AR 07B702
DI 10.1063/1.3536666
PG 3
WC Physics, Applied
SC Physics
GA 755PY
UT WOS:000289949000396
ER

PT J
AU Saga, H
   Shirahata, K
   Mitsuzuka, K
   Shimatsu, T
   Aoi, H
   Muraoka, H
AF Saga, Hideki
   Shirahata, Kazuki
   Mitsuzuka, Kaname
   Shimatsu, Takehito
   Aoi, Hajime
   Muraoka, Hiroaki
TI Experimental write margin analysis of bit patterned media
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article; Proceedings Paper
CT 55th Annual Conference on Magnetism and Magnetic Materials
CY NOV, 2010
CL Atlanta, GA
ID MAGNETIC STORAGE; DENSITY
AB Write margin analysis of the bit patterned media (BPM) was experimentally carried out using a static tester. Sample BPM were fabricated from hard/soft-stacked (exchange-coupled composite; ECC) base media with a Pt/Co multilayer hard layer and a Co soft layer. Write margins of 60-nm-dot (140 nm period) and 40-nm-dot (100 nm period) media were confirmed to be 80 nm and 50 nm, respectively. An analysis of the margin loss factor found a large residual margin loss. The loss factors of 60-nm-dot and 40-nm-dot media were 57 nm and 44 nm, respectively, and these values almost correspond to the dot diameter. The residual margin loss was identified as due to the formation of a multi-domain structure within some dots under certain recording conditions. (C) 2011 American Institute of Physics. [doi:10.1063/1.3554201]
C1 [Saga, Hideki] Hitachi Ltd, Cent Res Lab, Kanagawa 2568510, Japan.
   [Saga, Hideki; Shirahata, Kazuki; Mitsuzuka, Kaname; Shimatsu, Takehito; Aoi, Hajime; Muraoka, Hiroaki] Tohoku Univ, Elect Commun Res Inst, Aoba Ku, Sendai, Miyagi 9808577, Japan.
RP Saga, H (reprint author), Hitachi Ltd, Cent Res Lab, 2880 Kohzu, Kanagawa 2568510, Japan.
EM hideki.saga.vv@hitachi.com
CR Albrecht M, 2003, IEEE T MAGN, V39, P2323, DOI 10.1109/TMAG.2003.816285
   Albrecht M, 2002, APPL PHYS LETT, V80, P3409, DOI 10.1063/1.1476062
   Aoi H., 2009, MR200939 IEICE, P13
   CHOU SY, 1994, J APPL PHYS, V76, P6673, DOI 10.1063/1.358164
   Ikeda Y, 2010, IEEE T MAGN, V46, P1622, DOI 10.1109/TMAG.2010.2041193
   Kikuchi N, 2003, APPL PHYS LETT, V82, P4313, DOI 10.1063/1.1580994
   Kitakami O, 2009, Journal of Physics: Conference Series, V165, DOI 10.1088/1742-6596/165/1/012029
   LAMBERT SE, 1987, IEEE T MAGN, V23, P3690, DOI 10.1109/TMAG.1987.1065736
   Lohau J, 2001, IEEE T MAGN, V37, P1652, DOI 10.1109/20.950928
   Mitsuzuka K, 2009, J APPL PHYS, V105, DOI 10.1063/1.3072014
   Muraoka Hiroaki, 2008, IEEE Transactions on Magnetics, V44, P3423, DOI 10.1109/TMAG.2008.2001654
   NEW RMH, 1994, J VAC SCI TECHNOL B, V12, P3196, DOI 10.1116/1.587499
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Rottmayer RE, 2006, IEEE T MAGN, V42, P2417, DOI 10.1109/TMAG.2006.879572
   Terris BD, 2005, IEEE T MAGN, V41, P2822, DOI 10.1109/TMAG.2005.855264
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
   Yamamoto SY, 1996, APPL PHYS LETT, V69, P3263, DOI 10.1063/1.118030
   Zhu JG, 2008, IEEE T MAGN, V44, P125, DOI 10.1109/TMAG.2007.911031
NR 18
TC 3
Z9 3
U1 0
U2 0
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0021-8979
J9 J APPL PHYS
JI J. Appl. Phys.
PD APR 1
PY 2011
VL 109
IS 7
AR 07B721
DI 10.1063/1.3554201
PG 3
WC Physics, Applied
SC Physics
GA 755PY
UT WOS:000289949000415
ER

PT J
AU Wu, L
AF Wu, Lin
TI Lubricant distribution and its effect on slider air bearing performance
   over bit patterned media disk of disk drives
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article
ID RECORDING MEDIA
AB The distribution dynamics of a thin lubricant film on a bit-patterned media disk and its effect on the performance of the ultralow flying air bearing slider of disk drives are studied by direct numerical simulations. Our analysis shows that the physics governing lubricant distribution dynamics changes when deep enough sub-100-nm nanostructures are patterned on the disk surface. Air shearing under the slider that dominates lubricant flow on a flat disk may become negligible on a bit-patterned media disk. Surface tension and disjoining pressure become dominant factors instead. Our results show that disks with nanoscale patterns/roughness may no longer be treated as flat, and the air bearing load may strongly depend not only on the geometric detail of disk patterns but also on how lubricants are distributed on the patterns when slider-disk clearance is reduced to sub-10-nm. Air bearing load and consequently the slider's flying attitude are affected by disk pattern geometry, average lubricant thickness, and material properties of lubricant such as the surface tension coefficient and Hamaker constant. The significantly expanded parameter space, upon which ultralow flying slider's dynamics depends, has to be seriously considered in evaluating the head/disk interface tribology performance of next generation patterned media magnetic recording systems. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3573597]
C1 Univ Sci & Technol China, Dept Modern Mech, Hefei 230027, Anhui, Peoples R China.
RP Wu, L (reprint author), Univ Sci & Technol China, Dept Modern Mech, Hefei 230027, Anhui, Peoples R China.
EM linwu@ustc.edu.cn
CR Charap SH, 1997, IEEE T MAGN, V33, P978, DOI 10.1109/20.560142
   Dai Q, 2004, J APPL PHYS, V96, P696, DOI 10.1063/1.1739527
   Deoras SK, 2003, IEEE T MAGN, V39, P2471, DOI 10.1109/TMAG.2003.816441
   Duwensee M, 2006, IEEE T MAGN, V42, P2489, DOI 10.1109/TMAG.2006.878617
   Fukui S., 1988, ASME J TRIBOLOGY, V110, P335
   Hughes GF, 2000, IEEE T MAGN, V36, P521, DOI 10.1109/20.825831
   Li WL, 2005, MICROSYST TECHNOL, V11, P23, DOI 10.1007/s00542-004-0462-8
   Ma XD, 2002, IEEE T MAGN, V38, P112, DOI 10.1109/TMAG.2002.988921
   Oron A, 1997, REV MOD PHYS, V69, P931, DOI 10.1103/RevModPhys.69.931
   Ross C, 2001, ANN REV MATER RES, V31, P203, DOI 10.1146/annurev.matsci.31.1.203
   Scarpulla A., 2003, J CHEM PHYS, P3368
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Wu L., 2006, J APPL PHYS, V99
   Wu L, 2001, THESIS U CALIFORNIA
   Wu L, 2006, J APPL PHYS, V100, DOI 10.1063/1.2220489
NR 15
TC 1
Z9 1
U1 2
U2 5
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0021-8979
J9 J APPL PHYS
JI J. Appl. Phys.
PD APR 1
PY 2011
VL 109
IS 7
AR 074511
DI 10.1063/1.3573597
PG 8
WC Physics, Applied
SC Physics
GA 755PY
UT WOS:000289949000142
ER

PT J
AU Rybin, A
   Timonen, J
AF Rybin, Andrei
   Timonen, Jussi
TI Nonlinear theory of slow light
SO PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL
   AND ENGINEERING SCIENCES
LA English
DT Review
DE Bose-Einstein condensation; optical soliton; slow light
ID ELECTROMAGNETICALLY INDUCED TRANSPARENCY; SELF-INDUCED TRANSPARENCY;
   SINE-GORDON EQUATIONS; ATOMIC MEDIUM; PULSES; 3-LEVEL; PROPAGATION;
   SOLITONS; STORAGE; SYSTEM
AB In the framework of the nonlinear L model, propagation of solitons was analysed in atomic vapours and Bose-Einstein condensates. The complicated nonlinear interplay between fast and slow-light solitons in a L-type medium was shown to facilitate control of its optical transparency and formation of optical gates. An exact analytical description was given for the deceleration, stopping and revival of slow-light solitons in the experimentally relevant non-adiabatic regime. A stopping slow-light soliton imprints a localized immobile polarization pattern in the medium, which, as explicitly demonstrated here, can be used as a bit of readable optical memory. The whole process can be controlled with the background field and an auxiliary laser field. The latter regulates the signal velocity, while the slow-light soliton can be stopped by switching off the former. The location and shape of the imprinted memory bit were also determined. With few assumptions characteristic of slow light, the L model was reduced to a simpler nonlinear model that also describes two-dimensional dilatonic gravity. Exact solutions could now be derived also in the presence of relaxation. Spontaneous decay of the upper atomic level was found to be strongly suppressed, and the spatial form of the decelerating slow-light soliton was preserved, even if the optical relaxation time was much shorter than the typical time scale of the soliton. The effective relaxation coefficient of the slow-light soliton was significantly smaller than that of an arbitrary optical pulse. Such features are obviously of great importance when this kind of system is applied, in practice, to information processing. A number of experimentally observable properties of the solutions reported were found to be in good agreement with recent experimental results, and a few suggestions are also made for future experiments.
C1 [Rybin, Andrei] St Petersburg State Univ Informat Technol Mech &, St Petersburg 197101, Russia.
   [Timonen, Jussi] Univ Jyvaskyla, Dept Phys, SF-40351 Jyvaskyla, Finland.
RP Rybin, A (reprint author), St Petersburg State Univ Informat Technol Mech &, Kronwerkski Ave 49, St Petersburg 197101, Russia.
EM andrei.rybin@gmail.com
CR Andreev AV, 1998, J EXP THEOR PHYS+, V86, P412, DOI 10.1134/1.558444
   Bajcsy M, 2003, NATURE, V426, P638, DOI 10.1038/nature02176
   Bigelow MS, 2003, SCIENCE, V301, P200, DOI 10.1126/science.1084429
   Braje DA, 2003, PHYS REV A, V68, DOI 10.1103/PhysRevA.68.041801
   BULLOUGH RK, 1979, PHYS SCRIPTA, V20, P364, DOI 10.1088/0031-8949/20/3-4/011
   Byrne JA, 2003, PHYSICA D, V186, P69, DOI 10.1016/S0167-2789(03)00245-8
   CAUDREY PJ, 1973, PHYS REV LETT, V30, P237, DOI 10.1103/PhysRevLett.30.237
   Dey TN, 2003, PHYS REV A, V67, DOI 10.1103/PhysRevA.67.033813
   DODD RK, 1977, P ROY SOC LOND A MAT, V352, P481, DOI 10.1098/rspa.1977.0012
   Dutton Z, 2004, PHYS REV A, V70, DOI 10.1103/PhysRevA.70.053831
   Dutton Z, 2001, SCIENCE, V293, P663, DOI 10.1126/science.1062527
   EBERLY JH, 1995, QUANTUM SEMICL OPT, V7, P373, DOI 10.1088/1355-5111/7/3/013
   EILBECK JC, 1973, J PHYS A-MATH GEN, V6, P1337, DOI 10.1088/0305-4470/6/9/009
   Faddeev L. D., 1987, HAMILTONIAN METHODS
   Fleischhauer M, 2000, PHYS REV LETT, V84, P5094, DOI 10.1103/PhysRevLett.84.5094
   GROBE R, 1994, PHYS REV LETT, V73, P3183, DOI 10.1103/PhysRevLett.73.3183
   Harris SE, 1997, PHYS TODAY, V50, P36, DOI 10.1063/1.881806
   Hau LV, 1999, NATURE, V397, P594, DOI 10.1038/17561
   HIOE FT, 1994, PHYS REV LETT, V73, P2559, DOI 10.1103/PhysRevLett.73.2559
   Kocharovskaya O, 2001, PHYS REV LETT, V86, P628, DOI 10.1103/PhysRevLett.86.628
   Kozlov VV, 2000, OPT COMMUN, V179, P85, DOI 10.1016/S0030-4018(99)00730-0
   LEONHARDT U, 2004, SLOW LIGHT SOLITONS
   Liu C, 2001, NATURE, V409, P490, DOI 10.1038/35054017
   Lukin MD, 2003, REV MOD PHYS, V75, P457, DOI 10.1103/RevModPhys.75.457
   Matsko AB, 2001, PHYS REV A, V64, DOI 10.1103/PhysRevA.64.043809
   MATVEEV VB, 1988, INVERSE PROBL, V4, P173, DOI 10.1088/0266-5611/4/1/015
   Matveev V. B., 1991, SPRINGER SERIES NONL
   Mikhailov EE, 2004, J OPT SOC AM B, V21, P425, DOI 10.1364/JOSAB.21.000425
   Park QH, 1998, PHYS REV A, V57, P4643, DOI 10.1103/PhysRevA.57.4643
   Phillips DF, 2001, PHYS REV LETT, V86, P783, DOI 10.1103/PhysRevLett.86.783
   RYBIN A, 1993, J PHYS A-MATH GEN, V26, P3869, DOI 10.1088/0305-4470/26/15/035
   Rybin AV, 2005, PHYS REV E, V72, DOI 10.1103/PhysRevE.72.026613
   Rybin AV, 2005, J PHYS A-MATH GEN, V38, pL177, DOI 10.1088/0305-4470/38/9/L04
   Rybin AV, 2004, J OPT B-QUANTUM S O, V6, pS392, DOI 10.1088/1464-4266/6/5/029
   RYBIN AV, 1991, J PHYS A-MATH GEN, V24, P5235, DOI 10.1088/0305-4470/24/22/007
   Soljacic M, 2004, NAT MATER, V3, P211, DOI 10.1038/nmat1097
   Turukhin AV, 2002, PHYS REV LETT, V8802, P3602, DOI 10.1103/PhysRevLett.88.023602
NR 37
TC 3
Z9 3
U1 1
U2 11
PU ROYAL SOC
PI LONDON
PA 6-9 CARLTON HOUSE TERRACE, LONDON SW1Y 5AG, ENGLAND
SN 1364-503X
J9 PHILOS T R SOC A
JI Philos. Trans. R. Soc. A-Math. Phys. Eng. Sci.
PD MAR 28
PY 2011
VL 369
IS 1939
BP 1180
EP 1214
DI 10.1098/rsta.2010.0323
PG 35
WC Multidisciplinary Sciences
SC Science & Technology - Other Topics
GA 720RQ
UT WOS:000287298200005
PM 21320912
ER

PT J
AU Kuswik, P
   Ehresmann, A
   Tekielak, M
   Szymanski, B
   Sveklo, I
   Mazalski, P
   Engel, D
   Kisielewski, J
   Lengemann, D
   Urbaniak, M
   Schmidt, C
   Maziewski, A
   Stobiecki, F
AF Kuswik, Piotr
   Ehresmann, Arno
   Tekielak, Maria
   Szymanski, Bogdan
   Sveklo, Iosif
   Mazalski, Piotr
   Engel, Dieter
   Kisielewski, Jan
   Lengemann, Daniel
   Urbaniak, Maciej
   Schmidt, Christoph
   Maziewski, Andrzej
   Stobiecki, Feliks
TI Colloidal domain lithography for regularly arranged artificial magnetic
   out-of-plane monodomains in Au/Co/Au layers
SO NANOTECHNOLOGY
LA English
DT Article
ID SHADOW NANOSPHERE LITHOGRAPHY; PERPENDICULAR ANISOTROPY; ION
   IRRADIATION; DOT ARRAYS; REVERSAL; FABRICATION; MEDIA; FILMS
AB Regularly arranged magnetic out-of-plane patterns in continuous and flat films are promising for applications in data storage technology (bit patterned media) or transport of individual magnetic particles. Whereas topographic magnetic structures are fabricated by standard lithographical techniques, the fabrication of regularly arranged artificial domains in topographically flat films is difficult, since the free energy minimization determines the existence, shape, and regularity of domains. Here we show that keV He(+) ion bombardment of Au/Co/Au layer systems through a colloidal mask of hexagonally arranged spherical polystyrene beads enables magnetic patterning of regularly arranged cylindrical magnetic monodomains with out-of-plane magnetization embedded in a ferromagnetic matrix with easy-plane anisotropy. This colloidal domain lithography creates artificial domains via periodic lateral anisotropy variations induced by periodic defect density modulations. Magnetization reversal of the layer system observed by magnetic force microscopy shows individual disc switching indicating monodomain states.
C1 [Kuswik, Piotr; Szymanski, Bogdan; Urbaniak, Maciej; Stobiecki, Feliks] Polish Acad Sci, Inst Mol Phys, PL-60179 Poznan, Poland.
   [Ehresmann, Arno; Engel, Dieter; Lengemann, Daniel; Schmidt, Christoph] Univ Kassel, Inst Phys, D-34132 Kassel, Germany.
   [Ehresmann, Arno; Engel, Dieter; Lengemann, Daniel; Schmidt, Christoph] Univ Kassel, Ctr Interdisciplinary Nanostruct Sci & Technol, D-34132 Kassel, Germany.
   [Tekielak, Maria; Sveklo, Iosif; Mazalski, Piotr; Kisielewski, Jan; Maziewski, Andrzej] Univ Bialystok, Magnetism Lab, Fac Phys, PL-15424 Bialystok, Poland.
RP Kuswik, P (reprint author), Polish Acad Sci, Inst Mol Phys, M Smoluchowskiego 17, PL-60179 Poznan, Poland.
EM kuswik@ifmpan.poznan.pl
RI Engel, Dieter/B-3207-2012; Ehresmann, Arno/E-6853-2010
OI Engel, Dieter/0000-0001-9255-9554; Ehresmann, Arno/0000-0002-0981-2289;
   Schmidt, Christoph/0000-0002-1071-8580
FU Polish State Committee for Scientific Research [N507287836, N202235737];
   Polish-German joint project Technological-Cooperation; Polish Academy of
   Sciences
FX Supported by the Polish State Committee for Scientific Research, grant
   no. N507287836 and N202235737. This work was partially financed by
   Polish-German joint project Technological-Cooperation. P K acknowledges
   a PhD grant from the Polish Academy of Sciences.
CR Aign T, 1998, PHYS REV LETT, V81, P5656, DOI 10.1103/PhysRevLett.81.5656
   Aizpurua J, 2003, PHYS REV LETT, V90, DOI 10.1103/PhysRevLett.90.057401
   Albrecht M, 2005, NAT MATER, V4, P203, DOI 10.1038/nmat1324
   Aziz A, 2005, J APPL PHYS, V98, DOI 10.1063/1.2149500
   Blon T, 2007, NUCL INSTRUM METH B, V257, P374, DOI 10.1016/j.nimb.2007.01.264
   Burmeister F, 1998, ADV MATER, V10, P495, DOI 10.1002/(SICI)1521-4095(199804)10:6<495::AID-ADMA495>3.0.CO;2-A
   Chappert C, 1998, SCIENCE, V280, P1919, DOI 10.1126/science.280.5371.1919
   Choi DG, 2004, NANOTECHNOLOGY, V15, P970, DOI 10.1088/0957-4484/15/8/018
   Devolder T, 2000, J APPL PHYS, V87, P8671, DOI 10.1063/1.373595
   Devolder T, 2001, NUCL INSTRUM METH B, V175, P375, DOI 10.1016/S0168-583X(00)00679-0
   Fassbender J, 2004, J PHYS D APPL PHYS, V37, pR179, DOI 10.1088/0022-3727/37/16/R01
   Guo HB, 2004, PHYS REV B, V70, DOI 10.1103/PhysRevB.70.195434
   Hellwig O, 2007, J MAGN MAGN MATER, V319, P13, DOI 10.1016/j.jmmm.2007.04.035
   Jamet JP, 1998, PHYS REV B, V57, P14320, DOI 10.1103/PhysRevB.57.14320
   Jaworowicz J, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3179147
   Kisielewski M, 2002, PHYS REV LETT, V89, DOI 10.1103/PhysRevLett.89.087203
   Kosiorek A, 2004, NANO LETT, V4, P1359, DOI 10.1021/nl049361t
   Kosiorek A, 2005, SMALL, V1, P439, DOI 10.1002/smll.200400099
   Kuswik P, 2008, ACTA PHYS POL A, V113, P651
   Langridge S, 2006, PHYS REV B, V74, DOI 10.1103/PhysRevB.74.014417
   Moser A, 2002, J PHYS D APPL PHYS, V35, pR157, DOI 10.1088/0022-3727/35/19/201
   Ng V, 2002, NANOTECHNOLOGY, V13, P554, DOI 10.1088/0957-4484/13/5/302
   Prinz GA, 1998, SCIENCE, V282, P1660, DOI 10.1126/science.282.5394.1660
   Repain V, 2004, J APPL PHYS, V95, P2614, DOI 10.1063/1.1645973
   Stobiecki F, 2004, J MAGN MAGN MATER, V282, P32, DOI 10.1016/j.jmmm.2004.04.008
   TEKIELAK M, 2009, IEEE T MAGN, V44, P2850
   Tierno P, 2009, PHYS CHEM CHEM PHYS, V11, P9615, DOI 10.1039/b910427e
   Todorovic M, 1999, APPL PHYS LETT, V74, P2516, DOI 10.1063/1.123885
   XIOBIN Z, 2002, APPL PHYS LETT, V80, P4789
   Yang SM, 2006, SMALL, V2, P458, DOI 10.1002/smll.200500390
NR 30
TC 10
Z9 10
U1 1
U2 17
PU IOP PUBLISHING LTD
PI BRISTOL
PA DIRAC HOUSE, TEMPLE BACK, BRISTOL BS1 6BE, ENGLAND
SN 0957-4484
J9 NANOTECHNOLOGY
JI Nanotechnology
PD MAR 4
PY 2011
VL 22
IS 9
AR 095302
DI 10.1088/0957-4484/22/9/095302
PG 8
WC Nanoscience & Nanotechnology; Materials Science, Multidisciplinary;
   Physics, Applied
SC Science & Technology - Other Topics; Materials Science; Physics
GA 711WL
UT WOS:000286622000007
PM 21258148
ER

PT J
AU Choi, C
   Yoon, Y
   Hong, D
   Oh, Y
   Talke, FE
   Jin, S
AF Choi, Chulmin
   Yoon, Yeoungchin
   Hong, Daehoon
   Oh, Young
   Talke, Frank E.
   Jin, Sungho
TI Planarization of patterned magnetic recording media to enable head
   flyability
SO MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND
   PROCESSING SYSTEMS
LA English
DT Article
ID DISCRETE TRACK
AB The fabrication and planarization of patterned magnetic recording media is investigated and the flyability of magnetic recording sliders on a patterned and planarized 65 mm glass disk is investigated a small coupon of patterned media with an array of nano pillars of 40 nm diameter and 60 nm height was first fabricated by e-beam lithography and reactive ion etching (RIE) to investigate the planarization process for patterned media. Since read/write flyability tests require a patterned disk rather than a small coupon area, we have prepared a bit patterned glass disks of 65 mm diameter (2.5 in.) using the so-called "Ag ball-up process" in combination with RIE. This "Ag ball-up process" permits the manufacturing of a nano-sized bit patterns on a large area, i.e., on a disk with 65 mm diameter. Planarization of the patterned area was performed with hydrogen silsesquioxane (HSQ) by spin coating. The HSQ layer was back-etched using RIE, resulting in a smooth surface. "Flyability testing" indicates significantly improved flying stability of typical magnetic recording sliders on the planarized glass disks, with the standard deviation of flying height fluctuations on the order of 0.1 nm. The latter value is comparable to that of "smooth" disks.
C1 [Choi, Chulmin; Yoon, Yeoungchin; Hong, Daehoon; Oh, Young; Talke, Frank E.; Jin, Sungho] Univ Calif San Diego, Ctr Magnet Recording Res, La Jolla, CA 92093 USA.
RP Jin, S (reprint author), Univ Calif San Diego, Ctr Magnet Recording Res, La Jolla, CA 92093 USA.
EM jin@ucsd.edu
FU CMRR (Center for Magnetic Recording Research) at UC San Diego; NSF-CMMI,
   Nanomanufacturing Division [0856674]; CNMT [05K1501-01210]; Ministry of
   Science and Technology, Korea
FX This research was supported by CMRR (Center for Magnetic Recording
   Research) at UC San Diego, NSF-CMMI, Nanomanufacturing Division, Grant
   No. 0856674, CNMT Grant No. 05K1501-01210 under the 21st Century
   Frontier R&D Programs, Ministry of Science and Technology, Korea, and
   National Research Foundation (NRF) grant through World Class University
   Program (R33-2008-000-10025-0).
CR Hattori K, 2004, IEEE T MAGN, V40, P2510, DOI 10.1109/TMAG.2004.832244
   Kawamori M, 2006, JPN J APPL PHYS 1, V45, P8994, DOI 10.1143/JJAP.45.8994
   Knigge BE, 2008, IEEE T MAGN, V44, P3656, DOI 10.1109/TMAG.2008.2002613
   Penaud J, 2006, APPL SURF SCI, V253, P395, DOI 10.1016/j.apsusc.2006.06.021
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Shaw JM, 2007, J APPL PHYS, V101, DOI 10.1063/1.2431399
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Thomson T, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.257204
NR 8
TC 6
Z9 6
U1 0
U2 3
PU SPRINGER
PI NEW YORK
PA 233 SPRING ST, NEW YORK, NY 10013 USA
SN 0946-7076
EI 1432-1858
J9 MICROSYST TECHNOL
JI Microsyst. Technol.
PD MAR
PY 2011
VL 17
IS 3
BP 395
EP 402
DI 10.1007/s00542-011-1222-1
PG 8
WC Engineering, Electrical & Electronic; Nanoscience & Nanotechnology;
   Materials Science, Multidisciplinary; Physics, Applied
SC Engineering; Science & Technology - Other Topics; Materials Science;
   Physics
GA 749DP
UT WOS:000289442600009
ER

PT J
AU Deng, S
   Aung, KO
   Piramanayagam, SN
   Sbiaa, R
AF Deng, S.
   Aung, K. O.
   Piramanayagam, S. N.
   Sbiaa, R.
TI Magnetostatic Interactions in Antiferromagnetically Coupled Patterned
   Media
SO JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY
LA English
DT Article; Proceedings Paper
CT International Conference on Materials for Advanced Technologies (ICMAT
   2009) Symposium E - Nanostructured Magnetic Materials and Their
   Applications
CY JUN 28-JUL 03, 2009
CL Singapore, SINGAPORE
DE Perpendicular Recording; Recording Media; Antiferromagnetic Coupling;
   Patterned Media; Magnetic Force Microscopy; Microstructure
ID RECORDING MEDIA; MAGNETIZATION
AB In an array of closely spaced magnetic islands as in patterned media, magnetostatic interactions play a major role in widening the switching field distribution and reducing the thermal stability. Patterned antiferromagnetically coupled (AFC) media provide interesting systems for studying the effect of magnetostatic interactions on the reversal of closely spaced AFC bits in an array, as AFC structure helps to reduce the remanent magnetization (M(r)), leading to reduced magnetostatic interactions. Here, we study the magnetic reversal of single domain-patterned AFC CoCrPt:oxide bilayer system with perpendicular magnetic anisotropy, by imaging the remanence state of the bits after the application of a magnetic field with magnetic force microscopy (MFM). The influence of magnetostatic fields from the neighboring bits on the switching field distribution (SFD) for an entity in a patterned media is studied by varying the stabilizing layer thickness of the AFC structure and bit spacing. We observe a distinct increase in stability and coercivity with an increase in stabilizing layer thickness for the 40 nm spaced bits. This demonstrates the effectiveness of the AFC structure for reducing magnetostatic interactions in patterned media, such that high thermal stability can be achieved by the reduced M(r), without writability issues.
C1 [Deng, S.; Aung, K. O.; Piramanayagam, S. N.; Sbiaa, R.] ASTAR, Data Storage Inst, Singapore 117608, Singapore.
   [Deng, S.] Natl Univ Singapore, Dept Chem, Singapore 117543, Singapore.
RP Piramanayagam, SN (reprint author), ASTAR, Data Storage Inst, 5,Engn Dr 1, Singapore 117608, Singapore.
RI Piramanayagam, SN/A-4192-2008; Sbiaa, Rachid/I-8038-2013
OI Piramanayagam, SN/0000-0002-3178-2960; 
CR Acharya BR, 2004, IEEE T MAGN, V40, P2383, DOI 10.1109/TMAG.2004.832165
   Albrecht M, 2003, IEEE T MAGN, V39, P2323, DOI 10.1109/TMAG.2003.816285
   Bryan MT, 2004, APPL PHYS LETT, V85, P3510, DOI 10.1063/1.1806566
   Ferre J, 2002, SPIN DYNAMICS CONFIN
   Hee CH, 2001, APPL PHYS LETT, V79, P1646, DOI 10.1063/1.1402658
   Hu G, 2005, J APPL PHYS, V97, DOI 10.1063/1.1849572
   HUBERT A, 2002, MAGNETIC DOMAINS ANA
   Oikawa S, 2000, IEEE T MAGN, V36, P2393, DOI 10.1109/20.908443
   Piramanayagam SN, 2007, J APPL PHYS, V102, DOI 10.1063/1.2750414
   Piramanayagam SN, 2009, J APPL PHYS, V105, DOI 10.1063/1.3077203
   Piramanayagam SN, 2003, IEEE T MAGN, V39, P657, DOI 10.1109/TMAG.2003.808989
   Piramanayagam SN, 2001, IEEE T MAGN, V37, P1438, DOI 10.1109/20.950864
   Piramanayagam SN, 2001, APPL PHYS LETT, V79, P2423, DOI 10.1063/1.1407855
   Richter HJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2209179
   Sbiaa R, 2007, RECENT PAT NANOTECH, V1, P29, DOI 10.2174/187221007779814754
   Suess D, 2005, APPL PHYS LETT, V87, DOI 10.1063/1.1951053
   Thomson T, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.257204
   Victora RH, 2005, IEEE T MAGN, V41, P2828, DOI 10.1109/TMAG.2005.855263
NR 18
TC 1
Z9 1
U1 0
U2 4
PU AMER SCIENTIFIC PUBLISHERS
PI STEVENSON RANCH
PA 25650 NORTH LEWIS WAY, STEVENSON RANCH, CA 91381-1439 USA
SN 1533-4880
J9 J NANOSCI NANOTECHNO
JI J. Nanosci. Nanotechnol.
PD MAR
PY 2011
VL 11
IS 3
BP 2555
EP 2559
DI 10.1166/jnn.2011.2731
PG 5
WC Chemistry, Multidisciplinary; Nanoscience & Nanotechnology; Materials
   Science, Multidisciplinary; Physics, Applied; Physics, Condensed Matter
SC Chemistry; Science & Technology - Other Topics; Materials Science;
   Physics
GA 731JN
UT WOS:000288102300109
PM 21449425
ER

PT J
AU Ranjbar, M
   Piramanayagam, SN
   Sbiaa, R
   Aung, KO
   Guo, ZB
   Chong, TC
AF Ranjbar, Mojtaba
   Piramanayagam, S. N.
   Sbiaa, R.
   Aung, K. O.
   Guo, Z. B.
   Chong, T. C.
TI Ion Beam Modification of Exchange Coupling to Fabricate Patterned Media
SO JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY
LA English
DT Article; Proceedings Paper
CT International Conference on Materials for Advanced Technologies (ICMAT
   2009) Symposium E - Nanostructured Magnetic Materials and Their
   Applications
CY JUN 28-JUL 03, 2009
CL Singapore, SINGAPORE
DE Magnetic Materials; Patterning; Nanofabrication; Antiferromagnetically
   Coupled Media; Focused Ion Beam
ID RECORDING MEDIA; IRRADIATION
AB For bit-patterned media, media with low remanent magnetization (M(r)) and high M(r) regions are needed for storing information, which is usually achieved by lithographically defining magnetic and non-magnetic regions. In this work, we have investigated the use of ion beam modification of media surface to define the low and high M(r) states using a medium that is at a low M(r) state to start with. The low M(r) state is achieved by the use of synthetic antiferromagnetic coupling obtained in Co-alloy/Ru/Co-alloy trilayer structured film. Local ion beam modification at 30 keV energy using Ga(+) ions was used to create high M(r) regions. AFM and MFM observations indicated that patterned regions of low and high M(r) can be observed with ion beam irradiation. This technique is a potential method to achieve patterned media without the need of planarization techniques.
C1 [Ranjbar, Mojtaba; Piramanayagam, S. N.; Sbiaa, R.; Aung, K. O.; Guo, Z. B.; Chong, T. C.] ASTAR, Data Storage Inst, Singapore 117608, Singapore.
   [Ranjbar, Mojtaba; Chong, T. C.] Natl Univ Singapore, Elect & Comp Engn Dept, Singapore 117576, Singapore.
RP Piramanayagam, SN (reprint author), ASTAR, Data Storage Inst, Singapore 117608, Singapore.
RI Piramanayagam, SN/A-4192-2008; Sbiaa, Rachid/I-8038-2013; Guo,
   Zaibing/B-5984-2014
OI Piramanayagam, SN/0000-0002-3178-2960; 
CR Adeyeye AO, 2008, J PHYS D APPL PHYS, V41, DOI 10.1088/0022-3727/41/15/153001
   Chappert C, 1998, SCIENCE, V280, P1919, DOI 10.1126/science.280.5371.1919
   Fassbender J, 2008, J MAGN MAGN MATER, V320, P579, DOI 10.1016/j.jmmm.2007.07.032
   Hu G, 2005, J APPL PHYS, V97, DOI 10.1063/1.1849572
   MARGULIES DT, 2002, APPL PHYS LETT, V80, P1
   McGrouther D, 2004, J APPL PHYS, V95, P7772, DOI 10.1063/1.1745120
   Pang SI, 2002, APPL PHYS LETT, V80, P616, DOI 10.1063/1.1436281
   Piramanayagam SN, 2007, J APPL PHYS, V102, DOI 10.1063/1.2750414
   SBIAA R, 2007, PIRAMANAYAGAM RECENT, V1, P1
   Sbiaa R, 2009, J APPL PHYS, V105, DOI 10.1063/1.3055373
   Terris BD, 1999, APPL PHYS LETT, V75, P403, DOI 10.1063/1.124389
   Wang JP, 2001, IEEE T MAGN, V37, P1445, DOI 10.1109/20.950866
NR 12
TC 2
Z9 2
U1 0
U2 2
PU AMER SCIENTIFIC PUBLISHERS
PI STEVENSON RANCH
PA 25650 NORTH LEWIS WAY, STEVENSON RANCH, CA 91381-1439 USA
SN 1533-4880
J9 J NANOSCI NANOTECHNO
JI J. Nanosci. Nanotechnol.
PD MAR
PY 2011
VL 11
IS 3
BP 2611
EP 2614
DI 10.1166/jnn.2011.2704
PG 4
WC Chemistry, Multidisciplinary; Nanoscience & Nanotechnology; Materials
   Science, Multidisciplinary; Physics, Applied; Physics, Condensed Matter
SC Chemistry; Science & Technology - Other Topics; Materials Science;
   Physics
GA 731JN
UT WOS:000288102300121
PM 21449437
ER

PT J
AU Chong, TC
   Piramanayagam, SN
   Sbiaa, R
AF Chong, Tow Chong
   Piramanayagam, S. N.
   Sbiaa, Rachid
TI Perspectives for 10 Terabits/in(2) Magnetic Recording
SO JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY
LA English
DT Article; Proceedings Paper
CT International Conference on Materials for Advanced Technologies (ICMAT
   2009) Symposium E - Nanostructured Magnetic Materials and Their
   Applications
CY JUN 28-JUL 03, 2009
CL Singapore, SINGAPORE
DE Magnetic Recording; Perpendicular Magnetic Anisotropy; Bit-Patterned
   Media; Magneto-Resistance
ID GIANT MAGNETORESISTANCE; FEPT NANOPARTICLES; ROOM-TEMPERATURE;
   DATA-STORAGE; MEDIA; EXCHANGE; DENSITIES; FUTURE; HEAD; INCH
AB Magnetic recording technology has come a long way, since the introduction of the first hard disk drives (HDD) in 1956. The areal density has grown by a factor of 200 million times and the HDD has stayed as a main candidate for mass storage of information. In order to maintain its lead over other competing technologies, HDD industry continues to invent several technologies. Having introduced perpendicular recording technology in the last 5 years, the industry is looking at introducing bit-patterned media or heat-assisted magnetic recording in the next five years. The researchers - looking at a longer term - are investigating 10 Tbits/in(2) as the next major milestone. The issues and probable candidates for 10 Tbits/in(2) magnetic recording technology are described from a material perspective.
C1 [Chong, Tow Chong; Piramanayagam, S. N.; Sbiaa, Rachid] ASTAR, Data Storage Inst DSI, Singapore 117608, Singapore.
   [Chong, Tow Chong] Natl Univ Singapore, Dept Elect & Comp Engn, Singapore 117576, Singapore.
RP Piramanayagam, SN (reprint author), ASTAR, Data Storage Inst DSI, Singapore 117608, Singapore.
RI Piramanayagam, SN/A-4192-2008; Sbiaa, Rachid/I-8038-2013
OI Piramanayagam, SN/0000-0002-3178-2960; 
CR Albrecht M, 2002, APPL PHYS LETT, V80, P3409, DOI 10.1063/1.1476062
   BAIBICH MN, 1988, PHYS REV LETT, V61, P2472, DOI 10.1103/PhysRevLett.61.2472
   BINASCH G, 1989, PHYS REV B, V39, P4828, DOI 10.1103/PhysRevB.39.4828
   Charap SH, 1997, IEEE T MAGN, V33, P978, DOI 10.1109/20.560142
   Chen JS, 2007, APPL PHYS LETT, V90, DOI 10.1063/1.2430910
   Comstock RL, 2002, J MATER SCI-MATER EL, V13, P509, DOI 10.1023/A:1019642215245
   DIENY B, 1991, PHYS REV B, V43, P1297, DOI 10.1103/PhysRevB.43.1297
   Fukuzawa H, 2005, J APPL PHYS, V97, DOI 10.1063/1.1851673
   Gao KZ, 2002, IEEE T MAGN, V38, P3675, DOI 10.1109/TMAG.2002.804801
   Ikeda S, 2008, APPL PHYS LETT, V93, DOI 10.1063/1.2976435
   Iwamoto T, 2009, PHYSICA B, V404, P2080, DOI 10.1016/j.physb.2009.03.048
   Khizroev S, 2004, J APPL PHYS, V95, P4521, DOI 10.1063/1.1695092
   Litvinov D, 2005, J APPL PHYS, V97, DOI 10.1063/1.1880449
   Moser A, 2002, J PHYS D APPL PHYS, V35, pR157, DOI 10.1088/0022-3727/35/19/201
   O'Grady K, 1998, J MAGN MAGN MATER, V177, P886, DOI 10.1016/S0304-8853(97)01048-2
   Park S, 2009, SCIENCE, V323, P1030, DOI 10.1126/science.1168108
   Parkin SSP, 2004, NAT MATER, V3, P862, DOI 10.1038/nmat1256
   Perumal A, 2003, APPL PHYS LETT, V83, P3326, DOI 10.1063/1.1616975
   Piramanayagam SN, 2007, J APPL PHYS, V102, DOI 10.1063/1.2750414
   Piramanayagam SN, 2009, J APPL PHYS, V105, DOI 10.1063/1.3077203
   Piramanayagam SN, 2009, J MAGN MAGN MATER, V321, P485, DOI 10.1016/j.jmmm.2008.05.007
   Poh WC, 2008, J APPL PHYS, V103, DOI 10.1063/1.2836737
   Richter HJ, 2007, J PHYS D APPL PHYS, V40, pR149, DOI 10.1088/0022-3727/40/9/R01
   Ross C, 2001, ANN REV MATER RES, V31, P203, DOI 10.1146/annurev.matsci.31.1.203
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Sbiaa R, 2007, J APPL PHYS, V101, DOI 10.1063/1.2720094
   Seigler MA, 2008, IEEE T MAGN, V44, P119, DOI 10.1109/TMAG.2007.911029
   SHARROCK MP, 1989, IEEE T MAGN, V25, P4374, DOI 10.1109/20.45317
   SHARROCK MP, 1981, IEEE T MAGN, V17, P3020, DOI 10.1109/TMAG.1981.1061755
   Suess D, 2005, IEEE T MAGN, V41, P3166, DOI 10.1109/TMAG.2005.855284
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   van Dijken S, 2005, APPL PHYS LETT, V87, DOI 10.1063/1.1957111
   Victora RH, 2005, IEEE T MAGN, V41, P2828, DOI 10.1109/TMAG.2005.855263
   Victora RH, 2002, IEEE T MAGN, V38, P1886, DOI 10.1109/TMAG.2002.802791
   Weller D, 2000, ANNU REV MATER SCI, V30, P611, DOI 10.1146/annurev.matsci.30.1.611
   Wood R, 2000, IEEE T MAGN, V36, P36, DOI 10.1109/20.824422
   Yang B, 2005, SCRIPTA MATER, V53, P417, DOI 10.1016/j.scriptamat.2005.04.038
   Yuasa S, 2004, NAT MATER, V3, P868, DOI 10.1038/nmat1257
   Rubin K. A., 2005, U.S. Patent, Patent No. [6 937 421 B2, 6937421]
   FUJIWARA H, 2009, Patent No. 7538987
NR 40
TC 5
Z9 5
U1 0
U2 3
PU AMER SCIENTIFIC PUBLISHERS
PI VALENCIA
PA 26650 THE OLD RD, STE 208, VALENCIA, CA 91381-0751 USA
SN 1533-4880
J9 J NANOSCI NANOTECHNO
JI J. Nanosci. Nanotechnol.
PD MAR
PY 2011
VL 11
IS 3
BP 2704
EP 2709
DI 10.1166/jnn.2011.2738
PG 6
WC Chemistry, Multidisciplinary; Nanoscience & Nanotechnology; Materials
   Science, Multidisciplinary; Physics, Applied; Physics, Condensed Matter
SC Chemistry; Science & Technology - Other Topics; Materials Science;
   Physics
GA 731JN
UT WOS:000288102300143
PM 21449459
ER

PT J
AU Park, KS
   Park, YP
   Park, NC
AF Park, Kyoung-Su
   Park, Young-Pil
   Park, No-Cheol
TI Prospect of Recording Technologies for Higher Storage Performance
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT Asia-Pacific Data Storage Conference (APDSC 2010)
CY OCT 27-29, 2010
CL Haulien, TAIWAN
DE Dual stage actuator (DSA); dynamic TFC; holographic data storage system
   (HDSS); micro HDSS; near field recording (NFR); perpendicular magnetic
   recording (PMR); track mis-registration (TMR); two-dimensional magnetic
   recording (TDMR)
ID BIT-PATTERNED MEDIA; HARD-DISK DRIVES; DUAL-STAGE; SERVO SYSTEMS
AB With the progress of information technology (IT), we need more advanced storage devices to accommodate the unprecedented expansion of information and the rapidly changing IT environment. Magnetic and optical recording storage devices, such as hard disk drive (HDD) and optical disk drive (ODD), are the best candidates for satisfying these demands and requirements. For 10 Tb/in(2) HDD magnetic recording, we need to develop several advanced and innovative technologies related to the head disk interface (HDI), head/media, servo, and signal processing in current perpendicular magnetic recording (PMR). And, several new read/write mechanisms, such as heat-assisted magnetic recording (HAMR) and bit-patterned media (BPM), are being investigated by many researchers at several institutes around the world. In optical data storage, the page-based holographic data storage system (HDSS) and micro-HDSS are expected to achieve a higher user capacity with beyond terabyte. The near field recording (NFR) system was developed to confirm the feasibility of achieving a multiple terabyte capacity, and currently, through the application of NF nanogap servo system using a flexible media, it is possible to enhance the recording density and data transfer rate together.
C1 [Park, Kyoung-Su; Park, Young-Pil; Park, No-Cheol] Yonsei Univ, Dept Mech Engn, Seoul 120749, South Korea.
RP Park, YP (reprint author), Yonsei Univ, Dept Mech Engn, Seoul 120749, South Korea.
EM park2814@yonsei.ac.kr
CR Anderson K, 2004, OPT LETT, V29, P1402, DOI 10.1364/OL.29.001402
   Anderson K., 2006, P ODS2006 QUEB, P150
   Aruga K, 2007, IEEE T MAGN, V43, P3750, DOI 10.1109/TMAG.2007.902983
   Challener WA, 2009, NAT PHOTONICS, V3, P220, DOI 10.1038/NPHOTON.2009.26
   Challener WA, 2009, MOD ASP ELECTROCHEM, P53, DOI 10.1007/978-0-387-49586-6_2
   Chen YH, 2010, IEEE T MAGN, V46, P697, DOI 10.1109/TMAG.2010.2041040
   CHOI YB, 2009, P MICR 2009 OD, P304
   CONWAY R, 2008, P DYN SYST CONTR C
   Coufal H., 2000, HOLOGRAPHIC DATA STO
   *DAT STOR I, 2009, DAT STOR I ANN REP
   EICHLER HJ, 1998, IEEE SEL TOPICS QUAN, P840
   Han GC, 2010, IEEE T MAGN, V46, P709, DOI 10.1109/TMAG.2009.2034866
   Horowitz R, 2007, CONTROL ENG PRACT, V15, P291, DOI 10.1016/j.conengprac.2006.09.003
   Huang XH, 2006, IEEE T MAGN, V42, P1896, DOI 10.1109/TMAG.2006.875353
   HWANG H, 2010, P ISOM2010 HUAL, P40
   Ishii T, 2009, 2009 OPTICAL DATA STORAGE TOPICAL MEETING, P107, DOI 10.1109/ODS.2009.5031743
   Jallapuram R, 2006, OPT MATER, V28, P1329, DOI 10.1016/j.optmat.2005.11.027
   JEONG TS, 2008, P IWHMD2008 AICH, P18
   KATAYAMA R, 2010, P SPIE, V7730
   Katayama R, 2009, JPN J APPL PHYS, V48, DOI 10.1143/JJAP.48.03A056
   KIM JG, 2009, P ISOM2010 HUAL, P176
   Kim JG, 2009, IEEE T MAGN, V45, P2244, DOI 10.1109/TMAG.2009.2016237
   KIM KH, 2010, P ASME ISPS2010 SANT, P144
   KIM WC, 2009, OPT COMMUN, V282, P530
   Lee SH, 2010, J DYN SYST-T ASME, V132, DOI 10.1115/1.4001325
   Lee S.H., 2010, P ASME ISPS2010 SANT, P325
   Lee SC, 2010, J TRIBOL-T ASME, V132, DOI 10.1115/1.4001024
   LEE Y, 2010, P 20 ANN C ASME IS P, P10
   Li L., 2010, P ASME ISPS2010 SANT, P7
   Lim DS, 2009, IEEE T MAGN, V45, P3844, DOI 10.1109/TMAG.2009.2022180
   Lim DS, 2009, JPN J APPL PHYS, V48, DOI 10.1143/JJAP.48.03A060
   Lim DS, 2009, JPN J APPL PHYS, V48, DOI 10.1143/JJAP.48.03A059
   LOH HT, 2004, P AM CONTR C, P541
   McLeod RR, 2005, APPL OPTICS, V44, P3197, DOI 10.1364/AO.44.003197
   MIKAMI H, 2010, P SPIE, V7730
   Orlic S, 2001, J OPT A-PURE APPL OP, V3, P72, DOI 10.1088/1464-4258/3/1/312
   Ostroverkhov V, 2009, JPN J APPL PHYS, V48, DOI 10.1143/JJAP.48.03A035
   Peng W, 2005, TRIBOL INT, V38, P588, DOI 10.1016/j.tiboint.2005.01.040
   Rausch T, 2006, JPN J APPL PHYS 1, V45, P1314, DOI 10.1143/JJAP.45.1314
   Saito K., 2006, P ODS2006 QUEB, P188
   SCHABES ME, 2008, TMRC 2008 SING
   Shi XL, 2007, J APPL PHYS, V102, DOI 10.1063/1.2748352
   Shimada K., 2009, P ODS2009 FLOR, P61
   SHIMURA T, 2010, P ODS2010 COL, P7730
   Tanaka K., 2009, P ODS2009 FLOR, VTuC3, P64
   Tang Y, 2009, IEEE T MAGN, V45, P822, DOI 10.1109/TMAG.2008.2010642
   Tang YS, 2008, IEEE T MAGN, V44, P3460, DOI 10.1109/TMAG.2008.2001616
   WHITE MT, 2008, IEEE T MAGN, V44, P3695
   Wood R, 2009, J MAGN MAGN MATER, V321, P555, DOI 10.1016/j.jmmm.2008.07.027
   Wood R, 2009, IEEE T MAGN, V45, P917, DOI 10.1109/TMAG.2008.2010676
   Yang X, 2007, J VAC SCI TECHNOL B, V25, P2202, DOI 10.1116/1.2798711
   Yuan ZM, 2008, J MAGN MAGN MATER, V320, P3189, DOI 10.1016/j.jmmm.2008.08.075
   Zhang HB, 2009, MECHATRONICS, V19, P788, DOI 10.1016/j.mechatronics.2009.01.009
   Zhang J, 2006, IEEE T MAGN, V42, P2546, DOI 10.1109/TMAG.2006.878650
   Zheng JC, 2008, IEEE-ASME T MECH, V13, P510, DOI 10.1109/TMECH.2008.919823
   ZHOU WD, 2009, TRIBOL LETT, V39, P179
   Zhu JG, 2008, IEEE T MAGN, V44, P125, DOI 10.1109/TMAG.2007.911031
NR 57
TC 24
Z9 25
U1 0
U2 16
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD MAR
PY 2011
VL 47
IS 3
BP 539
EP 545
DI 10.1109/TMAG.2010.2102343
PG 7
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 728GE
UT WOS:000287861800011
ER

PT J
AU Bader, CA
   Williams, CR
AF Bader, C. A.
   Williams, C. R.
TI Eggs of the Australian saltmarsh mosquito, Aedes camptorhynchus, survive
   for long periods and hatch in instalments: implications for biosecurity
   in New Zealand
SO MEDICAL AND VETERINARY ENTOMOLOGY
LA English
DT Article
DE Aedes camptorhynchus; biosecurity; hatching; longevity; mosquito egg
ID ROSS RIVER VIRUS; DIPTERA-CULICIDAE; TEMPERATURE; DIAPAUSE;
   HATCHABILITY; DESICCATION; PHOTOPERIOD; VITTATUS; BATCHES; TIME
AB The Australian saltmarsh mosquito, Aedes camptorhynchus (Diptera: Culicidae), is a significant biting pest and disease vector and is the subject of an eradication programme in New Zealand (NZ), where it has been resident for more than 10 years. To better understand the ecology of this common and widespread pest, we studied egg longevity and hatching patterns in the laboratory. By regularly testing for the presence of viable embryos, we found that eggs may last more than 15 months when stored dry (13% viable at this time). Eggs display instalment hatching, with no more than 56% of a batch hatching upon first inundation. Further hatching may occur for at least six inundations and some unhatched eggs may remain viable even after this. Variation in hatching rates can be observed using different water types, with weaker hatching media stimulating lower hatching rates spread over more inundations. By applying average hatching rates to a non-linear model of natural egg attrition, we showed that egg batches exposed to three inundations should be exhausted (zero live eggs present) in approximately 11 months at the conditions tested here. These findings have implications for the current eradication programme for Ae. camptorhynchus in NZ and for our understanding of the ecology of a widespread and common disease vector in Australia.
C1 [Bader, C. A.; Williams, C. R.] Univ S Australia, Sansom Inst Hlth Res, Mosquitoes & Publ Hlth Res Grp, Adelaide, SA 5001, Australia.
RP Williams, CR (reprint author), Univ S Australia, Sansom Inst Hlth Res, Mosquitoes & Publ Hlth Res Grp, GPO Box 2471, Adelaide, SA 5001, Australia.
EM craig.williams@unisa.edu.au
RI Williams, Craig/A-1617-2011; Bader, Christie/A-4025-2012
OI Williams, Craig/0000-0002-4758-1506; 
FU Ministry of Agriculture and Forestry [10546/2007]
FX This work was funded through Project 10546/2007 for Biosecurity New
   Zealand (Ministry of Agriculture and Forestry). We are grateful for the
   support and guidance of Don Hammond, Matt Stone, Megan Sarty and David
   Yard at Biosecurity NZ, and all on the Southern Saltmarsh Mosquito
   Technical Advisory Group (TAG). Richard Russell and Scott Ritchie (both
   of TAG) provided much useful discussion regarding this project.
CR ANDREADIS TG, 1990, J AM MOSQUITO CONTR, V6, P727
   BALLARD JWO, 1986, AUST J EXP BIOL MED, V64, P197, DOI 10.1038/icb.1986.21
   BECKER N, 1989, Bulletin of the Society for Vector Ecology, V14, P6
   BREELAND SG, 1967, MOSQ NEWS, V25, P374
   Campos RE, 2006, MEM I OSWALDO CRUZ, V101, P47, DOI 10.1590/S0074-02762006000100009
   Derraik JGB, 2004, AUST NZ J PUBL HEAL, V28, P27, DOI 10.1111/j.1467-842X.2004.tb00628.x
   Gillett J. D., 1955, B ENTOMOL RES, V46, P241
   Hearnden M.N., 1999, HLTH RISK ASSESSMENT
   HOWARD GW, 1973, THESIS U ADELAIDE AD
   IRVINGBELL RJ, 1991, TROP MED PARASITOL, V42, P63
   KAPPUS KD, 1967, J INSECT PHYSIOL, V13, P1007, DOI 10.1016/0022-1910(67)90103-5
   Lee D. J., 1984, ENTOMOLOGY MONOGRAPH, VIII
   Lindsay MDA, 2007, AUST J ENTOMOL, V46, P60, DOI 10.1111/j.1440-6055.2007.00581.x
   MIURA T, 1968, Proceedings and Papers of the Annual Conference of the California Mosquito Control Association, V36, P42
   MOORE RICHARD C, 1966, MOSQUITO NEWS, V26, P405
   Roberts D, 2004, J ARID ENVIRON, V57, P203, DOI 10.1016/S0140-1963(03)00108-3
   Rohe D.L., 1979, Bulletin of the Society of Vector Ecologists, V4, P24
   SHROYER DA, 1980, ANN ENTOMOL SOC AM, V73, P39
   SOTA T, 1992, ENTOMOL EXP APPL, V63, P155
   SOTA T, 1992, OECOLOGIA, V90, P353, DOI 10.1007/BF00317691
   van Schie C, 2009, AUST J ENTOMOL, V48, P293, DOI 10.1111/j.1440-6055.2009.00719.x
   Williams CR, 2009, AUST NZ J PUBL HEAL, V33, P284, DOI 10.1111/j.1753-6405.2009.00390.x
   WILSON GR, 1970, ANN ENTOMOL SOC AM, V63, P1644
   WOODARD DB, 1968, MOSQ NEWS, V28, P143
NR 24
TC 9
Z9 9
U1 1
U2 5
PU WILEY-BLACKWELL
PI MALDEN
PA COMMERCE PLACE, 350 MAIN ST, MALDEN 02148, MA USA
SN 0269-283X
J9 MED VET ENTOMOL
JI Med. Vet. Entomol.
PD MAR
PY 2011
VL 25
IS 1
BP 70
EP 76
DI 10.1111/j.1365-2915.2010.00908.x
PG 7
WC Entomology; Veterinary Sciences
SC Entomology; Veterinary Sciences
GA 721NY
UT WOS:000287362900012
PM 20840222
ER

PT J
AU Stamatatos, TC
   Perlepes, SP
   Raptopoulou, CP
   Psycharis, V
   Klouras, N
AF Stamatatos, Theocharis C.
   Perlepes, Spyros P.
   Raptopoulou, Catherine P.
   Psycharis, Vassilis
   Klouras, Nikolaos
TI Reactions of the metallocene dichlorides [M(Cp)(2)Cl-2] (M = Zr, Hf) and
   [Ti(MeCp)(2)Cl-2] with the pyridine-2,6-dicarboxylate(-2) ligand:
   Synthesis, spectroscopic characterization and X-ray structures of the
   products
SO POLYHEDRON
LA English
DT Article
DE Bis(eta(5)-cyclopentadienyl)hafnium(IV)/pyridine-2,6-dicarboxylate
   complex;
   Bis(eta(5)-cyclopentadienyl)zirconium(IV)/pyridine-2,6-dicarboxylate
   complex;
   Bis(eta(5)-methylcyclopentadienyl)titanium(IV)/pyridine-2,6-dicarboxylat
   e complex; Crystal structures; Group 4 metal complexes; Reactivity
   studies
ID CRYSTAL-STRUCTURE; DIPICOLINATE COMPLEXES; MOLECULAR-STRUCTURE; ACID;
   MONONUCLEAR; DERIVATIVES; COORDINATION; DINUCLEAR; SPECTRA
AB The reactivity pattern of the 16-electron species [M(Cp)(2)Cl-2] (M = Zr, Hf; Cp- = eta(5)-C5H5-) and [Ti(MeCp)(2)Cl-2] (MeCP- = eta(5)-C5H4CH3-) towards the dipicolinate(-2) (dipic(2-)) ligand under mild (ambient temperature) and convenient (aerobic reactions, aqueous media) conditions have been investigated. The syntheses, molecular structures and spectroscopic (IR, H-1 NMR) characterization are reported for the 18-electron products [Zr(Cp)(2)(dipic)] (1), [Hf(Cp)(2)(dipic)] (2) and [Ti(MeCp)(2)(dipic)] (3). The dipic(2-) ion behaves as N,O,O'-chelating ligand in the three complexes, while the centroids of the Cp- (1, 2) and MeCp- (3) rings formally occupy the fourth and fifth coordination sites about the central metal. The two identical/very similar bite angles of only similar to 70 degrees make the dipic(2-) ligand particularly suited to form stable metallocene derivatives with 5-coordinate geometry. IR and H-1 NMR data are discussed in terms of the known structures and the tridentate chelating mode of the dipic(2-) ligand. (C) 2010 Elsevier Ltd. All rights reserved.
C1 [Stamatatos, Theocharis C.; Perlepes, Spyros P.; Klouras, Nikolaos] Univ Patras, Dept Chem, Patras 26500, Greece.
   [Raptopoulou, Catherine P.; Psycharis, Vassilis] NCSR Demokritos, Inst Mat Sci, Aghia Paraskevi 15310, Greece.
RP Klouras, N (reprint author), Univ Patras, Dept Chem, Patras 26500, Greece.
EM n.klouras@chemistry.upatras.gr
OI Raptopoulou, Catherine/0000-0002-8775-5427
CR Aghabozorg H, 2005, Z ANORG ALLG CHEM, V631, P909, DOI 10.1002/zaac.200400459
   BAILEY SI, 1986, J CHEM SOC DALTON, P603, DOI 10.1039/dt9860000603
   Browning K, 1995, J CHEM CRYSTALLOGR, V25, P851, DOI 10.1007/BF01671082
   BUGLYO P, 2005, INORG CHEM, V44, P5146
   CHESSA G, 1991, INORG CHIM ACTA, V185, P201, DOI 10.1016/S0020-1693(00)85445-6
   COTTON FA, 1999, ADV INORG CHEM, pR11
   Daneshvar S, 2008, ACTA CRYSTALLOGR E, V64, pM1308, DOI 10.1107/S1600536808029887
   DEACON GB, 1980, COORDIN CHEM REV, V33, P227, DOI 10.1016/S0010-8545(00)80455-5
   DEMAKOPOULOS I, 1995, Z ANORG ALLG CHEM, V621, P1761, DOI 10.1002/zaac.19956211025
   Devereux M, 2002, POLYHEDRON, V21, P1063, DOI 10.1016/S0277-5387(02)00842-2
   DIXIT SC, 1989, INORG CHIM ACTA, V158, P109, DOI 10.1016/S0020-1693(00)84019-0
   DRUCE PM, 1969, J CHEM SOC A, P2106, DOI 10.1039/j19690002106
   Fandos R, 2006, DALTON T, P2683, DOI 10.1039/b601544a
   GONZALEZBARE GAC, 2008, POLYHEDRON, V27, P502
   GUTHNER T, 1989, J ORGANOMET CHEM, V371, P43, DOI 10.1016/0022-328X(89)85206-4
   GUTMANN S, 1990, J ORGANOMET CHEM, V397, P21, DOI 10.1016/0022-328X(90)85310-U
   HAKANSSON K, 1993, ACTA CHEM SCAND, V47, P449, DOI 10.3891/acta.chem.scand.47-0449
   HOOF DL, 1973, J CHEM SOC DALTON, P200, DOI 10.1039/dt9730000200
   KHEIROLLAHI PD, 2005, ANAL SCI, V21, P153
   KLIMA S, 1988, J ORGANOMET CHEM, V354, P77, DOI 10.1016/0022-328X(88)80640-5
   Klouras N, 1997, MONATSH CHEM, V128, P1201, DOI 10.1007/BF00807251
   Koman M, 2000, INORG CHEM COMMUN, V3, P262, DOI 10.1016/S1387-7003(00)00060-5
   KOPF H, 1982, CHEM SCRIPTA, V19, P122
   LEIK R, 1986, J ORGANOMET CHEM, V312, P177, DOI 10.1016/0022-328X(86)80296-0
   Lever A.B.P., 1971, INORG CHEM, V10, P817, DOI 10.1021/ic50098a031
   Ma CB, 2003, EUR J INORG CHEM, P1227
   MANOHAR H, 1974, HELV CHIM ACTA, V57, P1086, DOI 10.1002/hlca.19740570416
   Mao L, 2004, J MOL STRUCT, V688, P197, DOI 10.1016/j.molstruc.2003.10.015
   Martinez D, 2010, DALTON T, V39, P446, DOI 10.1039/b913865j
   MEIRIM MG, 1988, TRANSIT METAL CHEM, V13, P272, DOI 10.1007/BF01025672
   NAKAMOTO K, 1997, INFRARED RAMAN SPE B, P285
   NIEMANN U, 1993, J ORGANOMET CHEM, V456, P195, DOI 10.1016/0022-328X(93)80426-C
   PETERSEN JL, 1975, J AM CHEM SOC, V97, P6422, DOI 10.1021/ja00855a022
   RAYNOLDS LT, 1959, J INORG NUCL CHEM, V9, P86
   Rigaku/MSC, 2005, CRYSTALCLEAR
   SCHWARZE.D, 1970, INORG CHEM, V9, P2391, DOI 10.1021/ic50093a002
   SCHWARZENBACH D, 1972, HELV CHIM ACTA, V55, P2990, DOI 10.1002/hlca.19720550832
   SENGUPTA SK, 1983, POLYHEDRON, V2, P317, DOI 10.1016/S0277-5387(00)83922-4
   Shavit M, 2008, EUR J INORG CHEM, P1467, DOI 10.1002/ejic.200701233
   Sheldrick G. M., 1997, SHELXS 97 STRUCTURE
   Sheldrick G. M., 1997, SHELXL 97 PROGRAM RE
   Sileo EE, 1996, POLYHEDRON, V15, P4531, DOI 10.1016/0277-5387(96)00189-1
   Smee JJ, 2009, J INORG BIOCHEM, V103, P575, DOI 10.1016/j.jinorgbio.2008.12.015
   Sofetis A, 2009, POLYHEDRON, V28, P3356, DOI 10.1016/j.poly.2009.05.048
   THEWALT U, 1989, J ORGANOMET CHEM, V379, P59, DOI 10.1016/0022-328X(89)80025-7
   Ucar I, 2007, J MOL STRUCT, V837, P38, DOI 10.1016/j.molstruc.2006.09.029
   Wang L, 2004, TRANSIT METAL CHEM, V29, P212, DOI 10.1023/B:TMCH.0000019450.01331.d4
   WANG ZQ, 1991, POLYHEDRON, V10, P2341, DOI 10.1016/S0277-5387(00)86159-8
   WILLEY GR, 1998, TRANSIT METAL CHEM, V23, P476
   Yang LQ, 2002, INORG CHEM, V41, P4859, DOI 10.1021/ic020062l
NR 50
TC 5
Z9 5
U1 0
U2 7
PU PERGAMON-ELSEVIER SCIENCE LTD
PI OXFORD
PA THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD OX5 1GB, ENGLAND
SN 0277-5387
J9 POLYHEDRON
JI Polyhedron
PD FEB 21
PY 2011
VL 30
IS 3
BP 451
EP 457
DI 10.1016/j.poly.2010.10.018
PG 7
WC Chemistry, Inorganic & Nuclear; Crystallography
SC Chemistry; Crystallography
GA 728WL
UT WOS:000287905100001
ER

PT J
AU Hu, B
   Amos, N
   Tian, YA
   Butler, J
   Litvinov, D
   Khizroev, S
AF Hu, Bing
   Amos, Nissim
   Tian, Yuan
   Butler, John
   Litvinov, Dmitri
   Khizroev, Sakhrat
TI Study of Co/Pd multilayers as a candidate material for next generation
   magnetic media
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article
ID RECORDING MEDIA; PD/CO; ANISOTROPY
AB We report a combinatorial synthesis study on the magnetic properties of sputter-deposited Co/Pd multilayers with high perpendicular anisotropy and high remnant squareness for magnetic media applications such as magnetic logic systems, bit patterned media, magneto-optical recording, and multilevel three-dimensional (3D) magnetic media. The perpendicular magnetic anisotropy in the multilayers originates from the interfacial anisotropy of the alloylike structure. The deposition conditions and subsequent microstructures of the multilayers are critical factors to determine the magnetic properties of the media. We investigated the dependence of the magnetic properties on the thickness of Co and Pd layers the number of Co/Pd bilayers. For instance, we found that a 0.26-nm-thick layer of Co would produce the highest coercivity value if paired with a 0.55-nm-thick Pd layer. Our results revealed that an Ar(+) milling could significantly increase the coercivity of the multilayer media. Further, we discovered that we could control the deposition pressure to achieve either granular or continuous media morphologies corresponding to exchange-coupled or decoupled grains, respectively. Finally, we used the combinatorial synthesis to tailor multilayers' properties to engineer a eight-level three-layer 3D media. (C) 2011 American Institute of Physics. [doi:10.1063/1.3544306]
C1 [Hu, Bing; Amos, Nissim; Tian, Yuan; Butler, John; Khizroev, Sakhrat] Univ Calif Riverside, Dept Elect Engn, Riverside, CA 92521 USA.
   [Litvinov, Dmitri] Univ Houston, Ctr Nanomagnet Syst, Houston, TX 77204 USA.
RP Hu, B (reprint author), Univ Calif Riverside, Dept Elect Engn, 900 Univ Ave, Riverside, CA 92521 USA.
EM bhu002@ucr.edu
RI Hu, Bing/M-3186-2014
OI Hu, Bing/0000-0003-1284-6153
FU Department of Defense (DoD)/Defense Microelectronics Activity (DMEA)
   [H94003-10-2-1003]; National Science Foundation (NSF) [ECCS-0824019]
FX The research was partially supported by Department of Defense
   (DoD)/Defense Microelectronics Activity (DMEA) under Contract No.
   H94003-10-2-1003 and National Science Foundation (NSF) under Contract
   No. ECCS-0824019.
CR Allwood DA, 2005, SCIENCE, V309, P1688, DOI 10.1126/science.1108813
   BENNETT WR, 1991, J APPL PHYS, V69, P4384, DOI 10.1063/1.348363
   CARCIA PF, 1985, APPL PHYS LETT, V47, P178, DOI 10.1063/1.96254
   DENBROEDER FJA, 1987, J APPL PHYS, V61, P4317, DOI 10.1063/1.338459
   Jiang WW, 2002, J APPL PHYS, V91, P8067, DOI 10.1063/1.1454982
   Khizroev S, 2006, J APPL PHYS, V100, DOI 10.1063/1.2338129
   Khizroev S, 2004, J APPL PHYS, V95, P4521, DOI 10.1063/1.1695092
   Kubota Y, 2002, J MAGN MAGN MATER, V242, P297, DOI 10.1016/S0304-8853(01)01235-5
   LIARSON BM, 1994, IEEE T MAGN, V30, P4014
   Matsunuma S, 2004, IEEE T MAGN, V40, P2492, DOI [10.1109/TMAG.2004.832146, 10.1109/j.TMAG.2004.832146]
   McMorran BJ, 2010, J APPL PHYS, V107, DOI 10.1063/1.3358218
   Piramanayagam SN, 2007, J APPL PHYS, V102, DOI 10.1063/1.2750414
   Prinz GA, 1998, SCIENCE, V282, P1660, DOI 10.1126/science.282.5394.1660
   Rachid S., 2009, J APPL PHYS, V106
   Richter HJ, 2009, J MAGN MAGN MATER, V321, P467, DOI 10.1016/j.jmmm.2008.04.161
   Rozatian ASH, 2005, J PHYS-CONDENS MAT, V17, P3759, DOI 10.1088/0953-8984/17/25/004
   Speetzen N, 2005, J MAGN MAGN MATER, V287, P181, DOI 10.1016/j.jmmm.2004.10.030
   TIAN Y, 2010, P 55 MAGN MAGN MAT M
NR 18
TC 11
Z9 11
U1 0
U2 13
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0021-8979
J9 J APPL PHYS
JI J. Appl. Phys.
PD FEB 1
PY 2011
VL 109
IS 3
AR 034314
DI 10.1063/1.3544306
PG 4
WC Physics, Applied
SC Physics
GA 721PC
UT WOS:000287366000088
ER

PT J
AU But, I
   Blazevic, S
   Doric, M
   Jelenc, M
   Spilak, M
   Pakiz, M
AF But, Igor
   Blazevic, Sabina
   Doric, Maja
   Jelenc, Marusa
   Spilak, Martina
   Pakiz, Maja
TI Sexual behavior and contraception use among secondary-school students in
   north-east Slovenia
SO ZDRAVNISKI VESTNIK-SLOVENIAN MEDICAL JOURNAL
LA Slovene
DT Article
DE secondary-school students; sexual intercourse; contraception; double
   protection; information
ID INTERCOURSE
AB Background: Age at first intercourse is declining, probably due to a false sense of maturity of the secondary-school students as well as due to the impact of different media. The purpose of this research is to examine the pattern of sexual behaviour and awareness of contraception among secondary school students in some of the major cities of northeastern Slovenia.
   Methods: The survey was done between April and June 2009 in nine secondary-schools in the cities of Maribor, Murska Sobota, Slovenj Gradec and Ravne na Koroskem. The questionnaires were filled out during class hours in complete anonymity and privacy. The data processing was done by SPSS 13.0 programme.
   Results: We distributed 5456 questionnaires, 4415 (80.9 %) were returned, out of them 4184 were suitable for analysis. There were 1426 (34.1 %) male and 2758 (65.9 %) female students included in the analysis. The average age of the 4184 students was 16.8 +/- 1.2 years, the average age of male students being the same as for female students. 53.0 % of students have already had vaginal sexual intercourse, and the age at which 50 % of secondary-school students experienced vaginal sexual intercourse was 17.0 years. Oral sex was already experienced by 40.0 % of the students, and 12.0% of all students had already had anal sex. At the first sexual intercourse, a reliable contraception was used by 86.2 % of female and 89.1% of male students. In the last three months, for protection purposes, the condom was mostly used by boys (54.0 %) and oral hormone contraceptives were used by girls (49.9 %). The first source of information on sexuality, as stated by students, were the media (47.3 %), but the most useful information they got was that from their parents (35.2 %). Less grammar-school students have ever had sexual intercourse compared to other secondary-school students (46.0 % vs. 65.0 %, p = 0.000).
   Conclusions: The age at which a half of secondary-school students experienced vaginal sexual intercourse was 17.0 years. Students are very conscious about protection, however the rate of anal sexual intercourses is a bit concerning. There are some differences in sexual behaviour among secondary school students: thus we found that students of other secondary-schools were more sexually active then students attending grammar school.
C1 [But, Igor; Pakiz, Maja] UKCM, KGP, Maribor 2000, Slovenia.
   [Blazevic, Sabina; Doric, Maja; Jelenc, Marusa; Spilak, Martina] Univ Maribor, Fak Med, SLO-2000 Maribor, Slovenia.
RP But, I (reprint author), UKCM, KGP, Ljubtjanska 5, Maribor 2000, Slovenia.
EM but.igor@gmail.com
CR Auslander BA, 2005, PEDIATR ANN, V34, P785
   Biro FM, 2005, PEDIATR ANN, V34, P777
   Godeau E, 2008, ARCH PEDIAT ADOL MED, V162, P66, DOI 10.1001/archpediatrics.2007.8
   Green J, 2003, BRIT J CANCER, V89, P2078, DOI 10.1038/sj.bjc.6601296
   Houston AM, 2007, J PEDIATR ADOL GYNEC, V20, P299, DOI 10.1016/j.jpag.2007.01.006
   HOYER S, 1997, OBZOR ZDRAV N, V31, P147
   *IPPF, 1994, MED B, V28, P1
   Lavikainen HM, 2009, HEALTH PROMOT INT, V24, P108, DOI 10.1093/heapro/dap007
   Lazarus JV, 2009, PUBLIC HEALTH, V123, P138, DOI 10.1016/j.puhe.2008.10.014
   Pinter B, 2000, Eur J Contracept Reprod Health Care, V5, P71, DOI 10.1080/13625180008500372
   PINTER B, 1995, SLOV PEDIAT, V4, P13
   PINTER B, 2006, ZDR VESTN, V75, P615
   Pinter B, 2009, EUR J CONTRACEP REPR, V14, P127, DOI 10.1080/13625180802606101
NR 13
TC 0
Z9 0
U1 0
U2 1
PU SLOVENE MEDICAL SOC
PI LJUBLJANA
PA ZDRAVNISKI VESTNIK, DALMATINOVA 10, P P 26, LJUBLJANA, 1001, SLOVENIA
SN 1318-0347
J9 ZDR VESTN
JI Zdr. Vestn.
PD FEB
PY 2011
VL 80
IS 2
BP 84
EP 91
PG 8
WC Medicine, General & Internal
SC General & Internal Medicine
GA 730OX
UT WOS:000288044500002
ER

PT J
AU Lubarda, MV
   Li, SJ
   Livshitz, B
   Fullerton, EE
   Lomakin, V
AF Lubarda, Marko V.
   Li, Shaojing
   Livshitz, Boris
   Fullerton, Eric E.
   Lomakin, Vitaliy
TI Antiferromagnetically coupled capped bit patterned media for
   high-density magnetic recording
SO APPLIED PHYSICS LETTERS
LA English
DT Article
ID STORAGE
AB We report micromagnetic modeling of a bit patterned media where a two-dimensional array of patterned composite islands is antiferromagnetically coupled to a continuous capping layer. This media allows optimization of writability, switching field distributions, and readback response. Lateral and vertical exchange introduced through the coupling with the capping layer compensates the dipolar interactions between islands and antiferromagnetic coupling is employed to modulate the high-density readback response. (c) 2011 American Institute of Physics. [doi: 10.1063/1.3532839]
C1 [Lubarda, Marko V.; Li, Shaojing; Livshitz, Boris; Fullerton, Eric E.; Lomakin, Vitaliy] Univ Calif San Diego, Dept Elect & Comp Engn, Ctr Magnet Recording Res, La Jolla, CA 92093 USA.
RP Lubarda, MV (reprint author), Univ Calif San Diego, Dept Elect & Comp Engn, Ctr Magnet Recording Res, La Jolla, CA 92093 USA.
EM malubard@ucsd.edu
RI Livshitz, Boris/G-3442-2011; Li, Shaojing/D-8003-2012; Fullerton,
   Eric/H-8445-2013
OI Fullerton, Eric/0000-0002-4725-9509
FU INSIC; CMRR
FX Support was provided by INSIC through the EDHR program and CMRR
   sponsors.
CR Albrecht M, 2002, APPL PHYS LETT, V81, P2875, DOI 10.1063/1.1512946
   Chappert C, 1998, SCIENCE, V280, P1919, DOI 10.1126/science.280.5371.1919
   E CS, 2006, IEEE T MAGN, V42, P2411, DOI 10.1109/TMAG.2006.878397
   Fullerton EE, 1998, PHYS REV B, V58, P12193, DOI 10.1103/PhysRevB.58.12193
   Goll D, 2008, APPL PHYS LETT, V93, DOI 10.1063/1.3001589
   Hellwig O, 2007, APPL PHYS LETT, V90, DOI 10.1063/1.2730744
   Karakulak S, 2008, IEEE T MAGN, V44, P193, DOI 10.1109/TMAG.2007.912837
   Krone P, 2010, APPL PHYS LETT, V97, DOI 10.1063/1.3481668
   Li SJ, 2009, J APPL PHYS, V105, DOI 10.1063/1.3076140
   Lomakin V, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2831732
   Moser A, 2003, PHYS REV LETT, V91, DOI 10.1103/PhysRevLett.91.097203
   Piramanayagam SN, 2009, J APPL PHYS, V105, DOI 10.1063/1.3077203
   Richter HJ, 2007, J PHYS D APPL PHYS, V40, pR149, DOI 10.1088/0022-3727/40/9/R01
   Shiroishi Y, 2009, IEEE T MAGN, V45, P3816, DOI 10.1109/TMAG.2009.2024879
   Suess D, 2005, APPL PHYS LETT, V87, DOI 10.1063/1.1951053
   Victora RH, 2005, IEEE T MAGN, V41, P537, DOI 10.1109/TMAG.2004.838075
   Albrecht T. R., 2009, U.S. Patent, Patent No. 0169731
NR 17
TC 12
Z9 12
U1 0
U2 12
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0003-6951
J9 APPL PHYS LETT
JI Appl. Phys. Lett.
PD JAN 3
PY 2011
VL 98
IS 1
AR 012513
DI 10.1063/1.3532839
PG 3
WC Physics, Applied
SC Physics
GA 703VQ
UT WOS:000286009800056
ER

PT J
AU Ayon, P
   Swartzman, G
   Espinoza, P
   Bertrand, A
AF Ayon, Patricia
   Swartzman, Gordon
   Espinoza, Pepe
   Bertrand, Arnaud
TI Long-term changes in zooplankton size distribution in the Peruvian
   Humboldt Current System: conditions favouring sardine or anchovy
SO MARINE ECOLOGY PROGRESS SERIES
LA English
DT Article
DE Anchovy; Sardine; Abundance; Zooplankton size dominance; Feeding
   energetics; Euphausiids; Humboldt Current System
ID ENGRAULIS-RINGENS; SOUTHERN BENGUELA; CURRENT ECOSYSTEM; OCEAN;
   PHYTOPLANKTON; SAGAX; TROPHODYNAMICS; TEMPERATURE; POPULATIONS;
   EUPHAUSIIDS
AB Changes in the size distribution of zooplankton in the Humboldt Current System have been hypothesized to underlie observed changes in sardine and anchovy populations, the dominant pelagic fish species. To examine this hypothesis, the size distribution of over 15 000 zooplankton data samples collected since the 1960s was qualitatively determined. Dominance of each size group of zooplankton (small, medium and large) and of euphausiids was modelled using generalized additive models as a function of year, latitude, time of day, distance from the 200 m isobath (a surrogate for on-shelf versus off-shelf), sea surface temperature and salinity. The temporal (yr) pattern for euphausiid dominance was highly cross-correlated (i.e. was in phase) with the time series for estimated biomass of anchovy, and small zooplankton dominance with that for estimated sardine biomass. This supports the focal hypothesis based on feeding-energetic experiments, which showed energetic advantages to sardine filter feeding on smaller zooplankton and to anchovy bite feeding on larger copepods and euphausiids. Although euphausiids predominate offshore from the shelf break, anchovy biomass is generally highest on the shelf, suggesting a possible mismatch between anchovy feeding and euphausiid dominance. However, evidence concerning the offshore expansion of the anchovy range in cooler conditions, where both anchovy and euphausiids predominate, somewhat alleviates this apparent contradiction. A strong diel component to euphausiids and large zooplankton indicated diel migration for these zooplankton groups. That anchovy will preferentially eat euphausiids when they are more available (i.e. during the night and offshore) is supported by anchovy diet data.
C1 [Swartzman, Gordon] Univ Washington, Sch Aquat & Fisheries Sci, Seattle, WA 98195 USA.
   [Ayon, Patricia; Espinoza, Pepe; Bertrand, Arnaud] Inst Mar Peru IMARPE, La Punta Callao, Peru.
   [Bertrand, Arnaud] Ctr Rech Halieut Mediterraneenne & Trop, IRD, UMR EME 212, F-34203 Sete, France.
RP Swartzman, G (reprint author), Univ Washington, Sch Aquat & Fisheries Sci, Box 355020, Seattle, WA 98195 USA.
EM gordie@apl.washington.edu
RI Bertrand, Arnaud/E-4251-2010
OI Bertrand, Arnaud/0000-0003-4723-179X
FU US National Science Foundation [NSF0526392]; LMI DISCOH from IRD; 
   [UR097];  [UMR212]
FX This work would not have been possible without the availability of
   zooplankton samples and supporting environmental data collected
   dutifully using the same protocol over a long time period and archived
   by IMARPE. This work was supported in part by the US National Science
   Foundation through grant no. NSF0526392 to G.S. and by UR097, UMR212 and
   the LMI DISCOH from IRD to A.B. We appreciate the help of L. Vasquez of
   IMARPE to complete the time series by inclusion of time of day,
   temperature and salinity for many of the earlier surveys. The
   zooplankton samples were organized and reconstructed by D. Chang and the
   samples were qualitatively assessed for size class by N. Serrano and
   especially J. Correa. They were trained by O. Lozano of IMARPE.
CR Alheit J, 2004, PROG OCEANOGR, V60, P201, DOI 10.1016/j.pocean.2004.02.006
   Ayon P, 2004, ICES J MAR SCI, V61, P478, DOI 10.1016/j.icesjms.2004.03.027
   Ayon P, 2008, PROG OCEANOGR, V79, P208, DOI 10.1016/j.pocean.2008.10.023
   Ayon P, 2008, PROG OCEANOGR, V79, P238, DOI 10.1016/j.pocean.2008.10.020
   BARANGE A, 2009, PROG OCEANOGR, V83, P251
   Bertrand A, 2004, FISH FISH, V5, P296, DOI 10.1111/j.1467-2679.2004.00165.x
   Bertrand A, 2010, PLOS ONE, V5, DOI 10.1371/journal.pone.0010330
   Bertrand A, 2008, PROG OCEANOGR, V79, P264, DOI 10.1016/j.pocean.2008.10.018
   Boltovskoy D., 1999, S ATLANTIC ZOOPLANKT
   BONICELLI J, 2008, THESIS U NACL AGRARI
   Brochier T, 2008, J PLANKTON RES, V30, P1133, DOI 10.1093/plankt/fbn066
   Chavez FP, 2003, SCIENCE, V299, P217, DOI 10.1126/science.1075880
   Dunn PK, 2008, STAT COMPUT, V18, P73, DOI 10.1007/s11222-007-9039-6
   Escribano Ruben, 2009, Deep-Sea Research Part II Topical Studies in Oceanography, V56, P1083, DOI 10.1016/j.dsr2.2008.09.009
   Espinoza P, 2009, PROG OCEANOGR, V83, P242, DOI 10.1016/j.pocean.2009.07.045
   Espinoza P, 2008, PROG OCEANOGR, V79, P215, DOI 10.1016/j.pocean.2008.10.022
   Falkowski PG, 2007, NAT REV MICROBIOL, V5, P813, DOI 10.1038/nrmicro1751
   Gorsky G, 2010, J PLANKTON RES, V32, P285, DOI 10.1093/plankt/fbp124
   Gutierrez D, 2009, BIOGEOSCIENCES, V6, P835
   Gutierrez M, 2007, FISH OCEANOGR, V16, P155, DOI 10.1111/j.1365-2419.2006.00422.x
   Hastie T, 1990, GEN ADDITIVE MODELS
   KRAMER D, 1972, NOAA (National Oceanic and Atmospheric Administration) Technical Report NMFS (National Marine Fisheries Service) Circular, V370, P1
   Lett C, 2007, J MARINE SYST, V64, P189, DOI 10.1016/j.jmarsys.2006.03.012
   Lu BW, 2003, PROG OCEANOGR, V57, P381, DOI 10.1016/S0079-6611(03)00107-1
   Niquen M., 2000, B I MAR PERU, V19, P103
   PAINTING SJ, 1993, MAR ECOL PROG SER, V100, P55, DOI 10.3354/meps100055
   PETERSON WT, 1989, BENGUELA ECOLOGY PRO, V17, P1
   Rykaczewski RR, 2008, P NATL ACAD SCI USA, V105, P1965, DOI 10.1073/pnas.0711777105
   Schnute J. T., 2002, HDB FISH BIOL FISHER, V2, P105
   Schwartzlose RA, 1999, S AFR J MARINE SCI, V21, P289
   Simmonds J., 2009, ICES J MAR SCI, V66, P1341
   Swartzman G, 2005, DEEP-SEA RES PT II, V52, P73, DOI 10.1016/j.dsr2.2004.09.028
   Swartzman G, 2008, PROG OCEANOGR, V79, P228, DOI 10.1016/j.pocean.2008.10.021
   Takasuka A, 2007, CAN J FISH AQUAT SCI, V64, P768, DOI 10.1139/F07-052
   Thomas AC, 2009, PROG OCEANOGR, V83, P386, DOI 10.1016/j.pocean.2009.07.020
   Valdes J, 2008, PROG OCEANOGR, V79, P198, DOI 10.1016/j.pocean.2008.10.002
   van der Lingen CD, 2006, AFR J MAR SCI, V28, P465, DOI 10.2989/18142320609504199
   van der Lingen CD, 2009, CLIMATE CHANGE AND SMALL PELAGIC FISH, P112
   vanderLingen CD, 1995, MAR ECOL PROG SER, V129, P41, DOI 10.3354/meps129041
   WALKER DR, 1991, S AFR J MARINE SCI, V11, P289
NR 40
TC 14
Z9 16
U1 4
U2 19
PU INTER-RESEARCH
PI OLDENDORF LUHE
PA NORDBUNTE 23, D-21385 OLDENDORF LUHE, GERMANY
SN 0171-8630
J9 MAR ECOL PROG SER
JI Mar. Ecol.-Prog. Ser.
PY 2011
VL 422
BP 211
EP 222
DI 10.3354/meps08918
PG 12
WC Ecology; Marine & Freshwater Biology; Oceanography
SC Environmental Sciences & Ecology; Marine & Freshwater Biology;
   Oceanography
GA 715ZD
UT WOS:000286933500020
ER

PT J
AU Grobis, MK
   Hellwig, O
   Hauet, T
   Dobisz, E
   Albrecht, TR
AF Grobis, Michael K.
   Hellwig, Olav
   Hauet, Thomas
   Dobisz, Elizabeth
   Albrecht, Thomas R.
TI High-Density Bit Patterned Media: Magnetic Design and Recording
   Performance
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT 21st Magnetic Recording Conference (TMRC 2010)
CY AUG 16-18, 2010
CL Univ California, San Diego, CA
HO Univ California
DE Bit patterned media; error analysis; magnetic recording
AB We examine the magnetic properties and recording performance of bit patterned exchange coupled composite (ECC) magnetic media at different bit and island aspect ratios. The ECC media consists of Co/Pd and Co/Ni multilayers whose coupling is controlled using Pd interlayers. We show that this multilayer system can be tuned to provide writeable media with a low switching field distribution for bit patterned magnetic recording. The recording performance of 100 Gb/in(2) media shows a sub 1e-4 bit error rate floor and misregistration errors that are well-described by a simple error model.
C1 [Grobis, Michael K.; Hellwig, Olav; Hauet, Thomas; Dobisz, Elizabeth; Albrecht, Thomas R.] Hitachi Global Storage Technol, San Jose Res Ctr, San Jose, CA 95135 USA.
   [Hauet, Thomas] Nancy Univ, CNRS, UPV Metz, Vandoeuvre Les Nancy, France.
RP Grobis, MK (reprint author), Hitachi Global Storage Technol, San Jose Res Ctr, San Jose, CA 95135 USA.
EM Michael.Grobis@hitachigst.com
CR Albrecht M, 2002, APPL PHYS LETT, V81, P2875, DOI 10.1063/1.1512946
   Albrecht TR, 2009, NANOSCALE MAGNETIC MATERIALS AND APPLICATIONS, P237, DOI 10.1007/978-0-387-85600-1_9
   Grobis M, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3304166
   Hauet T, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3276911
   Hellwig O, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3271679
   Kalezhi J, 2009, IEEE T MAGN, V45, P3531, DOI 10.1109/TMAG.2009.2022407
   Landis S, 1999, APPL PHYS LETT, V75, P2473, DOI 10.1063/1.125052
   Moser A, 1999, J APPL PHYS, V85, P5018, DOI 10.1063/1.370077
   Moser A, 2007, APPL PHYS LETT, V91, DOI 10.1063/1.2799174
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Richter HJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2209179
   Schabes ME, 2008, J MAGN MAGN MATER, V320, P2880, DOI 10.1016/j.jmmm.2008.07.035
   Stipe BC, 2010, NAT PHOTONICS, V4, P484, DOI 10.1038/nphoton.2010.90
   Suess D, 2009, J MAGN MAGN MATER, V321, P545, DOI 10.1016/j.jmmm.2008.06.041
   Suess D, 2005, APPL PHYS LETT, V87, DOI 10.1063/1.1951053
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
NR 16
TC 17
Z9 17
U1 2
U2 16
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JAN
PY 2011
VL 47
IS 1
BP 6
EP 10
DI 10.1109/TMAG.2010.2076798
PN 1
PG 5
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 701RZ
UT WOS:000285841800002
ER

PT J
AU Honda, N
   Yamakawa, K
   Ariake, J
   Kondo, Y
   Ouchi, K
AF Honda, Naoki
   Yamakawa, Kiyoshi
   Ariake, Jun
   Kondo, Yuji
   Ouchi, Kazuhiro
TI Write Margin Improvement in Bit Patterned Media With Inclined Anisotropy
   at High Areal Densities
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT 21st Magnetic Recording Conference (TMRC 2010)
CY AUG 16-18, 2010
CL Univ California, San Diego, CA
HO Univ California
DE Bit patterned media; inclined anisotropy; shielded planar head; write
   margin
ID RECORDING SIMULATION; 1 TB/IN(2)
AB Bit patterned media with inclined anisotropy were proposed along with media design with a higher saturation magnetization and a small thickness for the dot. Inclination of the anisotropy axis was found to reduce broadened switching field distribution of the media caused by the magnetostatic interaction between the dots. Recording simulation at an areal density of 2.6 Tbit/in(2) using a write field of a shielded planar head exhibited substantially increased write shift margins of 6.5 nm and 10 nm in down-and cross track directions, respectively, for the media with inclined anisotropy when the anisotropy dispersion of the media was as small as 2%. Recording density was expected to be increased beyond 4 Tbit/in(2) for the media with additional exchange coupling between the dots.
C1 [Honda, Naoki] Tohoku Inst Technol, Dept Elect & Intelligent Syst, Sendai, Miyagi 9828577, Japan.
   [Yamakawa, Kiyoshi; Ariake, Jun; Kondo, Yuji; Ouchi, Kazuhiro] Akita Prefectural R&D Ctr, Res Inst Adv Technol, Akita 0101623, Japan.
RP Honda, N (reprint author), Tohoku Inst Technol, Dept Elect & Intelligent Syst, Sendai, Miyagi 9828577, Japan.
EM n_honda@tohtech.ac.jp
CR Gao KZ, 2002, IEEE T MAGN, V38, P3675, DOI 10.1109/TMAG.2002.804801
   Greaves SJ, 2008, IEEE T MAGN, V44, P3430, DOI 10.1109/TMAG.2008.2002365
   HONDA N, PMRC 2010 SEND JAP
   Honda N, 2008, J MAGN MAGN MATER, V320, P2195, DOI 10.1016/j.jmmm.2008.03.048
   Honda N, 2007, IEICE T ELECTRON, VE90C, P1594, DOI 10.1093/ietele/e90-c.8.1594
   Honda N, 2007, IEEE T MAGN, V43, P2142, DOI 10.1109/TMAG.2007.893139
   Honda N, 2010, IEEE T MAGN, V46, P1806, DOI 10.1109/TMAG.2009.2039857
   Honda N, 2008, IEEE T MAGN, V44, P3438, DOI 10.1109/TMAG.2008.2002528
   Ise K, 2006, IEEE T MAGN, V42, P2422, DOI 10.1109/TMAG.2006.878818
   Ishida T, 2000, IEEE T MAGN, V36, P183, DOI 10.1109/20.824446
   KONDO Y, 11 JOINT MMM INT C 2
   KONDO Y, INT C 2009 SACR CA
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Schabes ME, 2008, J MAGN MAGN MATER, V320, P2880, DOI 10.1016/j.jmmm.2008.07.035
   Terris BD, 2005, IEEE T MAGN, V41, P2822, DOI 10.1109/TMAG.2005.855264
NR 15
TC 5
Z9 5
U1 0
U2 1
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JAN
PY 2011
VL 47
IS 1
BP 11
EP 17
DI 10.1109/TMAG.2010.2078802
PN 1
PG 7
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 701RZ
UT WOS:000285841800003
ER

PT J
AU Hanchi, J
   Sonda, P
   Crone, R
AF Hanchi, Jorge
   Sonda, Paul
   Crone, Robert
TI Dynamic Fly Performance of Air Bearing Sliders on Patterned Media
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT 21st Magnetic Recording Conference (TMRC 2010)
CY AUG 16-18, 2010
CL Univ California, San Diego, CA
HO Univ California
DE Air bearing; flyability; head-disk interface; patterned media;
   perpendicular magnetic recording
ID TRACK PERPENDICULAR MEDIA; HIGH RECORDING DENSITY; DISCRETE
AB It is anticipated that a radical shift in design paradigm will be required in order to enable perpendicular magnetic recording (PMR) areal densities beyond 1 Tb/in(2). The shift in question will involve the use of advanced magnetic recording assist technologies such as patterned media, heat-assisted magnetic recording (HAMR), or microwave-assisted magnetic recording (MAMR). This paper is concerned with one of the challenges associated with the practical implementation of patterned media technology, namely, the impact of non-planarity, and shifts in pattern orientation (at data-servo transitions, in particular) on the dynamic fly performance of air bearing sliders. The nature of the latter challenge becomes apparent when considering that key to realizing recording areal densities exceeding 1 Tb/in(2) will be air bearing sliders with superior dynamic fly stability at sub-2 nm clearances. Of the two types of patterned media technologies in development in the disk drive industry, namely, discrete track media (DTM) and bit patterned media (BPM), the former was chosen as a case study in this work.
C1 [Hanchi, Jorge; Sonda, Paul; Crone, Robert] Seagate Technol, Minneapolis, MN 55435 USA.
RP Hanchi, J (reprint author), Seagate Technol, Minneapolis, MN 55435 USA.
EM jorge.hanchi@seagate.com
CR Che XD, 2007, IEEE T MAGN, V43, P4106, DOI 10.1109/TMAG.2007.908279
   DUWENSEE M, 2001, J TRIBOL, V131
   Duwensee M, 2009, MICROSYST TECHNOL, V15, P1597, DOI 10.1007/s00542-009-0816-3
   Hattori K, 2004, IEEE T MAGN, V40, P2510, DOI 10.1109/TMAG.2004.832244
   HAYASHI T, 2002, J TRIBOL, V131
   Horowitz R, 2007, CONTROL ENG PRACT, V15, P291, DOI 10.1016/j.conengprac.2006.09.003
   Kryder MH, 2008, P IEEE, V96, P1810, DOI 10.1109/JPROC.2008.2004315
   Li JH, 2007, J TRIBOL-T ASME, V129, P712, DOI 10.1115/1.2768069
   LI L, 2010, INSIC EHDR TECHN REV
   MITSUYA Y, 1984, B JSME, V27, P2036
   Peng JP, 2006, IEEE T MAGN, V42, P2462, DOI 10.1109/TMAG.2006.878635
   Roddick E, 2005, IEEE T MAGN, V41, P3229, DOI 10.1109/TMAG.2005.854781
   Soeno Y, 2005, IEEE T MAGN, V41, P3220, DOI 10.1109/TMAG.2005.854777
   Terris BD, 2007, MICROSYST TECHNOL, V13, P189, DOI 10.1007/s00542-006-0144-9
   ZHANG MS, 2008, INT J PROD DEV, V5, P306, DOI 10.1504/IJPD.2008.017466
   Zhu JG, 2008, IEEE T MAGN, V44, P125, DOI 10.1109/TMAG.2007.911031
NR 16
TC 6
Z9 6
U1 0
U2 6
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JAN
PY 2011
VL 47
IS 1
BP 46
EP 50
DI 10.1109/TMAG.2010.2071857
PN 1
PG 5
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 701RZ
UT WOS:000285841800007
ER

PT J
AU Kamata, Y
   Kikitsu, A
   Kihara, N
   Morita, S
   Kimura, K
   Izumi, H
AF Kamata, Yoshiyuki
   Kikitsu, Akira
   Kihara, Naoko
   Morita, Seiji
   Kimura, Kaori
   Izumi, Haruhiko
TI Fabrication of Ridge-and-Groove Servo Pattern Consisting of
   Self-Assembled Dots for 2.5 Tb/in(2) Bit Patterned Media
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT 21st Magnetic Recording Conference (TMRC 2010)
CY AUG 16-18, 2010
CL Univ California, San Diego, CA
HO Univ California
DE Bit patterned media; HDD; self-assembled polymer; servo pattern
ID PERFORMANCE
AB Bit patterned media (BPM) is fabricated by a directed self-assembled polymer mask. CoPt magnetic dots with 17 nm pitch (2.5 Tb/in(2)) consists of ridge-and-groove servo patterns as well as circular data tracks. Distribution of dot size and dot pitch is 16% and 15%, respectively. The position error signal (PES) is estimated numerically employing a simulation model using estimated deviation of dot size and pitch. PES linearity was found to be fairly good in spite of large dot pitch deviation. Distribution of dot size and dot pitch causes distortion in the reproduced waveform, but it does not degrade the phase information of the servo signal. This result indicates that the ridge-and-groove servo has a high tolerance to the amplitude noise and is suitable for BPM. When the width of the read head is close to the dot pitch, the linearity error increases owing to the dot size and dot pitch deviation. Reduction of these distributions is necessary in order to apply BPM to hard disk drives.
C1 [Kamata, Yoshiyuki; Kikitsu, Akira; Kihara, Naoko; Morita, Seiji; Kimura, Kaori; Izumi, Haruhiko] Toshiba Co Ltd, Corp R&D Ctr, Kawasaki, Kanagawa 2128582, Japan.
RP Kamata, Y (reprint author), Toshiba Co Ltd, Corp R&D Ctr, Kawasaki, Kanagawa 2128582, Japan.
EM yoshiyuki.kamata@toshiba.co.jp
CR Han Y, 2009, IEEE T MAGN, V45, P5352, DOI 10.1109/TMAG.2009.2025035
   Hellwig O, 2007, APPL PHYS LETT, V90, DOI 10.1063/1.2730744
   Hughes EC, 2003, J APPL PHYS, V93, P7002, DOI 10.1063/1.1557937
   KAMATA Y, 2010, P SPIE, V7748
   Kamata Y, 2007, JPN J APPL PHYS 1, V46, P999, DOI 10.1143/JJAP.46.999
   KIKITSU A, 2010, 11 JOINT MMM INT C
   Lin XD, 2000, J APPL PHYS, V87, P5117, DOI 10.1063/1.373267
   Clerk Maxwell J., 1892, TREATISE ELECT MAGNE, V2, P68
   Park S, 2009, SCIENCE, V323, P1030, DOI 10.1126/science.1168108
   TAGAWA I, 1991, IEEE T MAGN, V27, P4975, DOI 10.1109/20.278712
   Xiao SG, 2009, ADV MATER, V21, P2516, DOI 10.1002/adma.200802087
   Yuan E, 2004, IEEE T MAGN, V40, P2452, DOI [10.1109/TMAG.2004.829324, 10.1109/TMAG.2004.829342]
NR 12
TC 31
Z9 31
U1 2
U2 11
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JAN
PY 2011
VL 47
IS 1
BP 51
EP 54
DI 10.1109/TMAG.2010.2077274
PN 1
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 701RZ
UT WOS:000285841800008
ER

PT J
AU Ruiz, R
   Dobisz, E
   Albrecht, TR
AF Ruiz, Ricardo
   Dobisz, Elizabeth
   Albrecht, Thomas R.
TI Rectangular Patterns Using Block Copolymer Directed Assembly for High
   Bit Aspect Ratio Patterned Media
SO ACS NANO
LA English
DT Article
DE directed self-assembly; block copolymer; nanofabrication; lithography;
   patterned media
ID DENSITY MULTIPLICATION; CYLINDER MONOLAYERS; THIN-FILMS; LITHOGRAPHY;
   BLENDS; ORDER; DIMENSIONS; TEMPLATES; DISORDER
AB We report a nanofabrication method that combines block copolymer directed assembly with e-beam lithography to achieve highly uniform rectangular patterns with a critical dimension of 16 nm, a full pitch of 27 nm, and arbitrary aspect ratio. This fabrication method enables geometries that are not natural to block. copolymer assembly, preserves both the feature uniformity and the center-to-center spacing of the original block copolymer, sustains long-range translational order, and facilitates high-resolution, high-density patterns through feature density multiplication. These highly uniform arrays of dense rectangular features are particularly attractive for fabricating magnetic bit patterned media with high bit aspect ratio.
C1 [Ruiz, Ricardo; Dobisz, Elizabeth; Albrecht, Thomas R.] Hitachi Global Storage Technol, San Jose Res Ctr, San Jose, CA 95135 USA.
RP Ruiz, R (reprint author), Hitachi Global Storage Technol, San Jose Res Ctr, San Jose, CA 95135 USA.
EM ricardo.ruiz@hitachigst.com
OI Ruiz, Ricardo/0000-0002-1698-4281
CR ALBRECHT T, 2009, NANOSCALE MAGNETIC M
   BATES FS, 1990, ANNU REV PHYS CHEM, V41, P525, DOI 10.1146/annurev.pc.41.100190.002521
   Bita I, 2008, SCIENCE, V321, P939, DOI 10.1126/science.1159352
   Black CT, 2007, IBM J RES DEV, V51, P605
   Cheng JY, 2008, ADV MATER, V20, P3155, DOI 10.1002/adma.200800826
   Cheng JY, 2004, PHYS REV B, V70, DOI 10.1103/PhysRevB.70.064417
   Cheng JY, 2001, ADV MATER, V13, P1174, DOI 10.1002/1521-4095(200108)13:15<1174::AID-ADMA1174>3.0.CO;2-Q
   Chuang VP, 2009, NANO LETT, V9, P4364, DOI 10.1021/nl902646e
   Dobisz EA, 2008, P IEEE, V96, P1836, DOI 10.1109/JPROC.2008.2007600
   Edwards EW, 2007, MACROMOLECULES, V40, P90, DOI 10.1021/ma0607564
   Edwards EW, 2006, J VAC SCI TECHNOL B, V24, P340, DOI 10.1116/1.2151226
   Edwards EW, 2006, MACROMOLECULES, V39, P3598, DOI 10.1021/ma052335c
   Hammond MR, 2006, MACROMOLECULES, V39, P1538, DOI 10.1021/ma051912u
   Hammond MR, 2005, MACROMOLECULES, V38, P6575, DOI 10.1021/ma050479l
   Harrison C, 2002, PHYS REV E, V66, DOI 10.1103/PhysRevE.66.011706
   FRS International Technology Roadmap for Semiconductors, LITHOGRAPHY
   Kang HM, 2009, J VAC SCI TECHNOL B, V27, P2993, DOI 10.1116/1.3256632
   Kang H, 2008, J VAC SCI TECHNOL B, V26, P2495, DOI 10.1116/1.3013336
   Kim SO, 2003, NATURE, V424, P411, DOI 10.1038/nature01775
   Naito K, 2002, IEEE T MAGN, V38, P1949, DOI 10.1109/TMAG.2002.802847
   Ross CA, 2008, MRS BULL, V33, P838, DOI 10.1557/mrs2008.179
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Ruiz R, 2007, ADV MATER, V19, P587, DOI 10.1002/adma.200600287
   Schabes ME, 2008, J MAGN MAGN MATER, V320, P2880, DOI 10.1016/j.jmmm.2008.07.035
   Stoykovich MP, 2007, ACS NANO, V1, P168, DOI 10.1021/nn700164p
   Stoykovich MP, 2005, SCIENCE, V308, P1442, DOI 10.1126/science.1111041
   Tada Y, 2009, POLYMER, V50, P4250, DOI 10.1016/j.polymer.2009.06.039
   Tang CB, 2008, SCIENCE, V322, P429, DOI 10.1126/science.1162950
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Thurn-Albrecht T, 2000, ADV MATER, V12, P787, DOI 10.1002/(SICI)1521-4095(200006)12:11<787::AID-ADMA787>3.0.CO;2-1
   Wan L, 2009, LANGMUIR, V25, P12408, DOI 10.1021/la901648y
   Xiao SG, 2009, ADV MATER, V21, P2516, DOI 10.1002/adma.200802087
   Yang XM, 2009, ACS NANO, V3, P1844, DOI 10.1021/nn900073r
NR 33
TC 70
Z9 70
U1 7
U2 53
PU AMER CHEMICAL SOC
PI WASHINGTON
PA 1155 16TH ST, NW, WASHINGTON, DC 20036 USA
SN 1936-0851
EI 1936-086X
J9 ACS NANO
JI ACS Nano
PD JAN
PY 2011
VL 5
IS 1
BP 79
EP 84
DI 10.1021/nn101561p
PG 6
WC Chemistry, Multidisciplinary; Chemistry, Physical; Nanoscience &
   Nanotechnology; Materials Science, Multidisciplinary
SC Chemistry; Science & Technology - Other Topics; Materials Science
GA 710CA
UT WOS:000286487300010
PM 21182251
ER

PT J
AU Moritz, J
   Arm, C
   Vinai, G
   Gautier, E
   Auffret, S
   Marty, A
   Bayle-Guillemaud, P
   Dieny, B
AF Moritz, Jerome
   Arm, Christophe
   Vinai, Giovanni
   Gautier, Eric
   Auffret, Stephane
   Marty, Alain
   Bayle-Guillemaud, Pascale
   Dieny, Bernard
TI Two-Bit-Per-Dot Patterned Media for Magnetic Storage
SO IEEE MAGNETICS LETTERS
LA English
DT Article
DE Information storage; magnetic recording; patterned media; multilevel
   media; electron holography
AB Bit-patterned recording media are made of arrays of physically separated magnetic nanodots, each nanodot carrying one bit of information. We demonstrate that by stacking perpendicular-to-plane and in-plane magnetized thin films within each magnetic dot, it is possible to obtain a 2-bit-per-dot multilevel magnetic recording system without penalty to the readout signal-to-noise ratio. The stray field above the dots was measured and analyzed by electron holography for different magnetic configurations and compared with numerical simulations. The perpendicular-to-plane magnetized layer mainly influences the stray field above the center of the dots, whereas the in-plane magnetized layer determines the stray field above the gap between dots. The areal density of information can thus be doubled with this media by making an optimum use of the whole area of the medium.
C1 [Moritz, Jerome; Vinai, Giovanni; Gautier, Eric; Auffret, Stephane; Dieny, Bernard] CEA CNRS UJF Grenoble INP, CEA INAC, SPINTEC, F-38054 Grenoble, France.
   [Arm, Christophe; Bayle-Guillemaud, Pascale] CEA Grenoble, INAC LEMMA SP2M, F-38054 Grenoble, France.
   [Marty, Alain] CEA Grenoble, SP2M, CEA UJF, F-38054 Grenoble, France.
RP Moritz, J (reprint author), CEA CNRS UJF Grenoble INP, CEA INAC, SPINTEC, F-38054 Grenoble, France.
EM jerome.moritz@cea.fr
OI Vinai, Giovanni/0000-0003-4882-663X
CR Albrecht M, 2005, J APPL PHYS, V97, DOI 10.1063/1.1904705
   Baltz V, 2005, J MAGN MAGN MATER, V290, P1286, DOI 10.1016/j.jmmm.2004.11.449
   Baltz V, 2009, APPL PHYS LETT, V94, DOI 10.1063/1.3078523
   Bromwich TJ, 2005, J APPL PHYS, V98, DOI 10.1063/1.2011780
   Hu G, 2004, J APPL PHYS, V95, P7013, DOI 10.1063/1.1669343
   Hyndman R, 2001, J APPL PHYS, V90, P3843, DOI 10.1063/1.1401803
   Khizroev S, 2006, J APPL PHYS, V100, DOI 10.1063/1.2338129
   LAMBERT SE, 1991, J APPL PHYS, V69, P4724, DOI 10.1063/1.348260
   Li SJ, 2009, APPL PHYS LETT, V94, DOI 10.1063/1.3133354
   Masseboeuf A, 2009, NANO LETT, V9, P2803, DOI 10.1021/nl900800q
   McCartney MR, 2007, ANNU REV MATER RES, V37, P729, DOI 10.1146/annurev.matsci.37.052506.084219
   McDaniel TW, 2005, J PHYS-CONDENS MAT, V17, pR315, DOI 10.1088/0953-8984/17/7/R01
   Moritz J, 2004, APPL PHYS LETT, V84, P1519, DOI 10.1063/1.1644341
   Piramanayagam SN, 2009, J MAGN MAGN MATER, V321, P485, DOI 10.1016/j.jmmm.2008.05.007
   Rhodes P., 1954, Proceedings of the Leeds Philosophical and Literary Society, V6, P191
   Rottmayer RE, 2006, IEEE T MAGN, V42, P2417, DOI 10.1109/TMAG.2006.879572
   Snoeck E, 2003, APPL PHYS LETT, V82, P88, DOI 10.1063/1.1532754
   Terris BD, 2009, J MAGN MAGN MATER, V321, P512, DOI 10.1016/j.jmmm.2008.05.046
NR 18
TC 2
Z9 2
U1 0
U2 4
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 1949-307X
J9 IEEE MAGN LETT
JI IEEE Magn. Lett.
PY 2011
VL 2
AR 4500104
DI 10.1109/LMAG.2010.2098852
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA V31VE
UT WOS:000208910300009
ER

PT J
AU Lubarda, MV
   Li, S
   Livshitz, B
   Fullerton, EE
   Lomakin, V
AF Lubarda, M. V.
   Li, S.
   Livshitz, B.
   Fullerton, E. E.
   Lomakin, V.
TI Reversal in Bit Patterned Media With Vertical and Lateral Exchange
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT 21st Magnetic Recording Conference (TMRC 2010)
CY AUG 16-18, 2010
CL Univ California, San Diego, CA
HO Univ California
DE Magnetic recording; magnetization reversal; magnetic thermal factors
ID COMPOSITE MEDIA; FUTURE; SYSTEMS; STORAGE
AB The extent to which dipolar interactions affect switching field distributions and thermal stability, and subsequently system performance, depends closely on the areal density, materials properties, and the architecture of the media, as well as the recording scheme and field profiles. This paper assesses, via micromagnetic simulations, the potential of heterogeneous capped bit patterned media and other proposed patterned media designs for ultra-high-density magnetic recording with respect to writability, switching field distributions, and thermal stability at different areal densities. Such media is comprised of an array of homogeneous or exchange coupled composite elements with vertical anisotropy that is ferromagnetically or antiferromagnetically coupled to a continuous horizontal layer. It is shown that such systems, characterized by lateral and vertical exchange, enable ultra-high-density recording at low switching fields while ensuring high thermal stability and low switching field distributions. Mechanisms leading to improved performance in capped systems are investigated. Structural and material considerations are provided for all media models.
C1 [Lubarda, M. V.; Li, S.; Livshitz, B.; Fullerton, E. E.; Lomakin, V.] Univ Calif San Diego, Dept Elect & Comp Engn, Ctr Magnet Recording Res, San Diego, CA 92093 USA.
RP Lomakin, V (reprint author), Univ Calif San Diego, Dept Elect & Comp Engn, Ctr Magnet Recording Res, San Diego, CA 92093 USA.
EM vitaliy@ece.ucsd.edu
RI Livshitz, Boris/G-3442-2011; Li, Shaojing/D-8003-2012; Fullerton,
   Eric/H-8445-2013
OI Fullerton, Eric/0000-0002-4725-9509
CR Albrecht M, 2002, APPL PHYS LETT, V81, P2875, DOI 10.1063/1.1512946
   Bertram HN, 1999, J APPL PHYS, V85, P4991, DOI 10.1063/1.370068
   Challener WA, 2009, NAT PHOTONICS, V3, P220, DOI 10.1038/NPHOTON.2009.26
   Chappert C, 1998, SCIENCE, V280, P1919, DOI 10.1126/science.280.5371.1919
   CHOU SY, 1994, J VAC SCI TECHNOL B, V12, P3695, DOI 10.1116/1.587642
   Dittrich R, 2002, J MAGN MAGN MATER, V250, pL12
   Dittrich R., 2003, J APPL PHYS, V93
   Dobin AY, 2007, J APPL PHYS, V101, DOI 10.1063/1.2714271
   Dobisz EA, 2008, P IEEE, V96, P1836, DOI 10.1109/JPROC.2008.2007600
   Fullerton EE, 1998, PHYS REV B, V58, P12193, DOI 10.1103/PhysRevB.58.12193
   Fullerton EE, 1999, J MAGN MAGN MATER, V200, P392, DOI 10.1016/S0304-8853(99)00376-5
   Goll D, 2008, APPL PHYS LETT, V93, DOI 10.1063/1.3001589
   Jang HJ, 2005, APPL PHYS LETT, V86, P23102, DOI 10.1063/1.1846150
   Krone P, 2010, APPL PHYS LETT, V97, DOI 10.1063/1.3481668
   Lee J, 2007, J MAGN MAGN MATER, V319, P5, DOI 10.1016/j.jmmm.2007.04.019
   Li SJ, 2009, J APPL PHYS, V105, DOI 10.1063/1.3076140
   Livshitz B, 2009, J APPL PHYS, V105, DOI 10.1063/1.3072442
   Livshitz B, 2007, APPL PHYS LETT, V91, DOI 10.1063/1.2801362
   Lomakin V, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2831732
   Lubarda M. V., 2010, APPL PHYS LETT UNPUB
   Matsumoto T, 2008, APPL PHYS LETT, V93, DOI 10.1063/1.2960344
   Moser A, 2003, PHYS REV LETT, V91, DOI 10.1103/PhysRevLett.91.097203
   Moser A, 2002, J PHYS D APPL PHYS, V35, pR157, DOI 10.1088/0022-3727/35/19/201
   PARKIN SSP, 1990, PHYS REV LETT, V64, P2304, DOI 10.1103/PhysRevLett.64.2304
   Qin G. W., 2010, MATER SCI FORUM, V638-642, P6
   Repain V, 2004, J APPL PHYS, V95, P2614, DOI 10.1063/1.1645973
   Richter HJ, 2007, J PHYS D APPL PHYS, V40, pR149, DOI 10.1088/0022-3727/40/9/R01
   Sasano J, 2010, NANOSTRUCT SCI TECHN, P133, DOI 10.1007/978-1-4419-1424-8_10
   Schabes ME, 2008, J MAGN MAGN MATER, V320, P2880, DOI 10.1016/j.jmmm.2008.07.035
   Scholz W, 2003, COMP MATER SCI, V28, P366, DOI 10.1016/S0927-0256(03)00119-8
   Schrefl T., FEMME
   SHARROCK MP, 1981, IEEE T MAGN, V17, P3020, DOI 10.1109/TMAG.1981.1061755
   Shiroishi Y, 2009, IEEE T MAGN, V45, P3816, DOI 10.1109/TMAG.2009.2024879
   Skorvanek I., 1987, PHYS STAT SOL A, V99
   Stanescu D, 2008, J APPL PHYS, V103, DOI 10.1063/1.2838228
   Suess D, 2002, J MAGN MAGN MATER, V248, P298, DOI 10.1016/S0304-8853(02)00341-4
   Suess D, 2005, APPL PHYS LETT, V87, DOI 10.1063/1.1951053
   Terris BD, 2007, MICROSYST TECHNOL, V13, P189, DOI 10.1007/s00542-006-0144-9
   Victora RH, 2008, P IEEE, V96, P1799, DOI 10.1109/JPROC.2008.2004314
   Victora RH, 2005, IEEE T MAGN, V41, P537, DOI 10.1109/TMAG.2004.838075
   Weller D, 1999, IEEE T MAGN, V35, P4423, DOI 10.1109/20.809134
   Albrecht T. R., 2009, U.S. Patent, Patent No. 0169731
NR 42
TC 9
Z9 9
U1 0
U2 4
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JAN
PY 2011
VL 47
IS 1
BP 18
EP 25
DI 10.1109/TMAG.2010.2089610
PN 1
PG 8
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 701RZ
UT WOS:000285841800004
ER

PT J
AU Muraoka, H
   Greaves, SJ
AF Muraoka, Hiroaki
   Greaves, Simon John
TI Statistical Modeling of Write Error Rates in Bit Patterned Media for 10
   Tb/in(2) Recording
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT 21st Magnetic Recording Conference (TMRC 2010)
CY AUG 16-18, 2010
CL Univ California, San Diego, CA
HO Univ California
DE Binomial probability distribution; bit patterned media; head field
   gradient; switching field distribution; temperature assisted magnetic
   recording; write error
ID MAGNETIC-PROPERTIES; FILMS; HEAD
AB A crucial issue for bit patterned media recording is write-errors. This is an essential concern for media whose individual bits are represented by single switching units (dots) due to the insufficient writing field gradient at high areal densities. In this paper a statistical approach to clarify the write error rate for a system with a switching field distribution and a head field gradient is established using binomial distribution modeling. Then, two approaches to reduce the write error rate are presented. The first is multi-dot recording with a bit patterned structure, in which the error rate is reduced due to the averaging effect of recording on several dots. The switching field distribution can also be reduced if exchange coupling is introduced between the dots. The second possible approach is the combination of bit patterned media and temperature gradient recording. This effectively improves the writing gradient. The minimum bit length and achievable areal density is estimated taking into account the switching field distribution and writing field gradient. Index Terms-Binomial probability distribution, bit patterned media, head field gradient, switching field distribution and writing field gradient.
C1 [Muraoka, Hiroaki; Greaves, Simon John] Tohoku Univ, RIEC, Sendai, Miyagi 9808577, Japan.
RP Muraoka, H (reprint author), Tohoku Univ, RIEC, Sendai, Miyagi 9808577, Japan.
EM muraoka@riec.tohoku.ac.jp
CR Akagi F, 2007, J APPL PHYS, V101, DOI 10.1063/1.2710546
   Albrecht M, 2002, APPL PHYS LETT, V80, P3409, DOI 10.1063/1.1476062
   Ash C., 1993, PROBABILITY TUTORING, P135
   Chikazumi S., 1997, PHYS FERROMAGNETISM, P120
   Greaves SJ, 2001, J MAGN MAGN MATER, V235, P418, DOI 10.1016/S0304-8853(01)00400-0
   Hughes GF, 1999, IEEE T MAGN, V35, P2310, DOI 10.1109/20.800809
   Inaba N, 2000, IEEE T MAGN, V36, P54, DOI 10.1109/20.824425
   Li SJ, 2009, J APPL PHYS, V105, DOI 10.1063/1.3076140
   MALLINSON JC, 1991, IEEE T MAGN, V27, P3519, DOI 10.1109/20.102923
   Muraoka Hiroaki, 2008, IEEE Transactions on Magnetics, V44, P3423, DOI 10.1109/TMAG.2008.2001654
   Muraoka H, 1996, IEEE T MAGN, V32, P3926, DOI 10.1109/20.539219
   Rausch T, 2004, IEEE T MAGN, V40, P137, DOI 10.1109/TMAG.2003.821569
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Schabes ME, 2008, J MAGN MAGN MATER, V320, P2880, DOI 10.1016/j.jmmm.2008.07.035
   Sonobe Y, 2001, J MAGN MAGN MATER, V235, P424, DOI 10.1016/S0304-8853(01)00401-2
   Stipe B. C., 2010, PMRC 2010, V2010, p18pA
   Terris BD, 2005, IEEE T MAGN, V41, P2822, DOI 10.1109/TMAG.2005.855264
   Thiele JU, 2002, J APPL PHYS, V91, P6595, DOI 10.1063/1.1470254
   TSANG C, 1991, IEEE T MAGN, V27, P795, DOI 10.1109/20.133294
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
   Yamakawa K, 2010, IEEE T MAGN, V46, P730, DOI 10.1109/TMAG.2009.2036587
NR 21
TC 11
Z9 11
U1 0
U2 2
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JAN
PY 2011
VL 47
IS 1
BP 26
EP 34
DI 10.1109/TMAG.2010.2080354
PN 1
PG 9
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 701RZ
UT WOS:000285841800005
ER

PT J
AU Iyengar, AR
   Siegel, PH
   Wolf, JK
AF Iyengar, Aravind Raghava
   Siegel, Paul H.
   Wolf, Jack Keil
TI Write Channel Model for Bit-Patterned Media Recording
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article; Proceedings Paper
CT 21st Magnetic Recording Conference (TMRC 2010)
CY AUG 16-18, 2010
CL Univ California, San Diego, CA
HO Univ California
DE Bit-patterned media; channel capacity; high-density magnetic recording;
   Markov-1 rate; symmetric information rate; zero-error capacity
ID INTERSYMBOL INTERFERENCE; DELETION CHANNEL; CAPACITY; BOUNDS;
   TRANSMISSION; RATES
AB We propose a new write channel model for bit-patterned media recording that reflects the data dependence of write synchronization errors. It is shown that this model accommodates both substitution-like errors and insertion-deletion errors whose statistics are determined by an underlying channel state process. We study information theoretic properties of the write channel model, including the capacity, symmetric information rate, Markov-1 rate, and the zero-error capacity.
C1 [Iyengar, Aravind Raghava] Univ Calif San Diego, Dept Elect & Comp Engn, La Jolla, CA 92093 USA.
   Univ Calif San Diego, Ctr Magnet Recording Res, La Jolla, CA 92093 USA.
RP Iyengar, AR (reprint author), Univ Calif San Diego, Dept Elect & Comp Engn, La Jolla, CA 92093 USA.
EM aravind@ucsd.edu
CR BAHL LR, 1974, IEEE T INFORM THEORY, V20, P284, DOI 10.1109/TIT.1974.1055186
   Cover TM, 2006, ELEMENTS INFORM THEO
   Diggavi S, 2006, IEEE T INFORM THEORY, V52, P1226, DOI 10.1109/TIT.2005.864445
   Diggavi S., 2001, P 39 ANN ALL C COMM, P573
   Diggavi S, 2007, 2007 IEEE INTERNATIONAL SYMPOSIUM ON INFORMATION THEORY PROCEEDINGS, VOLS 1-7, P1716, DOI 10.1109/ISIT.2007.4557469
   Drinea E, 2006, IEEE T INFORM THEORY, V52, P4648, DOI 10.1109/TIT.2006.881832
   Fertonani D, 2010, IEEE T INFORM THEORY, V56, P2753, DOI 10.1109/TIT.2010.2046210
   Gallager R., 1968, INFORM THEORY RELIAB
   Hu J, 2007, IEEE T MAGN, V43, P3517, DOI 10.1109/TMAG.2007.898307
   Hu J, 2010, IEEE T COMMUN, V58, P1102, DOI 10.1109/TCOMM.2010.04.080683
   Immink K. A. S., 1999, CODES MASS DATA STOR
   Iyengar AR, 2010, IEEE INT SYMP INFO, P958, DOI 10.1109/ISIT.2010.5513433
   Iyengar AR, 2009, ANN ALLERTON CONF, P620, DOI 10.1109/ALLERTON.2009.5394916
   KABAL P, 1975, IEEE T COMMUN, V23, P921, DOI 10.1109/TCOM.1975.1092918
   Kavcic A., 2001, P IEEE GLOB COMM C G, V5, P2997
   Kirsch A, 2010, IEEE T INFORM THEORY, V56, P86, DOI 10.1109/TIT.2009.2034883
   KOBAYASHI H, 1971, IEEE T COMMUN TECHN, VCO19, P1087, DOI 10.1109/TCOM.1971.1090770
   Livshitz B, 2009, IEEE T MAGN, V45, P3519, DOI 10.1109/TMAG.2009.2022501
   Mazumdar A, 2010, IEEE INT SYMP INFO, P978, DOI 10.1109/ISIT.2010.5513783
   Mitzenmacher M, 2008, IEEE T INFORM THEORY, V54, P72, DOI 10.1109/TIT.2007.911291
   Mitzenmacher M, 2006, IEEE T INFORM THEORY, V52, P4657, DOI 10.1109/TIT.2006.881844
   Papoulis A., 1991, PROBABILITY RANDOM V
   Richardson T. J., 2008, MODERN CODING THEORY
   SHANNON CE, 1956, IRE T INFORM THEOR, V2, P8, DOI 10.1109/TIT.1956.1056798
   Soriaga JB, 2007, IEEE T INFORM THEORY, V53, P1416, DOI 10.1109/TIT.2007.892778
   Vontobel PO, 2008, IEEE T INFORM THEORY, V54, P1887, DOI [10.1109/TIT.2008.920243, 10.1109/TIT.2008.926243]
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
   Wood R, 2009, IEEE T MAGN, V45, P917, DOI 10.1109/TMAG.2008.2010676
NR 28
TC 29
Z9 29
U1 0
U2 3
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JAN
PY 2011
VL 47
IS 1
BP 35
EP 45
DI 10.1109/TMAG.2010.2080667
PN 1
PG 11
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 701RZ
UT WOS:000285841800006
ER

PT J
AU Yao, J
   Teh, KC
   Li, KH
AF Yao, Jun
   Teh, Kah Chan
   Li, Kwok Hung
TI Reduced-State Bahl-Cocke-Jalinek-Raviv Detector for Patterned Media
   Storage
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE BCJR detector; "multiple islands per read head"; patterned media
ID CHANNELS; CODES
AB Bit-patterned media (BPM) is a promising candidate for future high-capacity magnetic storage. The inter-track interference (ITI) in BPM has been taken into account by the "multiple islands per read head" model. However, the complexity of the symbol-based detection for this model is too high for practical use. To reduce complexity, we propose to use the reduced-state Bahl-Cocke-Jelinek-Raviv (BCJR) detection algorithm for such a two-dimensional model. We compare the computational complexity of the proposed reduced-state detector to that of the full-state BCJR detector. Simulation results show that the proposed reduced-state BCJR detector can approach the optimal performance by 0.5 dB while significantly reducing the detector
C1 [Yao, Jun; Teh, Kah Chan; Li, Kwok Hung] Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore.
RP Teh, KC (reprint author), Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore.
EM EKCTeh@ntu.edu.sg
RI Teh, Kah Chan/A-5093-2011; Li,  Kwok Hung/A-5102-2011
CR Colavolpe G, 2001, IEEE J SEL AREA COMM, V19, P848, DOI 10.1109/49.924869
   HUGHES GF, 2002, INT 2002
   Karakulak S, 2008, IEEE T MAGN, V44, P193, DOI 10.1109/TMAG.2007.912837
   Keskinoz M, 2008, IEEE T MAGN, V44, P533, DOI 10.1109/TMAG.2007.914966
   Keskinoz M, 2008, IEEE T MAGN, V44, P3793, DOI 10.1109/TMAG.2008.2002378
   Liu XC, 2009, IEEE T MAGN, V45, P3745, DOI 10.1109/TMAG.2009.2022333
   Mittelholzer T, 2001, IEEE T MAGN, V37, P721, DOI 10.1109/20.917607
   Nabavi S, 2007, IEEE ICC, P6249, DOI 10.1109/ICC.2007.1035
   ROBERTSON P, 1995, ICC '95 - 1995 IEEE INTERNATIONAL CONFERENCE ON COMMUNICATIONS, CONFERENCE RECORD, VOLS 1-3, P1009, DOI 10.1109/ICC.1995.524253
   Tan WJ, 2005, IEEE T MAGN, V41, P730, DOI 10.1109/TMAG.2004.839064
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
NR 11
TC 4
Z9 4
U1 0
U2 2
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD DEC
PY 2010
VL 46
IS 12
BP 4108
EP 4110
DI 10.1109/TMAG.2010.2077307
PG 3
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 688IG
UT WOS:000284842400020
ER

PT J
AU Krone, P
   Makarov, D
   Albrecht, M
   Schrefl, T
   Suess, D
AF Krone, P.
   Makarov, D.
   Albrecht, M.
   Schrefl, T.
   Suess, D.
TI Magnetization reversal processes of single nanomagnets and their energy
   barrier
SO JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
LA English
DT Article
DE Micromagnetism; Bit patterned media; Magnetization reversal; Energy
   barrier of magnetization reversal
ID RECORDING MEDIA; ANISOTROPY; LIMITS
AB Micromagnetic simulations were performed to investigate the influence of geometry and magnetic anisotropy constant on energy barrier and magnetization reversal mechanism of individual bits important for the bit patterned media concept in magnetic data storage. It is shown that dependency of the energy barrier on magnetic and geometric properties of bits can be described by an analytical approach in the case of quasi-coherent magnetization rotation process. However, when the bit size exceeds a critical size, for which an incoherent magnetization reversal is preferred, the analytical approach becomes invalid and no self-consistent theory is available. By systematically investigating the influence of bit size on the magnetization reversal mode, it was found that the transition from quasi-coherent to incoherent magnetization reversal mode can still be described analytically if an activation volume is considered instead of the bit volume. In this case, the nucleation volume is an important parameter determining thermal stability of the bit. If the volume of the bit is larger than twice the activation volume, the energy barrier stays nearly constant; with further increase in bit size, no gain in thermal stability can be achieved (C) 2010 Elsevier B.V. All rights reserved.
C1 [Krone, P.; Makarov, D.; Albrecht, M.] Tech Univ Chemnitz, Inst Phys, Chemnitz, Germany.
   [Schrefl, T.] St Polten Univ Appl Sci, A-3100 St Polten, Austria.
   [Suess, D.] Vienna Univ Technol, Inst Solid State Phys, A-1040 Vienna, Austria.
RP Krone, P (reprint author), Tech Univ Chemnitz, Inst Phys, Chemnitz, Germany.
EM philipp.krone@physik.tu-chemnitz.de
RI Makarov, Denys/G-1025-2011; Suess, Dieter/H-7475-2012
OI Suess, Dieter/0000-0001-5453-9974
CR Aharoni A., 1996, INTRO THEORY FERROMA
   Blundell S., 2001, OXFORD MASTER SERIES
   Dittrich R., 2002, J MAGN MAGN MATER, V250, P12, DOI 10.1016/S0304-8853(02)00388-8
   Farrow RFC, 1996, J APPL PHYS, V79, P5967, DOI 10.1063/1.362122
   Henkelman G, 2000, J CHEM PHYS, V113, P9901, DOI 10.1063/1.1329672
   Kronmuller H, 2003, MICROMAGNETISM MICRO
   Piramanayagam SN, 2007, J APPL PHYS, V102, DOI 10.1063/1.2750414
   Piramanayagam SN, 2009, J MAGN MAGN MATER, V321, P485, DOI 10.1016/j.jmmm.2008.05.007
   Rave W, 1998, J MAGN MAGN MATER, V190, P332, DOI 10.1016/S0304-8853(98)00328-X
   Richter HJ, 2009, J MAGN MAGN MATER, V321, P467, DOI 10.1016/j.jmmm.2008.04.161
   SATO M, 1989, J APPL PHYS, V66, P983, DOI 10.1063/1.343481
   Schrefl T, 2005, IEEE T MAGN, V41, P3064, DOI 10.1109/TMAG.2005.855227
   Terris BD, 2009, J MAGN MAGN MATER, V321, P512, DOI 10.1016/j.jmmm.2008.05.046
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Weller D, 1999, IEEE T MAGN, V35, P4423, DOI 10.1109/20.809134
   Weller D, 2000, IEEE T MAGN, V36, P10, DOI 10.1109/20.824418
NR 16
TC 12
Z9 12
U1 1
U2 13
PU ELSEVIER SCIENCE BV
PI AMSTERDAM
PA PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
SN 0304-8853
J9 J MAGN MAGN MATER
JI J. Magn. Magn. Mater.
PD DEC
PY 2010
VL 322
IS 23
BP 3771
EP 3776
DI 10.1016/j.jmmm.2010.07.041
PG 6
WC Materials Science, Multidisciplinary; Physics, Condensed Matter
SC Materials Science; Physics
GA 644TJ
UT WOS:000281403900008
ER

PT J
AU Ouchi, T
   Arikawa, Y
   Konishi, Y
   Homma, T
AF Ouchi, Takanari
   Arikawa, Yuki
   Konishi, Yohei
   Homma, Takayuki
TI Fabrication of magnetic nanodot array using electrochemical deposition
   processes
SO ELECTROCHIMICA ACTA
LA English
DT Article; Proceedings Paper
CT 60th Annual Meeting of ISE
CY AUG 16-21, 2009
CL Peking Univ, Beijing, PEOPLES R CHINA
HO Peking Univ
DE Electrodeposition; Nanodot arrays; Nanoimprint lithography; Bit
   patterned media; CoPt alloy
ID PATTERNED MEDIA; ELECTRODEPOSITION; COPT; FILMS; GBIT/IN(2); ALUMINA;
   STORAGE
AB We investigated fabrication processes of magnetic nanodot arrays for the ultra-high density magnetic recording media by using an electrodeposition A CoZrNb underlayer was sputter-deposited on a glass disk substrate as a soft magnetic underlayer (SUL) Nano-patterns were formed on the substrate by UV-nanoimprint lithography (UV-NIL) and CoPt was electrodeposited into the nano-patterns For obtaining uniform CoPt nanodot arrays with high perpendicular coercivities we applied thin Cu intermediate layer on CoZrNb SUL and minimized its thickness As a result we obtained CoPt nanodot arrays with 150-nm diameter 300-nm pitches and 20-nm heights which have uniform structures on the substrates with the construction of Cu (1-2 nm)/CoZrNb (100 nm)/Cr (5 nm)/glass disk The perpendicular coercivity of the CoPt nanodot arrays was as high as 5 4 kOe From these results we showed that the Cu intermediate layer with even 1-2 nm thick considerably improved the deposition condition on the substrates with CoZrNb SUL to successfully fabricate CoPt nanodot arrays with the diameter and pitches of 80 nm and 160 nm with sufficient uniformity (C) 2010 Elsevier Ltd All rights reserved
C1 [Ouchi, Takanari; Arikawa, Yuki; Konishi, Yohei; Homma, Takayuki] Waseda Univ, Dept Appl Chem, Shinjuku Ku, Tokyo 1698555, Japan.
RP Homma, T (reprint author), Waseda Univ, Dept Appl Chem, Shinjuku Ku, Tokyo 1698555, Japan.
CR Aniya M, 2009, IEEE T MAGN, V45, P3539, DOI 10.1109/TMAG.2009.2023868
   Aoyama T, 2001, J MAGN MAGN MATER, V235, P174, DOI 10.1016/S0304-8853(01)00332-8
   Chappert C, 1998, SCIENCE, V280, P1919, DOI 10.1126/science.280.5371.1919
   Cheng JY, 2004, PHYS REV B, V70, DOI 10.1103/PhysRevB.70.064417
   Farhoud M, 1998, IEEE T MAGN, V34, P1087, DOI 10.1109/20.706365
   Gapin AI, 2006, J APPL PHYS, V99, DOI 10.1063/1.2163289
   Homma T, 2000, J ELECTROCHEM SOC, V147, P4138, DOI 10.1149/1.1394031
   Homma T., 2001, HYOMENKAGAKU, V22, P350, DOI 10.1380/jsssj.22.350
   Huang YH, 2002, J APPL PHYS, V91, P6869, DOI 10.1063/1.1447524
   Kamata Y, 2007, JPN J APPL PHYS 1, V46, P999, DOI 10.1143/JJAP.46.999
   Kato T, 2009, J APPL PHYS, V105, DOI 10.1063/1.3072024
   Kawaji J, 2005, J MAGN MAGN MATER, V287, P245, DOI 10.1016/j.jmmm.2004.10.040
   Oshima H, 2007, APPL PHYS LETT, V91, DOI 10.1063/1.2757118
   Ouchi T., 2009, ECS T, V16, P57
   Ouchi T, 2008, J MAGN MAGN MATER, V320, P3104, DOI 10.1016/j.jmmm.2008.08.022
   Pattanaik G, 2006, APPL PHYS LETT, V89, DOI 10.1063/1.2339070
   Rettner CT, 2001, IEEE T MAGN, V37, P1649, DOI 10.1109/20.950927
   Richter HJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2209179
   Ross CA, 1999, J VAC SCI TECHNOL B, V17, P3168, DOI 10.1116/1.590974
   Shiroishi Y, 2009, IEEE T MAGN, V45, P3816, DOI 10.1109/TMAG.2009.2024879
   Sohn JS, 2009, NANOTECHNOLOGY, V20, DOI 10.1088/0957-4484/20/2/025302
   Sun M, 2001, APPL PHYS LETT, V78, P2964, DOI 10.1063/1.1370986
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
   Yasui K, 2005, JPN J APPL PHYS 2, V44, pL469, DOI [10.1143/JJAP.44.L469, 10.1143/JJAP.44.L496]
   Yasui N, 2003, APPL PHYS LETT, V83, P3347, DOI 10.1063/1.1622787
   Zana I, 2003, ELECTROCHEM SOLID ST, V6, pC153, DOI 10.1149/1.1619648
NR 26
TC 11
Z9 11
U1 0
U2 18
PU PERGAMON-ELSEVIER SCIENCE LTD
PI OXFORD
PA THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD OX5 1GB, ENGLAND
SN 0013-4686
EI 1873-3859
J9 ELECTROCHIM ACTA
JI Electrochim. Acta
PD NOV 30
PY 2010
VL 55
IS 27
SI SI
BP 8081
EP 8086
DI 10.1016/j.electacta.2010.02.073
PG 6
WC Electrochemistry
SC Electrochemistry
GA 682WW
UT WOS:000284434700044
ER

PT J
AU Chang, W
   Cruz, JR
AF Chang, Wu
   Cruz, J. R.
TI Inter-Track Interference Mitigation for Bit-Patterned Magnetic Recording
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Bit-patterned magnetic recording; channel detection; inter-track
   interference; two-dimensional PR targets
ID MEDIA STORAGE; ERROR RATE; CHANNELS; SIGNAL; PERFORMANCE; NOISE
AB In bit-patterned magnetic recording (BPMR), inter-track interference (ITI) becomes a major impairment due to the small track pitch. One way to mitigate the ITI is to equalize the read channel to a two dimensional (2D) partial-response (PR) target. However, we find that the channel detection on the center track cannot take advantage of the 2D target without good estimation of the data on the sidetracks. Therefore, we propose a multi-track detection technique, where the detection on the center track is aided by the information obtained from the detection of the sidetracks. This technique works with any equalizer capable of equalizing the channel to a 2D target. We apply this method to joint-track equalized and 2D equalized BPMR channels. Our simulation results show that the proposed technique provides a significant performance improvement.
C1 [Chang, Wu; Cruz, J. R.] Univ Oklahoma, Sch Elect & Comp Engn, Norman, OK 73019 USA.
RP Cruz, JR (reprint author), Univ Oklahoma, Sch Elect & Comp Engn, Norman, OK 73019 USA.
EM jcruz@ou.edu
CR BAHL LR, 1974, IEEE T INFORM THEORY, V20, P284, DOI 10.1109/TIT.1974.1055186
   BARBOSA LC, 1990, IEEE T MAGN, V26, P2163, DOI 10.1109/20.104655
   Conway T, 2005, IEEE T MAGN, V41, P1333, DOI 10.1109/TMAG.2005.845394
   Hu J, 2008, EURASIP J ADV SIG PR, DOI 10.1155/2008/738281
   Keskinoz M, 2008, IEEE T MAGN, V44, P533, DOI 10.1109/TMAG.2007.914966
   Kovintavewat P, 2002, IEEE T MAGN, V38, P2340, DOI 10.1109/TMAG.2002.801899
   Kurtas E, 1999, IEEE T MAGN, V35, P2187, DOI 10.1109/20.774192
   Lai KH, 2008, JPN J APPL PHYS, V47, P5997, DOI 10.1143/JJAP.47.5997
   Marrow M, 2003, 2003 IEEE INFORMATION THEORY WORKSHOP, PROCEEDINGS, P131, DOI 10.1109/ITW.2003.1216712
   MOON JY, 1995, IEEE T MAGN, V31, P1083, DOI 10.1109/20.364789
   Myint LMM, 2009, IEEE T MAGN, V45, P3691, DOI 10.1109/TMAG.2009.2022638
   Nabavi S., 2008, THESIS CARNEGIE MELL
   NABAVI S, 2007, P IEEE INT C COMM IC, P6249
   Nabavi S, 2008, IEEE T MAGN, V44, P3789, DOI 10.1109/TMAG.2008.2002387
   Nutter PW, 2005, IEEE T MAGN, V41, P3214, DOI 10.1109/TMAG.2005.854780
   Nutter PW, 2005, IEEE T MAGN, V41, P4327, DOI 10.1109/TMAG.2005.856586
   Nutter PW, 2004, IEEE T MAGN, V40, P3551, DOI 10.1109/TMAG.2004.835697
   Soljanin E, 1998, IEEE T INFORM THEORY, V44, P2988, DOI 10.1109/18.737527
   Tan WJ, 2005, IEEE T MAGN, V41, P730, DOI 10.1109/TMAG.2004.839064
   Tan WJ, 2005, J MAGN MAGN MATER, V287, P397, DOI 10.1016/j.jmmm.2004.10.066
   VOOIS PA, 1994, IEEE T MAGN, V30, P5100, DOI 10.1109/20.334301
NR 21
TC 29
Z9 29
U1 0
U2 5
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD NOV
PY 2010
VL 46
IS 11
BP 3899
EP 3908
DI 10.1109/TMAG.2010.2056926
PG 10
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 670TR
UT WOS:000283450700010
ER

PT J
AU Hopmann, DN
   Stromback, J
AF Hopmann, David Nicolas
   Stromback, Jesper
TI The rise of the media punditocracy? Journalists and media pundits in
   Danish election news 1994-2007
SO MEDIA CULTURE & SOCIETY
LA English
DT Article
DE commercialization; election campaigns; interpretive journalism; media
   pundits; news coverage; public service
ID POLITICAL COMMUNICATION; SOUND BITE; COVERAGE; MEDIATIZATION; GERMANY
AB In the literature on changes in political journalism, it is often claimed that journalists and media pundits have become more prominent in the media's political news coverage. At the same time, politicians allegedly receive less attention and are more often depicted either positively or negatively instead of neutrally. It has also been claimed that those commenting on politicians' actions in the news are predominantly conservative. Based on data from a content analysis of thousands of news stories from all five Danish national elections since 1994, this study investigates whether the assumed changes have indeed taken place. Among other things, the results show that journalists and media pundits today appear more often on camera and that media pundits more often than not are right-rather than left-wing. However, these and other trends are not unidirectional, suggesting more complex patterns than is often assumed.
C1 [Hopmann, David Nicolas] Univ So Denmark, Dept Polit Sci, DK-5230 Odense M, Denmark.
   [Stromback, Jesper] Mid Sweden Univ, Dept Media & Commun, S-85170 Sundsvall, Sweden.
RP Hopmann, DN (reprint author), Univ So Denmark, Dept Polit Sci, Campusvej 55, DK-5230 Odense M, Denmark.
EM dnh@sam.sdu.dk; jesper@jesperstromback.com
CR Albaek E, 2003, JOURNALISM MASS COMM, V80, P937
   Alterman E., 2003, WHAT LIBERAL MEDIA T
   Altheide D., 1979, MEDIA LOGIC
   Asp K, 1995, KOMMERSIALISERADE TV
   BINDERKRANTZ A, 2008, 15 NOPSA C U TROMS 6
   Blumler JG, 1997, POLIT COMMUN, V14, P395, DOI 10.1080/105846097199191
   Blumler JG, 1999, POLIT COMMUN, V16, P209, DOI 10.1080/105846099198596
   Blumler J. G., 2001, MEDIATED POLITICS CO, P380
   Blumler Jay G., 1995, CRISIS PUBLIC COMMUN
   BOURNE S, 2008, POL MED C U MELB 12
   Brants K, 2006, JAVNOST-PUBLIC, V13, P25
   Brants K, 1998, EUR J COMMUN, V13, P315, DOI 10.1177/0267323198013003002
   Claudi N., 2006, POLITIKEN, V1
   Djerf-Pierre Monika, 2001, SPEGLA GRANSKA TOLKA
   Djerf-Pierre Monica, 2000, JOURNALISM STUD, V1, P239, DOI DOI 10.1080/14616700050028235
   Elmelund-Praestekaer C., 2008, TEFLON BULLSHIT TI M
   Esser F, 2003, AM BEHAV SCI, V46, P617, DOI 10.1177/0002764202238489
   Esser F, 2008, INT J PRESS/POLIT, V13, P401, DOI 10.1177/1940161208323691
   FARNSWORTH STEPHEN J., 2007, NIGHTLY NEWS NIGHTMA
   Fournier P, 2004, ELECT STUD, V23, P661, DOI 10.1016/j.electstud.2003.09.001
   Gunter B., 1997, MEASURING BIAS TELEV
   HALLIN DC, 1992, J COMMUN, V42, P5, DOI 10.1111/j.1460-2466.1992.tb00775.x
   Hallin D. C., 2004, COMP MEDIA SYSTEMS 3
   Hamilton JT, 2004, ALL THE NEWS THAT'S FIT TO SELL: HOW THE MARKET TRANSFORMS INFORMATION INTO NEWS, P1
   [Anonymous], 2007, JOURNALISTICA, V5, P27
   Hjarvard S., 2006, DANSK TVS HIST, P105
   Holm H., 2008, NAR NYHEDER BLIVER T
   HOLM HH, 2007, DR TV2 FOLKETS TJENE, P69
   HOPMANN DN, 2009, THESIS U SO DENMARK
   HOPMANN DN, 2008, 15 NOPSA C U TROMS 6
   HORSBOL ANDERS, 2010, J LANG POLIT, V9, P22
   Kahn KF, 2002, AM POLIT SCI REV, V96, P381
   Mazzoleni G, 1999, POLIT COMMUN, V16, P247, DOI 10.1080/105846099198613
   Mazzoleni G., 1987, EUROPEAN J COMMUNICA, V2, P81, DOI DOI 10.1177/0267323187002001005
   McManus J. H., 1994, MARKET DRIVEN JOURNA
   McNair B, 2000, JOURNALISM DEMOCRACY
   Meyer T, 2002, MEDIA DEMOCRACY MEDI
   Negrine R, 2008, TRANSFORMATION POLIT
   Neveu E., 2002, POLITICAL JOURNALISM, P22
   Nimmo D., 1992, POLITICAL PUNDITS
   Patterson TE, 1997, POLIT COMMUN, V14, P445, DOI 10.1080/105846097199245
   Patterson Thomas E, 1993, OUT ORDER
   Pfetsch B, 1996, EUR J COMMUN, V11, P427, DOI 10.1177/0267323196011004002
   Plasser F, 2005, HARV INT J PRESS/POL, V10, P47, DOI 10.1177/1081180X05277746
   Plasser F, 2002, GLOBAL POLITICAL CAM
   Powers A., 1994, J MEDIA ECON, V7, P21, DOI 10.1207/s15327736me0704_2
   Przeworski A, 1970, LOGIC COMP SOCIAL IN
   REINEMANN C, 2003, SCHRIFTENREIHE DTSCH, V30, P188
   SCHULTZ T, 2002, TALK ALLEN KANALEN A, P233
   Semetko H.A., 1991, FORMATION CAMPAIGN A
   Starkey G., 2007, BALANCE BIAS JOURNAL
   Jesper Stromback, 2008, HDB ELECTION NEWS CO
   Stromback J., 2007, NORDICOM REV, V28, P51
   Stromback J, 2008, INT J PRESS/POLIT, V13, P228, DOI 10.1177/1940161208319097
   Tunstall J., 1996, NEWSPAPER POWER NEW
   Walgrave S, 2006, J COMMUN, V56, P88, DOI 10.1111/j.1460-2466.2006.00005.x
   Weaver D, 2004, HDB POLITICAL COMMUN, P257
   Winston B., 2002, JOURNALISM STUD, V3, P5, DOI DOI 10.1080/14616700120107301
   Zaller J, 1998, ANN AM ACAD POLIT SS, V560, P111, DOI 10.1177/0002716298560001009
NR 59
TC 4
Z9 4
U1 0
U2 5
PU SAGE PUBLICATIONS LTD
PI LONDON
PA 1 OLIVERS YARD, 55 CITY ROAD, LONDON EC1Y 1SP, ENGLAND
SN 0163-4437
J9 MEDIA CULT SOC
JI Media Cult. Soc.
PD NOV
PY 2010
VL 32
IS 6
BP 943
EP +
DI 10.1177/0163443710379666
PG 19
WC Communication; Sociology
SC Communication; Sociology
GA 683JD
UT WOS:000284471200003
ER

PT J
AU Leem, G
   Zhang, SS
   Jamison, AC
   Galstyan, E
   Rusakova, I
   Lorenz, B
   Litvinov, D
   Lee, TR
AF Leem, Gyu
   Zhang, Shishan
   Jamison, Andrew C.
   Galstyan, Eduard
   Rusakova, Irene
   Lorenz, Bernd
   Litvinov, Dmitri
   Lee, T. Randall
TI Light-Induced Covalent Immobilization of Monolayers of Magnetic
   Nanoparticles on Hydrogen-Terminated Silicon
SO ACS APPLIED MATERIALS & INTERFACES
LA English
DT Article
DE UV-induced covalent attachment; magnetic nanoparticle arrays; silicon
   substrates; bit-patterned magnetic recording media
ID SELF-ASSEMBLED MONOLAYERS; MONODISPERSE FEPT NANOPARTICLES; MNFE2O4
   NANOPARTICLES; ALKYL MONOLAYERS; POROUS SILICON; SHAPE CONTROL;
   SURFACES; NANOCRYSTALS; SIZE; SI(111)
AB Specifically tailored omega-alkenyl-1-carboxylic acids were synthesized for use as surfactants in the single-step preparation of manganese ferrite (MnFe(2)O(4)) nanoparticles (NPs). Monodisperse manganese ferrite NPs terminated with omega-alkenyl moieties were prepared via a one-pot reaction at high temperature without the need of ligand exchange. Using this approach, simple adjustment of the rate of heating allowed precise tuning of the size of the nanoparticles, which were characterized in bulk form by transmission electron microscopy (TEM), Fourier-transform infrared (FT-IR) spectroscopy, and X-ray diffraction (XRD). These surfactant-coated magnetic nanoparticles were then deposited onto hydrogen-terminated silicon(111) wafers and covalently anchored to the surface by UV-initiated covalent bonding. Analysis by scanning electron microscopy (SEM) and X-ray photoelectron spectroscopy (XPS) confirmed that the UV treatment led to covalent immobilization of the NPs on the silicon surface with a consistent packing density across the surface. The magnetic properties of the stable, surface-bound nanoparticle arrays were characterized using a superconducting quantum interference device (SQUID) magnetometer. The materials and methods described here are being developed for use in bit-patterned ultrahigh density magnetic recording media and nanoscale biomagnetic sensing.
C1 [Leem, Gyu; Zhang, Shishan; Jamison, Andrew C.; Lee, T. Randall] Univ Houston, Dept Chem, Houston, TX 77204 USA.
   [Leem, Gyu; Zhang, Shishan; Jamison, Andrew C.; Lee, T. Randall] Univ Houston, Dept Chem Engn, Houston, TX 77204 USA.
   [Litvinov, Dmitri] Univ Houston, Ctr Nanomagnet Syst, Houston, TX 77204 USA.
   [Galstyan, Eduard; Rusakova, Irene; Lorenz, Bernd] Univ Houston, Texas Ctr Superconduct, Houston, TX 77204 USA.
RP Lee, TR (reprint author), Univ Houston, Dept Chem, Univ Pk, Houston, TX 77204 USA.
EM trlee@uh.edu
RI Dom, Rekha/B-7113-2012
OI Lee, T. Randall/0000-0001-9584-8861
CR Altavilla C, 2005, ADV MATER, V17, P1084, DOI 10.1002/adma.200401600
   Asanuma H, 2005, LANGMUIR, V21, P5013, DOI 10.1021/la0474969
   Aslam M, 2007, CRYST GROWTH DES, V7, P471, DOI 10.1021/cg060656p
   Balaji G, 2002, J MAGN MAGN MATER, V242, P617, DOI 10.1016/S0304-8853(01)01043-5
   Boal AK, 2002, CHEM MATER, V14, P2628, DOI 10.1021/cm011689p
   Bonnemain B, 1998, J DRUG TARGET, V6, P167
   Boukherroub R, 1999, LANGMUIR, V15, P3831, DOI 10.1021/la9901478
   Burda C, 2005, CHEM REV, V105, P1025, DOI 10.1021/cr030063a
   Buriak JM, 1999, J AM CHEM SOC, V121, P11491, DOI 10.1021/ja992188w
   Cai W, 2004, BIOSENS BIOELECTRON, V19, P1013, DOI 10.1016/j.bios.2003.09.009
   Cattaruzza F, 2005, CHEM MATER, V17, P3311, DOI 10.1021/cm050231a
   Chen M, 2004, J AM CHEM SOC, V126, P8394, DOI 10.1021/ja047648m
   Cicero RL, 2000, LANGMUIR, V16, P5688, DOI 10.1021/la9911990
   Cornell R.M., 1996, IRON OXIDE STRUCTURE
   Daou TJ, 2008, CHEM MATER, V20, P5869, DOI 10.1021/cm801405n
   de Smet LCPM, 2003, J AM CHEM SOC, V125, P13916, DOI 10.1021/ja037445i
   deVilleneuve CH, 1997, J PHYS CHEM B, V101, P2415, DOI 10.1021/jp962581d
   Dubroca T, 2006, PHYS REV B, V74, DOI 10.1103/PhysRevB.74.026403
   EFFENBERGER F, 1995, SYNTHESIS-STUTTGART, P1126
   Effenberger F, 1998, ANGEW CHEM INT EDIT, V37, P2462, DOI 10.1002/(SICI)1521-3773(19981002)37:18<2462::AID-ANIE2462>3.0.CO;2-R
   Fanizza E, 2007, ADV FUNCT MATER, V17, P201, DOI 10.1002/adfm.200600288
   Faucheux A, 2006, LANGMUIR, V22, P153, DOI 10.1021/la052145v
   Fiegland LR, 2005, LANGMUIR, V21, P2660, DOI 10.1021/la050044r
   GUPTA PK, 1988, INT J PHARM, V43, P167, DOI 10.1016/0378-5173(88)90072-5
   Hu J, 2005, LANGMUIR, V21, P11173, DOI 10.1021/la051076h
   Klug H. P., 1974, XRAY DIFFRACTION PRO
   Lasseter TL, 2004, J AM CHEM SOC, V126, P10220, DOI 10.1021/ja047642x
   Leem G, 2008, CHEM COMMUN, P4989, DOI 10.1039/b804633f
   Leem G, 2009, CRYST GROWTH DES, V9, P32, DOI 10.1021/cg8009833
   LINFORD MR, 1995, J AM CHEM SOC, V117, P3145, DOI 10.1021/ja00116a019
   Liu C, 2000, J PHYS CHEM B, V104, P1141, DOI 10.1021/jp993552g
   Lu AH, 2007, ANGEW CHEM INT EDIT, V46, P1222, DOI 10.1002/anie.200602866
   Masala O, 2005, CHEM PHYS LETT, V402, P160, DOI 10.1016/j.cplett.2004.12.032
   Mengistu TZ, 2006, LANGMUIR, V22, P5301, DOI 10.1021/la052776p
   Moumen N, 1996, J PHYS CHEM-US, V100, P1867, DOI 10.1021/jp9524136
   Murray CB, 2000, ANNU REV MATER SCI, V30, P545, DOI 10.1146/annurev.matsci.30.1.545
   Nandwana V, 2007, J PHYS CHEM C, V111, P4185, DOI 10.1021/jp068330e
   Samia ACS, 2006, CHEM MATER, V18, P5203, DOI 10.1021/cm0610579
   Schmeltzer JM, 2002, LANGMUIR, V18, P2971, DOI 10.1021/la0156560
   Shavel A, 2009, CHEM MATER, V21, P1326, DOI 10.1021/cm803201p
   Shukla N, 2003, J MAGN MAGN MATER, V266, P178, DOI 10.1016/S0304-8853(03)00469-4
   Si SF, 2005, CRYST GROWTH DES, V5, P391, DOI 10.1021/cg0497905
   Song HT, 2005, J AM CHEM SOC, V127, P9992, DOI 10.1021/ja051833y
   Song Q, 2007, CHEM MATER, V19, P4633, DOI 10.1021/cm070990o
   Speliotis DE, 1999, J MAGN MAGN MATER, V193, P29, DOI 10.1016/S0304-8853(98)00399-0
   STONER EC, 1991, IEEE T MAGN, V27, P3475, DOI 10.1109/TMAG.1991.1183750
   Strother T, 2000, J AM CHEM SOC, V122, P1205, DOI 10.1021/ja9936161
   Sun QY, 2005, J AM CHEM SOC, V127, P2514, DOI 10.1021/ja045359s
   Sun SH, 2004, J AM CHEM SOC, V126, P273, DOI 10.1021/ja0380852
   Sun SH, 2000, SCIENCE, V287, P1989, DOI 10.1126/science.287.5460.1989
   TANG ZX, 1992, PHYS REV LETT, V68, P3114, DOI 10.1103/PhysRevLett.68.3114
   Torchilin VP, 2000, EUR J PHARM SCI, V11, pS81, DOI 10.1016/S0928-0987(00)00166-4
   Tromsdorf UI, 2007, NANO LETT, V7, P2422, DOI 10.1021/nl071099b
   Vallant T, 1999, LANGMUIR, V15, P5339, DOI 10.1021/la9900977
   Vestal CR, 2003, J AM CHEM SOC, V125, P9828, DOI 10.1021/ja035474n
   Wagner P, 1997, J STRUCT BIOL, V119, P189, DOI 10.1006/jsbi.1997.3881
   Webb LJ, 2003, J PHYS CHEM B, V107, P5404, DOI 10.1021/jp0222752
   Weller D, 1999, IEEE T MAGN, V35, P4423, DOI 10.1109/20.809134
   Weller D, 2000, IEEE T MAGN, V36, P10, DOI 10.1109/20.824418
   Willard MA, 2004, INT MATER REV, V49, P125, DOI 10.1179/095066004225021882
   Yamanoi Y, 2006, CHEM-EUR J, V12, P314, DOI 10.1002/chem.200500455
   Zeng H, 2004, J AM CHEM SOC, V126, P11458, DOI 10.1021/ja045911d
NR 62
TC 10
Z9 11
U1 0
U2 17
PU AMER CHEMICAL SOC
PI WASHINGTON
PA 1155 16TH ST, NW, WASHINGTON, DC 20036 USA
SN 1944-8244
J9 ACS APPL MATER INTER
JI ACS Appl. Mater. Interfaces
PD OCT
PY 2010
VL 2
IS 10
BP 2789
EP 2796
DI 10.1021/am100457v
PG 8
WC Nanoscience & Nanotechnology; Materials Science, Multidisciplinary
SC Science & Technology - Other Topics; Materials Science
GA 670XP
UT WOS:000283463700020
PM 20857939
ER

PT J
AU Kalezhi, J
   Belle, BD
   Miles, JJ
AF Kalezhi, Josephat
   Belle, Branson D.
   Miles, Jim J.
TI Dependence of Write-Window on Write Error Rates in Bit Patterned Media
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Bit error rate (BER); bit patterned media (BPM); magnetic recording;
   write-window
ID PARTICLE; FIELD; SHAPE
AB In bit patterned media (BPM), the medium is patterned into nanometer-sized magnetic islands where each island stores one bit. Although BPM samples of credible densities have been made, many problems remain, one of which is the synchronization of the write head switching position with respect to the targeted island. An accurate but efficient model has been developed to calculate the timing margin available for a given required write bit error rate (BER). The model predicts the write-error performance of BPM composed of populations of islands with distributions of magnetic, position, and geometric parameters, and can be used to calculate the write-window for a given BER. The effect of distributions of island position, geometric and magnetic properties has been investigated, and it has been shown that island position and magnetic properties have a much more significant effect upon BER than geometric (shape/size) variations. This model enables the relationship between servo requirements and raw BER to be established for disk drives using BPM.
C1 [Kalezhi, Josephat; Belle, Branson D.; Miles, Jim J.] Univ Manchester, Sch Comp Sci, Manchester M13 9PL, Lancs, England.
   [Kalezhi, Josephat] Copperbelt Univ, Dept Comp Sci, Sch Technol, Kitwe 10101, Zambia.
RP Kalezhi, J (reprint author), Univ Manchester, Sch Comp Sci, Manchester M13 9PL, Lancs, England.
EM kalezhij@cs.man.ac.uk
FU EPSRC [EP/E017657/1]; Information Storage Industry Consortium (INSIC)
FX This work was supported by EPSRC under Grant EP/E017657/1 and by the
   Information Storage Industry Consortium (INSIC) EHDR Program.
CR Beleggia M, 2003, J MAGN MAGN MATER, V263, pL1, DOI 10.1016/S0304-8853(03)00238-5
   Belle BD, 2008, IEEE T MAGN, V44, P3468, DOI 10.1109/TMAG.2008.2001791
   BROWN WF, 1979, IEEE T MAGN, V15, P1196, DOI 10.1109/TMAG.1979.1060329
   Kalezhi J, 2009, IEEE T MAGN, V45, P3531, DOI 10.1109/TMAG.2009.2022407
   Livshitz B, 2009, J APPL PHYS, V105, DOI 10.1063/1.3072442
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Schabes ME, 2008, J MAGN MAGN MATER, V320, P2880, DOI 10.1016/j.jmmm.2008.07.035
   Scholz W, 2003, COMP MATER SCI, V28, P366, DOI 10.1016/S0927-0256(03)00119-8
   STONER EC, 1991, IEEE T MAGN, V27, P3475, DOI 10.1109/TMAG.1991.1183750
   Thomson T, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.257204
   Weller D, 1999, IEEE T MAGN, V35, P4423, DOI 10.1109/20.809134
   Wernsdorfer W, 1997, PHYS REV LETT, V78, P1791, DOI 10.1103/PhysRevLett.78.1791
   Wood R, 2009, IEEE T MAGN, V45, P100, DOI 10.1109/TMAG.2008.2006286
NR 13
TC 7
Z9 7
U1 0
U2 7
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD OCT
PY 2010
VL 46
IS 10
BP 3752
EP 3759
DI 10.1109/TMAG.2010.2052626
PG 8
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 669KP
UT WOS:000283347900008
ER

PT J
AU Tousi, YM
   Afshari, E
AF Tousi, Yahya M.
   Afshari, Ehsan
TI 2-D Electrical Interferometer: A Novel High-Speed Quantizer
SO IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
LA English
DT Article
DE Analog-to-digital converter (ADC); CMOS; interference; LC lattice; power
   detector; quantization; tapering; wave propagation
ID NONLINEAR TRANSMISSION-LINES; NEGATIVE REFRACTIVE-INDEX; TO-DIGITAL
   CONVERSION; CONVERTERS; MATRIX; DESIGN
AB In this paper, we propose a 2-D electircal interferometer as a means of high-speed data conversion. The structure is based on wave propagation in 2-D LC lattices. We will discuss the principle behind this technique, which exploits wave propagation and medium manipulation in order to take advantage of different interference patterns. This method of quantization is based on passive LC lattices that can operate at very high frequencies on a conventional CMOS process. We analyze different properties of the structure and propose the design methodology. To show the feasibility of this approach, we design a 20-GS/s 4-bit quantizer consuming 194 mW for quanization and 943 mW for an analog memory. There is good agreement between analysis and simulation.
C1 [Tousi, Yahya M.; Afshari, Ehsan] Cornell Univ, Dept Elect & Comp Engn, Ithaca, NY 14850 USA.
RP Tousi, YM (reprint author), Cornell Univ, Dept Elect & Comp Engn, Ithaca, NY 14850 USA.
FU C2S2; Marco Focus Center for Circuit and System Solutions; SRC
   [2009-CT-2047]; Defense Advanced Research Projects Agency (DARPA)
FX Manuscript received December 17, 2009; revised April 15, 2010; accepted
   July 08, 2010. Date of publication September 07, 2010; date of current
   version October 13, 2010. This work was supported by C2S2, the Marco
   Focus Center for Circuit and System Solutions, under SRC Contract
   2009-CT-2047 and by the Defense Advanced Research Projects Agency
   (DARPA) under a 2007 Young Faculty Award.
CR Afshari E, 2006, J APPL PHYS, V99, DOI 10.1063/1.2174126
   Afshari E, 2005, IEEE J SOLID-ST CIRC, V40, P744, DOI 10.1109/JSSC.2005.843639
   Afshari E., 2006, IEEE INT SOL STAT CI, P751
   Afshari E, 2008, IEEE T CIRCUITS-I, V55, P2332, DOI 10.1109/TCSI.2008.918151
   Bhat HS, 2008, PHYS REV E, V77, DOI 10.1103/PhysRevE.77.066602
   *CAD, 2010, CAD DES MAN
   Coppinger F, 1999, IEEE T MICROW THEORY, V47, P1309, DOI 10.1109/22.775471
   Eleftheriades GV, 2005, IEEE T MICROW THEORY, V53, P396, DOI 10.1109/TMTT.2004.839944
   Eleftheriades GV, 2002, IEEE T MICROW THEORY, V50, P2702, DOI 10.1109/TMTT.2002.805197
   HOEFER WJR, 1985, IEEE T MICROW THEORY, V33, P882, DOI 10.1109/TMTT.1985.1133146
   Houck AA, 2003, PHYS REV LETT, V9013, P7401, DOI 10.1103/PhysRevLett.90.137401
   Jarrahi M, 2008, IEEE T MICROW THEORY, V56, P2143, DOI 10.1109/TMTT.2008.2002230
   JOHNS PB, 1974, IEEE T MICROW THEORY, VTT22, P209, DOI 10.1109/TMTT.1974.1128203
   Juodawlkis PW, 2001, IEEE T MICROW THEORY, V49, P1840, DOI 10.1109/22.954797
   KERTIS RA, 2009, IEEE J SOLID-ST CIRC, V44, P1709
   Krishnan S, 2003, IEEE T MICROW THEORY, V51, P2555, DOI 10.1109/TMTT.2003.820176
   Lee J, 2004, IEEE J SOLID-ST CIRC, V39, P1671, DOI 10.1109/JSSC.2004.833555
   Lee T. H., 1998, DESIGN CMOS RADIO FR
   Li GS, 2009, IEEE T CIRCUITS-II, V56, P464, DOI 10.1109/TCSII.2009.2020947
   Momeni O, 2009, IEEE T MICROW THEORY, V57, P2790, DOI 10.1109/TMTT.2009.2032343
   Nathawad L. Y., 2003, INT SOL STAT CIRC C, P320
   Pok DSK, 1997, IEEE T MICROW THEORY, V45, P2283, DOI 10.1109/22.643832
   Poulton K., 2003, P IEEE INT SOL STAT, V1, P318
   Proakis JG, 2004, DIGITAL COMMUNICATIO
   Psiaki ML, 2005, IEEE T MICROW THEORY, V53, P3082, DOI 10.1109/TMTT.2005.855127
   Sanada A, 2004, IEEE T MICROW THEORY, V52, P1252, DOI 10.1109/TMTT.2004.825703
   Schvan P., 2008, ISSCC FEB, P544, DOI DOI 10.1109/ISSCC.2008.4523298
   Shahramian S, 2009, IEEE J SOLID-ST CIRC, V44, P1709, DOI 10.1109/JSSC.2009.2020657
   Sievenpiper D, 2002, IEEE ANTENN WIREL PR, V1, P179, DOI 10.1109/LAWP.2002.807788
   TAUR Y, 1998, FUNDUMENTALS MODERN
   Tousi YM, 2009, ISCAS: 2009 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS 1-5, P1121, DOI 10.1109/ISCAS.2009.5117957
NR 31
TC 3
Z9 3
U1 0
U2 2
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9480
J9 IEEE T MICROW THEORY
JI IEEE Trans. Microw. Theory Tech.
PD OCT
PY 2010
VL 58
IS 10
BP 2549
EP 2561
DI 10.1109/TMTT.2010.2063830
PG 13
WC Engineering, Electrical & Electronic
SC Engineering
GA 670PX
UT WOS:000283440900004
ER

PT J
AU Nishiyama, N
   Takenaka, K
   Togashi, N
   Miura, H
   Saidoh, N
   Inoue, A
AF Nishiyama, N.
   Takenaka, K.
   Togashi, N.
   Miura, H.
   Saidoh, N.
   Inoue, Akihisa
TI Glassy alloy composites for information technology applications
SO INTERMETALLICS
LA English
DT Article; Proceedings Paper
CT 7th International Conference on Bulk-Metallic Glasses
CY NOV 01-05, 2009
CL Busan, SOUTH KOREA
SP Yonsei Univ, Ctr Noncrystalline Mat
DE Composite; Magnetic properties; Thin films; Magnetic applications
ID PULSED-LASER DEPOSITION; AMORPHOUS ALLOY; MAGNETIC-PROPERTIES;
   SUPERCOOLED LIQUID; METALLIC-GLASS; BEHAVIOR; MEDIA
AB With the aim of developing a novel preparation process for bit-patterned-media, nano-patterned glassy alloy composite composed of zero-magneto-striction Co-Fe-B amorphous alloy thin film, Pd-Cu-Ni-P glassy alloy and Co/Pd multi-layer with perpendicular magnetization was prepared. Using the commercial imprinting mold, periodic nano hole array with a hole diameter of 90 nm and a pitch of 180 nm was successfully prepared on the surface of Pd-based glassy alloy thin film. By overlaying the Co/Pd multi-layer with perpendicular magnetization and surface polishing, isolated Co/Pd magnetic dots embedded into nano hole array can be obtained. These magnetic dots act as single magnetic domains. In addition, the change in magnetization direction was confirmed under magnetic fields of +/-20 kOe. These results suggest that the glassy alloy nano-composite is suitable for BPM of high data density HDD. It is therefore concluded that the preparation method is candidate process for the preparation of BPM of high data density HDD. (C) 2010 Elsevier Ltd. All rights reserved.
C1 [Nishiyama, N.; Takenaka, K.; Togashi, N.; Miura, H.; Saidoh, N.] RIMCOF Tohoku Univ Lab, R&D Inst Met & Composites Future Ind, Sendai, Miyagi 9808577, Japan.
   [Inoue, Akihisa] Tohoku Univ, Sendai, Miyagi 9808577, Japan.
RP Nishiyama, N (reprint author), RIMCOF Tohoku Univ Lab, R&D Inst Met & Composites Future Ind, Sendai, Miyagi 9808577, Japan.
EM rimcofnn@imr.tohoku.ac.jp
RI Nishiyama, Nobuyuki/C-8228-2015; Inoue, Akihisa/E-5271-2015
CR Charap SH, 1997, IEEE T MAGN, V33, P978, DOI 10.1109/20.560142
   CHOU SY, 1995, APPL PHYS LETT, V67, P3114, DOI 10.1063/1.114851
   FUJIMORI H, 1976, JPN J APPL PHYS, V15, P705, DOI 10.1143/JJAP.15.705
   Inoue A, 2000, ACTA MATER, V48, P279, DOI 10.1016/S1359-6454(99)00300-6
   IWASAKI S, 1977, IEEE T MAGN, V13, P1272, DOI 10.1109/TMAG.1977.1059695
   Koike K, 2001, APPL PHYS LETT, V78, P784, DOI 10.1063/1.1345804
   Masuda H, 2006, JPN J APPL PHYS 2, V45, pL406, DOI 10.1143/JJAP.45.L406
   Moritz J, 2002, IEEE T MAGN, V38, P1731, DOI 10.1109/TMAG.2002.1017764
   Nishiyama N, 1999, MATER T JIM, V40, P64
   Nishiyama N, 2007, J NON-CRYST SOLIDS, V353, P3615, DOI 10.1016/j.jnoncrysol.2007.05.170
   Saotome Y, 2004, MAT SCI ENG A-STRUCT, V375, P389, DOI 10.1016/j.msea.2003.10.173
   Saotome Y, 2001, SCRIPTA MATER, V44, P1541, DOI 10.1016/S1359-6462(01)00837-5
   Saotome Y, 2001, MAT SCI ENG A-STRUCT, V304, P716, DOI 10.1016/S0921-5093(00)01593-8
   Shen J, 2004, SURF SCI REP, V52, P163, DOI 10.1016/j.surfrep.2003.10.001
   Takenaka K, 2009, MATER LETT, V63, P1895, DOI 10.1016/j.matlet.2009.05.062
   YASUI N, 2005, J APPL PHYS, V97, pN103, DOI 10.1063/1.1847332
   Yasui N, 2008, J APPL PHYS, V103, DOI 10.1063/1.2837497
   Zeng H, 2000, J APPL PHYS, V87, P4718, DOI 10.1063/1.373137
NR 18
TC 21
Z9 21
U1 0
U2 15
PU ELSEVIER SCI LTD
PI OXFORD
PA THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD OX5 1GB, OXON, ENGLAND
SN 0966-9795
J9 INTERMETALLICS
JI Intermetallics
PD OCT
PY 2010
VL 18
IS 10
SI SI
BP 1983
EP 1987
DI 10.1016/j.intermet.2010.02.027
PG 5
WC Chemistry, Physical; Materials Science, Multidisciplinary; Metallurgy &
   Metallurgical Engineering
SC Chemistry; Materials Science; Metallurgy & Metallurgical Engineering
GA 644ZM
UT WOS:000281420700044
ER

PT J
AU Gurovich, BA
   Prikhodko, KE
   Kuleshova, EA
   Yakubovsky, AY
   Meilikhov, EZ
   Mosthenko, MG
AF Gurovich, B. A.
   Prikhodko, K. E.
   Kuleshova, E. A.
   Yakubovsky, A. Yu
   Meilikhov, E. Z.
   Mosthenko, M. G.
TI Magnetic properties of high-density patterned magnetic media
SO JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
LA English
DT Article
DE Patterned magnetic media; Selective removal of atoms; Co nanobits
   coercivity; Anisotropy factor
ID SELECTIVE REMOVAL; ATOMS
AB Structures of patterned magnetic media (PMM) with a density of 100-155 Gb/in.(2) have been prepared using the original method of selective removal of atoms making use of irradiation by an accelerated ion beam for producing patterns of materials whose chemical and physical properties are different from those of the matrix. Magnetic hysteres is loops for cobalt PMM structures with Co bit sizes of 40 x 15, 30 x 15, and 15 x 15 nm(2) show linear increase of coercivity with bit anisotropy factor. Consecutive reversals of nanobit magnetizations in bit ensembles have been visualized by the MFM technique, which allows one to reconstruct corresponding magnetic hysteresis loops. (C) 2010 Elsevier B.V. All rights reserved.
C1 [Gurovich, B. A.; Prikhodko, K. E.; Kuleshova, E. A.; Yakubovsky, A. Yu; Meilikhov, E. Z.; Mosthenko, M. G.] Russian Res Ctr, Kurchatov Inst, Moscow 123182, Russia.
RP Gurovich, BA (reprint author), Russian Res Ctr, Kurchatov Inst, Kurchatov Sq 1, Moscow 123182, Russia.
EM ba_gurovich@irmt.kiae.ru; evgenia-orm@yandex.ru
RI Kuleshova, Evgenia/N-8804-2013; Gurovich, Boris/N-8800-2013; Prikhodko,
   Kirill/L-1032-2016
OI Kuleshova, Evgenia/0000-0002-6975-7891; Gurovich,
   Boris/0000-0003-1232-3838; Prikhodko, Kirill/0000-0001-7439-1823;
   Gurovich, Boris/0000-0001-6884-2923
CR Chappert C, 1998, SCIENCE, V280, P1919, DOI 10.1126/science.280.5371.1919
   Grigoriev I. S., 1997, HDB PHYS QUANTITIES
   Gurovich B, 2004, J MAGN MAGN MATER, V272, P1629, DOI 10.1016/j.jmmm.2003.12.775
   Gurovich BA, 2009, PHYS-USP+, V52, P165, DOI 10.3367/UFNe.0179.200902d.0179
   Ichiyanagi Y, 2004, J MAGN MAGN MATER, V272, pE1245, DOI 10.1016/j.jmmm.2003.12.377
   van der Zaag PJ, 2000, PHYS REV LETT, V84, P6102, DOI 10.1103/PhysRevLett.84.6102
   CHOU SY, 1998, Patent No. 5772905
NR 7
TC 8
Z9 8
U1 0
U2 6
PU ELSEVIER SCIENCE BV
PI AMSTERDAM
PA PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
SN 0304-8853
J9 J MAGN MAGN MATER
JI J. Magn. Magn. Mater.
PD OCT
PY 2010
VL 322
IS 20
BP 3060
EP 3063
DI 10.1016/j.jmmm.2010.05.029
PG 4
WC Materials Science, Multidisciplinary; Physics, Condensed Matter
SC Materials Science; Physics
GA 623MG
UT WOS:000279743800016
ER

PT J
AU Asbahi, M
   Moritz, J
   Dieny, B
   Gourgon, C
   Perret, C
   van de Veerdonk, RJM
AF Asbahi, M.
   Moritz, J.
   Dieny, B.
   Gourgon, C.
   Perret, C.
   van de Veerdonk, R. J. M.
TI Recording performances in perpendicular magnetic patterned media
SO JOURNAL OF PHYSICS D-APPLIED PHYSICS
LA English
DT Article
ID DOT ARRAYS; DENSITY; STORAGE; SIGNAL; REVERSAL; ROUTE
AB We report on the recording performances and signal-to-noise ratio (SNR) analyses of perpendicular magnetic bit-patterned media. Two different types of magnetic samples are investigated. They differ by the way that they were patterned (nano-imprint versus e-beam lithography) as well as their magnetic properties (Co/Pt multilayers and CoCrPt alloy are the recording layers). Using a contact read/write quasi-static tester, we were able to characterize the write windows, the bit error rates and measure the SNR. The influence of magnetic properties and media microstructure on the writing processes is studied. We show also that the lithographical method used to replicate the media induces more or less noise due to structural distributions.
C1 [Asbahi, M.; Moritz, J.] CEA CNRS UJF Grenoble INP, SPINTEC, UMR8191, F-38054 Grenoble, France.
   [Asbahi, M.; Moritz, J.; Dieny, B.] CEA INAC, F-38054 Grenoble, France.
   [Gourgon, C.; Perret, C.] Lab Technol Microelect, F-38054 Grenoble, France.
   [van de Veerdonk, R. J. M.] Seagate Recording Media Operat, Fremont, CA 94538 USA.
RP Moritz, J (reprint author), CEA CNRS UJF Grenoble INP, SPINTEC, UMR8191, 17 Rue Martyrs, F-38054 Grenoble, France.
EM jerome.moritz@cea.fr
FU Region Rhone-Alpes
FX The authors thank Region Rhone-Alpes for financial support.
CR Albrecht M, 2002, APPL PHYS LETT, V80, P3409, DOI 10.1063/1.1476062
   Albrecht M, 2002, APPL PHYS LETT, V81, P2875, DOI 10.1063/1.1512946
   ASBAHI M, UNPUB
   Aziz MM, 2002, IEEE T MAGN, V38, P1964, DOI 10.1109/TMAG.2002.802787
   CHOU SY, 1994, J APPL PHYS, V76, P6673, DOI 10.1063/1.358164
   Jamet JP, 1998, PHYS REV B, V57, P14320, DOI 10.1103/PhysRevB.57.14320
   Landis S, 2000, PHYS REV B, V62, P12271, DOI 10.1103/PhysRevB.62.12271
   LANDIS S, 2001, THESIS U JF DEGRENOB
   Li SJ, 2009, J APPL PHYS, V105, DOI 10.1063/1.3076140
   Livshitz B, 2009, J APPL PHYS, V105, DOI 10.1063/1.3072442
   Lohau J, 2001, IEEE T MAGN, V37, P1652, DOI 10.1109/20.950928
   Moritz J, 2005, PHYS REV B, V71, DOI 10.1103/PhysRevB.71.100402
   Moritz J, 2002, IEEE T MAGN, V38, P1731, DOI 10.1109/TMAG.2002.1017764
   Moritz J, 2002, J APPL PHYS, V91, P7314, DOI 10.1063/1.1452260
   Nutter PW, 2004, IEEE T MAGN, V40, P3551, DOI 10.1109/TMAG.2004.835697
   Piramanayagam SN, 2007, J APPL PHYS, V102, DOI 10.1063/1.2750414
   Richter HJ, 2009, J MAGN MAGN MATER, V321, P467, DOI 10.1016/j.jmmm.2008.04.161
   Richter HJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2209179
   Rottmayer RE, 2006, IEEE T MAGN, V42, P2417, DOI 10.1109/TMAG.2006.879572
   SHARROCK MP, 1994, J APPL PHYS, V76, P6413, DOI 10.1063/1.358282
   STONER EC, 1948, PHILOS TR R SOC S-A, V240, P599, DOI 10.1098/rsta.1948.0007
   Svedberg EB, 2002, J APPL PHYS, V91, P5365, DOI 10.1063/1.1459602
   Terris BD, 2009, J MAGN MAGN MATER, V321, P512, DOI 10.1016/j.jmmm.2008.05.046
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Thompson DA, 2000, IBM J RES DEV, V44, P311
   Thomson T, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.257204
   Vogel J, 2006, CR PHYS, V7, P977, DOI 10.1016/j.crhy.2006.10.011
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
NR 28
TC 6
Z9 6
U1 0
U2 4
PU IOP PUBLISHING LTD
PI BRISTOL
PA TEMPLE CIRCUS, TEMPLE WAY, BRISTOL BS1 6BE, ENGLAND
SN 0022-3727
J9 J PHYS D APPL PHYS
JI J. Phys. D-Appl. Phys.
PD SEP 29
PY 2010
VL 43
IS 38
AR 385003
DI 10.1088/0022-3727/43/38/385003
PG 6
WC Physics, Applied
SC Physics
GA 649IZ
UT WOS:000281763600004
ER

PT J
AU Fal, TJ
   Camley, RE
AF Fal, T. J.
   Camley, R. E.
TI Microwave assisted switching In bit patterned media: Accessing multiple
   states
SO APPLIED PHYSICS LETTERS
LA English
DT Article
DE ground states; iron compounds; magnetic switching; micromagnetics;
   microwaves; tellurium compounds
ID FOCUSED ION-BEAM; FABRICATION; STORAGE
AB Using a micromagnetics calculation, we explore the properties of a submicron magnetic square with microwave assisted switching. For a 10x160x160 nm(3) structure of Fe-Ti-N, there are three particular stable magnetic states for reversal fields up to -320 Oe. One can switch between these different states by adding a microwave field. The strength and the frequency of the microwave field determine the final state. A microwave field of up to 30 Oe does not change the magnetization. Fields of 50 to 75 Oe result in an intermediate state, while larger microwave fields produce a reversed ground state. (C) 2010 American Institute of Physics. [doi:10.1063/1.3483773]
C1 [Fal, T. J.; Camley, R. E.] Univ Colorado, Ctr Magnetism & Magnet Nanostruct, Colorado Springs, CO 80918 USA.
RP Fal, TJ (reprint author), Univ Colorado, Ctr Magnetism & Magnet Nanostruct, 1420 Austin Bluffs Pkwy, Colorado Springs, CO 80918 USA.
EM tfal@uccs.edu
FU ARO [W911NF-04-1-0247]; NSF [DMR 0907063]
FX This work was supported by the ARO Grant No. W911NF-04-1-0247 and NSF
   Grant No. DMR 0907063.
CR Camley RE, 2008, PHYS REV B, V78, DOI 10.1103/PhysRevB.78.024425
   Das J., 2009, PHYS REV B, V75
   Goll D, 2003, PHYS REV B, V67, DOI 10.1103/PhysRevB.67.094414
   Grimsditch M, 2004, PHYS REV B, V69, DOI 10.1103/PhysRevB.69.174428
   Hamann HF, 2004, APPL PHYS LETT, V84, P810, DOI 10.1063/1.1644924
   Hertel R, 2007, PHYS REV LETT, V98, DOI 10.1103/PhysRevLett.98.117201
   Kalarickal SS, 2008, PHYS REV B, V77, DOI 10.1103/PhysRevB.77.054427
   Li J, 2005, NUCL INSTRUM METH B, V230, P518, DOI 10.1016/j.nimb.2004.12.094
   Li P., 2008, P SOC PHOTO-OPT INS, V7125, P6
   Li SJ, 2009, APPL PHYS LETT, V94, DOI 10.1063/1.3133354
   Lohau J, 2001, APPL PHYS LETT, V78, P990, DOI 10.1063/1.1347390
   Martin JI, 2003, J MAGN MAGN MATER, V256, P449, DOI 10.1016/S0304-8853(02)00898-3
   McMichael RD, 2005, J APPL PHYS, V97, DOI 10.1063/1.1852191
   Nistor C, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3175721
   Nozaki Y, 2007, APPL PHYS LETT, V91, DOI 10.1063/1.2775047
   Plumer M.L., 2001, PHYS HIGH DENSITY MA
   Rave W, 2000, IEEE T MAGN, V36, P3886, DOI 10.1109/20.914337
   Richter HJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2209179
   Ross CA, 1999, J VAC SCI TECHNOL B, V17, P3168, DOI 10.1116/1.590974
   Terris BD, 2007, MICROSYST TECHNOL, V13, P189, DOI 10.1007/s00542-006-0144-9
   Todorovic M, 1999, APPL PHYS LETT, V74, P2516, DOI 10.1063/1.123885
   Wang H, 2006, J MAGN MAGN MATER, V303, P237, DOI 10.1016/j.jmmm.2005.11.029
   Wang ZH, 2009, J APPL PHYS, V105, DOI 10.1063/1.3121075
   Wang ZK, 2005, PHYS REV LETT, V94, DOI 10.1103/PhysRevLett.94.137208
   Yang X, 2007, J VAC SCI TECHNOL B, V25, P2202, DOI 10.1116/1.2798711
   Zhu J.-G., 2008, IEEE T MAGN, V44, P1
NR 26
TC 6
Z9 6
U1 0
U2 4
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0003-6951
J9 APPL PHYS LETT
JI Appl. Phys. Lett.
PD SEP 20
PY 2010
VL 97
IS 12
AR 122506
DI 10.1063/1.3483773
PG 3
WC Physics, Applied
SC Physics
GA 653VC
UT WOS:000282124700045
ER

PT J
AU Choi, C
   Hong, D
   Oh, Y
   Noh, K
   Kim, JY
   Chen, L
   Liou, SH
   Jin, S
AF Choi, Chulmin
   Hong, Daehoon
   Oh, Young
   Noh, Kunbae
   Kim, Jin Yeol
   Chen, Leon
   Liou, Sy-Hwang
   Jin, Sungho
TI Enhanced Magnetic Properties of Bit Patterned Magnetic Recording Media
   by Trench-Filled Nanostructure
SO ELECTRONIC MATERIALS LETTERS
LA English
DT Article
DE bit patterned media; nano imprint lithography; filling and planarization
ID LIMITS
AB The structure and properties of nanoscale magnetic island arrays for bit patterned media (BPM) have been studied. A periodic Si nano-island array was fabricated by nano-imprint-lithography (NIL), with the trench-filling and flattening achieved by resist spin coating followed by reactive ion back-etching. A Co/Pd multilayer magnetic media with a perpendicular anisotropy was then sputtered and lifted-off so that the processed nanostructure array now has the magnetic material only on the top of the pillars. This process significantly improved the magnetic characteristics of BPM. A planarization by hydrogen silsesquioxane filling reduced the tribological interference of the protruding nanoisland heights in BPM.
C1 [Choi, Chulmin; Hong, Daehoon; Oh, Young; Noh, Kunbae; Kim, Jin Yeol; Chen, Leon; Jin, Sungho] Univ Calif San Diego, Ctr Magnet Recording Res, La Jolla, CA 92093 USA.
   [Liou, Sy-Hwang] Univ Nebraska, Dept Phys & Astron, Lincoln, NE 68588 USA.
RP Jin, S (reprint author), Univ Calif San Diego, Ctr Magnet Recording Res, La Jolla, CA 92093 USA.
EM jin@ucsd.edu
FU CMRR (Center for Magnetic Recording Research) at UC San Diego; Air Force
   Office of Scientific Research and the Center for Nanostructured
   Materials Technology; Ministry of Science and Technology, Korea
   [05K1501-01210]; UC [ele05-10241/Jin]
FX This research was supported by CMRR (Center for Magnetic Recording
   Research) at UC San Diego, UC Discovery Grant No. ele05-10241/Jin, the
   Air Force Office of Scientific Research and the Center for
   Nanostructured Materials Technology under the 21st Century Frontier R&D
   Programs, MOST, and CNMT Grant No. 05K1501-01210 under the 21st Century
   Frontier R&D Programs, Ministry of Science and Technology, Korea.
CR Bertram HN, 2000, IEEE T MAGN, V36, P4, DOI 10.1109/20.824417
   BROWN WF, 1963, PHYS REV, V130, P1677, DOI 10.1103/PhysRev.130.1677
   Charap SH, 1997, IEEE T MAGN, V33, P978, DOI 10.1109/20.560142
   [Anonymous], COMMUNICATION
   Kamata Y, 2004, J APPL PHYS, V95, P6705, DOI 10.1063/1.1669347
   KITTEL C, 1946, PHYS REV, V70, P965, DOI 10.1103/PhysRev.70.965
   Lu L, 2000, SCIENCE, V287, P1463, DOI 10.1126/science.287.5457.1463
   Park J, 2009, NANOTECHNOLOGY, V20, DOI 10.1088/0957-4484/20/1/015303
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Thomson T, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.257204
   Victora RH, 2002, IEEE T MAGN, V38, P1886, DOI 10.1109/TMAG.2002.802791
   Wachenschwanz D, 2005, IEEE T MAGN, V41, P670, DOI 10.1109/TMAG.2004.838049
   Weller D, 1999, IEEE T MAGN, V35, P4423, DOI 10.1109/20.809134
NR 13
TC 10
Z9 10
U1 2
U2 10
PU KOREAN INST METALS MATERIALS
PI SEOUL
PA POSCO CENTER, 4TH FL (EAST WING), 892 DAECHI-4-DONG, KANGNAM-KU, SEOUL
   135-777, SOUTH KOREA
SN 1738-8090
J9 ELECTRON MATER LETT
JI Electron. Mater. Lett.
PD SEP
PY 2010
VL 6
IS 3
BP 113
EP 116
DI 10.3365/eml.2010.09.113
PG 4
WC Materials Science, Multidisciplinary
SC Materials Science
GA 679ZA
UT WOS:000284198100005
ER

PT J
AU Karakulak, S
   Siegel, PH
   Wolf, JK
   Bertram, HN
AF Karakulak, Seyhan
   Siegel, Paul H.
   Wolf, Jack Keil
   Bertram, H. Neal
TI Joint-Track Equalization and Detection for Bit Patterned Media Recording
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Bit patterned media (BPM) recording; joint-track equalization; maximum a
   posteriori (MAP) detection; maximum-likelihood (ML) detection
ID INTERTRACK INTERFERENCE; STORAGE; CHANNELS
AB We compare several different detection and equalization methods for bit patterned media recording channels. We consider a scheme that utilizes a joint-track equalization technique followed by a Viterbi detector. For certain recording densities, simulation results show that it has essentially the same performance as an optimal detector but with reduced detection complexity. Furthermore, it outperforms another scheme of the same complexity previously described in the literature.
C1 [Karakulak, Seyhan; Siegel, Paul H.; Wolf, Jack Keil; Bertram, H. Neal] Univ Calif San Diego, Ctr Magnet Recording Res, La Jolla, CA 92093 USA.
RP Karakulak, S (reprint author), Univ Calif San Diego, Ctr Magnet Recording Res, La Jolla, CA 92093 USA.
EM skarakul@ucsd.edu
FU Center for Magnetic Recording Research, University of California, San
   Diego
FX This work was supported by the Patterned Media Project at Center for
   Magnetic Recording Research, University of California, San Diego.
CR BAHL LR, 1974, IEEE T INFORM THEORY, V20, P284, DOI 10.1109/TIT.1974.1055186
   Burkhard H., 1989, P COMPEURO 89 VLSI C, P43
   HEANUE JF, 1996, APPL OPT         MAY, P2341
   Huang L, 2005, IEEE T MAGN, V41, P2414, DOI 10.1109/TMAG.2005.852212
   Hughes G. F., 2002, Intermag Europe 2002 Digest of Technical Papers. 2002 IEEE International Magnetics Conference (Cat.No.02CH37323), DOI 10.1109/INTMAG.2002.1001400
   Karakulak S, 2008, IEEE T MAGN, V44, P193, DOI 10.1109/TMAG.2007.912837
   Keskinoz M, 2008, IEEE T MAGN, V44, P533, DOI 10.1109/TMAG.2007.914966
   MOON JY, 1995, IEEE T MAGN, V31, P1083, DOI 10.1109/20.364789
   NABAVI S, 2007, P IEEE INT C COMM IC, P6249
   Nabavi S, 2007, IEEE T MAGN, V43, P2274, DOI 10.1109/TMAG.2007.893479
   Nutter PW, 2005, IEEE T MAGN, V41, P4327, DOI 10.1109/TMAG.2005.856586
   Roh BG, 2002, IEEE T MAGN, V38, P1830, DOI 10.1109/TMAG.2002.1017779
   Tan WJ, 2005, IEEE T MAGN, V41, P730, DOI 10.1109/TMAG.2004.839064
   Tan WJ, 2005, J MAGN MAGN MATER, V287, P397, DOI 10.1016/j.jmmm.2004.10.066
   YUAN SW, 1994, IEEE T MAGN, V30, P1267, DOI 10.1109/20.297764
   Yuan SW, 1996, IEEE T MAGN, V32, P3334, DOI 10.1109/TMAG.1996.508399
NR 16
TC 35
Z9 35
U1 0
U2 3
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD SEP
PY 2010
VL 46
IS 9
BP 3639
EP 3647
DI 10.1109/TMAG.2010.2049116
PG 9
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 666SV
UT WOS:000283140900011
ER

PT J
AU Aoyama, N
   Ajan, A
   Sato, K
   Tanaka, T
   Miyaguchi, Y
   Tsumagari, K
   Morita, T
   Nishihashi, T
   Tanaka, A
   Uzumaki, T
AF Aoyama, Nobuhide
   Ajan, Antony
   Sato, Kenji
   Tanaka, Tsutomu
   Miyaguchi, Yusuke
   Tsumagari, Kanako
   Morita, Tadashi
   Nishihashi, Tsutomu
   Tanaka, Atsushi
   Uzumaki, Takuya
TI Reproduced Dot Image of Nitrogen Ion Implanted Co/Pd Bit Patterned Media
   With Flying Head
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Bit patterned medium; Co/Pd multilayer; ion implantation; perpendicular
   anisotropy; read/write characteristics
AB We investigated switching and read/write (R/W) characteristics of head flyable (Co/Pd) multilayer bit patterned media (BPM) fabricated by ion implantation. Two-dimensional (2-D) signal mapping of the de magnetized media shows a clear image of 134 Gbit/in(2) dots (60 nm x 80 nm pitch, 28 nm dot size). We performed synchronized writing with individual bits with alternate polarity (ac magnetized) and 2-D mapping of 134 Gbit/in(2) patterns. The results substantiated the potential of the fabrication technique. From the read-back signal amplitude, we estimated the effective dot size as 24 nm, slightly smaller than the expected value. We discuss R/W properties and important characteristics such as glide height and magnetic structure of BPM.
C1 [Aoyama, Nobuhide; Ajan, Antony; Sato, Kenji; Tanaka, Tsutomu; Tanaka, Atsushi; Uzumaki, Takuya] Fujitsu Labs Ltd, Kanagawa 2430197, Japan.
   [Miyaguchi, Yusuke; Tsumagari, Kanako; Morita, Tadashi; Nishihashi, Tsutomu] ULVAC Japan Ltd, Shizuoka 4101231, Japan.
RP Aoyama, N (reprint author), Fujitsu Labs Ltd, Kanagawa 2430197, Japan.
EM noaoyama@jp.fu-jitsu.com
CR Ajan A, 2010, IEEE T MAGN, V46, P2020, DOI 10.1109/TMAG.2010.2043647
   Albrecht M, 2003, APPL PHYS LETT, V83, P4363, DOI 10.1063/1.1630153
   Albrecht M, 2002, APPL PHYS LETT, V81, P2875, DOI 10.1063/1.1512946
   Bashir MA, 2009, IEEE T MAGN, V45, P3851, DOI 10.1109/TMAG.2009.2023621
   Chen YJ, 2008, APPL PHYS LETT, V93, DOI 10.1063/1.2978326
   Degawa N, 2008, IEEE T MAGN, V44, P3434, DOI 10.1109/TMAG.2008.2002407
   Honda N, 2007, IEEE T MAGN, V43, P2142, DOI 10.1109/TMAG.2007.893139
   Livshitz B, 2009, IEEE T MAGN, V45, P3519, DOI 10.1109/TMAG.2009.2022501
   SATO K, 2010, J APPL PHYS, V107
   Tang Y, 2009, IEEE T MAGN, V45, P822, DOI 10.1109/TMAG.2008.2010642
   WALLACE RL, 1951, AT&T TECH J, V30, P1145
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
   Yang XM, 2009, IEEE T MAGN, V45, P833, DOI 10.1109/TMAG.2008.2010647
NR 13
TC 1
Z9 1
U1 1
U2 4
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD SEP
PY 2010
VL 46
IS 9
BP 3648
EP 3651
DI 10.1109/TMAG.2010.2049364
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 666SV
UT WOS:000283140900012
ER

PT J
AU Martin-Gonzalez, MS
   Briones, F
   Garcia-Martin, JM
   Montserrat, J
   Vila, L
   Faini, G
   Testa, AM
   Fiorani, D
   Rohrmann, H
AF Martin-Gonzalez, M. S.
   Briones, F.
   Garcia-Martin, J. M.
   Montserrat, J.
   Vila, L.
   Faini, G.
   Testa, A. M.
   Fiorani, D.
   Rohrmann, H.
TI Nano-patterning of perpendicular magnetic recording media by low-energy
   implantation of chemically reactive ions
SO JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
LA English
DT Article
DE Hard drive; Perpendicular magnetic recording; CoPd multilayer;
   Multilayer medium; Nanoimprint lithography
ID CO/PD MULTILAYERS; ULTRATHIN FILMS; THIN-FILMS; IRRADIATION;
   LITHOGRAPHY; NANOIMPRINT; ISLANDS; NANOPARTICLES; FABRICATION;
   GBIT/IN(2)
AB Magnetic nano-patterning of perpendicular hard disk media with perpendicular anisotropy, but preserving disk surface planarity, is presented here. Reactive ion implantation is used to locally modify the chemical composition(hence the magnetization and magnetic anisotropy) of the Co/Pd multilayer in irradiated areas. The procedure involves low energy, chemically reactive ion irradiation through a resist mask. Among N, P and As ions, P are shown to be most adequate to obtain optimum bit density and topography flatness for industrial Co/Pd multilayer media. The effect of this ion contributes to isolate perpendicular bits by destroying both anisotropy and magnetic exchange in the irradiated areas. Low ion fluences are effective due to the stabilization of atomic displacement levels by the chemical effect of covalent impurities. (C) 2010 Elsevier B.V. All rights reserved.
C1 [Martin-Gonzalez, M. S.; Briones, F.; Garcia-Martin, J. M.] CSIC, CNM, IMM, Madrid 28760, Spain.
   [Montserrat, J.] CSIC, CNM, IMB, E-08193 Barcelona, Spain.
   [Vila, L.; Faini, G.] CNRS, LPN, F-91460 Marcoussis, France.
   [Testa, A. M.; Fiorani, D.] CNR, Ist Struttura Mat, Area Ric Roma, I-00016 Rome, Italy.
   [Rohrmann, H.] Oerlikon Syst, FL-9496 Balzers, Liechtenstein.
RP Martin-Gonzalez, MS (reprint author), CSIC, CNM, IMM, C Isaac Newton 8 PTM, Madrid 28760, Spain.
EM marisol@imm.cnm.csic.es
RI Martin-Gonzalez, Marisol/E-7076-2010; Vila, Laurent/J-3467-2012;
   Microelectronica de Madrid, Instituto de/D-5173-2013; Montserrat Marti,
   Josep/J-9092-2014; Garcia-Martin, Jose Miguel/H-4434-2011; Faini,
   Giancarlo/B-2392-2015
OI Martin-Gonzalez, Marisol/0000-0002-5687-3674; testa, alberto
   maria/0000-0002-1898-2730; Montserrat, Josep/0000-0002-4107-5346;
   Microelectronica de Madrid, Instituto de/0000-0003-4211-9045;
   Garcia-Martin, Jose Miguel/0000-0002-5908-8428; 
FU EC [G5RD-CT-2002-00731]
FX The work was supported by the EC Growth project HIDEMAR (Contract No.
   G5RD-CT-2002-00731). The authors thank the LPN technological platform
   for technical support. MSMG want to thanks to the Ramony Cajal program
   and ERC-Stg-2008: 240497.
CR Abarra EN, 2000, APPL PHYS LETT, V77, P2581, DOI 10.1063/1.1319183
   Aign T, 1998, PHYS REV LETT, V81, P5656, DOI 10.1103/PhysRevLett.81.5656
   Albrecht M, 2003, APPL PHYS LETT, V83, P4363, DOI 10.1063/1.1630153
   Belle BD, 2008, IEEE T MAGN, V44, P3468, DOI 10.1109/TMAG.2008.2001791
   BERTERO GA, 1995, J APPL PHYS, V77, P3953, DOI 10.1063/1.358577
   Bertram HN, 1998, IEEE T MAGN, V34, P1845, DOI 10.1109/20.706722
   Bertram H. N., 1994, THEORY MAGNETIC RECO
   bin Mohamad Z, 2008, NANOTECHNOLOGY, V19, DOI 10.1088/0957-4484/19/02/025301
   CHAPPERT C, 1988, J APPL PHYS, V64, P5736, DOI 10.1063/1.342243
   Chappert C, 1998, SCIENCE, V280, P1919, DOI 10.1126/science.280.5371.1919
   Chou SY, 1997, P IEEE, V85, P652, DOI 10.1109/5.573754
   Costa-Kramer JL, 2004, PHYS REV B, V69, DOI 10.1103/PhysRevB.69.144402
   Dietzel A, 2002, IEEE T MAGN, V38, P1952, DOI 10.1109/TMAG.2002.802846
   Fassbender J, 2008, J MAGN MAGN MATER, V320, P579, DOI 10.1016/j.jmmm.2007.07.032
   Fassbender J, 2004, J PHYS D APPL PHYS, V37, pR179, DOI 10.1088/0022-3727/37/16/R01
   Fernandez-Martinez I, 2008, J MAGN MAGN MATER, V320, P68, DOI 10.1016/j.jmmm.2007.05.007
   Ferre J, 1999, J MAGN MAGN MATER, V198-99, P191, DOI 10.1016/S0304-8853(98)01084-1
   Fidler J, 2006, PHYSICA B, V372, P312, DOI 10.1016/j.physb.2005.10.074
   Fullerton EE, 2000, APPL PHYS LETT, V77, P3806, DOI 10.1063/1.1329868
   Garcia JM, 2001, APPL PHYS LETT, V79, P656, DOI 10.1063/1.1389512
   Gibot P, 2005, J MAGN MAGN MATER, V290, P555, DOI 10.1016/j.jmmm.2004.11.526
   Gonzalez-Arrabal R, 2010, J APPL PHYS, V107, DOI 10.1063/1.3369450
   Gordillo N, 2008, J CRYST GROWTH, V310, P4362, DOI 10.1016/j.jcrysgro.2008.07.051
   Haast MAM, 1998, IEEE T MAGN, V34, P1006, DOI 10.1109/20.706339
   HE P, 1993, J APPL PHYS, V73, P5954, DOI 10.1063/1.353482
   Hu G, 2004, J APPL PHYS, V95, P7013, DOI 10.1063/1.1669343
   ISHIDA K, 1990, J PHASE EQUILIB, V11, P550
   IWASAKI S, 1977, IEEE T MAGN, V13, P1272, DOI 10.1109/TMAG.1977.1059695
   Krauss PR, 1997, APPL PHYS LETT, V71, P3174, DOI 10.1063/1.120280
   Martin-Gonzalez MS, 2004, SURF SCI, V571, P63, DOI 10.1016/j.susc.2004.07.045
   McClelland GM, 2002, APPL PHYS LETT, V81, P1483, DOI 10.1063/1.1501763
   Menendez E, 2009, SMALL, V5, P229, DOI 10.1002/smll.200800783
   Moritz J, 2002, J APPL PHYS, V91, P7314, DOI 10.1063/1.1452260
   Moser A, 2002, J PHYS D APPL PHYS, V35, pR157, DOI 10.1088/0022-3727/35/19/201
   Naito K, 2002, IEEE T MAGN, V38, P1949, DOI 10.1109/TMAG.2002.802847
   Peng C, 2007, J VAC SCI TECHNOL B, V25, P410, DOI 10.1116/1.2713405
   Rettner CT, 2002, APPL PHYS LETT, V80, P279, DOI 10.1063/1.1432108
   Rettner CT, 2001, IEEE T MAGN, V37, P1649, DOI 10.1109/20.950927
   Ross C, 2001, ANN REV MATER RES, V31, P203, DOI 10.1146/annurev.matsci.31.1.203
   Sifkovits M, 1999, J MAGN MAGN MATER, V204, P191, DOI 10.1016/S0304-8853(99)00296-6
   Sun SH, 2000, SCIENCE, V287, P1989, DOI 10.1126/science.287.5460.1989
   Terris BD, 2007, MICROSYST TECHNOL, V13, P189, DOI 10.1007/s00542-006-0144-9
   Terris BD, 2009, J MAGN MAGN MATER, V321, P512, DOI 10.1016/j.jmmm.2008.05.046
   Testa AM, 2007, EUR PHYS J-APPL PHYS, V38, P253, DOI 10.1051/epjap:2007078
   Thiaville A, 1997, J APPL PHYS, V82, P3182, DOI 10.1063/1.365623
   Weller D, 1999, IEEE T MAGN, V35, P4423, DOI 10.1109/20.809134
   Weller D, 2000, J APPL PHYS, V87, P5768, DOI 10.1063/1.372516
   *XRAY PDF, 150806 XRAY PDF
   Ziegler JF, 2010, NUCL INSTRUM METH B, V268, P1818, DOI 10.1016/j.nimb.2010.02.091
NR 49
TC 12
Z9 12
U1 0
U2 8
PU ELSEVIER SCIENCE BV
PI AMSTERDAM
PA PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
SN 0304-8853
J9 J MAGN MAGN MATER
JI J. Magn. Magn. Mater.
PD SEP
PY 2010
VL 322
IS 18
BP 2762
EP 2768
DI 10.1016/j.jmmm.2010.04.023
PG 7
WC Materials Science, Multidisciplinary; Physics, Condensed Matter
SC Materials Science; Physics
GA 604VC
UT WOS:000278305600026
ER

PT J
AU Krone, P
   Makarov, D
   Schrefl, T
   Albrecht, M
AF Krone, P.
   Makarov, D.
   Schrefl, T.
   Albrecht, M.
TI Exchange coupled composite bit patterned media
SO APPLIED PHYSICS LETTERS
LA English
DT Article
DE magnetic anisotropy; magnetic storage; magnetic switching; magnetisation
   reversal; micromagnetics; thermal stability
ID LIMITS; HEAD
AB A micromagnetic study on the magnetization reversal in bit patterned media (BPM) with each bit consisting of an exchange coupled composite (ECC) layer stack is presented. The simulations reveal superior magnetic properties of the combined ECC/BPM scheme, in particular for graded media, using uncorrelated distributions of magnetic anisotropy values in order to lower the switching field while keeping a high thermal stability of the media. In this study, a route for narrowing the switching field distribution of the bit array is provided as well, which is vital for the applicability of the BPM concept in magnetic data storage.
C1 [Krone, P.; Makarov, D.; Albrecht, M.] Tech Univ Chemnitz, Inst Phys, D-09107 Chemnitz, Germany.
   [Schrefl, T.] St Polten Univ Appl Sci, A-3100 St Polten, Austria.
RP Krone, P (reprint author), Tech Univ Chemnitz, Inst Phys, D-09107 Chemnitz, Germany.
EM philipp.krone@physik.tu-chemnitz.de
RI Makarov, Denys/G-1025-2011
FU European Commission [224001]
FX This work was supported in part by the European Commission via the FP7
   project TERAMAGSTOR (Grant No. 224001)
CR Albrecht M, 2002, APPL PHYS LETT, V81, P2875, DOI 10.1063/1.1512946
   Batra S, 2004, IEEE T MAGN, V40, P319, DOI 10.1109/TMAG.2003.821163
   Breitling A, 2009, PHYS STATUS SOLIDI-R, V3, P130, DOI 10.1002/pssr.200903074
   Farrow RFC, 1996, J APPL PHYS, V79, P5967, DOI 10.1063/1.362122
   Grobis M, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3304166
   Hauet T, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3276911
   Hellwig O, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3293301
   Hellwig O, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3271679
   Krone P, 2009, J APPL PHYS, V106, DOI 10.1063/1.3260240
   Makarov D, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3309417
   Schrefl T, 2005, IEEE T MAGN, V41, P3064, DOI 10.1109/TMAG.2005.855227
   Suess D, 2006, APPL PHYS LETT, V89, DOI 10.1063/1.2347894
   Suess D, 2009, J MAGN MAGN MATER, V321, P545, DOI 10.1016/j.jmmm.2008.06.041
   Suess D, 2005, APPL PHYS LETT, V87, DOI 10.1063/1.1951053
   Suess D, 2007, J MAGN MAGN MATER, V308, P183, DOI 10.1016/j.jmmm.2006.05.021
   Victora RH, 2005, IEEE T MAGN, V41, P537, DOI 10.1109/TMAG.2004.838075
   Weller D, 1999, IEEE T MAGN, V35, P4423, DOI 10.1109/20.809134
NR 17
TC 26
Z9 27
U1 2
U2 14
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0003-6951
J9 APPL PHYS LETT
JI Appl. Phys. Lett.
PD AUG 23
PY 2010
VL 97
IS 8
AR 082501
DI 10.1063/1.3481668
PG 3
WC Physics, Applied
SC Physics
GA 643OM
UT WOS:000281306500043
ER

PT J
AU Kaushik, N
   Sharma, P
   Yubuta, K
   Makino, A
   Inoue, A
AF Kaushik, Neelam
   Sharma, Parmanand
   Yubuta, Kunio
   Makino, Akihiro
   Inoue, Akihisa
TI Domain wall assisted magnetization switching in (111) oriented L1(0)
   FePt grown on a soft magnetic metallic glass
SO APPLIED PHYSICS LETTERS
LA English
DT Article
DE boron alloys; cobalt alloys; coercive force; iron alloys; magnetic
   domain walls; magnetic hysteresis; magnetic switching; magnetic thin
   films; metallic glasses; metallic thin films; permanent magnets;
   platinum alloys; soft magnetic materials; tantalum alloys
ID COUPLED COMPOSITE MEDIA
AB We report on growth and magnetic properties of exchange-coupled (111)-L1(0) FePt hard/CoFeTaB soft magnetic metallic glass bilayered structure processed at lower temperature (similar to 400 degrees C). Single phaselike hysteresis loops with tailorable coercivity (< 8.2 kOe) in out of plane direction are obtained. The magnetization switching mechanism is identified as domain wall assisted. In views of excellent nanofabrication abilities of metallic glass thin film and the ability to grow preferred oriented L1(0) FePt, the present bilayered structure is very promising for the fabrication of high density bit-patterned magnetic recording media and other spintronic devices. (C) 2010 American Institute of Physics. [doi:10.1063/1.3479054]
C1 [Kaushik, Neelam] Tohoku Univ, World Premier Initiat Ctr, Adv Inst Mat Res, Sendai, Miyagi 9808577, Japan.
   [Sharma, Parmanand; Yubuta, Kunio; Makino, Akihiro] Tohoku Univ, Inst Mat Res, Sendai, Miyagi 9808577, Japan.
RP Kaushik, N (reprint author), Tohoku Univ, World Premier Initiat Ctr, Adv Inst Mat Res, Sendai, Miyagi 9808577, Japan.
EM sharmap@imr.tohoku.ac.jp
RI Yubuta, Kunio/B-8124-2011; Sharma, Parmanand/C-1518-2011; MAKINO,
   AKIHIRO/B-2549-2009; Inoue, Akihisa/E-5271-2015
OI Yubuta, Kunio/0000-0002-3401-6874; 
CR Casoli F, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2905294
   Dannenberg A, 2009, PHYS REV B, V80, DOI 10.1103/PhysRevB.80.245438
   Dobin AY, 2006, APPL PHYS LETT, V89, DOI 10.1063/1.2335590
   Girt E, 2007, IEEE T MAGN, V43, P2166, DOI 10.1109/TMAG.2007.894176
   Goll D, 2009, APPL PHYS LETT, V94, DOI 10.1063/1.3078286
   Qin GW, 2009, INT MATER REV, V54, P157, DOI 10.1179/174328009X411172
   Sharma P, 2007, NANOTECHNOLOGY, V18, DOI 10.1088/0957-4484/18/3/035302
   Sharma P, 2006, J APPL PHYS, V100, DOI 10.1063/1.2359142
   Shima T, 2002, APPL PHYS LETT, V81, P1050, DOI 10.1063/1.1498504
   Tsai JL, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3293444
   Victora RH, 2008, P IEEE, V96, P1799, DOI 10.1109/JPROC.2008.2004314
   Wang JP, 2005, IEEE T MAGN, V41, P3181, DOI 10.1109/TMAG.2005.855278
   Weller D, 2000, IEEE T MAGN, V36, P10, DOI 10.1109/20.824418
   Zha CL, 2009, IEEE T MAGN, V45, P3491, DOI 10.1109/TMAG.2009.2022317
   Zha CL, 2009, APPL PHYS LETT, V94, DOI 10.1063/1.3123003
NR 15
TC 6
Z9 6
U1 1
U2 12
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0003-6951
J9 APPL PHYS LETT
JI Appl. Phys. Lett.
PD AUG 16
PY 2010
VL 97
IS 7
AR 072510
DI 10.1063/1.3479054
PG 3
WC Physics, Applied
SC Physics
GA 641TW
UT WOS:000281153600056
ER

PT J
AU Alexandrou, M
   Nutter, PW
   Delalande, M
   de Vries, J
   Hill, EW
   Schedin, F
   Abelmann, L
   Thomson, T
AF Alexandrou, M.
   Nutter, P. W.
   Delalande, M.
   de Vries, J.
   Hill, E. W.
   Schedin, F.
   Abelmann, L.
   Thomson, T.
TI Spatial sensitivity mapping of Hall crosses using patterned magnetic
   nanostructures
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article
ID THIN-FILMS; MEDIA
AB Obtaining an accurate profile of the spatial sensitivity of Hall cross structures is crucial if such devices are to be used to analyze the switching behavior of magnetic nanostructures and determine the switching field distribution of bit patterned media. Here, we have used the anomalous Hall effect to investigate the switching of patterned Co/Pt multilayer magnetic nanoislands, where the Hall cross has been integrated into the Pt seed layer. Using the anomalous Hall output voltage we have observed the magnetic switching of individual islands, allowing the spatial sensitivity across a Hall cross structure to be determined. The experimental results agree well with numerical simulation studies, using a three-dimensional finite element model, and with existing theoretical studies, where the spatial sensitivity of two-dimensional Hall cross structures have been found numerically. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3475485]
C1 [Alexandrou, M.; Nutter, P. W.; Hill, E. W.; Schedin, F.; Thomson, T.] Univ Manchester, Sch Comp Sci, Manchester M13 9PL, Lancs, England.
   [Delalande, M.; de Vries, J.; Abelmann, L.] Univ Twente, MESA Inst Nanotechnol, NL-7500 AE Enschede, Netherlands.
RP Alexandrou, M (reprint author), Univ Manchester, Sch Comp Sci, Manchester M13 9PL, Lancs, England.
EM p.nutter@manchester.ac.uk
RI Abelmann, Leon /H-8948-2012; Hill, Ernie/K-6942-2015
OI Abelmann, Leon /0000-0002-9733-1230; Hill, Ernie/0000-0001-9412-6795
FU Engineering and Physical Sciences Research Council [EP/E017657/1];
   Information Storage Industry Consortium (INSIC); Dutch Technology
   Foundation STW
FX This work was supported by the Engineering and Physical Sciences
   Research Council under Grant No. EP/E017657/1, by the Information
   Storage Industry Consortium (INSIC) EHDR program, and by the Dutch
   Technology Foundation STW.
CR Belle BD, 2008, IEEE T MAGN, V44, P3468, DOI 10.1109/TMAG.2008.2001791
   Bending SJ, 1997, J APPL PHYS, V81, P3721, DOI 10.1063/1.365494
   Cornelissens YG, 2002, J APPL PHYS, V92, P2006, DOI 10.1063/1.1487909
   Engelen JBC, 2010, NANOTECHNOLOGY, V21, DOI 10.1088/0957-4484/21/3/035703
   Kikuchi N, 2005, J MAGN MAGN MATER, V287, P320, DOI 10.1016/j.jmmm.2004.10.052
   Kikuchi N, 2003, APPL PHYS LETT, V82, P4313, DOI 10.1063/1.1580994
   Okamoto S, 2008, J APPL PHYS, V103, DOI 10.1063/1.2831785
   Sinitsyn NA, 2008, J PHYS-CONDENS MAT, V20, DOI 10.1088/0953-8984/20/02/023201
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Thomson T, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.257204
   WEBB BC, 1988, IEEE T MAGN, V24, P3006, DOI 10.1109/20.92316
NR 11
TC 10
Z9 10
U1 0
U2 17
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0021-8979
J9 J APPL PHYS
JI J. Appl. Phys.
PD AUG 15
PY 2010
VL 108
IS 4
AR 043920
DI 10.1063/1.3475485
PG 5
WC Physics, Applied
SC Physics
GA 650NV
UT WOS:000281857100093
ER

PT J
AU Ramaswamy, S
   Gopalakrishnan, C
   Ponnavaikko, M
AF Ramaswamy, Shivaraman
   Gopalakrishnan, C.
   Ponnavaikko, M.
TI Effect of template engineering on morphology and magnetic properties of
   Ni nanodots fabricated using polysulfone templated lithography
SO PHYSICA SCRIPTA
LA English
DT Article
ID COULOMB-BLOCKADE
AB The fabrication of magnetic nanodots using polysulfone templated lithography has been recently explored as a potential technique for bit patterned media fabrication. This work describes the efforts made to identify the ideal template engineering technique so as to develop a standard media fabrication technique. Nanoporous polysulfone membranes were fabricated using a phase inversion process. Nickel nanodots were then evaporated onto silicon substrates using the polysulfone membrane as a mask. The work maps the changes in the structural and magnetic properties of the nanodots fabricated using one of the three different template engineering techniques identified. The samples were studied using atomic force microscopy and a vibrating sample magnetometer. The results indicated that the fabrication of the mask on the substrate itself gave the best feature size, consistent shape and structure and the least deviation in magnetization due to thermal agitation. The dynamics of the growth process has also been postulated based on the results.
C1 [Ramaswamy, Shivaraman; Gopalakrishnan, C.] SRM Univ, Nanotechnol Res Ctr, Srm Nagar 603203, India.
   [Ponnavaikko, M.] Bharathidasan Univ, Tiruchchirappalli 620024, Tamil Nadu, India.
RP Ramaswamy, S (reprint author), SRM Univ, Nanotechnol Res Ctr, Srm Nagar 603203, India.
EM shivi.masti@gmail.com
CR ALI D, 1994, APPL PHYS LETT, V64, P2119, DOI 10.1063/1.111702
   Anders S, 2002, MICROELECTRON ENG, V61-2, P569, DOI 10.1016/S0167-9317(02)00522-1
   Diaz-Castanon S, 2008, SUPERLATTICE MICROST, V43, P482, DOI 10.1016/j.spmi.2007.07.005
   Huajun Z, 2008, J MAGN MAGN MATER, p[320, 565], DOI 10.1016/j.jmmm.2007.07.018
   LEOBANDUNG E, 1995, APPL PHYS LETT, V67, P938, DOI 10.1063/1.114701
   RAMASWAMY S, 2010, J APPL PHYS, V107, P1
   Ramaswamy S, 2010, APPL PHYS A-MATER, V98, P481, DOI 10.1007/s00339-009-5487-5
   Tseng AA, 2003, IEEE T ELECTRON PACK, V26, P141, DOI 10.1109/TEPM.2003.817714
   Yasuda T, 2000, APPL PHYS LETT, V77, P3917, DOI 10.1063/1.1331078
NR 9
TC 2
Z9 2
U1 0
U2 2
PU IOP PUBLISHING LTD
PI BRISTOL
PA TEMPLE CIRCUS, TEMPLE WAY, BRISTOL BS1 6BE, ENGLAND
SN 0031-8949
J9 PHYS SCRIPTA
JI Phys. Scr.
PD AUG
PY 2010
VL 82
IS 2
AR 025603
DI 10.1088/0031-8949/82/02/025603
PG 5
WC Physics, Multidisciplinary
SC Physics
GA 635IO
UT WOS:000280649000014
ER

PT J
AU Krone, P
   Makarov, D
   Albrecht, M
   Schrefl, T
AF Krone, P.
   Makarov, D.
   Albrecht, M.
   Schrefl, T.
TI Magnetization reversal of bit patterned media: Role of the angular
   orientation of the magnetic anisotropy axes
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article
ID RECORDING MEDIA; LITHOGRAPHY; SYSTEMS; FIELD
AB Micromagnetic modeling was performed to study the influence of an angular dispersion of the magnetic anisotropy axis on the reversal behavior of tilted bit patterned media with an areal density of about 1 Tbit/in.(2). Thereby, the angular dispersion was realized by having the anisotropy axes of the individual bits lying on the surface of a cone with a specific opening angle. In addition, a distribution of the magnetic anisotropy value within the array of magnetic nanostructures was taken into account. The effect of the angular variation in the magnetic anisotropy orientation on the switching field distribution was investigated. Two optimized geometries were suggested in order to keep the switching field distribution as narrow as possible: (1) uniaxial perpendicular bits with the magnetic field applied under an angle of 45 degrees and (2) tilting the anisotropy axis to about 45 degrees-75 degrees and applying a perpendicular magnetic field. However, mixing both situations results in a drastic increase in the switching field distribution. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3457037]
C1 [Krone, P.; Makarov, D.; Albrecht, M.] Tech Univ Chemnitz, Inst Phys, D-09107 Chemnitz, Germany.
   [Schrefl, T.] St Polten Univ Appl Sci, A-3100 St Polten, Austria.
RP Krone, P (reprint author), Tech Univ Chemnitz, Inst Phys, D-09107 Chemnitz, Germany.
RI Makarov, Denys/G-1025-2011
FU European Commission [224001]
FX This work was supported in part by the European Commission via the
   TERAMAGSTOR project (Grant No. 224001).
CR Albrecht M, 2005, NAT MATER, V4, P203, DOI 10.1038/nmat1324
   Chou SY, 1997, P IEEE, V85, P652, DOI 10.1109/5.573754
   Coffey KR, 2003, J APPL PHYS, V93, P8471, DOI 10.1063/1.1540167
   Coffey KR, 2002, J APPL PHYS, V92, P4553, DOI 10.1063/1.1508430
   Gao KZ, 2002, IEEE T MAGN, V38, P3675, DOI 10.1109/TMAG.2002.804801
   Hellwig O, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3293301
   Hellwig O, 2007, APPL PHYS LETT, V90, DOI 10.1063/1.2730744
   Kikitsu A, 2009, J MAGN MAGN MATER, V321, P526, DOI 10.1016/j.jmmm.2008.05.039
   Krone P, 2009, J APPL PHYS, V106, DOI 10.1063/1.3260240
   Lodder JC, 2004, J MAGN MAGN MATER, V272, P1692, DOI 10.1016/j.jmmm.2003.12.259
   McClelland GM, 2002, APPL PHYS LETT, V81, P1483, DOI 10.1063/1.1501763
   Moritz J, 2004, APPL PHYS LETT, V84, P1519, DOI 10.1063/1.1644341
   Park S, 2009, SCIENCE, V323, P1030, DOI 10.1126/science.1168108
   Piramanayagam SN, 2009, J MAGN MAGN MATER, V321, P485, DOI 10.1016/j.jmmm.2008.05.007
   Rave W, 1998, J MAGN MAGN MATER, V190, P332, DOI 10.1016/S0304-8853(98)00328-X
   Rettner CT, 2002, IEEE T MAGN, V38, P1725, DOI 10.1109/TMAG.2002.1017763
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Schabes ME, 2008, J MAGN MAGN MATER, V320, P2880, DOI 10.1016/j.jmmm.2008.07.035
   SCHABES ME, 1988, J APPL PHYS, V64, P1347, DOI 10.1063/1.341858
   Schrefl T, 2005, IEEE T MAGN, V41, P3064, DOI 10.1109/TMAG.2005.855227
   STONER EC, 1948, PHILOS TR R SOC S-A, V240, P599, DOI 10.1098/rsta.1948.0007
   Terris BD, 2009, J MAGN MAGN MATER, V321, P512, DOI 10.1016/j.jmmm.2008.05.046
   Terris BD, 1999, APPL PHYS LETT, V75, P403, DOI 10.1063/1.124389
   Thomson T, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.257204
   Wang JP, 2005, NAT MATER, V4, P191, DOI 10.1038/nmat1344
   Weller D, 2000, IEEE T MAGN, V36, P10, DOI 10.1109/20.824418
   Wood R, 2009, J MAGN MAGN MATER, V321, P555, DOI 10.1016/j.jmmm.2008.07.027
   Zhu JG, 2000, IEEE T MAGN, V36, P23, DOI 10.1109/20.824420
NR 28
TC 5
Z9 5
U1 0
U2 5
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0021-8979
J9 J APPL PHYS
JI J. Appl. Phys.
PD JUL
PY 2010
VL 108
IS 1
AR 013906
DI 10.1063/1.3457037
PG 4
WC Physics, Applied
SC Physics
GA 626XB
UT WOS:000280000400058
ER

PT J
AU Takenaka, K
   Togashi, N
   Nishiyama, N
   Inoue, A
AF Takenaka, Kana
   Togashi, Nozomu
   Nishiyama, Nobuyuki
   Inoue, Akihisa
TI Structure, mechanical properties and imprint-ability of Pd-Cu-Ni-P
   glassy alloy thin film prepared by a pulsed-laser deposition method
SO JOURNAL OF NON-CRYSTALLINE SOLIDS
LA English
DT Article
DE Glassy alloy; Thin film; Mechanical properties; Thermal stability;
   Nano-imprint lithography
ID METALLIC-GLASS; LITHOGRAPHY; DIAMETER; MM
AB With the aim of preparing nano-hole array for bit patterned media of ultra high density data storage, fabrication and imprint-ability of Pd-Cu-Ni-P glassy alloy thin film was investigated. By using a pulsed-laser deposition method, the Pd-based glassy alloy thin film was successfully fabricated. The thermal characteristics of the obtained film were very close to those of the melt-spun glassy alloy ribbon. The obtained film has very smooth surface and high hardness, which are suitable for nano-imprint processing. Nano-imprint-ability of the obtained film is demonstrated by using dot array mold with a dot diameter of 30 nm. The periodic dot pattern of the mold was precisely transcribed. These results suggest that the Pd-Cu-Ni-P glassy alloy thin films are potential nano-imprinting materials for fabricating bit patterned media. (C) 2010 Elsevier B.V. All rights reserved.
C1 [Takenaka, Kana; Togashi, Nozomu; Nishiyama, Nobuyuki] RIMCOF Tohoku Univ Lab, Mat Proc Technol Ctr, Sendai, Miyagi 9808577, Japan.
   [Inoue, Akihisa] Tohoku Univ, Inst Mat Res, Sendai, Miyagi 9808577, Japan.
RP Takenaka, K (reprint author), RIMCOF Tohoku Univ Lab, Mat Proc Technol Ctr, Sendai, Miyagi 9808577, Japan.
EM rimcoftk@imr.tohoku.ac.jp
RI Inoue, Akihisa/E-5271-2015; Nishiyama, Nobuyuki/C-8228-2015
FU "New Energy and Industrial Technology Development Organization" (NEDO)
FX Financial supported by "New Energy and Industrial Technology Development
   Organization" (NEDO) under "Technological Development of Innovative
   Components Based on Enhanced Functionality Metallic Glass" project is
   acknowledged.
CR Chou SY, 1997, J VAC SCI TECHNOL B, V15, P2897, DOI 10.1116/1.589752
   Fernandez A, 1996, IEEE T MAGN, V32, P4472, DOI 10.1109/20.538901
   Inoue A, 2000, ACTA MATER, V48, P279, DOI 10.1016/S1359-6454(99)00300-6
   Inoue A, 1997, MATER T JIM, V38, P179
   Inoue A, 1996, MATER T JIM, V37, P181
   Jeong HW, 2003, J MICROELECTROMECH S, V12, P42, DOI 10.1109/JMEMS.2002.807475
   Kumar G, 2009, NATURE, V457, P868, DOI 10.1038/nature07718
   MATSUMOTO Y, 2008, IUMRS INT C JAP
   NISHIYAMA N, 1997, THESIS TOHOKU U
   Osaka T, 2005, ELECTROCHIM ACTA, V50, P4576, DOI 10.1016/j.electacta.2004.10.099
   Saotome Y, 2002, INTERMETALLICS, V10, P1241, DOI 10.1016/S0966-9795(02)00135-8
   Schroers J, 2007, J MICROELECTROMECH S, V16, P240, DOI 10.1109/JMEMS.0007.892889
   Sharma P, 2005, J NANOSCI NANOTECHNO, V5, P416, DOI 10.1166/jnn.2005.055
   Sharma P, 2007, NANOTECHNOLOGY, V18, DOI 10.1088/0957-4484/18/3/035302
   Willmott PR, 2000, REV MOD PHYS, V72, P315, DOI 10.1103/RevModPhys.72.315
   Nakatani I, 1991, Japan patent, Patent No. 1888363
NR 16
TC 6
Z9 6
U1 0
U2 18
PU ELSEVIER SCIENCE BV
PI AMSTERDAM
PA PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
SN 0022-3093
J9 J NON-CRYST SOLIDS
JI J. Non-Cryst. Solids
PD JUL 1
PY 2010
VL 356
IS 31-32
BP 1542
EP 1545
DI 10.1016/j.jnoncrysol.2010.06.006
PG 4
WC Materials Science, Ceramics; Materials Science, Multidisciplinary
SC Materials Science
GA 643WL
UT WOS:000281330400002
ER

PT J
AU Stipe, BC
   Strand, TC
   Poon, CC
   Balamane, H
   Boone, TD
   Katine, JA
   Li, JL
   Rawat, V
   Nemoto, H
   Hirotsune, A
   Hellwig, O
   Ruiz, R
   Dobisz, E
   Kercher, DS
   Robertson, N
   Albrecht, TR
   Terris, BD
AF Stipe, Barry C.
   Strand, Timothy C.
   Poon, Chie C.
   Balamane, Hamid
   Boone, Thomas D.
   Katine, Jordan A.
   Li, Jui-Lung
   Rawat, Vijay
   Nemoto, Hiroaki
   Hirotsune, Akemi
   Hellwig, Olav
   Ruiz, Ricardo
   Dobisz, Elizabeth
   Kercher, Dan S.
   Robertson, Neil
   Albrecht, Thomas R.
   Terris, Bruce D.
TI Magnetic recording at 1.5 Pb m(-2) using an integrated plasmonic antenna
SO NATURE PHOTONICS
LA English
DT Article
ID RIDGE-WAVE-GUIDE; NEAR-FIELD; PATTERNED MEDIA; TRANSDUCER; LENS
AB Plasmonic devices are capable of efficiently confining and enhancing optical fields, serving as a bridge between the realm of diffraction-limited optics and the nanoscale. Specifically, a plasmonic device can be used to locally heat a recording medium for data storage. Ideally, the recording medium would consist of individually addressable and non-interacting entities, a configuration that has been regarded as the ultimate future hard-drive technology. Here, we describe a plasmonic nano-antenna that is fully integrated into a magnetic recording head and its use for thermally assisted magnetic recording on both continuous and fully-ordered patterned media using nanosecond pulses in a static tester configuration. In the case of patterned media at 1.5 Pb m(-2) (similar to 1 Tb inch(-2)) with 24-nm track pitch, we show ideally written bits without disturbing neighbouring tracks. We find a dramatic improvement in track width and optical efficiency compared to continuous media and show that this is largely due to advantageous near-field optical effects.
C1 [Stipe, Barry C.; Strand, Timothy C.; Poon, Chie C.; Balamane, Hamid; Boone, Thomas D.; Katine, Jordan A.; Li, Jui-Lung; Rawat, Vijay; Hellwig, Olav; Ruiz, Ricardo; Dobisz, Elizabeth; Kercher, Dan S.; Robertson, Neil; Albrecht, Thomas R.; Terris, Bruce D.] Hitachi Global Storage Technol, San Jose Res Ctr, San Jose, CA 95135 USA.
   [Nemoto, Hiroaki; Hirotsune, Akemi] Hitachi Ltd, Storage Technol Res Ctr, Res & Dev Grp, Odawara, Kanagawa 2568510, Japan.
RP Stipe, BC (reprint author), Hitachi Global Storage Technol, San Jose Res Ctr, 3403 Yerba Buena Rd, San Jose, CA 95135 USA.
EM barry.stipe@hitachigst.com
OI Ruiz, Ricardo/0000-0002-1698-4281
FU New Energy and Industrial Technology Development Organization (NEDO)
FX The authors would like to thank many colleagues who supported this work,
   including T. Matsumoto, H. Miyamoto, T. Olson, T. Hauet, H. Richter, G.
   Zeltzer, M. Grobis and R. Payne. A part of this work was funded by the
   New Energy and Industrial Technology Development Organization (NEDO)
   under the 'Development of nanobit technology for ultra-high density
   magnetic recording (Green IT)' project.
CR Challener WA, 2009, NAT PHOTONICS, V3, P220, DOI 10.1038/NPHOTON.2009.26
   Challener WA, 2006, JPN J APPL PHYS 1, V45, P6632, DOI 10.1143/JJAP.45.6632
   Grobis M, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3304166
   Hellwig O, 2010, APPL PHYS LETT, V96, DOI 10.1063/1.3293301
   HIROTSUNE A, IEEE T MAGN IN PRESS
   Itagi AV, 2003, APPL PHYS LETT, V83, P4474, DOI 10.1063/1.1631057
   JOHNSON PB, 1974, PHYS REV B, V9, P5056, DOI 10.1103/PhysRevB.9.5056
   Kryder MH, 2008, P IEEE, V96, P1810, DOI 10.1109/JPROC.2008.2004315
   Lim DS, 2009, IEEE T MAGN, V45, P3844, DOI 10.1109/TMAG.2009.2022180
   Lyman P, 2003, MUCH INFORM
   Martin YC, 2001, J APPL PHYS, V89, P5774, DOI 10.1063/1.1354655
   Matsumoto T, 2004, J APPL PHYS, V95, P3901, DOI 10.1063/1.1669052
   Matsumoto T, 2008, APPL PHYS LETT, V93, DOI 10.1063/1.2960344
   MCDANIEL TW, 2005, J PHYS-CONDENS MAT, V17, P315
   Moser A, 2007, APPL PHYS LETT, V91, DOI 10.1063/1.2799174
   Muhlschlegel P, 2005, SCIENCE, V308, P1607, DOI 10.1126/science.1111886
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Saga H, 1999, JPN J APPL PHYS 1, V38, P1839, DOI 10.1143/JJAP.38.1839
   Schuck PJ, 2005, PHYS REV LETT, V94, DOI 10.1103/PhysRevLett.94.017402
   Sendur K, 2005, PHYS REV LETT, V94, DOI 10.1103/PhysRevLett.94.043901
   Sendur K, 2009, APPL PHYS LETT, V94, DOI 10.1063/1.3073049
   Shi XL, 2002, JPN J APPL PHYS 1, V41, P1632, DOI 10.1143/JJAP.41.1632
   Srituravanich W, 2008, NAT NANOTECHNOL, V3, P733, DOI 10.1038/nnano.2008.303
   Terris B. D., 2005, J PHYS D, V38, pR199
   Weller D, 1999, IEEE T MAGN, V35, P4423, DOI 10.1109/20.809134
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
   Wood R, 2000, IEEE T MAGN, V36, P36, DOI 10.1109/20.824422
   Yasui N, 2008, J APPL PHYS, V103, DOI 10.1063/1.2837497
NR 28
TC 242
Z9 245
U1 3
U2 76
PU NATURE PUBLISHING GROUP
PI LONDON
PA MACMILLAN BUILDING, 4 CRINAN ST, LONDON N1 9XW, ENGLAND
SN 1749-4885
J9 NAT PHOTONICS
JI Nat. Photonics
PD JUL
PY 2010
VL 4
IS 7
BP 484
EP 488
DI 10.1038/nphoton.2010.90
PG 5
WC Optics; Physics, Applied
SC Optics; Physics
GA 618DO
UT WOS:000279331800020
ER

PT J
AU Sato, K
   Ajan, A
   Aoyama, N
   Tanaka, T
   Miyaguchi, Y
   Tsumagari, K
   Morita, T
   Nishihashi, T
   Tanaka, A
   Uzumaki, T
AF Sato, Kenji
   Ajan, Antony
   Aoyama, Nobuhide
   Tanaka, Tsutomu
   Miyaguchi, Yusuke
   Tsumagari, Kanako
   Morita, Tadashi
   Nishihashi, Tsutomu
   Tanaka, Atsushi
   Uzumaki, Takuya
TI Magnetization suppression in Co/Pd and CoCrPt by nitrogen ion
   implantation for bit patterned media fabrication
SO JOURNAL OF APPLIED PHYSICS
LA English
DT Article
ID IRRADIATION
AB We propose a bit patterned media fabrication method based on low energy nitrogen ion implantation. Nitrogen ion implantation of fcc-Co/Pd multilayer or hcp-CoCrPt single layer suppresses their magnetizations at room temperature. Ion implantation reduces the Curie temperature from 600 to 400 K (or lower) as a result of lattice expansion and reduced exchange interaction between the magnetic atoms in the magnetic layer. We have made media with magnetic dots of 190 to 30 nm in diameter by nitrogen ion doping through resist patterns. Writing and reading of the signal from individual dots were performed with a commercial perpendicular magnetic recording head. (C) 2010 American Institute of Physics. [doi :10.1063/1.3431529]
C1 [Sato, Kenji; Ajan, Antony; Aoyama, Nobuhide; Tanaka, Tsutomu; Tanaka, Atsushi; Uzumaki, Takuya] Fujitsu Labs Ltd, Kanagawa 2430197, Japan.
   [Miyaguchi, Yusuke; Tsumagari, Kanako; Morita, Tadashi; Nishihashi, Tsutomu] Ulvac Japan Ltd, Shizuoka 4101231, Japan.
RP Sato, K (reprint author), Fujitsu Labs Ltd, 10-1 Morinosato Wakamiya, Kanagawa 2430197, Japan.
EM ksat@jp.fujitsu.com
CR Ajan A, 2010, IEEE T MAGN, V46, P2020, DOI 10.1109/TMAG.2010.2043647
   AOYAMA N, IEEE T MAGN IN PRESS
   Chappert C, 1998, SCIENCE, V280, P1919, DOI 10.1126/science.280.5371.1919
   Chen YJ, 2008, APPL PHYS LETT, V93, DOI 10.1063/1.2978326
   Chikazumi S., 1964, PHYS FERROMAGNETISM
   CHOU SY, 1994, J APPL PHYS, V76, P6673, DOI 10.1063/1.358164
   CLINTON TW, 2008, 53 MMM C UNPUB
   Devolder T, 2000, PHYS REV B, V62, P5794, DOI 10.1103/PhysRevB.62.5794
   Hyndman R, 2001, J APPL PHYS, V90, P3843, DOI 10.1063/1.1401803
   Rettner CT, 2002, APPL PHYS LETT, V80, P279, DOI 10.1063/1.1432108
   Schmid GM, 2009, J VAC SCI TECHNOL B, V27, P573, DOI 10.1116/1.3081981
   Terris BD, 2005, IEEE T MAGN, V41, P2822, DOI 10.1109/TMAG.2005.855264
NR 12
TC 7
Z9 7
U1 1
U2 7
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0021-8979
J9 J APPL PHYS
JI J. Appl. Phys.
PD JUN 15
PY 2010
VL 107
IS 12
AR 123910
DI 10.1063/1.3431529
PG 4
WC Physics, Applied
SC Physics
GA 626UX
UT WOS:000279993900092
ER

PT J
AU Zhang, SH
   Chai, KS
   Cai, K
   Chen, BJ
   Qin, ZL
   Foo, SM
AF Zhang, Songhua
   Chai, Kao-Siang
   Cai, Kui
   Chen, Bingjin
   Qin, Zhiliang
   Foo, Siang-Meng
TI Write Failure Analysis for Bit-Patterned-Media Recording and Its Impact
   on Read Channel Modeling
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Bit-patterned media recording (BPMR); write synchronization; written-in
   errors
ID 1 TB/IN(2)
AB In this paper, we present a write failure analysis for bit-patterned media recording (BPMR) with formulas derived to calculate its probability for a given set of system parameters. The write failure model derived in this work includes the effect of the recording head and media characteristics and that of a hard disk spindle motor speed variations. Such a model can help assess the performance of the writing strategy for BPMR. It is also found that since the media local parameters associated with each bit directly affect both the write failure rate and read-back signal, the read-back signal actually contains information regarding whether a bit is correctly recorded. This may be exploited by coding and detection schemes to reduce the impact of write failure on bit-error-rate performance.
C1 [Zhang, Songhua; Chai, Kao-Siang; Cai, Kui; Chen, Bingjin; Qin, Zhiliang; Foo, Siang-Meng] ASTAR, Data Storage Inst, Singapore, Singapore.
RP Zhang, SH (reprint author), ASTAR, Data Storage Inst, Singapore, Singapore.
EM zhang_songhua@dsi.a-star.edu.sg
CR Chen YJ, 2008, APPL PHYS LETT, V93, DOI 10.1063/1.2978326
   Hu J, 2007, IEEE T MAGN, V43, P3517, DOI 10.1109/TMAG.2007.898307
   NAKAMURA Y, 2009, IEEE INTERMAG09 MAY
   Nutter PW, 2005, IEEE T MAGN, V41, P4327, DOI 10.1109/TMAG.2005.856586
   Patwari MS, 2004, IEEE T MAGN, V40, P247, DOI 10.1109/TMAG.2003.821186
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
NR 7
TC 16
Z9 16
U1 0
U2 4
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUN
PY 2010
VL 46
IS 6
BP 1363
EP 1365
DI 10.1109/TMAG.2010.2040713
PG 3
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 601DH
UT WOS:000278037800021
ER

PT J
AU Greaves, S
   Kanai, Y
   Muraoka, H
AF Greaves, Simon
   Kanai, Yasushi
   Muraoka, Hiroaki
TI Shingled Magnetic Recording on Bit Patterned Media
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Bit patterned perpendicular media; heads; magnetic recording; simulation
AB Shingled magnetic recording on bit patterned media with areal densities of 2-4 Tbit/in(2) is examined. The use of a shingled recording scheme allows wider write poles and dots with higher anisotropy to be used. The down-track and cross-track write margins can be tailored to suit the tolerances of the drivebyvarying the bit cell aspect ratio. Readback waveforms are calculated for sensors of various size, including the effect of thermal noise in the sensor, and the combination of a wide sensor and bit aspect ratio(BAR) of 1:1 is found to give the highest SNR.
C1 [Greaves, Simon; Muraoka, Hiroaki] Tohoku Univ, RIEC, Sendai, Miyagi 9808577, Japan.
   [Kanai, Yasushi] Niigata Inst Technol, Dept Informat & Elect Engn, Kashiwazaki 9451195, Japan.
RP Greaves, S (reprint author), Tohoku Univ, RIEC, Sendai, Miyagi 9808577, Japan.
EM simon@riec.tohoku.ac.jp
FU MEXT, Japanese Government; Japan Society for the Promotion of Science
   [21 560 374]; Storage Research Consortium, Japan
FX This work was supported in part by the Research and Development for Next
   Generation Information Technology project of the MEXT, Japanese
   Government, and by a Grant in Aid from the Japan Society for the
   Promotion of Science (#21 560 374) and the Storage Research Consortium,
   Japan.
CR Greaves S, 2009, IEEE T MAGN, V45, P3823, DOI 10.1109/TMAG.2009.2021663
   Greaves SJ, 2008, IEEE T MAGN, V44, P3430, DOI 10.1109/TMAG.2008.2002365
   Miura K, 2009, IEEE T MAGN, V45, P3722, DOI 10.1109/TMAG.2009.2023850
   Schabes ME, 2008, J MAGN MAGN MATER, V320, P2880, DOI 10.1016/j.jmmm.2008.07.035
   Wood R., 2009, IEEE T MAGN, V44, P917
NR 5
TC 9
Z9 9
U1 1
U2 2
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUN
PY 2010
VL 46
IS 6
BP 1460
EP 1463
DI 10.1109/TMAG.2010.2043221
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 601DH
UT WOS:000278037800046
ER

PT J
AU Toyoda, N
   Hirota, T
   Yamada, I
   Yakushiji, H
   Hinoue, T
   Ono, T
   Matsumoto, H
AF Toyoda, Noriaki
   Hirota, Tomokazu
   Yamada, Isao
   Yakushiji, Hiroshi
   Hinoue, Tatsuya
   Ono, Toshinori
   Matsumoto, Hiroyuki
TI Fabrication of Planarized Discrete Track Media Using Gas Cluster Ion
   Beams
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Discrete track media; gas cluster ion beam; planarization
AB Fabrication of planarized discrete track media (DTM) by using gas cluster ion beams (GCIB) was demonstrated. Line-and-space patterns were fabricated using nanoimprint lithography and ion beam etching. These patterns were refilled by TiCr films, and the TiCr surface was planarized using Ar and N(2)-GCIBs. The GCIB process yielded excellent planarization of these patterns owing to the preferential modification of surface bumps and enhancement of the surface motion of atoms by GCIB irradiation. The flyability test of a slider flying at a 10-nm height on the DTM planarized with GCIBs indicated an almost 10% reduction in the acoustic emission (AE) output. Further, magnetic force microscope (MFM) and Kerr rotation measurements revealed that GCIB planarization did not produce any significant change in the magnetic characteristics of DTM. It was demonstrated that GCIB planarization is effective for fabricating DTM or similar structures such as bit-patterned media (BPM).
C1 [Toyoda, Noriaki; Hirota, Tomokazu; Yamada, Isao] Univ Hyogo, Grad Sch Engn, Incubat Ctr, Himeji, Hyogo 6712280, Japan.
   [Yakushiji, Hiroshi; Hinoue, Tatsuya; Ono, Toshinori; Matsumoto, Hiroyuki] Hitachi Ltd, Cent Reseach Lab, Kanagawa 2568510, Japan.
RP Toyoda, N (reprint author), Univ Hyogo, Grad Sch Engn, Incubat Ctr, Himeji, Hyogo 6712280, Japan.
EM ntoyoda@incub.u-hyogo.ac.jp
CR Dobisz EA, 2008, P IEEE, V96, P1836, DOI 10.1109/JPROC.2008.2007600
   Hattori K, 2004, IEEE T MAGN, V40, P2510, DOI 10.1109/TMAG.2004.832244
   Insepov Z, 1997, NUCL INSTRUM METH B, V121, P44, DOI 10.1016/S0168-583X(96)00450-8
   Kakuta S, 2007, SURF COAT TECH, V201, P8632, DOI 10.1016/j.surfcoat.2006.03.064
   Nagato K, 2008, IEEE T MAGN, V44, P3476, DOI 10.1109/TMAG.2008.2001618
   Toyoda N, 2009, IEEE T MAGN, V45, P3503, DOI 10.1109/TMAG.2009.2023064
   TOYODA N, 2009, J APPL PHYS, V105
   Toyoda N, 2008, IEEE T PLASMA SCI, V36, P1471, DOI 10.1109/TPS.2008.927266
NR 8
TC 8
Z9 8
U1 3
U2 5
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUN
PY 2010
VL 46
IS 6
BP 1599
EP 1602
DI 10.1109/TMAG.2010.2048748
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 601DH
UT WOS:000278037800082
ER

PT J
AU Ikeda, Y
   Greaves, S
   Aoi, H
   Muraoka, H
AF Ikeda, Yuta
   Greaves, Simon
   Aoi, Hajime
   Muraoka, Hiroaki
TI Relationship Between Applied Field Gradient and Magnetization Switching
   in ECC Structured Dots
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Bit-patterened media (BPM); exchange coupled composite (ECC) media;
   gradient; magnetization switching
ID PATTERNED MEDIA
AB The dependence of the switching of magnetic dots with a composite structure on applied field gradients is investigated. The dot size and magnetic properties were targeted at 2 Tbit/in(2)-class bit patterned media. In the case of a head field with only a perpendicular component, the switching probability can be considered to be the fraction of the dot volume in which the field exceeds the average switching field of the dot when measured in a globally uniform field. The switching probability also depends on the recording field gradient within the dot. On the other hand, in the case of a vector recording field with in-plane components, the switching probability can be approximated by considering the angular dependence of switching field, calculated in a globally uniform field. Additionally, down-track write margins are estimated and found to increase logarithmically as the gradient is increased.
C1 [Ikeda, Yuta; Greaves, Simon; Aoi, Hajime; Muraoka, Hiroaki] Tohoku Univ, RIEC, Sendai, Miyagi 9808577, Japan.
RP Greaves, S (reprint author), Tohoku Univ, RIEC, Sendai, Miyagi 9808577, Japan.
EM simon@riec.tohoku.ac.jp
FU MEXT, Japanese Government
FX This work was supported in part by Research and Development for
   Next-Generation Information Technology by the MEXT, Japanese Government.
CR Hughes R.W., 2000, GEMS GEMOL, V36, P2
   Inaba Y, 2005, IEEE T MAGN, V41, P3136, DOI 10.1109/TMAG.2005.854848
   Muraoka Hiroaki, 2008, IEEE Transactions on Magnetics, V44, P3423, DOI 10.1109/TMAG.2008.2001654
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Shimatsu T, 2007, IEEE T MAGN, V43, P2103, DOI 10.1109/TMAG.2007.892539
   Victora RH, 2005, IEEE T MAGN, V41, P2828, DOI 10.1109/TMAG.2005.855263
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
NR 7
TC 2
Z9 2
U1 1
U2 2
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUN
PY 2010
VL 46
IS 6
BP 1622
EP 1625
DI 10.1109/TMAG.2010.2041193
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 601DH
UT WOS:000278037800088
ER

PT J
AU Zhang, SH
   Chen, BJ
   Wong, WE
   Lin-Yu, M
   Liu, ZJ
AF Zhang, Songhua
   Chen, Bingjin
   Wong, Wai-Ee
   Lin-Yu, Maria
   Liu, Zhejie
TI Effect of Read Head Scaling on Servo and Data Signal Characteristics for
   Staggered Two-Row-per-Track Bit-Patterned-Media Recording
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Bit-patterned media recording; position error signal; servo control
AB In this paper, we investigate the effect of read head profile on the playback signal from data and servo sector in a staggered bit-patterned-media recording system. The scaling of the read head is targeted to achieve better data signal quality while such scaling is shown to have negative effect on the servo signal. A secondary servo burst that uses data samples to generate supplementary PES is then proposed and its feasibility is demonstrated.
C1 [Zhang, Songhua; Chen, Bingjin; Wong, Wai-Ee; Lin-Yu, Maria; Liu, Zhejie] Agcy Sci Technol & Res, Data Storage Inst, Singapore, Singapore.
RP Zhang, SH (reprint author), Agcy Sci Technol & Res, Data Storage Inst, Singapore, Singapore.
EM zhang_songhua@dsi.a-star.edu.sg
RI Liu, Zhejie/G-3961-2012
CR Chen YJ, 2008, APPL PHYS LETT, V93, DOI 10.1063/1.2978326
   Nutter PW, 2005, IEEE T MAGN, V41, P4327, DOI 10.1109/TMAG.2005.856586
   Sacks A., 1995, THESIS CARNEGIE MELL
   SUZUKI H, 2009, TMRC
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
   Wood RW, 2008, IEEE T MAGN, V44, P1874, DOI 10.1109/TMAG.2008.920525
NR 6
TC 1
Z9 1
U1 0
U2 3
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUN
PY 2010
VL 46
IS 6
BP 1645
EP 1648
DI 10.1109/TMAG.2010.2042688
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 601DH
UT WOS:000278037800094
ER

PT J
AU Kato, T
   Oshima, D
   Yamauchi, Y
   Iwata, S
   Tsunashima, S
AF Kato, Takeshi
   Oshima, Daiki
   Yamauchi, Yukihiro
   Iwata, Satoshi
   Tsunashima, Shigeru
TI Fabrication of L1(2)-CrPt3 Alloy Films Using Rapid Thermal Annealing for
   Planar Bit Patterned Media
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE CrPt3; magnetic layered films; planar bit patterned media; rapid thermal
   annealing (RTA)
ID MAGNETIC-PROPERTIES; ION IRRADIATION; PD
AB SiO2(2 nm)/Cr25Pt75(15 nm) and SiO2(2 nm)/Cr25Pt75(15 nm)/SiO2(10,20 nm)/Co80Zr10Nb10(10 nm) were prepared by magnetron sputtering method and post-annealed by rapid thermal annealing ( RTA) at temperatures of 600 degrees C-1000 degrees C for 1-60 sec. The saturation magnetization M-s and coercivity H-c measured by applying a maximum field of 18 kOe were 150 emu/cc and 12 kOe, respectively, for the sample after rapid thermal annealing at 1000 degrees C for 30 sec. This means that L1(2)-CrPt3 phase was obtained by RTA process. The RTA process was applied to fabricate the multilayered structure having L1(2)-CrPt3 and CoZrNb soft magnetic underlayer (SUL). The polar Kerr loop of CrPt3(15 nm)/SiO2(20 nm)/CoZrNb(10 nm) after RTA at 1000 degrees C for 30 sec exhibited a large coercivity H-c > 9 kOe corresponding to that of the CrPt3 single layer. From the compositional depth profile of CrPt3(15 nm)/SiO2(20 nm)/CoZrNb(10 nm) processed by RTA at 1000 degrees C for 30 sec, sharp layered structure was confirmed despite the high-temperature heat treatment. When the SiO2 thickness was reduced to 10 nm, such a layered structure was completely destroyed due to the interdiffusion between CrPt3 and CoZrNb layers. Thus it was concluded that the RTA process and the interlayer of SiO2(20 nm) were effective to fabricate layered structure having L1(2)-CrPt3 and SUL.
C1 [Kato, Takeshi; Oshima, Daiki; Iwata, Satoshi] Nagoya Univ, Dept Quantum Engn, Nagoya, Aichi 4648603, Japan.
   [Yamauchi, Yukihiro; Tsunashima, Shigeru] Nagoya Univ, Dept Elect Engn & Comp Sci, Nagoya, Aichi 4648603, Japan.
RP Kato, T (reprint author), Nagoya Univ, Dept Quantum Engn, Nagoya, Aichi 4648603, Japan.
EM takeshik@nuee.nagoya-u.ac.jp
RI Kato, Takeshi/I-2654-2013
CR Chappert C, 1998, SCIENCE, V280, P1919, DOI 10.1126/science.280.5371.1919
   Cho J, 1999, J APPL PHYS, V86, P3149, DOI 10.1063/1.371181
   Ferre J, 1999, J MAGN MAGN MATER, V198-99, P191, DOI 10.1016/S0304-8853(98)01084-1
   Hyndman R, 2001, J APPL PHYS, V90, P3843, DOI 10.1063/1.1401803
   Kato T, 2004, J MAGN MAGN MATER, V272, P778, DOI [10.1016/j.jmmm.2003.12.382, 10.1016/j.jmmm.m2003.12.382]
   Kato T, 2009, J APPL PHYS, V106, DOI 10.1063/1.3212967
   Kato T, 2009, J APPL PHYS, V105, DOI 10.1063/1.3072024
   Leonhardt TD, 1999, J APPL PHYS, V85, P4307, DOI 10.1063/1.370351
   PICKART SJ, 1962, J APPL PHYS, V33, P1336, DOI 10.1063/1.1728717
   Suharyadi E, 2006, IEEE T MAGN, V42, P2972, DOI 10.1109/TMAG.2006.880076
   Suharyadi E, 2005, IEEE T MAGN, V41, P3595, DOI 10.1109/TMAG.2005.854735
   SUHARYADI E, 2005, T MAGN SOC JPN, V5, P125
   Terris BD, 1999, APPL PHYS LETT, V75, P403, DOI 10.1063/1.124389
NR 13
TC 4
Z9 4
U1 0
U2 1
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUN
PY 2010
VL 46
IS 6
BP 1671
EP 1674
DI 10.1109/TMAG.2010.2044559
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 601DH
UT WOS:000278037800101
ER

PT J
AU Shi, YJ
   Nutter, PW
   Belle, BD
   Miles, JJ
AF Shi, Yuanjing
   Nutter, Paul W.
   Belle, Branson D.
   Miles, Jim J.
TI Error Events Due to Island Size Variations in Bit Patterned Media
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Bit patterned media; error events; magnetic recording; position
   variations; read channel; size variations
ID READ CHANNEL PERFORMANCE; STORAGE
AB Control of the variations of island properties is one of the key challenges in fabricating Bit-Patterned Media for future storage systems. The presence on any variation in the size and position of an island has a detrimental effect on the ability to recover recorded data, particularly in the case of variation in island size. By analyzing error events when island size variations are present we have identified that these are more likely to be single-bit in nature. To understand the origins of these error events we have investigated the size and magnetization state of islands in the vicinity where a single-bit error event is encountered. It is shown that these error events occur due to particular combinations of island size and magnetization state for the three islands investigated. In every case the central island, from which the data bit is recovered in error, is small compared to the nominal island size. These results show that size variations must be controlled in the fabrication process in order to maximize the bit-error-rate performance of the read channel.
C1 [Shi, Yuanjing; Nutter, Paul W.; Belle, Branson D.; Miles, Jim J.] Univ Manchester, Sch Comp Sci, Nano Engn & Storage Technol Res Grp, Manchester M13 9PL, Lancs, England.
RP Nutter, PW (reprint author), Univ Manchester, Sch Comp Sci, Nano Engn & Storage Technol Res Grp, Manchester M13 9PL, Lancs, England.
EM p.nutter@manchester.ac.uk
FU Engineering & Physical Sciences Research Council [EP/E017657/1];
   Information Storage Industry Consortium (INSIC)
FX This work was supported by the Engineering & Physical Sciences Research
   Council under Grant EP/E017657/1, and by the Information Storage
   Industry Consortium (INSIC) EHDR program.
CR Belle BD, 2008, IEEE T MAGN, V44, P3468, DOI 10.1109/TMAG.2008.2001791
   JEON S, 2007, P IEEE GLOBECOM 07, P277
   Kalezhi J, 2009, IEEE T MAGN, V45, P3531, DOI 10.1109/TMAG.2009.2022407
   Nabavi S, 2008, IEEE T MAGN, V44, P3789, DOI 10.1109/TMAG.2008.2002387
   Nutter PW, 2008, IEEE T MAGN, V44, P3797, DOI 10.1109/TMAG.2008.2002516
   Nutter PW, 2005, IEEE T MAGN, V41, P4327, DOI 10.1109/TMAG.2005.856586
   Nutter PW, 2004, IEEE T MAGN, V40, P3551, DOI 10.1109/TMAG.2004.835697
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   RITCHER HJ, 2007, J PHYS D, V40, pR149
   Terris BD, 2009, J MAGN MAGN MATER, V321, P512, DOI 10.1016/j.jmmm.2008.05.046
NR 10
TC 2
Z9 2
U1 0
U2 1
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUN
PY 2010
VL 46
IS 6
BP 1755
EP 1758
DI 10.1109/TMAG.2010.2041047
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 601DH
UT WOS:000278037800124
ER

PT J
AU Ranjbar, M
   Piramanayagam, SN
   Deng, SZ
   Aung, KO
   Sbiaa, R
   Kay, YS
   Wong, SK
   Chong, CT
AF Ranjbar, Mojtaba
   Piramanayagam, S. N.
   Deng, Suzi
   Aung, Kyaw Oo
   Sbiaa, Rachid
   Kay, Yew Seng
   Wong, Seng Kai
   Chong, Chong Tow
TI Antiferromagnetically Coupled Patterned Media and Control of Switching
   Field Distribution
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Antiferromagnetically coupled patterned media; magnetostatic
   interactions; switching field distribution
ID MAGNETIC RECORDING MEDIA; ANISOTROPY; LAYERS
AB Switching Field distribution (SFD) is one of the critical issues for writing in bit patterned media (BPM) for high areal densities. It is believed that the magnetostatic interaction is one of the several factors that contribute to the SFD. With the antiferromagnetically coupled (AFC) structure, the magnetostatic interaction can be tailored to understand/reduce SFD. In this study, AFC patterned media is studied with emphasis placed on the effect of the top layer coercivity, which will determine the M(r) and hence the magnetostatic interaction. For this study, nanodots with a size and space of 60 and 40 nm respectively were fabricated with electron beam lithography (EBL). Remanent hysteresis curves for the nanodot arrays were obtained by counting the number of reversed dots in magnetic force microscopy (MFM) images at remanent state. The narrowest SFD at a pressure of 1 Pa for top layer was observed possibly because of good crystaline texture and reduced magnetostatic interaction.
C1 [Ranjbar, Mojtaba; Piramanayagam, S. N.; Deng, Suzi; Aung, Kyaw Oo; Sbiaa, Rachid; Kay, Yew Seng; Wong, Seng Kai; Chong, Chong Tow] Agcy Sci Technol & Res, Data Storage Inst, Singapore 117608, Singapore.
   [Ranjbar, Mojtaba; Chong, Chong Tow] Natl Univ Singapore, Dept Elect & Comp Engn, Singapore 117576, Singapore.
   [Deng, Suzi] Natl Univ Singapore, Dept Chem, Singapore 117543, Singapore.
RP Piramanayagam, SN (reprint author), Agcy Sci Technol & Res, Data Storage Inst, Singapore 117608, Singapore.
EM prem_sn@dsi.a-star.edu.sg
RI Piramanayagam, SN/A-4192-2008; Sbiaa, Rachid/I-8038-2013
OI Piramanayagam, SN/0000-0002-3178-2960; 
FU A*STAR (SINGA
FX Ranjbar would like to express gratitude for support from the A*STAR
   (SINGA) Graduate Scholarship program.
CR Abarra EN, 2000, APPL PHYS LETT, V77, P2581, DOI 10.1063/1.1319183
   Ariake J, 2007, IEEE T MAGN, V43, P2304, DOI 10.1109/TMAG.2007.892639
   Fullerton EE, 2000, APPL PHYS LETT, V77, P3806, DOI 10.1063/1.1329868
   Girt E, 2003, IEEE T MAGN, V39, P2306, DOI 10.1109/TMAG.2003.816280
   Kitade Y, 2004, IEEE T MAGN, V40, P2516, DOI 10.1109/TMAG.2004.830165
   Lau JW, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2822439
   Parekh V, 2006, NANOTECHNOLOGY, V17, P2079, DOI 10.1088/0957-4484/17/9/001
   Piramanayagam SN, 2007, J APPL PHYS, V102, DOI 10.1063/1.2750414
   Piramanayagam SN, 2009, J APPL PHYS, V105, DOI 10.1063/1.3075565
   Piramanayagam SN, 2003, IEEE T MAGN, V39, P657, DOI 10.1109/TMAG.2003.808989
   Piramanayagam SN, 2001, APPL PHYS LETT, V79, P2423, DOI 10.1063/1.1407855
   Ross C, 2001, ANN REV MATER RES, V31, P203, DOI 10.1146/annurev.matsci.31.1.203
   Sbiaa R, 2009, J APPL PHYS, V106, DOI 10.1063/1.3173546
   Sbiaa R, 2009, J APPL PHYS, V105, DOI 10.1063/1.3093699
   Shaw JM, 2007, J APPL PHYS, V101, DOI 10.1063/1.2431399
   Terris B. D., 2005, J PHYS D, V38, pR199
   Thomson T, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.257204
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
NR 18
TC 18
Z9 18
U1 0
U2 8
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUN
PY 2010
VL 46
IS 6
BP 1787
EP 1790
DI 10.1109/TMAG.2010.2043226
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 601DH
UT WOS:000278037800133
ER

PT J
AU Honda, N
   Yamakawa, K
   Ouchi, K
AF Honda, Naoki
   Yamakawa, Kiyoshi
   Ouchi, Kazuhiro
TI Simulation Study of Bit Patterned Media With Weakly Inclined Anisotropy
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Anisotropy dispersion; bit patterned media; recording simulation; weakly
   inclined anisotropy
ID TB/IN(2)
AB Recording properties of bit patterned media with weakly inclined anisotropy were studied by simulation. When a shielded planar head was used, a recording system with an areal density of 2.6 Tbit/in(2) was expected for 30-degree inclined anisotropy media. Relatively large tolerance of around 4% in the anisotropy field and 7 degrees in orientation dispersion as well as write margins in down- and cross-track directions would be expected. Recording densities would be extended to 4 Tbit/in(2) with additional exchange coupling between the dots. It is expected that bit patterned media with weakly inclined anisotropy is one of promising media for ultra high density recording.
C1 [Honda, Naoki] Tohoku Inst Technol, Sendai, Miyagi 9828577, Japan.
   [Yamakawa, Kiyoshi; Ouchi, Kazuhiro] Akita Prefectural R&D Ctr, Res Inst Adv Technol, Akita 0101623, Japan.
RP Honda, N (reprint author), Tohoku Inst Technol, Sendai, Miyagi 9828577, Japan.
EM n_honda@tohtech.ac.jp
FU NEDO; Cultivation Research Project of Innovation Satellite Iwate, JST
FX This work was supported in part by the Green IT Project of NEDO and in
   part by the Cultivation Research Project of Innovation Satellite Iwate,
   JST.
CR DOBIN AY, 2008, INT 2008 MADR
   Gao KZ, 2002, IEEE T MAGN, V38, P3675, DOI 10.1109/TMAG.2002.804801
   HONDA N, 2009, INT 2009 SACR
   Honda N, 2007, IEEE T MAGN, V43, P2142, DOI 10.1109/TMAG.2007.893139
   Honda N, 2008, IEEE T MAGN, V44, P3438, DOI 10.1109/TMAG.2008.2002528
   Ise K, 2006, IEEE T MAGN, V42, P2422, DOI 10.1109/TMAG.2006.878818
NR 6
TC 4
Z9 4
U1 0
U2 1
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUN
PY 2010
VL 46
IS 6
BP 1806
EP 1808
DI 10.1109/TMAG.2009.2039857
PG 3
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 601DH
UT WOS:000278037800138
ER

PT J
AU Chen, YJ
   Ding, J
   Deng, J
   Huang, TL
   Leong, SH
   Shi, JZ
   Zong, BY
   Ko, HYY
   Au, CK
   Hu, SB
   Liu, B
AF Chen, Yunjie
   Ding, Jun
   Deng, Jie
   Huang, Tianli
   Leong, Siang Huei
   Shi, Jianzhong
   Zong, Baoyu
   Ko, Hnin Yu Yu
   Au, Chun Kit
   Hu, Shengbin
   Liu, Bo
TI Switching Probability Distribution of Bit Islands in Bit Patterned Media
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Bit patterned media (BPM); magnetic force microscopy (MFM); magnetic
   recording; magnetic reversal
ID PERPENDICULAR MEDIA; RECORDING MEDIUM; FABRICATION; DENSITY; PARTICLE;
   DESIGN
AB In this paper, we report magnetic force microscopy (MFM) observations of switching probability of individual bit islands in bit patterned media. The switching probability (p) of each island was measured by repeated reversal tests at the same experimental conditions for each switching field (SF). It was found that there are similar to 60% of islands with 0 < p < 1 for SF = 11 kOe kOe (which is approximately the average remnant coercivity, Hcr of the patterned islands) while the rest of the islands are either switched every time (for magnetically softer islands) or never switched (for magnetically harder islands). The observed statistical behavior of 0 < p < 1 is an indication of thermal fluctuation during switching when magnetostatic energy (due to the applied external field) is comparable to magnetic anisotropy energy. As SF is decreased or increased away from Hcr (11 kOe to 9.5 kOe or 11 kOe to 12.5 kOe), percentage of islands with 0 < p < 1 becomes smaller [narrower switching probability distribution (SPD)], due to less dipolar interaction/variations among islands [which also lead to less switching field distribution (SFD) broadening]. Our results provide insights on the effects of statistical switching behavior of bit islands on the write errors in bit patterned media recording.
C1 [Chen, Yunjie; Huang, Tianli; Leong, Siang Huei; Shi, Jianzhong; Zong, Baoyu; Ko, Hnin Yu Yu; Au, Chun Kit; Hu, Shengbin; Liu, Bo] ASTAR, Data Storage Inst, Singapore 117608, Singapore.
   [Ding, Jun] Natl Univ Singapore, Dept Mat Sci & Engn, Singapore 117574, Singapore.
   [Deng, Jie] ASTAR, IMRE, Singapore 117602, Singapore.
RP Chen, YJ (reprint author), ASTAR, Data Storage Inst, Singapore 117608, Singapore.
EM chen_yunjie@ieee.org
RI Ding, Jun/C-5172-2011; Zong, Bao-Yu/E-6910-2012
OI Zong, BaoYu/0000-0003-2025-1395
CR Albrecht M, 2002, APPL PHYS LETT, V80, P3409, DOI 10.1063/1.1476062
   Berger A, 2005, IEEE T MAGN, V41, P3178, DOI 10.1109/TMAG.2005.855285
   BROWN WF, 1963, PHYS REV, V130, P1677, DOI 10.1103/PhysRev.130.1677
   Chen YJ, 2008, APPL PHYS LETT, V93, DOI 10.1063/1.2978326
   Engelen JBC, 2010, NANOTECHNOLOGY, V21, DOI 10.1088/0957-4484/21/3/035703
   Hattori K, 2004, IEEE T MAGN, V40, P2510, DOI 10.1109/TMAG.2004.832244
   Hellwig O, 2007, APPL PHYS LETT, V90, DOI 10.1063/1.2730744
   Honda N, 2008, J MAGN MAGN MATER, V320, P2195, DOI 10.1016/j.jmmm.2008.03.048
   Hughes GF, 1999, IEEE T MAGN, V35, P2310, DOI 10.1109/20.800809
   ISHIDA T, 1993, IEICE T FUND ELECTR, VE76A, P1161
   Kikitsu A, 2007, IEEE T MAGN, V43, P3685, DOI 10.1109/TMAG.2007.902970
   Krauss PR, 1995, J VAC SCI TECHNOL B, V13, P2850, DOI 10.1116/1.588303
   LAMBERT SE, 1987, IEEE T MAGN, V23, P3690, DOI 10.1109/TMAG.1987.1065736
   Parekh V, 2006, NANOTECHNOLOGY, V17, P2079, DOI 10.1088/0957-4484/17/9/001
   Richter HJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2209179
   Ross C, 2001, ANN REV MATER RES, V31, P203, DOI 10.1146/annurev.matsci.31.1.203
   Sbiaa R, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2831692
   Shew L.F., 1963, IEEE Transactions on Broadcast and Television Receivers, VBTR-9, P56
   TAGAWA I, 1991, IEEE T MAGN, V27, P4975, DOI 10.1109/20.278712
   Terris BD, 2009, J MAGN MAGN MATER, V321, P512, DOI 10.1016/j.jmmm.2008.05.046
   Wachenschwanz D, 2005, IEEE T MAGN, V41, P670, DOI 10.1109/TMAG.2004.838049
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
   Nakatani I., 1989, Japanese Patent, Patent No. 888363
NR 23
TC 5
Z9 5
U1 2
U2 7
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUN
PY 2010
VL 46
IS 6
BP 1990
EP 1993
DI 10.1109/TMAG.2010.2043064
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 601DH
UT WOS:000278037800185
ER

PT J
AU Ajan, A
   Sato, K
   Aoyama, N
   Tanaka, T
   Miyaguchi, Y
   Tsumagari, K
   Morita, T
   Nishihashi, T
   Tanaka, A
   Uzumaki, T
AF Ajan, Antony
   Sato, Kenji
   Aoyama, Nobuhide
   Tanaka, Tsutomu
   Miyaguchi, Yusuke
   Tsumagari, Kanako
   Morita, Tadashi
   Nishihashi, Tsutomu
   Tanaka, Atsushi
   Uzumaki, Takuya
TI Fabrication, Magnetic, and R/W Properties of Nitrogen-Ion-Implanted
   Co/Pd and CoCrPt Bit-Patterned Medium
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Bit-patterned medium; CoCrPt; Co/Pd Multilayer; ion implantation;
   magnetic anisotropy; Monte-Carlo simulation; patterned medium;
   perpendicular magnetic anisotropy; recording media; thermal stability
ID DENSITY; DESIGN; LITHOGRAPHY; TB/IN(2); SYSTEMS; TERABIT; LIMITS
AB A method of making a cost-effective bit-patterned medium combining: 1) a pattern imprint; 2) ion doping; and 3) an ashing process is described. The Nitrogen ion was doped to change the magnetic properties of the Co/Pd and CoCrPt magnetic layer. The Nitrogen ion induces surface and lattice, and the exchange coupling strength changes during doping which suppress the magnetization and anisotropy of Co/Pd and CoCrPt magnetic layers. This can be achieved at relatively lower dosages so that a subsequent ashing process creates a smooth surface. The thermal stability of doped film and dot was good for practical applications. Monte-Carlo simulations were used to estimate the lateral ionic distribution within the dot region and compared with magnetic-force microscopy. To demonstrate this technique, areal densities of 134 Gb/in(2) on Co/Pd media and 250 Gb/in(2) on CoCrPt media are shown.
C1 [Ajan, Antony; Sato, Kenji; Aoyama, Nobuhide; Tanaka, Tsutomu; Tanaka, Atsushi; Uzumaki, Takuya] Fujitsu Labs Ltd, Kanagawa 2430197, Japan.
   [Miyaguchi, Yusuke; Tsumagari, Kanako; Morita, Tadashi; Nishihashi, Tsutomu] Ulvac Japan Ltd, Shizuoka 4101231, Japan.
RP Ajan, A (reprint author), Fujitsu Labs Ltd, Kanagawa 2430197, Japan.
EM antony.ajan@jp.fujitsu.com
CR AJAN A, 2010, PHYS REV B IN PRESS
   Albrecht M, 2002, APPL PHYS LETT, V81, P2875, DOI 10.1063/1.1512946
   AOYAMA N, 2009, IEEE T MAGN IN PRESS
   BIERSACK JP, 1980, NUCL INSTRUM METHODS, V174, P257, DOI 10.1016/0029-554X(80)90440-1
   Chappert C, 1998, SCIENCE, V280, P1919, DOI 10.1126/science.280.5371.1919
   CHOU SY, 1994, J APPL PHYS, V76, P6673, DOI 10.1063/1.358164
   Greaves SJ, 2008, IEEE T MAGN, V44, P3430, DOI 10.1109/TMAG.2008.2002365
   Honda N, 2007, IEEE T MAGN, V43, P2142, DOI 10.1109/TMAG.2007.893139
   Mallary M, 2002, IEEE T MAGN, V38, P1719, DOI 10.1109/TMAG.2002.1017762
   Pease RF, 2008, P IEEE, V96, P248, DOI 10.1109/JPROC.2007.911853
   Richter HJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2209179
   Roddick E, 2005, IEEE T MAGN, V41, P3229, DOI 10.1109/TMAG.2005.854781
   SATO K, 2009, J APPL PHYS IN PRESS
   Schmid GM, 2009, J VAC SCI TECHNOL B, V27, P573, DOI 10.1116/1.3081981
   Shaw JM, 2008, PHYS REV B, V78, DOI 10.1103/PhysRevB.78.024414
   Terris BD, 1999, APPL PHYS LETT, V75, P403, DOI 10.1063/1.124389
   Victora RH, 2002, IEEE T MAGN, V38, P1886, DOI 10.1109/TMAG.2002.802791
   Wood RW, 2002, IEEE T MAGN, V38, P1711, DOI 10.1109/TMAG.2002.1017761
   Wu Z, 2007, IEEE T MAGN, V43, P721, DOI 10.1109/TMAG.2006.888369
   Ziegler J.F., 2008, SRIM STOPPING RANGE
NR 20
TC 10
Z9 10
U1 0
U2 5
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUN
PY 2010
VL 46
IS 6
BP 2020
EP 2023
DI 10.1109/TMAG.2010.2043647
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 601DH
UT WOS:000278037800193
ER

PT J
AU Aniya, M
   Shimada, A
   Sonobe, Y
   Sato, K
   Shima, T
   Takanashi, K
   Greaves, SJ
   Ouchi, T
   Homma, T
AF Aniya, M.
   Shimada, A.
   Sonobe, Y.
   Sato, K.
   Shima, T.
   Takanashi, K.
   Greaves, Simon J.
   Ouchi, T.
   Homma, T.
TI Magnetization Reversal Process of Hard/Soft Nano-Composite Structures
   Formed by Ion Irradiation
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Discrete-track media; patterned media; ion irradiation; magnetic
   modification; CGC films; exchange coupling
ID PERPENDICULAR RECORDING MEDIA; FILMS
AB Discrete track media (DTM) and bit-patterned media (BPM) are being extensively studied as routes to achieve higher density hard disk drives. In the DTM and BPM, it is essential to isolate the data tracks or bits with non-magnetic materials to reduce the magnetic noise from adjacent tracks or bits. In contrast to the conventional procedure of physically etching the media, we attempted to isolate the tracks or bits with soft regions using an area-selective ion irradiation method. We prepared hard and soft nano-composite structures by nanoimprinting, followed by ion irradiation. In this study, we confirmed the magnetic reversal process of the hard and soft regions of the nano-composite structure using magnetic force microscopy (MFM) with various external applied magnetic fields. The analysis of the magnetization reversal process of patterned Coupled Granular Continuous (CGC) films with weak exchange coupling confirmed the validity of this novel approach for the fabrication of DTM and BPM.
C1 [Aniya, M.; Shimada, A.; Sonobe, Y.] HOYA Corp, MD Div, R&D Ctr, Tokyo 1968510, Japan.
   [Sato, K.; Shima, T.] Tohoku Gakuin Univ, Fac Engn, Tagajo, Miyagi 9858537, Japan.
   [Takanashi, K.] Tohoku Univ, Inst Mat Res, Sendai, Miyagi 9808577, Japan.
   [Greaves, Simon J.] RIEC Tohoku Univ, Sendai, Miyagi 9808577, Japan.
   [Ouchi, T.; Homma, T.] Waseda Univ, Dept Appl Chem, Shinjuku Ku, Tokyo 1698555, Japan.
RP Aniya, M (reprint author), HOYA Corp, MD Div, R&D Ctr, Tokyo 1968510, Japan.
EM Masanori_Aniya@sngw.rdc.hoya.co.jp
RI Takanashi, Koki/A-9488-2011
FU New Energy Industrial Technology Development Organization (NEDO)
FX This work was supported in part by New Energy Industrial Technology
   Development Organization (NEDO).
CR Aniya M, 2009, IEEE T MAGN, V45, P3539, DOI 10.1109/TMAG.2009.2023868
   Chappert C, 1998, SCIENCE, V280, P1919, DOI 10.1126/science.280.5371.1919
   Muraoka H, 2002, IEEE T MAGN, V38, P1632, DOI 10.1109/TMAG.2002.1017747
   Richter HJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2209179
   SOENO Y, 2003, IEEE T MAGN, V39, P1963
   Sonobe Y, 2002, IEEE T MAGN, V38, P2006, DOI 10.1109/TMAG.2002.801810
   Sonobe Y, 2001, IEEE T MAGN, V37, P1667, DOI 10.1109/20.950932
   Terris BD, 2000, J APPL PHYS, V87, P7004, DOI 10.1063/1.372912
   Tham KK, 2007, IEEE T MAGN, V43, P671, DOI 10.1109/TMAG.2006.888227
   YAMAOKA T, 2006, IEEE T MAGN, V41, P3733
   Yasumori J, 2009, IEEE T MAGN, V45, P850, DOI 10.1109/TMAG.2008.2010652
NR 11
TC 5
Z9 5
U1 0
U2 4
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUN
PY 2010
VL 46
IS 6
BP 2132
EP 2135
DI 10.1109/TMAG.2010.2043229
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 601DH
UT WOS:000278037800222
ER

PT J
AU Ouchi, T
   Arikawa, Y
   Kuno, T
   Mizuno, J
   Shoji, S
   Homma, T
AF Ouchi, Takanari
   Arikawa, Yuki
   Kuno, Taisuke
   Mizuno, Jun
   Shoji, Shuichi
   Homma, Takayuki
TI Electrochemical Fabrication and Characterization of CoPt Bit Patterned
   Media: Towards a Wetchemical, Large-Scale Fabrication
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Bit patterned media; CoPt; electrodeposition; nano-imprint lithography
ID MAGNETIC-PROPERTIES; ELECTRODEPOSITION; FILMS; STORAGE; ARRAYS
AB This paper describes the fabrication process of CoPt nandot arrays on a glass disk substrate with a CoZrNb underlayer as a soft magnetic underlayer (SUL) by using an electrochemical process, and also the analysis on the magnetic properties of these fabricated CoPt nanodot arrays. We formed nano-patterned substrates by UV-nanoimprint lithography (UV-NIL) on the glass disk substrate. CoPt was electrodeposited into the nano-patterned substrates optimizing the electrodeposition condition and bath composition as well as a Cu intermediate layer. The construction of the nanodot arrays were CoPt nanodot arrays (20 nm)/Cu (5 nm)/CoZrNb (100 nm)/Cr (5 nm)/Glass disk. Magnetic signals were clearly observed on the dc magnetized state and multi domain were observed in each nanodot on the ac magnetized state by magnetic force microscopy (MFM). The perpendicular coercivity of the CoPt nanodot arrays was 430 kA/m. These results showed electrochemical process can be used for the manufacture of magnetic recording media.
C1 [Ouchi, Takanari; Homma, Takayuki] Waseda Univ, Dept Appl Chem, Shinjuku Ku, Tokyo 1698555, Japan.
   [Ouchi, Takanari; Arikawa, Yuki; Kuno, Taisuke; Shoji, Shuichi; Homma, Takayuki] Waseda Univ, Dept Nanosci & Nanoengn, Shinjuku Ku, Tokyo 1698555, Japan.
   [Mizuno, Jun; Shoji, Shuichi; Homma, Takayuki] Waseda Univ, Nanothechnol Res Ctr, Shinjuku Ku, Tokyo 1620041, Japan.
   [Shoji, Shuichi] Waseda Univ, Dept Elect & Photon Syst, Shinjuku Ku, Tokyo 1698555, Japan.
RP Homma, T (reprint author), Waseda Univ, Dept Appl Chem, Shinjuku Ku, Tokyo 1698555, Japan.
EM t.homma@waseda.jp
FU Storage Research Consortium (SRC) Japan; Waseda University
FX This work was carried out at the "Center for Practical Chemical Wisdom"
   in the Global-COE Program, MEXT, Japan, and was supported in part by the
   Storage Research Consortium (SRC) Japan, and by Waseda University Grant
   for Special Research Projects. The authors would like to thank Toppan
   Printing Co., LTD. for supplying quartz molds and Toyo Gosei Co., LTD.
   for supplying the UV-curable resin.
CR Aoyama T, 2001, J MAGN MAGN MATER, V235, P174, DOI 10.1016/S0304-8853(01)00332-8
   Farhoud M, 1998, IEEE T MAGN, V34, P1087, DOI 10.1109/20.706365
   Gapin AI, 2006, J APPL PHYS, V99, DOI 10.1063/1.2163289
   Huang YH, 2002, J APPL PHYS, V91, P6869, DOI 10.1063/1.1447524
   Kikitsu A, 2009, J MAGN MAGN MATER, V321, P526, DOI 10.1016/j.jmmm.2008.05.039
   Lodder JC, 2004, J MAGN MAGN MATER, V272, P1692, DOI 10.1016/j.jmmm.2003.12.259
   Mitsuzuka K, 2006, IEEE T MAGN, V42, P3883, DOI 10.1109/TMAG.2006.878667
   Oshima H, 2007, APPL PHYS LETT, V91, DOI 10.1063/1.2757118
   Ouchi T., 2009, ECS T, V16, P57
   Ouchi T, 2008, J MAGN MAGN MATER, V320, P3104, DOI 10.1016/j.jmmm.2008.08.022
   Piramanayagam SN, 2007, J APPL PHYS, V102, DOI 10.1063/1.2750414
   Richter HJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2209179
   Ross CA, 1999, J VAC SCI TECHNOL B, V17, P3168, DOI 10.1116/1.590974
   Shiroishi Y, 2009, IEEE T MAGN, V45, P3816, DOI 10.1109/TMAG.2009.2024879
   Sohn JS, 2009, NANOTECHNOLOGY, V20, DOI 10.1088/0957-4484/20/2/025302
   Sun M, 2001, APPL PHYS LETT, V78, P2964, DOI 10.1063/1.1370986
   Terris BD, 2009, J MAGN MAGN MATER, V321, P512, DOI 10.1016/j.jmmm.2008.05.046
   Weller D, 2000, IEEE T MAGN, V36, P10, DOI 10.1109/20.824418
   Yasui N, 2003, APPL PHYS LETT, V83, P3347, DOI 10.1063/1.1622787
   Zana I, 2005, J MAGN MAGN MATER, V292, P266, DOI 10.1016/j.jmmm.2004.11.141
NR 20
TC 6
Z9 6
U1 1
U2 13
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUN
PY 2010
VL 46
IS 6
BP 2224
EP 2227
DI 10.1109/TMAG.2010.2040068
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 601DH
UT WOS:000278037800246
ER

PT J
AU Ng, YB
   Kumar, BVKV
   Cai, K
   Nabavi, S
   Chong, TC
AF Ng, Yibin
   Kumar, B. V. K. Vijaya
   Cai, Kui
   Nabavi, Sheida
   Chong, Tow Chong
TI Picket-Shift Codes for Bit-Patterned Media Recording With
   Insertion/Deletion Errors
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Bit-patterned media (BPM); frequency offset; insertion/deletion errors;
   write synchronization
AB We report the results of an investigation of bit-patterned media recording (BPMR) channels containing insertion/deletion errors that may be introduced because of the write synchronization problem. We first describe a simple channel model for insertion/deletion errors in BPM, as a result of write clock frequency offset. Based on this channel model, we propose a new error correction coding (ECC) scheme to correct insertion/deletion errors-picket shift. Simulation results show that picket shift performs significantly better than a no-ECC scheme in the presence of insertion/deletion errors.
C1 [Ng, Yibin; Kumar, B. V. K. Vijaya; Nabavi, Sheida] Carnegie Mellon Univ, Ctr Data Storage Syst, Pittsburgh, PA 15213 USA.
   [Ng, Yibin; Cai, Kui; Chong, Tow Chong] Data Storage Inst, Singapore 117608, Singapore.
RP Ng, YB (reprint author), Carnegie Mellon Univ, Ctr Data Storage Syst, Pittsburgh, PA 15213 USA.
EM yibinn@andrew.cmu.edu
CR Narahara T, 2000, JPN J APPL PHYS 1, V39, P912, DOI 10.1143/JJAP.39.912
   Ng Y, 2009, IEEE T MAGN, V45, P3535, DOI 10.1109/TMAG.2009.2024427
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   SELLERS FF, 1962, IRE T INFORM THEOR, V8, P35, DOI 10.1109/TIT.1962.1057684
   Tang Y., 2009, IEEE T MAGN, V42, P822
   MALLARY ML, 2009, Patent No. 20090002868
NR 6
TC 12
Z9 12
U1 0
U2 1
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUN
PY 2010
VL 46
IS 6
BP 2268
EP 2271
DI 10.1109/TMAG.2010.2043926
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 601DH
UT WOS:000278037800257
ER

PT J
AU Hogg, CR
   Majetich, SA
   Bain, JA
AF Hogg, Charles R.
   Majetich, Sara A.
   Bain, James A.
TI Investigating Pattern Transfer in the Small-Gap Regime Using
   Electron-Beam Stabilized Nanoparticle Array Etch Masks
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Etching; lithography; magnetic recording
ID LITHOGRAPHY; MONOLAYERS
AB Extreme small-gap lithography is necessary for future bit-patterned media, but is underexplored due to lack of etch masks with small enough gaps. Self-assembled nanoparticle arrays featuring 2 nm gaps are promising candidates, but exhibit lateral instability during etching. We present a novel one-step method for stabilizing their order by exposing to intense electron beam doses, and show pattern transfer into an underlying Si wafer. Electron beam-induced cross-linking of the surfactant is hypothesized to explain the improved stability. We suggest that this process could be used to pattern hard masks for subsequent pattern transfer into underlying magnetic films, with the gap and feature size required for bit patterned media to achieve densities in excess of 2 terabits per square inch.
C1 [Hogg, Charles R.; Majetich, Sara A.] Carnegie Mellon Univ, Dept Phys, Pittsburgh, PA 15213 USA.
   [Bain, James A.] Carnegie Mellon Univ, Dept Elect & Comp Engn, Pittsburgh, PA 15213 USA.
RP Hogg, CR (reprint author), Carnegie Mellon Univ, Dept Phys, Pittsburgh, PA 15213 USA.
EM chogg@andrew.cmu.edu
RI Majetich, Sara/B-1022-2015
OI Majetich, Sara/0000-0003-0848-9317; Bain, James/0000-0002-5355-5048
FU NSF ECCS [0925926]; Bruce and Astrid McWilliams Fellowship
FX This work was supported by NSF ECCS under Grant 0925926. The authors
   thank C. Bowman, C. Kline, T. Fisher, and M. Sakaluk for assistance in
   nanofabrication. C. R. Hogg is grateful for the support of the Bruce and
   Astrid McWilliams Fellowship in the Mellon College of Science.
CR Djenizian T, 2001, ELECTROCHIM ACTA, V47, P891, DOI 10.1016/S0013-4686(01)00784-8
   Fontana RE, 2008, IEEE T MAGN, V44, P3617, DOI 10.1109/TMAG.2008.2002532
   GOTTSCHO RA, 1992, J VAC SCI TECHNOL B, V10, P2133, DOI 10.1116/1.586180
   HONDA T, 2006, J MICROLITH MICROFAB, V5
   *INSIC, EHDR PROGR 2009
   LERCEL MJ, 1995, J VAC SCI TECHNOL B, V13, P1139, DOI 10.1116/1.588225
   LIDDLE JA, 2003, MATER RES SOC S P, V739, P1930
   Lin XM, 2001, APPL PHYS LETT, V78, P1915, DOI 10.1063/1.1358363
   NABITY JC, 1989, REV SCI INSTRUM, V60, P27, DOI 10.1063/1.1140576
   Park S, 2009, SCIENCE, V323, P1030, DOI 10.1126/science.1168108
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Sun SH, 2004, J AM CHEM SOC, V126, P273, DOI 10.1021/ja0380852
   Terris B. D., 2005, J PHYS D, V38, pR199
   Yang XM, 2008, J VAC SCI TECHNOL B, V26, P2604, DOI 10.1116/1.2978487
NR 14
TC 11
Z9 11
U1 0
U2 8
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUN
PY 2010
VL 46
IS 6
BP 2307
EP 2310
DI 10.1109/TMAG.2010.2040145
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 601DH
UT WOS:000278037800267
ER

PT J
AU Liu, ZJ
   Chen, BJ
   Wang, HT
   Zhang, SH
AF Liu, Z. J.
   Chen, B. J.
   Wang, H. T.
   Zhang, S. H.
TI A Simulation Model for Two Dimensional Recording on Continuous Granular
   Media
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Computational micromagnetics; perpendicular recording; two-dimensional
   magnetic recording
ID HEAD
AB In this paper, we present analyses of the media response to the write field with the recorded bits each of which involves a small number of grains. Our focus is on the development of a model that can be used to generate speedily the recorded patterns on continuous granular media. A two-dimensional Fourier analysis method is then used to construct the recorded patterns corresponding to given bit stream of write signals for signal to noise ratio evaluation.
C1 [Liu, Z. J.; Chen, B. J.; Wang, H. T.; Zhang, S. H.] Natl Univ Singapore, Data Storage Inst, Singapore 117608, Singapore.
RP Liu, ZJ (reprint author), Natl Univ Singapore, Data Storage Inst, Singapore 117608, Singapore.
EM dsiliuzj@dsi.a-star.edu.sg
RI Liu, Zhejie/G-3961-2012
CR Chan KS, 2009, IEEE T MAGN, V45, P3837, DOI 10.1109/TMAG.2009.2024001
   Kavcic A, 1997, IEEE T MAGN, V33, P4482, DOI 10.1109/20.649886
   Krishnan AR, 2009, IEEE T MAGN, V45, P3679, DOI 10.1109/TMAG.2009.2023244
   Miles J, 2002, IEEE T MAGN, V38, P2060, DOI 10.1109/TMAG.2002.802698
   Richter HJ, 2005, J MAGN MAGN MATER, V287, P41, DOI 10.1016/j.jmmm.2004.10.006
   Shute HA, 2006, IEEE T MAGN, V42, P1611, DOI 10.1109/TMAG.2005.861829
   Wood R, 2009, IEEE T MAGN, V45, P917, DOI 10.1109/TMAG.2008.2010676
   Zhong LP, 2003, IEEE T MAGN, V39, P1851, DOI 10.1109/TMAG.2003.810612
NR 8
TC 3
Z9 3
U1 0
U2 1
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUN
PY 2010
VL 46
IS 6
BP 2379
EP 2382
DI 10.1109/TMAG.2010.2042431
PG 4
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 601DH
UT WOS:000278037800286
ER

PT J
AU Nagato, K
   Hoshino, H
   Naito, H
   Hirota, T
   Tani, H
   Sakane, Y
   Toyoda, N
   Yamada, I
   Nakao, M
   Hamaguchi, T
AF Nagato, Keisuke
   Hoshino, Hiroaki
   Naito, Hiroki
   Hirota, Tomokazu
   Tani, Hiroshi
   Sakane, Yasuo
   Toyoda, Noriaki
   Yamada, Isao
   Nakao, Masayuki
   Hamaguchi, Tetsuya
TI Planarization of Nonmagnetic Films on Bit Patterned Substrates by Gas
   Cluster Ion Beams
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Gas cluster ion beam; patterned media; planarization
ID MEDIA
AB We studied Ar gas cluster ion beam (GCIB) planarization effect on patterned surfaces refilled with Cr, Ta and SiO(2). The patterns of 20 nm in depth were fabricated on Si substrate by using electron beam lithography and CHF(3)-reactive-ion-etching. The bit pattern pitches and the height of peak-to-valley were 150/200/300/400 nm and 20 nm, respectively. Then, refilling materials were deposited 30 nm in thickness on the patterned substrates. The test samples were irradiated by Ar-GCIB and the resultant surface profiles were measured by atomic force microscopy. Acceleration energy for a cluster was 20 keV. The dose was set from 2 x 10(15) to 5 x 10(15) ion/cm(2). Although there was a difference in the dose, the patterns disappeared clearly by irradiating GCIB. The reduction rate of peak-to valley height decreased with decreases of the pattern pitch. We indicated that GCIB irradiation is effective for the planarization of patterned surface refilled with Cr, Ta, and SiO(2).
C1 [Nagato, Keisuke; Hoshino, Hiroaki; Nakao, Masayuki; Hamaguchi, Tetsuya] Univ Tokyo, Grad Sch Engn, Dept Mech Engn, Tokyo 1138656, Japan.
   [Naito, Hiroki; Hirota, Tomokazu; Toyoda, Noriaki; Yamada, Isao] Univ Hyogo, Grad Sch Engn, Incubat Ctr, Himeji, Hyogo 6712280, Japan.
   [Tani, Hiroshi] Kansai Univ, Dept Mech Engn, Osaka 5648680, Japan.
   [Sakane, Yasuo] Western Digital Media Operat, San Jose, CA 95131 USA.
RP Nagato, K (reprint author), Univ Tokyo, Grad Sch Engn, Dept Mech Engn, Tokyo 1138656, Japan.
EM nagato@hnl.t.u-tokyo.ac.jp
FU Ministry of Education, Culture, Sports, Science and Technology, Japan
   [19106003, 21860015]
FX The bit patterns were fabricated using an electron beam writer
   (F5112+VD01) at the VLSI Design and Education Center (VDEC), the
   University of Tokyo, which was donated by Advantest Corporation. This
   work was supported in part by a Grant-in-Aid for Scientific Research
   (No. 19106003, 21860015) and by the Global Center of Excellence (G-COE)
   Program "Global Center of Excellence for Mechanical Systems Innovation
   (GMSI)" from the Ministry of Education, Culture, Sports, Science and
   Technology, Japan.
CR Albrecht M, 2002, APPL PHYS LETT, V81, P2875, DOI 10.1063/1.1512946
   Kakuta S, 2007, NUCL INSTRUM METH B, V257, P677, DOI 10.1016/j.nimb.2007.01.110
   Matsuo J, 1997, NUCL INSTRUM METH B, V121, P459, DOI 10.1016/S0168-583X(96)00541-1
   Nagato K, 2008, IEEE T MAGN, V44, P3476, DOI 10.1109/TMAG.2008.2001618
   Nunez EE, 2008, IEEE T MAGN, V44, P3667, DOI 10.1109/TMAG.2008.2002593
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Richter HJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2209179
   Soeno Y, 2003, IEEE T MAGN, V39, P1967, DOI 10.1109/TMAG.2003.813753
   Toyoda N, 2009, IEEE T MAGN, V45, P3503, DOI 10.1109/TMAG.2009.2023064
   TOYODA N, 2009, J APPL PHYS, V105
   Yamada I, 2001, MAT SCI ENG R, V34, P231, DOI 10.1016/S0927-796X(01)00034-1
NR 11
TC 2
Z9 2
U1 2
U2 3
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD JUN
PY 2010
VL 46
IS 6
BP 2504
EP 2506
DI 10.1109/TMAG.2010.2044379
PG 3
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 601DH
UT WOS:000278037800319
ER

PT J
AU El-Hilo, M
AF El-Hilo, M.
TI Effects of array arrangements in nano-patterned thin film media
SO JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
LA English
DT Article; Proceedings Paper
CT 4th Joint European Magnetic Symposia (JEMS 08)
CY SEP 14-19, 2008
CL Dublin, IRELAND
SP Sci Fdn Ireland
DE Array arrangement; Nano-patterned thin film; Dipolar interaction effect
ID REVERSAL
AB In this work, the effect of different arrays arrangements on the magnetic behaviour of patterned thin film media is simulated. The modeled films consist of 80 x 80 cobalt grains of uniform diameter (20 nm) distributed into two different array arrangement: hexagonal (triangular) or square arrays. In addition to that, for each array arrangement, two cases of anisotropy orientations, random and textured films are considered. For both array arrangements and media orientations, hysteresis loops at different array separation (d) were simulated. Predictions show that for closely packed films, the shearing effects on the magnetization loop are much larger for the square array arrangement than the hexagonal one. According to these predictions, the bit switching field distribution in interacting 2D systems is much narrower for the hexagonal array arrangement. This result could be very important for high-density magnetic recording where a narrow bit switching field distribution is required. (C) 2009 Elsevier B.V. All rights reserved.
C1 Univ Bahrain, Dept Phys, Sakhir, Bahrain.
RP El-Hilo, M (reprint author), Univ Bahrain, Dept Phys, PO 32038, Sakhir, Bahrain.
EM mhilo@rocketmail.com
CR El-Hilo M, 1998, J APPL PHYS, V84, P5114, DOI 10.1063/1.368761
   Guan LJ, 2000, IEEE T MAGN, V36, P2297, DOI 10.1109/20.908406
   Hellwig O, 2007, APPL PHYS LETT, V90, DOI 10.1063/1.2730744
   HUGHES GF, 1983, J APPL PHYS, V54, P5306, DOI 10.1063/1.332706
   Lodder JC, 2004, J MAGN MAGN MATER, V272, P1692, DOI 10.1016/j.jmmm.2003.12.259
   Martin JI, 2003, J MAGN MAGN MATER, V256, P449, DOI 10.1016/S0304-8853(02)00898-3
   PFEIFFER H, 1990, PHYS STATUS SOLIDI A, V118, P295, DOI 10.1002/pssa.2211180133
   Wang XB, 2002, J APPL PHYS, V92, P2064, DOI 10.1063/1.1495093
   WOHLFARTH EP, 1955, PROC R SOC LON SER-A, V232, P208, DOI 10.1098/rspa.1955.0212
   ZHU JG, 1988, J APPL PHYS, V63, P3248, DOI 10.1063/1.341167
NR 10
TC 5
Z9 5
U1 0
U2 3
PU ELSEVIER SCIENCE BV
PI AMSTERDAM
PA PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
SN 0304-8853
EI 1873-4766
J9 J MAGN MAGN MATER
JI J. Magn. Magn. Mater.
PD MAY-JUN
PY 2010
VL 322
IS 9-12
BP 1279
EP 1282
DI 10.1016/j.jmmm.2009.06.036
PG 4
WC Materials Science, Multidisciplinary; Physics, Condensed Matter
SC Materials Science; Physics
GA 571IS
UT WOS:000275746100064
ER

PT J
AU Pontes, LD
   Agreil, C
   Magda, D
   Gleizes, B
   Fritz, H
AF Pontes, Laise da Silveira
   Agreil, Cyril
   Magda, Daniele
   Gleizes, Benoit
   Fritz, Herve
TI Feeding behaviour of sheep on shrubs in response to contrasting
   herbaceous cover in rangelands dominated by Cytisus scoparius L.
SO APPLIED ANIMAL BEHAVIOUR SCIENCE
LA English
DT Article
DE Bite; Broom; Feeding choices; Grazing behaviour; Shrub encroachment;
   Shrubland
ID PLANT SECONDARY METABOLITES; BIOCHEMICAL DIVERSITY; SEASONAL-VARIATIONS;
   SMALL RUMINANTS; FORAGE QUALITY; SCOTCH BROOM; RED DEER; GOATS; DIET;
   DIGESTIBILITY
AB The foraging responses of ewes faced with a diversity of feed items and their effects on broom (Cytisus scoparius L.) consumption were examined. The experiment was conducted on a farm in the autumn with ewes (n = 33) grazing three small paddocks (0.44 ha on average, for at least 10 days each) located in broom shrubland. The effects of three different herbaceous covers on broom consumption were compared: 100% of paddock area previously grazed in summer; 50% of paddock area previously grazed in summer; and paddock area non-grazed during the year. The characteristics of herbaceous cover (availability and quality) and the ewes' diet selection were encoded as bite categories. Flock activities were recorded through scan sampling. We used logistic regression to assess the relationship between feeding behaviour of sheep on herbaceous vegetation and on broom species, and calculated selectivity indices for this shrub. We showed that the presence of high-quality bite categories in the herbaceous cover affected the way ewes integrated broom into their diet. At the start of each paddock use period, ewes favoured high-quality larger and medium bites of the herbaceous cover. They gradually included larger bites of broom and reduced their bite size, but continued to seek out higher quality herbaceous plants, a pattern which suggested a stabilisation of their daily average digestibility and bite mass over time. A negative relation was observed between the percentage of ewes taking large and medium bites on highly digestible plant parts and the percentage of ewes browsing broom. A maximum of 26% of the flock browsing broom was observed on any given day. Hence, ewes have a threshold for this target shrubby species that they do not exceed during any paddock utilisation period. This finding was interpreted as a mechanism to deal with post-ingestive consequences and complementary interactions between nutrients and toxins. When comparing broom selection between paddocks in autumn, we found an earlier and thus longer broom selection in areas with herbaceous cover that had not been grazed during the year (possibly because of a lower palatability). Our results provide new insights into ways to manipulate diet selection in order to stimulate the use of broom by ewes. Bite categories are proposed as functional feed indicators that facilitate prediction of the herbaceous cover state preliminary to initial broom integration in the sheep's diet. (C) 2010 Elsevier By. All rights reserved.
C1 [Pontes, Laise da Silveira; Magda, Daniele; Gleizes, Benoit] INRA, UMR 1248, F-31326 Castanet Tolosan, France.
   [Agreil, Cyril] INRA, UR Ecodev 0767, F-84914 Avignon 9, France.
   [Fritz, Herve] Univ Lyon 1, CNRS, UMR 5558, F-69622 Villeurbanne, France.
RP Magda, D (reprint author), INRA, UMR 1248, Chemin Borde Rouge, F-31326 Castanet Tolosan, France.
EM laisepontes@iapar.br; agreil@avignon.inra.fr;
   Daniele.Magda@toulouse.inra.fr; Benoit.Gleizes@toulouse.inra.fr;
   fritz@biomserv.univ-lyon1.fr
RI Fritz, Herve/D-1729-2014
OI Fritz, Herve/0000-0002-7106-3661
FU ANR-DIVA; PSDR; INRA
FX The authors are especially grateful to livestock producers Mathias,
   Francis and Gila Chevillon. We are also grateful to P.A. Portela, E.
   Lecloux, C. Moder and M. Perreu for their skilful assistance during the
   experiment. This study was financially supported by ANR-DIVA and PSDR
   (Program "Pour et Sur le Developpement Regional"). L. da S. Pontes
   acknowledges the support of INRA for a postdoctoral grant.
CR Agreil C, 2006, FEEDING IN DOMESTIC VERTEBRATES: FROM STRUCTURE TO BEHAVIOUR, P302, DOI 10.1079/9781845930639.0302
   Agreil C, 2005, APPL ANIM BEHAV SCI, V91, P35, DOI 10.1016/j.applanim.2004.08.029
   Agreil C, 2004, SMALL RUMINANT RES, V54, P99, DOI 10.1016/j.smallrumres.2003.10.013
   AGREIL C, HORIZONS EA IN PRESS, V1
   Altman J., 1974, BEHAVIOUR, V9, P227
   Ammar H, 2004, ANIM FEED SCI TECH, V115, P327, DOI 10.1016/j.anifeedsci.2004.03.003
   Aufrere J., 1989, Proceedings of the XVI International Grassland Congress, 4-11 October 1989, Nice, France., P877
   Baraza E, 2005, APPL ANIM BEHAV SCI, V92, P293, DOI 10.1016/j.applanim.2004.11.010
   Bellingham PJ, 2003, DIVERS DISTRIB, V9, P19, DOI 10.1046/j.1472-4642.2003.00162.x
   BOSSARD CC, 1994, BIOL CONSERV, V67, P193, DOI 10.1016/0006-3207(94)90609-2
   Boval M, 2002, J AGR SCI, V138, P73
   Casasus I, 2007, AGR ECOSYST ENVIRON, V121, P365, DOI 10.1016/j.agee.2006.11.012
   Clark A., 2000, Plant Protection Quarterly, V15, P161
   Cooper SM, 2003, OIKOS, V100, P387, DOI 10.1034/j.1600-0706.2003.11792.x
   Dagnelie P., 1986, THEORIE METHODES STA, VII
   Dumont B., 1995, Productions Animales (Paris), V8, P285
   Dumont B, 2005, ANIM RES, V54, P369, DOI 10.1051/animres:2005030
   Frost R. A., 2003, Rangelands, V25, P43
   Frutos P, 2002, ANIM FEED SCI TECH, V95, P215, DOI 10.1016/S0377-8401(01)00323-6
   FRYXELL JM, 1991, AM NAT, V138, P478, DOI 10.1086/285227
   GRESSER G, 1996, J BIOSCIENCE, V51, P791
   Hester AJ, 1998, J APPL ECOL, V35, P772, DOI 10.1046/j.1365-2664.1998.355348.x
   Holst PJ, 2004, AUST J EXP AGR, V44, P553, DOI 10.1071/EA97041
   Hulber K, 2005, BASIC APPL ECOL, V6, P1, DOI 10.1016/j.baae.2004.09.010
   Ihaka R., 1996, J COMPUTATIONAL GRAP, V5, P299, DOI [10.1080/10618600.1996.10474713, DOI 10.2307/1390807]
   JACOBS J, 1974, OECOLOGIA, V14, P413, DOI 10.1007/BF00384581
   Kababya D, 1998, J AGR SCI, V131, P221, DOI 10.1017/S0021859698005577
   Launchbaugh K., 2006, TARGETED GRAZING NAT
   Mellado M, 2003, J RANGE MANAGE, V56, P167, DOI 10.2307/4003901
   Meuret M, 1997, PROD ANIM, V10, P391
   Meuret M., 1996, Annales de Zootechnie (Paris), V45, P87, DOI 10.1051/animres:19960620
   Meuret M, 1993, J NEAR INFRARED SPEC, V1, P45
   MILNE JA, 1994, ANN ZOOTECH, V43, P3, DOI 10.1051/animres:19940101
   NEGI GCS, 1993, J APPL ECOL, V30, P383, DOI 10.2307/2404180
   Oom SP, 2004, ECOL COMPLEX, V1, P299, DOI 10.1016/j.ecocom.2004.06.003
   Papachristou TG, 2005, SMALL RUMINANT RES, V59, P141, DOI 10.1016/j.smallrumres.2005.05.003
   Papanastasis VP, 2008, ANIM FEED SCI TECH, V140, P1, DOI 10.1016/j.anifeedsci.2007.03.012
   PARSONS AJ, 1994, J ANIM ECOL, V63, P465, DOI 10.2307/5563
   Penning P. D., 1986, Grazing research at northern latitudes, P219
   Penning PD, 1997, SMALL RUMINANT RES, V24, P175, DOI 10.1016/S0921-4488(96)00930-3
   Provenza FD, 2003, SMALL RUMINANT RES, V49, P257, DOI 10.1016/S0921-4488(03)00143-3
   PROVENZA FD, 1995, J RANGE MANAGE, V48, P2, DOI 10.2307/4002498
   PROVENZA FD, 1983, J RANGE MANAGE, V36, P518, DOI 10.2307/3897958
   Rogosic J, 2008, SMALL RUMINANT RES, V74, P1, DOI 10.1016/j.smallrumres.2007.07.006
   Rogosic J, 2007, APPL ANIM BEHAV SCI, V107, P58, DOI 10.1016/j.applanim.2006.09.013
   Shaw RA, 2006, J CHEM ECOL, V32, P1267, DOI 10.1007/s10886-006-9083-2
   SMETHAM ML, 1990, PASTURES THEIR ECOLO, P197
   Tolera A, 1997, ANIM FEED SCI TECH, V67, P181, DOI 10.1016/S0377-8401(96)01119-4
   Valderrabano J, 2000, FOREST ECOL MANAG, V126, P377, DOI 10.1016/S0378-1127(99)00108-5
   VAN SOEST P. J., 1985, ANAL FORAGES FIBROUS
   Van-Soest PJ, 1982, NUTR ECOLOGY RUMINAN
   Villalba JJ, 2005, J CHEM ECOL, V31, P123, DOI 10.1007/s10886-005-0979-z
   Villalba JJ, 2004, OIKOS, V107, P100, DOI 10.1111/j.0030-1299.2004.12983.x
   WAITE R, 1964, J AGR SCI, V62, P391
   WILMSHURST JF, 1995, BEHAV ECOL, V6, P209, DOI 10.1093/beheco/6.2.209
NR 55
TC 4
Z9 4
U1 2
U2 10
PU ELSEVIER SCIENCE BV
PI AMSTERDAM
PA PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
SN 0168-1591
EI 1872-9045
J9 APPL ANIM BEHAV SCI
JI Appl. Anim. Behav. Sci.
PD APR
PY 2010
VL 124
IS 1-2
BP 35
EP 44
DI 10.1016/j.applanim.2010.02.002
PG 10
WC Agriculture, Dairy & Animal Science; Behavioral Sciences; Veterinary
   Sciences
SC Agriculture; Behavioral Sciences; Veterinary Sciences
GA 580AC
UT WOS:000276417800005
ER

PT J
AU Hu, J
   Duman, TM
   Erden, MF
   Kavcic, A
AF Hu, Jun
   Duman, Tolga M.
   Erden, M. Fatih
   Kavcic, Aleksandar
TI Achievable Information Rates for Channels with Insertions, Deletions,
   and Intersymbol Interference with i.i.d. Inputs
SO IEEE TRANSACTIONS ON COMMUNICATIONS
LA English
DT Article
DE Information rates; deletion channel; insertion channel; intersymbol
   interference; synchronization errors; bit-patterned media recording
ID BIT-PATTERNED MEDIA; ERRORS
AB We propose to use various trellis structures to characterize different types of insertion and deletion channels. We start with binary independent and identically distributed (i.i.d.) insertion or deletion channels, propose a trellis representation and develop a simulation based algorithm to estimate the corresponding information rates with independent and uniformly distributed inputs. This approach is then generalized to other cases, including channels with additive white Gaussian noise, channels with both insertions and deletions, and channels with intersymbol interference (ISI) where the latter model is motivated by the recent developments on bit-patterned media recording. We demonstrate that the proposed algorithm is an efficient and flexible technique to closely estimate the achievable information rates for channels with insertions and/or deletions with or without intersymbol interference when i.i.d. inputs are employed while we also provide some notes on the achievable information rates when Markov inputs are used. We emphasize that our method is useful for evaluating information rates for channels with insertion/deletions with additional impairments where there does not seem to be a hope of obtaining fully analytical results.
C1 [Hu, Jun] Qualcomm Inc, San Diego, CA 92121 USA.
   [Duman, Tolga M.] Arizona State Univ, Sch ECEE, Tempe, AZ 85287 USA.
   [Erden, M. Fatih] Seagate Technol, Bloomington, MN 55435 USA.
   [Kavcic, Aleksandar] Univ Hawaii Manoa, Honolulu, HI 96822 USA.
RP Hu, J (reprint author), Qualcomm Inc, San Diego, CA 92121 USA.
EM hujun@asu.edu; duman@asu.edu; fatih.erden@seagate.com; kavcic@hawaii.edu
RI Duman, Tolga/F-4113-2015
OI Duman, Tolga/0000-0002-5187-8660
FU Seagate Technology; National Science Foundation [NSF-TF0830611]
FX The work in this paper was primarily supported by Seagate Technology. T.
   M. Duman's work is also funded in part by the National Science
   Foundation grant NSF-TF0830611. This paper was presented in part at the
   IEEE International Conference on Communications, 2008, and in part at
   the IEEE International Symposium on Information Theory, 2008.
CR Arnold D, 2003, 2003 IEEE INTERNATIONAL SYMPOSIUM ON INFORMATION THEORY - PROCEEDINGS, P119
   ARNOLD D, 2006, IEEE T INF THEOR AUG, P3498
   Arnold D. M., 2001, P IEEE INT C COMM HE, V9, P2692
   Davey MC, 2001, IEEE T INFORM THEORY, V47, P687, DOI 10.1109/18.910582
   Diggavi S, 2006, IEEE T INFORM THEORY, V52, P1226, DOI 10.1109/TIT.2005.864445
   DIGGAVI S, 2007, P IEEE INT S INF THE
   Dobrushin R. L., 1967, Problems of Information Transmission, V3, P11
   DRINEA E, 2007, P IEEE INT S INF THE, P1731
   Drinea E, 2007, IEEE T INFORM THEORY, V53, P2693, DOI 10.1109/TIT.2007.901221
   Drinea E, 2006, IEEE T INFORM THEORY, V52, P4648, DOI 10.1109/TIT.2006.881832
   FERTONANI D, 2009, IEEE T COM UNPUB MAR
   FERTONANI D, IEEE T INF IN PRESS
   Gallager R. G., 1961, SEQUENTIAL DECODING
   HU J, 2007, 8 PERP MAGN REC C PM
   Hu J, 2007, IEEE T MAGN, V43, P3517, DOI 10.1109/TMAG.2007.898307
   Hughes G., 2001, PATTERNED MEDIA PHYS
   Kavcic A, 2004, 2004 IEEE INTERNATIONAL SYMPOSIUM ON INFORMATION THEORY, PROCEEDINGS, P229
   Pfister H., 2001, P GLOBECOM 2001 SAN, V5, P2992
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   ULLMAN JD, 1967, IEEE T INFORM THEORY, V13, P95, DOI 10.1109/TIT.1967.1053954
   Vasic B., 2004, CODING SIGNAL PROCES
   Zeng W., 2005, P IEEE INT S INF THE, P709
   Zhang Z, 2006, IEEE T MAGN, V42, P1629, DOI 10.1109/TMAG.2006.871474
   Zhang Z, 2004, IEEE T COMMUN, V52, P1698, DOI 10.1109/TCOMM.2004.836449
   Zigangirov K. S., 1969, PROBL INFORM TRANSM, V5, P17
NR 25
TC 17
Z9 17
U1 0
U2 2
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0090-6778
EI 1558-0857
J9 IEEE T COMMUN
JI IEEE Trans. Commun.
PD APR
PY 2010
VL 58
IS 4
BP 1102
EP 1111
DI 10.1109/TCOMM.2010.04.080683
PG 10
WC Engineering, Electrical & Electronic; Telecommunications
SC Engineering; Telecommunications
GA 575TA
UT WOS:000276089900013
ER

PT J
AU Murthy, AN
   Duwensee, M
   Talke, FE
AF Murthy, Aravind N.
   Duwensee, Maik
   Talke, Frank E.
TI Numerical Simulation of the Head/Disk Interface for Patterned Media
SO TRIBOLOGY LETTERS
LA English
DT Article
DE Bit-patterned media; Patterned slider; Magnetic data storage; Slider air
   bearing; Finite element method
ID HARD-DISK DRIVES; HEAD SLIDER BEARINGS; MONTE-CARLO METHOD; AIR-BEARING;
   TEXTURES
AB The use of patterned media is a new approach proposed to extend the recording densities of hard disk drives beyond 1 Tb/in.(2). Bit-patterned media (BPM) overcome the thermal stability problems of conventional media by using single-domain islands for each bit of recorded information, thereby eliminating the magnetic transition noise (Albrecht et al., Magnetic Recording on Patterned Media, 2003). Considering steady state conditions, we have transferred the pattern from the disk surface onto the slider surface and have investigated the pressure generation due to the bit pattern. To reduce the numerical complexity, we have generated the bit pattern only in the areas of the slider near the trailing edge, where the spacing is small. Cylindrical protrusions were modeled using very small mesh size on the order of nanometers to obtain the flying characteristics for the entire slider air bearing surface (ABS) using the "CMRR" finite element Reynolds equation simulator (Duwensee et al., Microsyst Technol, 2006; Wahl et al., STLE Tribol Trans, 39(1), 1996). The effect of pattern height, pattern diameter, slider skew angle, and slider pitch angle on flying height of a typical slider is investigated. Numerical results show that the flying height decreases for a patterned slider and the change in flying height is a function of the pattern height and ratio of the pattern diameter to the pattern pitch. In comparison to discrete track media, the flying height loss is larger for a patterned slider disk interface for the same recessed area of pattern.
C1 [Murthy, Aravind N.; Duwensee, Maik; Talke, Frank E.] Univ Calif San Diego, Ctr Magnet Recording Res, La Jolla, CA 92093 USA.
   [Duwensee, Maik] Hitachi Global Storage Technol, San Jose, CA 95135 USA.
RP Murthy, AN (reprint author), Univ Calif San Diego, Ctr Magnet Recording Res, 9500 Gilman Dr, La Jolla, CA 92093 USA.
EM amurthy@talkelab.ucsd.edu
CR ALBRECHT M, 2003, MAGNETIC RECORDING P, P36
   ALEXANDER FJ, 1994, PHYS FLUIDS, V6, P3854, DOI 10.1063/1.868377
   Buscaglia GC, 2005, J TRIBOL-T ASME, V127, P899, DOI 10.1115/1.2033896
   Buscaglia GC, 2004, J TRIBOL-T ASME, V126, P547, DOI 10.1115/.1.1739410
   Buscaglia GC, 2007, J MATH ANAL APPL, V335, P1309, DOI 10.1016/j.jmaa.2007.02.051
   DUWENSEE M, 2009, ASME, V131, P12001
   Duwensee M, 2007, MICROSYST TECHNOL, V13, P1023, DOI 10.1007/s00542-006-0314-9
   Duwensee M, 2006, IEEE T MAGN, V42, P2489, DOI 10.1109/TMAG.2006.878617
   FUA TC, 1999, J APPL PHYS, V85, P5600
   Fukui S., 1990, ASME, V112, P78, DOI DOI 10.1115/1.2920234
   Fukui S., 1988, ASME, V110, P253
   Gui J, 2000, J APPL PHYS, V87, P5383, DOI 10.1063/1.373352
   Huang WD, 1998, IEEE T MAGN, V34, P1810, DOI 10.1109/20.706714
   Huang WD, 1997, PHYS FLUIDS, V9, P1764, DOI 10.1063/1.869293
   Li WL, 2005, MICROSYST TECHNOL, V11, P23, DOI 10.1007/s00542-004-0462-8
   Tagawa N, 2003, MICROSYST TECHNOL, V9, P362, DOI 10.1007/S00542-002-0285-4
   Tagawa N, 2002, J TRIBOL-T ASME, V124, P568, DOI 10.1115/1.1456084
   TAGAWA N, 2001, ASME, V123, P151, DOI DOI 10.1115/1.1326442
   Wachenschwanz D, 2005, IEEE T MAGN, V41, P670, DOI 10.1109/TMAG.2004.838049
   WAHL M, 1996, STLE TRIBOL T, V39, P130
NR 20
TC 8
Z9 8
U1 0
U2 10
PU SPRINGER/PLENUM PUBLISHERS
PI NEW YORK
PA 233 SPRING ST, NEW YORK, NY 10013 USA
SN 1023-8883
J9 TRIBOL LETT
JI Tribol. Lett.
PD APR
PY 2010
VL 38
IS 1
BP 47
EP 55
DI 10.1007/s11249-009-9570-z
PG 9
WC Engineering, Chemical; Engineering, Mechanical
SC Engineering
GA 567RB
UT WOS:000275463200006
ER

PT J
AU Chen, YH
   Song, D
   Qiu, JM
   Kolbo, P
   Wang, L
   He, Q
   Covington, M
   Stokes, S
   Sapozhnikov, V
   Dimitrov, D
   Gao, KZ
   Miller, B
AF Chen, Yonghua
   Song, Dion
   Qiu, Jiaoming
   Kolbo, Paul
   Wang, Lei
   He, Qing
   Covington, Mark
   Stokes, Scott
   Sapozhnikov, Victor
   Dimitrov, Dimitar
   Gao, Kaizhong
   Miller, Bradley
TI 2 Tbit/in(2) Reader Design Outlook
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Giant magnetoresistance; magnetic heads; tunneling
ID BIT PATTERNED MEDIA; HEADS; GB/IN(2)
AB We review the 2 Tbit/in(2) reader design landscape based on existing knowledge and projection. We found that the reader signal-to-noise ratio (SNR) requirement will be highly challenging due to the rapid increase in noise and the additional requirements from assisted writing. An acceptable level of channel bit density can be achieved in spite of a slow head-to-media spacing (HMS) reduction provided that both the shield-to-shield (SS) spacing and the "a" parameter scale with the bit length. We expect the side reading control for high ktpi to be difficult, and potentially a reader side shield will be required. The reader will likely use a higher quality MgO tunneling giant magnetoresistance (TGMR) stack with improved permanent-magnet coercivity. Certain new structures such as the differential reader or the trilayer will likely be part of the solution.
C1 [Chen, Yonghua; Song, Dion; Qiu, Jiaoming; Kolbo, Paul; Wang, Lei; He, Qing; Covington, Mark; Stokes, Scott; Sapozhnikov, Victor; Dimitrov, Dimitar; Gao, Kaizhong; Miller, Bradley] Seagate Technol, Bloomington, MN 55435 USA.
RP Song, D (reprint author), Seagate Technol, Bloomington, MN 55435 USA.
EM dion.song@seagate.com
CR BERTRAM HN, 1994, THEORY MAGNETIC RECO, P133
   BERTRAM HN, 1994, THEORY MAGNETIC RECO, P194
   Hashimoto M, 2008, J MAGN MAGN MATER, V320, P2935, DOI 10.1016/j.jmmm.2008.08.063
   Horowitz P., 1989, ART ELECT
   Jiang LX, 2009, APPL PHYS EXPRESS, V2, DOI 10.1143/APEX.2.083002
   Kikitsu A, 2009, J MAGN MAGN MATER, V321, P526, DOI 10.1016/j.jmmm.2008.05.039
   KNELLER EF, 1991, IEEE T MAGN, V27, P3588, DOI 10.1109/20.102931
   Kryder MH, 2008, P IEEE, V96, P1810, DOI 10.1109/JPROC.2008.2004315
   Lamberton R, 2007, IEEE T MAGN, V43, P645, DOI 10.1109/TMAG.2006.888213
   Mao SN, 2003, IEEE T MAGN, V39, P2396, DOI 10.1109/TMAG.2003.815461
   Nakamoto K, 2008, IEEE T MAGN, V44, P95, DOI 10.1109/TMAG.2007.911022
   Nazarov A. V., 2008, J APPL PHYS, V103
   OZBAY A, 2009, APPL PHYS LETT, V94
   Peng XL, 2009, J MAGN MAGN MATER, V321, P1889, DOI 10.1016/j.jmmm.2008.12.008
   Smith N, 2001, APPL PHYS LETT, V78, P1448, DOI 10.1063/1.1352694
   Weller D, 2000, IEEE T MAGN, V36, P1
   Yang XM, 2009, IEEE T MAGN, V45, P833, DOI 10.1109/TMAG.2008.2010647
   Yasui N, 2009, IEEE T MAGN, V45, P805, DOI 10.1109/TMAG.2008.2010636
   Yeo CD, 2007, J MATER RES, V22, P141, DOI 10.1557/JMR.2007.0007
   ZHOU Y, 2009, P INT
   Mao S., U.S. Patent, Patent No. [7,016,160, 7016160]
NR 21
TC 19
Z9 19
U1 0
U2 9
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD MAR
PY 2010
VL 46
IS 3
BP 697
EP 701
DI 10.1109/TMAG.2010.2041040
PN 1
PG 5
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 558HG
UT WOS:000274731100002
ER

PT J
AU Karakulak, S
   Siegel, PH
   Wolf, JK
AF Karakulak, Seyhan
   Siegel, Paul H.
   Wolf, Jack Keil
TI A Parametric Study of Inter-Track Interference in Bit Patterned Media
   Recording
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Bit patterned media (BPM) recording; inter-track interference (ITI);
   intersymbol interference (ISI); track misregistration (TMR)
ID CHANNELS; STORAGE
AB We present a parametric study of inter-track interference (ITI) in the context of bit patterned media (BPM) recording channels. Bit error rate (BER) simulation results for optimal bit detection at moderate-to-high signal-to-noise-ratio (SNR) show that, in a certain range of ITI levels, increased ITI does not necessarily degrade performance. This observation applies to channels both with and without intersymbol interference (ISI) as well as in the absence and presence of track misregistration (TMR). In the case of no ISI, an exact analysis of the BER performance of optimal bit detection provides a complete explanation of the observed effect of ITI. For channels with ISI, error event analysis of a joint-track maximum-likelihood sequence detector provides insight into the observed impact of varying levels of ITI on BER performance.
C1 [Karakulak, Seyhan; Siegel, Paul H.; Wolf, Jack Keil] Univ Calif San Diego, Ctr Magnet Recording Res, La Jolla, CA 92093 USA.
RP Karakulak, S (reprint author), Univ Calif San Diego, Ctr Magnet Recording Res, La Jolla, CA 92093 USA.
EM skarakul@ucsd.edu
FU Patterned Media Project at the Center for Magnetic Recording Research,
   University of California, San Diego
FX This research was supported by the Patterned Media Project at the Center
   for Magnetic Recording Research, University of California, San Diego.
   The authors would like to thank H. N. Bertram for helpful discussions,
   E. Kurul for helping with the implementation of the error-event search
   algorithm, and the anonymous reviewers for constructive criticisms and
   suggestions.
CR ALTEKAR SA, 1997, THESIS U CALIFORNIA
   BAHL LR, 1974, IEEE T INFORM THEORY, V20, P284, DOI 10.1109/TIT.1974.1055186
   Burkhard H., 1989, P COMPEURO 89 VLSI C, P43
   FORNEY GD, 1972, IEEE T INFORM THEORY, V18, P363, DOI 10.1109/TIT.1972.1054829
   Hughes G. F., 2002, Intermag Europe 2002 Digest of Technical Papers. 2002 IEEE International Magnetics Conference (Cat.No.02CH37323), DOI 10.1109/INTMAG.2002.1001400
   Hughes GF, 1999, IEEE T MAGN, V35, P2310, DOI 10.1109/20.800809
   KARAKULAK S, 2008, INT MAY, pHT10
   KARAKULAK S, 2008, IEEE T MAGN UNPUB
   Karakulak S, 2008, IEEE T MAGN, V44, P193, DOI 10.1109/TMAG.2007.912837
   Nutter PW, 2005, IEEE T MAGN, V41, P4327, DOI 10.1109/TMAG.2005.856586
   Roh BG, 2002, IEEE T MAGN, V38, P1830, DOI 10.1109/TMAG.2002.1017779
   Suzuki H, 2009, IEEE T MAGN, V45, P3749, DOI 10.1109/TMAG.2009.2021571
   Tan WJ, 2005, J MAGN MAGN MATER, V287, P397, DOI 10.1016/j.jmmm.2004.10.066
   Weathers AD, 1997, IEEE T MAGN, V33, P2809, DOI 10.1109/20.617738
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
   YUAN SW, 1994, IEEE T MAGN, V30, P1267, DOI 10.1109/20.297764
NR 16
TC 2
Z9 2
U1 0
U2 2
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD MAR
PY 2010
VL 46
IS 3
BP 819
EP 824
DI 10.1109/TMAG.2009.2037724
PN 1
PG 6
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 558HG
UT WOS:000274731100020
ER

PT J
AU Suzuki, H
   Messner, WC
   Bain, JA
   Bhagavatula, V
   Nabavi, S
AF Suzuki, Hiroyuki
   Messner, William C.
   Bain, James A.
   Bhagavatula, V.
   Nabavi, Sheida
TI Simultaneous PES Generation, Timing Recovery, and Multi-Track Read on
   Patterned Media: Concept and Performance
SO IEEE TRANSACTIONS ON MAGNETICS
LA English
DT Article
DE Multiple bit read; patterned media; position detection; timing recovery
AB This paper presents new work on the performance of the method for simultaneously detecting the position and timing error in bit patterned media (BPM). The regular spatial arrangement of bits in BPM allows position information and timing information to be extracted from the data. Our method exploits interference between adjacent tracks by employing a read head wider than the track pitch. The method also provides the capability of reading data from two tracks at the same time. Here we employ a more realistic read head field and more realistic shapes of the bit islands in simulations than in prior work. We determine the sensitivity of the position detection, timing recovery, and bit error rate of the method to manufacturing variations in the locations and sizes of bits.
C1 [Suzuki, Hiroyuki] Fujitsu Lab Ltd, Magnet Disk Drive Lab, Atsugi, Kanagawa 2430197, Japan.
   [Messner, William C.; Bain, James A.; Bhagavatula, V.; Nabavi, Sheida] Carnegie Mellon Univ, Ctr Data Storage Syst, Pittsburgh, PA 15215 USA.
RP Messner, WC (reprint author), Fujitsu Lab Ltd, Magnet Disk Drive Lab, Atsugi, Kanagawa 2430197, Japan.
EM bmessner@andrew.cmu.edu
OI Bain, James/0000-0002-5355-5048
CR Iannou PA, 2003, IEEE T CONTR SYST T, V11, P325, DOI 10.1109/TCST.2003.810400
   Ioannou PA, 2007, IEEE T CONTR SYST T, V15, P1089, DOI 10.1109/TCST.2006.890296
   Karakulak S, 2008, IEEE T MAGN, V44, P193, DOI 10.1109/TMAG.2007.912837
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Suzuki H, 2009, IEEE T MAGN, V45, P3749, DOI 10.1109/TMAG.2009.2021571
   Wiesen K, 2003, IEEE T MAGN, V39, P2609, DOI 10.1109/TMAG.2003.816496
NR 6
TC 0
Z9 0
U1 0
U2 2
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0018-9464
EI 1941-0069
J9 IEEE T MAGN
JI IEEE Trans. Magn.
PD MAR
PY 2010
VL 46
IS 3
BP 825
EP 829
DI 10.1109/TMAG.2010.2041191
PN 1
PG 5
WC Engineering, Electrical & Electronic; Physics, Applied
SC Engineering; Physics
GA 558HG
UT WOS:000274731100021
ER

PT J
AU Grobis, M
   Dobisz, E
   Hellwig, O
   Schabes, ME
   Zeltzer, G
   Hauet, T
   Albrecht, TR
AF Grobis, M.
   Dobisz, E.
   Hellwig, O.
   Schabes, M. E.
   Zeltzer, G.
   Hauet, T.
   Albrecht, T. R.
TI Measurements of the write error rate in bit patterned magnetic recording
   at 100-320 Gb/in(2)
SO APPLIED PHYSICS LETTERS
LA English
DT Article
DE error statistics; magnetic disc storage; magnetic heads; magnetic
   recording
ID MEDIA; DOMAIN
AB We demonstrate a technique for measuring the intrinsic bit-error-rate as a function of write misregistration in bit patterned media. We examine the recording performance at bit densities of 100, 200, and 320 Gigabits per square inch (Gb/in(2)) and find that the on-track write misregistration margin for error rates below 10(-4) is similar to 1/4 of a bit length for all three densities. We demonstrate two-dimensional recording at sub 10(-4) bit error rate at 100 and 200 Gb/in(2) and with a 10(-3) bit error rate at 320 Gb/in(2).
C1 [Grobis, M.; Dobisz, E.; Hellwig, O.; Schabes, M. E.; Zeltzer, G.; Hauet, T.; Albrecht, T. R.] Hitachi Global Storage Technol, San Jose Res Ctr, San Jose, CA 95135 USA.
RP Grobis, M (reprint author), Hitachi Global Storage Technol, San Jose Res Ctr, 3403 Yerba Buena Rd, San Jose, CA 95135 USA.
EM michael.grobis@hitachigst.com
RI Zeltzer, Gabriel/L-1475-2016
OI Zeltzer, Gabriel/0000-0001-7573-4170
CR Albrecht M, 2003, IEEE T MAGN, V39, P2323, DOI 10.1109/TMAG.2003.816285
   Albrecht M, 2002, APPL PHYS LETT, V80, P3409, DOI 10.1063/1.1476062
   Albrecht M, 2002, APPL PHYS LETT, V81, P2875, DOI 10.1063/1.1512946
   Albrecht TR, 2009, NANOSCALE MAGNETIC MATERIALS AND APPLICATIONS, P237, DOI 10.1007/978-0-387-85600-1_9
   Chen YJ, 2008, APPL PHYS LETT, V93, DOI 10.1063/1.2978326
   Hauet T, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3276911
   Hellwig O, 2008, APPL PHYS LETT, V93, DOI 10.1063/1.3013857
   Hellwig O, 2007, APPL PHYS LETT, V90, DOI 10.1063/1.2730744
   Hu G, 2004, J APPL PHYS, V95, P7013, DOI 10.1063/1.1669343
   Kikitsu A, 2009, J MAGN MAGN MATER, V321, P526, DOI 10.1016/j.jmmm.2008.05.039
   Landis S, 1999, APPL PHYS LETT, V75, P2473, DOI 10.1063/1.125052
   Moritz J, 2004, APPL PHYS LETT, V84, P1519, DOI 10.1063/1.1644341
   Moser A, 1999, J APPL PHYS, V85, P5018, DOI 10.1063/1.370077
   Moser A, 2007, APPL PHYS LETT, V91, DOI 10.1063/1.2799174
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Richter HJ, 2006, APPL PHYS LETT, V88, DOI 10.1063/1.2209179
   Schabes ME, 2008, J MAGN MAGN MATER, V320, P2880, DOI 10.1016/j.jmmm.2008.07.035
   Suzuki H, 2009, IEEE T MAGN, V45, P3749, DOI 10.1109/TMAG.2009.2021571
   Tang Y, 2009, IEEE T MAGN, V45, P822, DOI 10.1109/TMAG.2008.2010642
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Todorovic M, 1999, APPL PHYS LETT, V74, P2516, DOI 10.1063/1.123885
   Wood R, 2009, IEEE T MAGN, V45, P917, DOI 10.1109/TMAG.2008.2010676
   Yasui N, 2008, J APPL PHYS, V103, DOI 10.1063/1.2837497
NR 23
TC 22
Z9 22
U1 1
U2 4
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0003-6951
J9 APPL PHYS LETT
JI Appl. Phys. Lett.
PD FEB 1
PY 2010
VL 96
IS 5
AR 052509
DI 10.1063/1.3304166
PG 3
WC Physics, Applied
SC Physics
GA 552UQ
UT WOS:000274319500068
ER

PT J
AU Hellwig, O
   Bosworth, JK
   Dobisz, E
   Kercher, D
   Hauet, T
   Zeltzer, G
   Risner-Jamtgaard, JD
   Yaney, D
   Ruiz, R
AF Hellwig, O.
   Bosworth, J. K.
   Dobisz, E.
   Kercher, D.
   Hauet, T.
   Zeltzer, G.
   Risner-Jamtgaard, J. D.
   Yaney, D.
   Ruiz, R.
TI Bit patterned media based on block copolymer directed assembly with
   narrow magnetic switching field distribution
SO APPLIED PHYSICS LETTERS
LA English
DT Article
DE electron beam lithography; magnetic domains; magnetic recording;
   magnetic switching; polymer blends; self-assembly; synchronisation
ID LITHOGRAPHY; ANISOTROPY; FILMS
AB Electron-beam (E-beam) directed assembly, which combines the long-range phase and placement registration of e-beam lithography with the sharp dot size and spacing uniformity of block copolymer self assembly, is considered highly promising for fabricating templates that meet the tight magnetic specifications required for write synchronization in bit patterned media magnetic recording systems. In our study, we show that this approach also yields a narrower magnetic switching field distribution (SFD) than e-beam patterning or block copolymer self-assembly alone. We demonstrate that the pattern uniformity, i.e., island diameter and placement distributions are also important for achieving tight magnetic SFDs.
C1 [Hellwig, O.; Bosworth, J. K.; Dobisz, E.; Kercher, D.; Hauet, T.; Zeltzer, G.; Risner-Jamtgaard, J. D.; Yaney, D.; Ruiz, R.] Hitachi Global Storage Technol, San Jose Res Ctr, San Jose, CA 95135 USA.
RP Hellwig, O (reprint author), Hitachi Global Storage Technol, San Jose Res Ctr, 3403 Yerba Buena Rd, San Jose, CA 95135 USA.
EM olav.hellwig@hitachigst.com
RI Zeltzer, Gabriel/L-1475-2016
OI Zeltzer, Gabriel/0000-0001-7573-4170; Ruiz, Ricardo/0000-0002-1698-4281
CR Baltz V, 2009, APPL PHYS LETT, V94, DOI 10.1063/1.3078523
   Black CT, 2007, IBM J RES DEV, V51, P605
   Guarini KW, 2002, ADV MATER, V14, P1290, DOI 10.1002/1521-4095(20020916)14:18<1290::AID-ADMA1290>3.0.CO;2-N
   Hammond MR, 2003, MACROMOLECULES, V36, P8712, DOI 10.1021/ma026001o
   Hauet T, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3276911
   Hellwig O, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3271679
   Hellwig O, 2008, APPL PHYS LETT, V93, DOI 10.1063/1.3013857
   Hellwig O, 2007, APPL PHYS LETT, V90, DOI 10.1063/1.2730744
   Hellwig O, 2007, J MAGN MAGN MATER, V319, P13, DOI 10.1016/j.jmmm.2007.04.035
   Mansky P, 1997, SCIENCE, V275, P1458, DOI 10.1126/science.275.5305.1458
   Ross CA, 2008, MRS BULL, V33, P838, DOI 10.1557/mrs2008.179
   Ruiz R, 2008, PHYS REV B, V77, DOI 10.1103/PhysRevB.77.054204
   Ruiz R, 2008, SCIENCE, V321, P936, DOI 10.1126/science.1157626
   Schabes ME, 2008, J MAGN MAGN MATER, V320, P2880, DOI 10.1016/j.jmmm.2008.07.035
   Shaw JM, 2008, PHYS REV B, V78, DOI 10.1103/PhysRevB.78.024414
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Thomson T, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.257204
NR 17
TC 69
Z9 69
U1 5
U2 31
PU AMER INST PHYSICS
PI MELVILLE
PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1,
   MELVILLE, NY 11747-4501 USA
SN 0003-6951
J9 APPL PHYS LETT
JI Appl. Phys. Lett.
PD FEB 1
PY 2010
VL 96
IS 5
AR 052511
DI 10.1063/1.3293301
PG 3
WC Physics, Applied
SC Physics
GA 552UQ
UT WOS:000274319500070
ER

PT J
AU Nabavi, S
   Jeon, S
   Kumar, BVKV
AF Nabavi, Sheida
   Jeon, Seungjune
   Kumar, B. V. K. Vijaya
TI An Analytical Approach for Performance Evaluation of Bit-Patterned Media
   Channels
SO IEEE JOURNAL ON SELECTED AREAS IN COMMUNICATIONS
LA English
DT Article
DE bit error rate; performance analysis; Viterbi algorithm; inter-track
   interference; bit-patterned media
ID OFFTRACK INTERFERENCE; VITERBI ALGORITHM; EQUALIZATION; STORAGE
AB In this work, a new analytical approach is used to evaluate the error performance of bit-patterned media (BPM) magnetic recording channels that employ one-dimensional (1D) and two-dimensional (2D) generalized partial response (GPR) equalizers to combat the significant inter-track interference (ITI) expected in BPM magnetic recording systems. The probability density function of ITI is obtained analytically and is used to estimate the bit error rate (BER) from the Viterbi detector. The proposed method takes into account most of the important factors affecting the BER such as ITI, un-equalized intersymbol interference (ISI), colored noise and the distance and the multiplicity of error events. In this work, it is shown that for 1D channels, modeling ITI and un-equalized ISI by Gaussian PDFs leads to inaccurate BERs and that the non-Gaussian distribution of the ITI and un-equalized ISI must be taken into account for more accurate BER estimates. This method provides fast and accurate estimates of BERs for moderate to high signal-to-noise ratios (SNRs). By using this analytical method, time-consuming numerical simulations for error performance evaluation can be avoided.
C1 [Nabavi, Sheida; Jeon, Seungjune; Kumar, B. V. K. Vijaya] Carnegie Mellon Univ, Dept Elect & Comp Engn, Pittsburgh, PA 15213 USA.
RP Nabavi, S (reprint author), Carnegie Mellon Univ, Dept Elect & Comp Engn, Pittsburgh, PA 15213 USA.
CR ABBOTT WL, 1988, IEEE T MAGN, V24, P2964, DOI 10.1109/20.92302
   ABBOTT WL, 1991, IEEE T MAGN, V27, P705, DOI 10.1109/20.101120
   Altekar SA, 1999, IEEE T INFORM THEORY, V45, P241, DOI 10.1109/18.746796
   BURKHARDT H, 1985, IEEE T INFORM THEORY, V31, P626, DOI 10.1109/TIT.1985.1057087
   CIDECIYAN RD, 2001, P IEEE INT C COMM IC, V9, P2711
   FORNEY GD, 1972, IEEE T INFORM THEORY, V18, P363, DOI 10.1109/TIT.1972.1054829
   HE R, 1999, P IEEE GLOBECOM 99 B, V1, P939
   JEON S, 2007, P IEEE GLOBECOM 07, P277
   Karakulak S, 2008, IEEE T MAGN, V44, P193, DOI 10.1109/TMAG.2007.912837
   Keskinoz M, 2008, IEEE T MAGN, V44, P533, DOI 10.1109/TMAG.2007.914966
   Keskinoz M, 2008, IEEE T MAGN, V44, P3793, DOI 10.1109/TMAG.2008.2002378
   MOON JY, 1995, IEEE T MAGN, V31, P1083, DOI 10.1109/20.364789
   NABAVI S, 2007, P IEEE INT C COMM IC, P6249
   Nabavi S, 2007, IEEE T MAGN, V43, P2274, DOI 10.1109/TMAG.2007.893479
   Nabavi S, 2008, IEEE T MAGN, V44, P3789, DOI 10.1109/TMAG.2008.2002387
   Nutter PW, 2005, IEEE T MAGN, V41, P3214, DOI 10.1109/TMAG.2005.854780
   Nutter PW, 2005, IEEE T MAGN, V41, P4327, DOI 10.1109/TMAG.2005.856586
   Sawaguchi H, 2001, J MAGN MAGN MATER, V235, P265, DOI 10.1016/S0304-8853(01)00357-2
   White RL, 1997, IEEE T MAGN, V33, P990, DOI 10.1109/20.560144
NR 19
TC 9
Z9 9
U1 0
U2 0
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0733-8716
J9 IEEE J SEL AREA COMM
JI IEEE J. Sel. Areas Commun.
PD FEB
PY 2010
VL 28
IS 2
BP 135
EP 142
DI 10.1109/JSAC.2010.100202
PG 8
WC Engineering, Electrical & Electronic; Telecommunications
SC Engineering; Telecommunications
GA 588IP
UT WOS:000277063400002
ER

PT J
AU Wu, Z
   Siegel, PH
   Wolf, JK
   Bertram, HN
AF Wu, Zheng
   Siegel, Paul H.
   Wolf, Jack K.
   Bertram, H. Neal
TI Analysis of Nonlinear Transition Shift and Write Precompensation in
   Perpendicular Recording Systems
SO IEEE JOURNAL ON SELECTED AREAS IN COMMUNICATIONS
LA English
DT Article
DE NLTS; write precompensation; jitter noise; perpendicular recording
ID PATTERN-DEPENDENT NOISE; PREDICTION
AB In high density perpendicular magnetic recording channels, nonlinear transition shift (NLTS) is one of the distortions that can degrade the system performance. Write precompensation is a standard method used to combat the negative effect of NLTS. In this paper, we present an analysis of the bit-error-rate (BER) for perpendicular recording systems with NLTS and write precompensation. Media jitter noise and additive white Gaussian noise are also considered in the model. A BER lower bound is derived, as well as a more easily computed estimate of the bound. The write precompensation values that numerically minimize the estimate of the BER lower bound prove to be very close to those found using Monte-Carlo channel simulation. We then apply these methods to the design of multilevel precompensation schemes, for which the optimization of precompensation values by Monte-Carlo channel simulation is computationally infeasible. The results show that for higher recording densities subject to increased ISI and noise, the use of more complex precompensation schemes does not significantly improve the system performance.
C1 [Wu, Zheng; Siegel, Paul H.; Wolf, Jack K.; Bertram, H. Neal] Univ Calif San Diego, Ctr Magnet Recording Res, La Jolla, CA 92093 USA.
   [Bertram, H. Neal] Hitachi Global Storage Technol, San Jose, CA 95135 USA.
RP Wu, Z (reprint author), Link A Media Devices, Santa Clara, CA 95051 USA.
EM zwu@linka-media.com; psiegel@ucsd.edu; jwolf@ucsd.edu; nbertram@ucsd.edu
FU Information Storage Industry Consortium (INSIC); Center for Magnetic
   Recording Research at UC San Diego
FX The authors would like to thank the Information Storage Industry
   Consortium (INSIC) Extremely High Density Recording (EHDR) program and
   the Center for Magnetic Recording Research at UC San Diego for funding
   this work. They also wish to thank the anonymous reviewers, whose
   insightful comments and valuable suggestions helped to improve the
   paper.
CR BARBOSA LC, 1989, IEEE T INFORM THEORY, V35, P419, DOI 10.1109/18.32136
   Bertram H. N., 1994, THEORY MAGNETIC RECO
   CHE XD, 1995, IEEE T MAGN, V31, P3021, DOI 10.1109/20.490257
   HE R, 1999, GLOB TEL C 1999 GLOB, V1, P939
   Kavcic A, 2000, IEEE T INFORM THEORY, V46, P291, DOI 10.1109/18.817531
   LIM F, 2005, P IEEE GLOB TEL C GL, V1, P58
   Moon J, 2001, IEEE J SEL AREA COMM, V19, P730, DOI 10.1109/49.920181
   MOON JY, 1995, IEEE T MAGN, V31, P1083, DOI 10.1109/20.364789
   Nakamoto K., 2002, Journal of the Magnetics Society of Japan, V26, P79, DOI 10.3379/jmsjmag.26.79
   PALMER D, 1987, IEEE T MAGN, V23, P2377, DOI 10.1109/TMAG.1987.1065310
   Taratorin A, 1997, IEEE T MAGN, V33, P956, DOI 10.1109/20.560138
   Viterbi A. J., 1979, PRINCIPLES DIGITAL C
   WU Z, 2008, P IEEE INT C COMM IC, P1972
   WU Z, 2009, THESIS U CALIFORNIA
   Wu Z, 2008, IEEE T MAGN, V44, P3761, DOI 10.1109/TMAG.2008.2002423
NR 15
TC 1
Z9 1
U1 0
U2 1
PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
PI PISCATAWAY
PA 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
SN 0733-8716
J9 IEEE J SEL AREA COMM
JI IEEE J. Sel. Areas Commun.
PD FEB
PY 2010
VL 28
IS 2
BP 158
EP 166
DI 10.1109/JSAC.2010.100204
PG 9
WC Engineering, Electrical & Electronic; Telecommunications
SC Engineering; Telecommunications
GA 588IP
UT WOS:000277063400004
ER

PT J
AU Kaczor, O
   Gueheneuc, YG
   Hamel, S
AF Kaczor, Olivier
   Gueheneuc, Yann-Gael
   Hamel, Sylvie
TI Identification of design motifs with pattern matching algorithms
SO INFORMATION AND SOFTWARE TECHNOLOGY
LA English
DT Article
DE Design patterns; Design motifs; Identification of occurrences;
   Bit-vector; Automata simulation; Experimental validation
ID SOFTWARE; SEARCH
AB Design patterns are important in software maintenance because they help in understanding and re-engineering systems. They propose design motifs, solutions to recurring design problems. The identification of occurrences of design motifs in large systems consists of identifying classes whose structure and organization match exactly or approximately the structure and organization of classes as suggested by the motif. We adapt two classical approximate string matching algorithms based on automata simulation and bit-vector processing to efficiently identify exact and approximate occurrences of motifs. We then carry out two case studies to show the performance, precision, and recall of our algorithms. In the first case study, we assess the performance of our algorithms on seven medium-to-large systems. In the second case study, we compare our approach with three existing approaches (an explanation-based constraint approach, a metric-enhanced explanation-based constraint approach, and a similarity scoring approach) by applying the algorithms on three small-to-medium size systems, JHOTDRAW, JUZZLE, and QUICKUML. Our studies show that approximate string matching based on bit-vector processing provides efficient algorithms to identify design motifs. (C) 2009 Elsevier B.V. All rights reserved.
C1 [Kaczor, Olivier; Gueheneuc, Yann-Gael; Hamel, Sylvie] Univ Montreal, DIRO, Montreal, PQ H3C 3J7, Canada.
RP Gueheneuc, YG (reprint author), Ecole Polytech Montreal, Dept Comp Engn & Software Engn, Montreal, PQ, Canada.
EM kaczorol@iro.umontreal.ca; guehene@iro.umontreal.ca;
   hamelsyi@iro.umontreal.ca
FU FQRNT; NSERC
FX The authors are grateful to Jean-Yves Potvin for all the fruitful
   discussions. This work has been partially funded by FQRNT and NSERC.
CR Agerbo E., 1998, P C OBJ OR PROGR SYS, P134, DOI 10.1145/286936.286952
   Antoniol G, 1998, PROG COMPREHEN, P153, DOI 10.1109/WPC.1998.693342
   BAEZAYATES R, 1992, COMMUN ACM, V35, P74, DOI 10.1145/135239.135243
   Bergeron A., 2002, International Journal of Foundations of Computer Science, V13, P53, DOI 10.1142/S0129054102000947
   Jourdan M., 2003, P 10 WORK C REV ENG, P209
   Bieman JM, 2003, NINTH INTERNATIONAL SOFTWARE METRICS SYMPOSIUM, PROCEEDINGS, P40, DOI 10.1109/METRIC.2003.1232454
   BIGGERSTAFF TJ, 1993, PROC INT CONF SOFTW, P482, DOI 10.1109/ICSE.1993.346017
   Brown W. J., 1998, ANTIPATTERNS REFACTO
   Ciupke O., 1999, Proceedings of Technology of Object-Oriented Languages and Systems - TOOLS 30 (Cat. No.PR00278), P18, DOI 10.1109/TOOLS.1999.787532
   Dantzig GB, 1963, LINEAR PROGRAMMING E
   EISELT HA, 1994, CRT960
   EPPSTEIN D, 1995, PROCEEDINGS OF THE SIXTH ANNUAL ACM-SIAM SYMPOSIUM ON DISCRETE ALGORITHMS, P632
   Gamma E., 1994, DESIGN PATTERNS ELEM
   Glushkov V. M., 1961, RUSS MATH SURV, V16, P1, DOI 10.1070/RM1961v016n05ABEH004112
   Gueheneuc YG, 2008, IEEE T SOFTWARE ENG, V34, P667, DOI 10.1109/TSE.2008.48
   Gueheneuc YG, 2004, 11TH WORKING CONFERENCE ON REVERSE ENGINEERING, PROCEEDINGS, P172, DOI 10.1109/WCRE.2004.21
   Gueheneuc Y.-G., 2001, P 1 IJCAI WORKSH MOD, P57, DOI 10.1.1.150.4976
   Gueheneuc YG, 2004, P 19 C OBJ OR PROGR, P301, DOI 10.1145/1028976.1029002
   Gueheneuc Y.-G., 2005, P 1 ECOOP WORKSH BUI
   Gusfield D., 1997, ALGORITHMS STRINGS T
   Holub J., 1997, Proceedings of the Prague Stringology Club Workshop '97, P39
   HOLUB J, 1998, P 3 INT WORKSH IMPL, P92
   Hopcroft J. E., 1979, INTRO AUTOMATA THEOR
   JAHNKE JH, P 6 EUR SOFTW ENG C, P193
   Jussien Ne, 2001, 1 CP WORKSH US INT C
   KACZOR O, 2006, P 10 C SOFTW MAINT R, P173
   KAMPFFMEYER H, 2007, P 10 INT C MOD DRIV, P211
   Keller R. K., 1999, Proceedings of the 1999 International Conference on Software Engineering (IEEE Cat. No.99CB37002), P226, DOI 10.1109/ICSE.1999.841012
   KOSKINEN J, 2004, SOFTWARE MAINTENANCE
   Kramer C, 1996, PROCEEDINGS OF THE THIRD WORKING CONFERENCE ON REVERSE ENGINEERING, P208, DOI 10.1109/WCRE.1996.558905
   Levenshtein V. I., 1966, SOV PHYS DOKL, V6, P707
   LIENTZ BP, 1981, COMMUN ACM, V24, P763, DOI 10.1145/358790.358796
   Mens K, 1999, TOOLS, V29, P33, DOI 10.1109/TOOLS.1999.778997
   Myers G, 1999, J ACM, V46, P395, DOI 10.1145/316542.316550
   NEEDLEMAN SB, 1970, J MOL BIOL, V48, P443, DOI 10.1016/0022-2836(70)90057-4
   Quilici A, 1997, J AUTOMATED SOFTWARE, V5, P347
   SCHEGLOV K, 2004, ECLIPSE PROFILER
   SMITH TF, 1981, J MOL BIOL, V147, P195, DOI 10.1016/0022-2836(81)90087-5
   Thimbleby H, 2003, SOFTWARE PRACT EXPER, V33, P1081, DOI 10.1002/spe.540
   THOMPSON K, 1968, COMMUN ACM, V11, P419, DOI 10.1145/363347.363387
   Tsantalis N, 2006, IEEE T SOFTWARE ENG, V32, P896, DOI 10.1109/TSE.2006.112
   UKKONEN E, 1985, J ALGORITHM, V6, P132, DOI 10.1016/0196-6774(85)90023-9
   Wendehals L, 2003, P 1 ICSE WORKSH DYN
   Wuyts R, 1998, TOOLS 26 - TECHNOLOGY OF OBJECT-ORIENTED LANGUAGES - PROCEEDINGS, P112, DOI 10.1109/TOOLS.1998.711007
NR 44
TC 4
Z9 4
U1 1
U2 2
PU ELSEVIER SCIENCE BV
PI AMSTERDAM
PA PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
SN 0950-5849
EI 1873-6025
J9 INFORM SOFTWARE TECH
JI Inf. Softw. Technol.
PD FEB
PY 2010
VL 52
IS 2
BP 152
EP 168
DI 10.1016/j.infsof.2009.08.006
PG 17
WC Computer Science, Information Systems; Computer Science, Software
   Engineering
SC Computer Science
GA 540WW
UT WOS:000273372400003
ER

PT J
AU Gunther, CM
   Hellwig, O
   Menzel, A
   Pfau, B
   Radu, F
   Makarov, D
   Albrecht, M
   Goncharov, A
   Schrefl, T
   Schlotter, WF
   Rick, R
   Luning, J
   Eisebitt, S
AF Guenther, C. M.
   Hellwig, O.
   Menzel, A.
   Pfau, B.
   Radu, F.
   Makarov, D.
   Albrecht, M.
   Goncharov, A.
   Schrefl, T.
   Schlotter, W. F.
   Rick, R.
   Luening, J.
   Eisebitt, S.
TI Microscopic reversal behavior of magnetically capped nanospheres
SO PHYSICAL REVIEW B
LA English
DT Article
ID ENERGY BARRIERS; DATA-STORAGE; NANOSTRUCTURES; HOLOGRAPHY
AB The magnetic switching behavior of Co/Pd multilayer-capped nanospheres is investigated by x-ray spectro-holography. Images of the magnetic state of individual nanocaps are recorded as a function of externally applied magnetic field and the angle under which the field is applied, pertaining to magnetic data storage applications with patterned, tilted, and perpendicular storage media. Dispersed nanospheres with different coverage in the submonolayer regime are investigated simultaneously in a multiplexed experiment. In clustered nanosphere arrangements, we find that individual switching events are influenced by dipolar magnetostatic interactions. Micromagnetic simulations of the switching behavior complement the experimental observations, corroborating the influence of thermal activation processes and magnetostatic interactions in this system. Such magnetostatic interactions could lead to undesired cross-talk between bits in ultrahigh-density magnetic recording applications.
C1 [Guenther, C. M.; Menzel, A.; Pfau, B.; Radu, F.; Eisebitt, S.] Helmholtz Zentrum Berlin Mat & Energie GmbH, D-14109 Berlin, Germany.
   [Guenther, C. M.; Pfau, B.; Eisebitt, S.] Tech Univ Berlin, Inst Opt & Atomare Phys, D-10623 Berlin, Germany.
   [Hellwig, O.] San Jose Res Ctr, Hitachi Global Storage Technol, San Jose, CA 95135 USA.
   [Makarov, D.; Albrecht, M.] Tech Univ Chemnitz, Inst Phys, D-09126 Chemnitz, Germany.
   [Goncharov, A.; Schrefl, T.] Univ Sheffield, Dept Mat Engn, Sheffield S1 3JD, S Yorkshire, England.
   [Schrefl, T.] St Polten Univ Appl Sci, A-3100 St Polten, Austria.
   [Schlotter, W. F.; Rick, R.] SLAC, Menlo Pk, CA 94025 USA.
   [Luening, J.] Univ Paris 06, LCPMR, UMR 7614, F-75005 Paris, France.
   [Luening, J.] Synchrotron SOLEIL, F-91192 Gif Sur Yvette, France.
RP Eisebitt, S (reprint author), Helmholtz Zentrum Berlin Mat & Energie GmbH, Hahn Meitner Pl 1, D-14109 Berlin, Germany.
EM eisebitt@physik.tu-berlin.de
RI Radu, Florin/B-6725-2011; Makarov, Denys/G-1025-2011; Pfau,
   Bastian/B-4953-2014; Menzel, Andreas/C-4388-2012
OI Radu, Florin/0000-0003-0284-7937; Pfau, Bastian/0000-0001-9057-0346;
   Menzel, Andreas/0000-0002-0489-609X; Gunther, Christian
   Michael/0000-0002-3750-7556
FU EU [MTKD-CT-2004-003178]
FX We thank H. Zabel for providing the ALICE scattering chamber. In
   addition to the general support from the BESSY-II staff, we benefited in
   particular from the beam block adjustment designed by T. Noll. A. M.
   acknowledges EU support under Contract No. MTKD-CT-2004-003178.
CR Albrecht M, 2005, NAT MATER, V4, P203, DOI 10.1038/nmat1324
   Dittrich R, 2005, J APPL PHYS, V97, DOI 10.1063/1.1851931
   Dittrich R, 2003, IEEE T MAGN, V39, P2839, DOI 10.1109/TMAG.2003.816239
   Dittrich R, 2002, J MAGN MAGN MATER, V250, pL12
   Eisebitt S, 2005, APPL PHYS A-MATER, V80, P921, DOI 10.1007/s00339-004-3117-9
   Eisebitt S, 2004, NATURE, V432, P885, DOI 10.1038/nature03139
   Eisebitt S, 2003, PHYS REV B, V68, DOI 10.1103/PhysRevB.68.104419
   Grabis J, 2003, REV SCI INSTRUM, V74, P4048, DOI 10.1063/1.1602932
   Hellwig O, 2006, J APPL PHYS, V99, DOI 10.1063/1.2165925
   Kappenberger P, 2009, APPL PHYS LETT, V95, DOI 10.1063/1.3176937
   Martin JI, 2003, J MAGN MAGN MATER, V256, P449, DOI 10.1016/S0304-8853(02)00898-3
   Moser A, 2002, J PHYS D APPL PHYS, V35, pR157, DOI 10.1088/0022-3727/35/19/201
   Piramanayagam SN, 2007, J APPL PHYS, V102, DOI 10.1063/1.2750414
   [Anonymous], 2001, PHYS ULTRAHIGH DENSI
   Schlotter WF, 2006, APPL PHYS LETT, V89, DOI 10.1063/1.2364259
   Schlotter WF, 2007, OPT LETT, V32, P3110, DOI 10.1364/OL.32.003110
   STONER EC, 1948, PHILOS TR R SOC S-A, V240, P599, DOI 10.1098/rsta.1948.0007
   Suess D, 2007, PHYS REV B, V75, DOI 10.1103/PhysRevB.75.174430
   Terris BD, 2005, J PHYS D APPL PHYS, V38, pR199, DOI 10.1088/0022-3727/38/12/R01
   Thomson T, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.257204
   Ulbrich TC, 2008, J APPL PHYS, V104, DOI 10.1063/1.3003064
   Ulbrich TC, 2006, PHYS REV LETT, V96, DOI 10.1103/PhysRevLett.96.077202
   Wang JP, 2005, NAT MATER, V4, P191, DOI 10.1038/nmat1344
   Wang JP, 2003, IEEE T MAGN, V39, P1930, DOI 10.1109/TMAG.2003.813775
NR 24
TC 26
Z9 26
U1 0
U2 21
PU AMER PHYSICAL SOC
PI COLLEGE PK
PA ONE PHYSICS ELLIPSE, COLLEGE PK, MD 20740-3844 USA
SN 1098-0121
J9 PHYS REV B
JI Phys. Rev. B
PD FEB
PY 2010
VL 81
IS 6
AR 064411
DI 10.1103/PhysRevB.81.064411
PG 7
WC Physics, Condensed Matter
SC Physics
GA 561SB
UT WOS:000274998100062
ER

PT J
AU Lin, GP
   Kuo, PC
   Huang, KT
   Shen, CL
   Tsai, TL
   Lin, YH
   Wu, MS
AF Lin, G. P.
   Kuo, P. C.
   Huang, K. T.
   Shen, C. L.
   Tsai, T. L.
   Lin, Y. H.
   Wu, M. S.
TI Self-assembled nano-size FePt islands for ultra-high density magnetic
   recording media
SO THIN SOLID FILMS
LA English
DT Article
DE FePt; Perpendicular; Patterned media; Self-assembled; Recording media;
   Transmission electron microscopy
ID BIT-PATTERNED MEDIA; THIN-FILMS; 1 TB/IN(2); TEMPERATURE
AB To find a method to form nano-size FePt alloy for ultra-high density magnetic recording media, this work concentrated on the formation mechanisms of nano-island FePt films on amorphous glass substrates. FePt films of different thicknesses (1-10 nm) were deposited on amorphous glass Substrates and post-annealed at 700 degrees C for 10 and 30 min. The configuration of the film changed during the annealing process due to the surface energy difference between the glass substrate and FePt alloy. Investigation of the microstructures and magnetic properties of the ordered L1(0) FePt films revealed that the I nm FePt film annealed at 700 degrees C for 10 min had perpendicular magnetic anisotropy and good reproducibility of forming well-separated FePt nano-size islands for ultra-high density magnetic recording media. Crown Copyright (C) 2009 Published by Elsevier B.V. All rights reserved.
C1 [Lin, G. P.; Kuo, P. C.; Huang, K. T.; Shen, C. L.; Tsai, T. L.; Lin, Y. H.; Wu, M. S.] Natl Taiwan Univ, Dept Mat Sci & Engn, Taipei 10617, Taiwan.
RP Kuo, PC (reprint author), Natl Taiwan Univ, Dept Mat Sci & Engn, Taipei 10617, Taiwan.
EM pckuo@ntu.edu.tw
FU National Science Council and Ministry of Economic Affairs of Taiwan
   [98-2221-E-002-053-MY3, 98-EC-17-A-08-S1-006]
FX This work was supported by the National Science Council and Ministry of
   Economic Affairs of Taiwan through the NSC 98-2221-E-002-053-MY3 and
   98-EC-17-A-08-S1-006 grants, respectively.
CR Breitling A, 2008, J MAGN MAGN MATER, V320, P1449, DOI 10.1016/j.jmmm.2007.12.003
   Degawa N, 2008, J MAGN MAGN MATER, V320, P3092, DOI 10.1016/j.jmmm.2008.08.097
   Fang YH, 2009, THIN SOLID FILMS, V517, P5185, DOI 10.1016/j.tsf.2009.03.141
   Goll D, 2008, APPL PHYS LETT, V93, DOI 10.1063/1.3001589
   Honda N, 2008, J MAGN MAGN MATER, V320, P2195, DOI 10.1016/j.jmmm.2008.03.048
   Hu JF, 2008, THIN SOLID FILMS, V516, P2067, DOI 10.1016/j.tsf.2007.09.028
   Kim JS, 2006, J APPL PHYS, V99, DOI 10.1063/1.2176088
   Moritz J, 2002, IEEE T MAGN, V38, P1731, DOI 10.1109/TMAG.2002.1017764
   Perumal A, 2008, APPL PHYS LETT, V92, DOI 10.1063/1.2830708
   Richter HJ, 2006, IEEE T MAGN, V42, P2255, DOI 10.1109/TMAG.2006.878392
   Sun AC, 2008, THIN SOLID FILMS, V516, P1155, DOI 10.1016/j.tsf.2007.06.128
   Takahashi YK, 2005, SCRIPTA MATER, V53, P403, DOI 10.1016/j.scriptamat.2005.04.037
   Tanaka Y, 2005, J MAGN MAGN MATER, V287, P468, DOI 10.1016/j.jmmm.2004.10.077
   Weller D, 2000, IEEE T MAGN, V36, P10, DOI 10.1109/20.824418
   Wu YC, 2007, APPL PHYS LETT, V91, DOI 10.1063/1.2770652
   Zotov N, 2008, THIN SOLID FILMS, V517, P531, DOI 10.1016/j.tsf.2008.06.062
NR 16
TC 5
Z9 5
U1 0
U2 3
PU ELSEVIER SCIENCE SA
PI LAUSANNE
PA PO BOX 564, 1001 LAUSANNE, SWITZERLAND
SN 0040-6090
J9 THIN SOLID FILMS
JI Thin Solid Films
PD FEB 1
PY 2010
VL 518
IS 8
BP 2167
EP 2170
DI 10.1016/j.tsf.2009.10.111
PG 4
WC Materials Science, Multidisciplinary; Materials Science, Coatings &
   Films; Physics, Applied; Physics, Condensed Matter
SC Materials Science; Physics
GA 559GY
UT WOS:000274812800049
ER

PT J
AU Kitahara, H
   Uno, Y
   Suzuki, H
   Kobayashi, T
   Tanaka, H
   Kojima, Y
   Kobayashi, M
   Katsumura, M
   Wada, Y
   Iida, T
AF Kitahara, Hiroaki
   Uno, Yuhei
   Suzuki, Hiroaki
   Kobayashi, Takashi
   Tanaka, Hiroshi
   Kojima, Yoshiaki
   Kobayashi, Masaki
   Katsumura, Masahiro
   Wada, Yasumitsu
   Iida, Tetsuya
TI Electron Beam Recorder for Patterned Media Mastering
SO JAPANESE JOURNAL OF APPLIED PHYSICS
LA English
DT Article; Proceedings Paper
CT 22ND INTERNATIONAL MICROPROCESSES AND NANOTECHNOLOGY CONFERENCE (MNC 09)
CY NOV 16-19, 2009
CL SAPPORO, JAPAN
ID TRACK PERPENDICULAR MEDIA; GBIT/IN(2) DENSITY; PERFORMANCE; DIAMETER;
   STORAGE
AB Patterned media are promising technologies to realize the next-generation hard disk drives (HDD) with an areal density beyond 1 Tbit/in.(2). Two types of patterned media have been proposed: one is the discrete track medium (DTM) and the other is the bit-patterned medium (BPM). Both DTM and BPM require very small feature sizes and extremely tight tolerances. The mastering process is a key technology for production of patterned media, and electron beam mastering is the only means to carry out the process. We developed a new electron beam recorder (EBR) for patterned media mastering. In this paper, we introduce the technologies and the recording performance of the EBR. The EBR has four primary technical features: a 100 kV EB column, a high-precision r-theta stage system, a stage error correction system, and an EBR formatter for patterned media. In experimentals, the EBR demonstrated the following recording performance. The EBR achieved sufficient recording accuracy for the requirements of DTM with 1 Tbit/in.(2) areal density. The EBR succeeded in high-density recording of a DTM pattern with 35-nm track pitch for over 1.5 Tbit/in.(2) areal density. The EBR showed high throughput and good recording stability by recording a 1.8-in. DTM master. In this experiment, the EBR achieved a line width uniformity of less than 1 nm and a short exposure time of about 50 h for whole-area recording. We proved the practicality of the EBR for patterned media production. (C) 2010 The Japan Society of Applied Physics
C1 [Kitahara, Hiroaki; Uno, Yuhei; Suzuki, Hiroaki; Kobayashi, Takashi; Tanaka, Hiroshi; Kojima, Yoshiaki; Kobayashi, Masaki; Katsumura, Masahiro; Wada, Yasumitsu; Iida, Tetsuya] Pioneer Corp, Res & Dev Grp, Microfabricat Proc Dev Dept, Tsurugashima, Saitama 3502288, Japan.
RP Kitahara, H (reprint author), Pioneer Corp, Res & Dev Grp, Microfabricat Proc Dev Dept, 1-2 Fujimi 6 Chome, Tsurugashima, Saitama 3502288, Japan.
EM hiroakikitahara@post.pioneer.co.jp
CR Babin S, 2006, J VAC SCI TECHNOL B, V24, P2956, DOI 10.1116/1.2387158
   CHOU SY, 1994, J APPL PHYS, V76, P6673, DOI 10.1063/1.358164
   Goodberlet JG, 2001, J VAC SCI TECHNOL B, V19, P2499, DOI 10.1116/1.1414018
   Issiki F, 2002, JPN J APPL PHYS 1, V41, P1714, DOI 10.1143/JJAP.41.1714
   Katsumura M, 2005, JPN J APPL PHYS 1, V44, P3578, DOI 10.1143/JJAP.44.3578
   Kitahara H, 2006, JPN J APPL PHYS 1, V45, P1401, DOI 10.1143/JJAP.45.1401
   Kitahara H, 2004, JPN J APPL PHYS 1, V43, P5068, DOI 10.1143/JJAP.43.5068
   Kojima Y, 1998, JPN J APPL PHYS 1, V37, P2137, DOI 10.1143/JJAP.37.2137
   Mitsui K., 1982, P 23 INT MTDR C, P115
   OHYI H, 2007, 51 INT C EL ION PHOT
   Soeno Y, 2005, IEEE T MAGN, V41, P3220, DOI 10.1109/TMAG.2005.854777
   Soeno Y, 2003, IEEE T MAGN, V39, P1967, DOI 10.1109/TMAG.2003.813753
   Wada Y, 2001, JPN J APPL PHYS 1, V40, P1653, DOI 10.1143/JJAP.40.1653
   Wada Y, 2008, JPN J APPL PHYS, V47, P6007, DOI 10.1143/JJAP.47.6007
NR 14
TC 10
Z9 10
U1 0
U2 2
PU IOP PUBLISHING LTD
PI BRISTOL
PA TEMPLE CIRCUS, TEMPLE WAY, BRISTOL BS1 6BE, ENGLAND
SN 0021-4922
EI 1347-4065
J9 JPN J APPL PHYS
JI Jpn. J. Appl. Phys.
PY 2010
VL 49
IS 6
SI SI
AR 06GE02
DI 10.1143/JJAP.49.06GE02
PN 2
PG 9
WC Physics, Applied
SC Physics
GA 613GB
UT WOS:000278966300017
ER

PT J
AU Toyoda, N
   Hirota, T
   Mashita, T
   Yamada, I
AF Toyoda, Noriaki
   Hirota, Tomokazu
   Mashita, Takafumi
   Yamada, Isao
TI Refilling and Planarization of Patterned Surface with Amorphous Carbon
   Films by Using Gas Cluster Ion Beam Assisted Deposition
SO JAPANESE JOURNAL OF APPLIED PHYSICS
LA English
DT Article; Proceedings Paper
CT 22ND INTERNATIONAL MICROPROCESSES AND NANOTECHNOLOGY CONFERENCE (MNC 09)
CY NOV 16-19, 2009
CL SAPPORO, JAPAN
ID MEDIA
AB Planarization of nano-structured surface has become important for various devices such as the bit patterned media or discrete track media for next generation storage devices. In this study, gas cluster ion beam (GCIB) assisted deposition was used to deposit amorphous carbon film on line-and-space pattern to realize simultaneous refilling and planarization. As GCIB irradiations induce dense energy depositions, the density of the amorphous carbon film deposited with GCIB assisted deposition became high compared to the other chemical vapor deposition (CVD) based deposition technique. The line-and-space pattern was refilled and planarized by deposition of amorphous carbon films by using Ar-GCIB assisted deposition. The thickness required for planarization with amorphous carbon deposition using Ar-GCIB assisted deposition was approximately the initial peak-to-valley height of the line-and-space pattern. Thus, very effective refilling and planarization is realized by using GCIB assisted deposition. (C) 2010 The Japan Society of Applied Physics
C1 [Toyoda, Noriaki; Hirota, Tomokazu; Mashita, Takafumi; Yamada, Isao] Univ Hyogo, Incubat Ctr, Grad Sch Engn, Himeji, Hyogo 6712280, Japan.
RP Toyoda, N (reprint author), Univ Hyogo, Incubat Ctr, Grad Sch Engn, 2167 Shosha, Himeji, Hyogo 6712280, Japan.
EM ntoyoda@incub.u-hyogo.ac.jp
CR Dobisz EA, 2008, P IEEE, V96, P1836, DOI 10.1109/JPROC.2008.2007600
   Hattori K, 2004, IEEE T MAGN, V40, P2510, DOI 10.1109/TMAG.2004.832244
   Insepov Z, 1997, NUCL INSTRUM METH B, V121, P44, DOI 10.1016/S0168-583X(96)00450-8
   Kitagawa T, 2003, JPN J APPL PHYS 1, V42, P3971, DOI 10.1143/JJAP.42.3971
   Kitagawa T, 2003, NUCL INSTRUM METH B, V201, P405, DOI 10.1016/S0168-583X(02)01739-1
   Nagato K, 2008, IEEE T MAGN, V44, P3476, DOI 10.1109/TMAG.2008.2001618
   Toyoda N, 2004, APPL SURF SCI, V226, P231, DOI 10.1016/j.apsusc.2003.11.025
   Toyoda N, 2009, IEEE T MAGN, V45, P3503, DOI 10.1109/TMAG.2009.2023064
   Toyoda N, 2008, IEEE T PLASMA SCI, V36, P1471, DOI 10.1109/TPS.2008.927266
   Toyoda N, 2009, J APPL PHYS, V105, DOI 10.1063/1.3073665
NR 10
TC 0
Z9 0
U1 2
U2 3
PU JAPAN SOC APPLIED PHYSICS
PI TOKYO
PA KUDAN-KITA BUILDING 5TH FLOOR, 1-12-3 KUDAN-KITA, CHIYODA-KU, TOKYO,
   102-0073, JAPAN
SN 0021-4922
J9 JPN J APPL PHYS
JI Jpn. J. Appl. Phys.
PY 2010
VL 49
IS 6
SI SI
AR 06GH13
DI 10.1143/JJAP.49.06GH13
PN 2
PG 4
WC Physics, Applied
SC Physics
GA 613GB
UT WOS:000278966300058
ER

PT J
AU Li, H
   Amemiya, K
   Talke, FE
AF Li, Hui
   Amemiya, Kensuke
   Talke, Frank E.
TI Slider Flying Characteristics over Bit Patterned Media Using the Direct
   Simulation Monte Carlo Method
SO JOURNAL OF ADVANCED MECHANICAL DESIGN SYSTEMS AND MANUFACTURING
LA English
DT Article; Proceedings Paper
CT JSME-IIP/ASME-ISPS Joint Conference on Micromechatronics for Information
   and Precision Equipment
CY JUN, 2009
CL Tsukuba, JAPAN
SP Amer Soc Mech Engineers, ISPS, Japanese Soc Mech Engineers, IIP
DE Direct Simulation Monte Carlo Method; Bit Patterned Media; Air Bearing
   Simulation
ID DISCRETE-TRACK MEDIA; PERPENDICULAR MEDIA; AIR-BEARING; PERFORMANCE;
   DENSITY
AB This work presents numerical simulation results of head/disk interface for bit patterned media using the direct simulation Monte Carlo method. The effects of geometry of the bit pattern and of temperature on the air bearing force are studied.
C1 [Li, Hui; Amemiya, Kensuke] Hitachi Asia Ltd, Storage Mech Lab, Singapore 049318, Singapore.
   [Talke, Frank E.] Univ Calif San Diego, Ctr Magnet Recording Res, La Jolla, CA 92093 USA.
RP Li, H (reprint author), Hitachi Asia Ltd, Storage Mech Lab, 16 Collyer Quay,20-00 Hitachi Tower, Singapore 049318, Singapore.
EM hli@has.hitachi.com.sg
CR ALEXANDER FJ, 1994, PHYS FLUIDS, V6, P3854, DOI 10.1063/1.868377
   Bird G., 1994, MOL GAS DYNAMICS DIR
   DUWENSEE M, 2009, ASME, V131, P13011
   Duwensee M, 2007, MICROSYST TECHNOL, V13, P1023, DOI 10.1007/s00542-006-0314-9
   Duwensee M, 2006, IEEE T MAGN, V42, P2489, DOI 10.1109/TMAG.2006.878617
   Fukui S, 2008, IEEE T MAGN, V44, P3671, DOI 10.1109/TMAG.2008.2002526
   Garcia A. L., 2000, NUMERICAL METHODS PH
   Huang WD, 1998, IEEE T MAGN, V34, P1810, DOI 10.1109/20.706714
   Huang WD, 1997, PHYS FLUIDS, V9, P1764, DOI 10.1063/1.869293
   ISHIDA T, 1993, IEICE T FUND ELECTR, VE76A, P1161
   Knigge BE, 2008, IEEE T MAGN, V44, P3656, DOI 10.1109/TMAG.2008.2002613
   LI H, IEEE T MAGN IN PRESS, P13011
   Li H, 2009, TRIBOL LETT, V33, P199, DOI 10.1007/s11249-009-9409-7
   Li JH, 2007, J TRIBOL-T ASME, V129, P712, DOI 10.1115/1.2768069
   Soeno Y, 2005, IEEE T MAGN, V41, P3220, DOI 10.1109/TMAG.2005.854777
   Soeno Y, 2003, IEEE T MAGN, V39, P1967, DOI 10.1109/TMAG.2003.813753
   Wachenschwanz D, 2005, IEEE T MAGN, V41, P670, DOI 10.1109/TMAG.2004.838049
   WAGNER W, 1992, J STAT PHYS, V66, P1011, DOI 10.1007/BF01055714
NR 18
TC 3
Z9 3
U1 0
U2 6
PU JAPAN SOC MECHANICAL ENGINEERS
PI TOKYO
PA SHINANOMACHI-RENGAKAN BLDG., SHINANOMACHI 35, SHINJUKU-KU, TOKYO,
   160-0016, JAPAN
SN 1881-3054
J9 J ADV MECH DES SYST
JI J. Adv. Mech. Des. Syst. Manuf.
PY 2010
VL 4
IS 1
SI SI
BP 49
EP 55
DI 10.1299/jamdsm.4.49
PG 7
WC Engineering, Manufacturing; Engineering, Mechanical
SC Engineering
GA 613EA
UT WOS:000278959600007
ER

PT J
AU Moscowitz, LM
AF Moscowitz, Leigh M.
TI Gay Marriage in Television News: Voice and Visual Representation in the
   Same-Sex Marriage Debate
SO JOURNAL OF BROADCASTING & ELECTRONIC MEDIA
LA English
DT Article
ID BLACKS; MEDIA
AB Drawing from critical-cultural scholarship, this quantitative content analysis systematically interrogates national network television news coverage of the same-sex marriage debate in 2003 and 2004. Analysis of sourcing patterns and sound bite length indicate the debate was dominated by conventionally "straight" perspectives. While gay and lesbian couples were visually prevalent in news stories, they were largely seen and not heard. Scrutinizing the visual narratives about gay and lesbian life in television news reports, this study found gay and lesbian representation was largely normalized and mainstreamed in typically heteronormative ways.
C1 Coll Charleston, Dept Commun, Charleston, SC 29424 USA.
RP Moscowitz, LM (reprint author), Coll Charleston, Dept Commun, Charleston, SC 29424 USA.
CR AARONS L, 2003, J CULTURES
   Adatto K., 1990, R2 HARV U JS BAR CTR
   Alwood Edward, 1996, STRAIGHT NEWS GAY ME
   Battles K, 2002, CRIT STUD MEDIA COMM, V19, P87, DOI 10.1080/07393180216553
   Becker Ron, 2006, GAY TV STRAIGHT AM
   Bennet L., 2000, GAY LESBIAN REV, V7, P30
   Blumler Jay G., 1995, CRISIS PUBLIC COMMUN
   Broder John M, 2004, N Y Times Web, pA16
   Bronstein C, 2005, JOURNALISM MASS COMM, V82, P783
   BUCY EP, 2007, J COMMUN, V54, P652
   Dow BJ, 2001, CRIT STUD MEDIA COMM, V18, P123, DOI 10.1080/07393180128077
   ENTMAN RM, 1993, J COMMUN, V43, P51, DOI 10.1111/j.1460-2466.1993.tb01304.x
   ENTMAN RM, 1992, JOURNALISM QUART, V69, P341
   Gamson W., 1998, NEW AM CULTURAL SOC, P230
   Gans H, 1979, DECIDING WHATS NEWS
   Gitlin T., 1980, WHOLE WORLD IS WATCH
   Goffman Erving, 1974, FRAME ANAL
   Grabe ME, 1999, JOURNALISM MASS COMM, V76, P293
   GRABE ME, 2009, ANN M INT COMM ASS S
   Graber Doris, 1997, MASS MEDIA AM POLITI
   Gross L., 1999, COLUMBIA READER LESB
   Gross L, 2001, INVISIBILITY LESBIAN
   HALLIN DC, 1992, J COMMUN, V42, P5, DOI 10.1111/j.1460-2466.1992.tb00775.x
   JACOBS F, 2004, ADVOCATE, V72
   JURKOWTIZ M, 2004, BOSTON GLOBE    0519
   Just M, 1999, POLIT COMMUN, V16, P25, DOI 10.1080/105846099198758
   KANTROWITZ B, 2004, NEWSWEEK        0301, P42
   Krippendorff K., 1980, CONTENT ANAL INTRO I
   Lester W., 2004, COURIER J       1213, pA9
   LICHTER SR, 2001, PRESS POLITICS, V6, P8
   MESSARIS P, 2001, FRAMING PUBLIC LIFE, P215
   MOSCOWITZ L, 2007, THESIS INDIANA U BLO
   Owens L. C., 2008, HOWARD J COMMUNICATI, V19, P355, DOI 10.1080/10646170802418269
   Page S., 2003, US TODAY        0729, pA1
   Parameswaran R. E., 2004, COMMUNICATION REV, V7, P371, DOI 10.1080/10714420490886970
   Poindexter PM, 2003, J BROADCAST ELECTRON, V47, P524, DOI 10.1207/s15506878jobem4704_3
   Reese S. D., 2001, FRAMING PUBLIC LIFE, P7
   ROBERTS C, 1975, JOURNALISM QUART, V52, P50
   Breslau K., 2004, NEWSWEEK        1115, P23
   Vance Carole S., 1989, PLEASURE DANGER EXPL, P267
   SIGAL LV, 1973, REPORTERS OFFICIAL O
   THOMAS S, 1994, COMMUN RES, V21, P683, DOI 10.1177/009365094021006002
   TUCHMAN G, 1976, J COMMUN, V26, P93, DOI 10.1111/j.1460-2466.1976.tb01942.x
   Walters Suzanna Danuta, 2001, QUEER FAMILIES QUEER, P338
   Walters Suzanna Danuta, 2001, ALL RAGE STORY GAY V
   Weaver DH, 2007, J COMMUN, V57, P142, DOI 10.1111/j.1460-2466.2006.00333.x
   2004, 60 MINUTES 2
   2009, STATE NEWS MEDIA 200
NR 48
TC 4
Z9 4
U1 7
U2 27
PU ROUTLEDGE JOURNALS, TAYLOR & FRANCIS LTD
PI ABINGDON
PA 4 PARK SQUARE, MILTON PARK, ABINGDON OX14 4RN, OXFORDSHIRE, ENGLAND
SN 0883-8151
J9 J BROADCAST ELECTRON
JI J. Broadcast. Electron. Media
PY 2010
VL 54
IS 1
BP 24
EP 39
DI 10.1080/08838150903550360
PG 16
WC Communication; Film, Radio, Television
SC Communication; Film, Radio & Television
GA 579BK
UT WOS:000276341200004
ER

PT J
AU Otim, SO
   Collins, S
AF Otim, Stephen O.
   Collins, Steve
TI Analysis and assessment of the effects of fixed pattern and quantization
   noise on the accuracy of color rendition in wide-dynamic-range
   complementary metal-oxide semiconductor imagers
SO JOURNAL OF ELECTRONIC IMAGING
LA English
DT Article
ID AUTOMOTIVE APPLICATIONS; CMOS; CALIBRATION
AB For wide-dynamic-range cameras that achieve a logarithmic response using a load transistor operating in weak inversion, fixed pattern noise is a particular problem. The effects of fixed pattern noise can be reduced using one of a variety of methods that compensate for different forms of fixed pattern noise. In choosing between these methods, it becomes important to know the level of fixed pattern noise that is tolerable for the application in question. Similarly, when deciding on the number of bits that should be used when digitizing the image, it is important to know the level of quantization noise that is tolerable to maintain color image quality. In this work, a method of determining the tolerable levels of fixed pattern and quantization noise is proposed. This leads to the conclusion that for one type of wide-dynamic-range pixel, a relatively simple fixed pattern noise correction procedure gives acceptable results for applications of medium complexity. A more generally applicable result is that if quantization levels equivalent to a contrast change of less than 2% in logarithmic imagers are obtainable, then excellent color image rendition can be achieved. (C) 2010 SPIE and IS&T. [DOI: 10.1117/1.3272597]
C1 [Otim, Stephen O.; Collins, Steve] Univ Oxford, Dept Engn Sci, Oxford OX1 3PJ, England.
RP Otim, SO (reprint author), Univ Oxford, Dept Engn Sci, Parks Rd, Oxford OX1 3PJ, England.
EM stephen.otim@linacre.oxon.org
FU Rhodes Trust
FX Stephen O. Otim wishes to thank the Rhodes Trust for all their support
   for the duration of this work, as well as the contribution of the
   Department of Engineering Science, Oxford University.
CR ABRARDO A, 1997, P COL IM C COL SCI S, P94
   Akyuz AO, 2006, J ELECTRON IMAGING, V15, DOI 10.1117/1.2238891
   Boynton R M, 1979, HUMAN COLOUR VISION
   Choubey B, 2006, IEEE SENS J, V6, P950, DOI [10.1109/JSEN.2006.877983, 10.1009/JSEN.2006.877983]
   Fossum E. R., 1997, IEEE T ELECTRON DEV, V44
   HAMMADOU T, 2002, IEEE INT C CONS EL, P44
   Hardeberg J.Y., 1999, THESIS ECOLE NATL SU
   Hosticka BJ, 2003, IEEE T ELECTRON DEV, V50, P173, DOI 10.1109/TED.2002.807258
   *IMEC, 1998, DOC GUID FUG 15RGB C
   Joseph D, 2002, IEEE T INSTRUM MEAS, V51, P996, DOI 10.1109/TIM.2002.807803
   Loose M, 2001, IEEE J SOLID-ST CIRC, V36, P586, DOI 10.1109/4.913736
   Marshall GF, 1998, P SOC PHOTO-OPT INS, V3410, P176, DOI 10.1117/12.324006
   Mead C., 1989, ANALOG VLSI NEURAL S
   *MUNS COL CORP INC, 1976, MUNS BOOK COL MATT F
   Otim Stephen O., 2004, IEEE INSTR MEAS TECH, V1, P451
   Otim SO, 2007, IEEE T INSTRUM MEAS, V56, P1910, DOI 10.1109/TIM.2007.903581
   Schanz M, 2000, IEEE J SOLID-ST CIRC, V35, P932, DOI 10.1109/4.848200
   SPYROS K, 2000, IEEE J SOLID-ST CIRC, V35, P1146
   *U JOENS, 2004, MATT MUNS COL RES DA
   Wandel B. A., 1995, FDN VISION
NR 20
TC 0
Z9 0
U1 0
U2 1
PU I S & T - SOC IMAGING SCIENCE TECHNOLOGY
PI SPRINGFIELD
PA 7003 KILWORTH LANE, SPRINGFIELD, VA 22151 USA
SN 1017-9909
J9 J ELECTRON IMAGING
JI J. Electron. Imaging
PD JAN-MAR
PY 2010
VL 19
IS 1
AR 011011
DI 10.1117/1.3272597
PG 6
WC Engineering, Electrical & Electronic; Optics; Imaging Science &
   Photographic Technology
SC Engineering; Optics; Imaging Science & Photographic Technology
GA 586VX
UT WOS:000276944100011
ER

EF